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TWI884001B - Movable probe device - Google Patents

Movable probe device Download PDF

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Publication number
TWI884001B
TWI884001B TW113122446A TW113122446A TWI884001B TW I884001 B TWI884001 B TW I884001B TW 113122446 A TW113122446 A TW 113122446A TW 113122446 A TW113122446 A TW 113122446A TW I884001 B TWI884001 B TW I884001B
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Taiwan
Prior art keywords
seat
movable
probe device
fixed
limiting
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TW113122446A
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Chinese (zh)
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TW202601134A (en
Inventor
李永森
蕭家良
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英業達股份有限公司
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Priority to TW113122446A priority Critical patent/TWI884001B/en
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Publication of TWI884001B publication Critical patent/TWI884001B/en
Publication of TW202601134A publication Critical patent/TW202601134A/en

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  • A Measuring Device Byusing Mechanical Method (AREA)

Abstract

A measuring device including a fixed base, a ruler, a movable base and a probe. The ruler is disposed on the fixed base and has multiple scales arranged in line. The movable base is movably disposed on the fixed base. The probe is fixed to the movable base.

Description

可活動式探針裝置Movable probe device

本發明係關於一種可活動式探針裝置,特別係關於一種包含尺規的可活動式探針裝置。 The present invention relates to a movable probe device, and in particular to a movable probe device comprising a ruler.

為了確認伺服器特定空間中的靜電放電(ESD)輻射之強度,通常會使用ESD輻射場強計來進行量測。於傳統的ESD輻射場強計中,係將圓尺規設置於固定座上,並將探針設置在透過旋鈕調整位置的移動平台上。 In order to confirm the intensity of electrostatic discharge (ESD) radiation in a specific space of a server, an ESD radiation field strength meter is usually used for measurement. In a traditional ESD radiation field strength meter, a circular ruler is set on a fixed base, and the probe is set on a moving platform whose position is adjusted by a knob.

然,圓尺規的設計使得ESD輻射場強計整體的尺寸較大,而無法在較狹小的空間中進行量測,或是容易與其他結構干涉。因此,會使得ESD輻射場強計的測量範圍和效率受到限制。 However, the circular ruler design makes the overall size of the ESD radiation field strength meter larger, and it cannot be measured in a smaller space, or it is easy to interfere with other structures. Therefore, the measurement range and efficiency of the ESD radiation field strength meter are limited.

本發明在於提供一種可活動式探針裝置,包含刻度沿直線排列的尺規以減小可活動式探針裝置的整體尺寸,進而改善可活動式探針裝置的測量範圍和效率。 The present invention provides a movable probe device, comprising a ruler with graduations arranged along a straight line to reduce the overall size of the movable probe device, thereby improving the measurement range and efficiency of the movable probe device.

本發明一實施例所揭露之可活動式探針裝置包含一固定座、一尺規、一活動座以及一探針。尺規設置於固定座並包含沿直線排列的多個刻度。活動座可活動地設置於固定座。探針固定於活動座。 The movable probe device disclosed in an embodiment of the present invention includes a fixed seat, a ruler, a movable seat and a probe. The ruler is arranged on the fixed seat and includes a plurality of scales arranged along a straight line. The movable seat can be movably arranged on the fixed seat. The probe is fixed on the movable seat.

根據上述實施例所揭露之可活動式探針裝置,由於尺規包含沿直線排列的刻度,因此可活動式探針裝置的整體尺寸得以減小。如此一來,可活動式探針裝置便能在較狹小的空間中進行量測,且不容易與其他結構干涉,進而使得可活動式探針裝置的測量範圍和效率得到改善。 According to the movable probe device disclosed in the above embodiment, since the ruler includes scales arranged along a straight line, the overall size of the movable probe device is reduced. In this way, the movable probe device can be measured in a smaller space and is not easy to interfere with other structures, thereby improving the measurement range and efficiency of the movable probe device.

10:可活動式探針裝置 10: Movable probe device

100:固定座 100: Fixed seat

110:第一座體 110: The first seat

111:凹槽 111: Groove

120:第二座體 120: Second seat

121:第一限位面 121: First limit surface

200:尺規 200: Ruler

250:緊固件 250: Fasteners

300:活動座 300: movable seat

301:第二限位面 301: Second limiting surface

310:滑塊 310: Slider

311:組裝板部 311: Assembly board

3110:凹槽 3110: Groove

3111:限位槽 3111: Limiting slot

3112:側表面 3112: Side surface

312:安裝凸部 312: Mounting convex part

3120:指示凸部 3120:Indicate convex part

313:支撐凸部 313: Supporting convex part

314:套筒部 314: Sleeve part

320:蓋體 320: Cover

330:夾持槽 330: Clamping slot

350:限位件 350: Limiting parts

370:定位組件 370: Positioning assembly

371:螺絲 371:Screw

372:墊片 372: Gasket

400:探針 400:Probe

M1,M2:活動方向 M1,M2: Activity direction

A:排列方向 A: Arrangement direction

圖1為根據本發明一實施例的可活動式探針裝置的立體圖。 Figure 1 is a three-dimensional diagram of a movable probe device according to an embodiment of the present invention.

圖2為圖1中的可活動式探針裝置的立體分解圖。 Figure 2 is a three-dimensional exploded view of the movable probe device in Figure 1.

圖3為圖1中的可活動式探針裝置於另一視角的立體分解圖。 Figure 3 is a three-dimensional exploded view of the movable probe device in Figure 1 from another viewing angle.

圖4為圖1中的可活動式探針裝置的上視圖。 Figure 4 is a top view of the movable probe device in Figure 1.

圖5為圖4中的可活動式探針裝置的局部放大圖。 Figure 5 is a partial enlarged view of the movable probe device in Figure 4.

圖6為沿圖4中的割面線6-6繪製的剖面示意圖。 Figure 6 is a schematic cross-sectional view drawn along the cutting line 6-6 in Figure 4.

圖7至圖10為呈現活動座相對固定座活動的上視圖。 Figures 7 to 10 are top views showing the movement of the movable seat relative to the fixed seat.

以下在實施方式中詳細敘述本發明之實施例之詳細特徵以及優點,其內容足以使任何本領域中具通常知識者了解本發明之實施例之技術內容並據以實施,且根據本說明書所揭露之內容、申請專利範圍及圖式,任何本領域中具通常知識者可輕易地理解本發明相關之目的及優點。以下之實施例係進一步詳細說明本發明之觀點,但非以任何觀點限制本發明之範疇。 The detailed features and advantages of the embodiments of the present invention are described in detail in the following implementation method. The content is sufficient to enable any person with ordinary knowledge in the field to understand the technical content of the embodiments of the present invention and implement it accordingly. According to the content disclosed in this specification, the scope of the patent application and the drawings, any person with ordinary knowledge in the field can easily understand the relevant purposes and advantages of the present invention. The following embodiments are to further illustrate the viewpoints of the present invention, but do not limit the scope of the present invention by any viewpoint.

請參閱圖1至圖3,圖1為根據本發明一實施例的 可活動式探針裝置的立體圖。圖2為圖1中的可活動式探針裝置的立體分解圖。圖3為圖1中的可活動式探針裝置於另一視角的立體分解圖。 Please refer to Figures 1 to 3. Figure 1 is a three-dimensional view of a movable probe device according to an embodiment of the present invention. Figure 2 is a three-dimensional exploded view of the movable probe device in Figure 1. Figure 3 is a three-dimensional exploded view of the movable probe device in Figure 1 from another viewing angle.

於本實施例中,可活動式探針裝置10例如為靜電放電(ESD)輻射場強計,並包含一固定座100、一尺規200、二緊固件250、一活動座300、一限位件350、一定位組件370以及一探針400。 In this embodiment, the movable probe device 10 is, for example, an electrostatic discharge (ESD) radiation field strength meter, and includes a fixed base 100, a ruler 200, two fasteners 250, a movable base 300, a stopper 350, a positioning assembly 370, and a probe 400.

於本實施例中,固定座100包含一第一座體110及一第二座體120。第二座體120設置於第一座體110的一側。第一座體110包含二凹槽111。第二座體120包含一第一限位面121。 In this embodiment, the fixing base 100 includes a first base body 110 and a second base body 120. The second base body 120 is disposed on one side of the first base body 110. The first base body 110 includes two grooves 111. The second base body 120 includes a first limiting surface 121.

尺規200設置於第一座體110。二緊固件250例如為磁鐵,並分別設置於二凹槽111中。二緊固件250例如吸附於伺服器機殼,以將可活動式探針裝置10固定於伺服器機殼。於其他實施例中,緊固件250及凹槽111的數量亦可皆為單個。此外,於再其他實施例中,可活動式探針裝置亦可無須包含緊固件250,且固定座亦可無須包含凹槽111;在這樣的實施例中,可改成透過外部元件將可活動式探針裝置固定於伺服器機殼。 The ruler 200 is disposed on the first base 110. The two fasteners 250 are, for example, magnets and are disposed in the two grooves 111 respectively. The two fasteners 250 are, for example, adsorbed on the server housing to fix the movable probe device 10 on the server housing. In other embodiments, the number of fasteners 250 and grooves 111 can also be single. In addition, in other embodiments, the movable probe device may not include the fasteners 250, and the fixing seat may not include the groove 111; in such an embodiment, the movable probe device may be fixed to the server housing through an external component instead.

活動座300例如沿活動方向M1、M2可活動地設置於第一座體110。詳細來說,於本實施例中,活動座300包含一滑塊310及一蓋體320。滑塊310例如包含一組裝板部311、一安裝凸部312、一支撐凸部313及一套筒部314。組裝板部311沿活動方向M1、M2可滑動地設置於第一座體110。安裝凸部312凸 出於組裝板部311遠離第一座體110的一側。支撐凸部313凸出於安裝凸部312的一側,並設置於第二座體120。套筒部314設置於支撐凸部313遠離安裝凸部312的一側。蓋體320固定於安裝凸部312遠離組裝板部311的一側,並與安裝凸部312共同形成一夾持槽330。 The movable seat 300 is movably disposed on the first seat 110, for example, along the movable directions M1 and M2. Specifically, in this embodiment, the movable seat 300 includes a slider 310 and a cover 320. The slider 310 includes, for example, an assembly plate portion 311, a mounting protrusion 312, a supporting protrusion 313, and a sleeve portion 314. The assembly plate portion 311 is slidably disposed on the first seat 110 along the movable directions M1 and M2. The mounting protrusion 312 protrudes from a side of the assembly plate portion 311 away from the first seat 110. The supporting protrusion 313 protrudes from a side of the mounting protrusion 312 and is disposed on the second seat 120. The sleeve portion 314 is disposed on a side of the supporting protrusion 313 away from the mounting protrusion 312. The cover body 320 is fixed to a side of the mounting protrusion 312 away from the assembly plate portion 311, and together with the mounting protrusion 312, forms a clamping groove 330.

此外,組裝板部311包含一凹槽3110及一限位槽3111。凹槽3110及限位槽3111位於組裝板部311靠近第一座體110的一側。限位件350凸出於第一座體110靠近滑塊310的一側,並位於限位槽3111中。限位槽3111的一側表面3112位於限位件350的一側。此外,限位件350例如為螺絲。 In addition, the assembly plate portion 311 includes a groove 3110 and a limiting groove 3111. The groove 3110 and the limiting groove 3111 are located on a side of the assembly plate portion 311 close to the first base 110. The limiting member 350 protrudes from a side of the first base 110 close to the slider 310 and is located in the limiting groove 3111. A side surface 3112 of the limiting groove 3111 is located on one side of the limiting member 350. In addition, the limiting member 350 is, for example, a screw.

活動座300更包含一第二限位面301。第二限位面301由組裝板部311及安裝凸部312共同形成。第二限位面301介於限位槽3111的側表面3112及第一限位面121之間。 The movable seat 300 further includes a second limiting surface 301. The second limiting surface 301 is formed by the assembly plate portion 311 and the mounting protrusion 312. The second limiting surface 301 is between the side surface 3112 of the limiting groove 3111 and the first limiting surface 121.

於本實施例中,供緊固件250設置的凹槽111位於固定座100遠離活動座300的一側。也就是說,緊固件250設置於固定座100遠離活動座300的一側。 In this embodiment, the groove 111 for the fastener 250 is located on a side of the fixed base 100 away from the movable base 300. In other words, the fastener 250 is located on a side of the fixed base 100 away from the movable base 300.

請參閱圖4及圖5,圖4為圖1中的可活動式探針裝置的上視圖。圖5為圖4中的可活動式探針裝置的局部放大圖。 Please refer to Figures 4 and 5. Figure 4 is a top view of the movable probe device in Figure 1. Figure 5 is a partial enlarged view of the movable probe device in Figure 4.

於本實施例中,尺規200包含沿直線排列的多個刻度201。進一步來說,這些刻度201的一排列方向A例如平行於活動座300相對固定座100的活動方向M1、M2。因此,能更有效地利用固定座100上的空間,而進一步減小可活動式探針裝置 10的整體尺寸。然,於其他實施例中,若對於減小可活動式探針裝置的整體尺寸之要求較低,刻度的排列方向亦可與活動座的活動方向不平行。 In this embodiment, the ruler 200 includes a plurality of scales 201 arranged along a straight line. Further, an arrangement direction A of these scales 201 is, for example, parallel to the movable directions M1 and M2 of the movable seat 300 relative to the fixed seat 100. Therefore, the space on the fixed seat 100 can be more effectively utilized, and the overall size of the movable probe device 10 can be further reduced. However, in other embodiments, if the requirement for reducing the overall size of the movable probe device is lower, the arrangement direction of the scales may not be parallel to the movable direction of the movable seat.

此外,安裝凸部312例如包含一指示凸部3120。指示凸部3120設置於這些刻度201上方。於圖5中,指示凸部3120例如位於標記為15的刻度201上方。 In addition, the mounting protrusion 312 includes, for example, an indicating protrusion 3120. The indicating protrusion 3120 is disposed above these scales 201. In FIG. 5 , the indicating protrusion 3120 is, for example, located above the scale 201 marked as 15.

請參閱圖3及圖6,圖6為沿圖4中的割面線6-6繪製的剖面示意圖。 Please refer to Figure 3 and Figure 6. Figure 6 is a schematic cross-sectional view drawn along the cutting line 6-6 in Figure 4.

定位組件370包含一螺絲371及一墊片372。墊片372設置於凹槽3110中,並凸出於組裝板部311靠近第一座體110的一側。螺絲371螺鎖於墊片372,而使得墊片372抵靠於第一座體110。如此一來,便能固定活動座300相對固定座100的位置。螺絲371例如可為手轉螺絲以方便操作。需注意的是,當需要調整活動座300相對固定座100的位置時,只要轉動螺絲371便能釋放墊片372抵靠於第一座體110的狀態,而使得活動座300能相對固定座100活動。 The positioning assembly 370 includes a screw 371 and a gasket 372. The gasket 372 is disposed in the groove 3110 and protrudes from a side of the assembly plate portion 311 close to the first seat body 110. The screw 371 is screwed on the gasket 372, so that the gasket 372 abuts against the first seat body 110. In this way, the position of the movable seat 300 relative to the fixed seat 100 can be fixed. The screw 371 can be a hand-turned screw for easy operation. It should be noted that when it is necessary to adjust the position of the movable seat 300 relative to the fixed seat 100, just turn the screw 371 to release the state of the gasket 372 abutting against the first seat body 110, so that the movable seat 300 can move relative to the fixed seat 100.

探針400穿設於夾持槽330,而受蓋體320及安裝凸部312夾持,進而使探針400更穩固地設置於活動座300。此外,探針400受支撐凸部313支撐並穿設於套筒部314。於其他實施例中,活動座亦可無須包含蓋體320,而令探針直接承靠於安裝凸部。 The probe 400 is inserted into the clamping groove 330 and clamped by the cover 320 and the mounting protrusion 312, so that the probe 400 is more stably installed on the movable seat 300. In addition, the probe 400 is supported by the supporting protrusion 313 and inserted into the sleeve portion 314. In other embodiments, the movable seat may not include the cover 320, and the probe may be directly supported on the mounting protrusion.

以下,將說明活動座300相對固定座100的活動方 式。請參閱圖7至圖10,圖7至圖10為呈現活動座相對固定座活動的上視圖。 The following will describe the movement of the movable seat 300 relative to the fixed seat 100. Please refer to Figures 7 to 10, which are top views showing the movement of the movable seat relative to the fixed seat.

首先,如圖7及圖8所示,活動座300相對固定座100沿活動方向M1活動,而使得指示凸部3120位於標記為30的刻度201上方。此時,第一限位面121及第二限位面301彼此抵靠,而使得活動座300受第二座體120限位。如此一來,便能防止活動座300從固定座100脫落。 First, as shown in FIG. 7 and FIG. 8 , the movable seat 300 moves relative to the fixed seat 100 along the moving direction M1, so that the indicating protrusion 3120 is located above the scale 201 marked as 30. At this time, the first limiting surface 121 and the second limiting surface 301 abut against each other, so that the movable seat 300 is limited by the second seat body 120. In this way, the movable seat 300 can be prevented from falling off from the fixed seat 100.

接著,如圖9及圖10所示,活動座300相對固定座100沿活動方向M2活動,而使得指示凸部3120位於標記為0的刻度201上方。活動方向M2相反於圖7中的活動方向M1。此時,限位件350會靠近限位槽3111的側表面3112。應理解的是,若活動座300進一步沿活動方向M2活動,則限位件350會抵靠於限位件350,而使得活動座300受限位件350限位。如此一來,便能防止活動座300從固定座100脫落。 Next, as shown in FIG9 and FIG10, the movable seat 300 moves relative to the fixed seat 100 along the moving direction M2, so that the indicating protrusion 3120 is located above the scale 201 marked as 0. The moving direction M2 is opposite to the moving direction M1 in FIG7. At this time, the limiting member 350 will approach the side surface 3112 of the limiting groove 3111. It should be understood that if the movable seat 300 further moves along the moving direction M2, the limiting member 350 will abut against the limiting member 350, so that the movable seat 300 is limited by the limiting member 350. In this way, the movable seat 300 can be prevented from falling off from the fixed seat 100.

在本實施例中,本發明之伺服器係可用於人工智慧(Artificial Intelligence,簡稱AI)運算、邊緣運算(edge computing),亦可當作5G伺服器、雲端伺服器或車聯網伺服器使用。 In this embodiment, the server of the present invention can be used for artificial intelligence (AI) computing, edge computing, and can also be used as a 5G server, cloud server or car networking server.

根據上述實施例所揭露之可活動式探針裝置,由於尺規包含沿直線排列的刻度,因此可活動式探針裝置的整體尺寸得以減小。如此一來,可活動式探針裝置便能在較狹小的空間中進行量測,且不容易與其他結構干涉,進而使得可活動式探針裝置的測量範圍和效率得到改善。舉例來說,由於可活動式探針裝 置的整體尺寸減小,因此可活動式探針裝置不僅能於不同尺寸的伺服器機殼中進行量測,也能於伺服器機殼各種形狀的區域中進行量測。 According to the movable probe device disclosed in the above embodiment, since the ruler includes scales arranged along a straight line, the overall size of the movable probe device is reduced. In this way, the movable probe device can be measured in a smaller space and is not easy to interfere with other structures, thereby improving the measurement range and efficiency of the movable probe device. For example, since the overall size of the movable probe device is reduced, the movable probe device can not only measure in server housings of different sizes, but also in areas of various shapes of the server housing.

此外,根據本發明的可活動式探針裝置在使用時,僅需根據直線排列的刻度調整好活動座相對固定座的位置,再利用緊固件將可活動式探針裝置例如固定至伺服器機殼,便可進行靜電放電輻射之量測。因此,省去了每次量測時皆須歸零的繁瑣流程,且操作起來方便簡單,這節省了調整可活動式探針裝置的時間,進而提高量測效率及精準度。 In addition, when using the movable probe device of the present invention, it is only necessary to adjust the position of the movable seat relative to the fixed seat according to the linear scale, and then use the fasteners to fix the movable probe device to the server case, for example, to measure the electrostatic discharge radiation. Therefore, the cumbersome process of returning to zero every time measurement is omitted, and the operation is convenient and simple, which saves the time of adjusting the movable probe device, thereby improving the measurement efficiency and accuracy.

雖然本發明以前述之諸項實施例揭露如上,然其並非用以限定本發明,任何熟習相像技藝者,在不脫離本發明之精神和範圍內,當可作些許之更動與潤飾,因此本發明之專利保護範圍須視本說明書所附之申請專利範圍所界定者為準。 Although the present invention is disclosed as above by the aforementioned embodiments, they are not used to limit the present invention. Anyone familiar with similar techniques can make some changes and modifications without departing from the spirit and scope of the present invention. Therefore, the scope of patent protection of the present invention shall be subject to the scope of the patent application attached to this specification.

10:可活動式探針裝置 10: Movable probe device

100:固定座 100: Fixed seat

200:尺規 200: Ruler

300:活動座 300: movable seat

370:定位組件 370: Positioning assembly

400:探針 400:Probe

Claims (9)

一種可活動式探針裝置,包含:一固定座;一尺規,設置於該固定座並包含沿直線排列的多個刻度;一活動座,可活動地設置於該固定座,其中該活動座包含一滑塊及一蓋體,該蓋體固定於該滑塊的一側,該蓋體與該滑塊共同形成一夾持槽;以及一探針,固定於該活動座,該探針穿設於該夾持槽,而受該蓋體及該滑塊夾持。A movable probe device comprises: a fixed seat; a ruler, which is arranged on the fixed seat and comprises a plurality of scales arranged along a straight line; a movable seat, which is movably arranged on the fixed seat, wherein the movable seat comprises a slider and a cover body, the cover body is fixed to one side of the slider, and the cover body and the slider together form a clamping groove; and a probe, which is fixed to the movable seat, the probe is inserted into the clamping groove and clamped by the cover body and the slider. 如請求項1所述之可活動式探針裝置,其中該些刻度的一排列方向平行於該活動座相對該固定座的一活動方向。A movable probe device as described in claim 1, wherein an arrangement direction of the scales is parallel to a movement direction of the movable base relative to the fixed base. 如請求項1所述之可活動式探針裝置,其中該活動座的該滑塊包含一組裝板部、一安裝凸部、一支撐凸部及一套筒部,該組裝板部可滑動地設置於該固定座,該安裝凸部凸出於該組裝板部遠離該固定座的一側,該支撐凸部凸出於該安裝凸部的一側,該套筒部設置於該支撐凸部遠離該安裝凸部的一側,該蓋體固定於該安裝凸部遠離該組裝板部的一側,並與該安裝凸部共同形成該夾持槽,該探針受該支撐凸部支撐並穿設於該套筒部。A movable probe device as described in claim 1, wherein the slide block of the movable seat includes an assembly plate portion, a mounting protrusion, a supporting protrusion and a sleeve portion, the assembly plate portion can be slidably arranged on the fixed seat, the mounting protrusion protrudes from a side of the assembly plate portion away from the fixed seat, the supporting protrusion protrudes from a side of the mounting protrusion, the sleeve portion is arranged on a side of the supporting protrusion away from the mounting protrusion, the cover body is fixed to a side of the mounting protrusion away from the assembly plate portion, and together with the mounting protrusion forms the clamping groove, the probe is supported by the supporting protrusion and passed through the sleeve portion. 如請求項1所述之可活動式探針裝置,更包含一限位件,該限位件凸出於該固定座靠近該活動座的一側,該活動座包含一限位槽,該限位件位於該限位槽中,該限位槽的一側表面位於該限位件的一側,該限位槽的該側表面用以抵靠於該限位件,而使得該活動座受該限位件限位。The movable probe device as described in claim 1 further includes a limiting member, which protrudes from a side of the fixed seat close to the movable seat. The movable seat includes a limiting groove, in which the limiting member is located. A side surface of the limiting groove is located on one side of the limiting member. The side surface of the limiting groove is used to abut against the limiting member, so that the movable seat is limited by the limiting member. 如請求項4所述之可活動式探針裝置,其中該固定座包含一第一座體及一第二座體,該第二座體設置於該第一座體的一側,該尺規設置於該第一座體,該活動座可活動的設置於該第一座體,該限位件位於該第一座體,該第二座體包含一第一限位面,該活動座更包含一第二限位面,該第二限位面介於該限位槽的該側表面及該第一限位面之間,該第一限位面及該第二限位面用以彼此抵靠,而使得該活動座受該第二座體限位。A movable probe device as described in claim 4, wherein the fixed seat includes a first seat and a second seat, the second seat is arranged on one side of the first seat, the ruler is arranged on the first seat, the movable seat is movably arranged on the first seat, the limiting member is located on the first seat, the second seat includes a first limiting surface, and the movable seat further includes a second limiting surface, the second limiting surface is between the side surface of the limiting groove and the first limiting surface, the first limiting surface and the second limiting surface are used to abut against each other, so that the movable seat is limited by the second seat. 如請求項1所述之可活動式探針裝置,更包含一定位組件,該定位組件包含一螺絲及一墊片,該墊片凸出於該活動座靠近該固定座的一側,該螺絲螺鎖於該墊片而使得該墊片抵靠於該固定座。The movable probe device as described in claim 1 further includes a positioning assembly, which includes a screw and a gasket. The gasket protrudes from a side of the movable seat close to the fixed seat, and the screw is screwed into the gasket so that the gasket rests against the fixed seat. 如請求項1所述之可活動式探針裝置,更包含至少一緊固件,該至少一緊固件設置於該固定座遠離該活動座的一側。The movable probe device as described in claim 1 further includes at least one fastener, which is arranged on a side of the fixed base away from the movable base. 如請求項7所述之可活動式探針裝置,其中該至少一緊固件為磁鐵。A movable probe device as described in claim 7, wherein the at least one fastener is a magnet. 如請求項8所述之可活動式探針裝置,其中該固定座包含至少一凹槽,至少一凹槽位於該固定座遠離該活動座的一側,該至少一緊固件設置於該至少一凹槽中。A movable probe device as described in claim 8, wherein the fixed base includes at least one groove, the at least one groove is located on a side of the fixed base away from the movable base, and the at least one fastener is disposed in the at least one groove.
TW113122446A 2024-06-18 2024-06-18 Movable probe device TWI884001B (en)

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CN111736047A (en) * 2020-04-17 2020-10-02 中国兵器工业火炸药工程与安全技术研究院 Experimental device and experimental method based on electrostatic discharge transient field intensity measurement system
CN218240246U (en) * 2022-07-01 2023-01-06 深圳市汽联检测工程技术有限公司 Electrostatic discharge simulator capable of being remotely controlled
TW202415144A (en) * 2022-09-16 2024-04-01 英業達股份有限公司 Electrostatic discharge measurement device and electrostatic discharge measurement method

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070139050A1 (en) * 2005-12-20 2007-06-21 Dell Products L.P. Electrostatic discharge transient and frequency spectrum measurement of gap discharge
CN103238076A (en) * 2010-10-22 2013-08-07 大科防静电技术咨询(深圳)有限公司 Test pin array with electrostatic discharge (ESD) protection
CN206773094U (en) * 2017-04-14 2017-12-19 深圳立讯检测股份有限公司 A kind of electrostatic discharge testing testing stand
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