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TWI741729B - Substrate processing system, valve plate assembly and working method of substrate processing system - Google Patents

Substrate processing system, valve plate assembly and working method of substrate processing system Download PDF

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Publication number
TWI741729B
TWI741729B TW109127279A TW109127279A TWI741729B TW I741729 B TWI741729 B TW I741729B TW 109127279 A TW109127279 A TW 109127279A TW 109127279 A TW109127279 A TW 109127279A TW I741729 B TWI741729 B TW I741729B
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Taiwan
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valve plate
opening
cavity
transfer port
processing system
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TW109127279A
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Chinese (zh)
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TW202114019A (en
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陳煌琳
仲禮 雷
王謙
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大陸商中微半導體設備(上海)股份有限公司
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    • H10P72/0454
    • H10P72/0462
    • H10P72/0464
    • H10P72/0466

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Abstract

一種基片處理系統、閥板組件以及基片處理系統的工作方法,其中,基片處理系統包括:第一腔,第一腔具有第一基片傳輸口;第二腔,第二腔具有第二基片傳輸口,第二腔與第一腔沿水平方向排布;位於第一腔與第二腔之間的密封殼,密封殼與第一基片傳輸口和第二基片傳輸口連通;位於密封殼內的第一閥板;位於密封殼內的第二閥板,第二閥板與第一閥板上下疊放;第一驅動裝置,用於使第一閥板運動以密封第一基片傳輸口;第二驅動裝置,用於使第二閥板運動以密封第二基片傳輸口。本發明所述之基片處理系統對基片具有較高的處理效率。A substrate processing system, a valve plate assembly, and a working method of the substrate processing system, wherein the substrate processing system includes: a first cavity, the first cavity has a first substrate transfer port; the second cavity, the second cavity has a first Two substrate transfer ports, the second cavity and the first cavity are arranged in a horizontal direction; a sealed shell located between the first cavity and the second cavity, the sealed shell communicates with the first substrate transfer port and the second substrate transfer port ; The first valve plate located in the sealing shell; the second valve plate located in the sealing shell, the second valve plate and the first valve plate are stacked up and down; the first driving device is used to move the first valve plate to seal the first valve plate A substrate transfer port; a second driving device for moving the second valve plate to seal the second substrate transfer port. The substrate processing system of the present invention has higher processing efficiency for substrates.

Description

基片處理系統、閥板組件及基片處理系統的工作方法Substrate processing system, valve plate assembly and working method of substrate processing system

本發明涉及半導體領域,尤其涉及一種基片處理系統、閥板組件及基片處理系統的工作方法。The invention relates to the field of semiconductors, and in particular to a working method of a substrate processing system, a valve plate assembly and a substrate processing system.

現有的基片處理系統通常為真空群集設備(Cluster),真空集群設備包括設備前端模組、負載鎖定腔(Load Lock)、傳輸腔以及包圍傳輸腔的製程腔。其中,傳輸腔內安裝有機械臂(Robot),機械臂用於將待處理基片從負載鎖定腔內取出,並放置到任意一個製程腔中,在製程腔內,對待處理基片進行處理,待處理基片處理完成後,機械臂再將處理完的基片從製程腔內取出,並將處理完的基片移動到外界大氣環境中。The existing substrate processing system is usually a vacuum cluster equipment (Cluster), which includes a front-end module of the equipment, a load lock chamber (Load Lock), a transfer chamber, and a process chamber surrounding the transfer chamber. Among them, a robotic arm (Robot) is installed in the transfer cavity. The robotic arm is used to take the substrate to be processed from the load lock chamber and place it in any process chamber. In the process chamber, the substrate to be processed is processed. After the processing of the substrate to be processed is completed, the robotic arm then takes the processed substrate out of the processing chamber and moves the processed substrate to the outside atmosphere.

現有的基片處理系統中,傳輸腔與製程腔、以及傳輸腔與負載鎖定腔之間均設置有一個閥板。當閥板需要更換時,拆除閥板將破壞傳輸腔、製程腔和負載鎖定腔的真空環境,使得基片處理系統難以繼續對待處理基片進行處理,因此,現有的基片處理系統的停機頻率較高,對待處理基片的處理效率較低。In the existing substrate processing system, a valve plate is provided between the transfer chamber and the process chamber, and between the transfer chamber and the load lock chamber. When the valve plate needs to be replaced, removing the valve plate will destroy the vacuum environment of the transfer chamber, the process chamber and the load lock chamber, making it difficult for the substrate processing system to continue processing the substrate to be processed. Therefore, the frequency of shutdown of the existing substrate processing system Higher, the processing efficiency of the substrate to be processed is lower.

本發明解決技術問題的技術方案是提供一種基片處理系統、閥板組件及基片處理系統的工作方法,以提高基片處理系統對待處理基片的處理效率。The technical scheme of the present invention to solve the technical problem is to provide a working method of a substrate processing system, a valve plate assembly and a substrate processing system, so as to improve the processing efficiency of the substrate to be processed by the substrate processing system.

為了解決上述技術問題,本發明提供一種基片處理系統,包括:第一腔,第一腔具有第一基片傳輸口;第二腔,第二腔具有第二基片傳輸口,第二腔與第一腔沿水平方向排布;位於第一腔與第二腔之間的密封殼,密封殼與第一基片傳輸口和第二基片傳輸口連通;位於密封殼內的第一閥板;位於密封殼內的第二閥板,第二閥板與第一閥板上下疊放;第一驅動裝置,用於使第一閥板運動以密封第一基片傳輸口;第二驅動裝置,用於使第二閥板運動以密封第二基片傳輸口。In order to solve the above technical problems, the present invention provides a substrate processing system, including: a first cavity, the first cavity has a first substrate transfer port; a second cavity, the second cavity has a second substrate transfer port, and a second cavity It is arranged in the horizontal direction with the first cavity; the sealed shell located between the first cavity and the second cavity, the sealed shell communicates with the first substrate transfer port and the second substrate transfer port; the first valve located in the sealed shell Plate; the second valve plate located in the sealing shell, the second valve plate and the first valve plate are stacked up and down; the first drive device is used to move the first valve plate to seal the first substrate transfer port; the second drive The device is used to move the second valve plate to seal the second substrate transfer port.

較佳地,第一驅動裝置和第二驅動裝置均包括上下動力裝置和水平動力裝置,上下動力裝置用於使第一閥板或者第二閥板沿上下方向運動,水平動力裝置用於使第一閥板或者第二閥板沿水平方向運動。Preferably, both the first driving device and the second driving device include an up-and-down power device and a horizontal power device. A valve plate or a second valve plate moves in the horizontal direction.

較佳地,密封殼包括第一開口和第二開口,第一開口與第一基片傳輸口對應,第二開口與第二基片傳輸口對應。Preferably, the sealing shell includes a first opening and a second opening, the first opening corresponds to the first substrate transfer port, and the second opening corresponds to the second substrate transfer port.

較佳地,當第一開口的開口面積大於第一基片傳輸口的開口面積時,第一閥板用於密封第一基片傳輸口或者第一開口。Preferably, when the opening area of the first opening is larger than the opening area of the first substrate transfer port, the first valve plate is used to seal the first substrate transfer port or the first opening.

較佳地,當第一開口的開口面積小於等於第一基片傳輸口的開口面積時,第一閥板用於密封第一開口。Preferably, when the opening area of the first opening is less than or equal to the opening area of the first substrate transfer port, the first valve plate is used to seal the first opening.

較佳地,第一閥板的側面設置密封裝置,用於實現與第一基片傳輸口或第一開口的緊密貼合。Preferably, a sealing device is provided on the side of the first valve plate to achieve close contact with the first substrate transfer port or the first opening.

較佳地,第一基片傳輸口的周圍或者第一開口的周圍具有第一臺階,第一閥板設有與第一臺階匹配的密封臺階,第一閥板進一步包括設於密封臺階上的密封裝置,密封裝置用於實現密封臺階和第一臺階之間的密封。Preferably, there is a first step around the first substrate transfer port or around the first opening, the first valve plate is provided with a sealing step matching the first step, and the first valve plate further includes a sealing step provided on the sealing step. The sealing device is used to realize the seal between the sealing step and the first step.

較佳地,當第二開口的開口面積大於第二基片傳輸口的開口面積時,第二閥板用於密封第二基片傳輸口或者第二開口。Preferably, when the opening area of the second opening is larger than the opening area of the second substrate transfer port, the second valve plate is used to seal the second substrate transfer port or the second opening.

較佳地,當第二開口的開口面積小於等於第二基片傳輸口的開口面積時,第二閥板用於密封第二開口。Preferably, when the opening area of the second opening is less than or equal to the opening area of the second substrate transfer port, the second valve plate is used to seal the second opening.

較佳地,第二閥板的側面設置密封裝置,用於實現與第二基片傳輸口或第二開口的緊密貼合。Preferably, a sealing device is provided on the side of the second valve plate to achieve close contact with the second substrate transfer port or the second opening.

較佳地,第二基片傳輸口的周圍或者第二開口的周圍具有第二臺階,第二閥板設有與第二臺階匹配的密封臺階,第二閥板進一步包括設於密封臺階上的密封裝置,密封裝置用於實現密封臺階和第二臺階之間的密封。Preferably, the periphery of the second substrate transfer port or the periphery of the second opening is provided with a second step, the second valve plate is provided with a sealing step matching the second step, and the second valve plate further includes a sealing step provided on the sealing step. The sealing device is used to realize the seal between the sealing step and the second step.

較佳地,第一腔為製程腔,第二腔為傳輸腔。Preferably, the first cavity is a process cavity and the second cavity is a transfer cavity.

較佳地,當製程腔的個數大於1個時,大於1個的製程腔環繞傳輸腔;各個製程腔與傳輸腔之間均具有第一閥板、第二閥板和密封殼。Preferably, when the number of process chambers is greater than one, the process chambers greater than one surround the transfer chamber; each process chamber and the transfer chamber are provided with a first valve plate, a second valve plate and a sealing shell.

較佳地,第一腔為負載鎖定腔,第二腔為傳輸腔。Preferably, the first cavity is a load lock cavity and the second cavity is a transmission cavity.

較佳地,第一閥板與第二閥板的大小相等或者不相等。Preferably, the size of the first valve plate and the second valve plate are equal or not equal.

本發明提供一種用於基片處理系統的閥板組件,包括:第一閥板;與第一閥板上下疊放的第二閥板;位於第一閥板和第二閥板外圍的密封殼,密封殼沿水平方向具有第一開口和第二開口;第一驅動裝置,用於使第一閥板沿上下方向和水平方向運動;第二驅動裝置,用於使第二閥板沿上下方向和水平方向運動。The invention provides a valve plate assembly for a substrate processing system, comprising: a first valve plate; a second valve plate stacked up and down with the first valve plate; and a sealing shell located on the periphery of the first valve plate and the second valve plate , The sealing shell has a first opening and a second opening along the horizontal direction; the first driving device is used to move the first valve plate in the up and down direction and the horizontal direction; the second driving device is used to move the second valve plate in the up and down direction And horizontal movement.

較佳地,第一閥板和第二閥板均包括密封裝置。Preferably, both the first valve plate and the second valve plate include a sealing device.

較佳地,密封裝置設置於第一閥板及/或第二閥板的側壁。Preferably, the sealing device is arranged on the side wall of the first valve plate and/or the second valve plate.

較佳地,第一開口的周圍設置有第一臺階,第一閥板設有與第一臺階匹配的密封臺階,第一閥板的密封裝置位於密封臺階上;第二開口的周圍設置有第二臺階,第二閥板設置有與第二臺階匹配的密封臺階,第二閥板的密封裝置位於密封臺階上。Preferably, a first step is provided around the first opening, the first valve plate is provided with a sealing step matching the first step, and the sealing device of the first valve plate is located on the sealing step; the second opening is provided with a first step around the second opening. Two steps, the second valve plate is provided with a sealing step matching the second step, and the sealing device of the second valve plate is located on the sealing step.

較佳地,第一驅動裝置和第二驅動裝置均包括上下動力裝置和水平動力裝置,上下動力裝置用於使第一閥板或者第二閥板上下運動,水平動力裝置用於使第一閥板或者第二閥板沿水平方向運動。Preferably, the first driving device and the second driving device both include an upper and lower power device and a horizontal power device. The upper and lower power devices are used to move the first valve plate or the second valve plate up and down, and the horizontal power device is used to make the first valve The plate or the second valve plate moves in the horizontal direction.

相應的,本發明進一步提供一種基片處理系統的工作方法,包括:提供上述基片處理系統;利用第一驅動裝置使第一閥板運動密封第一基片傳輸口,及/或利用第二驅動裝置使第二閥板運動密封第二基片傳輸口。Correspondingly, the present invention further provides a working method of a substrate processing system, including: providing the above-mentioned substrate processing system; using a first driving device to move the first valve plate to seal the first substrate transfer port, and/or using the second The driving device moves the second valve plate to seal the second substrate transfer port.

較佳地,當第一閥板密封第一基片傳輸口時,更換第二閥板;或者,當第二閥板密封第二基片傳輸口時,更換第一閥板。Preferably, when the first valve plate seals the first substrate transfer port, the second valve plate is replaced; or, when the second valve plate seals the second substrate transfer port, the first valve plate is replaced.

與先前技術相比,本發明實施例的技術方案具有以下有益效果:Compared with the prior art, the technical solution of the embodiment of the present invention has the following beneficial effects:

本發明技術方案提供的基片處理系統中,第一閥板用於密封第一基片傳輸口,有利於確保第一腔內維持真空環境;第二閥板用於密封第二基片傳輸口,有利於確保第二腔內維持真空環境。當第一閥板需要維護時,使第二閥板密封第二基片傳輸口,則第二腔內仍能維持真空環境,當第二閥板需要維護時,使第一閥板密封第一基片傳輸口,則第一腔內仍能維持真空環境。當第一腔或者第二腔內仍能維持真空環境,使得第一腔或者第二腔內仍能繼續進行製程處理而無需停機,因此,有利於降低停機頻率,提高待處理基片的處理效率。In the substrate processing system provided by the technical scheme of the present invention, the first valve plate is used to seal the first substrate transfer port, which is beneficial to ensure that a vacuum environment is maintained in the first cavity; the second valve plate is used to seal the second substrate transfer port , Which helps to ensure that the vacuum environment is maintained in the second cavity. When the first valve plate needs maintenance, make the second valve plate seal the second substrate transfer port, and the vacuum environment can still be maintained in the second cavity. When the second valve plate needs maintenance, the first valve plate is sealed to the first valve plate. The substrate transfer port can still maintain a vacuum environment in the first cavity. When the vacuum environment can still be maintained in the first cavity or the second cavity, the process processing can be continued in the first cavity or the second cavity without shutting down. Therefore, it is beneficial to reduce the frequency of shutdown and improve the processing efficiency of the substrate to be processed .

正如先前技術所述,先前技術中的基片處理系統對待處理基片的處理效率較低,為了解決上述技術問題,本發明的技術方案提供一種基片處理系統、用於基片處理系統的閥板組件及基片處理系統的工作方法,其中,基片處理系統包括:第一腔,第一腔具有第一基片傳輸口;第二腔,第二腔具有第二基片傳輸口,第二腔與第一腔沿水平方向排布;位於第一腔與第二腔之間的密封殼,密封殼與第一基片傳輸口和第二基片傳輸口連通;位於密封殼內的第一閥板;位於密封殼內的第二閥板,第二閥板位於第一閥板上方;第一驅動裝置,用於使第一閥板運動以密封第一基片傳輸口;第二驅動裝置,用於使第二閥板運動以密封第二基片傳輸口。本發明提供之基片處理系統對待處理基片的處理效率較高。As described in the prior art, the substrate processing system in the prior art has low processing efficiency for the substrate to be processed. In order to solve the above technical problems, the technical solution of the present invention provides a substrate processing system and a valve for the substrate processing system. The working method of the board assembly and the substrate processing system, wherein the substrate processing system includes: a first cavity, the first cavity has a first substrate transfer port; the second cavity, the second cavity has a second substrate transfer port, and the The two cavities and the first cavity are arranged in the horizontal direction; the sealed shell located between the first cavity and the second cavity, the sealed shell communicates with the first substrate transfer port and the second substrate transfer port; the second substrate located in the sealed shell A valve plate; a second valve plate located in the sealing shell, the second valve plate is located above the first valve plate; a first drive device for moving the first valve plate to seal the first substrate transfer port; a second drive The device is used to move the second valve plate to seal the second substrate transfer port. The substrate processing system provided by the present invention has higher processing efficiency for the substrate to be processed.

為使本發明的上述目的、特徵和有益效果能夠更為明顯易懂,下面將結合附圖對本發明的具體實施例做詳細的說明。In order to make the above objectives, features and beneficial effects of the present invention more obvious and understandable, specific embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings.

圖1是根據本發明的一種基片處理系統的俯視圖。Fig. 1 is a top view of a substrate processing system according to the present invention.

請參考圖1,基片處理系統包括:製程腔100、傳輸腔101和負載鎖定腔102,製程腔100和負載鎖定腔102包圍傳輸腔101。Please refer to FIG. 1, the substrate processing system includes: a process chamber 100, a transfer chamber 101 and a load lock chamber 102, and the process chamber 100 and the load lock chamber 102 surround the transfer chamber 101.

製程腔100(Process Module,PM)內為真空環境,用於對待處理基片進行半導體製程的處理。The inside of the process chamber 100 (Process Module, PM) is a vacuum environment, which is used to process the semiconductor process on the substrate to be processed.

傳輸腔101(Transfer Module,TM)內為真空環境,且傳輸腔101內具有機械手臂,用於將傳輸腔101內的待處理基片移動至其中一個製程腔100內。The transfer chamber 101 (Transfer Module, TM) is in a vacuum environment, and there is a robot arm in the transfer chamber 101 for moving the substrate to be processed in the transfer chamber 101 into one of the process chambers 100.

負載鎖定腔102(Load lock)用於實現大氣環境與真空環境之間的切換。The load lock chamber 102 (Load lock) is used to switch between an atmospheric environment and a vacuum environment.

圖2是根據本發明的一種基片處理系統的剖面結構示意圖。2 is a schematic cross-sectional structure diagram of a substrate processing system according to the present invention.

請參考圖2,第一腔200具有第一基片傳輸口201;第二腔202具有第二基片傳輸口203,第二腔202與第一腔200沿水平方向X1排布;密封殼204位於第一腔200與第二腔202之間,密封殼204與第一基片傳輸口201和第二基片傳輸口203連通;位於密封殼204內的第一閥板205;位於密封殼204內的第二閥板206,第二閥板206與第一閥板205上下疊放;第一驅動裝置207,用於使第一閥板205運動以密封第一基片傳輸口201;第二驅動裝置208,用於使第二閥板206運動以密封第二基片傳輸口203。Please refer to FIG. 2, the first cavity 200 has a first substrate transfer port 201; the second cavity 202 has a second substrate transfer port 203, and the second cavity 202 and the first cavity 200 are arranged along the horizontal direction X1; the sealing shell 204 Located between the first cavity 200 and the second cavity 202, the sealed shell 204 is in communication with the first substrate transfer port 201 and the second substrate transfer port 203; the first valve plate 205 located in the sealed shell 204; located in the sealed shell 204 The second valve plate 206, the second valve plate 206 and the first valve plate 205 are stacked up and down; the first driving device 207 is used to move the first valve plate 205 to seal the first substrate transfer port 201; The driving device 208 is used to move the second valve plate 206 to seal the second substrate transfer port 203.

在一種實施例中,第一腔200為製程腔,製程腔內為真空環境,在第一腔200內對待處理基片進行半導體製程的處理,半導體製程包括:電漿蝕刻製程,第一腔200的第一基片傳輸口201用於移入或者移出待處理基片。第二腔202為傳輸腔,第二腔202內具有機械手臂(圖中未示出),機械手臂用於抓取待處理基片並通過第二基片傳輸口203移入或者移出待處理基片。In one embodiment, the first chamber 200 is a process chamber, and the process chamber is in a vacuum environment. The substrate to be processed is processed in a semiconductor process in the first chamber 200. The semiconductor process includes: a plasma etching process, the first chamber 200 The first substrate transfer port 201 is used to move in or out the substrate to be processed. The second cavity 202 is a transfer cavity. The second cavity 202 has a robotic arm (not shown in the figure). The robotic arm is used to grab the substrate to be processed and move in or out of the substrate to be processed through the second substrate transfer port 203 .

在另一種實施例中,第一腔200為傳輸腔,第二腔202為負載鎖定腔(Load lock)。In another embodiment, the first cavity 200 is a transmission cavity, and the second cavity 202 is a load lock cavity.

第二腔202與第一腔200沿水平方向X1排布,第二腔202與第一腔200之間具有密封殼204,密封殼204分別與第二腔202和第一腔200連接。The second cavity 202 and the first cavity 200 are arranged along the horizontal direction X1. There is a sealed shell 204 between the second cavity 202 and the first cavity 200, and the sealed shell 204 is connected to the second cavity 202 and the first cavity 200, respectively.

在本實施例中,密封殼204包括第一開口209和第二開口210,第一開口209與第一基片傳輸口201對應,第二開口210與第二基片傳輸口203對應。In this embodiment, the sealing shell 204 includes a first opening 209 and a second opening 210, the first opening 209 corresponds to the first substrate transfer port 201, and the second opening 210 corresponds to the second substrate transfer port 203.

在本實施例中,第一驅動裝置207和第二驅動裝置208均包括上下動力裝置(圖中未示出)和水平動力裝置(圖中未示出),上下動力裝置用於使第一閥板205或者第二閥板206沿上下方向Y1運動,使第一閥板205可與第一基片傳輸口201相對,第二閥板206與第二基片傳輸口203相對,且第一閥板205在密封殼204上的投影能夠覆蓋第一基片傳輸口201,第二閥板206在密封殼204上的投影能夠覆蓋第二基片傳輸口203,水平動力裝置用於使第一閥板205壓向第一開口209以密封第一基片傳輸口201,或者使第二閥板206壓向第二開口210以密封第二基片傳輸口203。In this embodiment, the first driving device 207 and the second driving device 208 both include an upper and lower power device (not shown in the figure) and a horizontal power device (not shown in the figure). The upper and lower power device is used to make the first valve The plate 205 or the second valve plate 206 moves in the up and down direction Y1, so that the first valve plate 205 can be opposed to the first substrate transfer port 201, the second valve plate 206 is opposed to the second substrate transfer port 203, and the first valve The projection of the plate 205 on the sealed shell 204 can cover the first substrate transfer port 201, the projection of the second valve plate 206 on the sealed shell 204 can cover the second substrate transfer port 203, and the horizontal power device is used to make the first valve The plate 205 is pressed to the first opening 209 to seal the first substrate transfer port 201, or the second valve plate 206 is pressed to the second opening 210 to seal the second substrate transfer port 203.

在本實施例中,當第一閥板205需要維護或者更換時,都需要拆卸第一閥板205。當拆除第一閥板205時,第二閥板206密封第二開口210,有利於確保第二腔202內的真空環境;同樣的,當第二閥板206需要維護或者更換時,第一閥板205密封第一開口209,使第一腔200內的真空環境不被破壞,使得第一腔200或者第二腔202的處理過程不被中斷,因此,有利於提高待處理基片的處理效率。In this embodiment, when the first valve plate 205 needs maintenance or replacement, the first valve plate 205 needs to be disassembled. When the first valve plate 205 is removed, the second valve plate 206 seals the second opening 210, which helps to ensure the vacuum environment in the second cavity 202; similarly, when the second valve plate 206 needs maintenance or replacement, the first valve plate 206 The plate 205 seals the first opening 209, so that the vacuum environment in the first cavity 200 is not destroyed, so that the processing process of the first cavity 200 or the second cavity 202 is not interrupted, therefore, it is beneficial to improve the processing efficiency of the substrate to be processed .

在本實施例中,拆卸第一閥板205的方法包括:同時拆卸第一閥板205和第一驅動裝置207;拆卸第二閥板206的方法包括:同時拆卸第二閥板206和第二驅動裝置208。In this embodiment, the method of disassembling the first valve plate 205 includes: disassembling the first valve plate 205 and the first driving device 207 at the same time; the method of disassembling the second valve plate 206 includes: disassembling the second valve plate 206 and the second valve plate 206 at the same time. Drive 208.

在本實施例中,基片處理系統進一步包括:位於第一腔200和第二腔202底部的支撐腳(圖中未示出)、位於支撐腳下方的設備板以及位於設備板下方的支撐柱。In this embodiment, the substrate processing system further includes: supporting feet (not shown in the figure) at the bottoms of the first cavity 200 and the second cavity 202, an equipment board located below the supporting feet, and a supporting column located below the equipment board .

在本實施例中,由於第一閥板205與第二閥板206上下疊放,使得第一閥板205和第二閥板206所占的面積與僅與第一閥板205所占的面積相同或者接近,則基片處理系統的重心不發生偏移或者發生輕微的偏移,使得原有的支撐腳和支撐柱無需額外重新設計,有利於減少設計難度。In this embodiment, since the first valve plate 205 and the second valve plate 206 are stacked on top of each other, the area occupied by the first valve plate 205 and the second valve plate 206 is equal to the area occupied by the first valve plate 205 only. If they are the same or close to each other, the center of gravity of the substrate processing system does not shift or slightly shifts, so that the original support feet and support columns do not need to be redesigned, which helps reduce the design difficulty.

在本實施例中,當第一腔200為製程腔,第二腔202為傳輸腔時,若製程腔的個數大於1個,則複數個製程腔環繞傳輸腔,且各製程腔與傳輸腔之間均具有第一閥板205、第二閥板206和密封殼204。In this embodiment, when the first cavity 200 is a process cavity and the second cavity 202 is a transfer cavity, if the number of process cavities is greater than one, a plurality of process cavities surround the transfer cavity, and each process cavity and the transfer cavity There are a first valve plate 205, a second valve plate 206 and a sealing shell 204 therebetween.

在本實施例中,第一閥板205和第二閥板206的大小相等。In this embodiment, the size of the first valve plate 205 and the second valve plate 206 are equal.

在其他實施例中,第一閥板和第二閥板的大小不相等。In other embodiments, the sizes of the first valve plate and the second valve plate are not equal.

圖3是圖2的基片處理系統中第一閥板密封第一基片傳輸口的結構示意圖。3 is a schematic diagram of the structure of the first valve plate sealing the first substrate transfer port in the substrate processing system of FIG. 2.

在本實施例中,第一開口209的開口面積與第一基片傳輸口201的開口面積相等,則第一驅動裝置207用於使第一閥板205密封第一開口209。在其他實施例中,第一開口的開口面積小於第一基片傳輸口的開口面積,第一驅動裝置使第一閥板密封第一開口;或者,第一開口的開口面積大於第一基片傳輸口的開口面積,第一驅動裝置使第一閥板密封第一基片傳輸口或者第一開口。In this embodiment, the opening area of the first opening 209 is equal to the opening area of the first substrate transfer port 201, and the first driving device 207 is used to make the first valve plate 205 seal the first opening 209. In other embodiments, the opening area of the first opening is smaller than the opening area of the first substrate transfer port, and the first driving device causes the first valve plate to seal the first opening; or, the opening area of the first opening is larger than that of the first substrate For the opening area of the transfer port, the first driving device makes the first valve plate seal the first substrate transfer port or the first opening.

在本實施例中,第一閥板205的側面設置有密封裝置205a,當第一閥板205密封第一開口209時,密封裝置205a用於實現與第一開口209的緊密貼合。In this embodiment, the side of the first valve plate 205 is provided with a sealing device 205a. When the first valve plate 205 seals the first opening 209, the sealing device 205a is used to achieve a tight fit with the first opening 209.

在本實施例中,當第二閥板206需要維護或者更換時,第一閥板205密封第一開口209,有利於確保第一腔200內的真空環境,使第一腔200內的處理不被中斷,因此,有利於提高基片處理系統的處理效率。In this embodiment, when the second valve plate 206 needs to be maintained or replaced, the first valve plate 205 seals the first opening 209, which is beneficial to ensure the vacuum environment in the first cavity 200, so that the processing in the first cavity 200 is not possible. Is interrupted, therefore, it is helpful to improve the processing efficiency of the substrate processing system.

圖4是圖2的基片處理系統中第二閥板密封第二基片傳輸口的結構示意圖。4 is a schematic diagram of the structure of the second valve plate sealing the second substrate transfer port in the substrate processing system of FIG. 2.

在本實施例中,第二開口210的開口面積與第二基片傳輸口203的開口面積相等,則第二驅動裝置208用於使第二閥板206密封第二開口210。In this embodiment, the opening area of the second opening 210 is equal to the opening area of the second substrate transfer port 203, and the second driving device 208 is used to make the second valve plate 206 seal the second opening 210.

在其他實施例中,第二開口的開口面積小於第二基片傳輸口的開口面積,第二驅動裝置使第二閥板密封第二開口;或者,第二開口的開口面積大於第二基片傳輸口的開口面積,第一驅動裝置使第二閥板密封第二基片傳輸口或者第二開口。In other embodiments, the opening area of the second opening is smaller than the opening area of the second substrate transfer port, and the second driving device causes the second valve plate to seal the second opening; or, the opening area of the second opening is larger than that of the second substrate For the opening area of the transfer port, the first driving device makes the second valve plate seal the second substrate transfer port or the second opening.

在本實施例中,第二閥板206的側面設置有密封裝置206a,當第二閥板206密封第二開口210時,密封裝置206a用於實現與第二開口210的緊密貼合。In this embodiment, the side of the second valve plate 206 is provided with a sealing device 206a. When the second valve plate 206 seals the second opening 210, the sealing device 206a is used to achieve a tight fit with the second opening 210.

在本實施例中,當第一閥板205需要維護或者更換時,第二閥板206密封第二開口210,有利於確保第二腔202內的真空環境,使第二腔202內的處理不被中斷,因此,有利於提高基片處理系統的處理效率。In this embodiment, when the first valve plate 205 needs to be maintained or replaced, the second valve plate 206 seals the second opening 210, which is beneficial to ensure the vacuum environment in the second cavity 202, so that the processing in the second cavity 202 is not possible. Is interrupted, therefore, it is helpful to improve the processing efficiency of the substrate processing system.

圖5是根據本發明的另一種基片處理系統的剖面結構示意圖。5 is a schematic cross-sectional structure diagram of another substrate processing system according to the present invention.

請參考圖5,第一腔300具有第一基片傳輸口301;第二腔302具有第二基片傳輸口303,第二腔302與第一腔300沿水平方向X2排布;密封殼304位於第一腔300與第二腔302之間,密封殼304與第一基片傳輸口301和第二基片傳輸口303連通;位於密封殼304內的第一閥板305;位於密封殼304的第二閥板306,第二閥板306與第一閥板305上下疊放;第一驅動裝置307,用於使第一閥板305運動以密封第一基片傳輸口301;第二驅動裝置308,用於使第二閥板306運動以密封第二基片傳輸口303。5, the first cavity 300 has a first substrate transfer port 301; the second cavity 302 has a second substrate transfer port 303, the second cavity 302 and the first cavity 300 are arranged along the horizontal direction X2; the sealing shell 304 Located between the first cavity 300 and the second cavity 302, the sealed shell 304 is in communication with the first substrate transfer port 301 and the second substrate transfer port 303; the first valve plate 305 located in the sealed shell 304; located in the sealed shell 304 The second valve plate 306, the second valve plate 306 and the first valve plate 305 are stacked up and down; the first drive device 307 is used to move the first valve plate 305 to seal the first substrate transfer port 301; the second drive The device 308 is used to move the second valve plate 306 to seal the second substrate transfer port 303.

在本實施例中,密封殼304包括第一開口309和第二開口310,第一開口309與第一基片傳輸口301對應,第二開口310與第二基片傳輸口303對應。In this embodiment, the sealing shell 304 includes a first opening 309 and a second opening 310, the first opening 309 corresponds to the first substrate transfer port 301, and the second opening 310 corresponds to the second substrate transfer port 303.

在本實施例中,第一開口309的開口面積與第一基片傳輸口301的開口面積相等,且第一開口309的周圍具有第一臺階311,第一閥板305具有與第一臺階311相匹配的密封臺階305a和位於密封臺階305a上的密封裝置305b;第二開口310的開口面積與第二基片傳輸口303的開口面積相等,且第二開口310的周圍具有第二臺階312,第二閥板306具有與第二臺階312相匹配的密封臺階306a和位於密封臺階306a上的密封裝置306b。In this embodiment, the opening area of the first opening 309 is equal to the opening area of the first substrate transfer port 301, and the first opening 309 has a first step 311 around the first opening 309, and the first valve plate 305 has the same opening area as the first step 311. The matching sealing step 305a and the sealing device 305b located on the sealing step 305a; the opening area of the second opening 310 is equal to the opening area of the second substrate transfer port 303, and the second opening 310 is surrounded by a second step 312, The second valve plate 306 has a sealing step 306a matching the second step 312 and a sealing device 306b located on the sealing step 306a.

在其他實施例中,第一開口的開口面積小於第一基片傳輸口的開口面積,第一開口的周圍具有第一臺階,第一閥板用於密封第一開口;第二開口的開口面積小於第二基片傳輸口的開口面積,且第二開口的周圍具有第二臺階,第二閥板用於密封第二開口;或者,第一開口的開口面積大於第一基片傳輸口的開口面積,第一基片傳輸口的周圍具有第一臺階,第一閥板用於密封第一開口或者第二基片傳輸口;第二開口的開口面積大於第二基片傳輸口的開口面積,且第二基片傳輸口的周圍具有第二臺階,第二閥板用於密封第二開口或者第二基片傳輸口。In other embodiments, the opening area of the first opening is smaller than the opening area of the first substrate transfer port, the first opening is surrounded by a first step, the first valve plate is used to seal the first opening; the opening area of the second opening It is smaller than the opening area of the second substrate transfer port, and there is a second step around the second opening, and the second valve plate is used to seal the second opening; or, the opening area of the first opening is larger than the opening of the first substrate transfer port Area, there is a first step around the first substrate transfer port, the first valve plate is used to seal the first opening or the second substrate transfer port; the opening area of the second opening is larger than the opening area of the second substrate transfer port, And there is a second step around the second substrate transfer port, and the second valve plate is used to seal the second opening or the second substrate transfer port.

圖6是圖5的基片處理系統中第一閥板密封第一基片傳輸口的結構示意圖。6 is a schematic diagram of the structure of the first valve plate sealing the first substrate transfer port in the substrate processing system of FIG. 5.

在本實施例中,第一開口309周圍具有第一臺階311,第一閥板305設有與第一臺階311相匹配的密封臺階305a和位於密封臺階305a上的密封裝置305b,第一驅動裝置307使密封臺階305a與第一臺階311相匹配,密封裝置305b用於實現密封臺階305a與第一臺階311之間的密封。In this embodiment, there is a first step 311 around the first opening 309. The first valve plate 305 is provided with a sealing step 305a matching the first step 311 and a sealing device 305b located on the sealing step 305a. The first driving device 307 matches the sealing step 305a with the first step 311, and the sealing device 305b is used to realize the seal between the sealing step 305a and the first step 311.

在本實施例中,第一閥板305包括設置於密封臺階305a上的密封裝置305b,利用驅動裝置使第一閥板305密封第一臺階311時,所施加的驅動力不會因第一閥板305的板材而減少,而是全部傳遞至第一閥板305頂部的密封裝置305b,因此,只需較小的驅動力就能達到較好的密封效果。並且,利用第一閥板305密封第一臺階311,對第一閥板305材質的剛性要求較低。In this embodiment, the first valve plate 305 includes a sealing device 305b arranged on the sealing step 305a. When the first valve plate 305 is used to seal the first step 311 by the driving device, the driving force applied will not be affected by the first valve. The number of plates of the plate 305 is reduced, but all are transferred to the sealing device 305b on the top of the first valve plate 305. Therefore, a better sealing effect can be achieved with only a small driving force. In addition, the first valve plate 305 is used to seal the first step 311, and the rigidity of the material of the first valve plate 305 is relatively low.

在其他實施例中,第一開口的開口面積小於第一基片傳輸口的開口面積,第一驅動裝置使第一閥板密封第一開口;或者,第一開口的開口面積大於第一基片傳輸口的開口面積,第一驅動裝置使第一閥板密封第一基片傳輸口或者第一開口。In other embodiments, the opening area of the first opening is smaller than the opening area of the first substrate transfer port, and the first driving device causes the first valve plate to seal the first opening; or, the opening area of the first opening is larger than that of the first substrate For the opening area of the transfer port, the first driving device makes the first valve plate seal the first substrate transfer port or the first opening.

在本實施例中,當第二閥板306需要維護或者更換時,第一閥板305密封第一開口309,有利於確保第一腔300內的真空環境,使第一腔300內的處理不被中斷,因此,有利於提高基片處理系統的處理效率。In this embodiment, when the second valve plate 306 needs to be maintained or replaced, the first valve plate 305 seals the first opening 309, which is beneficial to ensure the vacuum environment in the first cavity 300, so that the processing in the first cavity 300 is not effective. Is interrupted, therefore, it is helpful to improve the processing efficiency of the substrate processing system.

圖7是圖5的基片處理系統中第二閥板密封第二基片傳輸口的結構示意圖。FIG. 7 is a schematic diagram of the structure of the second valve plate sealing the second substrate transfer port in the substrate processing system of FIG. 5.

在本實施例中,第二開口310的周圍具有第二臺階312,第二閥板306設有與第二臺階312相匹配的密封臺階306a和位於密封臺階306a上的密封裝置306b,第二驅動裝置308使密封臺階306a與第二臺階312相匹配,密封裝置306b用於實現密封臺階306a與第二臺階312之間的密封。In this embodiment, there is a second step 312 around the second opening 310. The second valve plate 306 is provided with a sealing step 306a matching the second step 312 and a sealing device 306b located on the sealing step 306a. The device 308 matches the sealing step 306 a with the second step 312, and the sealing device 306 b is used to achieve the seal between the sealing step 306 a and the second step 312.

在本實施例中,第二閥板306包括設置於密封臺階306a上的密封裝置306b,利用驅動裝置使第二閥板306密封第二臺階312時,所施加的驅動力不會因第二閥板306的板材而減少,而是全部傳遞至第二閥板306頂部的密封裝置306b,因此,只需較小的驅動力就能達到較好的密封效果。並且,利用第二閥板306密封第二臺階312,對第二閥板306材質的剛性要求較低。In this embodiment, the second valve plate 306 includes a sealing device 306b arranged on the sealing step 306a. When the second valve plate 306 is used to seal the second step 312 by the driving device, the driving force applied will not be affected by the second valve. The number of plates of the plate 306 is reduced, but all are transferred to the sealing device 306b on the top of the second valve plate 306. Therefore, a better sealing effect can be achieved with a small driving force. In addition, the second valve plate 306 is used to seal the second step 312, and the rigidity of the material of the second valve plate 306 is relatively low.

在其他實施例中,第二開口的開口面積小於第二基片傳輸口的開口面積,第二驅動裝置使第二閥板密封第二開口;或者,第二開口的開口面積大於第二基片傳輸口的開口面積,第二驅動裝置使第二閥板密封第二基片傳輸口或者第二開口。In other embodiments, the opening area of the second opening is smaller than the opening area of the second substrate transfer port, and the second driving device causes the second valve plate to seal the second opening; or, the opening area of the second opening is larger than that of the second substrate For the opening area of the transfer port, the second driving device makes the second valve plate seal the second substrate transfer port or the second opening.

在本實施例中,當第一閥板305需要維護或者更換時,第二閥板306密封第二開口310,有利於確保第二腔302內的真空環境,使第二腔302內的處理不被中斷,因此,有利於提高基片處理系統的處理效率。In this embodiment, when the first valve plate 305 needs to be maintained or replaced, the second valve plate 306 seals the second opening 310, which is beneficial to ensure the vacuum environment in the second cavity 302, so that the processing in the second cavity 302 is not effective. Is interrupted, therefore, it is helpful to improve the processing efficiency of the substrate processing system.

圖8是根據本發明的一種用於基片處理系統的閥板組件的結構示意圖;圖9是圖8的閥板組件中第一閥板的側視圖。Fig. 8 is a schematic structural diagram of a valve plate assembly for a substrate processing system according to the present invention; Fig. 9 is a side view of a first valve plate in the valve plate assembly of Fig. 8.

請參考圖8,閥板組件包括:第一閥板401;與第一閥板401上下疊放的第二閥板402;位於第一閥板401和第二閥板402外圍的密封殼400,密封殼400沿水平方向X3具有第一開口405和第二開口406;第一驅動裝置403,用於使第一閥板401沿上下方向Y3和水平方向X3運動;第二驅動裝置404,用於使第二閥板402沿上下方向Y3和水平方向X3運動。Please refer to Figure 8, the valve plate assembly includes: a first valve plate 401; a second valve plate 402 stacked up and down with the first valve plate 401; a sealing shell 400 located on the periphery of the first valve plate 401 and the second valve plate 402, The sealing shell 400 has a first opening 405 and a second opening 406 along the horizontal direction X3; a first driving device 403 is used to move the first valve plate 401 in the vertical direction Y3 and the horizontal direction X3; a second driving device 404 is used to move the first valve plate 401 in the vertical direction Y3 and the horizontal direction X3 The second valve plate 402 is moved in the vertical direction Y3 and the horizontal direction X3.

第一驅動裝置403和第二驅動裝置404均包括上下動力裝置(圖中未示出)和水平動力裝置(圖中未示出),上下動力裝置用於使第一閥板401或者第二閥板402沿上下方向Y3運動,水平動力裝置用於使第一閥板401或者第二閥板402沿水平方向X3運動。Both the first driving device 403 and the second driving device 404 include an upper and lower power device (not shown in the figure) and a horizontal power device (not shown in the figure). The upper and lower power devices are used to make the first valve plate 401 or the second valve The plate 402 moves in the vertical direction Y3, and the horizontal power device is used to move the first valve plate 401 or the second valve plate 402 in the horizontal direction X3.

在本實施例中,第一閥板401的側壁設置有密封裝置401b,第一閥板401密封第一開口405的方法包括:利用上下動力裝置使第一閥板401沿上下方向Y3方向移動,直至第一閥板401與第一開口405相對;當第一閥板401與第一開口405相對之後,利用水平動力裝置使第一閥板401壓向密封殼400,使第一閥板401密封第一開口405。In this embodiment, the side wall of the first valve plate 401 is provided with a sealing device 401b, and the method for sealing the first opening 405 of the first valve plate 401 includes: using an up and down power device to move the first valve plate 401 in the up and down direction Y3, Until the first valve plate 401 is opposite to the first opening 405; when the first valve plate 401 is opposite to the first opening 405, the horizontal power device is used to press the first valve plate 401 against the sealing shell 400 to seal the first valve plate 401 First opening 405.

在本實施例中,第二閥板402的側壁設置有密封裝置402b,第二閥板402密封第二開口406的方法包括:利用上下動力裝置使第二閥板402沿上下方向Y3方向移動,直至第二閥板402與第二開口406相對;當第二閥板402與第二開口406相對之後,利用水平動力裝置使第二閥板402壓向密封殼400,使第二閥板402密封第二開口406。In this embodiment, the side wall of the second valve plate 402 is provided with a sealing device 402b, and the method for the second valve plate 402 to seal the second opening 406 includes: using an up and down power device to move the second valve plate 402 in the up and down direction Y3, Until the second valve plate 402 is opposite to the second opening 406; when the second valve plate 402 is opposite to the second opening 406, the horizontal power device is used to press the second valve plate 402 against the sealing shell 400 to seal the second valve plate 402 The second opening 406.

在本實施例中,第一閥板401的構造與第二閥板402的構造相同,具體的,第一閥板401的側壁設置有密封裝置401b,第二閥板402的側壁設置有密封裝置402b。In this embodiment, the structure of the first valve plate 401 is the same as the structure of the second valve plate 402. Specifically, the side wall of the first valve plate 401 is provided with a sealing device 401b, and the side wall of the second valve plate 402 is provided with a sealing device. 402b.

接下來將以第一閥板401為例進行說明,請參考圖9,圖9是圖8的閥板組件中第一閥板的側視圖。Next, the first valve plate 401 will be used as an example for description. Please refer to FIG. 9, which is a side view of the first valve plate in the valve plate assembly of FIG. 8.

當第一閥板401在上下動力裝置的作用下移動至與第一開口405相對的位置時,第一閥板401的密封裝置401b朝向第一開口405;第一閥板401在水平動力裝置的作用下壓向第一開口405密封第一開口405時,密封裝置401b環繞第一開口405。When the first valve plate 401 moves to a position opposite to the first opening 405 under the action of the upper and lower power devices, the sealing device 401b of the first valve plate 401 faces the first opening 405; When the first opening 405 is pressed to seal the first opening 405 under the action, the sealing device 401b surrounds the first opening 405.

圖10是根據本發明的另一種用於基片處理系統的閥板組件的結構示意圖;圖11是圖10的閥板組件中第一閥板的側視圖。Fig. 10 is a schematic structural diagram of another valve plate assembly for a substrate processing system according to the present invention; Fig. 11 is a side view of a first valve plate in the valve plate assembly of Fig. 10.

請參考圖10,閥板組件包括:第一閥板501;與第一閥板501上下疊放的第二閥板502;位於第一閥板501和第二閥板502外圍的密封殼500,密封殼500沿水平方向X4具有第一開口505和第二開口506;第一驅動裝置503,用於使第一閥板501沿上下方向Y4和水平方向X4運動;第二驅動裝置504,用於使第二閥板502沿上下方向Y4和水平方向X4運動。10, the valve plate assembly includes: a first valve plate 501; a second valve plate 502 stacked up and down with the first valve plate 501; a sealing shell 500 located on the periphery of the first valve plate 501 and the second valve plate 502, The sealing shell 500 has a first opening 505 and a second opening 506 along the horizontal direction X4; a first driving device 503 is used to move the first valve plate 501 in the vertical direction Y4 and the horizontal direction X4; a second driving device 504 is used to move the first valve plate 501 in the vertical direction Y4 and horizontal direction X4 The second valve plate 502 is moved in the vertical direction Y4 and the horizontal direction X4.

在本實施例中,第一開口505的周圍具有第一臺階507;第二開口的周圍具有第二臺階508,第一閥板501具有與第一臺階507匹配的密封臺階501a和位於密封臺階501a上的密封裝置501b;第二閥板502具有與第二臺階508匹配的密封臺階502a和位於密封臺階502a上的密封裝置502b。In this embodiment, the first opening 505 is surrounded by a first step 507; the second opening is surrounded by a second step 508, and the first valve plate 501 has a sealing step 501a that matches the first step 507 and a sealing step 501a. The upper sealing device 501b; the second valve plate 502 has a sealing step 502a matching the second step 508 and a sealing device 502b located on the sealing step 502a.

在其他實施例中,第一開口的周圍具有第一臺階,第二開口的周圍不具有第二臺階,第一閥板具有與第一臺階匹配的密封臺階和位於密封臺階上的密封裝置;或者,第一開口的周圍不具有第一臺階,第二開口的周圍具有第二臺階,第二閥板具有與第二臺階匹配的密封臺階和位於密封臺階上的密封裝置。In other embodiments, there is a first step around the first opening, and there is no second step around the second opening, and the first valve plate has a sealing step matching the first step and a sealing device located on the sealing step; or There is no first step around the first opening, and a second step around the second opening. The second valve plate has a sealing step matching the second step and a sealing device located on the sealing step.

在本實施例中,第一閥板501的形狀與第二閥板502的形狀相同。接下來將以第一閥板501的形狀為例進行說明,請參考圖11,圖11是圖10的閥板組件中第一閥板501的側視圖。In this embodiment, the shape of the first valve plate 501 is the same as the shape of the second valve plate 502. Next, the shape of the first valve plate 501 will be described as an example. Please refer to FIG. 11, which is a side view of the first valve plate 501 in the valve plate assembly of FIG. 10.

當第一閥板501密封第一開口505時,第一閥板501的密封裝置501b與第一開口505的周圍的第一臺階507接觸用於密封第一開口505。When the first valve plate 501 seals the first opening 505, the sealing device 501b of the first valve plate 501 contacts the first step 507 around the first opening 505 to seal the first opening 505.

在其他實施例中,第一閥板與第二閥板的形狀不同,第一閥板與第二閥板中其中一個為圖8中所示的構造,另一個則為圖10中所示的構造。In other embodiments, the shapes of the first valve plate and the second valve plate are different. One of the first valve plate and the second valve plate has the structure shown in FIG. 8 and the other has the structure shown in FIG. 10 structure.

圖12是根據本發明的基片處理系統工作方法的製程流程圖。FIG. 12 is a process flow chart of the working method of the substrate processing system according to the present invention.

請參考圖12,基片處理系統工作方法包含:步驟S1:提供上述基片處理系統;步驟S2:利用第一驅動裝置使第一閥板運動以密封第一基片傳輸口,及/或利用第二驅動裝置使第二閥板運動以密封第二基片傳輸口。12, the working method of the substrate processing system includes: Step S1: Provide the above-mentioned substrate processing system; Step S2: Use the first driving device to move the first valve plate to seal the first substrate transfer port, and/or use The second driving device moves the second valve plate to seal the second substrate transfer port.

第一閥板用於密封第一基片傳輸口,有利於確保第一腔內維持真空環境;第二閥板用於密封第二基片傳輸口,有利於確保第二腔內維持真空環境。當第一閥板需要維護時,使第二閥板密封第二基片傳輸口,則第二腔內仍能維持真空環境,當第二閥板需要維護時,使第一閥板密封第一基片傳輸口,則第一腔內仍能維持真空環境。當進行閥板的維護時,第一腔或者第二腔內仍能維持真空環境,使得第一腔或者第二腔內仍能繼續進行製程處理而無需停機,因此,有利於降低停機頻率,提高待處理基片的處理效率。The first valve plate is used to seal the first substrate transfer port, which is beneficial to ensure that the vacuum environment is maintained in the first cavity; the second valve plate is used to seal the second substrate transfer port, which is beneficial to ensure that the vacuum environment is maintained in the second cavity. When the first valve plate needs maintenance, make the second valve plate seal the second substrate transfer port, and the vacuum environment can still be maintained in the second cavity. When the second valve plate needs maintenance, the first valve plate is sealed to the first valve plate. The substrate transfer port can still maintain a vacuum environment in the first cavity. When the valve plate is maintained, the vacuum environment can still be maintained in the first cavity or the second cavity, so that the process processing can be continued in the first cavity or the second cavity without shutting down. Therefore, it is beneficial to reduce the frequency of downtime and improve The processing efficiency of the substrate to be processed.

雖然本發明揭露如上,但本發明並非限定於此。任何本領域具有通常知識者,在不脫離本發明的精神和範圍內,均可作各種更動與修改,因此本發明的保護範圍應當以申請專利範圍所限定的範圍為準。Although the present invention is disclosed as above, the present invention is not limited to this. Anyone with ordinary knowledge in the field can make various changes and modifications without departing from the spirit and scope of the present invention. Therefore, the protection scope of the present invention should be subject to the scope of the patent application.

100:製程腔 101:傳輸腔 102:負載鎖定腔 200,300:第一腔 201,301:第一基片傳輸口 202,302:第二腔 203,303:第二基片傳輸口 204,304:密封殼 205,305,401,501:第一閥板 205a,206a,305b,306b,401b,402b,501b,502b:密封裝置 206,306,402,502:第二閥板 207,307,403,503:第一驅動裝置 208,308,404,504:第二驅動裝置 209,309,405,505:第一開口 210,310,406,506:第二開口 305a,306a,501a,502a:密封臺階 311,507:第一臺階 312,508:第二臺階 400,500:密封殼 S1,S2:步驟 X1,X2,X3,X4:水平方向 Y1,Y2,Y3,Y4:上下方向100: process cavity 101: Transmission cavity 102: Load lock cavity 200,300: first cavity 201,301: The first substrate transfer port 202,302: second cavity 203, 303: second substrate transfer port 204, 304: sealed shell 205,305,401,501: the first valve plate 205a, 206a, 305b, 306b, 401b, 402b, 501b, 502b: sealing device 206, 306, 402, 502: the second valve plate 207, 307, 403, 503: the first drive device 208, 308, 404, 504: second drive device 209,309,405,505: first opening 210, 310, 406, 506: second opening 305a, 306a, 501a, 502a: sealing steps 311,507: First Step 312,508: second step 400,500: sealed shell S1, S2: steps X1, X2, X3, X4: horizontal direction Y1, Y2, Y3, Y4: up and down direction

圖1是根據本發明的一種基片處理系統的俯視圖; 圖2是根據本發明的一種基片處理系統的剖面結構示意圖; 圖3是圖2的基片處理系統中第一閥板密封第一基片傳輸口的結構示意圖; 圖4是圖2的基片處理系統中第二閥板密封第二基片傳輸口的結構示意圖; 圖5是根據本發明的另一種基片處理系統的剖面結構示意圖; 圖6是圖5的基片處理系統中第一閥板密封第一基片傳輸口的結構示意圖; 圖7是圖5的基片處理系統中第二閥板密封第二基片傳輸口的結構示意圖; 圖8是根據本發明的一種用於基片處理系統的閥板組件的結構示意圖; 圖9是圖8的閥板組件中第一閥板的側視圖; 圖10是根據本發明的另一種用於基片處理系統的閥板組件的結構示意圖; 圖11是圖10的閥板組件中第一閥板的側視圖; 圖12是根據本發明的基片處理系統工作方法的流程圖。Figure 1 is a top view of a substrate processing system according to the present invention; 2 is a schematic diagram of a cross-sectional structure of a substrate processing system according to the present invention; 3 is a schematic view of the structure of the first valve plate sealing the first substrate transfer port in the substrate processing system of FIG. 2; 4 is a schematic structural view of the second valve plate sealing the second substrate transfer port in the substrate processing system of FIG. 2; 5 is a schematic cross-sectional structure diagram of another substrate processing system according to the present invention; 6 is a schematic structural view of the first valve plate sealing the first substrate transfer port in the substrate processing system of FIG. 5; FIG. 7 is a schematic structural view of the second valve plate sealing the second substrate transfer port in the substrate processing system of FIG. 5; FIG. Figure 8 is a schematic structural view of a valve plate assembly for a substrate processing system according to the present invention; Figure 9 is a side view of the first valve plate in the valve plate assembly of Figure 8; Figure 10 is a schematic structural view of another valve plate assembly for a substrate processing system according to the present invention; Figure 11 is a side view of the first valve plate in the valve plate assembly of Figure 10; FIG. 12 is a flowchart of the working method of the substrate processing system according to the present invention.

200:第一腔200: first cavity

201:第一基片傳輸口201: The first substrate transfer port

202:第二腔202: second cavity

203:第二基片傳輸口203: second substrate transfer port

204:密封殼204: Sealed shell

205:第一閥板205: The first valve plate

206:第二閥板206: The second valve plate

207:第一驅動裝置207: The first drive device

208:第二驅動裝置208: second drive device

209:第一開口209: The first opening

210:第二開口210: second opening

X1:水平方向X1: horizontal direction

Y1:上下方向Y1: Up and down direction

Claims (22)

一種基片處理系統,包括: 一第一腔,該第一腔具有一第一基片傳輸口; 一第二腔,該第二腔具有一第二基片傳輸口,該第二腔與該第一腔沿水平方向排布; 位於該第一腔與該第二腔之間的一密封殼,該密封殼與該第一基片傳輸口和該第二基片傳輸口連通; 位於該密封殼內的一第一閥板; 位於該密封殼內的一第二閥板,該第二閥板與該第一閥板上下疊放; 一第一驅動裝置,用於使該第一閥板運動以密封該第一基片傳輸口; 一第二驅動裝置,用於使該第二閥板運動以密封該第二基片傳輸口。A substrate processing system, including: A first cavity, the first cavity having a first substrate transfer port; A second cavity, the second cavity has a second substrate transfer port, the second cavity and the first cavity are arranged in a horizontal direction; A sealed shell located between the first cavity and the second cavity, the sealed shell communicating with the first substrate transfer port and the second substrate transfer port; A first valve plate located in the sealed housing; A second valve plate located in the sealing shell, the second valve plate and the first valve plate are stacked up and down; A first driving device for moving the first valve plate to seal the first substrate transfer port; A second driving device is used to move the second valve plate to seal the second substrate transfer port. 如請求項1所述的基片處理系統,其中該第一驅動裝置和該第二驅動裝置均包括一上下動力裝置和一水平動力裝置,該上下動力裝置用於使該第一閥板或者該第二閥板上下運動,該水平動力裝置用於使該第一閥板或者該第二閥板沿水平方向運動。The substrate processing system according to claim 1, wherein the first driving device and the second driving device both include an up-and-down power device and a horizontal power device, and the up-and-down power device is used to make the first valve plate or the The second valve plate moves up and down, and the horizontal power device is used to move the first valve plate or the second valve plate in a horizontal direction. 如請求項1所述的基片處理系統,其中該密封殼包括一第一開口和一第二開口,該第一開口與該第一基片傳輸口對應,該第二開口與該第二基片傳輸口對應。The substrate processing system according to claim 1, wherein the sealed housing includes a first opening and a second opening, the first opening corresponds to the first substrate transfer port, and the second opening corresponds to the second substrate Corresponding to the film transmission port. 如請求項3所述的基片處理系統,其中當該第一開口的開口面積大於該第一基片傳輸口的開口面積時,該第一閥板用於密封該第一基片傳輸口或該第一開口。The substrate processing system according to claim 3, wherein when the opening area of the first opening is greater than the opening area of the first substrate transfer port, the first valve plate is used to seal the first substrate transfer port or The first opening. 如請求項3所述的基片處理系統,其中當該第一開口的開口面積小於等於該第一基片傳輸口的開口面積時,該第一閥板用於密封該第一開口。The substrate processing system according to claim 3, wherein when the opening area of the first opening is less than or equal to the opening area of the first substrate transfer port, the first valve plate is used to seal the first opening. 如請求項3所述的基片處理系統,其中該第一閥板的側面設置一密封裝置,用於實現與該第一基片傳輸口或該第一開口的緊密貼合。The substrate processing system according to claim 3, wherein a sealing device is provided on the side of the first valve plate to achieve close contact with the first substrate transfer port or the first opening. 如請求項3所述的基片處理系統,其中該第一基片傳輸口的周圍或者該第一開口的周圍具有一第一臺階,該第一閥板設有與該第一臺階匹配的一密封臺階,該第一閥板進一步包括設於該密封臺階上的一密封裝置,該密封裝置用於實現該密封臺階和該第一臺階之間的密封。The substrate processing system according to claim 3, wherein a first step is provided around the first substrate transfer port or the first opening, and the first valve plate is provided with a first step matching the first step. A sealing step, the first valve plate further includes a sealing device arranged on the sealing step, and the sealing device is used to achieve a seal between the sealing step and the first step. 如請求項3所述的基片處理系統,其中當該第二開口的開口面積大於該第二基片傳輸口的開口面積時,該第二閥板用於密封該第二基片傳輸口或該第二開口。The substrate processing system according to claim 3, wherein when the opening area of the second opening is larger than the opening area of the second substrate transfer port, the second valve plate is used to seal the second substrate transfer port or The second opening. 如請求項3所述的基片處理系統,其中當該第二開口的開口面積小於等於該第二基片傳輸口的開口面積時,該第二閥板用於密封該第二開口。The substrate processing system according to claim 3, wherein when the opening area of the second opening is less than or equal to the opening area of the second substrate transfer port, the second valve plate is used to seal the second opening. 如請求項3所述的基片處理系統,其中該第二閥板的側面設置一密封裝置,用於實現與該第二基片傳輸口或該第二開口的緊密貼合。The substrate processing system according to claim 3, wherein a sealing device is provided on the side of the second valve plate to achieve close contact with the second substrate transfer port or the second opening. 如請求項3所述的基片處理系統,其中該第二基片傳輸口的周圍或者該第二開口的周圍具有一第二臺階,該第二閥板設有與該第二臺階匹配的一密封臺階,該第二閥板進一步包括設於該密封臺階上的一密封裝置,該密封裝置用於實現該密封臺階和該第二臺階之間的密封。The substrate processing system according to claim 3, wherein a second step is provided around the second substrate transfer port or the second opening, and the second valve plate is provided with a second step matching the second step. A sealing step, the second valve plate further includes a sealing device arranged on the sealing step, and the sealing device is used to achieve a seal between the sealing step and the second step. 如請求項1所述的基片處理系統,其中該第一腔為一製程腔,該第二腔為一傳輸腔。The substrate processing system according to claim 1, wherein the first cavity is a process cavity, and the second cavity is a transfer cavity. 如請求項12所述的基片處理系統,其中當該製程腔的個數大於1個時,大於1個的該製程腔環繞該傳輸腔;各該製程腔與該傳輸腔之間均具有該第一閥板、該第二閥板和該密封殼。The substrate processing system according to claim 12, wherein when the number of the process chambers is greater than one, the process chambers greater than one surround the transfer chamber; each of the process chambers and the transfer chamber has the The first valve plate, the second valve plate and the sealing shell. 如請求項1所述的基片處理系統,其中該第一腔為一負載鎖定腔,該第二腔為一傳輸腔。The substrate processing system according to claim 1, wherein the first cavity is a load lock cavity, and the second cavity is a transfer cavity. 如請求項1所述的基片處理系統,其中該第一閥板與該第二閥板的大小相等或者不相等。The substrate processing system according to claim 1, wherein the size of the first valve plate and the second valve plate are equal or not equal. 一種用於基片處理系統的閥板組件,包括: 一第一閥板; 與該第一閥板上下疊放的一第二閥板; 位於該第一閥板和該第二閥板外圍的一密封殼,該密封殼沿水平方向具有一第一開口和一第二開口; 一第一驅動裝置,用於使該第一閥板沿上下方向和水平方向運動; 一第二驅動裝置,用於使該第二閥板沿上下方向和水平方向運動。A valve plate assembly for a substrate processing system, including: A first valve plate; A second valve plate stacked up and down with the first valve plate; A sealing shell located on the periphery of the first valve plate and the second valve plate, the sealing shell having a first opening and a second opening along the horizontal direction; A first driving device for moving the first valve plate in the vertical and horizontal directions; A second driving device is used to move the second valve plate in the vertical and horizontal directions. 如請求項16所述的閥板組件,其中該第一閥板和該第二閥板均包括一密封裝置。The valve plate assembly according to claim 16, wherein the first valve plate and the second valve plate both include a sealing device. 如請求項17所述的閥板組件,其中該密封裝置設置於該第一閥板及/或該第二閥板的側壁。The valve plate assembly according to claim 17, wherein the sealing device is disposed on a side wall of the first valve plate and/or the second valve plate. 如請求項17所述的閥板組件,其中該第一開口的周圍設置有一第一臺階,該第一閥板設有與該第一臺階匹配的一密封臺階,該第一閥板的該密封裝置位於該密封臺階上;該第二開口的周圍設置有一第二臺階,該第二閥板設置有與該第二臺階匹配的該密封臺階,該第二閥板的該密封裝置位於該密封臺階上。The valve plate assembly according to claim 17, wherein a first step is provided around the first opening, the first valve plate is provided with a sealing step matching the first step, and the sealing of the first valve plate The device is located on the sealing step; a second step is provided around the second opening, the second valve plate is provided with the sealing step matching the second step, and the sealing device of the second valve plate is located on the sealing step superior. 如請求項16所述的閥板組件,其中該第一驅動裝置和該第二驅動裝置均包括一上下動力裝置和一水平動力裝置,該上下動力裝置用於使該第一閥板或者該第二閥板上下運動,該水平動力裝置用於使該第一閥板或者該第二閥板沿水平方向運動。The valve plate assembly according to claim 16, wherein the first driving device and the second driving device each include an up-and-down power device and a horizontal power device, and the up-and-down power device is used to make the first valve plate or the second The two valve plates move up and down, and the horizontal power device is used to move the first valve plate or the second valve plate in a horizontal direction. 一種基片處理系統的工作方法,包括: 提供如請求項1至請求項15中之任意一項所述的基片處理系統; 利用該第一驅動裝置使該第一閥板運動密封該第一基片傳輸口,及/或利用該第二驅動裝置使該第二閥板運動密封該第二基片傳輸口。A working method of a substrate processing system includes: Provide the substrate processing system according to any one of claim 1 to 15; The first drive device is used to move the first valve plate to seal the first substrate transfer port, and/or the second drive device is used to move the second valve plate to seal the second substrate transfer port. 如請求項21所述的工作方法,其中當該第一閥板密封該第一基片傳輸口時,更換該第二閥板;或者,當該第二閥板密封該第二基片傳輸口時,更換該第一閥板。The working method according to claim 21, wherein when the first valve plate seals the first substrate transfer port, the second valve plate is replaced; or, when the second valve plate seals the second substrate transfer port When, replace the first valve plate.
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