TWI790581B - Plating device and method for cleaning contact members of the plating device - Google Patents
Plating device and method for cleaning contact members of the plating device Download PDFInfo
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- TWI790581B TWI790581B TW110111089A TW110111089A TWI790581B TW I790581 B TWI790581 B TW I790581B TW 110111089 A TW110111089 A TW 110111089A TW 110111089 A TW110111089 A TW 110111089A TW I790581 B TWI790581 B TW I790581B
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- 238000004140 cleaning Methods 0.000 title claims abstract description 159
- 238000007747 plating Methods 0.000 title claims description 87
- 238000000034 method Methods 0.000 title claims description 28
- 239000000758 substrate Substances 0.000 claims abstract description 165
- 239000012530 fluid Substances 0.000 claims abstract description 85
- 230000007246 mechanism Effects 0.000 claims abstract description 47
- 238000000576 coating method Methods 0.000 claims abstract description 46
- 239000011248 coating agent Substances 0.000 claims abstract description 45
- 230000002093 peripheral effect Effects 0.000 claims description 17
- 230000008569 process Effects 0.000 claims description 17
- 238000010586 diagram Methods 0.000 description 7
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 7
- 230000003028 elevating effect Effects 0.000 description 6
- 239000007788 liquid Substances 0.000 description 4
- 238000007789 sealing Methods 0.000 description 4
- KRKNYBCHXYNGOX-UHFFFAOYSA-N citric acid Chemical compound OC(=O)CC(O)(C(O)=O)CC(O)=O KRKNYBCHXYNGOX-UHFFFAOYSA-N 0.000 description 3
- 238000007599 discharging Methods 0.000 description 3
- 238000011144 upstream manufacturing Methods 0.000 description 3
- 238000009736 wetting Methods 0.000 description 3
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 description 2
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 description 2
- 230000002378 acidificating effect Effects 0.000 description 2
- 230000009471 action Effects 0.000 description 2
- 239000000654 additive Substances 0.000 description 2
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 2
- 230000032258 transport Effects 0.000 description 2
- YASYEJJMZJALEJ-UHFFFAOYSA-N Citric acid monohydrate Chemical compound O.OC(=O)CC(O)(C(O)=O)CC(O)=O YASYEJJMZJALEJ-UHFFFAOYSA-N 0.000 description 1
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical group [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 229910000365 copper sulfate Inorganic materials 0.000 description 1
- ARUVKPQLZAKDPS-UHFFFAOYSA-L copper(II) sulfate Chemical compound [Cu+2].[O-][S+2]([O-])([O-])[O-] ARUVKPQLZAKDPS-UHFFFAOYSA-L 0.000 description 1
- 238000006731 degradation reaction Methods 0.000 description 1
- HTXDPTMKBJXEOW-UHFFFAOYSA-N dioxoiridium Chemical compound O=[Ir]=O HTXDPTMKBJXEOW-UHFFFAOYSA-N 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- 230000005484 gravity Effects 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 229910000457 iridium oxide Inorganic materials 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
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- 229910052697 platinum Inorganic materials 0.000 description 1
- 239000011148 porous material Substances 0.000 description 1
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- Coating Apparatus (AREA)
- Manufacturing Of Electrical Connectors (AREA)
- Electroplating Methods And Accessories (AREA)
- Application Of Or Painting With Fluid Materials (AREA)
Abstract
本發明提供一種構造簡單且可清洗接觸構件之技術。本發明之鍍覆裝置1000具備:鍍覆槽、基板固持器20、旋轉機構、升降機構、接觸構件40、及清洗接觸構件40之清洗裝置50,清洗裝置50具有:回轉軸51、第一手臂53、第二手臂54、及至少具有一個吐出口之噴嘴55,且係以藉由從吐出口吐出之清洗流體碰觸接觸構件40來清洗接觸構件40的方式構成。 The invention provides a technology with simple structure and cleanable contact components. The coating device 1000 of the present invention is equipped with: a coating tank, a substrate holder 20, a rotating mechanism, a lifting mechanism, a contact member 40, and a cleaning device 50 for cleaning the contact member 40. The cleaning device 50 has: a rotary shaft 51, a first arm 53 . The second arm 54 and the nozzle 55 having at least one discharge port are configured to clean the contact member 40 by contacting the contact member 40 with the cleaning fluid discharged from the discharge port.
Description
本發明係關於一種鍍覆裝置及鍍覆裝置之接觸構件清洗方法。 The invention relates to a plating device and a method for cleaning a contact member of the plating device.
過去,可對基板實施鍍覆處理之鍍覆裝置習知有所謂杯式的鍍覆裝置(例如,參照專利文獻1)。此種鍍覆裝置具備:鍍覆槽;配置於比配置在鍍覆槽內部之陽極上方,保持作為陰極之基板的基板固持器;及使基板固持器旋轉之旋轉機構。 Conventionally, a so-called cup-type plating apparatus has been known as a plating apparatus capable of performing a plating process on a substrate (for example, refer to Patent Document 1). Such a plating apparatus includes: a plating tank; a substrate holder disposed above an anode disposed inside the coating tank and holding a substrate serving as a cathode; and a rotation mechanism for rotating the substrate holder.
如上述之過去鍍覆裝置的基板固持器中,一般而言配置有用於對基板饋電之接觸構件。該接觸構件不潔時,接觸構件之電阻值變化,可能造成基板之鍍覆品質惡化。因此,開發出關於可清洗該接觸構件之清洗裝置的技術(例如,參照專利文獻2)。 In the substrate holder of the above-mentioned de-plating device, generally speaking, a contact member for feeding power to the substrate is arranged. When the contact member is not clean, the resistance value of the contact member changes, which may cause the plating quality of the substrate to deteriorate. Therefore, a technique related to a cleaning device capable of cleaning the contact member has been developed (for example, refer to Patent Document 2).
[專利文獻1]日本特開2008-19496號公報 [Patent Document 1] Japanese Unexamined Patent Publication No. 2008-19496
[專利文獻2]美國專利申請公開第2013/0061875號說明書 [Patent Document 2] Specification of U.S. Patent Application Publication No. 2013/0061875
但是,上述過去之接觸構件的清洗裝置之構造複雜。 However, the structure of the cleaning device of the above-mentioned conventional contact member is complicated.
本發明係鑑於上述情形者,目的之一為提供一種構造簡單且可清洗接觸構件的技術。 One of the objects of the present invention is to provide a technique for cleaning a contact member with a simple structure.
(樣態1) (pattern 1)
為了達成上述目的,本發明一個樣態之鍍覆裝置具備:鍍覆槽;基板固持器,其係配置於比配置在前述鍍覆槽內部之陽極上方,可保持作為陰極之基板;旋轉機構,其係使前述基板固持器旋轉;升降機構,其係使前述基板固持器升降;接觸構件,其係配置於前述基板固持器,並且與前述基板下面之外周緣接觸,來對前述基板饋電;及清洗裝置,其係清洗前述接觸構件;前述清洗裝置具有:回轉軸,其係在前述基板固持器之徑方向配置於外側的區域,並在上下方向延伸;第一手臂,其係連接於前述回轉軸,並在水平方向延伸;第二手臂,其係從與前述第一手臂的連接於前述回轉軸之側相反側的端部朝向上方延伸;及噴嘴,其係連接於前述第二手臂之上端,具有朝向下方開口,並且吐出清洗流體之至少一個吐出口;並以藉由從該吐出口吐出之前述清洗流體碰觸前述接觸構件的方式來清洗前述接觸構件之方式構成。 In order to achieve the above object, the coating device of one aspect of the present invention has: a coating tank; a substrate holder, which is arranged above the anode disposed inside the aforementioned coating tank, and can hold a substrate as a cathode; a rotating mechanism, It is used to rotate the aforementioned substrate holder; the lifting mechanism is used to lift the aforementioned substrate holder; the contact member is configured on the aforementioned substrate holder and contacts the outer peripheral edge of the lower surface of the aforementioned substrate to feed power to the aforementioned substrate; and a cleaning device, which cleans the aforementioned contact member; the aforementioned cleaning device has: a rotary shaft, which is disposed outside the region in the radial direction of the aforementioned substrate holder, and extends in the vertical direction; a first arm, which is connected to the aforementioned a rotary shaft extending horizontally; a second arm extending upward from the end of the first arm opposite to the side connected to the rotary shaft; and a nozzle connected to the second arm The upper end has at least one discharge port that opens downward and discharges cleaning fluid; and is configured to clean the contact member by contacting the contact member with the cleaning fluid discharged from the discharge port.
採用該樣態時,可藉由如上述之回轉軸、第一手臂、第二手臂、噴嘴等簡單構造所構成的清洗裝置來清洗接觸構件。 When this aspect is adopted, the contact member can be cleaned by a cleaning device composed of a simple structure such as the above-mentioned rotary shaft, the first arm, the second arm, and the nozzle.
此外,採用該樣態時,可藉由第一手臂及第二手臂之2個手臂將噴嘴配置於回轉軸中從第一手臂之連接部位更遠的部位。藉此,可有效清洗接觸構件。此外,採用該樣態時,由於可藉由使回轉軸回轉而使噴嘴移動(回轉移動), 因此可使清洗流體之清洗部位輕易變化。藉此,可輕易清洗接觸構件的寬廣範圍。 In addition, when this aspect is adopted, the nozzle can be arranged at a position farther from the connection position of the first arm in the rotary shaft by the two arms of the first arm and the second arm. Thereby, the contact member can be effectively cleaned. In addition, in this aspect, since the nozzle can be moved (rotational movement) by rotating the rotary shaft, Therefore, the cleaning position of the cleaning fluid can be changed easily. Thereby, a wide range of contact members can be easily cleaned.
(樣態2) (pattern 2)
上述樣態1中,亦可前述噴嘴將前述第二手臂之上端作為起點,而朝向前述回轉軸之側延伸,平面觀看時,在前述噴嘴之長度方向延伸的軸線與在前述第一手臂之長度方向延伸的軸線形成之角度,為10度以上,70度以下之角度。
In the above-mentioned
採用該樣態時,從噴嘴之吐出口所吐出的清洗流體可輕易碰觸接觸構件。藉此,可有效清洗接觸構件。 With this aspect, the cleaning fluid discharged from the discharge port of the nozzle can easily contact the contact member. Thereby, the contact member can be effectively cleaned.
(樣態3) (pattern 3)
上述樣態1或2亦可進一步具備控制模組,其係控制前述旋轉機構、前述升降機構、及前述清洗裝置,前述控制模組在執行清洗前述接觸構件之接觸構件清洗處理時,使在前述基板固持器之徑方向移動至外側區域之前述噴嘴移動至藉由使前述回轉軸回轉,而在前述基板固持器之徑方向於內側區域的前述噴嘴不致干擾前述基板固持器的升降位置,接著,藉由前述升降機構使前述基板固持器下降,而使前述接觸構件位於比前述吐出口下方,接著,使前述回轉軸回轉,而使前述噴嘴移動至在前述內側區域之前述吐出口與前述接觸構件相對的清洗位置,接著,藉由前述旋轉機構使前述基板固持器旋轉,而且使前述清洗流體從前述吐出口吐出。
The
(樣態4) (pattern 4)
上述樣態3中,亦可前述控制模組藉由前述旋轉機構使前述基板固持器旋轉,而且在使前述清洗流體從前述吐出口吐出期間,使前述回轉軸在第 一旋轉方向及與前述第一旋轉方向相反之第二旋轉方向交互地回轉。採用該樣態時,可有效清洗接觸構件。 In the above-mentioned aspect 3, the control module may rotate the substrate holder by the rotation mechanism, and while the cleaning fluid is discharged from the discharge port, the rotary shaft may be rotated at the second position. A rotation direction and a second rotation direction opposite to the aforementioned first rotation direction rotate alternately. According to this aspect, the contact member can be effectively cleaned.
(樣態5) (pattern 5)
上述樣態1~4中任何1個樣態中,前述第二手臂亦可將前述第二手臂中之連接於前述第一手臂的部分作為起點,而可傾斜地連接於前述第一手臂之前述端部。採用該樣態時,可輕易調整清洗流體從噴嘴之吐出口的吐出方向。 In any one of the above-mentioned aspects 1-4, the aforementioned second arm can also use the part of the aforementioned second arm connected to the aforementioned first arm as a starting point, and can be obliquely connected to the aforementioned end of the aforementioned first arm department. With this aspect, the discharge direction of the cleaning fluid from the discharge port of the nozzle can be easily adjusted.
(樣態6) (pattern 6)
上述樣態1~5中任何1個樣態中,至少1個前述吐出口亦可包含複數個吐出口,從各個吐出口吐出之前述清洗流體的種類相互不同。
In any one of the above-mentioned
(樣態7) (pattern 7)
上述樣態1~6中任何1個樣態中,前述噴嘴亦可進一步具備吸引口,其係朝向下方開口,並且吸引流體。
In any one of the above-mentioned
採用該樣態時,可從吸引口吸引附著於接觸構件之清洗後的清洗流體。藉此,由於可抑制清洗後之清洗流體長期間殘留於接觸構件,因此可將接觸構件早期形成潔淨的狀態。 According to this aspect, the cleaning fluid after cleaning adhering to the contact member can be sucked from the suction port. Thereby, since the cleaning fluid after cleaning can be suppressed from remaining on the contact member for a long period of time, the contact member can be brought into a clean state at an early stage.
(樣態8) (pattern 8)
上述樣態1~7中任何1個樣態中,前述基板固持器亦可具備:第一保持構件,其係保持前述基板之上面;及第二保持構件,其係保持前述基板下面之外周緣;前述接觸構件配置於前述第二保持構件。
In any one of the
(樣態9) (pattern 9)
為了達成上述目的,本發明一個樣態的鍍覆裝置之接觸構件清洗方法,前述鍍覆裝置具備:鍍覆槽;基板固持器,其係配置於比配置在前述鍍覆槽內部之陽極上方,可保持作為陰極之基板;接觸構件,其係配置於前述基板固持器,並且與前述基板下面之外周緣接觸,來對前述基板饋電;及清洗裝置,其係清洗前述接觸構件;前述清洗裝置具有:回轉軸,其係在前述基板固持器之徑方向配置於外側的區域,並在上下方向延伸;第一手臂,其係連接於前述回轉軸,並在水平方向延伸;第二手臂,其係從與前述第一手臂的連接於前述回轉軸之側相反側的端部朝向上方延伸;及噴嘴,其係連接於前述第二手臂之上端,具有朝向下方開口,並且吐出清洗流體之至少一個吐出口;前述接觸構件清洗方法包含:藉由使前述回轉軸回轉,而使在前述基板固持器之徑方向而移動至外側區域之前述噴嘴移動至在前述基板固持器之徑方向於內側區域的前述噴嘴不致干擾前述基板固持器的升降位置,接著,藉由使前述基板固持器下降,而使前述接觸構件位於比前述吐出口下方,接著,藉由使前述回轉軸回轉,而使前述噴嘴移動至前述內側區域中前述吐出口與前述接觸構件相對的清洗位置,接著,使前述基板固持器旋轉,而且使前述清洗流體從前述吐出口吐出。 In order to achieve the above object, the contact member cleaning method of a coating device according to an aspect of the present invention, the aforementioned coating device is provided with: a coating tank; a substrate holder, which is arranged above the anode disposed inside the coating tank A substrate capable of holding a cathode; a contact member disposed on the substrate holder and in contact with the outer peripheral edge of the lower surface of the substrate to feed power to the substrate; and a cleaning device for cleaning the contact member; the cleaning device It has: a rotary shaft, which is arranged outside the region in the radial direction of the substrate holder, and extends in the vertical direction; a first arm, which is connected to the rotary shaft, and extends in the horizontal direction; a second arm, which It extends upward from the end of the first arm opposite to the side connected to the rotary shaft; and a nozzle connected to the upper end of the second arm has a downward opening and spits out at least one of the cleaning fluid. Discharge port; the cleaning method of the contact member includes: moving the nozzle which is moved to the outer area in the radial direction of the substrate holder to the inner area in the radial direction of the substrate holder by rotating the rotary shaft The nozzle does not interfere with the lifting position of the substrate holder. Then, by lowering the substrate holder, the contact member is positioned below the discharge port. Next, the nozzle is moved by rotating the rotary shaft. After reaching the cleaning position where the discharge port faces the contact member in the inner region, the substrate holder is rotated and the cleaning fluid is discharged from the discharge port.
採用該樣態時,可藉由以簡單構造所構成之清洗裝置清洗接觸構件。 In this aspect, the contact member can be cleaned by the cleaning device having a simple structure.
10:鍍覆槽 10: Plating tank
10a:底部 10a: Bottom
10b:外周部 10b: Peripheral part
11:陽極 11: anode
12:電阻體 12: resistor body
15:溢流槽 15: overflow tank
20:基板固持器 20: Substrate holder
21:第一保持構件 21: first holding member
22:第二保持構件 22: Second holding member
23:連接構件 23: Connecting components
25:外側區域 25: Outer area
26:內側區域 26: Inner area
30:旋轉機構 30: Rotating mechanism
31:旋轉軸 31: axis of rotation
35:傾斜機構 35: Tilt mechanism
36:升降機構 36: Lifting mechanism
37:支軸 37: pivot
40:接觸構件 40: Contact member
45:密封構件 45: sealing member
50:清洗裝置 50: cleaning device
51:回轉軸 51: rotary axis
52:致動器 52: Actuator
53:第一手臂 53: First Arm
54:第二手臂 54: Second Arm
55:噴嘴 55: Nozzle
56a,56b,56c:槽 56a, 56b, 56c: Slots
57a,57b,57c:泵浦 57a, 57b, 57c: pump
58a,58b,58c:配管 58a, 58b, 58c: Piping
59a,59b:吐出口 59a, 59b: outlet
60:吸引口 60: suction port
61a,61b,61c:內部流路 61a, 61b, 61c: internal flow path
400:鍍覆模組 400: Plating module
800:控制模組 800: Control module
1000:鍍覆裝置 1000: Plating device
La,Lb:清洗流體 La, Lb: cleaning fluid
Ps:鍍覆液 Ps: plating solution
R1:第一旋轉方向 R1: the first direction of rotation
R2:第二旋轉方向 R2: Second direction of rotation
XL1,XL2,XL3:軸線 XL1, XL2, XL3: axis
Wf:基板 Wf: Substrate
Wfa:下面 Wfa: below
Wfb:上面 Wfb: above
圖1係顯示實施形態之鍍覆裝置的整體構成立體圖。 Fig. 1 is a perspective view showing the overall configuration of a coating device according to an embodiment.
圖2係顯示實施形態之鍍覆裝置的整體構成俯視圖。 Fig. 2 is a plan view showing the overall configuration of the coating device of the embodiment.
圖3係實施形態之鍍覆裝置的鍍覆模組之構成模式圖。 Fig. 3 is a structural schematic diagram of a coating module of the coating device of the embodiment.
圖4係顯示將實施形態之基板浸漬於鍍覆液的情形之模式圖。 Fig. 4 is a schematic view showing a state where the substrate of the embodiment is immersed in a plating solution.
圖5(A)係放大實施形態之基板固持器的一部分而模式顯示之剖面圖。圖5(B)係實施形態之接觸構件的周邊構成之模式剖面圖。 Fig. 5(A) is a cross-sectional view schematically showing a part of the substrate holder according to the embodiment. Fig. 5(B) is a schematic cross-sectional view of the peripheral structure of the contact member of the embodiment.
圖6係模式顯示實施形態之清洗裝置的整體構成圖。 Fig. 6 is a diagram schematically showing the overall configuration of the cleaning device of the embodiment.
圖7係實施形態之清洗裝置的一部分構成之模式俯視圖。 Fig. 7 is a schematic plan view of a part of the cleaning device according to the embodiment.
圖8係模式顯示實施形態之噴嘴的移動情形之俯視圖。 Fig. 8 is a top view schematically showing the movement of the nozzle of the embodiment.
圖9係顯示實施形態之接觸構件執行清洗處理時進行的一連串控制之流程圖的一例。 Fig. 9 is an example of a flow chart showing a series of controls performed when cleaning the contact member according to the embodiment.
圖10係用於說明實施形態之第二手臂的修改例之模式圖。 Fig. 10 is a schematic diagram for explaining a modified example of the second arm of the embodiment.
以下,參照圖式說明本發明之實施形態。另外,圖式係為了容易理解事物之特徵而模式性圖示,各構成元件之尺寸、比率等未必與實際者相同。此外,一些圖式中圖示有X-Y-Z之正交座標用於參考。該正交座標中之Z方向相當於上方,-Z方向相當於下方(重力作用之方向)。 Hereinafter, embodiments of the present invention will be described with reference to the drawings. In addition, the drawings are schematic illustrations for easy understanding of the characteristics of things, and the dimensions, ratios, etc. of each component may not necessarily be the same as the actual ones. In addition, X-Y-Z orthogonal coordinates are shown in some drawings for reference. The Z direction in the orthogonal coordinates corresponds to the upper side, and the -Z direction corresponds to the lower side (the direction in which gravity acts).
圖1係顯示本實施形態之鍍覆裝置的整體構成立體圖。圖2係顯示本實施形態之鍍覆裝置的整體構成俯視圖。如圖1、2所示,鍍覆裝置1000具備:裝載埠100、搬送機器人110、對準器120、預濕模組200、預浸模組300、鍍覆模組400、清洗模組500、自旋沖洗乾燥器600、搬送裝置700、及控制模組800。
Fig. 1 is a perspective view showing the overall configuration of a coating device according to this embodiment. Fig. 2 is a plan view showing the overall configuration of the coating device of the present embodiment. As shown in Figures 1 and 2, the
裝載埠100係用於搬入收納於鍍覆裝置1000中無圖示之FOUP(前開式晶圓傳送盒)等匣盒的基板,或是從鍍覆裝置1000搬出基板至匣盒的模組。本實施形態係在水平方向並列配置4台裝載埠100,不過,裝載埠100之數量及配
置不拘。搬送機器人110係用於搬送基板之機器人,且以在裝載埠100、對準器120、及搬送裝置700之間交接基板的方式構成。搬送機器人110及搬送裝置700在搬送機器人110與搬送裝置700之間交接基板時,可經由無圖示之暫置台進行基板的交接。
The
對準器120係用於將基板之定向範圍或凹槽等的位置對準指定方向之模組。本實施形態係在水平方向並列配置2台對準器120,不過,對準器120之數量及配置不拘。預濕模組200藉由將鍍覆處理前之基板的被鍍覆面以純水或脫氣水等處理液濕潤,並將形成於基板表面之圖案內部的空氣替換成處理液。預濕模組200係以在鍍覆時藉由將圖案內部之處理液替換成鍍覆液,而實施容易在圖案內部供給鍍覆液之預濕處理的方式構成。本實施形態係在上下方向並列配置2台預濕模組200,不過預濕模組200之數量及配置不拘。
The
預浸模組300例如係以實施藉由硫酸或鹽酸等處理液蝕刻除去形成於鍍覆處理前之基板的被鍍覆面之種層表面等上存在之電阻大的氧化膜,清洗或活化鍍覆基底表面之預浸處理的方式構成。本實施形態係在上下方向並列配置2台預浸模組300,不過預浸模組300之數量及配置不拘。鍍覆模組400對基板實施鍍覆處理。本實施形態有2組在上下方向並列配置3台且在水平方向並列配置4台之12台的鍍覆模組400,而設置合計24台之鍍覆模組400,不過鍍覆模組400之數量及配置不拘。
The
清洗模組500係以為了除去殘留於鍍覆處理後之基板的鍍覆液等而對基板實施清洗處理之方式構成。本實施形態係在上下方向並列配置2台清洗模組500,不過清洗模組500之數量及配置不拘。自旋沖洗乾燥器600係用於使清洗處理後之基板高速旋轉而乾燥的模組。本實施形態係在上下方向並列配置2台
自旋沖洗乾燥器,不過自旋沖洗乾燥器之數量及配置不拘。搬送裝置700係用於在鍍覆裝置1000中之複數個模組間搬送基板的裝置。控制模組800係以控制鍍覆裝置1000之複數個模組的方式構成,例如可由具備與作業人員之間的輸入輸出介面之一般電腦或專用電腦而構成。
The
以下說明鍍覆裝置1000之一連串鍍覆處理的一例。首先,將收納於匣盒之基板搬入裝載埠100。繼續,搬送機器人110從裝載埠100之匣盒取出基板,並將基板搬送至對準器120。對準器120將基板之定向範圍或凹槽等的位置對準指定方向。搬送機器人110將藉由對準器120對準方向之基板送交搬送裝置700。
An example of a series of plating processes in the
搬送裝置700將從搬送機器人110接收之基板搬送至預濕模組200。預濕模組200對基板實施預濕處理。搬送裝置700將實施預濕處理後之基板搬送至預浸模組300。預浸模組300對基板實施預浸處理。搬送裝置700將實施預浸處理後之基板搬送至鍍覆模組400。鍍覆模組400對基板實施鍍覆處理。
The
搬送裝置700將實施鍍覆處理後之基板搬送至清洗模組500。清洗模組500對基板實施清洗處理。搬送裝置700將實施清洗處理後之基板搬送至自旋沖洗乾燥器600。自旋沖洗乾燥器600對基板實施乾燥處理。搬送裝置700將實施乾燥處理後之基板送交搬送機器人110。搬送機器人110將從搬送裝置700所接收之基板搬送至裝載埠100的匣盒。最後,從裝載埠100搬出收納了基板之匣盒。
The
另外,圖1及圖2說明之鍍覆裝置1000的構成不過是一例,鍍覆裝置1000之構成並非限定於圖1及圖2之構成者。
In addition, the configuration of the
繼續,說明鍍覆模組400。另外,由於本實施形態之鍍覆裝置1000具有的複數個鍍覆模組400具有同樣之構成,因此,就1個鍍覆模組400作說明。
Next, the
圖3係本實施形態之鍍覆裝置1000的鍍覆模組400之構成模式圖。圖4係顯示將基板Wf浸漬於鍍覆液Ps之情形的模式圖。本實施形態之鍍覆裝置1000係杯式的鍍覆裝置。鍍覆裝置1000之鍍覆模組400主要具備:鍍覆槽10、溢流槽15、基板固持器20、旋轉機構30、傾斜機構35、升降機構36、接觸構件40。另外,鍍覆模組400亦具備後述之清洗裝置50(圖6等),不過圖3及圖4中省略清洗裝置50之圖示。此外,圖3中,鍍覆模組400之一部分構成(鍍覆槽10、溢流槽15、基板固持器20等)係模式性圖示其剖面。
Fig. 3 is a structural schematic diagram of the
本實施形態之鍍覆槽10藉由上方具有開口之有底的容器而構成。具體而言,鍍覆槽10具有:底部10a;及從該底部10a之外周緣向上方延伸的外周部10b;該外周部10b之上部開口。另外,鍍覆槽10之外周部10b的形狀並非特別限定者,而本實施形態之外周部10b的一例為具有圓筒形狀。
The
在鍍覆槽10之內部貯存有鍍覆液Ps。鍍覆槽10中設有用於對鍍覆槽10供給鍍覆液Ps之供給口(無圖示)。鍍覆液Ps只要是含有構成鍍覆皮膜之金屬元素的離子之溶液即可,其具體例並非特別限定者。本實施形態中,鍍覆處理之一例為使用銅鍍覆處理,鍍覆液Ps之一例為使用硫酸銅溶液。此外,本實施形態中,鍍覆液Ps中含有指定之添加劑。但是,並非限定於該構成者,鍍覆液Ps亦可不含添加劑而構成。
The plating solution Ps is stored inside the
在鍍覆槽10之鍍覆液Ps的內部配置有陽極11。陽極11之具體種類並非特別限定者,可使用溶解陽極或不溶解陽極。本實施形態中,陽極11係使用不溶解陽極。該不溶解陽極之具體種類並非特別限定者,可使用鉑或氧化銥等。
The
溢流槽15係藉由在鍍覆槽10之徑方向配置於外側區域之有底的容器而構成。溢流槽15係為了暫時貯存超過鍍覆槽10之外周部10b上端的鍍覆液
Ps(亦即,從鍍覆槽10溢流之鍍覆液Ps)而設的槽。溢流槽15中設有用於從溢流槽15排出溢流槽15之鍍覆液Ps的排出口(無圖示)。從排出口排出之鍍覆液Ps暫時貯存於貯存槽(無圖示)後,再度從供給口供給至鍍覆槽10。
The
在鍍覆槽10內部之比陽極11上方配置有多孔質的電阻體12。電阻體12藉由具有複數個孔(細孔)之多孔性的板構件而構成。比電阻體12下方側之鍍覆液Ps通過電阻體12可流動至比電阻體12上方側。該電阻體12係為了謀求形成於陽極11與基板Wf間之電場均勻化而設的構件。因此,藉由鍍覆裝置1000具有電阻體12,可輕易謀求形成於基板Wf之鍍覆皮膜(鍍覆層)的膜厚均勻化。
A
基板固持器20係用於保持作為陰極之基板Wf的構件。基板Wf之下面Wfa相當於被鍍覆面。基板固持器20連接於旋轉機構30之旋轉軸31。旋轉機構30係用於使基板固持器20旋轉之機構。旋轉機構30可使用馬達等習知之機構。
The
傾斜機構35係用於使旋轉機構30及基板固持器20傾斜之機構。傾斜機構35可使用活塞、汽缸等習知之傾斜機構。升降機構36藉由在上下方向延伸之支軸37而支撐。升降機構36係用於使基板固持器20、旋轉機構30、及傾斜機構35在上下方向升降之機構。升降機構36可使用直動式之致動器等習知的升降機構。
The
如圖4所示,在基板Wf之下面Wfa(被鍍覆面)實施鍍覆處理時,旋轉機構30使基板固持器20旋轉,並且升降機構36使基板固持器20移動至下方,而使基板Wf浸漬於鍍覆槽10之鍍覆液Ps中。另外,使基板Wf浸漬於鍍覆液Ps時,傾斜機構35依需要亦可使基板固持器20傾斜。將基板Wf浸漬於鍍覆液Ps後,藉由通電裝置(無圖示)而在陽極11與基板Wf之間流動電流。藉此,在基板Wf之下面Wfa上形成鍍覆皮膜。
As shown in FIG. 4 , when the coating process is performed on the lower surface Wfa (surface to be coated) of the substrate Wf, the rotating
鍍覆模組400之動作藉由控制模組800來控制。控制模組800備有微電腦,該微電腦具備:作為處理器之CPU(中央處理單元)801;及作為永久性記憶媒體之記憶部802等。控制模組800依據記憶於記憶部802之程式的指令,藉由作為處理器之CPU801工作來控制鍍覆模組400的被控制部。
The action of the
圖5(A)係放大基板固持器20之一部分(圖3之A1部分)而模式性顯示的剖面圖。參照圖3及圖5(A),本實施形態之基板固持器20具備:保持基板Wf之上面Wfb的第一保持構件21;及保持基板Wf之下面Wfa的外周緣之第二保持構件22。本實施形態之第一保持構件21具有圓板形狀。本實施形態之第二保持構件22具有環形狀。基板固持器20藉由第一保持構件21及第二保持構件22,以夾著基板Wf之方式保持基板Wf。
FIG. 5(A) is a cross-sectional view schematically showing an enlarged part of the substrate holder 20 (part A1 in FIG. 3 ). Referring to FIG. 3 and FIG. 5(A), the
第一保持構件21連接於旋轉軸31之下方側端部。具體而言,本實施形態之第一保持構件21係以可從旋轉軸31卸除之連接樣態(裝卸自如之連接樣態)而連接於旋轉軸31。此外,本實施形態之第二保持構件22經由連接構件23而連接於旋轉軸31的中途部位。
The first holding
另外,本實施形態之第二保持構件22經由密封構件45而保持基板Wf之下面Wfa的外周緣。密封構件45在基板Wf浸漬於鍍覆液Ps時,係用於抑制鍍覆液Ps接觸後述之接觸構件40的構件。本實施形態之密封構件45具有環形狀。
In addition, the second holding
接觸構件40配置於基板固持器20。具體而言,本實施形態之接觸構件40係配置於基板固持器20的第二保持構件22。接觸構件40係接觸於基板Wf之下面Wfa的外周緣,而用於對基板Wf饋電之構件。
The
圖5(B)係接觸構件40之周邊構成的模式性剖面圖(B1-B1線剖面圖)。另外,圖5(B)中,省略第一保持構件21及基板Wf之圖示。參照圖5(A)
及圖5(B),接觸構件40在基板固持器20之周方向(具體而言,係第二保持構件22之周方向)配置複數個。
FIG. 5(B) is a schematic cross-sectional view (cross-sectional view along line B1-B1) of the peripheral configuration of the
具體而言,本實施形態之複數個接觸構件40均等地配置於基板固持器20的周方向。複數個接觸構件40之數量並非特別限定者,而本實施形態之一例為12個。複數個接觸構件40與通電裝置(無圖示)電性連接,而將從通電裝置所供給之電力供給至基板Wf。
Specifically, the plurality of
繼續,說明清洗裝置50。圖6係模式性顯示清洗裝置50之整體構成圖。清洗裝置50係用於清洗接觸構件40之裝置。具體而言,本實施形態之清洗裝置50具備:回轉軸51、致動器52、第一手臂53、第二手臂54、噴嘴55、槽(槽56a、槽56b、槽56c)、泵浦(泵浦57a、泵浦57b、泵浦57c)、及配管(配管58a、配管58b、配管58c)。
Next, the
回轉軸51在基板固持器20之徑方向,配置於比基板固持器20外側的區域。具體而言,本實施形態之回轉軸51係配置於基板固持器20之外側區域,且鍍覆槽10之外側區域。回轉軸51在上下方向延伸。回轉軸51之上端連接於致動器52。
The
致動器52配置於基板固持器20之外側,且鍍覆槽10之外側區域。致動器52藉由控制模組800控制,使回轉軸51在第一旋轉方向(R1)及第二旋轉方向(R2)回轉。致動器52例如可使用可在第一旋轉方向(R1)及第二旋轉方向(R2)旋轉之電動馬達等。
The
第一手臂53連接於回轉軸51之下端,並且在水平方向延伸。第二手臂54從與第一手臂53的連接於回轉軸51之側相反側的端部向上方延伸。第一手臂53及第二手臂54具有作為連接回轉軸51與噴嘴55之連接手臂的功能。第一
手臂53及第二手臂54在回轉軸51回轉時,與該回轉軸51成為一體而回轉。第一手臂53及第二手臂54之長度,係以噴嘴55位於後述之清洗位置時噴嘴55之後述吐出口及吸引口與接觸構件40相對的方式設定。
The
噴嘴55連接於第二手臂54之上端。噴嘴55具有直接向接觸構件40吐出清洗用之流體「清洗流體」的至少一個吐出口。具體而言,本實施形態之噴嘴55具有複數個吐出口,其一例為具有2個吐出口(吐出口59a、吐出口59b)。但是,噴嘴55具有之吐出口的數量並非限定於2個者,亦可比2個多,亦可比其少。
The
吐出口59a及吐出口59b朝向下方開口。吐出口59a係以將清洗流體La朝向下方而直接向接觸構件40吐出的方式構成,吐出口59b係以朝向下方直接向接觸構件40吐出與清洗流體La不同種類之清洗流體Lb的方式構成。亦即,本實施形態之從各個吐出口直接向接觸構件吐出之清洗流體的種類彼此不同。該清洗流體之具體例於後述。
The
此外,本實施形態之噴嘴55亦具備吸引口60。吸引口60係以朝向下方開口,並且吸引流體之方式構成。
Moreover, the
在本實施形態之噴嘴55的內部設有:內部流路61a、內部流路61b、及內部流路61c。內部流路61a之下游端連通於吐出口59a,內部流路61b之下游端連通於吐出口59b,內部流路61c之上游端連通於吸引口60。
Inside the
內部流路61a之上游端經由配管58a而連通於槽56a。內部流路61b之上游端經由配管58b而連通於槽56b。內部流路61c之下游端經由配管58c而連通於槽56c。配管58a中配置有用於朝向吐出口59a壓送貯存於槽56a之清洗流體La的泵浦57a。配管58b中配置有用於朝向吐出口59b壓送貯存於槽56b之清洗流體Lb
的泵浦57b。配管58c中配置有用於朝向槽56c壓送從吸引口60所吸引之流體的泵浦57c。泵浦57a、泵浦57b及泵浦57c之動作由控制模組800控制。
The upstream end of the
藉由泵浦57a接受控制模組800之指令而工作,槽56a之清洗流體La通過配管58a及內部流路61a而從吐出口59a吐出。同樣地,藉由泵浦57b工作,而槽56b之清洗流體Lb通過配管58b及內部流路61b而從吐出口59b吐出。藉由泵浦57c工作,配管58c及內部流路61c之內壓變成負壓,藉此,從吸引口60吸引流體(具體而言,係清洗後之清洗流體)。被該吸引口60所吸引之流體通過內部流路61c及配管58c而貯存於槽56c。
When the pump 57a operates under the command of the
本實施形態的清洗流體La之一例為使用中性水(具體而言係純水)。此外,本實施形態的清洗流體Lb之一例為使用酸性水。本實施形態的該酸性水之一例為使用含有檸檬酸之水(檸檬酸水)。但是,這不過是清洗流體La及清洗流體Lb的一例,清洗流體La及清洗流體Lb之具體種類並非限定於此者。 As an example of the cleaning fluid La of this embodiment, neutral water (specifically, pure water) is used. In addition, acidic water is used as an example of the cleaning fluid Lb of this embodiment. As an example of this acidic water of this embodiment, the water containing citric acid (citric acid water) is used. However, this is just an example of the cleaning fluid La and the cleaning fluid Lb, and the specific types of the cleaning fluid La and the cleaning fluid Lb are not limited thereto.
此外,清洗流體並非限定於液體者。清洗流體亦可使用氣體。舉出其具體例時,例如亦可使用空氣作為清洗流體La及清洗流體Lb的其中一方。另外,清洗流體La使用空氣時不需要槽56a。同樣地,清洗流體Lb使用空氣時不需要槽56b。
In addition, the cleaning fluid is not limited to liquid ones. Gases can also be used as the cleaning fluid. When specific examples thereof are given, for example, air may be used as one of the cleaning fluid La and the cleaning fluid Lb. In addition, the
圖7係清洗裝置50之一部分構成的模式俯視圖。另外,圖7中省略致動器52之圖示(關於此,後述之圖8亦同樣)。此外,圖7中,噴嘴55位於後述之升降位置。本實施形態之噴嘴55具有將第二手臂54之上端作為起點,朝向回轉軸51之側延伸的形狀(具體而言,係長方形之形狀)。而平面觀看(或俯視)時,在噴嘴55之長度方向延伸的軸線XL1與在第一手臂53之長度方向延伸的軸線XL2形成之角θ(從回轉軸51之側觀看形成之角)為比0度(°)大,且比90度(°)
小之角度,具體而言,係形成10度以上,70度以下之角度。更具體而言,形成之角θ為10度以上,60度以下之角度,更詳細而言,為形成10度以上,50度以下之角度。
FIG. 7 is a schematic top view of a part of the
如上述,藉由形成之角θ為10度以上,70度以下之角度,可使從噴嘴55之吐出口59a,59b吐出的清洗流體輕易碰觸接觸構件40(參照後述之圖8)。藉此,可有效清洗接觸構件40。但是,上述形成之角θ只不過是一例,形成之角θ宜依第一手臂53之長度及噴嘴55的長度等而使用適切之值。
As mentioned above, by forming the angle θ of 10 degrees or more and 70 degrees or less, the cleaning fluid discharged from the
此外,參照圖6及圖7,本實施形態之吐出口59a、吐出口59b、及吸引口60排列於噴嘴55的軸線XL1方向。但是,吐出口59a、吐出口59b、及吸引口60之配置樣態並非限定於此者。舉出其他一例時,吐出口59a吐出口59b、及吸引口60例如亦可排列於與噴嘴55之軸線XL1垂直的方向(亦即,噴嘴55之寬度方向)。
In addition, referring to FIG. 6 and FIG. 7 , the
圖8係模式顯示噴嘴55之移動情形的俯視圖。本實施形態之清洗裝置50藉由接受控制模組800之指令的致動器52使回轉軸51在第一旋轉方向(R1)及第二旋轉方向(R2)回轉,而使噴嘴55在基板固持器20之徑方向的外側區域(亦即,外側區域25)、與基板固持器20之徑方向的內側區域(亦即,內側區域26)之間移動。執行清洗接觸構件40之處理時,藉由將噴嘴55配置於基板固持器20之內側區域26,如後述,可以清洗流體有效清洗包含接觸構件40之基板固持器20的內側區域26,或是有效吸引清洗流體。
FIG. 8 is a top view schematically showing the movement of the
具體而言,本實施形態之控制模組800通常係先使噴嘴55移動至基板固持器20之外側區域25的避開位置。本實施形態中,該避開位置係位於基板
固持器20之外側區域25,並且亦位於鍍覆槽10之外側區域。因此,圖4之前述基板Wf的鍍覆處理係噴嘴55在避開位置之狀態下進行。
Specifically, the
另外,控制模組800在執行清洗接觸構件40之處理(稱為「接觸構件清洗處理」)時,進行以下說明之一連串控制。圖9係顯示執行接觸構件清洗處理時進行之一連串控制的流程圖之一例。圖9之流程圖的各步驟係依據控制模組800之具體而言為CPU801依據記憶部802的程式來執行。參照圖8及圖9說明接觸構件清洗處理如下。
In addition, when the
首先,本實施形態之接觸構件清洗處理係在從基板固持器20拆卸了基板Wf之狀態下執行。再者,本實施形態之基板固持器20的第一保持構件21亦係在從鍍覆模組400拆卸之狀態下,執行接觸構件清洗處理。
First, the contact member cleaning process of this embodiment is performed in a state where the substrate Wf is detached from the
控制模組800例如有開始執行接觸構件清洗處理之要旨的控制指令「開始清洗指令」時,則使圖9之流程圖開始。舉出其一例時,例如操作用於將開始清洗指令傳送至控制模組800的操作開關(這是藉由使用者操作的操作開關),將開始清洗指令傳送至控制模組800,控制模組800接收了該傳送之開始清洗指令時,控制模組800使圖9之流程圖開始。
For example, when the
圖9之步驟S10中,控制模組800控制致動器52使回轉軸51在第一旋轉方向(R1)回轉,而使移動至外側區域25之避開位置的噴嘴55移動至基板固持器20之內側區域26中噴嘴55不致干擾基板固持器20的位置之「升降位置」。
In step S10 of FIG. 9 , the
接著,控制模組800藉由升降機構36使基板固持器20下降,而使接觸構件40比噴嘴55之吐出口59a,59b、及吸引口60位於下方(步驟S11)。
Next, the
接著,控制模組800控制致動器52,藉由使回轉軸51在第一旋轉方向(R1)回轉,而使噴嘴55移動至內側區域26中吐出口59a,59b、及吸引口60與接觸構件40相對之「清洗位置」(步驟S12)。
Then, the
接著,控制模組800藉由旋轉機構30使基板固持器20旋轉,並且使泵浦57a、泵浦57b及泵浦57c開始運轉,而開始從吐出口59a吐出清洗流體La、從吐出口59b吐出清洗流體Lb、及從吸引口60吸引流體(步驟S13)。藉此,可使接觸構件40旋轉,而且開始從吐出口59a吐出清洗流體La、從吐出口59b吐出清洗流體Lb、及從吸引口60吸引流體。
Then, the
在該步驟S13中,藉由接觸構件40旋轉,且執行從吐出口59a吐出清洗流體La、及從吐出口59b吐出清洗流體Lb,可將從該吐出口59a吐出之清洗流體La及從吐出口59b吐出之清洗流體Lb有效碰觸接觸構件40,來清洗接觸構件40。
In this step S13, the cleaning fluid La discharged from the
此外,採用本實施形態時,如上述,噴嘴55不僅吐出口,還具備吸引口60,在步驟S13中,由於亦執行從吸引口60吸引流體,因此可從吸引口60吸引附著於接觸構件40之清洗後的清洗流體。藉此,可抑制清洗後之清洗流體(污染之清洗流體)長期間殘留於接觸構件40。結果,可將接觸構件40早期形成潔淨狀態。
In addition, according to this embodiment, as described above, the
另外,本實施形態之控制模組800在步驟S13中,係同時執行從吐出口59a吐出清洗流體La、從吐出口59b吐出清洗流體Lb、及從吸引口60吸引流體,不過並非限定於此者。步驟S13中,亦可分別在不同時期執行從吐出口59a吐出清洗流體La、從吐出口59b吐出清洗流體Lb、及從吸引口60吸引流體。
In addition, the
舉出該一例時,例如,在步驟S13中,亦可首先從吐出口59a吐出清洗流體La,接著,從吐出口59b吐出清洗流體Lb,接著從吸引口60吸引流體。或是,在步驟S13中,亦可首先從吐出口59b吐出清洗流體Lb,接著從吐出口59a吐出清洗流體La,接著,從吸引口60吸引流體。或是,亦可按照此等以外之順序執行吐出及吸引。
In this example, for example, in step S13 , the cleaning fluid La may be first discharged from the
另外,用於使步驟S13之控制結束的條件並非特別限定者,例如控制模組800亦可從開始控制步驟S13起經過預設的指定時間後,結束步驟S13之控制。亦即,此時,步驟S13係在指定時間中執行。
In addition, the conditions for ending the control of step S13 are not particularly limited. For example, the
或是,控制模組800亦可在有使接觸構件清洗處理之執行結束的要旨之控制指令的「結束清洗指令」時,使步驟S13之控制結束。舉出該一例時,例如亦可操作用於將結束清洗指令傳送至控制模組800的操作開關,而將結束清洗指令傳送至控制模組800,當控制模組800接收了該傳送之結束清洗指令時,控制模組800使步驟S13之控制結束。
Alternatively, the
此外,本實施形態之控制模組800在使步驟S13之控制結束時,具體而言,係進行以下之控制。首先,控制模組800使基板固持器20藉由旋轉機構30之旋轉停止,並且使泵浦57a、泵浦57b、及泵浦57c之運轉停止,並使從吐出口59a,59b吐出清洗流體、及從吸引口60吸引清洗流體停止。接著,控制模組800使回轉軸51在第二旋轉方向(R2)旋轉,而將噴嘴55送回升降位置。接著,控制模組800藉由升降機構36使基板固持器20上升至比噴嘴55上方。接著,控制模組800使回轉軸51在第二旋轉方向(R2)旋轉,而將噴嘴55送回外側區域25之避開位置。
In addition, the
另外,本實施形態之鍍覆裝置1000的接觸構件清洗方法係藉由上述之鍍覆裝置1000來實現。因此,為了省略重複之說明,而省略該接觸構件清洗方法之說明。
In addition, the cleaning method of the contact member of the
採用如以上說明之本實施形態時,可藉由以簡單構造而構成之清洗裝置50如上述地清洗接觸構件40。藉此,可謀求降低清洗裝置50之成本,並可抑制因為接觸構件40污染導致基板Wf之鍍覆品質惡化。
According to the present embodiment as described above, the
此外,採用本實施形態時,可藉由第一手臂53及第二手臂54之2個手臂將噴嘴55配置於回轉軸51中從第一手臂53之連接部位更遠的部位。藉此,可有效清洗接觸構件40。
In addition, according to the present embodiment, the
此外,採用本實施形態時,由於可藉由使回轉軸51回轉而使噴嘴55回轉移動,因此可輕易使清洗流體之清洗部位變化。藉此,可輕易清洗寬廣範圍。
In addition, according to this embodiment, since the
另外,於前述接觸構件清洗處理中之接觸構件40的清洗中(步驟S13執行中),亦即,在使基板固持器20旋轉而且使清洗流體從吐出口吐出期間,亦可使回轉軸51在第一旋轉方向(R1)及第二旋轉方向(R2)交互地回轉,而且清洗接觸構件40。採用該構成時,可以回轉軸51為中心使噴嘴55搖動,而且清洗接觸構件40。藉此,可有效清洗接觸構件40。
In addition, during the cleaning of the
此外,上述實施形態中,第二手臂54係以將第二手臂54中連接於第一手臂53之部分作為起點而不致傾斜的方式構成,不過並非限定於該構成。圖10係用於說明第二手臂54之修改例的模式圖。具體而言,圖10係模式地圖示將在升降位置之第二手臂54從第一手臂53之軸線XL2的方向辨識之情形。例如,第二手臂54亦可將第二手臂54中之連接於第一手臂53的部分(亦即,與第一手臂53連
接於回轉軸51之側相反側的端部)作為起點而可傾斜地連接於第一手臂53之端部。採用該構成時,使第二手臂54傾斜,可輕易調整清洗流體從噴嘴55之吐出口的吐出方向。
In addition, in the above-mentioned embodiment, the
具體而言,第二手臂54亦可將第二手臂54中連接於第一手臂53之部分作為起點,可對上下方向以指定角度(θ2)程度而傾斜地連接於第一手臂53的端部。該指定角度(θ2)例如可使用比0度(°)大,比20度(°)小之角度。
Specifically, the
更具體而言,圖10例示之第二手臂54在從第一手臂53之軸線XL2方向辨識時,係以在第二手臂54之長度方向延伸的軸線XL3將第二手臂54中之連接於第一手臂53的部分作為起點,在一方側及/或另一方側可對上下方向(對地面垂直之方向)以指定角度(θ2)程度傾斜之方式連接於第一手臂53的端部。
More specifically, when the
另外,第二手臂54從與第一手臂53之軸線XL2垂直的方向且水平方向(一例為圖6及圖10中之Y方向)辨識時,係以在第二手臂54之長度方向延伸的軸線XL3將第二手臂54中連接於第一手臂53之部分作為起點,可對上下方向以指定角度(θ2)程度傾斜之方式連接於第一手臂53的端部。
In addition, when the
以上,係就本發明之實施形態加以詳述,不過本發明並非限定於該實施形態者,在申請專利範圍中記載之本發明的要旨範圍內可進一步作各種修改、變更。 Above, the embodiments of the present invention have been described in detail, but the present invention is not limited to the embodiments, and various modifications and changes can be made within the scope of the present invention described in the claims.
20:基板固持器 20: Substrate holder
22:第二保持構件 22: Second holding member
25:外側區域 25: Outer area
26:內側區域 26: Inner area
40:接觸構件 40: Contact member
50:清洗裝置 50: cleaning device
51:回轉軸 51:Rotary axis
52:致動器 52: Actuator
53:第一手臂 53: First Arm
54:第二手臂 54: Second Arm
55:噴嘴 55: Nozzle
56a,56b,56c:槽 56a, 56b, 56c: Slots
57a,57b,57c:泵浦 57a, 57b, 57c: pump
58a,58b,58c:配管 58a, 58b, 58c: Piping
59a,59b:吐出口 59a, 59b: outlet
60:吸引口 60: suction port
61a,61b,61c:內部流路 61a, 61b, 61c: internal flow path
La,Lb:清洗流體 La, Lb: cleaning fluid
Claims (9)
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| CN104272438A (en) * | 2012-03-28 | 2015-01-07 | 诺发系统公司 | Methods and apparatuses for cleaning electroplating substrate holders |
| CN104272438B (en) | 2012-03-28 | 2018-01-12 | 诺发系统公司 | Method and apparatus for cleaning plated substrate retainer |
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