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TWI862182B - An integrated circuit having fewer power pins - Google Patents

An integrated circuit having fewer power pins Download PDF

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Publication number
TWI862182B
TWI862182B TW112136068A TW112136068A TWI862182B TW I862182 B TWI862182 B TW I862182B TW 112136068 A TW112136068 A TW 112136068A TW 112136068 A TW112136068 A TW 112136068A TW I862182 B TWI862182 B TW I862182B
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Taiwan
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pads
small
connection area
conductive path
pad
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TW112136068A
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TW202514970A (en
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洪揚哲
徐國恩
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雅特力科技股份有限公司
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Abstract

Disclosed is an integrated circuit having fewer power pins, which comprises a package casing, a power pin terminal, a die, a conductive path and two or more first small bonding pads. The power pin terminal penetrates through the package casing, the die is disposed in the package casing, and the conductive path and the first small bonding pads are respectively disposed on the die. A connection area is configured between the conductive path and the die. The first small bonding pads are respectively disposed in the connection area and are adjacently connected. One of the first small bonding pads is connected to the conductive path, and one of the first small bonding pads is connected to the power pin terminal through a wire. In this way, the number of power pins can be reduced, so that the expandable functionality of the I/O pins in the integrated circuit can be increased.

Description

可減少電源腳位的積體電路Integrated circuits that reduce power pins

本發明涉及一種積體電路,尤指一種可減少電源腳位的積體電路。The present invention relates to an integrated circuit, and more particularly to an integrated circuit capable of reducing power pins.

現有技術中,已知的一積體電路(Integrated Circuit, IC)封裝方式,係由一封裝外殼、一晶粒及多個腳位端子所構成,該晶粒封裝在該封裝外殼內,該等腳位端子穿設在該封裝外殼上,該封裝外殼除了可避免濕氣滲透至該晶粒、以及減少外力衝擊對該晶粒的破壞之外,該等腳位端子包括多個電源腳位端子,外部電源電路可透過該等電源腳位端子及該積體電路提供該晶粒所需的電能。In the prior art, a known integrated circuit (IC) packaging method is composed of a packaging shell, a die and a plurality of pin terminals. The die is packaged in the packaging shell, and the pin terminals are penetrated on the packaging shell. In addition to preventing moisture from penetrating into the die and reducing damage to the die caused by external force impact, the packaging shell includes a plurality of power pin terminals. An external power circuit can provide the power required by the die through the power pin terminals and the integrated circuit.

然而,傳統積體電路的封裝外殼須設置有相當數量的電源腳位端子,方能提供該晶粒穩定的電能,這導致傳統積體電路中原用於進行資料輸入/輸出(Input/Output, I/O)的腳位的數量,被多數的電源腳位端子佔據。因此,如何解決上述現有技術的問題,確實是有需要提出較佳解決方案的必要性。However, the package shell of the traditional integrated circuit must be equipped with a considerable number of power pin terminals to provide the chip with stable power, which results in the number of pins originally used for data input/output (I/O) in the traditional integrated circuit being occupied by the majority of power pin terminals. Therefore, how to solve the above-mentioned problems of the prior art is indeed necessary to propose a better solution.

有鑑於上述現有技術的不足,本發明的主要目的在於提供一種可減少電源腳位的積體電路,其改良積體電路架構,解決現有技術中多數電源腳位端子佔據I/O腳位的問題。In view of the above-mentioned shortcomings of the prior art, the main purpose of the present invention is to provide an integrated circuit that can reduce power pins, which improves the integrated circuit architecture and solves the problem that most power pin terminals occupy I/O pins in the prior art.

為達成上述目的,本發明所採取的主要技術手段係令前述可減少電源腳位的積體電路包括一封裝外殼、一電源腳位端子、一晶粒、一導電路徑及二個以上的第一小型焊墊,該電源腳位端子設在該封裝外殼上,該晶粒設在該封裝外殼的內部,該導電路徑設在該晶粒上,並於該導電路徑與該晶粒的外緣之間具有一第一連接區,該等第一小型焊墊設置在該第一連接區並相鄰連接;其中,該等第一小型焊墊中任一個係與該導電路徑連接,且該等第一小型焊墊中任一個係透過一導線與該電源腳位端子連接。To achieve the above-mentioned purpose, the main technical means adopted by the present invention is to make the above-mentioned integrated circuit capable of reducing power pins include a packaging shell, a power pin terminal, a die, a conductive path and more than two first small solder pads, the power pin terminal is arranged on the packaging shell, the die is arranged inside the packaging shell, the conductive path is arranged on the die, and there is a first connection area between the conductive path and the outer edge of the die, and the first small solder pads are arranged in the first connection area and connected adjacently; wherein, any one of the first small solder pads is connected to the conductive path, and any one of the first small solder pads is connected to the power pin terminal through a wire.

本發明透過設置在該第一連接區的該等第一小型焊墊係相鄰連接並與該導電路徑連接,且該電源腳位端子透過該導線與該等第一小型焊墊中任一個連接,如此可減省電源腳位的設置數量,以使積體電路中I/O腳位的可擴充之功能性增加。The present invention arranges the first small solder pads in the first connection area adjacently and connected to the conductive path, and the power pin terminal is connected to any one of the first small solder pads through the wire, so that the number of power pins can be reduced, thereby increasing the expandable functionality of the I/O pins in the integrated circuit.

為達成上述目的,本發明所採取的另一主要技術手段係令前述可減少電源腳位的積體電路包括一封裝外殼、一電源腳位端子、一晶粒、一環形的導電路徑、二個以上的第一長型焊墊及一大型焊墊,該電源腳位端子設在該封裝外殼上,該晶粒設在該封裝外殼的內部,該導電路徑環設在該晶粒上,並於該導電路徑與該晶粒的外緣之間構成一第一連接區,以及由該導電路徑的內部構成一第二連接區,該等第一長型焊墊設置在該第一連接區的相對位置;其中,該等第一長型焊墊係與該導電路徑連接,且該等第一長型焊墊中任一個係透過一導線與該電源供應端子連接;該大型焊墊設在該第二連接區,該大型焊墊透過另二個以上導線與該等第一長型焊墊連接。To achieve the above-mentioned purpose, another main technical means adopted by the present invention is to make the above-mentioned integrated circuit capable of reducing power pins include a package shell, a power pin terminal, a die, a ring-shaped conductive path, two or more first elongated solder pads and a large solder pad, the power pin terminal is arranged on the package shell, the die is arranged inside the package shell, the conductive path is arranged on the die, and a conductive path is arranged between the conductive path and the outer edge of the die. A first connection area is formed between the conductive path and a second connection area is formed by the inside of the conductive path, and the first elongated pads are arranged at relative positions of the first connection area; wherein the first elongated pads are connected to the conductive path, and any one of the first elongated pads is connected to the power supply terminal through a wire; the large pad is arranged in the second connection area, and the large pad is connected to the first elongated pads through two or more wires.

本發明透過設置在該第一連接區的該等第一長型焊墊及設置在該第二連接區的該大型焊墊,且該電源腳位端子透過該導線與該等第一長型焊墊中任一個連接,如此可減省電源腳位的設置數量,以使積體電路中I/O腳位的可擴充之功能性增加。The present invention arranges the first elongated pads in the first connection area and the large pad in the second connection area, and the power pin terminal is connected to any one of the first elongated pads through the wire, so that the number of power pins can be reduced, thereby increasing the expandable functionality of the I/O pins in the integrated circuit.

關於本發明之第一實施例,提供一種可減少電源腳位的積體電路,請參閱圖1,其中包括一封裝外殼10,一電源腳位端子20、一晶粒30、一導電路徑40及二個以上的第一小型焊墊50,該電源腳位端子20可穿設在該封裝外殼10上,該晶粒30設置在該封裝外殼10的內部,該導電路徑40設置在該晶粒30上,並於該導電路徑40與該晶粒30的外緣之間具有一第一連接區A1,該等第一小型焊墊50係分別設置在該第一連接區A1,且該等第一小型焊墊50係位置相鄰並構成電連接;其中,該等第一小型焊墊50中任一個係與該導電路徑40電連接,且該等第一小型焊墊50中任一個係透過一導線W1與該電源腳位端子20電連接。The first embodiment of the present invention provides an integrated circuit capable of reducing power pins. Referring to FIG. 1 , the integrated circuit comprises a package shell 10, a power pin terminal 20, a die 30, a conductive path 40, and two or more first small solder pads 50. The power pin terminal 20 can be inserted into the package shell 10, the die 30 is disposed inside the package shell 10, the conductive path 40 is disposed on the die 30, and There is a first connection area A1 between the conductive path 40 and the outer edge of the die 30, and the first small solder pads 50 are respectively arranged in the first connection area A1, and the first small solder pads 50 are located adjacent to each other and form an electrical connection; wherein, any one of the first small solder pads 50 is electrically connected to the conductive path 40, and any one of the first small solder pads 50 is electrically connected to the power pin terminal 20 through a wire W1.

本發明藉由前述設置在該第一連接區A1的該等第一小型焊墊50係相鄰連接並與該導電路徑40連接,且該電源腳位端子20透過該導線W1與該等第一小型焊墊50中任一個連接,減省電源腳位的設置數量,使積體電路中I/O腳位的可擴充之功能性增加。The present invention reduces the number of power pins and increases the expandable functionality of I/O pins in the integrated circuit by connecting the first small solder pads 50 disposed in the first connection area A1 adjacent to each other and connected to the conductive path 40, and the power pin terminal 20 is connected to any one of the first small solder pads 50 through the wire W1.

在本實施例中,如圖1所示,其進一步於該導電路徑40與該晶粒30的外緣之間具有一第二連接區A2,該第二連接區A2與該第一連接區A1不重疊。該導電路徑40係呈環形設置在該晶粒30上,且該導電路徑40可為口字型,進一步的該第一連接區A1係由該導電路徑40的外側至該晶粒30的外緣所構成,且該第二連接區A2係可由呈環形的該導電路徑40的內部所構成。在本實施例中,該等第一小型焊墊50係透過一導電層60構成電連接,且該等第一小型焊墊50中任一個係透過另一導電層60與該導電路徑40電連接。另外,該導線W1的一端與該等第一小型焊墊50中任一個的表面焊接,該第一導線W1的另一端與該電源腳位端子20焊接,使該等第一小型焊墊50中任一個與該電源腳位端子20構成電連接。In this embodiment, as shown in FIG. 1 , there is further a second connection area A2 between the conductive path 40 and the outer edge of the die 30, and the second connection area A2 does not overlap with the first connection area A1. The conductive path 40 is disposed in a ring shape on the die 30, and the conductive path 40 can be in a square shape. Further, the first connection area A1 is formed from the outer side of the conductive path 40 to the outer edge of the die 30, and the second connection area A2 can be formed by the inner part of the conductive path 40 in a ring shape. In this embodiment, the first small pads 50 are electrically connected through a conductive layer 60, and any of the first small pads 50 is electrically connected to the conductive path 40 through another conductive layer 60. In addition, one end of the wire W1 is welded to the surface of any of the first small pads 50, and the other end of the first wire W1 is welded to the power pin terminal 20, so that any of the first small pads 50 is electrically connected to the power pin terminal 20.

請參閱圖2,在本實施例中,進一步包括二個以上的第二小型焊墊51,該等第二小型焊墊51係分別設置在該第一連接區A1或該第二連接區A2,且位置相鄰並構成電連接,該等第一小型焊墊50的位置係在該導電路徑40的一頂側,該等第二小型焊墊51的位置係在該導電路徑40的該頂側之一相鄰側;其中,該等第二小型焊墊51中任一個與該導電路徑40電連接,且該等第二小型焊墊51中任一個係透過另一導線W2與該等第一小型焊墊50中任一個電連接。Please refer to Figure 2. In this embodiment, more than two second small solder pads 51 are further included. The second small solder pads 51 are respectively arranged in the first connection area A1 or the second connection area A2, and are located adjacent to each other and form an electrical connection. The first small solder pads 50 are located on a top side of the conductive path 40, and the second small solder pads 51 are located on an adjacent side of the top side of the conductive path 40; wherein any one of the second small solder pads 51 is electrically connected to the conductive path 40, and any one of the second small solder pads 51 is electrically connected to any one of the first small solder pads 50 through another wire W2.

為提供其他應用方式,請參閱圖3,在本實施例中,進一步還包括二個以上的第三小型焊墊52及二個以上的第四小型焊墊53,該等第三小型焊墊52係分別設置在該第一連接區A1或該第二連接區A2,且該等第三小型焊墊52係位置相鄰並構成電連接;該等第四小型焊墊53係分別設置在該第一連接區A1或該第二連接區A2,且該等第四小型焊墊53係位置相鄰並構成電連接;該等第三小型焊墊52的位置係在該導電路徑40的該頂側之另一相鄰側,該等第四小型焊墊53的位置係與該等第一小型焊墊50的位置相對,在本實施例中,該等第四小型焊墊53的位置係在該導電路徑40的一底側,該底側與該頂側相對。To provide other application methods, please refer to FIG. 3. In this embodiment, more than two third small solder pads 52 and more than two fourth small solder pads 53 are further included. The third small solder pads 52 are respectively arranged in the first connection area A1 or the second connection area A2, and the third small solder pads 52 are located adjacent to each other and form an electrical connection. The fourth small solder pads 53 are respectively arranged in the first connection area A1 or the second connection area A2. The second connection area A2, and the fourth small solder pads 53 are located adjacent to each other and form an electrical connection; the third small solder pads 52 are located on another adjacent side of the top side of the conductive path 40, and the fourth small solder pads 53 are located opposite to the first small solder pads 50. In the present embodiment, the fourth small solder pads 53 are located on a bottom side of the conductive path 40, and the bottom side is opposite to the top side.

其中,該等第三小型焊墊52中任一個與該導電路徑40電連接,該等第四小型焊墊53中任一個與該導電路徑40電連接,該等第三小型焊墊52中任一個係透過另一導線W3與該等第一小型焊墊50中任一個電連接,該等第四小型焊墊53中任一個係透過另一導線W4與該等第二小型焊墊51中任一個電連接,該等第四小型焊墊53中任一個係透過另一導線W5與該等第三小型焊墊52中任一個電連接。必須特別說明的是,本發明中所有的小型焊墊50,51,52,53不僅可分別設置在該第一連接區A1,還可以是分別設置在第二連接區A2,而在本實施例中僅是舉例,並非對所有的小型焊墊50,51,52,53的空間配置方式加以限制。Among them, any one of the third small welding pads 52 is electrically connected to the conductive path 40, any one of the fourth small welding pads 53 is electrically connected to the conductive path 40, any one of the third small welding pads 52 is electrically connected to any one of the first small welding pads 50 through another wire W3, any one of the fourth small welding pads 53 is electrically connected to any one of the second small welding pads 51 through another wire W4, and any one of the fourth small welding pads 53 is electrically connected to any one of the third small welding pads 52 through another wire W5. It must be specially pointed out that all the small solder pads 50, 51, 52, 53 in the present invention can be respectively arranged not only in the first connection area A1, but also in the second connection area A2. In this embodiment, it is only an example and does not limit the spatial arrangement of all the small solder pads 50, 51, 52, 53.

此外,在本實施例中,該等第一小型焊墊50、該等第二小型焊墊51、該等第三小型焊墊52及該等第四小型焊墊53的面積介於900至7225平方微米(μm 2)之間,以提供較適配的焊接空間及空間利用。 Furthermore, in this embodiment, the areas of the first small solder pads 50 , the second small solder pads 51 , the third small solder pads 52 and the fourth small solder pads 53 are between 900 and 7225 square micrometers (μm 2 ) to provide a more suitable soldering space and space utilization.

關於本發明之第二實施例,請參閱圖2、圖4,其主要技術內容與第一實施例大致相同,如圖4所示,惟主要差異在於本實施例進一步包括一第一長型焊墊70,該第一長型焊墊70設置在該第二連接區A2;其中,該第一長型焊墊70係透過另一導線W6與該等第二小型焊墊51中任一個電連接,並且,該第一長型焊墊70係透過另一導線W7與該等第一小型焊墊50中任一個電連接。Regarding the second embodiment of the present invention, please refer to Figures 2 and 4. The main technical content is roughly the same as the first embodiment, as shown in Figure 4, but the main difference is that this embodiment further includes a first long solder pad 70, and the first long solder pad 70 is arranged in the second connection area A2; wherein, the first long solder pad 70 is electrically connected to any one of the second small solder pads 51 through another wire W6, and the first long solder pad 70 is electrically connected to any one of the first small solder pads 50 through another wire W7.

請參閱圖5,在本實施例中與第一實施例的另一差異在於,本實施例進一步還包括一第二長型焊墊71、一第三長型焊墊72及一第四長型焊墊73,該第二長型焊墊71、該第三長型焊墊72及該第四長型焊墊73係分別設置在該第二連接區A2,在本實施例中,該第一至第四長型焊墊70,71,72,73可彼此不連接、連接、不交疊或交疊。該第二長型焊墊71係透過另一導線W8與該等第二小型焊墊51中任一個電連接,並且,該第二長型焊墊71係透過另一導線W9與該等第四小型焊墊53中任一個電連接;該第三長型焊墊72係透過另一導線W10與該等第四小型焊墊53中任一個電連接,並且,該第三長型焊墊72係透過另一導線W11與該等第三小型焊墊52中任一個電連接;該第四長型焊墊73係透過另一導線W12與該等第三小型焊墊52中任一個電連接,該第四長型焊墊73係透過另一導線W13與該等第一小型焊墊50中任一個電連接。Please refer to Figure 5. Another difference between the present embodiment and the first embodiment is that the present embodiment further includes a second elongated solder pad 71, a third elongated solder pad 72 and a fourth elongated solder pad 73. The second elongated solder pad 71, the third elongated solder pad 72 and the fourth elongated solder pad 73 are respectively arranged in the second connection area A2. In the present embodiment, the first to fourth elongated solder pads 70, 71, 72, 73 may be unconnected, connected, non-overlapping or overlapping with each other. The second long pad 71 is electrically connected to any one of the second small pads 51 through another wire W8, and the second long pad 71 is electrically connected to any one of the fourth small pads 53 through another wire W9; the third long pad 72 is electrically connected to any one of the fourth small pads 53 through another wire W10, and the third long pad 72 is electrically connected to any one of the third small pads 52 through another wire W11; the fourth long pad 73 is electrically connected to any one of the third small pads 52 through another wire W12, and the fourth long pad 73 is electrically connected to any one of the first small pads 50 through another wire W13.

此外,在本實施例中,該第一長型焊墊70、該第二長型焊墊71、該第三長型焊墊72及該第四長型焊墊73的面積介於2800至14800μm 2之間,以提供較具延伸性的焊接空間及空間利用。 In addition, in the present embodiment, the areas of the first elongated bonding pad 70, the second elongated bonding pad 71, the third elongated bonding pad 72 and the fourth elongated bonding pad 73 are between 2800 and 14800 μm 2 to provide a more extensible bonding space and space utilization.

關於本發明之第三實施例,請參閱圖6,其主要技術內容與上述各實施例大致相同,如圖4、圖6,惟主要差異在於本實施例係提供二個以上的第五小型焊墊54,以取代第二實施例中的長型焊墊;在本實施例中,該等第五小型焊墊54係分別設置在該第二連接區A2,且該等第五小型焊墊54係位置相鄰並構成電連接;其中該等第五小型焊墊54中任一個係透過又一導線W14與該等第二小型焊墊51中任一個電連接,並且,該等第五小型焊墊54中任一個係透過又一導線W15與該等第一小型焊墊50中任一個電連接。Regarding the third embodiment of the present invention, please refer to Figure 6. Its main technical content is roughly the same as the above-mentioned embodiments, such as Figures 4 and 6, but the main difference is that this embodiment provides more than two fifth small welding pads 54 to replace the long welding pads in the second embodiment; in this embodiment, the fifth small welding pads 54 are respectively arranged in the second connection area A2, and the fifth small welding pads 54 are located adjacent to each other and form an electrical connection; wherein any one of the fifth small welding pads 54 is electrically connected to any one of the second small welding pads 51 through another wire W14, and any one of the fifth small welding pads 54 is electrically connected to any one of the first small welding pads 50 through another wire W15.

此外,在本實施例中,該等第五小型焊墊54的面積介於900至7225μm 2之間,以提供配置更彈性的焊接空間及空間利用。 In addition, in this embodiment, the area of the fifth small bonding pads 54 is between 900 and 7225 μm 2 to provide more flexible bonding space configuration and space utilization.

關於本發明之第四實施例,係提供另一種可減少電源腳位的積體電路,請參閱圖7所示,其中包括一封裝外殼100、一電源腳位端子200、一晶粒300、一環形的導電路徑400、二個以上的第一長型焊墊500及一大型焊墊600,惟本實施例與前述各實施例的差異僅在於,本實施例進一步提供該等第一長型焊墊500及該大型焊墊600,該等第一長型焊墊500可取代前述各實施例中的第一連接區A1或第二連接區A2中的焊墊,該大型焊墊600亦可取代前述各實施例中的第一連接區A1或第二連接區A2中的焊墊。Regarding the fourth embodiment of the present invention, another integrated circuit that can reduce power pins is provided, please refer to Figure 7, which includes a packaging shell 100, a power pin terminal 200, a chip 300, an annular conductive path 400, two or more first long solder pads 500 and a large solder pad 600. However, the difference between this embodiment and the aforementioned embodiments is that this embodiment further provides the first long solder pads 500 and the large solder pad 600. The first long solder pads 500 can replace the solder pads in the first connection area A1 or the second connection area A2 in the aforementioned embodiments, and the large solder pad 600 can also replace the solder pads in the first connection area A1 or the second connection area A2 in the aforementioned embodiments.

於本實施例中,如圖7所示,該電源腳位端子200同樣可穿設在該封裝外殼100上,該晶粒300設置在該封裝外殼100的內部,該導電路徑400係呈環形設置在該晶粒300上,同樣呈一口字型,並於該導電路徑400與該晶粒300的外緣之間構成一第一連接區A10,以及由呈環形的該導電路徑400的口字型之內部構成一第二連接區A20,該等第一長型焊墊500係分別設置在該第一連接區A10的相對位置。In this embodiment, as shown in FIG. 7 , the power pin terminal 200 can also be passed through the package shell 100, the die 300 is disposed inside the package shell 100, the conductive path 400 is disposed in a ring shape on the die 300, and is also in a U-shape, and a first connection area A10 is formed between the conductive path 400 and the outer edge of the die 300, and a second connection area A20 is formed by the inner part of the U-shape of the conductive path 400 in a ring shape, and the first elongated solder pads 500 are respectively disposed at relative positions of the first connection area A10.

在本實施例中,又如圖7所示,該第一連接區A10的相對位置係指非相鄰側,該等第一長型焊墊500可分設在該第一連接區A10的頂側與底側;或者在本實施例中,該等第一長型焊墊500亦可分設在該第一連接區A10的兩相鄰側,在此僅為舉例,而非加以限制。其中,該等第一長型焊墊500係與該導電路徑400電連接,且該等第一長型焊墊500中任一個係透過一導線WR1與該電源腳位端子200電連接;透過該等第一長型焊墊500,可以提供該第一連接區A10較具延伸性的焊接空間及空間利用。In this embodiment, as shown in FIG. 7 , the relative position of the first connection area A10 refers to non-adjacent sides, and the first elongated pads 500 can be disposed at the top and bottom of the first connection area A10; or in this embodiment, the first elongated pads 500 can also be disposed at two adjacent sides of the first connection area A10, which is only an example and not a limitation. Among them, the first elongated pads 500 are electrically connected to the conductive path 400, and any of the first elongated pads 500 is electrically connected to the power pin terminal 200 through a wire WR1; through the first elongated pads 500, a more extensible welding space and space utilization can be provided for the first connection area A10.

於本實施例中,該大型焊墊600可設置在該第二連接區A20內的任何位置,在本實施例中係可位於置中位置,該大型焊墊600透過另二個以上的導線WR2分別與該等第一長型焊墊500電連接,透過該大型焊墊600可減省該第二連接區A20內的焊接空間及提升空間利用。In this embodiment, the large welding pad 600 can be set at any position in the second connection area A20. In this embodiment, it can be located in the center. The large welding pad 600 is electrically connected to the first long welding pads 500 through two or more other wires WR2. The large welding pad 600 can reduce the welding space in the second connection area A20 and improve space utilization.

本發明透過設置在該第一連接區A10的該等第一長型焊墊500及設置在該第二連接區A20的該大型焊墊600,且該電源腳位端子200透過該導線WR1與該等第一長型焊墊500中任一個連接,減省電源腳位的設置數量,以使積體電路中I/O腳位的可擴充之功能性增加。The present invention reduces the number of power pins by setting the first elongated pads 500 in the first connection area A10 and the large pad 600 in the second connection area A20, and the power pin terminal 200 is connected to any one of the first elongated pads 500 through the wire WR1, thereby increasing the expandable functionality of the I/O pins in the integrated circuit.

在本實施例中,為提升其應用的方式,請參閱圖8,其中進一步包括二個以上的第二長型焊墊510,該等第二長型焊墊510亦可取代前述各實施例中的第一連接區A1或第二連接區A2中的焊墊;在本實施例中該等第二長型焊墊510係分別設置在該第一連接區A10的另一相對位置,且與該等第一長型焊墊500係設置於不同位置,該等第二長型焊墊510可分設在該導電路徑400的兩相鄰側,或是在該第一連接區A10的頂側與底側;其中該等第二長型焊墊510與該導電路徑400電連接,且該大型焊墊600係透過另二個以上的導線WR3分別與該等第二長型焊墊510電連接。In this embodiment, in order to improve its application, please refer to FIG. 8, which further includes more than two second elongated solder pads 510, and the second elongated solder pads 510 can also replace the solder pads in the first connection area A1 or the second connection area A2 in the above-mentioned embodiments; in this embodiment, the second elongated solder pads 510 are respectively arranged at another relative position of the first connection area A10, and are connected to the second elongated solder pads 510. The first elongated pads 500 are disposed at different positions, and the second elongated pads 510 can be disposed at two adjacent sides of the conductive path 400, or at the top and bottom sides of the first connection area A10; wherein the second elongated pads 510 are electrically connected to the conductive path 400, and the large pad 600 is electrically connected to the second elongated pads 510 through two or more wires WR3.

此外,在本實施例中,該等第一長型焊墊500及該等第二長型焊墊510的面積介於2800至14800μm 2之間,該大型焊墊600的面積介於2800至34225μm 2之間,以提供更具延伸性與彈性配置的焊接空間及提升空間利用。 In addition, in this embodiment, the areas of the first elongated pads 500 and the second elongated pads 510 are between 2800 and 14800 μm 2 , and the area of the large pad 600 is between 2800 and 34225 μm 2 , so as to provide a more extensible and flexible welding space and improve space utilization.

10:封裝外殼10: Encapsulation shell

20:電源腳位端子20: Power pin terminal

30:晶粒30: Grain

40:導電路徑40: Conductive path

50:第一小型焊墊50: First small pad

51:第二小型焊墊51: Second small welding pad

52:第三小型焊墊52: Third small welding pad

53:第四小型焊墊53: Fourth small welding pad

54:第五小型焊墊54: Fifth small welding pad

60:導電層60: Conductive layer

70:第一長型焊墊70: First long pad

71:第二長型焊墊71: Second long welding pad

72:第三長型焊墊72: The third long pad

73:第四長型焊墊73: Fourth long welding pad

100:封裝外殼100: Encapsulation shell

200:電源腳位端子200: Power pin terminal

300:晶粒300: Grain

400:導電路徑400: Conductive path

500:第一長型焊墊500: First long pad

510:第二長型焊墊510: Second long pad

600:大型焊墊600:Large welding pad

A1:第一連接區A1: First connection area

A2:第二連接區A2: Second connection area

A10:第一連接區A10: First connection area

A20:第二連接區A20: Second connection area

W1:導線W1: Conductor

W2:導線W2: Conductor

W3:導線W3: Conductor

W4:導線W4: Conductor

W5:導線W5: Conductor

W6:導線W6: Conductor

W7:導線W7: Conductor

W8:導線W8: Conductor

W9:導線W9: Conductor

W10:導線W10: Conductor

W11:導線W11: Conductor

W12:導線W12: Conductor

W13:導線W13: Conductor

W14:導線W14: Conductor

W15:導線W15: Conductor

WR1:導線WR1: Conductor

WR2:導線WR2: Conductor

WR3:導線WR3: Conductor

圖1 係本發明之第一實施例的可減少電源腳位的積體電路的一示意圖。 圖2 係本發明之第一實施例的可減少電源腳位的積體電路的另一示意圖。 圖3 係本發明之第一實施例的可減少電源腳位的積體電路的又一示意圖。 圖4 係本發明之第二實施例的可減少電源腳位的積體電路的一示意圖。 圖5 係本發明之第二實施例的可減少電源腳位的積體電路的另一示意圖。 圖6 係本發明之第三實施例的可減少電源腳位的積體電路的一示意圖。 圖7 係本發明之第四實施例的可減少電源腳位的積體電路的一示意圖。 圖8 係本發明之第四實施例的另一種可減少電源腳位的積體電路的示意圖。 FIG. 1 is a schematic diagram of an integrated circuit with reduced power pins of the first embodiment of the present invention. FIG. 2 is another schematic diagram of an integrated circuit with reduced power pins of the first embodiment of the present invention. FIG. 3 is another schematic diagram of an integrated circuit with reduced power pins of the first embodiment of the present invention. FIG. 4 is a schematic diagram of an integrated circuit with reduced power pins of the second embodiment of the present invention. FIG. 5 is another schematic diagram of an integrated circuit with reduced power pins of the second embodiment of the present invention. FIG. 6 is a schematic diagram of an integrated circuit with reduced power pins of the third embodiment of the present invention. FIG. 7 is a schematic diagram of an integrated circuit capable of reducing power pins according to the fourth embodiment of the present invention. FIG. 8 is a schematic diagram of another integrated circuit capable of reducing power pins according to the fourth embodiment of the present invention.

10:封裝外殼 10: Encapsulation shell

20:電源腳位端子 20: Power pin terminal

30:晶粒 30: Grain

40:導電路徑 40: Conductive path

50:第一小型焊墊 50: First small welding pad

60:導電層 60: Conductive layer

A1:第一連接區 A1: First connection area

A2:第二連接區 A2: Second connection area

W1:導線 W1: Conductor

Claims (10)

一種可減少電源腳位的積體電路,其包括:一封裝外殼;一電源腳位端子,設在該封裝外殼上;一晶粒,設在該封裝外殼的內部;一導電路徑,設在該晶粒上,並於該導電路徑與該晶粒的外緣之間具有一第一連接區;以及二個以上的第一小型焊墊,設置在該第一連接區並相鄰連接;其中,該等第一小型焊墊中任一個係與該導電路徑連接,且該等第一小型焊墊中任一個係透過一導線與該電源腳位端子連接。 An integrated circuit capable of reducing power pins includes: a package shell; a power pin terminal disposed on the package shell; a die disposed inside the package shell; a conductive path disposed on the die and having a first connection area between the conductive path and the outer edge of the die; and two or more first small solder pads disposed in the first connection area and connected adjacently; wherein any one of the first small solder pads is connected to the conductive path, and any one of the first small solder pads is connected to the power pin terminal through a wire. 如請求項1所述之可減少電源腳位的積體電路,其中,該導電路徑與該晶粒的外緣之間具有一第二連接區,該等第一小型焊墊可設置在該第二連接區。 An integrated circuit capable of reducing power pins as described in claim 1, wherein there is a second connection area between the conductive path and the outer edge of the die, and the first small solder pads can be arranged in the second connection area. 如請求項2所述之可減少電源腳位的積體電路,其中,該導電路徑係呈環形設置在該晶粒上,該第二連接區係由呈環形的該導電路徑的內部所構成。 An integrated circuit capable of reducing power pins as described in claim 2, wherein the conductive path is arranged in a ring shape on the die, and the second connection area is formed by the inner part of the conductive path in a ring shape. 如請求項2或3所述之可減少電源腳位的積體電路,其中,進一步包括二個以上的第二小型焊墊,該等第二小型焊墊係設置在該第一連接區或該第二連接區並相鄰連接;其中,該等第二小型焊墊中任一個與該導電路徑連接,且該等第二小型焊墊中任一個係透過另一導線與該等第一小型焊墊中任一個連接。 An integrated circuit capable of reducing power pins as described in claim 2 or 3, further comprising two or more second small solder pads, the second small solder pads being disposed in the first connection area or the second connection area and connected adjacently; wherein any one of the second small solder pads is connected to the conductive path, and any one of the second small solder pads is connected to any one of the first small solder pads via another wire. 如請求項4所述之可減少電源腳位的積體電路,其中,進一步包括二個以上的第三小型焊墊及二個以上的第四小型焊墊,該等第三小型焊墊係 設置在該第一連接區或該第二連接區並相鄰連接;該等第四小型焊墊係設置在該第一連接區或該第二連接區並相鄰連接;其中,該等第三小型焊墊中任一個與該導電路徑連接,該等第四小型焊墊中任一個與該導電路徑連接,該等第三小型焊墊中任一個係透過另一導線與該等第一小型焊墊中任一個連接,該等第四小型焊墊中任一個係透過另一導線與該等第二小型焊墊中任一個連接,該等第四小型焊墊中任一個係透過另一導線與該等第三小型焊墊中任一個連接。 The integrated circuit capable of reducing power pins as described in claim 4, further comprising two or more third small solder pads and two or more fourth small solder pads, wherein the third small solder pads are disposed in the first connection area or the second connection area and are adjacently connected; the fourth small solder pads are disposed in the first connection area or the second connection area and are adjacently connected; wherein any one of the third small solder pads is adjacent to the The conductive path is connected to any one of the fourth small pads, any one of the third small pads is connected to any one of the first small pads through another conductive path, any one of the fourth small pads is connected to any one of the second small pads through another conductive path, and any one of the fourth small pads is connected to any one of the third small pads through another conductive path. 如請求項2或3所述之可減少電源腳位的積體電路,其中,進一步包括二個以上的第二小型焊墊及一第一長型焊墊,該等第二小型焊墊係設置在該第一連接區或該第二連接區並相鄰連接,該第一長型焊墊設在該第二連接區;其中,該等第二小型焊墊中任一個與該導電路徑連接,該第一長型焊墊係透過另一導線與該等第二小型焊墊中任一個連接,並且,該第一長型焊墊係透過另一導線與該等第一小型焊墊中任一個連接。 An integrated circuit capable of reducing power pins as described in claim 2 or 3, further comprising two or more second small solder pads and a first long solder pad, wherein the second small solder pads are disposed in the first connection area or the second connection area and are adjacently connected, and the first long solder pad is disposed in the second connection area; wherein any one of the second small solder pads is connected to the conductive path, the first long solder pad is connected to any one of the second small solder pads through another wire, and the first long solder pad is connected to any one of the first small solder pads through another wire. 如請求項6所述之可減少電源腳位的積體電路,其中,進一步包括二個以上的第三小型焊墊、二個以上的第四小型焊墊、一第二長型焊墊、一第三長型焊墊及一第四長型焊墊,該等第三小型焊墊係設置在該第一連接區或該第二連接區並相鄰連接;該等第四小型焊墊係設置在該第一連接區或該第二連接區並相鄰連接,該第二長型焊墊、該第三長型焊墊及該第四長型焊墊係設置在該第二連接區;其中,該等第三小型焊墊中任一個與該導電路徑連接,該等第四小型焊墊中任一個與該導電路徑連接,該第二長型焊墊係透過另一導線與該等第二小型焊墊中任一個連接,並且,該第二長型焊墊係透過另一導線與該等第四小型焊墊中任一個連接;該第三長型焊墊係透過另一導線與該等第四小型焊墊中任一個連 接,並且,該第三長型焊墊係透過另一導線與該等第三小型焊墊中任一個連接;該第四長型焊墊係透過另一導線與該等第三小型焊墊中任一個連接,該第四長型焊墊係透過另一導線與該等第一小型焊墊中任一個連接。 An integrated circuit capable of reducing power pins as described in claim 6, further comprising two or more third small solder pads, two or more fourth small solder pads, a second long solder pad, a third long solder pad and a fourth long solder pad, wherein the third small solder pads are disposed in the first connection area or the second connection area and are adjacently connected; the fourth small solder pads are disposed in the first connection area or the second connection area and are adjacently connected, and the second long solder pad, the third long solder pad and the fourth long solder pad are disposed in the second connection area; wherein any one of the third small solder pads is connected to the conductive path, and the fourth small solder pads are connected to the conductive path. Any of the pads is connected to the conductive path, the second long pad is connected to any of the second small pads through another wire, and the second long pad is connected to any of the fourth small pads through another wire; the third long pad is connected to any of the fourth small pads through another wire, and the third long pad is connected to any of the third small pads through another wire; the fourth long pad is connected to any of the third small pads through another wire, and the fourth long pad is connected to any of the first small pads through another wire. 如請求項2或3所述之可減少電源腳位的積體電路,其中,進一步包括二個以上的第二小型焊墊及二個以上的第五小型焊墊,該等第二小型焊墊係設置在該第一連接區或該第二連接區並相鄰連接,該等第五小型焊墊係設置在該第二連接區並相鄰連接;其中,該等第二小型焊墊中任一個與該導電路徑連接,該等第五小型焊墊中任一個係透過又一導線與該等第二小型焊墊中任一個連接,並且,該等第五小型焊墊中任一個係透過又一導線與該等第一小型焊墊中任一個連接。 An integrated circuit capable of reducing power pins as described in claim 2 or 3, further comprising two or more second small solder pads and two or more fifth small solder pads, wherein the second small solder pads are disposed in the first connection area or the second connection area and are adjacently connected, and the fifth small solder pads are disposed in the second connection area and are adjacently connected; wherein any one of the second small solder pads is connected to the conductive path, any one of the fifth small solder pads is connected to any one of the second small solder pads through another wire, and any one of the fifth small solder pads is connected to any one of the first small solder pads through another wire. 一種可減少電源腳位的積體電路,其包括:一封裝外殼;一電源腳位端子,設在該封裝外殼上;一晶粒,設在該封裝外殼的內部;一環形的導電路徑,環設在該晶粒上,並於該導電路徑與該晶粒的外緣之間構成一第一連接區,以及由該導電路徑的內部構成一第二連接區;二個以上的第一長型焊墊,設置在該第一連接區的相對位置;其中,該等第一長型焊墊係與該導電路徑連接,且該等第一長型焊墊中任一個係透過一導線與該電源腳位端子連接;以及一大型焊墊,設在該第二連接區,該大型焊墊透過另二個以上導線與該等第一長型焊墊連接。 An integrated circuit capable of reducing power pins includes: a package shell; a power pin terminal disposed on the package shell; a die disposed inside the package shell; an annular conductive path disposed around the die, forming a first connection area between the conductive path and the outer edge of the die, and forming a second connection area by the inside of the conductive path; More than one first elongated pads are arranged at relative positions of the first connection area; wherein the first elongated pads are connected to the conductive path, and any one of the first elongated pads is connected to the power pin terminal through a wire; and a large pad is arranged in the second connection area, and the large pad is connected to the first elongated pads through another two or more wires. 如請求項9所述之可減少電源腳位的積體電路,其中,進一步包括二個以上的第二長型焊墊,該等第二長型焊墊係設置在該第一連接區,且與該等第一長型焊墊係設於不同位置; 其中,該等第二長型焊墊與該導電路徑連接,且該大型焊墊係透過另二個以上的導線分別與該等第二長型焊墊連接。 The integrated circuit capable of reducing power pins as described in claim 9 further comprises two or more second elongated pads, the second elongated pads are arranged in the first connection area and are arranged at different positions from the first elongated pads; wherein the second elongated pads are connected to the conductive path, and the large pad is connected to the second elongated pads through two or more other wires.
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