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TWI884620B - Array flow field structure - Google Patents

Array flow field structure Download PDF

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Publication number
TWI884620B
TWI884620B TW112147454A TW112147454A TWI884620B TW I884620 B TWI884620 B TW I884620B TW 112147454 A TW112147454 A TW 112147454A TW 112147454 A TW112147454 A TW 112147454A TW I884620 B TWI884620 B TW I884620B
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fan set
flow field
field structure
side fan
working area
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TW112147454A
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TW202524088A (en
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朱善龍
蔡朝仁
鐘偉銘
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志聖工業股份有限公司
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Abstract

一種陣列式流場結構,適用於一正壓環境測試設備,該陣列式流場結構其包含一殼體、複數測試板、一熱交換裝置、至少一第一循環風扇組、一第一側面風扇組以及一第二側面風扇組,該殼體具有一壓力腔室,該壓力腔室劃分有一作業區。該複數測試板設置於該作業區。熱交換裝置相對設置於該作業區。至少一第一循環風扇組設置於該作業區之一側。一第一側面風扇組以及一第二側面風扇組分別設置於該作業區之二側。本發明的陣列式流場結構對老化測試板上的IC晶片進行散熱,能夠提升IC晶片的散熱效果及效率,並確保各個IC晶片的溫度均勻性。An array flow field structure is applicable to a positive pressure environment test equipment, the array flow field structure comprises a housing, a plurality of test plates, a heat exchange device, at least a first circulation fan set, a first side fan set and a second side fan set, the housing has a pressure chamber, the pressure chamber is divided into a working area. The plurality of test plates are arranged in the working area. The heat exchange device is relatively arranged in the working area. At least a first circulation fan set is arranged on one side of the working area. A first side fan set and a second side fan set are respectively arranged on two sides of the working area. The array flow field structure of the present invention is used to dissipate heat from the IC chips on the aging test board, thereby improving the heat dissipation effect and efficiency of the IC chips and ensuring the temperature uniformity of each IC chip.

Description

陣列式流場結構Array flow field structure

本發明係關於一種流場結構,更特別的是關於一種陣列式流場結構。 The present invention relates to a flow field structure, and more particularly to an array flow field structure.

老化測試板(Burn-in board;BIB),是IC製程中最後一個步驟,即將經過最後測試的IC,透過烤箱高溫、高電壓、高電流等的環境考驗,以挑選出生命週期較短之IC,再將良好品質之IC出貨給廠商。有鑑於IC晶片的功率逐年提高,以目前AI IC晶片為例已提高到單顆300~800瓦,標準大氣壓(1atm)的老化測試機並無法有效散熱,也有可能造成某些散熱效率較差的區域容易造成IC晶片的損壞。 Burn-in board (BIB) is the last step in the IC manufacturing process. It is to put the ICs that have passed the final test through the high temperature, high voltage, and high current environment of the oven to select ICs with a shorter life cycle, and then ship the ICs with good quality to the manufacturer. In view of the fact that the power of IC chips has increased year by year, taking the current AI IC chip as an example, it has increased to 300~800 watts per chip. The standard atmospheric pressure (1atm) aging test machine cannot effectively dissipate heat, and it may also cause some areas with poor heat dissipation efficiency to easily cause damage to the IC chip.

因此,需要發展一種可改善上述習知技術缺失的老化測試設備。 Therefore, it is necessary to develop an aging test equipment that can improve the above-mentioned deficiencies in the known technology.

本發明之目的,在於提供一種能解決前述問題的陣列式流場結構。 The purpose of the present invention is to provide an array flow field structure that can solve the above-mentioned problems.

本發明提出一種陣列式流場結構,利用高壓環境(大於常壓)來提高熱量傳遞效率,並搭配陣列式風扇組的流場設計來達到解熱效率相同的雙重功能,且針對散熱效率較差的區域,亦可藉由系統控制改變該區域的風扇速度,即可提高該區域的解熱效率,以達到所有老化測試板上的測試條件(如溫度)均相 同。 The present invention proposes an array flow field structure, which uses a high-pressure environment (greater than normal pressure) to improve the heat transfer efficiency, and is matched with the flow field design of the array fan group to achieve the dual functions of the same heat dissipation efficiency. For areas with poor heat dissipation efficiency, the fan speed of the area can be changed by system control to improve the heat dissipation efficiency of the area, so as to achieve the same test conditions (such as temperature) on all aging test boards.

於是,本發明陣列式流場結構在一些實施態樣中,適用於正壓環境測試設備,該陣列式流場結構其包含一殼體,具有一壓力腔室,該壓力腔室劃分有一作業區;複數測試板,設置於該作業區;一熱交換裝置,相對設置於該作業區;至少一第一循環風扇組,設置於該作業區之一側;以及一第一側面風扇組以及一第二側面風扇組,分別設置於該作業區之二側,其中,該壓力腔室的一壓力大於常壓的該正壓環境。 Therefore, in some embodiments, the array flow field structure of the present invention is suitable for positive pressure environment testing equipment, and the array flow field structure includes a housing having a pressure chamber, the pressure chamber is divided into a working area; a plurality of test plates are arranged in the working area; a heat exchange device is relatively arranged in the working area; at least one first circulation fan set is arranged on one side of the working area; and a first side fan set and a second side fan set are respectively arranged on two sides of the working area, wherein a pressure of the pressure chamber is greater than the positive pressure environment of normal pressure.

在一些實施態樣中,陣列式流場結構更包含一第二循環風扇組,設置於該熱交換裝置的遠離該作業區的一側。 In some embodiments, the array flow field structure further includes a second circulation fan unit, which is disposed on a side of the heat exchange device away from the working area.

在一些實施態樣中,該第一側面風扇組以及該第二側面風扇組具有複數導流板,用以改變一氣流方向或一氣流大小。 In some embodiments, the first side fan assembly and the second side fan assembly have a plurality of guide plates for changing an airflow direction or an airflow size.

在一些實施態樣中,該第一循環風扇組、該第二循環風扇組、該第一側面風扇組以及該第二側面風扇組為交叉陣列式排列或平行陣列式排列,以對應該複數測試板。 In some embodiments, the first circulation fan set, the second circulation fan set, the first side fan set, and the second side fan set are arranged in a cross array or a parallel array to correspond to the plurality of test panels.

在一些實施態樣中,該第一循環風扇組、該第二循環風扇組、該第一側面風扇組以及該第二側面風扇組為複數風扇組成。 In some embodiments, the first circulation fan set, the second circulation fan set, the first side fan set, and the second side fan set are composed of a plurality of fans.

在一些實施態樣中,該複數風扇為可控制轉速之風扇。 In some embodiments, the plurality of fans are fans with controllable speed.

在一些實施態樣中,該第一循環風扇組、該第二循環風扇組、該第一側面風扇組以及該第二側面風扇組的該氣流風向為正向通風,以導引該氣流循環。 In some embodiments, the airflow direction of the first circulation fan set, the second circulation fan set, the first side fan set, and the second side fan set is forward ventilation to guide the airflow circulation.

在一些實施態樣中,該第一循環風扇組、該第二循環風扇組、該第一側面風扇組以及該第二側面風扇組的該氣流風向為逆向通風,以導引該氣 流循環。 In some embodiments, the airflow direction of the first circulation fan set, the second circulation fan set, the first side fan set, and the second side fan set is reverse ventilation to guide the airflow circulation.

在一些實施態樣中,該複數導流板與該複數風扇的風向的夾角為15°~90°。 In some embodiments, the angle between the wind direction of the plurality of deflectors and the plurality of fans is 15°~90°.

在一些實施態樣中,該陣列式流場結構更包含一加壓裝置,以連通該壓力腔室。 In some embodiments, the array flow field structure further includes a pressurizing device to connect to the pressure chamber.

本發明至少具有以下功效:藉由該熱交換裝置、該第一循環風扇組、該第二循環風扇組、該第一側面風扇組以及該第二側面風扇組的設置,讓該在此循環風路下,對老化測試板上的IC晶片進行散熱,因此能夠提升IC晶片的散熱效果及效率,並確保各個IC晶片的溫度均勻性。 The present invention has at least the following effects: by arranging the heat exchange device, the first circulation fan set, the second circulation fan set, the first side fan set and the second side fan set, the IC chips on the aging test board can be cooled under this circulation air path, thereby improving the cooling effect and efficiency of the IC chips and ensuring the temperature uniformity of each IC chip.

100:正壓環境測試設備 100: Positive pressure environment test equipment

101:陣列式流場結構 101: Array flow field structure

1:殼體 1: Shell

11:壓力腔室 11: Pressure chamber

12:加壓通道 12: Pressurized channel

13:洩壓通道 13: Pressure relief channel

14:隔板 14: Partition

111:作業區 111: Work area

2:測試板 2: Test board

3:熱交換裝置 3: Heat exchange device

4:第一循環風扇組 4: First circulation fan unit

5:第二循環風扇組 5: Second circulation fan unit

6:第一側面風扇組 6: First side fan assembly

61:導流板 61: deflector

7:第二側面風扇組 7: Second side fan assembly

8:驅動板區 8: Drive board area

9:轉接板區 9: Adapter board area

本發明之其他的特徵及功效,將於參照圖式的實施方式中清楚地呈現,其中:圖1所示為一種俯視示意圖,說明本發明陣列式流場結構的一實施例。 Other features and effects of the present invention will be clearly presented in the implementation method with reference to the drawings, wherein: FIG1 is a top view schematic diagram illustrating an implementation example of the array flow field structure of the present invention.

圖2所示為一種俯視示意圖,說明本發明陣列式流場結構的氣流風向為正向通風實施態樣。 Figure 2 shows a schematic top view, illustrating that the airflow direction of the array flow field structure of the present invention is a forward ventilation implementation state.

圖3所示為一種俯視示意圖,說明本發明陣列式流場結構的氣流風向為逆向通風實施態樣。 Figure 3 shows a top view schematic diagram, which illustrates that the airflow direction of the array flow field structure of the present invention is a reverse ventilation implementation.

體現本案特徵與優點的一些典型實施例將在後段的說明中詳細敘述。應理解的是本案能夠在不同的態樣上具有各種的變化,其皆不脫離本案 的範圍,且其中的說明及圖示在本質上當作說明之用,而非架構於限制本案。 Some typical embodiments that embody the features and advantages of this case will be described in detail in the following description. It should be understood that this case can have various variations in different forms, all of which are within the scope of this case, and the descriptions and diagrams therein are essentially for illustrative purposes, rather than for limiting this case.

請參閱圖1,圖1所示一種俯視示意圖,說明本發明陣列式流場結構101的一實施例,適用於一正壓環境測試設備100,包含一殼體1、複數測試板2、一熱交換裝置3、至少一第一循環風扇組4、一第二循環風扇組5、一第一側面風扇組6、一第二側面風扇組7、一驅動板區8、一轉接板區9以及一隔板14。 Please refer to FIG. 1, which is a top view schematic diagram illustrating an embodiment of the array flow field structure 101 of the present invention, which is applicable to a positive pressure environment test equipment 100, including a housing 1, a plurality of test plates 2, a heat exchange device 3, at least a first circulation fan set 4, a second circulation fan set 5, a first side fan set 6, a second side fan set 7, a driving plate area 8, a transfer plate area 9 and a partition 14.

請繼續參閱圖1,如圖1所示,殼體1具有一壓力腔室11,並以隔板14將壓力腔室11劃分出兩個區域,其中一區域設置陣列式流場結構101,用以形成場流,另一區域設置驅動板區8、轉接板區9,用於供應測試板2的供電、訊號傳輸以及控制。複數測試板2具有複數IC晶片(未圖示),設置於作業區111,而複數測試板2以層架方式分層設置,並對應第一循環風扇組4、第二循環風扇組5、第一側面風扇組6、第二側面風扇組7的多層設計,也可為單層設計,但不此以為限。熱交換裝置3,相對設置於作業區111。於本實施例中,至少一第一循環風扇組4,設置該作業區111之一側,亦也可以將設置兩組第一循環風扇組4同時設置於作業區111前後兩側、作業區111前側或作業區111後側,但不此以為限。第一側面風扇組6以及第二側面風扇組7,則分別設置相反於第一循環風扇組4之作業區111之左右二側。陣列式流場結構101更包含一第二循環風扇組5,並設置於熱交換裝置3的遠離該作業區111的一側,藉以使壓力腔室11達成氣流循環之功效。並且當陣列式流場結構101之第一循環風扇組4、第二循環風扇組5、第一側面風扇組6以及第二側面風扇組7轉動時,壓力腔室11的一壓力大於常壓的該正壓環境。 Please continue to refer to FIG. 1. As shown in FIG. 1, the housing 1 has a pressure chamber 11, and the pressure chamber 11 is divided into two areas by a partition 14. One area is provided with an array flow field structure 101 for forming a field flow, and the other area is provided with a driving plate area 8 and a transfer plate area 9 for supplying power, signal transmission and control of the test board 2. The plurality of test boards 2 have a plurality of IC chips (not shown) and are arranged in the working area 111. The plurality of test boards 2 are arranged in layers in a rack manner, and correspond to the multi-layer design of the first circulation fan set 4, the second circulation fan set 5, the first side fan set 6, and the second side fan set 7. It can also be a single-layer design, but it is not limited thereto. The heat exchange device 3 is relatively disposed in the working area 111. In this embodiment, at least one first circulation fan set 4 is disposed on one side of the working area 111, and two sets of first circulation fan sets 4 can also be disposed at the front and rear sides of the working area 111, the front side of the working area 111, or the rear side of the working area 111, but not limited thereto. The first side fan set 6 and the second side fan set 7 are respectively disposed on the left and right sides of the working area 111 opposite to the first circulation fan set 4. The array flow field structure 101 further includes a second circulation fan set 5, which is disposed on a side of the heat exchange device 3 away from the working area 111, so that the pressure chamber 11 can achieve the effect of airflow circulation. And when the first circulation fan set 4, the second circulation fan set 5, the first side fan set 6 and the second side fan set 7 of the array flow field structure 101 rotate, the pressure of the pressure chamber 11 is greater than the positive pressure environment of the normal pressure.

於本實施例中,第一循環風扇組4、第二循環風扇組5、第一側面風扇組6以及第二側面風扇7組為複數風扇組成,並複數風扇為可控制轉速之風 扇,且複數風扇也可為不同尺寸風扇規格。其中,風扇型態可為軸流扇,但不此以為限。 In this embodiment, the first circulation fan set 4, the second circulation fan set 5, the first side fan set 6 and the second side fan set 7 are composed of a plurality of fans, and the plurality of fans are fans with controllable rotation speeds, and the plurality of fans can also be fans of different sizes. Among them, the fan type can be an axial flow fan, but is not limited thereto.

於本實施例中,第一循環風扇組4、該第二循環風扇組5、第一側面風扇組6以及第二側面風扇組7可為一維陣列、二維陣列、或三維陣列,其中第一、二維陣列又可以為交叉陣列式排列或平行陣列式排列,但不此以為限。另外,第一側面風扇組6以及第二側面風扇組7具有複數導流板61,用以改變風扇氣流方向或氣流大小,且導流板與風扇的風向的較佳夾角可以為15°~90°,但不此以為限。 In this embodiment, the first circulation fan set 4, the second circulation fan set 5, the first side fan set 6 and the second side fan set 7 can be a one-dimensional array, a two-dimensional array, or a three-dimensional array, wherein the first and two-dimensional arrays can be arranged in a cross array or a parallel array, but not limited thereto. In addition, the first side fan set 6 and the second side fan set 7 have a plurality of guide plates 61 to change the direction or size of the fan airflow, and the preferred angle between the guide plate and the wind direction of the fan can be 15°~90°, but not limited thereto.

請參閱圖2,圖2所示一種俯視示意圖,說明本發明陣列式流場結構的氣流風向為正向通風實施態樣,當第一循環風扇組4、第二循環風扇組5、第一側面風扇組6以及第二側面風扇組7執行作動時,複數風扇所產生的氣流風向為正向通風,以導引氣流在作業區111進行正向循環。 Please refer to FIG. 2, which is a top view schematic diagram illustrating the implementation of the array flow field structure of the present invention in which the airflow direction is forward ventilation. When the first circulation fan set 4, the second circulation fan set 5, the first side fan set 6 and the second side fan set 7 are in operation, the airflow direction generated by the plurality of fans is forward ventilation, so as to guide the airflow to circulate forward in the working area 111.

請參閱圖3,圖3所示一種俯視示意圖,說明本發明陣列式流場結構的氣流風向為逆向通風實施態樣,當第一循環風扇組4、第二循環風扇組5、第一側面風扇組6以及第二側面風扇組7執行作動時,複數風扇所產生的氣流風向為逆向通風,以導引氣流在作業區111進行逆向循環。 Please refer to FIG. 3, which is a top view schematic diagram illustrating the reverse ventilation implementation of the array flow field structure of the present invention. When the first circulation fan set 4, the second circulation fan set 5, the first side fan set 6 and the second side fan set 7 are in operation, the airflow direction generated by the plurality of fans is reverse ventilation, so as to guide the airflow to circulate in reverse in the working area 111.

請繼續參閱圖2、圖3,如圖所示,作業區111內正向氣流流向為:氣流由第二循環風扇組5導入、進入熱交換裝置3、第一循環風扇組4、作業區111、再由第一側面風扇組6以及第二側面風扇組7兩側導出,最後氣流進入第二循環風扇組5,以達到作業區111內氣流正向循環。 Please continue to refer to Figures 2 and 3. As shown in the figure, the positive airflow in the working area 111 is as follows: the airflow is introduced by the second circulating fan unit 5, enters the heat exchange device 3, the first circulating fan unit 4, the working area 111, and then is guided out from both sides of the first side fan unit 6 and the second side fan unit 7. Finally, the airflow enters the second circulating fan unit 5 to achieve positive airflow circulation in the working area 111.

作業區111內反向氣流流向為:氣流由第一側面風扇組6以及第二側面風扇組7兩側導入、進入作業區111、第一循環風扇組4、作業區111、再由 第二循環風扇組52導出,最後進入第一側面風扇組6以及第二側面風扇組7兩側,以達到作業區111內氣流逆向循環。 The reverse airflow direction in the working area 111 is: the airflow is introduced from both sides of the first side fan set 6 and the second side fan set 7, enters the working area 111, the first circulation fan set 4, the working area 111, and then is introduced from the second circulation fan set 52, and finally enters both sides of the first side fan set 6 and the second side fan set 7, so as to achieve reverse circulation of the airflow in the working area 111.

對此,使用者可以依照需求,將複數風扇設置任何種陣列型形式,並針對散熱效率較差的測試板2的IC晶片區域,藉由系統控制改變該區域的風扇速度,即可提高該區域的散熱效率,以達到所有老化測試板上的測試條件(如溫度)均相同,於一些實施例中,IC晶片可裝設散熱器(未圖示),藉以達到更佳散熱功效,於一些實施例中,IC晶片可裝設加熱器(未圖示),藉以達到更佳溫度均勻功效。 In this regard, the user can set multiple fans in any array form according to the needs, and for the IC chip area of the test board 2 with poor heat dissipation efficiency, the fan speed of the area can be changed by system control to improve the heat dissipation efficiency of the area, so as to achieve the same test conditions (such as temperature) on all aging test boards. In some embodiments, the IC chip can be equipped with a heat sink (not shown) to achieve better heat dissipation effect. In some embodiments, the IC chip can be equipped with a heater (not shown) to achieve better temperature uniformity.

由上述說明可知,本案之陣列式流場結構101,藉由複數導流板61進行調整第一側面風扇組6以及第二側面風扇組7的風扇氣流方向或氣流大小,其各項能力變化如下表一以及表二所示:

Figure 112147454-A0305-12-0006-1
From the above description, it can be known that the array flow field structure 101 of the present case adjusts the fan airflow direction or airflow size of the first side fan set 6 and the second side fan set 7 by using a plurality of guide plates 61, and its various capacity changes are shown in the following Table 1 and Table 2:
Figure 112147454-A0305-12-0006-1

Figure 112147454-A0305-12-0006-2
Figure 112147454-A0305-12-0006-2

是以,藉由實驗上表可知,當氣流正向通風時,第一側面風扇組6以及第二側面風扇組7的導流板61角度15度~90度之間,測試板溫度差都至少有13.5℃以下的功效,溫度差較小(較佳)的在於導流板61角度45時,測試板溫度 差更達到4.6℃功效。而當氣流逆向通風時,第一側面風扇組6以及第二側面風扇組7的導流板61角度15度~90度之間,測試板溫度差都至少有15.8℃以下的的功效,較佳的在於導流板61角度75時,測試板溫度差更達到7.5度功效。 Therefore, it can be seen from the experimental table that when the airflow is ventilated in the forward direction, the angle of the guide plate 61 of the first side fan set 6 and the second side fan set 7 is between 15 degrees and 90 degrees, and the temperature difference of the test plate is at least 13.5℃ or less. The smaller (better) temperature difference is when the angle of the guide plate 61 is 45 degrees, and the temperature difference of the test plate reaches 4.6℃. When the airflow is ventilated in the reverse direction, the angle of the guide plate 61 of the first side fan set 6 and the second side fan set 7 is between 15 degrees and 90 degrees, and the temperature difference of the test plate is at least 15.8℃ or less. The best temperature difference is when the angle of the guide plate 61 is 75 degrees, and the temperature difference of the test plate reaches 7.5 degrees.

但無論如何,上述第一側面風扇組6以及第二側面風扇組7的導流板61角度在正向通風以及逆向通風狀況下,均是藉由實驗中所獲的,並非能夠靠理論之公式所直接推導,其增進散熱效果功能原因的推測僅作為實驗合理的參考說明。 However, the angles of the guide plates 61 of the first side fan set 6 and the second side fan set 7 under forward and reverse ventilation conditions are obtained through experiments and cannot be directly derived from theoretical formulas. The speculation on the reasons for improving the heat dissipation effect is only a reasonable reference for the experiment.

於本實施例中,陣列式流場結構101,更包含一加壓裝置(未圖示)、加壓通道12、洩壓通道13,加壓裝置藉由加壓通道12以連通該壓力腔室11,對壓力腔室11進行加壓動作。 In this embodiment, the array flow field structure 101 further includes a pressurizing device (not shown), a pressurizing channel 12, and a pressure relief channel 13. The pressurizing device is connected to the pressure chamber 11 through the pressurizing channel 12 to perform a pressurizing operation on the pressure chamber 11.

綜合上述,本發明所提供陣列式流場結構,主要第一循環風扇組、第二循環風扇組、第一側面風扇組以及第二側面風扇組設置在於壓力腔室內的陣列式流場結構中,當複數風扇進行轉動時,使作業區達到氣流循環,藉以對老化測試板上的IC晶片進行解熱,並且風扇可以採用交差陣列式、平行陣列式等配置方式,以對應作業區的作業板進行更有效率散熱。 In summary, the array flow field structure provided by the present invention mainly includes the first circulation fan group, the second circulation fan group, the first side fan group and the second side fan group arranged in the array flow field structure in the pressure chamber. When the multiple fans rotate, the working area can achieve airflow circulation to cool down the IC chips on the aging test board. The fans can be arranged in a cross array, parallel array or other configurations to achieve more efficient heat dissipation for the working board in the corresponding working area.

惟以上所述者,僅為本發明之實施例而已,當不能以此限定本發明實施之範圍,凡是依本發明申請專利範圍及專利說明書內容所作之簡單的等效變化與修飾,皆仍屬本發明專利涵蓋之範圍內。 However, the above is only an example of the implementation of the present invention, and it cannot be used to limit the scope of the implementation of the present invention. All simple equivalent changes and modifications made according to the scope of the patent application of the present invention and the content of the patent specification are still within the scope of the patent of the present invention.

100:正壓環境測試設備 100: Positive pressure environment test equipment

101:陣列式流場結構 101: Array flow field structure

1:殼體 1: Shell

11:壓力腔室 11: Pressure chamber

12:加壓通道 12: Pressurized channel

13:洩壓通道 13: Pressure relief channel

14:隔板 14: Partition

111:作業區 111: Work area

2:測試板 2: Test board

3:熱交換裝置 3: Heat exchange device

4:第一循環風扇組 4: First circulation fan unit

5:第二循環風扇組 5: Second circulation fan unit

6:第一側面風扇組 6: First side fan assembly

7:第二側面風扇組 7: Second side fan assembly

8:驅動板區 8: Drive board area

9:轉接板區 9: Adapter board area

Claims (8)

一種陣列式流場結構,適用於一正壓環境測試設備,該陣列式流場結構其包含: 一殼體,具有一壓力腔室,該壓力腔室劃分有一作業區; 複數測試板,設置於該作業區; 一熱交換裝置,相對設置於該作業區; 至少一第一循環風扇組,設置於該作業區之一側; 一第二循環風扇組,設置於該熱交換裝置的遠離該作業區的一側;以及 一第一側面風扇組以及一第二側面風扇組,分別設置於該作業區之二側, 其中,該壓力腔室的一壓力大於常壓的該正壓環境,該第一側面風扇組以及該第二側面風扇組具有複數導流板,用以改變一氣流方向或一氣流大小。 An array flow field structure is applicable to a positive pressure environment test equipment, and the array flow field structure comprises: A housing having a pressure chamber, the pressure chamber is divided into a working area; A plurality of test plates are arranged in the working area; A heat exchange device is relatively arranged in the working area; At least one first circulation fan group is arranged on one side of the working area; A second circulation fan group is arranged on a side of the heat exchange device away from the working area; and A first side fan group and a second side fan group are respectively arranged on two sides of the working area, The pressure of the pressure chamber is a positive pressure environment with a pressure greater than normal pressure, and the first side fan set and the second side fan set have a plurality of guide plates for changing an airflow direction or an airflow size. 如請求項1所述之陣列式流場結構,其中該第一循環風扇組、該第二循環風扇組、該第一側面風扇組以及該第二側面風扇組為交叉陣列式排列或平行陣列式排列,以對應該複數測試板。The array flow field structure as described in claim 1, wherein the first circulation fan set, the second circulation fan set, the first side fan set and the second side fan set are arranged in a cross array or in a parallel array to correspond to the plurality of test plates. 如請求項1所述之陣列式流場結構,其中該第一循環風扇組、該第二循環風扇組、該第一側面風扇組以及該第二側面風扇組為複數風扇組成。The array flow field structure as described in claim 1, wherein the first circulation fan set, the second circulation fan set, the first side fan set and the second side fan set are composed of a plurality of fans. 如請求項3所述之陣列式流場結構,其中該複數風扇為可控制轉速之風扇。An array flow field structure as described in claim 3, wherein the plurality of fans are fans with controllable rotation speed. 如請求項1所述之陣列式流場結構,其中該第一循環風扇組、該第二循環風扇組、該第一側面風扇組以及該第二側面風扇組的該氣流風向為正向通風,以導引該氣流循環。The array flow field structure as described in claim 1, wherein the airflow direction of the first circulation fan set, the second circulation fan set, the first side fan set and the second side fan set is forward ventilation to guide the airflow circulation. 如請求項1所述之陣列式流場結構,其中該第一循環風扇組、該第二循環風扇組、該第一側面風扇組以及該第二側面風扇組的該氣流風向為逆向通風,以導引該氣流循環。The array flow field structure as described in claim 1, wherein the airflow direction of the first circulation fan set, the second circulation fan set, the first side fan set and the second side fan set is reverse ventilation to guide the airflow circulation. 如請求項1所述之陣列式流場結構,其中該複數導流板與該第一側面風扇組以及該第二側面風扇組的風向的夾角為15∘~90∘。The array flow field structure as described in claim 1, wherein the angle between the plurality of guide plates and the wind direction of the first side fan set and the second side fan set is 15∘~90∘. 如請求項1所述之陣列式流場結構,更包含一加壓裝置,以連通該壓力腔室。The array flow field structure as described in claim 1 further includes a pressurizing device connected to the pressure chamber.
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Publication number Priority date Publication date Assignee Title
TW202310709A (en) * 2021-08-17 2023-03-01 伊士博國際商業股份有限公司 Close loop liquid cooling burn-in apparatus and temperature control method thereof
CN220084983U (en) * 2023-06-16 2023-11-24 深圳市云海防静电科技有限公司 Aging test box

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW202310709A (en) * 2021-08-17 2023-03-01 伊士博國際商業股份有限公司 Close loop liquid cooling burn-in apparatus and temperature control method thereof
CN220084983U (en) * 2023-06-16 2023-11-24 深圳市云海防静电科技有限公司 Aging test box

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