TWI712805B - Handler for testing electronic devices - Google Patents

Abstract

The invention relates to a sorting machine for testing electronic components. In the sorting machine for testing electronic components according to the present invention, before the opening and closing device that opens and closes the first port of the test chamber opens the first port and then closes the first port, the test of the electronic component that has been tested is carried The tray is moved out of the test chamber, and the test tray containing the electronic components to be tested is moved into the test chamber. According to the present invention, it is possible to minimize the loss of the temperature environment of the test chamber and increase the processing capacity.

Description

Sorting machine for electronic component testing

The invention relates to a sorting machine for testing electronic components.

After being tested by the tester, the produced electronic components are divided into good and defective products, and only good products are shipped.

The electrical connection between the tester and the electronic components is performed by a sorting machine for testing electronic components (hereinafter referred to as "sorting machine"), and various types of sorting machines are included depending on the type of electronic component. Among them, the present invention relates to a sorting machine using a test tray capable of stacking a plurality of electronic components.

The sorting machine using test trays has various forms including Korean Patent No. 10-2013-0105104, etc., usually as shown in the schematic plan view of FIG. 1, including a loading device 110, a soak chamber (Soak Chamber) 120, The test chamber 130, the connection device 140, the heat dissipation chamber (Desoak Chamber) 150, and the unloading device 160.

The loading device 110 loads the electronic components that need to be tested stacked on the passenger tray CT ₁ to the test tray TT located at the loading position (LOADING POSITION) LP.

The soaking chamber 120 is used to apply a thermal stimulus according to the test temperature to adjust the temperature in advance (preheating or pre-cooling) before testing the electronic components stacked on the stored test tray TT.

The test chamber 130 is provided for testing the electronic components of the test tray TT transferred to the test position (TEST POSITION) TP after the soaking chamber 120 is preheated/pre-cooled. That is, the test chamber 130 provides a temperature environment for maintaining the temperature of the electronic components stacked on the stored test tray TT at the test temperature condition.

The connecting device 140 electrically connects the electronic components of the test tray TT stacked on the test position TP to the tester.

The heat dissipation chamber 150 is configured to restore the electronic components loaded on the test tray TT transferred from the test chamber 130 to room temperature or a predetermined temperature at which there is no problem during unloading.

The unloading device 160 unloads the electronic components from the test tray TT located at the unloading position (UNLOADING POSITION) UP, classifies the electronic components according to the test level, and moves them to the empty passenger tray CT ₂ .

As mentioned above, the test tray TT circulates along the circulation path CC that is connected to the loading position LP again via the loading position LP, the test position TP, and the unloading position UP. For this reason, a plurality of unshown conveyors are forming the circulation path CC. Transfer the test tray TT in each section.

In addition, the sorting machine 100 shown in FIG. 1 has a structure in which a test chamber 130 is provided between the soaking chamber 110 and the heat dissipation chamber 150, and a structure in which the test tray TT is transferred along the closed circulation path CC, so it is considered It is difficult to equip more than four test windows TW depending on the width or height of the equipment. Here, the test window TW indicates a window through which the electronic component is electrically connected to the tester TESTER, and one test window TW corresponds to one test tray TT. Obviously, the tester TESTER is combined with the sorting machine 100 through the test window TW. Therefore, the number of electronic components that can be tested at one time is limited to the number loaded on 1 to 3 test trays TT, which limits the processing capacity of the sorting machine 100 that cannot be expanded infinitely.

Therefore, the applicant of the present invention, in the currently unpublished Korean Patent Application No. 10-2017-000080, proposed the following new concept of sorting machine technology (hereinafter referred to as "prior art"): equipped with The moving chamber in which the tray moves can greatly expand the processing capacity.

[Problems to be Solved by the Invention] The purpose of the present invention is to provide a technology that can reduce the number of test trays when the mobile chamber is implemented as a soaking chamber by inheriting and developing a sorting machine according to the prior art. The overall time for moving from the corresponding soaking chamber to the test chamber and moving the test tray from the test chamber to the corresponding soaking chamber.

[Technical Means to Solve the Problem] The sorting machine for testing electronic components according to the present invention includes: a loading device for loading the electronic components loaded on the passenger tray on the test tray at the loading position; and the first soaking chamber in After accommodating the test tray loaded with electronic components through the loading device, thermal stimulus is applied to the electronic components; a test chamber, accommodating the test tray from the first soaking chamber, and providing a test tray capable of testing the accommodated test tray The temperature environment of the electronic component, and has a first inlet and outlet that can allow the test tray to enter and exit; a connecting device, which electrically connects the electronic component of the test tray contained in the test chamber to the tester; an opening and closing device, which opens and closes the test chamber The first entrance and exit of the chamber; an unloading device for unloading the electronic components that have completed the test from the test tray moved to the unloading position after being unloaded from the test chamber; and a transfer device for removing the electronic components from the first soaking chamber During the process of moving to the test chamber, or during the process of moving from the test chamber to the unloading position, the test tray is transferred and equipped, wherein the transfer device includes: a second soaking chamber, After the first soaking chamber receives the test tray, it maintains the thermal stimulus applied to the electronic components by the first soaking chamber, and has a second entrance and exit that can allow the test tray to enter and exit; a shutter, an opening and closing station The second entrance and exit of the second soaking chamber; a stacking block capable of stacking test trays carried out from the test chamber, and is equipped in an integrated manner with the second soaking chamber; A mover to move the second soaking chamber so that the second soaking chamber is located on one side of the first soaking chamber or the test chamber, wherein the electronic component is used for testing The sorting machine also includes: a supply device that supplies test trays from the second soaking chamber to the test chamber; a recovery device that recovers test trays from the test chamber to the stacking block, when all When the second soaking chamber is located on one side of the test chamber, the first port and the second port are formed spaced apart and opposed to each other, and the opening and closing device opens the first port After closing the first port, the supply and the recovery device are operated to retrieve the test tray containing the electronic components that have been tested to the stacking block through the first port and the The test trays of the electronic components to be tested are sequentially supplied to the test chamber via the second port and the first port, so that the test chamber and the transfer device can be exchanged when the opening and closing device is operated once. The exchange of test trays between.

The test chamber and the connecting device are provided in multiples, at least one of the test chambers is separated from the first soaking chamber, and the mover can position the second soaking chamber One side of each of the test chambers.

In order to minimize the loss of the temperature environment in the test chamber, when the test tray is exchanged between the test chamber and the transfer device, the operating time interval of the supplier and the operating time of the recovery device At least a part of the time interval overlaps, and the movement line of the test tray by the supplier and the movement line of the test tray by the recycler are separated from each other.

The stacking block is arranged on the upper side of the second soaking chamber.

[Effects of Invention] According to the present invention, there are the following effects.

First, since the time for the test tray to move from the test chamber to the second soaking chamber and the time for the test tray to move from the second soaking chamber to the test chamber overlap, the temperature environment of the test chamber can be minimized Loss.

Second, since the supply of test trays to the test chamber and the recovery of the test trays are realized in an exchange manner, time can be saved accordingly, and the processing capacity can be increased.

The preferred embodiments of the present invention are described with reference to the accompanying drawings. For the sake of brevity of the description, the content disclosed in the prior patent application No. 10-2017-000080, the known technology or the description is repeated or repeated as much as possible. Explanation of the same composition.

＜Description of composition＞

2 is a schematic plan view of a sorting machine for testing electronic components (hereinafter referred to as "sorting machine") 200 according to the present invention.

The sorting machine 200 according to this embodiment includes a supply part SP, a loading device 210, an identifier DA, a drive tester DT, a first buffer B1, a first opening device 220, a first soaking chamber 230, and 8 tests. Chamber TC, 8 connecting devices CA, 8 opening and closing devices OC, heat dissipation chamber 240, unloading device 250, second buffer B2, second opening device 260, recovery part RP, transfer device 270, supplier 280 and recovery器290.

Part of the supply SP supplies electronic components that need to be tested. Such a supply part SP can be embodied in various forms. However, in this embodiment, a truck TM for transporting a passenger pallet CT ₁ loaded with electronic components to be tested is installed, and the passenger pallet CT of the truck TM is installed. ₁ is sequentially supplied one sheet at a time.

The loading device 210 grasps the electronic components provided from the supply part SP and loaded on the passenger tray CT ₁ and finally loads them on the test tray TT located at the loading position LP.

The recognizer DA is equipped when it is necessary to separately manage electronic components, and it only needs to be equipped with a reader that can read the corresponding identifier based on the identifier. For example, in the case where the identifier is a barcode, the reader is equipped with a barcode reader capable of reading the barcode (or a camera for photographing the barcode). The identifier DA of this embodiment reads the identifier in a state where the electronic component is grasped by the loading device 210. Therefore, in the process of loading the electronic components on the test tray TT, the loading device 210 operates in a manner via the identifier DA.

The drive tester DT is provided for simply testing whether the electronic components are operated by the application of power. In order to carry out the drive test of the electronic component by means of this drive tester DT, it is preferable to equip a separate test frame TF and an opener OD. In this embodiment, in order to increase the processing capacity, the test frame TF and the opener OD are provided as a pair on both sides of the drive tester DT. In addition, the test tray TF moves in the left-right direction so as to be selectively located in the supply and demand area RA and the test area TA, and the opener OD is equipped to be fixed to the supply and demand area RA.

In order to drive the test, the loading device 210 first stacks the electronic components on the test frame TF opened by the opener OD before loading the electronic components on the test tray TT.

If the electronic components are all stacked on the test frame TF, the test frame TF moves to the test area TA to realize the drive test by the drive tester DT. At this time, the loading device 210 stacks the electronic components on the test frame TF on the other side.

If the driving test ends, the test framework TF returns to the supply and demand area RA, and the opener OD opens the test framework TF. In addition, the loading device 210 grips the electronic component from the test frame TF and loads it on the test tray TT. At this time, the electronic components judged to be defective in the drive test are moved to the first buffer B1.

The first buffer B1 is provided for stacking electronic components judged to be defective in the drive test.

The first opening device 220 opens the test tray TT located at the loading position LP, so that the loading device 210 loads the electronic components on the test tray TT located at the loading position LP.

The first soaking chamber 230 is configured to apply thermal stimulation to the electronic components after accommodating the test tray loaded with the electronic components by the loading device 210. Here, thermal stimulation not only heats electronic components, but also includes cooling electronic components.

The eight test chambers TC are allocated in a group of four, and are arranged side by side in the front-rear direction behind the first soaking chamber 230 and the heat dissipation chamber 240 via the transfer device 270. Each test chamber TC accommodates the test tray TT passing through the first soaking chamber 230 and the transfer device 270, and provides a temperature environment capable of testing the electronic components of the accommodated test tray TT. As shown in the partial view of FIG. 3, the above-mentioned test chambers TC respectively have first inlets and outlets I/O1 formed toward the transmission device 270 side. Obviously, the test tray TT is moved into or out of the test chamber TC through the first port I/O1. Here, it can be seen that the test chamber TC is separated from the first soaking chamber 230. According to the embodiment, the test chamber TC located directly behind the first soaking chamber 230 may be adjacent to the first soaking chamber 230. It is equipped in a front-to-back combination, but at least the remaining test chambers TC cannot be equipped in a combination with the first soaking chamber 230. That is, this is because the present invention adopts the following method: the first soaking chamber 230 and the test chamber TC are provided separately, and the test tray TT cannot directly move between the first soaking chamber 230 and the test chamber TC Situation, maximally The thermal stimulus applied to the electronic component is stored and the electronic component is transferred from the first soaking chamber 230 to the test chamber TC.

A connection device CA is provided corresponding to each test chamber TC, and the connection device CA electrically connects the electronic components of the test tray TT contained in the test chamber TC to the tester, and when the test is over, in order to remove the test tray TT raises the test tray TT. The technology of the above-mentioned connecting device CA is named as a pressurizing device in Korean Patent Application No. 10-2017-0160905 of the applicant of this case and described in detail, so detailed description is omitted.

The opening and closing device OC is equipped corresponding to each test chamber TC, so there are 8 in total, and as shown in FIG. 3, the cylinder C and the door D are respectively equipped. Therefore, the door D opens or closes the first port I/O1 according to the operating state of the cylinder C.

The soaking chamber 240 accommodates the test tray TT carrying the electronic components that have been tested, and restores the electronic components of the test tray TT to normal temperature or close to normal temperature, so that future unloading operations by the unloading device 250 can be performed appropriately. And can prevent damage to electronic components. Obviously, in the case where the thermal stimulus can be sufficiently removed from the electronic component only by exposure to normal temperature, the heat dissipation chamber 240 does not need to be formed.

The unloading device 250 unloads the electronic components that have completed the test from the test tray TT moved to the unloading position UP via the transfer device 270 and the heat dissipation chamber 240 after being carried out of the test chamber TC. At this time, the unloading device 250 may unload the electronic components according to the level according to the test result, and For electronic components that need to be retested, move them to the second buffer B2.

The second buffer B2 is equipped for stacking electronic components that need to be retested.

The second opening device 260 opens the test tray TT located at the unloading position UP, so that the electronic components that have been tested can be unloaded from the corresponding test tray TT by means of the unloading device 250.

The recycling part RP provides an empty passenger tray CT ₂ that can be loaded with electronic components that have been tested, so that the electronic components that have been tested can be recovered. That is, after unloading the electronic components from the test tray TT located in the unloading position UP, the unloading device 250 moves it to the empty passenger tray CT ₂ provided by the recovery part RP. For this reason, as in the present embodiment, a plurality of stackers SK capable of accommodating the passenger tray CT ₂ may be equipped in the recovery part RP.

The transfer device 270 is configured to move from the first soaking chamber 230 to the test chamber TC or to move to the heat dissipation chamber 250 in order to move from the test chamber TC to the unloading position UP as the final destination. In, transfer the test tray TT. This transfer device 270 includes a second soaking chamber 271, a pair of shutters 272, a stacking block 273, and a mover 274.

The second soaking chamber 271 accommodates the test tray TT received from the first soaking chamber 230 and maintains the thermal stimulation applied by the first soaking chamber 230 to the electronic component 271. For this reason, the internal composition of the second soaking chamber 271 is used to maintain the thermal stimulation of the electronic components or to assimilate electronic components that have not received sufficient thermal stimulation into a temperature environment according to the temperature of the test condition. As shown As shown in the partial view of 4, the second soaking chamber 271 has second inlets I/O2 formed toward the test chamber TC on the left and right sides, and the test tray TT is covered by the second inlet I/O2. Carry into the second soaking chamber 271, or carry out from the second soaking chamber 271.

As mentioned above, the second soaking chamber 271 moves forward and backward so as to be selectively located on one side of each test chamber TC. Therefore, if the second soaking chamber 271 is located at one side of the test chamber TC, the first port I/O1 and the second port I/O2 are spaced apart and face each other, so that the test tray TT passes through the first port I/O1. And the second inlet and outlet I/O2 move from the second soaking chamber 271 to the test chamber TC.

The pair of shutters 272 have substantially the same structure as the opening and closing device OC, and respectively open and close the second inlet and outlet I/O2 located on the left and right sides.

The stacking block 273 is provided on the upper side of the second soaking chamber 271, and can stack the test tray TT carried out from the test chamber TC. Such a stacking block 273 is equipped in an integrated manner with the second soaking chamber, so that it moves in the front-to-rear direction together with the second soaking chamber 271. In this embodiment, the stacking block 273 is configured to include a quadrilateral frame SF that is open in four directions, front, back, left, and right, and a support rail SR that supports and guides the test tray TT, but according to the embodiment, a housing with an opening and closing door may be used instead of the quadrilateral frame It is equipped with a chamber form. In the case of being equipped with a chamber form, it may also have a function for removing thermal stimulation applied to electronic components.

The mover 274 moves the second soaking chamber 271 in the front-rear direction in such a way that the second soaking chamber 271 is located at one side of the first soaking chamber 230 or the test chamber TC.

The supplier 280 supplies the test tray TT from the second soaking chamber 271 to the test chamber TC.

The recoverer 290 recovers the test tray TT from the test chamber TC to the stacking block 273.

In this embodiment, the following method is adopted: the structure in which the supplier 280 is equipped in the second soaking chamber 271 and the collector 290 is installed in the stacking block 273, so the supplier 280 and the collector 290 are the same as the first. The thermal chamber 271 and the stacking block 273 move together in the forward and backward directions. However, according to the embodiment, an example in which the supplier 280 and the recoverer 290 are provided corresponding to each test chamber TC may be adopted.

<Explanation for operation>

Hereinafter, the operation of the aforementioned sorting machine 200 will be described.

If the passenger piles ₁ and CT tray truck mounted together supply portion TM SP, then the loading operation for the electronic component at a time and one off the supply tray CT Embodiment ₁ sequentially supplied off _a tray CT.

The loading device 210 grasps the electronic component to be tested from the passenger tray CT ₁ and then stacks it on the test frame TF located in the supply and demand area RA via the identifier DA. In this process, the electronic components are individually identified by the identifier DA.

If the electronic components are all loaded on the test tray TF, the electronic components and the drive tester DT are electrically connected in a state where the test frame TF moves to the test area TA. And implement drive test.

If the test is completed, the test frame TF returns to the supply and demand area RA, and the loading device 210 grabs the electronic component from the test frame TF and loads it onto the test tray TT at the loading position LP. At this time, the electronic components judged to be defective in the drive test are separated to the first buffer B1.

If the electronic components are all loaded on the test tray TT at the loading position LP, the test tray TT is stored in the first soaking chamber 230 at the rear. Therefore, thermal stimulation is applied to the electronic components mounted on the test tray TT. Also, if the test tray TT moves to the second soaking chamber 271 waiting on the right side of the first soaking chamber 230, the second soaking chamber 271 moves backward and is placed where the electronic components to be tested are required to be loaded. The test tray TT is on the side of the test chamber TC. In this state, the opening and closing device OC and the shutter 272 operate to open the first port I/O1 and the second port I/O2. Next, the supply 280 operates to move the test tray TT from the soaking chamber 271 to the test chamber TC. At this time, if it is not the initial step of the operation of the sorting machine 200, the test tray TT loaded with the electronic components that have been tested is already stored in the test chamber TC. This will be explained in more detail with reference to FIG. 5.

Referring to the schematic diagram of FIG. 5, the test tray TT loaded with the electronic components that have been tested is raised in advance by the connecting device CA, and therefore the test tray TT from the second soaking chamber 271 can be carried into the test chamber TC. In the state of Figure 5, if the opening and closing device OC and the shutter 272 runs to open the first port I/O1 and the second port I/O2, and the supplier 280 runs to make the test tray TT carrying the electronic components to be tested sequentially pass through the second port I/O2 and the first port I/ O1 is supplied to the test chamber TC. In addition, in parallel with this, the collector 290 operates to collect the test tray TT on which the electronic components that have completed the test are loaded to the stacking block 273 via the first port I/O1. And, when the exchange of the test tray TT is completed, the opening and closing device OC and the shutter 272 respectively close the first port I/O1 and the second port I/O2. That is, when the opening and closing device OC is operated once, the test tray TT is exchanged between the test chamber TC and the transfer device 270. Therefore, the time interval for operating the provider 280 and at least a part of the time interval for operating the collector 290 overlap. Therefore, the time for supplying the test tray TT to the test chamber TC and the overall time for recovering the test tray TT from the test chamber TC will be correspondingly minimized, thereby minimizing the temperature environment loss in the test chamber TC. Obviously, the corresponding time minimization will also bring about an increase in processing capacity. The reason why the test tray TT can be exchanged between the test chamber TC and the transfer device 270 at the same time as described above is that the connecting device CA raises the test tray TT to be carried out from the test chamber TC, so that the The moving line ML1 of the test tray TT and the moving line ML2 of the test tray TT by the recycler 290 are separated from each other in the up and down direction.

If the exchange of the test tray TT between the test chamber TC and the transfer device 270 is completed, the second soaking chamber 271 moves forward and is located on the left side of the heat dissipation chamber 240, and the test tray TT moves to the heat dissipation chamber 240.

Next, the test tray TT moves from the heat dissipation chamber 240 to the unloading position UP, and the unloading device 250 unloads the electronic components from the test tray TT located at the unloading position UP and moves it to the passenger tray CT _{2 of the} recovery part RP. In this process, the electronic components that need to be retested move to the second buffer B2.

<References>

1. In the above embodiment, there are multiple test chambers TC and connection devices CA. However, if only one test chamber TC is provided, if the test tray TT cannot be moved directly from the first soaking chamber 230 To the test chamber TC, the present invention can also be suitably applied.

2. The sorting machine 200 according to the present invention is equipped with a first soaking chamber 230 and a second soaking chamber 271, and depending on the processing speed, the test tray TT can stay in the first soaking chamber more 230, or more stay in the second soaking chamber 271. Obviously, it does not matter which side of the first soaking chamber 230 or the second soaking chamber 271 receives more thermal stimulation on the electronic components loaded on the test tray TT. It is important that the electronic components are stored in the test chamber TC and are supplied to the test chamber TC in a state that can be tested as quickly as possible. Therefore, it is preferable to appropriately control the first soaking in consideration of the processing speed or the test speed. The temperature environment in the chamber 230 or the second soaking chamber 271.

3. In the sorting machine 200 of FIG. 2, the loading device 210 and the unloading device 250 are separately equipped to separate the loading and unloading operations. However, considering the processing speed, the loading device 210 and the unloading device can be considered 250 is constructed as a single gripping device. Obviously, in contrast to this, the loading device 210 can be divided into a first loader that moves electronic components from the passenger tray CT ₁ to the test tray TF and a second loader that moves the electronic components from the test frame TF to the test tray TT for fast loading operations. Equipped with two loaders.

4. With reference to the plan view of FIG. 2, the case where the test tray TT carried into the first soaking chamber 230 moves to the right and moves to the second soaking chamber 271 is described, but in order to ensure sufficient application of the electronic components The thermal stimulation time requires that the test tray TT stays in the first soaking chamber 230 for a long time. To this end, the following method may be adopted: the test tray TT is moved into the upper area of the first soaking chamber 230, and the test tray TT is translated downward and then moved out to the right. If the above method is adopted, a plurality of test trays TT can be accommodated in the first soaking chamber 230, and the residence time of the test trays TT in the first soaking chamber 230 becomes longer, so that the electronic components can be heated in the first soaking chamber 230. The chamber 230 receives sufficient thermal stimulation.

5. In the above, when the exchange of the test tray TT is formed between the test chamber TC and the transfer device 270, the situation in which the supply and recovery of the test tray TT is formed at the same time has been described. However, if the supply and recovery time of the supply 280 is The interval overlaps with at least a part of the time interval during which the recovery unit 290 operates, and the effect according to the present invention can be achieved corresponding to the above overlap.

As mentioned above, the specific description of the present invention is carried out by referring to the embodiments of the drawings, but the above-mentioned embodiments are only the preferred embodiments of the present invention. Therefore, it should not be understood that the present invention is limited to the above-mentioned embodiments, and the scope of rights of the present invention should be understood as the scope of patent application and its equivalent scope.

200: Sorting machine

210: loading device

230: The first soaking chamber

TC: test chamber

CA: Connect the device

OC: Opening and closing device

250: Unloading device

270: transfer device

271: The second soaking chamber

272: Shutter

273: Overload Block

274: Mover

280: Supply

290: Collector

Fig. 1 is a schematic plan view of a conventional sorting machine for testing electronic components. 2 is a schematic plan view of a sorting machine for testing electronic components according to an embodiment of the present invention. Fig. 3 is a schematic partial perspective view of a test chamber applied to the sorting machine of Fig. 2. Fig. 4 is a schematic partial perspective view of a second moving chamber applied to the sorting machine of Fig. 2. 5 is a reference diagram for explaining the exchange of test trays between the transfer device and the test chamber in the sorting machine of FIG. 2.

Domestic hosting information (please note in the order of hosting organization, date and number)

Foreign hosting information (please note in the order of hosting country, institution, date and number) None

200‧‧‧Splitting machine

210‧‧‧Loading device

220‧‧‧The first opening device

230‧‧‧The first soaking chamber

240‧‧‧Radiating chamber

250‧‧‧Unloading device

260‧‧‧Second Opening Device

270‧‧‧Transfer device

271‧‧‧Second soaking chamber

272‧‧‧Shutter

273‧‧‧Stacking block/stacking block

274‧‧‧Movers

280‧‧‧Supply

290‧‧‧Recycler

B1‧‧‧First buffer

B2‧‧‧Second buffer

CA‧‧‧Connecting device

CT ₁ 、CT ₂ ‧‧‧Passenger tray

DA‧‧‧Recognizer

DT‧‧‧Drive Tester

LP‧‧‧Loading position

OC‧‧‧Opening and closing device

OD‧‧‧Opener

RA‧‧‧Supply and demand area

RP‧‧‧Recycling part

SK‧‧‧Stacker

SP‧‧‧Supply part

TA‧‧‧Test area

TC‧‧‧Test Chamber

TF‧‧‧Test Frame/Test Tray

TM‧‧‧Truck

TT‧‧‧Test tray

UP‧‧‧Uninstall location

Claims (4)

A sorting machine for testing electronic components, which includes: a loading device for loading electronic components loaded on a passenger tray to a test tray located at a loading position; a first soaking chamber, which contains the electronic components loaded by the loading device. After the test tray of the component, thermal stimulation is applied to the electronic component; the test chamber contains the test tray from the first soaking chamber, provides a temperature environment that can test the electronic components of the stored test tray, and has The first entrance and exit of the test tray; a connecting device that electrically connects the electronic components of the test tray contained in the test chamber to the tester; an opening and closing device that opens and closes the first entrance and exit of the test chamber; an unloading device , Unloading the electronic components that have completed the test from the test tray moved to the unloading position after being removed from the test chamber; and a transfer device configured to move from the first soaking chamber to the test chamber During the process, or during the process of moving from the test chamber to the unloading position, the test tray is transferred, wherein the transfer device includes: a second soaking chamber for receiving the test tray received from the first soaking chamber After testing the tray, maintain the first soaking chamber to The thermal stimulus applied by the electronic component has a second inlet and outlet that can make the test tray in and out; a shutter that opens and closes the second inlet and outlet of the second soaking chamber; and a stacking block can be stacked from the The test tray moved out of the test chamber is equipped with the second soaking chamber as a whole; the mover moves the second soaking chamber to make the second soaking chamber Located on one side of the first soaking chamber or the test chamber, wherein the sorting machine for testing electronic components further includes: a supplier, from the second soaking chamber to the test chamber Supply a test tray; a recovery device to recover the test tray from the test chamber to the stacking block. When the second soaking chamber is located on one side of the test chamber, the first entrance and exit The second inlets and outlets are formed in a manner of being spaced apart from each other and facing each other, and before the first inlet and outlet are closed after the opening and closing device opens the first inlet and outlet, the supply and the recovery device operate to complete the test The test trays of the electronic components are recovered to the stacking block through the first entrance and exit, and will contain the electronic components that need to be tested The test tray of the component is supplied to the test chamber through the second port and the first port in sequence, so that the test tray between the test chamber and the transfer device can be realized when the opening and closing device is operated once. In order to minimize the loss of the temperature environment in the test chamber, when the test tray is exchanged between the test chamber and the transfer device, the operating time interval of the supplier and the recovery At least a part of the time interval during which the detector is running overlaps. The sorting machine for testing electronic components according to claim 1, wherein the test chamber and the connecting device are provided in a plurality, and at least one of the test chambers and the first soaking chamber Separately, the mover can enable the second soaking chamber to be located on one side of each of the test chambers. The sorting machine for testing electronic components according to claim 1, wherein the stacking block is provided on the upper side of the second soaking chamber. A sorting machine for testing electronic components, which includes: a loading device for loading electronic components loaded on a passenger tray to a test tray located at a loading position; a first soaking chamber, which is loaded by the loading device The test tray of the electronic component applies thermal stimulation to the electronic component; the test chamber contains the test tray from the first soaking chamber, provides a temperature environment that can test the electronic components of the stored test tray, and has A first port for accessing the test tray; a connecting device for electrically connecting the electronic components of the test tray contained in the test chamber to the tester; an opening and closing device for opening and closing the first port of the test chamber; unloading A device for unloading the electronic components that have been tested from the test tray moved to the unloading position after being unloaded from the test chamber; and a transfer device configured to move from the first soaking chamber to the test chamber During the process, or during the process of moving from the test chamber to the unloading position, the test tray is transferred, wherein the transfer device includes: a second soaking chamber, receiving from the first soaking chamber After the test tray, the thermal stimulus applied by the first soaking chamber to the electronic components is maintained, and there is a second entrance and exit that can allow the test tray to enter and exit; a shutter that opens and closes all of the second soaking chamber The second entrance and exit; the stacking block, which can stack the test moved out from the test chamber The tray is equipped with the second soaking chamber as a whole; the mover moves the second soaking chamber so that the second soaking chamber is located in the first soaking chamber The thermal chamber or one side of the test chamber, wherein the sorting machine for testing electronic components further includes: a supplier, which supplies a test tray from the second soaking chamber to the test chamber; and a recycler , The test tray is recovered from the test chamber to the stacking block, and when the second soaking chamber is located on one side of the test chamber, the first port and the second port are mutually It is formed in a spaced apart and opposite manner. Before the opening and closing device opens the first port and then closes the first port, the supply and the recovery device operate to load a test tray containing electronic components that have been tested. It is recovered to the stacking block via the first port, and the test tray containing the electronic components to be tested is supplied to the test chamber via the second port and the first port in sequence, so that the When the opening and closing device is operated, the test tray can be exchanged between the test chamber and the transfer device, and with the aid of the moving line and borrowing of the test tray of the supplier The moving lines of the test trays of the recovery device are separated from each other.

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