TWI715084B - Testing device - Google Patents
Testing device Download PDFInfo
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- TWI715084B TWI715084B TW108122668A TW108122668A TWI715084B TW I715084 B TWI715084 B TW I715084B TW 108122668 A TW108122668 A TW 108122668A TW 108122668 A TW108122668 A TW 108122668A TW I715084 B TWI715084 B TW I715084B
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- base
- side plate
- detection device
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- 238000012360 testing method Methods 0.000 title abstract description 5
- 230000007246 mechanism Effects 0.000 claims abstract description 30
- 238000001514 detection method Methods 0.000 claims abstract description 24
- 238000007689 inspection Methods 0.000 description 5
- 238000012423 maintenance Methods 0.000 description 2
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000000750 progressive effect Effects 0.000 description 1
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- Slide Fasteners (AREA)
- Automatic Analysis And Handling Materials Therefor (AREA)
Abstract
Description
本發明係有關於一種檢測裝置。 The invention relates to a detection device.
隨著科技的發展,現今之電子產品之體積已大幅縮減。其中,由於電路板可密集地配置電路而有效減少產品體積,因此多被採用。一般電路板於製造及設置完成後會經由檢測機台自動化地進行電性測試,以確認其可正常運作。然,隨著電路板之電路結構日趨微小,習知之檢測機台之載物機構於移動時常會造成檢測位置偏離而影響檢測結果,穩定度不佳。 With the development of technology, the volume of today's electronic products has been greatly reduced. Among them, because the circuit board can be densely configured with circuits and effectively reduce the product volume, it is mostly used. Generally, after the manufacturing and setting of the circuit board is completed, an electrical test is automatically performed by a testing machine to confirm that it can operate normally. However, as the circuit structure of the circuit board becomes smaller and smaller, the loading mechanism of the conventional inspection machine often causes the inspection position to deviate when moving, which affects the inspection result, and the stability is not good.
因此,有必要提供一種新穎且具有進步性之檢測裝置,以解決上述之問題。 Therefore, it is necessary to provide a novel and progressive detection device to solve the above-mentioned problems.
本發明之主要目的在於提供一種檢測裝置,其基座可穩定移動。 The main purpose of the present invention is to provide a detection device whose base can move stably.
為達成上述目的,本發明提供一種檢測裝置,包括:一機架;至少一導柱,固定地連接該機架;至少一基座,可移動地連接於該至少一導柱,供設置一待測物件或一檢測模組;一驅動機構,連接該至少一基座且可移動該至少一基座;至少一引導機構,各該引導機構包括一設於該機架之導軌及一滑 設於該導軌且連接其中一該基座之滑座。 To achieve the above object, the present invention provides a detection device, including: a frame; at least one guide post, fixedly connected to the frame; at least one base, movably connected to the at least one guide post, for setting a stand A test object or a detection module; a driving mechanism connected to the at least one base and capable of moving the at least one base; at least one guiding mechanism, each of the guiding mechanisms includes a guide rail and a slide provided on the rack The sliding seat is arranged on the guide rail and connected to one of the bases.
1:檢測裝置 1: Detection device
10:機架 10: rack
20:導柱 20: guide post
30:基座 30: Pedestal
40:驅動機構 40: drive mechanism
50:引導機構 50: Guiding agency
51:導軌 51: Rail
52:滑座 52: Slide
60a,60b:固緊件 60a, 60b: fasteners
70:連接件 70: connection
71:第一側板 71: The first side panel
711:凹弧部 711: concave arc
72:第二側板 72: second side panel
73:第三側板 73: Third side panel
74:貫穿缺口 74: Through the gap
圖1為本發明一較佳實施例之立體圖。 Figure 1 is a perspective view of a preferred embodiment of the present invention.
圖2為本發明一較佳實施例之局部放大圖。 Figure 2 is a partial enlarged view of a preferred embodiment of the present invention.
以下僅以實施例說明本發明可能之實施態樣,然並非用以限制本發明所欲保護之範疇,合先敘明。 The following examples are only used to illustrate the possible implementation aspects of the present invention, but they are not intended to limit the scope of protection of the present invention, and are described first.
請參考圖1至2,其顯示本發明之一較佳實施例,本發明之檢測裝置1包括一機架10、至少一導柱20、至少一基座30、一驅動機構40及至少一引導機構50。該檢測裝置1可與一供輸送、轉移或/及分類置放待檢測物件之移動裝置組配而可進行自動化檢測作業。
Please refer to FIGS. 1 to 2, which show a preferred embodiment of the present invention. The detection device 1 of the present invention includes a
該至少一導柱20固定地連接該機架10;該至少一基座30可移動地連接於該至少一導柱20並供設置一待測物件或一檢測模組;該驅動機構40連接該至少一基座30且可移動該至少一基座30;各該引導機構50包括一設於該機架10之導軌51及一滑設於該導軌51且連接其中一該基座30之滑座52。藉此,該至少一基座30可穩定地沿該至少一導柱20移動而不偏移。
The at least one
該機架10為一多格外框體,該至少一導柱20及該至少一基座30位於該多格外框體之內部。於本實施例中,該檢測裝置1包括多個該導柱20,該多個導柱20對角地配置於該機架10,例如但不限為配置於二對角或四角,奇
數或偶數地等間距或非等間距間隔配置亦可,可平均地支撐該至少一基座30穩定移動。該檢測裝置1較佳包括多個該基座30而可供設置多個該檢測模組;該多個基座30平行地連接於該多個導柱20,該多個基座30至少其中一者(最佳為全部)連接該驅動機構40及該至少一引導機構50,穩定且順暢地移動。
The
該滑座52與該基座30較佳為可拆卸地連接,便於維修、更換。於本實施例中,該滑座52與該基座30以多個固緊件60a可拆卸地連接,該多個固緊件60a上下交錯呈多排配置,該滑座52受力平均而可穩定滑移。
The sliding
較佳地,該至少一引導機構50為複數個,各該引導機構50及其中一該基座30以至少一連接件70連接,該等引導機構50連接於該基座30之四角隅處,該等導柱20位於該等引導機構50之內側。於本實施例中,該至少一連接件70為複數個,各該滑座52及其中一該基座30以一該連接件70連接而可穩定滑移連動。然,該連接件亦可一體設於該基座或該引導機構而無需另外連接設置。
Preferably, the at least one guiding
詳細說,該連接件70為一角板,該角板包括一連接該基座30之第一側板71及一橫向於該第一側板71且連接該滑座52之第二側板72。該滑座52與該第二側板72以多個固緊件60b可拆卸地連接,該多個固緊件60b上下對齊呈多排配置,便於維修、更換且穩固性佳。該第一側板71朝該第二側板72方向漸寬而具有一凹弧部711,增加結構強度且可有效導引承重及受力。該角板另包括一連接於該第一側板71及該第二側板72之間的第三側板73;該第一、第二及第三側板71,72,73相互垂直連接;該第三側板73朝該第二側板72方向漸寬,增加該角板之結構完整性,強度佳而可避免受力變形且可有效導引受力。該第一、第二及第三側板71,72,73相互連接之一角隅處設有一貫穿缺口74,可分散該第一及第二側板71,
72之受力,避免該角板損壞、變形,且可將應力有效導引至相互垂直之三維方向上支持,該滑座52可穩定精準地滑移。
In detail, the connecting
1:檢測裝置 1: Detection device
10:機架 10: rack
20:導柱 20: guide post
30:基座 30: Pedestal
40:驅動機構 40: drive mechanism
50:引導機構 50: Guiding agency
60a:固緊件 60a: Fastener
Claims (8)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821210029.2U CN208568988U (en) | 2018-07-27 | 2018-07-27 | Detection device |
| CN201821210029.2 | 2018-07-27 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW202022383A TW202022383A (en) | 2020-06-16 |
| TWI715084B true TWI715084B (en) | 2021-01-01 |
Family
ID=65448670
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW108122668A TWI715084B (en) | 2018-07-27 | 2019-06-27 | Testing device |
Country Status (2)
| Country | Link |
|---|---|
| CN (1) | CN208568988U (en) |
| TW (1) | TWI715084B (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110763975B (en) * | 2018-07-27 | 2022-03-29 | 吴茂祥 | Detection device |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW200305724A (en) * | 2002-04-08 | 2003-11-01 | Micromanipulator Company Inc | High resolution analytical probe station |
| US7362117B2 (en) * | 1998-11-25 | 2008-04-22 | Advantest Corporation | Cooling fin connected to a cooling unit and a pusher of the testing apparatus |
| CN103868930A (en) * | 2013-11-29 | 2014-06-18 | 中科华核电技术研究院有限公司 | Non-contact type detection equipment |
| CN206906511U (en) * | 2017-03-24 | 2018-01-19 | 深圳市斯纳达科技有限公司 | Electronic product test equipment |
| TWM557730U (en) * | 2017-05-16 | 2018-04-01 | 亞克先進科技股份有限公司 | Electronic component testing device |
-
2018
- 2018-07-27 CN CN201821210029.2U patent/CN208568988U/en not_active Expired - Fee Related
-
2019
- 2019-06-27 TW TW108122668A patent/TWI715084B/en active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7362117B2 (en) * | 1998-11-25 | 2008-04-22 | Advantest Corporation | Cooling fin connected to a cooling unit and a pusher of the testing apparatus |
| TW200305724A (en) * | 2002-04-08 | 2003-11-01 | Micromanipulator Company Inc | High resolution analytical probe station |
| CN103868930A (en) * | 2013-11-29 | 2014-06-18 | 中科华核电技术研究院有限公司 | Non-contact type detection equipment |
| CN206906511U (en) * | 2017-03-24 | 2018-01-19 | 深圳市斯纳达科技有限公司 | Electronic product test equipment |
| TWM557730U (en) * | 2017-05-16 | 2018-04-01 | 亞克先進科技股份有限公司 | Electronic component testing device |
Also Published As
| Publication number | Publication date |
|---|---|
| CN208568988U (en) | 2019-03-01 |
| TW202022383A (en) | 2020-06-16 |
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