TWI875362B - Pressing mechanism, testing device, and processing machine - Google Patents
Pressing mechanism, testing device, and processing machine Download PDFInfo
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本發明提供一種利於空間配置及便利修護更換第二作業器,並提高感溫準確性之接合機構。The present invention provides a joining mechanism which is advantageous for space configuration, convenient for repairing and replacing a second operating device, and improves temperature sensing accuracy.
在現今,請參閱圖1,測試裝置10於機台設有複數個電性連接之電路板11及測試座12,以供測試電子元件13;測試座12之上方配置接合機構,接合機構於下壓臂14裝配複數排浮動器15,每一排設有複數個浮動器15,每一個浮動器15之底部裝配下壓治具16,以供壓接電子元件13;由於電子元件13於測試過程中會產生高溫,為了知悉電子元件13是否於預設測試溫度執行測試作業,業者遂於下壓治具16裝配一感溫件17,以感測電子元件13之溫度。At present, please refer to Figure 1. The
然,測試不同尺寸之電子元件13,必需搭配不同尺寸之下壓治具16,因此,複數排之每一個下壓治具16內的感溫件17以線路連接一插座18,利用插座18可插拔於電控裝置(圖未示出)之插頭19,以供更換下壓治具16;於浮動器15組裝下壓治具16後,再將感溫件17之插座18插置電性連接電控裝置之插頭19,使感溫件17感測之溫度訊號傳輸至電控裝置,以供分析判斷電子元件13之溫度是否超出預設測試溫度。However, to test
惟,複數排下壓治具16之插座18的體積大,且需預留工作人員之手部在複數排下壓治具16間的操作空間,導致相鄰之二浮動器15必需具有較大之間距而相當浪費空間,以致下壓臂14無法配置更多數量之浮動器15及下壓治具16,進而無法提高生產效能。However, the
反之,若縮減複數排之相鄰二浮動器15的間距,卻會使工作人員之操作空間受限,尤其對於中間排之複數個下壓治具16,更加不易修護換裝下壓治具16及插拔該插座18,造成使用不便之問題。On the contrary, if the distance between two
再者,若將感溫件17裝配於浮動器15,雖可避免於下壓治具16配置插座18,卻增加感溫件17之感測距離,以致降低感測溫度之準確性,進而無法有效確保電子元件13之測試品質。Furthermore, if the
本發明之目的一,提供一種接合機構,包含架置具、第一作業器 、第二作業器及溫度感測單元,第一作業器裝配於架置具,第二作業器可裝拆於第一作業器,並設有接合面以供接合電子元件,溫度感測單元包含第一電控件、感溫件、第一導接件及第二導接件,第一電控件能夠電性連接電控裝置,感溫件裝配於第二作業器之接合面,以供感測電子元件之溫度,第一導接件裝配於第一作業器,並電性連接第一電控件,第二導接件裝配於第二作業器,並電性連接感溫件,第二導接件能夠對接或分離第一導接件;藉以第二作業器裝配第一作業器時,利用第一導接件與第二導接件之相互對接,而使感溫件迅速電性連接且傳輸感測之溫度訊號至第一電控件,第一電控件將溫度訊號傳輸至電控裝置,達到提高使用便利性之實用效益。 The first object of the present invention is to provide a bonding mechanism, comprising a mounting device, a first operating device, a second operating device and a temperature sensing unit, wherein the first operating device is mounted on the mounting device, the second operating device can be mounted on the first operating device, and is provided with a bonding surface for bonding electronic components, the temperature sensing unit comprises a first electrical component, a temperature sensing component, a first conductive component and a second conductive component, the first electrical component can be electrically connected to the electronic control device, the temperature sensing component is mounted on the bonding surface of the second operating device to sense the temperature of the electronic component, the first conductive component is mounted on the first operating device, and is electrically The first electrical component is electrically connected to the second conductive part, and the second conductive part is assembled on the second operator and electrically connected to the temperature sensing part. The second conductive part can be connected to or separated from the first conductive part. When the second operator is assembled to the first operator, the first conductive part and the second conductive part are connected to each other, so that the temperature sensing part is quickly electrically connected and transmits the sensed temperature signal to the first electrical component. The first electrical component transmits the temperature signal to the electronic control device, thereby achieving the practical benefit of improving the convenience of use.
本發明之目的二,提供一種接合機構,其溫度感測單元以第一作業器之第一導接件與第二作業器之第二導接件的相互對接,而可將感溫件之溫度訊號傳輸至第一電控件,毋需於第一作業器及第二作業器之周側預留較大之操作空間及插座容置空間等,進而有效縮減間距,以利空間配置及增設第一、二作業器,達到提高生產效能之實用效益。The second object of the present invention is to provide a joint mechanism, wherein the temperature sensing unit can transmit the temperature signal of the temperature sensing component to the first electronic component by connecting the first conductive component of the first operator and the second conductive component of the second operator. It is not necessary to reserve a larger operating space and socket accommodation space around the first operator and the second operator, thereby effectively shortening the distance to facilitate space configuration and the addition of the first and second operators, thereby achieving the practical benefit of improving production efficiency.
本發明之目的三,提供一種接合機構,其溫度感測單元以第一作業器之第一導接件與第二作業器之第二導接件的相互對接,即可將感溫件之溫度訊號傳輸至第一電控件,毋需於第二作業器配置插座等元件,使第一電控件可於第一作業器之外部插拔於電控裝置,進而提高工作人員修護之操作便利性。The third object of the present invention is to provide a joint mechanism, wherein the temperature sensing unit can transmit the temperature signal of the temperature sensing component to the first electronic component by connecting the first conductive component of the first operator with the second conductive component of the second operator. There is no need to configure a socket or other components on the second operator, so that the first electronic component can be plugged in and out of the electronic control device outside the first operator, thereby improving the convenience of maintenance operations for workers.
本發明之目的四,提供一種接合機構,其溫度感測單元以第一作業器之第一導接件與第二作業器之第二導接件的相互對接,毋需於第二作業器配置插座等元件,而可使感溫件配置於第二作業器,以有效縮短感測距離,進而提高感溫電子元件之準確性,達到確保電子元件測試品質之實用效益。The fourth object of the present invention is to provide a joint mechanism, wherein the temperature sensing unit is connected to the first conductive member of the first operator and the second conductive member of the second operator. There is no need to configure a socket or other components on the second operator, and the temperature sensing component can be configured on the second operator to effectively shorten the sensing distance, thereby improving the accuracy of the temperature-sensitive electronic component and achieving the practical benefit of ensuring the quality of electronic component testing.
本發明之目的五,提供一種測試裝置,包含測試機構及本發明接合機構,測試機構設有至少一測試器,以供測試電子元件;本發明接合機構包含架置具、至少一第一作業器、至少一第二作業器及至少一溫度感測單元,以供壓接及感溫該測試器之電子元件。The fifth object of the present invention is to provide a testing device, including a testing mechanism and the bonding mechanism of the present invention, wherein the testing mechanism is provided with at least one tester for testing electronic components; the bonding mechanism of the present invention includes a mounting device, at least one first operator, at least one second operator and at least one temperature sensing unit for crimping and sensing the temperature of the electronic components of the tester.
本發明之目的六,提供一種作業機,包含機台、供料裝置、收料裝置、本發明測試裝置、輸送裝置及中央控制裝置,供料裝置配置於機台,並設有至少一供料器,以供容置至少一待測電子元件;收料裝置配置於機台,並設有至少一收料器,以供容置至少一已測電子元件;本發明測試裝置配置於機台,並設有測試機構及接合機構,以供測試及感溫電子元件;輸送裝置配置於機台,並設有至少一輸送器,以供輸送電子元件;中央控制裝置以供控制及整合各裝置作動而執行自動化作業。The sixth object of the present invention is to provide an operating machine, comprising a machine, a feeding device, a receiving device, a testing device of the present invention, a conveying device and a central control device, wherein the feeding device is arranged on the machine and is provided with at least one feeder for accommodating at least one electronic component to be tested; the receiving device is arranged on the machine and is provided with at least one receiver for accommodating at least one electronic component that has been tested; the testing device of the present invention is arranged on the machine and is provided with a testing mechanism and a bonding mechanism for testing and temperature sensing electronic components; the conveying device is arranged on the machine and is provided with at least one conveyor for conveying electronic components; the central control device is used to control and integrate the actions of each device to perform automated operations.
為使 貴審查委員對本發明作更進一步之瞭解,茲舉一較佳實施例並配合圖式,詳述如後:In order to enable you to have a further understanding of the present invention, a preferred embodiment is given below with accompanying drawings:
請參閱圖2、3,本發明接合機構包含架置具21、至少一第一作業器、至少一第二作業器及至少一溫度感測單元。Please refer to FIGS. 2 and 3 , the bonding mechanism of the present invention includes a
依作業需求,接合機構更包含架置驅動器(圖未示出),架置驅動器以供驅動該架置具21作至少一方向位移。According to the operation requirements, the joint mechanism further includes a mounting driver (not shown), and the mounting driver is used to drive the
架置具21為固定式配置或可移動式配置;例如架置具21為固定式之機架,以供測試器(圖未示出)朝向架置具21作相對位移;例如架置具21由架置驅動器(圖未示出)驅動作至少一方向位移,使架置具21朝向測試器作相對位移。更進一步,架置驅動器為壓缸、線性馬達或包含馬達及至少一傳動組
,傳動組為皮帶輪組或螺桿螺座組等。於本實施例,架置具21為可移動之移載臂,接合機構設置一架置驅動器(圖未示出),以驅動該架置具21作Y-Z方向位移。
The
至少一第一作業器裝配於架置具21。更進一步,第一作業器可直接裝配於架置具21,或者裝配於至少一連接板,連接板裝配於架置具21,使第一作業器間接裝配於架置具21。依作業需求,第一作業器可包含浮動具或/及溫控具。於本實施例,架置具21之底面設置連接板22,連接板22之底面裝配至少一第一作業器,至少一第一作業器包含複數排第一作業器,每一排設有複數個第一作業器,第一作業器包含浮動具23及溫控具,浮動具23可供電子元件浮動位移,並於底面界定第一貼面231,溫控具為加熱件、致冷晶片或具流體之座體,以供溫控電子元件,於本實施例,溫控具為加熱件24,並裝配於浮動具23之內部。At least one first operating device is mounted on the
至少一第二作業器可裝拆於第一作業器,以供接合電子元件。依作業需求,第二作業器以供壓接電子元件,或者移載及壓接電子元件。複數個第一作業器裝配複數個第二作業器。於本實施例,至少一第二作業器包含複數個第二作業器,各第二作業器為下壓治具25,下壓治具25可以至少一結合件(圖未示出)而組裝或拆卸於浮動具23;更進一步,結合件可為栓具、扣具或磁性件等;下壓治具25之頂面界定為第二貼面251,且相對於浮動具23之第一貼面231
,下壓治具25之底面界定為接合面252,以供壓接電子元件(圖未示出)。另於下壓治具25之接合面252設有至少一抽吸部253,以供取放電子元件。
At least one second operator can be mounted and disassembled on the first operator for joining electronic components. According to the operation requirements, the second operator is used for pressing electronic components, or transferring and pressing electronic components. A plurality of first operators are assembled with a plurality of second operators. In this embodiment, at least one second operator includes a plurality of second operators, each of which is a
至少一溫度感測單元包含第一電控件261、感溫件262、第一導接件263及第二導接件264;第一電控件261以供傳輸溫度訊號;感溫件262裝配於第二作業器,以供感測電子元件之溫度;第一導接件263裝配於第一作業器,並電性連接第一電控件261;第二導接件264裝配於第二作業器,並相對於第一導接件263,且電性連接感溫件262,第二導接件264能夠對接或分離第一導接件263。At least one temperature sensing unit includes a first
依作業需求,至少一溫度感測單元包含複數個溫度感測單元,複數個溫度感測單元配置於複數個第一作業器及複數個第二作業器間,複數個溫度感測單元之複數個第一導接件263的複數個第一線路265能夠電性連接至少一第一電控件261。According to the operation requirements, at least one temperature sensing unit includes a plurality of temperature sensing units, and the plurality of temperature sensing units are arranged between a plurality of first operating devices and a plurality of second operating devices. The plurality of
承上述,溫度感測單元之第一電控件261可為插頭、插座或金手指等,以供傳輸溫度訊號至電控裝置(圖未示出),第一電控件261可插入或拔離電控裝置(圖未示出)之第二電控件31,以供連通或切斷傳輸溫度訊號至電控裝置。感溫件262裝配於下壓治具25之內部,並以一端之感測部朝向接合面252,以供感測電子元件之溫度。As mentioned above, the first
依作業需求,第一導接件263或/及第二導接件264能夠沿組裝方向作伸縮位移;更進一步,第一導接件263或/及第二導接件264裝設有彈性件。According to the operation requirements, the first
依作業需求,第一導接件263或/及第二導接件264能夠為固定件。According to the operation requirements, the first
依作業需求,第一導接件263或第二導接件264可為導接針或導接墊。According to the operation requirements, the first
於本實施例,第一導接件263為導接針,且裝配於浮動具23之容置孔232,其一端連接有彈性件267,而可於容置孔232內且沿組裝方向作伸縮位移,使另一端凸伸或內縮於第一貼面231,又第一導接件263之一端以第一線路265電性連接第一電控件261,以供傳輸溫度訊號;承上述,複數個第一導接件263之複數個第一線路265電性連接於一第一電控件261,第一電控件261可插入或拔離電控裝置(圖未示出)之第二電控件31,以供連通或切斷傳輸溫度訊號至電控裝置。第二導接件264為導接墊,並固設於下壓治具25之第二貼面251,第二導接件264之一面相對於第一導接件263,另一面以第二線路266電性連接感溫件262,以供傳輸溫度訊號。In this embodiment, the first
請參閱圖4,下壓治具25以第二貼面251貼合浮動具23之第一貼面231,複數個為栓具之結合件(圖未示出)將下壓治具25鎖固組裝於浮動具23之底部,以供下壓治具25之接合面252壓接電子元件,並以抽吸部253取放移載電子元件。由於溫度感測單元之第一導接件263配置有彈性件267,於下壓治具25之第二導接件264對接且頂壓浮動具23之第一導接件263時,第一導接件263壓縮彈性件267,且於容置孔232內沿組裝方向向上位移;在第一導接件263電性連接第二導接件264的狀態下,可供感溫件262感測之溫度訊號經由第二線路266傳輸至第二導接件264,第二導接件264將溫度訊號經第一導接件263及第一線路265而傳輸至第一電控件261,當第一電控件261插置電性連接電控裝置(圖未示出)之第二電控件31時,可將溫度訊號傳輸至電控裝置以供分析判斷。Please refer to Figure 4. The
因此,在下壓治具25未配置有線路及插座的要件下,二相鄰之浮動具23及下壓治具25的周側毋需預留較大之操作空間及插座容置空間等,而可有效縮減間距,以利空間配置及增設浮動具23、加熱件24及下壓治具25,進而提高生產效能。Therefore, under the condition that the
承上述,溫度感測單元可將感溫件262配置於下壓治具25,以有效縮短感測距離,進而提高感溫電子元件之準確性及確保電子元件測試品質。Based on the above, the temperature sensing unit can configure the
又,由於浮動器23毋需經常更換不同尺寸,而固設於連接板22,可將連接複數個第一線路265之一第一電控件261配置於接合機構之外部,以利工作人員修護。Furthermore, since the
請參閱圖4、5,本發明測試裝置20包含測試機構及本發明接合機構,測試機構設置至少一測試器,以供測試電子元件;於本實施例,測試器設置電性連接之電路板271及測試座272,測試座272具有複數支探針,以供測試電子元件。本發明接合機構配置於測試機構之上方,包含架置具21、至少一第一作業器、至少一第二作業器及至少一溫度感測單元,以供壓接及感溫測試器之電子元件。於本實施例,接合機構之下壓治具25的接合面252接觸電子元件,並以抽吸部253拾取電子元件,架置驅動器(圖未示出)驅動該架置具21、連接板22
、浮動具23、下壓治具25及電子元件等同步作Y-Z方向位移,將電子元件置入壓接於測試座272而執行測試作業;於測試同時,接合機構以溫度感測單元之感溫件262感測電子元件之溫度,並以第二線路266經第二導接件264、第一導接件263及第一線路265將溫度訊號傳輸至第一電控件261,第一電控件261再將溫度訊號經由第二電控件31傳輸至電控裝置(圖未示出),以供判別電子元件是否於預設測試溫度執行測試作業。
Please refer to Figures 4 and 5. The
請參閱圖6,於更換不同尺寸之下壓治具25A時,在下壓治具25A未配置有線路及插座的要件下,僅需將舊的下壓治具與浮動具23拆卸分離,即可使舊的下壓治具之第二導接件與浮動具23之第一導接件263迅速分離,浮動具23上之第一線路265及第一電控件261仍保持電性連接第二電控件31,進而可迅速且便利地更換不同尺寸之下壓治具25A。Please refer to Figure 6. When replacing the
請參閱圖2~5、7,本發明測試裝置20應用於電子元件作業機,作業機包含機台40、供料裝置50、收料裝置60、測試裝置20、輸送裝置70及中央控制裝置(圖未示出)。供料裝置50裝配於機台40,並設有至少一供料器,以容納至少一待測之電子元件;收料裝置60裝配於機台40,並設有至少一收料器
,以容納至少一已測之電子元件;本發明測試裝置20配置於機台40,包含測試機構及接合機構,測試機構設置至少一測試器,以供測試電子元件;於本實施例,測試器設有電性連接之電路板271及測試座272,測試座272以供承置及測試電子元件;本發明接合機構配置於測試機構之上方,包含架置具21、至少一第一作業器、至少一第二作業器及至少一溫度感測單元,以供壓接及感溫測試器之電子元件;輸送裝置70裝配於機台40,並設有至少一輸送器,以供輸送電子元件,於本實施例,輸送裝置70以第一輸送器71於供料裝置50之供料器取出待測之電子元件,並將待測電子元件移載第二輸送器72,第二輸送器72將待測之電子元件載送至測試裝置20之側方;測試裝置20之接合機構以架置具21帶動該浮動具23、下壓治具25及溫度感測單元等作Y-Z方向位移至第二輸送器72之上方,令下壓治具25於第二輸送器72取出待測電子元件,並移載至測試座272執行測試作業,以及將已測電子元件移載至輸送裝置70之第三輸送器73,第三輸送器73載出已測之電子元件,以供第四輸送器74取出已測之電子元件,並依據測試結果,將已測之電子元件輸送至收料裝置60之收料器處而分類收置;中央控制裝置(圖未示出)用以控制及整合各裝置作動,以執行自動化作業,達到提升作業效能之實用效益。
Please refer to Figures 2 to 5 and 7. The
[習知]
10:測試裝置
11:電路板
12:測試座
13:電子元件
14:下壓臂
15:浮動器
16:下壓治具
17:感溫件
18:插座
19:插頭
[本發明]
20:測試裝置
21:架置具
22:連接板
23:浮動具
231:第一貼面
232:容置孔
24:加熱件
25、25A:下壓治具
251:第二貼面
252:接合面
253:抽吸部
261:第一電控件
262:感溫件
263:第一導接件
264:第二導接件
265:第一線路
266:第二線路
267:彈性件
271:電路板
272:測試座
31:第二電控件
40:機台
50:供料裝置
60:收料裝置
70:輸送裝置
71:第一輸送器
72:第二輸送器
73:第三輸送器
74:第四輸送器
[Knowledge]
10: Test device
11: Circuit board
12: Test seat
13: Electronic component
14: Pressing arm
15: Floater
16: Pressing fixture
17: Temperature sensor
18: Socket
19: Plug
[Invention]
20: Test device
21: Mounting device
22: Connecting plate
23: Floater
231: First surface
232: Accommodation hole
24:
圖1:習知測試裝置之示意圖。 圖2:本發明接合機構之示意圖。 圖3:接合機構之局部示意圖。 圖4:本發明接合機構之組裝示意圖。 圖5:本發明接合機構應用於測試裝置之使用示意圖。 圖6:本發明接合機構更換下壓治具之使用示意圖。 圖7:本發明測試裝置應用於作業機之示意圖。 Figure 1: Schematic diagram of a known test device. Figure 2: Schematic diagram of the joint mechanism of the present invention. Figure 3: Schematic diagram of a part of the joint mechanism. Figure 4: Schematic diagram of the assembly of the joint mechanism of the present invention. Figure 5: Schematic diagram of the use of the joint mechanism of the present invention applied to the test device. Figure 6: Schematic diagram of the use of the joint mechanism of the present invention to replace the pressing fixture. Figure 7: Schematic diagram of the test device of the present invention applied to the operating machine.
21:架置具 21: Mounting device
22:連接板 22: Connecting plate
23:浮動具 23: Floating device
231:第一貼面 231: First veneer
232:容置孔 232: Accommodation hole
24:加熱件 24: Heating element
25:下壓治具 25: Pressing fixture
251:第二貼面 251: Second veneer
252:接合面 252: Joint surface
253:抽吸部 253: Suction unit
261:第一電控件 261: First electronic control unit
262:感溫件 262: Temperature sensing device
263:第一導接件 263: First contact piece
264:第二導接件 264: Second conductive part
265:第一線路 265: First Line
266:第二線路 266: Second Line
267:彈性件 267: Elastic parts
31:第二電控件 31: Second electronic control unit
Claims (10)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW112147394A TWI875362B (en) | 2023-12-06 | 2023-12-06 | Pressing mechanism, testing device, and processing machine |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW112147394A TWI875362B (en) | 2023-12-06 | 2023-12-06 | Pressing mechanism, testing device, and processing machine |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TWI875362B true TWI875362B (en) | 2025-03-01 |
| TW202524096A TW202524096A (en) | 2025-06-16 |
Family
ID=95830394
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW112147394A TWI875362B (en) | 2023-12-06 | 2023-12-06 | Pressing mechanism, testing device, and processing machine |
Country Status (1)
| Country | Link |
|---|---|
| TW (1) | TWI875362B (en) |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20020075024A1 (en) * | 1999-03-26 | 2002-06-20 | John A. Fredeman | Actively controlled heat sink for convective burn-in oven |
| TW201423899A (en) * | 2012-12-14 | 2014-06-16 | Hon Tech Inc | Electric component pressing mechanism and testing facility applying the same |
| TW201632902A (en) * | 2015-02-27 | 2016-09-16 | Seiko Epson Corp | Electronic component conveyance device and electronic component inspection device |
| TWI561836B (en) * | 2016-06-24 | 2016-12-11 | ||
| US20230375615A1 (en) * | 2022-05-17 | 2023-11-23 | Chroma Ate Inc. | Aging test system and aging test method for thermal interface material and electronic device testing apparatus having the system |
-
2023
- 2023-12-06 TW TW112147394A patent/TWI875362B/en active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20020075024A1 (en) * | 1999-03-26 | 2002-06-20 | John A. Fredeman | Actively controlled heat sink for convective burn-in oven |
| TW201423899A (en) * | 2012-12-14 | 2014-06-16 | Hon Tech Inc | Electric component pressing mechanism and testing facility applying the same |
| TW201632902A (en) * | 2015-02-27 | 2016-09-16 | Seiko Epson Corp | Electronic component conveyance device and electronic component inspection device |
| TWI561836B (en) * | 2016-06-24 | 2016-12-11 | ||
| US20230375615A1 (en) * | 2022-05-17 | 2023-11-23 | Chroma Ate Inc. | Aging test system and aging test method for thermal interface material and electronic device testing apparatus having the system |
Also Published As
| Publication number | Publication date |
|---|---|
| TW202524096A (en) | 2025-06-16 |
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