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TWI793745B - Low-dissipation and high dimensional stability flexible copper clad laminate, manufacturing method thereof, and electronic device - Google Patents

Low-dissipation and high dimensional stability flexible copper clad laminate, manufacturing method thereof, and electronic device Download PDF

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TWI793745B
TWI793745B TW110132492A TW110132492A TWI793745B TW I793745 B TWI793745 B TW I793745B TW 110132492 A TW110132492 A TW 110132492A TW 110132492 A TW110132492 A TW 110132492A TW I793745 B TWI793745 B TW I793745B
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copper foil
dielectric loss
dimensional stability
high dimensional
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TW202311361A (en
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林慶炫
陳文章
劉振良
蕭婉伶
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國立中興大學
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Abstract

The present disclosure provides a low-dissipation and high dimensional stability flexible copper clad laminate. The low-dissipation and high dimensional stability flexible copper clad laminate includes a copper foil and a polyimide film. The polyimide film is connected to the copper foil, and includes a polyimide. The polyimide has a structure represented by formula (I), in which each symbol is as defined in the specification. Thus, the flexible copper clad laminate prepared by using the polyimide of the present disclosure has an extra low dissipation factor and a thermal expansion coefficient similar to that of the copper foil.

Description

具低介電損失及高尺寸安定性的軟性銅箔基板、其製備方法以及電子裝置Flexible copper foil substrate with low dielectric loss and high dimensional stability, its preparation method and electronic device

本發明是有關於一種軟性銅箔基板、其製備方法以及電子裝置,特別是有關於一種具低介電損失及高尺寸安定性的軟性銅箔基板、其製備方法以及電子裝置。The present invention relates to a flexible copper foil substrate, its preparation method and electronic device, in particular to a flexible copper foil substrate with low dielectric loss and high dimensional stability, its preparation method and electronic device.

自2015年國際電信聯盟(International Telecommunication Union, ITU)正式發表5G通訊(5 thGeneration Mobile Network)願景,各相關單位相繼開發新技術及材料,且對於新一代通訊網路具有必須在高頻率下達到高傳輸率、高穩定性、低延遲性及低傳輸耗損等期待。 Since the International Telecommunication Union (ITU) officially announced the vision of 5G communication (5 th Generation Mobile Network) in 2015, various relevant units have successively developed new technologies and materials, and for the new generation of communication networks, it is necessary to achieve high Transmission rate, high stability, low latency and low transmission loss are expected.

印刷電路板(Printed circuit board, PCB)主要應用在通訊、汽車、半導體等電子產品,用來固定積體電路(Integrated Circuit, IC)與其他電子元件,並且利用銅導線連接,讓電子訊號可以在不同元件之間傳遞,由已知文獻可知,訊號傳輸速率(V p)與材料介電常數(D k)之平方根成反比,如式(1);而訊號傳輸損失(L)正比於介電常數(D k)的平方根與介電損失(D f),如式(2),因此若要成為新一代高頻通訊用基板,其材料必須具備優異的熱性質、電氣性質、耐化學性高以及低濕性,且為了達到高傳輸率以及低傳輸損失,降低材料之介電常數(D k)與介電損失(D f)是極力發展的目標。

Figure 02_image003
式(1)、
Figure 02_image005
式(2)。
Printed circuit board (PCB) is mainly used in communications, automobiles, semiconductors and other electronic products to fix integrated circuits (Integrated Circuit, IC) and other electronic components, and use copper wires to connect electronic signals Transmission between different components, according to the known literature, the signal transmission rate (V p ) is inversely proportional to the square root of the material permittivity (D k ), such as formula (1); and the signal transmission loss (L) is proportional to the dielectric constant The square root of the constant (D k ) and the dielectric loss (D f ), such as formula (2), so to become a new generation of high-frequency communication substrate, the material must have excellent thermal properties, electrical properties, and high chemical resistance And low humidity, and in order to achieve high transmission rate and low transmission loss, reducing the dielectric constant (D k ) and dielectric loss (D f ) of the material is the goal of development.
Figure 02_image003
Formula 1),
Figure 02_image005
Formula (2).

常見的印刷電路板有軟性印刷電路板,其一般是由聚醯亞胺與銅箔接合而成,且電性與聚醯亞胺息息相關。市面上最常見的聚醯亞胺為杜邦公司的Kapton,其介電損失約為0.016,因此習知的聚醯亞胺已經不能滿足電路板的高頻信號傳輸化和高速運算的要求。Common printed circuit boards include flexible printed circuit boards, which are generally made of polyimide and copper foil, and the electrical properties are closely related to polyimide. The most common polyimide on the market is DuPont's Kapton, and its dielectric loss is about 0.016. Therefore, the conventional polyimide can no longer meet the requirements of high-frequency signal transmission and high-speed computing of circuit boards.

有鑑於此,如何合成出一種低介電損失的聚醯亞胺,其所製備之軟性銅箔基板可應用於高頻傳輸印刷電路板的製作,遂成相關業者努力的目標。In view of this, how to synthesize a polyimide with low dielectric loss, and the flexible copper foil substrate prepared by it can be applied to the production of high-frequency transmission printed circuit boards, has become the goal of related industry efforts.

本發明之一目的是提供一種具低介電損失及高尺寸安定性的軟性銅箔基板及其製備方法,利用二胺與二酸酐之分子鏈具有線性的特性,使其合成的聚醯亞胺具有低介電損失及低熱膨脹係數,並應用於軟性銅箔基板。One object of the present invention is to provide a flexible copper foil substrate with low dielectric loss and high dimensional stability and its preparation method, utilizing the linear characteristics of the molecular chains of diamine and dianhydride to synthesize polyimide It has low dielectric loss and low thermal expansion coefficient, and is applied to flexible copper foil substrates.

本發明之一實施方式提供一種具低介電損失及高尺寸安定性的軟性銅箔基板,其包含一銅箔以及一聚醯亞胺膜。聚醯亞胺膜與銅箔接合,且包含一聚醯亞胺。聚醯亞胺具有如式(I)所示之一結構:

Figure 02_image001
式(I), 其中,A 1為式(I-1)所示之一結構,A 2為式(I-2)所示之一結構,A 3為式(I-3)所示之一結構,A 4為式(I-4)所示之一結構:
Figure 02_image007
式(I-1)、
Figure 02_image009
式(I-2)、
Figure 02_image011
式(I-3)、
Figure 02_image013
式(I-4),
其中,R及Q各自獨立為氫、碳數1至6的烷基、三氟甲基、苯基或鹵素基,x、y、z及q為整數或小數,n為聚合度,其滿足下列條件:0 < x < 1;0 ≤ y ≤ 1;0 ≤ z ≤ 1;0 ≤ q ≤ 1;x+y+z+q = 1;以及1 ≤ n ≤ 500。 One embodiment of the present invention provides a flexible copper foil substrate with low dielectric loss and high dimensional stability, which includes a copper foil and a polyimide film. The polyimide film is bonded to the copper foil and contains a polyimide. Polyimide has one structure as shown in formula (I):
Figure 02_image001
Formula (I),
Wherein, A 1 is a structure shown in formula (I-1), A 2 is a structure shown in formula (I-2), A 3 is a structure shown in formula (I-3), A 4 is One structure shown in formula (I-4):
Figure 02_image007
Formula (I-1),
Figure 02_image009
Formula (I-2),
Figure 02_image011
Formula (I-3),
Figure 02_image013
Formula (I-4),
Wherein, R and Q are each independently hydrogen, alkyl, trifluoromethyl, phenyl or halogen group with 1 to 6 carbons, x, y, z and q are integers or decimals, n is the degree of polymerization, which satisfies the following Conditions: 0 < x <1; 0 ≤ y ≤ 1; 0 ≤ z ≤ 1; 0 ≤ q ≤ 1; x+y+z+q = 1; and 1 ≤ n ≤ 500.

依據前段所述之具低介電損失及高尺寸安定性的軟性銅箔基板,其中當式(I)中,R為氫且x+z為1時,聚醯亞胺膜所包含之聚醯亞胺可具有如式(I-A)所示之一結構:

Figure 02_image015
式(I-A)。 According to the flexible copper foil substrate with low dielectric loss and high dimensional stability described in the previous paragraph, when in formula (I), R is hydrogen and x+z is 1, the polyamide contained in the polyimide film Imines can have one of the structures shown in formula (IA):
Figure 02_image015
Formula (IA).

依據前段所述之具低介電損失及高尺寸安定性的軟性銅箔基板,其中當式(I)中,R為氫且x+y為1時,聚醯亞胺膜所包含之聚醯亞胺可具有如式(I-B)所示之一結構:

Figure 02_image017
式(I-B), 其中Q為甲基或三氟甲基。 According to the flexible copper foil substrate with low dielectric loss and high dimensional stability described in the previous paragraph, when in formula (I), R is hydrogen and x+y is 1, the polyamide contained in the polyimide film Imines can have one of the structures shown in formula (IB):
Figure 02_image017
Formula (IB),
Wherein Q is methyl or trifluoromethyl.

依據前段所述之具低介電損失及高尺寸安定性的軟性銅箔基板,其中當式(I)中,R為氫且x+q為1時,聚醯亞胺膜所包含之聚醯亞胺可具有如式(I-C)所示之一結構:

Figure 02_image019
式(I-C)。 According to the flexible copper foil substrate with low dielectric loss and high dimensional stability described in the previous paragraph, when in formula (I), R is hydrogen and x+q is 1, the polyamide contained in the polyimide film Imines can have one of the structures shown in formula (IC):
Figure 02_image019
Formula (IC).

依據前段所述之具低介電損失及高尺寸安定性的軟性銅箔基板,其中聚醯亞胺膜的熱膨脹係數可為9 ppm/ oC至33 ppm/ oC。 According to the flexible copper foil substrate with low dielectric loss and high dimensional stability mentioned above, the thermal expansion coefficient of the polyimide film can be 9 ppm/ o C to 33 ppm/ o C.

依據前段所述之具低介電損失及高尺寸安定性的軟性銅箔基板,其中聚醯亞胺膜的介電損失可小於0.0025。According to the flexible copper foil substrate with low dielectric loss and high dimensional stability mentioned above, the dielectric loss of the polyimide film can be less than 0.0025.

本發明之另一實施方式提供一種如前述之具低介電損失及高尺寸安定性的軟性銅箔基板的製備方法,包含進行一混合步驟以及進行一縮合反應。混合步驟係將一如式(i)所示的二胺單體以及一如式(ii-1)、如式(ii-2)、如式(ii-3)或如式(ii-4)所示的二胺單體溶於一有機溶劑後,再加入一如式(iii)所示的二酸酐單體,混合後形成一聚醯胺酸溶液:

Figure 02_image021
Figure 02_image023
Figure 02_image025
Figure 02_image027
式(i)、 式(ii-1)、 式(ii-2)、 式(ii-3)、
Figure 02_image029
Figure 02_image031
式(ii-4)、 式(iii), 其中,R為氫、碳數1至6的烷基、三氟甲基、苯基或鹵素基。縮合反應係將聚醯胺酸溶液塗佈至銅箔上,並進行加熱閉環後,以獲得具低介電損失及高尺寸安定性的軟性銅箔基板。 Another embodiment of the present invention provides a method for preparing the aforementioned flexible copper foil substrate with low dielectric loss and high dimensional stability, including performing a mixing step and performing a condensation reaction. The mixing step is to combine a diamine monomer as shown in formula (i) and a diamine monomer as shown in formula (ii-1), such as formula (ii-2), such as formula (ii-3) or such as formula (ii-4) After the diamine monomer shown is dissolved in an organic solvent, a dianhydride monomer as shown in formula (iii) is added to form a polyamic acid solution after mixing:
Figure 02_image021
Figure 02_image023
Figure 02_image025
Figure 02_image027
Formula (i), Formula (ii-1), Formula (ii-2), Formula (ii-3),
Figure 02_image029
Figure 02_image031
Formula (ii-4), Formula (iii),
Wherein, R is hydrogen, alkyl having 1 to 6 carbons, trifluoromethyl, phenyl or halogen. The condensation reaction is to apply the polyamic acid solution on the copper foil, and after heating and closing the loop, a flexible copper foil substrate with low dielectric loss and high dimensional stability can be obtained.

依據前段所述之具低介電損失及高尺寸安定性的軟性銅箔基板的製備方法,其中有機溶劑可為二甲基乙醯胺、二甲基甲醯胺或N-甲基吡咯烷酮。According to the method for preparing a flexible copper foil substrate with low dielectric loss and high dimensional stability described above, the organic solvent can be dimethylacetamide, dimethylformamide or N-methylpyrrolidone.

依據前段所述之具低介電損失及高尺寸安定性的軟性銅箔基板的製備方法,其中如式(i)所示的二胺單體加上如式(ii-1)、如式(ii-2)、如式(ii-3)或如式(ii-4)所示的二胺單體與如式(iii)所示的二酸酐單體的莫耳比可為0.9至1.1。According to the preparation method of the flexible copper foil substrate with low dielectric loss and high dimensional stability described in the previous paragraph, wherein the diamine monomer shown in formula (i) is added with formula (ii-1), formula ( The molar ratio of ii-2), the diamine monomer represented by formula (ii-3) or formula (ii-4) and the dianhydride monomer represented by formula (iii) may be 0.9 to 1.1.

本發明之又一實施方式提供一種電子裝置,其包含前述之具低介電損失及高尺寸安定性的軟性銅箔基板。Yet another embodiment of the present invention provides an electronic device, which includes the aforementioned flexible copper foil substrate with low dielectric loss and high dimensional stability.

藉此,以本發明之聚醯亞胺所製備之軟性銅箔基板具有低介電常數、低介電損失、低熱膨脹係數以及低製造成本,不但符合產業上的需求,並適用於電子裝置中。Thus, the flexible copper foil substrate prepared by the polyimide of the present invention has low dielectric constant, low dielectric loss, low thermal expansion coefficient and low manufacturing cost, which not only meets the needs of the industry, but is also suitable for electronic devices .

下述將更詳細討論本發明各實施方式。然而,此實施方式可為各種發明概念的應用,可被具體實行在各種不同的特定範圍內。特定的實施方式是僅以說明為目的,且不受限於揭露的範圍。Various embodiments of the invention are discussed in more detail below. However, this embodiment may be an application of various inventive concepts, and may be embodied in various specific ranges. The specific embodiments are for illustrative purposes only and do not limit the scope of the disclosure.

本發明中,有時以鍵線式(skeleton formula)表示化合物結構,此種表示法可以省略碳原子、氫原子以及碳氫鍵。倘若,結構式中有明確繪出官能基的,則以繪示者為準。In the present invention, the compound structure is sometimes represented by a skeleton formula, and carbon atoms, hydrogen atoms, and carbon-hydrogen bonds can be omitted in this representation. If there is a clearly drawn functional group in the structural formula, the drawn one shall prevail.

本發明中,「聚醯亞胺,具有如式(I)所示之一結構」,為了簡潔與通順,有時會表達為式(I)所示的聚醯亞胺或聚醯亞胺(I),其他化合物或基團的表示方式依此類推。In the present invention, "polyimide having a structure as shown in formula (I)" is sometimes expressed as polyimide or polyimide shown in formula (I) for the sake of brevity and clarity. (I), the representation of other compounds or groups can be deduced by analogy.

<聚醯亞胺><Polyimide>

本發明之聚醯亞胺具有如式(I)所示之一結構:

Figure 02_image001
式(I), 其中,A 1為式(I-1)所示之一結構,A 2為式(I-2)所示之一結構,A 3為式(I-3)所示之一結構,A 4為式(I-4)所示之一結構:
Figure 02_image007
式(I-1)、
Figure 02_image009
式(I-2)、
Figure 02_image011
式(I-3)、
Figure 02_image013
式(I-4),
其中,R及Q各自獨立為氫、碳數1至6的烷基、三氟甲基(-CF 3)、苯基或鹵素基,x、y、z及q為整數或小數,n為聚合度,其滿足下列條件:0 < x < 1;0 ≤ y ≤ 1;0 ≤ z ≤ 1;0 ≤ q ≤ 1;x+y+z+q = 1;以及1 ≤ n ≤ 500,具體地,本發明之聚醯亞胺的完整結構如下表一所示。 表一
Figure 02_image035
Polyimide of the present invention has a structure as shown in formula (I):
Figure 02_image001
Formula (I),
Wherein, A 1 is a structure shown in formula (I-1), A 2 is a structure shown in formula (I-2), A 3 is a structure shown in formula (I-3), A 4 is One structure shown in formula (I-4):
Figure 02_image007
Formula (I-1),
Figure 02_image009
Formula (I-2),
Figure 02_image011
Formula (I-3),
Figure 02_image013
Formula (I-4),
Wherein, R and Q are each independently hydrogen, alkyl with 1 to 6 carbons, trifluoromethyl (-CF 3 ), phenyl or halogen, x, y, z and q are integers or decimals, and n is a polymer degree, which satisfies the following conditions: 0 < x <1; 0 ≤ y ≤ 1; 0 ≤ z ≤ 1; 0 ≤ q ≤ 1; x+y+z+q = 1; and 1 ≤ n ≤ 500, specifically , the complete structure of the polyimide of the present invention is shown in Table 1 below. Table I
Figure 02_image035

詳細來說,目前市面上擁有最低介電損失的材料為液晶聚酯(Liquid Crystal Polyester, LCP),在10 GHz下,其介電損失可達0.0025以下,原因在於液晶聚酯具有局部的順向排列以及低極性的酯基,造就其低介電損失特性。因此,為了使聚醯亞胺達到低介電損失,聚醯亞胺的分子鏈需具備線性的特性,所選擇的單體也必須以線性為考量。Specifically, the material with the lowest dielectric loss on the market is Liquid Crystal Polyester (LCP). At 10 GHz, its dielectric loss can reach less than 0.0025, because the liquid crystal polyester has a local forward Alignment and low polarity of the ester group, resulting in its low dielectric loss characteristics. Therefore, in order to achieve low dielectric loss in polyimide, the molecular chain of polyimide must have linear characteristics, and the selected monomers must also be linear.

請參考第1A圖、第1B圖、第1C圖、第1D圖、第1E圖、第1F圖以及第1G圖,其係繪示分子鏈排列結構示意圖。具體而言,若分子鏈排列結構太過線性,會導致加工性不佳,或膜的機械性質不佳(韌性不足),如第1A圖所示,其所對應之結構可為但不限於式(a-1)、式(a-2)或式(a-3)所示之結構,因此需導入非線性或側鏈基的單體,來增加其加工性或膜的機械性質,如第1B圖、第1C圖、第1D圖、第1E圖、第1F圖以及第1G圖所示,其中第1F圖以及第1G圖中的R代表取代基。

Figure 02_image037
Figure 02_image039
Figure 02_image041
式(a-1)、 式(a-2)、 式(a-3)。 Please refer to Fig. 1A, Fig. 1B, Fig. 1C, Fig. 1D, Fig. 1E, Fig. 1F and Fig. 1G, which are diagrams showing the molecular chain arrangement structure. Specifically, if the molecular chain arrangement structure is too linear, it will lead to poor processability, or poor mechanical properties of the film (insufficient toughness), as shown in Figure 1A, the corresponding structure can be but not limited to formula (a-1), the structure shown in formula (a-2) or formula (a-3), therefore, it is necessary to introduce a monomer of nonlinear or side chain group to increase its processability or the mechanical properties of the film, as shown in the first paragraph Figure 1B, Figure 1C, Figure 1D, Figure 1E, Figure 1F and Figure 1G, wherein R in Figure 1F and Figure 1G represents a substituent.
Figure 02_image037
Figure 02_image039
Figure 02_image041
Formula (a-1), Formula (a-2), Formula (a-3).

常見的聚醯亞胺Kapton(杜邦公司)是由4,4’-二胺基二苯醚(4,4’-oxydianiline, 4,4’-ODA)和均苯四甲酸二酐(pyromellitic anhydride, PMDA)所構成,雖然液晶高分子和聚醯亞胺的分子式不同,但排列的方式是相通的,故可以液晶高分子的排列來模擬聚醯亞胺的分子排列。The common polyimide Kapton (DuPont) is composed of 4,4'-diaminodiphenyl ether (4,4'-oxydianiline, 4,4'-ODA) and pyromellitic anhydride (pyromellitic anhydride, PMDA), although the molecular formulas of liquid crystal polymers and polyimide are different, but the arrangement is the same, so the arrangement of liquid crystal polymers can be used to simulate the molecular arrangement of polyimide.

舉例來說,若聚醯亞胺分子鏈排列如第1B圖所示,其所對應之結構可為但不限於式(b-1)、式(b-2)或式(b-3)所示之結構,說明當選用4,4’-ODA為反應單體和酸酐反應時,聚醯亞胺分子鏈的線性度將大幅降低。

Figure 02_image043
Figure 02_image045
Figure 02_image046
式(b-1)、 式(b-2)、 式(b-3)。 For example, if the polyimide molecular chains are arranged as shown in Figure 1B, the corresponding structure can be but not limited to formula (b-1), formula (b-2) or formula (b-3) The structure shown shows that when 4,4'-ODA is selected as the reaction monomer to react with acid anhydride, the linearity of the polyimide molecular chain will be greatly reduced.
Figure 02_image043
Figure 02_image045
Figure 02_image046
Formula (b-1), Formula (b-2), Formula (b-3).

另外,若聚醯亞胺分子鏈排列如第1C圖所示,其所對應之結構可為但不限於式(c-1)或式(c-2)所示之結構,說明當選用3,4’-二胺基二苯醚(3,4’-oxydianiline, 3,4’-ODA)或4,4’-二胺基二苯甲酮(4,4’-diaminobenzophenone)為反應單體和酸酐反應時,相對於第1A圖所示之排列結構,可提高加工性或膜的機械性質,且相對於第1B圖所示之排列結構,仍可維持分子鏈的線性度。然而,4,4’-二胺基二苯甲酮的羰基的極性較高,不利於介電損失,且羰基為一拉電子基,會造成雙胺反應性低,不利於聚合成高分子,而3,4’-ODA的氧基相對於羰基的極性低,且是一推電子基,故其雙胺反應性高,有利於聚合成高分子。

Figure 02_image048
Figure 02_image050
式(c-1)、 式(c-2)。 In addition, if the polyimide molecular chains are arranged as shown in Figure 1C, the corresponding structure can be but not limited to the structure shown in formula (c-1) or formula (c-2), indicating that when 3, 4'-diaminodiphenyl ether (3,4'-oxydianiline, 3,4'-ODA) or 4,4'-diaminobenzophenone (4,4'-diaminobenzophenone) as the reaction monomer and When the acid anhydride is reacted, compared to the arrangement shown in Figure 1A, the processability or mechanical properties of the film can be improved, and the linearity of the molecular chain can still be maintained compared to the arrangement shown in Figure 1B. However, the polarity of the carbonyl group of 4,4'-diaminobenzophenone is high, which is not conducive to dielectric loss, and the carbonyl group is an electron-withdrawing group, which will cause low reactivity of diamine, which is not conducive to polymerization into polymers. On the other hand, the oxy group of 3,4'-ODA has low polarity relative to the carbonyl group and is an electron-pushing group, so its diamine reactivity is high, which is beneficial to polymerize into polymers.
Figure 02_image048
Figure 02_image050
Formula (c-1), Formula (c-2).

然而,為了滿足更佳的低介電損失以及更低的熱膨脹係數,本發明採用3,4’-ODA,即含式(c-1)所示之結構,以達成局部線性的結構並具有低介電損失的特性。若要再降低介電損失,則必須再導入線性的結構,故本發明導入如式(d-1)或式(d-2)所示之二胺結構。

Figure 02_image052
Figure 02_image054
式(d-1)、 式(d-2)。 However, in order to meet better low dielectric loss and lower thermal expansion coefficient, the present invention adopts 3,4'-ODA, which contains the structure shown in formula (c-1), to achieve a locally linear structure and have a low Properties of dielectric loss. To further reduce the dielectric loss, a linear structure must be introduced, so the present invention introduces the diamine structure shown in formula (d-1) or formula (d-2).
Figure 02_image052
Figure 02_image054
Formula (d-1), Formula (d-2).

詳細來說,式(d-1)所示之二胺結構為2,2’-二甲對聯苯胺(m-Tolidine),而式(d-2)所示之二胺結構為2,2’-雙(三氟甲基)-二氨基聯苯(2,2’-bis(trifluoromethyl)benzidine, TFMB)。另外,若以達成低熱膨脹係數的要求,則需導入如式(a-1)所示之二胺結構,其可為對苯二胺(Phenylene diamine, PDA),以增加聚醯亞胺的剛性。In detail, the diamine structure represented by formula (d-1) is 2,2'-dimethyl-p-benzidine (m-Tolidine), while the diamine structure represented by formula (d-2) is 2,2' - Bis(trifluoromethyl)-diaminobiphenyl (2,2'-bis(trifluoromethyl)benzidine, TFMB). In addition, to meet the requirement of low thermal expansion coefficient, it is necessary to introduce a diamine structure as shown in formula (a-1), which can be p-phenylenediamine (Phenylene diamine, PDA) to increase the rigidity of polyimide .

藉此,本發明以3,4’-ODA、PDA、m-Tolidine、TFMB或其混合之二胺單體與二酸酐單體聚合,應可符合具備更佳線性排列結構的聚醯亞胺。In this way, the polymerization of 3,4'-ODA, PDA, m-Tolidine, TFMB or their mixed diamine monomers and dianhydride monomers in the present invention should conform to the polyimide with a better linear arrangement structure.

<聚醯亞胺膜><Polyimide film>

本發明之聚醯亞胺膜,其包含前述聚醯亞胺,詳細來說,當式(I)之聚醯亞胺中,R為氫且x+z為1時(即y、q為0),其具有如式(I-A)所示之一結構:

Figure 02_image015
式(I-A)。 此時,所製備之聚醯亞胺膜的熱膨脹係數可為9 ppm/ oC至33 ppm/ oC,介電常數可為2.8至3.3,且介電損失可為0.0017至0.0038。 The polyimide film of the present invention comprises the aforementioned polyimide, in detail, when in the polyimide of formula (I), R is hydrogen and x+z is 1 (i.e. y, q are 0 ), which has a structure as shown in formula (IA):
Figure 02_image015
Formula (IA).
At this time, the thermal expansion coefficient of the prepared polyimide film can be 9 ppm/ ° C to 33 ppm/ ° C, the dielectric constant can be 2.8 to 3.3, and the dielectric loss can be 0.0017 to 0.0038.

此外,當式(I)之聚醯亞胺中,R為氫且x+y為1時(即z、q為0),其具有如式(I-B)所示之一結構:

Figure 02_image017
式(I-B)。 當Q為甲基時,所製備之聚醯亞胺膜的介電損失可為小於0.0025。另外,當Q為三氟甲基時,所製備之聚醯亞胺膜的介電損失可為0.0017至0.0028,且導入三氟甲基之含氟結構可以有助於提高疏水性以及增加自由體積,進而有效降低介電常數。 In addition, when in the polyimide of formula (I), R is hydrogen and x+y is 1 (that is, z, q are 0), it has a structure as shown in formula (IB):
Figure 02_image017
Formula (IB).
When Q is a methyl group, the dielectric loss of the prepared polyimide film can be less than 0.0025. In addition, when Q is trifluoromethyl, the dielectric loss of the prepared polyimide film can be 0.0017 to 0.0028, and the fluorine-containing structure introduced into trifluoromethyl can help to improve hydrophobicity and increase free volume , thereby effectively reducing the dielectric constant.

然而,當式(I)之聚醯亞胺中,R為氫且x+q為1時(即y、z為0),則具有如式(I-C)所示之一結構:

Figure 02_image019
式(I-C)。 Yet, when in the polyimide of formula (I), R is hydrogen and x+q is 1 (that is y, z are 0), then has a structure as shown in formula (IC):
Figure 02_image019
Formula (IC).

<軟性銅箔基板><Flexible copper foil substrate>

本發明提供一種具低介電損失及高尺寸安定性的軟性銅箔基板,其包含一銅箔以及前述的聚醯亞胺膜,其中聚醯亞胺膜與銅箔接合,且銅箔係本領域所周知的軟性銅箔基板所使用的任一種銅箔,在此不另贅述。藉此,因聚醯亞胺膜具有低介電常數與低介電損失,使得所製備之軟性銅箔基板具有低介電損失,且將軟性銅箔基板應用在軟性電路板中時,其線路之間的電性干擾會降低,有助於避免發生功率負載及訊號延遲。此外,因聚醯亞胺具有與銅箔相近的熱膨脹係數,使得所製備之軟性銅箔基板具有高尺寸安定性,在後續加熱製程中不會因熱膨脹係數差異太大而使基板有翹曲龜裂的現象。The present invention provides a flexible copper foil substrate with low dielectric loss and high dimensional stability, which includes a copper foil and the aforementioned polyimide film, wherein the polyimide film is bonded to the copper foil, and the copper foil is a basic Any copper foil used in flexible copper foil substrates known in the art will not be described in detail here. In this way, because the polyimide film has low dielectric constant and low dielectric loss, the prepared flexible copper foil substrate has low dielectric loss, and when the flexible copper foil substrate is applied in a flexible circuit board, its circuit The electrical interference between them is reduced, helping to avoid power loading and signal delays. In addition, because polyimide has a thermal expansion coefficient similar to that of copper foil, the prepared flexible copper foil substrate has high dimensional stability, and the substrate will not warp due to the large difference in thermal expansion coefficient in the subsequent heating process. crack phenomenon.

<具低介電損失及高尺寸安定性的軟性銅箔基板的製備方法><Manufacturing method of flexible copper foil substrate with low dielectric loss and high dimensional stability>

請參照第2圖,其係繪示依照本發明之一實施方式之一種具低介電損失及高尺寸安定性的軟性銅箔基板的製備方法100的步驟流程圖。第2圖中,具低介電損失及高尺寸安定性的軟性銅箔基板的製備方法100包含步驟110以及步驟120。Please refer to FIG. 2 , which is a flowchart illustrating a method 100 for manufacturing a flexible copper foil substrate with low dielectric loss and high dimensional stability according to an embodiment of the present invention. In FIG. 2 , the manufacturing method 100 of the flexible copper foil substrate with low dielectric loss and high dimensional stability includes step 110 and step 120 .

步驟110是進行一混合步驟,其係將一如式(i)所示的二胺單體以及一如式(ii-1)、如式(ii-2)、如式(ii-3)或如式(ii-4)所示的二胺單體溶於一有機溶劑後,再加入一如式(iii)所示的二酸酐單體,混合後形成一聚醯胺酸溶液:

Figure 02_image021
Figure 02_image023
Figure 02_image025
Figure 02_image027
式(i)、 式(ii-1)、 式(ii-2)、 式(ii-3)、
Figure 02_image029
Figure 02_image031
式(ii-4)、 式(iii), 其中,R為氫、碳數1至6的烷基、三氟甲基、苯基或鹵素基。 Step 110 is to carry out a mixing step, which is a diamine monomer shown in formula (i) and a formula (ii-1), such as formula (ii-2), such as formula (ii-3) or After dissolving the diamine monomer shown in formula (ii-4) in an organic solvent, add a dianhydride monomer shown in formula (iii) and mix to form a polyamic acid solution:
Figure 02_image021
Figure 02_image023
Figure 02_image025
Figure 02_image027
Formula (i), Formula (ii-1), Formula (ii-2), Formula (ii-3),
Figure 02_image029
Figure 02_image031
Formula (ii-4), Formula (iii),
Wherein, R is hydrogen, alkyl having 1 to 6 carbons, trifluoromethyl, phenyl or halogen.

步驟120是進行一縮合反應,其係將聚醯胺酸溶液塗佈至銅箔上,並進行加熱閉環後,以獲得具低介電損失及高尺寸安定性的軟性銅箔基板。Step 120 is to carry out a condensation reaction, which is to apply the polyamic acid solution on the copper foil, and heat and close the loop to obtain a flexible copper foil substrate with low dielectric loss and high dimensional stability.

詳細來說,混合步驟中所使用的有機溶劑可為但不限於二甲基乙醯胺(dimethylacetamide, DMAc)、二甲基甲醯胺(dimethylformamide, DMF)或N-甲基吡咯烷酮(N-methyl-2-pyrrolidone, NMP),而在此步驟中,前述如式(i)所示的二胺單體加上如式(ii-1)、如式(ii-2)、如式(ii-3)或如式(ii-4)所示的二胺單體與如式(iii)所示的二酸酐單體的莫耳比可為0.9至1.1。之後於縮合反應中,將聚醯胺酸溶液塗佈於銅箔上並加熱移除溶劑後,即可合成出包含式(I)所示之聚醯亞胺的聚醯亞胺膜,並獲得銅箔與聚醯亞胺膜接合而成的軟性銅箔基板,其中塗佈方式可為但不限於刮刀塗佈法或旋轉塗佈法。In detail, the organic solvent used in the mixing step can be but not limited to dimethylacetamide (dimethylacetamide, DMAc), dimethylformamide (dimethylformamide, DMF) or N-methylpyrrolidone (N-methyl -2-pyrrolidone, NMP), and in this step, the aforementioned diamine monomer shown in formula (i) plus formula (ii-1), formula (ii-2), formula (ii- 3) or the molar ratio of the diamine monomer represented by formula (ii-4) to the dianhydride monomer represented by formula (iii) may be 0.9 to 1.1. Then in the condensation reaction, the polyamic acid solution is coated on the copper foil and heated to remove the solvent, and then a polyimide film comprising the polyimide shown in formula (I) can be synthesized, and obtained A flexible copper foil substrate formed by joining copper foil and polyimide film, the coating method can be but not limited to doctor blade coating method or spin coating method.

<電子裝置><Electronic devices>

本發明提供一種電子裝置,其包含前述之具低介電損失及高尺寸安定性的軟性銅箔基板。關於具低介電損失及高尺寸安定性的軟性銅箔基板請參照上文,在此不另贅述,關於電子裝置的結構與製造方法係習用,在此不另贅述。The present invention provides an electronic device, which comprises the aforementioned flexible copper foil substrate with low dielectric loss and high dimensional stability. For the flexible copper foil substrate with low dielectric loss and high dimensional stability, please refer to the above, and will not be repeated here. The structure and manufacturing method of the electronic device are conventional, and will not be repeated here.

茲以下列具體實施例進一步示範說明本發明,用以有利於本發明所屬技術領域通常知識者,可在不需過度解讀的情形下完整利用並實踐本發明,而不應將這些實施例視為對本發明範圍的限制,但用於說明如何實施本發明的材料及方法。The following specific examples are hereby further illustrated to illustrate the present invention, so that those who are ordinary in the technical field to which the present invention belongs can fully utilize and practice the present invention without excessive interpretation, and these examples should not be regarded as To limit the scope of the invention, but to illustrate how to practice the materials and methods of the invention.

<實施例/比較例><Example/Comparative Example>

實施例1:先取1.0克(4.994毫莫耳)的3,4’-ODA二胺單體以及0.1800克(1.665毫莫耳)的PDA二胺單體,溶於25克的除水NMP中(20 wt%),待二胺單體完全溶解後,加入3.0519克(6.659毫莫耳)的對-亞苯基-雙苯偏三酸酯二酐(p-Phenylene bis(trimellitate) dianhydride, TAHQ),於氮氣環境下攪拌24小時,接著控制刮刀厚度400 μm將其塗佈於銅箔基板上,置於循環烘箱中以150 oC加熱20分鐘,烘乾大部分溶劑後,再階段升溫150 oC半小時、200 oC一小時、250 oC一小時、300 oC一小時,可得實施例1之單面銅箔軟板供漂錫耐熱性測試,接著,將銅箔基板蝕刻即可得到實施例1之聚醯亞胺薄膜供電性測試。實施例1的反應方程式如下表二所示。 表二

Figure 02_image065
Embodiment 1: First get 1.0 grams (4.994 millimoles) of 3,4'-ODA diamine monomers and 0.1800 grams (1.665 millimoles) of PDA diamine monomers, dissolve them in 25 grams of dewatered NMP ( 20 wt%), after the diamine monomer is completely dissolved, add 3.0519 g (6.659 mmol) of p-phenylene-bis (trimellitate) dianhydride (p-Phenylene bis(trimellitate) dianhydride, TAHQ) , stirred for 24 hours under a nitrogen atmosphere, then controlled the thickness of the scraper to 400 μm and coated it on the copper foil substrate, placed it in a circulating oven and heated it at 150 o C for 20 minutes, dried most of the solvent, and then raised the temperature by 150 o C in stages Half an hour at C, 1 hour at 200 o C, one hour at 250 o C, and one hour at 300 o C, the single-sided copper foil flexible board of Example 1 can be used for the heat resistance test of tin bleaching, and then the copper foil substrate can be etched Obtain the polyimide film power supply test of embodiment 1. The reaction equation of Example 1 is shown in Table 2 below. Table II
Figure 02_image065

實施例2:先取1.0克(4.994毫莫耳)的3,4’-ODA二胺單體以及0.5401克(4.994毫莫耳)的PDA二胺單體,溶於25克的除水NMP中(20 wt%),待二胺單體完全溶解後,加入4.5778克(9.988毫莫耳)的TAHQ二酸酐單體,於氮氣環境下攪拌24小時,之後的步驟與實施例1相同,可得實施例2之單面銅箔軟板供漂錫耐熱性測試,接著,將銅箔基板蝕刻即可得到實施例2之聚醯亞胺薄膜供電性測試。實施例2的反應方程式如下表三所示。 表三

Figure 02_image067
Embodiment 2: First get 1.0 grams (4.994 millimoles) of 3,4'-ODA diamine monomers and 0.5401 grams (4.994 millimoles) of PDA diamine monomers, dissolve them in 25 grams of dewatered NMP ( 20 wt%), after the diamine monomer is completely dissolved, add the TAHQ dianhydride monomer of 4.5778 grams (9.988 millimoles), and stir for 24 hours under a nitrogen environment, and the subsequent steps are the same as in Example 1, and can be implemented The single-sided copper-clad flexible board of Example 2 was used for the heat resistance test of tin-bleaching. Then, the copper-clad substrate was etched to obtain the polyimide film of Example 2 for the power supply test. The reaction equation of Example 2 is shown in Table 3 below. Table three
Figure 02_image067

實施例3:先取1.0克(4.994毫莫耳)的3,4’-ODA二胺單體以及1.6202克(14.98毫莫耳)的PDA二胺單體,溶於25克的除水NMP中(20 wt%),待二胺單體完全溶解後,加入9.1556克(19.98毫莫耳)的TAHQ二酸酐單體,於氮氣環境下攪拌24小時,之後的步驟與實施例1相同,可得實施例3之單面銅箔軟板供漂錫耐熱性測試,接著,將銅箔基板蝕刻即可得到實施例3之聚醯亞胺薄膜供電性測試。實施例3的反應方程式如下表四所示。 表四

Figure 02_image069
Embodiment 3: First get 1.0 grams (4.994 millimoles) of 3,4'-ODA diamine monomers and 1.6202 grams (14.98 millimoles) of PDA diamine monomers, dissolve them in 25 grams of dewatered NMP ( 20 wt%), after the diamine monomer is completely dissolved, add the TAHQ dianhydride monomer of 9.1556 grams (19.98 millimoles), and stir for 24 hours under a nitrogen environment, and the subsequent steps are the same as in Example 1, and can be implemented The single-sided copper foil flexible board of Example 3 was used for the heat resistance test of tin-flooding, and then, the copper foil substrate was etched to obtain the power supply test of the polyimide film of Example 3. The reaction equation of Example 3 is shown in Table 4 below. Table four
Figure 02_image069

實施例4:先取1.0克(4.994毫莫耳)的3,4’-ODA二胺單體以及0.3534克(1.665毫莫耳)的m-Tolidine二胺單體,溶於25克的除水NMP中(20 wt%),待二胺單體完全溶解後,加入9.1556克(19.98毫莫耳)的TAHQ二酸酐單體,於氮氣環境下攪拌24小時,之後的步驟與實施例1相同,可得實施例4之單面銅箔軟板供漂錫耐熱性測試,接著,將銅箔基板蝕刻即可得到實施例4之聚醯亞胺薄膜供電性測試。實施例4的反應方程式如下表五所示。 表五

Figure 02_image071
Example 4: First take 1.0 g (4.994 mmol) of 3,4'-ODA diamine monomer and 0.3534 g (1.665 mmol) of m-Tolidine diamine monomer, dissolve them in 25 g of dewatered NMP In (20 wt%), after the diamine monomer is completely dissolved, add the TAHQ dianhydride monomer of 9.1556 grams (19.98 mmoles), and stir for 24 hours under a nitrogen environment, and the subsequent steps are the same as in Example 1. The single-sided copper foil flexible board of Example 4 was obtained for the tin-flooding heat resistance test, and then the copper foil substrate was etched to obtain the polyimide film power supply test of Example 4. The reaction equation of Example 4 is shown in Table 5 below. Table five
Figure 02_image071

實施例5:先取1.0克(4.994毫莫耳)的3,4’-ODA二胺單體以及1.0602克(4.994毫莫耳)的m-Tolidine二胺單體,溶於25克的除水NMP中(20 wt%),待二胺單體完全溶解後,加入4.5778克(9.988毫莫耳)的TAHQ二酸酐單體,於氮氣環境下攪拌24小時,之後的步驟與實施例1相同,可得實施例5之單面銅箔軟板供漂錫耐熱性測試,接著,將銅箔基板蝕刻即可得到實施例5之聚醯亞胺薄膜供電性測試。實施例5的反應方程式如下表六所示。 表六

Figure 02_image073
Example 5: First take 1.0 g (4.994 mmol) of 3,4'-ODA diamine monomer and 1.0602 g (4.994 mmol) of m-Tolidine diamine monomer, dissolve them in 25 g of dehydrated NMP In (20 wt%), after the diamine monomer is completely dissolved, add the TAHQ dianhydride monomer of 4.5778 grams (9.988 mmoles), and stir for 24 hours under a nitrogen environment, and the subsequent steps are the same as in Example 1. The single-sided copper foil flexible board of Example 5 was obtained for the heat resistance test of tin bleaching. Then, the copper foil substrate was etched to obtain the power supply test of the polyimide film of Example 5. The reaction equation of Example 5 is shown in Table 6 below. Table six
Figure 02_image073

實施例6:先取1.0克(4.994毫莫耳)的3,4’-ODA二胺單體以及3.1805克(14.98毫莫耳)的m-Tolidine二胺單體,溶於25克的除水NMP中(20 wt%),待二胺單體完全溶解後,加入9.1556克(19.98毫莫耳)的TAHQ二酸酐單體,於氮氣環境下攪拌24小時,之後的步驟與實施例1相同,可得實施例6之單面銅箔軟板供漂錫耐熱性測試,接著,將銅箔基板蝕刻即可得到實施例6之聚醯亞胺薄膜供電性測試。實施例6的反應方程式如下表七所示。 表七

Figure 02_image075
Example 6: First take 1.0 g (4.994 mmol) of 3,4'-ODA diamine monomer and 3.1805 g (14.98 mmol) of m-Tolidine diamine monomer, dissolve them in 25 g of dehydrated NMP In (20 wt%), after the diamine monomer is completely dissolved, add the TAHQ dianhydride monomer of 9.1556 grams (19.98 mmoles), and stir for 24 hours under a nitrogen environment, and the subsequent steps are the same as in Example 1. The single-sided copper foil flexible board of Example 6 was obtained for the heat resistance test of tin bleaching, and then the copper foil substrate was etched to obtain the power supply test of the polyimide film of Example 6. The reaction equation of Example 6 is shown in Table 7 below. Table seven
Figure 02_image075

實施例7:先取1.0克(4.994毫莫耳)的3,4’-ODA二胺單體以及0.5331克(1.665毫莫耳)的TFMB二胺單體,溶於25克的除水NMP中(20 wt%),待二胺單體完全溶解後,加入3.0519克(6.6587毫莫耳)的TAHQ二酸酐單體,於氮氣環境下攪拌24小時,之後的步驟與實施例1相同,可得實施例7之單面銅箔軟板供漂錫耐熱性測試,接著,將銅箔基板蝕刻即可得到實施例7之聚醯亞胺薄膜供電性測試。實施例7的反應方程式如下表八所示。 表八

Figure 02_image077
Example 7: First take 1.0 g (4.994 mmol) of 3,4'-ODA diamine monomer and 0.5331 g (1.665 mmol) of TFMB diamine monomer, and dissolve them in 25 g of dewatered NMP ( 20 wt%), after the diamine monomer is completely dissolved, add the TAHQ dianhydride monomer of 3.0519 grams (6.6587 millimoles), and stir for 24 hours under a nitrogen environment, and the subsequent steps are the same as in Example 1, and can be implemented The single-sided copper-clad flexible board of Example 7 was used for the heat resistance test of tin-bleaching, and then, the copper-clad substrate was etched to obtain the polyimide film of Example 7 for the power supply test. The reaction equation of Example 7 is shown in Table 8 below. table eight
Figure 02_image077

實施例8:先取1.0克(4.994毫莫耳)的3,4’-ODA二胺單體以及1.5992克(4.994毫莫耳)的TFMB二胺單體,溶於25克的除水NMP中(20 wt%),待二胺單體完全溶解後,加入4.5778克(9.988毫莫耳)的TAHQ二酸酐單體,於氮氣環境下攪拌24小時,之後的步驟與實施例1相同,可得實施例8之單面銅箔軟板供漂錫耐熱性測試,接著,將銅箔基板蝕刻即可得到實施例8之聚醯亞胺薄膜供電性測試。實施例8的反應方程式如下表九所示。 表九

Figure 02_image079
Example 8: First take 1.0 g (4.994 mmol) of 3,4'-ODA diamine monomer and 1.5992 g (4.994 mmol) of TFMB diamine monomer, and dissolve them in 25 g of dewatered NMP ( 20 wt%), after the diamine monomer is completely dissolved, add the TAHQ dianhydride monomer of 4.5778 grams (9.988 millimoles), and stir for 24 hours under a nitrogen environment, and the subsequent steps are the same as in Example 1, and can be implemented The single-sided copper foil flexible board of Example 8 was used for the heat resistance test of tin-floating, and then, the copper foil substrate was etched to obtain the power supply test of the polyimide film of Example 8. The reaction equation of Example 8 is shown in Table 9 below. Table nine
Figure 02_image079

實施例9:先取1.0克(4.994毫莫耳)的3,4’-ODA二胺單體以及4.7977克(14.98毫莫耳)的TFMB二胺單體,溶於25克的除水NMP中(20 wt%),待二胺單體完全溶解後,加入9.1556克(19.98毫莫耳)的TAHQ二酸酐單體,於氮氣環境下攪拌24小時,之後的步驟與實施例1相同,可得實施例9之單面銅箔軟板供漂錫耐熱性測試,接著,將銅箔基板蝕刻即可得到實施例9之聚醯亞胺薄膜供電性測試。實施例9的反應方程式如下表十所示。 表十

Figure 02_image081
Example 9: First take 1.0 g (4.994 mmol) of 3,4'-ODA diamine monomer and 4.7977 g (14.98 mmol) of TFMB diamine monomer, and dissolve them in 25 g of dewatered NMP ( 20 wt%), after the diamine monomer is completely dissolved, add the TAHQ dianhydride monomer of 9.1556 grams (19.98 millimoles), and stir for 24 hours under a nitrogen environment, and the subsequent steps are the same as in Example 1, and can be implemented The single-sided copper foil flexible board of Example 9 was used for the heat resistance test of tin-flooding, and then, the copper foil substrate was etched to obtain the power supply test of the polyimide film of Example 9. The reaction equation of Example 9 is shown in Table 10 below. table ten
Figure 02_image081

實施例10:先取1.0克(4.994毫莫耳)的3,4’-ODA二胺單體以及0.1901克(1.665毫莫耳)的CHDA二胺單體,溶於25克的除水NMP中(20 wt%),待二胺單體完全溶解後,加入3.0519克(6.659毫莫耳)的TAHQ二酸酐單體,於氮氣環境下攪拌24小時,之後的步驟與實施例1相同,可得實施例10之單面銅箔軟板供漂錫耐熱性測試,接著,將銅箔基板蝕刻即可得到實施例10之聚醯亞胺薄膜供電性測試。實施例10的反應方程式如下表十一所示。 表十一

Figure 02_image083
Example 10: First take 1.0 g (4.994 mmol) of 3,4'-ODA diamine monomer and 0.1901 g (1.665 mmol) of CHDA diamine monomer, and dissolve them in 25 g of dehydrated NMP ( 20 wt%), after the diamine monomer is completely dissolved, add the TAHQ dianhydride monomer of 3.0519 grams (6.659 millimoles), and stir for 24 hours under a nitrogen environment, and the subsequent steps are the same as in Example 1, and can be implemented The single-sided copper foil flexible board of Example 10 was used for the heat resistance test of tin-floating, and then, the copper foil substrate was etched to obtain the power supply test of the polyimide film of Example 10. The reaction equation of Example 10 is shown in Table 11 below. Table Eleven
Figure 02_image083

比較例1:先取2.0克(4.994毫莫耳)的3,4’-ODA二胺單體溶於25克的除水NMP中(20 wt%),待二胺單體完全溶解後,加入4.5778克(9.988毫莫耳)的TAHQ二酸酐單體,於氮氣環境下攪拌24小時,之後的步驟與實施例1相同,可得比較例1之單面銅箔軟板供漂錫耐熱性測試,接著,將銅箔基板蝕刻即可得到比較例1之聚醯亞胺薄膜供電性測試。比較例1的反應方程式如下表十二所示。 表十二

Figure 02_image085
Comparative Example 1: First take 2.0 grams (4.994 millimoles) of 3,4'-ODA diamine monomer and dissolve it in 25 grams of dehydrated NMP (20 wt%). After the diamine monomer is completely dissolved, add 4.5778 The TAHQ diacid anhydride monomer of gram (9.988 millimoles) was stirred for 24 hours under a nitrogen atmosphere, and the subsequent steps were the same as in Example 1, so that the single-sided copper foil soft board of Comparative Example 1 could be used for the tin-flooding heat resistance test. Next, the polyimide film of Comparative Example 1 was obtained by etching the copper foil substrate for power supply test. The reaction equation of Comparative Example 1 is shown in Table 12 below. Table 12
Figure 02_image085

比較例2:先取1.0克(9.247毫莫耳)的PDA二胺單體溶於25克的除水NMP中(20 wt%),待二胺單體完全溶解後,加入4.2383克(9.247毫莫耳)的TAHQ二酸酐單體,於氮氣環境下攪拌24小時,之後的步驟與實施例1相同,可得比較例2之單面銅箔軟板供漂錫耐熱性測試,接著,將銅箔基板蝕刻即可得到比較例2之聚醯亞胺薄膜供電性測試。比較例2的反應方程式如下表十三所示。 表十三

Figure 02_image087
Comparative example 2: first get the PDA diamine monomer of 1.0 gram (9.247 mmol) and be dissolved in the dewatering NMP of 25 grams (20 wt%), after treating that diamine monomer dissolves completely, add 4.2383 grams (9.247 mmol ear) TAHQ diacid anhydride monomer, stirred for 24 hours under a nitrogen atmosphere, and the subsequent steps were the same as in Example 1, and the single-sided copper foil soft board of Comparative Example 2 could be obtained for the heat resistance test of tin bleaching. Then, the copper foil The polyimide film of Comparative Example 2 can be obtained by etching the substrate for power supply test. The reaction equation of Comparative Example 2 is shown in Table 13 below. Table 13
Figure 02_image087

比較例3:先取2.0克(9.421毫莫耳)的m-Tolidine二胺單體溶於25克的除水NMP中(20 wt%),待二胺單體完全溶解後,加入4.3180克(9.421毫莫耳)的TAHQ二酸酐單體,於氮氣環境下攪拌24小時,之後的步驟與實施例1相同,可得比較例3之單面銅箔軟板供漂錫耐熱性測試,接著,將銅箔基板蝕刻即可得到比較例3之聚醯亞胺薄膜供電性測試。比較例3的反應方程式如下表十四所示。 表十四

Figure 02_image089
Comparative Example 3: First get 2.0 grams (9.421 millimoles) of m-Tolidine diamine monomer and dissolve it in 25 grams of dewatered NMP (20 wt%). After the diamine monomer is completely dissolved, add 4.3180 grams (9.421 millimole) of TAHQ dianhydride monomer, stirred for 24 hours under nitrogen atmosphere, and the subsequent steps were the same as in Example 1, and the single-sided copper foil flexible board of Comparative Example 3 could be obtained for the tin-flooding heat resistance test. Then, the The polyimide film of Comparative Example 3 can be obtained by etching the copper foil substrate for the power supply test. The reaction equation of Comparative Example 3 is shown in Table 14 below. Table Fourteen
Figure 02_image089

比較例4:先取2.0克(6.246毫莫耳)的TFMB二胺單體溶於25克的除水NMP中(20 wt%),待二胺單體完全溶解後,加入2.8625克(6.246毫莫耳)的TAHQ二酸酐單體,於氮氣環境下攪拌24小時,之後的步驟與實施例1相同,可得比較例4之單面銅箔軟板供漂錫耐熱性測試,接著,將銅箔基板蝕刻即可得到比較例4之聚醯亞胺薄膜供電性測試。比較例4的反應方程式如下表十五所示。 表十五

Figure 02_image091
Comparative example 4: get the TFMB diamine monomer of 2.0 grams (6.246 millimolar) earlier and be dissolved in the dehydration NMP of 25 grams (20 wt%), after treating that diamine monomer dissolves completely, add 2.8625 grams (6.246 millimolar) ear) TAHQ diacid anhydride monomer, stirred for 24 hours under a nitrogen atmosphere, and the subsequent steps were the same as in Example 1, and the single-sided copper foil soft board of Comparative Example 4 could be obtained for the heat resistance test of tin bleaching. Then, the copper foil The polyimide film of Comparative Example 4 can be obtained by etching the substrate for power supply test. The reaction equation of Comparative Example 4 is shown in Table 15 below. Table 15
Figure 02_image091

比較例5:先取1.0克(4.994毫莫耳)的3,4’-ODA二胺單體以及1.0602克(4.994毫莫耳)的m-Tolidine二胺單體,溶於25克的除水NMP中(20 wt%),待二胺單體完全溶解後,加入5.3379克(9.988毫莫耳)的TABP二酸酐單體,於氮氣環境下攪拌24小時,之後的步驟與實施例1相同,可得比較例5之單面銅箔軟板供漂錫耐熱性測試,接著,將銅箔基板蝕刻即可得到比較例5之聚醯亞胺薄膜供電性測試。比較例5的反應方程式如下表十六所示。 表十六

Figure 02_image093
Comparative Example 5: First take 1.0 g (4.994 mmol) of 3,4'-ODA diamine monomer and 1.0602 g (4.994 mmol) of m-Tolidine diamine monomer, dissolve them in 25 g of dehydrated NMP In (20 wt%), after the diamine monomer is completely dissolved, add the TABP dianhydride monomer of 5.3379 grams (9.988 mmoles), and stir for 24 hours under a nitrogen environment, and the subsequent steps are the same as in Example 1. The single-sided copper foil flexible board of Comparative Example 5 was obtained for the heat resistance test of tin bleaching, and then the copper foil substrate was etched to obtain the power supply test of the polyimide film of Comparative Example 5. The reaction equation of Comparative Example 5 is shown in Table 16 below. Table 16
Figure 02_image093

比較例6:先取1.0克(4.994毫莫耳)的3,4’-ODA二胺單體以及1.0602克(4.994毫莫耳)的m-Tolidine二胺單體,溶於25克的除水NMP中(20 wt%),待二胺單體完全溶解後,加入2.1786克(9.98毫莫耳)的PMDA二酸酐單體,於氮氣環境下攪拌24小時,之後的步驟與實施例1相同,可得比較例6之單面銅箔軟板供漂錫耐熱性測試,接著,將銅箔基板蝕刻即可得到比較例6之聚醯亞胺薄膜供電性測試。比較例6的反應方程式如下表十七所示。 表十七

Figure 02_image095
Comparative Example 6: First take 1.0 g (4.994 mmol) of 3,4'-ODA diamine monomer and 1.0602 g (4.994 mmol) of m-Tolidine diamine monomer, dissolve them in 25 g of dehydrated NMP In (20 wt%), after the diamine monomer dissolves completely, add the PMDA dianhydride monomer of 2.1786 grams (9.98 millimoles), stir 24 hours under nitrogen environment, after the step is identical with embodiment 1, can The single-sided copper foil flexible board of Comparative Example 6 was obtained for the heat resistance test of tin bleaching. Then, the copper foil substrate was etched to obtain the power supply test of the polyimide film of Comparative Example 6. The reaction equation of Comparative Example 6 is shown in Table 17 below. Table 17
Figure 02_image095

比較例7:先取1.0克(4.994毫莫耳)的3,4’-ODA二胺單體以及1.0602克(4.994毫莫耳)的m-Tolidine二胺單體,溶於25克的除水NMP中(20 wt%),待二胺單體完全溶解後,加入2.9387克(9.988毫莫耳)的BPDA二酸酐單體,於氮氣環境下攪拌24小時,之後的步驟與實施例1相同,可得比較例7之單面銅箔軟板供漂錫耐熱性測試,接著,將銅箔基板蝕刻即可得到比較例7之聚醯亞胺薄膜供電性測試。比較例7的反應方程式如下表十八所示。 表十八

Figure 02_image097
Comparative Example 7: First take 1.0 g (4.994 mmol) of 3,4'-ODA diamine monomer and 1.0602 g (4.994 mmol) of m-Tolidine diamine monomer, dissolve them in 25 g of dehydrated NMP In (20 wt%), after the diamine monomer is completely dissolved, add the BPDA dianhydride monomer of 2.9387 grams (9.988 millimoles), and stir for 24 hours under a nitrogen environment, and the subsequent steps are the same as in Example 1. The single-sided copper foil flexible board of Comparative Example 7 was obtained for the heat resistance test of tin-flooding, and then the copper foil substrate was etched to obtain the polyimide film of Comparative Example 7 for the power supply test. The reaction equation of Comparative Example 7 is shown in Table 18 below. Table 18
Figure 02_image097

比較例8:先取1.0克(8.757毫莫耳)的CHDA二胺單體溶於25克的除水NMP中(20 wt%),待二胺單體完全溶解後,加入4.0137克(8.757毫莫耳)的TAHQ二酸酐單體,於氮氣環境下攪拌24小時,之後的步驟與實施例1相同,可得比較例8之單面銅箔軟板供漂錫耐熱性測試,接著,將銅箔基板蝕刻即可得到比較例8之聚醯亞胺薄膜供電性測試。比較例8的反應方程式如下表十九所示。 表十九

Figure 02_image099
Comparative Example 8: First get 1.0 g (8.757 mmol) of CHDA diamine monomer and dissolve it in 25 g of dewatered NMP (20 wt%). After the diamine monomer is completely dissolved, add 4.0137 g (8.757 mmol) ear) TAHQ diacid anhydride monomer, stirred for 24 hours under a nitrogen environment, and the subsequent steps were the same as in Example 1, and the single-sided copper foil soft board of Comparative Example 8 could be used for the tin-floating heat resistance test. Then, the copper foil The polyimide film of Comparative Example 8 can be obtained by etching the substrate for power supply test. The reaction equation of Comparative Example 8 is shown in Table 19 below. Table nineteen
Figure 02_image099

<評估測試方法><Evaluation test method>

漂錫耐熱性測試:將製得之單面銅箔軟板置於288 oC下漂錫10秒,試驗三次目視看有無起泡。 Tin-flooding heat resistance test: Place the prepared single-sided copper foil soft board at 288 o C for 10 seconds, and test for three times to visually check for blisters.

介電分析方法:先將製得之聚醯亞胺膜於120 oC下烘乾除水1小時,接著置於10 GHz介電常數儀進行介電分析,測試三次取平均值。其中介電常數儀(Dielectric constant Analysis)的廠牌與型號分別為台灣羅德史瓦茲/鋼製/ZNB20,在10 GHz下測量固化薄膜之介電常數(D k)及介電損失(D f),其固化薄膜需小於或等於350 μm,並將薄膜裁切為9 cm

Figure 02_image101
13 cm,於室溫下測量。 Dielectric analysis method: first dry the prepared polyimide film at 120 o C to remove water for 1 hour, then place it in a 10 GHz dielectric constant meter for dielectric analysis, and take the average value of three tests. Among them, the brand and model of the dielectric constant meter (Dielectric constant Analysis) are Taiwan Rohde Schwartz/Steel/ZNB20, and the dielectric constant (D k ) and dielectric loss (D k ) of the cured film are measured at 10 GHz. f ), the cured film must be less than or equal to 350 μm, and the film should be cut to 9 cm
Figure 02_image101
13 cm, measured at room temperature.

將實施例1至實施例10以及比較例1至比較例8進行上述評估測試方法,並將結果紀錄於表二十。 表二十   二胺 二酸酐 成膜性 漂錫 耐熱性 D k D f CTE (ppm/ oC) 實施例1 3,4’-ODA/ PDA = 3/1 TAHQ O 通過 2.8 0.0019 33 實施例2 3,4’-ODA/ PDA = 1/1 TAHQ O 通過 3.2 0.0020 20 實施例3 3,4’-ODA/ PDA = 1/3 TAHQ O 通過 3.3 0.0027 18 實施例4 3,4’-ODA/ m-Tolidine = 3/1 TAHQ O 通過 2.9 0.0014 32 實施例5 3,4’-ODA/ m-Tolidine = 1/1 TAHQ O 通過 3.2 0.0014 30 實施例6 3,4’-ODA/ m-Tolidine = 1/3 TAHQ O 通過 3.1 0.0011 23 實施例7 3,4’-ODA/ TFMB = 3/1 TAHQ O 通過 3.0 0.0020 26 實施例8 3,4’-ODA/ TFMB = 1/1 TAHQ O 通過 2.9 0.0019 21 實施例9 3,4’-ODA/ TFMB = 1/3 TAHQ O 通過 2.6 0.0019 23 實施例10 3,4’-ODA/ CHDA = 1/1 TAHQ O 通過 3.2 0.0019 40 比較例1 3,4’-ODA TAHQ O 通過 3.0 0.0017 32 比較例2 PDA TAHQ O 通過 3.2 0.0038 9 比較例3 m-Tolidine TAHQ O 通過 2.8 0.0017 24 比較例4 TFMB TAHQ O 通過 3.3 0.0028 23 比較例5 3,4’-ODA/ m-Tolidine = 1/1 TABP O 通過 3.0 0.0024 - 比較例6 3,4’-ODA/ m-Tolidine = 1/1 PMDA O 通過 3.4 0.015 - 比較例7 3,4’-ODA/ m-Tolidine = 1/1 BPDA O 通過 3.2 0.0058 - 比較例8 CHDA TAHQ X X - - - Example 1 to Example 10 and Comparative Example 1 to Comparative Example 8 were subjected to the above evaluation test method, and the results were recorded in Table 20. Table twenty diamine dianhydride Film forming Tin bleaching heat resistance D f CTE (ppm/ oC ) Example 1 3,4'-ODA/PDA = 3/1 TAHQ o pass 2.8 0.0019 33 Example 2 3,4'-ODA/PDA = 1/1 TAHQ o pass 3.2 0.0020 20 Example 3 3,4'-ODA/PDA = 1/3 TAHQ o pass 3.3 0.0027 18 Example 4 3,4'-ODA/ m-Tolidine = 3/1 TAHQ o pass 2.9 0.0014 32 Example 5 3,4'-ODA/ m-Tolidine = 1/1 TAHQ o pass 3.2 0.0014 30 Example 6 3,4'-ODA/ m-Tolidine = 1/3 TAHQ o pass 3.1 0.0011 twenty three Example 7 3,4'-ODA/ TFMB = 3/1 TAHQ o pass 3.0 0.0020 26 Example 8 3,4'-ODA/ TFMB = 1/1 TAHQ o pass 2.9 0.0019 twenty one Example 9 3,4'-ODA/ TFMB = 1/3 TAHQ o pass 2.6 0.0019 twenty three Example 10 3,4'-ODA/ CHDA = 1/1 TAHQ o pass 3.2 0.0019 40 Comparative example 1 3,4'-ODA TAHQ o pass 3.0 0.0017 32 Comparative example 2 PDA TAHQ o pass 3.2 0.0038 9 Comparative example 3 m-Tolidine TAHQ o pass 2.8 0.0017 twenty four Comparative example 4 TFMB TAHQ o pass 3.3 0.0028 twenty three Comparative Example 5 3,4'-ODA/ m-Tolidine = 1/1 TABP o pass 3.0 0.0024 - Comparative example 6 3,4'-ODA/ m-Tolidine = 1/1 PMDA o pass 3.4 0.015 - Comparative Example 7 3,4'-ODA/ m-Tolidine = 1/1 BPDA o pass 3.2 0.0058 - Comparative Example 8 CHDA TAHQ x x - - -

由上述表二十的結果可見,本案之軟性銅箔基板具有低介電損失以及高尺寸安定性,詳細說明如下。From the results in Table 20 above, it can be seen that the flexible copper foil substrate in this case has low dielectric loss and high dimensional stability, and the details are as follows.

當固定二酸酐結構時,可以比較m-Tolidine對介電損失的影響。例如,實施例4至實施例6相比,其介電損失隨著m-Tolidine添加的含量越高進而降低,且介電損失介於0.0011至0.0017之間,其中實施例6具有最低介電損失0.0011。因此,可以發現混合3,4’-ODA及m-Tolidine二胺單體所構成的共聚聚醯亞胺具有較低的介電損失特性,其與導入m-Tolidine後,線性度較佳有關。The effect of m-Tolidine on dielectric loss can be compared when the dianhydride structure is fixed. For example, compared with embodiment 4 to embodiment 6, its dielectric loss decreases with the higher content of m-Tolidine added, and the dielectric loss is between 0.0011 to 0.0017, wherein embodiment 6 has the lowest dielectric loss 0.0011. Therefore, it can be found that the copolymerized polyimide formed by mixing 3,4'-ODA and m-Tolidine diamine monomers has lower dielectric loss characteristics, which is related to better linearity after introducing m-Tolidine.

當固定二酸酐結構時,可以比較PDA對熱膨脹係數的影響。例如,實施例1至實施例3以及比較例2相比,其熱膨脹係數隨著PDA添加的含量越高進而降低,且熱膨脹係數介於9 ppm/ oC至33 ppm/ oC之間,其中實施例3的熱膨脹係數為18 ppm/ oC,其係最接近銅箔的熱膨脹係數(17 ppm/ oC)。因此,可以發現混合3,4’-ODA及PDA二胺單體所構成的共聚聚醯亞胺具有與銅箔相近的熱膨脹係數,其與PDA線性度較佳有關,且有利於多層版的製作而使所製備之軟性銅箔基板具有高尺寸安定性。 The effect of PDA on the coefficient of thermal expansion can be compared when the dianhydride structure is fixed. For example, compared with Example 1 to Example 3 and Comparative Example 2, its coefficient of thermal expansion decreases with the higher content of PDA added, and the coefficient of thermal expansion is between 9 ppm/ ° C to 33 ppm/ ° C, where The coefficient of thermal expansion of Example 3 is 18 ppm/ o C, which is closest to that of copper foil (17 ppm/ o C). Therefore, it can be found that the copolymerized polyimide formed by mixing 3,4'-ODA and PDA diamine monomers has a thermal expansion coefficient similar to that of copper foil, which is related to the better linearity of PDA and is conducive to the production of multi-layer plates. Therefore, the prepared flexible copper foil substrate has high dimensional stability.

另外,當固定二胺結構時,可以比較不同二酸酐對介電損失的影響。例如,實施例5、比較例6及比較例7相比,其介電損失分別為0.0014、0.015、0.0058。因此,可以發現在二酸酐的結構上,TAHQ優於BPDA,而BPDA優於PMDA,故含酯基的二酸酐是構成低介電損失的重要原料。In addition, when the diamine structure is fixed, the effect of different dianhydrides on the dielectric loss can be compared. For example, compared with Example 5, Comparative Example 6, and Comparative Example 7, the dielectric losses are 0.0014, 0.015, and 0.0058, respectively. Therefore, it can be found that TAHQ is superior to BPDA in terms of the structure of dianhydrides, and BPDA is superior to PMDA, so dianhydrides containing ester groups are important raw materials for low dielectric loss.

綜上所述,本發明以混合3,4’-ODA以及m-Tolidine二胺單體與含酯基之TAHQ二酸酐單體合成的聚醯亞胺具有低介電常數以及低介電損失的特性,而以混合3,4’-ODA以及PDA二胺單體與含酯基之TAHQ二酸酐單體合成的聚醯亞胺具有相近於銅箔基板的熱膨脹係數以及低介電損失的特性,且上述單體所製備之軟性銅箔基板可以通過漂錫耐熱性的測試,有利於應用在5G高頻傳輸印刷電路軟板的製作,以符合產業需求。In summary, the polyimide synthesized by mixing 3,4'-ODA and m-Tolidine diamine monomers and TAHQ dianhydride monomers containing ester groups in the present invention has low dielectric constant and low dielectric loss properties, while the polyimide synthesized by mixing 3,4'-ODA and PDA diamine monomers with TAHQ dianhydride monomers containing ester groups has the characteristics of thermal expansion coefficient and low dielectric loss close to that of copper foil substrates, Moreover, the flexible copper foil substrate prepared by the above-mentioned monomers can pass the heat resistance test of tin bleaching, which is beneficial to the production of flexible printed circuit boards for 5G high-frequency transmission, so as to meet the needs of the industry.

雖然本發明已以實施方式揭露如上,然其並非用以限定本發明,任何熟習此技藝者,在不脫離本發明之精神和範圍內,當可作各種之更動與潤飾,因此本發明之保護範圍當視後附之申請專利範圍所界定者為準。Although the present invention has been disclosed above in terms of implementation, it is not intended to limit the present invention. Anyone skilled in this art can make various changes and modifications without departing from the spirit and scope of the present invention. Therefore, the protection of the present invention The scope shall be defined by the appended patent application scope.

100:具低介電損失及高尺寸安定性的軟性銅箔基板的製備方法 110,120:步驟 100: Preparation method of flexible copper foil substrate with low dielectric loss and high dimensional stability 110,120: steps

為讓本發明之上述和其他目的、特徵、優點與實施例能更明顯易懂,所附圖式之說明如下: 第1A圖、第1B圖、第1C圖、第1D圖、第1E圖、第1F圖以及第1G圖係繪示分子鏈排列結構示意圖;以及 第2圖係繪示依照本發明之一實施方式之一種具低介電損失及高尺寸安定性的軟性銅箔基板的製備方法的步驟流程圖。 In order to make the above and other objects, features, advantages and embodiments of the present invention more clearly understood, the accompanying drawings are described as follows: Fig. 1A, Fig. 1B, Fig. 1C, Fig. 1D, Fig. 1E, Fig. 1F and Fig. 1G are diagrams showing the molecular chain arrangement structure; and FIG. 2 is a flow chart showing the steps of a method for preparing a flexible copper foil substrate with low dielectric loss and high dimensional stability according to an embodiment of the present invention.

Claims (9)

一種具低介電損失及高尺寸安定性的軟性銅箔基板,包含:一銅箔;以及一聚醯亞胺膜,其與該銅箔接合,且該聚醯亞胺膜包含一聚醯亞胺,該聚醯亞胺具有如式(I)所示之一結構:
Figure 110132492-A0305-02-0033-1
其中,A1為式(I-1)所示之一結構,A2為式(I-2)所示之一結構,A4為式(I-4)所示之一結構:
Figure 110132492-A0305-02-0033-2
Figure 110132492-A0305-02-0033-3
Figure 110132492-A0305-02-0033-4
其中,R為氫,Q為碳數1的烷基或三氟甲基,x、y、z及q為整數或小數,n為聚合度,且0<x<1、0
Figure 110132492-A0305-02-0033-8
y<1、z=0、0
Figure 110132492-A0305-02-0033-10
q<1、1
Figure 110132492-A0305-02-0033-11
n
Figure 110132492-A0305-02-0033-12
500;其中,x+y為1且q為0;或x+q為1且y為0。
A flexible copper foil substrate with low dielectric loss and high dimensional stability, comprising: a copper foil; and a polyimide film bonded to the copper foil, and the polyimide film comprises a polyimide film Amine, this polyimide has one structure as shown in formula (I):
Figure 110132492-A0305-02-0033-1
Wherein, A 1 is a structure shown in formula (I-1), A 2 is a structure shown in formula (I-2), A 4 is a structure shown in formula (I-4):
Figure 110132492-A0305-02-0033-2
Figure 110132492-A0305-02-0033-3
Figure 110132492-A0305-02-0033-4
Wherein, R is hydrogen, Q is an alkyl group or trifluoromethyl group with 1 carbon number, x, y, z and q are integers or decimals, n is the degree of polymerization, and 0<x<1, 0
Figure 110132492-A0305-02-0033-8
y<1, z=0, 0
Figure 110132492-A0305-02-0033-10
q<1, 1
Figure 110132492-A0305-02-0033-11
no
Figure 110132492-A0305-02-0033-12
500; where x+y is 1 and q is 0; or x+q is 1 and y is 0.
如請求項1所述之具低介電損失及高尺寸安 定性的軟性銅箔基板,其中當該式(I)中,R為氫且x+y為1時,該聚醯亞胺膜所包含之該聚醯亞胺具有如式(I-B)所示之一結構:
Figure 110132492-A0305-02-0034-5
其中Q為甲基或三氟甲基。
The flexible copper foil substrate with low dielectric loss and high dimensional stability as described in claim 1, wherein when R is hydrogen and x+y is 1 in the formula (I), the polyimide film is This polyimide that comprises has a structure as shown in formula (IB):
Figure 110132492-A0305-02-0034-5
Wherein Q is methyl or trifluoromethyl.
如請求項1所述之具低介電損失及高尺寸安定性的軟性銅箔基板,其中當該式(I)中,R為氫且x+q為1時,該聚醯亞胺膜所包含之該聚醯亞胺具有如式(I-C)所示之一結構:
Figure 110132492-A0305-02-0034-6
The flexible copper foil substrate with low dielectric loss and high dimensional stability as described in Claim 1, wherein when R is hydrogen and x+q is 1 in the formula (I), the polyimide film is The polyimide that comprises has a structure as shown in formula (IC):
Figure 110132492-A0305-02-0034-6
如請求項1所述之具低介電損失及高尺寸安定性的軟性銅箔基板,其中該聚醯亞胺膜的熱膨脹係數為9ppm/℃至33ppm/℃。 The flexible copper foil substrate with low dielectric loss and high dimensional stability as claimed in Claim 1, wherein the thermal expansion coefficient of the polyimide film is 9 ppm/°C to 33 ppm/°C. 如請求項1所述之具低介電損失及高尺寸安定性的軟性銅箔基板,其中該聚醯亞胺膜的介電損失小於0.0025。 The flexible copper foil substrate with low dielectric loss and high dimensional stability as claimed in Claim 1, wherein the dielectric loss of the polyimide film is less than 0.0025. 一種如請求項1所述之具低介電損失及高尺寸安定性的軟性銅箔基板的製備方法,包含:進行一混合步驟,其係將一如式(i)所示的二胺單體以及一如式(ii-1)、如式(ii-3)或如式(ii-4)所示的二胺單體溶於一有機溶劑後,再加入一如式(iii)所示的二酸酐單體,混合後形成一聚醯胺酸溶液:
Figure 110132492-A0305-02-0035-7
其中,R為氫;以及進行一縮合反應,其係將該聚醯胺酸溶液塗佈至該銅箔上,並進行加熱閉環後,以獲得該具低介電損失及高尺寸安定性的軟性銅箔基板。
A method for preparing a flexible copper foil substrate with low dielectric loss and high dimensional stability as described in claim 1, comprising: performing a mixing step, which is to mix a diamine monomer as shown in formula (i) And after dissolving the diamine monomer shown in formula (ii-1), formula (ii-3) or formula (ii-4) in an organic solvent, add a diamine monomer shown in formula (iii) Diic anhydride monomers, mixed to form a polyamic acid solution:
Figure 110132492-A0305-02-0035-7
Wherein, R is hydrogen; and a condensation reaction is carried out, which is to apply the polyamic acid solution to the copper foil, and heat and close the ring to obtain the soft material with low dielectric loss and high dimensional stability. Copper foil substrate.
如請求項6所述之具低介電損失及高尺寸安定性的軟性銅箔基板的製備方法,其中該有機溶劑為二甲基乙醯胺、二甲基甲醯胺或N-甲基吡咯烷酮。 The method for preparing a flexible copper foil substrate with low dielectric loss and high dimensional stability as described in Claim 6, wherein the organic solvent is dimethylacetamide, dimethylformamide or N-methylpyrrolidone . 如請求項6所述之具低介電損失及高尺寸安定性的軟性銅箔基板的製備方法,其中該如式(i)所示的二胺單體加上該如式(ii-1)、如式(ii-3)或如式(ii-4)所示的二胺單體與該如式(iii)所示的二酸酐單體的莫耳比為0.9至1.1。 The method for preparing a flexible copper foil substrate with low dielectric loss and high dimensional stability as described in claim 6, wherein the diamine monomer shown in formula (i) plus the formula (ii-1) , The molar ratio of the diamine monomer represented by formula (ii-3) or formula (ii-4) to the dianhydride monomer represented by formula (iii) is 0.9 to 1.1. 一種電子裝置,其包含如請求項1至請求項5中任一項所述之具低介電損失及高尺寸安定性的軟性銅箔基板。 An electronic device comprising the flexible copper foil substrate with low dielectric loss and high dimensional stability as described in any one of claim 1 to claim 5.
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