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TWI790581B - Plating device and method for cleaning contact members of the plating device - Google Patents

Plating device and method for cleaning contact members of the plating device Download PDF

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Publication number
TWI790581B
TWI790581B TW110111089A TW110111089A TWI790581B TW I790581 B TWI790581 B TW I790581B TW 110111089 A TW110111089 A TW 110111089A TW 110111089 A TW110111089 A TW 110111089A TW I790581 B TWI790581 B TW I790581B
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Taiwan
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aforementioned
substrate holder
contact member
cleaning
arm
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TW110111089A
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Chinese (zh)
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TW202237908A (en
Inventor
関正也
富田正輝
張紹華
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日商荏原製作所股份有限公司
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  • Manufacturing Of Electrical Connectors (AREA)
  • Electroplating Methods And Accessories (AREA)
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Abstract

本發明提供一種構造簡單且可清洗接觸構件之技術。本發明之鍍覆裝置1000具備:鍍覆槽、基板固持器20、旋轉機構、升降機構、接觸構件40、及清洗接觸構件40之清洗裝置50,清洗裝置50具有:回轉軸51、第一手臂53、第二手臂54、及至少具有一個吐出口之噴嘴55,且係以藉由從吐出口吐出之清洗流體碰觸接觸構件40來清洗接觸構件40的方式構成。 The invention provides a technology with simple structure and cleanable contact components. The coating device 1000 of the present invention is equipped with: a coating tank, a substrate holder 20, a rotating mechanism, a lifting mechanism, a contact member 40, and a cleaning device 50 for cleaning the contact member 40. The cleaning device 50 has: a rotary shaft 51, a first arm 53 . The second arm 54 and the nozzle 55 having at least one discharge port are configured to clean the contact member 40 by contacting the contact member 40 with the cleaning fluid discharged from the discharge port.

Description

鍍覆裝置及鍍覆裝置之接觸構件清洗方法 Plating device and method for cleaning contact members of the plating device

本發明係關於一種鍍覆裝置及鍍覆裝置之接觸構件清洗方法。 The invention relates to a plating device and a method for cleaning a contact member of the plating device.

過去,可對基板實施鍍覆處理之鍍覆裝置習知有所謂杯式的鍍覆裝置(例如,參照專利文獻1)。此種鍍覆裝置具備:鍍覆槽;配置於比配置在鍍覆槽內部之陽極上方,保持作為陰極之基板的基板固持器;及使基板固持器旋轉之旋轉機構。 Conventionally, a so-called cup-type plating apparatus has been known as a plating apparatus capable of performing a plating process on a substrate (for example, refer to Patent Document 1). Such a plating apparatus includes: a plating tank; a substrate holder disposed above an anode disposed inside the coating tank and holding a substrate serving as a cathode; and a rotation mechanism for rotating the substrate holder.

如上述之過去鍍覆裝置的基板固持器中,一般而言配置有用於對基板饋電之接觸構件。該接觸構件不潔時,接觸構件之電阻值變化,可能造成基板之鍍覆品質惡化。因此,開發出關於可清洗該接觸構件之清洗裝置的技術(例如,參照專利文獻2)。 In the substrate holder of the above-mentioned de-plating device, generally speaking, a contact member for feeding power to the substrate is arranged. When the contact member is not clean, the resistance value of the contact member changes, which may cause the plating quality of the substrate to deteriorate. Therefore, a technique related to a cleaning device capable of cleaning the contact member has been developed (for example, refer to Patent Document 2).

〔先前技術文獻〕 [Prior Technical Literature] 〔專利文獻〕 〔Patent Document〕

[專利文獻1]日本特開2008-19496號公報 [Patent Document 1] Japanese Unexamined Patent Publication No. 2008-19496

[專利文獻2]美國專利申請公開第2013/0061875號說明書 [Patent Document 2] Specification of U.S. Patent Application Publication No. 2013/0061875

但是,上述過去之接觸構件的清洗裝置之構造複雜。 However, the structure of the cleaning device of the above-mentioned conventional contact member is complicated.

本發明係鑑於上述情形者,目的之一為提供一種構造簡單且可清洗接觸構件的技術。 One of the objects of the present invention is to provide a technique for cleaning a contact member with a simple structure.

(樣態1) (pattern 1)

為了達成上述目的,本發明一個樣態之鍍覆裝置具備:鍍覆槽;基板固持器,其係配置於比配置在前述鍍覆槽內部之陽極上方,可保持作為陰極之基板;旋轉機構,其係使前述基板固持器旋轉;升降機構,其係使前述基板固持器升降;接觸構件,其係配置於前述基板固持器,並且與前述基板下面之外周緣接觸,來對前述基板饋電;及清洗裝置,其係清洗前述接觸構件;前述清洗裝置具有:回轉軸,其係在前述基板固持器之徑方向配置於外側的區域,並在上下方向延伸;第一手臂,其係連接於前述回轉軸,並在水平方向延伸;第二手臂,其係從與前述第一手臂的連接於前述回轉軸之側相反側的端部朝向上方延伸;及噴嘴,其係連接於前述第二手臂之上端,具有朝向下方開口,並且吐出清洗流體之至少一個吐出口;並以藉由從該吐出口吐出之前述清洗流體碰觸前述接觸構件的方式來清洗前述接觸構件之方式構成。 In order to achieve the above object, the coating device of one aspect of the present invention has: a coating tank; a substrate holder, which is arranged above the anode disposed inside the aforementioned coating tank, and can hold a substrate as a cathode; a rotating mechanism, It is used to rotate the aforementioned substrate holder; the lifting mechanism is used to lift the aforementioned substrate holder; the contact member is configured on the aforementioned substrate holder and contacts the outer peripheral edge of the lower surface of the aforementioned substrate to feed power to the aforementioned substrate; and a cleaning device, which cleans the aforementioned contact member; the aforementioned cleaning device has: a rotary shaft, which is disposed outside the region in the radial direction of the aforementioned substrate holder, and extends in the vertical direction; a first arm, which is connected to the aforementioned a rotary shaft extending horizontally; a second arm extending upward from the end of the first arm opposite to the side connected to the rotary shaft; and a nozzle connected to the second arm The upper end has at least one discharge port that opens downward and discharges cleaning fluid; and is configured to clean the contact member by contacting the contact member with the cleaning fluid discharged from the discharge port.

採用該樣態時,可藉由如上述之回轉軸、第一手臂、第二手臂、噴嘴等簡單構造所構成的清洗裝置來清洗接觸構件。 When this aspect is adopted, the contact member can be cleaned by a cleaning device composed of a simple structure such as the above-mentioned rotary shaft, the first arm, the second arm, and the nozzle.

此外,採用該樣態時,可藉由第一手臂及第二手臂之2個手臂將噴嘴配置於回轉軸中從第一手臂之連接部位更遠的部位。藉此,可有效清洗接觸構件。此外,採用該樣態時,由於可藉由使回轉軸回轉而使噴嘴移動(回轉移動), 因此可使清洗流體之清洗部位輕易變化。藉此,可輕易清洗接觸構件的寬廣範圍。 In addition, when this aspect is adopted, the nozzle can be arranged at a position farther from the connection position of the first arm in the rotary shaft by the two arms of the first arm and the second arm. Thereby, the contact member can be effectively cleaned. In addition, in this aspect, since the nozzle can be moved (rotational movement) by rotating the rotary shaft, Therefore, the cleaning position of the cleaning fluid can be changed easily. Thereby, a wide range of contact members can be easily cleaned.

(樣態2) (pattern 2)

上述樣態1中,亦可前述噴嘴將前述第二手臂之上端作為起點,而朝向前述回轉軸之側延伸,平面觀看時,在前述噴嘴之長度方向延伸的軸線與在前述第一手臂之長度方向延伸的軸線形成之角度,為10度以上,70度以下之角度。 In the above-mentioned form 1, the nozzle can also be extended toward the side of the rotary shaft from the upper end of the second arm as a starting point. When viewed in a plane, the axis extending in the length direction of the nozzle is the same as the length of the first arm. The angle formed by the axes extending in the same direction is not less than 10 degrees and not more than 70 degrees.

採用該樣態時,從噴嘴之吐出口所吐出的清洗流體可輕易碰觸接觸構件。藉此,可有效清洗接觸構件。 With this aspect, the cleaning fluid discharged from the discharge port of the nozzle can easily contact the contact member. Thereby, the contact member can be effectively cleaned.

(樣態3) (pattern 3)

上述樣態1或2亦可進一步具備控制模組,其係控制前述旋轉機構、前述升降機構、及前述清洗裝置,前述控制模組在執行清洗前述接觸構件之接觸構件清洗處理時,使在前述基板固持器之徑方向移動至外側區域之前述噴嘴移動至藉由使前述回轉軸回轉,而在前述基板固持器之徑方向於內側區域的前述噴嘴不致干擾前述基板固持器的升降位置,接著,藉由前述升降機構使前述基板固持器下降,而使前述接觸構件位於比前述吐出口下方,接著,使前述回轉軸回轉,而使前述噴嘴移動至在前述內側區域之前述吐出口與前述接觸構件相對的清洗位置,接著,藉由前述旋轉機構使前述基板固持器旋轉,而且使前述清洗流體從前述吐出口吐出。 The above aspect 1 or 2 may further include a control module, which is to control the aforementioned rotating mechanism, the aforementioned elevating mechanism, and the aforementioned cleaning device. The nozzles moved to the outside area in the radial direction of the substrate holder are moved to a lifting position where the nozzles in the inner area in the radial direction of the substrate holder do not interfere with the lifting position of the substrate holder by rotating the rotary shaft, and then, The substrate holder is lowered by the lifting mechanism so that the contact member is located below the discharge port, and then the rotary shaft is rotated to move the nozzle to the discharge port and the contact member in the inner region. In the relative cleaning position, next, the substrate holder is rotated by the rotation mechanism, and the cleaning fluid is discharged from the discharge port.

(樣態4) (pattern 4)

上述樣態3中,亦可前述控制模組藉由前述旋轉機構使前述基板固持器旋轉,而且在使前述清洗流體從前述吐出口吐出期間,使前述回轉軸在第 一旋轉方向及與前述第一旋轉方向相反之第二旋轉方向交互地回轉。採用該樣態時,可有效清洗接觸構件。 In the above-mentioned aspect 3, the control module may rotate the substrate holder by the rotation mechanism, and while the cleaning fluid is discharged from the discharge port, the rotary shaft may be rotated at the second position. A rotation direction and a second rotation direction opposite to the aforementioned first rotation direction rotate alternately. According to this aspect, the contact member can be effectively cleaned.

(樣態5) (pattern 5)

上述樣態1~4中任何1個樣態中,前述第二手臂亦可將前述第二手臂中之連接於前述第一手臂的部分作為起點,而可傾斜地連接於前述第一手臂之前述端部。採用該樣態時,可輕易調整清洗流體從噴嘴之吐出口的吐出方向。 In any one of the above-mentioned aspects 1-4, the aforementioned second arm can also use the part of the aforementioned second arm connected to the aforementioned first arm as a starting point, and can be obliquely connected to the aforementioned end of the aforementioned first arm department. With this aspect, the discharge direction of the cleaning fluid from the discharge port of the nozzle can be easily adjusted.

(樣態6) (pattern 6)

上述樣態1~5中任何1個樣態中,至少1個前述吐出口亦可包含複數個吐出口,從各個吐出口吐出之前述清洗流體的種類相互不同。 In any one of the above-mentioned aspects 1 to 5, at least one of the discharge ports may include a plurality of discharge ports, and the types of the cleaning fluids discharged from the respective discharge ports are different from each other.

(樣態7) (pattern 7)

上述樣態1~6中任何1個樣態中,前述噴嘴亦可進一步具備吸引口,其係朝向下方開口,並且吸引流體。 In any one of the above-mentioned aspects 1 to 6, the nozzle may further include a suction port which opens downward and sucks fluid.

採用該樣態時,可從吸引口吸引附著於接觸構件之清洗後的清洗流體。藉此,由於可抑制清洗後之清洗流體長期間殘留於接觸構件,因此可將接觸構件早期形成潔淨的狀態。 According to this aspect, the cleaning fluid after cleaning adhering to the contact member can be sucked from the suction port. Thereby, since the cleaning fluid after cleaning can be suppressed from remaining on the contact member for a long period of time, the contact member can be brought into a clean state at an early stage.

(樣態8) (pattern 8)

上述樣態1~7中任何1個樣態中,前述基板固持器亦可具備:第一保持構件,其係保持前述基板之上面;及第二保持構件,其係保持前述基板下面之外周緣;前述接觸構件配置於前述第二保持構件。 In any one of the aforementioned aspects 1 to 7, the aforementioned substrate holder may also include: a first holding member that holds the upper surface of the aforementioned substrate; and a second holding member that holds the outer peripheral edge of the lower surface of the aforementioned substrate ; The aforementioned contact member is disposed on the aforementioned second holding member.

(樣態9) (pattern 9)

為了達成上述目的,本發明一個樣態的鍍覆裝置之接觸構件清洗方法,前述鍍覆裝置具備:鍍覆槽;基板固持器,其係配置於比配置在前述鍍覆槽內部之陽極上方,可保持作為陰極之基板;接觸構件,其係配置於前述基板固持器,並且與前述基板下面之外周緣接觸,來對前述基板饋電;及清洗裝置,其係清洗前述接觸構件;前述清洗裝置具有:回轉軸,其係在前述基板固持器之徑方向配置於外側的區域,並在上下方向延伸;第一手臂,其係連接於前述回轉軸,並在水平方向延伸;第二手臂,其係從與前述第一手臂的連接於前述回轉軸之側相反側的端部朝向上方延伸;及噴嘴,其係連接於前述第二手臂之上端,具有朝向下方開口,並且吐出清洗流體之至少一個吐出口;前述接觸構件清洗方法包含:藉由使前述回轉軸回轉,而使在前述基板固持器之徑方向而移動至外側區域之前述噴嘴移動至在前述基板固持器之徑方向於內側區域的前述噴嘴不致干擾前述基板固持器的升降位置,接著,藉由使前述基板固持器下降,而使前述接觸構件位於比前述吐出口下方,接著,藉由使前述回轉軸回轉,而使前述噴嘴移動至前述內側區域中前述吐出口與前述接觸構件相對的清洗位置,接著,使前述基板固持器旋轉,而且使前述清洗流體從前述吐出口吐出。 In order to achieve the above object, the contact member cleaning method of a coating device according to an aspect of the present invention, the aforementioned coating device is provided with: a coating tank; a substrate holder, which is arranged above the anode disposed inside the coating tank A substrate capable of holding a cathode; a contact member disposed on the substrate holder and in contact with the outer peripheral edge of the lower surface of the substrate to feed power to the substrate; and a cleaning device for cleaning the contact member; the cleaning device It has: a rotary shaft, which is arranged outside the region in the radial direction of the substrate holder, and extends in the vertical direction; a first arm, which is connected to the rotary shaft, and extends in the horizontal direction; a second arm, which It extends upward from the end of the first arm opposite to the side connected to the rotary shaft; and a nozzle connected to the upper end of the second arm has a downward opening and spits out at least one of the cleaning fluid. Discharge port; the cleaning method of the contact member includes: moving the nozzle which is moved to the outer area in the radial direction of the substrate holder to the inner area in the radial direction of the substrate holder by rotating the rotary shaft The nozzle does not interfere with the lifting position of the substrate holder. Then, by lowering the substrate holder, the contact member is positioned below the discharge port. Next, the nozzle is moved by rotating the rotary shaft. After reaching the cleaning position where the discharge port faces the contact member in the inner region, the substrate holder is rotated and the cleaning fluid is discharged from the discharge port.

採用該樣態時,可藉由以簡單構造所構成之清洗裝置清洗接觸構件。 In this aspect, the contact member can be cleaned by the cleaning device having a simple structure.

10:鍍覆槽 10: Plating tank

10a:底部 10a: Bottom

10b:外周部 10b: Peripheral part

11:陽極 11: anode

12:電阻體 12: resistor body

15:溢流槽 15: overflow tank

20:基板固持器 20: Substrate holder

21:第一保持構件 21: first holding member

22:第二保持構件 22: Second holding member

23:連接構件 23: Connecting components

25:外側區域 25: Outer area

26:內側區域 26: Inner area

30:旋轉機構 30: Rotating mechanism

31:旋轉軸 31: axis of rotation

35:傾斜機構 35: Tilt mechanism

36:升降機構 36: Lifting mechanism

37:支軸 37: pivot

40:接觸構件 40: Contact member

45:密封構件 45: sealing member

50:清洗裝置 50: cleaning device

51:回轉軸 51: rotary axis

52:致動器 52: Actuator

53:第一手臂 53: First Arm

54:第二手臂 54: Second Arm

55:噴嘴 55: Nozzle

56a,56b,56c:槽 56a, 56b, 56c: Slots

57a,57b,57c:泵浦 57a, 57b, 57c: pump

58a,58b,58c:配管 58a, 58b, 58c: Piping

59a,59b:吐出口 59a, 59b: outlet

60:吸引口 60: suction port

61a,61b,61c:內部流路 61a, 61b, 61c: internal flow path

400:鍍覆模組 400: Plating module

800:控制模組 800: Control module

1000:鍍覆裝置 1000: Plating device

La,Lb:清洗流體 La, Lb: cleaning fluid

Ps:鍍覆液 Ps: plating solution

R1:第一旋轉方向 R1: the first direction of rotation

R2:第二旋轉方向 R2: Second direction of rotation

XL1,XL2,XL3:軸線 XL1, XL2, XL3: axis

Wf:基板 Wf: Substrate

Wfa:下面 Wfa: below

Wfb:上面 Wfb: above

圖1係顯示實施形態之鍍覆裝置的整體構成立體圖。 Fig. 1 is a perspective view showing the overall configuration of a coating device according to an embodiment.

圖2係顯示實施形態之鍍覆裝置的整體構成俯視圖。 Fig. 2 is a plan view showing the overall configuration of the coating device of the embodiment.

圖3係實施形態之鍍覆裝置的鍍覆模組之構成模式圖。 Fig. 3 is a structural schematic diagram of a coating module of the coating device of the embodiment.

圖4係顯示將實施形態之基板浸漬於鍍覆液的情形之模式圖。 Fig. 4 is a schematic view showing a state where the substrate of the embodiment is immersed in a plating solution.

圖5(A)係放大實施形態之基板固持器的一部分而模式顯示之剖面圖。圖5(B)係實施形態之接觸構件的周邊構成之模式剖面圖。 Fig. 5(A) is a cross-sectional view schematically showing a part of the substrate holder according to the embodiment. Fig. 5(B) is a schematic cross-sectional view of the peripheral structure of the contact member of the embodiment.

圖6係模式顯示實施形態之清洗裝置的整體構成圖。 Fig. 6 is a diagram schematically showing the overall configuration of the cleaning device of the embodiment.

圖7係實施形態之清洗裝置的一部分構成之模式俯視圖。 Fig. 7 is a schematic plan view of a part of the cleaning device according to the embodiment.

圖8係模式顯示實施形態之噴嘴的移動情形之俯視圖。 Fig. 8 is a top view schematically showing the movement of the nozzle of the embodiment.

圖9係顯示實施形態之接觸構件執行清洗處理時進行的一連串控制之流程圖的一例。 Fig. 9 is an example of a flow chart showing a series of controls performed when cleaning the contact member according to the embodiment.

圖10係用於說明實施形態之第二手臂的修改例之模式圖。 Fig. 10 is a schematic diagram for explaining a modified example of the second arm of the embodiment.

以下,參照圖式說明本發明之實施形態。另外,圖式係為了容易理解事物之特徵而模式性圖示,各構成元件之尺寸、比率等未必與實際者相同。此外,一些圖式中圖示有X-Y-Z之正交座標用於參考。該正交座標中之Z方向相當於上方,-Z方向相當於下方(重力作用之方向)。 Hereinafter, embodiments of the present invention will be described with reference to the drawings. In addition, the drawings are schematic illustrations for easy understanding of the characteristics of things, and the dimensions, ratios, etc. of each component may not necessarily be the same as the actual ones. In addition, X-Y-Z orthogonal coordinates are shown in some drawings for reference. The Z direction in the orthogonal coordinates corresponds to the upper side, and the -Z direction corresponds to the lower side (the direction in which gravity acts).

圖1係顯示本實施形態之鍍覆裝置的整體構成立體圖。圖2係顯示本實施形態之鍍覆裝置的整體構成俯視圖。如圖1、2所示,鍍覆裝置1000具備:裝載埠100、搬送機器人110、對準器120、預濕模組200、預浸模組300、鍍覆模組400、清洗模組500、自旋沖洗乾燥器600、搬送裝置700、及控制模組800。 Fig. 1 is a perspective view showing the overall configuration of a coating device according to this embodiment. Fig. 2 is a plan view showing the overall configuration of the coating device of the present embodiment. As shown in Figures 1 and 2, the plating device 1000 has: a loading port 100, a transfer robot 110, an aligner 120, a pre-wet module 200, a pre-soak module 300, a plating module 400, a cleaning module 500, A spin rinse dryer 600 , a conveying device 700 , and a control module 800 .

裝載埠100係用於搬入收納於鍍覆裝置1000中無圖示之FOUP(前開式晶圓傳送盒)等匣盒的基板,或是從鍍覆裝置1000搬出基板至匣盒的模組。本實施形態係在水平方向並列配置4台裝載埠100,不過,裝載埠100之數量及配 置不拘。搬送機器人110係用於搬送基板之機器人,且以在裝載埠100、對準器120、及搬送裝置700之間交接基板的方式構成。搬送機器人110及搬送裝置700在搬送機器人110與搬送裝置700之間交接基板時,可經由無圖示之暫置台進行基板的交接。 The loading port 100 is used to load substrates stored in a cassette such as a FOUP (Front Opening Pod) not shown in the figure in the coating apparatus 1000 , or a module for unloading substrates from the coating apparatus 1000 to a cassette. In this embodiment, four loading ports 100 are arranged side by side in the horizontal direction. However, the number and configuration of the loading ports 100 no matter what. The transfer robot 110 is a robot for transferring substrates, and is configured to transfer substrates between the load port 100 , the aligner 120 , and the transfer device 700 . When the transfer robot 110 and the transfer device 700 transfer the substrate between the transfer robot 110 and the transfer device 700 , the transfer of the substrate can be performed via a temporary stand (not shown).

對準器120係用於將基板之定向範圍或凹槽等的位置對準指定方向之模組。本實施形態係在水平方向並列配置2台對準器120,不過,對準器120之數量及配置不拘。預濕模組200藉由將鍍覆處理前之基板的被鍍覆面以純水或脫氣水等處理液濕潤,並將形成於基板表面之圖案內部的空氣替換成處理液。預濕模組200係以在鍍覆時藉由將圖案內部之處理液替換成鍍覆液,而實施容易在圖案內部供給鍍覆液之預濕處理的方式構成。本實施形態係在上下方向並列配置2台預濕模組200,不過預濕模組200之數量及配置不拘。 The aligner 120 is a module for aligning the orientation range of the substrate or the positions of the grooves and the like to a specified direction. In this embodiment, two aligners 120 are arranged in parallel in the horizontal direction, but the number and arrangement of the aligners 120 are not limited. The pre-wetting module 200 wets the plated surface of the substrate before the plating process with a process liquid such as pure water or degassed water, and replaces the air inside the pattern formed on the surface of the substrate with the process liquid. The pre-wetting module 200 is configured to perform pre-wetting treatment for easily supplying the plating solution inside the pattern by replacing the treatment solution inside the pattern with the plating solution during plating. In this embodiment, two pre-humidity modules 200 are arranged side by side in the vertical direction, but the number and arrangement of the pre-humidity modules 200 are not limited.

預浸模組300例如係以實施藉由硫酸或鹽酸等處理液蝕刻除去形成於鍍覆處理前之基板的被鍍覆面之種層表面等上存在之電阻大的氧化膜,清洗或活化鍍覆基底表面之預浸處理的方式構成。本實施形態係在上下方向並列配置2台預浸模組300,不過預浸模組300之數量及配置不拘。鍍覆模組400對基板實施鍍覆處理。本實施形態有2組在上下方向並列配置3台且在水平方向並列配置4台之12台的鍍覆模組400,而設置合計24台之鍍覆模組400,不過鍍覆模組400之數量及配置不拘。 The prepreg module 300 is used, for example, to etch and remove the high-resistance oxide film formed on the surface of the seed layer of the plated surface of the substrate before the plating process by etching with a treatment solution such as sulfuric acid or hydrochloric acid, and to clean or activate the plating. The method of pre-preg treatment of the substrate surface is formed. In this embodiment, two prepreg modules 300 are arranged side by side in the vertical direction, but the number and arrangement of the prepreg modules 300 are not limited. The plating module 400 performs plating treatment on the substrate. In this embodiment, there are 2 sets of 12 plating modules 400, 3 of which are arranged side by side in the vertical direction and 4 in the horizontal direction, and a total of 24 plating modules 400 are installed, but only one of the plating modules 400 The quantity and configuration are not limited.

清洗模組500係以為了除去殘留於鍍覆處理後之基板的鍍覆液等而對基板實施清洗處理之方式構成。本實施形態係在上下方向並列配置2台清洗模組500,不過清洗模組500之數量及配置不拘。自旋沖洗乾燥器600係用於使清洗處理後之基板高速旋轉而乾燥的模組。本實施形態係在上下方向並列配置2台 自旋沖洗乾燥器,不過自旋沖洗乾燥器之數量及配置不拘。搬送裝置700係用於在鍍覆裝置1000中之複數個模組間搬送基板的裝置。控制模組800係以控制鍍覆裝置1000之複數個模組的方式構成,例如可由具備與作業人員之間的輸入輸出介面之一般電腦或專用電腦而構成。 The cleaning module 500 is configured to perform cleaning processing on the substrate in order to remove the plating solution and the like remaining on the substrate after the plating processing. In this embodiment, two cleaning modules 500 are arranged side by side in the vertical direction, but the number and arrangement of the cleaning modules 500 are not limited. The spin rinse dryer 600 is a module used to dry the cleaned substrate by rotating it at high speed. In this embodiment, two units are arranged side by side in the vertical direction Spin rinsing dryers, but the number and configuration of spin rinsing dryers are not limited. The transfer device 700 is a device for transferring substrates between a plurality of modules in the plating device 1000 . The control module 800 is configured to control a plurality of modules of the coating device 1000, and can be configured, for example, by a general computer or a dedicated computer having an input/output interface with an operator.

以下說明鍍覆裝置1000之一連串鍍覆處理的一例。首先,將收納於匣盒之基板搬入裝載埠100。繼續,搬送機器人110從裝載埠100之匣盒取出基板,並將基板搬送至對準器120。對準器120將基板之定向範圍或凹槽等的位置對準指定方向。搬送機器人110將藉由對準器120對準方向之基板送交搬送裝置700。 An example of a series of plating processes in the plating apparatus 1000 will be described below. First, the substrate stored in the cassette is loaded into the loading port 100 . Continuing, the transfer robot 110 takes out the substrate from the cassette of the loading port 100 and transfers the substrate to the aligner 120 . The aligner 120 aligns the orientation range of the substrate or the positions of grooves and the like in a specified direction. The transfer robot 110 transfers the substrate aligned by the aligner 120 to the transfer device 700 .

搬送裝置700將從搬送機器人110接收之基板搬送至預濕模組200。預濕模組200對基板實施預濕處理。搬送裝置700將實施預濕處理後之基板搬送至預浸模組300。預浸模組300對基板實施預浸處理。搬送裝置700將實施預浸處理後之基板搬送至鍍覆模組400。鍍覆模組400對基板實施鍍覆處理。 The transfer device 700 transfers the substrate received from the transfer robot 110 to the pre-humidity module 200 . The pre-wet module 200 performs pre-wet treatment on the substrate. The conveying device 700 conveys the pre-wetted substrate to the prepreg module 300 . The prepreg module 300 performs prepreg treatment on the substrate. The conveying device 700 conveys the prepreg-processed substrate to the coating module 400 . The plating module 400 performs plating treatment on the substrate.

搬送裝置700將實施鍍覆處理後之基板搬送至清洗模組500。清洗模組500對基板實施清洗處理。搬送裝置700將實施清洗處理後之基板搬送至自旋沖洗乾燥器600。自旋沖洗乾燥器600對基板實施乾燥處理。搬送裝置700將實施乾燥處理後之基板送交搬送機器人110。搬送機器人110將從搬送裝置700所接收之基板搬送至裝載埠100的匣盒。最後,從裝載埠100搬出收納了基板之匣盒。 The transport device 700 transports the plated substrate to the cleaning module 500 . The cleaning module 500 cleans the substrate. The transfer device 700 transfers the cleaned substrate to the spin rinse dryer 600 . The spin rinse dryer 600 dries the substrate. The transfer device 700 transfers the dried substrate to the transfer robot 110 . The transfer robot 110 transfers the substrate received from the transfer device 700 to the cassette of the load port 100 . Finally, the cassette containing the substrate is carried out from the load port 100 .

另外,圖1及圖2說明之鍍覆裝置1000的構成不過是一例,鍍覆裝置1000之構成並非限定於圖1及圖2之構成者。 In addition, the configuration of the coating apparatus 1000 described in FIGS. 1 and 2 is merely an example, and the configuration of the coating apparatus 1000 is not limited to those shown in FIGS. 1 and 2 .

繼續,說明鍍覆模組400。另外,由於本實施形態之鍍覆裝置1000具有的複數個鍍覆模組400具有同樣之構成,因此,就1個鍍覆模組400作說明。 Next, the plating module 400 will be described. In addition, since the plurality of plating modules 400 included in the plating apparatus 1000 of this embodiment have the same configuration, one plating module 400 will be described.

圖3係本實施形態之鍍覆裝置1000的鍍覆模組400之構成模式圖。圖4係顯示將基板Wf浸漬於鍍覆液Ps之情形的模式圖。本實施形態之鍍覆裝置1000係杯式的鍍覆裝置。鍍覆裝置1000之鍍覆模組400主要具備:鍍覆槽10、溢流槽15、基板固持器20、旋轉機構30、傾斜機構35、升降機構36、接觸構件40。另外,鍍覆模組400亦具備後述之清洗裝置50(圖6等),不過圖3及圖4中省略清洗裝置50之圖示。此外,圖3中,鍍覆模組400之一部分構成(鍍覆槽10、溢流槽15、基板固持器20等)係模式性圖示其剖面。 Fig. 3 is a structural schematic diagram of the coating module 400 of the coating device 1000 of the present embodiment. FIG. 4 is a schematic diagram showing a state where the substrate Wf is immersed in the plating solution Ps. The coating device 1000 of this embodiment is a cup-type coating device. The coating module 400 of the coating device 1000 mainly includes: a coating tank 10 , an overflow tank 15 , a substrate holder 20 , a rotating mechanism 30 , a tilting mechanism 35 , a lifting mechanism 36 , and a contact member 40 . In addition, the plating module 400 also includes a cleaning device 50 ( FIG. 6 etc.) described later, but the illustration of the cleaning device 50 is omitted in FIGS. 3 and 4 . In addition, in FIG. 3 , a part of the coating module 400 (plating tank 10 , overflow tank 15 , substrate holder 20 , etc.) is schematically shown in cross section.

本實施形態之鍍覆槽10藉由上方具有開口之有底的容器而構成。具體而言,鍍覆槽10具有:底部10a;及從該底部10a之外周緣向上方延伸的外周部10b;該外周部10b之上部開口。另外,鍍覆槽10之外周部10b的形狀並非特別限定者,而本實施形態之外周部10b的一例為具有圓筒形狀。 The plating tank 10 of this embodiment is comprised by the bottomed container which has an opening in the upper part. Specifically, the plating tank 10 has: a bottom 10a; and an outer peripheral portion 10b extending upward from the outer peripheral edge of the bottom 10a; and an upper opening of the outer peripheral portion 10b. In addition, the shape of the outer peripheral part 10b of the coating tank 10 is not specifically limited, An example of the outer peripheral part 10b of this embodiment has a cylindrical shape.

在鍍覆槽10之內部貯存有鍍覆液Ps。鍍覆槽10中設有用於對鍍覆槽10供給鍍覆液Ps之供給口(無圖示)。鍍覆液Ps只要是含有構成鍍覆皮膜之金屬元素的離子之溶液即可,其具體例並非特別限定者。本實施形態中,鍍覆處理之一例為使用銅鍍覆處理,鍍覆液Ps之一例為使用硫酸銅溶液。此外,本實施形態中,鍍覆液Ps中含有指定之添加劑。但是,並非限定於該構成者,鍍覆液Ps亦可不含添加劑而構成。 The plating solution Ps is stored inside the plating tank 10 . A supply port (not shown) for supplying the plating solution Ps to the plating tank 10 is provided in the plating tank 10 . The plating liquid Ps should just be a solution containing the ion of the metal element which comprises a plating film, and the specific example is not specifically limited. In this embodiment, an example of the plating treatment is a copper plating treatment, and an example of the plating solution Ps is a copper sulfate solution. In addition, in this embodiment, predetermined additives are contained in the plating solution Ps. However, it is not limited to this configuration, and the plating solution Ps may be configured without any additives.

在鍍覆槽10之鍍覆液Ps的內部配置有陽極11。陽極11之具體種類並非特別限定者,可使用溶解陽極或不溶解陽極。本實施形態中,陽極11係使用不溶解陽極。該不溶解陽極之具體種類並非特別限定者,可使用鉑或氧化銥等。 The anode 11 is arranged inside the plating solution Ps of the plating tank 10 . The specific type of the anode 11 is not particularly limited, and a soluble anode or an insoluble anode can be used. In this embodiment, the anode 11 is an insoluble anode. The specific type of the insoluble anode is not particularly limited, and platinum, iridium oxide, and the like can be used.

溢流槽15係藉由在鍍覆槽10之徑方向配置於外側區域之有底的容器而構成。溢流槽15係為了暫時貯存超過鍍覆槽10之外周部10b上端的鍍覆液 Ps(亦即,從鍍覆槽10溢流之鍍覆液Ps)而設的槽。溢流槽15中設有用於從溢流槽15排出溢流槽15之鍍覆液Ps的排出口(無圖示)。從排出口排出之鍍覆液Ps暫時貯存於貯存槽(無圖示)後,再度從供給口供給至鍍覆槽10。 The overflow tank 15 is constituted by a bottomed container disposed in the outer region in the radial direction of the coating tank 10 . The overflow tank 15 is for temporarily storing the plating solution exceeding the upper end of the outer peripheral portion 10b of the plating tank 10 Ps (that is, the plating solution Ps overflowing from the plating tank 10) is provided. A discharge port (not shown) for discharging the plating solution Ps of the overflow tank 15 from the overflow tank 15 is provided in the overflow tank 15 . The plating solution Ps discharged from the discharge port is temporarily stored in a storage tank (not shown), and then supplied to the plating tank 10 from the supply port again.

在鍍覆槽10內部之比陽極11上方配置有多孔質的電阻體12。電阻體12藉由具有複數個孔(細孔)之多孔性的板構件而構成。比電阻體12下方側之鍍覆液Ps通過電阻體12可流動至比電阻體12上方側。該電阻體12係為了謀求形成於陽極11與基板Wf間之電場均勻化而設的構件。因此,藉由鍍覆裝置1000具有電阻體12,可輕易謀求形成於基板Wf之鍍覆皮膜(鍍覆層)的膜厚均勻化。 A porous resistor 12 is disposed above the anode 11 inside the plating tank 10 . The resistor 12 is constituted by a porous plate member having a plurality of holes (pores). The plating solution Ps on the lower side of the resistive body 12 can flow to the upper side of the resistive body 12 through the resistive body 12 . The resistor 12 is a member provided for uniforming the electric field formed between the anode 11 and the substrate Wf. Therefore, since the plating apparatus 1000 has the resistor 12, it is possible to easily achieve uniformity of the film thickness of the plating film (plating layer) formed on the substrate Wf.

基板固持器20係用於保持作為陰極之基板Wf的構件。基板Wf之下面Wfa相當於被鍍覆面。基板固持器20連接於旋轉機構30之旋轉軸31。旋轉機構30係用於使基板固持器20旋轉之機構。旋轉機構30可使用馬達等習知之機構。 The substrate holder 20 is a member for holding the substrate Wf as a cathode. The lower surface Wfa of the substrate Wf corresponds to the surface to be plated. The substrate holder 20 is connected to the rotation shaft 31 of the rotation mechanism 30 . The rotation mechanism 30 is a mechanism for rotating the substrate holder 20 . The rotation mechanism 30 can use known mechanisms such as motors.

傾斜機構35係用於使旋轉機構30及基板固持器20傾斜之機構。傾斜機構35可使用活塞、汽缸等習知之傾斜機構。升降機構36藉由在上下方向延伸之支軸37而支撐。升降機構36係用於使基板固持器20、旋轉機構30、及傾斜機構35在上下方向升降之機構。升降機構36可使用直動式之致動器等習知的升降機構。 The tilt mechanism 35 is a mechanism for tilting the rotation mechanism 30 and the substrate holder 20 . Tilt mechanism 35 can use known tilt mechanism such as piston, cylinder. The elevating mechanism 36 is supported by a support shaft 37 extending in the vertical direction. The elevating mechanism 36 is a mechanism for elevating the substrate holder 20 , the rotating mechanism 30 , and the tilting mechanism 35 in the vertical direction. As the lifting mechanism 36, known lifting mechanisms such as direct-acting actuators can be used.

如圖4所示,在基板Wf之下面Wfa(被鍍覆面)實施鍍覆處理時,旋轉機構30使基板固持器20旋轉,並且升降機構36使基板固持器20移動至下方,而使基板Wf浸漬於鍍覆槽10之鍍覆液Ps中。另外,使基板Wf浸漬於鍍覆液Ps時,傾斜機構35依需要亦可使基板固持器20傾斜。將基板Wf浸漬於鍍覆液Ps後,藉由通電裝置(無圖示)而在陽極11與基板Wf之間流動電流。藉此,在基板Wf之下面Wfa上形成鍍覆皮膜。 As shown in FIG. 4 , when the coating process is performed on the lower surface Wfa (surface to be coated) of the substrate Wf, the rotating mechanism 30 rotates the substrate holder 20, and the elevating mechanism 36 moves the substrate holder 20 to the bottom, so that the substrate Wf It is immersed in the plating solution Ps of the plating tank 10 . In addition, when the substrate Wf is immersed in the plating solution Ps, the tilt mechanism 35 can also tilt the substrate holder 20 as necessary. After immersing the substrate Wf in the plating solution Ps, an electric current flows between the anode 11 and the substrate Wf by means of an energizing device (not shown). Thereby, a plated film is formed on the lower surface Wfa of the substrate Wf.

鍍覆模組400之動作藉由控制模組800來控制。控制模組800備有微電腦,該微電腦具備:作為處理器之CPU(中央處理單元)801;及作為永久性記憶媒體之記憶部802等。控制模組800依據記憶於記憶部802之程式的指令,藉由作為處理器之CPU801工作來控制鍍覆模組400的被控制部。 The action of the coating module 400 is controlled by the control module 800 . The control module 800 is provided with a microcomputer including: a CPU (Central Processing Unit) 801 as a processor; a memory unit 802 as a permanent storage medium, and the like. The control module 800 controls the controlled part of the coating module 400 by operating the CPU 801 as a processor according to the instructions of the program stored in the memory part 802 .

圖5(A)係放大基板固持器20之一部分(圖3之A1部分)而模式性顯示的剖面圖。參照圖3及圖5(A),本實施形態之基板固持器20具備:保持基板Wf之上面Wfb的第一保持構件21;及保持基板Wf之下面Wfa的外周緣之第二保持構件22。本實施形態之第一保持構件21具有圓板形狀。本實施形態之第二保持構件22具有環形狀。基板固持器20藉由第一保持構件21及第二保持構件22,以夾著基板Wf之方式保持基板Wf。 FIG. 5(A) is a cross-sectional view schematically showing an enlarged part of the substrate holder 20 (part A1 in FIG. 3 ). Referring to FIG. 3 and FIG. 5(A), the substrate holder 20 of this embodiment includes: a first holding member 21 holding the upper surface Wfb of the substrate Wf; and a second holding member 22 holding the outer periphery of the lower surface Wfa of the substrate Wf. The first holding member 21 of this embodiment has a disc shape. The second holding member 22 of this embodiment has a ring shape. The substrate holder 20 holds the substrate Wf with the substrate Wf sandwiched between the first holding member 21 and the second holding member 22 .

第一保持構件21連接於旋轉軸31之下方側端部。具體而言,本實施形態之第一保持構件21係以可從旋轉軸31卸除之連接樣態(裝卸自如之連接樣態)而連接於旋轉軸31。此外,本實施形態之第二保持構件22經由連接構件23而連接於旋轉軸31的中途部位。 The first holding member 21 is connected to the lower end of the rotating shaft 31 . Specifically, the first holding member 21 of this embodiment is connected to the rotation shaft 31 in a detachable connection form (detachable connection form) from the rotation shaft 31 . In addition, the second holding member 22 of the present embodiment is connected to an intermediate portion of the rotating shaft 31 via a connecting member 23 .

另外,本實施形態之第二保持構件22經由密封構件45而保持基板Wf之下面Wfa的外周緣。密封構件45在基板Wf浸漬於鍍覆液Ps時,係用於抑制鍍覆液Ps接觸後述之接觸構件40的構件。本實施形態之密封構件45具有環形狀。 In addition, the second holding member 22 of the present embodiment holds the outer peripheral edge of the lower surface Wfa of the substrate Wf via the sealing member 45 . The sealing member 45 is a member for preventing the plating solution Ps from coming into contact with the contact member 40 described later when the substrate Wf is immersed in the plating solution Ps. The sealing member 45 of this embodiment has a ring shape.

接觸構件40配置於基板固持器20。具體而言,本實施形態之接觸構件40係配置於基板固持器20的第二保持構件22。接觸構件40係接觸於基板Wf之下面Wfa的外周緣,而用於對基板Wf饋電之構件。 The contact member 40 is disposed on the substrate holder 20 . Specifically, the contact member 40 of this embodiment is disposed on the second holding member 22 of the substrate holder 20 . The contact member 40 is a member for feeding power to the substrate Wf by contacting the outer peripheral edge of the lower surface Wfa of the substrate Wf.

圖5(B)係接觸構件40之周邊構成的模式性剖面圖(B1-B1線剖面圖)。另外,圖5(B)中,省略第一保持構件21及基板Wf之圖示。參照圖5(A) 及圖5(B),接觸構件40在基板固持器20之周方向(具體而言,係第二保持構件22之周方向)配置複數個。 FIG. 5(B) is a schematic cross-sectional view (cross-sectional view along line B1-B1) of the peripheral configuration of the contact member 40 . In addition, in FIG. 5(B), illustration of the 1st holding member 21 and the board|substrate Wf is abbreviate|omitted. Referring to Figure 5(A) 5(B), a plurality of contact members 40 are arranged in the circumferential direction of the substrate holder 20 (specifically, in the circumferential direction of the second holding member 22).

具體而言,本實施形態之複數個接觸構件40均等地配置於基板固持器20的周方向。複數個接觸構件40之數量並非特別限定者,而本實施形態之一例為12個。複數個接觸構件40與通電裝置(無圖示)電性連接,而將從通電裝置所供給之電力供給至基板Wf。 Specifically, the plurality of contact members 40 of the present embodiment are equally arranged in the circumferential direction of the substrate holder 20 . The number of the plurality of contact members 40 is not particularly limited, but an example of this embodiment is twelve. The plurality of contact members 40 are electrically connected to an energizing device (not shown), and supply electric power supplied from the energizing device to the substrate Wf.

繼續,說明清洗裝置50。圖6係模式性顯示清洗裝置50之整體構成圖。清洗裝置50係用於清洗接觸構件40之裝置。具體而言,本實施形態之清洗裝置50具備:回轉軸51、致動器52、第一手臂53、第二手臂54、噴嘴55、槽(槽56a、槽56b、槽56c)、泵浦(泵浦57a、泵浦57b、泵浦57c)、及配管(配管58a、配管58b、配管58c)。 Next, the cleaning device 50 will be described. FIG. 6 is a diagram schematically showing the overall configuration of the cleaning device 50 . The cleaning device 50 is a device for cleaning the contact member 40 . Specifically, the cleaning device 50 of the present embodiment is provided with: a rotary shaft 51, an actuator 52, a first arm 53, a second arm 54, a nozzle 55, grooves (groove 56a, groove 56b, groove 56c), a pump ( pump 57a, pump 57b, pump 57c), and piping (piping 58a, piping 58b, piping 58c).

回轉軸51在基板固持器20之徑方向,配置於比基板固持器20外側的區域。具體而言,本實施形態之回轉軸51係配置於基板固持器20之外側區域,且鍍覆槽10之外側區域。回轉軸51在上下方向延伸。回轉軸51之上端連接於致動器52。 The rotary shaft 51 is arranged in a region outside the substrate holder 20 in the radial direction of the substrate holder 20 . Specifically, the rotary shaft 51 of the present embodiment is arranged in the outer area of the substrate holder 20 and the outer area of the plating tank 10 . The rotary shaft 51 extends in the vertical direction. The upper end of the rotary shaft 51 is connected to the actuator 52 .

致動器52配置於基板固持器20之外側,且鍍覆槽10之外側區域。致動器52藉由控制模組800控制,使回轉軸51在第一旋轉方向(R1)及第二旋轉方向(R2)回轉。致動器52例如可使用可在第一旋轉方向(R1)及第二旋轉方向(R2)旋轉之電動馬達等。 The actuator 52 is disposed outside the substrate holder 20 and coats the outside area of the plating tank 10 . The actuator 52 is controlled by the control module 800 to make the rotary shaft 51 rotate in the first rotation direction ( R1 ) and the second rotation direction ( R2 ). For the actuator 52 , for example, an electric motor that can rotate in the first rotation direction ( R1 ) and the second rotation direction ( R2 ) can be used.

第一手臂53連接於回轉軸51之下端,並且在水平方向延伸。第二手臂54從與第一手臂53的連接於回轉軸51之側相反側的端部向上方延伸。第一手臂53及第二手臂54具有作為連接回轉軸51與噴嘴55之連接手臂的功能。第一 手臂53及第二手臂54在回轉軸51回轉時,與該回轉軸51成為一體而回轉。第一手臂53及第二手臂54之長度,係以噴嘴55位於後述之清洗位置時噴嘴55之後述吐出口及吸引口與接觸構件40相對的方式設定。 The first arm 53 is connected to the lower end of the rotating shaft 51 and extends in the horizontal direction. The second arm 54 extends upward from the end of the first arm 53 on the opposite side to the side connected to the rotary shaft 51 . The first arm 53 and the second arm 54 function as connecting arms connecting the rotary shaft 51 and the nozzle 55 . First The arm 53 and the second arm 54 rotate integrally with the rotary shaft 51 when the rotary shaft 51 rotates. The lengths of the first arm 53 and the second arm 54 are set so that when the nozzle 55 is located at a cleaning position described later, the discharge port and the suction port behind the nozzle 55 face the contact member 40 .

噴嘴55連接於第二手臂54之上端。噴嘴55具有直接向接觸構件40吐出清洗用之流體「清洗流體」的至少一個吐出口。具體而言,本實施形態之噴嘴55具有複數個吐出口,其一例為具有2個吐出口(吐出口59a、吐出口59b)。但是,噴嘴55具有之吐出口的數量並非限定於2個者,亦可比2個多,亦可比其少。 The nozzle 55 is connected to the upper end of the second arm 54 . The nozzle 55 has at least one discharge port for directly discharging a cleaning fluid “cleaning fluid” toward the contact member 40 . Specifically, the nozzle 55 of the present embodiment has a plurality of discharge ports, and one example thereof has two discharge ports (discharge port 59a, discharge port 59b). However, the number of discharge ports which the nozzle 55 has is not limited to two, and may be more or less than two.

吐出口59a及吐出口59b朝向下方開口。吐出口59a係以將清洗流體La朝向下方而直接向接觸構件40吐出的方式構成,吐出口59b係以朝向下方直接向接觸構件40吐出與清洗流體La不同種類之清洗流體Lb的方式構成。亦即,本實施形態之從各個吐出口直接向接觸構件吐出之清洗流體的種類彼此不同。該清洗流體之具體例於後述。 The discharge port 59a and the discharge port 59b open downward. The discharge port 59 a is configured to discharge the cleaning fluid La downward and directly toward the contact member 40 , and the discharge port 59 b is configured to discharge the cleaning fluid Lb of a different type from the cleaning fluid La directly downward to the contact member 40 . That is, in the present embodiment, the types of cleaning fluids that are directly discharged from the respective discharge ports to the contact member are different from each other. Specific examples of the cleaning fluid will be described later.

此外,本實施形態之噴嘴55亦具備吸引口60。吸引口60係以朝向下方開口,並且吸引流體之方式構成。 Moreover, the nozzle 55 of this embodiment also has the suction port 60. As shown in FIG. The suction port 60 opens downward and is configured to suck fluid.

在本實施形態之噴嘴55的內部設有:內部流路61a、內部流路61b、及內部流路61c。內部流路61a之下游端連通於吐出口59a,內部流路61b之下游端連通於吐出口59b,內部流路61c之上游端連通於吸引口60。 Inside the nozzle 55 of this embodiment, an internal flow path 61a, an internal flow path 61b, and an internal flow path 61c are provided. The downstream end of the internal flow path 61 a communicates with the discharge port 59 a , the downstream end of the internal flow path 61 b communicates with the discharge port 59 b , and the upstream end of the internal flow path 61 c communicates with the suction port 60 .

內部流路61a之上游端經由配管58a而連通於槽56a。內部流路61b之上游端經由配管58b而連通於槽56b。內部流路61c之下游端經由配管58c而連通於槽56c。配管58a中配置有用於朝向吐出口59a壓送貯存於槽56a之清洗流體La的泵浦57a。配管58b中配置有用於朝向吐出口59b壓送貯存於槽56b之清洗流體Lb 的泵浦57b。配管58c中配置有用於朝向槽56c壓送從吸引口60所吸引之流體的泵浦57c。泵浦57a、泵浦57b及泵浦57c之動作由控制模組800控制。 The upstream end of the internal flow path 61a communicates with the groove 56a via the pipe 58a. The upstream end of the internal flow path 61b communicates with the groove 56b via the pipe 58b. The downstream end of the internal flow path 61c communicates with the tank 56c via the pipe 58c. The pump 57a for pressure-feeding the cleaning fluid La stored in the tank 56a toward the discharge port 59a is arranged in the piping 58a. In the piping 58b, the cleaning fluid Lb stored in the tank 56b is pressure-fed toward the discharge port 59b. The pump 57b. The pump 57c for pressure-feeding the fluid sucked from the suction port 60 toward the tank 56c is arranged in the piping 58c. The actions of the pump 57 a , the pump 57 b and the pump 57 c are controlled by the control module 800 .

藉由泵浦57a接受控制模組800之指令而工作,槽56a之清洗流體La通過配管58a及內部流路61a而從吐出口59a吐出。同樣地,藉由泵浦57b工作,而槽56b之清洗流體Lb通過配管58b及內部流路61b而從吐出口59b吐出。藉由泵浦57c工作,配管58c及內部流路61c之內壓變成負壓,藉此,從吸引口60吸引流體(具體而言,係清洗後之清洗流體)。被該吸引口60所吸引之流體通過內部流路61c及配管58c而貯存於槽56c。 When the pump 57a operates under the command of the control module 800, the cleaning fluid La in the tank 56a passes through the pipe 58a and the internal flow path 61a, and is discharged from the discharge port 59a. Similarly, when the pump 57b operates, the cleaning fluid Lb in the tank 56b passes through the pipe 58b and the internal flow path 61b, and is discharged from the discharge port 59b. When the pump 57c operates, the internal pressure of the piping 58c and the internal flow path 61c becomes negative pressure, whereby fluid (specifically, cleaning fluid after cleaning) is sucked from the suction port 60 . The fluid sucked by the suction port 60 is stored in the groove 56c through the internal flow path 61c and the piping 58c.

本實施形態的清洗流體La之一例為使用中性水(具體而言係純水)。此外,本實施形態的清洗流體Lb之一例為使用酸性水。本實施形態的該酸性水之一例為使用含有檸檬酸之水(檸檬酸水)。但是,這不過是清洗流體La及清洗流體Lb的一例,清洗流體La及清洗流體Lb之具體種類並非限定於此者。 As an example of the cleaning fluid La of this embodiment, neutral water (specifically, pure water) is used. In addition, acidic water is used as an example of the cleaning fluid Lb of this embodiment. As an example of this acidic water of this embodiment, the water containing citric acid (citric acid water) is used. However, this is just an example of the cleaning fluid La and the cleaning fluid Lb, and the specific types of the cleaning fluid La and the cleaning fluid Lb are not limited thereto.

此外,清洗流體並非限定於液體者。清洗流體亦可使用氣體。舉出其具體例時,例如亦可使用空氣作為清洗流體La及清洗流體Lb的其中一方。另外,清洗流體La使用空氣時不需要槽56a。同樣地,清洗流體Lb使用空氣時不需要槽56b。 In addition, the cleaning fluid is not limited to liquid ones. Gases can also be used as the cleaning fluid. When specific examples thereof are given, for example, air may be used as one of the cleaning fluid La and the cleaning fluid Lb. In addition, the tank 56a is unnecessary when air is used for the cleaning fluid La. Similarly, the groove 56b is unnecessary when air is used as the cleaning fluid Lb.

圖7係清洗裝置50之一部分構成的模式俯視圖。另外,圖7中省略致動器52之圖示(關於此,後述之圖8亦同樣)。此外,圖7中,噴嘴55位於後述之升降位置。本實施形態之噴嘴55具有將第二手臂54之上端作為起點,朝向回轉軸51之側延伸的形狀(具體而言,係長方形之形狀)。而平面觀看(或俯視)時,在噴嘴55之長度方向延伸的軸線XL1與在第一手臂53之長度方向延伸的軸線XL2形成之角θ(從回轉軸51之側觀看形成之角)為比0度(°)大,且比90度(°) 小之角度,具體而言,係形成10度以上,70度以下之角度。更具體而言,形成之角θ為10度以上,60度以下之角度,更詳細而言,為形成10度以上,50度以下之角度。 FIG. 7 is a schematic top view of a part of the cleaning device 50 . In addition, illustration of the actuator 52 is abbreviate|omitted in FIG. 7 (about this, FIG. 8 mentioned later is also the same). In addition, in FIG. 7, the nozzle 55 is located in the elevation position mentioned later. The nozzle 55 of this embodiment has a shape (specifically, a rectangular shape) extending toward the side of the rotary shaft 51 starting from the upper end of the second arm 54 . When viewed in a plane (or viewed from above), the angle θ formed by the axis XL1 extending in the length direction of the nozzle 55 and the axis XL2 extending in the length direction of the first arm 53 (the angle formed when viewed from the side of the rotary shaft 51) is proportional to 0 degrees (°) greater than 90 degrees (°) A small angle is, specifically, an angle of not less than 10 degrees and not more than 70 degrees. More specifically, the formed angle θ is an angle of not less than 10 degrees and not more than 60 degrees, more specifically, an angle of not less than 10 degrees and not more than 50 degrees.

如上述,藉由形成之角θ為10度以上,70度以下之角度,可使從噴嘴55之吐出口59a,59b吐出的清洗流體輕易碰觸接觸構件40(參照後述之圖8)。藉此,可有效清洗接觸構件40。但是,上述形成之角θ只不過是一例,形成之角θ宜依第一手臂53之長度及噴嘴55的長度等而使用適切之值。 As mentioned above, by forming the angle θ of 10 degrees or more and 70 degrees or less, the cleaning fluid discharged from the discharge ports 59a, 59b of the nozzle 55 can easily touch the contact member 40 (see FIG. 8 described later). Thereby, the contact member 40 can be effectively cleaned. However, the angle θ formed above is just an example, and an appropriate value for the angle θ formed in accordance with the length of the first arm 53, the length of the nozzle 55, and the like should be used.

此外,參照圖6及圖7,本實施形態之吐出口59a、吐出口59b、及吸引口60排列於噴嘴55的軸線XL1方向。但是,吐出口59a、吐出口59b、及吸引口60之配置樣態並非限定於此者。舉出其他一例時,吐出口59a吐出口59b、及吸引口60例如亦可排列於與噴嘴55之軸線XL1垂直的方向(亦即,噴嘴55之寬度方向)。 In addition, referring to FIG. 6 and FIG. 7 , the discharge port 59 a, the discharge port 59 b, and the suction port 60 of the present embodiment are arranged in the direction of the axis line XL1 of the nozzle 55 . However, the layout of the discharge port 59a, the discharge port 59b, and the suction port 60 is not limited to this. As another example, the discharge port 59a, the discharge port 59b, and the suction port 60 may be arranged, for example, in a direction perpendicular to the axis XL1 of the nozzle 55 (that is, in the width direction of the nozzle 55).

圖8係模式顯示噴嘴55之移動情形的俯視圖。本實施形態之清洗裝置50藉由接受控制模組800之指令的致動器52使回轉軸51在第一旋轉方向(R1)及第二旋轉方向(R2)回轉,而使噴嘴55在基板固持器20之徑方向的外側區域(亦即,外側區域25)、與基板固持器20之徑方向的內側區域(亦即,內側區域26)之間移動。執行清洗接觸構件40之處理時,藉由將噴嘴55配置於基板固持器20之內側區域26,如後述,可以清洗流體有效清洗包含接觸構件40之基板固持器20的內側區域26,或是有效吸引清洗流體。 FIG. 8 is a top view schematically showing the movement of the nozzle 55 . The cleaning device 50 of this embodiment rotates the rotary shaft 51 in the first rotation direction ( R1 ) and the second rotation direction ( R2 ) by the actuator 52 receiving the instruction of the control module 800 , so that the nozzle 55 is held on the substrate. The outer region in the radial direction of the holder 20 (that is, the outer region 25 ) and the inner region in the radial direction of the substrate holder 20 (that is, the inner region 26 ). When performing the process of cleaning the contact member 40, by disposing the nozzle 55 on the inner region 26 of the substrate holder 20, as described later, the cleaning fluid can effectively clean the inner region 26 of the substrate holder 20 including the contact member 40, or effectively Suction cleaning fluid.

具體而言,本實施形態之控制模組800通常係先使噴嘴55移動至基板固持器20之外側區域25的避開位置。本實施形態中,該避開位置係位於基板 固持器20之外側區域25,並且亦位於鍍覆槽10之外側區域。因此,圖4之前述基板Wf的鍍覆處理係噴嘴55在避開位置之狀態下進行。 Specifically, the control module 800 of this embodiment usually firstly moves the nozzle 55 to the avoiding position of the outer region 25 of the substrate holder 20 . In this embodiment, the avoided position is located on the substrate The outer area 25 of the holder 20 is also located at the outer area of the plating tank 10 . Therefore, the plating process of the above-mentioned substrate Wf in FIG. 4 is performed with the nozzle 55 in the avoided position.

另外,控制模組800在執行清洗接觸構件40之處理(稱為「接觸構件清洗處理」)時,進行以下說明之一連串控制。圖9係顯示執行接觸構件清洗處理時進行之一連串控制的流程圖之一例。圖9之流程圖的各步驟係依據控制模組800之具體而言為CPU801依據記憶部802的程式來執行。參照圖8及圖9說明接觸構件清洗處理如下。 In addition, when the control module 800 performs the process of cleaning the contact member 40 (referred to as “contact member cleaning process”), it performs a series of controls described below. Fig. 9 is an example of a flow chart showing a series of controls performed when cleaning the contact member. Each step in the flow chart of FIG. 9 is executed according to the program of the memory unit 802 by the CPU 801 of the control module 800 . Referring to FIG. 8 and FIG. 9, the contact member cleaning process will be described as follows.

首先,本實施形態之接觸構件清洗處理係在從基板固持器20拆卸了基板Wf之狀態下執行。再者,本實施形態之基板固持器20的第一保持構件21亦係在從鍍覆模組400拆卸之狀態下,執行接觸構件清洗處理。 First, the contact member cleaning process of this embodiment is performed in a state where the substrate Wf is detached from the substrate holder 20 . Furthermore, the first holding member 21 of the substrate holder 20 of this embodiment is also in the state of being detached from the plating module 400, and the contact member cleaning process is performed.

控制模組800例如有開始執行接觸構件清洗處理之要旨的控制指令「開始清洗指令」時,則使圖9之流程圖開始。舉出其一例時,例如操作用於將開始清洗指令傳送至控制模組800的操作開關(這是藉由使用者操作的操作開關),將開始清洗指令傳送至控制模組800,控制模組800接收了該傳送之開始清洗指令時,控制模組800使圖9之流程圖開始。 For example, when the control module 800 has a control command "cleaning start command" of the gist of starting the cleaning process of the contact member, it starts the flow chart of FIG. 9 . When giving an example, for example, operating the operation switch (this is the operation switch operated by the user) for transmitting the cleaning start command to the control module 800, the cleaning start command is transmitted to the control module 800, and the control module When 800 receives the transmission start cleaning command, the control module 800 starts the flow chart of FIG. 9 .

圖9之步驟S10中,控制模組800控制致動器52使回轉軸51在第一旋轉方向(R1)回轉,而使移動至外側區域25之避開位置的噴嘴55移動至基板固持器20之內側區域26中噴嘴55不致干擾基板固持器20的位置之「升降位置」。 In step S10 of FIG. 9 , the control module 800 controls the actuator 52 to rotate the rotary shaft 51 in the first rotation direction ( R1 ), so that the nozzle 55 moved to the avoiding position of the outer region 25 moves to the substrate holder 20 The nozzle 55 in the inner region 26 does not interfere with the position of the substrate holder 20 in the "lift position".

接著,控制模組800藉由升降機構36使基板固持器20下降,而使接觸構件40比噴嘴55之吐出口59a,59b、及吸引口60位於下方(步驟S11)。 Next, the control module 800 lowers the substrate holder 20 by the elevating mechanism 36, so that the contact member 40 is located below the discharge ports 59a, 59b and the suction port 60 of the nozzle 55 (step S11).

接著,控制模組800控制致動器52,藉由使回轉軸51在第一旋轉方向(R1)回轉,而使噴嘴55移動至內側區域26中吐出口59a,59b、及吸引口60與接觸構件40相對之「清洗位置」(步驟S12)。 Then, the control module 800 controls the actuator 52 to make the nozzle 55 move to the inner region 26 in contact with the discharge ports 59a, 59b and the suction port 60 by rotating the rotary shaft 51 in the first rotation direction (R1). The relative "cleaning position" of the member 40 (step S12).

接著,控制模組800藉由旋轉機構30使基板固持器20旋轉,並且使泵浦57a、泵浦57b及泵浦57c開始運轉,而開始從吐出口59a吐出清洗流體La、從吐出口59b吐出清洗流體Lb、及從吸引口60吸引流體(步驟S13)。藉此,可使接觸構件40旋轉,而且開始從吐出口59a吐出清洗流體La、從吐出口59b吐出清洗流體Lb、及從吸引口60吸引流體。 Then, the control module 800 rotates the substrate holder 20 by the rotation mechanism 30, and starts the operation of the pump 57a, the pump 57b, and the pump 57c, and starts to discharge the cleaning fluid La from the discharge port 59a and discharge the cleaning fluid La from the discharge port 59b. The cleaning fluid Lb is sucked from the suction port 60 (step S13). Thereby, the contact member 40 can be rotated, and discharge of the cleaning fluid La from the discharge port 59 a , discharge of the cleaning fluid Lb from the discharge port 59 b , and suction of the fluid from the suction port 60 can be started.

在該步驟S13中,藉由接觸構件40旋轉,且執行從吐出口59a吐出清洗流體La、及從吐出口59b吐出清洗流體Lb,可將從該吐出口59a吐出之清洗流體La及從吐出口59b吐出之清洗流體Lb有效碰觸接觸構件40,來清洗接觸構件40。 In this step S13, the cleaning fluid La discharged from the discharge port 59a and the cleaning fluid La discharged from the discharge port 59a can be discharged from the discharge port 59a by rotating the contact member 40 and discharging the cleaning fluid La from the discharge port 59a and the cleaning fluid Lb from the discharge port 59b. The cleaning fluid Lb spouted by 59 b effectively touches the contact member 40 to clean the contact member 40 .

此外,採用本實施形態時,如上述,噴嘴55不僅吐出口,還具備吸引口60,在步驟S13中,由於亦執行從吸引口60吸引流體,因此可從吸引口60吸引附著於接觸構件40之清洗後的清洗流體。藉此,可抑制清洗後之清洗流體(污染之清洗流體)長期間殘留於接觸構件40。結果,可將接觸構件40早期形成潔淨狀態。 In addition, according to this embodiment, as described above, the nozzle 55 not only has the discharge port but also has the suction port 60. In step S13, since the fluid is also sucked from the suction port 60, it is possible to suck and adhere to the contact member 40 from the suction port 60. The cleaning fluid after cleaning. Thereby, the cleaning fluid after cleaning (contaminated cleaning fluid) can be suppressed from remaining on the contact member 40 for a long period of time. As a result, the contact member 40 can be brought into a clean state at an early stage.

另外,本實施形態之控制模組800在步驟S13中,係同時執行從吐出口59a吐出清洗流體La、從吐出口59b吐出清洗流體Lb、及從吸引口60吸引流體,不過並非限定於此者。步驟S13中,亦可分別在不同時期執行從吐出口59a吐出清洗流體La、從吐出口59b吐出清洗流體Lb、及從吸引口60吸引流體。 In addition, the control module 800 of the present embodiment simultaneously performs discharge of the cleaning fluid La from the discharge port 59a, discharge of the cleaning fluid Lb from the discharge port 59b, and suction of the fluid from the suction port 60 in step S13, but it is not limited to this. . In step S13, discharge of the cleaning fluid La from the discharge port 59a, discharge of the cleaning fluid Lb from the discharge port 59b, and suction of the fluid from the suction port 60 may be performed at different timings.

舉出該一例時,例如,在步驟S13中,亦可首先從吐出口59a吐出清洗流體La,接著,從吐出口59b吐出清洗流體Lb,接著從吸引口60吸引流體。或是,在步驟S13中,亦可首先從吐出口59b吐出清洗流體Lb,接著從吐出口59a吐出清洗流體La,接著,從吸引口60吸引流體。或是,亦可按照此等以外之順序執行吐出及吸引。 In this example, for example, in step S13 , the cleaning fluid La may be first discharged from the discharge port 59 a, then the cleaning fluid Lb may be discharged from the discharge port 59 b, and then the fluid may be suctioned from the suction port 60 . Alternatively, in step S13 , the cleaning fluid Lb may be discharged from the discharge port 59 b first, then the cleaning fluid La may be discharged from the discharge port 59 a, and then the fluid may be sucked from the suction port 60 . Alternatively, ejection and suction may be performed in an order other than these.

另外,用於使步驟S13之控制結束的條件並非特別限定者,例如控制模組800亦可從開始控制步驟S13起經過預設的指定時間後,結束步驟S13之控制。亦即,此時,步驟S13係在指定時間中執行。 In addition, the conditions for ending the control of step S13 are not particularly limited. For example, the control module 800 may end the control of step S13 after a preset specified time elapses from the start of controlling step S13. That is, at this time, step S13 is performed within a specified time.

或是,控制模組800亦可在有使接觸構件清洗處理之執行結束的要旨之控制指令的「結束清洗指令」時,使步驟S13之控制結束。舉出該一例時,例如亦可操作用於將結束清洗指令傳送至控制模組800的操作開關,而將結束清洗指令傳送至控制模組800,當控制模組800接收了該傳送之結束清洗指令時,控制模組800使步驟S13之控制結束。 Alternatively, the control module 800 may end the control in step S13 when there is a "cleaning end command" of the control command to end the execution of the contact member cleaning process. When citing this example, for example, the operation switch used to transmit the end cleaning command to the control module 800 can also be operated, and the end cleaning command is transmitted to the control module 800. When the control module 800 receives the transmitted end cleaning When commanded, the control module 800 ends the control of step S13.

此外,本實施形態之控制模組800在使步驟S13之控制結束時,具體而言,係進行以下之控制。首先,控制模組800使基板固持器20藉由旋轉機構30之旋轉停止,並且使泵浦57a、泵浦57b、及泵浦57c之運轉停止,並使從吐出口59a,59b吐出清洗流體、及從吸引口60吸引清洗流體停止。接著,控制模組800使回轉軸51在第二旋轉方向(R2)旋轉,而將噴嘴55送回升降位置。接著,控制模組800藉由升降機構36使基板固持器20上升至比噴嘴55上方。接著,控制模組800使回轉軸51在第二旋轉方向(R2)旋轉,而將噴嘴55送回外側區域25之避開位置。 In addition, the control module 800 of this embodiment performs the following control specifically, when finishing the control of step S13. First, the control module 800 stops the rotation of the substrate holder 20 by the rotation mechanism 30, stops the operation of the pump 57a, the pump 57b, and the pump 57c, and discharges the cleaning fluid from the discharge ports 59a, 59b, And the suction of cleaning fluid from the suction port 60 is stopped. Next, the control module 800 rotates the rotating shaft 51 in the second rotation direction ( R2 ), and returns the nozzle 55 to the lifting position. Then, the control module 800 raises the substrate holder 20 to be higher than the nozzle 55 through the lifting mechanism 36 . Then, the control module 800 rotates the rotating shaft 51 in the second rotation direction ( R2 ), and returns the nozzle 55 to the avoiding position of the outer area 25 .

另外,本實施形態之鍍覆裝置1000的接觸構件清洗方法係藉由上述之鍍覆裝置1000來實現。因此,為了省略重複之說明,而省略該接觸構件清洗方法之說明。 In addition, the cleaning method of the contact member of the plating apparatus 1000 of this embodiment is realized by the above-mentioned plating apparatus 1000. Therefore, in order to omit repeated description, the description of the contact member cleaning method is omitted.

採用如以上說明之本實施形態時,可藉由以簡單構造而構成之清洗裝置50如上述地清洗接觸構件40。藉此,可謀求降低清洗裝置50之成本,並可抑制因為接觸構件40污染導致基板Wf之鍍覆品質惡化。 According to the present embodiment as described above, the contact member 40 can be cleaned as described above by the cleaning device 50 having a simple structure. Thereby, the cost of the cleaning device 50 can be reduced, and the degradation of the plating quality of the substrate Wf due to contamination of the contact member 40 can be suppressed.

此外,採用本實施形態時,可藉由第一手臂53及第二手臂54之2個手臂將噴嘴55配置於回轉軸51中從第一手臂53之連接部位更遠的部位。藉此,可有效清洗接觸構件40。 In addition, according to the present embodiment, the nozzle 55 can be arranged at a position farther from the connection position of the first arm 53 in the rotary shaft 51 by the two arms of the first arm 53 and the second arm 54 . Thereby, the contact member 40 can be effectively cleaned.

此外,採用本實施形態時,由於可藉由使回轉軸51回轉而使噴嘴55回轉移動,因此可輕易使清洗流體之清洗部位變化。藉此,可輕易清洗寬廣範圍。 In addition, according to this embodiment, since the nozzle 55 can be rotated and moved by rotating the rotary shaft 51, the cleaning position of the cleaning fluid can be easily changed. Thereby, a wide area can be cleaned easily.

另外,於前述接觸構件清洗處理中之接觸構件40的清洗中(步驟S13執行中),亦即,在使基板固持器20旋轉而且使清洗流體從吐出口吐出期間,亦可使回轉軸51在第一旋轉方向(R1)及第二旋轉方向(R2)交互地回轉,而且清洗接觸構件40。採用該構成時,可以回轉軸51為中心使噴嘴55搖動,而且清洗接觸構件40。藉此,可有效清洗接觸構件40。 In addition, during the cleaning of the contact member 40 in the above-mentioned contact member cleaning process (in execution of step S13 ), that is, while the substrate holder 20 is rotated and the cleaning fluid is discharged from the discharge port, the rotary shaft 51 may also be rotated. The first rotation direction ( R1 ) and the second rotation direction ( R2 ) rotate alternately, and the contact member 40 is cleaned. With this configuration, the nozzle 55 can be swung about the rotary shaft 51 and the contact member 40 can be cleaned. Thereby, the contact member 40 can be effectively cleaned.

此外,上述實施形態中,第二手臂54係以將第二手臂54中連接於第一手臂53之部分作為起點而不致傾斜的方式構成,不過並非限定於該構成。圖10係用於說明第二手臂54之修改例的模式圖。具體而言,圖10係模式地圖示將在升降位置之第二手臂54從第一手臂53之軸線XL2的方向辨識之情形。例如,第二手臂54亦可將第二手臂54中之連接於第一手臂53的部分(亦即,與第一手臂53連 接於回轉軸51之側相反側的端部)作為起點而可傾斜地連接於第一手臂53之端部。採用該構成時,使第二手臂54傾斜,可輕易調整清洗流體從噴嘴55之吐出口的吐出方向。 In addition, in the above-mentioned embodiment, the second arm 54 is configured so as not to incline with the part of the second arm 54 connected to the first arm 53 as a starting point, but it is not limited to this configuration. FIG. 10 is a schematic diagram for explaining a modified example of the second arm 54. As shown in FIG. Specifically, FIG. 10 schematically illustrates the situation in which the second arm 54 in the lifting position is recognized from the direction of the axis XL2 of the first arm 53 . For example, the second arm 54 can also connect the part of the second arm 54 connected to the first arm 53 (that is, the part connected to the first arm 53 The end portion on the opposite side to the side connected to the rotary shaft 51) is used as a starting point to be obliquely connected to the end portion of the first arm 53. With this configuration, the discharge direction of the cleaning fluid from the discharge port of the nozzle 55 can be easily adjusted by tilting the second arm 54 .

具體而言,第二手臂54亦可將第二手臂54中連接於第一手臂53之部分作為起點,可對上下方向以指定角度(θ2)程度而傾斜地連接於第一手臂53的端部。該指定角度(θ2)例如可使用比0度(°)大,比20度(°)小之角度。 Specifically, the second arm 54 may be connected to the end of the first arm 53 so as to be inclined at a predetermined angle (θ2) in the vertical direction, starting from the part of the second arm 54 connected to the first arm 53 . For the specified angle (θ2), for example, an angle larger than 0 degrees (°) and smaller than 20 degrees (°) can be used.

更具體而言,圖10例示之第二手臂54在從第一手臂53之軸線XL2方向辨識時,係以在第二手臂54之長度方向延伸的軸線XL3將第二手臂54中之連接於第一手臂53的部分作為起點,在一方側及/或另一方側可對上下方向(對地面垂直之方向)以指定角度(θ2)程度傾斜之方式連接於第一手臂53的端部。 More specifically, when the second arm 54 illustrated in FIG. 10 is recognized from the axis XL2 direction of the first arm 53, the axis XL3 extending in the length direction of the second arm 54 connects the second arm 54 to the first arm 54. The part of an arm 53 is used as a starting point, and can be connected to the end of the first arm 53 in a manner inclined at a specified angle (θ2) to the vertical direction (vertical direction to the ground) on one side and/or the other side.

另外,第二手臂54從與第一手臂53之軸線XL2垂直的方向且水平方向(一例為圖6及圖10中之Y方向)辨識時,係以在第二手臂54之長度方向延伸的軸線XL3將第二手臂54中連接於第一手臂53之部分作為起點,可對上下方向以指定角度(θ2)程度傾斜之方式連接於第一手臂53的端部。 In addition, when the second arm 54 is recognized from a direction perpendicular to the axis XL2 of the first arm 53 and a horizontal direction (for example, the Y direction in FIGS. 6 and 10 ), the axis extending in the length direction of the second arm 54 is used. The XL3 uses the part of the second arm 54 connected to the first arm 53 as a starting point, and is connected to the end of the first arm 53 in such a way that it can be inclined at a predetermined angle (θ2) in the vertical direction.

以上,係就本發明之實施形態加以詳述,不過本發明並非限定於該實施形態者,在申請專利範圍中記載之本發明的要旨範圍內可進一步作各種修改、變更。 Above, the embodiments of the present invention have been described in detail, but the present invention is not limited to the embodiments, and various modifications and changes can be made within the scope of the present invention described in the claims.

20:基板固持器 20: Substrate holder

22:第二保持構件 22: Second holding member

25:外側區域 25: Outer area

26:內側區域 26: Inner area

40:接觸構件 40: Contact member

50:清洗裝置 50: cleaning device

51:回轉軸 51:Rotary axis

52:致動器 52: Actuator

53:第一手臂 53: First Arm

54:第二手臂 54: Second Arm

55:噴嘴 55: Nozzle

56a,56b,56c:槽 56a, 56b, 56c: Slots

57a,57b,57c:泵浦 57a, 57b, 57c: pump

58a,58b,58c:配管 58a, 58b, 58c: Piping

59a,59b:吐出口 59a, 59b: outlet

60:吸引口 60: suction port

61a,61b,61c:內部流路 61a, 61b, 61c: internal flow path

La,Lb:清洗流體 La, Lb: cleaning fluid

Claims (9)

一種鍍覆裝置,係具備:鍍覆槽;基板固持器,其係配置於比配置在前述鍍覆槽內部之陽極更上方,可保持作為陰極之基板;旋轉機構,其係使前述基板固持器旋轉;升降機構,其係使前述基板固持器升降;接觸構件,其係配置於前述基板固持器,並且與前述基板下面之外周緣接觸,來對前述基板饋電;及清洗裝置,其係清洗前述接觸構件;前述清洗裝置具有:回轉軸,其係在前述基板固持器之徑方向配置於外側的區域,並在上下方向延伸;第一手臂,其係連接於前述回轉軸,並在水平方向延伸;第二手臂,其係從與前述第一手臂的連接於前述回轉軸之側相反側的端部朝向上方延伸;及噴嘴,其係連接於前述第二手臂之上端,具有朝向下方開口,並且直接向前述接觸構件吐出清洗流體之至少一個吐出口;並以藉由從該吐出口吐出之前述清洗流體碰觸前述接觸構件的方式來清洗前述接觸構件之方式構成。 A coating device is provided with: a coating tank; a substrate holder, which is arranged above the anode inside the coating tank, and can hold a substrate as a cathode; a rotating mechanism, which makes the substrate holder rotation; a lift mechanism, which lifts the aforementioned substrate holder; a contact member, which is arranged on the aforementioned substrate holder, and contacts the outer peripheral edge of the lower surface of the aforementioned substrate to feed power to the aforementioned substrate; and a cleaning device, which is used for cleaning The aforementioned contact member; the aforementioned cleaning device has: a rotary shaft, which is arranged outside the area in the radial direction of the aforementioned substrate holder, and extends in the vertical direction; a first arm, which is connected to the aforementioned rotary shaft, and extends in the horizontal direction extending; the second arm, which extends upward from the end of the first arm opposite to the side connected to the rotary shaft; and the nozzle, which is connected to the upper end of the second arm and has an opening facing downward, And at least one discharge port that directly discharges the cleaning fluid to the contact member; and is configured to clean the contact member by contacting the contact member with the cleaning fluid discharged from the discharge port. 如請求項1之鍍覆裝置,其中前述噴嘴將前述第二手臂之上端作為起點,而朝向前述回轉軸之側延伸,平面觀看時,在前述噴嘴之長度方向延伸的軸線與在前述第一手臂之長度方向延伸的軸線形成之角度,為10度以上、70度以下之角度。 The coating device according to claim 1, wherein the nozzle extends toward the side of the rotary shaft with the upper end of the second arm as a starting point, and when viewed in a plan view, the axis extending in the longitudinal direction of the nozzle is the same as that in the first arm The angle formed by the axes extending in the longitudinal direction is not less than 10 degrees and not more than 70 degrees. 如請求項1之鍍覆裝置,其中進一步具備控制模組,其係控制前述旋轉機構、前述升降機構、及前述清洗裝置,前述控制模組在執行清洗前述接觸構件之接觸構件清洗處理時,藉由使前述回轉軸回轉,而在位於前述基板固持器下方之平面視角上使在前述基板固持器之徑方向移動至外側區域之前述噴嘴移動至在位於前述基板固持器下方之平面視角上在前述基板固持器之徑方向於內側區域的升降位置,接著,藉由前述升降機構使前述基板固持器下降,而使前述接觸構件位於比前述吐出口下方,接著,使前述回轉軸回轉,而使前述噴嘴移動至在前述內側區域之前述吐出口與前述接觸構件相對的清洗位置,接著,藉由前述旋轉機構使前述基板固持器旋轉,而且使前述清洗流體從前述吐出口吐出。 Such as the coating device of claim 1, which further has a control module, which is to control the aforementioned rotating mechanism, the aforementioned lifting mechanism, and the aforementioned cleaning device. When the aforementioned control module performs the cleaning process of cleaning the contact member, By rotating the rotary shaft, the nozzles that move to the outside area in the radial direction of the substrate holder are moved to the plane viewing angle below the substrate holder. The radial direction of the substrate holder is raised and lowered in the inner area, and then the substrate holder is lowered by the lifting mechanism, so that the contact member is positioned below the discharge port, and then the rotary shaft is rotated, so that the The nozzle moves to a cleaning position where the discharge port in the inner region faces the contact member, and then the substrate holder is rotated by the rotation mechanism, and the cleaning fluid is discharged from the discharge port. 如請求項3之鍍覆裝置,其中前述控制模組藉由前述旋轉機構使前述基板固持器旋轉,而且在使前述清洗流體從前述吐出口吐出期間,使前述回轉軸在第一旋轉方向及與前述第一旋轉方向相反之第二旋轉方向交互地回轉。 The coating device according to claim 3, wherein the control module rotates the substrate holder through the rotating mechanism, and makes the rotating shaft rotate in the first rotation direction and in the same direction as the cleaning fluid is discharged from the discharge port. The second rotation direction opposite to the aforementioned first rotation direction rotates alternately. 如請求項1之鍍覆裝置,其中前述第二手臂係將前述第二手臂中之連接於前述第一手臂的部分作為起點,而可傾斜地連接於前述第一手臂之前述端部。 The coating device according to claim 1, wherein the second arm is connected to the end of the first arm obliquely by using the part of the second arm connected to the first arm as a starting point. 如請求項1之鍍覆裝置,其中至少一個前述吐出口係包含複數個吐出口,從各個吐出口吐出之前述清洗流體的種類相互不同。 The coating device according to claim 1, wherein at least one of the discharge ports includes a plurality of discharge ports, and the types of the cleaning fluids discharged from the respective discharge ports are different from each other. 如請求項1之鍍覆裝置,其中前述噴嘴進一步具備吸引口,其係朝向下方開口,並且吸引流體。 The coating device according to claim 1, wherein the nozzle is further provided with a suction port which opens downward and sucks fluid. 如請求項1之鍍覆裝置,其中前述基板固持器具備:第一保持構件,其係保持前述基板之上面;及第二保持構件,其係保持前述基板下面之外周緣;前述接觸構件配置於前述第二保持構件。 As the coating device of claim 1, wherein the aforementioned substrate holder is provided with: a first holding member, which holds the upper surface of the aforementioned substrate; and a second holding member, which holds the outer peripheral edge of the lower surface of the aforementioned substrate; the aforementioned contact member is arranged on The aforementioned second holding member. 一種鍍覆裝置之接觸構件清洗方法,前述鍍覆裝置具備:鍍覆槽;基板固持器,其係配置於比配置在前述鍍覆槽內部之陽極更上方,可保持作為陰極之基板;接觸構件,其係配置於前述基板固持器,並且與前述基板下面之外周緣接觸,來對前述基板饋電;及清洗裝置,其係清洗前述接觸構件;前述清洗裝置具有:回轉軸,其係在前述基板固持器之徑方向配置於外側的區域,並在上下方向延伸;第一手臂,其係連接於前述回轉軸,並在水平方向延伸;第二手臂,其係從與前述第一手臂的連接於前述回轉軸之側相反側的端部朝向上方延伸;及噴嘴,其係連接於前述第二手臂之上端,具有朝向下方開口,並且直接向前述接觸構件吐出清洗流體之至少一個吐出口;前述接觸構件清洗方法包含:藉由使前述回轉軸回轉,而在位於前述基板固持器下方之平面視角上使在前述基板固持器之徑方向而移動至外側區域之前述噴嘴移動至在位於前述基板固持器下方之平面視角上在前述基板固持器之徑方向於內側區域的升降位置,接著,藉由使前述基板固持器下降,而使前述接觸構件位於比前述吐出口下方,接著,藉由使前述回轉軸回轉,而使前述噴嘴移動至前述內側區域中前述吐出口與前述接觸構件相對的清洗位置,接著,使前述基板固持器旋轉,而且使前述清洗流體從前述吐出口直接向前述接觸構件吐出。 A method for cleaning a contact member of a plating device, the aforementioned plating device comprising: a plating tank; a substrate holder disposed above the anode disposed inside the aforementioned coating tank and capable of holding a substrate serving as a cathode; a contact member , which is arranged on the aforementioned substrate holder, and is in contact with the outer peripheral edge of the lower surface of the aforementioned substrate to feed power to the aforementioned substrate; and a cleaning device, which cleans the aforementioned contact member; the aforementioned cleaning device has: a rotary shaft, which is tied to the aforementioned The radial direction of the substrate holder is arranged in the outer area and extends in the vertical direction; the first arm is connected to the aforementioned rotary shaft and extends in the horizontal direction; the second arm is connected to the aforementioned first arm. The end portion on the opposite side of the aforementioned rotary shaft extends upward; and the nozzle, which is connected to the upper end of the aforementioned second arm, has at least one outlet that opens downward and directly ejects the cleaning fluid to the aforementioned contact member; the aforementioned The contact member cleaning method includes: rotating the rotary shaft, and moving the nozzle that moves to the outside area in the radial direction of the substrate holder in the plane viewing angle below the substrate holder to the area located on the substrate holder. The lifting position of the inner region in the radial direction of the substrate holder in the plane view below the device, then, by lowering the substrate holder, the contact member is positioned below the discharge port, and then, by making the substrate holder lower The rotary shaft rotates to move the nozzle to a cleaning position where the discharge port faces the contact member in the inner region, and then rotates the substrate holder to discharge the cleaning fluid directly from the discharge port to the contact member. .
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Citations (1)

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Publication number Priority date Publication date Assignee Title
CN104272438A (en) * 2012-03-28 2015-01-07 诺发系统公司 Methods and apparatuses for cleaning electroplating substrate holders

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104272438A (en) * 2012-03-28 2015-01-07 诺发系统公司 Methods and apparatuses for cleaning electroplating substrate holders
CN104272438B (en) 2012-03-28 2018-01-12 诺发系统公司 Method and apparatus for cleaning plated substrate retainer

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