TWI651511B - Detection method and optical device using the same - Google Patents

Abstract

The invention provides a detecting method and an optical device applying the detecting method, the optical device comprises a structured light generating unit and a sensing determining unit, and the structured light generating unit is configured to provide a structured light projected onto a surface to be tested (structure light) And when the structured light is projected onto the surface to be tested, a measured pattern and a measured spot are presented on the surface to be tested, and the sensing determining unit is configured to sense the measured pattern presented on the surface to be tested and The spot is measured, and whether the surface to be tested is flat according to the degree of deformation of the sensed pattern to be sensed, and the distance between the surface to be tested and the optical device is obtained according to the area of the detected spot to be sensed.

Description

Detection method and optical device applying the detection method

The present invention relates to an optical device, and more particularly to an optical device that provides a detection function.

In recent years, with the evolution of the electronics industry and the rapid development of industrial technology, the design and development of various electronic devices have gradually evolved in a light and portable manner, so that users can use it for mobile commerce, entertainment or leisure whenever and wherever. . For example, a wide variety of image capture devices are widely used in various fields, such as smart phones, wearable electronic devices, and aerial devices, which have the advantages of small size and convenient portability. It can be taken out and imaged and stored at any time when there is a demand for use, or uploaded to the Internet through the mobile network. It not only has important commercial value, but also adds color to the daily life of the general public.

Furthermore, with the improvement of the quality of life, people have more demands on the functions that the image capture device can provide. For example, people want to obtain distance information from the captured images, and even can judge from the images. The surface flatness information of the contents, and the above distance information and surface flatness information are very important for many application fields, such as the landing control of the aerial device.

Further, the conventional aerial device is a lightning device disposed thereon. The range finder measures the distance from the surface to be landed, and the aerial camera performs the landing control according to the distance measured by the laser range finder; however, the single laser range finder can only obtain a single point. The distance information on the surface of the landing, and in order to improve the quality of the landing, it is necessary to install a plurality of laser range finder on the aerial device to obtain the multiple points and the aerial shot on the surface to be landed. The distance of the device, and thus the flatness of the surface to be dropped, but this obviously increases the cost of the aerial device and increases the complexity of the control calculation.

According to the above description, the conventional method of measuring distance information and surface flatness and the electronic device to which the method is applied still have room for improvement.

The object of the present invention is to provide a detection method and an optical device using the same, and in particular, a method and an optical device for detecting a distance and a flatness measurement of a surface to be tested by using structured light.

In a preferred embodiment, the present invention provides an optical device comprising: a structured light generating unit for providing a structure light projected onto a surface to be tested; wherein the structured light is projected onto the structure a measured surface, a measured pattern and a measured spot; and a sensing determining unit for sensing the measured pattern and the measured spot on the surface to be tested And determining whether the surface to be tested is flat according to the degree of deformation of the one of the measured patterns sensed, and obtaining a distance between the surface to be tested and the optical device according to the area of the sensed light spot sensed .

In a preferred embodiment, the structured light generating unit includes a light source and a lens group corresponding to the measured pattern and/or the measured light spot.

In a preferred embodiment, the light source comprises a laser diode (LD), a light emitting diode (LED), an organic light emitting diode (OLED), and the output has a thermal sensing wavelength. At least one of a lighting unit of the beam of the interval.

In a preferred embodiment, the illumination source is configured to output a light beam having a first wavelength and/or a light beam having a second wavelength.

In a preferred embodiment, the beam having the first wavelength is a visible beam, and the beam having the second wavelength is an invisible beam.

In a preferred embodiment, the structured light generating unit and the sensing determining unit share a single optical path window.

In a preferred embodiment, the optical device further includes at least one lens group disposed on an optical path of the structured light generating unit for changing the size of the measured pattern presented on the surface to be tested. And/or the at least one lens group is disposed on an optical path of the sensing determining unit for changing an angle of view of the sensing determining unit.

In a preferred embodiment, the pattern to be tested includes at least one of a grid pattern, a divergent radial pattern, and a symmetrical pattern.

In a preferred embodiment, the spot to be measured is formed by a diffused beam projected onto the surface to be tested.

In a preferred embodiment, the degree of deformation includes at least one of a degree of distortion, a degree of skew deformation, and a degree of dislocation deformation.

In a preferred embodiment, the optical device is applied to a portable electronic device or an aerial camera device.

In a preferred embodiment, the present invention also provides a detecting method for detecting whether a surface to be tested is flat and a distance from the surface to be tested, and the detecting method includes: projecting a structure light To the surface to be tested; wherein, when the structured light is projected onto the surface to be tested, a measured pattern and a measured spot are presented on the surface to be tested; and the surface presented on the surface to be tested is sensed The measured pattern and the measured spot, and determining whether the surface to be tested is flat according to the degree of deformation of the one of the measured patterns sensed, and obtaining the surface to be tested according to the area of the sensed spot to be sensed The distance.

In a preferred embodiment, the detecting method further includes: providing a light source and a lens group corresponding to the measured pattern and/or the measured light spot to perform the projecting step.

In a preferred embodiment, the light source comprises a laser diode (LD), a light emitting diode (LED), an organic light emitting diode (OLED), and the output has a thermal sensing wavelength. At least one of a lighting unit of the beam of the interval.

In a preferred embodiment, the illumination source is configured to output a light beam having a first wavelength and/or a light beam having a second wavelength.

In a preferred embodiment, the beam having the first wavelength is a visible beam, and the beam having the second wavelength is an invisible beam.

In a preferred embodiment, the pattern to be tested includes at least one of a grid pattern, a divergent radial pattern, and a symmetrical pattern.

In a preferred embodiment, the spot to be measured is formed by a diffused beam projected onto the surface to be tested.

In a preferred embodiment, the degree of deformation includes at least one of a degree of distortion, a degree of skew deformation, and a degree of dislocation deformation.

In a preferred embodiment, the detection method is applied to a portable electronic device or an aerial camera.

1‧‧‧Optical device

1'‧‧‧Optical device

1"‧‧‧Optical device

1'''‧‧‧Optical device

2‧‧‧Measured pattern

2A‧‧‧Measured pattern

2B‧‧‧Measured pattern

2C‧‧‧Measured pattern

2D‧‧‧Measured pattern

3‧‧‧Measured spot

3A‧‧‧Measured spot

3B‧‧‧Measured spot

3C‧‧‧Spots under test

3D‧‧‧Measured spot

6‧‧‧Portable electronic devices

7‧‧‧Airshot device

11‧‧‧Structural light generating unit

12‧‧‧Sensor unit

13‧‧‧ Optical Path Window

14‧‧‧ Optical path window

15‧‧‧ Optical Path Window

16‧‧‧Light path changing components

17‧‧‧second lens group

18‧‧‧second lens group

19‧‧‧ Third lens group

71‧‧‧ bottom

72‧‧‧From the tripod

81‧‧‧Measured surface

81C‧‧‧Measured surface

81D‧‧‧Measured surface

91‧‧‧ structured light

92‧‧‧ Beam

93‧‧‧ optical axis

111‧‧‧Light source

112‧‧‧First lens group

D1‧‧‧ spacing

D2‧‧‧ spacing

L1‧‧‧ horizontal lines

L2‧‧‧ horizontal lines

P1‧‧‧ steps

P2‧‧‧ steps

Figure 1 is a schematic view showing the structure of an optical device of the present invention in a first preferred embodiment.

Fig. 2 is a conceptual diagram showing the measured pattern and the measured spot on the surface to be measured when the structure shown in Fig. 1 is projected onto the surface to be tested.

FIG. 3A is a conceptual diagram of a measured pattern and a plurality of measured light spots that are sensed by the sensing determining unit on the surface to be tested when the optical device is spaced apart from the surface to be tested by a first distance.

Figure 3B: when the optical device is spaced a second distance from the surface to be tested The time sensing sensing unit senses the measured pattern presented on the surface to be tested and a conceptual diagram of the plurality of measured light spots.

FIG. 3C is a conceptual diagram showing a measured pattern that the sensing judging unit senses on the surface to be tested and a plurality of measured spots when the surface to be tested is a flat surface.

FIG. 3D is a conceptual diagram of a measured pattern that the sensing judging unit senses on the surface to be tested and a plurality of measured spots when the surface to be tested is not a flat surface.

4 is a schematic view showing the structure of an optical device of the present invention in a second preferred embodiment.

Figure 5 is a schematic view showing the structure of an optical device of the present invention in a third preferred embodiment.

Figure 6 is a schematic view showing the structure of an optical device of the present invention in a fourth preferred embodiment.

Figure 7 is a preferred schematic diagram of the pattern being measured as a divergent radial pattern.

Figure 8 is a preferred schematic diagram of the pattern being measured as a diagonally symmetric pattern.

Figure 9 is a schematic view showing the underside of an aerial device of the preferred embodiment of the optical device of the present invention applied to an aerial device.

FIG. 10 is a schematic diagram of a preferred structure of an optical device of the present invention applied to a portable electronic device.

Figure 11 is a flow chart of a preferred embodiment of the detection method of the present invention.

1 and FIG. 2, FIG. 1 is a schematic view showing the structure of an optical device according to a first preferred embodiment of the present invention, and FIG. 2 is a schematic view of the structure shown in FIG. A conceptual representation of the measured pattern and the measured spot of light presented on the surface being tested when the surface is being measured. The optical device 1 includes a structured light generating unit 11 and a sensing determining unit 12 that provides a structured light 91 that can be projected onto a surface to be tested 81, and that is projected onto the surface to be tested when the structured light 91 is projected At 81 o'clock, the measured surface 81 presents a pattern 2 to be measured and a plurality of light spots 3 to be measured.

In the preferred embodiment, the structured light generating unit 11 includes a light source 111 and a first lens group 112, and the light source 111 can include a laser diode (LD), a light emitting diode (LED), and an organic At least one of a light emitting diode (OLED) and a light emitting unit for outputting a light beam having a thermally induced wavelength interval, and/or the light emitting source 111 may further include a laser diode, a light emitting diode And other light-emitting units of a semiconductor type such as an organic light-emitting diode; further, the light-emitting source 111 is configured to output a plurality of light beams 92, and the light beam 92 may be a light beam having a first wavelength (such as a visible light beam) and/or having a second wavelength a light beam (such as an invisible beam or a beam having a thermally induced wavelength), and the first lens group 112 includes at least optical elements corresponding to the pattern 2 to be measured and the spot 3 to be measured (not shown, such as a diffractive element). And when the light beam 92 outputted by the light source 111 passes through, so that the structured light 91 generated by the structured light generating unit 11 is projected onto the surface to be tested 81, the measured surface 2 can be presented on the measured surface 81 and a measured spot 3; in addition, in the preferred embodiment In the example, the pattern 2 to be measured is a grid pattern, and each of the measured spots 3 is a spot formed by the diffused beam projected onto the surface to be measured 81, and the diffusion of each diffused beam The angles are not limited to the same.

Furthermore, the sensing determination unit 12 includes a visible light sensing unit (not shown) and/or an invisible light sensing unit (not shown), and is configured to sense the measured pattern 2 and the measured light presented on the surface to be tested 81. Point 3, and obtaining the distance between the surface to be tested 81 and the optical device 1 according to the sensed area of the detected light spot 3, and determining whether the surface to be tested 81 is determined according to the degree of deformation of the sensed pattern 2 sensed flat.

Further, since the light spot 3 to be measured is a light spot formed by the diffusion type light beam projected onto the surface to be measured 81, when the surface to be tested 81 and the optical device 1 are The farther the distance is, the larger the area of the measured spot 3 presented on the surface to be measured 81 is. For example, referring to FIG. 3A and FIG. 3B, FIG. 3A is a measured pattern 2A and a plurality of measured patterns 2A sensed by the sensing determining unit 12 on the surface to be tested 81 when the optical device 1 is spaced apart from the surface to be tested 81 by a first distance. FIG. 3B is a conceptual diagram of the measured light spot 3A, and FIG. 3B is a measured pattern 2B and a plurality of measured lights that the sensing determining unit 12 senses on the measured surface 81 when the optical device 1 is spaced apart from the measured surface 81 by a second distance. A conceptual diagram of point 3B. 3A and FIG. 3B, since the area of the spot 3A to be measured shown in FIG. 3A is smaller than the area of the spot 3B to be measured shown in FIG. 3B, the distance between the surface 81 to be measured and the optical device 1 shown in FIG. 3A is smaller than that of the optical device 1. 3B shows the distance between the surface to be tested 81 and the optical device 1.

Obviously, the distance between the surface to be measured 81 and the optical device 1 can be calculated based on the area of the light spot 3 to be measured which is induced on the surface to be measured 81 by the sensing determination unit 12. The method of obtaining the area of the light spot 3 to be measured can directly calculate the pixel value of the light-receiving element (not shown) of the sensing light-receiving unit 12, and can also pass the measured light spot 3 Judging from the pitch of any of the designated sub-patterns on the pattern 2 to be measured; for example, since the area of the spot 3A to be measured shown in FIG. 3A is smaller than the area of the spot 3B to be measured shown in FIG. 3B, the spot to be measured shown in FIG. 3A The distance D1 between the 3A and the horizontal line L1 of the pattern to be tested 2A (grid pattern) is larger than the distance D2 between the measured light spot 3 and the horizontal line L2 of the measured pattern 2B (grid pattern) shown in FIG. 3B, and it is understood that The area of the light spot 3 to be measured can be estimated by calculating the distances D1 and D2 of the horizontal lines L1 and L2 of the measured light spots 3A and 3B and the detected patterns 2A and 2B (gate pattern), respectively; however, the above is only an embodiment. The manner in which the area of the spot 3 to be measured is obtained is not limited to the above.

Referring to FIG. 3C and FIG. 3D, FIG. 3C is a conceptual diagram of the measured pattern 2C and the plurality of measured light spots 3C that the sensing determining unit 12 senses on the surface to be tested 81C when the surface to be tested 81 is a flat surface. FIG. 3D is a conceptual diagram of the measured pattern 2D and the plurality of measured light spots 3D that the sensing determination unit 12 senses on the surface to be tested 81 when the surface to be measured 81D is not a flat surface. Comparing Fig. 3C with Fig. 3D, when the surface to be tested 81C is a flat surface, it is tested. The pattern 2C can be neatly presented on the surface to be tested 81C, and when the surface to be tested 81D is not a flat surface, the pattern 2D to be measured is deformed in response to the unevenness of the surface to be tested 81D; obviously, according to the sensing unit 12 The degree of deformation of the detected patterns 2C, 2D on the tested surfaces 81C, 81D is sensed, that is, whether the measured surfaces 81C, 81D are flat; wherein the degree of deformation may include the degree of distortion, the degree of skew deformation, and the dislocation deformation. At least one of the extents, but not limited to the above.

Please refer to FIG. 4 , which is a schematic structural view of an optical device according to a second preferred embodiment of the present invention. The optical device 1' of the preferred embodiment is substantially similar to that described in the first preferred embodiment of the present invention, and will not be further described herein, and the preferred embodiment differs from the first preferred embodiment described above. In the first preferred embodiment, the structured light generating unit 11 and the sensing determining unit 12 respectively use different optical path windows 13, 14. In the second preferred embodiment, the structured light generating unit 11 and the sensing determination Unit 12 shares a single optical path window 15.

In detail, in the second preferred embodiment, the optical device 1' further includes an optical path changing component 16 (such as a beam splitter) disposed between the structured light generating unit 11 and the sensing determining unit 12 for changing The path of the light beam 92 output by the structured light generating unit 11 is such that the structured light generating unit 11 and the sensing determining unit 12 have a common optical axis 93, so that the structured light generating unit 11 and the sensing determining unit 12 can share a single optical path window 15, In this way, when the optical device 1 ′ is far away from the surface to be tested 81 , the sensing determination unit 12 can more accurately sense the detected pattern 2 on the surface to be tested 81 and the measured light spot 3 , particularly the surface to be tested 81 . At the edge (ie, farther from the optical axis 93).

Please refer to FIG. 5 , which is a schematic structural view of an optical device according to a third preferred embodiment of the present invention. The optical device 1" of the preferred embodiment is substantially similar to that described in the second preferred embodiment of the present invention, and will not be further described herein, and the preferred embodiment differs from the second preferred embodiment described above. The optical device 1 ′′ further includes a second lens group 17 which is located on the optical path of the structured light generating unit 11 and the sensing determining unit 12 and is located adjacent to the optical path window 15 , thereby changing the surface to be tested 81 . The size of the detected pattern 2 presented above and the sensing determination unit 12 Field of view (FOV).

Please refer to FIG. 6, which is a schematic diagram of the structure of an optical device according to a fourth preferred embodiment of the present invention. The optical device 1''' of the preferred embodiment is substantially similar to that described in the first preferred embodiment of the present invention, and will not be further described herein, and the preferred embodiment is different from the foregoing first preferred embodiment. The optical device 1 further includes a second lens group 18 and a third lens group 19, and the second lens group 18 and the third lens group 19 are respectively located at the optical path of the sensing determining unit 12 and the structured light generating unit 11. The second lens group is used to change the angle of view of the sensing determination unit 12, and the third lens group is used to change the size of the detected pattern 2 presented on the surface to be tested 81.

In particular, in the third preferred embodiment, the second lens group 17 is selectively controlled to move to the optical path of the structured light generating unit 11 and the sensing determining unit 12 in some specific cases, and In the fourth preferred embodiment, the second lens group 18 and the third lens group 19 are selectively controlled to move to the optical path of the sensing determining unit 12 and the structured light generating unit 11, respectively, in some specific cases. .

For example, in the fourth preferred embodiment (the third preferred embodiment is also applicable), the specific case may include: when the optical device 1 is far from the surface to be tested 81, the sensing determination unit 12 can The detected measured pattern 2 and all the measured spot 3 are detected, but when the optical device 1 is getting closer and closer to the surface to be measured 81, since the angle of view of the sensing judging unit 12 does not change, the sensing judging unit 12 The range that can be sensed is gradually reduced, that is, only the portion of the detected pattern 2 or part of the measured spot 3 that can be sensed, resulting in the inability to obtain the distance between the surface to be tested 81 and the optical device 1 or to determine the measured In the case where the surface 81 is flat, the angle of view of the sensing determination unit 12 can be increased by controlling the movement of the second lens group 18 to the optical path of the sensing determination unit 12, or can be moved to the structure by controlling the third lens group 19. The optical path of the light generating unit 11 changes the size of the detected pattern 2 presented on the surface to be measured 81 so that the sensing unit 12 can sense the complete measured pattern 2 and all the measured spots 3, Further, the measured surface 81 and the light can be obtained. The distance between the devices 1 is determined and it is judged whether or not the surface to be tested 81 is flat.

In addition, although the measured patterns in the above-mentioned plurality of preferred embodiments are all grid patterns, they are not limited thereto, and the measured patterns can be any equal to those skilled in the art according to actual application requirements. The design may be changed, for example, the pattern 2 to be measured may be a divergent radial pattern as shown in FIG. 7, and for example, the pattern to be measured may be a diagonally symmetric pattern as shown in FIG.

Please refer to FIG. 9 , which is a schematic diagram of a bottom surface of an aerial device of an optical camera in accordance with a preferred embodiment of the optical device of the present invention. The bottom surface 71 of the aerial device 7 is provided with a tripod 72 and an optical device 1, and the optical device 1 includes a structured light generating unit 11 and an inductive judging unit 12, and the structured light generating unit 11 and the sensing judging unit 12 are as described above. , will not repeat them here. Therefore, the aerial device 7 can accurately obtain the distance from the surface to be dropped and the flatness of the surface to be dropped through the optical device 1, thereby improving the landing quality.

Please refer to FIG. 10 , which is a schematic diagram of a preferred structure of an optical device of the present invention applied to a portable electronic device. The portable electronic device 6 can be a mobile phone, a tablet computer or a wearable device, but is not limited to the above, and includes the optical device 1 , and the optical device 1 includes the structured light generating unit 11 and the sensing determining unit 12 , and the structured light is generated. The unit 11 and the sensing judging unit 12 are as described above, and will not be further described herein. Therefore, the portable electronic device 6 can accurately obtain the distance and flatness of the surface to be used by the optical device 1. It is to be noted that FIG. 11 and FIG. 12 are only application examples of the optical device 1 of the present invention. Those skilled in the art can apply the optical device 1 of the present invention to other electronic devices according to the actual requirements by the teachings of FIG. 11 and FIG. on.

According to the above description, the method for detecting whether the surface to be tested is flat and the distance from the surface to be tested can be integrated as shown in FIG. 11; wherein the detecting method comprises: step P1, projecting a structured light to a surface to be tested; wherein, when the structured light is projected onto the surface to be tested, the measured pattern and the measured spot are presented on the surface to be tested; and in step P2, the measured pattern and the measured spot appearing on the surface to be tested are sensed, And determining whether the surface to be tested is flat according to the degree of deformation of the sensed pattern sensed Tan, and the distance from the surface being measured is obtained based on the area of the measured spot being sensed.

As can be seen from the description of the above preferred embodiments, the detection method of the present invention can reduce the complexity of detecting the flatness of the surface to be tested and the distance from the surface to be tested, and can also reduce the electronic device to which it is applied. cost. In addition, since different tested surfaces may have different materials, and different materials have different responses to thermal sensing wavelengths or infrared rays, the illumination source of the present invention can also provide corresponding measures according to the tested surfaces of different materials. The wavelength of the beam to further improve the quality of the judgment and measurement.

The above are only the preferred embodiments of the present invention, and are not intended to limit the scope of the present invention. Therefore, any equivalent changes or modifications made without departing from the spirit of the present invention should be included in the present invention. Within the scope of the patent application.

Claims (18)

An optical device for use in an aerial photographing device, comprising: a structured light generating unit for providing a structure light projected onto a same measured surface; wherein, when the structured light is projected onto the surface to be tested, A measured pattern and a measured spot are simultaneously displayed on the surface to be tested; and a sensing determining unit is configured to sense the measured pattern and the measured spot simultaneously displayed on the surface to be tested, and according to the Determining the degree of deformation of the one of the measured patterns to determine whether the surface to be tested is flat, and obtaining a distance between the surface to be tested and the optical device according to an area of the sensed light spot sensed. The optical device of claim 1, wherein the structured light generating unit comprises a light source and a lens group corresponding to the measured pattern and/or the measured spot. The optical device of claim 2, wherein the light source comprises a laser diode (LD), a light emitting diode (LED), an organic light emitting diode (OLED), and At least one of a light emitting unit having a light beam having a thermally induced wavelength interval is output. The illuminating device of claim 2, wherein the illuminating source is configured to output a light beam having a first wavelength and/or a light beam having a second wavelength. The optical device of claim 4, wherein the beam having the first wavelength is a visible light beam and the beam having the second wavelength is an invisible light beam. The optical device of claim 1, wherein the structured light generating unit and the sensing determining unit share a single optical path window. The optical device of claim 1, further comprising at least one lens group disposed on an optical path of the structured light generating unit for changing the measured condition presented on the tested surface And a size of the pattern; and/or the at least one lens group is disposed on an optical path of the sensing determining unit for changing an angle of view of the sensing determining unit. The optical device of claim 1, wherein the measured pattern comprises at least one of a grid pattern, a divergent radial pattern, and a symmetrical pattern. The optical device of claim 1, wherein the light spot to be measured is formed by a diffused beam projected onto the surface to be tested. The optical device of claim 1, wherein the degree of deformation comprises at least one of a degree of distortion, a degree of skew deformation, and a degree of dislocation deformation. A detecting method is applied to an aerial photographing device for detecting whether a surface to be tested is flat and a distance from the surface to be tested, and the detecting method comprises: projecting a structure light to the same surface to be tested Wherein, when the structured light is projected onto the surface to be tested, a measured pattern and a measured spot are simultaneously displayed on the surface to be tested; and the measured pattern is simultaneously displayed on the surface to be tested. And the measured spot, and determining whether the surface to be tested is flat according to the degree of deformation of the one of the measured patterns sensed, and obtaining the distance of the surface to be tested according to an area of the sensed spot to be sensed. The detecting method of claim 11, further comprising: providing a light source and a lens group corresponding to the measured pattern and/or the measured light spot to perform the projecting step. The detection method of claim 12, wherein the illumination source comprises a laser diode (LD), a light emitting diode (LED), an organic light emitting diode (OLED), and the like. At least one of a light emitting unit having a light beam having a thermally induced wavelength interval is output. The detecting method of claim 12, wherein the light source is for outputting a light beam having a first wavelength and/or a light beam having a second wavelength. The detecting method of claim 14, wherein the beam having the first wavelength is a visible beam, and the beam having the second wavelength is an invisible beam. The detecting method of claim 11, wherein the measured pattern comprises at least one of a grid pattern, a divergent radial pattern, and a symmetrical pattern. The detecting method of claim 11, wherein the light spot to be measured is formed by a diffused beam projected onto the surface to be tested. The detecting method of claim 11, wherein the degree of deformation comprises at least one of a degree of distortion, a degree of skew deformation, and a degree of dislocation deformation.