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TWI628808B - Light-emitting device - Google Patents

Light-emitting device Download PDF

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Publication number
TWI628808B
TWI628808B TW105117097A TW105117097A TWI628808B TW I628808 B TWI628808 B TW I628808B TW 105117097 A TW105117097 A TW 105117097A TW 105117097 A TW105117097 A TW 105117097A TW I628808 B TWI628808 B TW I628808B
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Taiwan
Prior art keywords
light
layer
transparent substrate
cavity
reflective
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TW105117097A
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Chinese (zh)
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TW201743462A (en
Inventor
蔡孟倫
陳譽云
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晶元光電股份有限公司
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Priority to TW105117097A priority Critical patent/TWI628808B/en
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Publication of TWI628808B publication Critical patent/TWI628808B/en

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Abstract

一種發光元件,包含一透明基板;一發光疊層;一反射結構,其中該透明基板位於該發光疊層及該反射結構之間;以及一空腔,位於該透明基板及該反射結構之間;其中,該透明基板面向該反射結構的方向具有一凹部以構成該空腔的至少一部分。 A light-emitting element comprising a transparent substrate; a light-emitting layer; a reflective structure, wherein the transparent substrate is located between the light-emitting layer and the reflective structure; and a cavity between the transparent substrate and the reflective structure; The transparent substrate has a recess facing the reflective structure to form at least a portion of the cavity.

Description

發光元件 Light-emitting element

本發明係關於一種發光元件,特別係關於一種可提升光取出效率的發光元件。 The present invention relates to a light-emitting element, and more particularly to a light-emitting element capable of improving light extraction efficiency.

發光二極體(light-emitting diode,簡稱LED)為一種固態半導體元件,且LED一般包含一p型半導體層、一n型半導體層及一活性層位於p型半導體層及n型半導體層之間。發光二極體係分別透過p型半導體層及n型半導體層將電洞及電子注入活性層以輻射復合並發光,藉此將電能轉換為光能。 A light-emitting diode (LED) is a solid-state semiconductor device, and the LED generally includes a p-type semiconductor layer, an n-type semiconductor layer, and an active layer between the p-type semiconductor layer and the n-type semiconductor layer. . The light-emitting diode system injects holes and electrons into the active layer through the p-type semiconductor layer and the n-type semiconductor layer to radiate and illuminate, thereby converting electrical energy into light energy.

一種發光元件,係包含:一透明基板;一發光疊層;一反射結構,其中該透明基板位於該發光疊層及該反射結構之間;以及一空腔,位於該透明基板及該反射結構之間;其中,該透明基板面向該反射結構的方向具有一凹部以構成該空腔的至少一部分。 A light emitting device comprising: a transparent substrate; a light emitting laminate; a reflective structure, wherein the transparent substrate is located between the light emitting laminate and the reflective structure; and a cavity between the transparent substrate and the reflective structure Wherein the transparent substrate has a recess facing the reflective structure to form at least a portion of the cavity.

1‧‧‧本體 1‧‧‧ Ontology

11‧‧‧發光疊層 11‧‧‧Lighting laminate

111‧‧‧第一型半導體層 111‧‧‧First type semiconductor layer

112‧‧‧第二型半導體層 112‧‧‧Second type semiconductor layer

113‧‧‧活性層 113‧‧‧Active layer

12‧‧‧透明基板 12‧‧‧Transparent substrate

121‧‧‧上表面 121‧‧‧ upper surface

122‧‧‧下表面 122‧‧‧ lower surface

123‧‧‧凹部 123‧‧‧ recess

12E‧‧‧周緣 12E‧‧‧ Periphery

13‧‧‧緩衝層 13‧‧‧buffer layer

14‧‧‧第一電極 14‧‧‧First electrode

15‧‧‧第二電極 15‧‧‧second electrode

16‧‧‧導電通道 16‧‧‧ conductive path

17‧‧‧絕緣包覆層 17‧‧‧Insulation coating

2‧‧‧反射結構 2‧‧‧Reflective structure

21‧‧‧反射疊層 21‧‧‧Reflective laminate

211‧‧‧第一反射層 211‧‧‧First reflective layer

212‧‧‧第二反射層 212‧‧‧second reflective layer

22‧‧‧金屬反射層 22‧‧‧Metal reflector

23‧‧‧連接層 23‧‧‧Connection layer

24‧‧‧凹穴 24‧‧‧ recess

2a‧‧‧表面 2a‧‧‧ surface

2E‧‧‧周緣 2E‧‧‧ Periphery

3‧‧‧空腔 3‧‧‧ Cavity

4‧‧‧載體 4‧‧‧ Carrier

41‧‧‧頂面 41‧‧‧ top surface

42‧‧‧底面 42‧‧‧ bottom

43‧‧‧第一導接部 43‧‧‧First Guide

44‧‧‧第二導接部 44‧‧‧Second Guide

5‧‧‧接合層 5‧‧‧ bonding layer

5’‧‧‧接合層部份 5'‧‧‧ joint layer

R‧‧‧凹陷區 R‧‧‧ recessed area

E1‧‧‧第一連接件 E1‧‧‧First connector

E2‧‧‧第二連接件 E2‧‧‧Second connector

T‧‧‧厚度 T‧‧‧ thickness

R1‧‧‧粗化表面 R1‧‧‧ roughened surface

P‧‧‧保護層 P‧‧‧ protective layer

M‧‧‧擋板 M‧‧ ‧ baffle

M1‧‧‧第一檔板 M1‧‧‧ first board

M2‧‧‧第二檔板 M2‧‧‧ second board

O1‧‧‧第一開口 O1‧‧‧ first opening

O2‧‧‧第二開口 O2‧‧‧ second opening

第1圖為本發明第一實施例之發光元件的剖視圖。 Fig. 1 is a cross-sectional view showing a light-emitting element of a first embodiment of the present invention.

第2A圖為本發明第一實施例之具有厚度為300nm的空腔之系統的反射率與入射角之關係圖。 Fig. 2A is a graph showing the relationship between the reflectance and the incident angle of the system having a cavity having a thickness of 300 nm according to the first embodiment of the present invention.

第2B圖為本發明第一實施例之具有厚度為400nm的空腔之系統的反射率與入射角之關係圖。 Fig. 2B is a graph showing the relationship between the reflectance and the incident angle of the system having a cavity having a thickness of 400 nm according to the first embodiment of the present invention.

第2C圖為本發明第一實施例之具有厚度為520nm的空腔之系統的反射率與入射角之關係圖。 Fig. 2C is a graph showing the relationship between the reflectance and the incident angle of the system having a cavity having a thickness of 520 nm according to the first embodiment of the present invention.

第3圖為本發明第一實施例之發光元件的空腔與接合層的設置關係俯視圖。 Fig. 3 is a plan view showing the arrangement relationship between the cavity and the bonding layer of the light-emitting element of the first embodiment of the present invention.

第4圖為本發明另一實施例之發光元件的空腔與接合層的設置關係俯視圖。 Fig. 4 is a plan view showing the arrangement relationship between a cavity and a bonding layer of a light-emitting element according to another embodiment of the present invention.

第5圖為本發明第一實施例之具有不同物質填充於空腔之發光元件的反射率與波長之關係圖。 Fig. 5 is a graph showing the relationship between reflectance and wavelength of a light-emitting element having a different substance filled in a cavity according to a first embodiment of the present invention.

第6圖為本發明第一實施例之具有不同物質填充於空腔之系統的反射率與入射角之關係圖。 Figure 6 is a graph showing the relationship between reflectance and incident angle for a system having different materials filled in a cavity according to a first embodiment of the present invention.

第7圖為本發明第二實施例之發光元件的剖視圖。 Figure 7 is a cross-sectional view showing a light-emitting element of a second embodiment of the present invention.

第8圖為本發明第三實施例之發光元件的剖視圖。 Figure 8 is a cross-sectional view showing a light-emitting element of a third embodiment of the present invention.

第9圖為本發明第三實施例之發光元件的空腔與接合層的設置關係俯視圖。 Fig. 9 is a plan view showing the arrangement relationship between the cavity and the bonding layer of the light-emitting element of the third embodiment of the present invention.

第10圖為本發明第四實施例之發光元件的剖視圖。 Figure 10 is a cross-sectional view showing a light-emitting element of a fourth embodiment of the present invention.

以下實施例將伴隨著圖式說明本發明之概念,在圖式或說明中,相似或相同之部分係使用相同之標號,並且在圖式中,元件之形狀或厚度可擴 大或縮小。需特別注意的是,圖中未繪示或說明書未描述之元件,可以是熟習此技藝之人士所知之形式。 The following embodiments will be described with reference to the drawings, in which the same or the same parts are used in the drawings, and in the drawings, the shape or thickness of the elements can be expanded. Big or small. It is to be noted that elements not shown or described in the specification may be in a form known to those skilled in the art.

請參照第1圖所示,此為本發明第一實施例之發光元件的剖面圖,發光元件包含一本體1、一反射結構2及一空腔3,空腔3位於本體1及反射結構2之間。本體1包含一發光疊層11及一透明基板12,透明基板12具有相對之一上表面121及一下表面122,上表面121及下表面122分別連接發光疊層11及空腔3。換言之,透明基板12係較發光疊層11靠近空腔3,透明基板12位於發光疊層11及空腔3之間,空腔3則位於透明基板12及反射結構2之間。 Please refer to FIG. 1 , which is a cross-sectional view of a light-emitting device according to a first embodiment of the present invention. The light-emitting device includes a body 1 , a reflective structure 2 and a cavity 3 . The cavity 3 is located in the body 1 and the reflective structure 2 . between. The body 1 includes a light-emitting layer 11 and a transparent substrate 12. The transparent substrate 12 has a pair of upper surface 121 and a lower surface 122. The upper surface 121 and the lower surface 122 are respectively connected to the light-emitting layer 11 and the cavity 3. In other words, the transparent substrate 12 is closer to the cavity 3 than the light-emitting layer 11 , the transparent substrate 12 is located between the light-emitting layer 11 and the cavity 3 , and the cavity 3 is located between the transparent substrate 12 and the reflective structure 2 .

發光疊層11包含一第一型半導體層111、一第二型半導體層112及位於第一型半導體層111及第二型半導體層112之間的一活性層113,且第一型半導體層111、活性層113及第二型半導體層112係堆疊於透明基板12之上表面121上方,第一型半導體層111及第二型半導體層112分別具有不同之一第一導電性及一第二導電性,以分別提供電子與電洞,或者分別提供電洞與電子;活性層113可以包含單異質結構(single heterostructure)、雙異質結構(double heterostructure)或多層量子井(multiple quantum wells)。第一型半導體層111、第二型半導體層112及活性層113之材料為三五族化合物半導體,例如可以為:GaAs、InGaAs、AlGaAs、AlInGaAs、GaP、InGaP、AlInP、AlGaInP、GaN、InGaN、AlGaN、AlInGaN、AlAsSh、InGaAsP、InGaAsN、AlGaAsP等。在本實施例中,若無特別說明,上述化學表示式包含「符合化學劑量之化合物」及「非符合化學劑量之化合物」,其中,「符合化學劑量之化合物」例如為三族元素的總元素劑量與五族元素的總元素劑量相同,反之,「非符合化學劑量之 化合物」例如為三族元素的總元素劑量與五族元素的總元素劑量不同。舉例而言,化學表示式為AlGaAs即代表包含三族元素鋁(Al)及/或鎵(Ga),以及包含五族元素砷(As),其中三族元素(鋁及/或鎵)的總元素劑量可以與五族元素(砷)的總元素劑量相同或相異。另外,若上述由化學表示式表示的各化合物為符合化學劑量之化合物時,AlGaAs即代表AlxGa(1-x)As,其中,0≦x≦1;AlInP代表AlxIn(1-x)P,其中,0≦x≦1;AlGaInP代表(AlyGa(1-y))1-xInxP,其中,0≦x≦1,0≦y≦1;AlGaN代表AlxGa(1-x)N,其中,0≦x≦1;AlAsSb代表AlAsxSb(1-x),其中,0≦x≦1;InGaP代表InxGa1-xP,其中,0≦x≦1;InGaAsP代表InxGa1-xAs1-yPy,其中,0≦x≦1,0≦y≦1;InGaAsN代表InxGa1-xAs1-yNy,其中,0≦x≦1,0≦y≦1;AlGaAsP代表AlxGa1-xAs1-yPy,其中,0≦x≦1,0≦y≦1;InGaAs代表InxGa1-xAs,其中,0≦x≦1。此外,發光疊層11可在遠離透明基板12之方向上可具有一粗化表面R1,例如在第二型半導體層112上表面具有粗化表面R1,以減少活性層113發射的光在第二型半導體層112上表面發生全反射的機率,並增加發射光取出的路徑。粗化表面R1的粗糙度例如可以為小於0.2~5μm,在此所述之粗糙度為粗化表面R1之凸部最高點與凹部最低點的高度差異。 The light emitting laminate 11 includes a first type semiconductor layer 111, a second type semiconductor layer 112, and an active layer 113 between the first type semiconductor layer 111 and the second type semiconductor layer 112, and the first type semiconductor layer 111 The active layer 113 and the second semiconductor layer 112 are stacked on the upper surface 121 of the transparent substrate 12. The first semiconductor layer 111 and the second semiconductor layer 112 respectively have different first conductivity and second conductivity. To provide electrons and holes, respectively, or to provide holes and electrons, respectively; the active layer 113 may comprise a single heterostructure, a double heterostructure or a multiple quantum wells. The material of the first type semiconductor layer 111, the second type semiconductor layer 112, and the active layer 113 is a tri-five compound semiconductor, and may be, for example, GaAs, InGaAs, AlGaAs, AlInGaAs, GaP, InGaP, AlInP, AlGaInP, GaN, InGaN, AlGaN, AlInGaN, AlAsSh, InGaAsP, InGaAsN, AlGaAsP, and the like. In the present embodiment, unless otherwise specified, the chemical expressions include "chemically-accepting compounds" and "non-chemically-accepting compounds", wherein "chemically-accepting compounds" are, for example, total elements of a tri-family element. The dose is the same as the total elemental dose of the Group 5 element. Conversely, the "non-stoichiometric compound" such as the total elemental dose of the Group III element is different from the total elemental dose of the Group 5 element. For example, the chemical expression is AlGaAs, which means that the tri-group element aluminum (Al) and/or gallium (Ga), and the five-element element arsenic (As), of which the tri-group elements (aluminum and/or gallium) are total. The elemental dose may be the same as or different from the total elemental dose of the Group V element (arsenic). Further, if each of the compounds represented by the chemical expressions is a compound having a stoichiometric amount, AlGaAs represents Al x Ga (1-x) As, wherein 0 ≦ x ≦ 1; AlInP represents Al x In (1-x ) P, wherein, 0 ≦ x ≦ 1; AlGaInP representative of (Al y Ga (1-y )) 1-x In x P, wherein, 0 ≦ x ≦ 1,0 ≦ y ≦ 1; AlGaN Representative Al x Ga ( 1-x) N, where 0≦x≦1; AlAsSb represents AlAs x Sb (1-x) , where 0≦x≦1; InGaP represents In x Ga 1-x P, where 0≦x≦1 InGaAsP represents In x Ga 1-x As 1-y P y , where 0≦x≦1,0≦y≦1; InGaAsN represents In x Ga 1-x As 1-y N y , where 0≦x ≦1,0≦y≦1; AlGaAsP represents Al x Ga 1-x As 1-y P y , where 0≦x≦1,0≦y≦1; InGaAs represents In x Ga 1-x As, wherein 0≦x≦1. In addition, the light emitting laminate 11 may have a roughened surface R1 in a direction away from the transparent substrate 12, for example, a roughened surface R1 on the upper surface of the second type semiconductor layer 112 to reduce the light emitted by the active layer 113 in the second The probability of total reflection occurs on the upper surface of the semiconductor layer 112, and the path of the emitted light is increased. The roughness of the roughened surface R1 may be, for example, less than 0.2 to 5 μm, and the roughness described herein is the difference in height between the highest point of the convex portion of the roughened surface R1 and the lowest point of the concave portion.

透明基板12的材料之能隙大於活性層113的材料之能隙,使透明基板12對由活性層113所發射的光具有高穿透率,例如穿透率為90%以上,透明基板12的材料可以為但並不限於藍寶石(Sapphire)、鑽石(Diamond)、玻璃(Glass)、石英(Quartz)、壓克力(Acryl)、環氧樹脂(Epoxy)氮化鋁(AlN)等透明絕緣材料,或者可以為透明導電氧化物(TCO)如氧化鋅(ZnO)、氧化銦錫(ITO)、氧化銦鋅(IZO)、氧化鎵(Ga2O3)、氧化鋰鎵(LiGaO2)、氧化鋰鋁(LiAlO2)或氧化鎂 鋁(MgAl2O4)等,或者可以為半導體材料如碳化矽(SiC)、砷化鎵(GaAs)、磷化鎵(GaP)、磷砷化鎵(GaAsP)、硒化鋅(ZnSe)、硒化鋅(ZnSe)或磷化銦(InP)等。發光疊層11可以透過有機金屬化學氣相沉積法(MOCVD)、分子束磊晶法(MBE)或氫化物氣相磊晶法(HVPE)等磊晶方法成長於透明基板12或一成長基板上,而在成長基板上生成的發光疊層11則可藉由基板轉移技術,將發光疊層11接合至透明基板12並移除所述成長基板。本實施例發光元件之發光疊層11係直接成長於透明基板12上,且發光疊層11及透明基板12之間設有一緩衝層13,緩衝層13可以包含多晶或單晶材料,例如緩衝層13之材料可包含氮化鎵(GaN)、氮化鋁(AlN)或氮化鋁鎵(AlGaN)等,在磊晶製程中透過緩衝層13可減少當透明基板12與發光疊層11晶格不匹配時所產生的缺陷。或者,在另一實施例中,發光疊層11透過基板轉移技術接合於透明基板12之上表面121,緩衝層13可以為黏著層以將發光疊層11固定於透明基板12上,在此情況下,緩衝層13的材料可以包含透明之高分子材料、氧化物、氮化物或氟化物等,以避免阻擋或吸收發光疊層11朝向透明基板12的方向發射之光。舉例來說,緩衝層13的材料可以包含氧化鋁(Al2O3)、二氧化矽(SiO2)、氧化銦錫(ITO)、氧化銦鋅(IZO)、二氧化鈦(TiO2)、氧化鉈(Ta2O5)、氧化碲(TeO2)、氧化釔(Y2O3)、氧化鉿(HfO2)或鈮酸鋰(LiNbO3)等。透明基板12的上表面121具有圖案化結構,具體而言,透明基板12之圖案化上表面121的凸部最高點與凹部最低點的高度差異可為0.2~5μm,以透過圖案化結構增加發光元件的光取出率。 The energy gap of the material of the transparent substrate 12 is larger than the energy gap of the material of the active layer 113, so that the transparent substrate 12 has high transmittance to the light emitted by the active layer 113, for example, the transmittance is 90% or more, and the transparent substrate 12 is The material may be, but not limited to, transparent insulating materials such as sapphire, diamond, glass, quartz, Acryl, and epoxy resin (Alp). Or may be a transparent conductive oxide (TCO) such as zinc oxide (ZnO), indium tin oxide (ITO), indium zinc oxide (IZO), gallium oxide (Ga 2 O 3 ), lithium gallium oxide (LiGaO 2 ), oxidation Lithium aluminum (LiAlO 2 ) or magnesium aluminum oxide (MgAl 2 O 4 ), etc., or may be a semiconductor material such as SiC, GaAs, GaN, GaB, GaAsP ), zinc selenide (ZnSe), zinc selenide (ZnSe) or indium phosphide (InP). The light-emitting layer 11 can be grown on the transparent substrate 12 or a growth substrate by an epitaxial method such as metalorganic chemical vapor deposition (MOCVD), molecular beam epitaxy (MBE) or hydride vapor phase epitaxy (HVPE). The light-emitting laminate 11 formed on the growth substrate can be bonded to the transparent substrate 12 by the substrate transfer technique and the growth substrate can be removed. The light-emitting layer 11 of the light-emitting element of the present embodiment is directly grown on the transparent substrate 12, and a buffer layer 13 is disposed between the light-emitting layer 11 and the transparent substrate 12. The buffer layer 13 may comprise a polycrystalline or single crystal material, such as a buffer. The material of the layer 13 may include gallium nitride (GaN), aluminum nitride (AlN) or aluminum gallium nitride (AlGaN), etc., and the transparent substrate 12 and the light-emitting layer 11 may be reduced by transmitting the buffer layer 13 in the epitaxial process. Defects that occur when the grid does not match. Alternatively, in another embodiment, the light emitting laminate 11 is bonded to the upper surface 121 of the transparent substrate 12 through a substrate transfer technique, and the buffer layer 13 may be an adhesive layer to fix the light emitting laminate 11 on the transparent substrate 12. The material of the buffer layer 13 may include a transparent polymer material, oxide, nitride or fluoride, etc., in order to avoid blocking or absorbing light emitted from the light-emitting layer 11 in the direction of the transparent substrate 12. For example, the material of the buffer layer 13 may comprise alumina (Al 2 O 3), silicon dioxide (SiO 2), indium tin oxide (ITO), indium zinc oxide (IZO), titanium oxide (TiO 2), thallium oxide (Ta 2 O 5 ), cerium oxide (TeO 2 ), yttrium oxide (Y 2 O 3 ), cerium oxide (HfO 2 ) or lithium niobate (LiNbO 3 ). The upper surface 121 of the transparent substrate 12 has a patterned structure. Specifically, the height difference between the highest point of the convex portion of the patterned upper surface 121 of the transparent substrate 12 and the lowest point of the concave portion may be 0.2 to 5 μm to increase the light emission through the patterned structure. The light extraction rate of the component.

本實施例之本體1更包含一第一電極14及一第二電極15分別電性連接於第一型半導體層111及第二型半導體層112,且第一電極14與第二電極15可位於透明基板12的同一側,例如,本實施例之發光元件的第一電極14與第二電極15係位於發光疊層11上,使發光元件形成一水平式(horizontal type)發光結 構,其中,本體1具有一凹陷區R以暴露第一半導體層111之一部分,第一電極14是位於凹陷區R之第一半導體層111上,第二電極15則位於第二型半導體112上。外部電源之電流透過第一電極14及第二電極15注入發光元件中,使電子與電洞在外部電源的驅動下於活性層113復合而產生光線。此外,本體1可包含一保護層P覆蓋發光疊層11並暴露第一電極14及第二電極15。第一電極14及第二電極15包含高導電率之材料且均可包含數層結構,第一電極14及第二電極15的材料例如可以包含透明導電材料或金屬材料。舉例來說,透明導電材料包含但不限於氧化銦錫(ITO)、氧化銦(InO)、氧化錫(SnO)、氧化鎘錫(CTO)、氧化銻錫(ATO)、氧化鋁鋅(AZO)、氧化鋅錫(ZTO)、氧化鎵鋅(GZO)、氧化鋅(ZnO)、磷化鎵(GaP)、氧化銦鋅(IZO)、類鑽碳薄膜(DLC)、氧化銦鎵(IGO)、氧化鎵鋁鋅(GAZO)或上述材料之化合物;金屬材料包含但不限於鋁(Al)、鉻(Cr)、銅(Cu)、錫(Sn)、金(Au)、鎳(Ni)、鈦(Ti)、鉑(Pt)、鉛(Pb)、鋅(Zn)、鎘(Cd)、銻(Sb)、鈷(Co)或上述材料之合金等。 The body 1 of the present embodiment further includes a first electrode 14 and a second electrode 15 electrically connected to the first type semiconductor layer 111 and the second type semiconductor layer 112, respectively, and the first electrode 14 and the second electrode 15 are located The same side of the transparent substrate 12, for example, the first electrode 14 and the second electrode 15 of the light-emitting element of the present embodiment are located on the light-emitting laminate 11, so that the light-emitting element forms a horizontal type light-emitting junction. The body 1 has a recess R to expose a portion of the first semiconductor layer 111. The first electrode 14 is on the first semiconductor layer 111 of the recess R, and the second electrode 15 is on the second semiconductor 112. . The current of the external power source is injected into the light-emitting element through the first electrode 14 and the second electrode 15, and the electrons and the hole are combined with the active layer 113 by the external power source to generate light. In addition, the body 1 may include a protective layer P covering the light emitting laminate 11 and exposing the first electrode 14 and the second electrode 15. The first electrode 14 and the second electrode 15 comprise a high conductivity material and may each comprise a plurality of layers. The material of the first electrode 14 and the second electrode 15 may comprise, for example, a transparent conductive material or a metal material. For example, transparent conductive materials include, but are not limited to, indium tin oxide (ITO), indium oxide (InO), tin oxide (SnO), cadmium tin oxide (CTO), antimony tin oxide (ATO), aluminum zinc oxide (AZO). , zinc tin oxide (ZTO), gallium zinc oxide (GZO), zinc oxide (ZnO), gallium phosphide (GaP), indium zinc oxide (IZO), diamond-like carbon film (DLC), indium gallium oxide (IGO), Gallium aluminum zinc oxide (GAZO) or a compound of the above materials; metal materials include, but are not limited to, aluminum (Al), chromium (Cr), copper (Cu), tin (Sn), gold (Au), nickel (Ni), titanium (Ti), platinum (Pt), lead (Pb), zinc (Zn), cadmium (Cd), antimony (Sb), cobalt (Co) or an alloy of the above materials.

如第1圖所示,反射結構2係位於一載體4之一頂面41與透明基板12之下表面122之間,且反射結構2可與空腔3直接相接。載體4可以為陶瓷基板、導電支架、PCB板(printed circuit board)或者其他由導電材料、半導體材料或絕緣材料形成之結構。反射結構2具有朝向透明基板12之下表面122的一表面2a,且反射結構2包含一反射疊層21,反射疊層21包含複數第一反射層211及複數第二反射層212,且複數第一反射層211及複數第二反射層212係互相交錯堆疊。第一反射層211與第二反射層212各自具有不同的材料及折射率,第一反射層211及第二反射層212的材料包含導電材料、介電材料(dielectric material)或三五族半導體材料,其中,導電材料例如可以為氧化銦錫(ITO)、氧化銦(InO)、氧化錫(SnO)、 氧化鎘錫(CTO)、氧化銻錫(ATO)、氧化鋅(ZnO)、氧化鋁鋅(AZO)、氧化鋅錫(ZTO)、氧化鎵鋅(GZO)或氧化銦鋅(IZO);介電材料例如可以為氧化鎂(MgO)、SU8、苯並環丁烯(BCB)、過氟環丁烷(PFCB)、環氧樹脂(Epoxy)、丙烯酸樹脂(Acrylic Resin)、環烯烴聚合物(COC)、聚甲基丙烯酸甲酯(PMMA)、聚對苯二甲酸乙二酯(PET)、聚醯亞胺(PI)、聚碳酸酯(PC)、聚醚酰亞胺(Polyetherimide)、氟碳聚合物(Fluorocarbon Polymer)、玻璃(Glass)、氧化鉭(Ta2O5)、氧化鋁(Al2O3)、二氧化矽(SiO2)、氧化鈦(TiO2)、氮化矽(SiNx)、旋塗玻璃(SOG)或四乙氧基矽烷(TEOS);三五族半導體材料例如可以為砷化鋁鎵(AlGaAs)、鋁鎵銦磷(AlGaInP)、氮化鎵(GaN)、磷化鎵(GaP)等。當第一反射層211及/或第二反射層212的材料為三五族半導體時,可藉由調整三五族半導體中的元素組成,或者透過改變第一反射層211與第二反射層212的厚度,以提升反射疊層21對欲反射的光波長的反射率。另一實施例中,折射率高的介電材料所形成之第一反射層211或第二反射層212,與折射率低的介電材料所形成之其他反射層相比具有較薄的厚度,例如第一反射層211之折射率高於第二反射層212之折射率,第一反射層211的厚度小於第二反射層212的厚度。此外,第一反射層211及第二反射層212的厚度可以符合以下公式(1)及公式(2),其中,第一反射層211具有一第一厚度t1及一第一折射率n11,第二反射層212具有一第二厚度t2及一第二折射率n12:t1=m(λ/4n11).....公式(1) As shown in FIG. 1, the reflective structure 2 is located between a top surface 41 of a carrier 4 and a lower surface 122 of the transparent substrate 12, and the reflective structure 2 can directly interface with the cavity 3. The carrier 4 may be a ceramic substrate, a conductive support, a printed circuit board, or other structure formed of a conductive material, a semiconductor material, or an insulating material. The reflective structure 2 has a surface 2a facing the lower surface 122 of the transparent substrate 12, and the reflective structure 2 includes a reflective layer 21 including a plurality of first reflective layers 211 and a plurality of second reflective layers 212, and a plurality of A reflective layer 211 and a plurality of second reflective layers 212 are stacked one on another. The first reflective layer 211 and the second reflective layer 212 each have different materials and refractive indices, and the materials of the first reflective layer 211 and the second reflective layer 212 include a conductive material, a dielectric material, or a tri-five semiconductor material. The conductive material may be, for example, indium tin oxide (ITO), indium oxide (InO), tin oxide (SnO), cadmium tin oxide (CTO), antimony tin oxide (ATO), zinc oxide (ZnO), aluminum zinc oxide. (AZO), zinc tin oxide (ZTO), gallium zinc oxide (GZO) or indium zinc oxide (IZO); dielectric materials such as magnesium oxide (MgO), SU8, benzocyclobutene (BCB), perfluorination Cyclobutane (PFCB), epoxy resin (Epoxy), acrylic resin (Acrylic Resin), cycloolefin polymer (COC), polymethyl methacrylate (PMMA), polyethylene terephthalate (PET) , Polyimine (PI), Polycarbonate (PC), Polyetherimide, Fluorocarbon Polymer, Glass, Ta 2 O 5 , Alumina (Al 2 O 3 ), cerium oxide (SiO 2 ), titanium oxide (TiO 2 ), cerium nitride (SiN x ), spin-on glass (SOG) or tetraethoxy decane (TEOS); Material example May be aluminum gallium arsenide (AlGaAs), aluminum gallium indium phosphide (AlGaInP), gallium nitride (GaN), gallium phosphide (GaP) and the like. When the material of the first reflective layer 211 and/or the second reflective layer 212 is a tri-five semiconductor, the element composition in the tri-five semiconductor may be adjusted, or the first reflective layer 211 and the second reflective layer 212 may be changed. The thickness of the reflective laminate 21 is such that it reflects the wavelength of the light to be reflected. In another embodiment, the first reflective layer 211 or the second reflective layer 212 formed by the dielectric material having a high refractive index has a thinner thickness than other reflective layers formed of a dielectric material having a low refractive index. For example, the refractive index of the first reflective layer 211 is higher than the refractive index of the second reflective layer 212, and the thickness of the first reflective layer 211 is smaller than the thickness of the second reflective layer 212. In addition, the thicknesses of the first reflective layer 211 and the second reflective layer 212 may conform to the following formulas (1) and (2), wherein the first reflective layer 211 has a first thickness t 1 and a first refractive index n 11 The second reflective layer 212 has a second thickness t2 and a second refractive index n 12 : t 1 =m(λ/4n 11 )..... Formula (1)

t2=m(λ/4n12).....公式(2) t 2 =m(λ/4n 12 ).....formula (2)

其中,m為正整數,λ為反射結構2所欲反射的波長。舉例而言,本實施例之第一反射層211為二氧化鈦,具有第一折射率n11為2.6,第二反射層212為二氧化矽,具有第二折射率n12為1.46,若欲使反射結構2對波長為450nm的發射光達到良好反射效果,則第一厚度t1可為43nm或其倍數,而第二厚度t2可為77 nm或其倍數。惟,為了增加反射結構2具有高反射率的波長範圍,複數第一反射層211可以選擇性地各自具有不同厚度,同樣地,複數第二反射層212亦可以選擇性地各自具有不同厚度,在此並不多加限制。 Where m is a positive integer and λ is the wavelength to be reflected by the reflective structure 2. For example, the first reflective layer 211 of the present embodiment is titanium dioxide, having a first refractive index n 11 of 2.6, and the second reflective layer 212 is ceria having a second refractive index n 12 of 1.46. Structure 2 achieves a good reflection effect on the emitted light having a wavelength of 450 nm, and the first thickness t 1 may be 43 nm or a multiple thereof, and the second thickness t2 may be 77 nm or a multiple thereof. However, in order to increase the wavelength range in which the reflective structure 2 has high reflectivity, the plurality of first reflective layers 211 may each selectively have different thicknesses. Similarly, the plurality of second reflective layers 212 may also selectively have different thicknesses, respectively. This is not a limit.

本實施例的第一反射層211為二氧化鈦(TiO2),第二反射層212為二氧化矽(SiO2),且複數第一反射層211各自具有相同厚度為30nm~60nm,複數第二反射層212亦各自具有相同厚度為50nm~90nm,且各第一反射層211及各第二反射層212的厚度較佳符合上述公式(1)及公式(2)。複數第一反射層211及複數第二反射層212的層數係分別為3~10層且複數第一反射層211及複數第二反射層212互相交疊以形成反射疊層21,即由空腔3朝向載體4之頂面41方向呈現第一反射層211、第二反射層212、第一反射層211、第二反射層212…互相交錯堆疊之結構。反射結構2另外還可以選擇性地包含一金屬反射層22位於反射疊層21下方,即反射疊層21位於空腔3及金屬反射層22之間,使反射疊層21及金屬反射層22共同形成全方位反射鏡(omni-directionally reflector)。透過反射結構2可使未在透明基板12與空腔3的介面反射的光線,能夠藉由反射結構2反射回透明基板12,而進一步地增加發光元件的外部量子效率(External Quantum Efficiency)。金屬反射層22的厚度例如為50nm~200nm,且金屬反射層22可以包含各自具有不同金屬材料之數個子層,而金屬反射層22的材料可例如包含銅(Cu)、鋁(Al)、錫(Sn)、金(Au)、銀(Ag)、鉛(Pb)、鈦(Ti)、鎳(Ni)、鉑(Pt)、鎢(W)、鍺(Ge)或上述材料之合金等。此外,如第1圖所示,反射結構2可以包含一連接層23位於反射疊層21的最後一層(於本實施例中即最遠離空腔3之第二反射層212)及金屬反射層22之間,以增加反射疊層21與金屬反射層22之間的結合力,連接層23例如 可以為氧化鋁(Al2O3)。在另一實施例中,反射疊層21的最後一層為第一反射層211,並以第一反射層211透過連接層23與金屬反射層22相接,連接層23的厚度可為1nm~50nm。 The first reflective layer 211 of the present embodiment is titanium dioxide (TiO 2 ), the second reflective layer 212 is cerium oxide (SiO 2 ), and the plurality of first reflective layers 211 each have the same thickness of 30 nm to 60 nm, and the second plurality of reflections The layers 212 also have the same thickness of 50 nm to 90 nm, and the thickness of each of the first reflective layer 211 and each of the second reflective layers 212 preferably conforms to the above formulas (1) and (2). The number of layers of the plurality of first reflective layers 211 and the plurality of second reflective layers 212 is 3-10 layers, respectively, and the plurality of first reflective layers 211 and the plurality of second reflective layers 212 overlap each other to form a reflective laminate 21, that is, The cavity 3 faces the top surface 41 of the carrier 4 in a structure in which the first reflective layer 211, the second reflective layer 212, the first reflective layer 211, and the second reflective layer 212 are alternately stacked. The reflective structure 2 can also optionally include a metal reflective layer 22 under the reflective layer 21, that is, the reflective layer 21 is located between the cavity 3 and the metal reflective layer 22, so that the reflective layer 21 and the metal reflective layer 22 are common. An omni-directionally reflector is formed. The light that is not reflected by the interface between the transparent substrate 12 and the cavity 3 can be reflected by the reflective structure 2 back to the transparent substrate 12 through the reflective structure 2, thereby further increasing the external quantum efficiency of the light-emitting element (External Quantum Efficiency). The metal reflective layer 22 has a thickness of, for example, 50 nm to 200 nm, and the metal reflective layer 22 may include a plurality of sub-layers each having a different metal material, and the material of the metal reflective layer 22 may include, for example, copper (Cu), aluminum (Al), and tin. (Sn), gold (Au), silver (Ag), lead (Pb), titanium (Ti), nickel (Ni), platinum (Pt), tungsten (W), germanium (Ge) or an alloy of the above materials. In addition, as shown in FIG. 1, the reflective structure 2 may include a connection layer 23 on the last layer of the reflective layer 21 (the second reflection layer 212 which is the farthest from the cavity 3 in this embodiment) and the metal reflection layer 22 In order to increase the bonding force between the reflective laminate 21 and the metal reflective layer 22, the connection layer 23 may be, for example, aluminum oxide (Al 2 O 3 ). In another embodiment, the last layer of the reflective layer 21 is the first reflective layer 211, and the first reflective layer 211 is connected to the metal reflective layer 22 through the connecting layer 23. The thickness of the connecting layer 23 may be 1 nm to 50 nm. .

空腔3位於透明基板12與反射結構2之間,其中透明基板12可與空腔3直接相接,使光線能夠透過透明基板12與空腔3之間的界面反射,而由透明基板12的側邊射出或返回發光疊層11;且空腔3亦可與反射結構2直接相接,使穿透空腔3的光能被反射結構2反射,進一步增加由透明基板12-空腔3-反射結構2所形成之系統對發光疊層11所發射光線的反射率。如第1圖所示,本實施例的空腔3具有一厚度T,厚度T為透明基板12往反射結構2的方向上,透明基板12的下表面122與反射結構2之表面2a之最短距離,其中厚度T介於200nm~800nm,或可為不小於400nm,且當發光元件具有厚度T不小於400nm之空腔3時,能夠增加由發光疊層11發射之光線於透明基板12、空腔3及反射結構2所構成系統的反射能力。請參照第2A~2C圖所示,此分別為具有不同厚度T之空腔3的透明基板12-空腔3-反射結構2之系統的反射率與光入射角關係,其中空腔3之厚度T為300nm(第2A圖)、400nm(第2B圖)及520nm(第2C圖),入射光波長為450nm,由圖可以觀察到當厚度T大於400nm時,對於入射角為40度~70度的範圍內之反射率皆有大幅的提升,而當厚度T提升至520nm時,對於全角度(即:0度~90度)的入射光幾乎達到100%的反射率,顯見空腔3的厚度T可為大於400nm,或者可為大於520nm,以增加具有高反射率響應的入射角範圍。 The cavity 3 is located between the transparent substrate 12 and the reflective structure 2, wherein the transparent substrate 12 can directly contact the cavity 3, so that light can be reflected through the interface between the transparent substrate 12 and the cavity 3, and the transparent substrate 12 is The side edges are ejected or returned to the light emitting stack 11; and the cavity 3 can also be directly connected to the reflective structure 2, so that the light energy penetrating the cavity 3 can be reflected by the reflective structure 2, further increased by the transparent substrate 12-cavity 3- The reflectivity of the system formed by the reflective structure 2 to the light emitted by the light-emitting stack 11. As shown in FIG. 1, the cavity 3 of the present embodiment has a thickness T which is the shortest distance between the lower surface 122 of the transparent substrate 12 and the surface 2a of the reflective structure 2 in the direction of the transparent substrate 12 toward the reflective structure 2. Wherein the thickness T is between 200 nm and 800 nm, or may be not less than 400 nm, and when the light-emitting element has the cavity 3 having a thickness T of not less than 400 nm, the light emitted by the light-emitting layer 11 can be increased on the transparent substrate 12, the cavity 3 and the reflective capability of the system formed by the reflective structure 2. Please refer to FIGS. 2A-2C for the relationship between the reflectivity and the incident angle of the light of the transparent substrate 12-cavity 3-reflecting structure 2 of the cavity 3 having different thicknesses T, wherein the thickness of the cavity 3 is T is 300 nm (Fig. 2A), 400 nm (Fig. 2B), and 520 nm (Fig. 2C). The incident light has a wavelength of 450 nm. It can be observed from the figure that when the thickness T is greater than 400 nm, the incident angle is 40 to 70 degrees. The reflectance in the range is greatly improved, and when the thickness T is raised to 520 nm, the incident light for the full angle (ie, 0 to 90 degrees) is almost 100% reflectance, and the thickness of the cavity 3 is apparent. T can be greater than 400 nm, or can be greater than 520 nm to increase the range of incident angles with high reflectivity response.

此外,透明基板12對發光疊層11所發射光線具有一第三折射率n3,且空腔3對發光疊層11所發射光線具有一第四折射率n4,其中,第三折射率 n3大於第四折射率n4,且空腔3內可以為真空或是填充一物質,若空腔3內填充物質,則物質對發光疊層11所發射光線之折射率即為第四折射率n2。例如以藍寶石(折射率約為1.76~1.78)作為透明基板12的材料時,空腔3中的物質可以選擇為包含空氣、氮氣、氟化鎂(MgF2)、氟化鋁(AlF3)或二氧化矽(SiO2)等。,在此情況下,第三折射率n3約為1.76~1.78,且第四折射率n2分別約為1.0、1.0、1.38、1.38、1.46,當由發光疊層11發射的光朝向透明基板12方向前進時,光線在透明基板12與空腔3的界面即可能發生全反射,而使光由透明基板12之側邊發射至外界或返回並由發光疊層11遠離透明基板12的另一側出光,藉此增加發光元件之光取出率。在不同實施例中,為使透明基板12及空腔3之介面容易發生全反射,第三折射率n3及第四折射率n4的差異可不小於0.33,或可介於0.35與0.9之間,或可介於0.38與0.78之間,如此藉由第三折射率n3與第四折射率n4特定的差異,可有助於使發光元件的光萃取效率提升。 Further, the transparent substrate 12, the light-emitting stack 11 emit light having a third refractive index n. 3, the cavity 3 and the light-emitting stack 11 emit light having a fourth refractive index n. 4, wherein the third refractive index n 3 is greater than the fourth refractive index n 4 , and the cavity 3 may be vacuum or filled with a substance. If the cavity 3 is filled with a substance, the refractive index of the light emitted by the substance to the light-emitting layer 11 is the fourth refractive index. n 2 . For example, when sapphire (refractive index of about 1.76 to 1.78) is used as the material of the transparent substrate 12, the substance in the cavity 3 may be selected to include air, nitrogen, magnesium fluoride (MgF 2 ), aluminum fluoride (AlF 3 ) or Cerium oxide (SiO 2 ) or the like. In this case, the third refractive index n 3 is about 1.76 to 1.78, and the fourth refractive index n 2 is about 1.0, 1.0, 1.38, 1.38, 1.46, respectively, when the light emitted by the light emitting laminate 11 is directed toward the transparent substrate. When the direction of 12 is advanced, the light may be totally reflected at the interface between the transparent substrate 12 and the cavity 3, and the light may be emitted from the side of the transparent substrate 12 to the outside or returned and separated from the transparent substrate 12 by the light-emitting layer 11. The side emits light, thereby increasing the light extraction rate of the light-emitting element. In different embodiments, in order to make the interface between the transparent substrate 12 and the cavity 3 susceptible to total reflection, the difference between the third refractive index n 3 and the fourth refractive index n 4 may be not less than 0.33, or may be between 0.35 and 0.9. Or may be between 0.38 and 0.78, so that the specific difference between the third refractive index n 3 and the fourth refractive index n 4 may contribute to an improvement in light extraction efficiency of the light-emitting element.

載體4係用以支持反射結構2,載體4實施態樣可以包含陶瓷基板、導電支架或PCB板等,但不應以此為限。如第1圖所示,本實施例之載體4具有相對的頂面41及一底面42,其中頂面41與透明基板12之下表面122的距離小於底面42與下表面122的距離,且至少部分空腔3的形狀可以透過載體4之頂面41的表面形貌所定義,例如載體4的頂面41可朝向底面42的方向凹陷,凹陷的位置係對應地位於透明基板12下方,而反射結構2位於載體4的頂面41上,反射結構2之金屬反射層22及反射疊層21依序堆疊於載體4的頂面41,使反射結構2是依循頂面41的形狀形成於載體4上方,因此反射結構2具有朝向底面42方向凹陷的一凹穴24,且凹穴24對應地位於透明基板12的下方,並位於發光疊層11的發射光 之通過路徑上,其中凹穴24可構成空腔3的至少一部份。另外,載體4設有一第一導接部43及一第二導接部44分別電性連接於第一電極14及第二電極15,第一導接部43及第二導接部44可位於反射結構2之表面2a上或載體4上,再利用正裝打線接合(face-up wire bond)製程、倒裝晶粒接合(flip chip bond)製程或其他接合製程以透過一第一連接件E1使第一電極14與第一導接部43電性連接,以及透過一第二連接件E2使第二電極15與第二導接部44電性連接。在一實施例中,第一導接部43及第二導接部44係貫穿反射結構2而使第一導接部43及第二導接部44的至少一部分表面未被反射結構2覆蓋而裸露出來,以透過後續的接合製程分別與第一電極14及第二電極15電性連接。其中,第一連接件E1及第二連接件E2舉例可為金屬導線、金屬或合金焊料、或其他導電膠材。此外,本實施例之反射結構2位於載體4上且具有一周緣2E,由發光元件的俯視角度觀之,該反射結構2的周緣2E係位於透明基板12的周緣12E之外側,使反射結構2上具有足夠空間將第一導接部43及第二導接部44能夠設於其上,且對應位在透明基板12的外側。詳言之,由俯視角度觀之,第一導接部43及第二導接部44是位於周緣2E與周緣12E之間(圖未示),以利於後續透過正裝打線接合製程分別接合載體4之第一導接部43、第二導接部44,與本體1之第一電極14及第二電極15。 The carrier 4 is used to support the reflective structure 2, and the implementation of the carrier 4 may include a ceramic substrate, a conductive support or a PCB board, etc., but should not be limited thereto. As shown in FIG. 1, the carrier 4 of the present embodiment has an opposite top surface 41 and a bottom surface 42, wherein the distance between the top surface 41 and the lower surface 122 of the transparent substrate 12 is smaller than the distance between the bottom surface 42 and the lower surface 122, and at least The shape of the partial cavity 3 can be defined by the surface topography of the top surface 41 of the carrier 4. For example, the top surface 41 of the carrier 4 can be recessed toward the bottom surface 42, and the position of the recess is correspondingly located below the transparent substrate 12, and the reflection The structure 2 is located on the top surface 41 of the carrier 4, and the metal reflective layer 22 and the reflective layer 21 of the reflective structure 2 are sequentially stacked on the top surface 41 of the carrier 4, so that the reflective structure 2 is formed on the carrier 4 according to the shape of the top surface 41. Above, the reflective structure 2 has a recess 24 recessed toward the bottom surface 42 , and the recess 24 is correspondingly located below the transparent substrate 12 and is located at the light emitting layer 11 In the path of the passage, the pocket 24 can form at least a portion of the cavity 3. In addition, the carrier 4 is provided with a first guiding portion 43 and a second guiding portion 44 electrically connected to the first electrode 14 and the second electrode 15, respectively, and the first guiding portion 43 and the second guiding portion 44 are located On the surface 2a of the reflective structure 2 or on the carrier 4, a face-up wire bond process, a flip chip bond process or other bonding process is used to pass through the first connector E1. The first electrode 14 is electrically connected to the first guiding portion 43 and the second electrode 15 is electrically connected to the second guiding portion 44 through a second connecting member E2. In one embodiment, the first guiding portion 43 and the second guiding portion 44 penetrate the reflective structure 2 such that at least a portion of the surfaces of the first guiding portion 43 and the second guiding portion 44 are not covered by the reflective structure 2 Exposed, the first electrode 14 and the second electrode 15 are electrically connected to each other through a subsequent bonding process. The first connecting member E1 and the second connecting member E2 can be exemplified by metal wires, metal or alloy solders, or other conductive rubber materials. In addition, the reflective structure 2 of the present embodiment is located on the carrier 4 and has a peripheral edge 2E. The peripheral edge 2E of the reflective structure 2 is located on the outer side of the peripheral edge 12E of the transparent substrate 12 so that the reflective structure 2 is formed. There is sufficient space for the first guiding portion 43 and the second guiding portion 44 to be disposed thereon, and the corresponding position is located outside the transparent substrate 12. In detail, the first guiding portion 43 and the second guiding portion 44 are located between the peripheral edge 2E and the peripheral edge 12E (not shown), so as to facilitate the subsequent engagement of the carrier through the dressing and wire bonding process. The first guiding portion 43 and the second guiding portion 44 of the fourth electrode and the first electrode 14 and the second electrode 15 of the body 1.

如第1圖所示,本實施例的本體1設置於載體4上方並透過一接合層5與載體4結合,其中接合層5具有類似墊高層的功能。接合層5位於透明基板12之下表面122並對應地環繞凹穴24的上緣,且接合層5的外側邊緣可靠近或對齊透明基板12之一側邊12E,或是接合層5沿透明基板12的邊緣設置。此外,空腔3是由透明基板12的下表面122、接合層5及反射結構2所共同圍設形成,可為 一密閉或非密閉空間。接合層5的材料可使用對活性層113所發射光具有90%以上穿透率的物質,使朝向反射結構2的光不致受到接合層5的阻擋或吸收,而能夠穿透接合層5以被接合層5下方的反射結構2進一步反射,進而增加發光元件的光取出率。舉例而言,若接合層5為透明(即為對發光疊層11之發射光之穿透率為90%以上)之物質,則接合層5的材料可以選自由苯并環丁烯(BCB)、環氧樹脂(Epoxy)、旋塗玻璃(SOG)、聚醯亞胺(polyimide)、全氟環丁烷(PFCB)、Su8、丙烯酸樹脂(Acrylic Resin)、聚甲基丙烯酸甲酯(PMMA)、聚對苯二甲酸乙二酯(PET)、聚碳酸酯(PC)、聚醚醯亞胺(Polyetherimide)及氟碳聚合物(Fluorocarbon Polymer)所組成之群組,且在一實施例中接合層5還可於上述材料所形成的膠體中添加導熱劑,例如氮化硼(BN)或氮化鋁(AlN)等,使本體1運作時產生的熱量能夠透過接合層5傳導散出。在另一實施例中,接合層5的材料亦可為對發光疊層11發射光線具有90%以上反射率的物質,例如可以選自由金、銀、鋁、鉻、錫及鈦等金屬所組成之群組,包括金錫合金或錫銀銅合金等,如此使朝向反射結構2的光可部分被接合層5反射回透明基板12,而由透明基板12的側面出光,進而增加發光元件的光取出率。 As shown in FIG. 1, the body 1 of the present embodiment is disposed above the carrier 4 and coupled to the carrier 4 through a bonding layer 5, wherein the bonding layer 5 has a function similar to the upper layer of the pad. The bonding layer 5 is located on the lower surface 122 of the transparent substrate 12 and correspondingly surrounds the upper edge of the recess 24, and the outer edge of the bonding layer 5 can be close to or aligned with one side 12E of the transparent substrate 12, or the bonding layer 5 is along the transparent substrate. 12 edge settings. In addition, the cavity 3 is formed by the lower surface 122 of the transparent substrate 12, the bonding layer 5, and the reflective structure 2, which may be A closed or non-closed space. The material of the bonding layer 5 may use a substance having a transmittance of 90% or more for the light emitted from the active layer 113, so that the light toward the reflective structure 2 is not blocked or absorbed by the bonding layer 5, and can penetrate the bonding layer 5 to be The reflective structure 2 under the bonding layer 5 is further reflected, thereby increasing the light extraction rate of the light-emitting element. For example, if the bonding layer 5 is transparent (ie, the transmittance of the light emitted from the light-emitting layer 11 is 90% or more), the material of the bonding layer 5 may be selected from benzocyclobutene (BCB). Epoxy, spin-on glass (SOG), polyimide, perfluorocyclobutane (PFCB), Su8, acrylic resin (Acrylic Resin), polymethyl methacrylate (PMMA) a group consisting of polyethylene terephthalate (PET), polycarbonate (PC), polyetherimide, and fluorocarbon polymer, and bonded in one embodiment. The layer 5 can also add a heat conductive agent such as boron nitride (BN) or aluminum nitride (AlN) to the colloid formed by the above materials, so that the heat generated when the body 1 operates can be conducted and transmitted through the bonding layer 5. In another embodiment, the material of the bonding layer 5 may also be a substance having a reflectance of 90% or more for the light emitted from the light emitting layer 11, and may be, for example, selected from the group consisting of metals such as gold, silver, aluminum, chromium, tin, and titanium. The group includes gold tin alloy or tin silver copper alloy, etc., so that the light toward the reflective structure 2 can be partially reflected back to the transparent substrate 12 by the bonding layer 5, and light is emitted from the side surface of the transparent substrate 12, thereby increasing the light of the light emitting element. Takeout rate.

此外,請參照第1圖及第3圖所示,本發明第一實施例之發光元件可以選擇性地設有一擋板M位於透明基板12之下表面122及反射結構2之間,其中擋板M具有一第一開口O1對應位於透明基板12的下方,以使第一開口O1設在凹穴24開口的位置,藉此隔離接合層5及空腔3,使空腔3位於透明基板12、反射結構2及擋板M之間,如此可以防止在利用接合層5接合本體1及反射結構2時,接合層5的材料受力被擠壓而移動至空腔3中。擋板M的材質選擇為具有對發光疊層11 之發射光具高透明度(穿透率達90%以上)或高反射率(反射率達90%以上)之材料,例如包含環氧樹酯(Epoxy)、玻璃或塑膠。在另一實施例中,擋板M包含一第一檔板M1及一第二檔板M2,第一檔板M1形成上述之第一開口O1,第二檔板形成一第二開口O2,第二開口O2的面積大於第一開口O1的面積,且第一檔板M1位於第二開口O2內,使接合層5夾設於第一檔板M1、第二檔板M2、透明基板12及反射結構2所形成的空間內,避免接合層5之材料受力往空腔3移動或突出透明基板12的側邊。藉由檔板M的設置,可使接合層5成形於預定位置,並且精確地控制空腔3的厚度。請參照第3圖所示,於本實施例中,接合層5是連續地位於空腔3的外周。然而,接合層5的型態並不限於此,如第4圖所示的實施例中,接合層5為不連續且包含數個接合層部分5’,該些接合層部分5’以空腔3為對稱中心於空腔3的周圍排列,其中擋板M具有兩兩對稱的數個第二開口O2,第二開口O2的形狀即為接合層部份5’所欲成形的形狀,使該些接合層部分5’互相對稱於空腔3。 In addition, as shown in FIG. 1 and FIG. 3, the light-emitting element of the first embodiment of the present invention can be selectively provided with a baffle M between the lower surface 122 of the transparent substrate 12 and the reflective structure 2, wherein the baffle M has a first opening O1 corresponding to the lower side of the transparent substrate 12, so that the first opening O1 is disposed at the position where the recess 24 is open, thereby isolating the bonding layer 5 and the cavity 3, so that the cavity 3 is located on the transparent substrate 12, Between the reflective structure 2 and the baffle M, it is possible to prevent the material of the bonding layer 5 from being pressed and moved into the cavity 3 when the body 1 and the reflective structure 2 are joined by the bonding layer 5. The material of the baffle M is selected to have a pair of light emitting laminates 11 A material that emits light with high transparency (more than 90% penetration) or high reflectance (reflectance of more than 90%), such as Epoxy, glass or plastic. In another embodiment, the baffle M includes a first baffle M1 and a second baffle M2. The first baffle M1 forms the first opening O1, and the second baffle forms a second opening O2. The area of the second opening O2 is larger than the area of the first opening O1, and the first baffle M1 is located in the second opening O2, so that the bonding layer 5 is sandwiched between the first baffle M1, the second baffle M2, the transparent substrate 12, and the reflection In the space formed by the structure 2, the material of the bonding layer 5 is prevented from being forced to move toward the cavity 3 or to protrude from the side of the transparent substrate 12. By the arrangement of the shutter M, the bonding layer 5 can be formed at a predetermined position, and the thickness of the cavity 3 can be precisely controlled. Referring to FIG. 3, in the present embodiment, the bonding layer 5 is continuously located on the outer periphery of the cavity 3. However, the form of the bonding layer 5 is not limited thereto, and in the embodiment shown in FIG. 4, the bonding layer 5 is discontinuous and includes a plurality of bonding layer portions 5' which are cavities 3 is a symmetry center arranged around the cavity 3, wherein the baffle M has a plurality of second openings O2 symmetrically, and the shape of the second opening O2 is a shape to be formed by the bonding layer portion 5'. The joint layer portions 5' are symmetrical to each other to the cavity 3.

請參照第5圖所示,此為本發明第一實施例之發光元件之反射率與波長之關係圖。其中,線5A所示之發光元件的空腔3填充折射率為1的空氣,而線5B之發光元件的空腔3則填充折射率為1.46的二氧化矽,線5A及5B之發光元件之透明基板12的折射率為1.76~1.78,因此,如前所述,線5A之發光元件的第三折射率n3與第四折射率n4的差為0.76~0.78,而線5B之發光元件的第三折射率n3與第四折射率n4的差為0.3~0.32。由圖可知,在波長為430nm~550nm的區間中,線5A之發光元件的反射率皆高於線5B之發光元件的反射率,特別是在430nm~470nm的區間的反射率差異更為顯著,即空腔3填充有空氣之發光元件在一波 長範圍下均具有較空腔3填充有二氧化矽之發光元件高的反射率。另外,請再參照第6圖所示,此為針對填充不同物質之空腔3的透明基板12-空腔3-反射結構2之系統,量測此系統的反射率與光入射角的關係,其中,空腔3內所填充的物質分別為空氣(線6A)、氟化鎂(線6B)及二氧化矽(線6C)。由第6圖可以得知:空腔3填充空氣之系統對於入射角為35度~62度的入射光具有高於97%之反射率,反射效果優於空腔3填充氟化鎂及二氧化矽之系統。而當空腔3中填充之物質為氟化鎂時,在入射角53度~54度及60度~61度相較於在空腔3中填充二氧化矽之系統具有較高反射率。 Referring to Fig. 5, this is a graph showing the relationship between the reflectance and the wavelength of the light-emitting element of the first embodiment of the present invention. The cavity 3 of the light-emitting element shown by the line 5A is filled with air having a refractive index of 1, and the cavity 3 of the light-emitting element of the line 5B is filled with cerium oxide having a refractive index of 1.46, and the light-emitting elements of the lines 5A and 5B. The refractive index of the transparent substrate 12 is 1.76 to 1.78. Therefore, as described above, the difference between the third refractive index n 3 and the fourth refractive index n 4 of the light-emitting element of the line 5A is 0.76 to 0.78, and the light-emitting element of the line 5B The difference between the third refractive index n 3 and the fourth refractive index n 4 is 0.3 to 0.32. As can be seen from the figure, in the interval of 430 nm to 550 nm, the reflectance of the light-emitting element of the line 5A is higher than that of the light-emitting element of the line 5B, and particularly, the difference in reflectance between the regions of 430 nm and 470 nm is more remarkable. That is, the light-emitting element in which the cavity 3 is filled with air has a higher reflectance than the light-emitting element in which the cavity 3 is filled with cerium oxide in a wavelength range. In addition, please refer to FIG. 6 again, which is a system for the transparent substrate 12-cavity 3-reflecting structure 2 filling the cavity 3 of different substances, and measuring the relationship between the reflectivity of the system and the incident angle of the light, Among them, the substances filled in the cavity 3 are air (line 6A), magnesium fluoride (line 6B) and cerium oxide (line 6C). It can be seen from Fig. 6 that the system in which the cavity 3 is filled with air has a reflectance higher than 97% for incident light having an incident angle of 35 to 62 degrees, and the reflection effect is better than that of the cavity 3 filled with magnesium fluoride and dioxide. The system of 矽. When the substance filled in the cavity 3 is magnesium fluoride, the system has a higher reflectance at an incident angle of 53 to 54 degrees and 60 to 61 degrees than a system in which the cavity 3 is filled with cerium oxide.

請參照第7圖所示,此為本發明第二實施例之發光元件的剖視圖,本實施例的發光元件之各構件的材料及各構件之間的連接關係大致與前述實施例之發光元件相似或相同,差異在於本實施例空腔3的形狀至少一部分是透過透明基板12的下表面122的表面形貌所定義。詳言之,本實施例之透明基板12面向反射結構2的方向具有一凹部123以構成空腔3的至少一部分,其中,凹部123係由透明基板12之下表面122朝向發光疊層11的方向凹陷形成,而載體4之頂面41為一平坦面,接合層5位於透明基板12與反射結構2之間且可以環繞凹部123的開口,空腔3位於透明基板12之凹部123、接合層5及反射結構2之間。在另一實施例中,載體4之頂面41亦可具有如第一實施例所示之凹穴24,使空腔3位於反射結構2之凹穴24、透明基板12之凹部123及接合層5之間。 Referring to FIG. 7, which is a cross-sectional view of a light-emitting element according to a second embodiment of the present invention, the material of each member of the light-emitting element of the present embodiment and the connection relationship between the members are substantially similar to those of the light-emitting element of the foregoing embodiment. Or the same, the difference is that at least a portion of the shape of the cavity 3 of the present embodiment is defined by the surface topography of the lower surface 122 of the transparent substrate 12. In detail, the transparent substrate 12 of the present embodiment has a concave portion 123 facing the reflective structure 2 to constitute at least a portion of the cavity 3, wherein the concave portion 123 is directed from the lower surface 122 of the transparent substrate 12 toward the light emitting laminate 11. The recess is formed, and the top surface 41 of the carrier 4 is a flat surface. The bonding layer 5 is located between the transparent substrate 12 and the reflective structure 2 and can surround the opening of the recess 123. The cavity 3 is located in the recess 123 of the transparent substrate 12 and the bonding layer 5. And between the reflective structures 2. In another embodiment, the top surface 41 of the carrier 4 may also have a recess 24 as shown in the first embodiment, such that the cavity 3 is located in the recess 24 of the reflective structure 2, the recess 123 of the transparent substrate 12, and the bonding layer. Between 5

請參照第8圖所示,此為本發明第三實施例之發光元件的剖視圖,本實施例的發光元件之各構件的材料及各構件之間的連接關係大致與前述各實施例之發光元件相似或相同,差異在於本實施例之發光元件係藉由接合層5 使透明基板12與反射結構2之間具有一空隙。詳言之,在本實施例中,反射結構2之表面2a與透明基板12之下表面122皆為平坦表面,接合層5具有類似墊高層的功能,詳言之,接合層5在表面2a至下表面122的方向上具有一厚度T,以將透明基板12的下表面122與反射結構2的表面2a之間相隔至具有厚度T的距離,使空腔3設於位於透明基板12之下表面122、反射結構2及接合層5之間。如第9圖所示,接合層5位於透明基板12之下表面122的中央位置,而空腔3環繞接合層5,使空腔3位於透明基板12之邊緣12E及接合層5之間,此時空腔3為透明基板12與反射結構2之間的空隙。本實施例的特點在於空腔3環繞接合層5使得空腔3直接連通於外界環境,因此當空腔3中填充之物質具有較高的熱膨脹係數(Coefficient of thermal expansion,CTE)時,舉例而言:在室溫(約293K)下熱膨脹係數大於10-4K-1的材料時,發光元件不易因操作環境的溫度變異使物質冷縮熱脹而造成損害,亦可避免因空腔3中的物質體積改變過大,而對接合層5結合本體1與反射結構2的能力產生弱化的影響。 Referring to FIG. 8, a cross-sectional view of a light-emitting element according to a third embodiment of the present invention, the material of each member of the light-emitting element of the present embodiment and the connection relationship between the members are substantially the same as those of the foregoing embodiments. Similar or identical, the difference is that the light-emitting element of the present embodiment has a gap between the transparent substrate 12 and the reflective structure 2 by the bonding layer 5. In detail, in the embodiment, the surface 2a of the reflective structure 2 and the lower surface 122 of the transparent substrate 12 are both flat surfaces, and the bonding layer 5 has a function similar to the upper layer of the pad. In detail, the bonding layer 5 is on the surface 2a to The lower surface 122 has a thickness T in the direction to separate the lower surface 122 of the transparent substrate 12 from the surface 2a of the reflective structure 2 to a distance T having a thickness T such that the cavity 3 is disposed on the lower surface of the transparent substrate 12. 122. Between the reflective structure 2 and the bonding layer 5. As shown in FIG. 9, the bonding layer 5 is located at a central position of the lower surface 122 of the transparent substrate 12, and the cavity 3 surrounds the bonding layer 5 such that the cavity 3 is located between the edge 12E of the transparent substrate 12 and the bonding layer 5. The cavity 3 is a gap between the transparent substrate 12 and the reflective structure 2. The feature of this embodiment is that the cavity 3 surrounds the bonding layer 5 so that the cavity 3 directly communicates with the external environment, so when the substance filled in the cavity 3 has a high coefficient of thermal expansion (CTE), for example, : When the material has a thermal expansion coefficient greater than 10 -4 K -1 at room temperature (about 293 K), the light-emitting element is not easily damaged by the temperature variation of the operating environment, and the damage is caused by the shrinkage of the material. The volume change of the substance is excessively large, and the influence of the bonding layer 5 in combination with the body 1 and the reflective structure 2 is weakened.

請參照第10圖所示,此為本發明第四實施例之發光元件的剖視圖,本實施例的發光元件之各構件的材料及各構件之間的連接關係大致與前述各實施例之發光元件相似或相同,惟接合層5可以選擇地省略。本實施例與前述各實施例主要差異在於第一電極14及第二電極15係位於發光疊層11與反射結構2之間,並且第一電極14與第二電極15分別電性連接於第一型半導體層111及第二型半導體層112。具體而言,本實施例之透明基板12為導電基板,但並不以此為限,此外,本體1可以選擇性包含具有導電性的緩衝層13。第一型半導體層111係透過具導電性的緩衝層13及透明基板12與第一電極14電性連接,此外,本體1 另包含一導電通道16,使第二電極15透過導電通道16電性連接第二型半導體層112。為了防止漏電,本體1另設有一絕緣包覆層17包覆於導電通道16的外圍,詳言之,絕緣包覆層17係位於活性層113、第一型半導體層111、緩衝層13、透明基板12及導電通道16之間,使導電通道16電性絕緣於上述各層(即113、111、13、12)。 Referring to FIG. 10, which is a cross-sectional view of a light-emitting element according to a fourth embodiment of the present invention, the material of each member of the light-emitting element of the present embodiment and the connection relationship between the members are substantially the same as those of the foregoing embodiments. Similar or identical, but the bonding layer 5 can be optionally omitted. The main difference between the present embodiment and the foregoing embodiments is that the first electrode 14 and the second electrode 15 are located between the light-emitting layer 11 and the reflective structure 2, and the first electrode 14 and the second electrode 15 are electrically connected to the first electrode, respectively. The semiconductor layer 111 and the second semiconductor layer 112. Specifically, the transparent substrate 12 of the present embodiment is a conductive substrate, but is not limited thereto. Further, the body 1 may selectively include a buffer layer 13 having conductivity. The first type semiconductor layer 111 is electrically connected to the first electrode 14 through the conductive buffer layer 13 and the transparent substrate 12, and further, the body 1 Further, a conductive path 16 is included to electrically connect the second electrode 15 to the second type semiconductor layer 112 through the conductive path 16 . In order to prevent leakage, the body 1 is further provided with an insulating coating layer 17 covering the periphery of the conductive path 16. In detail, the insulating coating layer 17 is located on the active layer 113, the first type semiconductor layer 111, the buffer layer 13, and the transparent layer. Between the substrate 12 and the conductive path 16, the conductive path 16 is electrically insulated from the above layers (ie, 113, 111, 13, 12).

本實施例的載體4與前述各實施例相同,均包含第一導接部43及第二導接部44,第一導接部43及第二導接部44位於反射結構2之表面2a,本體1的第一電極14與第二電極15對位於載體4的第一導接部43及第二導接部44,並透過焊料或導電膠等材料形成第一連接件E1及第二連接件E2,第一連接件E1位於第一電極14與第一導接部43之間以使兩者形成電性連接,同樣地,第二連接件E2位於第二電極15與第二導接部44之間使兩者形成電性連接。第一連接件E1與第二連接件E2的材料可以包含錫、鉍、銦或由錫、鉍、銦之任兩種以上組成的合金。本實施例之空腔3位於發光疊層11、反射結構2、第一電極14、第二電極15、第一導接部43、第二導接部44、第一連接件E1及第二連接件E2之間,其中,本實施例之第一導接部43、第一連接件E1及第一電極14具有墊高層的功能,三者係以垂直反射結構2之表面2a的方向依序堆疊於表面2a,藉此墊高透明基板12,使透明基板12之下表面122與反射結構2之表面2a之間形成厚度T的空腔3,因此本實施例之發光元件可以選擇性地省略接合層5。同樣地,空腔3可以填充一物質,物質可以選擇為對發光疊層11之發射光呈現透明,且對發射光的折射率(即第四折射率n4)小於透明基板12之第三折射率n3之材質,並透過空腔3中的物 質增加發光元件的散熱效率,本實施例中,係以呈透明之物質填充於空腔3中,藉此提供支撐發光元件的功用,使發光元件的結構強度藉此增加。 The carrier 4 of the present embodiment is the same as the foregoing embodiments, and includes a first guiding portion 43 and a second guiding portion 44. The first guiding portion 43 and the second guiding portion 44 are located on the surface 2a of the reflective structure 2, The first electrode 14 and the second electrode 15 of the body 1 are disposed on the first guiding portion 43 and the second guiding portion 44 of the carrier 4, and are formed of a material such as solder or conductive adhesive to form the first connecting member E1 and the second connecting member. E2, the first connecting member E1 is located between the first electrode 14 and the first guiding portion 43 to electrically connect the two, and the second connecting member E2 is located at the second electrode 15 and the second guiding portion 44. The two are electrically connected. The material of the first connecting member E1 and the second connecting member E2 may include tin, antimony, indium, or an alloy composed of two or more of tin, antimony, and indium. The cavity 3 of the embodiment is located on the light emitting laminate 11 , the reflective structure 2 , the first electrode 14 , the second electrode 15 , the first guiding portion 43 , the second guiding portion 44 , the first connecting member E1 and the second connection Between the pieces E2, the first guiding portion 43, the first connecting member E1 and the first electrode 14 of the embodiment have the function of the upper layer, and the three are sequentially stacked in the direction of the surface 2a of the vertical reflecting structure 2. On the surface 2a, the transparent substrate 12 is raised to form the cavity 3 of the thickness T between the lower surface 122 of the transparent substrate 12 and the surface 2a of the reflective structure 2, so that the light-emitting element of the embodiment can be selectively omitted. Layer 5. Similarly, the cavity 3 may be filled with a substance which may be selected to be transparent to the emitted light of the light-emitting stack 11 and having a refractive index to the emitted light (ie, the fourth refractive index n 4 ) smaller than the third refractive index of the transparent substrate 12 . Rate n 3 material, and increase the heat dissipation efficiency of the light-emitting element through the substance in the cavity 3. In this embodiment, the transparent material is filled in the cavity 3, thereby providing the function of supporting the light-emitting element to make the light The structural strength of the component is thereby increased.

需注意的是,本發明所列舉之各實施例僅用以說明本發明,並非用以限制本發明之範圍。任何人對本發明所作顯而易見的修飾或變更皆不脫離本發明之精神與範圍。不同實施例中相同或相似的構件,或者不同實施例中具相同標號的構件皆具有相同的物理或化學特性。此外,本發明中上述之實施例在適當的情況下,是可互相組合或替換,而非僅限於所描述之特定實施例。在一實施例中詳細描述之特定構件與其他構件的連接關係亦可以應用於其他實施例中,且均落於如後所述之本發明之權利保護範圍的範疇中。 It is to be noted that the various embodiments of the present invention are intended to be illustrative only and not to limit the scope of the invention. Any obvious modifications or variations of the present invention are possible without departing from the spirit and scope of the invention. The same or similar components in different embodiments, or components having the same reference numbers in different embodiments, have the same physical or chemical properties. In addition, the above-described embodiments of the present invention may be combined or substituted with each other as appropriate, and are not limited to the specific embodiments described. The connection between the specific components and the other components described in detail in the embodiments can also be applied to other embodiments, and all fall within the scope of the scope of the invention as described hereinafter.

Claims (10)

一種發光元件,係包含:一透明基板;一發光疊層;一反射結構,其中該透明基板位於該發光疊層及該反射結構之間;以及一空腔,位於該透明基板及該反射結構之間;其中該透明基板面向該反射結構的方向具有一凹部以構成該空腔的至少一部分。 A light emitting device comprising: a transparent substrate; a light emitting laminate; a reflective structure, wherein the transparent substrate is located between the light emitting laminate and the reflective structure; and a cavity between the transparent substrate and the reflective structure Wherein the transparent substrate faces a direction of the reflective structure with a recess to form at least a portion of the cavity. 如申請專利範圍第1項所述之發光元件,更包含一載體,其中該反射結構位於該載體上。 The light-emitting element of claim 1, further comprising a carrier, wherein the reflective structure is located on the carrier. 如申請專利範圍第1項所述之發光元件,更包含一第一電極及一第二電極,其中,該發光疊層包含一第一型半導體層、一第二型半導體層及一活性層位於該第一型半導體層及該第二型半導體層之間,且該第一電極電性連接於該第一型半導體層及該第二電極電性連結於該第二型半導體層,該第一電極與該第二電極位於該發光疊層與該反射結構之間。 The illuminating device of claim 1, further comprising a first electrode and a second electrode, wherein the luminescent layer comprises a first type semiconductor layer, a second type semiconductor layer and an active layer Between the first type semiconductor layer and the second type semiconductor layer, the first electrode is electrically connected to the first type semiconductor layer and the second electrode is electrically connected to the second type semiconductor layer, the first An electrode and the second electrode are located between the light emitting stack and the reflective structure. 如申請專利範圍第1項所述之發光元件,其中,該反射結構包含一反射疊層,該反射疊層包含複數第一反射層及複數第二反射層互相交錯堆疊,該第一反射層與該第二反射層具有不同折射率。 The light-emitting element of claim 1, wherein the reflective structure comprises a reflective laminate, the reflective laminate comprising a plurality of first reflective layers and a plurality of second reflective layers interleaved with each other, the first reflective layer and The second reflective layer has a different refractive index. 如申請專利範圍第1項所述之發光元件,其中,該透明基板具有一第一折射率,該空腔具有一第二折射率,該第一折射率大於該第二折射率,且該第一折射率與該第二折射率的差異介於0.38與0.78之間。 The light-emitting element of claim 1, wherein the transparent substrate has a first refractive index, the cavity has a second refractive index, the first refractive index is greater than the second refractive index, and the first The difference between a refractive index and the second refractive index is between 0.38 and 0.78. 一種發光元件,係包含:一透明基板;一發光疊層;一反射結構,其中該透明基板位於該發光疊層及該反射結構之間;一空腔,位於該透明基板及該反射結構之間;以及一接合層位於該透明基板及該反射結構之間,該接合層具有一第一接合層部分及一第二接合層部分與該第一接合層部分分離。 A light-emitting element comprising: a transparent substrate; a light-emitting layer; a reflective structure, wherein the transparent substrate is located between the light-emitting layer and the reflective structure; a cavity between the transparent substrate and the reflective structure; And a bonding layer between the transparent substrate and the reflective structure, the bonding layer having a first bonding layer portion and a second bonding layer portion separated from the first bonding layer portion. 如申請專利範圍第6項所述之發光元件,其中,該第一接合層部分與該第二接合層部分對稱於該空腔。 The illuminating element of claim 6, wherein the first bonding layer portion and the second bonding layer portion are symmetrical to the cavity. 如申請專利範圍第6項所述之發光元件,其中,該第一接合層部分及該第二接合層部分環繞該空腔。 The light-emitting element of claim 6, wherein the first bonding layer portion and the second bonding layer portion surround the cavity. 一種發光元件,係包含:一透明基板具有一第一寬度;一發光疊層;一反射結構,其中該透明基板位於該發光疊層及該反射結構之間;一接合層,位於該透明基板及該反射結構之間且具有一第二寬度,其中,該第二寬度小於該第一寬度;以及一空腔,位於該透明基板、該接合層及該反射結構之間。 A light-emitting element comprising: a transparent substrate having a first width; a light-emitting layer; a reflective structure, wherein the transparent substrate is located between the light-emitting layer and the reflective structure; a bonding layer located on the transparent substrate and The reflective structure has a second width therebetween, wherein the second width is smaller than the first width; and a cavity is located between the transparent substrate, the bonding layer and the reflective structure. 如申請專利範圍第9項所述之發光元件,其中,該空腔係環繞於該接合層周圍。 The light-emitting element of claim 9, wherein the cavity surrounds the bonding layer.
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