TWI641845B - Conveying device with temperature control mechanism and operation classification device thereof - Google Patents
Conveying device with temperature control mechanism and operation classification device thereof Download PDFInfo
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- TWI641845B TWI641845B TW107111349A TW107111349A TWI641845B TW I641845 B TWI641845 B TW I641845B TW 107111349 A TW107111349 A TW 107111349A TW 107111349 A TW107111349 A TW 107111349A TW I641845 B TWI641845 B TW I641845B
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- temperature
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- control mechanism
- temperature control
- conveying device
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- 239000003507 refrigerant Substances 0.000 claims description 26
- 238000012546 transfer Methods 0.000 claims description 5
- 239000012530 fluid Substances 0.000 claims description 4
- 238000010438 heat treatment Methods 0.000 claims description 3
- 238000006073 displacement reaction Methods 0.000 abstract description 8
- 238000005452 bending Methods 0.000 abstract description 6
- 238000012360 testing method Methods 0.000 description 36
- 238000007599 discharging Methods 0.000 description 5
- 239000000969 carrier Substances 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 208000028659 discharge Diseases 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 description 3
- 238000001816 cooling Methods 0.000 description 2
- 239000011810 insulating material Substances 0.000 description 2
- 238000013459 approach Methods 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 238000005336 cracking Methods 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 238000010792 warming Methods 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
一種具溫控機構之輸送裝置,其係設有作至少一方向位移之第一承載器,該第一承載器設有至少一承置電子元件之第一承置部,該溫控機構係於第一承載器周側之承置件上配置至少一具有溫度源之溫控器,並於溫控器設有至少一可傳導溫度源之溫度的導溫部件,以於第一承載器接觸或靠近該導溫部件時,利用導溫部件對第一承載器傳遞預設溫度,使第一承載器保持預設溫度而預溫電子元件;藉此,該第一承載器毋需配置高壓管體,以避免管體因隨第一承載器位移而反覆彎折斷裂及冷源外洩,達到有效節省成本及提升作業便利性之實用效益。 A conveying device with a temperature control mechanism is provided with a first carrier for displacement in at least one direction, the first carrier is provided with at least one first bearing portion for receiving electronic components, and the temperature control mechanism is At least one temperature controller having a temperature source is disposed on the mounting member on the circumferential side of the first carrier, and the temperature control member is provided with at least one temperature guiding member capable of transmitting the temperature of the temperature source to contact the first carrier or When the temperature guiding component is adjacent to the temperature guiding component, the first temperature is transmitted to the first carrier by using the temperature guiding component, so that the first carrier maintains the preset temperature to preheat the electronic component; thereby, the first carrier does not need to be configured with the high pressure pipe body In order to avoid the bending and fracture of the pipe body and the leakage of the cold source due to the displacement of the first carrier, the utility model has the practical benefit of effectively saving cost and improving work convenience.
Description
本發明係提供一種毋需於第一承載器上配置高壓管體,不僅縮減更換管體成本,並可提升溫控作業便利性的具溫控機構之輸送裝置。 The invention provides a conveying device with a temperature control mechanism which is required to dispose a high-pressure pipe body on the first carrier, not only reduces the cost of replacing the pipe body, but also improves the convenience of temperature control operation.
在現今,電子元件係應用於不同電子設備,由於電子設備所處之環境可能為高溫環境或低溫環境,為確保電子元件之使用品質,於製作完成後,業者係以測試設備對電子元件進行冷測作業或熱測作業,以淘汰出不良品;請參閱第1、2圖,該測試設備係於機台11上設有一具電路板121及測試座122之測試裝置12,並以測試座122承載及測試電子元件,一輸送裝置13係裝配於機台11,並配置有入料載台131及出料載台132,該入料載台131及出料載台132係分別設有入料基座1311及出料基座1321,並於入料基座1311及出料基座1321之上方各設有入料治具1312及出料治具1322,以分別承置待測電子元件及已測電子元件,該入料載台131及出料載台132再由第一驅動源133驅動作第一方向(如X方向)位移,該輸送裝置13另配置有一壓移器134,該壓移器134係由第二驅動源135驅動作第二、三方向(如Y、Z方向)位移,然為縮短電子元件於測試裝置12內之冷測降溫時間,業者係於輸送裝置13之入料載台131的入料基座1311裝配一冷媒輸送管136,該冷媒輸送管136係連接冷媒供應裝置(圖未示出),並將冷媒輸送至入料載台131之入料基座1311內,利用冷媒使入料載台131保持預設低溫,使得入料載台131預溫入料治具1312上之待測電子元件,當第一驅動源133驅動入料載台131及出料載台132同步 作X方向位移時,該入料載台131即帶動待測電子元件及冷媒輸送管136同步位移至測試座122之前方,第二驅動源135係驅動壓移器134作Y-Z方向位移於入料載台131之入料治具1312取出待測之電子元件,並將待測電子元件移入測試座122執行冷測作業,於壓移器134取料後,第一驅動源133再驅動入料載台131及出料載台132同步作X方向反向位移復位;惟,此一輸送裝置13之預溫設計於使用上具有如下待改善之處: Nowadays, electronic components are applied to different electronic devices. Since the environment in which the electronic devices are located may be a high temperature environment or a low temperature environment, in order to ensure the quality of use of the electronic components, after the completion of the production, the manufacturer uses the test equipment to cool the electronic components. The test operation or the thermal test operation is performed to eliminate the defective product; please refer to the figures 1 and 2, the test device is provided with a test device 12 with a circuit board 121 and a test socket 122 on the machine table 11, and the test seat 122 is used. Carrying and testing electronic components, a transport device 13 is mounted on the machine table 11, and is provided with a loading stage 131 and a discharge loading platform 132. The feeding stage 131 and the discharging stage 132 are respectively provided with materials. The susceptor 1311 and the discharge pedestal 1321 are respectively provided with a feeding fixture 1312 and a discharging fixture 1322 above the feeding base 1311 and the discharging base 1321 to respectively receive the electronic components to be tested and The electronic measuring device, the loading stage 131 and the discharging stage 132 are further driven by the first driving source 133 to be displaced in a first direction (such as an X direction), and the conveying device 13 is further provided with a pressure shifter 134, the pressure shifting The device 134 is driven by the second driving source 135 for the second and third directions (eg In the Y and Z directions, the refrigerant is cooled in the test device 12 by the refrigerant. The conveying pipe 136 is connected to a refrigerant supply device (not shown), and conveys the refrigerant to the feeding base 1311 of the feeding stage 131, and uses the refrigerant to keep the feeding stage 131 at a preset low temperature, so that the feeding load The stage 131 preheats the electronic component to be tested on the feeding fixture 1312, and when the first driving source 133 drives the loading stage 131 and the discharging stage 132 to synchronize When the X-direction displacement is performed, the loading stage 131 drives the electronic component to be tested and the refrigerant conveying pipe 136 to be synchronously displaced to the front of the test socket 122, and the second driving source 135 drives the pressure shifter 134 to shift in the YZ direction. The feeding fixture 1312 of the stage 131 takes out the electronic component to be tested, and moves the electronic component to be tested into the test socket 122 to perform a cold-test operation. After the material is taken by the pressure shifter 134, the first driving source 133 is driven into the material load. The stage 131 and the discharge stage 132 are synchronously reset in the X direction reverse displacement; however, the preheating design of the conveying device 13 has the following improvements in use:
1.由於冷媒輸送管136之管體內部係呈一高壓狀態,當冷媒輸送管136隨同該入料載台131之入料基座1311作X方向往復位移時,該冷媒輸送管136易因反覆彎曲變形且受壓不均,而會發生管體彎折處破裂之情況,以致必須停機更換冷媒輸送管136,造成增加設備成本及降低生產效能之缺失。 1. Since the inside of the tubular body of the refrigerant conveying pipe 136 is in a high pressure state, when the refrigerant conveying pipe 136 is reciprocally displaced in the X direction along with the feeding base 1311 of the feeding stage 131, the refrigerant conveying pipe 136 is easily deformed by repeated bending. Moreover, the pressure is uneven, and the pipe bend is broken, so that the refrigerant delivery pipe 136 must be shut down, resulting in an increase in equipment cost and a decrease in production efficiency.
2.由於冷媒輸送管136易因反覆彎曲變形且受壓不均,而發生管體彎折處破裂之問題,導致冷媒輸送管136輸送之冷媒洩漏於機台11上,工作人員必須停機耗時清理,造成增加工作人員作業不便之缺失。 2. Since the refrigerant conveying pipe 136 is easily deformed by repeated bending and uneven pressure, the problem of cracking of the pipe body bend occurs, and the refrigerant conveyed by the refrigerant conveying pipe 136 leaks on the machine table 11, and the worker must stop and time-consuming cleaning. This has led to an increase in the inconvenience of staff inconvenience.
本發明之目的一,係提供一種具溫控機構之輸送裝置,其係設有作至少一方向位移之第一承載器,該第一承載器設有至少一承置電子元件之第一承置部,該溫控機構係於第一承載器周側之承置件上配置至少一具有溫度源之溫控器,並於溫控器設有至少一可傳導溫度源之溫度的導溫部件,以於第一承載器接觸或靠近該導溫部件時,利用導溫部件對第一承載器傳遞預設溫度,使第一承載器保持預設溫度而預溫電子元件;藉此,該第一承載器毋需配置高壓管體,以避免管體因隨第一承載器位移而反覆彎折斷裂及冷源外洩,達到有效節省成本及提升作業便利性之實用效益。 A first object of the present invention is to provide a transport device with a temperature control mechanism, which is provided with a first carrier that is displaced in at least one direction, and the first carrier is provided with at least one first bearing for mounting electronic components. The temperature control mechanism is provided with at least one temperature controller having a temperature source on the mounting member on the circumferential side of the first carrier, and the temperature controller is provided with at least one temperature guiding component capable of transmitting the temperature of the temperature source. When the first carrier contacts or approaches the temperature guiding component, the first temperature is transmitted to the first carrier by the temperature guiding component, so that the first carrier maintains the preset temperature and preheats the electronic component; thereby, the first The high-pressure pipe body is not required to be arranged on the carrier, so as to avoid the bending and breaking of the pipe body and the leakage of the cold source due to the displacement of the first carrier, thereby achieving the practical benefit of effectively saving cost and improving work convenience.
本發明之目的二,係提供一種具溫控機構之輸送裝置,其中,該溫控機構之溫控器係配置於第一承載器周側之承置件上,並以導溫部件對第一承載器傳遞預設溫度,使第一承載器保持預設溫度而預溫電子元件,毋須於第一承載器裝配具冷媒之高壓管體,以避免管體彎折破裂而外洩冷媒,而可確保機台潔淨,達到提升作業便利性及生產效能之實用效益。 The second object of the present invention is to provide a conveying device with a temperature control mechanism, wherein the temperature controller of the temperature control mechanism is disposed on a bearing member on a circumferential side of the first carrier, and is firstly connected by a temperature guiding component. The carrier transmits a preset temperature, so that the first carrier maintains the preset temperature and preheats the electronic component, and the high pressure pipe body of the refrigerant is not required to be assembled on the first carrier to avoid the pipe body being bent and broken to leak the refrigerant. Ensure that the machine is clean and achieve practical benefits of improving work convenience and production efficiency.
本發明之目的三,係提供一種應用具溫控機構之輸送裝置的作業分類設備,其包含機台、供料裝置、收料裝置、作業裝置、輸送裝置及中央控制裝置,該供料裝置係配置於機台上,並設有至少一容納待作業電子元件之供料承置器,該收料裝置係配置於機台上,並設有至少一容納已作業電子元件之收料承置器,該作業裝置係配置於機台上,並設有至少一對電子元件執行預設作業之作業器,該輸送裝置係配置於機台上,並設有至少一移載電子元件之移料器,以及設有至少一載送電子元件之第一承載器,該輸送裝置另設有至少一本發明之溫控機構,以溫控第一承載器上之電子元件,該中央控制裝置係用以控制及整合各裝置作動,以執行自動化作業,達到提升作業效能之實用效益。 A third object of the present invention is to provide an operation classification device using a conveying device with a temperature control mechanism, which comprises a machine table, a feeding device, a receiving device, a working device, a conveying device and a central control device, and the feeding device is Disposed on the machine table, and provided with at least one feeding device for accommodating electronic components to be operated, the receiving device is disposed on the machine table, and is provided with at least one receiving device for accommodating the working electronic components The working device is disposed on the machine table, and is provided with at least one pair of electronic components to perform a preset operation, the conveying device is disposed on the machine table, and is provided with at least one shifting device for transferring electronic components. And a first carrier provided with at least one electronic component, the conveying device is further provided with at least one temperature control mechanism of the invention to temperature control the electronic components on the first carrier, the central control device is used for Control and integrate the operation of each device to perform automated operations to achieve practical benefits of improving operational efficiency.
11‧‧‧機台 11‧‧‧ machine
12‧‧‧測試裝置 12‧‧‧Testing device
121‧‧‧電路板 121‧‧‧Circuit board
122‧‧‧測試座 122‧‧‧ test seat
13‧‧‧輸送裝置 13‧‧‧Conveyor
131‧‧‧入料載台 131‧‧‧Incoming loading platform
1311‧‧‧入料基座 1311‧‧‧Feeding base
1312‧‧‧入料治具 1312‧‧‧Feeding fixture
132‧‧‧出料載台 132‧‧‧Output loading platform
1321‧‧‧出料基座 1321‧‧‧Draining base
1322‧‧‧出料治具 1322‧‧‧Feeding fixture
133‧‧‧第一驅動源 133‧‧‧First drive source
134‧‧‧壓移器 134‧‧‧pressure shifter
135‧‧‧第二驅動源 135‧‧‧second drive source
136‧‧‧冷媒輸送管 136‧‧‧ refrigerant pipe
20‧‧‧輸送裝置 20‧‧‧Conveyor
21、21A‧‧‧第一承載器 21, 21A‧‧‧ first carrier
211、211A‧‧‧第一基座 211, 211A‧‧‧ first base
212、212A‧‧‧第一治具 212, 212A‧‧‧First fixture
213、213A‧‧‧第一承置部 213, 213A‧‧‧First Undertaking
214‧‧‧第一套合孔 214‧‧‧First set of holes
22、22A‧‧‧溫控器 22, 22A‧‧‧ thermostat
221、221A‧‧‧本體 221, 221A‧‧‧ ontology
2211A‧‧‧第一面板 2211A‧‧‧ first panel
222‧‧‧輸送管 222‧‧‧ delivery tube
223、223A‧‧‧導溫部件 223, 223A‧‧ ‧ temperature components
224‧‧‧致冷晶片 224‧‧‧Cold wafer
23‧‧‧第一動力源 23‧‧‧First power source
24‧‧‧第二承載器 24‧‧‧Second carrier
241‧‧‧第二基座 241‧‧‧Second base
242‧‧‧第二治具 242‧‧‧Second fixture
243‧‧‧第二承置部 243‧‧‧Second Undertaking
25‧‧‧壓移器 25‧‧‧Pumper
26‧‧‧第二動力源 26‧‧‧second power source
27‧‧‧外罩 27‧‧‧ Cover
271‧‧‧第一通口 271‧‧‧ first port
272‧‧‧第二通口 272‧‧‧second port
28‧‧‧移料器 28‧‧‧Transfer
281‧‧‧第一移料器 281‧‧‧First mover
282‧‧‧第二移料器 282‧‧‧Second shifter
29‧‧‧保溫件 29‧‧‧Insulation
30‧‧‧機台 30‧‧‧ machine
40‧‧‧測試裝置 40‧‧‧Testing device
41‧‧‧電路板 41‧‧‧ boards
42‧‧‧測試座 42‧‧‧ test seat
50‧‧‧供料裝置 50‧‧‧Feeding device
51‧‧‧供料承置器 51‧‧‧Feeder
60‧‧‧收料裝置 60‧‧‧ receiving device
61‧‧‧收料承置器 61‧‧‧Receipt receiver
70‧‧‧作業裝置 70‧‧‧Working device
71‧‧‧電路板 71‧‧‧Circuit board
72‧‧‧測試座 72‧‧‧ test seat
第1圖:習知測試裝置及輸送裝置之使用示意圖(一)。 Figure 1: Schematic diagram of the use of conventional test devices and transport devices (1).
第2圖:習知測試裝置及輸送裝置之使用示意圖(二)。 Figure 2: Schematic diagram of the use of conventional test devices and transport devices (2).
第3圖:本發明溫控機構第一實施例之示意圖。 Figure 3 is a schematic view showing a first embodiment of the temperature control mechanism of the present invention.
第4圖:本發明溫控機構第一實施例之使用示意圖(一)。 Fig. 4 is a schematic view showing the use of the first embodiment of the temperature control mechanism of the present invention (1).
第5圖:本發明溫控機構第一實施例之使用示意圖(二)。 Fig. 5 is a schematic view showing the use of the first embodiment of the temperature control mechanism of the present invention (2).
第6圖:本發明溫控機構第一實施例之使用示意圖(三)。 Figure 6 is a schematic view showing the use of the first embodiment of the temperature control mechanism of the present invention (3).
第7圖:本發明溫控機構第二實施例之示意圖。 Figure 7 is a schematic view showing a second embodiment of the temperature control mechanism of the present invention.
第8圖:本發明溫控機構第三實施例之示意圖。 Figure 8 is a schematic view showing a third embodiment of the temperature control mechanism of the present invention.
第9圖:本發明溫控機構第四實施例之示意圖。 Figure 9 is a schematic view showing a fourth embodiment of the temperature control mechanism of the present invention.
第10圖:本發明輸送裝置應用於作業分類設備之示意圖。 Fig. 10 is a schematic view showing the application of the conveying device of the present invention to an operation sorting device.
為使 貴審查委員對本發明作更進一步之瞭解,茲舉一較佳實施例並配合圖式,詳述如後: In order to make the reviewer further understand the present invention, a preferred embodiment will be described in conjunction with the drawings, as follows:
請參閱第3圖,本發明之輸送裝置20係設有至少一第一承載器21及具溫控器22之溫控機構,該第一承載器21係作至少一方向位移,並設有至少一承置電子元件之第一承置部,於本實施例中,該第一承載器21係具有一導溫性佳之第一基座211,該第一基座211可直接開設第一承置部,亦或裝配至少一具第一承置部之第一治具,於本實施例中,係於該第一基座211之上方裝配一具有第一承置部213且導溫性佳之第一治具212,並以第一承置部213承置電子元件,又該輸送裝置20係於機台30上裝配至少一第一動力源23,以驅動第一承載器21之第一基座211作至少一方向位移,於本實施例中,該第一動力源23係呈X方向配置,以驅動第一基座211作X方向位移;該溫控機構之第一實施例係於該第一承載器21周側之承置件上配置至少一具溫度源之溫控器22,更進一步,該承置件可為機台30或獨立面板或周側機構之架體等,該溫控器22可裝配於第一承載器21之前方或後方或移動路徑,該溫度源可為致冷晶片或加熱件或冷源流體或熱源流體等,若第一承載器21承置待作業之電子元件,該溫控器22可對第一承載器21進行預冷作業或預熱作業,若第一承載器21承置已完成冷測之電子元件,該溫控器22可對第一承載器21上之已完成冷測的電子元件進行回溫作業,於本實施例中,該溫控器22係於第一承載器21之移動路徑且於一為機台30之承置件上固設有一本體221,該本體221係設有至少一輸送該溫度源之輸送管222,於本實施例中,該輸送管222係連接冷媒供應裝置(圖未示出),以輸送可為冷媒之溫度源,另於溫控器22設有至少一可傳導溫度源之溫度的導溫部件,以對第一承載器21傳遞預設溫度,使第一承載器21保持預設溫度,更進一步,該溫控 器22之導溫部件於第一承載器21接觸或靠近時傳遞預設溫度,該導溫部件可為桿件或面,於本實施例中,該溫控機構係於該第一承載器21之第一基座211的側面開設有呈X方向之第一套合孔214,並於本體221之第一面相對應第一承載器21之第一套合孔214位置設有可為中空桿件且導溫性佳之導溫部件223,該導溫部件223之內部則有冷媒流動而可保持低溫狀態。 Referring to FIG. 3, the conveying device 20 of the present invention is provided with at least one first carrier 21 and a temperature control mechanism with a temperature controller 22, the first carrier 21 being displaced in at least one direction and provided with at least In the embodiment, the first carrier 21 has a first pedestal 211 with good temperature conductivity, and the first pedestal 211 can directly open the first susceptor. And a first jig having at least one first receiving portion, and in the embodiment, a first bearing portion 213 is mounted on the first base 211 and the temperature guiding property is good. a fixture 212, and the electronic component is mounted by the first receiving portion 213, and the conveying device 20 is mounted on the machine 30 to assemble at least a first power source 23 to drive the first base of the first carrier 21. 211 is at least one direction displacement. In this embodiment, the first power source 23 is disposed in the X direction to drive the first base 211 to be displaced in the X direction; the first embodiment of the temperature control mechanism is At least one temperature source thermostat 22 is disposed on the mounting member on the circumferential side of the carrier 21, and further, the mounting member can be the machine 30 The thermostat 22 may be mounted in front of or behind the first carrier 21 or in a moving path, which may be a cryogenic wafer or a heating element or a cold source fluid or a heat source fluid. If the first carrier 21 carries the electronic component to be operated, the thermostat 22 can perform pre-cooling operation or pre-heating operation on the first carrier 21, and if the first carrier 21 is installed, the cold measurement is completed. The electronic component, the thermostat 22 can perform a warming operation on the electronic component of the first carrier 21 that has been cold-tested. In this embodiment, the thermostat 22 is attached to the moving path of the first carrier 21. And a body 221 is fixed on the mounting member of the machine 30. The body 221 is provided with at least one conveying pipe 222 for conveying the temperature source. In the embodiment, the conveying pipe 222 is connected to the refrigerant supply device. (not shown) for conveying a temperature source which can be a refrigerant, and the temperature controller 22 is provided with at least one temperature guiding member capable of transmitting the temperature of the temperature source to transmit a preset temperature to the first carrier 21, so that The first carrier 21 maintains a preset temperature, and further, the temperature control The temperature guiding component of the device 22 transmits a preset temperature when the first carrier 21 is in contact with or close to the first carrier 21, and the temperature guiding component can be a rod or a surface. In this embodiment, the temperature control mechanism is attached to the first carrier 21 A first sleeve hole 214 is formed in a side of the first base 211, and a first hollow hole is disposed at a position corresponding to the first sleeve hole 214 of the first carrier 21 on the first surface of the body 221 Further, the temperature-conducting member 223 having a good temperature conductivity has a refrigerant flowing inside the temperature-conducting member 223 to maintain a low temperature state.
請參閱第4圖,該測試設備係於機台30上配置有測試裝置40及輸送裝置20,該測試裝置40係設有電性連接之電路板41及測試座42,並以測試座42承置及測試電子元件,本發明之輸送裝置20係設有第一承載器21及第二承載器24,該第二承載器24係具有第二基座241,該第二基座241之上方裝配一具第二承置部243之第二治具242,並以第二承置部243承置已測之電子元件,該第一承載器21及第二承載器24係由第一動力源23驅動同步作X方向位移而分別載送待測電子元件及已測電子元件,該輸送裝置20另於測試裝置40之上方設置一壓移器25,該壓移器25並由第二動力源26驅動作Y-Z方向位移,以於測試座42及第一、二承載器21、24間移載及壓接該待測電子元件及已測電子元件;由於該溫控機構之溫控器22係配置於該第一承載器21之移動路徑的起點(即入料區),該第一承載器21之第一基座211係以第一套合孔214套合於溫控器22之本體221的導溫部件223,因溫控器22之輸送管222將冷媒輸送至本體221,而可使本體221上之導溫部件223的內部具有冷媒而呈一低溫狀態,該溫控器22即可透過導溫部件223及第一套合孔214將低溫傳導至第一基座211,再利用第一基座211將低溫傳導至第一治具212,進而使第一治具212保持預設低溫,於第一承載器21之第一治具212的第一承置部213承置待測之電子元件後,即可令第一治具212預冷待測之電子元件。 Referring to FIG. 4 , the test apparatus is equipped with a test device 40 and a transport device 20 on the machine 30 . The test device 40 is provided with an electrically connected circuit board 41 and a test socket 42 , and is supported by the test socket 42 . The test device 20 of the present invention is provided with a first carrier 21 and a second carrier 24, the second carrier 24 having a second base 241, which is assembled above the second base 241 a second fixture 242 of the second mounting portion 243, and the measured electronic components are mounted by the second mounting portion 243, the first carrier 21 and the second carrier 24 being the first power source 23 The driving device synchronously transmits the X-direction displacement to respectively carry the electronic component to be tested and the tested electronic component, and the conveying device 20 further sets a pressure shifter 25 above the testing device 40, and the pressure shifter 25 is controlled by the second power source 26 The driving is performed in the YZ direction to transfer and crimp the electronic component to be tested and the tested electronic component between the test socket 42 and the first and second carriers 21 and 24; since the temperature controller 22 of the temperature control mechanism is configured At the beginning of the moving path of the first carrier 21 (ie, the feeding area), the first base 2 of the first carrier 21 The first set of holes 214 are fitted to the temperature guiding member 223 of the body 221 of the thermostat 22, and the temperature is transmitted to the body 221 by the conveying pipe 222 of the thermostat 22, so that the temperature of the body 221 can be guided. The inside of the member 223 has a low temperature state, and the temperature controller 22 can conduct the low temperature to the first base 211 through the temperature guiding member 223 and the first sleeve hole 214, and then use the first base 211 to lower the temperature. The first jig 212 is kept at a predetermined low temperature, and the first mounting portion 213 of the first jig 212 of the first carrier 21 is placed on the electronic component to be tested. The first jig 212 is pre-cooled to the electronic component to be tested.
請參閱第5圖,該輸送裝置20之第一動力源23係驅動第一承載器21及第二承載器24作X方向位移,由於冷媒之輸送管222係裝配於溫控器22之本體221,且本體221裝配於機台30上,使得冷媒之輸送管222並不會隨第一承載器21作X方向位移而可有效防止彎折破裂,以確保輸送管222之使用壽命及防止冷媒外洩至機台30,進而節省成本及提升作業便利性;因此,當第一承載器21作X方向位移時,其第一套合孔214即直接脫離導溫部件223,並於載送過程中,經由已呈低溫狀態之第一治具212預冷待測之電子元件,於第一承載器21位移至測試座42之前方時,該壓移器25係由第二動力源26驅動作Y-Z方向位移,而於第一承載器21取出待測之電子元件,並將待測之電子元件移入測試座42而執行測試作業。 Referring to FIG. 5, the first power source 23 of the conveying device 20 drives the first carrier 21 and the second carrier 24 to be displaced in the X direction. The refrigerant delivery tube 222 is mounted on the body 221 of the thermostat 22. And the body 221 is assembled on the machine table 30, so that the refrigerant conveying pipe 222 does not shift with the first carrier 21 in the X direction, thereby effectively preventing the bending and rupture, thereby ensuring the service life of the conveying pipe 222 and preventing the refrigerant from being external. Leaking to the machine table 30, thereby saving cost and improving work convenience; therefore, when the first carrier 21 is displaced in the X direction, the first sleeve hole 214 is directly separated from the temperature guiding member 223 and is carried during the loading process. The electronic component to be tested is pre-cooled via the first fixture 212 that has been in a low temperature state. When the first carrier 21 is displaced to the front of the test socket 42, the pressure shifter 25 is driven by the second power source 26 as YZ. The direction is displaced, and the electronic component to be tested is taken out by the first carrier 21, and the electronic component to be tested is moved into the test stand 42 to perform a test operation.
請參閱第6圖,於壓移器25取出第一承載器21之待測電子元件後,該第一動力源23係驅動第一承載器21及第二承載器24作X方向反向位移,第一承載器21之第一套合孔214即再次套合於溫控器22之導溫部件223,使溫控器22利用具冷媒之導溫部件223對第一承載器21之第一基座211進行傳導低溫作業,使得第一承載器21之第一治具212保持預設低溫,以便承載及預冷下一待測之電子元件;因此,該第一承載器21不需配置高壓管體,更毋須擔心於X方向往復位移過程中會發生管體彎折斷裂及冷媒外洩之問題,達到提升溫控使用效能及節省成本之實用效益。 Referring to FIG. 6, after the electronic component to be tested of the first carrier 21 is taken out by the pressure shifter 25, the first power source 23 drives the first carrier 21 and the second carrier 24 to be reversely displaced in the X direction. The first sleeve hole 214 of the first carrier 21 is again fitted to the temperature guiding member 223 of the thermostat 22, so that the temperature controller 22 uses the temperature guiding member 223 with the refrigerant to the first base of the first carrier 21. The seat 211 performs a low temperature operation, so that the first jig 212 of the first carrier 21 maintains a preset low temperature to carry and pre-cool the next electronic component to be tested; therefore, the first carrier 21 does not need to be configured with a high pressure pipe. In addition, there is no need to worry about the problem of bending and fracture of the pipe body and leakage of refrigerant during the reciprocating displacement in the X direction, so as to achieve the practical benefit of improving the efficiency of temperature control and saving cost.
請參閱第7圖,係本發明溫控機構之第二實施例,其與第一實施例之差異在於該溫控器22A之本體221A係於第一面板2211A裝配一為致冷晶片224之溫度源,該致冷晶片224之第一面係為冷面,而第二面則為熱面,並以冷面貼合接觸本體221A之第一面板2211A,以使第一面板2211A呈一低溫狀態,該溫控器22A並以第一面板2211A 相對第一承載器21A之第一面作為導溫部件223A,該第一承載器21A係於第一基座211A之上方裝配一具第一承置部213A且導溫性佳之第一治具212A,並以第一承置部213A承置電子元件,該第一承載器21A由第一動力源23驅動作至少一方向位移,於第一承載器21A之第一基座211A及第一治具212A的第二面貼合接觸本體221A第一面之導溫部件223A時,溫控器22A之致冷晶片224即可經由本體221A之導溫部件223A將低溫傳導至第一基座211A及第一治具212A,使第一承載器21A保持預設低溫,以預冷待測電子元件。 Referring to FIG. 7, a second embodiment of the temperature control mechanism of the present invention is different from the first embodiment in that the body 221A of the thermostat 22A is attached to the first panel 2211A to be a temperature of the refrigerant wafer 224. The first surface of the cooled wafer 224 is a cold surface, and the second surface is a hot surface, and the first surface 2211A of the contact body 221A is adhered to the cold surface so that the first panel 2211A is in a low temperature state. , the thermostat 22A and the first panel 2211A The first surface of the first carrier 21A is used as the temperature guiding member 223A. The first carrier 21A is mounted on the first base 211A to assemble a first fixture 212A having a first bearing portion 213A and having good temperature conductivity. The first carrier 21A is driven by the first power source 23 to be displaced in at least one direction, and is coupled to the first base 211A and the first fixture of the first carrier 21A. When the second surface of the 212A is in contact with the temperature guiding member 223A of the first surface of the main body 221A, the cooling wafer 224 of the thermostat 22A can conduct the low temperature to the first base 211A via the temperature guiding member 223A of the main body 221A. A fixture 212A maintains the first carrier 21A at a predetermined low temperature to pre-cool the electronic component to be tested.
請參閱第8圖,係本發明溫控機構之第三實施例,其係於第一承載器21及溫控器22之外部罩設有至少一外罩27,該外罩27並開設有供第一承載器21出入之第一通口271,於本實施例中,該外罩27係以保溫材質製成,並罩置於第一承載器21及溫控器22之本體221外部,該外罩27係於第一側開設有供第一承載器21出入之第一通口271,並於頂面開設有供移料器28出入之第二通口272,於溫控器22之導溫部件223對第一承載器21進行傳導低溫作業時,可利用外罩27輔助保持第一承載器21之低溫,使第一承載器21保持預設溫度,達到提升使用效能之實用效益。 Please refer to FIG. 8 , which is a third embodiment of the temperature control mechanism of the present invention. The outer cover of the first carrier 21 and the temperature controller 22 is provided with at least one outer cover 27 , and the outer cover 27 is opened for the first In the embodiment, the outer cover 27 is made of a heat insulating material, and is disposed outside the main body 221 of the first carrier 21 and the thermostat 22, and the outer cover 27 is a first opening 271 for the first carrier 21 to enter and exit is opened on the first side, and a second opening 272 for the inlet and outlet 28 of the feeder 28 is opened on the top surface, and the temperature guiding member 223 of the temperature controller 22 is opposite. When the first carrier 21 performs the low temperature operation, the outer cover 27 can be used to assist in maintaining the low temperature of the first carrier 21, so that the first carrier 21 maintains the preset temperature, thereby achieving the practical benefit of improving the use efficiency.
請參閱第9圖,係本發明溫控機構之第四實施例,其係於第一承載器21設有至少一保溫件,於本實施例中,係於第一承載器21之第一基座211及第一治具212的外周面設置以保溫材質製成之保溫件29,於溫控器22之導溫部件223對第一承載器21進行傳導低溫作業時,可利用保溫件29輔助保持第一承載器21之低溫,使第一承載器21保持預設溫度,達到提升使用效能之實用效益。 Please refer to FIG. 9 , which is a fourth embodiment of the temperature control mechanism of the present invention. The first carrier 21 is provided with at least one heat insulating member. In this embodiment, the first base of the first carrier 21 is The outer peripheral surface of the seat 211 and the first jig 212 is provided with a heat insulating member 29 made of a heat insulating material. When the temperature guiding member 223 of the temperature controller 22 conducts low temperature operation on the first carrier 21, the heat insulating member 29 can be used to assist Maintaining the low temperature of the first carrier 21 maintains the first carrier 21 at a preset temperature, thereby achieving the practical benefit of improving the performance.
請參閱第3、10圖,係本發明具溫控機構之輸送裝置20應用於電子元件作業分類設備之示意圖,該作業分類設 備係於機台30上配置有供料裝置50、收料裝置60、作業裝置70、本發明具溫控機構之輸送裝置20及中央控制裝置(圖未示出);該供料裝置50係裝配於機台30,並設有至少一為供料盤之供料承置器51,用以容納至少一待作業之電子元件;該收料裝置60係裝配於機台30,並設有至少一為收料盤之收料承置器61,用以容納至少一已作業之電子元件;該作業裝置70係裝配於機台30上,並設有至少一對電子元件執行預設作業之作業器,於本實施例中,該作業器係設有電性連接之電路板71及測試座72,以對電子元件執行測試作業;該輸送裝置20係裝配於機台30上,並設有至少一移載電子元件之移料器,以及設有至少一載送電子元件之第一承載器21,該輸送裝置20另設有至少一本發明之溫控機構,以溫控第一承載器21,於本實施例中,該輸送裝置20係設有二可承置待測電子元件之第一承載器21,並於二第一承載器21之移載路徑分別設置溫控機構,各溫控機構之溫控器22係以導溫部件223對第一承載器21傳導低溫,以使第一承載器21保持預設溫度,又該輸送裝置20係設有第一移料器281,以於供料裝置50之供料承置器51取出待測之電子元件,並移載至二第一承載器21,二第一承載器21即預冷待測之電子元件,並將待測之電子元件載送至作業裝置70之側方,該輸送裝置20係以二壓移器25分別將二第一承載器21上待測之電子元件移載至作業裝置70之測試座72而執行測試作業,以及將測試座72之已測電子元件移載至二第二承載器24,二第二承載器24載出已測之電子元件,該輸送裝置20係設有第二移料器282於二第二承載器24上取出已測之電子元件,並依據測試結果,將已測之電子元件輸送至收料裝置60之收料承置器61處而分類收置;該中央控制裝置係用以控制及整合各裝置作動,以執行自動化作業,達到提升作業效能之實用效益。 Please refer to FIG. 3 and FIG. 10 , which are schematic diagrams of the conveying device 20 with the temperature control mechanism applied to the electronic component operation sorting device. The feeding machine 30 is provided with a feeding device 50, a receiving device 60, a working device 70, a conveying device 20 with a temperature control mechanism of the present invention, and a central control device (not shown); the feeding device 50 is Mounted on the machine table 30, and provided with at least one feeding device 51 for feeding trays for accommodating at least one electronic component to be operated; the receiving device 60 is mounted on the machine table 30 and provided with at least a receiving receptacle 61 for receiving trays for accommodating at least one electronic component that has been operated; the working device 70 is mounted on the machine 30 and is provided with at least one pair of electronic components for performing preset operations In this embodiment, the operator is provided with an electrically connected circuit board 71 and a test stand 72 for performing a test operation on the electronic component; the transport device 20 is mounted on the machine 30 and is provided with at least a shifter for transferring the electronic component, and a first carrier 21 for carrying at least one electronic component, the transport device 20 is further provided with at least one temperature control mechanism of the invention for temperature-controlling the first carrier 21 In the embodiment, the conveying device 20 is provided with two electronic components capable of being tested. The first carrier 21 and the temperature transfer mechanism are respectively disposed on the transfer paths of the two first carriers 21, and the temperature controller 22 of each temperature control mechanism conducts the low temperature to the first carrier 21 by the temperature guiding member 223, so that The first carrier 21 maintains a preset temperature, and the conveying device 20 is provided with a first feeder 281 for taking out the electronic component to be tested at the feeding device 51 of the feeding device 50 and transferring it to the second The first carrier 21, the two first carriers 21 pre-cools the electronic components to be tested, and carries the electronic components to be tested to the side of the working device 70, and the conveying device 20 is respectively connected by the two pressure shifters 25 Transferring the electronic components to be tested on the two first carriers 21 to the test socket 72 of the working device 70 to perform a test operation, and transferring the tested electronic components of the test socket 72 to the second second carrier 24, The second carrier 24 carries the measured electronic components, and the conveying device 20 is provided with a second shifter 282 to take out the measured electronic components on the second carrier 24, and according to the test result, the measured electronic components The components are transported to the receiving device 61 of the receiving device 60 for sorting and accommodating; the central control device is And integration of each device to control actuator to perform automatic operation, to achieve practical benefits of the job performance of the lift.
Claims (9)
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW107111349A TWI641845B (en) | 2018-03-30 | 2018-03-30 | Conveying device with temperature control mechanism and operation classification device thereof |
Country Status (1)
| Country | Link |
|---|---|
| TW (1) | TWI641845B (en) |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2000009793A (en) * | 1998-06-24 | 2000-01-14 | Advantest Corp | Parts testing equipment |
| US20060244472A1 (en) * | 2005-05-02 | 2006-11-02 | Daytona Control Co., Ltd. | Temperature control apparatus |
| CN1287436C (en) * | 2002-07-24 | 2006-11-29 | 未来产业株式会社 | Test tray with carrier assembly for semiconductor device processing machine |
| TW201629680A (en) * | 2015-02-13 | 2016-08-16 | Hon Tech Inc | Electronic component preheating apparatus and operation equipment using the same |
| CN106896842A (en) * | 2015-11-13 | 2017-06-27 | 鸿劲科技股份有限公司 | Temperature control mechanism and method of electronic element jointing device and test equipment applied by temperature control mechanism |
-
2018
- 2018-03-30 TW TW107111349A patent/TWI641845B/en active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2000009793A (en) * | 1998-06-24 | 2000-01-14 | Advantest Corp | Parts testing equipment |
| CN1287436C (en) * | 2002-07-24 | 2006-11-29 | 未来产业株式会社 | Test tray with carrier assembly for semiconductor device processing machine |
| US20060244472A1 (en) * | 2005-05-02 | 2006-11-02 | Daytona Control Co., Ltd. | Temperature control apparatus |
| TW201629680A (en) * | 2015-02-13 | 2016-08-16 | Hon Tech Inc | Electronic component preheating apparatus and operation equipment using the same |
| CN106896842A (en) * | 2015-11-13 | 2017-06-27 | 鸿劲科技股份有限公司 | Temperature control mechanism and method of electronic element jointing device and test equipment applied by temperature control mechanism |
Also Published As
| Publication number | Publication date |
|---|---|
| TW201942589A (en) | 2019-11-01 |
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