TWI728663B - Operating device and operating equipment using the same - Google Patents
Operating device and operating equipment using the same Download PDFInfo
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Abstract
Description
本發明係提供一種校正電子元件之作業裝置。 The present invention provides a working device for calibrating electronic components.
在現今,電子元件日趨精密輕巧,自動化作業設備係以移料器將電子元件移載至作業裝置之承置器,以便相關裝置於承置器取出電子元件,或於承置器上執行電子元件預設作業,承置器可為料盤、測試座或載台等;請參閱第1圖,承置器11係設有容置槽111,以供容置電子元件12,然為避免移料器(圖未示出)將電子元件12移入承置器11之容置槽111時發生碰撞而受損;業者係於承置器11設置尺寸較大之容置槽111,由於容置槽111與電子元件12之間不具有精密公差,使得移料器可易於將電子元件12移入容置槽111;惟此一方式雖可防止電子元件12碰撞受損,但容置槽111與電子元件12間具有較大之間隙,導致電子元件12會於容置槽111內任意漂移,使電子元件12之中心位置與容置槽111之中心位置具有偏移誤差,以致一接合器(圖未示出)之吸嘴於承置器11之容置槽111內取出偏移擺置之電子元件12後,卻無法準確將電子元件12移入測試座(圖未示出),致使電子元件12之接點無法準確電性接觸測試座之探針,進而影響測試品質。
Nowadays, electronic components are becoming more sophisticated and lighter. Automated operation equipment uses a transfer device to transfer the electronic components to the carrier of the working device, so that the relevant device can take out the electronic components from the carrier or execute the electronic components on the carrier. For the preset operation, the holder can be a tray, a test seat or a stage, etc.; please refer to Figure 1, the
本發明之目的一,係提供一種作業裝置,包含承置機構、校正機構及第一驅動機構,承置機構係以承置具承載電子元件,校正機構係設有複數個校正件及作動件,複數個校正件樞設於承置機構,以供校正電子元件,作動件係沿作業軸向而穿置於承置機構,並供傳動複數個校正件旋轉擺動,第一驅動機構係設有第一驅動源及掣動件,第一驅動源驅動該掣動件作動,使掣動件帶動校正機構之作動件沿作業軸向位移,作動件即傳動複數個校正件旋轉擺動而校正該承置具上之電子元件;藉以第一驅動機構控制校正機構之複數個校正件旋轉擺動,以供易於校正及取放電子元件,達到提升電子元件作業精準性之實用效益。 The first object of the present invention is to provide a working device, which includes a supporting mechanism, a correction mechanism and a first driving mechanism. The supporting mechanism uses the supporting tool to carry electronic components, and the correction mechanism is provided with a plurality of correcting parts and actuating parts. A plurality of correcting parts are pivoted on the supporting mechanism for correcting electronic components. The actuating parts are inserted into the supporting mechanism along the working axis and are used to drive the plurality of correcting parts to rotate and swing. The first driving mechanism is provided with a first drive mechanism. A driving source and a detent, the first driving source drives the detent to act, so that the detent drives the actuator of the correcting mechanism to move along the working axis, and the actuator drives a plurality of corrective members to rotate and oscillate to correct the bearing With the above electronic components; the first driving mechanism controls the rotation and swing of the plurality of calibration parts of the calibration mechanism for easy calibration and access to the electronic components, which achieves the practical benefit of improving the accuracy of the operation of the electronic components.
本發明之目的二,係提供一種作業裝置,其複數個校正件於樞轉外擺時,可擴增複數個校正件間之開口範圍,以供易於移入電子元件而防止碰損,達到提升移入作業便利性及節省電子元件成本之實用效益。 The second object of the present invention is to provide a working device, which can enlarge the opening range between the plurality of correcting members when the plurality of correcting members are pivoted outward, so that the electronic components can be easily moved in to prevent the collision from being damaged, so as to achieve the lifting and moving in Operational convenience and practical benefits of saving the cost of electronic components.
本發明之目的三,係提供一種作業裝置,更包含第二驅動機構,第二驅動機構係設有第二驅動源及傳動組,第二驅動源係驅動傳動組,傳動組即帶動承置具及校正機構同步轉動,藉以調整承置具上之電子元件的角位,達到提升校正使用效能之實用效益。 The third objective of the present invention is to provide a working device that further includes a second drive mechanism. The second drive mechanism is provided with a second drive source and a transmission group. The second drive source drives the transmission group. The transmission group drives the supporting device. And the calibration mechanism rotates synchronously to adjust the angular position of the electronic components on the supporting tool to achieve the practical benefit of improving the calibration performance.
本發明之目的四,係提供一種作業裝置,其第一驅動機構之掣動件可為凸輪,以控制作動件平穩沿作業軸向位移,使作動件帶動複數個校正件穩定夾持或釋放電子元件,以避免損傷電子元件,達到提升作動順暢性之實用效益。 The fourth object of the present invention is to provide a working device, the actuator of the first drive mechanism can be a cam to control the actuator to move smoothly along the working axis, so that the actuator can drive a plurality of correcting components to hold or release the electronics stably Components to avoid damage to electronic components and achieve the practical benefit of improving the smoothness of operation.
本發明之目的五,係提供一種作業設備,包含機台、供料裝置、收料裝置、工作裝置、輸送裝置、本發明作業裝置及中央控制裝置,供料裝置 係配置於機台,並設有至少一供料承置器,以供容納待作業之電子元件;收料裝置係配置於機台,並設有至少一收料承置器,以供容納已作業之電子元件;工作裝置係配置於機台,並設有至少一作業器,以對電子元件執行預設作業;輸送裝置係配置於機台,並設置至少一移料器,以供移載電子元件;本發明作業裝置係配置於機台,並設有承置機構、校正機構及第一驅動機構,以校正電子元件;中央控制裝置係用以控制及整合各裝置作動,以執行自動化作業,達到提升作業效能之實用效益。 The fifth objective of the present invention is to provide a working equipment, including a machine, a feeding device, a receiving device, a working device, a conveying device, a working device of the present invention, a central control device, and a feeding device It is arranged on the machine and is equipped with at least one feeding holder for accommodating the electronic components to be operated; the receiving device is arranged on the machine and is equipped with at least one receiving holder for accommodating the Electronic components for operation; working device is arranged on the machine and equipped with at least one working device to perform preset operations on the electronic components; the conveying device is arranged on the machine and equipped with at least one material shifter for transfer Electronic components; the working device of the present invention is arranged on the machine, and is equipped with a supporting mechanism, a calibration mechanism and a first drive mechanism to calibrate the electronic components; the central control device is used to control and integrate the actions of each device to perform automated operations , To achieve the practical benefits of improving the operating efficiency.
〔習知〕 [Learning]
11:承置器 11: Holder
111:容置槽 111: accommodating slot
12:電子元件 12: Electronic components
〔本發明〕 〔this invention〕
20:作業裝置 20: Operating device
21:承置機構 21: Host institution
211:第一座具 211: The first seat
2111:第一面板 2111: The first panel
2112:第一支架 2112: The first bracket
2113:第二面板 2113: second panel
2114:凹槽 2114: Groove
212:第二座具 212: The second seat
2121:通孔 2121: Through hole
213:承置具 213: Settlement
2131:承板 2131: bearing plate
2132:第二支架 2132: second bracket
22:校正機構 22: Correction mechanism
221:校正件 221: Calibration Parts
2211:推抵板 2211: push to board
2212:轉動架 2212: turret
2213:校正部 2213: Correction Department
2214:承推部件 2214: Propelled components
222:作動件 222: Actuator
2221:頂推部件 2221: Pushing parts
2222:承掣部件 2222: Supporting parts
223:基座 223: Pedestal
2231:樞軸 2231: pivot
23:第一驅動機構 23: The first drive mechanism
231:第一驅動源 231: first drive source
232:掣動件 232: Switch
24:第二驅動機構 24: The second drive mechanism
241:第二驅動源 241: second drive source
242:傳動組 242: Transmission Group
25:輸送動力源 25: Conveying power source
26:電性承接件 26: electrical socket
27:電路板 27: circuit board
X:作業軸向 X: working axis
P1:第一位置 P1: first position
P2:第二位置 P2: second position
31:移料器 31: Shifter
32:電子元件 32: Electronic components
40:機台 40: Machine
50:供料裝置 50: Feeding device
60:收料裝置 60: Receiving device
70:工作裝置 70: working device
80:輸送裝置 80: Conveying device
81:第一移料器 81: The first shifter
82:輸送載台 82: Conveying platform
83:第二移料器 83: Second shifter
第1圖:習知承置器之使用示意圖。 Figure 1: Schematic diagram of the use of the conventional holder.
第2圖:本發明作業裝置第一實施例之外觀圖。 Figure 2: The external view of the first embodiment of the working device of the present invention.
第3圖:本發明作業裝置第一實施例之剖視圖。 Figure 3: A cross-sectional view of the first embodiment of the working device of the present invention.
第4圖:本發明作業裝置第一實施例之使用示意圖(一)。 Figure 4: A schematic diagram of the use of the first embodiment of the working device of the present invention (1).
第5圖:本發明作業裝置第一實施例之使用示意圖(二)。 Figure 5: A schematic diagram of the use of the first embodiment of the working device of the present invention (2).
第6圖:本發明作業裝置第一實施例之使用示意圖(三)。 Figure 6: A schematic diagram of the use of the first embodiment of the working device of the present invention (3).
第7圖:本發明作業裝置之第二實施例示意圖。 Figure 7: A schematic diagram of the second embodiment of the working device of the present invention.
第8圖:本發明作業裝置之第三實施例示意圖。 Figure 8: A schematic diagram of the third embodiment of the working device of the present invention.
第9圖:本發明作業裝置應用於作業設備之示意圖。 Figure 9: A schematic diagram of the working device of the present invention applied to working equipment.
為使 貴審查委員對本發明作更進一步之瞭解,茲舉一較佳實施例並配合圖式,詳述如後:
請參閱第2、3圖,本發明作業裝置20第一實施例包含承置機構21、校正機構22及第一驅動機構23,更包含第二驅動機構24。
In order to enable your reviewer to have a better understanding of the present invention, a preferred embodiment is given in conjunction with the drawings. The details are as follows:
Please refer to FIGS. 2 and 3, the first embodiment of the working
該承置機構21包含承具單元及承置具213,承具單元係裝配承置具213,並可為獨立座體或載台,例如承具單元可為獨立座體而配置於機台(圖未示出),例如承具單元可為一載台,並裝配輸送動力源(圖未示出),而作至少一方向位移載送電子元件;於本實施例中,承具單元係設有第一座具211及第二座具212,第一座具211包含第一面板2111、複數個第一支架2112及第二面板2113,第一面板2111利用複數個第一支架2112架置於第二面板2113之上方,另於第一面板2111設有具軸承之凹槽2114;第二座具212可固定式或可旋轉式裝配於第一座具211,以供裝配至少一承置具213,於本實施例中,第二座具212係裝配於第一座具211之凹槽2114,並可旋轉作動,第二座具212之內部開設通孔2121;承置具213係裝配於承具單元,並供承置電子元件,承置具213可為架體或測試座,例如承置具213可為架體,以單純承置電子元件,例如承置具213可為測試座,並裝配電性承接件(如探針),以供測試電子元件,於本實施例中,承置具213係設有承板2131及複數個第二支架2132,承板2131係供承置電子元件,並利用複數個第二支架2132架置於第二座具212,而可隨第二座具212同步轉動。
The supporting
該校正機構22包含複數個校正件221及至少一作動件222,複數個校正件221係樞設於承置機構21之承具單元,以供校正承置機構21之承置具213上的電子元件;更進一步,校正件221可為一體式之物件,或包含推抵板及轉動架,於本實施例中,複數個校正件221係配置於承置具213之周側,各校正件221包含推抵板2211及轉動架2212,推抵板2211係於第一端設有校正部2213,以推
移校正承置具213上之電子元件,轉動架2212係概呈一L型架體,並裝配可拆裝式之推抵板2211,亦即轉動架2212之第一端裝配鎖固推抵板2211之第二端,使推抵板2211之校正部2213位於承置具213之承板2131上方,轉動架2212之第二端則位於承置具213之承板2131下方,轉動架2212與推抵板2211同步轉動,並依作業需求及不同電子元件尺寸,而可調整推抵板2211裝配於轉動架2212上之位置,亦或更換不同尺寸之推抵板2211,以提升校正件221之使用效能;又校正機構22係於承具單元裝配有複數個基座223,複數個基座223配置於承置具213之周側,於本實施例中,複數個基座223係固設於第二座具212上,各基座223以樞軸2231樞接於轉動架2212的第一端及第二端之間,使轉動架2212以樞軸2231為旋轉中心而可於基座223上旋轉擺動;作動件222係裝配於承置機構21之承具單元,並供帶動複數個校正件221旋轉擺動,使複數個校正件221校正承置具213上之電子元件,於本實施例中,作動件222係穿置於承具單元之第二座具212的通孔2121,而可沿作業軸向X位移,作動件222之第一端及第二端分別凸伸出第二座具212之頂面及底面;另於作動件222與複數個校正件221之間係設有掣動單元,以使作動件222帶動複數個校正件221同步旋轉擺動,掣動單元係於作動件222與校正件221間設有相互配合之頂推部件及承推部件,頂推部件可為平面、桿體或凸塊,承推部件可為凹槽、凸塊或平面,於本實施例中,掣動單元係於作動件222第一端相對複數個校正件221之轉動架2212第二端的位置設有複數個為桿體之頂推部件2221,以及於複數個校正件221之轉動架2212第二端設置為凹槽之承推部件2214,作動件222可利用頂推部件2221頂抵且沿轉動架2212之承推部件2214位移,而帶動轉動架2212以基座223之樞軸2231為旋轉中心而旋轉擺動,使複數個校正件221同步擺動,又作動件222之第二端則設有承掣部件2222,更進
一步,承掣部件2222可為作動件222之第二端,亦或於第二端裝配一塊體,該塊體可為軸承或防磨耗塊體,於本實施例中,作動件222係於第二端設有一為塊體之承掣部件2222。
The
第一驅動機構23包含第一驅動源231及掣動件232,第一驅動源231驅動該掣動件232作動,掣動件232帶動校正機構22之作動件222沿作業軸向X位移;更進一步,第一驅動源231可為馬達、線性壓缸或包含馬達及傳動組,掣動件232之頂掣面可為凸輪面、平面或斜面,於本實施例中,第一驅動源231係為馬達,並裝配於承置機構21之第一座具211的第二面板2113,以驅動該掣動件232轉動,掣動件232係具有凸輪面,以抵接作動件222之承掣部件2222,於掣動件232旋轉作動時,以其凸輪面頂推帶動該作動件222沿作業軸向X位移;又掣動件232之凸輪面不僅可帶動該作動件222平穩位移,並可控制作動件222之位移高度,以進一步控制複數個校正件221間之開口範圍。
The
第二驅動機構24包含第二驅動源241及傳動組242,第二驅動源241係驅動該傳動組242作動,傳動組242係帶動承置機構21之第二座具212及其上之校正機構22、電子元件同步轉動,而調整電子元件之角位;更進一步,傳動組242可為皮帶輪組或齒輪組,於本實施例中,第二驅動源241係裝配於承置機構21之第一座具211的第二面板2113,以驅動一為皮帶輪組之傳動組242,傳動組242則連結驅動第二座具212轉動。
The
請參閱第3、4圖,作業裝置20係以第一驅動機構23之第一驅動源231驅動該掣動件232旋轉作動,掣動件232以即凸輪面頂推作動件222之承掣部件2222,而驅動該作動件222於第二座具212之通孔2121內沿作業軸向X向上位移,使作動件222由第一位置P1上升位移至第二位置P2;作動件222即以複數個
頂推部件2221同步向上推抵複數個校正件221之轉動架2212的承推部件2214,校正件221之轉動架2212即以基座223之樞軸2231為旋轉中心而向外旋轉擺動,令轉動架2212帶動推抵板2211同步向外擺動,而擴增複數個校正件221之校正部2213間的開口範圍,以供一移料器31易於將電子元件32移入,且置放於承置具213之承板2131,而可防止電子元件32碰損。
Please refer to Figures 3 and 4, the operating
請參閱第4、5圖,作業裝置20係以第一驅動機構23之第一驅動源231驅動該掣動件232繼續順向旋轉作動,掣動件232以即凸輪面承抵作動件222之承掣部件2222,並驅動該作動件222於第二座具212之通孔2121內沿作業軸向X向下位移,使作動件222由第二位置P2下降位移至第一位置P1;作動件222即以複數個頂推部件2221同步下壓複數個校正件221之轉動架2212的承推部件2214,校正件221之轉動架2212即以基座223之樞軸2231為旋轉中心而向內旋轉擺動,令轉動架2212帶動推抵板2211同步向內擺動,使複數個校正件221之校正部2213推移校正承置具213之承板2131上的電子元件32擺置於正確作業位置。
Please refer to Figures 4 and 5, the operating
請參閱第6圖,由於電子元件32之角位可能不符合下一裝置之需求,即必須調整電子元件32之角位,作業裝置20即以第二驅動機構24之第二驅動源241驅動該傳動組242作動,傳動組242帶動第二座具212旋轉,由於第二座具212承置作動件222、複數個校正件221及承置具213等,於複數個校正件221仍保持夾持電子元件32的狀態下,使得第二座具212帶動作動件222、校正件221、承置具213及電子元件32同步轉動,進而調整電子元件32之角位,達到提升使用效能之實用效益。
Please refer to Fig. 6, since the angular position of the
請參閱第2、3、7圖,本發明作業裝置20之第二實施例與第一實施例之差異在於作業裝置20更包含輸送動力源25,輸送動力源25係裝配承置機
構21,以帶動承置機構21作至少一方向位移;於本實施例中,承置機構21之第一座具211的第二面板2113裝配於輸送動力源25,使承具單元形成一載台,進而利用輸送動力源25帶動承置機構21、校正機構22、第一驅動機構23及第二驅動機構24作至少一方向位移,用以載送電子元件。
Referring to Figures 2, 3, and 7, the difference between the second embodiment of the working
請參閱第2、3、8圖,本發明作業裝置20之第三實施例與第一實施例之差異在於作業裝置20更包含測試器,測試器係裝配於承置機構21之承置具213,以供測試電子元件;於本實施例中,測試器係於承置具213之承板2131裝配電性連接之電性承接件26及電路板27,使承置具213形成一測試座,承置機構21之第一座具211則裝配於機台40,當承置具213承置已校正之電子元件後,電性承接件26即電性連接電子元件之接點,而對電子元件執行測試作業。
Please refer to Figures 2, 3, and 8, the difference between the third embodiment of the working
請參閱第2、3、9圖,本發明作業裝置20應用於電子元件作業設備之示意圖,作業設備係於機台40配置有供料裝置50、收料裝置60、工作裝置70、本發明作業裝置20、輸送裝置80及中央控制裝置(圖未示出);該供料裝置50係裝配於機台40,並設有至少一供料承置器,以供容納至少一待作業之電子元件;該收料裝置60係裝配於機台40,並設有至少一收料承置器,以供容納至少一已作業之電子元件;該工作裝置70係裝配於機台40,並設有至少一作業器,以供對電子元件執行預設作業,於本實施例中,作業器係為檢知器;本發明作業裝置20係裝配於機台40,包含承置機構21、校正機構22及第一驅動機構23,更包含第二驅動機構24,作業裝置20係供承置及校正電子元件;該輸送裝置80係裝配於機台40上,並設有至少一移料器,以供移載電子元件,於本實施例中,輸送裝置80係以第一移料器81於供料裝置50取出待作業之電子元件,並將待作業之電子元件移載至本發明作業裝置20之承置機構21上,作業裝置20係
以第一驅動機構23驅動校正機構22校正待作業之電子元件,輸送裝置80之第一移料器81再將待作業之電子元件移載至輸送載台82,輸送載台82將待作業之電子元件載送至第二移料器83下方,第二移料器83於輸送載台82取出待作業之電子元件,並移載至工作裝置70,工作裝置70對電子元件執行取像檢知作業,於檢知作業完畢後,第二移料器83依檢知結果,將工作裝置70處之已作業電子元件移載至收料裝置60分類收置;該中央控制裝置係用以控制及整合各裝置作動,以執行自動化作業,達到提升作業效能之實用效益。
Please refer to Figures 2, 3, and 9, a schematic diagram of the working
20:作業裝置 20: Operating device
21:承置機構 21: Host institution
211:第一座具 211: The first seat
2111:第一面板 2111: The first panel
2112:第一支架 2112: The first bracket
2113:第二面板 2113: second panel
2114:凹槽 2114: Groove
212:第二座具 212: The second seat
2121:通孔 2121: Through hole
213:承置具 213: Settlement
2131:承板 2131: bearing plate
2132:第二支架 2132: second bracket
22:校正機構 22: Correction mechanism
221:校正件 221: Calibration Parts
2211:推抵板 2211: push to board
2212:轉動架 2212: turret
2213:校正部 2213: Correction Department
2214:承推部件 2214: Propelled components
222:作動件 222: Actuator
2221:頂推部件 2221: Pushing parts
2222:承掣部件 2222: Supporting parts
223:基座 223: Pedestal
2231:樞軸 2231: pivot
23:第一驅動機構 23: The first drive mechanism
231:第一驅動源 231: first drive source
232:掣動件 232: Switch
24:第二驅動機構 24: The second drive mechanism
241:第二驅動源 241: second drive source
242:傳動組 242: Transmission Group
X:作業軸向 X: working axis
P1:第一位置 P1: first position
Claims (10)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW109102007A TWI728663B (en) | 2020-01-20 | 2020-01-20 | Operating device and operating equipment using the same |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW109102007A TWI728663B (en) | 2020-01-20 | 2020-01-20 | Operating device and operating equipment using the same |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TWI728663B true TWI728663B (en) | 2021-05-21 |
| TW202129300A TW202129300A (en) | 2021-08-01 |
Family
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW109102007A TWI728663B (en) | 2020-01-20 | 2020-01-20 | Operating device and operating equipment using the same |
Country Status (1)
| Country | Link |
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| TW (1) | TWI728663B (en) |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20070159194A1 (en) * | 2006-01-10 | 2007-07-12 | Yoshiei Hasegawa | Probing apparatus |
| TWM343795U (en) * | 2008-05-15 | 2008-11-01 | Gtb Ind Co Ltd | Structure of testing jig |
| US9459280B2 (en) * | 2012-08-27 | 2016-10-04 | Intel Corporation | Using fluid to position a device in a socket for testing |
| TWM568971U (en) * | 2018-08-15 | 2018-10-21 | 橙澳科技股份有限公司 | Fast exchange rotation test platform |
-
2020
- 2020-01-20 TW TW109102007A patent/TWI728663B/en active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20070159194A1 (en) * | 2006-01-10 | 2007-07-12 | Yoshiei Hasegawa | Probing apparatus |
| TWM343795U (en) * | 2008-05-15 | 2008-11-01 | Gtb Ind Co Ltd | Structure of testing jig |
| US9459280B2 (en) * | 2012-08-27 | 2016-10-04 | Intel Corporation | Using fluid to position a device in a socket for testing |
| TWM568971U (en) * | 2018-08-15 | 2018-10-21 | 橙澳科技股份有限公司 | Fast exchange rotation test platform |
Also Published As
| Publication number | Publication date |
|---|---|
| TW202129300A (en) | 2021-08-01 |
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