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TWI883179B - Method for joining adhesive sheet, apparatus for joining adhesive sheet, and manufacturing method of semiconductor products - Google Patents

Method for joining adhesive sheet, apparatus for joining adhesive sheet, and manufacturing method of semiconductor products Download PDF

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Publication number
TWI883179B
TWI883179B TW110113912A TW110113912A TWI883179B TW I883179 B TWI883179 B TW I883179B TW 110113912 A TW110113912 A TW 110113912A TW 110113912 A TW110113912 A TW 110113912A TW I883179 B TWI883179 B TW I883179B
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adhesive sheet
sheet
attaching
wafer
forming surface
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TW110113912A
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Chinese (zh)
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TW202147507A (en
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秋月伸也
山本雅之
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日商日東電工股份有限公司
日商日東精機股份有限公司
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Priority claimed from JP2021015589A external-priority patent/JP7681408B2/en
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Publication of TWI883179B publication Critical patent/TWI883179B/en

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    • H10P72/0442
    • H10P52/00
    • H10P54/00
    • H10P72/0441
    • H10P72/7402
    • H10P72/7416

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  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
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  • Microelectronics & Electronic Packaging (AREA)
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  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)

Abstract

[課題]本發明係提供對形成有環狀凸部的半導體晶圓的環狀凸部形成面,既能夠更確實地避免在該半導體晶圓產生損傷又能夠精度佳地貼附黏著片之黏著片貼附方法、黏著片貼附裝置及半導體製品的製造方法。 [解決手段]本發明的黏著片貼附方法係具備:貼附過程,係對在一面的外周具有環狀凸部Ka的晶圓W的環狀凸部形成面附著黏著片DT而構成的片複合體M,施加比大氣壓高的壓力,藉此將黏著片DT貼附於晶圓W的環狀凸部形成面。在貼附過程中,能夠對黏著片DT施加足夠大的推壓力V1,因此,能夠大幅提升黏著片DT與晶圓W的密接力。因此,即使經過一段時間,仍能夠避免黏著片DT逐漸從晶圓W剝離。 [Topic] The present invention provides an adhesive sheet attaching method, an adhesive sheet attaching device, and a method for manufacturing a semiconductor product, which can more reliably avoid damage to the semiconductor wafer and can attach an adhesive sheet with good precision to the annular protrusion forming surface of the semiconductor wafer having an annular protrusion. [Solution] The adhesive sheet attaching method of the present invention comprises: a attaching process, wherein a pressure higher than atmospheric pressure is applied to a sheet composite M formed by attaching an adhesive sheet DT to the annular protrusion forming surface of a wafer W having an annular protrusion Ka on the outer periphery of one side, thereby attaching the adhesive sheet DT to the annular protrusion forming surface of the wafer W. During the attachment process, a sufficiently large pushing force V1 can be applied to the adhesive sheet DT, thereby greatly improving the adhesion between the adhesive sheet DT and the wafer W. Therefore, even after a period of time, the adhesive sheet DT can be prevented from gradually peeling off from the wafer W.

Description

黏著片貼附方法、黏著片貼附裝置及半導體製品的製造方法Adhesive sheet attaching method, adhesive sheet attaching device and semiconductor product manufacturing method

本發明係有關供對以半導體晶圓(以下,以「晶圓」適當稱呼)或基板作為例子的工件(work),貼附以膠帶(tape)狀的黏著材作為例子的黏著片之用的黏著片貼附方法、黏著片貼附裝置及半導體製品的製造方法。The present invention relates to an adhesive sheet attaching method, an adhesive sheet attaching device and a method for manufacturing a semiconductor product for attaching an adhesive sheet such as a tape-like adhesive material to a workpiece such as a semiconductor wafer (hereinafter referred to as "wafer") or a substrate.

在晶圓的表面形成電路圖案後,藉由背部研磨(back grind)製程研磨晶圓的背面,接著再藉由切割(dicing)製程將該晶圓分割成多個晶片零件。在背面研磨的製程中,有保留晶圓的背面外周僅研磨中央部分,而以將背部研磨區域圍起來的方式在晶圓的背面外周形成環狀凸部的情形。After forming a circuit pattern on the surface of the wafer, the back side of the wafer is ground by a back grinding process, and then the wafer is divided into multiple chip components by a dicing process. In the back grinding process, there are cases where only the center part of the back side of the wafer is ground while retaining the outer periphery of the back side of the wafer, and a ring-shaped convex portion is formed on the outer periphery of the back side of the wafer in a manner that surrounds the back grinding area.

此時,即便將晶圓的中央部薄型化了,仍藉由環狀凸部而補強,因此能夠在作業時避免變形等的發生。在背部研磨製程之後,令具有環狀凸部的晶圓載置於環形框架(ring frame)的中央,將支撐用的黏著膠帶(切割膠帶(dicing tape))遍及環形框架及晶圓的背面貼附。藉由切割膠帶的貼附,製作安裝框架(mount frame),提供至切割製程。At this time, even if the central part of the wafer is thinned, it is still reinforced by the annular protrusion, so deformation can be avoided during operation. After the back grinding process, the wafer with the annular protrusion is placed in the center of the ring frame, and the supporting adhesive tape (dicing tape) is attached to the ring frame and the back of the wafer. By attaching the dicing tape, a mount frame is made and provided to the dicing process.

就對因環狀凸部而形成有段差的晶圓貼附以切割膠帶作為例子的黏著片之方法的一例而言,有提出如下述的方法。亦即,將黏著片夾在由上下一對殼體(housing)組成的腔室(chamber)的接合部分。接著,將腔室內減壓,使壓差在藉由該黏著片而隔出的兩個空間產生,並且進行使該黏著膠帶凹入彎曲而將黏著片貼附於晶圓背面的處理。接著,在令腔室的壓差消除後,從第1推壓構件供給氣體至在環狀凸部的內側角落部沒有完全接著而浮起的黏著片的該內側角落部,藉此進行第2次貼附處理(參照專利文獻1)。 [先前技術文獻] [專利文獻] As an example of a method for attaching an adhesive sheet such as a dicing tape to a wafer having a step difference formed by an annular protrusion, the following method is proposed. That is, the adhesive sheet is clamped at the joint portion of a chamber composed of a pair of upper and lower housings. Then, the pressure in the chamber is reduced to generate a pressure difference between two spaces separated by the adhesive sheet, and the adhesive tape is bent concavely to attach the adhesive sheet to the back of the wafer. Then, after eliminating the pressure difference in the chamber, gas is supplied from the first pressing member to the inner corner of the adhesive sheet that is not completely attached to the inner corner of the annular protrusion and floats up, thereby performing a second attachment process (see Patent Document 1). [Prior art literature] [Patent literature]

專利文獻1:日本國特開2013-232582號公報Patent document 1: Japanese Patent Application Publication No. 2013-232582

[發明欲解決之課題][Problems to be solved by the invention]

然而,上述的習知技術裝置係存在如下的問題。亦即,在習知技術的黏著片貼附方法中係發生:從貼附黏著片起,隨著時間經過,黏著片從環狀凸部的內側角落部逐漸往晶圓中心剝離的問題。此外,在習知技術的黏著片貼附方法中亦發生:在將黏著片貼附於晶圓時,在晶圓發生破裂和缺損等損傷的問題。晶圓的損傷係在晶圓中的薄型化的部分、特別是環狀凸部的內側角部以比較高的頻度發生。However, the above-mentioned conventional art device has the following problems. That is, in the conventional art adhesive sheet attaching method, there occurs a problem that the adhesive sheet gradually peels off from the inner corner of the annular protrusion toward the center of the wafer as time passes after the adhesive sheet is attached. In addition, in the conventional art adhesive sheet attaching method, there also occurs a problem that when the adhesive sheet is attached to the wafer, damage such as cracks and defects occur on the wafer. The damage to the wafer occurs at a relatively high frequency in the thinned portion of the wafer, especially the inner corner of the annular protrusion.

本發明乃係鑒於如上述的情事而研創,主要目的在於提供一種對形成有環狀凸部的半導體晶圓的環狀凸部形成面,既可更確實地避免在該半導體晶圓產生損傷又能夠精度佳地貼附黏著片的黏著片貼附方法、黏著片貼附裝置及半導體製品的製造方法。 [用以解決課題之手段] The present invention is developed in view of the above-mentioned situation, and its main purpose is to provide an adhesive sheet attaching method, adhesive sheet attaching device and semiconductor product manufacturing method that can more reliably avoid damage to the annular protrusion forming surface of a semiconductor wafer having an annular protrusion, and can attach the adhesive sheet with good precision. [Means for solving the problem]

為了解決上述問題,本案發明人等研究的結果,得到如下的見解。亦即,在使用第1推壓構件進行第2次貼附處理的習知技術的構成中,作用於黏著片的力小。因此,晶圓與黏著片的密接性難以充分地提升,所以咸信黏著片因此而隨著時間的經過逐漸從晶圓剝離。To solve the above problem, the inventors of the present case have studied and obtained the following conclusions. That is, in the conventional technology of using the first pressing member for the second bonding process, the force acting on the adhesive sheet is small. Therefore, it is difficult to fully improve the adhesion between the wafer and the adhesive sheet, so it is believed that the adhesive sheet is gradually peeled off from the wafer over time.

此外,在第2次貼附處理中,相較於晶圓的中央部,對晶圓的環狀凸部的內側角落部作用比較大的推壓力。咸信起因於這樣的推壓力的不均,造成在比較大的推壓力作用的晶圓的環狀凸部的內側角落部以尤其高的頻度發生破裂或缺損。In addition, during the second bonding process, a relatively large pressure is applied to the inner corners of the annular protrusion of the wafer compared to the center of the wafer. It is believed that due to the uneven pressure, cracks or defects occur particularly frequently at the inner corners of the annular protrusion of the wafer where the relatively large pressure is applied.

此外,第1推壓構件係具備氣體供給孔,乃係以金屬或樹脂等而構成的柱狀構件。此外,在習知技術構成中,係將該第1推壓構件的底面靠近晶圓來供給氣體。因為將第1推壓構件靠近,有可能發生第1推壓構件接觸受薄型化處理而形成為凹狀的晶圓的中央部造成晶圓的薄的凹部損傷的情況。當第1推壓構件的底面的平坦性低時,咸信即使是在第1推壓構件接近晶圓的環狀凸部的內側角落部的狀態,第1推壓構件也會接觸晶圓的其他部分(例如中心部),結果在晶圓產生損傷。Furthermore, the first pushing member is a columnar member formed of metal or resin and having a gas supply hole. Furthermore, in the known technical configuration, the bottom surface of the first pushing member is brought close to the wafer to supply gas. Since the first pushing member is brought close, there is a possibility that the first pushing member contacts the central portion of the wafer that is formed into a concave shape by thinning, thereby damaging the thin concave portion of the wafer. When the flatness of the bottom surface of the first pushing member is low, it is believed that even when the first pushing member is close to the inner corner of the annular convex portion of the wafer, the first pushing member will contact other portions of the wafer (e.g., the center portion), resulting in damage to the wafer.

為了達成如上述的目的,本發明係採用如下述的構成。 亦即,本發明的黏著片貼附方法係具備下述過程:貼附過程,係對在一面的外周具有環狀凸部的工件的環狀凸部形成面附著黏著片而構成的片複合體,施加比大氣壓高的壓力,藉此將前述黏著片貼附於前述環狀凸部形成面。 In order to achieve the above-mentioned purpose, the present invention adopts the following structure. That is, the adhesive sheet attaching method of the present invention has the following process: the attaching process is to attach the adhesive sheet to the annular convex portion forming surface of the workpiece having an annular convex portion on the outer periphery of one side, and apply a pressure higher than the atmospheric pressure to the sheet composite body formed by attaching the adhesive sheet to the annular convex portion forming surface.

(作用.效果)依據上述構成,在貼附過程中,對片複合體施加比大氣壓高的壓力,藉此將黏著片貼附於工件的環狀凸部形成面。此時,能夠對黏著片施加足夠大的推壓力,因此能夠更加提升貼附在工件的黏著片與工件的環狀凸部形成面之間的密接性。因此,能夠更確實地防止經過一段時間後黏著片從工件剝離的情況發生。(Function and Effect) According to the above structure, during the attachment process, a pressure higher than atmospheric pressure is applied to the sheet composite, thereby attaching the adhesive sheet to the annular convex portion forming surface of the workpiece. At this time, a sufficiently large pushing force can be applied to the adhesive sheet, so that the close contact between the adhesive sheet attached to the workpiece and the annular convex portion forming surface of the workpiece can be further improved. Therefore, it is possible to more reliably prevent the adhesive sheet from peeling off from the workpiece after a period of time.

此外,較佳為,在上述的發明中,具備將前述片複合體收容於腔室的收容過程;前述貼附過程係在前述收容過程後,藉由提高前述腔室的內部空間的壓力,而將前述黏著片貼附於前述環狀凸部形成面。Furthermore, preferably, in the above invention, there is provided a housing process for housing the sheet composite in a chamber; and the aforementioned attaching process is after the aforementioned housing process, by increasing the pressure of the internal space of the aforementioned chamber, thereby attaching the aforementioned adhesive sheet to the aforementioned annular convex portion forming surface.

(作用.效果)依據上述構成,在將片複合體收容於腔室後,藉由提高腔室的內部空間的壓力,對片複合體施加比大氣壓高的壓力。此時,藉由內部空間的加壓,能夠使推壓力遍及黏著片全體均一地作用。因此,能夠確實地避免因作用於黏著片的力的不均造成在黏著片的表面產生凹凸,因此,能夠更確實地提升黏著片貼附在晶圓之狀態時的黏著片的平坦性。此外,亦能夠避免因作用於黏著片的力的不均導致作用於晶圓之局部的力的不均而使得晶圓損傷的情況發生。(Function and Effect) According to the above-mentioned structure, after the sheet complex is accommodated in the chamber, a pressure higher than atmospheric pressure is applied to the sheet complex by increasing the pressure of the internal space of the chamber. At this time, by pressurizing the internal space, the pushing force can be uniformly applied to the entire adhesive sheet. Therefore, it is possible to reliably avoid the unevenness of the force acting on the adhesive sheet, thereby more reliably improving the flatness of the adhesive sheet when the adhesive sheet is attached to the wafer. In addition, it is also possible to avoid the situation where the uneven force acting on the adhesive sheet causes the uneven force acting on the local part of the wafer, thereby causing damage to the wafer.

此外,較佳為,在上述的發明中,前述腔室係具備上殼體及下殼體;前述貼附過程係具備下述過程:上下空間形成過程,係藉由前述上殼體與前述下殼體將前述黏著片夾住,藉此將前述腔室的內部空間區隔成供配置前述的環狀凸部形成面朝上之狀態的前述工件之下空間、及隔著前述黏著片而與前述下空間相對向之上空間;及空間加壓過程,係對前述上空間與前述下空間之中的至少前述上空間進行加壓,藉此將前述黏著片貼附於前述環狀凸部形成面。In addition, preferably, in the above invention, the chamber comprises an upper shell and a lower shell; the attaching process comprises the following processes: an upper and lower space forming process, in which the upper shell and the lower shell clamp the adhesive sheet, thereby dividing the internal space of the chamber into a lower space for arranging the workpiece with the annular protrusion forming surface facing upward, and an upper space opposite to the lower space with the adhesive sheet interposed therebetween; and a space pressurizing process, in which at least the upper space of the upper space and the lower space is pressurized, thereby attaching the adhesive sheet to the annular protrusion forming surface.

(作用.效果)依據上述構成,利用上殼體與前述下殼體將前述黏著片夾住,藉此將腔室的內部空間區隔成下空間與上空間。此時,黏著片作為密封材而發揮作用,因此,能夠在腔室的內部空間中避免氣體在下空間與上空間之間漏氣。因此,藉由至少對上空間進行加壓,上空間的加壓力係精度佳地作用於黏著片。因此,能夠更加提升貼附在工件的黏著片與工件的環狀凸部形成面之間的密接性。(Function and Effect) According to the above-mentioned structure, the upper shell and the lower shell are used to clamp the above-mentioned adhesive sheet, thereby dividing the internal space of the chamber into a lower space and an upper space. At this time, the adhesive sheet acts as a sealing material, so that gas leakage between the lower space and the upper space in the internal space of the chamber can be avoided. Therefore, by pressurizing at least the upper space, the pressure of the upper space acts on the adhesive sheet with good precision. Therefore, the close contact between the adhesive sheet attached to the workpiece and the annular convex portion forming surface of the workpiece can be further improved.

此外,較佳為,在上述的發明中,前述黏著片係具有與前述工件的環狀凸部形成面相應的預定形狀,保持在長形的搬送用片;前述腔室係具備上殼體及下殼體;前述貼附過程係含有下述過程:上下空間形成過程,係藉由前述上殼體與前述下殼體將前述搬送用片夾住,藉此將前述腔室的內部空間區隔成供配置前述的環狀凸部形成面朝上之狀態的前述工件之下空間、及隔著保持在前述搬送用片的前述黏著片而與前述下空間相對向之上空間;及空間加壓過程,係對前述上空間與前述下空間之中的至少前述上空間進行加壓,藉此將前述黏著片貼附於前述環狀凸部形成面。In addition, it is preferred that, in the above invention, the adhesive sheet has a predetermined shape corresponding to the annular protrusion forming surface of the workpiece and is held on a long conveying sheet; the chamber comprises an upper shell and a lower shell; the attaching process includes the following processes: an upper and lower space forming process, in which the conveying sheet is clamped by the upper shell and the lower shell to divide the internal space of the chamber into a lower space for arranging the workpiece with the annular protrusion forming surface facing upward, and an upper space opposite to the lower space via the adhesive sheet held on the conveying sheet; and a space pressurizing process, in which at least the upper space of the upper space and the lower space is pressurized to attach the adhesive sheet to the annular protrusion forming surface.

(作用.效果)依據上述構成,黏著片係預先具有與工件的環狀凸部形成面相應的預定形狀。因此,能夠相應於工件的環狀凸部形成面的位置及形狀將黏著片適切地貼附至環狀凸部形成面。此外,不需要將黏著片切斷成適切的預定形狀等製程,因此能夠縮短貼附黏著片的製程。(Function and Effect) According to the above configuration, the adhesive sheet is pre-prepared with a predetermined shape corresponding to the annular convex portion forming surface of the workpiece. Therefore, the adhesive sheet can be appropriately attached to the annular convex portion forming surface corresponding to the position and shape of the annular convex portion forming surface of the workpiece. In addition, there is no need to cut the adhesive sheet into a suitable predetermined shape, so the process of attaching the adhesive sheet can be shortened.

此外,黏著片係保持在長形的搬送用片,藉由上殼體與下殼體將搬送用片夾住,藉此使腔室形成。此時,即使為了使工件與黏著片更加密接而採用黏著力高的材料作為黏著片,兩殼體也能夠在不碰觸黏著片下夾住搬送用片。因此,能夠避免黏著片黏著於腔室而無法剝離,而妨礙貼附過程的情況發生。In addition, the adhesive sheet is a long conveying sheet, and the upper shell and the lower shell clamp the conveying sheet to form a cavity. At this time, even if a material with high adhesive force is used as the adhesive sheet to make the workpiece and the adhesive sheet more tightly bonded, the two shells can clamp the conveying sheet without touching the adhesive sheet. Therefore, it is possible to avoid the situation where the adhesive sheet is adhered to the cavity and cannot be peeled off, thereby hindering the attachment process.

此外,藉由令黏著片保持在長形的搬送用片,即使在黏著片已預先成型成預定形狀之情況,藉由將長形的搬送用片沿預定的路徑送出而供給,一樣能夠將黏著片沿該預定的路徑精度佳地搬送。亦即,既避免將黏著片設成長形而產生無謂的成本又能夠提升黏著片的搬送精度。Furthermore, by keeping the adhesive sheet on the long conveying sheet, even if the adhesive sheet has been pre-formed into a predetermined shape, the adhesive sheet can be conveyed along the predetermined path with good accuracy by feeding the long conveying sheet along the predetermined path. That is, it is possible to avoid unnecessary costs caused by setting the adhesive sheet in a long shape and improve the conveying accuracy of the adhesive sheet.

此外,較佳為,在上述的發明中,具備配置在前述上殼體內部的片狀彈性體;前述片狀彈性體係以在前述上下空間形成過程中利用前述上殼體與前述下殼體將前述黏著片夾住,藉此使前述片狀彈性體抵接於前述黏著片的方式配設。In addition, preferably, in the above invention, there is a sheet-like elastic body arranged inside the aforementioned upper shell; the aforementioned sheet-like elastic body is arranged in a manner that the aforementioned adhesive sheet is clamped by the aforementioned upper shell and the aforementioned lower shell during the formation process of the aforementioned upper and lower spaces, thereby making the aforementioned sheet-like elastic body abut against the aforementioned adhesive sheet.

(作用.效果)依據上述構成,藉由壓差,片狀彈性體係遍及全體以更加均一的彎曲率變形成凸狀。因此,黏著片係變得容易相應於工件的環狀凸部形成面的形狀而變形,因此能夠提升環狀凸部形成面與黏著片的密接性。因此,能夠將黏著片精度更佳地貼附於環狀凸部形成面。(Function and Effect) According to the above structure, the sheet-like elastic body is deformed into a convex shape with a more uniform curvature throughout the entire body by the pressure difference. Therefore, the adhesive sheet becomes easy to deform in accordance with the shape of the annular convex portion forming surface of the workpiece, so that the adhesion between the annular convex portion forming surface and the adhesive sheet can be improved. Therefore, the adhesive sheet can be attached to the annular convex portion forming surface with better accuracy.

此外,較佳為,在上述的發明中,具備藉由對前述下空間及前述上空間中的至少一者進行加溫而加溫前述黏著片的加溫過程;前述貼附過程係對藉由前述加溫過程而經加溫之狀態的前述黏著片施加比大氣壓高的壓力,藉此將前述黏著片貼附於前述環狀凸部形成面。In addition, it is preferred that the above invention has a heating process for heating the adhesive sheet by heating at least one of the lower space and the upper space; the attaching process is to apply a pressure higher than atmospheric pressure to the adhesive sheet in a heated state by the heating process, thereby attaching the adhesive sheet to the annular convex portion forming surface.

(作用.效果)依據此構成,藉由加溫過程對黏著片進行加溫,藉此黏著片係變得更柔軟。亦即,黏著片係變得容易相應於工件的環狀凸部形成面的形狀而變形,因此能夠提升環狀凸部形成面與黏著片的密接性。(Function and Effect) According to this structure, the adhesive sheet is heated by the heating process, so that the adhesive sheet becomes softer. That is, the adhesive sheet becomes easy to deform according to the shape of the annular convex portion forming surface of the workpiece, thereby improving the adhesion between the annular convex portion forming surface and the adhesive sheet.

為了達成如上述的目的,本發明係亦可採用如下述的構成。 亦即,本發明的黏著片貼附裝置係具備:貼附機構,係對在一面的外周具有環狀凸部的工件的環狀凸部形成面附著黏著片而構成的片複合體,施加比大氣壓高的壓力,藉此將前述黏著片貼附於前述環狀凸部形成面。 In order to achieve the above-mentioned purpose, the present invention can also adopt the following structure. That is, the adhesive sheet attaching device of the present invention has: an attaching mechanism, which is a sheet composite body formed by attaching an adhesive sheet to the annular convex portion forming surface of a workpiece having an annular convex portion on the outer periphery of one side, and applies a pressure higher than atmospheric pressure to attach the aforementioned adhesive sheet to the aforementioned annular convex portion forming surface.

(作用.效果)本發明的貼附機構係對片複合體施加比大氣壓高的壓力,藉此將黏著片貼附於工件的環狀凸部形成面。此時,能夠對黏著片施加足夠大的推壓力,因此能夠更加提升貼附在工件的黏著片與工件的環狀凸部形成面之間的密接性。因此,能夠更確實地防止經過一段時間後黏著片從工件剝離的情況發生。(Function and Effect) The attachment mechanism of the present invention applies a pressure higher than atmospheric pressure to the sheet composite, thereby attaching the adhesive sheet to the annular convex portion forming surface of the workpiece. At this time, a sufficiently large pushing force can be applied to the adhesive sheet, so that the adhesion between the adhesive sheet attached to the workpiece and the annular convex portion forming surface of the workpiece can be further improved. Therefore, it is possible to more reliably prevent the adhesive sheet from peeling off from the workpiece after a period of time.

為了達成如上述的目的,本發明係亦可採用如下述的構成。 亦即,本發明的半導體製品的製造方法係製造形成為在一面的外周具有環狀凸部的工件的環狀凸部形成面貼附有黏著片之狀態的半導體製品, 前述半導體製品的製造方法的特徵為具備: 貼附過程,係對在前述工件的環狀凸部形成面附著前述黏著片而構成的片複合體,施加比大氣壓高的壓力,藉此將前述黏著片貼附於前述環狀凸部形成面。 In order to achieve the above-mentioned purpose, the present invention can also adopt the following structure. That is, the manufacturing method of the semiconductor product of the present invention is to manufacture a semiconductor product in which an adhesive sheet is attached to the annular convex portion forming surface of a workpiece having an annular convex portion on the periphery of one side. The manufacturing method of the semiconductor product is characterized by having: The attachment process is to apply a pressure higher than atmospheric pressure to a sheet composite formed by attaching the adhesive sheet to the annular convex portion forming surface of the workpiece, thereby attaching the adhesive sheet to the annular convex portion forming surface.

(作用.效果)依據上述構成,能夠較佳地製造形成為在一面的外周具有環狀凸部的工件的環狀凸部形成面貼附有黏著片之狀態的半導體製品。亦即,在貼附過程中,對片複合體施加比大氣壓高的壓力,藉此將黏著片貼附於工件的環狀凸部形成面。此時,能夠對黏著片施加足夠大的推壓力,因此藉由經過貼附過程,能夠更加提升片複合體中黏著片與工件的環狀凸部形成面之間的密接性。因此,能夠更確實地防止經過一段時間後黏著片從工件剝離的情況發生。 [發明之效果] (Function and effect) According to the above-mentioned structure, a semiconductor product can be preferably manufactured in which an adhesive sheet is attached to the annular protrusion forming surface of a workpiece having an annular protrusion on the periphery of one side. That is, during the attachment process, a pressure higher than atmospheric pressure is applied to the sheet composite, thereby attaching the adhesive sheet to the annular protrusion forming surface of the workpiece. At this time, a sufficiently large pushing force can be applied to the adhesive sheet, so that the adhesion between the adhesive sheet in the sheet composite and the annular protrusion forming surface of the workpiece can be further improved through the attachment process. Therefore, it is possible to more reliably prevent the adhesive sheet from peeling off from the workpiece after a period of time. [Effect of the invention]

依據本發明的黏著片貼附方法、黏著片貼附裝置及半導體製品的製造方法,藉由對片複合體施加比大氣壓高的壓力,而將黏著片貼附於工件的環狀凸部形成面。此時,能夠對黏著片施加足夠大的推壓力,因此能夠更加提升貼附在工件的黏著片與工件的環狀凸部形成面之間的密接性。因此,能夠更確實地防止經過一段時間後黏著片從工件剝離的情況發生。此外,能夠將該大的推壓力遍及工件的全體均一地施加,因此,能夠避免因工件所作用的推壓力的不均造成在工件發生例如破裂或缺損等的損傷的情況。According to the adhesive sheet attaching method, adhesive sheet attaching device and semiconductor product manufacturing method of the present invention, the adhesive sheet is attached to the annular protrusion forming surface of the workpiece by applying a pressure higher than atmospheric pressure to the sheet composite. At this time, a sufficiently large pushing force can be applied to the adhesive sheet, so that the closeness between the adhesive sheet attached to the workpiece and the annular protrusion forming surface of the workpiece can be further improved. Therefore, it is possible to more reliably prevent the adhesive sheet from peeling off from the workpiece after a period of time. In addition, the large pushing force can be uniformly applied to the entire workpiece, so it is possible to avoid damage to the workpiece such as cracks or defects caused by uneven pushing force acting on the workpiece.

[用以實施發明的形態][Form used to implement the invention]

以下,參照圖式,說明本發明的實施例1。在實施例1的黏著片貼附裝置1中,就黏著片而言係使用支撐用的黏著膠帶DT(切割膠帶),就貼附黏著片的對象即工件而言係使用半導體晶圓W(以下,稱為「晶圓W」)及環形框架f。亦即,在實施例1的黏著片貼附裝置1中,係藉由將黏著膠帶DT遍及晶圓W及環形框架f貼附,製作安裝框架MF。Hereinafter, Embodiment 1 of the present invention will be described with reference to the drawings. In the adhesive sheet attaching device 1 of Embodiment 1, as the adhesive sheet, a supporting adhesive tape DT (dicing tape) is used, and as the workpiece to which the adhesive sheet is attached, a semiconductor wafer W (hereinafter referred to as "wafer W") and an annular frame f are used. That is, in the adhesive sheet attaching device 1 of Embodiment 1, the mounting frame MF is manufactured by attaching the adhesive tape DT to the wafer W and the annular frame f.

如圖1(a)至圖1(c)所示,晶圓W乃係在形成有電路圖案的表面貼附了電路保護用的保護膠帶PT的狀態下經背部研磨處理。晶圓W的背面係將外周部沿徑向保留約3mm進行了研磨(背部研磨)。亦即,使用的是加工成在背面形成有扁平凹部He並且沿著其外周留存有環狀凸部Ka之形狀的晶圓。就一例而言,係以在扁平凹部He研磨的深度d為數百μm、扁平凹部He的晶圓厚度J形成為30μm至50μm的方式加工。因此,形成在背面外周的環狀凸部Ka係作為提高晶圓W剛性的環狀肋(rib)而發揮功能,抑制在搬運(handling)和其他處理製程時的晶圓W的撓曲變形。另外,針對環狀凸部Ka的內側角落部,使用符號Kf標示。內側角落部Kf係相當於環狀凸部Ka與扁平凹部He的交界。晶圓W的背面係相當於本發明的工件的環狀凸部形成面。As shown in FIG. 1(a) to FIG. 1(c), the wafer W is subjected to back grinding in a state where a protective tape PT for circuit protection is attached to the surface on which the circuit pattern is formed. The back side of the wafer W is ground (back grinding) with the outer periphery retained at about 3 mm in the radial direction. That is, a wafer is used which is processed to form a flat recess He on the back side and an annular protrusion Ka along its periphery. For example, the depth d of the flat recess He ground is several hundred μm, and the wafer thickness J of the flat recess He is formed to be 30 μm to 50 μm. Therefore, the annular protrusion Ka formed on the outer periphery of the back side functions as an annular rib that improves the rigidity of the wafer W, thereby suppressing the bending and deformation of the wafer W during handling and other processing processes. In addition, the inner corner of the annular convex portion Ka is denoted by a symbol Kf. The inner corner Kf corresponds to the boundary between the annular convex portion Ka and the flat concave portion He. The back surface of the wafer W corresponds to the annular convex portion forming surface of the workpiece of the present invention.

本實施例所用的黏著膠帶DT係如圖2所示,具備有由非黏著性的基材Ta與具黏著性的黏著材Tb積層而成的長形的構造。在黏著材Tb係添設有分離膜(separator)S。亦即,在黏著膠帶DT的黏著面添設有分離膜S,藉由將分離膜S從黏著膠帶DT剝離,使黏著膠帶DT的黏著面露出。The adhesive tape DT used in this embodiment has a long structure formed by laminating a non-adhesive base material Ta and an adhesive material Tb as shown in FIG2. A separator S is added to the adhesive material Tb. That is, the separator S is added to the adhesive surface of the adhesive tape DT, and the adhesive surface of the adhesive tape DT is exposed by peeling the separator S from the adhesive tape DT.

就構成基材Ta的材料的例子而言,可舉出:聚烯烴(polyolefin)、聚乙烯(polyethylene)、乙烯-醋酸乙烯酯共聚物(ethylene-vinyl acetate copolymer)、聚酯(polyester)、聚醯亞胺(polyimide)、聚氨酯(polyurethane)、氯乙烯(vinyl chloride)、聚對苯二甲酸乙二酯(polyethylene terephthalate)、聚對苯二甲酸丁二酯(polybutylene terephthalate)、聚對萘二甲酸乙二酯(polyethylene terenaphthalate)、聚偏二氯乙烯(polyvinylidene chloride)、聚乙烯-甲基丙烯酸共聚物(polyethylene-methacrylic acid copolymer)、聚丙烯(polypropylene)、對苯二甲酸甲基丙烯酸酯(methacrylic acid terephthalate、聚醯胺-醯亞胺(polyamide-imide)、聚胺基甲酸酯彈性物(elastomer)等。另外,就基材Ta而言亦可使用組合複數種上述材料而成的材料。此外,基材Ta係可為單層,亦可為積層複數層而成的構成。Examples of the material constituting the substrate Ta include polyolefin, polyethylene, ethylene-vinyl acetate copolymer, polyester, polyimide, polyurethane, vinyl chloride, polyethylene terephthalate, polybutylene terephthalate, polyethylene terenaphthalate, polyvinylidene chloride, polyethylene-methacrylic acid copolymer, polypropylene, methacrylic acid terephthalate, Terephthalate, polyamide-imide, elastomer, etc. In addition, a material combining a plurality of the above materials may be used for the substrate Ta. In addition, the substrate Ta may be a single layer or a structure formed by laminating a plurality of layers.

黏著材Tb係較佳為以能夠擔保能夠將黏著膠帶DT黏著於晶圓W及環形框架f之狀態予以保持之功能、及在之後的切割製程中防止晶片零件的飛散之功能的材料構成。就構成黏著材Tb的材料的例子而言,可舉出丙烯酸酯共聚物(acrylic acid ester copolymer)等。就分離膜S的例子而言,可舉出長形的紙材和塑膠(plastic)等。另外,亦可使用接著材或黏接著材來取代黏著材Tb。The adhesive material Tb is preferably made of a material that can ensure that the adhesive tape DT is adhered to the wafer W and the annular frame f and prevent the chip parts from flying during the subsequent dicing process. Examples of materials constituting the adhesive material Tb include acrylic acid ester copolymers, etc. Examples of the separation film S include long paper materials and plastics, etc. In addition, a bonding material or an adhesive material can be used instead of the adhesive material Tb.

<全體構成的說明> 此處,針對實施例1的黏著片貼附裝置1的全體構成進行說明。圖3係顯示實施例1的黏著片貼附裝置1的基本構成之俯視圖。黏著片貼附裝置1係構成為具備橫長的矩形部1a、及突出部1b。突出部1b係構成為在矩形部1a的中央部連接而往上側突出。另外,在之後的說明中,將矩形部1a的長邊方向稱為左右方向(x方向),將與該方向正交的水平方向(y方向)稱為前後方向。 <Description of the overall structure> Here, the overall structure of the adhesive sheet attaching device 1 of Example 1 is described. FIG. 3 is a top view showing the basic structure of the adhesive sheet attaching device 1 of Example 1. The adhesive sheet attaching device 1 is configured to have a rectangular portion 1a having a horizontal length, and a protruding portion 1b. The protruding portion 1b is configured to be connected to the central portion of the rectangular portion 1a and protrude upward. In addition, in the subsequent description, the long side direction of the rectangular portion 1a is referred to as the left-right direction (x direction), and the horizontal direction (y direction) orthogonal to this direction is referred to as the front-back direction.

在矩形部1a的右側係配置有晶圓搬送機構3。在矩形部1a的下側靠右的位置係並列載置有收容有晶圓W的兩個容器5。在容器5的內部係以多段的方式將表面貼附有保護膠帶PT的晶圓W以表面側朝下的狀態收納。在矩形部1a的左端係配置有將完成晶圓W之安裝的圖8所示的安裝框架MF予以回收的框架回收部6。On the right side of the rectangular portion 1a, a wafer transfer mechanism 3 is arranged. On the lower right side of the rectangular portion 1a, two containers 5 containing wafers W are placed side by side. Wafers W with protective tapes PT attached to their surfaces are stored in multiple stages with their surfaces facing downward. On the left end of the rectangular portion 1a, a frame recovery unit 6 is arranged for recovering the mounting frame MF shown in FIG. 8 on which the wafers W are mounted.

從矩形部1a的上側的右邊,依序配備有對準機(aligner)7、升降台8、保持台9、及框架供給部12。在突出部1b係配置有將支撐用的黏著膠帶DT(切割膠帶)遍及晶圓W的背面及環形框架f貼附的貼附單元13。From the upper right side of the rectangular portion 1a, there are arranged in order an aligner 7, a lifting table 8, a holding table 9, and a frame supply unit 12. The protruding portion 1b is provided with a sticking unit 13 for sticking a supporting adhesive tape DT (dicing tape) to the back surface of the wafer W and the ring frame f.

晶圓搬送機構3係如圖4所示,具備有晶圓搬送裝置16,該晶圓搬送裝置16以能夠左右往復移動的方式支撐於導引軌道15之右側,該導引軌道15左右水平地架設在矩形部2a上部。此外,在導引軌道15之左側係具備以能夠左右移動的方式支撐於導引軌道15的框架搬送裝置17。As shown in FIG. 4 , the wafer transfer mechanism 3 includes a wafer transfer device 16 supported on the right side of a guide rail 15 in a manner capable of reciprocating left and right, and the guide rail 15 is horizontally erected on the upper part of the rectangular portion 2a. In addition, on the left side of the guide rail 15, a frame transfer device 17 supported on the guide rail 15 in a manner capable of moving left and right is provided.

晶圓搬送裝置16係以能夠將從容器5的其中任一者取出的晶圓W往左右及前後搬送的方式構成。晶圓搬送裝置16係裝備有左右移動可動台18與前後移動可動台19。The wafer transfer device 16 is configured to transfer the wafer W taken out from any one of the containers 5 to the left and right and to the front and back. The wafer transfer device 16 is equipped with a movable stage 18 for moving to the left and right and a movable stage 19 for moving to the front and back.

左右移動可動台18係以能夠沿導引軌道15朝左右方向往復移動的方式構成。前後移動可動台19係以能夠沿左右移動可動台18所具有的導引軌道20朝前後方向往復移動的方式構成。The horizontal movable table 18 is configured to be reciprocatingly movable in the horizontal direction along the guide rail 15. The forward and backward movable table 19 is configured to be reciprocatingly movable in the forward and backward direction along the guide rail 20 provided in the horizontal movable table 18.

此外,在前後移動可動台19的下部係裝備有保持晶圓W的保持單元21。保持單元21係以能夠沿縱向延伸的升降軌道22上下方向(z方向)往復移動的方式構成。此外,保持單元21係藉由未圖示的旋轉軸,成為能夠以z方向為軸進行繞轉。In addition, a holding unit 21 for holding the wafer W is provided at the bottom of the forward and backward movable stage 19. The holding unit 21 is configured to be able to reciprocate in the vertical direction (z direction) along a longitudinally extending lifting rail 22. In addition, the holding unit 21 is capable of rotating around the z direction by a rotating shaft (not shown).

在保持單元21的下部係裝備有馬蹄形的保持臂23。在保持臂23的保持面係設有些微突出的複數個吸附墊,透過該吸附墊吸附保持晶圓W。此外,保持臂23係透過形成在其內部的流路及連接在該流路的基端側的連接流路而連通連接至空壓裝置。A horseshoe-shaped holding arm 23 is provided at the lower part of the holding unit 21. A plurality of slightly protruding adsorption pads are provided on the holding surface of the holding arm 23, and the wafer W is adsorbed and held by the adsorption pads. In addition, the holding arm 23 is connected to the air pressure device through a flow path formed inside it and a connecting flow path connected to the base end side of the flow path.

藉由利用上述的可動構造,構成為能夠藉由保持臂23使吸附保持的晶圓W進行前後移動、左右移動、及以z方向為軸的繞轉移動。By utilizing the above movable structure, the wafer W held by suction can be moved forward and backward, left and right, and rotated about the z direction by the holding arm 23 .

框架搬送裝置17係具備:左右移動可動台24、前後移動可動台25、連接在左右移動可動台24下部的屈伸連桿機構26、及裝備在屈伸連桿機構26下端的吸附板27等。吸附板27係吸附保持晶圓W。在吸附板27的周圍係配備有吸附保持環形框架f的複數個吸附墊28。因此,框架搬送裝置17係能夠將載置保持在保持台9的環形框架f或安裝框架MF吸附保持以進行升降及前後左右搬送。吸附墊28係構成為能夠對應於環形框架f的尺寸在水平方向進行滑動調節。The frame transport device 17 is equipped with a movable table 24 for moving left and right, a movable table 25 for moving forward and backward, a flexion-extension link mechanism 26 connected to the lower part of the movable table 24 for moving left and right, and an adsorption plate 27 installed at the lower end of the flexion-extension link mechanism 26. The adsorption plate 27 adsorbs and holds the wafer W. A plurality of adsorption pads 28 for adsorbing and holding the annular frame f are arranged around the adsorption plate 27. Therefore, the frame transport device 17 is capable of adsorbing and holding the annular frame f or the mounting frame MF mounted on the holding table 9 so as to be lifted and lowered and transported forward and backward and left and right. The adsorption pad 28 is configured to be able to slide and adjust in the horizontal direction corresponding to the size of the annular frame f.

升降台8乃係保持晶圓W者,就一例而言,乃係具有與晶圓W相同形狀以上之大小的金屬製吸盤台(chuck table)。就升降台8的較佳構成而言,係構成為藉由設在內部的吸引裝置吸附保持晶圓W。升降台8係如圖5等所示,與貫通給予升降台8支撐的支撐台51的桿52的一端連結。桿52的另一端係與具備馬達等的致動器(actuator)53驅動連結。藉由桿52及致動器53,升降台8係成為能夠升降移動。The lifting table 8 is used to hold the wafer W, and for example, is a metal chuck table having the same shape or larger than the size of the wafer W. A preferred structure of the lifting table 8 is to hold the wafer W by adsorption using a suction device provided inside. As shown in FIG. 5 and the like, the lifting table 8 is connected to one end of a rod 52 that passes through a support table 51 that supports the lifting table 8. The other end of the rod 52 is connected to an actuator 53 having a motor or the like for driving. The lifting table 8 is able to move up and down by means of the rod 52 and the actuator 53.

升降台8係如圖3及圖5所示,構成為能夠沿著沿前後方向附設的軌道54在初始位置與貼附位置之間往復移動。初始位置係位在矩形部1a內部,乃係圖3中升降台8以實線標示的位置。在該初始位置,晶圓W係載置於升降台8。As shown in FIG3 and FIG5 , the lifting platform 8 is configured to be able to reciprocate between an initial position and an attachment position along a track 54 provided in the front-rear direction. The initial position is located inside the rectangular portion 1a, which is the position of the lifting platform 8 indicated by a solid line in FIG3 . At the initial position, the wafer W is placed on the lifting platform 8 .

貼附位置係位在突出部1b內部,乃係圖3中升降台8以虛線標示的位置。藉由升降台8移動到貼附位置,便能夠使載置在升降台8的晶圓W接觸黏著膠帶DT。The attachment position is located inside the protruding portion 1b, which is the position indicated by the dotted line of the lifting platform 8 in Fig. 3. By moving the lifting platform 8 to the attachment position, the wafer W placed on the lifting platform 8 can contact the adhesive tape DT.

保持台9係如圖5及圖6等所示,乃係具有與晶圓W相同形狀以上之大小的金屬製的吸盤台,係與配備在外部的加壓裝置32連通連接。加壓裝置32的動作係藉由控制部33控制。此外,保持台9係內部設有吸引裝置,構成為吸附保持晶圓W。As shown in FIG. 5 and FIG. 6, the holding table 9 is a metal suction cup table having the same shape or larger size as the wafer W, and is connected to the pressurizing device 32 provided outside. The operation of the pressurizing device 32 is controlled by the control unit 33. In addition, the holding table 9 is provided with a suction device inside, and is configured to hold the wafer W by adsorption.

在實施例1中,保持台9係在外周部具備環狀的突起部9a,整體形成為中空。突起部9a係構成在於俯視下與晶圓W的環狀凸部Ka的配置大致一致的位置,藉由突起部9a支撐晶圓W的環狀凸部Ka,從而保持台9能夠在不接觸薄的扁平凹部He下保持晶圓W。In the first embodiment, the holding table 9 has an annular protrusion 9a on the outer periphery and is formed hollow as a whole. The protrusion 9a is formed at a position roughly consistent with the configuration of the annular convex portion Ka of the wafer W in a plan view, and the annular convex portion Ka of the wafer W is supported by the protrusion 9a, so that the holding table 9 can hold the wafer W without contacting the thin flat concave portion He.

此外,如圖5所示,保持台9係收納在構成腔室29的下殼體29A,與貫通下殼體29A的桿35的一端連結。桿35的另一端係與具備馬達等的致動器37驅動連結。因此,保持台9係成為能夠在腔室29的內部升降移動。As shown in Fig. 5, the holding table 9 is housed in the lower case 29A constituting the chamber 29, and is connected to one end of a rod 35 passing through the lower case 29A. The other end of the rod 35 is drivably connected to an actuator 37 having a motor or the like. Therefore, the holding table 9 is capable of moving up and down inside the chamber 29.

下殼體29A係具備包圍該下殼體29A的框架保持部38。框架保持部38係以當載置有環形框架f時,環形框架f的上表面與下殼體29A的圓筒頂部成為齊平的方式構成。此外,下殼體29A的圓筒頂部係較佳為施作有離型處理。The lower shell 29A has a frame holding portion 38 surrounding the lower shell 29A. The frame holding portion 38 is configured so that when the annular frame f is placed, the upper surface of the annular frame f is flush with the cylindrical top of the lower shell 29A. In addition, the cylindrical top of the lower shell 29A is preferably subjected to a release treatment.

另外,如圖3所示,保持台9係構成為能夠與下殼體29A一起沿著沿前後方向附設的軌道40在初始位置與貼附位置之間往復移動。初始位置係位在矩形部1a內部,乃係圖3中保持台9以實線標示的位置。在該初始位置,環形框架f係載置於保持台9。In addition, as shown in FIG3 , the holding platform 9 is configured to be able to reciprocate between an initial position and an attachment position along a track 40 provided along the front-rear direction together with the lower housing 29A. The initial position is located inside the rectangular portion 1a, which is the position of the holding platform 9 indicated by a solid line in FIG3 . In this initial position, the annular frame f is placed on the holding platform 9.

貼附位置係位在突出部1b內部,乃係圖3中保持台9以虛線標示的位置。藉由保持台9移動到貼附位置,便能夠執行對載置在保持台9的晶圓W貼附黏著膠帶DT的貼附製程。The attachment position is located inside the protruding portion 1b, which is the position indicated by the dotted line of the holding table 9 in Fig. 3. By moving the holding table 9 to the attachment position, the attachment process of attaching the adhesive tape DT to the wafer W placed on the holding table 9 can be performed.

框架供給部12係收納抽出式的匣盒(cassette),該匣盒係積層收納有預定片數的環形框架f。The frame supply unit 12 is a drawable storage cassette that stores a predetermined number of annular frames f in layers.

貼附單元13係如圖5所示,由片供給部71、分離膜回收部72、片貼附部73及片回收部74等構成。片供給部71係具備裝填有原材輥的供給筒管(bobbin),該原材輥係捲繞有支撐用的黏著膠帶DT而成。此外,係構成為在從片供給部71的供給筒管供給黏著膠帶DT至貼附位置的過程中藉由剝離輥75將分離膜S剝離。另外,設在片供給部71的供給筒管係與電磁制動器(brake)連動連結而被施加有適度的旋轉阻力。因此,防止從供給筒管放出過多的膠帶。As shown in FIG5 , the attachment unit 13 is composed of a sheet supply section 71, a separation film recovery section 72, a sheet attachment section 73, and a sheet recovery section 74. The sheet supply section 71 is provided with a supply bobbin loaded with a raw material roll, and the raw material roll is wound with a supporting adhesive tape DT. In addition, the separation film S is peeled off by a peeling roller 75 during the process of supplying the adhesive tape DT from the supply bobbin of the sheet supply section 71 to the attachment position. In addition, the supply bobbin provided in the sheet supply section 71 is linked to an electromagnetic brake and is applied with an appropriate rotational resistance. Therefore, excessive tape is prevented from being released from the supply bobbin.

分離膜回收部72係具備捲收從黏著膠帶DT剝離下來的分離膜S之回收筒管。該回收筒管係構成為藉由馬達進行正反轉的旋轉驅控制。The separation film recovery unit 72 is provided with a recovery bobbin for taking up the separation film S peeled off from the adhesive tape DT. The recovery bobbin is configured to be driven and controlled to rotate forward and reverse by a motor.

片貼附部73係由腔室29、片貼附機構81及片切斷機構82等構成。The sheet attaching section 73 is composed of the chamber 29, a sheet attaching mechanism 81, a sheet cutting mechanism 82, and the like.

腔室29係藉由下殼體29A與上殼體29B構成。下殼體29A係以圍繞保持台9的方式配設,係與保持台9一起在初始位置與密封位置之間前後方向往復移動。上殼體29B係配備在突出部1b,構成為能夠升降。The chamber 29 is composed of a lower shell 29A and an upper shell 29B. The lower shell 29A is disposed around the holding platform 9 and reciprocates in the front-rear direction between the initial position and the sealing position together with the holding platform 9. The upper shell 29B is disposed on the protruding portion 1b and is configured to be able to rise and fall.

在下殼體29A及上殼體29B係如圖6所示,透過流路101而與加壓裝置32連通連接。另外,在上殼體29B側的流路101係具備電磁閥103。此外,在兩殼體29A、29B係分別連通連接有具備向大氣開放用的電磁閥105、107之流路109。As shown in Fig. 6, the lower housing 29A and the upper housing 29B are connected to the pressurizing device 32 through the flow path 101. In addition, the flow path 101 on the upper housing 29B side is equipped with an electromagnetic valve 103. In addition, the two housings 29A and 29B are connected to the flow path 109 equipped with electromagnetic valves 105 and 107 for opening to the atmosphere.

此外,在上殼體29B係連通連接有流路111,該流路111係具備藉由漏洩(leak)來調整一度減壓過之內壓的電磁閥110。另外,該些電磁閥103、105、107、110的開閉操作、加壓裝置32的作動係藉由控制部33進行。In addition, the upper housing 29B is connected to a flow path 111, which has an electromagnetic valve 110 for adjusting the internal pressure of the pressure reduction by leakage. In addition, the opening and closing operations of the electromagnetic valves 103, 105, 107, 110 and the operation of the pressurizing device 32 are performed by the control unit 33.

亦即,加壓裝置32係以能夠將下殼體29A側的空間的氣壓與上殼體29B側的空間的氣壓獨立進行加壓調節的方式構成。That is, the pressurizing device 32 is configured to be able to independently adjust the air pressure of the space on the lower housing 29A side and the air pressure of the space on the upper housing 29B side.

片貼附機構81係具備有可動台84、貼附輥85、及夾送輥(nip roller)86等。可動台84係沿著沿左右方向架設的導引軌道88左右水平移動。貼附輥85係以軸支撐於與可動台84所具有的缸體(cylinder)前端的連結的支架(bracket)。夾送輥86係配置在片回收部74側,具備有藉由馬達進行驅動的饋送輥89及藉由缸體進行升降的壓輥(pinch roller)90。The sheet attaching mechanism 81 includes a movable table 84, an attaching roller 85, and a nip roller 86. The movable table 84 moves horizontally along a guide rail 88 arranged in the left-right direction. The attaching roller 85 is supported by a bracket connected to the front end of the cylinder of the movable table 84. The nip roller 86 is arranged on the side of the sheet recovery section 74 and includes a feed roller 89 driven by a motor and a pinch roller 90 raised and lowered by the cylinder.

片切斷機構82係配備在令上殼體29B升降的升降驅動台91,係具備有沿z方向延伸的支軸92、及繞支軸92旋轉的軸筒(boss)部93。軸筒部93係具備沿徑向延伸的複數個支撐臂94。在至少一個支撐臂94的前端,以能夠上下移動的方式配備有沿環形框架f切斷黏著膠帶DT的圓板形的切刀(cutter)95。在其他支撐臂94的前端,以能夠上下移動的方式配備有推壓輥96。The sheet cutting mechanism 82 is provided on a lifting drive table 91 for lifting the upper housing 29B, and has a support shaft 92 extending in the z direction and a boss portion 93 rotating around the support shaft 92. The boss portion 93 has a plurality of support arms 94 extending in the radial direction. A disc-shaped cutter 95 for cutting the adhesive tape DT along the ring frame f is provided at the front end of at least one support arm 94 so as to be movable up and down. A push roller 96 is provided at the front end of the other support arms 94 so as to be movable up and down.

片回收部74係具備有捲收切斷後剝離下來的不要的黏著膠帶DT之回收筒管。該回收筒管係構成為藉由未圖示的馬達進行正反轉的旋轉驅動控制。The sheet recovery section 74 is provided with a recovery bobbin for winding up the unnecessary adhesive tape DT peeled off after cutting. The recovery bobbin is configured to be driven and controlled to rotate forward and reverse by a motor (not shown).

框架回收部6係如圖4所示,配備有積載安裝框架MF進行回收的匣盒41。該匣盒41係具備:連結固定在裝置框架43的縱向軌道45、及藉由馬達47沿該縱向軌道45以螺桿進給方式升降的升降台49。因此,框架回收部6係構成為將安裝框架MF載置於升降台49並以節距(pinch)進給的方式下降。As shown in FIG4 , the frame recovery unit 6 is equipped with a cassette 41 for collecting the mounting frame MF. The cassette 41 is provided with a longitudinal rail 45 connected and fixed to the device frame 43, and a lifting platform 49 that is raised and lowered along the longitudinal rail 45 by a screw feed method by a motor 47. Therefore, the frame recovery unit 6 is configured to place the mounting frame MF on the lifting platform 49 and lower it by a pinch feed method.

<動作的概要> 此處,說明實施例1的黏著片貼附裝置1的基本動作。圖7係說明使用黏著片貼附裝置1將黏著膠帶DT貼附於晶圓W的一連串製程之流程圖。 <Overview of Operation> Here, the basic operation of the adhesive sheet attaching device 1 of Embodiment 1 is described. FIG. 7 is a flow chart illustrating a series of processes for attaching the adhesive tape DT to the wafer W using the adhesive sheet attaching device 1.

步驟S1(工件的供給) 當貼附指令送出,環形框架f便從框架供給部12搬送至下殼體29A的框架保持部38,並且晶圓W從容器5搬送至升降台8。 Step S1 (supply of workpiece) When the attachment instruction is sent, the annular frame f is transferred from the frame supply unit 12 to the frame holding unit 38 of the lower shell 29A, and the wafer W is transferred from the container 5 to the lifting platform 8.

亦即,框架搬送裝置17係從框架供給部12吸附環形框架f,將之移載至框架保持部38。當框架搬送裝置17解除環形框架f的吸附而上升時,便進行環形框架f的對位。關於該對位,就一例而言,係藉由令以圍繞框架保持部38的方式豎設的複數根支撐銷同步往中央方向移動來進行。當框架保持部38將環形框架f保持時,下殼體29A便與保持台9一起沿軌道40從初始位置移動至片貼附機構81側的貼附位置。That is, the frame conveying device 17 absorbs the annular frame f from the frame supply portion 12 and transfers it to the frame holding portion 38. When the frame conveying device 17 releases the absorption of the annular frame f and rises, the annular frame f is aligned. For example, the alignment is performed by causing a plurality of support pins vertically arranged around the frame holding portion 38 to move synchronously toward the center. When the frame holding portion 38 holds the annular frame f, the lower shell 29A moves along the track 40 together with the holding table 9 from the initial position to the attachment position on the side of the sheet attaching mechanism 81.

框架搬送裝置17搬送環形框架f,另一方面,晶圓搬送裝置16係將保持臂23插入至在容器5的內部以多段的方式收納的晶圓W彼此之間。保持臂23係吸附保持晶圓W將之搬出,搬送至對準機7。對準機7係藉由從其中央突出的吸附墊吸附晶圓W中央。同時,晶圓搬送裝置16係解除晶圓W的吸附,退避至上方。對準機7係一邊以吸附墊保持晶圓W令之旋轉,一邊根據凹口(notch)等進行對位。The frame transport device 17 transports the annular frame f, while the wafer transport device 16 inserts the holding arm 23 between the wafers W stored in multiple stages in the container 5. The holding arm 23 holds the wafer W by suction and carries it out to the alignment machine 7. The alignment machine 7 uses the suction pad protruding from the center to suck the center of the wafer W. At the same time, the wafer transport device 16 releases the suction of the wafer W and retreats to the top. The alignment machine 7 holds the wafer W by the suction pad to rotate it, while performing alignment according to the notch, etc.

當對位完成,令吸附晶圓W的吸附墊從對準機7的面突出。晶圓搬送裝置16移動至該位置,吸附保持晶圓W。吸附墊係解除吸附後下降。When the alignment is completed, the suction pad that absorbs the wafer W is protruded from the surface of the aligner 7. The wafer transfer device 16 moves to this position and absorbs and holds the wafer W. The suction pad is released and then lowered.

晶圓搬送裝置16係移動至升降台8的上方,在貼附有保護膠帶PT的表面側朝下的狀態下令晶圓W載置於升降台8。當升降台8將晶圓W吸附保持時,升降台8便沿軌道54從初始位置移動至片貼附機構81側的貼附位置。升降台8及保持台9各者移動到貼附位置的狀態係顯示於圖9。The wafer transfer device 16 moves to the top of the lifting platform 8, and places the wafer W on the lifting platform 8 with the surface with the protective tape PT attached facing downward. When the lifting platform 8 adsorbs and holds the wafer W, the lifting platform 8 moves along the track 54 from the initial position to the attachment position on the side of the sheet attachment mechanism 81. The state in which the lifting platform 8 and the holding platform 9 each move to the attachment position is shown in FIG. 9.

步驟S2(黏著片的供給) 當進行了藉由晶圓搬送裝置16等進行的工件的供給,便在貼附單元13進行黏著膠帶DT的供給。亦即,從片供給部71將預定量的黏著膠帶DT一邊剝離分離膜S一邊送出。整體為長形的黏著膠帶DT係沿預定的搬送路徑導引至貼附位置的上方。 Step S2 (supply of adhesive sheet) When the workpiece is supplied by the wafer conveyor 16 or the like, the adhesive tape DT is supplied in the attaching unit 13. That is, a predetermined amount of adhesive tape DT is delivered from the sheet supply unit 71 while peeling off the separation film S. The overall long adhesive tape DT is guided to the top of the attaching position along a predetermined conveying path.

步驟S3(第1貼附過程) 當供給了工件及黏著膠帶DT,便開始進行第1貼附過程。亦即,控制部33係令致動器53驅動以使升降台8上升。藉由升降台8的上升,如圖10所示,晶圓W的背面接觸黏著膠帶DT,晶圓W的背面係被黏著膠帶DT覆蓋。 Step S3 (first bonding process) When the workpiece and adhesive tape DT are supplied, the first bonding process begins. That is, the control unit 33 drives the actuator 53 to raise the lifting platform 8. As the lifting platform 8 rises, as shown in FIG. 10, the back side of the wafer W contacts the adhesive tape DT, and the back side of the wafer W is covered by the adhesive tape DT.

藉由該接觸,使晶圓W的背面附著於黏著層Tb,晶圓W藉由黏著膠帶DT而獲得保持。以下,將由晶圓W與黏著膠帶DT一體化而成者稱為片複合體M。在形成有片複合體M後,將黏著膠帶DT送出預定量,藉此,如圖11所示,片複合體M係朝保持台9的上方被搬送。在搬送片複合體M的同時,升降台8係下降而回復至初始狀態。藉由形成片複合體M並搬送至保持台9,步驟S3的第1貼附過程係完成。Through this contact, the back side of the wafer W is adhered to the adhesive layer Tb, and the wafer W is held by the adhesive tape DT. Hereinafter, the wafer W and the adhesive tape DT are integrated as a whole and referred to as a sheet composite M. After the sheet composite M is formed, the adhesive tape DT is fed out by a predetermined amount, whereby the sheet composite M is conveyed toward the top of the holding table 9 as shown in FIG. 11 . While conveying the sheet composite M, the lifting table 8 is lowered and returned to its initial state. By forming the sheet composite M and conveying it to the holding table 9, the first bonding process of step S3 is completed.

步驟S4(腔室的形成) 當片複合體M搬送到保持台9的上方,貼附輥85便下降。接著,如圖12所示,一邊在黏著膠帶DT上滾動過去一邊將黏著膠帶DT遍及環形框架f及下殼體29A的頂部貼附。 Step S4 (Cavity formation) When the sheet composite M is transported to the top of the holding table 9, the attachment roller 85 descends. Then, as shown in FIG12, the adhesive tape DT is attached to the top of the annular frame f and the lower shell 29A while rolling over the adhesive tape DT.

當在環形框架f貼附了黏著膠帶DT,便令貼附輥85返回到初始位置,並且令上殼體29B下降。伴隨著上殼體29B的下降,如圖13所示,貼附在下殼體29A的頂部之部分的黏著膠帶DT係被上殼體29B與下殼體29A夾持,而構成腔室29。When the adhesive tape DT is attached to the annular frame f, the attaching roller 85 is returned to the initial position and the upper housing 29B is lowered. As the upper housing 29B is lowered, as shown in FIG. 13 , the adhesive tape DT attached to the top of the lower housing 29A is clamped by the upper housing 29B and the lower housing 29A to form the chamber 29.

此時,黏著膠帶DT作為密封材而發揮功能,並且腔室29係藉由黏著膠帶DT而分割成兩個空間。亦即,隔著黏著膠帶DT而分割成下殼體29A側的下空間H1與上殼體29B側的上空間H2。位在下殼體29A內的晶圓W係與黏著膠帶DT擁有預定的間隙(clearance)而近接相對向。At this time, the adhesive tape DT functions as a sealing material, and the chamber 29 is divided into two spaces by the adhesive tape DT. That is, the chamber 29 is divided into a lower space H1 on the side of the lower shell 29A and an upper space H2 on the side of the upper shell 29B via the adhesive tape DT. The wafer W in the lower shell 29A is in close proximity with the adhesive tape DT with a predetermined clearance.

步驟S5(第2貼附過程) 在使腔室29形成後,開始進行第2貼附過程。首先,控制部33係控制致動器37令保持台9下降至初始位置。接著,控制部33係在將圖6中所示的電磁閥105、107、110關閉的狀態下,令加壓裝置32作動以將氣體供給至下空間H1及上空間H2,將下空間H1及上空間H2加壓到特定值為止。就特定值的例子而言,可舉出0.3MPa至0.5MPa。藉由加壓裝置32進行加壓操作,下空間H1的氣壓及上空間H2的氣壓皆變得比大氣壓高。 Step S5 (Second Attachment Process) After the chamber 29 is formed, the second attachment process is started. First, the control unit 33 controls the actuator 37 to lower the holding table 9 to the initial position. Then, the control unit 33 operates the pressurizing device 32 to supply gas to the lower space H1 and the upper space H2, and pressurizes the lower space H1 and the upper space H2 to a specific value while the solenoid valves 105, 107, and 110 shown in FIG. 6 are closed. As an example of a specific value, 0.3MPa to 0.5MPa can be cited. By performing the pressurizing operation of the pressurizing device 32, the air pressure of the lower space H1 and the air pressure of the upper space H2 both become higher than the atmospheric pressure.

藉由上空間H2的加壓,如圖14所示,從上空間H2朝黏著膠帶DT作用推壓力V1。另外,因上空間H2全體受到加壓,所以推壓力V1係遍及黏著膠帶DT全體均一地作用。此外,藉由下空間H1全體受到加壓,從下空間H1朝晶圓W的下表面(在本實施例中為晶圓W的表面側)均一地作用推壓力V2。亦即,藉由推壓力V1及推壓力V2的作用,使黏著膠帶DT精度佳地逐漸於晶圓W的背面。結果,晶圓W與黏著膠帶DT的密接性提升,因此能夠避免因時間的經過造成黏著膠帶DT從晶圓W的背面剝離的情況發生。By pressurizing the upper space H2, as shown in FIG. 14, a pushing force V1 is applied from the upper space H2 to the adhesive tape DT. In addition, since the entire upper space H2 is pressurized, the pushing force V1 is applied uniformly to the entire adhesive tape DT. In addition, by pressurizing the entire lower space H1, a pushing force V2 is applied uniformly from the lower space H1 to the lower surface of the wafer W (the surface side of the wafer W in this embodiment). That is, by the action of the pushing force V1 and the pushing force V2, the adhesive tape DT is gradually applied to the back side of the wafer W with good precision. As a result, the adhesion between the wafer W and the adhesive tape DT is improved, so it is possible to prevent the adhesive tape DT from being peeled off from the back side of the wafer W over time.

在將下空間H1及上空間H2加壓到比大氣壓高的氣壓的狀態下,使推壓力作用於黏著膠帶DT與晶圓W之間預定時間後,控制部33係令加壓裝置32停止。接著,控制部33係將電磁閥103、105、107、110設為全開使下空間H1及上空間H2向大氣開放。控制部33係令上殼體29B上升將腔室29開放,並且令保持台9上升以使晶圓W的表面抵接於保持台9的晶圓保持面。第2貼附過程係相當於本發明的貼附過程。After the lower space H1 and the upper space H2 are pressurized to a pressure higher than the atmospheric pressure and the pushing force is applied between the adhesive tape DT and the wafer W for a predetermined time, the control unit 33 stops the pressurizing device 32. Then, the control unit 33 sets the electromagnetic valves 103, 105, 107, and 110 to be fully opened to open the lower space H1 and the upper space H2 to the atmosphere. The control unit 33 raises the upper housing 29B to open the chamber 29, and raises the holding table 9 so that the surface of the wafer W abuts against the wafer holding surface of the holding table 9. The second attachment process is equivalent to the attachment process of the present invention.

步驟S6(片的切斷) 另外,於在腔室29內進行步驟S5的製程的期間,令片切斷機構82作動而進行黏著膠帶DT的切斷。此時,如圖15所示,切刀95將貼附在環形框架f的黏著膠帶DT切斷成環形框架f的形狀,並且,推壓輥96追隨切刀95在環形框架f上的片切斷部位一邊滾動一邊推壓過去。 Step S6 (cutting of sheet) In addition, during the process of step S5 in the chamber 29, the sheet cutting mechanism 82 is operated to cut the adhesive tape DT. At this time, as shown in FIG. 15, the cutter 95 cuts the adhesive tape DT attached to the annular frame f into the shape of the annular frame f, and the pressing roller 96 follows the sheet cutting portion of the cutter 95 on the annular frame f while rolling and pressing.

在使上殼體29B上升後的時點,步驟S5的第2貼附過程係已經完成,因此,令壓輥90上升,解除黏著膠帶DT的夾送。然後,如圖16所示,令夾送輥86移動,將切斷後的不要的黏著膠帶DT持續往片回收部74捲收過去進行回收,並且從片供給部71送出預定量的黏著膠帶DT。藉由到步驟S6為止的各製程,片複合體M係與環形框架f一體化。結果,形成由環形框架f及晶圓W透過黏著膠帶DT一體化而成的安裝框架MF。At the point after the upper shell 29B is raised, the second attachment process of step S5 is completed, so the pressure roller 90 is raised to release the clamping of the adhesive tape DT. Then, as shown in FIG. 16 , the clamping roller 86 is moved to continuously reel in the unnecessary adhesive tape DT after being cut to the sheet recovery section 74 for recovery, and a predetermined amount of adhesive tape DT is delivered from the sheet supply section 71. Through each process up to step S6, the sheet complex M is integrated with the annular frame f. As a result, a mounting frame MF is formed in which the annular frame f and the wafer W are integrated through the adhesive tape DT.

當不要的黏著膠帶DT被捲收並回收,夾送輥86及貼附輥85便返回到初始位置。接著,保持台9係在保持著安裝框架MF的狀態下從貼附位置移動至初始位置。When the unnecessary adhesive tape DT is rolled up and recovered, the nip roller 86 and the attaching roller 85 return to the initial position. Then, the holding table 9 moves from the attaching position to the initial position while holding the mounting frame MF.

步驟S7(安裝框架的回收) 當保持台9返回到初始位置,如圖17所示,設置在框架搬送裝置17的吸附墊28便吸附保持有安裝框架MF,令安裝框架MF從下殼體29A脫離。吸附保持安裝框架MF的框架搬送裝置17係將安裝框架MF搬送至框架回收部6。搬送的安裝框架MF係積載收納至匣盒41。 Step S7 (recovery of mounting frame) When the holding table 9 returns to the initial position, as shown in FIG17 , the adsorption pad 28 provided in the frame conveying device 17 adsorbs and holds the mounting frame MF, so that the mounting frame MF is separated from the lower shell 29A. The frame conveying device 17 that adsorbs and holds the mounting frame MF conveys the mounting frame MF to the frame recovery unit 6. The conveyed mounting frame MF is loaded and stored in the cassette 41.

至此,將黏著膠帶DT貼附於晶圓W的一輪動作係結束。之後,重複進行上述處理直到安裝框架MF達到預定數目。如上述,藉由黏著片貼附裝置1,製造成為有黏著膠帶DT密接貼附在晶圓W之狀態的片複合體M。藉由第2貼附過程而成為有黏著膠帶DT貼附在晶圓W之狀態的片複合體M係相當於本發明的半導體製品。At this point, one round of action of attaching the adhesive tape DT to the wafer W is completed. Afterwards, the above process is repeated until the number of mounting frames MF reaches a predetermined number. As described above, the sheet composite M in which the adhesive tape DT is closely attached to the wafer W is manufactured by the adhesive sheet attaching device 1. The sheet composite M in which the adhesive tape DT is attached to the wafer W by the second attaching process is equivalent to the semiconductor product of the present invention.

<實施例1的構成產生的效果> 依據上述實施例1的裝置,在藉由第1貼附過程將黏著膠帶DT貼附到晶圓W後進行第2貼附過程,藉此,以對晶圓W精度更佳地密接的方式貼附黏著膠帶DT。在本發明的第2貼附過程中,係以使下空間H1及上空間H2的氣壓變得比大氣壓大的方式加壓,藉此,將黏著膠帶DT精度佳地貼附於晶圓W的背面。 <Effects of the structure of embodiment 1> According to the device of embodiment 1, after the adhesive tape DT is attached to the wafer W by the first attachment process, the second attachment process is performed, thereby attaching the adhesive tape DT in a manner that is more closely attached to the wafer W with better accuracy. In the second attachment process of the present invention, the pressure of the lower space H1 and the upper space H2 is pressurized in a manner that is greater than the atmospheric pressure, thereby attaching the adhesive tape DT to the back of the wafer W with better accuracy.

在習知技術的構成中,係使用真空裝置將腔室的內部減壓,藉由因此而產生的壓差將黏著膠帶貼附於晶圓。然而,藉由自大氣壓狀態的減壓而產生的壓差的大小係成為大氣壓以下。亦即,當利用壓差將黏著膠帶DT貼附於晶圓W時,令黏著膠帶DT對晶圓W的背面推壓的力的大小存在上限。In the known technology, the pressure inside the chamber is reduced by using a vacuum device, and the adhesive tape is attached to the wafer by the pressure difference generated thereby. However, the pressure difference generated by reducing the pressure from the atmospheric pressure state is below the atmospheric pressure. That is, when the adhesive tape DT is attached to the wafer W by using the pressure difference, there is an upper limit to the force that the adhesive tape DT pushes against the back of the wafer W.

因此,在利用因減壓而產生的壓差使黏著膠帶DT接觸於晶圓W的狀態,黏著膠帶DT與晶圓W的密接性係低。此外,在使用第1推壓構件進行第2次貼附的習知技術的構成中,只能令推壓力作用在黏著膠帶DT當中的有限部分。此外,該推壓力的大小亦不足,因此難以使黏著膠帶DT與晶圓W的密接性提升。Therefore, in the state where the adhesive tape DT is brought into contact with the wafer W by the pressure difference generated by the decompression, the adhesion between the adhesive tape DT and the wafer W is low. In addition, in the structure of the conventional technology of using the first pushing member for the second attachment, the pushing force can only act on a limited part of the adhesive tape DT. In addition, the magnitude of the pushing force is also insufficient, so it is difficult to improve the adhesion between the adhesive tape DT and the wafer W.

相對於此,在本發明中係使用加壓裝置32以使腔室29內的上空間H2及下空間H1的氣壓變得比大氣壓大的方式加壓。亦即,在第2貼附過程中係能夠使足夠大於藉由減壓而產生的壓差之推壓力V1、V2作用於黏著膠帶DT及晶圓W。此外,推壓力V1、V2係遍及貼附於晶圓W的黏著膠帶DT的全面作用。因此,藉由進行第2貼附過程,能夠大幅提升黏著膠帶DT與晶圓W的密接性,因此在一連串的貼附處理完成後即使經過一段時間,仍能夠避免黏著膠帶DT從晶圓W剝離。In contrast, in the present invention, a pressurizing device 32 is used to pressurize the upper space H2 and the lower space H1 in the chamber 29 so that the air pressure becomes greater than the atmospheric pressure. That is, in the second bonding process, the pushing pressures V1 and V2 that are sufficiently greater than the pressure difference generated by decompression can act on the adhesive tape DT and the wafer W. In addition, the pushing pressures V1 and V2 are applied to the entire adhesive tape DT attached to the wafer W. Therefore, by performing the second bonding process, the adhesion between the adhesive tape DT and the wafer W can be greatly improved, so that even after a period of time has passed after a series of bonding processes are completed, the adhesive tape DT can be prevented from peeling off from the wafer W.

此外,在第2貼附過程中係能夠藉由適宜地控制加壓裝置32,將推壓力V1及V2的大小調節成任意的值。因此,即使以黏著材Tb的構成材料、或晶圓W的尺寸及環狀凸部Ka的厚度作為例子的各種條件發生改變,仍能夠藉由適宜地調節推壓力V1及V2的大小,將黏著膠帶DT確實地貼附於晶圓W的環狀凸部形成面。此外,因為適切之大小的推壓力V1及V2遍及黏著膠帶DT全體均一地作用,所以能夠避免因過多的推壓力的作用或推壓力的不均造成晶圓W破損的情況發生。 [實施例2] In addition, in the second attachment process, the magnitude of the pushing forces V1 and V2 can be adjusted to any value by appropriately controlling the pressurizing device 32. Therefore, even if various conditions such as the constituent material of the adhesive material Tb, the size of the wafer W, and the thickness of the annular protrusion Ka change, the adhesive tape DT can be reliably attached to the annular protrusion forming surface of the wafer W by appropriately adjusting the magnitude of the pushing forces V1 and V2. In addition, because the pushing forces V1 and V2 of appropriate magnitude act uniformly throughout the entire adhesive tape DT, it is possible to avoid the occurrence of damage to the wafer W due to excessive pushing force or uneven pushing force. [Example 2]

以下,參照圖式,說明本發明的實施例2。在實施例1中係採用將長形的黏著膠帶DT遍及晶圓W的背面與環形框架f貼附後切斷成與工件的形狀(此處乃係晶圓W或環形框架f的形狀)相應的預定的形狀的構成為例子進行了說明。在實施例2中係採用將已預先具有與工件的形狀相應的預定的形狀的黏著膠帶貼附於該工件的構成為例子進行說明。另外,針對與實施例1的黏著片貼附裝置1相同的構成係僅止於標記相同的元件符號,針對不同的構成部分進行詳細說明。Hereinafter, the second embodiment of the present invention will be described with reference to the drawings. In the first embodiment, a configuration in which a long adhesive tape DT is attached to the back of a wafer W and an annular frame f and then cut into a predetermined shape corresponding to the shape of a workpiece (here, the shape of the wafer W or the annular frame f) is used as an example for description. In the second embodiment, a configuration in which an adhesive tape having a predetermined shape corresponding to the shape of a workpiece is attached to the workpiece is used as an example for description. In addition, the configuration identical to that of the adhesive sheet attaching device 1 of the first embodiment is limited to being marked with the same component symbols, and the different configuration parts are described in detail.

首先,針對實施例2的黏著膠帶DT的構成作說明。圖18(a)係顯示搬送用片P及黏著膠帶DT的背面側之立體圖,圖18(b)係搬送用片P及黏著膠帶DT的縱剖面圖。First, the structure of the adhesive tape DT of Example 2 will be described. Fig. 18(a) is a perspective view showing the back side of the transport sheet P and the adhesive tape DT, and Fig. 18(b) is a longitudinal sectional view of the transport sheet P and the adhesive tape DT.

實施例2的黏著膠帶DT係如圖18(a)所示,保持在長形的搬送用片P。亦即,在長形的搬送用片P的一面,以預定的節距貼附保持著預定形狀的黏著膠帶DT。黏著膠帶DT係已預先切斷成與晶圓W的環狀凸部Ka的形成面(在本實施例中為背面)的形狀相應的預定的形狀。在實施例2中,設黏著膠帶DT已預先切斷成圓形形狀。The adhesive tape DT of the second embodiment is held on the long conveying sheet P as shown in FIG. 18( a). That is, the adhesive tape DT of a predetermined shape is attached to one side of the long conveying sheet P at a predetermined pitch. The adhesive tape DT is pre-cut into a predetermined shape corresponding to the shape of the formation surface (the back side in this embodiment) of the annular convex portion Ka of the wafer W. In the second embodiment, the adhesive tape DT is pre-cut into a circular shape.

搬送用片P係如圖18(b)所示,具備有由非黏著性的基材Pa與具黏著性的黏著材Pb積層而成的構造。就構成基材Pa的材料的例子而言,可舉出聚烯烴、聚乙烯等。就構成黏著材Pb的材料的例子而言,可舉出丙烯酸酯共聚物等。藉由黏著膠帶DT的基材Ta貼附於搬送用片P的黏著材Pb,搬送用片P係將黏著膠帶DT予以保持。在本實施例中,黏著膠帶DT的形狀乃係圓形形狀,但能夠相應於晶圓W的形狀適宜變更。As shown in FIG18( b ), the transport sheet P has a structure in which a non-adhesive base material Pa and an adhesive adhesive material Pb are laminated. Examples of materials constituting the base material Pa include polyolefins, polyethylene, etc. Examples of materials constituting the adhesive material Pb include acrylic copolymers, etc. The transport sheet P holds the adhesive tape DT by attaching the base material Ta of the adhesive tape DT to the adhesive material Pb of the transport sheet P. In the present embodiment, the shape of the adhesive tape DT is circular, but it can be changed appropriately according to the shape of the wafer W.

實施例2的黏著片貼附裝置1係與圖3至圖6所示實施例1的裝置有共通的基本構成。惟在片供給部71係裝填已保持有複數個預先成型成預定形狀的黏著膠帶DT之搬送用片P。片切斷機構82係切斷貼附在環形框架f之部分的搬送用片P。片回收部74係構成為在藉由片切斷機構82切斷搬送用片P後,回收殘留在安裝框架MF周圍的不要的搬送用片P。The adhesive sheet sticking device 1 of the second embodiment has the same basic structure as the device of the first embodiment shown in FIGS. 3 to 6. However, the sheet supply section 71 is loaded with a conveying sheet P which has been loaded with a plurality of adhesive tapes DT pre-formed into a predetermined shape. The sheet cutting mechanism 82 cuts the conveying sheet P stuck to the ring frame f. The sheet recovery section 74 is configured to recover the unnecessary conveying sheet P remaining around the mounting frame MF after the conveying sheet P is cut by the sheet cutting mechanism 82.

<實施例2的動作> 此處,說明實施例2的黏著片貼附裝置1的動作。圖19係說明使用實施例2的黏著片貼附裝置1將黏著膠帶DT貼附於晶圓W的一連串製程之流程圖。針對與實施例1的黏著片貼附裝置1的動作相同的製程係簡化說明,針對不同的製程進行詳細說明。 <Operation of Embodiment 2> Here, the operation of the adhesive sheet attaching device 1 of Embodiment 2 is described. FIG. 19 is a flow chart illustrating a series of processes for attaching the adhesive tape DT to the wafer W using the adhesive sheet attaching device 1 of Embodiment 2. The processes that are the same as the operations of the adhesive sheet attaching device 1 of Embodiment 1 are simplified, and the different processes are described in detail.

步驟S1(工件的供給) 當貼附指令送出,便同實施例1一樣進行晶圓W及環形框架f的供給。亦即,收納在框架供給部12的環形框架f係藉由框架搬送裝置17移載至框架保持部38。當框架保持部38保持環形框架f時,下殼體29A便與保持台9一起沿軌道40從初始位置朝片貼附機構81側的貼附位置移動。 Step S1 (supply of workpiece) When the attachment instruction is sent, the wafer W and the annular frame f are supplied as in Example 1. That is, the annular frame f stored in the frame supply unit 12 is transferred to the frame holding unit 38 by the frame conveying device 17. When the frame holding unit 38 holds the annular frame f, the lower shell 29A moves along the track 40 with the holding table 9 from the initial position to the attachment position on the side of the sheet attachment mechanism 81.

接著,收納在容器5的晶圓W係藉由晶圓搬送裝置16,經由對準機7移載至升降台8。當升降台8將基板10吸附保持,升降台8便沿軌道54從初始位置朝片貼附機構81側的貼附位置移動。升降台8及保持台9各者移動到貼附位置的狀態係顯示於圖20。Next, the wafer W stored in the container 5 is transferred to the lifting platform 8 via the alignment machine 7 by the wafer transfer device 16. When the lifting platform 8 adsorbs and holds the substrate 10, the lifting platform 8 moves along the track 54 from the initial position to the attachment position on the side of the sheet attachment mechanism 81. The state in which the lifting platform 8 and the holding platform 9 each move to the attachment position is shown in FIG.

步驟S2(黏著片的供給) 當進行了藉由晶圓搬送裝置16等進行的工件的供給,便在貼附單元13進行黏著膠帶DT的供給。亦即,從片供給部71將預定量的黏著膠帶DT一邊剝離分離膜S一邊與搬送用片P一起送出。整體為長形的搬送用片P係沿預定的搬送路徑朝貼附位置的上方被導引。此時,如圖21所示,保持在搬送用片P的黏著膠帶DT係以位在載置在升降台8的晶圓W的上方的方式進行定位(positioning)。 Step S2 (supply of adhesive sheet) When the workpiece is supplied by the wafer conveying device 16 or the like, the adhesive tape DT is supplied in the attaching unit 13. That is, a predetermined amount of adhesive tape DT is delivered from the sheet supply unit 71 together with the conveying sheet P while peeling off the separation film S. The conveying sheet P, which is generally long, is guided toward the upper side of the attaching position along a predetermined conveying path. At this time, as shown in FIG. 21, the adhesive tape DT held on the conveying sheet P is positioned so as to be located above the wafer W placed on the lifting table 8.

步驟S3(第1貼附過程) 當供給了工件及晶圓W,便同實施例1一樣執行第1貼附過程。亦即,控制部33係令致動器53驅動使升降台8上升。藉由升降台8的上升,如圖22所示,晶圓W的背面接觸黏著膠帶DT,晶圓W的背面係被黏著膠帶DT覆蓋。 Step S3 (first attachment process) When the workpiece and wafer W are supplied, the first attachment process is performed as in Example 1. That is, the control unit 33 drives the actuator 53 to raise the lifting platform 8. As the lifting platform 8 rises, as shown in FIG. 22, the back side of the wafer W contacts the adhesive tape DT, and the back side of the wafer W is covered by the adhesive tape DT.

藉由該接觸,使晶圓W的背面附著於黏著層Tb,晶圓W藉由黏著膠帶DT而獲得保持。接著,製作由晶圓W與黏著膠帶DT一體化而成的片複合體M。在製成片複合體M後,將黏著膠帶DT送出預定量,藉此,如圖23所示,片複合體M係搬送至保持台9的上方。在搬送片複合體M的同時,升降台8係下降而回復至初始狀態。By this contact, the back side of the wafer W is attached to the adhesive layer Tb, and the wafer W is held by the adhesive tape DT. Then, a sheet composite M is produced by integrating the wafer W and the adhesive tape DT. After the sheet composite M is produced, the adhesive tape DT is fed out by a predetermined amount, whereby the sheet composite M is conveyed to the top of the holding table 9 as shown in FIG. 23. While conveying the sheet composite M, the lifting table 8 is lowered and returned to the initial state.

步驟S4(腔室的形成) 當片複合體M搬送到保持台9的上方,便令腔室29形成。亦即如圖24所示,貼附輥85下降。接著,一邊在搬送用片P上滾動一邊將搬送用片P遍及環形框架f及下殼體29A的頂部貼附。連動於該貼附輥85的移動,從片供給部71將預定量的黏著膠帶DT一邊剝離分離膜S一邊與搬送用片P一起送出。 Step S4 (Cavity formation) When the sheet composite M is transported to the top of the holding table 9, the cavity 29 is formed. That is, as shown in FIG24, the attachment roller 85 descends. Then, the conveying sheet P is attached to the top of the annular frame f and the lower shell 29A while rolling on the conveying sheet P. In conjunction with the movement of the attachment roller 85, a predetermined amount of adhesive tape DT is delivered from the sheet supply section 71 together with the conveying sheet P while peeling off the separation film S.

當在環形框架f貼附了搬送用片P,便令貼附輥85返回到初始位置,並且令上殼體29B下降。伴隨著上殼體29B的下降,如圖25所示,貼附在下殼體29A的頂部之部分的搬送用片P係被上殼體29B與下殼體29A夾持,形成腔室29。此時,搬送用片P作為密封材而發揮功能,並且腔室29係藉由搬送用片P而分割成下空間H1與上空間H2。When the conveying sheet P is attached to the annular frame f, the attaching roller 85 is returned to the initial position and the upper housing 29B is lowered. As the upper housing 29B is lowered, as shown in FIG. 25 , the conveying sheet P attached to the top of the lower housing 29A is sandwiched by the upper housing 29B and the lower housing 29A to form a chamber 29. At this time, the conveying sheet P functions as a sealing material, and the chamber 29 is divided into a lower space H1 and an upper space H2 by the conveying sheet P.

步驟S5(第2貼附過程) 在使腔室29形成後,同實施例1一樣令第2貼附過程執行。首先,控制部33係令保持台9下降,並且令加壓裝置32作動以將氣體供給至下空間H1及上空間H2,將下空間H1及上空間H2加壓到特定值為止。藉由加壓裝置32進行加壓操作,使下空間H1的氣壓及上空間H2的氣壓皆變得比大氣壓高。 Step S5 (Second Attachment Process) After the chamber 29 is formed, the second attachment process is executed as in Example 1. First, the control unit 33 causes the holding table 9 to descend, and causes the pressurizing device 32 to operate to supply gas to the lower space H1 and the upper space H2, and pressurize the lower space H1 and the upper space H2 to a specific value. The pressurizing device 32 performs the pressurizing operation, so that the air pressure of the lower space H1 and the air pressure of the upper space H2 become higher than the atmospheric pressure.

藉由上空間H2的加壓,如圖26所示,從上空間H2朝黏著膠帶DT均一地作用推壓力V1。此外,藉由下空間H1全體受到加壓,從下空間H1對晶圓W的朝下的面均一地作用推壓力V2。亦即,藉由足夠大的力即推壓力V1及推壓力V2的作用,使黏著膠帶DT精度佳地逐漸貼附於晶圓W的背面,晶圓W與黏著膠帶DT的密接性提升。By pressurizing the upper space H2, as shown in FIG. 26, a push force V1 is uniformly applied from the upper space H2 to the adhesive tape DT. In addition, by pressurizing the entire lower space H1, a push force V2 is uniformly applied from the lower space H1 to the downward surface of the wafer W. That is, by the action of sufficiently large forces, namely, the push force V1 and the push force V2, the adhesive tape DT is gradually attached to the back surface of the wafer W with good precision, and the adhesion between the wafer W and the adhesive tape DT is improved.

在將下空間H1及上空間H2加壓到比大氣壓高的氣壓的狀態下,使推壓力作用於黏著膠帶DT與晶圓W之間預定時間後,控制部33係令加壓裝置32停止。接著,控制部33係將電磁閥103、105、107、110設為全開使下空間H1及上空間H2向大氣開放。控制部33係令上殼體29B上升將腔室29開放,並且令保持台9上升使晶圓W的表面抵接於保持台9的晶圓保持面。After the lower space H1 and the upper space H2 are pressurized to a pressure higher than the atmospheric pressure and the pushing force is applied between the adhesive tape DT and the wafer W for a predetermined time, the control unit 33 stops the pressurizing device 32. Then, the control unit 33 sets the electromagnetic valves 103, 105, 107, and 110 to be fully opened to open the lower space H1 and the upper space H2 to the atmosphere. The control unit 33 raises the upper housing 29B to open the chamber 29, and raises the holding table 9 so that the surface of the wafer W abuts against the wafer holding surface of the holding table 9.

步驟S6(搬送用片的切斷) 另外,於在腔室29內進行步驟S5的製程的期間,令片切斷機構82作動。在實施例2中,片切斷機構82係在切斷搬送用片P這點上不同於實施例1的製程。亦即,如圖27所示,切刀95將貼附在環形框架f的搬送用片P切斷成環形框架f的形狀,並且,推壓輥96追隨切刀95在環形框架f上的片切斷部位一邊滾動一邊推壓過去。 Step S6 (cutting of the conveying sheet) In addition, during the process of step S5 in the chamber 29, the sheet cutting mechanism 82 is operated. In the second embodiment, the sheet cutting mechanism 82 is different from the process of the first embodiment in that it cuts the conveying sheet P. That is, as shown in FIG. 27, the cutter 95 cuts the conveying sheet P attached to the annular frame f into the shape of the annular frame f, and the pressing roller 96 follows the sheet cutting portion of the cutter 95 on the annular frame f while rolling and pressing.

在將搬送用片P切斷成圓形後,令上殼體29B上升。在使上殼體29B上升後的時點,步驟S5的過程係已經完成,因此,令壓輥90上升,解除黏著膠帶DT的夾送。然後,如圖28所示,令夾送輥86移動,將切斷後的不要的搬送用片P持續往片回收部74捲收過去進行回收,並且從片供給部71將預定量的黏著膠帶DT連同搬送用片P一起送出。After the conveying sheet P is cut into a circular shape, the upper shell 29B is raised. At the time when the upper shell 29B is raised, the process of step S5 is completed, so the pressing roller 90 is raised to release the clamping of the adhesive tape DT. Then, as shown in FIG. 28, the clamping roller 86 is moved to continuously reel in the unnecessary conveying sheet P after the cut to the sheet recovery section 74 for recovery, and a predetermined amount of adhesive tape DT is sent out from the sheet supply section 71 together with the conveying sheet P.

藉由到步驟S6為止的各製程,形成安裝框架MF。在實施例2的安裝框架MF,環形框架f及晶圓W透過黏著膠帶DT及搬送用片P而一體化。當將不要的搬送用片P捲收進行回收,夾送輥86及貼附輥85便返回到初始位置。接著,保持台9係在保持著安裝框架MF的狀態下從貼附位置移動至初始位置。Through each process up to step S6, the mounting frame MF is formed. In the mounting frame MF of the second embodiment, the ring frame f and the wafer W are integrated through the adhesive tape DT and the transport sheet P. When the unnecessary transport sheet P is rolled up and recovered, the clamping roller 86 and the attaching roller 85 return to the initial position. Then, the holding table 9 moves from the attaching position to the initial position while holding the mounting frame MF.

步驟S7(安裝框架的回收) 當保持台9返回到初始位置,如圖29所示,設置在框架搬送裝置17的吸附墊28便吸附保持安裝框架MF,令安裝框架MF從下殼體29A脫離。吸附保持有安裝框架MF的框架搬送裝置17係將安裝框架MF搬送至框架回收部6。搬送的安裝框架MF係積載收納至匣盒41。 Step S7 (recovery of mounting frame) When the holding table 9 returns to the initial position, as shown in FIG. 29 , the adsorption pad 28 provided in the frame conveying device 17 adsorbs and holds the mounting frame MF, so that the mounting frame MF is separated from the lower shell 29A. The frame conveying device 17 adsorbing and holding the mounting frame MF conveys the mounting frame MF to the frame recovery unit 6. The conveyed mounting frame MF is loaded and stored in the cassette 41.

至此,將黏著膠帶DT貼附於晶圓W的一輪動作係結束。之後,重複進行上述處理直到安裝框架MF達到預定數目。藉由使用實施例2的黏著片貼附裝置1,即使是使用預先切斷成預定形狀的黏著膠帶DT的情況,仍能夠獲得與實施例1相同的效果。亦即,在將黏著膠帶DT貼附於具有環狀凸部的晶圓W的環狀凸部形成面時,既可避免在晶圓W產生損傷又能夠將黏著膠帶DT精度佳地貼附於晶圓W。At this point, one round of action of attaching the adhesive tape DT to the wafer W is completed. Thereafter, the above process is repeated until the number of mounting frames MF reaches a predetermined number. By using the adhesive sheet attaching device 1 of Example 2, even when using the adhesive tape DT that has been pre-cut into a predetermined shape, the same effect as that of Example 1 can be obtained. That is, when attaching the adhesive tape DT to the annular protrusion forming surface of the wafer W having the annular protrusion, damage to the wafer W can be avoided and the adhesive tape DT can be attached to the wafer W with good precision.

另外,本說明書所揭示的實施形態之各點均為例子而已,並非作為限制用。本發明之範圍,並不限於上述實施型態之說明,而是如申請專利範圍所示,且包含與申請專利範圍均等之意義以及範圍內之所有改變(變形例)。就例子而言,本發明係能夠實施如下述的變形。In addition, the various aspects of the embodiments disclosed in this specification are examples only and are not intended to be limiting. The scope of the present invention is not limited to the above embodiments, but is as shown in the scope of the patent application, and includes all changes (variations) within the scope that are equivalent to the scope of the patent application. For example, the present invention can be implemented as follows.

(2)在各實施例的步驟S5中,加壓裝置32係對下空間H1及上空間H2雙方的內部加壓,但並不限於此。亦即,加壓裝置32係亦可僅將上空間H2加壓至比大氣壓高的氣壓為止,藉由推壓力V1精度更佳地貼附黏著膠帶DT。(2) In step S5 of each embodiment, the pressurizing device 32 pressurizes the interior of both the lower space H1 and the upper space H2, but the present invention is not limited thereto. That is, the pressurizing device 32 may only pressurize the upper space H2 to a pressure higher than atmospheric pressure, so that the adhesive tape DT can be attached with better precision by the push pressure V1.

(3)在各實施例的步驟S5中,使用加壓裝置32將腔室29內部的氣壓變得比大氣壓高,藉此,以使晶圓W密接至黏著膠帶DT的方式使推壓的推壓力V1產生。然而,步驟S5的製程係只要是使比大氣壓大的推壓力產生在黏著膠帶DT與晶圓W之間的構成,則並不限於使用腔室29。(3) In step S5 of each embodiment, the pressure inside the chamber 29 is made higher than the atmospheric pressure by using the pressurizing device 32, thereby generating a pushing pressure V1 to make the wafer W closely contact the adhesive tape DT. However, the process of step S5 is not limited to using the chamber 29 as long as it is a configuration that generates a pushing pressure greater than the atmospheric pressure between the adhesive tape DT and the wafer W.

就省略掉腔室29的構成的一例而言,如圖30所示,可舉出如下的構成:在保持台9的上方配設推壓板141,令推壓板141下降來推壓密封片S,藉此而施加推壓力V1。As an example of a configuration in which the chamber 29 is omitted, as shown in FIG. 30 , the following configuration can be cited: a pressing plate 141 is disposed above the holding table 9, and the pressing plate 141 is lowered to press the sealing sheet S, thereby applying a pressing force V1.

推壓構件141係底面形成為平坦,以位在黏著膠帶DT上方的方式配設。因此,藉由令推壓構件141下降,使平坦的推壓構件141的底面推壓黏著膠帶DT,黏著膠帶DT係變形成凸狀而能夠接觸晶圓W。The pressing member 141 has a flat bottom surface and is disposed above the adhesive tape DT. Therefore, by lowering the pressing member 141, the flat bottom surface of the pressing member 141 presses the adhesive tape DT, and the adhesive tape DT is deformed into a convex shape to contact the wafer W.

(4)在各實施例,係以將支撐用的黏著膠帶DT貼附於晶圓W的構成為例子進行了說明,但貼附於晶圓W的黏著片並不限於此。只要是貼附以電路保護用的黏著膠帶作為例子的片狀的黏著材的構成,則能夠適用各實施例的構成。(4) In each embodiment, the structure of attaching the supporting adhesive tape DT to the wafer W is described as an example, but the adhesive sheet attached to the wafer W is not limited to this. As long as the structure of attaching a sheet-shaped adhesive material such as the circuit protection adhesive tape is used as an example, the structure of each embodiment can be applied.

(5)在各實施例,就作為貼附黏著片之對象的工件而言,係例示了晶圓W及環形框架f,但工件並不限於此。就一例而言,亦可省略環形框架f,將黏著片僅貼附於晶圓W。此外,本實施例的構成係能夠適用基板、面板(panel)等各種半導體用構件作為工件。此外,就工件的形狀而言,除了圓形形狀,亦可為矩形形狀、多邊形形狀、大致圓形形狀等。(5) In each embodiment, as a workpiece to which the adhesive sheet is attached, a wafer W and an annular frame f are exemplified, but the workpiece is not limited to this. For example, the annular frame f can be omitted and the adhesive sheet can be attached only to the wafer W. In addition, the structure of this embodiment can be applied to various semiconductor components such as substrates and panels as workpieces. In addition, as for the shape of the workpiece, in addition to a circular shape, it can also be a rectangular shape, a polygonal shape, a roughly circular shape, etc.

(6)在各實施例,係令保持台9在預定的時點(timing)升降移動來將黏著膠帶DT貼附於晶圓W,但保持台9的升降移動係亦可適宜變更。就一例而言,並不限為步驟S5的加壓處理係在令保持台9下降後進行的構成,亦可一邊維持上升狀態一邊進行加壓處理。(6) In each embodiment, the holding table 9 is moved up and down at a predetermined timing to attach the adhesive tape DT to the wafer W, but the up and down movement of the holding table 9 can be changed as appropriate. For example, the pressurization process in step S5 is not limited to being performed after the holding table 9 is lowered, and the pressurization process can also be performed while maintaining the raised state.

(7)在各實施例,框架保持部38係配設在下殼體29A的外部,但亦可將框架保持部38設在下殼體29A的內部。此時,自步驟S4起的過程係在將環形框架f及晶圓W的各者收納在腔室29的內部的狀態下進行。(7) In each embodiment, the frame holding part 38 is disposed outside the lower housing 29A, but the frame holding part 38 may be disposed inside the lower housing 29A. In this case, the process from step S4 onwards is performed with the ring frame f and the wafer W each housed inside the chamber 29.

(8)在實施例2,黏著膠帶DT係以成為與晶圓W的環狀凸部形成面的形狀相應的預定形狀的方式預先成型,但並不限於此。亦即,片供給部71係亦可裝填添設有長形的搬送用片P的長形的黏著膠帶DT。添設有長形的搬送用片P的長形的黏著膠帶DT的構成係如同圖31(a)所示。此時,黏著片貼附裝置1係在腔室29的上游具備片切斷裝置201,片切斷裝置201將長形的黏著膠帶DT成型成預定形狀。(8) In Embodiment 2, the adhesive tape DT is pre-molded in a predetermined shape corresponding to the shape of the annular convex portion forming surface of the wafer W, but the present invention is not limited to this. That is, the sheet supply portion 71 can also be loaded with a long adhesive tape DT with a long conveying sheet P added thereto. The structure of the long adhesive tape DT with a long conveying sheet P added thereto is as shown in FIG. 31(a). At this time, the adhesive sheet attaching device 1 is provided with a sheet cutting device 201 upstream of the chamber 29, and the sheet cutting device 201 molds the long adhesive tape DT into a predetermined shape.

片切斷裝置201的構成係如同圖31(b)所示。片切斷裝置201係具備支撐台203、切刀205、及黏著片回收部207。另外,從片供給部71送出的黏著膠帶DT及搬送用片P係藉由未圖示的翻面裝置而翻面,以黏著膠帶DT成為在搬送用片P上側的狀態供給至片切斷裝置201。The sheet cutting device 201 is configured as shown in FIG31(b). The sheet cutting device 201 includes a support table 203, a cutter 205, and an adhesive sheet collecting unit 207. In addition, the adhesive tape DT and the conveying sheet P fed from the sheet supply unit 71 are turned over by a turning device (not shown) and supplied to the sheet cutting device 201 with the adhesive tape DT on the upper side of the conveying sheet P.

支撐台203係配設成將從片供給部71沿方向L送出而供給過來的長形的黏著膠帶DT及搬送用片P當中的為在下側的搬送用片P水平地承接。切刀205係配設在支撐台203的上方,藉由未圖示的可動台而能夠升降移動。就切刀205的一例而言,使用圓環狀的湯姆森刀(Thomson blade)。The support table 203 is configured to horizontally receive the long adhesive tape DT and the conveying sheet P at the lower side among the conveying sheets P fed from the sheet supply unit 71 along the direction L. The cutter 205 is disposed above the support table 203 and can be moved up and down by a movable table not shown. As an example of the cutter 205, a circular Thomson blade is used.

藉由切刀205下降,黏著膠帶DT與搬送用片P當中的黏著膠帶DT的層被切出成圓環狀的軌跡K的形狀。切刀205切斷黏著膠帶DT的構成並不限於此,就其他例子而言,可舉出令刀(knife)狀的切刀205沿圓形形狀的軌道移動,將黏著膠帶DT切出成圓形形狀的構成等。As the cutter 205 descends, the adhesive tape DT and the layer of the adhesive tape DT between the conveying sheet P are cut into the shape of a circular track K. The configuration in which the cutter 205 cuts the adhesive tape DT is not limited to this. As another example, a configuration in which the knife-shaped cutter 205 moves along a circular track to cut the adhesive tape DT into a circular shape can be cited.

黏著片回收部207係將切斷成圓形形狀的黏著膠帶DT的周圍剩下的不要的黏著膠帶DTn回收。不要的部分的黏著膠帶DTn係在通過饋送輥208後立即從搬送用片P剝離。剝離的黏著膠帶DTn係藉由導引輥209而導引至回收筒管210。回收筒管201係將從搬送用片P剝離下來的黏著膠帶DTn捲收進行回收。因此,藉由片切斷裝置201,成為藉由切刀205成型成圓形的黏著膠帶DT殘留在搬送用片P上的狀態。The adhesive sheet recovery section 207 recovers the unnecessary adhesive tape DTn remaining around the adhesive tape DT cut into a circular shape. The unnecessary part of the adhesive tape DTn is immediately peeled off from the conveying sheet P after passing through the feed roller 208. The peeled adhesive tape DTn is guided to the recovery bobbin 210 by the guide roller 209. The recovery bobbin 201 reels and recovers the adhesive tape DTn peeled off from the conveying sheet P. Therefore, by the sheet cutting device 201, the adhesive tape DT formed into a circular shape by the cutter 205 remains on the conveying sheet P.

切斷成圓形的黏著膠帶DT係與搬送用片P一起導引至腔室29。另外,黏著膠帶DT及搬送用片P係在片切斷裝置201的下游藉由未圖示的翻面裝置再次翻面,以黏著膠帶DT成為在搬送用片P下側的狀態導引至腔室29。The adhesive tape DT cut into a circular shape is guided to the chamber 29 together with the conveying sheet P. The adhesive tape DT and the conveying sheet P are turned over again by a turning device (not shown) downstream of the sheet cutting device 201, and guided to the chamber 29 with the adhesive tape DT under the conveying sheet P.

(9)在各實施例,如圖32(a)所示,腔室29係亦可具備片狀彈性體Ds。以下,以實施例2的構成為例示,針對本變形例進行說明。(9) In each embodiment, as shown in Fig. 32(a), the chamber 29 may also include a sheet-like elastic body Ds. Hereinafter, this modification will be described by taking the structure of the second embodiment as an example.

彈性體Ds係配設在上殼體29B的內部,以與上殼體29B的內徑相接的方式構成。此外,以彈性體Ds的下表面與上殼體29B的圓筒底部成為齊平的方式構成。因此,當下殼體29A與上殼體29B夾住搬送用片P而形成腔室29時,彈性體Ds便與搬送用片P抵接。具體而言,在搬送用片P,係在保持黏著膠帶DT之面的相反側(在圖中為上表面側)抵接彈性體Ds。藉由將彈性體Ds以與下殼體29A的內徑相接的方式配設,在形成腔室29時,使彈性體Ds不會被夾到,因此,能夠防止腔室29的密閉性因彈性體Ds而下降。就構成彈性體Ds的材料的例子而言,可舉出橡膠、彈性物、或膠(gel)狀的高分子材料等。The elastic body Ds is disposed inside the upper shell 29B and is configured to be in contact with the inner diameter of the upper shell 29B. In addition, the lower surface of the elastic body Ds is configured to be flush with the cylindrical bottom of the upper shell 29B. Therefore, when the lower shell 29A and the upper shell 29B sandwich the transport sheet P to form the chamber 29, the elastic body Ds abuts against the transport sheet P. Specifically, the elastic body Ds abuts against the transport sheet P on the side opposite to the side holding the adhesive tape DT (the upper surface side in the figure). By arranging the elastic body Ds in contact with the inner diameter of the lower shell 29A, the elastic body Ds is not caught when the cavity 29 is formed, thereby preventing the airtightness of the cavity 29 from being reduced by the elastic body Ds. Examples of the material constituting the elastic body Ds include rubber, elastic material, or gel-like polymer material.

藉由腔室29具備彈性體Ds,在步驟S4使黏著膠帶DT變形成凸狀時,能夠使黏著膠帶DT的彎曲率更加均一。此處,針對具備彈性體Ds的構成的效果進行說明。就一例而言,當黏著膠帶DT以比較硬的材料構成時,如圖32(b)所示,黏著膠帶DT的彎曲率容易變得不均一。By providing the elastic body Ds in the chamber 29, when the adhesive tape DT is deformed into a convex shape in step S4, the curvature of the adhesive tape DT can be made more uniform. Here, the effect of the structure having the elastic body Ds is described. For example, when the adhesive tape DT is made of a relatively hard material, as shown in FIG. 32(b), the curvature of the adhesive tape DT tends to become non-uniform.

亦即,在搬送用片P當中有黏著膠帶DT保持在搬送用片P的區域P1,因存在黏著膠帶DT,藉由推壓力V1造成的搬送用片P的彎曲率小。另一方面,在搬送用片P當中沒有黏著膠帶DT保持在搬送用片P的區域P2,藉由推壓力V1造成的搬送用片P的彎曲率比較大。亦即,區域P2比較容易因推壓力V1而變形,藉此,使區域P1的搬送用片P的彎曲率更進一步下降。That is, in the area P1 of the conveying sheet P where the adhesive tape DT is held, the curvature of the conveying sheet P caused by the pressing force V1 is small due to the presence of the adhesive tape DT. On the other hand, in the area P2 of the conveying sheet P where the adhesive tape DT is not held, the curvature of the conveying sheet P caused by the pressing force V1 is relatively large. That is, the area P2 is more easily deformed by the pressing force V1, thereby further reducing the curvature of the conveying sheet P in the area P1.

此外,在黏著膠帶DT當中的靠近區域P2之側(周緣部),黏著膠帶DT的彎曲率變大,在黏著膠帶DT的中央部,黏著膠帶DT的彎曲率變小。如上述,在黏著膠帶DT及搬送用片P各者,藉由推壓力V1造成的彎曲率變得不均一。結果,對於貼附到晶圓W的黏著膠帶DT,黏著膠帶DT與晶圓W的密接性降低。In addition, the curvature of the adhesive tape DT becomes larger on the side (periphery) near the area P2 in the adhesive tape DT, and becomes smaller in the center of the adhesive tape DT. As described above, the curvature of the adhesive tape DT and the transport sheet P caused by the push force V1 becomes non-uniform. As a result, the adhesive tape DT attached to the wafer W has a reduced adhesion to the wafer W.

另一方面,當具備彈性體Ds時,如圖32(c)所示,藉由推壓力V1使彈性體Ds全體均一地呈凸狀變形。因此,搬送用片P在區域P1的彎曲率提升,與在區域P2的彎曲率之差變小,因此,搬送用片P及黏著膠帶DT的彎曲率係整體上變得均一。亦即,黏著膠帶DT係變得容易相應於晶圓W的環狀凸部形成面的形狀而變形,因此,能夠更進一步提升黏著膠帶DT與晶圓W的密接性。On the other hand, when the elastic body Ds is provided, as shown in FIG32(c), the entire elastic body Ds is uniformly deformed into a convex shape by the pushing force V1. Therefore, the curvature of the conveying sheet P in the region P1 is improved, and the difference between the curvature and the curvature in the region P2 is reduced, so that the curvature of the conveying sheet P and the adhesive tape DT becomes uniform as a whole. That is, the adhesive tape DT becomes easy to deform in accordance with the shape of the annular convex portion forming surface of the wafer W, so that the adhesion between the adhesive tape DT and the wafer W can be further improved.

(10)在各實施例,亦可復具備對黏著膠帶DT進行加溫的構成。就對黏著膠帶DT進行加溫的構成的一例而言,片貼附機構81係如圖33(a)所示,在上殼體29B的內部具有加溫機構120。加溫機構120係具備缸體121及加溫構件123。缸體121係連結至加溫構件123的上部,藉由缸體121的動作,加溫構件123係能夠在腔室29的內部升降。另外,加溫構件123係只要能夠對黏著膠帶DT進行加溫,則亦可不是能夠升降移動的構成。(10) In each embodiment, a structure for heating the adhesive tape DT may be further provided. As an example of a structure for heating the adhesive tape DT, the sheet attaching mechanism 81 is as shown in FIG. 33(a), and has a heating mechanism 120 inside the upper shell 29B. The heating mechanism 120 has a cylinder 121 and a heating member 123. The cylinder 121 is connected to the upper part of the heating member 123, and the heating member 123 can be raised and lowered inside the chamber 29 by the movement of the cylinder 121. In addition, the heating member 123 does not need to be a structure that can be raised and lowered as long as it can heat the adhesive tape DT.

在加溫構件123的內部係埋設有對黏著膠帶DT進行加溫的加熱器(heater)125。藉由加熱器125進行的加溫的溫度係以成為使黏著膠帶DT變得柔軟的溫度的方式進行調整。就該加溫的溫度的一例而言,可舉出50℃至70℃左右。加溫構件123的底面的形狀係可相應於晶圓W的形狀而變更。就一例而言,加溫構件123係整體形成為圓柱狀。A heater 125 for heating the adhesive tape DT is buried inside the heating member 123. The heating temperature by the heater 125 is adjusted so as to make the adhesive tape DT soft. An example of the heating temperature is about 50°C to 70°C. The shape of the bottom surface of the heating member 123 can be changed according to the shape of the wafer W. For example, the heating member 123 is formed in a cylindrical shape as a whole.

另外,較佳為在開始進行步驟S5前預先使用加溫機構120使上空間H2加溫。亦即,控制部33係令加熱器125作動以使加溫裝置123加溫至預定的溫度。藉由加溫裝置123進行加溫,使上空間H2藉導熱效果加溫,進而加溫黏著膠帶DT。In addition, it is preferred to use the heating mechanism 120 to heat the upper space H2 before starting step S5. That is, the control unit 33 operates the heater 125 to heat the heating device 123 to a predetermined temperature. The heating device 123 heats the upper space H2 by heat conduction, thereby heating the adhesive tape DT.

黏著膠帶DT係藉由加溫而變得柔軟,因此,藉由推壓力V1產生的黏著膠帶DT的變形性提升。亦即,在以黏著膠帶DT覆蓋晶圓W時,能夠更進一步提升黏著膠帶DT對晶圓W的跟隨性。另外,亦可如圖33(b)所示,以接近或抵接黏著膠帶DT的方式令加溫構件123下降,以加溫構件123直接加溫黏著膠帶DT。The adhesive tape DT becomes soft by heating, so the deformability of the adhesive tape DT generated by the pushing force V1 is improved. That is, when the adhesive tape DT covers the wafer W, the followability of the adhesive tape DT to the wafer W can be further improved. In addition, as shown in FIG. 33( b ), the heating member 123 can be lowered in a manner close to or abutting the adhesive tape DT, so that the heating member 123 directly heats the adhesive tape DT.

(11)在實施例,加溫機構120乃係配設在腔室29的上空間H2之側且對上空間H2進行加溫的構成,但並不限於此。亦即,加溫機構120係亦可為對下空間H1進行加溫的構成。就一例而言,可舉出將加熱器125配設在保持台9的內部,藉由加熱器125對下空間H1進行加溫而加溫黏著膠帶DT的構成。此外,加溫機構120係亦可為對上空間H2及下空間H1雙方進行加溫的構成。(11) In the embodiment, the heating mechanism 120 is disposed on the side of the upper space H2 of the chamber 29 and is configured to heat the upper space H2, but the present invention is not limited thereto. That is, the heating mechanism 120 may also be configured to heat the lower space H1. For example, a heater 125 may be disposed inside the holding table 9, and the heater 125 may heat the lower space H1 to heat the adhesive tape DT. In addition, the heating mechanism 120 may also be configured to heat both the upper space H2 and the lower space H1.

(12)在各實施例,係以在黏著片貼附裝置1中進行步驟S3的第1貼附過程來製作片複合體M的構成為例子進行了說明,但並不限於片複合體M係在黏著片貼附裝置1在內部製作的構成。亦即,亦可為下述構成:預先將在黏著膠帶DT附著晶圓W而構成的片複合體M製作好,使用黏著片貼附裝置1對該片複合體M施加比大氣壓高的壓力,藉此,將黏著膠帶DT貼附於晶圓W。(12) In each embodiment, the sheet composite M is produced by performing the first attaching process of step S3 in the adhesive sheet attaching device 1 as an example for explanation, but the present invention is not limited to a structure in which the sheet composite M is produced inside the adhesive sheet attaching device 1. That is, the following structure may be used: the sheet composite M formed by attaching the wafer W to the adhesive tape DT is produced in advance, and the adhesive tape DT is attached to the wafer W by applying a pressure higher than the atmospheric pressure to the sheet composite M using the adhesive sheet attaching device 1.

1:黏著片貼附裝置 3:晶圓搬送機構 5:容器 6:框架回收部 7:對準機 8:升降台 9:保持台 12:框架供給部 13:貼附單元 16:晶圓搬送裝置 17:框架搬送裝置 23:保持臂 27:吸附板 28:吸附墊 32:加壓裝置 33:控制部 38:框架保持部 71:片供給部 72:分離膜回收部 73:片貼附部 74:片回收部 81:片貼附機構 82:片切斷機構 85:貼附輥 86:夾送輥 95:切刀 f:環形框架 DT:黏著膠帶 P:搬送用片 M:片複合體 MF:安裝框架 Ta:基材 Tb:黏著材 Pa:基材 Pb:黏著材 1: Adhesive sheet attaching device 3: Wafer transfer mechanism 5: Container 6: Frame recovery unit 7: Alignment machine 8: Lifting platform 9: Holding platform 12: Frame supply unit 13: Attachment unit 16: Wafer transfer device 17: Frame transfer device 23: Holding arm 27: Adsorption plate 28: Adsorption pad 32: Pressurization device 33: Control unit 38: Frame holding unit 71: Sheet supply unit 72: Separation film recovery unit 73: Sheet attaching unit 74: Sheet recovery unit 81: Sheet attaching mechanism 82: Sheet cutting mechanism 85: Attachment roller 86: Clamping roller 95: Cutter f: Ring frame DT: Adhesive tape P: Transport sheet M: Sheet composite MF: Mounting frame Ta: Base material Tb: Adhesive material Pa: Base material Pb: Adhesive material

圖1係顯示實施例1的半導體晶圓的構成之圖;(a)係半導體晶圓的局部剖切立體圖,(b)係半導體晶圓的背面側的立體圖,(c)係半導體晶圓的局部縱剖面圖。 圖2係顯示實施例1的黏著片的構成之縱剖面圖。 圖3係實施例1的黏著片貼附裝置的俯視圖。 圖4係實施例1的黏著片貼附裝置的前視圖。 圖5係實施例1的貼附單元的前視圖。 圖6係實施例1的腔室的縱剖面圖。 圖7係顯示實施例1的黏著片貼附裝置的動作之流程圖。 圖8係實施例1的安裝框架的立體圖。 圖9係說明實施例1的步驟S2之圖。 圖10係說明實施例1的步驟S3之圖。 圖11係說明實施例1的步驟S3之圖。 圖12係說明實施例1的步驟S4之圖。 圖13係說明實施例1的步驟S4之圖。 圖14係說明實施例1的步驟S5之圖。 圖15係說明實施例1的步驟S6之圖。 圖16係說明實施例1的步驟S6之圖。 圖17係說明實施例1的步驟S7之圖。 圖18係顯示實施例2的黏著片及搬送用片的構成之圖;(a)係黏著片及搬送用片的背面側的立體圖,(b)係黏著片及搬送用片的縱剖面圖。 圖19係顯示實施例2的黏著片貼附裝置的動作之流程圖。 圖20係說明實施例2的步驟S1之圖。 圖21係說明實施例2的步驟S2之圖。 圖22係說明實施例2的步驟S3之圖。 圖23係說明實施例2的步驟S3之圖。 圖24係說明實施例2的步驟S4之圖。 圖25係說明實施例2的步驟S4之圖。 圖26係說明實施例2的步驟S5之圖。 圖27係說明實施例2的步驟S6之圖。 圖28係說明實施例2的步驟S6之圖。 圖29係說明實施例2的步驟S7之圖。 圖30係說明變形例的構成之圖。 圖31係說明變形例的構成之圖;(a)係顯示變形例的黏著膠帶及搬送用片的構成之縱剖面圖,(b)係說明變形例的片切斷裝置的構成之縱剖面圖。 圖32係說明變形例的構成之圖;(a)係顯示具備變形例的彈性體的構成之縱剖面圖,(b)係說明在不具有彈性體的構成中可能會發生的問題點之圖,(c)係說明具有彈性體的構成的優點之圖。 圖33係說明變形例的構成之圖;(a)係顯示具備變形例的加溫機構的構成之縱剖面圖,(b)係說明藉由加溫機構對黏著膠帶進行加溫的製程的一例之縱剖面圖。 FIG. 1 is a diagram showing the structure of a semiconductor wafer of Example 1; (a) is a partially cutaway perspective view of a semiconductor wafer, (b) is a perspective view of the back side of a semiconductor wafer, and (c) is a partial longitudinal section view of a semiconductor wafer. FIG. 2 is a longitudinal section view showing the structure of an adhesive sheet of Example 1. FIG. 3 is a top view of an adhesive sheet attaching device of Example 1. FIG. 4 is a front view of an adhesive sheet attaching device of Example 1. FIG. 5 is a front view of an attaching unit of Example 1. FIG. 6 is a longitudinal section view of a chamber of Example 1. FIG. 7 is a flow chart showing the operation of the adhesive sheet attaching device of Example 1. FIG. 8 is a perspective view of a mounting frame of Example 1. FIG. 9 is a diagram for explaining step S2 of Example 1. FIG. 10 is a diagram for explaining step S3 of Example 1. FIG. 11 is a diagram for explaining step S3 of Example 1. FIG. 12 is a diagram for explaining step S4 of Example 1. FIG. 13 is a diagram for explaining step S4 of Example 1. FIG. 14 is a diagram for explaining step S5 of Example 1. FIG. 15 is a diagram for explaining step S6 of Example 1. FIG. 16 is a diagram for explaining step S6 of Example 1. FIG. 17 is a diagram for explaining step S7 of Example 1. FIG. 18 is a diagram showing the structure of the adhesive sheet and the conveying sheet of Example 2; (a) is a three-dimensional diagram of the back side of the adhesive sheet and the conveying sheet, and (b) is a longitudinal cross-sectional diagram of the adhesive sheet and the conveying sheet. FIG. 19 is a flow chart showing the operation of the adhesive sheet attaching device of Example 2. FIG. 20 is a diagram illustrating step S1 of Example 2. FIG. 21 is a diagram illustrating step S2 of Example 2. FIG. 22 is a diagram illustrating step S3 of Example 2. FIG. 23 is a diagram illustrating step S3 of Example 2. FIG. 24 is a diagram illustrating step S4 of Example 2. FIG. 25 is a diagram illustrating step S4 of Example 2. FIG. 26 is a diagram illustrating step S5 of Example 2. FIG. 27 is a diagram illustrating step S6 of Example 2. FIG. 28 is a diagram illustrating step S6 of Example 2. FIG. 29 is a diagram illustrating step S7 of Example 2. FIG. 30 is a diagram illustrating the structure of a variant. FIG. 31 is a diagram illustrating the structure of a variant; (a) is a longitudinal sectional view showing the structure of the adhesive tape and the conveying sheet of the variant, and (b) is a longitudinal sectional view illustrating the structure of the sheet cutting device of the variant. FIG. 32 is a diagram illustrating a configuration of a modified example; (a) is a longitudinal cross-sectional view showing a configuration of an elastic body having a modified example, (b) is a diagram illustrating a problem that may occur in a configuration without an elastic body, and (c) is a diagram illustrating an advantage of a configuration having an elastic body. FIG. 33 is a diagram illustrating a configuration of a modified example; (a) is a longitudinal cross-sectional view showing a configuration of a heating mechanism having a modified example, and (b) is a longitudinal cross-sectional view illustrating an example of a process of heating an adhesive tape by a heating mechanism.

9:保持台 9: Holding table

29:腔室 29: Chamber

29A:下殼體 29A: Lower housing

35:桿 35: Rod

37:致動器 37: Actuator

DT:黏著膠帶 DT: Adhesive tape

f:環形框架 f: Ring frame

H1:下空間 H1: Lower space

H2:上空間 H2: Upper space

He:扁平凹部 He: flat concave part

Ka:環狀凸部 Ka: annular convex part

Kf:內側角落部 Kf: Inner corner

V1:推壓力 V1: Pushing force

V2:推壓力 V2: Pushing force

W:晶圓 W: Wafer

Claims (8)

一種黏著片貼附方法,其特徵為具備:貼附過程,係對在一面的外周具有環狀凸部的工件的環狀凸部形成面附著黏著片而構成的片複合體,在從前述黏著片朝向前述工件的方向施加比大氣壓高的壓力,藉此將前述黏著片貼附於前述環狀凸部形成面。 A method for attaching an adhesive sheet is characterized by comprising: an attaching process, wherein an adhesive sheet is attached to a sheet composite body formed by attaching an annular protrusion forming surface of a workpiece having an annular protrusion on the outer periphery of one side, and a pressure higher than atmospheric pressure is applied in a direction from the adhesive sheet toward the workpiece, thereby attaching the adhesive sheet to the annular protrusion forming surface. 如請求項1之黏著片貼附方法,其中具備將前述片複合體收容於腔室的收容過程;前述貼附過程係在前述收容過程後,藉由提高前述腔室的內部空間的壓力,而將前述黏著片貼附於前述環狀凸部形成面。 The adhesive sheet attaching method of claim 1 includes a receiving process of the sheet composite being received in a chamber; the attaching process is to attach the adhesive sheet to the annular convex portion forming surface by increasing the pressure of the internal space of the chamber after the receiving process. 如請求項2之黏著片貼附方法,其中前述腔室係具備上殼體及下殼體;前述貼附過程係具備:上下空間形成過程,係利用前述上殼體與前述下殼體將前述黏著片夾住,藉此將前述腔室的內部空間區隔成供配置前述的環狀凸部形成面朝上之狀態的前述工件之下空間、及隔著前述黏著片而與前述下空間相對向之上空間;及空間加壓過程,係對前述上空間與前述下空間之中的至少前述上空間進行加壓,藉此將前述黏著片貼附於前述環狀凸部形成面。 As in claim 2, the adhesive sheet attaching method, wherein the chamber has an upper shell and a lower shell; the attaching process includes: an upper and lower space forming process, in which the upper shell and the lower shell are used to clamp the adhesive sheet, thereby dividing the internal space of the chamber into a lower space for arranging the workpiece with the annular protrusion forming surface facing upward, and an upper space opposite to the lower space through the adhesive sheet; and a space pressurizing process, in which at least the upper space of the upper space and the lower space is pressurized, thereby attaching the adhesive sheet to the annular protrusion forming surface. 如請求項2之黏著片貼附方法,其中前述黏著片係具有與前述工件的環狀凸部形成面相應的預定形狀,保持在長形的搬送用片; 前述腔室係具備上殼體及下殼體;前述貼附過程係具有:上下空間形成過程,係利用前述上殼體與前述下殼體將前述搬送用片夾住,藉此將前述腔室的內部空間區隔成供配置前述的環狀凸部形成面朝上之狀態的前述工件之下空間、及隔著保持在前述搬送用片的前述黏著片而與前述下空間相對向之上空間;及空間加壓過程,係對前述上空間與前述下空間之中的至少前述上空間進行加壓,藉此將前述黏著片貼附於前述環狀凸部形成面。 As in claim 2, the adhesive sheet attaching method, wherein the adhesive sheet has a predetermined shape corresponding to the annular convex portion forming surface of the workpiece, and is held on a long conveying sheet; the chamber has an upper shell and a lower shell; the attaching process comprises: an upper and lower space forming process, in which the upper shell and the lower shell are used to clamp the conveying sheet, thereby dividing the internal space of the chamber into a lower space for arranging the workpiece with the annular convex portion forming surface facing upward, and an upper space opposite to the lower space via the adhesive sheet held on the conveying sheet; and a space pressurizing process, in which at least the upper space of the upper space and the lower space is pressurized, thereby attaching the adhesive sheet to the annular convex portion forming surface. 如請求項3之黏著片貼附方法,其中具備配置在前述上殼體內部的片狀彈性體;前述片狀彈性體係以在前述上下空間形成過程中利用前述上殼體與前述下殼體將前述黏著片夾住,藉此使前述片狀彈性體抵接於前述黏著片的方式配設。 As in claim 3, the adhesive sheet attaching method comprises a sheet-like elastic body disposed inside the upper shell; the sheet-like elastic body is disposed in such a manner that the upper shell and the lower shell clamp the adhesive sheet during the formation of the upper and lower spaces, thereby making the sheet-like elastic body abut against the adhesive sheet. 如請求項3至5中任一項之黏著片貼附方法,其中具備藉由對前述下空間及前述上空間中的至少一者進行加溫而加溫前述黏著片的加溫過程;前述貼附過程係對藉由前述加溫過程而經加溫之狀態的前述黏著片施加比大氣壓高的壓力,藉此將前述黏著片貼附於前述環狀凸部形成面。 The adhesive sheet attaching method of any one of claims 3 to 5 includes a heating process for heating the adhesive sheet by heating at least one of the lower space and the upper space; the attaching process is to apply a pressure higher than atmospheric pressure to the adhesive sheet heated by the heating process, thereby attaching the adhesive sheet to the annular convex portion forming surface. 一種黏著片貼附裝置,其特徵為具備:貼附機構,係對在一面的外周具有環狀凸部的工件的環狀凸部形成面附著黏著片而構成的片複合體,在從前述黏著片朝向前述工件的方向施加比大氣壓高的壓 力,藉此將前述黏著片貼附於前述環狀凸部形成面。 An adhesive sheet attaching device is characterized by having: an attaching mechanism, a sheet composite body formed by attaching an adhesive sheet to the annular convex portion forming surface of a workpiece having an annular convex portion on the outer periphery of one side, and applying a pressure higher than atmospheric pressure in the direction from the adhesive sheet toward the workpiece, thereby attaching the adhesive sheet to the annular convex portion forming surface. 一種半導體製品的製造方法,係製造形成為在一面的外周具有環狀凸部的工件的環狀凸部形成面貼附有黏著片之狀態的半導體製品,前述半導體製品的製造方法的特徵為具備:貼附過程,係對在前述工件的環狀凸部形成面附著前述黏著片而構成的片複合體,在從前述黏著片朝向前述工件的方向施加比大氣壓高的壓力,藉此將前述黏著片貼附於前述環狀凸部形成面。 A method for manufacturing a semiconductor product is to manufacture a semiconductor product in which an adhesive sheet is attached to the annular convex portion forming surface of a workpiece having an annular convex portion on the periphery of one side. The method for manufacturing the semiconductor product is characterized by comprising: a bonding process, in which a pressure higher than atmospheric pressure is applied from the adhesive sheet toward the workpiece to a sheet composite body formed by attaching the adhesive sheet to the annular convex portion forming surface of the workpiece, thereby attaching the adhesive sheet to the annular convex portion forming surface.
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Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20080023134A1 (en) * 2006-07-31 2008-01-31 Nitto Denko Corporation Method for joining adhesive tape to semiconductor wafer, method for separating protective tape from semiconductor wafer, and apparatuses using the methods
US20100000654A1 (en) * 2008-07-03 2010-01-07 Disco Corporation Adhesive tape attaching method
JP2017050388A (en) * 2015-09-01 2017-03-09 日東電工株式会社 Protective tape sticking method and protective tape sticking device

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4841355B2 (en) * 2006-08-08 2011-12-21 日東電工株式会社 Method for holding semiconductor wafer
JP4917526B2 (en) * 2007-12-21 2012-04-18 リンテック株式会社 Sheet pasting device
JP5117934B2 (en) * 2008-06-06 2013-01-16 リンテック株式会社 MOUNTING DEVICE AND MOUNTING METHOD
JP5317267B2 (en) * 2008-11-14 2013-10-16 株式会社タカトリ Wafer mounting device
JP5542582B2 (en) * 2010-08-26 2014-07-09 リンテック株式会社 Sheet sticking device and sticking method
JP5895676B2 (en) * 2012-04-09 2016-03-30 三菱電機株式会社 Manufacturing method of semiconductor device
JP2013232582A (en) 2012-05-01 2013-11-14 Nitto Denko Corp Method of applying adhesive tape and adhesive tape applying apparatus
JP5992803B2 (en) * 2012-11-07 2016-09-14 リンテック株式会社 Sheet sticking device and sticking method
JP6204765B2 (en) * 2013-09-06 2017-09-27 リンテック株式会社 Sheet sticking device and sticking method
JP6636696B2 (en) * 2014-12-25 2020-01-29 日東電工株式会社 Semiconductor wafer mounting method and semiconductor wafer mounting apparatus

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20080023134A1 (en) * 2006-07-31 2008-01-31 Nitto Denko Corporation Method for joining adhesive tape to semiconductor wafer, method for separating protective tape from semiconductor wafer, and apparatuses using the methods
US20100000654A1 (en) * 2008-07-03 2010-01-07 Disco Corporation Adhesive tape attaching method
JP2017050388A (en) * 2015-09-01 2017-03-09 日東電工株式会社 Protective tape sticking method and protective tape sticking device

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