TWI884001B - Movable probe device - Google Patents
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- TWI884001B TWI884001B TW113122446A TW113122446A TWI884001B TW I884001 B TWI884001 B TW I884001B TW 113122446 A TW113122446 A TW 113122446A TW 113122446 A TW113122446 A TW 113122446A TW I884001 B TWI884001 B TW I884001B
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Abstract
Description
本發明係關於一種可活動式探針裝置,特別係關於一種包含尺規的可活動式探針裝置。 The present invention relates to a movable probe device, and in particular to a movable probe device comprising a ruler.
為了確認伺服器特定空間中的靜電放電(ESD)輻射之強度,通常會使用ESD輻射場強計來進行量測。於傳統的ESD輻射場強計中,係將圓尺規設置於固定座上,並將探針設置在透過旋鈕調整位置的移動平台上。 In order to confirm the intensity of electrostatic discharge (ESD) radiation in a specific space of a server, an ESD radiation field strength meter is usually used for measurement. In a traditional ESD radiation field strength meter, a circular ruler is set on a fixed base, and the probe is set on a moving platform whose position is adjusted by a knob.
然,圓尺規的設計使得ESD輻射場強計整體的尺寸較大,而無法在較狹小的空間中進行量測,或是容易與其他結構干涉。因此,會使得ESD輻射場強計的測量範圍和效率受到限制。 However, the circular ruler design makes the overall size of the ESD radiation field strength meter larger, and it cannot be measured in a smaller space, or it is easy to interfere with other structures. Therefore, the measurement range and efficiency of the ESD radiation field strength meter are limited.
本發明在於提供一種可活動式探針裝置,包含刻度沿直線排列的尺規以減小可活動式探針裝置的整體尺寸,進而改善可活動式探針裝置的測量範圍和效率。 The present invention provides a movable probe device, comprising a ruler with graduations arranged along a straight line to reduce the overall size of the movable probe device, thereby improving the measurement range and efficiency of the movable probe device.
本發明一實施例所揭露之可活動式探針裝置包含一固定座、一尺規、一活動座以及一探針。尺規設置於固定座並包含沿直線排列的多個刻度。活動座可活動地設置於固定座。探針固定於活動座。 The movable probe device disclosed in an embodiment of the present invention includes a fixed seat, a ruler, a movable seat and a probe. The ruler is arranged on the fixed seat and includes a plurality of scales arranged along a straight line. The movable seat can be movably arranged on the fixed seat. The probe is fixed on the movable seat.
根據上述實施例所揭露之可活動式探針裝置,由於尺規包含沿直線排列的刻度,因此可活動式探針裝置的整體尺寸得以減小。如此一來,可活動式探針裝置便能在較狹小的空間中進行量測,且不容易與其他結構干涉,進而使得可活動式探針裝置的測量範圍和效率得到改善。 According to the movable probe device disclosed in the above embodiment, since the ruler includes scales arranged along a straight line, the overall size of the movable probe device is reduced. In this way, the movable probe device can be measured in a smaller space and is not easy to interfere with other structures, thereby improving the measurement range and efficiency of the movable probe device.
10:可活動式探針裝置 10: Movable probe device
100:固定座 100: Fixed seat
110:第一座體 110: The first seat
111:凹槽 111: Groove
120:第二座體 120: Second seat
121:第一限位面 121: First limit surface
200:尺規 200: Ruler
250:緊固件 250: Fasteners
300:活動座 300: movable seat
301:第二限位面 301: Second limiting surface
310:滑塊 310: Slider
311:組裝板部 311: Assembly board
3110:凹槽 3110: Groove
3111:限位槽 3111: Limiting slot
3112:側表面 3112: Side surface
312:安裝凸部 312: Mounting convex part
3120:指示凸部 3120:Indicate convex part
313:支撐凸部 313: Supporting convex part
314:套筒部 314: Sleeve part
320:蓋體 320: Cover
330:夾持槽 330: Clamping slot
350:限位件 350: Limiting parts
370:定位組件 370: Positioning assembly
371:螺絲 371:Screw
372:墊片 372: Gasket
400:探針 400:Probe
M1,M2:活動方向 M1,M2: Activity direction
A:排列方向 A: Arrangement direction
圖1為根據本發明一實施例的可活動式探針裝置的立體圖。 Figure 1 is a three-dimensional diagram of a movable probe device according to an embodiment of the present invention.
圖2為圖1中的可活動式探針裝置的立體分解圖。 Figure 2 is a three-dimensional exploded view of the movable probe device in Figure 1.
圖3為圖1中的可活動式探針裝置於另一視角的立體分解圖。 Figure 3 is a three-dimensional exploded view of the movable probe device in Figure 1 from another viewing angle.
圖4為圖1中的可活動式探針裝置的上視圖。 Figure 4 is a top view of the movable probe device in Figure 1.
圖5為圖4中的可活動式探針裝置的局部放大圖。 Figure 5 is a partial enlarged view of the movable probe device in Figure 4.
圖6為沿圖4中的割面線6-6繪製的剖面示意圖。 Figure 6 is a schematic cross-sectional view drawn along the cutting line 6-6 in Figure 4.
圖7至圖10為呈現活動座相對固定座活動的上視圖。 Figures 7 to 10 are top views showing the movement of the movable seat relative to the fixed seat.
以下在實施方式中詳細敘述本發明之實施例之詳細特徵以及優點,其內容足以使任何本領域中具通常知識者了解本發明之實施例之技術內容並據以實施,且根據本說明書所揭露之內容、申請專利範圍及圖式,任何本領域中具通常知識者可輕易地理解本發明相關之目的及優點。以下之實施例係進一步詳細說明本發明之觀點,但非以任何觀點限制本發明之範疇。 The detailed features and advantages of the embodiments of the present invention are described in detail in the following implementation method. The content is sufficient to enable any person with ordinary knowledge in the field to understand the technical content of the embodiments of the present invention and implement it accordingly. According to the content disclosed in this specification, the scope of the patent application and the drawings, any person with ordinary knowledge in the field can easily understand the relevant purposes and advantages of the present invention. The following embodiments are to further illustrate the viewpoints of the present invention, but do not limit the scope of the present invention by any viewpoint.
請參閱圖1至圖3,圖1為根據本發明一實施例的 可活動式探針裝置的立體圖。圖2為圖1中的可活動式探針裝置的立體分解圖。圖3為圖1中的可活動式探針裝置於另一視角的立體分解圖。 Please refer to Figures 1 to 3. Figure 1 is a three-dimensional view of a movable probe device according to an embodiment of the present invention. Figure 2 is a three-dimensional exploded view of the movable probe device in Figure 1. Figure 3 is a three-dimensional exploded view of the movable probe device in Figure 1 from another viewing angle.
於本實施例中,可活動式探針裝置10例如為靜電放電(ESD)輻射場強計,並包含一固定座100、一尺規200、二緊固件250、一活動座300、一限位件350、一定位組件370以及一探針400。
In this embodiment, the
於本實施例中,固定座100包含一第一座體110及一第二座體120。第二座體120設置於第一座體110的一側。第一座體110包含二凹槽111。第二座體120包含一第一限位面121。
In this embodiment, the
尺規200設置於第一座體110。二緊固件250例如為磁鐵,並分別設置於二凹槽111中。二緊固件250例如吸附於伺服器機殼,以將可活動式探針裝置10固定於伺服器機殼。於其他實施例中,緊固件250及凹槽111的數量亦可皆為單個。此外,於再其他實施例中,可活動式探針裝置亦可無須包含緊固件250,且固定座亦可無須包含凹槽111;在這樣的實施例中,可改成透過外部元件將可活動式探針裝置固定於伺服器機殼。
The
活動座300例如沿活動方向M1、M2可活動地設置於第一座體110。詳細來說,於本實施例中,活動座300包含一滑塊310及一蓋體320。滑塊310例如包含一組裝板部311、一安裝凸部312、一支撐凸部313及一套筒部314。組裝板部311沿活動方向M1、M2可滑動地設置於第一座體110。安裝凸部312凸
出於組裝板部311遠離第一座體110的一側。支撐凸部313凸出於安裝凸部312的一側,並設置於第二座體120。套筒部314設置於支撐凸部313遠離安裝凸部312的一側。蓋體320固定於安裝凸部312遠離組裝板部311的一側,並與安裝凸部312共同形成一夾持槽330。
The
此外,組裝板部311包含一凹槽3110及一限位槽3111。凹槽3110及限位槽3111位於組裝板部311靠近第一座體110的一側。限位件350凸出於第一座體110靠近滑塊310的一側,並位於限位槽3111中。限位槽3111的一側表面3112位於限位件350的一側。此外,限位件350例如為螺絲。
In addition, the
活動座300更包含一第二限位面301。第二限位面301由組裝板部311及安裝凸部312共同形成。第二限位面301介於限位槽3111的側表面3112及第一限位面121之間。
The
於本實施例中,供緊固件250設置的凹槽111位於固定座100遠離活動座300的一側。也就是說,緊固件250設置於固定座100遠離活動座300的一側。
In this embodiment, the
請參閱圖4及圖5,圖4為圖1中的可活動式探針裝置的上視圖。圖5為圖4中的可活動式探針裝置的局部放大圖。 Please refer to Figures 4 and 5. Figure 4 is a top view of the movable probe device in Figure 1. Figure 5 is a partial enlarged view of the movable probe device in Figure 4.
於本實施例中,尺規200包含沿直線排列的多個刻度201。進一步來說,這些刻度201的一排列方向A例如平行於活動座300相對固定座100的活動方向M1、M2。因此,能更有效地利用固定座100上的空間,而進一步減小可活動式探針裝置
10的整體尺寸。然,於其他實施例中,若對於減小可活動式探針裝置的整體尺寸之要求較低,刻度的排列方向亦可與活動座的活動方向不平行。
In this embodiment, the
此外,安裝凸部312例如包含一指示凸部3120。指示凸部3120設置於這些刻度201上方。於圖5中,指示凸部3120例如位於標記為15的刻度201上方。
In addition, the mounting
請參閱圖3及圖6,圖6為沿圖4中的割面線6-6繪製的剖面示意圖。 Please refer to Figure 3 and Figure 6. Figure 6 is a schematic cross-sectional view drawn along the cutting line 6-6 in Figure 4.
定位組件370包含一螺絲371及一墊片372。墊片372設置於凹槽3110中,並凸出於組裝板部311靠近第一座體110的一側。螺絲371螺鎖於墊片372,而使得墊片372抵靠於第一座體110。如此一來,便能固定活動座300相對固定座100的位置。螺絲371例如可為手轉螺絲以方便操作。需注意的是,當需要調整活動座300相對固定座100的位置時,只要轉動螺絲371便能釋放墊片372抵靠於第一座體110的狀態,而使得活動座300能相對固定座100活動。
The
探針400穿設於夾持槽330,而受蓋體320及安裝凸部312夾持,進而使探針400更穩固地設置於活動座300。此外,探針400受支撐凸部313支撐並穿設於套筒部314。於其他實施例中,活動座亦可無須包含蓋體320,而令探針直接承靠於安裝凸部。
The
以下,將說明活動座300相對固定座100的活動方
式。請參閱圖7至圖10,圖7至圖10為呈現活動座相對固定座活動的上視圖。
The following will describe the movement of the
首先,如圖7及圖8所示,活動座300相對固定座100沿活動方向M1活動,而使得指示凸部3120位於標記為30的刻度201上方。此時,第一限位面121及第二限位面301彼此抵靠,而使得活動座300受第二座體120限位。如此一來,便能防止活動座300從固定座100脫落。
First, as shown in FIG. 7 and FIG. 8 , the
接著,如圖9及圖10所示,活動座300相對固定座100沿活動方向M2活動,而使得指示凸部3120位於標記為0的刻度201上方。活動方向M2相反於圖7中的活動方向M1。此時,限位件350會靠近限位槽3111的側表面3112。應理解的是,若活動座300進一步沿活動方向M2活動,則限位件350會抵靠於限位件350,而使得活動座300受限位件350限位。如此一來,便能防止活動座300從固定座100脫落。
Next, as shown in FIG9 and FIG10, the
在本實施例中,本發明之伺服器係可用於人工智慧(Artificial Intelligence,簡稱AI)運算、邊緣運算(edge computing),亦可當作5G伺服器、雲端伺服器或車聯網伺服器使用。 In this embodiment, the server of the present invention can be used for artificial intelligence (AI) computing, edge computing, and can also be used as a 5G server, cloud server or car networking server.
根據上述實施例所揭露之可活動式探針裝置,由於尺規包含沿直線排列的刻度,因此可活動式探針裝置的整體尺寸得以減小。如此一來,可活動式探針裝置便能在較狹小的空間中進行量測,且不容易與其他結構干涉,進而使得可活動式探針裝置的測量範圍和效率得到改善。舉例來說,由於可活動式探針裝 置的整體尺寸減小,因此可活動式探針裝置不僅能於不同尺寸的伺服器機殼中進行量測,也能於伺服器機殼各種形狀的區域中進行量測。 According to the movable probe device disclosed in the above embodiment, since the ruler includes scales arranged along a straight line, the overall size of the movable probe device is reduced. In this way, the movable probe device can be measured in a smaller space and is not easy to interfere with other structures, thereby improving the measurement range and efficiency of the movable probe device. For example, since the overall size of the movable probe device is reduced, the movable probe device can not only measure in server housings of different sizes, but also in areas of various shapes of the server housing.
此外,根據本發明的可活動式探針裝置在使用時,僅需根據直線排列的刻度調整好活動座相對固定座的位置,再利用緊固件將可活動式探針裝置例如固定至伺服器機殼,便可進行靜電放電輻射之量測。因此,省去了每次量測時皆須歸零的繁瑣流程,且操作起來方便簡單,這節省了調整可活動式探針裝置的時間,進而提高量測效率及精準度。 In addition, when using the movable probe device of the present invention, it is only necessary to adjust the position of the movable seat relative to the fixed seat according to the linear scale, and then use the fasteners to fix the movable probe device to the server case, for example, to measure the electrostatic discharge radiation. Therefore, the cumbersome process of returning to zero every time measurement is omitted, and the operation is convenient and simple, which saves the time of adjusting the movable probe device, thereby improving the measurement efficiency and accuracy.
雖然本發明以前述之諸項實施例揭露如上,然其並非用以限定本發明,任何熟習相像技藝者,在不脫離本發明之精神和範圍內,當可作些許之更動與潤飾,因此本發明之專利保護範圍須視本說明書所附之申請專利範圍所界定者為準。 Although the present invention is disclosed as above by the aforementioned embodiments, they are not used to limit the present invention. Anyone familiar with similar techniques can make some changes and modifications without departing from the spirit and scope of the present invention. Therefore, the scope of patent protection of the present invention shall be subject to the scope of the patent application attached to this specification.
10:可活動式探針裝置 10: Movable probe device
100:固定座 100: Fixed seat
200:尺規 200: Ruler
300:活動座 300: movable seat
370:定位組件 370: Positioning assembly
400:探針 400:Probe
Claims (9)
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| TW113122446A TWI884001B (en) | 2024-06-18 | 2024-06-18 | Movable probe device |
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| CN218240246U (en) * | 2022-07-01 | 2023-01-06 | 深圳市汽联检测工程技术有限公司 | Electrostatic discharge simulator capable of being remotely controlled |
| TW202415144A (en) * | 2022-09-16 | 2024-04-01 | 英業達股份有限公司 | Electrostatic discharge measurement device and electrostatic discharge measurement method |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| US20070139050A1 (en) * | 2005-12-20 | 2007-06-21 | Dell Products L.P. | Electrostatic discharge transient and frequency spectrum measurement of gap discharge |
| CN103238076A (en) * | 2010-10-22 | 2013-08-07 | 大科防静电技术咨询(深圳)有限公司 | Test pin array with electrostatic discharge (ESD) protection |
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