TWI772535B - Grinding method and grinding device of workpiece - Google Patents
Grinding method and grinding device of workpiece Download PDFInfo
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- TWI772535B TWI772535B TW107136178A TW107136178A TWI772535B TW I772535 B TWI772535 B TW I772535B TW 107136178 A TW107136178 A TW 107136178A TW 107136178 A TW107136178 A TW 107136178A TW I772535 B TWI772535 B TW I772535B
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- 238000000034 method Methods 0.000 title claims abstract description 13
- 238000005259 measurement Methods 0.000 claims abstract description 74
- 239000004575 stone Substances 0.000 claims abstract description 26
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 11
- 239000002313 adhesive film Substances 0.000 claims description 4
- 230000001681 protective effect Effects 0.000 abstract description 2
- 238000004140 cleaning Methods 0.000 description 11
- 239000006061 abrasive grain Substances 0.000 description 5
- 238000003825 pressing Methods 0.000 description 5
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- 229920005989 resin Polymers 0.000 description 4
- 235000012431 wafers Nutrition 0.000 description 4
- 239000000463 material Substances 0.000 description 3
- 229910052710 silicon Inorganic materials 0.000 description 3
- 239000010703 silicon Substances 0.000 description 3
- 230000007547 defect Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
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- 239000010410 layer Substances 0.000 description 2
- 238000003754 machining Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 description 1
- 229910002601 GaN Inorganic materials 0.000 description 1
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 1
- JMASRVWKEDWRBT-UHFFFAOYSA-N Gallium nitride Chemical compound [Ga]#N JMASRVWKEDWRBT-UHFFFAOYSA-N 0.000 description 1
- 239000012790 adhesive layer Substances 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 229910003460 diamond Inorganic materials 0.000 description 1
- 239000010432 diamond Substances 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 239000000284 extract Substances 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
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- 229910052594 sapphire Inorganic materials 0.000 description 1
- 239000010980 sapphire Substances 0.000 description 1
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 1
- 229910010271 silicon carbide Inorganic materials 0.000 description 1
- 238000001179 sorption measurement Methods 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
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- Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)
- Grinding Of Cylindrical And Plane Surfaces (AREA)
Abstract
[課題] 在研削裝置中,防止以研削磨石錯誤研削黏貼於工件的正面側的正面保護構件。[解決手段]一種研削方法,其具備:以保護構件覆蓋工件的正面的步驟;以卡盤台30的保持面保持工件的步驟;使厚度測量器382接觸和工件的被保持面為相反側的面以測量厚度,從測量到的第1厚度資料與從測量到第1厚度資料的時間點至經過任意時間後所測量到的第2厚度資料,計算出變化量的厚度測量步驟;以及研削工件的背面的步驟;在厚度測量步驟中,計算出的變化量是預先登錄的閾值以下的話,判斷厚度測量器382所接觸的工件的面為工件的背面,且開始研削,計算出的變化量為超越預先登錄的閾值的話,判斷該厚度測量器382所接觸的工件的面為正面保護構件,且不開始研削。[Problem] In a grinding apparatus, the front protection member attached to the front side of the workpiece is prevented from being erroneously ground with a grinding stone. [Solution] A grinding method comprising: a step of covering the front surface of a workpiece with a protective member; a step of holding the workpiece with a holding surface of the chuck table 30; In order to measure the thickness, the thickness measurement step of calculating the change amount from the first thickness data measured and the second thickness data measured from the time when the first thickness data was measured to the second thickness data measured after an arbitrary time; and grinding the workpiece In the thickness measurement step, if the calculated change amount is below the pre-registered threshold value, it is judged that the surface of the workpiece contacted by the thickness measuring device 382 is the back surface of the workpiece, and grinding starts, and the calculated change amount is When the threshold value registered in advance is exceeded, it is determined that the surface of the workpiece with which the thickness measuring device 382 comes into contact is a front protection member, and grinding is not started.
Description
本發明為一種關於研削半導體晶圓等的板狀的工件的研削方法及研削該工件的研削裝置。The present invention relates to a grinding method for grinding a plate-shaped workpiece such as a semiconductor wafer, and a grinding apparatus for grinding the workpiece.
在正面形成多個IC或LSI等元件的工件,其背面被研削以薄化至預定厚度,進而藉由切割裝置等的分割裝置分割為一個個的元件晶片並利用於各種電子設備。A workpiece in which a plurality of components such as ICs and LSIs are formed on the front surface is ground to be thinned to a predetermined thickness on the back surface, and then divided into individual component wafers by a dividing device such as a dicing device, which are used in various electronic devices.
研削工件的背面的研削裝置(例如,參閱專利文獻1),其具備:卡盤台,保持正面保護構件所黏貼的工件的正面側;以及研削手段,可旋轉地支撐對保持於卡盤台的工件背面進行研削的研削磨石,並可更有效率的研削工件。 [習知技術文獻] [專利文獻]A grinding device for grinding the back surface of a workpiece (see, for example, Patent Document 1) includes: a chuck table that holds the front side of the workpiece to which the front protection member is attached; A grinding stone that grinds the back of the workpiece and grinds the workpiece more efficiently. [Prior Art Documents] [Patent Documents]
[專利文獻1] 日本特許5025200號公報[Patent Document 1] Japanese Patent No. 5025200
[發明所欲解決的課題] 然而,如上述的研削裝置中,以卡盤台保持工件時,有誤將並未覆蓋正面保護構件的工件的背面側以卡盤台的保持面吸附之事。工件的背面側以卡盤台的保持面吸附之情況,會變成以研削磨石研削工件的正面側的正面保護構件,因加工不良而使研削磨石旋轉的馬達的電流值會超越容許值,可能發生研削裝置的全自動動作停止的事態。如此情況,必須要修整(打磨)研削磨石以回到正常狀態,導致研削裝置的停機時間的增加。[Problem to be Solved by the Invention] However, in the above grinding apparatus, when the workpiece is held by the chuck table, the back side of the workpiece not covered with the front protection member is erroneously attracted to the holding surface of the chuck table. When the rear side of the workpiece is attracted by the holding surface of the chuck table, the front side protection member of the front side of the workpiece is ground by the grinding stone, and the current value of the motor that rotates the grinding stone due to poor machining exceeds the allowable value. The automatic operation of the grinding device may stop. In this case, it is necessary to dress (grind) the grinding stone to return to a normal state, resulting in increased downtime of the grinding device.
因此,在研削裝置中,有所謂防止以研削磨石錯誤研削黏貼於工件的正面側的正面保護構件的課題。Therefore, in the grinding apparatus, there is a problem of preventing erroneous grinding of the front protection member adhered to the front side of the workpiece with the grinding stone.
[解決課題的技術手段] 為解決上述課題,本發明為一種工件的研削方法,以研削磨石研削工件的背面,該工件具有在形成格子狀的多條分割預定線所劃分的區域中形成元件的正面,該工件的研削方法具備:正面保護步驟,以正面保護構件覆蓋工件的正面;保持步驟,實施了該正面保護步驟後,以卡盤台的保持面保持該工件,該卡盤台可繞著以軸方向為鉛直方向的旋轉軸旋轉;厚度測量步驟,實施了該保持步驟後,使厚度測量器接觸該工件的和卡盤台所保持的面為相反側的面,並測量工件的厚度,從測量到的第1厚度資料,與測量到該第1厚度資料的時間點至經過任意時間後所測量到的第2厚度資料,計算出其變化量;以及研削步驟,實施了該厚度測量步驟後,利用與該保持面正交的旋轉軸所旋轉的研削磨石,一邊供給研削水一邊研削工件的背面;在該厚度測量步驟中,計算出的該變化量是預先登錄的閾值以下的話,判斷該厚度測量器所接觸的工件的該面為難以發生該厚度測量器的沉入的工件背面,並開始進行研削步驟,計算出的該變化量為超越該預先登錄的閾值的話,判斷該厚度測量器所接觸的工件的該面為容易發生該厚度測量器的沉入的該正面保護構件,並且不開始進行該研削步驟。[Technical Means for Solving the Problem] In order to solve the above-mentioned problems, the present invention provides a method for grinding a workpiece having elements formed in regions divided by a plurality of planned dividing lines formed in a lattice shape, using a grinding stone to grind the back surface of a workpiece. The front side of the workpiece, the grinding method of the workpiece includes: a front side protection step, covering the front side of the workpiece with a front side protection member; a holding step, after the front side protection step is implemented, the workpiece is held by the holding surface of the chuck table, the chuck table can be Rotate around the axis of rotation with the axis direction as the vertical direction; in the thickness measurement step, after the holding step is carried out, the thickness measuring device is brought into contact with the surface on the opposite side of the workpiece and the surface held by the chuck table, and the thickness of the workpiece is measured. , calculate the amount of change from the measured first thickness data, and the time when the first thickness data was measured to the second thickness data measured after an arbitrary period of time; and the grinding step, implemented the thickness measurement After the step, the back surface of the workpiece is ground while supplying grinding water with a grinding stone rotated by a rotating shaft orthogonal to the holding surface; in the thickness measurement step, the calculated change amount is below a pre-registered threshold value. , judging that the surface of the workpiece contacted by the thickness measuring device is the back surface of the workpiece where the sinking of the thickness measuring device is difficult to occur, and starts the grinding step, and if the calculated change exceeds the pre-registered threshold, it is judged that the The face of the workpiece with which the thickness gauge is in contact is the front protection member where sinking of the thickness gauge is likely to occur, and the grinding step is not started.
前述正面保護構件,舉例可為黏著膠膜。The aforementioned front protection member can be, for example, an adhesive film.
另外,為解決上述的課題,本發明為一種研削裝置,具備保持工件的卡盤台、測量保持在該卡盤台的工件的厚度的厚度測量手段、以及研削保持在該卡盤台的工件的研削手段,該研削裝置的特徵在於:該卡盤台可繞著以鉛直方向為軸方向的旋轉軸旋轉,且藉由保持面保持黏貼正面保護構件的工件,該厚度測量手段在工件的研削開始前使厚度測量器接觸工件的和該卡盤台所保持的面為相反側的面,並實施厚度測量,該研削手段利用與該卡盤台的保持面正交的旋轉軸所旋轉的研削磨石,一邊供給研削水一邊研削工件的背面;該研削裝置具備:計算手段,從藉由該厚度測量手段測量到的第1厚度資料,與測量到該第1厚度資料的時間點至經過任意時間後所測量到的第2厚度資料,計算出其變化量;以及控制手段,在該計算手段所計算出的該變化量為預先登錄的閾值以下的話,則使研削開始進行,在該變化量為超越該預先登錄的閾值的情況,則表示錯誤而不使研削開始進行。In addition, in order to solve the above-mentioned problems, the present invention provides a grinding apparatus including a chuck table holding a workpiece, a thickness measuring means for measuring the thickness of the workpiece held on the chuck table, and a grinding device for grinding the workpiece held on the chuck table. Grinding means, the grinding device is characterized in that: the chuck table is rotatable around a rotation axis with the vertical direction as the axis direction, and the workpiece to which the front protection member is adhered is held by the holding surface, and the thickness measuring means starts grinding of the workpiece. Before the thickness measurement device is brought into contact with the surface of the workpiece on the opposite side to the surface held by the chuck table, and thickness measurement is performed, the grinding means utilizes a grinding stone rotated by a rotation axis orthogonal to the holding surface of the chuck table. , grinding the back side of the workpiece while supplying grinding water; the grinding device is provided with: calculation means from the first thickness data measured by the thickness measuring means, and the time point when the first thickness data is measured to after an arbitrary time has elapsed Calculate the amount of change of the measured second thickness data; and control means to start grinding if the amount of change calculated by the calculation means is below a pre-registered threshold value, and when the amount of change exceeds the threshold In the case of this pre-registered threshold value, it indicates an error and does not start grinding.
前述厚度測量手段較佳為,用於研削開始前的工件的厚度測量的同時,亦用於研削開始後的工件的厚度控制。The aforementioned thickness measurement means is preferably used for thickness measurement of the workpiece before the start of grinding and also for thickness control of the workpiece after the start of grinding.
[發明功效] 藉由厚度測量手段量測工件的厚度時,在測量面為具備柔軟性的正面保護構件的情況,藉由厚度測量手段所具備的厚度測量器的對正面保護構件的沉入,工件厚度的變化量變大。另一方面,測量面為工件的被研削面的硬背面的情況,因幾乎沒有厚度測量手段所具備的厚度測量器的對該背面的沉入,工件厚度的變化量變小。因此,本發明的研削方法具備:正面保護步驟,以正面保護構件覆蓋工件的正面;保持步驟,實施了正面保護步驟後,以卡盤台的保持面保持該工件,該卡盤台可繞著以軸方向為鉛直方向的旋轉軸旋轉;厚度測量步驟,實施了保持步驟後,使厚度測量器接觸工件的和卡盤台所保持的面為相反側的面,並測量工件的厚度,從測量到的第1厚度資料與測量到第1厚度資料的時間點至經過任意時間後所測量到的第2厚度資料,計算出其變化量;以及研削步驟,實施了厚度測量步驟後,利用與保持面正交的旋轉軸所旋轉的研削磨石,一邊供給研削水一邊研削工件的背面;在厚度測量步驟中,計算出的變化量是預先登錄的閾值以下的話,判斷厚度測量器所接觸的工件的面為難以發生厚度測量器的沉入的工件背面,並開始進行研削步驟,計算出的變化量為超越預先登錄的閾值的話,判斷厚度測量器所接觸的工件的面為容易發生厚度測量器的沉入的正面保護構件,並且不開始進行研削步驟,藉此,當工件在卡盤台以錯誤的狀態吸引保持的情況,亦即,當工件的被研削面的背面不小心被卡盤台吸附到的情況下,也不會保持現狀實施研削步驟而研削正面保護構件使研削不良發生。[Effect of the Invention] When the thickness of the workpiece is measured by the thickness measurement means, when the measurement surface is a front protection member with flexibility, the subsidence of the thickness measurement device provided in the thickness measurement means to the front protection member, The variation in workpiece thickness becomes larger. On the other hand, when the measurement surface is the hard back surface of the ground surface of the workpiece, the amount of variation in the thickness of the workpiece is small because there is hardly any subsidence of the thickness measuring device provided in the thickness measuring means to the back surface. Therefore, the grinding method of the present invention includes: a front protection step of covering the front surface of the workpiece with a front protection member; and a holding step of holding the workpiece with the holding surface of the chuck table after the front protection step is performed, and the chuck table can be wound around Rotate the rotation shaft with the axis direction as the vertical direction; in the thickness measurement step, after the holding step is implemented, the thickness measuring device is placed in contact with the workpiece and the surface on the opposite side of the chuck table is held, and the thickness of the workpiece is measured, from measurement to The first thickness data and the second thickness data measured after an arbitrary time have elapsed from the time when the first thickness data is measured, and the amount of change is calculated; and in the grinding step, after the thickness measurement step is performed, use and hold the surface The grinding stone rotated by the orthogonal rotation axis grinds the back surface of the workpiece while supplying grinding water; in the thickness measurement step, if the calculated change amount is less than or equal to the pre-registered threshold value, the thickness of the workpiece in contact with the thickness measuring device is judged. If the surface is the back surface of the workpiece where the thickness gauge is difficult to sink in, the grinding step is started, and if the calculated change exceeds the pre-registered threshold, it is judged that the surface of the workpiece that the thickness gauge is in contact with is prone to the thickness gauge. The front surface protection member sinks in, and the grinding step is not started, whereby when the workpiece is attracted and held in the wrong state on the chuck table, that is, when the back side of the ground surface of the workpiece is accidentally sucked by the chuck table Even in this case, the grinding step is not carried out as it is, and the front protection member is ground without causing grinding defects.
本發明的研削裝置具備:計算手段,從藉由厚度測量手段測量到的第1厚度資料與從測量到該第1厚度資料的時間點至經過任意的時間後所測量到的第2厚度資料,計算出其變化量;以及控制手段,在計算手段所計算出的變化量為預先登錄的閾值以下的話,則使研削開始進行,在變化量為超越預先登錄的閾值的情況,則表示錯誤而不使研削開始進行;藉此,當工件在卡盤台以錯誤的狀態吸引保持的情況,亦即,當工件的被研削面的背面不小心被卡盤台吸附到的情況下,也不會保持現狀以研削手段研削正面保護構件而使研削不良發生。The grinding device of the present invention is provided with: calculation means from the first thickness data measured by the thickness measurement means and the second thickness data measured after an arbitrary time has elapsed from the time when the first thickness data was measured, Calculate the amount of change; and control means, if the amount of change calculated by the calculation means is below the pre-registered threshold value, start grinding, and if the amount of change exceeds the pre-registered threshold value, it will indicate an error and not. Grinding is started; thereby, when the workpiece is attracted and held on the chuck table in a wrong state, that is, when the back side of the workpiece to be ground is accidentally sucked by the chuck table, it will not be held. In the current situation, the front protection member is ground by a grinding method, and grinding failure occurs.
研削裝置的厚度測量手段為,用於研削開始前的工件的厚度測量的同時,亦用於研削開始後的工件的厚度控制,藉此可試圖達成研削裝置的小型化,並防止研削裝置的製造成本的增加。The thickness measurement means of the grinding device is used to measure the thickness of the workpiece before the start of grinding, and also to control the thickness of the workpiece after the start of grinding, which can try to achieve the miniaturization of the grinding device and prevent the production of the grinding device. increase in cost.
如圖1所示的本發明的研削裝置3為,是對藉由卡盤台30吸引保持的工件W施以研削加工的裝置。 如圖1所示的工件W為,例如,以矽為母材的外型為圓形板狀的半導體晶圓,在圖1中面向下側的正面Wa上,形成垂直交差的多條的分割預定線S,在藉由分割預定線S劃分成格子狀的各區域上分別形成IC等的元件D。工件W的正面Wa與相反側的背面Wb為施以研削加工的被研削面。再者,工件W可由矽以外的砷化鎵、藍寶石、氮化鎵或碳化矽等構成,其外型可非圓形狀,舉例而言亦可形成為矩形狀。The
研削裝置3的基底3A上的前方(-Y方向側)為,藉由可搬送工件W的機器臂330對卡盤台30進行工件W的裝卸的區域,基底3A上的後方(+Y方向側)為,藉由對工件W施以粗研削的粗研削手段31或對工件W施以精研削的精研削手段32對保持在卡盤台30上的工件W進行研削的區域。The front (-Y direction side) on the
在基底3A上的前方側,配設有容納研削前的工件W的第一卡匣331及容納研削完的工件W的第二卡匣332。第一卡匣331及第二卡匣332的附近,配設具有從第一卡匣331搬出研削前的工件W並且將研削完的工件W搬入第二卡匣332的功能之機器臂330。On the front side of the
在機器臂330的可動域,配設有將加工前的工件W對位到預定位置的對準手段333及清洗研削完的工件W的清洗手段334。清洗手段334為,例如,枚葉式(single wafer processing)清洗機清洗裝置,具備吸引保持研削完的工件W之清洗台。In the movable range of the
在對準手段333的附近配設第一搬送手段335,清洗手段334的附近配設第二搬送手段336。第一搬送手段335具有將對準手段333所載置的研削前的工件W搬送至如圖1所示的任一卡盤台30之功能,第二搬送手段336具有將任一卡盤台30保持的研削完工件W搬送至清洗手段334之功能。The first conveyance means 335 is arranged in the vicinity of the alignment means 333 , and the second conveyance means 336 is arranged in the vicinity of the cleaning means 334 . The first conveyance means 335 has a function of conveying the workpiece W before grinding placed on the alignment means 333 to any one of the chuck tables 30 as shown in FIG. A function of conveying the retained ground workpiece W to the cleaning means 334 .
在基底3A上的第一搬送手段335的後方側(+Y方向側)配設有旋轉台34,在旋轉台34的上表面於圓周方向上等間隔空開配設有例如3個的卡盤台30。在旋轉台34的中心,配設有用來使旋轉台34自轉的未圖示旋轉軸,以旋轉軸為中心可使旋轉台34在基底3A上自轉。並且,藉由旋轉台34的旋轉,任一卡盤台30為定位於第一搬送手段335及第二搬送手段336的附近的構成。A
卡盤台30藉由旋轉台34可公轉地支撐。另外,在卡盤台30的底面側連接著軸方向為鉛直方向(Z軸方向)的旋轉軸30b,該旋轉軸30b藉由從馬達等所組成的未圖示旋轉手段旋轉,藉此卡盤台30在旋轉台34上可繞鉛直方向的旋轉軸周圍旋轉。卡盤台30,舉例而言,其外形為圓形,具備吸附保持由多孔構件等構成的工件W的吸附部300,及支撐吸附部300的框體301。吸附部300連通未圖示的吸引源,吸引源所吸引所產生之吸引力藉由傳遞至吸附部300的露出面的保持面300a,卡盤台30在保持面300a上吸引保持工件W。The chuck table 30 is rotatably supported by the rotary table 34 . In addition, a rotating
在基底3A上的後方側並排立設柱3B及柱3C,在柱3B的-Y方向側的側面配設有第一研削進給手段35,第一研削進給手段35使粗研削手段31藉由卡盤台30對保持的工件W研削進給,在柱3C的-Y方向側的側面配設有第二研削進給手段36,第二研削進給手段36使精研削手段32藉由卡盤台30對保持的工件W研削進給。A
第一研削進給手段35由以下構成:滾珠螺桿350,具有鉛直方向的軸心;一對導軌351,和滾珠螺桿350平行配設;馬達352,和滾珠螺桿350連結且使滾珠螺桿350旋動;以及昇降部353,其內部的螺帽和滾珠螺桿350螺合且側部與導軌351滑動接觸,且第一研削進給手段35成為以下構成:當馬達352使滾珠螺桿350旋轉並伴隨昇降部353被導軌351引導而昇降。昇降部353支撐粗研削手段31,藉由昇降部353的昇降而粗研削手段31亦昇降。The first grinding and
第二研削進給手段36由以下構成:滾珠螺桿360,具有鉛直方向的軸心;一對導軌361,和滾珠螺桿360平行配設;馬達362,和滾珠螺桿360連結且使滾珠螺桿360旋動;以及昇降部363,其內部的螺帽和滾珠螺桿360螺合且側部與導軌361滑動接觸,且第二研削進給手段36成為以下構成:當馬達362使滾珠螺桿360旋轉並伴隨昇降部363被導軌361引導而昇降。昇降部363支撐精研削手段32,藉由昇降部363的昇降而精研削手段32亦昇降。The second grinding and
粗研削手段31具備:旋轉軸310,其軸方向為在卡盤台30的保持面300a正交的鉛直方向(Z軸方向);外殼311,可旋轉地支撐旋轉軸310,馬達312,旋轉驅動旋轉軸310;安裝件314,安裝在旋轉軸310的下端;研削輪313,可裝卸地連接在安裝件314。在研削輪313的底面,環狀地配設有大致直方體形狀的多個粗研削磨石313a。粗研削磨石313a為,例如,藉由陶瓷結合劑等固著金剛石磨粒等而成形。再者,粗研削磨石313a的形狀可為環狀地一體形成。粗研削磨石313a為,例如,用於粗研削的磨石,磨石中含有磨粒較大的磨石。The rough grinding means 31 includes a rotating
例如,在旋轉部310的內部,連通研削水供給源且成為研削水的通道的未圖示的流路徑,為貫通旋轉軸310的軸方向(Z軸方向)所形成,且流路徑在研削輪313的底面開口以朝向粗研削磨石313a噴出研削水。For example, inside the
精研削手段32可對經粗研削薄化至完工厚度的程度的工件W進行高平坦性的精研削。亦即,精研削手段32藉由具備精研削磨石323a且可旋轉地裝設的研削輪313,更進一步研削粗研削手段31所研削的工件W的背面Wb。精研削磨石323a中所包含的磨粒為,比粗研削手段31的粗研削磨石313a所包含的磨粒的粒徑更小之磨粒。精研削手段32的精研削磨石323a以外的構成,與粗研削手段31的構成相同。The fine grinding means 32 can perform fine grinding with high flatness on the workpiece W that has been thinned to a finished thickness by rough grinding. That is, the fine grinding means 32 further grinds the back surface Wb of the workpiece W ground by the rough grinding means 31 by the
在分別與下降至研削位置的狀態的粗研削手段31及精研削手段32相鄰的位置上,例如,分別配設接觸式測量工件W厚度的第1厚度測量手段38A及第2厚度測量手段38B。第1厚度測量手段38A及第2厚度測量手段38B因具備相同構造,以下僅對第1厚度測量手段38A進行說明。第1厚度測量手段38A具備,例如一對的厚度測量器(高度計),亦即,用於測量卡盤台30的保持面300a的高度位置的第1高度測量器381與用於測量以工件W的和卡盤台30所保持的面為相反側的面(被研削面)的高度位置的第2高度測量器382。At positions adjacent to the rough grinding means 31 and the fine grinding means 32 in the state of being lowered to the grinding position, for example, a first thickness measuring means 38A and a second thickness measuring means 38B, which measure the thickness of the workpiece W by a contact type, are respectively disposed. . Since the first thickness measurement means 38A and the second thickness measurement means 38B have the same structure, only the first thickness measurement means 38A will be described below. The first thickness measuring means 38A includes, for example, a pair of thickness measuring devices (altimeters), that is, a first
第1厚度測量器381及第2厚度測量器382在其各前端具備於上下方向昇降並接觸各測量面的接觸器,該接觸器形成為例如面向下方逐漸縮徑的銳頭狀。第1厚度測量器381(第2厚度測量器382)的根元側藉由第1支撐部383(第2支撐部384)所支撐。第1支撐部383(第2支撐部384)可上下移動地支撐第1厚度測量器381(第2厚度測量器382),並藉由例如藉由在內部內置的彈簧所生的按壓力,能夠將第1厚度測量器381(第2厚度測量器382)對各測量面按壓適當的力。 第1厚度測量手段38A藉由第1厚度測量器381,檢測成為基準面的框體301的上表面的高度位置,並藉由第2厚度測量器382檢測被研削工件W的被研削面,亦即工件W的和卡盤台30所保持的面為相反側的面的高度位置,並藉計算出兩者的檢測值的相差值,可在研削前或研削後隨時測量工件W的厚度。The first
研削裝置3為例如具備進行裝置整體的控制的控制手段9。控制手段9包含隨著控制程式演算處理的CPU、儲存控制程式等的ROM、以及儲存演算結果或其他資訊等的RAM等,藉由未圖示的配線,連接使第一研削進給手段35或卡盤台30旋轉的未圖示旋轉手段等。並且,在控制手段9的控制下,未圖示的旋轉手段使卡盤台30進行的旋轉動作、或使第一研削進給手段35進行的粗研削手段31的在Z軸方向的研削進給動作等的研削裝置3的各構成的動作被控制。The grinding
以下說明使用本發明的研削裝置3研削如圖1所示工件W的情況之各步驟。Hereinafter, each procedure in the case of grinding the workpiece W shown in FIG. 1 using the grinding
(1)正面保護步驟 首先,在工件W的正面Wa,例如黏貼與工件W大致同徑的圓形的正面保護構件T,正面Wa成為以正面保護構件T覆蓋保護的狀態。正面保護構件T例如是具備基材層與黏著層的黏著膠膜,基材層則由具有一定程度柔軟性的樹脂等所組成,但不限定於此,亦可在正面Wa塗佈液體的樹脂後,對該樹脂加熱或照射紫外線等使該樹脂硬化,形成具備一定程度柔軟性並覆蓋工件W的正面Wa的保護構件。(1) Front Protection Step First, a circular front protection member T having substantially the same diameter as the workpiece W is adhered to the front surface Wa of the workpiece W, and the front surface Wa is covered and protected by the front protection member T. The front protection member T is, for example, an adhesive film having a base material layer and an adhesive layer, and the base material layer is composed of a resin having a certain degree of flexibility, but it is not limited to this, and a liquid resin may also be coated on the front side Wa. Then, the resin is cured by heating or irradiating ultraviolet rays, etc., to form a protective member which has a certain degree of flexibility and covers the front surface Wa of the workpiece W. As shown in FIG.
(2)保持步驟 如圖1所示的旋轉台34從+Z軸方向看去以順時針方向自轉,且卡盤台30移動至第一搬送手段335的附近。機器臂330從第一卡匣331抽出黏貼正面保護構件T的一枚工件W,並使工件W移動至對準手段333 。在對準手段333中工件W定位於預定的位置後,第一搬送手段335搬送對準手段333上的工件W至卡盤台30的保持面300a上。並且,未圖示的吸引源所產生之吸引力被傳遞至保持面300a,藉此卡盤台30吸引保持工件W。 在此,工件W正確地被搬送到卡盤台30並吸引保持的話,工件W的卡盤台30所保持的面為以正面保護構件T覆蓋的正面Wa,和卡盤台30所保持的面為相反側的背面Wb為向上方露出的狀態。 另一方面,亦可能會發生工件W在錯誤的狀態被搬送到卡盤台30並吸引保持的情況。亦即,可能發生工件W的卡盤台30所保持的面為背面Wb,和卡盤台30所保持的面成為相反側的面的正面保護構件T所覆蓋的正面Wa為面向上方的狀態。(2) Holding Step The
(3)厚度測量步驟 如上述的工件W在被卡盤台30以錯誤的狀態吸引保持的情況中,為防止保持現狀開始研削而發生研削不良之事,本發明的研削裝置1實施下述說明的厚度測量步驟。 如圖1所示,從+Z軸方向看去旋轉台34以順時針方向旋轉,藉此移動保持工件W的卡盤台30至第1厚度測量手段38A的下方。並且,舉例而言,卡盤台30以預定的旋轉速度繞旋轉軸30b旋轉,藉由第1厚度測量手段38A開始測量工件W的厚度。再者,在卡盤台30並未旋轉的狀態下亦可開始測量工件W的厚度。(3) Thickness Measurement Step In the case where the workpiece W is sucked and held by the chuck table 30 in an incorrect state as described above, in order to prevent the occurrence of poor grinding caused by starting grinding while maintaining the status quo, the grinding device 1 of the present invention implements the following description. thickness measurement steps. As shown in FIG. 1 , the
圖3表示工件W在正確的狀態下藉由卡盤台30吸引保持的情況。因此,第1厚度測量器381以預定的按壓力被按壓在成為旋轉的卡盤台30的基準面的框體301的上表面上,另外,第2厚度測量器382以預定的按壓力被按壓在工件W的和卡盤台30所保持的面的正面Wa為相反側的面的背面Wb上。 另一方面,在圖4中表示工件W在錯誤的狀態下藉由卡盤台30吸引保持的情況。因此,第1厚度測量器381以預定的按壓力被按壓在成為旋轉的卡盤台30的基準面的框體301的上表面上,另外,第2厚度測量器382以預定的按壓力被按壓在工件W的與卡盤台30所保持的面的背面Wb與相反側的面的正面Wa所黏貼的正面保護構件T上。FIG. 3 shows a state in which the workpiece W is sucked and held by the chuck table 30 in a correct state. Therefore, the
如圖3所示的情況,藉由第1厚度測量器381測量框體301的上表面的高度位置,藉由第2厚度測量器382測量工件W的背面Wb的高度位置,計算出兩者測量值的差值作為工件W的厚度。並且,將計算出的工件W的厚度的資訊,例如傳送至控制手段9並記憶在RAM中。 如圖5所示曲線G1係表示,藉由如圖3所示的第1厚度測量手段38A對工件W的厚度測量開始進行時至經過任意的時間t1的時間點為止的工件W的厚度變化圖的一例。在圖5中縱軸表示工件W的厚度,橫軸表示經過時間。In the case shown in FIG. 3, the height position of the upper surface of the
另一方面,如圖4所示的情況,藉由第1厚度測量器381測量框體301的上表面的高度位置,藉由第2厚度測量器382測量工件W的正面Wa所黏貼的正面保護構件T的高度位置,計算出兩者測量值的差值作為工件W的厚度。並且,將計算出的工件W的厚度的資訊,例如傳送至控制手段9並記憶在RAM中。 如圖5所示曲線G2係表示,藉由如圖4所示的第1厚度測量手段38A工件W的厚度測量開始時至經過任意的時間t1的時間點為止的工件W的厚度變化圖的一例。On the other hand, as shown in FIG. 4 , the height position of the upper surface of the
因工件W的背面Wb為具備一定程度的硬度的矽,在圖3中藉由第1厚度測量手段38A測量工件W的厚度時,第2厚度測量器382對工件W的背面Wb的沉入為少量。此種結果,第1厚度測量器381的測量值與第2厚度測量器382的測量值的差值所示的工件W的厚度為,如圖5所示如曲線G1幾乎無變化,在測量開始時工件W的厚度M1與工件W的厚度測量開始時至經過任意的時間t1的時間點中工件W的厚度M2幾乎無產生差值。 另一方面,因正面保護構件T為具備一定程度柔軟性的樹脂等所組成的黏著膠膜,在圖4中藉由第1厚度測量手段38A測量工件W的厚度時,第2厚度測量器382對正面保護構件T的沉入為大量。此種結果,第1厚度測量器381的測量值與第2厚度測量器382的測量值2的差值所示的工件W的厚度為,如圖5所示的曲線G2般與曲線G1相比有大的變化,如曲線G2所示測量開始時工件W的厚度M1與工件W的厚度測量開始時至經過任意的時間t1的時間點中工件W的厚度M3產生一定程度的差值。Since the back surface Wb of the workpiece W is silicon having a certain degree of hardness, when the thickness of the workpiece W is measured by the first thickness measuring means 38A in FIG. small amount. As a result of this, the thickness of the workpiece W indicated by the difference between the measurement value of the first
控制手段9為,例如,包含如圖1所示的計算手段90。計算手段從藉由第1厚度測量手段38A測量到的第1厚度資料,與測量到第1厚度資料的時間點至經過任意時間後所測量到的第2厚度資料,計算出其變化量。在本實施方式的圖3所示的情況之厚度測量步驟中,第1厚度資料為,例如,圖5的曲線G1所示的在測量開始時工件W的厚度M1,第2厚度資料為,曲線G1所示的在測量開始時至經過任意的時間t1的時間點的工件W的厚度M2。並且,計算手段90為,例如,計算出工件W的厚度M1與工件W的厚度M2的差值(M1-M2)作為工件W的厚度的變化量(差分量)。 在本實施方式的圖4所示的情況之厚度測量步驟中,第1厚度資料為,例如,曲線G2所示的在測量開始時工件W的厚度M1,第2厚度資料為,曲線G2所示的在測量開始時至經過任意的時間t1的時間點的工件W的厚度M3。並且,計算手段90為,例如,計算出工件W的厚度M1與工件W的厚度M3的差值(M1-M3)作為工件W的厚度的變化量(差分量)。The control means 9 includes, for example, a calculation means 90 as shown in FIG. 1 . The calculation means calculates the amount of change from the first thickness data measured by the first thickness measurement means 38A and the time point when the first thickness data is measured to the second thickness data measured after an arbitrary time has elapsed. In the thickness measurement step of the case shown in FIG. 3 of the present embodiment, the first thickness data is, for example, the thickness M1 of the workpiece W at the start of measurement shown by the curve G1 in FIG. 5 , and the second thickness data is the curve The thickness M2 of the workpiece W at the time point from the start of the measurement to the elapse of an arbitrary time t1 indicated by G1. Then, the calculation means 90 calculates the difference ( M1 - M2 ) between the thickness M1 of the workpiece W and the thickness M2 of the workpiece W as a variation (difference) of the thickness of the workpiece W, for example. In the thickness measurement step in the case shown in FIG. 4 of the present embodiment, the first thickness data is, for example, the thickness M1 of the workpiece W at the start of the measurement shown by the curve G2, and the second thickness data is, as shown by the curve G2 The thickness M3 of the workpiece W at the time point from the start of the measurement to the elapse of an arbitrary time t1. Then, the calculation means 90 calculates, for example, the difference ( M1 - M3 ) between the thickness M1 of the workpiece W and the thickness M3 of the workpiece W as the amount of change in the thickness of the workpiece W (difference).
例如,在控制手段9的ROM中登錄閾值Mc,是用來判斷第2厚度測量器382所接觸的工件W的面是否為難以發生第2厚度測量器382的沉入的工件W的背面Wb,換言之,是用來判斷工件W的和卡盤台30所保持的面為相反側的面是否為被研削面的背面Wb。並且,控制手段9判斷計算手段90所計算出的工件W的厚度的變化量(在本實施方式為差分量)是否超越閾值Mc或為閾值Mc以下。再者,藉由工件W的類型及正面保護構件T的類型,因第2厚度測量器382對工件W的背面Wb或正面保護構件T的沉入量不同,預先登錄的閾值Mc成為對應工件W的背面Wb和正面保護構件T的類型之依據實驗性、經驗性或理論性所選擇的數值。For example, the threshold value Mc is registered in the ROM of the control means 9 to determine whether or not the surface of the workpiece W that the
圖3所示的情況,如圖5的曲線G1所示,因變化量(M1-M2)為比閾值Mc小的數值,控制手段9亦可判斷第2厚度測量器382所接觸的工件W的面為難以發生第2厚度測量器382的沉入的工件W的背面Wb,亦即,判斷為工件W在正確的狀態下藉由卡盤台30吸引保持而可保持現狀開始研削。 圖4所示的情況,如圖5的曲線G2所示,因變化量(M1-M3)為超越閾值Mc的數值,控制手段9判斷第2厚度測量器382所接觸的工件W的面為發生第2厚度測量器382的沉入的正面保持構件T,亦即,判斷工件W在錯誤的狀態下藉由卡盤台30吸引保持而不可以保持現狀開始研削。In the case shown in FIG. 3 , as shown by the curve G1 in FIG. 5 , since the amount of change ( M1 - M2 ) is smaller than the threshold value Mc, the control means 9 can also determine the size of the workpiece W that the second
在控制手段9判斷為不可以開始研削的情況,藉由控制手段9的控制下,停止研削裝置3中往後述研削步驟的轉換,並不開始進行工件W的研削加工。進而,控制手段9從揚聲器發出警報音或在螢幕顯示錯誤等向作業員通知該判斷。例如,藉由被通知該判斷的作業員的手動作業,調整工件W為在卡盤台30的保持面300a上背面Wb向上方露出的狀態,或從卡盤台30上去除工件W。When the control means 9 judges that the grinding cannot be started, under the control of the control means 9, the transition to the grinding step described later in the grinding
厚度測量步驟並不限定於上述實施方式,例如,亦可如以下說明般來實施(以下為厚度測量步驟的其他實施方式)。在厚度測量步驟的其他實施方式中,如圖3所示的情況計算手段90所計算出的變化量為,在測量時間內的任意的時間點t2中曲線G1的切線L1的傾斜度(微分量)。亦即,計算手段90為,計算出藉由厚度測量開始後的第1厚度測量手段38A測量到的第1厚度資料,與測量到第1厚度的時間點至經過任意時間後(僅經過短時間後)所測量到的第2厚度資料的差值,並進一步將計算出的差值藉由微分計算變化量(切線L1的傾斜度)。再者,變化量非切線L1的傾斜度時,亦可為厚度測量時間內的任意的2個時間點(例如,測量開始時與經過t1時間時或經過t2時間時與經過t1時間時)中的曲線G1的傾斜度。 相同地,在圖4所示的情況計算手段90所計算的變化量為,在測量時間內的任意的時間點t2中曲線G2的切線L2的傾斜度(微分量)。亦即,計算手段90為,計算出藉由厚度測量開始後的第1厚度測量手段38A測量到的第1厚度資料,與測量到第1厚度的時間點至經過任意時間後(僅經過短時間後)所測量到的第2厚度資料的差值,並進而將計算出的差值藉由微分計算變化量(切線L2的傾斜度)。再者,變化量非切線L2的傾斜度時,亦可為厚度測量時間內的任意的2個時間點(例如,測量開始時與經過t1時間時或經過t2時間時與經過t1時間時)中的曲線G2的傾斜度。The thickness measurement step is not limited to the above-described embodiment, and may be implemented, for example, as described below (the following are other embodiments of the thickness measurement step). In another embodiment of the thickness measurement step, as shown in FIG. 3 , the amount of change calculated by the calculation means 90 is the inclination (differential amount of the tangent line L1 of the curve G1 at an arbitrary time point t2 in the measurement time) ). That is, the calculating means 90 calculates the first thickness data measured by the first thickness measuring means 38A after the start of the thickness measurement, and the time when the first thickness is measured until an arbitrary time has elapsed (only a short time has elapsed). After) the difference value of the measured second thickness data, and further calculate the change amount (inclination of the tangent L1) by differentiating the calculated difference value. Furthermore, when the change amount is not the inclination of the tangent line L1, it may be at any two time points within the thickness measurement time (for example, when the measurement starts and when the time t1 elapses, or when the time t2 elapses and when the time t1 elapses). the slope of the curve G1. Similarly, in the case shown in FIG. 4 , the amount of change calculated by the calculation means 90 is the inclination (differential amount) of the tangent line L2 of the curve G2 at an arbitrary time point t2 within the measurement time. That is, the calculating means 90 calculates the first thickness data measured by the first thickness measuring means 38A after the start of the thickness measurement, and the time when the first thickness is measured until an arbitrary time has elapsed (only a short time has elapsed). After) the difference value of the measured second thickness data, and further calculate the change amount (the inclination of the tangent L2) by differentiating the calculated difference value. Furthermore, when the change amount is not the inclination of the tangent line L2, it may be at any two time points within the thickness measurement time (for example, when the measurement starts and when the time t1 elapses, or when the time t2 elapses and when the time t1 elapses). the slope of the curve G2.
在控制手段9的ROM中登錄閾值,是用來判斷第2厚度測量器382所接觸的工件W的面是否為難以發生第2厚度測量器382的沉入的工件W的背面Wb,換言之,是用來判斷工件W的和卡盤台30所保持的面為相反側的面是否為被研削面的背面Wb。並且,控制手段9判斷計算手段90所計算出的變化量(在其他實施方式為微分量)為超越閾值或閾值以下。The threshold value registered in the ROM of the control means 9 is used to judge whether or not the surface of the workpiece W that the
圖3所示的情況,如圖5的曲線G1的切線L1的傾斜度(變化量)為例如比登錄的閾值小時,控制手段9亦可判斷第2厚度測量器382所接觸的工件W的面為難以發生第2厚度測量器382的沉入的工件W的背面Wb,亦即,判斷工件W在正確的狀態下藉由卡盤台30吸引保持而可開始研削。圖4所示的情況,如圖5的曲線G2的切線L2的傾斜度(變化量)為例如超越登錄的閾值時,控制手段9判斷第2厚度測量器382所接觸的工件W的面為發生第2厚度測量器382的沉入的正面保持構件T,亦即,判斷工件W在錯誤的狀態下藉由卡盤台30吸引保持而不可以開始研削。In the case shown in FIG. 3 , if the inclination (change amount) of the tangent line L1 of the curve G1 in FIG. 5 is smaller than the registered threshold value, for example, the control means 9 may determine the surface of the workpiece W that the second
(4)研削步驟 實施如上述任一的厚度測量步驟,此種結果,在所謂控制手段9做出使工件W的研削開始之判斷的情況下,亦即,如圖3所示,判斷為工件W在正確的狀態下藉由卡盤台30吸引保持的情況,實施本研削步驟。 如圖1所示,從+Z軸方向看去旋轉台34以順時針方向旋轉,藉此移動保持工件W的卡盤台30至粗研削手段31的下方,使研削輪313與工件W對準。對準舉例為如圖6所示,係被執行以將研削輪313的旋轉中心對工件W的旋轉中心在+X方向上偏離預定的距離,並使粗研削磨石313的旋轉軌道通過工件W的旋轉中心。(4) Grinding Step The thickness measurement step as described above is carried out. As a result, when the so-called control means 9 determines that the grinding of the workpiece W is started, that is, as shown in FIG. 3 , it is determined that the workpiece is a workpiece. This grinding step is carried out when the chuck table 30 is sucked and held in a correct state. As shown in FIG. 1 , the rotary table 34 rotates clockwise when viewed from the +Z axis direction, thereby moving the chuck table 30 holding the workpiece W to the lower side of the rough grinding means 31, and aligning the
使旋轉軸310旋轉驅動時伴隨研削輪313旋轉。另外,粗研削手段31藉由圖1所示的第一研削進給手段35往-Z方向運送,以旋轉的研削輪313的粗研削磨石313a抵接工件W的背面Wb進行粗研削加工。另外,因卡盤台30的旋轉亦伴隨在保持面300a上保持的工件W旋轉,使工件W的背面Wb的全表面被研削。另外,研削水透過旋轉軸310內的未圖示流路徑而被供給至粗研削磨石313a與工件W的接觸部位,使接觸部位被冷卻、清洗。另外,在工件W的粗研削中,藉由第1厚度測量手段38A測量工件W的厚度,工件W被控制厚度以成為所期望的厚度(例如完工厚度之前的厚度)。When the
藉由粗研削研削至完工厚度前的工件W,接著研削至完工厚度。如圖1所示的粗研削手段31從工件W分離後,旋轉台34從+Z方向看去以順時針方向旋轉,藉此卡盤台30移動至精研削手段32的下方。並且,當精研削手段32具備的研削輪313與工件W進行對準後,精研削手段32往-Z方向運送,旋轉的精研削磨石323a抵接工件W的背面Wb,另外,卡盤台30的旋轉伴隨在保持面300a上保持的工件旋轉,使工件W的背面Wb的全表面被精研削。另外,研削水被供給至精研削磨石323a與工件W的接觸部位,使接觸部位被冷卻、清洗。另外,在工件W的粗研削中,藉由第2厚度測量手段38B測量工件W的厚度,工件W被控制厚度以成為所期望的厚度(完工厚度)。The workpiece W before the finished thickness is ground by rough grinding, and then ground to the finished thickness. After the rough grinding means 31 shown in FIG. 1 is separated from the workpiece W, the
精研削手段32從工件W分離後,旋轉台34從+Z方向看去以順時針方向自轉,研削至完工厚度的背面Wb的高平坦性的工件W1藉此移動至第二搬送手段336的附近。並且,第二搬送手段336搬送卡盤台30上的工件W至清洗手段334。並且,在清洗手段334中使工件W清洗後,工件W藉由機器臂330容納至第二卡匣332內。After the fine grinding means 32 is separated from the workpiece W, the
如上述本發明的研削方法具備:正面保護步驟,以正面保護構件覆蓋工件的正面;保持步驟,實施了正面保護步驟後,以卡盤台30的保持面300a保持工件W,該卡盤台30可繞著以軸方向為鉛直方向的旋轉軸30b旋轉;厚度測量步驟,實施了保持步驟後,使第2厚度測量器382接觸工件W的和卡盤台30所保持的面為相反側的面,並測量工件W的厚度,從測量到的第1厚度資料,與測量到第1厚度資料的時間點至經過任意時間後所測量到的第2厚度資料,計算出其變化量;以及研削步驟,實施了厚度測量步驟後,利用與保持面300a正交的旋轉軸310所旋轉的粗研削磨石313a,一邊供給研削水一邊研削工件W的背面Wb;在厚度測量步驟中,計算出的變化量是預先登錄的閾值以下的話,判斷第2厚度測量器382所接觸的工件W的面為難以發生第2厚度測量器382的沉入的工件W的背面Wb,並開始進行研削步驟,計算出的變化量為超越預先登錄的閾值的話,判斷第2厚度測量器382所接觸的工件W的面為容易發生第2厚度測量器382的沉入的正面保護構件T則,並且不開始進行研削步驟,藉此,當工件W在卡盤台30以錯誤的狀態吸引保持的情況,亦即,當工件W的被研削面的背面Wb藉由卡盤台30吸附的情況,也不會保持現狀實施研削步驟,研削正面保護構件T並使研削不良發生。The grinding method of the present invention as described above includes: a front protection step of covering the front surface of the workpiece with a front protection member; and a holding step of holding the workpiece W by the holding
如上述本發明的研削裝置3具備:計算手段90,從藉由第1厚度測量手段38A測量到的第1厚度資料,與測量到該第1厚度資料的時間點至經過任意時間後所測量到的第2厚度資料,計算出其變化量;以及控制手段9,在計算手段90所計算出的變化量為預先登錄的閾值以下的話,則使研削開始進行,在變化量為超越預先登錄的閾值的情況,則表示錯誤而不使研削開始進行;藉此,當工件W在卡盤台30以錯誤的狀態吸引保持的情況,亦即,當工件W的被研削面的背面Wb在卡盤台30吸附的情況,也不會保持現狀以粗研削手段31研削正面保護構件T,並使研削不良發生。As described above, the grinding
研削裝置3的第1厚度測量手段38A為,用於研削開始前的工件W的厚度測量的同時,亦用於研削開始後的工件W的厚度控制,藉此可試圖達成研削裝置3的小型化,並防止研削裝置3的製造成本的增加。The first thickness measuring means 38A of the grinding
再者,本發明的研削方法並不限定於上述實施方式,另外,隨附圖面所圖示的研削裝置3的構成等亦不限定於此,在可發揮本發明功效範圍內可進行適當變更。 例如,研削裝置3並非限定如本實施方式的研削手段為二軸的研削裝置,研削手段亦可為一軸的研削裝置。 另外,例如,第1厚度測量手段38A並非限定為具備如本實施方式的第1厚度測量381與第2厚度測量器382的構成,例如,亦可為以1個厚度測量器測量工件W的厚度,其具備第2厚度測量器382、將第2厚度測量器382在上下方向可移動地保持的托盤、測量托盤位置的變位檢測手段的構成。In addition, the grinding method of the present invention is not limited to the above-described embodiment, and the configuration of the grinding
W‧‧‧工件Wa‧‧‧工件的正面Wb‧‧‧工件的背面T‧‧‧正面保護構件3‧‧‧研削裝置3A‧‧‧基底3B、3C‧‧‧柱30‧‧‧卡盤台300‧‧‧吸附部300a‧‧‧保持面301‧‧‧框體31‧‧‧粗研削手段310‧‧‧旋轉軸311‧‧‧外殼312‧‧‧馬達313‧‧‧研削輪313a‧‧‧粗研削磨石32‧‧‧精研削手段323a‧‧‧精研削磨石330‧‧‧機器臂331‧‧‧第一卡匣332‧‧‧第二卡匣333‧‧‧對準手段334‧‧‧清洗手段335‧‧‧第一搬送手段336‧‧‧第二搬送手段34‧‧‧旋轉台35‧‧‧第一研削進給手段350‧‧‧滾珠螺桿351‧‧‧導軌352‧‧‧馬達353‧‧‧昇降部36‧‧‧第二研削進給手段360‧‧‧滾珠螺桿361‧‧‧導軌362‧‧‧馬達363‧‧‧昇降部38A‧‧‧第1厚度測量手段381‧‧‧第1厚度測量器382‧‧‧第2厚度測量器38B‧‧‧第2厚度測量手段9‧‧‧控制手段90‧‧‧計算手段W‧‧‧Workpiece Wa‧‧‧Front surface of workpiece Wb‧‧‧Back surface of workpiece T‧‧‧Front protection member 3‧‧‧Grinding device 3A‧‧‧Base 3B, 3C‧‧‧Column 30‧‧‧Chuck Table 300‧‧‧Suction part 300a‧‧‧Holding surface 301‧‧‧Frame body 31‧‧‧Rough grinding means 310‧‧‧Rotating shaft 311‧‧‧Enclosure 312‧‧‧Motor 313‧‧‧Grinding wheel 313a‧ ‧‧Rough Grinding Grinding Stone 32‧‧‧Fine Grinding Means 323a‧‧‧Fine Grinding Grinding Stone 330‧‧‧Robot Arm 331‧‧‧First Cartridge 332‧‧‧Second Cartridge 333‧‧‧Aligning Means 334‧‧‧Cleaning Means 335‧‧‧First Conveying Means 336‧‧‧Second Conveying Means 34‧‧‧Rotary Tables 35‧‧‧First Grinding Feeding Means 350‧‧‧Ball Screws 351‧‧‧Guideways 352 ‧‧‧Motor 353‧‧‧Elevating part 36‧‧‧Second grinding feed means 360‧‧‧Ball screw 361‧‧‧Guide 362‧‧‧Motor 363‧‧‧Elevating part 38A‧‧‧First thickness measurement Means 381‧‧‧First Thickness Measuring Device 382‧‧‧Second Thickness Measuring Device 38B‧‧‧Second Thickness Measuring Means 9‧‧‧Control Means 90‧‧‧Calculating Means
圖1係表示研削裝置的一例之立體圖。 圖2係表示工件的正面以正面保護構件覆蓋的狀態之立體圖。 圖3係表示使第2厚度測量器接觸工件的與卡盤台所保持的黏貼正面保護構件的正面為相反側的背面,並實施工件的厚度測量的狀態之剖面圖。 圖4係表示使第2厚度測量器接觸工件的與卡盤台所保持的背面為相反側的正面上所黏貼的正面保護構件,並實施工件的厚度測量的狀態之剖面圖。 圖5係表示使第2厚度測量器接觸背面並實施工件的厚度測量的情況之工件的厚度變化的圖,及使第2厚度測量器接觸正面保護構件並實施工件的厚度測量的情況之工件的厚度變化的圖。 圖6係表示進行工件的厚度控制且藉由粗研削手段進行粗研削的狀態之剖面圖。FIG. 1 is a perspective view showing an example of a grinding apparatus. FIG. 2 is a perspective view showing a state in which the front surface of the workpiece is covered with a front protection member. 3 is a cross-sectional view showing a state in which the second thickness measuring instrument is brought into contact with the back surface opposite to the front side of the sticking front protection member held by the chuck table of the workpiece, and the thickness of the workpiece is measured. 4 is a cross-sectional view showing a state where the second thickness measuring device is brought into contact with the front surface protection member attached to the front surface opposite to the back surface held by the chuck table, and the thickness of the workpiece is measured. 5 is a diagram showing a change in the thickness of the workpiece when the second thickness measuring device is brought into contact with the back surface and the thickness of the workpiece is measured, and the thickness of the workpiece when the second thickness measuring device is brought into contact with the front protection member and the thickness of the workpiece is measured. Graph of thickness change. 6 is a cross-sectional view showing a state in which the thickness of the workpiece is controlled and rough grinding is performed by rough grinding means.
G1‧‧‧曲線 G1‧‧‧curve
G2‧‧‧曲線 G2‧‧‧curve
L1‧‧‧切線 L1‧‧‧Tangent
L2‧‧‧切線 L2‧‧‧Tangent
M1‧‧‧厚度 M1‧‧‧Thickness
M2‧‧‧厚度 M2‧‧‧Thickness
M3‧‧‧厚度 M3‧‧‧Thickness
Mc‧‧‧閾值 Mc‧‧‧Threshold
t1‧‧‧任意的時間 t1‧‧‧any time
t2‧‧‧任意的時間 t2‧‧‧any time
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| TW200807538A (en) * | 2006-06-12 | 2008-02-01 | Disco Corp | Wafer grinding apparatus |
| TW200943405A (en) * | 2008-03-27 | 2009-10-16 | Tokyo Seimitsu Co Ltd | Wafer grinding method and wafer grinding machine |
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