TWI870004B - Improving the non-contact light probe for measuring back-drilled hole profile depth - Google Patents
Improving the non-contact light probe for measuring back-drilled hole profile depth Download PDFInfo
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Abstract
一種提升量測背鑽孔輪廓深度之非接觸光探針,其包含:一固定裝置,其裝設至少一板體,該板體的下方設有一反射治具,該板體上包括有至少一第一鑽孔,該固定裝置連接有一第一移動模組;至少一光探針本體,其係設於該固定裝置上方;以及一電腦,其係與該光探針本體及該第一移動模組電性連接,該電腦啟動該光探針本體發射一小於該第一鑽孔的半徑的光束,該光束照射該板體,同時該電腦控制該第一動力源帶動該固定裝置移動,使該第一鑽孔通過該光探針本體下方,該第一鑽孔受該光束連續照射,該電腦記錄該光束進入至離開該第一鑽孔及該反射治具的複數第一反射點,並依據各該第一反射點生成一第一鑽孔深度平面圖。A non-contact optical probe for measuring the depth of a back-drilled hole profile comprises: a fixing device, which is equipped with at least one plate, a reflection fixture is provided below the plate, the plate includes at least one first drill hole, the fixing device is connected to a first moving module; at least one optical probe body is provided above the fixing device; and a computer is electrically connected to the optical probe body and the first moving module, the computer starts the The optical probe body emits a light beam smaller than the radius of the first drill hole, and the light beam irradiates the plate. At the same time, the computer controls the first power source to drive the fixing device to move, so that the first drill hole passes under the optical probe body. The first drill hole is continuously irradiated by the light beam. The computer records the light beam entering and leaving the first drill hole and the plurality of first reflection points of the reflection fixture, and generates a first drill hole depth plane map according to each first reflection point.
Description
本發明係有關於一種電路板背鑽孔檢測裝置,尤指一種非接觸式且能夠量測PCB板的厚度、鑽孔深度及偏心度的提升量測背鑽孔輪廓深度之非接觸光探針。The present invention relates to a circuit board back drilling hole detection device, in particular to a non-contact optical probe capable of measuring the thickness, drilling depth and eccentricity of a PCB board and measuring the contour depth of a back drilling hole.
現有的電路板的製造方法在進行背鑽孔作業時,其是以電路板的表面銅面為基準來統一下鑽設定的深度值,其並沒有考量到電路板與電路板之間的板厚差異或板厚均勻性不佳對背鑽孔深度的加工精度帶來的影響。因此,當電路板與電路板之間的板厚差異較大或板厚均勻性不佳時,背鑽孔深度的加工精度會隨著背鑽孔的深度越深,其誤差範圍就會越大,同時也可能會產生偏心及傾斜狀況。The existing manufacturing method of circuit boards uses the copper surface of the circuit board as a reference to unify the depth of the drill when performing back drilling operations. It does not take into account the impact of the thickness difference between circuit boards or the poor thickness uniformity on the processing accuracy of the back drilling depth. Therefore, when the thickness difference between circuit boards is large or the thickness uniformity is poor, the processing accuracy of the back drilling depth will increase with the depth of the back drilling hole, and eccentricity and tilt may also occur.
習用的背鑽孔檢測方式係以破壞式檢測方式,以隨機抽驗方式對電路板切片破壞再觀察各個背鑽孔是否符合需求,但破壞性檢驗除了費時且只能由特定角度觀測為習用檢測方式的最大缺點,因此仍有改善之必要。The conventional back-drilling inspection method is a destructive inspection method, which randomly samples the circuit board and then inspects whether each back-drilled hole meets the requirements. However, the destructive inspection is time-consuming and can only be observed from a specific angle, which is the biggest disadvantage of the conventional inspection method. Therefore, there is still a need for improvement.
有鑑於此,本發明人乃累積多年相關領域的研究以及實務經驗,利用本發明改善上述習知技術的缺失。In view of this, the inventor has accumulated many years of research and practical experience in related fields and uses the present invention to improve the deficiencies of the above-mentioned prior art.
本發明的主要目的,在於提供一種提升量測背鑽孔輪廓深度之非接觸光探針,其包括:一固定裝置,其係連接有一第一移動模組,該第一移動模組包括有一第一動力源,該固定裝置設有一反射治具,該反射治具的頂面提供裝設至少一板體,該板體上包括有至少一第一鑽孔;至少一光探針本體,其係設於該固定裝置上方;以及一電腦,其係與該光探針本體及該第一移動模組電性連接,該電腦包括有一輸出單元,以該電腦啟動該光探針本體發射一光束,該光束的直徑小於該第一鑽孔的半徑,該光束照射該板體,同時該電腦控制該第一動力源帶動該固定裝置移動,使該第一鑽孔通過該光探針本體下方,該第一鑽孔受該光束連續照射,該電腦記錄該光束進入至離開該第一鑽孔及該反射治具的複數第一反射點,並依據各該第一反射點生成一第一鑽孔深度平面圖,並由該輸出單元輸出該第一鑽孔深度平面圖。The main purpose of the present invention is to provide a non-contact optical probe for measuring the profile depth of a back drill hole, which comprises: a fixing device connected to a first moving module, the first moving module comprising a first power source, the fixing device is provided with a reflection fixture, the top surface of the reflection fixture is provided with at least one plate body, the plate body comprising at least one first drill hole; at least one optical probe body, which is arranged above the fixing device; and a computer, which is electrically connected to the optical probe body and the first moving module, the computer comprising an input The output unit is used to activate the optical probe body with the computer to emit a light beam, the diameter of the light beam is smaller than the radius of the first drill hole, and the light beam irradiates the plate body. At the same time, the computer controls the first power source to drive the fixing device to move, so that the first drill hole passes under the optical probe body. The first drill hole is continuously irradiated by the light beam. The computer records the light beam entering, leaving, and plural first reflection points of the first drill hole and the reflection fixture, and generates a first drill hole depth plane map according to each of the first reflection points, and the output unit outputs the first drill hole depth plane map.
其中該板體更具有至少一第二鑽孔,該第二鑽孔與該第一鑽孔之間具有一預定距離,當該第一鑽孔通過該光探針本體下方後,該電腦控制該第一動力源帶動該固定裝置移動,使該第二鑽孔通過該光探針本體下方,該第二鑽孔受該光束連續照射,該電腦記錄由該光束進入至離開該第二鑽孔及該反射治具的複數第二反射點,並依據各該第二反射點生成一第二鑽孔深度平面圖,並由該輸出單元輸出該第二鑽孔深度平面圖。The plate body further has at least one second drill hole, and there is a predetermined distance between the second drill hole and the first drill hole. When the first drill hole passes under the optical probe body, the computer controls the first power source to drive the fixing device to move, so that the second drill hole passes under the optical probe body. The second drill hole is continuously irradiated by the light beam. The computer records a plurality of second reflection points from the light beam entering to leaving the second drill hole and the reflection fixture, and generates a second drill hole depth plane map according to each second reflection point, and the output unit outputs the second drill hole depth plane map.
其中該板體包括有至少一第一貫孔及至少一第二貫孔,該第一鑽孔及該第二鑽孔係分別鑽設於該第一貫孔及該第二貫孔,使該第一鑽孔及該第二鑽孔分別與該第一貫孔及該第二貫孔重合,且該第一鑽孔與該第二鑽孔的直徑分別大於該第一貫孔與該第二貫孔;由該第一鑽孔深度平面圖及該第二鑽孔深度平面圖檢驗該板體的厚度、該第一鑽孔及該第二鑽孔的深度、該第一鑽孔與該第一貫孔的偏心度及該第二鑽孔與該第二貫孔的偏心度;該偏心度係為該第一貫孔的圓心與該第一鑽孔的圓心之間的距離,及該第二貫孔的圓心與該第二鑽孔的圓心之間的距離。The plate body includes at least one first through hole and at least one second through hole, the first drilled hole and the second drilled hole are respectively drilled in the first through hole and the second through hole, so that the first drilled hole and the second drilled hole overlap with the first through hole and the second through hole respectively, and the diameters of the first drilled hole and the second drilled hole are respectively larger than the first through hole and the second through hole; the depth of the first drilled hole is equal to the depth of the second through hole. The thickness of the plate, the depth of the first drill hole and the second drill hole, the eccentricity between the first drill hole and the first through hole, and the eccentricity between the second drill hole and the second through hole are checked by the plan view and the second drill hole depth plan view; the eccentricity is the distance between the center of the first through hole and the center of the first drill hole, and the distance between the center of the second through hole and the center of the second drill hole.
其中各該第一反射點及各該第二反射點係為該光束照射該板體表面、該第一鑽孔內部及該第二鑽孔內部受阻並反射該光束回到該光探針本體的位置,該電腦記錄及運算各該第一反射點的位置與距離及各該第二反射點的位置與距離,並分別將各該第一反射點及各該第二反射點互相連接而形成該第一鑽孔深度平面圖及各該第二鑽孔深度平面圖。The first reflection points and the second reflection points are the positions where the light beam irradiates the surface of the plate, is blocked inside the first drill hole and the second drill hole, and reflects the light beam back to the optical probe body. The computer records and calculates the position and distance of the first reflection points and the position and distance of the second reflection points, and connects the first reflection points and the second reflection points to form the first drill hole depth plane diagram and the second drill hole depth plane diagram.
其中該電腦更包括有一輸入單元,由該輸入單元輸入該第一鑽孔及該第二鑽孔的座標及該第一移動模組的移動路線。The computer further includes an input unit, and the coordinates of the first drilling hole and the second drilling hole and the moving route of the first moving module are input by the input unit.
其中該座標為該第一鑽孔的圓心及該第二鑽孔的圓心,該第一移動模組移動該板體時,該移動路線為該第一鑽孔及該第二鑽孔的直徑,以令該第一鑽孔及該第二鑽孔通過該光探針本體下方。The coordinates are the center of the first drill hole and the center of the second drill hole. When the first moving module moves the plate, the moving route is the diameter of the first drill hole and the second drill hole, so that the first drill hole and the second drill hole pass under the optical probe body.
一種提升量測背鑽孔輪廓深度之非接觸光探針,其包含:一固定裝置,其頂面提供裝設至少一板體,該板體下方設有一反射治具,該板體上包括有至少一第一鑽孔;至少一光探針本體,其係可拆式設於一第二移動模組,該第二移動模組包括有一第二動力源,該第二移動模組位於該固定裝置上方;以及一電腦,其係與該光探針本體及該第一移動模組電性連接,該電腦包括有一輸出單元,以該電腦啟動該光探針本體發射一光束,該光束的直徑小於該第一鑽孔的半徑,該光束照射該板體同時該電腦控制該第二動力源帶動該光探針本體移動,使該光探針本體通過該第一鑽孔上方,該第一鑽孔受該光束連續照射,該電腦記錄該光束進入至離開該第一鑽孔及該反射治具的複數第一反射點,並依據各該第一反射點生成一第一鑽孔深度平面圖,並由該輸出單元輸出該第一鑽孔深度平面圖。A non-contact optical probe for measuring the depth of a back-drilled hole profile comprises: a fixing device, the top surface of which is provided with at least one plate, a reflection fixture is provided below the plate, and the plate includes at least one first drill hole; at least one optical probe body, which is detachably arranged on a second moving module, the second moving module includes a second power source, and the second moving module is located above the fixing device; and a computer, which is electrically connected to the optical probe body and the first moving module, and the computer includes an output unit, with the The computer activates the optical probe body to emit a light beam, the diameter of which is smaller than the radius of the first drill hole. The light beam irradiates the plate body, and the computer controls the second power source to drive the optical probe body to move, so that the optical probe body passes over the first drill hole. The first drill hole is continuously irradiated by the light beam. The computer records the light beam entering, leaving, and plural first reflection points of the first drill hole and the reflection fixture, and generates a first drill hole depth plane map according to each of the first reflection points, and the output unit outputs the first drill hole depth plane map.
其中該板體更具有至少一第二鑽孔,該第二鑽孔與該第一鑽孔之間具有一預定距離,當該光探針本體通過該第一鑽孔上方後,該電腦控制該第二動力源帶動該光探針本體移動,使該光探針本體通過該第二鑽孔上方,該第二鑽孔受該光束連續照射,該電腦記錄該光束進入至離開該第二鑽孔及該反射治具的複數第二反射點,並依據各該第二反射點生成一第二鑽孔深度平面圖,並由該輸出單元輸出該第二鑽孔深度平面圖。The plate body further has at least one second drill hole, and there is a predetermined distance between the second drill hole and the first drill hole. When the optical probe body passes over the first drill hole, the computer controls the second power source to drive the optical probe body to move, so that the optical probe body passes over the second drill hole. The second drill hole is continuously irradiated by the light beam. The computer records the light beam entering, leaving, and plural second reflection points of the second drill hole and the reflection fixture, and generates a second drill hole depth plane map according to each second reflection point, and the output unit outputs the second drill hole depth plane map.
其中該板體包括有至少一第一貫孔及至少一第二貫孔,該第一鑽孔及該第二鑽孔係分別鑽設於該第一貫孔及該第二貫孔,使該第一鑽孔及該第二鑽孔分別與該第一貫孔及該第二貫孔重合,且該第一鑽孔與該第二鑽孔的直徑分別大於該第一貫孔與該第二貫孔;由該第一鑽孔深度平面圖及該第二鑽孔深度平面圖檢驗該板體的厚度、該第一鑽孔及該第二鑽孔的深度、該第一鑽孔與該第一貫孔的偏心度及該第二鑽孔與該第二貫孔的偏心度;該偏心度係為該第一貫孔的圓心與該第一鑽孔的圓心之間的距離,及該第二貫孔的圓心與該第二鑽孔的圓心之間的距離。The plate body includes at least one first through hole and at least one second through hole, the first drilled hole and the second drilled hole are respectively drilled in the first through hole and the second through hole, so that the first drilled hole and the second drilled hole overlap with the first through hole and the second through hole respectively, and the diameters of the first drilled hole and the second drilled hole are respectively larger than the first through hole and the second through hole; the depth of the first drilled hole is equal to the depth of the second through hole. The thickness of the plate, the depth of the first drill hole and the second drill hole, the eccentricity between the first drill hole and the first through hole, and the eccentricity between the second drill hole and the second through hole are checked by the plan view and the second drill hole depth plan view; the eccentricity is the distance between the center of the first through hole and the center of the first drill hole, and the distance between the center of the second through hole and the center of the second drill hole.
其中各該第一反射點及各該第二反射點係為該光束照射該板體表面、該第一鑽孔內部及該第二鑽孔內部受阻並反射該光束回到該光探針本體的位置,該電腦記錄及運算各該第一反射點的位置與距離及各該第二反射點的位置與距離,並分別將各該第一反射點及各該第二反射點互相連接而形成該第一鑽孔深度平面圖及各該第二鑽孔深度平面圖。The first reflection points and the second reflection points are the positions where the light beam irradiates the surface of the plate, is blocked inside the first drill hole and the second drill hole, and reflects the light beam back to the optical probe body. The computer records and calculates the position and distance of the first reflection points and the position and distance of the second reflection points, and connects the first reflection points and the second reflection points to form the first drill hole depth plane diagram and the second drill hole depth plane diagram.
其中該電腦更包括有一輸入單元,由該輸入單元輸入該第一鑽孔及該第二鑽孔的座標及該第二移動模組的移動路線。The computer further includes an input unit, and the coordinates of the first drilling hole and the second drilling hole and the moving route of the second moving module are input by the input unit.
其中該座標為該第一鑽孔的圓心及該第二鑽孔的圓心,該第二移動模組移動該光探針本體時,該移動路線為該第一鑽孔及該第二鑽孔的直徑,以令該光探針本體通過該第一鑽孔及該第二鑽孔上方。The coordinates are the center of the first drill hole and the center of the second drill hole. When the second moving module moves the optical probe body, the moving route is the diameter of the first drill hole and the second drill hole, so that the optical probe body passes over the first drill hole and the second drill hole.
為便於說明本發明之內容及所能達成之功效,請參照第一圖至第三圖,為本發明提升量測背鑽孔輪廓深度之非接觸光探針的第一實施例,包含:To facilitate the description of the content and the effects that can be achieved by the present invention, please refer to the first to third figures, which are the first embodiment of the present invention for improving the non-contact light probe for measuring the profile depth of the back drill hole, including:
一固定裝置10,其係連接有一第一移動模組11,該第一移動模組包括有一第一動力源12,該固定裝置10設有一反射治具101,該反射治具101的頂面提供裝設夾持至少一板體A,該板體A上包括有至少一第一鑽孔A1,其中該板體具有一預定厚度。A
至少一光探針本體20,其係設於該固定裝置10上方。At least one
請參照第一圖及第三圖,一電腦30,其係與該光探針本體20及該第一移動模組11的第一動力源12電性連接,該電腦30包括有一輸出單元31,該輸出單元31包括顯示器及列印機。Please refer to the first and third figures, a
請參照第四圖及第五圖,本發明的使用方式係以該電腦30啟動該光探針本體20發射一光束21,該光束21的直徑小於該第一鑽孔A1的半徑(但並不局限於此),該光束21照射該板體A,同時該電腦30控制該第一動力源12帶動該固定裝置10移動,使該第一鑽孔A1通過該光探針本體20下方,請參照第五圖至第七圖,該第一鑽孔A1受該光束21連續照射,該電腦30記錄該光束21進入至離開該第一鑽孔A1及該反射治具101的複數第一反射點211,並依據各該第一反射點211生成一第一鑽孔深度平面圖40,並由該輸出單元31輸出該第一鑽孔深度平面圖40。Referring to the fourth and fifth figures, the use of the present invention is to activate the
請參照第二圖及第八圖,該板體A更具有至少一第二鑽孔A2,該第二鑽孔A2與該第一鑽孔A1之間具有一預定距離,當該第一鑽孔A1通過該光探針本體20下方後,該電腦30控制該第一動力源12帶動該固定裝置10移動,使該第二鑽孔A2通過該光探針本體20下方,該第二鑽孔A2受該光束21連續照射,該電腦30記錄由該光束21進入至離開該第二鑽孔A2及該反射治具101的複數第二反射點212,並依據各該第二反射點212生成一第二鑽孔深度平面圖50,並由該輸出單元31輸出該第二鑽孔深度平面圖50。Please refer to the second and eighth figures, the plate A further has at least one second drill hole A2, and there is a predetermined distance between the second drill hole A2 and the first drill hole A1. When the first drill hole A1 passes under the
簡言之,本發明經過電腦30的設定能夠快速檢測複數鑽孔,且檢測完畢後,各該板體A仍為完整狀態,克服了習用技術需要以破壞式檢測的缺點。In short, the present invention can quickly detect multiple drill holes through the setting of the
請參照第二圖,詳細而言,請參照該板體A包括有至少一第一貫孔B1及至少一第二貫孔B2,該第一鑽孔A1及該第二鑽孔A2係分別鑽設於該第一貫孔B1及該第二貫孔B2,使該第一鑽孔A1及該第二鑽孔A2分別與該第一貫孔B1及該第二貫孔B2重合,且該第一鑽孔A1與該第二鑽孔A2的直徑分別大於該第一貫孔B1與該第二貫孔B2。Please refer to the second figure. For details, please refer to the plate body A including at least one first through hole B1 and at least one second through hole B2. The first drilled hole A1 and the second drilled hole A2 are drilled in the first through hole B1 and the second through hole B2, respectively, so that the first drilled hole A1 and the second drilled hole A2 overlap with the first through hole B1 and the second through hole B2, respectively, and the diameters of the first drilled hole A1 and the second drilled hole A2 are respectively larger than the first through hole B1 and the second through hole B2.
請參照第五圖至第八圖,各該第一反射點211及各該第二反射點212係為該光束照射該板體A表面、該第一鑽孔A1內部及該第二鑽孔A2內部受阻並反射該光束回到該光探針本體20的位置,該電腦30記錄及運算各該第一反射點211的位置與距離及各該第二反射點212的位置與距離,並分別將各該第一反射點211及各該第二反射點212互相連接而形成該第一鑽孔深度平面圖40及各該第二鑽孔深度平面圖50。Please refer to Figures 5 to 8. Each of the
請參照第七圖及第八圖,由該第一鑽孔深度平面圖40及該第二鑽孔深度平面圖50 檢驗該板體A的厚度、該第一鑽孔A1及該第二鑽孔A2的深度、該第一鑽孔A1與該第一貫孔B1的偏心度及該第二鑽孔A2與該第二貫孔B2的偏心度,該偏心度係為該第一貫孔B1的圓心與該第一鑽孔A1的圓心之間的距離,及該第二貫孔B2的圓心與該第二鑽孔A2的圓心之間的距離。Please refer to Figures 7 and 8. The thickness of the plate A, the depth of the first drill hole A1 and the second drill hole A2, the eccentricity between the first drill hole A1 and the first through hole B1, and the eccentricity between the second drill hole A2 and the second through hole B2 are inspected by the first drill hole
偏心度產生的原因為鑽孔時鑽針未與貫孔的圓心對應,或是鑽孔時鑽針產生偏擺等狀況,在實務中由於偏心度肉眼幾乎無法辨識,因此本發明透過該第一鑽孔深度平面圖40及該第二鑽孔深度平面圖50即能輕易分析該第一鑽孔A1及該第二鑽孔A2。The cause of eccentricity is that the drill needle does not correspond to the center of the through hole during drilling, or the drill needle deviates during drilling. In practice, eccentricity is almost impossible to identify with the naked eye. Therefore, the present invention can easily analyze the first drill hole A1 and the second drill hole A2 through the first drill hole depth plane diagram 40 and the second drill hole depth plane diagram 50.
因此在本發明的第二圖及第九圖中,刻意將第二鑽孔A2與第二貫孔B2繪製成偏心形態,藉此表現出本發明能夠檢測偏心度的功能。Therefore, in the second and ninth figures of the present invention, the second drill hole A2 and the second through hole B2 are intentionally drawn into an eccentric shape, thereby demonstrating the function of the present invention to detect eccentricity.
請參照第十圖,由於板體A具有該預定厚度,若不使用該反射治具101,則該光束21無法偵測,導致該電腦30所輸出的第一鑽孔深度平面圖40及第二鑽孔深度平面圖50中無法完整呈現出該第一貫孔B1及該第二貫孔B2的圖形,因此有必要使用該反射治具101,藉此使反射該光束21。Please refer to Figure 10. Since the plate A has the predetermined thickness, if the
請參照第三圖及第十一圖,該電腦30更包括有一輸入單元32,由該輸入單元32輸入該第一鑽孔A1及該第二鑽孔A2的座標及該第一移動模組11的移動路線。Please refer to FIG. 3 and FIG. 11 , the
其中該座標為該第一鑽孔A1的圓心及該第二鑽孔A2的圓心,該第一移動模組11移動該板體A時,該移動路線為該第一鑽孔A1及該第二鑽孔A2的直徑,以令該第一鑽孔A1及該第二鑽孔A2通過該光探針本體20下方。The coordinates are the center of the first drill hole A1 and the center of the second drill hole A2. When the first moving
請參照第十二圖,為本發明的第二實施例,由於本實施例主要結構與前述實施例相同,故相同處不再贅述,合先敘明。Please refer to FIG. 12 , which is a second embodiment of the present invention. Since the main structure of this embodiment is the same as the above-mentioned embodiment, the same parts will not be described in detail and will be described first.
在本實施例中,光探針本體20可拆式設於一第二移動模組22,該第二移動模組22與該電腦30電性連接,並包括有一第二動力源221,該第二移動模組22位於該固定裝置10上方,因此當電腦30輸入該第一鑽孔A1及第二鑽孔A2的座標及移動路線後,係由第二動力源221帶動光探針本體20移動,而固定裝置10則固定不動,藉此也能夠使光束21通過該第一鑽孔A1及第二鑽孔A2,並由電腦30輸出該第一鑽孔深度平面圖40及各該第二鑽孔深度平面圖50。In the present embodiment, the
惟以上所述者,僅為本發明之較佳實施例,當不能用以限定本發明可實施之範圍,凡習於本業之人士所明顯可作的變化與修飾,皆應視為不悖離本發明之實質內容。However, the above is only a preferred embodiment of the present invention and should not be used to limit the scope of the present invention. Any changes and modifications that are obviously possible for people skilled in the art should be considered as not deviating from the essential content of the present invention.
10:固定裝置 101:反射治具 11:第一移動模組 12:第一動力源 20:光探針本體 21:光束 211:第一反射點 212:第二反射點 22:第二移動模組 221:第二動力源 30:電腦 31:輸出單元 32:輸入單元 40:第一鑽孔深度平面圖 50:第二鑽孔深度平面圖 A:板體 A1:第一鑽孔 A2:第二鑽孔 B1:第一貫孔 B2:第二貫孔 10: Fixing device 101: Reflection fixture 11: First moving module 12: First power source 20: Light probe body 21: Light beam 211: First reflection point 212: Second reflection point 22: Second moving module 221: Second power source 30: Computer 31: Output unit 32: Input unit 40: First drilling depth plan 50: Second drilling depth plan A: Plate A1: First drilling hole A2: Second drilling hole B1: First through hole B2: Second through hole
第一圖為本發明的結構示意圖。 第二圖為本發明的板體側視圖。 第三圖為本發明的電腦架構示意圖。 第四圖為本發明的使用狀態示意圖。 第五圖為延續第四圖的第一鑽孔受光束照射示意圖。 第六圖為本發明之電腦運算示意圖。 第七圖為本發明的第一鑽孔與第二鑽孔深度平面圖。 第八圖為延續第六圖之放大的第一鑽孔深度平面圖。 第九圖為延續第四圖的第二鑽孔受光束照射示意圖。 第十圖為本發明之未使用反射治具的第一鑽孔與第二鑽孔深度平面圖。 第十一圖為本發明之電腦設定移動路線示意圖。 第十二圖為本發明之另一實施例結構示意圖。 The first figure is a schematic diagram of the structure of the present invention. The second figure is a side view of the plate of the present invention. The third figure is a schematic diagram of the computer architecture of the present invention. The fourth figure is a schematic diagram of the use status of the present invention. The fifth figure is a schematic diagram of the first drill hole being irradiated by a light beam, which is a continuation of the fourth figure. The sixth figure is a schematic diagram of the computer operation of the present invention. The seventh figure is a depth plan view of the first drill hole and the second drill hole of the present invention. The eighth figure is an enlarged depth plan view of the first drill hole, which is a continuation of the sixth figure. The ninth figure is a schematic diagram of the second drill hole being irradiated by a light beam, which is a continuation of the fourth figure. The tenth figure is a depth plan view of the first drill hole and the second drill hole of the present invention without using a reflection fixture. The eleventh figure is a schematic diagram of the computer setting movement route of the present invention. The twelfth figure is a structural schematic diagram of another embodiment of the present invention.
無without
10:固定裝置 10:Fixed device
101:反射治具 101: Reflection fixture
21:光束 21: Beam
211:第一反射點 211: First reflection point
A:板體 A: Board
A1:第一鑽孔 A1: First drilling hole
B1:第一貫孔 B1: First through hole
Claims (6)
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| US5101442A (en) * | 1989-11-24 | 1992-03-31 | At&T Bell Laboratories | Three-dimensional imaging technique using sharp gradient of illumination |
| JP2005121508A (en) * | 2003-10-17 | 2005-05-12 | Hitachi Ltd | Bump shape measuring apparatus and method, and method for manufacturing multilayer printed circuit board |
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| TW202511699A (en) | 2025-03-16 |
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