TWI867098B - Processing equipment - Google Patents
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- TWI867098B TWI867098B TW109141416A TW109141416A TWI867098B TW I867098 B TWI867098 B TW I867098B TW 109141416 A TW109141416 A TW 109141416A TW 109141416 A TW109141416 A TW 109141416A TW I867098 B TWI867098 B TW I867098B
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/0058—Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material
- B28D5/0082—Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material for supporting, holding, feeding, conveying or discharging work
- B28D5/0094—Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material for supporting, holding, feeding, conveying or discharging work the supporting or holding device being of the vacuum type
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B27/00—Other grinding machines or devices
- B24B27/033—Other grinding machines or devices for grinding a surface for cleaning purposes, e.g. for descaling or for grinding off flaws in the surface
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B27/00—Other grinding machines or devices
- B24B27/06—Grinders for cutting-off
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B49/00—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
- B24B49/12—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation involving optical means
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/0058—Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material
- B28D5/0064—Devices for the automatic drive or the program control of the machines
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/0058—Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material
- B28D5/0082—Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material for supporting, holding, feeding, conveying or discharging work
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/02—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by rotary tools, e.g. drills
- B28D5/022—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by rotary tools, e.g. drills by cutting with discs or wheels
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- H10P72/0428—
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- H10P72/0606—
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- H10P72/53—
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- H10P72/7616—
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- H10P72/78—
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- H10P54/00—
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- Mechanical Engineering (AREA)
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- Physics & Mathematics (AREA)
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- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Machine Tool Sensing Apparatuses (AREA)
- Laser Beam Processing (AREA)
- Optics & Photonics (AREA)
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Abstract
[課題]提供一種加工裝置,前述加工裝置讓作業人員可以確認形成於被加工物的背面側之溝是否沿著設定於被加工物的正面側之分割預定線而形成。 [解決手段]提供一種加工裝置,前述加工裝置具備:保持工作台,具有從一面到另一面以透明材所形成的預定的區域;加工單元,對被加工物進行加工;第1拍攝單元,設置於保持工作台的上方;第2拍攝單元,設置於保持工作台的下方;顯示單元;控制部,包含記憶部,前述記憶部是記憶預定的型樣的位置資訊,前述預定的型樣是包含於藉由以第2拍攝單元拍攝正面側已被保持工作台的一面所保持的被加工物而取得的正面側的圖像中,且前述控制部使包含於在被加工物的厚度方向上對應於被加工物的背面側的第1區域之正面側的第2區域中的預定的型樣、和第1區域的圖像重疊來顯示於顯示單元。[Topic] Provide a processing device that allows an operator to confirm whether a groove formed on the back side of a workpiece is formed along a predetermined dividing line set on the front side of the workpiece. [Solution] A processing device is provided, comprising: a holding workbench having a predetermined area formed from one side to the other side with a transparent material; a processing unit for processing a workpiece; a first photographing unit disposed above the holding workbench; a second photographing unit disposed below the holding workbench; a display unit; and a control unit including a memory unit, wherein the memory unit stores position information of a predetermined pattern, the predetermined pattern being included in an image of the front side obtained by photographing the workpiece held by one side of the holding workbench on the front side with the second photographing unit, and the control unit causes the predetermined pattern included in the second area on the front side corresponding to the first area on the back side of the workpiece in the thickness direction of the workpiece to be overlapped with the image of the first area and displayed on the display unit.
Description
本發明是有關於一種以保持正面側形成有預定的型樣之被加工物的正面側的狀態來對被加工物的背面側進行加工的加工裝置。 The present invention relates to a processing device for processing the back side of a workpiece while maintaining the front side of the workpiece having a predetermined shape formed on the front side.
利用於行動電話、個人電腦等電氣機器的半導體器件晶片,是藉由例如對以矽等的半導體材料所形成之圓盤狀的晶圓(被加工物)進行加工來製造。在被加工物的正面側設定有複數條分割預定線,且在以複數條分割預定線所區劃出的各區域中形成有IC(積體電路,Integrated Circuit)、LSI(大型積體電路,Large Scale Integration)、MEMS(微機電系統,Micro Electro Mechanical Systems)等的器件。 Semiconductor device chips used in electric devices such as mobile phones and personal computers are manufactured by processing a disk-shaped wafer (workpiece) formed of semiconductor materials such as silicon. A plurality of predetermined dividing lines are set on the front side of the workpiece, and devices such as IC (Integrated Circuit), LSI (Large Scale Integration), and MEMS (Micro Electro Mechanical Systems) are formed in each area divided by the plurality of predetermined dividing lines.
為了從被加工物製造器件晶片,可在例如藉由磨削被加工物的背面側而將被加工物薄化成預定的厚度後,藉由沿著各分割預定線切削被加工物,來將被加工物分割成器件單位而製造器件晶片。 In order to manufacture a device wafer from a workpiece, the workpiece may be thinned to a predetermined thickness by grinding the back side of the workpiece, and then the workpiece may be cut along each predetermined dividing line to divide the workpiece into device units to manufacture a device wafer.
在切削被加工物之切削步驟中,是使用切削裝置,前述切削裝置具備於主軸之一端裝設有切削刀片的切削單元、及吸引並保持被加工物之保持工作台。在通常的切削步驟中,首先是將被加工物的正面側設成向上,而以保持工作台吸引並保持被加工物的背面側。 In the cutting step of cutting the workpiece, a cutting device is used. The cutting device has a cutting unit with a cutting blade installed at one end of the spindle, and a holding table that attracts and holds the workpiece. In the usual cutting step, the front side of the workpiece is first set upward, and the back side of the workpiece is attracted and held by the holding table.
在保持背面側後,可藉由以設置於保持工作台之上方的相機拍攝被加工物的正面側來進行校準。在校準中,會使用具有拍攝元件的相機,且前述拍攝元件是用於以可見光拍攝被攝體的CCD(電荷耦合器件,Charge-Coupled Device)影像感測器或CMOS(互補式金屬氧化物半導體,Complementary Metal-Oxide-Semiconductor)影像感測器等。 After holding the back side, calibration can be performed by photographing the front side of the workpiece with a camera installed above the holding table. During calibration, a camera with a photographing element is used, and the photographing element is a CCD (Charge-Coupled Device) image sensor or a CMOS (Complementary Metal-Oxide-Semiconductor) image sensor that photographs the object with visible light.
可依據以此相機拍攝形成有校準標記等之被加工物的正面側的結果,來進行被加工物的位置補正等的校準。校準後,沿著各分割預定線以切削刀片切削被加工物。 Calibration such as position correction of the workpiece can be performed based on the result of photographing the front side of the workpiece with calibration marks formed on it with this camera. After calibration, the workpiece is cut along each predetermined dividing line with a cutting blade.
但是,近年來,隨著器件的多樣化,有時會從被加工物的背面側切削被加工物(參照例如專利文獻1)。此時,由於將被加工物的正面側配置成向下且以保持工作台保持,因此即使以設置於保持工作台的上方的上述之相機來拍攝被加工物的背面側,也無法拍攝校準標記等。 However, in recent years, with the diversification of devices, the workpiece is sometimes cut from the back side of the workpiece (see, for example, Patent Document 1). At this time, since the front side of the workpiece is arranged downward and held by a holding table, even if the back side of the workpiece is photographed with the above-mentioned camera set above the holding table, the calibration mark, etc. cannot be photographed.
於是,已開發有一種切削裝置,前述切削裝置具備以對可見光透明的材料所形成的保持工作台、及配置於保持工作台的下方之可見光用之相機(參照例如專利文獻2)。只要使用此切削裝置,即可以在以保持工作台保持了被加工物的正面側的狀態下,從保持工作台的下方拍攝被加工物的正面側。因此,即使是在將被加工物的背面側設成向上,而以保持工作台保持了被加工物的正面側的情況下,也可以進行校準。 Therefore, a cutting device has been developed, which has a holding table formed of a material transparent to visible light and a camera for visible light arranged below the holding table (see, for example, Patent Document 2). By using this cutting device, the front side of the workpiece can be photographed from below the holding table while the front side of the workpiece is held by the holding table. Therefore, calibration can be performed even when the back side of the workpiece is set upward and the front side of the workpiece is held by the holding table.
專利文獻1:日本特開2006-140341號公報 Patent document 1: Japanese Patent Publication No. 2006-140341
專利文獻2:日本特開2010-87141號公報 Patent document 2: Japanese Patent Publication No. 2010-87141
然而,即使在使用於保持工作台的下方配置有上述之相機的切削裝置的情況下,也會有無法確認形成於被加工物的切削溝是否沿著分割預定線來形成之情況。 However, even when a cutting device is used in which the above-mentioned camera is arranged below the holding table, it may be impossible to confirm whether the cutting groove formed on the workpiece is formed along the predetermined dividing line.
例如,在從被加工物的背面側到未到達被加工物的正面之預定的 深度來局部地形成將被加工物去除的切削溝(即半切溝)的情況下,作業人員會無法確認切削溝是否沿著設定於正面側的分割預定線來形成。 For example, when a cutting groove (i.e., a half-cut groove) is formed locally to remove the workpiece from the back side of the workpiece to a predetermined depth that does not reach the front side of the workpiece, the operator cannot confirm whether the cutting groove is formed along the predetermined dividing line set on the front side.
本發明是有鑒於所述的問題點而作成的發明,目的在於提供一種加工裝置,前述加工裝置可以讓作業人員確認形成於被加工物的背面側之溝是否沿著設定於被加工物的正面側的分割預定線來形成。 The present invention is made in view of the above-mentioned problems, and its purpose is to provide a processing device that allows the operator to confirm whether the groove formed on the back side of the workpiece is formed along the predetermined dividing line set on the front side of the workpiece.
根據本發明之一態樣,可提供一種加工裝置,前述加工裝置具備:板狀的保持工作台,包含一面、及與該一面位於相反側的另一面,且具有從該一面至該另一面以透明材所形成的預定的區域;加工單元,以該保持工作台的該一面來保持正面側具有預定的型樣的被加工物的該正面側,且以該被加工物的背面側朝上方露出的狀態來對該被加工物進行加工;第1拍攝單元,在該保持工作台的上方設置成相向於該一面;第2拍攝單元,在該保持工作台的下方設置成相向於該另一面;顯示單元,顯示以該第1拍攝單元及該第2拍攝單元的至少任一個所取得的圖像;及控制部,包含記憶部,前述記憶部是記憶該預定的型樣的位置資訊,該預定的型樣是包含於藉由以該第2拍攝單元拍攝該正面側已被該保持工作台的該一面所保持的該被加工物而取得的該正面側的圖像中,且前述控制部使包含於在該被加工物的厚度方向上對應於該被加工物的該背面側的第1區域之該正面側的第2區域中的該預定的型樣、和該第1區域的圖像重疊來顯示於該顯示單元。 According to one aspect of the present invention, a processing device can be provided, which comprises: a plate-shaped holding workbench, including one side and another side located on the opposite side of the one side, and having a predetermined area formed by a transparent material from the one side to the other side; a processing unit, which uses the one side of the holding workbench to hold the front side of a workpiece having a predetermined shape on the front side, and processes the workpiece in a state where the back side of the workpiece is exposed upward; a first shooting unit, which is arranged above the holding workbench to face the one side; and a second shooting unit, which is arranged below the holding workbench to face the other side. ; a display unit that displays an image obtained by at least one of the first shooting unit and the second shooting unit; and a control unit that includes a memory unit that stores position information of the predetermined pattern, the predetermined pattern included in the image of the front side obtained by shooting the workpiece whose front side is held by the one side of the holding table with the second shooting unit, and the control unit causes the predetermined pattern included in the second area of the front side corresponding to the first area of the back side of the workpiece in the thickness direction of the workpiece to be overlapped with the image of the first area and displayed on the display unit.
較佳的是,顯示於該顯示單元的該第1區域的圖像包含顯示藉由該加工單元所形成之加工溝的區域,該控制部是使該第2區域中的該預定的型樣顯示在包含顯示該加工溝之區域的該第1區域的圖像上。 Preferably, the image of the first area displayed on the display unit includes an area showing the processing groove formed by the processing unit, and the control unit causes the predetermined pattern in the second area to be displayed on the image of the first area including the area showing the processing groove.
又,較佳的是,在該顯示單元顯示該第2區域的圖像,且該第1區域的圖像包含顯示藉由該加工單元所形成之加工溝的區域,該控制部是使該第1區域的圖像之至少顯示該加工溝的區域顯示在該第2區域的圖像上。 Furthermore, preferably, the display unit displays the image of the second area, and the image of the first area includes an area showing the processing groove formed by the processing unit, and the control unit causes at least the area showing the processing groove of the image of the first area to be displayed on the image of the second area.
又,較佳的是,該控制部是以將X軸方向及Y軸方向之方向設成在該第1區域的圖像與該第2區域的圖像上相同的狀態,來使該第1區域的圖像與該第2區域的圖像重疊而顯示於該顯示單元。 Furthermore, preferably, the control unit sets the direction of the X-axis direction and the Y-axis direction to be the same on the image of the first area and the image of the second area, so that the image of the first area and the image of the second area are overlapped and displayed on the display unit.
又,較佳的是,該加工單元是裝設切削刀片的切削單元、或者照射雷射光束的雷射照射單元。 Furthermore, it is preferred that the processing unit is a cutting unit equipped with a cutting blade, or a laser irradiation unit irradiating a laser beam.
本發明之一態樣的加工裝置的保持工作台,具有從一面到另一面以透明材所形成的預定的區域。在保持工作台的上方,將第1拍攝單元設置成相向於保持工作台的一面,且在保持工作台的下方將第2拍攝單元設置成相向於保持工作台的另一面。 The holding table of the processing device of one embodiment of the present invention has a predetermined area formed by a transparent material from one side to the other side. Above the holding table, the first shooting unit is set to face one side of the holding table, and below the holding table, the second shooting unit is set to face the other side of the holding table.
控制部包含記憶部,並在此記憶部記憶預定的型樣的位置資訊,且前述預定的型樣是包含於藉由以第2拍攝單元拍攝正面側被保持工作台的一面所保持的被加工物而取得的正面側的圖像中。 The control unit includes a memory unit, and the position information of the predetermined pattern is stored in the memory unit, and the predetermined pattern is included in the front side image obtained by photographing the workpiece held by one side of the worktable held on the front side with the second photographing unit.
此外,控制部使包含於在被加工物的厚度方向上對應於被加工物的背面側的第1區域之正面側的第2區域中的預定的型樣、與第1區域的圖像重疊來顯示於顯示單元。因此,作業人員可以確認形成於被加工物之溝是否沿著分割預定線形成。 In addition, the control unit causes the predetermined pattern contained in the second area on the front side of the first area corresponding to the back side of the workpiece in the thickness direction of the workpiece to be displayed on the display unit by overlapping the image of the first area. Therefore, the operator can confirm whether the groove formed in the workpiece is formed along the predetermined dividing line.
2:切削裝置(加工裝置) 2: Cutting device (processing device)
4:基台 4: Base
4a,4b,4d:開口 4a,4b,4d: Opening
4c:支撐構造 4c: Support structure
6:片匣 6: Film box
10:保持工作台 10: Keep the workbench
11:被加工物 11: Object to be processed
11a:正面 11a: Front
11b:背面 11b: Back
11c:溝(加工溝) 11c: Groove (processing groove)
12:保持構件 12: Maintain components
12a:一面 12a: One side
12b:另一面 12b: The other side
12c1:第1吸引路 12c 1 : First attraction path
12c2:第2吸引路 12c 2 : Second attraction path
12c3:交點 12c 3 : Intersection
12d:開口部 12d: Opening
12e:外周吸引路 12e: Peripheral attraction path
12f:吸引路 12f: Attraction Road
13:分割預定線 13: Split the predetermined line
14:吸引源 14: Attraction source
15:器件 15: Devices
16:框體 16: Frame
16a:開口部 16a: Opening
16b:帶輪部 16b: Pulley part
17:膠帶 17: Tape
18:X軸移動工作台 18: X-axis moving table
18a:底板 18a: Base plate
18b:側板 18b: Side panels
18c:頂板 18c: Top plate
18d:空間 18d: Space
19:框架 19: Framework
20:X軸導軌 20: X-axis guide rail
20a:X軸線性標度尺 20a: X-axis linear scale
21:被加工物單元 21: Processing unit
22:X軸滾珠螺桿 22: X-axis ball screw
24:X軸脈衝馬達 24: X-axis pulse motor
26:X軸移動機構 26: X-axis moving mechanism
28:傳送帶 28: Conveyor belt
30:旋轉驅動源 30: Rotation drive source
30a:帶輪 30a: Pulley
32:Y軸移動機構 32: Y-axis moving mechanism
34:Y軸導軌 34:Y-axis guide rail
36:Y軸移動工作台 36: Y-axis moving worktable
38:Y軸滾珠螺桿 38: Y-axis ball screw
40:Y軸脈衝馬達 40:Y-axis pulse motor
42:Z軸移動機構 42: Z-axis moving mechanism
42a:支撐構造 42a: Support structure
44:Z軸導軌 44: Z-axis guide rail
46:Z軸移動板 46: Z-axis moving plate
48:Z軸滾珠螺桿 48: Z-axis ball screw
50:Z軸脈衝馬達 50: Z-axis pulse motor
52:支撐臂 52: Support arm
54:下方拍攝單元(第2拍攝單元) 54: Lower camera unit (second camera unit)
56:低倍率相機 56: Low magnification camera
56a:照明裝置 56a: Lighting device
58:高倍率相機 58: High magnification camera
58a:照明裝置 58a: Lighting device
60:加工單元移動機構 60: Processing unit moving mechanism
62:Y軸導軌 62:Y-axis guide rail
64:Y軸移動板 64: Y-axis moving plate
66:Y軸滾珠螺桿 66: Y-axis ball screw
68:Y軸脈衝馬達 68:Y-axis pulse motor
70:Z軸移動板 70: Z-axis moving plate
72:Z軸導軌 72: Z-axis guide rail
74:Z軸滾珠螺桿 74: Z-axis ball screw
76:Z軸脈衝馬達 76: Z-axis pulse motor
78:切削單元(加工單元) 78: Cutting unit (processing unit)
80:主軸殼體 80: Spindle housing
82a:主軸 82a: Main axis
82b:切削刀片 82b: Cutting blade
84:上方拍攝單元(第1拍攝單元) 84: Upper shooting unit (first shooting unit)
86:洗淨單元 86: Washing unit
88:洗淨工作台 88: Clean the workbench
90:噴嘴 90: Nozzle
92:觸控面板(顯示單元) 92: Touch panel (display unit)
94:控制部 94: Control Department
96:記憶部 96: Memory Department
98:標記 98:Mark
100:電路 100: Circuit
102,102a:圖像 102,102a:Image
104:雷射加工裝置(加工裝置) 104: Laser processing device (processing device)
106:靜止基台 106: Static abutment
108:Y軸移動工作台 108: Y-axis moving worktable
110:Y軸導軌 110:Y-axis guide rail
110a:Y軸標度尺 110a: Y-axis scale
112:Y軸滾珠螺桿 112: Y-axis ball screw
114:Y軸脈衝馬達 114:Y-axis pulse motor
116:Y軸移動機構 116: Y-axis moving mechanism
118:支柱 118: Pillar
120:罩殼 120: Shell
122:雷射照射單元(加工單元) 122: Laser irradiation unit (processing unit)
124:照射頭 124: Irradiation head
A:區域 A: Area
B,C,D:角部 B,C,D: Corners
+X,-X,+Y,-Y,+Z,-Z:方向 +X,-X,+Y,-Y,+Z,-Z: Direction
S10:載置步驟 S10: Loading step
S20:保持步驟 S20: Keep step
S30:教導步驟 S30: Teaching steps
S40:校準步驟 S40: Calibration step
S50:圖像取得步驟 S50: Image acquisition step
S60:記憶步驟 S60: Memory step
S70:切削步驟 S70: Cutting step
S80:背面顯示步驟 S80: Back display steps
圖1是切削裝置的立體圖。 Figure 1 is a three-dimensional diagram of the cutting device.
圖2是被加工物單元的立體圖。 Figure 2 is a three-dimensional diagram of the workpiece unit.
圖3是保持工作台等的立體圖。 Figure 3 is a three-dimensional diagram of the workbench, etc.
圖4是保持工作台等的局部截面側視圖。 Figure 4 is a partial cross-sectional side view of the holding table, etc.
圖5為圖4之區域A的放大圖。 Figure 5 is an enlarged view of area A in Figure 4.
圖6是Z軸移動機構等的放大立體圖。 Figure 6 is an enlarged three-dimensional diagram of the Z-axis moving mechanism, etc.
圖7是顯示切削步驟的圖。 Figure 7 is a diagram showing the cutting steps.
圖8是顯示背面顯示步驟的圖。 Figure 8 is a diagram showing the back display step.
圖9(A)是第1區域的圖像之一例,圖9(B)是第2區域的圖像之一例。 Figure 9(A) is an example of an image of the first area, and Figure 9(B) is an example of an image of the second area.
圖10是在背面顯示步驟中所顯示的圖像之一例。 Figure 10 is an example of an image displayed in the back display step.
圖11是在背面顯示步驟中所顯示的圖像的其他例。 FIG. 11 is another example of an image displayed in the back display step.
圖12是雷射加工裝置的立體圖。 Figure 12 is a three-dimensional diagram of the laser processing device.
參照附加圖式,說明本發明之一態樣的實施形態。圖1是第1實施形態之切削裝置2的立體圖。再者,在圖1中,是將構成要素的一部分以功能方塊圖來顯示。又,在以下的說明中所使用之X軸方向(加工進給方向)、Y軸方向(分度進給方向)及Z軸方向(鉛直方向、切入進給方向)是互相垂直的。 Referring to the attached drawings, an embodiment of the present invention is described. FIG. 1 is a perspective view of a cutting device 2 of the first embodiment. Furthermore, in FIG. 1, a part of the components is shown as a functional block diagram. In addition, the X-axis direction (machining feed direction), Y-axis direction (indexing feed direction) and Z-axis direction (lead vertical direction, cutting feed direction) used in the following description are perpendicular to each other.
切削裝置(加工裝置)2具備支撐各構成要素的基台4。於基台4之前方(+Y方向)的角部形成有開口4a,在此開口4a內設置有片匣升降機(未圖示)。在片匣升降機的上表面可載置用於容置複數個被加工物11(參照圖2)之片匣6。 The cutting device (processing device) 2 has a base 4 that supports each component. An opening 4a is formed at the front corner (+Y direction) of the base 4, and a film cassette elevator (not shown) is arranged in the opening 4a. A film cassette 6 for accommodating a plurality of workpieces 11 (see FIG. 2) can be placed on the upper surface of the film cassette elevator.
在圖1中,為了方便說明,僅顯示有片匣6的輪廓。被加工物11是例如以矽等的半導體材料所形成的圓盤狀的晶圓。但是,對被加工物11的材質、形狀、構造、大小等並無限制。也可以使用例如以其他的半導體、陶瓷、樹脂、金屬等的材料所形成之基板等作為被加工物11。 In FIG. 1 , for the sake of convenience, only the outline of the cassette 6 is shown. The workpiece 11 is a disc-shaped wafer formed of a semiconductor material such as silicon. However, there is no limitation on the material, shape, structure, size, etc. of the workpiece 11. For example, a substrate formed of other semiconductor, ceramic, resin, metal, etc. materials can also be used as the workpiece 11.
如圖2所示,被加工物11的正面11a側是藉由互相交叉的複數條分割預定線(切割道)13而區劃成複數個區域。在正面11a側的各區域中形成有IC(積 體電路,Integrated Circuit)等的器件15、校準標記(圖9(B)的標記98)等。但是,對於器件15的種類、數量、形狀、構造、大小、配置等也無限制。在被加工物11上亦可未形成有器件15。 As shown in FIG2 , the front side 11a of the workpiece 11 is divided into a plurality of regions by a plurality of intersecting predetermined dividing lines (cutting paths) 13. In each region on the front side 11a, components 15 such as IC (Integrated Circuit), calibration marks (mark 98 in FIG9 (B)), etc. are formed. However, there are no restrictions on the type, quantity, shape, structure, size, and configuration of the components 15. The workpiece 11 may not have components 15 formed thereon.
於被加工物11的正面11a側貼附有直徑比被加工物11更大的膠帶(切割膠帶)17。膠帶17是以可見光可穿透的透明材來形成。膠帶17具有例如基材層、及黏著層(糊層)之積層構造。 A tape (cutting tape) 17 having a larger diameter than the object 11 is attached to the front side 11a of the object 11. The tape 17 is formed of a transparent material that can transmit visible light. The tape 17 has a layered structure such as a base layer and an adhesive layer (paste layer).
基材層是以例如聚烯烴(PO)等所形成。黏著層是以例如紫外線(UV)硬化型之丙烯酸樹脂等的黏著性樹脂所形成。將此膠帶17的黏著層側貼附於正面11a側。 The base layer is formed of, for example, polyolefin (PO). The adhesive layer is formed of an adhesive resin such as an ultraviolet (UV) curable acrylic resin. The adhesive layer side of the tape 17 is attached to the front side 11a.
在膠帶17的外周部分,貼附並固定有以金屬所形成的環狀的框架19。像這樣,被加工物11是以透過膠帶17被框架19所支撐之被加工物單元21的狀態來容置到片匣6。圖2是被加工物單元21的立體圖。 A ring-shaped frame 19 formed of metal is attached and fixed to the outer periphery of the tape 17. In this way, the workpiece 11 is accommodated in the cassette 6 in the state of the workpiece unit 21 supported by the frame 19 through the tape 17. Figure 2 is a three-dimensional view of the workpiece unit 21.
如圖1所示,在開口4a的後方(-Y方向)形成有在X軸方向上較長的開口4b。在開口4b配置有保持工作台(工作夾台)10。在保持工作台10之外周部,設置有沿圓周方向離散地形成有吸引口之圓環狀的框架吸引板(未圖示)。 As shown in FIG1 , an opening 4b that is longer in the X-axis direction is formed behind the opening 4a (-Y direction). A holding table (work clamping table) 10 is arranged at the opening 4b. On the outer periphery of the holding table 10, a ring-shaped frame suction plate (not shown) with suction ports discretely formed in the circumferential direction is provided.
在此,參照圖3至圖5,更詳細地說明保持工作台10等。圖3是保持工作台10等的立體圖,圖4是保持工作台10等的局部截面側視圖。但是,在圖4中,為了方便而省略剖面線。圖5為圖4之區域A的放大圖。在圖5中,是將構成要素的一部分以功能方塊圖來顯示。 Here, referring to Figures 3 to 5, the holding table 10, etc. is described in more detail. Figure 3 is a three-dimensional view of the holding table 10, etc., and Figure 4 is a partial cross-sectional side view of the holding table 10, etc. However, in Figure 4, the section line is omitted for convenience. Figure 5 is an enlarged view of area A in Figure 4. In Figure 5, a part of the constituent elements is shown as a functional block diagram.
保持工作台10具有圓盤狀(板狀)的保持構件12。保持構件12包含大致平坦的一面12a、及與該一面12a位於相反側的另一面12b(參照圖5)。保持構件12是以鈉玻璃、硼矽酸玻璃、石英玻璃等之可見光可穿透的透明材所形成。 The holding table 10 has a disc-shaped (plate-shaped) holding member 12. The holding member 12 includes a substantially flat surface 12a and another surface 12b located on the opposite side of the surface 12a (see FIG. 5 ). The holding member 12 is formed of a transparent material that can transmit visible light, such as sodium glass, borosilicate glass, quartz glass, etc.
在保持構件12之內部形成有複數個流路。在本實施形態之保持構件12的內部,在從Z軸方向觀看保持構件12的情況下,以橫切圓盤的中心軸的形 式而形成有直線狀的第1吸引路12c1。又,以在XY平面方向上和第1吸引路12c1正交的態樣而形成有直線狀的第2吸引路12c2。 A plurality of flow paths are formed inside the holding member 12. Inside the holding member 12 of the present embodiment, a straight first suction path 12c 1 is formed in a manner that crosses the center axis of the disk when the holding member 12 is viewed from the Z axis direction. In addition, a straight second suction path 12c 2 is formed in a manner that is orthogonal to the first suction path 12c 1 in the XY plane direction.
第1吸引路12c1及第2吸引路12c2是在位於圓盤的中心軸的交點12c3上相交且互相連接。在一面12a的外周部,以於圓周方向上互相分開的方式形成有複數個開口部12d。各開口部12d是從一面12a形成到未到達另一面12b之預定的深度。 The first suction passage 12c1 and the second suction passage 12c2 intersect and are connected to each other at the intersection 12c3 located at the central axis of the disk. A plurality of openings 12d are formed on the outer periphery of one surface 12a in a manner separated from each other in the circumferential direction. Each opening 12d is formed from one surface 12a to a predetermined depth that does not reach the other surface 12b.
在第1吸引路12c1的兩端部、與第2吸引路12c2的兩端部各自形成有開口部12d。各開口部12d是藉由形成於保持構件12的外周部之預定的深度的外周吸引路12e,而在圓周方向上連接。 Openings 12d are formed at both ends of the first suction passage 12c1 and both ends of the second suction passage 12c2 . The openings 12d are connected in the circumferential direction by an outer peripheral suction passage 12e formed at a predetermined depth on the outer peripheral portion of the holding member 12.
在開口部12d之外周側形成有朝保持構件12的徑方向延伸之吸引路12f,且於吸引路12f連接有噴射器等之吸引源14(參照圖5)。當使吸引源14動作而產生負壓時,在開口部12d會產生負壓。因此,一面12a是作為吸引並保持被加工物單元21(被加工物11)的保持面而發揮功能。 A suction path 12f extending in the radial direction of the holding member 12 is formed on the outer peripheral side of the opening 12d, and a suction source 14 such as an ejector is connected to the suction path 12f (see FIG. 5 ). When the suction source 14 is operated to generate negative pressure, negative pressure is generated in the opening 12d. Therefore, one side 12a functions as a holding surface for attracting and holding the workpiece unit 21 (workpiece 11).
然而,入射之光的一部分會在第1吸引路12c1、第2吸引路12c2、開口部12d、外周吸引路12e、吸引路12f等之保持構件12的流路上散射或反射。因此,保持構件12的流路在從一面12a或另一面12b觀看的情況下,並非完全地對可見光透明,而是有具有透光性的情況或不透明的情況。 However, a part of the incident light is scattered or reflected on the flow path of the holding member 12 such as the first suction path 12c 1 , the second suction path 12c 2 , the opening 12d, the peripheral suction path 12e, and the suction path 12f. Therefore, the flow path of the holding member 12 is not completely transparent to visible light when viewed from one surface 12a or the other surface 12b, but may be translucent or opaque.
但是,將保持構件12之流路除外的預定區域則是從一面12a到另一面12b都是透明的。具體而言,從一面12a到另一面12b透明之區域為:被第1吸引路12c1及第2吸引路12c2分割成4個,且在保持構件12的徑方向上位於比外周吸引路12e更內側的區域。 However, the predetermined area excluding the flow path of the holding member 12 is transparent from one side 12a to the other side 12b. Specifically, the transparent area from one side 12a to the other side 12b is divided into four by the first suction path 12c1 and the second suction path 12c2 , and is located further inside the peripheral suction path 12e in the radial direction of the holding member 12.
在保持構件12的外周設有以不鏽鋼等金屬材料所形成之圓筒狀的框體16。在框體16的上部形成有開口部16a(參照圖5),保持構件12是配置成將此開口部16a堵塞。 A cylindrical frame 16 made of a metal material such as stainless steel is provided on the outer periphery of the retaining member 12. An opening 16a (see FIG. 5 ) is formed on the upper portion of the frame 16, and the retaining member 12 is configured to block the opening 16a.
如圖3及圖4所示,框體16是受到X軸移動工作台18所支撐。X軸移動工作台18包含從Z軸方向所觀看到的形狀為長方形之底板18a。在底板18a之前方(+Y方向)的一端,連接有從Y軸方向所觀看到的形狀為長方形之側板18b的下端。 As shown in Figures 3 and 4, the frame 16 is supported by the X-axis moving table 18. The X-axis moving table 18 includes a bottom plate 18a having a rectangular shape when viewed from the Z-axis direction. The lower end of the side plate 18b having a rectangular shape when viewed from the Y-axis direction is connected to one end in front of the bottom plate 18a (in the +Y direction).
在側板18b的上端連接有從Z軸方向所觀看到的形狀為與底板18a相同的長方形之頂板18c的前方的一端。在底板18a與頂板18c之間形成有朝後方(-Y方向)的一端及X軸方向的兩端開放的空間18d。 The upper end of the side plate 18b is connected to the front end of the top plate 18c, which is a rectangular shape similar to the bottom plate 18a when viewed from the Z axis direction. A space 18d is formed between the bottom plate 18a and the top plate 18c, which is open to one end toward the rear (-Y direction) and both ends in the X axis direction.
在底板18a之下方(-Z方向)以可使底板18a滑動的態樣而設置有在X軸方向上大致平行的一對X軸導軌20。一對X軸導軌20是固定於靜止基台(未圖示)的上表面。 A pair of X-axis guide rails 20 are provided below the bottom plate 18a (-Z direction) so that the bottom plate 18a can slide. The pair of X-axis guide rails 20 are fixed to the upper surface of a stationary base (not shown).
在相鄰於X軸導軌20的位置設置有可在檢測X軸移動工作台18之X軸方向的位置時使用的X軸線性標度尺20a。又,在X軸移動工作台18的下表面側設有讀取頭(未圖示)。 An X-axis linear scale 20a is provided adjacent to the X-axis guide rail 20 and can be used to detect the position of the X-axis moving table 18 in the X-axis direction. In addition, a reading head (not shown) is provided on the lower surface of the X-axis moving table 18.
在X軸移動工作台18的移動時,可藉由以讀取頭來檢測X軸線性標度尺20a的刻度,而計算X軸移動工作台18之X軸方向的位置(座標)、或X軸方向的移動量。 When the X-axis moving table 18 moves, the scale of the X-axis linear scale 20a can be detected by a reading head to calculate the position (coordinate) of the X-axis moving table 18 in the X-axis direction or the amount of movement in the X-axis direction.
在X軸移動工作台18的底板18a的下表面側設置有螺帽部(未圖示),且在此螺帽部以可旋轉的態樣連結有大致平行於X軸導軌20之X軸滾珠螺桿22。 A nut portion (not shown) is provided on the lower surface of the bottom plate 18a of the X-axis moving worktable 18, and an X-axis ball screw 22 roughly parallel to the X-axis guide rail 20 is rotatably connected to the nut portion.
在X軸滾珠螺桿22的一端部連結有X軸脈衝馬達24。只要以X軸脈衝馬達24使X軸滾珠螺桿22旋轉,X軸移動工作台18即可沿著X軸導軌20在X軸方向上移動。X軸導軌20、X軸滾珠螺桿22、X軸脈衝馬達24等是構成使X軸移動工作台18移動的X軸移動機構26。 An X-axis pulse motor 24 is connected to one end of the X-axis ball screw 22. As long as the X-axis pulse motor 24 rotates the X-axis ball screw 22, the X-axis moving table 18 can move in the X-axis direction along the X-axis guide rail 20. The X-axis guide rail 20, the X-axis ball screw 22, the X-axis pulse motor 24, etc. constitute the X-axis moving mechanism 26 that moves the X-axis moving table 18.
在X軸移動工作台18的頂板18c的上表面側,是將框體16以可繞著 與Z軸方向大致平行的旋轉軸的方式旋轉的態樣來支撐於頂板18c。框體16包含圓筒狀的側面即帶輪部16b。在框體16已被X軸移動工作台18所支撐的情況下,帶輪部16b位於比頂板18c更上方。 On the upper surface side of the top plate 18c of the X-axis moving table 18, the frame 16 is supported on the top plate 18c in a manner that it can rotate around a rotation axis that is roughly parallel to the Z-axis direction. The frame 16 includes a cylindrical side surface, that is, a pulley portion 16b. When the frame 16 is supported by the X-axis moving table 18, the pulley portion 16b is located above the top plate 18c.
在X軸移動工作台18的側板18b設置有馬達等之旋轉驅動源30。在旋轉驅動源30的旋轉軸設置有帶輪30a。於帶輪30a及帶輪部16b上掛設有1個旋轉無端傳送帶(傳送帶28)。 A rotational drive source 30 such as a motor is provided on the side plate 18b of the X-axis moving table 18. A pulley 30a is provided on the rotating shaft of the rotational drive source 30. A rotating endless conveyor belt (conveyor belt 28) is hung on the pulley 30a and the pulley portion 16b.
若使旋轉驅動源30動作來使帶輪30a旋轉,框體16會藉由透過傳送帶28所傳達之力,而以繞著與Z軸方向大致平行的旋轉軸的方式來旋轉。藉由控制帶輪30a之旋轉,可以讓保持工作台10以繞著旋轉軸的方式旋轉相當於任意的角度。 If the rotary drive source 30 is operated to rotate the pulley 30a, the frame 16 will rotate around the rotation axis roughly parallel to the Z-axis direction by the force transmitted through the conveyor belt 28. By controlling the rotation of the pulley 30a, the holding table 10 can be rotated around the rotation axis to an arbitrary angle.
在X軸移動機構26之X軸方向的延長線上設置有Y軸移動機構32。Y軸移動機構32具備有大致平行於Y軸方向的一對Y軸導軌34。一對Y軸導軌34是固定於靜止基台(未圖示)的上表面。 A Y-axis moving mechanism 32 is provided on the extension line of the X-axis direction of the X-axis moving mechanism 26. The Y-axis moving mechanism 32 has a pair of Y-axis guide rails 34 roughly parallel to the Y-axis direction. The pair of Y-axis guide rails 34 are fixed to the upper surface of the stationary base (not shown).
在Y軸導軌34上,可滑動地安裝有Y軸移動工作台36。在Y軸移動工作台36的下表面側設有螺帽部(未圖示),在此螺帽部以可旋轉的態樣連結有大致平行於Y軸導軌34之Y軸滾珠螺桿38。 A Y-axis moving table 36 is slidably mounted on the Y-axis guide rail 34. A nut portion (not shown) is provided on the lower surface of the Y-axis moving table 36, and a Y-axis ball screw 38 roughly parallel to the Y-axis guide rail 34 is rotatably connected to the nut portion.
在Y軸滾珠螺桿38的一端部連結有Y軸脈衝馬達40。只要以Y軸脈衝馬達40使Y軸滾珠螺桿38旋轉,Y軸移動工作台36即沿著Y軸導軌34在Y軸方向上移動。 A Y-axis pulse motor 40 is connected to one end of the Y-axis ball screw 38. As long as the Y-axis pulse motor 40 rotates the Y-axis ball screw 38, the Y-axis moving table 36 moves along the Y-axis guide rail 34 in the Y-axis direction.
在相鄰於Y軸導軌34的位置上設置有可在檢測Y軸移動工作台36之Y軸方向的位置時使用的Y軸線性標度尺(未圖示)。又,在Y軸移動工作台36的下表面側設有讀取頭(未圖示)。 A Y-axis linear scale (not shown) is provided adjacent to the Y-axis guide rail 34 and can be used to detect the position of the Y-axis moving table 36 in the Y-axis direction. In addition, a reading head (not shown) is provided on the lower surface of the Y-axis moving table 36.
在Y軸移動工作台36的移動時,可藉由以讀取頭來檢測Y軸線性標度尺的刻度,而計算Y軸移動工作台36的Y軸方向的位置(座標)、或Y軸方向的移 動量。 When the Y-axis moving table 36 moves, the Y-axis position (coordinate) or the Y-axis movement amount of the Y-axis moving table 36 can be calculated by detecting the scale of the Y-axis linear scale with a reading head.
在Y軸移動工作台36的上表面設置有Z軸移動機構42。圖6是Z軸移動機構42等的放大立體圖。Z軸移動機構42具有固定於Y軸移動工作台36的上表面之支撐構造42a。 A Z-axis moving mechanism 42 is provided on the upper surface of the Y-axis moving table 36. FIG. 6 is an enlarged three-dimensional view of the Z-axis moving mechanism 42, etc. The Z-axis moving mechanism 42 has a supporting structure 42a fixed to the upper surface of the Y-axis moving table 36.
在支撐構造42a的X軸移動工作台18側的側面,固定有大致平行於Z軸方向的一對Z軸導軌44。在Z軸導軌44上可滑動地安裝有Z軸移動板46。 A pair of Z-axis guide rails 44 roughly parallel to the Z-axis direction are fixed on the side surface of the X-axis moving worktable 18 of the support structure 42a. A Z-axis moving plate 46 is slidably mounted on the Z-axis guide rails 44.
在Z軸移動板46的側面的Z軸導軌44側設置有螺帽部(未圖示),且在此螺帽部以可旋轉的態樣連結有大致平行於Z軸導軌44之Z軸滾珠螺桿48。 A nut portion (not shown) is provided on the side of the Z-axis guide rail 44 on the side of the Z-axis moving plate 46, and a Z-axis ball screw 48 roughly parallel to the Z-axis guide rail 44 is rotatably connected to the nut portion.
在Z軸滾珠螺桿48的一端部連結有Z軸脈衝馬達50。只要以Z軸脈衝馬達50使Z軸滾珠螺桿48旋轉,Z軸移動板46即沿著Z軸導軌44在Z軸方向上移動。 A Z-axis pulse motor 50 is connected to one end of the Z-axis ball screw 48. As long as the Z-axis pulse motor 50 rotates the Z-axis ball screw 48, the Z-axis moving plate 46 moves along the Z-axis guide rail 44 in the Z-axis direction.
在相鄰於Z軸導軌44的位置上設置有Z軸線性標度尺(未圖示),且在Z軸移動板46的Z軸導軌44側設置有讀取頭(未圖示)。在Z軸移動板46的移動時,可藉由以讀取頭來檢測Z軸線性標度尺的刻度,而計算Z軸移動板46的Z軸方向的位置(座標)等。 A Z-axis linear scale (not shown) is provided adjacent to the Z-axis guide rail 44, and a reading head (not shown) is provided on the Z-axis guide rail 44 side of the Z-axis moving plate 46. When the Z-axis moving plate 46 moves, the reading head can be used to detect the scale of the Z-axis linear scale and calculate the position (coordinates) of the Z-axis moving plate 46 in the Z-axis direction.
在Z軸移動板46上,透過在X軸方向上較長的支撐臂52而固定有下方拍攝單元(第2拍攝單元)54。本實施形態的下方拍攝單元54是配置在比保持工作台10更下方,且包含低倍率相機56與高倍率相機58,前述低倍率相機56與高倍率相機58各自將拍攝透鏡等設置成與保持構件12的另一面12b相向。 On the Z-axis moving plate 46, a lower photographing unit (second photographing unit) 54 is fixed via a supporting arm 52 that is longer in the X-axis direction. The lower photographing unit 54 of this embodiment is arranged below the holding table 10 and includes a low-magnification camera 56 and a high-magnification camera 58. The low-magnification camera 56 and the high-magnification camera 58 each have a photographing lens and the like arranged to face the other surface 12b of the holding member 12.
但是,下方拍攝單元54亦可不具有低倍率相機56及高倍率相機58之2個相機。下方拍攝單元54亦可僅具有1個預定的倍率之相機。 However, the lower shooting unit 54 may not have two cameras, the low-magnification camera 56 and the high-magnification camera 58. The lower shooting unit 54 may also have only one camera with a predetermined magnification.
低倍率相機56及高倍率相機58的每一個具有預定的光學系統、與CCD(電荷耦合器件,Charge-Coupled Device)影像感測器或CMOS(互補式金屬氧化物半導體,Complementary Metal-Oxide-Semiconductor)影像感測器等之拍攝元 件。 Each of the low-magnification camera 56 and the high-magnification camera 58 has a predetermined optical system and a photographing element such as a CCD (Charge-Coupled Device) image sensor or a CMOS (Complementary Metal-Oxide-Semiconductor) image sensor.
在低倍率相機56之側邊,設置有可對位於上方之被攝體(例如被加工物11)照射可見光之照明裝置56a。同樣地,在高倍率相機58之側邊也設置有照明裝置58a。 On the side of the low-magnification camera 56, there is an illumination device 56a that can illuminate the object (such as the object 11) located above with visible light. Similarly, on the side of the high-magnification camera 58, there is also an illumination device 58a.
在以下方拍攝單元54拍攝被攝體的情況下,是使X軸移動工作台18朝Y軸移動工作台36側移動,而將下方拍攝單元54配置到空間18d。藉此,可以從下方拍攝配置於保持構件12的一面12a側之被加工物11。 When the lower shooting unit 54 is used to shoot the object, the X-axis moving table 18 is moved toward the Y-axis moving table 36, and the lower shooting unit 54 is arranged in the space 18d. In this way, the object 11 arranged on the side 12a of the holding member 12 can be photographed from below.
接著,返回到圖1,針對切削裝置2的其他構成要素進行說明。在比X軸移動工作台18的頂板18c更左邊(+X方向)及右邊(-X方向),以覆蓋開口4b的態樣而安裝有伸縮自如之蛇腹狀的防塵防滴蓋。 Next, returning to Figure 1, the other components of the cutting device 2 are described. On the left (+X direction) and right (-X direction) of the top plate 18c of the X-axis moving table 18, a retractable bellows-shaped dust and drip-proof cover is installed to cover the opening 4b.
在開口4b的上方,以跨越開口4b的方式設有門型的支撐構造4c。在支撐構造4c的側面當中於朝開口4a側的一個側面上設置有2個加工單元移動機構(分度進給單元、切入進給單元)60。 Above the opening 4b, a door-shaped support structure 4c is provided in a manner that spans the opening 4b. Two processing unit moving mechanisms (indexing feed unit, cutting feed unit) 60 are provided on one side of the side of the support structure 4c that faces the opening 4a.
各個加工單元移動機構60是固定於支撐構造4c的一個側面且共有大致平行於Y軸方向的一對Y軸導軌62。在Y軸導軌62上,以可互相獨立地滑動的態樣安裝有2個Y軸移動板64。 Each processing unit moving mechanism 60 is fixed to a side surface of the supporting structure 4c and has a pair of Y-axis guide rails 62 roughly parallel to the Y-axis direction. Two Y-axis moving plates 64 are installed on the Y-axis guide rails 62 so as to slide independently of each other.
在Y軸移動板64的位於支撐構造4c側的一面,設置有螺帽部(未圖示),且在此螺帽部以可旋轉的態樣連結有大致平行於Y軸導軌62之Y軸滾珠螺桿66。再者,位於前方側之Y軸移動板64的螺帽部、及位於後方側之Y軸移動板64的螺帽部是分別連結於不同的Y軸滾珠螺桿66。 A nut portion (not shown) is provided on one side of the Y-axis moving plate 64 located on the supporting structure 4c side, and a Y-axis ball screw 66 roughly parallel to the Y-axis guide rail 62 is rotatably connected to the nut portion. Furthermore, the nut portion of the Y-axis moving plate 64 located on the front side and the nut portion of the Y-axis moving plate 64 located on the rear side are respectively connected to different Y-axis ball screws 66.
在各Y軸滾珠螺桿66的一端部連結有Y軸脈衝馬達68。只要以Y軸脈衝馬達68使Y軸滾珠螺桿66旋轉,Y軸移動板64即沿著Y軸導軌62在Y軸方向上移動。 A Y-axis pulse motor 68 is connected to one end of each Y-axis ball screw 66. As long as the Y-axis pulse motor 68 rotates the Y-axis ball screw 66, the Y-axis moving plate 64 moves in the Y-axis direction along the Y-axis guide rail 62.
在各Y軸移動板64之位於與支撐構造4c為相反側的另一面上,分 別設置有在大致平行於Z軸方向的一對Z軸導軌72。在Z軸導軌72上可滑動地安裝有Z軸移動板70。 On the other side of each Y-axis moving plate 64, which is located on the opposite side to the supporting structure 4c, a pair of Z-axis guide rails 72 are respectively provided in a direction roughly parallel to the Z-axis direction. The Z-axis moving plate 70 is slidably mounted on the Z-axis guide rails 72.
在Z軸移動板70的位於支撐構造4c側的一面,設置有螺帽部(未圖示),且在此螺帽部以可旋轉的態樣連結有平行於Z軸導軌72之Z軸滾珠螺桿74。 A nut portion (not shown) is provided on one side of the Z-axis moving plate 70 located on the supporting structure 4c side, and a Z-axis ball screw 74 parallel to the Z-axis guide rail 72 is rotatably connected to the nut portion.
在Z軸滾珠螺桿74的一端部連結有Z軸脈衝馬達76。只要以Z軸脈衝馬達76使Z軸滾珠螺桿74旋轉,Z軸移動板70即沿著Z軸導軌72在Z軸方向上移動。 A Z-axis pulse motor 76 is connected to one end of the Z-axis ball screw 74. As long as the Z-axis pulse motor 76 rotates the Z-axis ball screw 74, the Z-axis moving plate 70 moves along the Z-axis guide rail 72 in the Z-axis direction.
在Z軸移動板70的下部設置有切削單元(加工單元)78。切削單元78具備有筒狀的主軸殼體80。在主軸殼體80內,以可旋轉的態樣容置有圓柱狀的主軸82a(參照圖7)的一部分。 A cutting unit (processing unit) 78 is provided at the lower part of the Z-axis moving plate 70. The cutting unit 78 has a cylindrical spindle housing 80. A part of a cylindrical spindle 82a (see FIG. 7 ) is rotatably accommodated in the spindle housing 80.
在主軸82a的一端連結有使主軸82a旋轉之伺服馬達等的旋轉驅動機構(未圖示)。又,在主軸82a的另一端裝設有具有圓環狀的切刃的切削刀片82b。 A rotation drive mechanism (not shown) such as a servo motor that rotates the spindle 82a is connected to one end of the spindle 82a. In addition, a cutting blade 82b having a circular cutting edge is installed at the other end of the spindle 82a.
在Z軸移動板70的下部,以相鄰於切削單元78的態樣連結有上方拍攝單元(第1拍攝單元)84。上方拍攝單元84是位於保持工作台10的上方,且將拍攝透鏡等設置成與保持構件12的一面12a相向。上方拍攝單元84具有用於從上方拍攝被加工物11之預定的光學系統、及CCD影像感測器或CMOS影像感測器等的拍攝元件。 At the lower part of the Z-axis moving plate 70, an upper photographing unit (first photographing unit) 84 is connected in a state adjacent to the cutting unit 78. The upper photographing unit 84 is located above the holding table 10, and the photographing lens and the like are arranged to face the one side 12a of the holding member 12. The upper photographing unit 84 has a predetermined optical system for photographing the workpiece 11 from above, and photographing elements such as a CCD image sensor or a CMOS image sensor.
在相對於開口4b而在與開口4a為相反側的位置上,設置有開口4d。在開口4d內設有用於將切削後的被加工物11等洗淨的洗淨單元86。洗淨單元86包含保持被加工物11的洗淨工作台88,及將噴射口配置成相向於洗淨工作台88的噴嘴90。 An opening 4d is provided at a position opposite to the opening 4b and on the opposite side to the opening 4a. A cleaning unit 86 for cleaning the workpiece 11 after cutting is provided in the opening 4d. The cleaning unit 86 includes a cleaning table 88 for holding the workpiece 11 and a nozzle 90 with a nozzle disposed facing the cleaning table 88.
在基台4上設置有未圖示之箱體,在箱體的前方的側面設置有兼作為輸入裝置與顯示裝置的觸控面板(顯示單元)92。於觸控面板92可顯示以下方拍攝單元54及上方拍攝單元84所拍攝到的圖像、加工條件、GUI(圖形使用者介面, Graphical User Interface)的按鈕等。 A box (not shown) is provided on the base 4, and a touch panel (display unit) 92 serving as both an input device and a display device is provided on the front side of the box. The touch panel 92 can display images captured by the lower shooting unit 54 and the upper shooting unit 84, processing conditions, GUI (Graphical User Interface) buttons, etc.
切削裝置2具備控制部94。控制部94會控制吸引源14、X軸移動機構26、旋轉驅動源30、Y軸移動機構32、Z軸移動機構42、下方拍攝單元54、加工單元移動機構60、上方拍攝單元84、切削單元78、觸控面板92等。 The cutting device 2 is equipped with a control unit 94. The control unit 94 controls the suction source 14, the X-axis moving mechanism 26, the rotation drive source 30, the Y-axis moving mechanism 32, the Z-axis moving mechanism 42, the lower shooting unit 54, the processing unit moving mechanism 60, the upper shooting unit 84, the cutting unit 78, the touch panel 92, etc.
控制部94是藉由包含例如CPU(中央處理單元,Central Processing Unit)等之處理裝置、DRAM(動態隨機存取記憶體,Dynamic Random Access Memory)等之主記憶裝置、快閃記憶體、硬碟驅動機等之輔助記憶裝置的電腦而構成。可藉由依照記憶於輔助記憶裝置的軟體且使處理裝置等動作,來實現控制部94的功能。 The control unit 94 is composed of a computer including a processing device such as a CPU (Central Processing Unit), a main memory device such as a DRAM (Dynamic Random Access Memory), and an auxiliary memory device such as a flash memory and a hard disk drive. The functions of the control unit 94 can be realized by operating the processing device and the like according to the software stored in the auxiliary memory device.
輔助記憶裝置的一部分是作為記憶部96而發揮功能。在記憶部96中記憶有進行型樣匹配等之圖像處理的軟體。例如,可利用進行圖像處理的軟體,從以下方拍攝單元54所拍攝到之正面11a側的圖像提取出形成於正面11a側的預定的型樣。 A part of the auxiliary memory device functions as a memory unit 96. The memory unit 96 stores image processing software such as pattern matching. For example, the image processing software can be used to extract a predetermined pattern formed on the front side 11a from an image of the front side 11a captured by the lower shooting unit 54.
預定的型樣是例如分割預定線13、器件15、標記98、及電路100(參照圖9(B)等)的輪廓。再者,標記98有時也被稱為校準標記、主要型樣、目標型樣等。 The predetermined pattern is, for example, the outline of the predetermined dividing line 13, the device 15, the mark 98, and the circuit 100 (see FIG. 9(B) etc.). Furthermore, the mark 98 is sometimes also referred to as a calibration mark, a main pattern, a target pattern, etc.
接著,利用圖7至圖10,針對被加工物11的加工方法進行說明。首先,將被加工物單元21以背面11b側露出於上方之態樣載置在保持工作台10的一面12a(載置步驟S10)。 Next, the processing method of the workpiece 11 is described using Figures 7 to 10. First, the workpiece unit 21 is placed on one side 12a of the holding table 10 with the back side 11b exposed upward (placement step S10).
在載置步驟S10後,使吸引源14動作,而以一面12a隔著膠帶17來保持被加工物11的正面11a側,並以框架吸引板(未圖示)保持框架19(保持步驟S20)。在保持步驟S20後,進行教導步驟S30。 After the loading step S10, the suction source 14 is operated to hold the front side 11a of the workpiece 11 with one surface 12a through the tape 17, and the frame 19 is held with the frame suction plate (not shown) (holding step S20). After the holding step S20, the teaching step S30 is performed.
在教導步驟S30中,是例如以使用下方拍攝單元54使正面11a側顯示於觸控面板92的狀態,來讓作業人員搜尋正面11a側的標記98(參照圖9(B)等)。 In the teaching step S30, for example, the front side 11a is displayed on the touch panel 92 using the lower camera unit 54, so that the operator can search for the mark 98 on the front side 11a (see FIG. 9 (B) etc.).
作業人員在發現到任意的標記98後,以下方拍攝單元54取得包含該標記98的正面11a側的圖像。標記98的形狀、座標等可作為型樣匹配的模板而記憶於記憶部96。又,可將利用標記98及分割預定線13的座標等而計算出之標記98與分割預定線13的中心線之間的距離記憶於記憶部96。 After the operator finds any mark 98, the operator obtains an image of the front side 11a including the mark 98 with the bottom shooting unit 54. The shape and coordinates of the mark 98 can be stored in the memory unit 96 as a template for pattern matching. In addition, the distance between the mark 98 and the center line of the predetermined dividing line 13 calculated using the coordinates of the mark 98 and the predetermined dividing line 13 can be stored in the memory unit 96.
除此之外,還可將利用標記98的座標等而計算出的在Y軸方向上相鄰的2條分割預定線13的距離(切割道間距)記憶於記憶部96。再者,所記憶之各座標是以上述之交點12c3為原點的XY座標。 In addition, the distance between two adjacent predetermined dividing lines 13 in the Y-axis direction (cutting path spacing) calculated using the coordinates of the mark 98 can also be stored in the memory unit 96. Furthermore, each stored coordinate is an XY coordinate with the above-mentioned intersection 12c3 as the origin.
在教導步驟S30後,進行被加工物11的校準(校準步驟S40)。在校準步驟S40中,首先是利用下方拍攝單元54在沿著X軸方向的1條分割預定線13上的相互分開的複數處取得正面11a側的圖像。 After the teaching step S30, the workpiece 11 is calibrated (calibration step S40). In the calibration step S40, the lower shooting unit 54 is first used to obtain images of the front side 11a at multiple locations separated from each other on a predetermined dividing line 13 along the X-axis direction.
並且,在複數處所取得的正面11a側的圖像中,可藉由型樣匹配等之預定的處理,來檢測與已記憶為模板之標記98相同的型樣。依據與所檢測出的標記98相同的型樣,可特定出分割預定線13在繞保持構件12的中心軸的θ方向之偏移。 Furthermore, in the images of the front side 11a obtained at multiple locations, the same pattern as the mark 98 stored as a template can be detected by predetermined processing such as pattern matching. Based on the same pattern as the detected mark 98, the deviation of the predetermined dividing line 13 in the θ direction around the central axis of the retaining member 12 can be identified.
之後,藉由使旋轉驅動源30動作,而使傳送帶28旋轉相當於預定量,來補正保持構件12的θ方向之偏移。藉此,將分割預定線13定位成與X軸方向大致平行。再者,在校準步驟S40中,亦可進行θ方向的補正以外之預定的處理、操作等。 Afterwards, by operating the rotation drive source 30, the conveyor belt 28 rotates by a predetermined amount to correct the deviation of the holding member 12 in the θ direction. In this way, the predetermined dividing line 13 is positioned to be roughly parallel to the X-axis direction. Furthermore, in the calibration step S40, predetermined processing and operations other than the correction in the θ direction can also be performed.
在校準步驟S40後,藉由以下方拍攝單元54拍攝正面11a側已被保持工作台10保持之被加工物11的正面11a側的大致整體,來取得正面11a側的圖像(圖像取得步驟S50)。 After the calibration step S40, the image of the front side 11a is obtained by photographing the front side 11a of the workpiece 11 held by the holding table 10 with the lower photographing unit 54 (image acquisition step S50).
在圖像取得步驟S50中,是利用X軸移動機構26、Y軸移動機構32等,來一邊調整保持工作台10及下方拍攝單元54的相對位置一邊對正面11a側進行拍攝。但是,在圖像取得步驟S50中,亦可並非對正面11a側的整體進行拍攝。 In the image acquisition step S50, the X-axis moving mechanism 26, the Y-axis moving mechanism 32, etc. are used to adjust the relative position of the holding table 10 and the lower shooting unit 54 while shooting the front side 11a. However, in the image acquisition step S50, the entire front side 11a may not be shot.
亦即,亦可在形成有器件15的器件區域、與包圍器件區域的外周部之外周剩餘區域當中,僅取得器件區域的整體的圖像、或器件區域當中包含有標記98的區域的圖像。若將拍攝區設為是限定的,即可以縮短在圖像取得步驟S50所需要的時間。 That is, it is also possible to obtain only the overall image of the device area or the image of the area including the mark 98 in the device area, from the device area where the device 15 is formed and the peripheral remaining area surrounding the device area. If the shooting area is set to be limited, the time required for the image acquisition step S50 can be shortened.
在圖像取得步驟S50後,首先,控制部94會進行圖像處理,並檢測所取得之圖像的邊緣。接著,控制部94是藉由型樣匹配等之預定的處理,而計算以邊緣所規定之幾何形狀、及與事先登錄的幾何形狀之一致性程度,藉此來提取出形成於正面11a側之預定的型樣。 After the image acquisition step S50, the control unit 94 first performs image processing and detects the edge of the acquired image. Then, the control unit 94 calculates the geometric shape specified by the edge and the degree of consistency with the pre-registered geometric shape through predetermined processing such as pattern matching, thereby extracting the predetermined pattern formed on the front side 11a.
可將已提取出的預定的型樣、該預定的型樣之位置資訊等記憶於記憶部96(記憶步驟S60)。例如,在使用於圖9(B)等所示的標記98來作為預定的型樣的情況下,可將標記98的形狀、及標記98之位於分割預定線13側的角部B、C、D等的座標記憶於記憶部96。 The extracted predetermined pattern, the position information of the predetermined pattern, etc. can be stored in the memory unit 96 (storage step S60). For example, when the marker 98 shown in FIG. 9 (B) is used as the predetermined pattern, the shape of the marker 98 and the coordinates of the corners B, C, D, etc. of the marker 98 located on the side of the predetermined dividing line 13 can be stored in the memory unit 96.
此時,可將已相對於標記98事先決定有相對的位置關係之分割預定線13、器件15及電路100的至少任一個的座標也記憶於記憶部。 At this time, the coordinates of at least one of the predetermined dividing line 13, the device 15, and the circuit 100 that have been predetermined to have a relative positional relationship with respect to the mark 98 can also be stored in the memory unit.
正面11a側的圖像是以設為例如和從背面11b側觀看的情況下(亦即,對被加工物11進行上表面觀看的情況下)之X及Y軸方向的方向相同的狀態,在記憶步驟S60中記憶於記憶部96。 The image of the front side 11a is stored in the storage unit 96 in the storage step S60 in a state where the X and Y axis directions are the same as when viewed from the back side 11b (i.e., when the workpiece 11 is viewed from the top surface).
再者,為了將正面11a側的圖像之X及Y軸方向的方向設為與背面11b側的圖像相同的方向,只要例如控制部94對正面11a側的圖像施行預定的座標轉換(例如,使圖像相對於X軸翻轉之鏡像轉換)即可。預定的座標轉換可藉由例如已記憶於控制部94之預定的軟體來進行。 Furthermore, in order to set the X and Y axis directions of the image on the front side 11a to the same direction as the image on the back side 11b, for example, the control unit 94 can perform a predetermined coordinate conversion (for example, a mirror conversion that flips the image relative to the X axis) on the image on the front side 11a. The predetermined coordinate conversion can be performed by, for example, predetermined software that has been stored in the control unit 94.
又,亦可取代施行預定的座標轉換,而藉由透過以XZ平面相對於X軸傾斜了45度的鏡面來拍攝正面11a側,來取得相對於X軸作了鏡像轉換之正面11a側的圖像。 Furthermore, instead of performing the predetermined coordinate conversion, the front side 11a can be photographed through a mirror that is tilted 45 degrees relative to the X-axis in the XZ plane to obtain an image of the front side 11a that has been mirror-converted relative to the X-axis.
在將下方拍攝單元54之拍攝透鏡(未圖示)設置成與另一面12b相向的本實施形態中,可將以XZ平面相對於X軸傾斜了45度的鏡面設置在例如下方拍攝單元54的拍攝透鏡與拍攝元件(未圖示)之間的預定的位置。取而代之,亦可將該傾斜之鏡面設置在:設置成與另一面12b相向的蓋玻璃(cover glass)(未圖示)、與將光軸沿著X軸方向來配置的拍攝透鏡之間。 In the present embodiment in which the photographing lens (not shown) of the lower photographing unit 54 is arranged to face the other surface 12b, a mirror surface tilted 45 degrees relative to the X-axis in the XZ plane can be arranged at a predetermined position between the photographing lens of the lower photographing unit 54 and the photographing element (not shown). Alternatively, the tilted mirror surface can be arranged between a cover glass (not shown) arranged to face the other surface 12b and a photographing lens arranged with the optical axis along the X-axis direction.
再者,以XZ平面相對於X軸傾斜了45度的鏡面,亦可在已將相對於下方拍攝單元54的位置固定之狀態下設置於下方拍攝單元54的外部。在此情況下,是將下方拍攝單元54的拍攝透鏡之光軸以朝向該鏡面的方式來沿著X軸方向e置。 Furthermore, the mirror surface that is tilted 45 degrees relative to the X-axis in the XZ plane can also be set outside the lower shooting unit 54 in a state where the position relative to the lower shooting unit 54 has been fixed. In this case, the optical axis of the shooting lens of the lower shooting unit 54 is set along the X-axis direction in a manner facing the mirror surface.
正面11a側之任意的XY座標位置可將交點12c3特定為座標系統的原點,且背面11b側之任意的XY座標位置可將交點12c3特定為座標系統的原點。因此,可特定出對應於背面11b側的第1區域之正面11a側的第2區域。 Any XY coordinate position on the front side 11a can specify the intersection 12c 3 as the origin of the coordinate system, and any XY coordinate position on the back side 11b can specify the intersection 12c 3 as the origin of the coordinate system. Therefore, the second area on the front side 11a corresponding to the first area on the back side 11b can be specified.
在記憶步驟S60後,切削被加工物11(切削步驟S70)。圖7是顯示切削步驟S70的圖。在切削步驟S70中,首先是將高速旋轉的切削刀片82b定位在分割預定線13的延長線上。此時,將切削刀片82b之下端定位在被加工物11的正面11a與背面11b之間。 After the memory step S60, the workpiece 11 is cut (cutting step S70). FIG. 7 is a diagram showing the cutting step S70. In the cutting step S70, the high-speed rotating cutting blade 82b is first positioned on the extension line of the predetermined dividing line 13. At this time, the lower end of the cutting blade 82b is positioned between the front side 11a and the back side 11b of the workpiece 11.
並且,以X軸移動機構26使保持工作台10與切削刀片82b沿著X軸方向相對地移動。藉此,可藉由切削刀片82b在被加工物11的厚度方向上將被加工物11從背面11b側局部地切削(加工)至未到達正面11a之預定的深度(亦即,進行半切(half cut)),而沿著分割預定線13形成溝(加工溝)11c。 Furthermore, the X-axis moving mechanism 26 is used to move the holding table 10 and the cutting blade 82b relative to each other along the X-axis direction. Thus, the cutting blade 82b can partially cut (process) the workpiece 11 from the back side 11b to a predetermined depth that does not reach the front side 11a in the thickness direction of the workpiece 11 (i.e., perform a half cut), and form a groove (processing groove) 11c along the predetermined dividing line 13.
再者,在切削步驟S70中的切削,並不限定於半切。在切削步驟S70中,亦可藉從背面11b至正面11a切斷的方式來對被加工物11進行切削(亦即,全切(full cut))。 Furthermore, the cutting in the cutting step S70 is not limited to half cutting. In the cutting step S70, the workpiece 11 can also be cut from the back surface 11b to the front surface 11a (i.e., full cut).
藉由沿著平行於X軸方向的1條分割預定線13來切削被加工物11 後將切削單元78分度進給,來將切削刀片82b定位到在Y軸方向上相鄰的分割預定線13的延長線上。然後,同樣地,沿著分割預定線13切削被加工物11。 The workpiece 11 is cut along a predetermined dividing line 13 parallel to the X-axis direction. The cutting unit 78 is then indexed to position the cutting blade 82b on the extension line of the adjacent predetermined dividing line 13 in the Y-axis direction. Then, the workpiece 11 is cut along the predetermined dividing line 13 in the same manner.
在切削了任意的數量之分割預定線13後,作業人員使用上方拍攝單元84來取得背面11b側的圖像,並使其顯示於觸控面板92(背面顯示步驟S80)。 After cutting an arbitrary number of predetermined dividing lines 13, the operator uses the upper camera unit 84 to obtain an image of the back side 11b and displays it on the touch panel 92 (back side display step S80).
圖8是顯示背面顯示步驟S80的圖。在圖8中,是以功能方塊圖來顯示控制部94等。再者,下方拍攝單元54會往X軸移動工作台18的空間18d之外退避。 FIG8 is a diagram showing the back display step S80. In FIG8, the control unit 94 and the like are displayed as a functional block diagram. Furthermore, the lower shooting unit 54 will retreat outside the space 18d of the X-axis moving table 18.
在本實施形態之背面顯示步驟S80中,是控制部94將包含在被加工物11的厚度方向上對應於背面11b側的第1區域之正面11a側的第2區域的標記98等之預定的型樣重疊於第1區域的圖像來顯示於觸控面板92。 In the back display step S80 of the present embodiment, the control unit 94 displays a predetermined pattern including a mark 98 of the second area on the front 11a side corresponding to the first area on the back 11b side in the thickness direction of the workpiece 11, superimposed on the image of the first area, on the touch panel 92.
圖9(A)是背面11b側的第1區域的圖像之一例。在圖9(A)中,是將顯示形成於背面11b側之溝11c的區域以塗黑的區域來顯示。圖9(B)是對應於背面11b側的第1區域之正面11a側的第2區域的圖像之一例。 FIG9(A) is an example of an image of the first area on the back side 11b. In FIG9(A), the area showing the groove 11c formed on the back side 11b is displayed as a black area. FIG9(B) is an example of an image of the second area on the front side 11a corresponding to the first area on the back side 11b.
在圖9(B)中,是顯示器件15、分割預定線13、標記98及電路100的輪廓。再者,如上述,圖9(B)所示之正面11a側的第2區域的圖像之X及Y軸方向的方向,是與被加工物11的背面11b側之X及Y軸方向的方向相同。 FIG9(B) shows the outlines of the display device 15, the predetermined dividing line 13, the mark 98, and the circuit 100. Furthermore, as mentioned above, the directions of the X and Y axis directions of the image of the second area on the front side 11a shown in FIG9(B) are the same as the directions of the X and Y axis directions on the back side 11b of the workpiece 11.
控制部94是從記憶部96讀出對應於背面11b側的第1區域之第2區域的圖像,並讓已將此第2區域的圖像之預定的型樣重疊於背面11b側的第1區域的圖像之圖像102(參照圖10)顯示於觸控面板92。藉此,作業人員可以確認形成於被加工物11之溝11c是否沿著分割預定線13形成。 The control unit 94 reads the image of the second area corresponding to the first area on the back side 11b from the memory unit 96, and displays an image 102 (see FIG. 10 ) in which the predetermined pattern of the image of the second area is superimposed on the image of the first area on the back side 11b on the touch panel 92. In this way, the operator can confirm whether the groove 11c formed in the workpiece 11 is formed along the predetermined dividing line 13.
在本實施形態中,在觸控面板92所顯示之背面11b側的圖像,雖然是藉由上方拍攝單元84所取得的背面11b側的即時圖像,但亦可為藉由上方拍攝單元84所取得的背面11b側的靜止圖像。 In this embodiment, the image of the back side 11b displayed on the touch panel 92 is a real-time image of the back side 11b obtained by the upper shooting unit 84, but it can also be a still image of the back side 11b obtained by the upper shooting unit 84.
圖10是顯示在背面顯示步驟S80中所顯示的圖像之一例(圖像 102)。在圖10中,是以虛線來表示器件15、分割預定線13、標記98及電路100的輪廓。 FIG10 is an example of an image (image 102) displayed in the back display step S80. In FIG10, the outlines of the device 15, the predetermined dividing line 13, the mark 98, and the circuit 100 are indicated by dotted lines.
在圖10中,雖然已將器件15、分割預定線13、標記98及電路100的全部重疊而顯示在圖像102上,但是亦可選擇性地顯示任一個(例如僅分割預定線13)。 In FIG. 10 , although the device 15, the predetermined dividing line 13, the mark 98 and the circuit 100 are all overlapped and displayed on the image 102, any one of them can be selectively displayed (for example, only the predetermined dividing line 13).
又,分割預定線13、標記98等的輪廓亦可在將正面11a側的圖像進行二值化處理後,以醒目地加工為預定的粗細、預定的顏色、預定的亮度的狀態來顯示於圖像102上。 In addition, the outlines of the predetermined dividing line 13, the mark 98, etc. can also be displayed on the image 102 in a state of being processed into a predetermined thickness, a predetermined color, and a predetermined brightness after the image on the front side 11a is binarized.
再者,如圖10所示,在圖像102中,雖然僅顯示分割預定線13、標記98等的輪廓,但亦可顯示分割預定線13、標記98等的圖像,而非輪廓。 Furthermore, as shown in FIG. 10 , in the image 102 , although only the outlines of the predetermined dividing line 13 and the mark 98 are displayed, the image of the predetermined dividing line 13 and the mark 98 may be displayed instead of the outline.
在背面顯示步驟S80後,在尚未沿著所有的分割預定線13切削被加工物11的情況下,會返回到切削步驟S70,並切削被加工物11。亦可將切削步驟S70及背面顯示步驟S80重複複數次。 After the back display step S80, if the workpiece 11 has not been cut along all the predetermined dividing lines 13, it will return to the cutting step S70 and cut the workpiece 11. The cutting step S70 and the back display step S80 can also be repeated several times.
在沿著平行於X軸方向的所有的分割預定線13切削被加工物11後,使旋轉驅動源30動作,而使保持工作台10旋轉90度。然後,再度進行切削步驟S70。此時,亦可將切削步驟S70及背面顯示步驟S80重複複數次。 After cutting the workpiece 11 along all the predetermined dividing lines 13 parallel to the X-axis direction, the rotary drive source 30 is operated to rotate the holding table 10 90 degrees. Then, the cutting step S70 is performed again. At this time, the cutting step S70 and the back display step S80 can also be repeated several times.
再者,在背面顯示步驟S80中,亦可在觸控面板92顯示:將第1區域的圖像之至少顯示溝11c的區域對包含第2區域所包含的標記98等之預定的型樣之圖像重疊而成的圖像。圖11是顯示在背面顯示步驟S80中所顯示之圖像的其他例(圖像102a)。在圖11中,是以虛線表示溝11c的輪廓。 Furthermore, in the back display step S80, an image may be displayed on the touch panel 92: an image in which at least the area showing the groove 11c of the image in the first area is superimposed on an image of a predetermined pattern including the mark 98 included in the second area. FIG. 11 is another example (image 102a) of the image displayed in the back display step S80. In FIG. 11, the outline of the groove 11c is indicated by a dotted line.
在包含顯示溝11c的區域之圖像中,亦可如圖11所示地僅顯示溝11c的輪廓,亦可將藉由拍攝而得到的溝11c直接顯示。無論如何,都可在第1區域的圖像中使用至少顯示溝11c的區域。如此,即使在觸控面板92顯示圖像102a的情況下,作業人員也可以確認形成於被加工物11之溝11c是否沿著分割預定線 13形成。 In the image including the area showing the groove 11c, only the outline of the groove 11c may be shown as shown in FIG. 11, or the groove 11c obtained by shooting may be directly displayed. In any case, at least the area showing the groove 11c may be used in the image of the first area. In this way, even when the touch panel 92 displays the image 102a, the operator can confirm whether the groove 11c formed in the workpiece 11 is formed along the predetermined dividing line 13.
其次,說明第2實施形態。在第2實施形態中,是使用雷射加工裝置(加工裝置)104取代切削裝置2來加工被加工物11。但是,上述之載置步驟S10到背面顯示步驟S80是與第1實施形態同樣地進行。 Next, the second embodiment is described. In the second embodiment, a laser processing device (processing device) 104 is used instead of the cutting device 2 to process the workpiece 11. However, the above-mentioned loading step S10 to the back display step S80 are performed in the same manner as the first embodiment.
圖12是第2實施形態之雷射加工裝置104的立體圖。再者,對於與第1實施形態之切削裝置2相同的構成要素會附上相同的符號。以下,主要是說明與切削裝置2的差異。 FIG. 12 is a perspective view of the laser processing device 104 of the second embodiment. In addition, the same symbols are attached to the same components as the cutting device 2 of the first embodiment. The following mainly describes the differences from the cutting device 2.
在雷射加工裝置104中,是將下方拍攝單元54固定在靜止基台106。又,為了可以讓下方拍攝單元54從與X軸移動工作台18的側板18b位於相反側的區域進入到空間18d內,而以在XY平面上的方向旋轉了90度的狀態來配置X軸移動工作台18。 In the laser processing device 104, the lower photographing unit 54 is fixed to the stationary base 106. In addition, in order to allow the lower photographing unit 54 to enter the space 18d from the area on the opposite side of the side plate 18b of the X-axis moving table 18, the X-axis moving table 18 is configured in a state rotated 90 degrees in the direction on the XY plane.
雷射加工裝置104具有固定有1對X軸導軌20的Y軸移動工作台108。Y軸移動工作台108是可滑動地安裝在已固定於靜止基台106的上表面的一對Y軸導軌110上。 The laser processing device 104 has a Y-axis movable table 108 fixed with a pair of X-axis guide rails 20. The Y-axis movable table 108 is slidably mounted on a pair of Y-axis guide rails 110 fixed to the upper surface of the stationary base 106.
再者,在相鄰於Y軸導軌110的位置上設置有可在檢測Y軸移動工作台108的Y軸方向的位置時使用的Y軸標度尺110a。在Y軸移動工作台108的下表面側設有螺帽部(未圖示),在此螺帽部以可旋轉的態樣連結有大致平行於Y軸導軌110之Y軸滾珠螺桿112。 Furthermore, a Y-axis scale 110a is provided adjacent to the Y-axis guide rail 110 and can be used to detect the Y-axis position of the Y-axis moving table 108. A nut portion (not shown) is provided on the lower surface of the Y-axis moving table 108, and a Y-axis ball screw 112 roughly parallel to the Y-axis guide rail 110 is rotatably connected to the nut portion.
在Y軸滾珠螺桿112的一端部連結有Y軸脈衝馬達114。只要以Y軸脈衝馬達114使Y軸滾珠螺桿112旋轉,Y軸移動工作台108即沿著Y軸導軌110在Y軸方向上移動。Y軸導軌110、Y軸滾珠螺桿112、Y軸脈衝馬達114等是構成使Y軸移動工作台108移動的Y軸移動機構116。 A Y-axis pulse motor 114 is connected to one end of the Y-axis ball screw 112. As long as the Y-axis pulse motor 114 rotates the Y-axis ball screw 112, the Y-axis moving table 108 moves in the Y-axis direction along the Y-axis guide rail 110. The Y-axis guide rail 110, the Y-axis ball screw 112, the Y-axis pulse motor 114, etc. constitute the Y-axis moving mechanism 116 that moves the Y-axis moving table 108.
在相鄰於下方拍攝單元54的位置上,以從靜止基台106的上表面朝上方突出的態樣設置有支柱118。於支柱118上設置有罩殼120,前述罩殼120具 有大致平行於X軸方向的長邊部。 A support 118 is provided adjacent to the lower camera unit 54 so as to protrude upward from the upper surface of the stationary base 106. A housing 120 is provided on the support 118, and the housing 120 has a long side that is substantially parallel to the X-axis direction.
在罩殼120中設置有雷射照射單元122的至少一部分。雷射照射單元122具有用於生成具有被加工物11可吸收之波長、或者穿透被加工物11之波長的雷射光束的雷射振盪產生器(未圖示)等。 At least a portion of the laser irradiation unit 122 is disposed in the housing 120. The laser irradiation unit 122 has a laser oscillation generator (not shown) for generating a laser beam having a wavelength that can be absorbed by the workpiece 11 or a wavelength that can penetrate the workpiece 11.
在雷射照射單元122的X軸方向的前端部,設置有包含聚光器的照射頭124。以雷射照射單元122所生成之預定的波長的雷射光束,是經過預定的光學系統而從照射頭124朝下方照射。又,在罩殼120的前端部,在相鄰於照射頭124的位置上設置有上方拍攝單元84。 At the front end of the laser irradiation unit 122 in the X-axis direction, an irradiation head 124 including a condenser is provided. The laser beam of a predetermined wavelength generated by the laser irradiation unit 122 is irradiated downward from the irradiation head 124 through a predetermined optical system. In addition, at the front end of the housing 120, an upper shooting unit 84 is provided at a position adjacent to the irradiation head 124.
即使在第2實施形態的背面顯示步驟S80中,也可以使在在圖像取得步驟S50中所取得的標記98等之預定的型樣重疊於觸控面板92所顯示之背面11b側的第1區域的圖像來顯示。藉此,作業人員可以確認形成於被加工物11之溝11c是否沿著分割預定線13形成。 Even in the back display step S80 of the second embodiment, the predetermined pattern of the mark 98 etc. obtained in the image acquisition step S50 can be superimposed on the image of the first area on the back side 11b displayed on the touch panel 92 for display. In this way, the operator can confirm whether the groove 11c formed in the workpiece 11 is formed along the predetermined dividing line 13.
另外,上述實施形態之構造、方法等,只要在不脫離本發明的目的之範圍下,均可適當變更來實施。例如,在第2實施形態中,亦可與第1實施形態同樣地,追加使Z軸移動機構42在Y軸方向上移動的Y軸移動機構。 In addition, the structure and method of the above-mentioned embodiments can be appropriately changed and implemented as long as they do not deviate from the scope of the purpose of the present invention. For example, in the second embodiment, a Y-axis moving mechanism that moves the Z-axis moving mechanism 42 in the Y-axis direction can be added as in the first embodiment.
2:切削裝置(加工裝置) 2: Cutting device (processing device)
4:基台 4: Base
4a,4b,4d:開口 4a,4b,4d: Opening
4c:支撐構造 4c: Support structure
6:片匣 6: Film box
10:保持工作台 10: Keep the workbench
18:X軸移動工作台 18: X-axis moving table
60:加工單元移動機構 60: Processing unit moving mechanism
62:Y軸導軌 62:Y-axis guide rail
64:Y軸移動板 64: Y-axis moving plate
66:Y軸滾珠螺桿 66: Y-axis ball screw
68:Y軸脈衝馬達 68:Y-axis pulse motor
70:Z軸移動板 70: Z-axis moving plate
72:Z軸導軌 72: Z-axis guide rail
74:Z軸滾珠螺桿 74: Z-axis ball screw
76:Z軸脈衝馬達 76: Z-axis pulse motor
78:切削單元(加工單元) 78: Cutting unit (processing unit)
80:主軸殼體 80: Spindle housing
82b:切削刀片 82b: Cutting blade
84:上方拍攝單元(第1拍攝單元) 84: Upper shooting unit (first shooting unit)
86:洗淨單元 86: Washing unit
88:洗淨工作台 88: Clean the workbench
90:噴嘴 90: Nozzle
92:觸控面板(顯示單元) 92: Touch panel (display unit)
94:控制部 94: Control Department
96:記憶部 96: Memory Department
+X,-X,+Y,-Y,+Z,-Z:方向 +X,-X,+Y,-Y,+Z,-Z: Direction
Claims (4)
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| Application Number | Priority Date | Filing Date | Title |
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| JP2019-218757 | 2019-12-03 | ||
| JP2019218757A JP7551232B2 (en) | 2019-12-03 | 2019-12-03 | Processing Equipment |
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| TW202123327A TW202123327A (en) | 2021-06-16 |
| TWI867098B true TWI867098B (en) | 2024-12-21 |
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| JP (2) | JP7551232B2 (en) |
| KR (1) | KR102860798B1 (en) |
| CN (1) | CN112908891B (en) |
| DE (1) | DE102020215282A1 (en) |
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| TW (1) | TWI867098B (en) |
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| JP7225709B2 (en) * | 2018-11-08 | 2023-02-21 | 株式会社三洋物産 | game machine |
| JP7225707B2 (en) * | 2018-11-08 | 2023-02-21 | 株式会社三洋物産 | game machine |
| JP7225712B2 (en) * | 2018-11-08 | 2023-02-21 | 株式会社三洋物産 | game machine |
| JP7430449B2 (en) * | 2020-02-04 | 2024-02-13 | 株式会社ディスコ | processing equipment |
| JP7642292B2 (en) * | 2021-07-28 | 2025-03-10 | 株式会社ディスコ | Processing System |
| JP7715564B2 (en) * | 2021-07-28 | 2025-07-30 | 株式会社ディスコ | Processing system and inspection target selection method |
| JP7680909B2 (en) * | 2021-08-25 | 2025-05-21 | 株式会社ディスコ | Wafer processing method |
| CN116598247B (en) * | 2023-07-18 | 2023-09-12 | 深圳新控半导体技术有限公司 | Self-adjusting pasting platform for chip pasting and control method thereof |
| KR102876109B1 (en) * | 2024-08-28 | 2025-10-28 | 주식회사 에스피오엠 | Glass processing equipment for lens production |
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2020
- 2020-11-09 SG SG10202011113WA patent/SG10202011113WA/en unknown
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| JP2005223270A (en) * | 2004-02-09 | 2005-08-18 | Sony Corp | Semiconductor thin plate scribing equipment |
| JP2009224476A (en) * | 2008-03-14 | 2009-10-01 | Olympus Corp | Defect relevance displaying apparatus, substrate testing apparatus, and defect relevance displaying method |
| TW201143947A (en) * | 2009-12-07 | 2011-12-16 | J P Sercel Associates Inc | Laser machining and scribing systems and methods |
| TW201911443A (en) * | 2017-07-28 | 2019-03-16 | 日商迪思科股份有限公司 | Wafer processing method |
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| CN112908891A (en) | 2021-06-04 |
| TW202123327A (en) | 2021-06-16 |
| KR102860798B1 (en) | 2025-09-16 |
| JP2021089938A (en) | 2021-06-10 |
| JP7551232B2 (en) | 2024-09-17 |
| SG10202011113WA (en) | 2021-07-29 |
| DE102020215282A1 (en) | 2021-06-10 |
| KR20210069574A (en) | 2021-06-11 |
| CN112908891B (en) | 2025-12-23 |
| JP2024096180A (en) | 2024-07-12 |
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