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TWI849035B - Breaking method and splitting method - Google Patents

Breaking method and splitting method Download PDF

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TWI849035B
TWI849035B TW109101195A TW109101195A TWI849035B TW I849035 B TWI849035 B TW I849035B TW 109101195 A TW109101195 A TW 109101195A TW 109101195 A TW109101195 A TW 109101195A TW I849035 B TWI849035 B TW I849035B
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substrate
scribe line
line
along
scribing
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TW109101195A
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TW202041475A (en
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朱江
舩木清二郎
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日商三星鑽石工業股份有限公司
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B28WORKING CEMENT, CLAY, OR STONE
    • B28DWORKING STONE OR STONE-LIKE MATERIALS
    • B28D1/00Working stone or stone-like materials, e.g. brick, concrete or glass, not provided for elsewhere; Machines, devices, tools therefor
    • B28D1/22Working stone or stone-like materials, e.g. brick, concrete or glass, not provided for elsewhere; Machines, devices, tools therefor by cutting, e.g. incising
    • B28D1/225Working stone or stone-like materials, e.g. brick, concrete or glass, not provided for elsewhere; Machines, devices, tools therefor by cutting, e.g. incising for scoring or breaking, e.g. tiles
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03BMANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
    • C03B33/00Severing cooled glass
    • C03B33/07Cutting armoured, multi-layered, coated or laminated, glass products
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B28WORKING CEMENT, CLAY, OR STONE
    • B28DWORKING STONE OR STONE-LIKE MATERIALS
    • B28D7/00Accessories specially adapted for use with machines or devices of the preceding groups
    • B28D7/04Accessories specially adapted for use with machines or devices of the preceding groups for supporting or holding work or conveying or discharging work
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03BMANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
    • C03B33/00Severing cooled glass
    • C03B33/02Cutting or splitting sheet glass or ribbons; Apparatus or machines therefor
    • C03B33/023Cutting or splitting sheet glass or ribbons; Apparatus or machines therefor the sheet or ribbon being in a horizontal position
    • C03B33/033Apparatus for opening score lines in glass sheets
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03BMANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
    • C03B33/00Severing cooled glass
    • C03B33/02Cutting or splitting sheet glass or ribbons; Apparatus or machines therefor
    • C03B33/04Cutting or splitting in curves, especially for making spectacle lenses

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Organic Chemistry (AREA)
  • Mechanical Engineering (AREA)
  • Mining & Mineral Resources (AREA)
  • Re-Forming, After-Treatment, Cutting And Transporting Of Glass Products (AREA)
  • Processing Of Stones Or Stones Resemblance Materials (AREA)
  • Liquid Crystal (AREA)
  • Perforating, Stamping-Out Or Severing By Means Other Than Cutting (AREA)

Abstract

本發明提供一種可沿形成於貼合基板之刻劃線容易且良好地進行分斷之分斷方法、及應用於該分斷方法之裂斷方法。 本發明之分斷方法,係將由第1基板11與第2基板12藉由密封材SL貼合而成之基板10分斷,其包含:於第1基板11之表面11a之與密封材SL相對向之位置形成第1刻劃線L1之步驟;於第2基板12之表面12a之與密封材SL相對向之位置形成第2刻劃線L2之步驟;對包含第1刻劃線L1之區域進行按壓,而使第2垂直裂紋C2沿第2刻劃線L2滲透之步驟;及將由第1刻劃線L1與第2刻劃線L2分隔之基板10之區域沿平行於基板10之方向互相拉離,而沿第1刻劃線L1與第2刻劃線L2將基板10分離之步驟。The present invention provides a breaking method that can easily and well break along a scribe line formed on a bonded substrate, and a cracking method applied to the breaking method. The breaking method of the present invention is to break a substrate 10 formed by bonding a first substrate 11 and a second substrate 12 by a sealing material SL, and includes: forming a first scribe line L1 on a surface 11a of the first substrate 11 at a position opposite to the sealing material SL; forming a second scribe line L1 on a surface 12a of the second substrate 12 at a position opposite to the sealing material SL. L2; pressing the area including the first scribe line L1 so that the second vertical crack C2 penetrates along the second scribe line L2; and pulling the areas of the substrate 10 separated by the first scribe line L1 and the second scribe line L2 away from each other in a direction parallel to the substrate 10, thereby separating the substrate 10 along the first scribe line L1 and the second scribe line L2.

Description

分斷方法及裂斷方法Breaking method and splitting method

本發明係關於一種形成刻劃線而將貼合基板分斷之分斷方法、及應用於該分斷方法之貼合基板之裂斷方法。 The present invention relates to a separation method for forming a scribe line to separate a bonded substrate, and a bonded substrate cleaving method applied to the separation method.

以往,玻璃基板等脆性材料基板之分斷係藉由於基板之表面形成刻劃線之刻劃步驟、及沿所形成之刻劃線對基板之表面施加既定之力之裂斷步驟而進行。於刻劃步驟中,一邊將刻劃輪壓抵於基板之表面,一邊使其沿既定之線移動。 In the past, the breaking of brittle material substrates such as glass substrates was performed by a scribing step of forming a scribing line on the surface of the substrate and a cracking step of applying a predetermined force to the surface of the substrate along the formed scribing line. In the scribing step, the scribing wheel is pressed against the surface of the substrate while being moved along the predetermined line.

以下之專利文獻1中記載有一種裂斷方法,其係沿形成於第1基板之表面之第1刻劃線與形成於第2基板之表面之第2刻劃線將由第1基板與第2基板貼合所構成之基板裂斷。形成於第2基板之表面之第2刻劃線係形成於俯視下與第1刻劃線相同之位置。於此裂斷方法中,若朝向第1基板對載置於第1刻劃線上之導桿施加衝擊,則沿第2刻劃線將第2基板裂斷。其後,以第1刻劃線及第2刻劃線為邊界之一側區域之一部分或全部由支承構件支承,又,以第1刻劃線及第2刻劃線為邊界之另一側區域之全部自支承構件之一端突出之方式進行配置。然後,藉由利用裂斷桿按壓該另一側區域,而沿第1刻劃線將第1基板裂斷。 The following patent document 1 describes a cleavage method, which is to cleave a substrate formed by bonding a first substrate and a second substrate along a first scribe line formed on the surface of the first substrate and a second scribe line formed on the surface of the second substrate. The second scribe line formed on the surface of the second substrate is formed at the same position as the first scribe line in a plan view. In this cleavage method, if an impact is applied to a guide rod placed on the first scribe line toward the first substrate, the second substrate is cleaved along the second scribe line. Afterwards, a part or all of one side region bounded by the first scribe line and the second scribe line is supported by a supporting member, and the other side region bounded by the first scribe line and the second scribe line is configured to protrude from one end of the supporting member. Then, the first substrate is fractured along the first scribe line by pressing the other side region with a fracture bar.

[先前技術文獻] [Prior Art Literature] [專利文獻] [Patent Literature]

[專利文獻1] 日本特開2017-013239號公報 [Patent Document 1] Japanese Patent Publication No. 2017-013239

貼合基板存在於裂斷位置處第1基板與第2基板被密封材貼合之情形。於此種基板中,第1基板及第2基板中刻劃線後形成之基板中,垂直裂紋難以沿刻劃線充分滲透至基板。若於垂直裂紋之滲透不充分之狀態下對基板執行裂斷步驟,則有裂斷後之基板之端緣產生較細之龜裂或破損而導致基板之強度降低之虞。專利文獻1之裂斷方法,裂斷之對象為貼合基板,但並未揭示考慮到垂直裂紋對各基板之滲透狀態之貼合基板之裂斷步驟。又,如專利文獻1般,若藉由自一個方向按壓貼合基板進行裂斷,則存在因基板之端面於裂斷時互相接觸而產生基板之缺損等製品品質降低之可能性。尤其是於製品形狀之至少一部分包含曲線部分之情形時,由於曲線部分中基板之端面彼此接觸,會產生基板之缺損,因此無法採用專利文獻1之裂斷方法。 In the case of a bonded substrate, the first substrate and the second substrate are bonded together by a sealing material at the crack position. In such a substrate, in the substrate formed after the scribing lines in the first substrate and the second substrate, it is difficult for the vertical cracks to fully penetrate into the substrate along the scribing lines. If the substrate is subjected to a cracking step when the vertical cracks have not fully penetrated, there is a risk that the edge of the substrate after cracking will have finer cracks or damage, resulting in a reduction in the strength of the substrate. The cracking method of Patent Document 1 cracks the bonded substrate, but does not disclose a cracking step of the bonded substrate that takes into account the penetration of the vertical cracks into each substrate. Furthermore, as in Patent Document 1, if the bonded substrate is cracked by pressing from one direction, there is a possibility that the end faces of the substrate will contact each other during cracking, resulting in substrate defects and other degradation of product quality. In particular, when at least a part of the product shape includes a curved portion, the end faces of the substrate will contact each other in the curved portion, resulting in substrate defects, so the cracking method of Patent Document 1 cannot be adopted.

有鑒於此課題,本發明之目的在於提供一種可沿形成於貼合基板之刻劃線容易且良好地進行分斷之分斷方法、及應用於該分斷方法之裂斷方法。 In view of this topic, the purpose of the present invention is to provide a breaking method that can easily and well break along the scribe lines formed on the bonded substrate, and a cleaving method applied to the breaking method.

本發明之第1態樣,係關於一種將由第1基板與第2基板藉由密封材貼合而成之基板分斷之分斷方法。本態樣之分斷方法,包含:一邊將刻劃輪壓抵於上述第1基板之表面之與上述密封材相對向之位置、一邊移動上述刻劃輪,而於上述第1基板之表面形成第1刻劃線;一邊將刻劃輪壓抵於上述第2基板之表面之與上述密封材相對向之位置、一邊移動上述刻劃輪,而於上述第2基板之表面形成第2刻劃線;按壓包含形成於上述第1基板之表面之上述第1刻劃線之區域,使垂直裂紋沿上述第2刻劃線滲透至上述第2基板;將由上述第1刻劃線及上述第2刻劃線分隔之上述基板之區域沿平行於上述基板之表面之方向互相拉離, 藉此沿上述第1刻劃線及上述第2刻劃線將上述基板分離;沿上述第1刻劃線形成之第1垂直裂紋的滲透度為70~100%;形成上述第2刻劃線之步驟,係在形成上述第1刻劃線之步驟之後進行;沿上述第2刻劃線形成之第2垂直裂紋的滲透度低於上述第1刻劃線之垂直裂紋的滲透度。 The first aspect of the present invention is a method for separating substrates formed by bonding a first substrate and a second substrate together with a sealing material. The method of this aspect includes: pressing a scribing wheel against a position on the surface of the first substrate opposite to the sealing material while moving the scribing wheel to form a first scribing line on the surface of the first substrate; pressing a scribing wheel against a position on the surface of the second substrate opposite to the sealing material while moving the scribing wheel to form a second scribing line on the surface of the second substrate; pressing an area including the first scribing line formed on the surface of the first substrate to cause a vertical crack to penetrate along the second scribing line to the second scribing line; The second substrate; the regions of the substrate separated by the first scribe line and the second scribe line are pulled apart from each other in a direction parallel to the surface of the substrate, thereby separating the substrate along the first scribe line and the second scribe line; the first vertical crack formed along the first scribe line has a permeability of 70-100%; the step of forming the second scribe line is performed after the step of forming the first scribe line; the second vertical crack formed along the second scribe line has a permeability lower than the vertical crack of the first scribe line.

關於以密封材將第1基板與第2基板貼合之貼合基板,於先形成刻劃線之基板,垂直裂紋會良好地滲透,於後形成刻劃線之基板,垂直裂紋難以充分滲透。於此方面,藉由上述構成,暫時先於第2基板形成刻劃線後,經由第1基板而對第2基板施加力,藉此垂直裂紋沿後形成之第2刻劃線滲透至第2基板。由此,第2基板成為容易沿第2刻劃線分離之狀態。藉此,可沿第1刻劃線及第2刻劃線將基板容易地分離。 Regarding the bonded substrate in which the first substrate and the second substrate are bonded with a sealing material, the vertical cracks will penetrate well in the substrate where the scribe line is formed first, but it is difficult for the vertical cracks to fully penetrate in the substrate where the scribe line is formed later. In this regard, by the above-mentioned structure, after the scribe line is temporarily formed before the second substrate, a force is applied to the second substrate through the first substrate, so that the vertical cracks penetrate into the second substrate along the second scribe line formed later. As a result, the second substrate becomes easy to separate along the second scribe line. In this way, the substrates can be easily separated along the first scribe line and the second scribe line.

又,可預先沿第1刻劃線及第2刻劃線形成較深之垂直裂紋,將由第1刻劃線及第2刻劃線分隔之基板之區域沿平行於基板之表面之方向互相拉離,藉此將基板分離。因此,於分離基板時,不存在基板之端面互相接觸之情況,而無需擔心基板會產生龜裂或破損。因此,不會降低基板之強度,可精加工為高品質之製品。 In addition, deeper vertical cracks can be formed along the first and second scribe lines in advance, and the areas of the substrate separated by the first and second scribe lines can be pulled apart from each other in a direction parallel to the surface of the substrate, thereby separating the substrates. Therefore, when separating the substrates, there is no situation where the end faces of the substrates touch each other, and there is no need to worry about cracks or damage to the substrates. Therefore, the strength of the substrate will not be reduced, and it can be finely processed into a high-quality product.

於本態樣之分斷方法中,上述第1刻劃線及上述第2刻劃線可形成包含曲線之刻劃線。 In the segmentation method of this aspect, the first scribe line and the second scribe line can form a scribe line including a curve.

藉由此構成,可使垂直裂紋適當地滲透至第1刻劃線及第2刻劃線之兩者中,因此,即使於第1刻劃線及第2刻劃線包含曲線之情形時,亦可藉由沿第1刻劃線及第2刻劃線將基板拉離而防止基板之端面之接觸,從而將基板順利地分離。由此,上述構成之分斷方法可應用於多種多樣之基板之分斷。 With this structure, the vertical crack can be properly penetrated into both the first and second scribe lines. Therefore, even when the first and second scribe lines include curves, the substrate can be pulled apart along the first and second scribe lines to prevent the end faces of the substrate from contacting, thereby smoothly separating the substrate. Therefore, the above-mentioned separation method can be applied to the separation of a variety of substrates.

本態樣之分斷方法,可以如下方式構成:於使垂直裂紋滲透至上述第2基板之步驟中,使彈性構件密接於上述第1刻劃線,而對包含上述第1刻劃線之區域進行按壓。 The breaking method of this aspect can be constructed as follows: in the step of making the vertical crack penetrate into the second substrate, the elastic member is brought into close contact with the first scribe line, and the area including the first scribe line is pressed.

藉由此構成,藉由彈性構件密接於沿第1刻劃線之區域,而可對該區域之全部範圍一律賦予按壓力。藉此,可對形成於第2基板之表面之第2刻劃線均勻地施力。由此,於使垂直裂紋滲透至第2基板之步驟中,容易使垂直裂紋沿第2刻劃線滲透至第2基板。藉此,可沿第1刻劃線及第2刻劃線將基板容易地分離。 With this structure, the elastic member is in close contact with the area along the first scribe line, and the entire range of the area can be uniformly applied with pressure. In this way, the second scribe line formed on the surface of the second substrate can be uniformly applied with force. Therefore, in the step of making the vertical crack penetrate into the second substrate, the vertical crack can be easily penetrated into the second substrate along the second scribe line. In this way, the substrates can be easily separated along the first scribe line and the second scribe line.

於此情形時,可以如下方式構成:對用以固定上述彈性構件之固定構件施力,而對包含上述第1刻劃線之區域進行按壓。 In this case, the structure can be as follows: force is applied to the fixing member used to fix the elastic member, and the area including the first scoring line is pressed.

藉此,對固定構件賦予之力被全面地賦予至彈性構件,因此,彈性構件均勻地密接於沿第1刻劃線之整個區域。藉此,可將按壓力均勻地賦予至沿第1刻劃線之區域之全部範圍,而對形成於第2基板之表面之第2刻劃線確實且均勻地施力。由此,垂直裂紋更容易沿第2刻劃線滲透至第2基板。藉此,可沿第1刻劃線及第2刻劃線將基板容易地分離。 Thus, the force applied to the fixed member is fully applied to the elastic member, so that the elastic member is uniformly and closely attached to the entire area along the first scribe line. Thus, the pressure can be uniformly applied to the entire range of the area along the first scribe line, and the second scribe line formed on the surface of the second substrate can be reliably and uniformly applied. As a result, the vertical cracks can more easily penetrate into the second substrate along the second scribe line. Thus, the substrates can be easily separated along the first scribe line and the second scribe line.

本發明之第2態樣,係關於一種裂斷方法,其係沿形成於第1基板之與密封材相對向之位置之第1刻劃線與於上述第1刻劃線之後形成於第2基板之與上述密封材相對向之位置之第2刻劃線將由上述第1基板與上述第2基板藉由上述密封材貼合而成之基板裂斷。此態樣之裂斷方法,包含:對包含上述第1刻劃線之區域進行按壓,而使垂直裂紋沿上述第2刻劃線滲透至上述第2基板之步驟;及將由上述第1刻劃線及上述第2刻劃線分隔之上述基板之區域沿平行於上述基板之表面之方向互相拉離,藉此沿上述第1刻劃線及上述第2刻劃線將上述基板分離之步驟;沿上述第1刻劃線形成之第1垂直裂紋的滲透度為70~100%;形成上述第2刻劃線之步驟,係在形成上述第1刻劃線之步驟之後進行;沿上述第2刻劃線形成之第2垂直裂紋的滲透度低於上述第1刻劃線之垂直裂紋的滲透度。 The second aspect of the present invention is a cleavage method, which is to cleave a substrate formed by bonding the first substrate and the second substrate via the sealing material along a first scribe line formed on the first substrate at a position opposite to the sealing material and a second scribe line formed on the second substrate after the first scribe line at a position opposite to the sealing material. The cleavage method of this aspect includes: pressing an area including the first scribe line to allow a vertical crack to penetrate along the second scribe line to the second substrate; and pulling areas of the substrate separated by the first scribe line and the second scribe line away from each other in a direction parallel to the surface of the substrate, thereby cleaving the substrate along the first scribe line and the second scribe line. 2. The step of separating the substrate along the above-mentioned scribe line; the permeability of the first vertical crack formed along the above-mentioned scribe line is 70-100%; the step of forming the above-mentioned second scribe line is performed after the step of forming the above-mentioned first scribe line; the permeability of the second vertical crack formed along the above-mentioned second scribe line is lower than the permeability of the vertical crack along the above-mentioned first scribe line.

依此構成,發揮與第1態樣相同之效果。 According to this structure, the same effect as the first aspect is achieved.

如以上所述,根據本發明,可提供一種可沿形成於貼合基板之刻劃線容易且良好地進行分斷之分斷方法、及應用於該分斷方法之裂斷方法。 As described above, according to the present invention, a breaking method that can easily and well break along the scribe lines formed on the bonded substrate and a cleaving method applied to the breaking method can be provided.

本發明之效果或意義,藉由以下所示之實施形態之說明而變得更明確。但以下所示之實施形態僅係實施本發明時之一個例示,本發明並不受以下之實施形態所記載者任何限制。 The effect or significance of the present invention becomes clearer through the description of the implementation form shown below. However, the implementation form shown below is only an example of the implementation of the present invention, and the present invention is not limited to anything described in the following implementation form.

1:刻劃輪 1: Grating wheel

10:基板 10: Substrate

11:第1基板 11: 1st substrate

11a:第1基板之表面 11a: Surface of the first substrate

12:第2基板 12: Second substrate

12a:第2基板之表面 12a: Surface of the second substrate

L1:第1刻劃線 L1: 1st scale line

L2:第2刻劃線 L2: 2nd scale line

13:彈性構件 13: Elastic components

14:固定構件(板構件) 14: Fixed components (plate components)

15:衝擊構件 15: Impact components

41:第1基板 41: 1st substrate

41a:表面 41a: Surface

42:第2基板 42: Second substrate

42a:表面 42a: Surface

43:板構件 43: Plate components

44:彈性構件 44: Elastic components

45:錘 45: Hammer

100:刻劃裝置 100: Engraving device

101:移動台 101: Mobile station

102:滾珠螺桿 102: Ball screw

103:導軌 103:Guide rails

104:馬達 104: Motor

105:載置部 105: Loading unit

106:相機 106: Camera

107:橋 107: Bridge

108a、108b:支柱 108a, 108b: Pillars

109:軌 109: Track

110:移動部 110: Mobile unit

120:刻劃頭 120: Engraving head

121:支承部 121: Supporting part

130:保持具單元 130: Holding unit

C1:第1垂直裂紋 C1: 1st vertical crack

C2:第2垂直裂紋 C2: Second vertical crack

F:密封材 F: Sealing material

G1:第1垂直裂紋 G1: 1st vertical crack

G2:第2垂直裂紋 G2: Second vertical crack

H:輔助線 H: Auxiliary line

H1:評價對象輔助線 H1: Auxiliary line of evaluation object

R:液晶注入區域 R: Liquid crystal injection area

S:製品線 S:Production line

S1:評價對象製品線 S1: Evaluation product line

SL:密封材 SL: Sealing material

[圖1]係示意性地表示實施形態之刻劃裝置之構成之圖。 [Figure 1] is a diagram schematically showing the structure of the engraving device in the implementation form.

[圖2]係表示實施形態之分斷方法之流程圖。 [Figure 2] is a flow chart showing the segmentation method of the implementation form.

[圖3](a)~(f)係示意性地表示實施形態之分斷方法之過程之側視圖。 [Figure 3] (a) to (f) are side views schematically showing the process of implementing the segmentation method.

[圖4](a)~(e)分別為用以對實施形態之分斷方法之驗證進行說明之示意圖。 [Figure 4] (a)~(e) are schematic diagrams used to illustrate the verification of the segmentation method of the implementation form.

[圖5](a)~(d)分別為用以對實施形態之分斷方法之驗證進行說明之示意圖。 [Figure 5] (a)~(d) are schematic diagrams used to illustrate the verification of the segmentation method of the implementation form.

以下,參照圖式對本發明之實施形態進行說明。再者,各圖中,為了方便起見而標註互相正交之X軸、Y軸及Z軸。Z軸表示鉛直方向之上方及下方。下文中,上方及下方分別意指Z軸正側及Z軸負側。 Below, the implementation form of the present invention is described with reference to the drawings. Furthermore, in each figure, for the sake of convenience, the mutually orthogonal X-axis, Y-axis and Z-axis are labeled. The Z-axis represents the upper and lower sides in the vertical direction. In the following text, the upper side and the lower side respectively refer to the positive side of the Z-axis and the negative side of the Z-axis.

本實施形態係關於將由第1基板11與第2基板12貼合而成之貼合基板10分斷之方法。下文中,於本說明書中將「貼合基板10」簡稱為「基板10」。又,於本實施形態中,於無特別說明之情形時,「將基板10分斷」或「將基板10分離」係將第1基板11及第2基板12同時分斷或分離之含義。 This embodiment is about a method for separating a bonded substrate 10 formed by bonding a first substrate 11 and a second substrate 12. Hereinafter, in this specification, "bonded substrate 10" is referred to as "substrate 10". In addition, in this embodiment, unless otherwise specified, "separating substrate 10" or "separating substrate 10" means separating or separating the first substrate 11 and the second substrate 12 at the same time.

首先,對用以於基板10形成刻劃線之刻劃裝置100之構成進行說明。於本實施形態中,首先於第1基板11之表面11a形成第1刻劃線L1後,於第2基板12之表面12a形成第2刻劃線L2。 First, the structure of the scribing device 100 for forming scribing lines on the substrate 10 is described. In this embodiment, the first scribing line L1 is first formed on the surface 11a of the first substrate 11, and then the second scribing line L2 is formed on the surface 12a of the second substrate 12.

圖1係示意性地表示實施形態1之刻劃裝置100之構成之圖。刻劃裝置100,具備移動台101、及刻劃頭120。移動台101與滾珠螺桿102螺合。移動台101以可沿Y軸方向移動之方式由一對導軌103支承。利用馬達之驅動使滾珠螺桿102旋轉,藉此,移動台101沿一對導軌103於Y軸方向移動。 FIG. 1 schematically shows the structure of the engraving device 100 of the embodiment 1. The engraving device 100 has a moving table 101 and an engraving head 120. The moving table 101 is screwed with a ball screw 102. The moving table 101 is supported by a pair of guide rails 103 so as to be movable along the Y-axis direction. The ball screw 102 is rotated by the drive of a motor, whereby the moving table 101 moves along the pair of guide rails 103 in the Y-axis direction.

於移動台101之上表面設置有馬達104。馬達104使位於上部之載置部105於XY平面旋轉並以既定角度將其定位。可藉由馬達104而水平旋轉之載置部105具備未圖示之真空吸附手段。於載置部105上載置之基板10由該真空吸附手段保持於載置部105上。 A motor 104 is provided on the upper surface of the moving stage 101. The motor 104 rotates the upper mounting portion 105 in the XY plane and positions it at a predetermined angle. The mounting portion 105 that can be horizontally rotated by the motor 104 is provided with a vacuum adsorption means not shown. The substrate 10 mounted on the mounting portion 105 is held on the mounting portion 105 by the vacuum adsorption means.

刻劃裝置100於載置於載置部105之基板10之上方具備對形成於該基板10之對準標記進行拍攝之兩台相機106。又,以橫跨移動台101與其上部之載置部105之方式於支柱108a、108b架設有橋107。 The scribing device 100 has two cameras 106 above the substrate 10 placed on the mounting portion 105 for photographing the alignment marks formed on the substrate 10. In addition, a bridge 107 is provided on the pillars 108a and 108b in a manner that spans the moving stage 101 and the mounting portion 105 above it.

於橋107安裝有軌109。軌109與刻劃頭120經由移動部110連接,以藉由移動部110於軌109上滑動移動使得刻劃頭120沿X軸方向移動之方式設置。 A rail 109 is installed on the bridge 107. The rail 109 is connected to the engraving head 120 via the moving part 110, and is arranged in such a way that the engraving head 120 moves along the X-axis direction by sliding the moving part 110 on the rail 109.

於使用刻劃裝置100於基板10形成刻劃線之情形時,首先將安裝有刻劃輪1之保持具單元130安裝於刻劃頭120之支承部121。 When using the scribing device 100 to form scribing lines on the substrate 10, firstly, the holder unit 130 on which the scribing wheel 1 is mounted is mounted on the support portion 121 of the scribing head 120.

其次,刻劃裝置100藉由一對相機106進行基板10之定位。然後,刻劃裝置100使刻劃頭120移動至既定之位置,對刻劃輪1施加既定之荷重,使其與第1基板11之表面11a接觸。其後,刻劃裝置100使刻劃頭120沿X軸方向移動,藉此於第1基板10之表面11a形成第1刻劃線L1。再者,刻劃裝置100視需要轉動載置部105或將其沿Y軸方向移動,以與上述情形同樣之方式形成第1刻劃線L1。 Next, the scribing device 100 positions the substrate 10 by means of a pair of cameras 106. Then, the scribing device 100 moves the scribing head 120 to a predetermined position, applies a predetermined load to the scribing wheel 1, and makes it contact with the surface 11a of the first substrate 11. Thereafter, the scribing device 100 moves the scribing head 120 along the X-axis direction, thereby forming the first scribing line L1 on the surface 11a of the first substrate 10. Furthermore, the scribing device 100 rotates the carrier 105 or moves it along the Y-axis direction as needed, and forms the first scribing line L1 in the same manner as in the above case.

在第2基板12之表面12a形成第2刻劃線L2之情形時,藉由未圖示之反轉機構使基板10反轉,而使基板12之表面12a位於上方。於此狀態下,以與上述同樣之方式利用刻劃輪1於第2基板12之表面12a形成第2刻劃線L2。 When the second scribe line L2 is formed on the surface 12a of the second substrate 12, the substrate 10 is reversed by a reversing mechanism (not shown) so that the surface 12a of the substrate 12 is located at the top. In this state, the second scribe line L2 is formed on the surface 12a of the second substrate 12 using the scribing wheel 1 in the same manner as described above.

於上述實施形態中,示出了刻劃頭120沿X軸方向移動、載置部105沿Y軸方向移動並且旋轉之刻劃裝置100,但刻劃裝置100為刻劃頭120與載置部105相對移動者即可。例如,亦可為將刻劃頭120固定而載置部105沿X軸、Y軸方向移動且旋轉之刻劃裝置100。又,於此情形時,可將相機106固定於刻劃頭120。 In the above-mentioned embodiment, the scribing device 100 is shown in which the scribing head 120 moves along the X-axis direction and the carrier 105 moves and rotates along the Y-axis direction, but the scribing device 100 may be a device in which the scribing head 120 and the carrier 105 move relative to each other. For example, the scribing device 100 may be a device in which the scribing head 120 is fixed and the carrier 105 moves and rotates along the X-axis and Y-axis directions. In this case, the camera 106 may be fixed to the scribing head 120.

本實施形態之基板之分斷方法係由如下步驟構成:利用上述刻劃裝置100形成第1刻劃線L1及第2刻劃線L2後,使第2垂直裂紋C2沿第2刻劃線L2滲透至第2基板12中之步驟;及將基板10沿第1刻劃線L1及第2刻劃線L2分離之步驟。此處,下文將上述「使第2垂直裂紋C2沿第2刻劃線L2滲透至第2基板12中」之動作稱為「預裂斷」。再者,第1垂直裂紋C1及第2垂直裂紋C2係以圖3(b)、(c)圖示。 The substrate breaking method of this embodiment is composed of the following steps: after forming the first scribe line L1 and the second scribe line L2 using the above-mentioned scribing device 100, the second vertical crack C2 is made to penetrate into the second substrate 12 along the second scribe line L2; and the substrate 10 is separated along the first scribe line L1 and the second scribe line L2. Here, the above-mentioned action of "making the second vertical crack C2 penetrate into the second substrate 12 along the second scribe line L2" is referred to as "pre-breaking". Furthermore, the first vertical crack C1 and the second vertical crack C2 are illustrated in Figures 3(b) and (c).

圖2係表示基板10之分斷方法之流程圖。 FIG2 is a flow chart showing a method for cutting the substrate 10.

基板10之分斷係藉由如下步驟進行:於第1基板11形成第1刻劃線L1之步驟(S11);於第2基板12形成第2刻劃線L2之步驟(S12);對第2基板12進行預裂斷(S13);及將基板10沿第1刻劃線L1及第2刻劃線L2分離之步驟(S14)。其中,步驟S11、S12之形成刻劃線之步驟係利用上述刻劃裝置100進行。 The substrate 10 is divided by the following steps: forming the first scribe line L1 on the first substrate 11 (S11); forming the second scribe line L2 on the second substrate 12 (S12); pre-breaking the second substrate 12 (S13); and separating the substrate 10 along the first scribe line L1 and the second scribe line L2 (S14). The steps of forming scribe lines in steps S11 and S12 are performed using the above-mentioned dividing device 100.

其次,參照圖3(a)~(f)對圖2所示之基板之分斷方法,尤其是圖2之步驟S13、S14之步驟進行詳細說明。 Next, the method for separating the substrate shown in FIG. 2 , especially steps S13 and S14 of FIG. 2 , is described in detail with reference to FIG. 3 (a) to (f).

圖3(a)~(f)係示意性地表示基板10之分斷方法之過程之側視圖。圖3(a)係自Y軸負側觀察刻劃位置附近時之示意圖,圖3(b)~(f)係自X軸負側觀察基板10之刻劃位置附近時之示意圖。 Figures 3(a) to (f) are schematic side views of the process of the substrate 10 breaking method. Figure 3(a) is a schematic view when observing the vicinity of the engraving position from the negative side of the Y axis, and Figures 3(b) to (f) are schematic views when observing the vicinity of the engraving position of the substrate 10 from the negative side of the X axis.

圖3(a)~(c)表示形成刻劃線之步驟,此係藉由參照圖1說明之刻劃裝置100進行。圖3(d)表示對第2基板12進行預裂斷之步驟。圖3(e)、(f)表示將基板10分離之步驟。 Figures 3(a) to (c) show the steps of forming a scribe line, which is performed by the scribe device 100 described with reference to Figure 1. Figure 3(d) shows the step of pre-breaking the second substrate 12. Figures 3(e) and (f) show the step of separating the substrate 10.

又,基板10係將第1基板11與第2基板12經由密封材SL貼合而構成。作為此種基板10,例如可列舉於第1基板11形成有彩色濾光片(CF)、於第2基板12形成有薄膜電晶體(TFT)者。於此情形時,由密封材SL、第1基板11、及第2基板12形成液晶注入區域R,於該液晶注入區域R中注入液晶。 Furthermore, the substrate 10 is formed by bonding the first substrate 11 and the second substrate 12 via a sealing material SL. As such a substrate 10, for example, a color filter (CF) is formed on the first substrate 11 and a thin film transistor (TFT) is formed on the second substrate 12. In this case, a liquid crystal injection region R is formed by the sealing material SL, the first substrate 11, and the second substrate 12, and liquid crystal is injected into the liquid crystal injection region R.

密封材SL例如可使用由環氧樹脂等樹脂材料構成之接著劑。於密封材SL由紫外線硬化樹脂構成之情形時,在第2基板12之表面塗布有密封材SL之狀態下將第1基板11重疊於第2基板12之上表面,其後,照射紫外線。藉此,密封材SL硬化,第1基板11與第2基板12經由密封材SL而貼合。除此以外,密封材SL亦存在由熱硬化樹脂構成之情形。於此情形時,藉由加熱使得密封材SL硬化,第1基板11與第2基板12經由密封材SL而貼合。密封材SL若硬化,則具有較高之硬度。 The sealing material SL may be an adhesive made of a resin material such as an epoxy resin. When the sealing material SL is made of a UV-curing resin, the first substrate 11 is overlapped on the upper surface of the second substrate 12 while the sealing material SL is applied to the surface of the second substrate 12, and then irradiated with ultraviolet rays. As a result, the sealing material SL is cured, and the first substrate 11 and the second substrate 12 are bonded together via the sealing material SL. In addition, the sealing material SL may also be made of a thermosetting resin. In this case, the sealing material SL is cured by heating, and the first substrate 11 and the second substrate 12 are bonded together via the sealing material SL. If the sealing material SL is cured, it has a higher hardness.

如圖3(a)所示,一邊將刻劃輪1壓抵於第1基板11之表面11a,一邊使刻劃輪1沿X軸正方向移動,從而形成第1刻劃線L1。此時,刻劃輪1被壓抵於密封材SL之正上方之位置,而沿密封材SL於第1基板11之表面11a形成第1刻劃線L1。藉此,如圖3(b)所示,沿第1刻劃線L1於第1基板11形成第1垂直裂紋C1。該第1垂直裂紋C1朝向密封材SL滲透至第1基板11之內部。其滲透度為70~100%,為高滲透。再者,此步驟相當於圖2之步驟S11。 As shown in FIG3(a), the scribing wheel 1 is pressed against the surface 11a of the first substrate 11 while the scribing wheel 1 is moved along the positive direction of the X-axis to form the first scribing line L1. At this time, the scribing wheel 1 is pressed against the position directly above the sealing material SL, and the first scribing line L1 is formed along the sealing material SL on the surface 11a of the first substrate 11. Thus, as shown in FIG3(b), the first vertical crack C1 is formed on the first substrate 11 along the first scribing line L1. The first vertical crack C1 penetrates into the interior of the first substrate 11 toward the sealing material SL. Its penetration is 70~100%, which is high penetration. Furthermore, this step is equivalent to step S11 of FIG2.

其次,利用未圖示之反轉機構使基板10反轉,而使第2基板12之表面12a位於上方。於此狀態下,如圖3(a)所說明般,一邊將刻劃輪1壓抵於第2基板12之表面12a,一邊使刻劃輪1沿X軸正方向移動,從而形成第2刻劃線L2。藉此,如圖3(c)所示,沿第2刻劃線L2而於第2基板12形成第2垂直裂紋C2。該 第2垂直裂紋C2朝向密封材SL滲透至第2基板12之內部。第2基板12中之第2垂直裂紋C2之滲透情況遠低於第1基板11,滲透度為15~30%。再者,此步驟相當於圖2之步驟S12。 Next, the substrate 10 is reversed by a reversing mechanism (not shown) so that the surface 12a of the second substrate 12 is located at the top. In this state, as shown in FIG3(a), the scribing wheel 1 is pressed against the surface 12a of the second substrate 12 while the scribing wheel 1 is moved along the positive direction of the X axis, thereby forming the second scribing line L2. Thus, as shown in FIG3(c), a second vertical crack C2 is formed on the second substrate 12 along the second scribing line L2. The second vertical crack C2 penetrates into the interior of the second substrate 12 toward the sealing material SL. The penetration of the second vertical crack C2 in the second substrate 12 is much lower than that of the first substrate 11, and the penetration is 15-30%. Furthermore, this step is equivalent to step S12 in Figure 2.

其次,對第2基板12進行預裂斷。具體而言,再度將基板10反轉,如圖3(d)所示,使第1基板11之表面11a位於上方。然後,以覆蓋包含第1刻劃線L1之區域之方式,將固定於固定構件14之彈性構件13載置於第1基板11之表面11a。若藉由衝擊構件15對固定構件14賦予朝向第1基板11之力,則沿第2刻劃線L2形成之第2垂直裂紋C2朝向密封材SL滲透。於圖3(d)中,圈住之部分係藉由衝擊構件15所賦予之力而新滲透至第2基板12之內部之第2垂直裂紋C2。再者,此步驟相當於圖2之步驟S13。 Next, the second substrate 12 is pre-cracked. Specifically, the substrate 10 is turned over again, as shown in FIG3(d), so that the surface 11a of the first substrate 11 is located at the top. Then, the elastic member 13 fixed to the fixing member 14 is placed on the surface 11a of the first substrate 11 in a manner covering the area including the first scribe line L1. If a force toward the first substrate 11 is applied to the fixing member 14 by the impact member 15, the second vertical crack C2 formed along the second scribe line L2 penetrates toward the sealing material SL. In FIG3(d), the circled portion is the second vertical crack C2 that has newly penetrated into the interior of the second substrate 12 by the force applied by the impact member 15. Furthermore, this step is equivalent to step S13 in Figure 2.

上述彈性構件13例如為橡膠或樹脂。固定構件14係硬度高於彈性構件13之板狀之構件。衝擊構件15係使用重量較固定構件14更重之構件,以可自遠離固定構件14之位置向固定構件14移動,與固定構件14碰撞而對基板10施力。 The elastic member 13 is, for example, rubber or resin. The fixed member 14 is a plate-shaped member having a higher hardness than the elastic member 13. The impact member 15 is a member heavier than the fixed member 14, which can move from a position away from the fixed member 14 to the fixed member 14, collide with the fixed member 14 and apply force to the substrate 10.

又,於對第2基板12進行預裂斷時,基板10係載置於載置台上。於該載置台與基板10之間配置緩衝材。緩衝材例如係由紙或橡膠構成。 Furthermore, when the second substrate 12 is pre-cracked, the substrate 10 is placed on a mounting table. A buffer material is arranged between the mounting table and the substrate 10. The buffer material is made of, for example, paper or rubber.

對第2基板12進行預裂斷後,進行基板10之分離。具體而言,如圖3(e)所示,沿第1刻劃線L1及第2刻劃線L2,將基板10沿與第1基板11之表面11a平行之方向互相拉離。藉由拉離進行之分離可用手進行,亦可以機械方式進行。藉此,如圖3(f)所示,基板10之分離結束。再者,此步驟相當於步驟S14。由此,貼合基板10被分斷。 After the second substrate 12 is pre-cracked, the substrate 10 is separated. Specifically, as shown in FIG3(e), along the first scribe line L1 and the second scribe line L2, the substrates 10 are pulled apart from each other in a direction parallel to the surface 11a of the first substrate 11. The separation by pulling can be performed manually or mechanically. Thus, as shown in FIG3(f), the separation of the substrate 10 is completed. Furthermore, this step is equivalent to step S14. Thus, the bonded substrate 10 is separated.

<驗證> <Verification>

本申請案發明人等對使用上述構成之分斷方法之情形時之效果進行了驗證。以下,參照圖4(a)~圖5(d)對該驗證及驗證結果進行說明。 The inventors of this application have verified the effect of using the above-mentioned segmentation method. The verification and verification results are described below with reference to Figures 4(a) to 5(d).

於該驗證中,使用將第1基板41與第2基板42貼合而成之基板40, 對沿密封材F由第1基板41與第2基板42形成之刻劃線為曲線之情形進行了驗證。此時,於第1基板41及第2基板42之各者形成有圓形刻劃線及所謂之輔助線H。為了方便說明,將該圓形刻劃線稱為「製品線S」。 In this verification, a substrate 40 formed by bonding a first substrate 41 and a second substrate 42 was used, and the case where the scribe line formed by the first substrate 41 and the second substrate 42 along the sealing material F was a curved line was verified. At this time, a circular scribe line and a so-called auxiliary line H were formed on each of the first substrate 41 and the second substrate 42. For the convenience of explanation, the circular scribe line is referred to as a "product line S".

此處,所謂輔助線H係於沿對藉由基板40之分離所獲得之製品之形狀進行規定之製品線S將基板分斷時,為了沿該製品線S順利地分離第1基板41及第2基板42而於製品線S之外側形成之刻劃線。於分離閉合曲線狀之製品時,首先沿輔助線H將貼合基板40拉離而分離。由此自經分離之輔助線H誘導出延長之垂直裂紋,沿製品線S將第1基板41之第1垂直裂紋G1、及第2基板42之第2垂直裂紋G2分斷。由此,容易取出由閉合曲線狀之製品線S規定之製品。 Here, the so-called auxiliary line H is a scribing line formed outside the product line S in order to smoothly separate the first substrate 41 and the second substrate 42 along the product line S when the substrate is separated along the product line S that specifies the shape of the product obtained by separating the substrate 40. When separating the closed curved product, the bonded substrate 40 is first pulled apart along the auxiliary line H to separate. Thus, the extended vertical crack is induced from the separated auxiliary line H, and the first vertical crack G1 of the first substrate 41 and the second vertical crack G2 of the second substrate 42 are separated along the product line S. Thus, the product specified by the closed curved product line S is easily taken out.

再者,此處將形成於第1基板41之輔助線及形成於第2基板42之輔助線均稱為「輔助線H」。「製品線S」亦為同樣。 Furthermore, the auxiliary line formed on the first substrate 41 and the auxiliary line formed on the second substrate 42 are both referred to as "auxiliary line H". The same is true for "product line S".

[驗證1] [Verification 1]

[條件] [condition]

於下述條件下利用刻劃輪於貼合基板之表面形成刻劃線。 A scribing wheel is used to form scribing lines on the surface of the bonded substrate under the following conditions.

‧貼合基板...第1基板0.2mm 第2基板0.2mm ‧Bonding substrates...1st substrate 0.2mm 2nd substrate 0.2mm

‧刻劃線(製品線)之形狀...圓形 ‧Shape of the engraved line (product line)...circular

‧密封材...協立化學產業股份有限公司製造之WORLD ROCK 723K1 ‧Sealing material...WORLD ROCK 723K1 manufactured by Xieli Chemical Industry Co., Ltd.

厚度10μm Thickness 10μm

‧行進荷重...0.06MPa ‧Travel load...0.06MPa

‧行進速度...30mm/sec ‧Travel speed...30mm/sec

‧刻劃輪...直徑2.0mm,刀尖之角115度 ‧Scribing wheel...diameter 2.0mm, blade tip angle 115 degrees

槽數360,槽深度3μm Number of grooves: 360, groove depth: 3μm

‧彈性構件...材質 橡膠 ‧Elastic components...Material: rubber

‧板構件...重量45g,尺寸50×50mm ‧Plate components...weight 45g, size 50×50mm

‧錘...重量441g,直徑48mm ‧Hammer...weight 441g, diameter 48mm

上述貼合基板40(下文簡稱為基板40)係於第1基板41之表面41a及第2基板42之表面42a分別形成製品線S。然後,如圖4(a)、(b)所示,沿製品線S載置貼附於板構件43之彈性構件44。於此狀態下,藉由自上方使錘45落下,而對第2基板42進行預裂斷。其後,由作業者之手沿製品線S將基板40分離。 The above-mentioned bonded substrate 40 (hereinafter referred to as substrate 40) forms product lines S on the surface 41a of the first substrate 41 and the surface 42a of the second substrate 42. Then, as shown in Figures 4 (a) and (b), the elastic member 44 attached to the plate member 43 is placed along the product line S. In this state, the second substrate 42 is pre-cracked by dropping a hammer 45 from above. Thereafter, the substrate 40 is separated along the product line S by the operator's hand.

再者,於本驗證中,上述條件中之板構件43、彈性構件44、及錘45分別相當於參照上述圖3(d)所說明之固定構件14、彈性構件13、及衝擊構件15。 Furthermore, in this verification, the plate member 43, the elastic member 44, and the hammer 45 in the above conditions are respectively equivalent to the fixed member 14, the elastic member 13, and the impact member 15 described with reference to the above FIG. 3(d).

又,於驗證1中,使用形成有如圖4(c)所示之製品線S與輔助線H之第1基板41及第2基板42。進而,如圖4(d)之虛線所示,關於製品線S之Y軸正側之半圓、及與製品線S之切線相接之Y軸正側之輔助線H,對是否可進行基板40之分離進行評價。將圖4(d)之虛線部分別稱為評價對象製品線S1及評價對象輔助線H1。 In verification 1, the first substrate 41 and the second substrate 42 formed with the product line S and the auxiliary line H as shown in FIG4(c) are used. Furthermore, as shown by the dotted line in FIG4(d), the semicircle on the positive side of the Y axis of the product line S and the auxiliary line H on the positive side of the Y axis connected to the tangent of the product line S are evaluated to see whether the substrate 40 can be separated. The dotted line parts in FIG4(d) are respectively referred to as the evaluation object product line S1 and the evaluation object auxiliary line H1.

又,於驗證1中,板構件43係使用不透明者。進而,於驗證1中,如圖4(e)所示,彈性構件44僅載置於製品線S,不載置於輔助線H。再者,於圖4(e)中,彈性構件44係以一點鏈線表示。 In Verification 1, the plate member 43 is an opaque one. Furthermore, in Verification 1, as shown in FIG4(e), the elastic member 44 is only placed on the product line S, and not on the auxiliary line H. Furthermore, in FIG4(e), the elastic member 44 is represented by a one-point chain line.

於此狀態下,使錘45自既定之高度落下至板構件43之表面,對第2基板42進行預裂斷。又,此時,於第2基板42下重疊鋪置8張厚度約0.07mm之無塵紙作為緩衝材,自距板構件43之表面20mm之高度使錘45落下。 In this state, the hammer 45 is dropped from a predetermined height to the surface of the plate member 43 to pre-crack the second substrate 42. At this time, 8 sheets of dust-free paper with a thickness of about 0.07 mm are stacked under the second substrate 42 as a buffer material, and the hammer 45 is dropped from a height of 20 mm from the surface of the plate member 43.

然後,對第2基板42進行預裂斷後,沿製品線S將基板40分離。 Then, after pre-breaking the second substrate 42, the substrate 40 is separated along the product line S.

[驗證1之結果] [Results of Verification 1]

第2基板42之預裂斷後,基板40未沿圖4(d)之評價對象製品線S1分離,但沿輔助線H分離後,可實現製品線S之分離。於此情形時,第2基板42之預裂斷後,可將基板40容易地分離。 After the second substrate 42 is pre-cracked, the substrate 40 is not separated along the evaluation object product line S1 in Figure 4 (d), but after separation along the auxiliary line H, the separation of the product line S can be achieved. In this case, after the second substrate 42 is pre-cracked, the substrate 40 can be easily separated.

[驗證2] [Verification 2]

[條件] [condition]

於驗證2中,將板構件43設為透明者。又,如圖5(a)所示,使輔助線H之形狀不同於驗證1。於此情形時,以圖5(b)之虛線部分作為評價對象製品線S1及評價對象輔助線H1。 In Verification 2, the plate member 43 is set to be transparent. Also, as shown in FIG5(a), the shape of the auxiliary line H is different from that in Verification 1. In this case, the dotted line portion of FIG5(b) is used as the evaluation object product line S1 and the evaluation object auxiliary line H1.

驗證2亦與驗證1同樣地,彈性構件44僅載置於製品線S,不載置於輔助線H(參照圖4(e))。其他條件與驗證1相同。 Verification 2 is the same as Verification 1. The elastic member 44 is only placed on the product line S and not on the auxiliary line H (see Figure 4(e)). Other conditions are the same as Verification 1.

於此狀態下,藉由使錘45自既定之高度落下至第1基板41之表面41a,而對第2基板42進行預裂斷。此時,於第2基板42下重疊8張厚度約0.07mm之無塵紙作為緩衝材,自距第1基板41之表面41a為50mm、40mm、30mm、20mm之各高度使錘45落下。 In this state, the second substrate 42 is pre-cracked by dropping the hammer 45 from a predetermined height to the surface 41a of the first substrate 41. At this time, 8 sheets of dust-free paper with a thickness of about 0.07 mm are stacked under the second substrate 42 as a buffer material, and the hammer 45 is dropped from the heights of 50 mm, 40 mm, 30 mm, and 20 mm from the surface 41a of the first substrate 41.

然後,對第2基板42進行預裂斷後,將基板40沿製品線S分離。 Then, after pre-breaking the second substrate 42, the substrate 40 is separated along the product line S.

[驗證2之結果] [Results of Verification 2]

自任何高度使錘45落下而對第2基板42進行預裂斷,基板40均未沿圖5(b)之評價對象製品線S1分離。於此情形時,將第2基板42預裂斷後,將評價對象輔助線H1分離,繼而沿評價對象製品線S1進行基板40之分離,藉此可將基板40分離。 When the hammer 45 is dropped from any height to pre-crack the second substrate 42, the substrate 40 is not separated along the evaluation object product line S1 in FIG. 5(b). In this case, after the second substrate 42 is pre-cracked, the evaluation object auxiliary line H1 is separated, and then the substrate 40 is separated along the evaluation object product line S1, thereby separating the substrate 40.

又,任何情形均未產生沿評價對象輔助線H1及評價對象製品線S1形成之垂直裂紋以外之裂紋。 Furthermore, no cracks other than vertical cracks formed along the evaluation object auxiliary line H1 and the evaluation object product line S1 were generated in any case.

[驗證3] [Verification 3]

[條件] [condition]

驗證1及驗證2中係將彈性構件44僅載置於製品線S。於驗證3中,於輔助線H亦載置彈性構件44。即,對製品線S與輔助線H進行預裂斷。 In Verification 1 and Verification 2, the elastic member 44 is placed only on the product line S. In Verification 3, the elastic member 44 is also placed on the auxiliary line H. That is, the product line S and the auxiliary line H are pre-broken.

於此情形時,輔助線H之形狀如圖5(a)所示,為與驗證2相同之 輔助線H,如圖5(c)所示,將彈性構件44載置於製品線S及輔助線H。其他條件與驗證1相同。即,板構件43係使用不透明者。又,圖5(c)與圖4(e)同樣,彈性構件44係以一點鏈線表示。 In this case, the shape of the auxiliary line H is shown in FIG5(a), which is the same as that of Verification 2. As shown in FIG5(c), the elastic member 44 is placed on the product line S and the auxiliary line H. Other conditions are the same as those of Verification 1. That is, the plate member 43 is an opaque one. In addition, FIG5(c) is the same as FIG4(e), and the elastic member 44 is represented by a one-point chain line.

於此狀態下,藉由使錘45自既定之高度落下至板構件43之表面,對第2基板42進行預裂斷。此時,於第2基板42下重疊8張厚度約0.07mm之無塵紙作為緩衝材,自距板構件43之表面20mm、15mm、10mm、5mm之各高度使錘45落下。 In this state, the second substrate 42 is pre-cracked by dropping the hammer 45 from a predetermined height to the surface of the plate member 43. At this time, 8 sheets of dust-free paper with a thickness of about 0.07 mm are stacked under the second substrate 42 as a buffer material, and the hammer 45 is dropped from the surface of the plate member 43 at heights of 20 mm, 15 mm, 10 mm, and 5 mm.

然後,對第2基板42進行預裂斷後,將基板40沿製品線S分離。 Then, after pre-breaking the second substrate 42, the substrate 40 is separated along the product line S.

[驗證3之結果] [Results of Verification 3]

自任何高度使錘45落下進行預裂斷,均產生自基板40之評價對象輔助線H之一部分偏離之裂紋。此種裂紋無助於基板40之分斷,於基板40之分斷時有使製品部分產生龜裂或破損之虞,因此並非較佳之裂紋。 When the hammer 45 is dropped from any height for pre-breaking, a crack that deviates from a part of the evaluation object auxiliary line H of the substrate 40 is generated. This kind of crack does not help the breaking of the substrate 40, and there is a risk of causing partial cracking or damage to the product when the substrate 40 is broken, so it is not a preferred crack.

[驗證4] [Verification 4]

[條件] [condition]

於驗證4中,僅於輔助線H載置彈性構件44。即,僅對輔助線H進行預裂斷。 In Verification 4, the elastic member 44 is placed only on the auxiliary line H. That is, only the auxiliary line H is pre-fractured.

於此情形時,輔助線H之形狀如圖5(a)所示,為與驗證2相同之輔助線H,如圖5(d)所示,僅於輔助線H載置彈性構件44。其他條件與驗證1相同。但板構件43使用透明者。 In this case, the shape of the auxiliary line H is shown in FIG5(a), which is the same as the auxiliary line H in Verification 2. As shown in FIG5(d), only the elastic member 44 is placed on the auxiliary line H. Other conditions are the same as those in Verification 1. However, a transparent plate member 43 is used.

於此狀態下,於第2基板42下重疊8張厚度約0.07mm之無塵紙作為緩衝材,自距板構件43之表面5mm之高度使錘45落下。 In this state, 8 sheets of dust-free paper with a thickness of about 0.07 mm are stacked under the second substrate 42 as a buffer material, and the hammer 45 is dropped from a height of 5 mm from the surface of the plate member 43.

對第2基板42進行預裂斷後,將基板40沿製品線S分離。 After pre-breaking the second substrate 42, the substrate 40 is separated along the product line S.

[驗證4之結果] [Results of Verification 4]

自評價對象輔助線H1向製品內部產生裂紋,無法進行基板40之分離。 The auxiliary line H1 of the self-evaluation object produced cracks inside the product, and the substrate 40 could not be separated.

[驗證5] [Verification 5]

為了提高預裂斷之精度、即第2基板42中第2垂直裂紋G2之滲透,而進行如以下之驗證。 In order to improve the accuracy of pre-fracture, that is, the penetration of the second vertical crack G2 in the second substrate 42, the following verification is performed.

以感壓紙取代基板40載置於載置台,於感壓紙上載置彈性構件及板構件。此時,使用與驗證2相同之透明之板構件43及彈性構件44。然後,自距板構件43之表面30mm、20mm、10mm之高度使錘45落下。此時,將具有較錘45之直徑大一些之直徑之筒狀且空腔之構件(未圖示)置於板構件43上,使用該筒狀之構件作為錘45之導件。即,使彈性構件之中心與導件之中心一致而配置導件,使錘45於被固定之導件之筒狀構件之內部落下,使錘45與板構件43碰撞。由此將彈性構件44之形狀轉印至感壓紙。 Substrate 40 is replaced with pressure-sensitive paper and placed on the mounting table, and an elastic member and a plate member are placed on the pressure-sensitive paper. At this time, the transparent plate member 43 and elastic member 44 are used as in Verification 2. Then, hammer 45 is dropped from a height of 30 mm, 20 mm, and 10 mm from the surface of plate member 43. At this time, a cylindrical and hollow member (not shown) having a diameter larger than that of hammer 45 is placed on plate member 43, and the cylindrical member is used as a guide for hammer 45. That is, the guide is arranged so that the center of the elastic member is consistent with the center of the guide, and hammer 45 is dropped inside the cylindrical member of the fixed guide, so that hammer 45 collides with plate member 43. Thus, the shape of the elastic member 44 is transferred to the pressure-sensitive paper.

[驗證5之結果] [Results of Verification 5]

於自高度10mm使錘45落下之情形時,轉印至感壓紙之彈性構件44之痕跡不均勻。由此認為,於自高度10mm使錘45落下之情形時,就算使用導件,自彈性構件44施加至基板40之衝擊亦不均勻。 When the hammer 45 is dropped from a height of 10 mm, the trace of the elastic member 44 transferred to the pressure-sensitive paper is uneven. Therefore, it is believed that when the hammer 45 is dropped from a height of 10 mm, even if a guide is used, the impact applied from the elastic member 44 to the substrate 40 is uneven.

於自高度20mm、30mm使錘45落下之情形時,均勻地形成轉印至感壓紙之彈性構件44之痕跡。認為其原因在於:藉由導件可使錘45確實地與彈性構件44之中心接觸,而可自彈性構件向基板均勻地施加衝擊。 When the hammer 45 is dropped from a height of 20 mm or 30 mm, the trace of the elastic member 44 transferred to the pressure-sensitive paper is formed uniformly. The reason is believed to be that the hammer 45 can be reliably contacted with the center of the elastic member 44 by the guide, and the impact can be uniformly applied from the elastic member to the substrate.

[驗證6] [Verification 6]

於與驗證1相同之條件下,於第1基板41之表面41a及第2基板42之表面形成製品線S。其後,並不如驗證1~4般對第2基板42進行預裂斷,而進行基板40之分離。 Under the same conditions as Verification 1, a product line S is formed on the surface 41a of the first substrate 41 and the surface of the second substrate 42. Afterwards, the second substrate 42 is not pre-cracked as in Verifications 1 to 4, but the substrate 40 is separated.

[驗證6之結果] [Results of Verification 6]

於評價對象輔助線H1與第1基板41之邊界線處產生被稱為角之殘餘或於製品線之內側產生裂紋而發生基板被破壞等缺陷,而難以將基板40分離。 A defect called a corner residue is generated at the boundary between the evaluation object auxiliary line H1 and the first substrate 41, or a crack is generated on the inner side of the product line, resulting in the substrate being damaged, and it is difficult to separate the substrate 40.

[驗證之彙總] [Summary of verification]

根據對第2基板42進行預裂斷後進行基板40之分離之驗證1及驗證2、與不對第2基板42進行預裂斷而進行基板40之分離之驗證6的結果,可確認於貼合基板40中,若對第2基板42進行預裂斷,則可沿輔助線H及製品線S將基板40分離。 Based on the results of verification 1 and verification 2 of separating the substrate 40 after pre-breaking the second substrate 42, and verification 6 of separating the substrate 40 without pre-breaking the second substrate 42, it can be confirmed that in the bonded substrate 40, if the second substrate 42 is pre-broken, the substrate 40 can be separated along the auxiliary line H and the product line S.

若將僅對製品線S進行預裂斷之驗證1及驗證2與亦對輔助線H進行預裂斷之驗證3加以比較,則於驗證3中,於基板40之分離時,基板40產生裂紋。由此可確認,適當為不對輔助線H進行預裂斷,而僅對製品線S進行預裂斷。 If we compare Verification 1 and Verification 2, which only pre-cracked the product line S, with Verification 3, which also pre-cracked the auxiliary line H, we can see that in Verification 3, cracks occurred in the substrate 40 when the substrate 40 was separated. This confirms that it is appropriate not to pre-crack the auxiliary line H, but to pre-crack only the product line S.

若將僅對製品線S進行預裂斷之驗證1及驗證2與僅對輔助線H進行預裂斷之驗證4加以比較,則於驗證4中,製品線S之內部亦產生裂紋而無法分離。由此可確認,適當為不對輔助線H進行預裂斷,而僅對製品線S進行預裂斷。 If we compare Verification 1 and Verification 2, which only pre-cracked the product line S, with Verification 4, which only pre-cracked the auxiliary line H, we can see that in Verification 4, cracks also occurred inside the product line S and could not be separated. This confirms that it is appropriate not to pre-crack the auxiliary line H, but to pre-crack only the product line S.

於驗證1與驗證2中,使輔助線H之形狀不同而進行驗證,但兩者均對第2基板42進行預裂斷後,可將基板40分離。因此認為,輔助線H之形狀之不同不太會影響預裂斷。 In Verification 1 and Verification 2, the shapes of the auxiliary line H are different for verification, but in both cases, the substrate 40 can be separated after the second substrate 42 is pre-cracked. Therefore, it is believed that the difference in the shape of the auxiliary line H will not affect the pre-crack much.

若將驗證1與驗證2之結果加以比較,則使用透明之板構件43之驗證2可容易地進行基板40之分離。認為其原因在於:於製品線S上載置彈性構件44時,由於板構件43透明,因此可一邊確認製品線S之位置一邊載置彈性構件44。由此推測,於預裂斷時,若於包含製品線S之區域確實地載置彈性構件44,則可良好地進行預裂斷,而可容易地將基板40分離。 If the results of verification 1 and verification 2 are compared, verification 2 using the transparent plate member 43 can easily separate the substrate 40. The reason is believed to be that when the elastic member 44 is placed on the product line S, the plate member 43 is transparent, so the elastic member 44 can be placed while confirming the position of the product line S. It is inferred that during pre-breaking, if the elastic member 44 is surely placed in the area including the product line S, the pre-breaking can be performed well, and the substrate 40 can be easily separated.

根據驗證5之結果可確認,於使錘45落下時,若使用導件構件(筒狀之構件),則可使錘45確實地與包含製品線S之區域之中央碰撞。據此認為,藉由導件可提高錘45之碰撞位置之再現性,又,可對基板40均勻地施力,因此第2垂直裂紋G2容易沿著製品線S滲透至第2基板42。 According to the results of Verification 5, it can be confirmed that when the hammer 45 is dropped, if a guide member (a cylindrical member) is used, the hammer 45 can reliably collide with the center of the area including the product line S. Based on this, it is believed that the guide can improve the reproducibility of the collision position of the hammer 45, and can evenly apply force to the substrate 40, so that the second vertical crack G2 can easily penetrate along the product line S to the second substrate 42.

<實施形態之效果> <Effects of implementation form>

於第1基板11與第2基板12經由密封材SL貼合而成之基板10中,存在後形成刻劃線之基板之第2垂直裂紋C2之滲透較低之情形。於此種狀態下,於對基板10 施加既定之力進行裂斷步驟之情形時,有基板10之截面產生龜裂或破損之虞。 In the substrate 10 formed by bonding the first substrate 11 and the second substrate 12 via the sealing material SL, there is a situation where the penetration of the second vertical crack C2 of the substrate where the scribe line is formed later is low. In this state, when a predetermined force is applied to the substrate 10 to perform the cracking step, there is a risk that the cross section of the substrate 10 will crack or be damaged.

於此方面,如圖2、及圖3(a)~(e)所示,於上述構成中,於第1基板11之表面11a形成第1刻劃線L1,於第2基板12之表面12a形成第2刻劃線L2後,對第2基板12進行預裂斷。藉此,可使第2基板12產生之第2垂直裂紋C2朝向密封材SL滲透。藉此,第2基板12成為容易沿第2刻劃線L2被分離之狀態。藉此,可沿第1刻劃線L1及第2刻劃線L2將基板10容易地分離。 In this regard, as shown in FIG. 2 and FIG. 3 (a) to (e), in the above-mentioned structure, after forming the first scribe line L1 on the surface 11a of the first substrate 11 and forming the second scribe line L2 on the surface 12a of the second substrate 12, the second substrate 12 is pre-cracked. Thereby, the second vertical crack C2 generated in the second substrate 12 can penetrate toward the sealing material SL. Thereby, the second substrate 12 becomes a state that can be easily separated along the second scribe line L2. Thereby, the substrate 10 can be easily separated along the first scribe line L1 and the second scribe line L2.

又,於以上述方式對第2基板12進行預裂斷之情形時,起初於第2基板12產生之第2垂直裂紋C2藉由沿厚度方向伸展而成為更深之垂直裂紋,藉此可將基板10分離。由此,於分離基板10時,無需擔心基板10會產生龜裂或破損。因此,不會降低基板10之強度,可精加工為高品質之製品。 Furthermore, when the second substrate 12 is pre-cracked in the above manner, the second vertical crack C2 initially generated in the second substrate 12 is extended along the thickness direction to become a deeper vertical crack, thereby separating the substrate 10. Therefore, when separating the substrate 10, there is no need to worry about cracking or damage of the substrate 10. Therefore, the strength of the substrate 10 will not be reduced, and it can be processed into a high-quality product.

又,如圖3(f)所示,於將基板10分離時,將由第1刻劃線L1及第2刻劃線L2分隔之基板10之區域沿與第1基板11之表面11a平行之方向互相拉離。藉此,不存在分離之截面互相接觸之情況,分斷後之基板10之表面之端部不易產生缺損或破裂。由此,不會降低基板10之強度,可精加工為高品質之製品。 Furthermore, as shown in FIG3(f), when the substrate 10 is separated, the regions of the substrate 10 separated by the first scribe line L1 and the second scribe line L2 are pulled apart from each other in a direction parallel to the surface 11a of the first substrate 11. Thus, there is no situation where the separated cross sections touch each other, and the ends of the surface of the separated substrate 10 are not prone to defects or cracks. Thus, the strength of the substrate 10 is not reduced, and it can be processed into a high-quality product.

又,即使於第1刻劃線L1及第2刻劃線L2包含曲線之情形時,亦可沿第1刻劃線L1及第2刻劃線L2將基板10順利地分離。 Furthermore, even when the first scribe line L1 and the second scribe line L2 include curves, the substrate 10 can be separated smoothly along the first scribe line L1 and the second scribe line L2.

如圖3(d)所示,於對第2基板12進行預裂斷時,使彈性構件13與沿第1刻劃線L1之區域密接。藉此,可利用衝擊構件15對該區域之全部範圍一律賦予按壓力。並且,可對形成於第2基板12之表面12a之第2刻劃線L2均勻地施力。由此,最初沿第2刻劃線L2產生之第2垂直裂紋C2容易滲透至第2基板12。藉此,可沿第1刻劃線L1及第2刻劃線L2將基板10容易地分離。 As shown in FIG3(d), when the second substrate 12 is pre-cracked, the elastic member 13 is brought into close contact with the area along the first scribe line L1. Thus, the impact member 15 can be used to uniformly apply pressure to the entire range of the area. In addition, force can be uniformly applied to the second scribe line L2 formed on the surface 12a of the second substrate 12. Thus, the second vertical crack C2 initially generated along the second scribe line L2 can easily penetrate into the second substrate 12. Thus, the substrate 10 can be easily separated along the first scribe line L1 and the second scribe line L2.

又,彈性構件13被固定於固定構件14。因此,可自固定構件14對彈性構件13全面地施力,從而彈性構件13均勻地密接於沿第1刻劃線L1之整個區域。藉此,可對沿第1刻劃線L1之區域之全部範圍均勻地賦予按壓力,而對形成 於第2基板12之表面之第2刻劃線L2確實且均勻地施力。由此,沿第2刻劃線L2產生之第2垂直裂紋C2更容易地滲透至第2基板12。藉此,可沿第1刻劃線L1及第2刻劃線L2將基板10容易地分離。 Furthermore, the elastic member 13 is fixed to the fixed member 14. Therefore, the elastic member 13 can be fully applied from the fixed member 14, so that the elastic member 13 is uniformly and closely attached to the entire area along the first scribe line L1. Thereby, the entire range of the area along the first scribe line L1 can be uniformly applied with pressure, and the second scribe line L2 formed on the surface of the second substrate 12 can be reliably and uniformly applied. As a result, the second vertical crack C2 generated along the second scribe line L2 can more easily penetrate into the second substrate 12. Thereby, the substrate 10 can be easily separated along the first scribe line L1 and the second scribe line L2.

再者,於上述實施形態中,如圖3(c)所示,於第1基板11之表面11a形成第1刻劃線L1後,將基板10反轉,而於第2基板12之表面12a形成第2刻劃線L2,但不限於此。例如,亦可以如下方式構成:準備2個刻劃輪1,一邊利用其中一個刻劃輪1於第1基板11之表面11a形成第1刻劃線L1,一邊利用另一刻劃輪1於第2基板12之表面12a形成第2刻劃線L2。即,亦可為如同時並行形成第1刻劃線L1與第2刻劃線L2之構成。 Furthermore, in the above-mentioned embodiment, as shown in FIG. 3(c), after forming the first scribe line L1 on the surface 11a of the first substrate 11, the substrate 10 is reversed to form the second scribe line L2 on the surface 12a of the second substrate 12, but the present invention is not limited thereto. For example, the following configuration may be adopted: two scribing wheels 1 are prepared, one of the scribing wheels 1 is used to form the first scribe line L1 on the surface 11a of the first substrate 11, and the other scribing wheel 1 is used to form the second scribe line L2 on the surface 12a of the second substrate 12. That is, the first scribe line L1 and the second scribe line L2 may be formed simultaneously and in parallel.

於此情形時,若較第1基板11側之刻劃輪1落後既定距離移送第2基板12側之刻劃輪1,則亦為於第1基板11之表面11a形成第1刻劃線L1後於第2基板12之表面12a形成第2刻劃線L2,因此第2基板12產生之第2垂直裂紋C2之滲透有可能變淺。因此,於此情形時,亦如上述實施形態般,藉由對第2基板12進行預裂斷,而可沿第1刻劃線L1及第2刻劃線L2將基板10容易且良好地分離。 In this case, if the scribing wheel 1 on the second substrate 12 side is transferred behind the scribing wheel 1 on the first substrate 11 side by a predetermined distance, the second scribing line L2 is formed on the surface 12a of the second substrate 12 after the first scribing line L1 is formed on the surface 11a of the first substrate 11, so the penetration of the second vertical crack C2 generated in the second substrate 12 may become shallow. Therefore, in this case, by pre-crack the second substrate 12 as in the above-mentioned embodiment, the substrate 10 can be easily and well separated along the first scribing line L1 and the second scribing line L2.

又,第1刻劃線L1及第2刻劃線L2可僅由直線構成,亦可於其一部分包含曲線。又,由第1刻劃線L1及第2刻劃線L2構成之製品形狀之一部分可於製品側包含凹陷之凹部。 Furthermore, the first scribe line L1 and the second scribe line L2 may be composed of only straight lines, or may include a curved line in part thereof. Furthermore, a part of the product shape formed by the first scribe line L1 and the second scribe line L2 may include a concave portion on the product side.

此外,本發明之實施形態可於申請專利範圍中所示之技術思想之範圍內適當進行各種變更。 In addition, the implementation form of the present invention can be appropriately modified in various ways within the scope of the technical concept shown in the scope of the patent application.

1:刻劃輪 1: Grating wheel

10:基板 10: Substrate

11:第1基板 11: 1st substrate

11a:第1基板之表面 11a: Surface of the first substrate

12:第2基板 12: Second substrate

12a:第2基板之表面 12a: Surface of the second substrate

13:彈性構件 13: Elastic components

14:固定構件(板構件) 14: Fixed components (plate components)

15:衝擊構件 15: Impact components

C1:第1垂直裂紋 C1: 1st vertical crack

C2:第2垂直裂紋 C2: Second vertical crack

L1:第1刻劃線 L1: 1st scale line

L2:第2刻劃線 L2: 2nd scale line

R:液晶注入區域 R: Liquid crystal injection area

SL:密封材 SL: Sealing material

Claims (5)

一種分斷方法,其係將由第1基板與第2基板藉由密封材貼合而成之基板分斷,其特徵在於,包含:一邊將刻劃輪壓抵於上述第1基板之表面之與上述密封材相對向之位置、一邊使上述刻劃輪移動,而於上述第1基板之表面形成第1刻劃線之步驟;一邊將刻劃輪壓抵於上述第2基板之表面之與上述密封材相對向之位置、一邊使上述刻劃輪移動,而於上述第2基板之表面形成第2刻劃線之步驟;按壓包含形成於上述第1基板之表面之上述第1刻劃線之區域,使垂直裂紋沿上述第2刻劃線滲透至上述第2基板之步驟;及將由上述第1刻劃線及上述第2刻劃線分隔之上述基板之區域沿平行於上述基板之表面之方向互相拉離,藉此沿上述第1刻劃線及上述第2刻劃線將上述基板分離之步驟;沿上述第1刻劃線形成之第1垂直裂紋的滲透度為70~100%;形成上述第2刻劃線之步驟,係在形成上述第1刻劃線之步驟之後進行;沿上述第2刻劃線形成之第2垂直裂紋的滲透度低於上述第1刻劃線之垂直裂紋的滲透度。 A method for separating substrates formed by bonding a first substrate and a second substrate by a sealing material, wherein the method comprises: pressing a scribing wheel against a position of the surface of the first substrate opposite to the sealing material, while moving the scribing wheel, to form a first scribing line on the surface of the first substrate; pressing the scribing wheel against a position of the surface of the second substrate opposite to the sealing material, while moving the scribing wheel, to form a second scribing line on the surface of the second substrate; pressing an area including the first scribing line formed on the surface of the first substrate, so that the scribing wheel is pressed against the surface of the second substrate, and the scribing wheel is pressed against the surface of the second substrate. The step of vertical cracks penetrating into the second substrate along the second scribe line; and the step of separating the substrate along the first scribe line and the second scribe line by pulling the regions of the substrate separated by the first scribe line and the second scribe line away from each other in a direction parallel to the surface of the substrate; the first vertical crack formed along the first scribe line has a penetration of 70-100%; the step of forming the second scribe line is performed after the step of forming the first scribe line; the penetration of the second vertical crack formed along the second scribe line is lower than the penetration of the vertical crack of the first scribe line. 如請求項1之分斷方法,其中,上述第1刻劃線及上述第2刻劃線為包含曲線之刻劃線。 The segmentation method of claim 1, wherein the first scale line and the second scale line are scale lines including curves. 如請求項1或2之分斷方法,其中,於使垂直裂紋滲透至上述第2基板之步驟中,使彈性構件密接於上述第1刻劃線,而對包含上述第1刻劃線之區域進行按壓。 A breaking method as claimed in claim 1 or 2, wherein in the step of causing the vertical crack to penetrate into the second substrate, the elastic member is brought into close contact with the first scribe line, and the area including the first scribe line is pressed. 如請求項3之分斷方法,其中,對用以固定上述彈性構件之固定構件施力,而對包含上述第1刻劃線之區域進行按壓。 A separation method as claimed in claim 3, wherein a force is applied to a fixing member for fixing the elastic member, and the area including the first scoring line is pressed. 一種裂斷方法,其係沿形成於第1基板之與密封材相對向之位置之第1刻劃線與於上述第1刻劃線之後形成於第2基板之與上述密封材相對向之位置之第2刻劃線將由上述第1基板與上述第2基板藉由上述密封材貼合而成之基板裂斷,其特徵在於,包含:對包含上述第1刻劃線之區域進行按壓,而使垂直裂紋沿上述第2刻劃線滲透至上述第2基板之步驟;及將由上述第1刻劃線及上述第2刻劃線分隔之上述基板之區域沿平行於上述基板之表面之方向互相拉離,藉此沿上述第1刻劃線及上述第2刻劃線將上述基板分離之步驟;沿上述第1刻劃線形成之第1垂直裂紋的滲透度為70~100%;形成上述第2刻劃線之步驟,係在形成上述第1刻劃線之步驟之後進行;沿上述第2刻劃線形成之第2垂直裂紋的滲透度低於上述第1刻劃線之垂直裂紋的滲透度。A cleavage method is to cleave a substrate formed by laminating the first substrate and the second substrate via the sealing material along a first scribe line formed on the first substrate at a position opposite to the sealing material and a second scribe line formed on the second substrate after the first scribe line at a position opposite to the sealing material, wherein the method comprises: pressing an area including the first scribe line to allow a vertical crack to penetrate along the second scribe line to the second substrate; and and the regions of the substrate separated by the second scribe line are pulled apart from each other in a direction parallel to the surface of the substrate, thereby separating the substrate along the first scribe line and the second scribe line; the permeability of the first vertical crack formed along the first scribe line is 70-100%; the step of forming the second scribe line is performed after the step of forming the first scribe line; the permeability of the second vertical crack formed along the second scribe line is lower than the permeability of the vertical crack of the first scribe line.
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