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TWI798327B - Film frame holding device and film frame holding method - Google Patents

Film frame holding device and film frame holding method Download PDF

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Publication number
TWI798327B
TWI798327B TW108100529A TW108100529A TWI798327B TW I798327 B TWI798327 B TW I798327B TW 108100529 A TW108100529 A TW 108100529A TW 108100529 A TW108100529 A TW 108100529A TW I798327 B TWI798327 B TW I798327B
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Taiwan
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film
frame
mask
distance
mentioned
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TW108100529A
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Chinese (zh)
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TW201933512A (en
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米澤良
佐藤敬行
及川昴
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日商V科技股份有限公司
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    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F1/00Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
    • G03F1/62Pellicles, e.g. pellicle assemblies, e.g. having membrane on support frame; Preparation thereof
    • G03F1/64Pellicles, e.g. pellicle assemblies, e.g. having membrane on support frame; Preparation thereof characterised by the frames, e.g. structure or material, including bonding means therefor
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F1/00Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
    • G03F1/62Pellicles, e.g. pellicle assemblies, e.g. having membrane on support frame; Preparation thereof
    • H10P72/10
    • H10P72/30

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Preparing Plates And Mask In Photomechanical Process (AREA)
  • Engineering & Computer Science (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Supplying Of Containers To The Packaging Station (AREA)

Abstract

本發明提供一種可確認薄膜確實地貼附於遮罩之薄膜框架把持裝置及薄膜框架把持方法。 使用設置於框體之薄膜把持部把持薄膜框架,使薄膜之黏著構件與遮罩抵接。將測量部配置於前端附近與遮罩重疊之第1位置而測定作為距遮罩之表面為止之距離之第1距離,且使測量部移動至前端附近與薄膜框架重疊之第2位置而測定作為距薄膜之膜為止之距離之第2距離。The invention provides a film frame holding device and a film frame holding method capable of confirming that a film is firmly attached to a mask. The film frame is held by the film holding part provided on the frame, so that the adhesive member of the film is in contact with the mask. The measuring part is arranged at the first position near the front end overlapping with the mask to measure the first distance as the distance from the surface of the mask, and the measuring part is moved to the second position near the front end overlapping the film frame and measured as The second distance is the distance from the film to the film.

Description

薄膜框架把持裝置及薄膜框架把持方法Film frame holding device and film frame holding method

本發明係關於一種薄膜框架把持裝置及薄膜框架把持方法。 The invention relates to a film frame holding device and a film frame holding method.

專利文獻1中記載有一種薄膜框架把持裝置,其藉由將薄膜把持構件插入至形成於薄膜框架周緣之溝槽中而把持薄膜,將所把持之薄膜與沿大致豎直方向把持之光罩之位置對準,並將薄膜按壓至光罩,藉此將薄膜貼附於光罩。 Patent Document 1 discloses a film frame holding device that holds a film by inserting a film holding member into a groove formed on the periphery of the film frame, and holds the film between the held film and the photomask held approximately vertically. Align the position, and press the film to the photomask, thereby attaching the film to the photomask.

[先前技術文獻] [Prior Art Literature]

[專利文獻] [Patent Document]

[專利文獻1]國際公開第2016/133054號 [Patent Document 1] International Publication No. 2016/133054

於專利文獻1所記載之發明中,於將薄膜貼附於光罩後,藉由將薄膜把持構件自溝槽中取下而鬆開薄膜,但若於薄膜未確實地貼附於光罩之狀態下將薄膜鬆開,則有薄膜掉落之虞。 In the invention described in Patent Document 1, after attaching the film to the photomask, the film is loosened by removing the film holding member from the groove, but if the film is not firmly attached to the photomask If the film is loosened in this state, there is a risk that the film will fall.

本發明係鑒於此種情況而完成者,其目的在於提供一種可確認薄膜確實地貼附於遮罩之薄膜框架把持裝置及薄膜框架把持方法。 The present invention has been made in view of such circumstances, and an object of the present invention is to provide a film frame holding device and a film frame holding method capable of confirming that a film is reliably attached to a mask.

為了解決上述課題,本發明之薄膜框架把持裝置,係把持如下薄膜而將上述薄膜貼附於沿大致豎直方向保持之大致板狀之遮罩,上述薄膜例如具有大致中空筒狀之薄膜框架、以覆蓋上述薄膜框架之中空部之方式設置於與上述薄膜框架之外周面大致正交之第1面之薄膜之膜、及設置於與上述第1面大致平行之第2面之黏著構件,其特徵在於,具備:作為將複數根棒材組合為大致矩形形狀而成之框狀之構件之框體,設置於上述框體且把持上述薄膜框架之上述外周面之薄膜把持部,設置於上述框體之測量部,及控制上述框體、上述薄膜把持部及上述測量部之控制部,上述測量部以可於前端附近與上述遮罩重疊之第1位置和上述前端附近與上述薄膜框架重疊之第2位置之間移動之方式設置,自與上述棒材之延設方向大致正交之方向觀察,上述薄膜把持部與上述測量部係設置於不同之位置,上述控制部於上述薄膜把持部把持上述薄膜框架、且將上述框體沿大致垂直方向延設並且使上述黏著構件與上述遮罩抵接之狀態下,將上述測量部配置於上述第1位置而測定作為距上述遮罩之表面為止之距離之第1距離,使上述測量部移動至上述第2位置而測定作為距上述薄膜之膜為止之距離之第2距離。 In order to solve the above-mentioned problems, the film frame holding device of the present invention is to hold the following film and attach the above-mentioned film to a substantially plate-shaped mask maintained in a substantially vertical direction. The above-mentioned film has, for example, a substantially hollow cylindrical film frame, The film of the film provided on the first surface substantially perpendicular to the outer peripheral surface of the above-mentioned film frame so as to cover the hollow portion of the above-mentioned film frame, and the adhesive member provided on the second surface substantially parallel to the above-mentioned first surface, wherein It is characterized by comprising: a frame body which is a frame-shaped member formed by combining a plurality of rods into a substantially rectangular shape; The measurement part of the body, and the control part that controls the above-mentioned frame body, the above-mentioned film holding part and the above-mentioned measurement part, the above-mentioned measurement part can overlap the first position with the above-mentioned mask near the front end and overlap with the above-mentioned film frame near the front end The method of moving between the second positions is set, and when viewed from a direction approximately perpendicular to the extension direction of the above-mentioned rod, the above-mentioned film holding part and the above-mentioned measuring part are arranged at different positions, and the above-mentioned control part is held by the above-mentioned film holding part The above-mentioned film frame and the above-mentioned frame body are extended in a substantially vertical direction and the above-mentioned adhesive member is in contact with the above-mentioned mask, and the above-mentioned measuring part is arranged at the above-mentioned first position to measure the distance from the surface of the above-mentioned mask. The first distance of the distance is to move the above-mentioned measuring part to the above-mentioned second position to measure the second distance which is the distance from the film of the above-mentioned thin film.

根據本發明之薄膜框架把持裝置,使黏著構件與遮罩抵接,將測量部配置於前端附近與遮罩重疊之第1位置而測定作為距遮罩之表面為止之距離之第1距離,使測量部移動至前端附近與上述薄膜框架重疊之第2位置而測定作為距薄膜之膜為止之距離之第2距離。藉此,可確認薄膜確實地貼附於遮罩。 According to the film frame gripping device of the present invention, the adhesive member is brought into contact with the mask, the measuring unit is arranged at the first position overlapping the mask near the front end, and the first distance as the distance from the surface of the mask is measured, so that The measurement unit moves to the second position where the vicinity of the front end overlaps with the film frame, and measures the second distance which is the distance from the film of the film. Thereby, it can be confirmed that the film is reliably attached to the mask.

上述薄膜把持部可具有以可於與上述外周面抵接之抵接位置和不與上述外周面抵接之退避位置之間沿水平方向或垂直方向移動之方式設置之薄膜把持構件,上述框體可沿水平方向移動,上述控制部於將上述薄膜把持構件配置於上述抵接位置而把持上述薄膜框架且將上述框體沿大致垂直方向延設 之狀態下,使上述框體沿水平方向移動而使上述黏著構件與上述遮罩抵接,將上述測量部配置於上述第1位置而測定上述第1距離,且使上述測量部移動至上述第2位置而測定上述第2距離,於上述第1距離與上述第2距離之差為閾值以下之情形時,使上述薄膜把持構件可自上述抵接位置向上述退避位置移動。藉此,可防止於薄膜未確實地貼附於遮罩之狀態(第1距離與第2距離之差不為閾值以下之情形)時薄膜被鬆開而掉落之情況。 The film gripping portion may have a film gripping member that can move horizontally or vertically between a contact position that contacts the outer peripheral surface and a retracted position that does not contact the outer peripheral surface, and the frame body The control unit is capable of moving in the horizontal direction, and the control unit arranges the film holding member at the contact position to hold the film frame and extend the frame body in a substantially vertical direction. In this state, the frame is moved in the horizontal direction to bring the adhesive member into contact with the mask, the measuring unit is arranged at the first position to measure the first distance, and the measuring unit is moved to the first position. The second distance is measured at two positions, and when the difference between the first distance and the second distance is equal to or less than a threshold value, the film holding member can be moved from the contact position to the retracted position. Thereby, it is possible to prevent the film from being loosened and falling when the film is not firmly attached to the mask (the difference between the first distance and the second distance is not equal to or less than the threshold value).

上述測量部可於使上述黏著構件與上述遮罩抵接時之姿勢下具有設置於上述框體之上側附近且左端附近之第1測量部、及設置於上述框體之上側附近且右端附近之第2測量部。藉此,測量部可測定遮罩或薄膜之上端部、以及左右兩端附近之點。又,於將薄膜貼附於遮罩時,可發現貼附薄膜之一端而未貼附薄膜之另一端之異常。 The measurement unit may have a first measurement unit provided near the upper side and near the left end of the frame, and a first measurement unit provided near the upper side and near the right end of the frame when the adhesive member is brought into contact with the mask. 2nd measurement department. Thereby, the measurement unit can measure the upper end of the mask or the film, and the points near the left and right ends. Also, when attaching the film to the mask, it can be found that one end of the film is attached but the other end of the film is not attached.

上述框體可於使上述黏著構件與上述遮罩抵接時之姿勢下具有大致豎直地延設之大致棒狀之第1縱框部及第2縱框部、以及大致水平地延設於上述第1縱框部及上述第2縱框部之上端附近之上框部,上述第1縱框部及上述第2縱框部可沿上述上框部之延設方向移動,上述上框部可沿上述第1縱框部及上述第2縱框部之延設方向移動,上述薄膜把持部係設置於上述第1縱框部及上述第2縱框部,上述測量部係設置於上述上框部。藉此,可改變由第1縱框部、第2縱框部、上框部構成之框之大小,而應對各種大小之薄膜。又,可不論薄膜之大小而皆於薄膜之上端附近之位置測定薄膜之膜之高度。 The frame body may have a substantially rod-shaped first vertical frame portion and a second vertical frame portion extending substantially vertically in a posture when the adhesive member is brought into contact with the mask, and a substantially horizontally extending frame portion. The upper frame portion near the upper end of the first vertical frame portion and the second vertical frame portion, the first vertical frame portion and the second vertical frame portion can move along the extending direction of the upper frame portion, and the upper frame portion Can move along the extension direction of the first vertical frame part and the second vertical frame part, the film holding part is installed on the first vertical frame part and the second vertical frame part, and the measuring part is installed on the upper box part. Thereby, the size of the frame constituted by the first vertical frame portion, the second vertical frame portion, and the upper frame portion can be changed to cope with films of various sizes. Also, the film height of the film can be measured at a position near the upper end of the film regardless of the size of the film.

上述框體可具有大致水平地延設於上述第1縱框部及上述第2縱框部之下端附近之下框部,上述測量部可具有設置於上述下框部之第3測量部。藉此,可更確實地確認是否貼附薄膜。 The frame body may have a lower frame portion extended substantially horizontally near the lower ends of the first vertical frame portion and the second vertical frame portion, and the measurement unit may have a third measurement portion provided on the lower frame portion. In this way, it is possible to more reliably confirm whether or not the film is attached.

上述框體能以於使上述黏著構件與上述遮罩抵接時上端側之上述第2面與上述遮罩之距離較下端側之上述第2面與上述遮罩之距離更近之方式 傾斜。藉此,可防止產生黏著構件與遮罩局部抵接而無法將薄膜貼附於遮罩之問題。又,藉由將薄膜之上端部貼附於遮罩,根據在遮罩及薄膜之上端附近測定遮罩之表面之高度及薄膜之膜之高度所獲得之結果判定薄膜是否貼附於遮罩,而可準確地判定薄膜之貼附狀態。 The frame body can be configured such that the distance between the second surface on the upper end side and the mask is closer than the distance between the second surface on the lower end side and the mask when the adhesive member is brought into contact with the mask. tilt. Thereby, it is possible to prevent the problem that the adhesive member and the mask partially abut and the film cannot be attached to the mask. Also, by attaching the upper end of the film to the mask, it is determined whether the film is attached to the mask based on the results obtained by measuring the height of the surface of the mask and the height of the film of the film near the upper end of the mask and the film, It can accurately determine the sticking state of the film.

為了解決上述課題,本發明之薄膜框架把持方法,係把持薄膜而將其貼附於保持於大致豎直方向上之大致板狀之遮罩,上述薄膜例如具有大致中空筒狀之薄膜框架、以覆蓋上述薄膜框架之中空部之方式設置於與上述薄膜框架之外周面大致正交之第1面之薄膜之膜、及設置於與上述第1面大致平行之第2面之黏著構件,其特徵在於:其將以可沿水平方向移動之方式設置於框體之薄膜把持構件配置於與上述外周面抵接之抵接位置而把持上述薄膜框架,於把持上述薄膜框架之狀態下使上述框體平行移動而使上述黏著構件與上述遮罩抵接,將設置於上述框體之測量部配置於前端附近與上述遮罩重疊之第1位置,測定作為距上述遮罩之表面為止之距離之第1距離,使上述測量部移動至上述前端附近與上述薄膜框架重疊之第2位置,測定作為距上述薄膜之膜為止之距離之第2距離,於上述第1距離與上述第2距離之差為閾值以下之情形時,使上述薄膜把持構件可自上述抵接位置向不與上述外周面抵接之退避位置移動。 In order to solve the above problems, the film frame holding method of the present invention is to hold the film and attach it to a substantially plate-shaped mask maintained in a substantially vertical direction. The above-mentioned film has, for example, a substantially hollow cylindrical film frame, and The film of the film provided on the first surface substantially perpendicular to the outer peripheral surface of the above-mentioned film frame in such a manner as to cover the hollow portion of the above-mentioned film frame, and the adhesive member provided on the second surface substantially parallel to the above-mentioned first surface are characterized in that In that, it arranges the film holding member provided on the frame so as to be movable in the horizontal direction at the abutting position against the above-mentioned outer peripheral surface to hold the above-mentioned film frame, and make the above-mentioned frame body in the state of holding the above-mentioned film frame. The above-mentioned adhesive member is moved parallel to the above-mentioned mask, and the measuring part provided on the above-mentioned frame is arranged at the first position overlapping the above-mentioned mask near the front end, and the second distance as the distance from the surface of the above-mentioned mask is measured. 1 distance, the above-mentioned measuring part is moved to the second position where the vicinity of the above-mentioned front end overlaps with the above-mentioned film frame, and the second distance is measured as the distance from the film of the above-mentioned film. The difference between the above-mentioned first distance and the above-mentioned second distance is When it is below the threshold value, the film gripping member can be moved from the contact position to the retreat position where it does not come into contact with the outer peripheral surface.

根據本發明,可確認將薄膜確實地貼附於光罩。 According to the present invention, it can be confirmed that the film is reliably attached to the photomask.

1:薄膜框架把持裝置 1: film frame holding device

10:框體 10: frame

11、12:縱框部 11, 12: Vertical frame part

13、14:上框部 13, 14: Upper frame part

15:框 15: box

15a:下端部 15a: lower end

15b:上端部 15b: upper end

16:驅動部 16: Drive Department

20:薄膜把持部 20: film holding part

21:薄膜把持構件 21: film holding member

22:驅動構件 22: Drive components

22a:桿 22a: Rod

22b:致動器 22b: Actuator

30:測量部 30: Measurement department

31:超音波感測器 31: Ultrasonic sensor

32:反射板 32: reflector

32a:反射部 32a: reflection part

33:致動器 33: Actuator

100:薄膜 100: film

101:薄膜框架 101: Film frame

101a:上表面 101a: upper surface

101b:下表面 101b: lower surface

101c:外周面 101c: outer peripheral surface

101d:溝槽 101d: Groove

101e:中空部 101e: hollow part

102:薄膜之膜 102: Membrane of Membrane

103:黏著構件 103: Adhesive components

151:CPU 151: CPU

151a:控制部 151a: Control Department

152:RAM 152: RAM

153:ROM 153:ROM

154:輸入輸出介面 154: Input and output interface

155:通訊介面 155: communication interface

156:媒體介面 156:Media interface

161:輸入輸出裝置 161: Input and output device

162:網路 162: Network

163:儲存媒體 163: storage media

M:遮罩 M: mask

圖1係表示第1實施形態之薄膜框架把持裝置1之概略之前視圖。 Fig. 1 is a schematic front view showing a film frame holding device 1 according to a first embodiment.

圖2係表示薄膜100之概略之立體圖。 FIG. 2 is a perspective view schematically showing the film 100 .

圖3係圖2之A-A剖面圖。 Fig. 3 is the A-A sectional view of Fig. 2 .

圖4係表示薄膜把持部20之概略之圖。 FIG. 4 is a diagram showing the outline of the film holding unit 20 .

圖5係示意性地表示測量部30位於第1位置之狀態之圖。 FIG. 5 is a diagram schematically showing a state where the measuring unit 30 is located at the first position.

圖6係示意性地表示測量部30位於第2位置之狀態之圖。 FIG. 6 is a diagram schematically showing a state where the measurement unit 30 is located at the second position.

圖7係表示薄膜框架把持裝置1之電氣構成之方塊圖。 FIG. 7 is a block diagram showing the electrical configuration of the film frame holding device 1. As shown in FIG.

圖8係表示薄膜框架把持裝置1所進行之處理之流程之流程圖。 FIG. 8 is a flow chart showing the flow of processing performed by the film frame holding device 1 .

圖9係表示步驟S107之處理之流程之流程圖。 FIG. 9 is a flowchart showing the flow of processing in step S107.

圖10係表示步驟S107所示之檢查時之情況之示意圖。 FIG. 10 is a schematic diagram showing the situation during the inspection shown in step S107.

圖11係表示步驟S107所示之檢查時之情況之示意圖。 FIG. 11 is a schematic diagram showing the situation during the inspection shown in step S107.

以下,參照圖式對本發明之實施形態進行詳細說明。於各圖式中,對相同之要素標註相同之符號,對於重複之部分省略說明。 Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings. In each figure, the same code|symbol is attached|subjected to the same element, and description of the part which overlaps is abbreviate|omitted.

〈第1實施形態〉 <First Embodiment>

圖1係表示第1實施形態之薄膜框架把持裝置1之概略之前視圖。薄膜框架把持裝置1係將薄膜100貼附於保持於大致豎直方向上之大致板狀之遮罩M者。遮罩M藉由未圖示之遮罩把持裝置而保持於大致豎直方向上。 Fig. 1 is a schematic front view showing a film frame holding device 1 according to a first embodiment. The film frame holding device 1 is for attaching the film 100 to a substantially plate-shaped mask M held in a substantially vertical direction. The mask M is held in a substantially vertical direction by a mask holding device not shown.

首先,對薄膜100進行說明。圖2係表示薄膜100之概略之立體圖。圖3係圖2之A-A剖面圖。薄膜100主要具有薄膜框架101、撐設於薄膜框架101上之薄膜之膜102、及於薄膜框架101形成於下表面之黏著構件103(參照圖3)。 First, the film 100 will be described. FIG. 2 is a perspective view schematically showing the film 100 . Fig. 3 is the A-A sectional view of Fig. 2 . The film 100 mainly has a film frame 101 , a film 102 of the film supported on the film frame 101 , and an adhesive member 103 formed on the lower surface of the film frame 101 (see FIG. 3 ).

薄膜框架101係具有大致矩形之外周之框狀(大致中空筒狀),由例如鐵、鋁等金屬所形成。薄膜框架101於俯視(自圖2之紙面上方觀察)下為大致矩形形狀,於中央部具有中空部101e。於薄膜框架101以覆蓋中空部101e 之方式設置薄膜之膜102。薄膜框架101中,中空部101e之大小與光罩之大小(例如520mm×800mm~1620mm×1780mm左右)為相同程度。薄膜框架101之框狀部分之寬度為數十mm左右,厚度為2mm~10mm左右。 The film frame 101 is a frame shape (a substantially hollow cylindrical shape) having a substantially rectangular outer periphery, and is formed of metal such as iron or aluminum. The film frame 101 has a substantially rectangular shape in plan view (viewed from the upper side of the paper in FIG. 2 ), and has a hollow portion 101e in the center. on the film frame 101 to cover the hollow portion 101e The film 102 of the thin film is set in the same way. In the film frame 101, the size of the hollow portion 101e is about the same as the size of the photomask (for example, about 520 mm×800 mm to 1620 mm×1780 mm). The width of the frame-shaped portion of the film frame 101 is about tens of mm, and the thickness is about 2 mm to 10 mm.

薄膜框架101具有大致平行之上表面101a及下表面101b。又,與薄膜框架101之上表面101a及下表面101b正交之外周面101c包含溝槽101d。溝槽101d係沿外周面101c形成,高度及深度為2mm左右。於溝槽101d中插入設置於框體10之薄膜把持構件21(下文詳細說明)。 The film frame 101 has a substantially parallel upper surface 101a and a lower surface 101b. Also, the outer peripheral surface 101c perpendicular to the upper surface 101a and the lower surface 101b of the film frame 101 includes a groove 101d. The groove 101d is formed along the outer peripheral surface 101c, and the height and depth are about 2 mm. A film holding member 21 provided on the frame body 10 (details described below) is inserted into the groove 101d.

薄膜之膜102為次微米之厚度之薄膜。薄膜之膜102係以覆蓋薄膜框架101之中空部101e之方式撐設於薄膜框架101之上表面101a。若將薄膜框架101貼附於光罩基板上,則薄膜之膜102與遮罩M之圖案形成面(表面)以既定之間隔設置。 The film of thin film 102 is a thin film of sub-micron thickness. The film 102 of the film is supported on the upper surface 101a of the film frame 101 in such a way as to cover the hollow portion 101e of the film frame 101 . When the film frame 101 is attached to the photomask substrate, the film 102 of the film and the pattern forming surface (surface) of the mask M are provided at a predetermined interval.

黏著構件103係設置於薄膜框架101之下表面101b。黏著構件103以邊框狀形成於薄膜框架101之整個周邊。又,黏著構件103以不自薄膜框架101伸出之方式設置。 The adhesive member 103 is disposed on the lower surface 101b of the film frame 101 . The adhesive member 103 is formed on the entire periphery of the film frame 101 in a frame shape. Also, the adhesive member 103 is provided so as not to protrude from the film frame 101 .

返回至圖1之說明。薄膜框架把持裝置1主要具有框體10、薄膜把持部20、及測量部30。薄膜把持部20及測量部30係設置於框體10。 Return to the description of FIG. 1 . The film frame gripping device 1 mainly includes a frame body 10 , a film gripping unit 20 , and a measuring unit 30 . The film holding unit 20 and the measuring unit 30 are provided on the frame body 10 .

框體10係將複數根棒材組合為大致矩形形狀而成之框狀之構件。框體10主要具有縱框部11、12、上框部13、14、以及設置於縱框部11、12及上框部13、14之外側之框15。縱框部11、12、上框部13、14及框15係由例如鐵、鋁等金屬形成。 The frame body 10 is a frame-shaped member formed by combining a plurality of rods into a substantially rectangular shape. The frame body 10 mainly includes vertical frame portions 11 , 12 , upper frame portions 13 , 14 , and a frame 15 provided outside the vertical frame portions 11 , 12 and the upper frame portions 13 , 14 . The vertical frame parts 11 and 12, the upper frame parts 13 and 14, and the frame 15 are formed of metals such as iron and aluminum, for example.

縱框部11、12係於圖1所示之將薄膜100貼附於遮罩M(使黏著構件103與遮罩M抵接)時之姿勢下大致豎直地延設之大致棒狀之構件,長度方向沿z方向設置。縱框部11、12係以可沿框15之下端部15a及上端部15b、即沿x方向移動之方式設置。使縱框部11、12沿x方向移動之機構可使用已公知之各 種技術。 The vertical frame parts 11 and 12 are substantially rod-shaped members extending substantially vertically in the posture shown in FIG. , the length direction is set along the z direction. The vertical frame parts 11 and 12 are provided so as to be movable along the lower end part 15a and the upper end part 15b of the frame 15, that is, in the x direction. The mechanisms that make the vertical frame parts 11, 12 move along the x direction can use known various technology.

上框部13、14分別為於圖1所示之將薄膜100貼附於遮罩M時之姿勢下大致水平地延設於縱框部11、12之上端附近之大致棒狀之構件,長度方向沿x方向設置。上框部13、14係分別以可沿縱框部11、12、即沿z方向移動之方式設置。使上框部13、14沿z方向移動之機構可使用已公知之各種技術。 The upper frame parts 13, 14 are substantially rod-shaped members extending substantially horizontally near the upper ends of the vertical frame parts 11, 12 in the posture when the film 100 is attached to the mask M shown in FIG. The direction is set along the x direction. The upper frame parts 13, 14 are provided so as to be movable along the vertical frame parts 11, 12, ie, along the z direction, respectively. As a mechanism for moving the upper frame parts 13 and 14 in the z direction, various known techniques can be used.

此外,上框部13、14之形態並不限於此。例如,亦可為上框部由大致水平地延設之1根棒材所構成,該1根棒材之兩端附近設置於縱框部11、12。 In addition, the form of the upper frame part 13,14 is not limited to this. For example, the upper frame portion may be constituted by a single rod extended approximately horizontally, and the vicinity of both ends of the single rod may be provided in the vertical frame portions 11 and 12 .

如上所述,藉由使縱框部11、12及上框部13、14可移動,而可改變由縱框部11、12、上框部13、14及下端部15a所構成之框之大小,從而應對各種大小之薄膜100。此外,薄膜100例如可列舉420mm×720mm之大小者、700mm×800mm之大小者、520mm×680mm之大小者、750mm×1300mm之大小者、1520mm×1680mm之大小者。 As described above, by making the vertical frame portions 11, 12 and the upper frame portions 13, 14 movable, the size of the frame formed by the vertical frame portions 11, 12, the upper frame portions 13, 14, and the lower end portion 15a can be changed. , so as to deal with films 100 of various sizes. In addition, the film 100 includes, for example, a size of 420 mm×720 mm, a size of 700 mm×800 mm, a size of 520 mm×680 mm, a size of 750 mm×1300 mm, and a size of 1520 mm×1680 mm.

框體10係以可藉由未圖示之移動機構而沿水平方向移動之方式設置。於將薄膜100貼附於遮罩M時,框體10係沿+y方向平行移動。框體10具有驅動部16(參照圖7)、及使框體10沿水平方向移動之機構。使框體10沿水平方向移動之機構係公知,因此省略說明。 The housing 10 is provided so as to be movable in the horizontal direction by a movement mechanism not shown. When attaching the film 100 to the mask M, the frame body 10 moves in parallel along the +y direction. The housing 10 has a drive unit 16 (see FIG. 7 ) and a mechanism for moving the housing 10 in the horizontal direction. The mechanism for moving the frame body 10 in the horizontal direction is well known, so the description is omitted.

又,框體10於下端部附近設置未圖示之轉動軸。框體10能以轉動軸為中心,於由框15形成之面成為大致水平(與xy平面大致平行)之位置與由框15形成之面成為大致豎直(與xz平面大致平行)之位置之間轉動。於圖1中,於框體10把持薄膜100之狀態下,框體10以上端側(+z側)之下表面101b(圖1中之紙面內側)與遮罩M之距離較下端側(-z側)之下表面101b與上述遮罩之距離更近之方式相對於豎直方向傾斜。 In addition, the frame body 10 is provided with an unillustrated rotation shaft near the lower end. The frame body 10 can be centered on the rotation axis at a position where the plane formed by the frame 15 is approximately horizontal (approximately parallel to the xy plane) and at a position where the plane formed by the frame 15 is approximately vertical (approximately parallel to the xz plane). rotate between. In FIG. 1, in the state where the frame body 10 holds the film 100, the distance between the upper end side (+z side) and the lower surface 101b (the inner side of the paper in FIG. 1 ) of the frame body 10 and the mask M is smaller than the lower end side (-z side). The lower surface 101b on side z) is inclined relative to the vertical direction in such a way that the distance between the lower surface 101b and the above-mentioned mask is closer.

薄膜把持部20具有複數個把持薄膜框架101之外周面101c之薄膜 把持構件21。薄膜把持構件21係設置於縱框部11、12、上框部13、14、下端部15a及上端部15b。 The film holding part 20 has a plurality of films that hold the outer peripheral surface 101c of the film frame 101 Hold the member 21 . The film gripping member 21 is provided in the vertical frame parts 11 and 12, the upper frame parts 13 and 14, the lower end part 15a, and the upper end part 15b.

於圖1所示之例中,於縱框部11、12分別設置5個薄膜把持構件21,於上框部13、14分別設置1個薄膜把持構件21,於下端部15a設置5個薄膜把持構件21,於上端部15b設置1個薄膜把持構件21,但薄膜把持構件21之位置及數量並不限於此。 In the example shown in FIG. 1, five film holding members 21 are respectively provided on the vertical frame parts 11 and 12, one film holding member 21 is respectively provided on the upper frame parts 13 and 14, and five film holding members 21 are provided on the lower end part 15a. As for the member 21, one film holding member 21 is provided at the upper end portion 15b, but the position and number of the film holding members 21 are not limited to this.

根據薄膜100之大小,所使用之薄膜把持構件21有所不同。於圖1中,設置於框體10之薄膜把持構件21中,僅使用抵接於薄膜100(此處為外周面101c)之薄膜把持構件21。 Depending on the size of the film 100, the film holding member 21 used varies. In FIG. 1 , among the film holding members 21 provided in the frame body 10 , only the film holding member 21 that is in contact with the film 100 (here, the outer peripheral surface 101 c ) is used.

薄膜把持構件21以能於與外周面101c抵接之抵接位置和不與外周面101c抵接之退避位置之間沿水平方向或垂直方向移動之方式設置。圖4係表示薄膜把持部20之概略之圖。 The film gripping member 21 is provided so as to be able to move horizontally or vertically between a contact position where it contacts the outer peripheral surface 101c and a retracted position where it does not contact the outer peripheral surface 101c. FIG. 4 is a diagram showing the outline of the film holding unit 20 .

薄膜把持構件21係由金屬製之板材形成。此外,薄膜把持構件21並不限於板狀之構件,例如亦可使用棒狀之構件而形成。 The film holding member 21 is formed of a metal plate. In addition, the film holding member 21 is not limited to a plate-shaped member, For example, it can also be formed using a rod-shaped member.

於薄膜把持構件21設置驅動構件22。驅動構件22具有桿22a、及使桿22a移動之致動器22b。薄膜把持構件21係連結於桿22a。致動器22b係設置於框體10(圖4中省略圖示)。 The drive member 22 is provided on the film holding member 21 . The driving member 22 has a rod 22a and an actuator 22b that moves the rod 22a. The film holding member 21 is connected to the rod 22a. The actuator 22b is provided in the housing 10 (not shown in FIG. 4 ).

薄膜把持構件21藉由驅動構件22而於將薄膜把持構件21插入至溝槽101d中之插入位置(參照圖4實線)與未將薄膜把持構件21插入至溝槽101d中而薄膜把持構件21不與薄膜框架101干涉之退避位置(參照圖4一點鎖線)之間沿水平方向移動。 The film holding member 21 is at the insertion position (refer to the solid line in FIG. 4 ) where the film holding member 21 is inserted into the groove 101d by the driving member 22 and the film holding member 21 is not inserted into the groove 101d. It moves in the horizontal direction between retracted positions (refer to the dot lock line in FIG. 4 ) that do not interfere with the film frame 101 .

薄膜把持構件21之前端藉由以樹脂(例如,超高分子量聚乙烯)形成之片材等所覆蓋。藉此,於將薄膜把持構件21插入至溝槽101d中時,可防止薄膜把持構件21或薄膜框架101被磨削而產生塵屑。 The front end of the film holding member 21 is covered with a sheet or the like formed of resin (for example, ultra-high molecular weight polyethylene). Thereby, when the film holding member 21 is inserted into the groove 101d, it is possible to prevent the film holding member 21 or the film frame 101 from being ground to generate dust.

返回至圖1之說明。測量部30測定遮罩M或薄膜框架101之高度(y方向之位置)。測量部30係設置於框體10(此處為上框部13、14)。測量部30係設置於不與薄膜把持構件21干涉之位置。換言之,自與構成框體10之棒材(例如,上框部13、14)之延設方向大致正交之方向(此處為y方向)觀察,測量部30與薄膜把持構件21係設置於不同之位置。 Return to the description of FIG. 1 . The measuring unit 30 measures the height (position in the y direction) of the mask M or the film frame 101 . The measurement part 30 is provided in the frame body 10 (here, the upper frame parts 13 and 14). The measurement unit 30 is provided at a position where it does not interfere with the film holding member 21 . In other words, when viewed from a direction (here, the y direction) substantially perpendicular to the direction in which the rods (for example, the upper frame parts 13 and 14) constituting the frame body 10 are extended, the measuring part 30 and the film holding member 21 are arranged on different locations.

測量部30係以可於前端附近與遮罩M重疊之第1位置(參照圖1實線)與前端附近與薄膜框架101重疊之第2位置(參照圖1二點鎖線)之間沿垂直方向移動之方式設置。 The measurement part 30 is in the vertical direction between the first position (refer to the solid line in FIG. 1 ) that overlaps the mask M near the front end and the second position (refer to the two-point lock line in FIG. 1 ) that overlaps the film frame 101 near the front end. The method of movement is set.

設置於上框部13之測量部30係設置於縱框部11之附近,設置於上框部14之測量部30係設置於縱框部12之附近。換言之,2個測量部30係分別設置於框體10之上側附近且左端附近,且設置於框體10之上側附近且右端附近。藉此,測量部30可測定遮罩M或薄膜框架101之上端部、且左右兩端附近之點。但設置測量部30之位置及數量並不限於圖1所示之形態。 The measurement part 30 provided on the upper frame part 13 is provided near the vertical frame part 11 , and the measurement part 30 provided on the upper frame part 14 is provided near the vertical frame part 12 . In other words, the two measurement units 30 are respectively provided near the upper side and near the left end of the housing 10 , and are provided near the upper side and near the right end of the housing 10 . Thereby, the measurement part 30 can measure the upper end part of the mask M or the film frame 101, and the point near both left and right ends. However, the position and number of the measuring units 30 are not limited to those shown in FIG. 1 .

圖5係示意性地表示測量部30位於第1位置之狀態之圖。圖6係示意性地表示測量部30位於第2位置之狀態之圖。 FIG. 5 is a diagram schematically showing a state where the measuring unit 30 is located at the first position. FIG. 6 is a diagram schematically showing a state where the measurement unit 30 is located at the second position.

測量部30主要具有超音波感測器31、及反射板32。超音波感測器31係向對象物發送超音波並接收其反射波,根據訊號發送與反射波接收之時間間隔測定距目標物之距離之測距感測器。超音波感測器31已公知,因此省略詳細之說明。 The measurement unit 30 mainly includes an ultrasonic sensor 31 and a reflector 32 . The ultrasonic sensor 31 is a distance measuring sensor that sends ultrasonic waves to the object and receives its reflected waves, and measures the distance to the target object according to the time interval between signal sending and reflected wave reception. The ultrasonic sensor 31 is known, so detailed description is omitted.

反射板32將由超音波感測器31發送之超音波進行反射。藉由將反射板32之反射部32a於yz平面上傾斜45度地設置,而於反射部32a中將自超音波感測器31向下(朝向-z)發送之超音波向+y方向反射(參照圖5、6中之2點鎖線)。 The reflection plate 32 reflects the ultrasonic wave sent by the ultrasonic sensor 31 . By setting the reflection part 32a of the reflection plate 32 at an inclination of 45 degrees on the yz plane, the ultrasonic wave sent downward (towards -z) from the ultrasonic sensor 31 is reflected in the +y direction in the reflection part 32a (Refer to the 2-point lock line in Figures 5 and 6).

此外,於本實施形態中,測量部30具有超音波感測器31,但用 以求出距離之感測器並不限於超音波感測器31。作為測距感測器,亦可使用利用光求距離之光學式感測器、或渦電流式之感測器。作為光學式感測器,例如可使用利用雷射之雷射位移感測器、或三角測距式光學感測器。但較理想為使用非接觸式之感測器作為測量部30。又,於本實施形態中設置有反射板32,但亦可不使用反射板32。於此情形時,以向+y方向發送超音波之方式設置超音波感測器31即可。 In addition, in this embodiment, the measurement unit 30 has an ultrasonic sensor 31, but The sensor for calculating the distance is not limited to the ultrasonic sensor 31 . As the distance measuring sensor, an optical sensor that uses light to find the distance, or an eddy current sensor can also be used. As an optical sensor, for example, a laser displacement sensor using a laser or a triangulation distance measuring optical sensor can be used. However, it is preferable to use a non-contact sensor as the measuring unit 30 . In addition, although the reflection plate 32 is provided in this embodiment, the reflection plate 32 may not be used. In this case, it is sufficient to install the ultrasonic sensor 31 so as to transmit ultrasonic waves in the +y direction.

測量部30具有致動器33。致動器33使超音波感測器31及反射板32於第1位置與第2位置之間沿z方向(垂直方向)移動。 The measuring unit 30 has an actuator 33 . The actuator 33 moves the ultrasonic sensor 31 and the reflection plate 32 along the z direction (vertical direction) between the first position and the second position.

於圖5中,測量部30之測量位置(此處為測量部30之前端(-z端))附近與遮罩M重疊。因此,自超音波感測器31發送之超音波到達遮罩M之表面Ma,測量部30測定反射部32a與表面Ma之距離、即表面Ma之高度(y方向之位置)。 In FIG. 5 , the vicinity of the measurement position of the measurement unit 30 (here, the front end (-z end) of the measurement unit 30 ) overlaps the mask M. Therefore, the ultrasonic wave transmitted from the ultrasonic sensor 31 reaches the surface Ma of the mask M, and the measurement unit 30 measures the distance between the reflection portion 32a and the surface Ma, that is, the height of the surface Ma (position in the y direction).

於圖6中,測量部30之測量位置(此處為測量部30之前端(-z端))附近與薄膜框架101重疊。因此,自超音波感測器31發送之超音波到達薄膜之膜102,測量部30測定反射部32a與薄膜之膜102之距離、即薄膜之膜102之高度。於將薄膜100貼附於遮罩M之情形時,遮罩M之高度與薄膜之膜102之高度之差成為閾值以下。 In FIG. 6 , the vicinity of the measurement position of the measurement unit 30 (here, the front end (-z end) of the measurement unit 30 ) overlaps the film frame 101 . Therefore, the ultrasonic wave transmitted from the ultrasonic sensor 31 reaches the thin-film film 102, and the measurement unit 30 measures the distance between the reflective portion 32a and the thin-film film 102, that is, the height of the thin-film film 102. When attaching the thin film 100 to the mask M, the difference between the height of the mask M and the height of the film 102 of the thin film becomes equal to or less than a threshold value.

圖7係表示薄膜框架把持裝置1之電氣構成之方塊圖。薄膜框架把持裝置1具有CPU(Central Processing Unit)151、RAM(Random Access Memory)152、ROM(Read Only Memory)153、輸入輸出介面(I/F)154、通訊介面(I/F)155、及媒體介面(I/F)156,其等與驅動部16、致動器22b、測量部30等互相連接。 FIG. 7 is a block diagram showing the electrical configuration of the film frame holding device 1. As shown in FIG. The film frame holding device 1 has a CPU (Central Processing Unit) 151, a RAM (Random Access Memory) 152, a ROM (Read Only Memory) 153, an input/output interface (I/F) 154, a communication interface (I/F) 155, and The media interface (I/F) 156 is connected to the drive unit 16, the actuator 22b, the measurement unit 30, and the like.

CPU 151係根據儲存於RAM 152、ROM 153中之程式動作,進行各部之控制。自驅動部16、致動器22b、測量部30向CPU 151輸入訊號。自 CPU 151輸出之訊號被輸出至驅動部16、致動器22b、測量部30。 The CPU 151 operates according to the programs stored in the RAM 152 and the ROM 153 to control each part. Signals are input to the CPU 151 from the drive unit 16 , the actuator 22 b , and the measurement unit 30 . since The signal output from the CPU 151 is output to the drive unit 16 , the actuator 22 b , and the measurement unit 30 .

RAM 152係揮發性記憶體。ROM 153係儲存各種控制程式等之非揮發性記憶體。CPU 151根據儲存於RAM 152、ROM 153中之程式動作,進行各部之控制。又,ROM 153儲存薄膜框架把持裝置1之起動時CPU 151所進行之啟動程式、或依賴於薄膜框架把持裝置1之硬體之程式等。又,RAM 152儲存CPU 151所執行之程式及CPU 151所使用之資料等。 RAM 152 is a volatile memory. ROM 153 is a non-volatile memory for storing various control programs and the like. The CPU 151 operates according to the programs stored in the RAM 152 and the ROM 153 to control each part. In addition, the ROM 153 stores an activation program executed by the CPU 151 when the film frame holding device 1 is started, a program depending on the hardware of the film frame holding device 1 , and the like. Also, the RAM 152 stores programs executed by the CPU 151, data used by the CPU 151, and the like.

CPU 151經由輸入輸出介面154控制鍵盤或滑鼠等輸入輸出裝置161。通訊介面155經由網路162自其他機器接收資料並傳送至CPU 151,並且將CPU 151產生之資料經由網路162傳送至其他機器。 The CPU 151 controls an input-output device 161 such as a keyboard or a mouse through the input-output interface 154 . The communication interface 155 receives data from other machines via the network 162 and transmits them to the CPU 151 , and transmits the data generated by the CPU 151 to other machines via the network 162 .

媒體介面156讀取儲存於儲存媒體163之程式或資料並儲存至RAM 152中。此外,儲存媒體163例如為IC卡、SD卡、DVD等。 The media interface 156 reads the programs or data stored in the storage medium 163 and stores them in the RAM 152 . In addition, the storage medium 163 is IC card, SD card, DVD etc., for example.

此外,實現各功能之程式係例如自儲存媒體163中讀出,經由RAM 152而被安裝於薄膜框架把持裝置1中,由CPU 151執行。 In addition, the program which realizes each function is read from the storage medium 163, for example, is installed in the film frame gripping apparatus 1 via the RAM 152, and is executed by CPU151.

CPU 151具有根據輸入訊號控制薄膜框架把持裝置1之各部之控制部151a之功能。控制部151a藉由執行CPU 151所讀入之既定之程式而構建。下文對控制部151a所進行之處理進行詳細說明。 The CPU 151 has a function of controlling a control section 151a of each section of the film frame gripping device 1 according to an input signal. The control unit 151a is constructed by executing a predetermined program read by the CPU 151 . The processing performed by the control unit 151a will be described in detail below.

於說明本實施形態之特徵時,圖7所示之薄膜框架把持裝置1之構成係對主要構成進行說明,並不排除例如通常之資訊處理裝置所具備之構成。圖7所示之功能構成係為了使薄膜框架把持裝置1之構成容易理解所分類者,構成要素之分類之方法或名稱並不限定於圖7所記載之形態。薄膜框架把持裝置1之構成可根據處理內容進一步分類為較多之構成要素,亦可為1個構成要素執行複數個構成要素之處理。 In describing the features of this embodiment, the configuration of the film frame gripping device 1 shown in FIG. 7 is to describe the main configuration, and does not exclude configurations that are included in, for example, general information processing devices. The functional configuration shown in FIG. 7 is classified in order to make the configuration of the film frame gripping device 1 easy to understand, and the method or name of the classification of the constituent elements is not limited to the form described in FIG. 7 . The structure of the film frame gripping device 1 can be further classified into more constituent elements according to the processing content, and processing of plural constituent elements can also be executed by one constituent element.

對由此構成之薄膜框架把持裝置1之作用進行說明。圖8係表示薄膜框架把持裝置1所進行之處理之流程之流程圖。以下之處理主要藉由控制 部151a進行。 The operation of the film frame holding device 1 thus constituted will be described. FIG. 8 is a flow chart showing the flow of processing performed by the film frame holding device 1 . The following processes are mainly controlled by Section 151a is performed.

首先,控制部151a控制致動器22b使薄膜把持構件21自退避位置向插入位置移動,將薄膜把持構件21插入至溝槽101d中(步驟S101)。控制部151a係對各薄膜把持構件21逐個進行步驟S101之處理。藉此,薄膜框架把持裝置1把持薄膜100。使薄膜把持構件21於退避位置與插入位置之間移動之量係預先設定而儲存於ROM 153中。 First, the control unit 151a controls the actuator 22b to move the film holding member 21 from the withdrawn position to the insertion position, and inserts the film holding member 21 into the groove 101d (step S101). The control part 151a performs the process of step S101 for each film holding member 21 one by one. Thereby, the film frame holding device 1 holds the film 100 . The amount to move the film holding member 21 between the retreat position and the insertion position is set in advance and stored in the ROM 153 .

控制部151a驅動驅動部16使框體10沿大致垂直方向轉動(步驟S102)。框體10把持薄膜100,因此薄膜100亦與框體10一起轉動。其次,控制部151a使用未圖示之檢查部,對由框體10把持之薄膜100進行檢查(步驟S103)。檢查部具有發送雷射束等之發送部,使用已公知之各種方法對薄膜100進行檢查。步驟S103已公知,因此省略說明。 The control unit 151a drives the driving unit 16 to rotate the housing 10 in a substantially vertical direction (step S102). The frame body 10 holds the film 100 , so the film 100 also rotates together with the frame body 10 . Next, the control part 151a inspects the film 100 held by the frame body 10 using the inspection part which is not shown in figure (step S103). The inspection part has a transmitting part which transmits a laser beam etc., and inspects the film 100 using various well-known methods. Step S103 is already known, so the description is omitted.

若藉由檢查處理(步驟S103)確認薄膜100無異常,則控制部151a使用驅動部16使框體10向載置有遮罩M之裝置內平行移動(步驟S104)。然後進行遮罩M與薄膜100之位置對準(對準)(步驟S105)。於步驟S104、S105中,控制部151a藉由驅動部16使框體10轉動,以上端側之下表面101b(即黏著構件103)與遮罩M之距離較下端側之下表面101b(即黏著構件103)與遮罩M之距離更近之方式使框體10傾斜。該傾斜相對於豎直方向為微小角度。 If it is confirmed that there is no abnormality in the film 100 through the inspection process (step S103), the control unit 151a uses the drive unit 16 to move the frame 10 in parallel into the device on which the mask M is placed (step S104). Then, the mask M and the film 100 are aligned (aligned) (step S105). In steps S104 and S105, the control unit 151a rotates the frame body 10 through the driving unit 16, so that the distance between the lower surface 101b on the upper end side (ie, the adhesive member 103) and the mask M is smaller than the lower surface 101b on the lower end side (ie, the adhesive member 103 ). The frame body 10 is tilted so that the distance between the member 103) and the mask M is closer. The inclination is at a slight angle relative to the vertical.

對準(步驟S105)後控制部151a將薄膜100貼附於光罩(步驟S106)。步驟S106係所謂之暫貼附步驟。 After alignment (step S105), the control unit 151a attaches the film 100 to the photomask (step S106). Step S106 is the so-called temporary attaching step.

控制部151a藉由驅動部16以使框體10相對於豎直方向僅傾斜微小角度之狀態使框體10平行移動(此處為向+y方向移動),而使薄膜100靠近遮罩M。由此,薄膜100與遮罩M抵接。控制部151a於該狀態下使薄膜100向靠近遮罩M之方向(+y方向)移動。然而,由於薄膜100與遮罩M抵接,故而薄膜100被遮罩M按壓,藉由黏著構件103將薄膜100貼附於遮罩M。 The control unit 151a moves the frame body 10 in parallel (here, in the +y direction) with the frame body 10 tilted at a slight angle relative to the vertical direction by the drive unit 16, thereby bringing the film 100 close to the mask M. Thus, the film 100 comes into contact with the mask M. As shown in FIG. The control part 151a moves the film 100 to the direction (+y direction) which approaches the mask M in this state. However, since the film 100 is in contact with the mask M, the film 100 is pressed by the mask M, and the film 100 is attached to the mask M by the adhesive member 103 .

於貼附步驟(步驟S106)中,薄膜100相對於遮罩M僅傾斜微小角度。與此相對,於薄膜100相對於遮罩M未傾斜而大致平行之情形時,因薄膜100之形變等導致黏著構件103與遮罩M僅局部抵接,因此存在無法使薄膜100貼附於遮罩M之可能性。因此,較理想為使薄膜100相對於遮罩M僅傾斜微小角度。 In the attaching step (step S106 ), the film 100 is only inclined at a slight angle relative to the mask M. On the other hand, when the film 100 is substantially parallel to the mask M without inclination, the adhesive member 103 and the mask M are only in partial contact due to deformation of the film 100, so that the film 100 cannot be attached to the mask M. The possibility of covering M. Therefore, it is desirable to incline the film 100 relative to the mask M by only a slight angle.

其次,控制部151a使用測量部30檢查是否將薄膜100貼附於遮罩M(步驟S107)。圖9係表示步驟S107之處理之流程之流程圖。 Next, the control part 151a checks whether the film 100 is attached to the mask M using the measuring part 30 (step S107). FIG. 9 is a flowchart showing the flow of processing in step S107.

首先,控制部151a如圖5所示將測量部30配置於第1位置。然後,自超音波感測器31發送超音波,測定遮罩M之表面Ma之高度(y方向之位置)(步驟S201)。 First, the control unit 151a arranges the measurement unit 30 at the first position as shown in FIG. 5 . Then, ultrasonic waves are sent from the ultrasonic sensor 31 to measure the height (position in the y direction) of the surface Ma of the mask M (step S201).

其次,控制部151a藉由致動器33使超音波感測器31及反射板32移動,而如圖6所示將測量部30配置於第2位置。然後,自超音波感測器31發送超音波,測定薄膜之膜102之高度(y方向之位置)(步驟S202)。此外,使超音波感測器31及反射板32自第1位置向第2位置移動之距離係預先設定而儲存於ROM 153中。 Next, the control part 151a moves the ultrasonic sensor 31 and the reflection plate 32 by the actuator 33, and arrange|positions the measurement part 30 in the 2nd position as shown in FIG. Then, ultrasonic waves are sent from the ultrasonic sensor 31, and the height (position in the y direction) of the film 102 of the thin film is measured (step S202). In addition, the distance for moving the ultrasonic sensor 31 and the reflection plate 32 from the first position to the second position is preset and stored in the ROM 153 .

其後,控制部151a將遮罩M之高度與薄膜之膜102之高度之差與閾值T加以比較(步驟S203)。閾值T預先設定為任意值。例如,於薄膜框架101之厚度大致為7mm、黏著構件103之厚度大致為1mm之情形時,閾值T大致為8mm。關於閾值T之資訊(此處為值)係儲存於ROM 153中。 Thereafter, the control unit 151a compares the difference between the height of the mask M and the height of the film 102 of the thin film with the threshold T (step S203). The threshold T is set to an arbitrary value in advance. For example, when the thickness of the film frame 101 is approximately 7 mm and the thickness of the adhesive member 103 is approximately 1 mm, the threshold T is approximately 8 mm. Information about the threshold T (value here) is stored in the ROM 153 .

控制部151a根據步驟S203中之比較結果,判定薄膜100之貼附狀態(步驟S204)。於遮罩M之高度與薄膜之膜102之高度之差不為閾值以下之情形(步驟S204中為「否」)時,控制部151a判定未將薄膜100貼附於遮罩M。於未將薄膜100貼附於遮罩M之情形時,控制部151a返回至使框體10平行移動而使薄膜100靠近遮罩M之處理(步驟S106),再次進行步驟S107之貼附檢查處 理。於即便將步驟S106、S107重複數次而遮罩M之高度與薄膜之膜102之高度之差仍不為閾值以下之情形時,控制部151a停止處理。 The control unit 151a determines the sticking state of the film 100 according to the comparison result in step S203 (step S204). When the difference between the height of the mask M and the height of the film 102 of the film is not below the threshold (NO in step S204), the control unit 151a determines that the film 100 is not attached to the mask M. When the film 100 is not attached to the mask M, the control unit 151a returns to the process of moving the frame 10 in parallel to bring the film 100 close to the mask M (step S106), and performs the attachment inspection of step S107 again. reason. When the difference between the height of the mask M and the height of the film 102 of the thin film is not below the threshold value even after steps S106 and S107 are repeated several times, the control unit 151 a stops the processing.

於遮罩M之高度與薄膜之膜102之高度之差為閾值以下之情形(步驟S204中為「是」)時,控制部151a判定已將薄膜100貼附於遮罩M,而解除薄膜100之把持(步驟S108,參照圖8)。於步驟S108中,控制部151a控制致動器22b使薄膜把持構件21自插入位置向退避位置移動,避免薄膜把持構件21之前端與溝槽101d抵接。 When the difference between the height of the mask M and the height of the film 102 of the film is below the threshold (YES in step S204), the control unit 151a determines that the film 100 has been attached to the mask M, and releases the film 100. The grasping (step S108, refer to Fig. 8). In step S108, the control unit 151a controls the actuator 22b to move the film holding member 21 from the insertion position to the withdrawn position so that the front end of the film holding member 21 does not come into contact with the groove 101d.

然後,控制部151a結束圖8所示之一系列處理。若該一系列處理結束,則控制部151a使用未圖示之按壓部將薄膜100之四角向遮罩M按壓,而將薄膜100貼附於遮罩M(所謂之正式貼附)。 Then, the control unit 151a ends the series of processes shown in FIG. 8 . When the series of processes is completed, the control unit 151a presses the four corners of the film 100 against the mask M using a pressing unit not shown, and attaches the film 100 to the mask M (so-called final attachment).

圖10、11係表示步驟S107所示之檢查時之情況之示意圖。圖10之虛線表示未設置薄膜之膜102時之薄膜框架101之情況,圖10之實線表示設置有薄膜之膜102時之薄膜框架101之情況。若於薄膜框架101設置薄膜之膜102,則藉由薄膜之膜102之張力,於沿薄膜框架101之中心軸觀察時,薄膜框架101之各邊之中央部分進入內側。於本實施形態中,測量部30係設置於框體10(圖10中省略圖示)之上側附近且左右兩端附近,測量部30對薄膜100之上端附近且左右兩端附近之高度進行測定,因此,即便薄膜框架101變形,於第2位置測量部30亦可測定薄膜之膜102之高度。 10 and 11 are schematic diagrams showing the situation during the inspection shown in step S107. The dotted line in FIG. 10 shows the situation of the film frame 101 when the film 102 of the film is not provided, and the solid line in FIG. 10 shows the situation of the film frame 101 when the film 102 of the film is provided. When the thin film 102 is provided on the thin film frame 101, the central part of each side of the thin film frame 101 enters inside when viewed along the central axis of the thin film frame 101 due to the tension of the thin film film 102. In this embodiment, the measurement unit 30 is provided near the upper side and near the left and right ends of the frame body 10 (not shown in FIG. 10 ), and the measurement unit 30 measures the height near the upper end and the left and right ends of the film 100 Therefore, even if the film frame 101 is deformed, the height of the film 102 of the film can be measured in the second position measuring unit 30 .

又,如圖11所示,於將薄膜100貼附於遮罩M時,假定產生貼附薄膜100之一端(例如,+x側之端),而未貼附薄膜100之另一端(例如,-x側之端)之異常之情形。於本實施形態中,由於測量部30對薄膜100之上端附近且左右兩端附近之高度進行測定,故而若產生此種異常,則於一測量部30(此處為+x側之測量部30)中,遮罩M之高度與薄膜之膜102之高度之差成為閾值以下,但於另一測量部30(此處為-x側之測量部30)中,遮罩M之高度與薄膜 之膜102之高度之差不為閾值以下。因此,藉由將設置於上框部13之測量部30設置於縱框部11之附近,將設置於上框部14之測量部30設置於縱框部12之附近,而可檢測此種異常。 Also, as shown in FIG. 11 , when the film 100 is attached to the mask M, it is assumed that one end of the attached film 100 (for example, the end on the +x side) is produced, while the other end of the unattached film 100 (for example, The abnormal situation of the end of -x side). In the present embodiment, since the measuring section 30 measures the height near the upper end and near the left and right ends of the film 100, if such an abnormality occurs, a measuring section 30 (here, the measuring section 30 on the +x side) ), the difference between the height of the mask M and the height of the film 102 of the thin film becomes below the threshold value, but in another measurement unit 30 (here, the measurement unit 30 on the -x side), the height of the mask M and the height of the thin film The difference in the height of the film 102 is not below the threshold value. Therefore, such an abnormality can be detected by disposing the measurement unit 30 provided on the upper frame part 13 near the vertical frame part 11 and the measurement part 30 provided on the upper frame part 14 near the vertical frame part 12. .

根據本實施形態,可確認將薄膜100確實地貼附於遮罩M。因此,可防止於未將薄膜100確實地貼附於遮罩M之狀態下鬆開薄膜100而薄膜100掉落之狀況。 According to this embodiment, it can be confirmed that the film 100 is attached to the mask M reliably. Therefore, it is possible to prevent the situation that the film 100 is released and the film 100 falls when the film 100 is not firmly attached to the mask M. FIG.

於利用例如使框體10移動之馬達等之座標確認薄膜100之貼附狀態之情形時,有因薄膜把持構件21之損傷等導致薄膜100與遮罩M之位置關係與假定不同,而於未將薄膜100貼附於遮罩M之狀態下鬆開薄膜100之虞。尤其是於尺寸較大之薄膜100之情形時,掉落1塊薄膜100會導致產生1000萬日元左右之高額損失。因此,如本實施形態般,藉由確認將薄膜100確實地貼附於遮罩M,可減少無謂之成本。 When the attached state of the film 100 is confirmed by the coordinates of the motor that moves the frame 10, for example, the positional relationship between the film 100 and the mask M may be different from the assumption due to damage to the film holding member 21, etc. In the state where the film 100 is attached to the mask M, there is a risk of releasing the film 100 . Especially in the case of a large film 100, dropping one film 100 would cause a high loss of about 10 million yen. Therefore, unnecessary costs can be reduced by confirming that the film 100 is reliably attached to the mask M as in the present embodiment.

又,根據本實施形態,由於實際測定遮罩M之表面Ma與薄膜100之距離而確認貼附狀態,故而即便於操作各種厚度之薄膜框架101之情形時,薄膜框架把持裝置1亦可容易地應對。 Also, according to this embodiment, since the distance between the surface Ma of the mask M and the film 100 is actually measured to confirm the attached state, the film frame gripping device 1 can be easily handled even when handling film frames 101 of various thicknesses. response.

又,根據本實施形態,藉由使框體10、即薄膜100以相對於豎直方向僅傾斜微小角度之狀態平行移動而將黏著構件103按壓至遮罩M,從而將薄膜100之上端部貼附於遮罩M,於遮罩M及薄膜100之上端附近,根據測定表面Ma之高度及薄膜之膜102之高度所獲得之結果判定是否將薄膜100貼附於遮罩M,因此可準確地判定薄膜100之貼附狀態。 Also, according to the present embodiment, by moving the frame body 10, that is, the film 100 in parallel with a slight angle with respect to the vertical direction, and pressing the adhesive member 103 against the mask M, the upper end of the film 100 is pasted. Attached to the mask M, in the vicinity of the upper end of the mask M and the film 100, determine whether to attach the film 100 to the mask M according to the results obtained by measuring the height of the surface Ma and the height of the film 102 of the film, so that it can be accurately The attached state of the film 100 is judged.

此外,於本實施形態中,薄膜框架把持裝置1具有2個測量部30,且將2個測量部30設置於框體10之上側附近且左右兩端附近,但設置測量部30之位置及數量並不限於此。2個測量部30亦可設置於縱框部11、12之上端附近而非設置於上框部13、14。於此情形時,致動器33使超音波感測器31及反 射板32於第1位置與第2位置之間沿x方向(水平方向)移動即可。 In addition, in this embodiment, the film frame gripping device 1 has two measuring parts 30, and the two measuring parts 30 are provided near the upper side of the frame body 10 and near the left and right ends, but the positions and numbers of the measuring parts 30 are different. It is not limited to this. The two measuring parts 30 may also be provided near the upper ends of the vertical frame parts 11 and 12 instead of being provided on the upper frame parts 13 and 14 . In this case, the actuator 33 makes the ultrasonic sensor 31 and the feedback The shooter 32 may move in the x direction (horizontal direction) between the first position and the second position.

又,例如,亦可為薄膜框架把持裝置1具有3個測量部30,且將3個測量部30設置於上框部13、14及下端部15a。藉由在薄膜100之上下端附近測定薄膜之膜102之高度,而可更確實地確認是否貼附薄膜100。於此情形時,於使薄膜100抵接於遮罩M時,上端側之下表面101b與遮罩M之距離較下端側之下表面101b與遮罩M之距離更近,因此於步驟S203、204中,可使下端側之閾值大於上端側之閾值。此外,設置於下端部15a之測量部30較理想為配置於下端部15a之x方向大致中央部。 Moreover, for example, the film frame gripping apparatus 1 may have the three measurement parts 30, and the three measurement parts 30 may be provided in the upper frame part 13,14 and the lower end part 15a. By measuring the height of the film 102 of the film near the upper and lower ends of the film 100, it is possible to more reliably confirm whether or not the film 100 is attached. In this case, when the film 100 is brought into contact with the mask M, the distance between the lower surface 101b on the upper end side and the mask M is closer than the distance between the lower surface 101b on the lower end side and the mask M. Therefore, in steps S203, In 204, the threshold value on the lower end side may be made larger than the threshold value on the upper end side. In addition, it is preferable that the measurement part 30 provided in the lower end part 15a is arrange|positioned in the substantially center part of the x direction of the lower end part 15a.

又,例如,測量部30亦可設置於上端部15b而非設置於上框部13、14。由於將測量部30設置於上端部15b,故而可於薄膜100之上端附近之位置測定薄膜之膜102之高度。於設置於上端部15b之測量部30為1個之情形時,測量部30較理想為設置於框體10之中央附近。但為了檢測將薄膜100之一部分(例如+x端)貼附於遮罩M、未將另一部分(例如-x端)貼附於遮罩M之狀態,較理想為將測量部30設置於框體10之上側且左右兩端附近。 Also, for example, the measurement unit 30 may be provided on the upper end portion 15 b instead of the upper frame portions 13 and 14 . Since the measuring unit 30 is provided at the upper end portion 15b, the height of the film 102 of the thin film can be measured at a position near the upper end of the thin film 100. When there is one measurement unit 30 provided on the upper end portion 15b, the measurement unit 30 is preferably provided near the center of the frame body 10 . However, in order to detect a state where a part of the film 100 (for example, the +x end) is attached to the mask M and the other part (for example, the -x end) is not attached to the mask M, it is ideal to arrange the measuring part 30 on the frame The upper side of the body 10 and near the left and right ends.

又,於本實施形態中,主要以縱框部11、12或上框部13、14可相對於框15移動之方式設置,以使框體10可把持各種大小之薄膜100,但縱框部11、12或上框部13、14並非必需。例如,於框體10只要可把持1種薄膜100即可之情形時,僅框15即可。於此情形時,測量部30對薄膜100之上側附近且左右兩端附近之點進行測定,故而較理想為設置於處於框15之上側之2個角附近。 Also, in the present embodiment, the vertical frame portions 11, 12 or the upper frame portions 13, 14 are arranged so that they can move relative to the frame 15, so that the frame body 10 can hold films 100 of various sizes, but the vertical frame portions 11, 12 or the upper frame parts 13, 14 are not essential. For example, only the frame 15 is sufficient when the frame body 10 only needs to be able to hold one type of film 100 . In this case, the measuring unit 30 measures points near the upper side and near both left and right ends of the film 100 , so it is ideally installed near two corners on the upper side of the frame 15 .

以上已參照圖式對本發明之實施形態進行了詳細說明,但具體之構成並不限於該實施形態,亦包括不脫離本發明之主旨之範圍之設計變更等。只要為本技術領域中具有通常知識者,則可對實施形態之各要素進行適當變更、追加、轉換等。 The embodiment of the present invention has been described in detail above with reference to the drawings, but the specific configuration is not limited to the embodiment, and design changes within the scope of the present invention are also included. Appropriate changes, additions, conversions, and the like can be made to each element of the embodiment as long as those with ordinary knowledge in the technical field can do so.

又,於本發明中,所謂「大致」係不僅包括嚴格相同之情形,而且包括不喪失同一性之程度之誤差或變形之概念。例如,所謂大致平行並不限於嚴格平行之情形,係包括例如數度左右之誤差之概念。又,例如,於僅表述為平行、正交等之情形時,不僅包括嚴格平行、正交等情形,而且包括大致平行、大致正交等情形。又,於本發明中,所謂「附近」意指包括處於成為基準之位置附近之範圍(可任意確定)之區域。例如,於A之附近之情形時,該概念係表示處於A附近之範圍之區域,可包含A,亦可不包含A。 In addition, in the present invention, the term "approximately" includes not only the situation of being exactly the same, but also the concept of error or deformation to the extent that the identity is not lost. For example, the so-called approximately parallel is not limited to the situation of being strictly parallel, and includes concepts such as an error of about several degrees. Also, for example, when it is only expressed as parallel, orthogonal, etc., not only strictly parallel, orthogonal, etc., but also approximately parallel, approximately orthogonal, etc. are included. In addition, in the present invention, "nearby" means an area including a range (arbitrary determination) in the vicinity of a reference position. For example, in the case of the vicinity of A, the concept refers to the area in the vicinity of A, which may or may not include A.

1‧‧‧薄膜框架把持裝置 1‧‧‧Film frame holding device

10‧‧‧框體 10‧‧‧frame

11、12‧‧‧縱框部 11, 12‧‧‧Longitudinal frame

13、14‧‧‧上框部 13, 14‧‧‧upper frame

15‧‧‧框 15‧‧‧Frame

15a‧‧‧下端部 15a‧‧‧lower end

15b‧‧‧上端部 15b‧‧‧upper end

20‧‧‧薄膜把持部 20‧‧‧Film control part

21‧‧‧薄膜把持構件 21‧‧‧Film holding member

30‧‧‧測量部 30‧‧‧Measurement Department

100‧‧‧薄膜 100‧‧‧film

101‧‧‧薄膜框架 101‧‧‧Film frame

101a‧‧‧上表面 101a‧‧‧upper surface

101b‧‧‧下表面 101b‧‧‧lower surface

102‧‧‧薄膜之膜 102‧‧‧Membrane of thin film

M‧‧‧遮罩 M‧‧‧Masking

Claims (10)

一種薄膜框架把持裝置,其係把持薄膜而將上述薄膜貼附於沿大致豎直方向保持之大致板狀之遮罩,上述薄膜具有大致中空筒狀之薄膜框架、以覆蓋上述薄膜框架之中空部之方式設置於與上述薄膜框架之外周面大致正交之第1面之薄膜之膜、及設置於與上述第1面大致平行之第2面之黏著構件,其特徵在於,具備: 作為將複數根棒材組合為大致矩形形狀而成之框狀之構件之框體, 設置於上述框體且把持上述薄膜框架之上述外周面之薄膜把持部, 設置於上述框體之測量部,及 控制上述框體、上述薄膜把持部及上述測量部之控制部, 上述測量部係以可於前端附近與上述遮罩重疊之第1位置和上述前端附近與上述薄膜框架重疊之第2位置之間移動之方式設置, 自與上述棒材之延設方向大致正交之方向觀察,上述薄膜把持部與上述測量部係設置於不同之位置, 上述控制部於上述薄膜把持部把持上述薄膜框架、且將上述框體沿大致垂直方向延設並且使上述黏著構件與上述遮罩抵接之狀態下,將上述測量部配置於上述第1位置而測定作為距上述遮罩之表面為止之距離之第1距離,且使上述測量部移動至上述第2位置而測定作為距上述薄膜之膜為止之距離之第2距離。A film frame holding device, which is used to hold a film and attach the film to a substantially plate-shaped mask maintained in a substantially vertical direction. The film has a substantially hollow cylindrical film frame to cover the hollow portion of the film frame The film of the film provided on the first surface substantially perpendicular to the outer peripheral surface of the above-mentioned film frame, and the adhesive member provided on the second surface substantially parallel to the above-mentioned first surface, are characterized in that: A frame body that is a frame-shaped member that combines a plurality of rods into a roughly rectangular shape, a film gripping portion provided on the frame body and gripping the outer peripheral surface of the film frame, The measurement part installed in the above frame, and a control unit that controls the frame body, the film gripping unit, and the measurement unit, The measuring unit is provided in a manner to be movable between a first position where the vicinity of the front end overlaps the mask and a second position where the vicinity of the front end overlaps the film frame, Viewed from a direction substantially perpendicular to the extending direction of the rod, the film gripping portion and the measuring portion are located at different positions, The control unit arranges the measurement unit at the first position in a state where the film holding unit holds the film frame, extends the frame body in a substantially vertical direction, and makes the adhesive member contact the mask. The first distance which is the distance from the surface of the mask is measured, and the second distance which is the distance from the film of the thin film is measured by moving the measurement unit to the second position. 如請求項1所述之薄膜框架把持裝置,其中, 上述薄膜把持部具有以可於與上述外周面抵接之抵接位置和不與上述外周面抵接之退避位置之間沿水平方向或垂直方向移動之方式設置之薄膜把持構件, 上述框體可沿水平方向移動, 上述控制部於將上述薄膜把持構件配置於上述抵接位置而把持上述薄膜框架且將上述框體沿大致垂直方向延設之狀態下,使上述框體沿水平方向移動而使上述黏著構件與上述遮罩抵接,將上述測量部配置於上述第1位置而測定上述第1距離,且使上述測量部移動至上述第2位置而測定上述第2距離,於上述第1距離與上述第2距離之差為閾值以下之情形時,使上述薄膜把持構件可自上述抵接位置向上述退避位置移動。The film frame holding device according to claim 1, wherein, The film holding part has a film holding member provided so as to be movable horizontally or vertically between a contact position abutting against the outer peripheral surface and a retracted position not abutting the outer peripheral surface, The above-mentioned frame can move along the horizontal direction, In a state where the film holding member is arranged at the contact position, the film frame is held and the frame body is extended in a substantially vertical direction, the control unit moves the frame body in the horizontal direction so that the adhesive member and the The mask is in contact, the measuring unit is arranged at the first position to measure the first distance, and the measuring unit is moved to the second position to measure the second distance. Between the first distance and the second distance When the difference is equal to or less than a threshold value, the film holding member can be moved from the contact position to the retracted position. 如請求項1所述之薄膜框架把持裝置,其中, 上述測量部於使上述黏著構件與上述遮罩抵接時之姿勢下具有設置於上述框體之上側附近且左端附近之第1測量部、及設置於上述框體之上側附近且右端附近之第2測量部。The film frame holding device according to claim 1, wherein, The measurement unit has a first measurement unit provided near the upper side and near the left end of the frame and a first measurement unit provided near the upper side and near the right end of the frame when the adhesive member is brought into contact with the mask. 2 Measurement Department. 如請求項2所述之薄膜框架把持裝置,其中, 上述測量部於使上述黏著構件與上述遮罩抵接時之姿勢下具有設置於上述框體之上側附近且左端附近之第1測量部、及設置於上述框體之上側附近且右端附近之第2測量部。The film frame holding device according to claim 2, wherein, The measurement unit has a first measurement unit provided near the upper side and near the left end of the frame and a first measurement unit provided near the upper side and near the right end of the frame when the adhesive member is brought into contact with the mask. 2 Measurement Department. 如請求項1至4中任一項所述之薄膜框架把持裝置,其中, 上述框體於使上述黏著構件與上述遮罩抵接時之姿勢下具有大致豎直地延設之大致棒狀之第1縱框部及第2縱框部、以及大致水平地延設於上述第1縱框部及上述第2縱框部之上端附近之上框部, 上述第1縱框部及上述第2縱框部可沿上述上框部之延設方向移動, 上述上框部可沿上述第1縱框部及上述第2縱框部之延設方向移動, 上述薄膜把持部係設置於上述第1縱框部及上述第2縱框部, 上述測量部係設置於上述上框部。The film frame holding device according to any one of Claims 1 to 4, wherein, The frame body has a substantially rod-shaped first vertical frame portion and a second vertical frame portion extending substantially vertically in a posture when the adhesive member is in contact with the mask, and a substantially horizontally extending portion on the above-mentioned mask. the upper frame portion near the upper end of the first vertical frame portion and the second vertical frame portion, The first vertical frame portion and the second vertical frame portion can move along the extending direction of the upper frame portion, The upper frame portion can move along the extending direction of the first vertical frame portion and the second vertical frame portion, The film gripping portion is provided on the first vertical frame portion and the second vertical frame portion, The measurement unit is provided on the upper frame. 如請求項5所述之薄膜框架把持裝置,其中, 上述框體具有大致水平地延設於上述第1縱框部及上述第2縱框部之下端附近之下框部, 上述測量部具有設置於上述下框部之第3測量部。The film frame holding device according to claim 5, wherein, The frame body has a lower frame portion extended substantially horizontally near the lower ends of the first vertical frame portion and the second vertical frame portion, The said measurement part has the 3rd measurement part provided in the said lower frame part. 如請求項1至4中任一項所述之薄膜框架把持裝置,其中, 上述框體以於使上述黏著構件與上述遮罩抵接時,上端側之上述第2面與上述遮罩之距離較下端側之上述第2面與上述遮罩之距離更近之方式傾斜。The film frame holding device according to any one of Claims 1 to 4, wherein, The frame body is inclined such that the distance between the second surface on the upper end side and the mask is closer than the distance between the second surface on the lower end side and the mask when the adhesive member is brought into contact with the mask. 如請求項5所述之薄膜框架把持裝置,其中, 上述框體以於使上述黏著構件與上述遮罩抵接時,上端側之上述第2面與上述遮罩之距離較下端側之上述第2面與上述遮罩之距離更近之方式傾斜。The film frame holding device according to claim 5, wherein, The frame body is inclined such that the distance between the second surface on the upper end side and the mask is closer than the distance between the second surface on the lower end side and the mask when the adhesive member is brought into contact with the mask. 如請求項6所述之薄膜框架把持裝置,其中, 上述框體以於使上述黏著構件與上述遮罩抵接時,上端側之上述第2面與上述遮罩之距離較下端側之上述第2面與上述遮罩之距離更近之方式傾斜。The film frame holding device according to claim 6, wherein, The frame body is inclined such that the distance between the second surface on the upper end side and the mask is closer than the distance between the second surface on the lower end side and the mask when the adhesive member is brought into contact with the mask. 一種薄膜框架把持方法,其係把持薄膜而將其貼附於保持於大致豎直方向上之大致板狀之遮罩,上述薄膜具有大致中空筒狀之薄膜框架、以覆蓋上述薄膜框架之中空部之方式設置於與上述薄膜框架之外周面大致正交之第1面之薄膜之膜、及設置於與上述第1面大致平行之第2面之黏著構件,其特徵在於: 其將以可沿水平方向移動之方式設置於框體之薄膜把持構件配置於與上述外周面抵接之抵接位置而把持上述薄膜框架, 於把持上述薄膜框架之狀態下使上述框體平行移動而使上述黏著構件與上述遮罩抵接, 將設置於上述框體之測量部配置於前端附近與上述遮罩重疊之第1位置,測定作為距上述遮罩之表面為止之距離之第1距離, 使上述測量部移動至上述前端附近與上述薄膜框架重疊之第2位置,測定作為距上述薄膜之膜為止之距離之第2距離, 於上述第1距離與上述第2距離之差為閾值以下之情形時,使上述薄膜把持構件可自上述抵接位置向不與上述外周面抵接之退避位置移動。A method of holding a film frame, which is to hold a film and attach it to a substantially plate-shaped mask maintained in a substantially vertical direction, the above-mentioned film has a substantially hollow cylindrical film frame to cover the hollow portion of the above-mentioned film frame The film of the film provided on the first surface substantially perpendicular to the outer peripheral surface of the above-mentioned film frame, and the adhesive member provided on the second surface substantially parallel to the above-mentioned first surface, are characterized in that: It arranges the film holding member provided in the frame so as to be movable in the horizontal direction at the abutting position against the above-mentioned outer peripheral surface to hold the above-mentioned film frame, In the state of holding the above-mentioned film frame, the above-mentioned frame body is moved in parallel so that the above-mentioned adhesive member is in contact with the above-mentioned mask, The measuring part provided on the above-mentioned frame is arranged at the first position overlapping the above-mentioned mask near the front end, and the first distance which is the distance from the surface of the above-mentioned mask is measured, Move the above-mentioned measuring part to the second position where the vicinity of the above-mentioned front end overlaps with the above-mentioned film frame, and measure the second distance as the distance from the film of the above-mentioned film, When the difference between the first distance and the second distance is equal to or less than a threshold value, the film holding member is movable from the contact position to a retreat position where it does not contact the outer peripheral surface.
TW108100529A 2018-01-25 2019-01-07 Film frame holding device and film frame holding method TWI798327B (en)

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