TWI884088B - Wafer cold-expansion apparatus - Google Patents
Wafer cold-expansion apparatus Download PDFInfo
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本發明涉及一種晶圓冷擴設備,尤其涉及一種晶對藍膜進行冷卻加工的晶圓冷擴設備。The present invention relates to a wafer cooling and expansion device, and in particular to a wafer cooling and expansion device for performing cooling processing on a blue film.
現有的晶圓冷擴設備都是著重於如何對晶圓進行加工,以實現所述晶片的裂片作業,但此種架構已遇到發展瓶頸且逐漸無法符合日新月異的半導體進展。於是,本發明人認為上述缺陷可改善,乃特潛心研究並配合科學原理的運用,終於提出一種設計合理且有效改善上述缺陷的本發明。Existing wafer cooling and expansion equipment focuses on how to process the wafer to achieve the chip splitting operation, but this architecture has encountered a development bottleneck and is gradually unable to keep up with the ever-changing semiconductor progress. Therefore, the inventor believes that the above defects can be improved, and has conducted intensive research and applied scientific principles to finally propose a reasonable design and effective improvement of the above defects.
本發明實施例在於提供一種晶圓冷擴設備,其能有效地改善現有晶圓冷擴設備所可能產生的缺陷。The embodiment of the present invention provides a wafer cooling and expansion device, which can effectively improve the defects that may be produced by the existing wafer cooling and expansion device.
本發明實施例公開一種晶圓冷擴設備,其用於對黏接在一藍膜的正面的一晶圓進行一裂片作業,所述晶圓冷擴設備包括:一工作台,形成有呈貫穿狀的一作業孔;其中,所述工作台用以供所述藍膜設置,以使所述晶圓的位置對應於所述作業孔;一遮罩模組,安裝於所述工作台之上;其中所述遮罩模組與所述工作台用於壓迫固定於所述藍膜的周緣,以使所述遮罩模組與所述藍膜的所述正面共同形成一上作業空間,其容納所述晶圓於其內;一升降機構,對應於所述工作台設置,並且所述遮罩模組與所述升降機構分別位於所述工作台的相反兩側;以及一冷卻模組,包含有:一冷卻腔體,安裝於所述升降機構且面向所述作業孔;其中,所述冷卻腔體能通過所述升降機構而相對於所述作業孔於一冷卻位置及一壓迫位置之間移動;及一致冷機構,連通於所述冷卻腔體,並且所述致冷機構用以輸入低於0℃且露點溫度低於-10℃的一乾燥氣體至所述冷卻腔體之內;其中,當所述遮罩模組與所述藍膜形成有所述上作業空間時,所述冷卻腔體能移動至所述冷卻位置以壓抵於所述藍膜的背面而共同形成一下作業空間,其用於接收所述乾燥氣體來對所述藍膜持續地降溫一預設時間、以提升所述藍膜與所述晶圓之間的黏接強度;其中,當所述藍膜被所述下作業空間內的所述乾燥氣體降溫所述預設時間之後,所述冷卻腔體能移動上升至所述壓迫位置、以擴張拉伸所述藍膜而完成所述晶圓的所述裂片作業。The present invention discloses a wafer cold expansion device, which is used to perform a splitting operation on a wafer bonded to the front side of a blue film. The wafer cold expansion device comprises: a workbench, which is formed with a through-shaped work hole; wherein the workbench is used for setting the blue film so that the position of the wafer corresponds to the work hole; a mask module, which is installed on the workbench; wherein the mask module and the workbench are used to press and fix The invention relates to a blue film having a plurality of blue film portions, wherein the blue film has a plurality of blue film portions, and the plurality of blue film portions are provided on the blue film surface. The plurality of blue film portions are provided on the blue film surface, and the plurality of blue film portions are provided on the blue film surface. The plurality of blue film portions are provided on the blue film surface, and the plurality of blue film portions are provided on the blue film surface. The plurality of blue film portions are provided on the blue film surface, and the plurality of blue film portions are provided on the blue film surface. The lifting mechanism moves between a cooling position and a pressing position relative to the working hole; and a cooling mechanism is connected to the cooling cavity, and the cooling mechanism is used to input a dry gas with a temperature below 0°C and a dew point temperature below -10°C into the cooling cavity; wherein, when the mask module and the blue film form the upper working space, the cooling cavity can move to the cooling position to press against the The back of the blue film is used to form a lower working space for receiving the dry gas to continuously cool the blue film for a preset time to enhance the bonding strength between the blue film and the wafer; wherein, after the blue film is cooled by the dry gas in the lower working space for the preset time, the cooling chamber can move up to the compressing position to expand and stretch the blue film to complete the wafer splitting operation.
本發明實施例也公開一種晶圓冷擴設備,其用於對黏接在一藍膜的正面的一晶圓進行一裂片作業,所述晶圓冷擴設備包括:一工作台,形成有呈貫穿狀的一作業孔;其中,所述工作台用以固定所述藍膜,以使所述晶圓的位置對應於所述作業孔;一升降機構,對應於所述工作台設置;以及一冷卻模組,包含有:一冷卻腔體,安裝於所述升降機構且面向所述作業孔;其中,所述冷卻腔體能通過所述升降機構而相對於所述作業孔於一冷卻位置及一壓迫位置之間移動;及一致冷機構,連通於所述冷卻腔體,並且所述致冷機構用以輸入低於0℃且露點溫度低於-10℃的一乾燥氣體至所述冷卻腔體之內;其中,當所述工作台固定所述藍膜時,所述冷卻腔體能移動至所述冷卻位置以壓抵於所述藍膜的背面而共同形成一下作業空間,其用於接收所述乾燥氣體來對所述藍膜持續地降溫一預設時間、以提升所述藍膜與所述晶圓之間的黏接強度;其中,當所述藍膜被所述下作業空間內的所述乾燥氣體降溫所述預設時間之後,所述冷卻腔體能移動上升至所述壓迫位置、以擴張拉伸所述藍膜而完成所述晶圓的所述裂片作業。The embodiment of the present invention also discloses a wafer cooling and expansion device, which is used to perform a splitting operation on a wafer bonded to the front side of a blue film, and the wafer cooling and expansion device includes: a workbench, formed with a through-shaped working hole; wherein the workbench is used to fix the blue film so that the position of the wafer corresponds to the working hole; a lifting mechanism, which is arranged corresponding to the workbench; and a cooling module, which includes: a cooling chamber, which is installed on the lifting mechanism and faces the working hole; wherein the cooling chamber can move between a cooling position and a pressing position relative to the working hole through the lifting mechanism; and a cooling mechanism, which is connected to the cooling chamber, and The refrigeration mechanism is used to input a dry gas with a temperature lower than 0°C and a dew point temperature lower than -10°C into the cooling chamber; wherein, when the workbench fixes the blue film, the cooling chamber can move to the cooling position to press against the back of the blue film to form a lower working space, which is used to receive the dry gas to continuously cool the blue film for a preset time to enhance the bonding strength between the blue film and the wafer; wherein, after the blue film is cooled by the dry gas in the lower working space for the preset time, the cooling chamber can move up to the pressing position to expand and stretch the blue film to complete the wafer splitting operation.
綜上所述,本發明實施例所公開的晶圓冷擴設備,其通過所述冷卻模組來對所述藍膜的所述背面進行冷卻,以利於提升所述藍膜與所述晶圓之間的黏接強度,進而在以所述冷卻腔體實現所述藍膜的拉伸擴張之後,即可有效且穩定地完成所述晶圓的所述裂片作業、且有效地降低飛片情況的產生。In summary, the wafer cooling and expansion device disclosed in the embodiment of the present invention cools the back side of the blue film through the cooling module to improve the bonding strength between the blue film and the wafer. After the blue film is stretched and expanded by the cooling chamber, the wafer splitting operation can be completed effectively and stably, and the occurrence of flying wafers can be effectively reduced.
為能更進一步瞭解本發明的特徵及技術內容,請參閱以下有關本發明的詳細說明與附圖,但是此等說明與附圖僅用來說明本發明,而非對本發明的保護範圍作任何的限制。In order to further understand the features and technical contents of the present invention, please refer to the following detailed description and drawings of the present invention. However, such description and drawings are only used to illustrate the present invention and do not limit the protection scope of the present invention in any way.
以下是通過特定的具體實施例來說明本發明所公開有關「晶圓冷擴設備」的實施方式,本領域技術人員可由本說明書所公開的內容瞭解本發明的優點與效果。本發明可通過其他不同的具體實施例加以施行或應用,本說明書中的各項細節也可基於不同觀點與應用,在不悖離本發明的構思下進行各種修改與變更。另外,本發明的附圖僅為簡單示意說明,並非依實際尺寸的描繪,事先聲明。以下的實施方式將進一步詳細說明本發明的相關技術內容,但所公開的內容並非用以限制本發明的保護範圍。The following is a specific embodiment to illustrate the implementation of the "wafer cooling and expansion equipment" disclosed in the present invention. Technical personnel in this field can understand the advantages and effects of the present invention from the content disclosed in this specification. The present invention can be implemented or applied through other different specific embodiments, and the details in this specification can also be modified and changed based on different viewpoints and applications without deviating from the concept of the present invention. In addition, the drawings of the present invention are only for simple schematic illustrations and are not depicted according to actual sizes. Please note in advance. The following implementation will further explain the relevant technical content of the present invention in detail, but the disclosed content is not intended to limit the scope of protection of the present invention.
應當可以理解的是,雖然本文中可能會使用到「第一」、「第二」、「第三」等術語來描述各種元件或者特徵,但這些元件或者特徵不應受這些術語的限制。這些術語主要是用以區分一元件與另一元件,或者一特徵與另一特徵。另外,本文中所使用的術語「或」,應視實際情況可能包括相關聯的列出項目中的任一個或者多個的組合。It should be understood that, although the terms "first", "second", "third", etc. may be used herein to describe various elements or features, these elements or features should not be limited by these terms. These terms are mainly used to distinguish one element from another element, or one feature from another feature. In addition, the term "or" used herein may include any one or more combinations of the related listed items depending on the actual situation.
請參閱圖1至圖11所示,其為本發明的一實施例。如圖1至圖4所示,本實施例公開一種晶圓冷擴設備100,其用於對黏接在一藍膜200(blue tape)的正面201的一晶圓300進行一裂片作業。需先說明的是,所述藍膜200為可拉伸的材質且其也可稱為晶片黏結薄膜(die attach film,DAF),並且所述藍膜200具有黏著度可隨著其溫度降低而提高的特性。再者,適用於所述晶圓冷擴設備100的所述晶圓300,其可以是處於先經過切片(如:隱形雷射切割)而定義有多個晶片的狀態。Please refer to Figures 1 to 11, which are an embodiment of the present invention. As shown in Figures 1 to 4, this embodiment discloses a
如圖5至圖7所示,所述晶圓冷擴設備100於本實施例中包含有一工作台1、安裝於所述工作台1之上的一遮罩模組2、對應於所述工作台1設置的一升降機構3、安裝於所述工作台1之上的一冷卻模組4、及對應於所述冷卻模組4設置的一回溫機構5,但本發明不受限於此。舉例來說,於本發明未繪示的其他實施例中,所述晶圓冷擴設備100也可依據實際需求而省略所述回溫機構5。As shown in FIGS. 5 to 7 , the wafer cooling and
所述工作台1形成有呈貫穿狀的一作業孔11,並且所述工作台1用以供所述藍膜200設置,以使所述晶圓300的位置對應於所述作業孔11。此外,所述晶圓冷擴設備100可以在所述工作台1下方進一步設有一外殼6,以使所述遮罩模組2以外的構件位於所述外殼6之內。The
所述遮罩模組2與所述工作台1用於壓迫固定於所述藍膜200的周緣,以使所述遮罩模組2與所述藍膜200的所述正面201共同形成一上作業空間S1,其容納所述晶圓300於其內。需說明的是,所述遮罩模組2也可以是為所述工作台1的一部分,以使所述工作台1能用以固定所述藍膜200,但本發明不以此為限。舉例來說,於本發明未繪示的其他實施例中,所述工作台1也可依據實際需求而通過其他固定機構來實現所述藍膜200的固定,進而使所述晶圓冷擴設備100可以省略所述遮罩模組2。The
本實施例於下述內容說明所述遮罩模組2的其中一種較佳實施態樣,但不以此為限。其中,所述遮罩模組2包含有樞接於所述工作台1的一罩體21、安裝於所述罩體21外環部211的一壓迫環22、多個加壓彈性件23、安裝於所述工作台1與所述外環部211的一緊固機構24、及安裝於所述罩體21之內的一加熱機構25。The present embodiment describes one preferred embodiment of the
更詳細地說,所述罩體21的所述外環部211的一側邊樞接於所述工作台1,以使所述罩體21能相對於所述工作台1轉動(如:圖4和圖5)。再者,所述緊固機構24用於將所述外環部211的另一側邊固定在所述工作台1,以使所述壓迫環22能用於壓迫所述藍膜200的所述周緣至所述工作台1。其中,多個所述加壓彈性件23(如:彈簧)安裝於所述壓迫環22與所述罩體21的所述外環部211之間,以使所述壓迫環22能通過多各所述加壓彈性件23而提升其對所述藍膜200的壓迫力。In more detail, one side of the
此外,所述加熱機構25於本實施例中配置於所述罩體21的頂部位置,並且所述加熱機構25面向所述工作台1的所述作業孔11,以使所述加熱機構25能用以對所述罩體21內的空氣進行加熱。再者,所述加熱機構25的加熱方式(如:熱風加熱或紅外線加熱)可依據實際需求而加以調整變化,本發明在此不加以限制。In addition, the
所述遮罩模組2與所述升降機構3分別位於所述工作台1的相反兩側(如:所述遮罩模組2位於所述工作台1的上方,而所述升降機構3則是位於所述工作台1的下方),並且所述升降機構3是對應於所述冷卻模組4設置。The
所述冷卻模組4包含有安裝於所述升降機構3的一冷卻腔體41、及連通於所述冷卻腔體41的一致冷機構42。其中,所述冷卻腔體41面向所述作業孔11,並且所述冷卻腔體41能通過所述升降機構3而相對於所述作業孔11於一冷卻位置(如:圖8)及一壓迫位置(如:圖9)之間移動。再者,所述致冷機構42能用以輸入低於0℃且露點溫度低於-10℃的一乾燥氣體G至所述冷卻腔體41之內。The
依上所述,當所述遮罩模組2與所述藍膜200形成有所述上作業空間S1時,所述冷卻腔體41能(通過所述升降機構3)移動至所述冷卻位置以壓抵於所述藍膜200的背面202而共同形成一下作業空間S2(如:圖8),其用於接收所述乾燥氣體G來對所述藍膜200持續地降溫一預設時間(如:20秒~30秒)、以提升所述藍膜200與所述晶圓300之間的黏接強度。As described above, when the
再者,當所述藍膜200被所述下作業空間S2內的所述乾燥氣體G降溫所述預設時間之後,所述冷卻腔體41能(通過所述升降機構3)移動上升至所述壓迫位置(如:圖9)、以擴張拉伸所述藍膜200而完成所述晶圓300的所述裂片作業。也就是說,所述藍膜200在被拉伸擴張之後,所述晶圓300的多個所述晶片301被彼此分離,並且所述藍膜200與所述晶圓300之間的黏接強度被提升,以使得多個所述晶片301被牢固地黏著於所述藍膜200而不易產生飛片的情況。Furthermore, after the
據此,所述晶圓冷擴設備100於本實施例中通過所述冷卻模組4來對所述藍膜200的所述背面202進行冷卻,以利於提升所述藍膜200與所述晶圓300之間的黏接強度,進而在以所述冷卻腔體41實現所述藍膜200的拉伸擴張之後,即可有效且穩定地完成所述晶圓300的所述裂片作業、且有效地降低飛片情況的產生。再者,所述晶圓冷擴設備100採用了不同於以往的對所述晶圓300加工之方式,此不但突破了本領域的技術偏見、更是能夠將所述裂片作業的時程縮短至1分鐘之內,利於提升整體的產能。Accordingly, the wafer cooling and
此外,所述回溫機構5配置於所述冷卻腔體41的外側,並且所述回溫機構5於本實施例中是以包含有圍繞於所述冷卻腔體41外側的多個紅外線加熱器來說明,但本發明不受限於此。舉例來說,於本發明未繪示的其他實施例中,所述回溫機構5也可以採用吹出熱風的方式來進行所述冷卻腔體41的加熱。In addition, the
其中,當所述晶圓冷擴設備100完成所述裂片作業之後(如:圖10),所述回溫機構5能加熱所述冷卻腔體41至一待機溫度,其較佳是低於環境露點溫度15℃~18℃,據以避免所述冷卻腔體41的表面凝結出水滴、並利於進行下一次的裂片作業。Among them, after the wafer cooling and
需說明的是,為使所述冷卻模組4能夠以較短的時間對所述藍膜200的所述背面202進行均勻地冷卻、並於所述裂片作業完成後迅速回溫至所述待機溫度,所述冷卻模組4較佳是具備有下述結構特徵的至少部分,但本發明不以此為限。It should be noted that in order for the
進一步地說,如圖5至圖7所示,所述冷卻腔體41於本實施例中包含有一第一腔室R1、及呈環狀且圍繞於所述第一腔室R1周圍的一第二腔室R2。於本實施例中,所述第一腔室R1連接(或連通)於所述致冷機構42,用以接收所述致冷機構42輸出地所述乾燥氣體G(如:圖8)。再者,所述第二腔室R2連通於所述第一腔室R1的頂緣並連接(或連通)於所述致冷機構42,用以供所述乾燥氣體G回流至所述致冷機構42。Further, as shown in FIGS. 5 to 7 , the
據此,當所述冷卻腔體41移動至所述冷卻位置時(如:圖8),所述第二腔室R2的頂緣壓抵於所述藍膜200的所述背面202,以使所述第一腔室R1、所述第二腔室R2、及所述藍膜200共同形成所述下作業空間S2(或是說,此時的所述下作業空間S2包含所述第一腔室R1與所述第二腔室R2),而所述第一腔室R1的所述頂緣間隔於所述藍膜200的所述背面202且面向黏著有所述晶圓300的所述藍膜200的部位。Accordingly, when the
換個角度來看,如圖2和圖8所示,所述冷卻腔體41包含有一底板411、相連於所述底板411的一內環壁412、固定於所述內環壁412頂端的一均流板413、及相連於所述底板411且圍繞於所述內環壁412周圍的一外環壁414。於本實施例中,所述底板411連接於所述致冷機構42,並且所述內環壁412圍繞於連接所述致冷機構42的所述底板411的部位(如:所述底板411的中心部位),而所述外環壁414也連接於所述致冷機構42。也就是說,所述底板411、所述內環壁412、及所述均流板413共同構成所述第一腔室R1,並且所述底板411、所述內環壁412、及所述外環壁414共同構成所述第二腔室R2。From another perspective, as shown in FIG. 2 and FIG. 8 , the
再者,所述致冷機構42包含有用於產生所述乾燥氣體G的一致冷器421、及連接於所述致冷器421的一輸入管路422與至少一個回流管路423。其中,所述輸入管路422連接所述致冷器421與所述底板411,以供所述致冷器421所產生的所述乾燥氣體G流動至所述第一腔室R1。再者,至少一個所述回流管路423連接所述致冷器421與所述外環壁414,以供所述第二腔室R2內的所述乾燥氣體G回流至所述致冷器421。Furthermore, the
據此,當所述冷卻腔體41移動至所述冷卻位置時(如:圖8),所述外環壁414的頂端壓抵於所述藍膜200的所述背面202,以使所述第一腔室R1、所述第二腔室R2、及所述藍膜200共同形成所述下作業空間S2,而所述均流板413間隔於所述藍膜200的所述背面202且面向黏著有所述晶圓300的所述藍膜200的部位。Accordingly, when the cooling
此外,如圖11所示,所述晶圓冷擴設備100也可依據實際需求而於使所述致冷機構42連通於所述遮罩模組2;例如:所述致冷機構42增設一條所述輸入管路422,以連接於所述罩體21與所述致冷器(圖11未繪示)。據此,當所述遮罩模組2與所述藍膜200形成有所述上作業空間S1時,所述上作業空間S1能用於接收所述乾燥氣體G,據以提升所述藍膜200的降溫速度。In addition, as shown in FIG11 , the wafer cooling and
[本發明實施例的技術效果][Technical Effects of the Embodiments of the Invention]
綜上所述,本發明實施例所公開的晶圓冷擴設備,其通過所述冷卻模組來對所述藍膜的所述背面進行冷卻,以利於提升所述藍膜與所述晶圓之間的黏接強度,進而在以所述冷卻腔體實現所述藍膜的拉伸擴張之後,即可有效且穩定地完成所述晶圓的所述裂片作業、且有效地降低飛片情況的產生。In summary, the wafer cooling and expansion device disclosed in the embodiment of the present invention cools the back side of the blue film through the cooling module to improve the bonding strength between the blue film and the wafer. After the blue film is stretched and expanded by the cooling chamber, the wafer splitting operation can be completed effectively and stably, and the occurrence of flying wafers can be effectively reduced.
以上所公開的內容僅為本發明的優選可行實施例,並非因此侷限本發明的專利範圍,所以凡是運用本發明說明書及圖式內容所做的等效技術變化,均包含於本發明的專利範圍內。The above disclosed contents are only preferred feasible embodiments of the present invention and are not intended to limit the patent scope of the present invention. Therefore, all equivalent technical changes made using the contents of the specification and drawings of the present invention are included in the patent scope of the present invention.
100:晶圓冷擴設備 1:工作台 11:作業孔 2:遮罩模組 21:罩體 211:外環部 22:壓迫環 23:加壓彈性件 24:緊固機構 25:加熱機構 3:升降機構 4:冷卻模組 41:冷卻腔體 411:底板 412:內環壁 413:均流板 414:外環壁 42:致冷機構 421:致冷器 422:輸入管路 423:回流管路 5:回溫機構 6:外殼 200:藍膜 201:正面 202:背面 300:晶圓 301:晶片 S1:上作業空間 S2:下作業空間 G:乾燥氣體 R1:第一腔室 R2:第二腔室100: Wafer cooling and expansion equipment 1: Workbench 11: Working hole 2: Mask module 21: Cover body 211: Outer ring 22: Compression ring 23: Pressurized elastic part 24: Fastening mechanism 25: Heating mechanism 3: Lifting mechanism 4: Cooling module 41: Cooling chamber 411: Bottom plate 412: Inner ring wall 413: Flow plate 414: Outer ring wall 42: Refrigeration mechanism 421: Refrigerator 422: Input pipeline 423: Return pipeline 5: Reheating mechanism 6: Outer shell 200: Blue film 201: Front 202: Back 300: Wafer 301: Chip S1: Upper working space S2: Lower working space G: Dry gas R1: First chamber R2: Second chamber
圖1為本發明實施例的晶圓冷擴設備的立體示意圖。FIG1 is a three-dimensional schematic diagram of a wafer cooling and expansion device according to an embodiment of the present invention.
圖2為圖1的分解示意圖。FIG. 2 is an exploded schematic diagram of FIG. 1 .
圖3為圖1另一視角的分解示意圖。FIG. 3 is an exploded schematic diagram of FIG. 1 from another viewing angle.
圖4為本發明實施例的晶圓冷擴設備設置有藍膜與晶圓的立體示意圖。FIG. 4 is a three-dimensional schematic diagram of a wafer cooling and expansion device provided with a blue film and a wafer according to an embodiment of the present invention.
圖5為圖4的遮罩模組關閉時的立體示意圖。FIG5 is a three-dimensional schematic diagram of the mask module of FIG4 when it is closed.
圖6為圖5沿剖線VI-VI的剖視示意圖。FIG. 6 is a schematic cross-sectional view along the section line VI-VI of FIG. 5 .
圖7為圖6的局部放大示意圖。FIG. 7 is a partial enlarged schematic diagram of FIG. 6 .
圖8為圖7的後續作動示意圖。FIG8 is a schematic diagram of the subsequent operation of FIG7.
圖9為圖8的後續作動示意圖。FIG. 9 is a schematic diagram of the subsequent operation of FIG. 8 .
圖10為圖9的後續作動示意圖。FIG. 10 is a schematic diagram of the subsequent operation of FIG. 9 .
圖11為本發明實施例的晶圓冷擴設備另一態樣的剖視示意圖。FIG. 11 is a schematic cross-sectional view of another embodiment of the wafer cooling and expansion device of the present invention.
100:晶圓冷擴設備 100: Wafer cooling and expansion equipment
1:工作台 1: Workbench
11:作業孔 11: Working hole
2:遮罩模組 2: Mask module
21:罩體 21: Mask body
211:外環部 211: Outer Ring Department
22:壓迫環 22: Compression ring
23:加壓彈性件 23: Pressurized elastic parts
24:緊固機構 24: Fastening mechanism
25:加熱機構 25: Heating mechanism
3:升降機構 3: Lifting mechanism
41:冷卻腔體 41: Cooling chamber
411:底板 411: Base plate
412:內環壁 412: Inner ring wall
413:均流板 413: Current balancing plate
414:外環壁 414: Outer Ring Wall
422:輸入管路 422: Input pipeline
423:回流管路 423: Return pipe
5:回溫機構 5: Temperature recovery mechanism
6:外殼 6: Shell
200:藍膜 200: Blue film
201:正面 201: Front
202:背面 202: Back
300:晶圓 300: Wafer
S1:上作業空間 S1: Upper work space
S2:下作業空間 S2: Lower working space
G:乾燥氣體 G: Dry gas
R1:第一腔室 R1: First chamber
R2:第二腔室 R2: Second chamber
Claims (10)
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| TW113137230A TWI884088B (en) | 2024-09-30 | 2024-09-30 | Wafer cold-expansion apparatus |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW113137230A TWI884088B (en) | 2024-09-30 | 2024-09-30 | Wafer cold-expansion apparatus |
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| TWI884088B true TWI884088B (en) | 2025-05-11 |
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Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105321865A (en) * | 2014-06-13 | 2016-02-10 | 株式会社迪思科 | Tape expanding apparatus |
| WO2019130786A1 (en) * | 2017-12-28 | 2019-07-04 | 日東電工株式会社 | Dicing-tape-integrated semiconductor backing cling film |
| TW202324520A (en) * | 2021-11-30 | 2023-06-16 | 日商迪思科股份有限公司 | extension device |
-
2024
- 2024-09-30 TW TW113137230A patent/TWI884088B/en active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105321865A (en) * | 2014-06-13 | 2016-02-10 | 株式会社迪思科 | Tape expanding apparatus |
| WO2019130786A1 (en) * | 2017-12-28 | 2019-07-04 | 日東電工株式会社 | Dicing-tape-integrated semiconductor backing cling film |
| TW202324520A (en) * | 2021-11-30 | 2023-06-16 | 日商迪思科股份有限公司 | extension device |
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