TWI632971B - Laser processing apparatus and laser processing method - Google Patents
Laser processing apparatus and laser processing method Download PDFInfo
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- TWI632971B TWI632971B TW105125219A TW105125219A TWI632971B TW I632971 B TWI632971 B TW I632971B TW 105125219 A TW105125219 A TW 105125219A TW 105125219 A TW105125219 A TW 105125219A TW I632971 B TWI632971 B TW I632971B
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- 238000003672 processing method Methods 0.000 title claims abstract description 6
- 230000003287 optical effect Effects 0.000 claims description 44
- 238000005286 illumination Methods 0.000 claims description 22
- 238000003384 imaging method Methods 0.000 claims description 11
- 238000000034 method Methods 0.000 description 16
- 230000002411 adverse Effects 0.000 description 3
- 230000001678 irradiating effect Effects 0.000 description 3
- 239000000470 constituent Substances 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 210000001747 pupil Anatomy 0.000 description 2
- 229910021417 amorphous silicon Inorganic materials 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 1
- 238000003754 machining Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
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Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
- B23K26/03—Observing, e.g. monitoring, the workpiece
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
- B23K26/04—Automatically aligning, aiming or focusing the laser beam, e.g. using the back-scattered light
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
- B23K26/04—Automatically aligning, aiming or focusing the laser beam, e.g. using the back-scattered light
- B23K26/046—Automatically focusing the laser beam
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
- B23K26/06—Shaping the laser beam, e.g. by masks or multi-focusing
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
- B23K26/06—Shaping the laser beam, e.g. by masks or multi-focusing
- B23K26/067—Dividing the beam into multiple beams, e.g. multifocusing
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/70—Auxiliary operations or equipment
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- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Mechanical Engineering (AREA)
- Laser Beam Processing (AREA)
Abstract
本發明揭示一種雷射加工裝置與雷射加工方法。本發明所揭示的雷射加工裝置包括:光束產生部,出射多個雷射束;多個掃描儀,對自上述光束產生部出射的多個雷射束的路徑進行調節;及遠心透鏡部,供自上述掃描儀反射的雷射束入射,以使所入射的雷射束垂直地入射至加工物的方式對上述雷射束進行聚光。 The invention discloses a laser processing device and a laser processing method. A laser processing apparatus according to the present invention includes: a light beam generating unit that emits a plurality of laser beams; a plurality of scanners that adjust paths of a plurality of laser beams emitted from the light beam generating unit; and a telecentric lens unit, The laser beam reflected from the scanner is incident to converge the laser beam in such a manner that the incident laser beam is incident perpendicularly to the workpiece.
Description
本發明揭示一種雷射加工裝置,且揭示一種可對雷射束照射至加工物的位置及角度進行調節的雷射加工裝置。The present invention discloses a laser processing apparatus and discloses a laser processing apparatus that can adjust the position and angle of a laser beam irradiated to a workpiece.
通常,雷射加工製程是指向加工物的表面掃描雷射束而對加工物表面的形狀或物理性質等進行加工的製程。此種加工物可有多個例,且其形狀可為二維平面形狀。作為雷射加工製程的一例,可列舉藉由在矽晶圓上掃描雷射束使非晶矽(amorphous silicon)膜結晶化而形成為多晶矽(polysilicone)膜的製程。Generally, a laser processing process is a process of processing a laser beam toward a surface of a workpiece to process a shape or a physical property of the surface of the workpiece. Such a workpiece may have a plurality of examples, and its shape may be a two-dimensional planar shape. As an example of the laser processing process, a process of forming a polysilicone film by crystallizing an amorphous silicon film by scanning a laser beam on a germanium wafer is exemplified.
此種加工製程的產物的品質依存於雷射束照射至加工物的位置、方向、時間等。於雷射加工製程中,將自光源出射的光束分割成多個而同時進行照射、或藉由操作掃描儀而移動自光源出射的雷射束照射至加工物的位置。然而,於此種情形時,雷射束照射至加工物的角度根據雷射束的路徑而發生變化。另外,因此而藉由雷射束形成的加工物的加工形狀發生變化,從而會對雷射加工品質造成不良影響。The quality of the product of such a processing depends on the position, direction, time, etc. of the laser beam irradiated to the workpiece. In the laser processing process, the light beam emitted from the light source is divided into a plurality of beams while being irradiated, or the laser beam emitted from the light source is moved to the position of the workpiece by operating the scanner. However, in this case, the angle at which the laser beam is irradiated to the workpiece changes depending on the path of the laser beam. Further, as a result, the processed shape of the workpiece formed by the laser beam changes, which adversely affects the laser processing quality.
因此,即便同時照射多個雷射束或變更雷射束的照射位置,亦需固定地保持雷射束照射至加工物的角度。並且,為了精確地控制加工位置,需要一種可觀測雷射加工製程的過程的觀測技術。Therefore, even if a plurality of laser beams are irradiated at the same time or the irradiation position of the laser beam is changed, it is necessary to fixedly maintain the angle at which the laser beam is irradiated to the workpiece. Moreover, in order to accurately control the machining position, an observation technique that can observe the process of the laser processing process is required.
[發明欲解決的課題] 本發明提供一種為了進行雷射加工製程,將自雷射光源射出的雷射束分割成測定光束與加工光束,之後對測定光束的光特性進行測定,藉此可判斷雷射束是否不良的雷射測定裝置、雷射加工系統及雷射測定方法。 [解決課題的手段][Problem to be Solved by the Invention] The present invention provides a laser beam processing process for dividing a laser beam emitted from a laser light source into a measuring beam and a processing beam, and then measuring the optical characteristics of the measuring beam. A laser measuring device, a laser processing system, and a laser measuring method that are defective in the laser beam. [Means for solving the problem]
於一觀點中,提供一種雷射加工裝置,其包括: 光束產生部,出射多個雷射束; 多個掃描儀,對自上述光束產生部出射的多個雷射束的路徑進行調節;及 遠心透鏡部,供自上述掃描儀反射的雷射束入射,以使所入射的雷射束垂直地入射至加工物的方式對上述雷射束進行聚光。In one aspect, a laser processing apparatus includes: a beam generating portion that emits a plurality of laser beams; and a plurality of scanners that adjust paths of a plurality of laser beams emitted from the beam generating portion; The telecentric lens portion is incident on a laser beam reflected from the scanner to condense the laser beam so that the incident laser beam is incident perpendicularly to the workpiece.
自上述掃描儀反射的雷射束可通過上述遠心透鏡部的光圈中心。The laser beam reflected from the scanner can pass through the center of the aperture of the telecentric lens portion.
上述雷射加工裝置可更包括對上述掃描儀的位置及角度進行調節的掃描儀驅動部。The above laser processing apparatus may further include a scanner driving unit that adjusts the position and angle of the scanner.
上述掃描儀驅動部能夠以使自上述掃描儀反射的雷射束通過上述遠心透鏡部的光圈中心的方式對上述掃描儀的位置及角度進行調節。The scanner driving unit can adjust the position and angle of the scanner such that the laser beam reflected from the scanner passes through the center of the aperture of the telecentric lens unit.
上述雷射加工裝置可更包括拍攝部,上述拍攝部用以拍攝自上述遠心透鏡部出射的雷射束照射至上述加工物的情形。The laser processing apparatus may further include an imaging unit that captures a case where a laser beam emitted from the telecentric lens unit is irradiated onto the processed object.
上述雷射加工裝置可更包括設置於上述遠心透鏡部的光圈的分色鏡。The above laser processing apparatus may further include a dichroic mirror provided on the aperture of the telecentric lens portion.
上述雷射加工裝置可更包括向上述分色鏡照射照明光的照明光源。The above laser processing apparatus may further include an illumination source that illuminates the dichroic mirror with illumination light.
上述分色鏡能夠以如下方式形成:針對上述雷射束的波長而使光透射,針對照明光的波長而使光反射。The dichroic mirror can be formed by transmitting light for the wavelength of the laser beam and reflecting the light for the wavelength of the illumination light.
於另一觀點中,提供一種雷射加工裝置,其包括: 光源; 繞射光學元件(Diffractive Optical Element,DOE),將自上述光源出射的光束分割成至少兩個光束以上; 遠心透鏡部,使由上述繞射光學元件分割所得的光束垂直地入射至加工物。In another aspect, a laser processing apparatus is provided, comprising: a light source; a diffractive optical element (DOE) that divides a light beam emitted from the light source into at least two light beams; and a telecentric lens portion The light beam split by the above-described diffractive optical element is incident perpendicularly to the workpiece.
上述雷射加工裝置可更包括對上述第一繞射光學元件的旋轉角度進行控制的旋轉台。The above laser processing apparatus may further include a rotary table that controls a rotation angle of the first diffractive optical element.
於另一觀點中,提供一種雷射加工方法,其包括如下步驟: 出射多個雷射束的光束出射步驟; 以使於上述光束出射步驟中出射的多個雷射束入射至遠心透鏡部的方式對上述雷射束的光路徑進行調節的步驟;及 利用上述遠心透鏡部以使上述雷射束垂直地入射至加工物的方式對上述雷射束進行聚光的步驟。In another aspect, a laser processing method is provided, comprising the steps of: emitting a beam of light from a plurality of laser beams; and causing a plurality of laser beams emitted from the beam exiting step to be incident on the telecentric lens portion a step of adjusting a light path of the laser beam; and a step of concentrating the laser beam by the telecentric lens portion to vertically inject the laser beam into a workpiece.
上述雷射加工方法可包括如下步驟:向設置於上述遠心透鏡部的光圈的分色鏡照射照明光的步驟;及 藉由對由上述加工物反射的上述照明光進行測定而拍攝上述雷射束照射至上述加工物的情形的步驟。 [發明效果]The laser processing method may include the steps of: irradiating illumination light to a dichroic mirror provided on the aperture of the telecentric lens portion; and capturing the laser beam by measuring the illumination light reflected by the processed object; The step of irradiating to the above-mentioned processed object. [Effect of the invention]
根據實施例,提供一種即便聚光光學系統發生變動、加工物的厚度發生變化,亦可精確且穩定地檢測加工光束的聚光點位置的聚光點檢測裝置。According to the embodiment, there is provided a concentrating point detecting device capable of accurately and stably detecting the position of a condensing point of a processing beam even if the concentrating optical system fluctuates and the thickness of the workpiece changes.
於以下圖式中,相同的參照符號表示相同的構成要素,為了說明的明確性及便利性,可於圖中誇張地表示各構成要素的尺寸。另一方面,以下所說明的實施例僅為示例,可根據這些實施例實現各種變形。In the following drawings, the same reference numerals are given to the same components, and the size of each component may be exaggerated in the drawing for clarity and convenience of description. On the other hand, the embodiments described below are merely examples, and various modifications can be made according to the embodiments.
第1、第2等用語可用於說明各種構成要素,但構成要素不應受用語的限定。用語僅以自其他構成要素區分一個構成要素為目的而使用。Terms such as the first and second terms can be used to describe various constituent elements, but the constituent elements should not be limited by the terms. The term is used only for the purpose of distinguishing one component from other components.
只要未於文中明確地表示其他含義,則單數的表達包括複數的表達。並且,於記載為某個部分“包括”某個構成要素時,只要無特別相反的記載,則意味著可更包括其他構成要素,而並非是指排除其他構成要素。As long as the other meanings are not explicitly indicated in the text, the singular expression includes the plural expression. In addition, when a part is "included" as a certain component, unless otherwise indicated, it means that it may include other components, and does not mean that other components are excluded.
並且,說明書中所記載的“…部”、“模組”等用語是指對至少一個功能或動作進行處理的單位。Further, terms such as "parts" and "modules" described in the specification refer to units that process at least one function or operation.
圖1是表示雷射束藉由普通的聚焦透鏡部10而聚光的情況的圖。於圖1中,表示透鏡部10包括第一透鏡12、第二透鏡14、第三透鏡16與第四透鏡18的例,但上述內容僅為示例,可改變透鏡部10所包括的透鏡的個數及形狀。FIG. 1 is a view showing a state in which a laser beam is collected by a normal focus lens unit 10. In FIG. 1, an example in which the lens portion 10 includes the first lens 12, the second lens 14, the third lens 16, and the fourth lens 18 is shown, but the above is merely an example, and the lens included in the lens portion 10 can be changed. Number and shape.
參照圖1,通過透鏡部10的光圈(aperture)的光束可經由透鏡部10而於聚光面形成聚光點P0、P1、P2。與透鏡部10的光軸平行地入射的光束的中心光可垂直地照射至聚光面。即,中心光與聚光面之間的角度θ0可接近90度。然而,不與透鏡部10的光軸平行地入射的光束的中心光會不垂直地照射至聚光面。例如,形成聚光點P1的光束的中心光與聚光面之間的角度θ1可變得小於90度。並且,形成聚光點P2的光束的中心光與聚光面之間的角度θ2可變得更小於θ1。即,透鏡部10的光軸與聚光點之間的距離越遠,則光束的中心光與聚光面之間的角度會越小。Referring to Fig. 1, a light beam passing through an aperture of the lens portion 10 can form light collecting points P0, P1, and P2 on the light collecting surface via the lens portion 10. The center light of the light beam incident in parallel with the optical axis of the lens portion 10 can be vertically irradiated to the light collecting surface. That is, the angle θ0 between the center light and the condensing surface can be close to 90 degrees. However, the center light of the light beam that is not incident parallel to the optical axis of the lens portion 10 is not perpendicularly irradiated to the light collecting surface. For example, the angle θ1 between the center light of the light beam forming the light collecting point P1 and the condensing surface may become less than 90 degrees. Further, the angle θ2 between the center light of the light beam forming the light collecting point P2 and the condensing surface may become smaller than θ1. That is, the farther the distance between the optical axis of the lens portion 10 and the light collecting point is, the smaller the angle between the center light of the light beam and the light collecting surface is.
如圖1所示,即便光束照射至透鏡部10的光圈內部,雷射束於聚光面聚光的形狀及入射角度亦會根據入射角而發生變化。As shown in FIG. 1, even if a light beam is irradiated to the inside of the aperture of the lens portion 10, the shape and incident angle of the laser beam collected on the condensing surface change depending on the incident angle.
圖2A與圖2B是概略性地表示藉由通過圖1所示的透鏡部10的雷射束形成的雷射加工形狀的圖。圖2A表示於透鏡部10的光軸附近、即聚光點P0的附近實現雷射加工的情況。並且,圖2B表示於脫離透鏡部10的光軸的位置、即聚光點P1、P2的附近實現雷射加工的情況。2A and 2B are views schematically showing a laser processed shape formed by a laser beam passing through the lens portion 10 shown in Fig. 1. FIG. 2A shows a case where laser processing is performed in the vicinity of the optical axis of the lens unit 10, that is, in the vicinity of the condensing point P0. 2B shows a case where laser processing is performed at a position away from the optical axis of the lens unit 10, that is, in the vicinity of the light collecting points P1 and P2.
參照圖2A,於透鏡部10的光軸附近,雷射束的中心光垂直地照射至加工物,因此雷射加工形狀可呈對稱的形狀。相反地,參照圖2B,於脫離透鏡部10的光軸的位置,雷射束的中心光傾斜地照射至加工物,因此雷射加工形狀會改變。若如上所述般雷射加工形狀改變,則會對雷射加工品質造成不良影響。Referring to FIG. 2A, in the vicinity of the optical axis of the lens portion 10, the center light of the laser beam is vertically irradiated to the workpiece, and thus the laser processed shape may have a symmetrical shape. Conversely, referring to FIG. 2B, at the position of the optical axis of the lens portion 10, the center light of the laser beam is obliquely irradiated to the workpiece, and thus the laser processing shape is changed. If the shape of the laser processing changes as described above, it will adversely affect the laser processing quality.
圖3是表示雷射束照射至例示性的實施例的遠心透鏡部20的情形的圖。FIG. 3 is a view showing a state in which a laser beam is irradiated to the telecentric lens portion 20 of the exemplary embodiment.
參照圖3,通過遠心透鏡部20的光圈中心C的光可與入射角無關而始終垂直地照射至入射面。遠心透鏡部20的出射光瞳(Exit pupil)接近無限大,故而照射至光圈的光可與入射角無關地以相同的形狀聚光。然而,聚光點的位置會根據照射至光圈的入射束的入射角而發生變化。作為示例,入射束的入射角、聚光點與光軸之間的距離可滿足如[式1]的關係。Referring to Fig. 3, the light passing through the center C of the aperture of the telecentric lens portion 20 can be uniformly irradiated to the incident surface at all times regardless of the incident angle. Since the exit pupil of the telecentric lens portion 20 is close to infinity, the light irradiated to the aperture can be collected in the same shape regardless of the incident angle. However, the position of the condensed spot changes depending on the incident angle of the incident beam irradiated to the aperture. As an example, the incident angle of the incident beam, the distance between the condensed spot and the optical axis may satisfy the relationship as in [Formula 1].
[式1] h=f×θ[Formula 1] h=f×θ
於式1中,h表示聚光點與遠心透鏡部20的光軸之間的距離,f表示遠心透鏡部20的有效焦距,θ表示遠心透鏡部20的光軸與入射束之間的角度。參照[式1],可知遠心透鏡部20的光軸與入射束之間的角度越大,則聚光點與遠心透鏡部20的光軸之間距離亦越大。因此,可藉由對入射束的入射方向進行調節而調節聚光點的位置。例如,於圖3中,相對於光軸以α1的角度入射的光束可於遠離光軸h1=f*α1的位置形成聚光點。並且,相對於光軸以α2的角度入射的光束可於遠離光軸h2=f*α2的位置形成聚光點。In Formula 1, h represents the distance between the condensed point and the optical axis of the telecentric lens portion 20, f represents the effective focal length of the telecentric lens portion 20, and θ represents the angle between the optical axis of the telecentric lens portion 20 and the incident beam. Referring to [Formula 1], it is understood that the larger the angle between the optical axis of the telecentric lens portion 20 and the incident beam, the larger the distance between the light collecting point and the optical axis of the telecentric lens portion 20. Therefore, the position of the condensed spot can be adjusted by adjusting the incident direction of the incident beam. For example, in FIG. 3, a light beam incident at an angle of α1 with respect to the optical axis may form a light collecting point at a position away from the optical axis h1=f*α1. Further, the light beam incident at an angle of α2 with respect to the optical axis can form a light collecting point at a position away from the optical axis h2=f*α2.
於圖3中,表示遠心透鏡部20包括一個凹透鏡22、兩個凸透鏡26、28、及左側凹陷且右側凸出的透鏡24的例。然而,遠心透鏡部20亦可呈可使入射於光圈中心C的光平行地出射的其他任意的透鏡排列。於本發明中,為了有助於理解發明而圖示光圈29,但光圈是用以表示透鏡特性的位置及範圍者,可並非為實際存在的構件。如上所述,通過遠心透鏡的光圈的光束的出射光瞳(Exit pupil)可為無限大,入射至光圈的光可與入射角無光地以相同的形狀聚光。圖4是概略性地表示例示性的實施例的雷射加工裝置的圖。圖4所示的雷射加工裝置可包括圖3所示的遠心透鏡部20。方便起見,於圖4中將遠心透鏡部20簡單地表示為方塊。In FIG. 3, the telecentric lens portion 20 is shown to include a concave lens 22, two convex lenses 26, 28, and a lens 24 that is recessed on the left side and protruded on the right side. However, the telecentric lens portion 20 may be any other lens arrangement that allows light incident on the center C of the aperture to be emitted in parallel. In the present invention, the aperture 29 is illustrated to facilitate understanding of the invention, but the aperture is a position and a range for indicating the characteristics of the lens, and may not be a member actually present. As described above, the exit pupil of the light beam passing through the aperture of the telecentric lens can be infinite, and the light incident to the aperture can be condensed in the same shape as the incident angle without light. Fig. 4 is a view schematically showing a laser processing apparatus of an exemplary embodiment. The laser processing apparatus shown in FIG. 4 may include the telecentric lens portion 20 shown in FIG. For convenience, the telecentric lens portion 20 is simply shown as a square in FIG.
參照圖4,例示性的實施例的雷射加工裝置可包括:光束產生部(未圖示),出射多個雷射束;多個掃描儀32、34、36、38,對自光束產生部(未圖示)出射的多個雷射束的路徑進行調節;及遠心透鏡部20,供自多個掃描儀32、34、36、38反射的雷射束照射,以使所入射的雷射束垂直地照射至加工物的方式對上述雷射束進行聚光。Referring to FIG. 4, the laser processing apparatus of the exemplary embodiment may include a beam generating portion (not shown) that emits a plurality of laser beams, and a plurality of scanners 32, 34, 36, 38 for the self-beam generating portion. The path of the plurality of laser beams (not shown) is adjusted; and the telecentric lens portion 20 is irradiated with laser beams reflected from the plurality of scanners 32, 34, 36, 38 to cause the incident laser The above-described laser beam is condensed in such a manner that the beam is irradiated perpendicularly to the workpiece.
如圖4所示,光束產生部(未圖示)可使第一光束至第四光束L1、L2、L3、L4分別入射至第一掃描儀至第四掃描儀32、34、36、38。光束產生部的構成可實現各種變更。例如,光束產生部可包括多個光源。作為另一例,光束產生部亦可包括:一個光源;及分光光學系統,將自上述一個光源出射的光束分割成多個光束L1、L2、L3、L4而傳遞至第一掃描儀至第四掃描儀32、34、36、38。As shown in FIG. 4, the light beam generating portion (not shown) may cause the first to fourth light beams L1, L2, L3, L4 to be incident on the first to fourth scanners 32, 34, 36, 38, respectively. The configuration of the light beam generating portion can be variously changed. For example, the light beam generating portion may include a plurality of light sources. As another example, the light beam generating unit may further include: a light source; and a spectroscopic optical system that splits the light beam emitted from the one light source into the plurality of light beams L1, L2, L3, and L4 and transmits the first to fourth scans to the fourth scan Instruments 32, 34, 36, 38.
第一掃描儀至第四掃描儀32、34、36、38可使第一光束至第四光束L1、L2、L3、L4穿過遠心透鏡部20的光圈29的中心C。此處,遠心透鏡部20的光圈29的開口位置及尺寸可根據遠心透鏡部20的尺寸及透鏡特性而發生變化。因此,第一掃描儀至第四掃描儀32、34、36、38的位置及排列角度亦可根據遠心透鏡部20的尺寸及透鏡特性而發生變化。The first to fourth scanners 32, 34, 36, 38 may pass the first to fourth light beams L1, L2, L3, L4 through the center C of the aperture 29 of the telecentric lens portion 20. Here, the opening position and size of the diaphragm 29 of the telecentric lens portion 20 can be changed according to the size of the telecentric lens portion 20 and the lens characteristics. Therefore, the positions and arrangement angles of the first to fourth scanners 32, 34, 36, 38 may also vary depending on the size of the telecentric lens portion 20 and the lens characteristics.
若第一光束至第四光束L1、L2、L3、L4藉由第一掃描儀至第四掃描儀32、34、36、38而穿過遠心透鏡部20的光圈29的中心C,則第一光束至第四光束L1、L2、L3、L4可穿過遠心透鏡部20而彼此平行地照射至加工物5。即,第一光束至第四光束L1、L2、L3、L4能夠以相同的角度照射至加工物5。藉此,多個雷射束L1、L2、L3、L4能夠以相同的方向及相同的光束形狀照射至加工物5。使多個雷射束L1、L2、L3、L4以相同的特性一次照射至加工物5,藉此可提高雷射加工速度,提高雷射加工品質。If the first to fourth beams L1, L2, L3, L4 pass through the center C of the aperture 29 of the telecentric lens portion 20 by the first to fourth scanners 32, 34, 36, 38, the first The light beam to the fourth light beams L1, L2, L3, L4 may pass through the telecentric lens portion 20 and be irradiated to the workpiece 5 in parallel with each other. That is, the first to fourth light beams L1, L2, L3, and L4 can be irradiated to the workpiece 5 at the same angle. Thereby, the plurality of laser beams L1, L2, L3, and L4 can be irradiated to the workpiece 5 in the same direction and the same beam shape. By irradiating the plurality of laser beams L1, L2, L3, and L4 with the same characteristics to the workpiece 5 at a time, the laser processing speed can be improved and the laser processing quality can be improved.
於圖4中,表示第一掃描儀至第四掃描儀32、34、36、38的位置及角度固定而使相同特性的雷射束L1、L2、L3、L4一次入射至加工物5的例。然而,實施例並不限制於此。4, an example in which the positions and angles of the first to fourth scanners 32, 34, 36, and 38 are fixed so that the laser beams L1, L2, L3, and L4 having the same characteristics are incident on the workpiece 5 at a time are shown. . However, the embodiment is not limited to this.
圖5是概略性地表示另一例示性的實施例的雷射加工裝置的圖。於對圖5的實施例進行說明時,省略與圖4重複的內容。Fig. 5 is a view schematically showing a laser processing apparatus according to another exemplary embodiment. When the embodiment of FIG. 5 is described, the content overlapping with FIG. 4 is omitted.
參照圖5,例示性的實施例的雷射加工裝置可包括:光束產生部(未圖示),出射第一雷射束L1與第二雷射束L2;及第一掃描儀31與第二掃描儀33,分別照射第一光束L1與第二光束L2。此處,自光束產生部(未圖示)出射的雷射束的個數及掃描儀的個數僅為示例,並不限制於此。於圖5所示的實施例中,第一掃描儀31及第二掃描儀33的位置及角度可發生變化。因此,第一光束L1及第二光束L2於加工物5形成聚光點的位置亦可根據第一掃描儀31及第二掃描儀33的位置及角度而發生變化。Referring to FIG. 5, the laser processing apparatus of the exemplary embodiment may include: a light beam generating portion (not shown) that emits the first laser beam L1 and the second laser beam L2; and the first scanner 31 and the second The scanner 33 illuminates the first light beam L1 and the second light beam L2, respectively. Here, the number of laser beams emitted from the light beam generating unit (not shown) and the number of scanners are merely examples, and are not limited thereto. In the embodiment shown in FIG. 5, the positions and angles of the first scanner 31 and the second scanner 33 may vary. Therefore, the positions at which the first light beam L1 and the second light beam L2 form the light collecting point in the workpiece 5 may be changed according to the positions and angles of the first scanner 31 and the second scanner 33.
雖未圖示,但例示性的實施例的雷射加工裝置可包括對第一掃描儀31及第二掃描儀33的位置及角度進行調節的掃描儀驅動部(未圖示)。掃描儀驅動部可對掃描儀31、33的位置及排列角度進行調節。掃描儀驅動部能夠以使自掃描儀31、33反射的光束L1、L2通過遠心透鏡部20的光圈29的中心的方式對掃描儀31、33的位置及角度進行調節。Although not shown, the laser processing apparatus of the exemplary embodiment may include a scanner driving unit (not shown) that adjusts the position and angle of the first scanner 31 and the second scanner 33. The scanner driving section can adjust the position and arrangement angle of the scanners 31, 33. The scanner driving unit can adjust the positions and angles of the scanners 31 and 33 so that the light beams L1 and L2 reflected from the scanners 31 and 33 pass through the center of the diaphragm 29 of the telecentric lens unit 20.
圖6是表示掃描儀驅動部對掃描儀的位置及角度進行調節的例的圖。Fig. 6 is a view showing an example in which the scanner driving unit adjusts the position and angle of the scanner.
參照圖6,於掃描儀與自光源50射出的光束形成β1的角度時,自掃描儀反射的光束L1可沿遠心透鏡部20的光軸穿過遠心透鏡部20的光圈29的中心而垂直地照射至加工物5。此處,為了改變光束聚光至加工物5的位置,可如參照[式1]進行的說明般變更自掃描儀反射的光束的行進方向與遠心透鏡部20的光軸之間的角度。然而,若調節自掃描儀反射的光束的角度,則自掃描儀反射的光束L21會不通過遠心透鏡部20的光圈29的中心C。於是,即便光束L21通過遠心透鏡部20,亦會傾斜地照射至加工物5。Referring to FIG. 6, when the scanner forms an angle of β1 with the light beam emitted from the light source 50, the light beam L1 reflected from the scanner can pass vertically along the optical axis of the telecentric lens portion 20 through the center of the aperture 29 of the telecentric lens portion 20 Irradiation to the workpiece 5. Here, in order to change the position where the light beam is condensed to the workpiece 5, the angle between the traveling direction of the light beam reflected from the scanner and the optical axis of the telecentric lens portion 20 can be changed as described with reference to [Formula 1]. However, if the angle of the light beam reflected from the scanner is adjusted, the light beam L21 reflected from the scanner will not pass through the center C of the aperture 29 of the telecentric lens portion 20. Then, even if the light beam L21 passes through the telecentric lens portion 20, it is obliquely irradiated to the workpiece 5.
因此,能夠以使自掃描儀反射的光束通過遠心透鏡部20的光圈29的中心C的方式變更掃描儀的位置。即,藉由將掃描儀的角度自β1變更為β2,可將掃描儀的位置自P1變更為P2。藉此,自掃描儀反射的光束L22垂直地照射至加工物5,從而可變更光束L22照射至加工物5的位置。Therefore, the position of the scanner can be changed such that the light beam reflected from the scanner passes through the center C of the diaphragm 29 of the telecentric lens portion 20. That is, by changing the angle of the scanner from β1 to β2, the position of the scanner can be changed from P1 to P2. Thereby, the light beam L22 reflected from the scanner is irradiated perpendicularly to the workpiece 5, and the position where the light beam L22 is irradiated to the workpiece 5 can be changed.
為了精確地控制圖6所示的掃描儀驅動部的動作等,需隨時測定雷射加工製程的過程。為此,圖4及圖5所示的例示性的實施例的雷射加工裝置可更包括拍攝部,上述拍攝部用以拍攝自遠心透鏡部20出射的雷射束照射至加工物5的情形。以下,參照圖式,對圖5所示的實施例的雷射加工裝置更包括拍攝部的例進行說明。In order to accurately control the operation of the scanner driving unit shown in Fig. 6, it is necessary to measure the course of the laser processing process at any time. For this reason, the laser processing apparatus of the exemplary embodiment shown in FIG. 4 and FIG. 5 may further include an imaging unit for capturing the case where the laser beam emitted from the telecentric lens unit 20 is irradiated to the workpiece 5 . . Hereinafter, an example in which the laser processing apparatus of the embodiment shown in FIG. 5 further includes an imaging unit will be described with reference to the drawings.
圖7是表示另一例示性的實施例的雷射加工裝置的圖。Fig. 7 is a view showing a laser processing apparatus of another exemplary embodiment.
參照圖7,實施例的雷射加工裝置可更包括拍攝部90。拍攝部90是用以拍攝自加工物5的表面反射的照明光的裝置,可包括電荷耦合(Charge Coupled Device,CCD)相機92及聚光透鏡94。CCD相機92僅為示例,亦可由可進行光感測的其他構成代替。自加工物5的表面反射的照明光亦可使用實驗室內部照明的反射光,但可另外設置照明用光源70。於雷射加工裝置包括另外的照明用光源70的情形時,拍攝部90亦可更具備分束器96,上述分束器用以使自照明用光源70射出的光中的一部分透射,使自加工物5反射的照明用光中的一部分向CCD相機92側反射。Referring to FIG. 7, the laser processing apparatus of the embodiment may further include an imaging unit 90. The imaging unit 90 is a device for capturing illumination light reflected from the surface of the workpiece 5, and may include a charge coupled device (CCD) camera 92 and a collecting lens 94. The CCD camera 92 is merely an example, and may be replaced by other components that can perform light sensing. The illumination light reflected from the surface of the workpiece 5 may also use the reflected light of the laboratory internal illumination, but an illumination source 70 may be additionally provided. In the case where the laser processing apparatus includes another illumination light source 70, the imaging unit 90 may further include a beam splitter 96 for transmitting a part of the light emitted from the illumination light source 70 to self-process A part of the illumination light reflected by the object 5 is reflected toward the CCD camera 92 side.
通常,加工用雷射束L1、L2亦於加工物5反射,若反射的加工用雷射束L1、L2照射至拍攝部的CCD相機92,則不僅對拍攝影像造成不良影響,而且會導致設備受損。為了防止上述內容,實施例的雷射加工裝置可包括設置於遠心透鏡部20的光圈29的分色鏡(dichroic mirror)39。分色鏡39可根據波長而使光透射或反射。例如,分色鏡39針對加工用雷射束的波長,可使大部分的光透射而不反射。藉此,可防止加工用雷射束L1、L2照射至拍攝部90。相反地,分色鏡39針對自照明用光源70出射的照明用光的波長,可使大部分的光反射。藉此,可使自加工物5反射的大部分照明用光傳遞至拍攝部90。分色鏡39的位置僅為示例,可根據光學系統的構成及製品的要求事項而發生變化。Normally, the processing laser beams L1 and L2 are also reflected by the workpiece 5, and if the reflected processing laser beams L1 and L2 are irradiated to the CCD camera 92 of the imaging unit, it not only adversely affects the captured image but also causes the device. Damaged. In order to prevent the above, the laser processing apparatus of the embodiment may include a dichroic mirror 39 provided to the diaphragm 29 of the telecentric lens portion 20. The dichroic mirror 39 can transmit or reflect light according to the wavelength. For example, the dichroic mirror 39 can transmit most of the light without reflection for the wavelength of the processing laser beam. Thereby, it is possible to prevent the processing laser beams L1 and L2 from being irradiated onto the imaging unit 90. Conversely, the dichroic mirror 39 can reflect most of the light for the wavelength of the illumination light emitted from the illumination light source 70. Thereby, most of the illumination light reflected from the workpiece 5 can be transmitted to the imaging unit 90. The position of the dichroic mirror 39 is merely an example, and may vary depending on the configuration of the optical system and the requirements of the product.
拍攝部90的CCD相機92可拍攝自加工物5反射的照明用光而提供拍攝圖像。可根據上述拍攝圖像而隨時檢查雷射加工製程。The CCD camera 92 of the imaging unit 90 can capture the illumination light reflected from the workpiece 5 to provide a captured image. The laser processing process can be checked at any time based on the above captured images.
於以上實施例中,對利用掃描儀向遠心透鏡部20入射多個光束的實施例進行了說明。以下,對利用繞射光學元件(Diffractive Optical Element,DOE)向遠心透鏡部20入射多個光束的例進行說明。In the above embodiment, an embodiment in which a plurality of light beams are incident on the telecentric lens portion 20 by the scanner has been described. Hereinafter, an example in which a plurality of light beams are incident on the telecentric lens unit 20 by a diffractive optical element (DOE) will be described.
圖8是概略性地表示另一例示性的實施例的雷射加工裝置的圖。Fig. 8 is a view schematically showing a laser processing apparatus according to another exemplary embodiment.
參照圖8,例示性的實施例的雷射加工裝置可包括: 光源(未圖示),照射雷射束;繞射光學元件62,將自上述光源出射的光束分割成至少兩個光束以上;及遠心透鏡部20,使由上述繞射光學元件62分割所得的光束垂直地照射至加工物。Referring to FIG. 8, the laser processing apparatus of the exemplary embodiment may include: a light source (not shown) for illuminating the laser beam; and a diffractive optical element 62 for dividing the light beam emitted from the light source into at least two beams; The telecentric lens unit 20 irradiates the light beam divided by the diffractive optical element 62 perpendicularly to the workpiece.
繞射光學元件62可利用雷射束的繞射現象將所照射的一個雷射束分成多個光束而出射。若利用繞射光學元件62分割雷射束,則可獲得可於加工物的多個位置同時調節雷射束的效果。而且,加工物的加工形態由繞射光學元件62的設計決定。自光源射出的光束可經由繞射光學元件62分割成多個光束。並且,由繞射光學元件62分割所得的光束可穿過遠心透鏡部20而垂直地照射至加工物5。The diffractive optical element 62 can split the irradiated one laser beam into a plurality of light beams by using a diffraction phenomenon of the laser beam. When the laser beam is divided by the diffractive optical element 62, an effect of simultaneously adjusting the laser beam at a plurality of positions of the workpiece can be obtained. Moreover, the processing form of the workpiece is determined by the design of the diffractive optical element 62. The light beam emitted from the light source can be split into a plurality of light beams via the diffractive optical element 62. Further, the light beam split by the diffractive optical element 62 can be vertically irradiated to the workpiece 5 through the telecentric lens portion 20.
於圖8中,分割所得的雷射束照射於加工物5上的一個加工線D1。若將該狀態設為繞射光學元件62的旋轉角度θ為0°,則可藉由改變繞射光學元件62的旋轉角度θ而變更雷射束照射至加工物5上的位置。In FIG. 8, the laser beam obtained by the division is irradiated onto one processing line D1 on the workpiece 5. When the state is such that the rotation angle θ of the diffractive optical element 62 is 0°, the position at which the laser beam is irradiated onto the workpiece 5 can be changed by changing the rotation angle θ of the diffractive optical element 62.
圖9是表示使圖8所示的繞射光學元件62旋轉的例的圖。FIG. 9 is a view showing an example in which the diffractive optical element 62 shown in FIG. 8 is rotated.
參照圖9,可使繞射光學元件62旋轉指定角度(0<θ<90°)。為了使繞射光學元件62旋轉,雷射加工裝置可包括旋轉台。若藉由旋轉台而旋轉繞射光學元件62,則分割所得的雷射束可分別照射至不同的加工線D1、D2。即,可對加工物5同時執行兩條加工。Referring to Figure 9, the diffractive optical element 62 can be rotated by a specified angle (0 < θ < 90 °). In order to rotate the diffractive optical element 62, the laser processing apparatus can include a rotating stage. When the diffractive optical element 62 is rotated by the turntable, the divided laser beams can be irradiated to different processing lines D1 and D2, respectively. That is, two processes can be simultaneously performed on the workpiece 5.
於以上說明中,具體地記載有多個事項,但這些事項並不限定發明的範圍,而應解釋為較佳的實施例的示例。因此,本發明的範圍不應由所說明的實施例界定,而應由申請專利範圍中所記載的技術思想界定。In the above description, a plurality of items are specifically described, but these matters are not intended to limit the scope of the invention, but should be construed as an example of a preferred embodiment. Therefore, the scope of the invention should not be limited by the illustrated embodiments, but should be defined by the technical idea recited in the claims.
5‧‧‧加工物5‧‧‧Processing
10‧‧‧透鏡部10‧‧‧Lens Department
12‧‧‧第一透鏡12‧‧‧ first lens
14‧‧‧第二透鏡14‧‧‧second lens
16‧‧‧第三透鏡16‧‧‧ third lens
18‧‧‧第四透鏡18‧‧‧Fourth lens
20‧‧‧遠心透鏡部20‧‧‧ Telecentric lens section
22‧‧‧凹透鏡22‧‧‧ concave lens
24‧‧‧左側凹陷且右側凸出的透鏡24‧‧‧Lens with the left side recessed and the right side protruding
26、28‧‧‧凸透鏡26, 28‧‧ ‧ convex lens
29‧‧‧遠心透鏡部的光圈29‧‧‧Aperture of the telecentric lens
31‧‧‧第一掃描儀31‧‧‧First Scanner
33‧‧‧第二掃描儀33‧‧‧Second scanner
32、34、36、38‧‧‧掃描儀32, 34, 36, 38‧‧ ‧ scanner
39‧‧‧分色鏡39‧‧‧ dichroic mirror
50‧‧‧光源50‧‧‧Light source
62‧‧‧繞射光學元件62‧‧‧Diffractive optical components
70‧‧‧照明用光源70‧‧‧Light source for illumination
90‧‧‧拍攝部90‧‧‧Photography Department
92‧‧‧CCD相機92‧‧‧CCD camera
94‧‧‧聚光透鏡94‧‧‧ Concentrating lens
96‧‧‧分束器96‧‧‧beam splitter
C‧‧‧光圈中心C‧‧‧ Aperture Center
D1、D2‧‧‧加工線D1, D2‧‧‧ processing line
h1、h2‧‧‧距離H1, h2‧‧‧ distance
L1、L2‧‧‧雷射束/光束L1, L2‧‧‧Laser beam/beam
L21、L22‧‧‧光束L21, L22‧‧‧ beams
L3、L4‧‧‧雷射束/光束L3, L4‧‧‧Laser beam/beam
P0、P1、P2‧‧‧聚光點P0, P1, P2‧‧‧ spotlights
α1、α2、β1、β2、θ0、θ1、θ2‧‧‧角度Α1, α2, β1, β2, θ0, θ1, θ2‧‧‧ angle
圖1是表示雷射束藉由普通的聚焦透鏡部而聚光的情況的圖。 圖2A與圖2B是概略性地表示藉由通過圖1所示的透鏡部的雷射束形成的雷射加工形狀的圖。 圖3是表示雷射束照射至例示性的實施例的遠心透鏡部的情形的圖。 圖4是概略性地表示例示性的實施例的雷射加工裝置的圖。 圖5是概略性地表示另一例示性的實施例的雷射加工裝置的圖。 圖6是表示掃描儀驅動部對掃描儀的位置及角度進行調節的例的圖。 圖7是表示另一例示性的實施例的雷射加工裝置的圖。 圖8是概略性地表示另一例示性的實施例的雷射加工裝置的圖。 圖9是表示使圖8所示的繞射光學元件旋轉的例的圖。FIG. 1 is a view showing a state in which a laser beam is collected by a general focus lens unit. 2A and 2B are views schematically showing a laser processed shape formed by a laser beam passing through the lens portion shown in Fig. 1. Fig. 3 is a view showing a state in which a laser beam is irradiated to a telecentric lens portion of an exemplary embodiment. Fig. 4 is a view schematically showing a laser processing apparatus of an exemplary embodiment. Fig. 5 is a view schematically showing a laser processing apparatus according to another exemplary embodiment. Fig. 6 is a view showing an example in which the scanner driving unit adjusts the position and angle of the scanner. Fig. 7 is a view showing a laser processing apparatus of another exemplary embodiment. Fig. 8 is a view schematically showing a laser processing apparatus according to another exemplary embodiment. Fig. 9 is a view showing an example in which the diffractive optical element shown in Fig. 8 is rotated.
Claims (8)
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| ??10-2015-0112721 | 2015-08-10 | ||
| KR1020150112721A KR101742132B1 (en) | 2015-08-10 | 2015-08-10 | Laser processing apparauts |
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| KR (1) | KR101742132B1 (en) |
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| KR102324548B1 (en) * | 2019-12-31 | 2021-11-10 | (주)미래컴퍼니 | Laser machining system and laser machining method |
| WO2026019133A1 (en) * | 2024-07-15 | 2026-01-22 | 주식회사 엘지에너지솔루션 | Laser welding apparatus |
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| US6184490B1 (en) * | 1996-04-09 | 2001-02-06 | Carl-Zeiss-Stiftung | Material irradiation apparatus with a beam source that produces a processing beam for a workpiece, and a process for operation thereof |
| JP2007268600A (en) * | 2006-03-31 | 2007-10-18 | Mitsubishi Electric Corp | Laser processing equipment |
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| TWM486507U (en) * | 2014-03-13 | 2014-09-21 | Tong Tai Machine & Tool Co Ltd | Laser machining system, detection module and determination circuit |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100660111B1 (en) * | 2005-02-01 | 2006-12-21 | 주식회사 이오테크닉스 | Laser processing device equipped with light sensor and beam control means |
| KR101010600B1 (en) * | 2008-07-31 | 2011-01-24 | 주식회사 이오테크닉스 | Laser processing device using diffractive optical element |
| KR20150009123A (en) * | 2013-07-15 | 2015-01-26 | 삼성전자주식회사 | Apparatus of processing semiconductor using LASERs |
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2016
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Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6184490B1 (en) * | 1996-04-09 | 2001-02-06 | Carl-Zeiss-Stiftung | Material irradiation apparatus with a beam source that produces a processing beam for a workpiece, and a process for operation thereof |
| JP2007268600A (en) * | 2006-03-31 | 2007-10-18 | Mitsubishi Electric Corp | Laser processing equipment |
| TW200905735A (en) * | 2007-05-09 | 2009-02-01 | Eo Technics Co Ltd | Multi laser system |
| TW201338900A (en) * | 2012-03-28 | 2013-10-01 | Toray Eng Co Ltd | Optical axis alignment method of laser and laser processing device using the same |
| TW201524649A (en) * | 2013-08-28 | 2015-07-01 | Omron Tateisi Electronics Co | Laser processing apparatus |
| TWM486507U (en) * | 2014-03-13 | 2014-09-21 | Tong Tai Machine & Tool Co Ltd | Laser machining system, detection module and determination circuit |
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| KR20170018740A (en) | 2017-02-20 |
| WO2017026747A1 (en) | 2017-02-16 |
| TW201711780A (en) | 2017-04-01 |
| KR101742132B1 (en) | 2017-05-31 |
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