TWI640053B - Substrate support table and manufacturing method thereof - Google Patents
Substrate support table and manufacturing method thereof Download PDFInfo
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Abstract
一種基板支撐台,其包括:靜電夾盤、加熱器和基座。靜電夾盤安裝到加熱器上方,加熱器固定到基座上表面。其中所述基座內包括冷卻液流通管道;所述加熱器包括加熱元件用於產生熱量,還包括位於加熱元件上方的上絕緣材料層和位於加熱元件下方的下絕緣材料層,所述下絕緣材料層底面固定到所述基座上表面,其中所述下絕緣材料層厚度大於1mm,下絕緣材料層中包括至少一金屬層將下絕緣材料層分隔為多個絕緣材料子層。 A substrate support table includes an electrostatic chuck, a heater, and a base. An electrostatic chuck is mounted above the heater, and the heater is fixed to the upper surface of the base. Wherein the base includes a cooling liquid circulation pipe; the heater includes a heating element for generating heat, and further includes an upper insulating material layer above the heating element and a lower insulating material layer below the heating element, the lower insulation The bottom surface of the material layer is fixed to the upper surface of the base, wherein the thickness of the lower insulating material layer is greater than 1 mm, and the lower insulating material layer includes at least one metal layer to separate the lower insulating material layer into a plurality of insulating material sub-layers.
Description
本發明係關於半導體製造技術領域,尤其係關於一種用於電漿處理器反應腔內的基板支撐台。 The invention relates to the technical field of semiconductor manufacturing, and in particular to a substrate support table used in a reaction chamber of a plasma processor.
電漿處理器被廣泛應用在半導體工業內,用來對待處理基板進行高精度的加工如電漿刻蝕、化學氣相沉積(CVD)等。電漿處理器包括一個反應腔,反應腔內底部具有一個基板支撐台用來放置並固定住基板。支撐台除了固定基板還需要對基板進行溫度控制,所以需要能夠帶走電漿處理中產生的熱量,同時支撐台還連接有射頻電源,藉由調節射頻電源的輸出功率來調節基板上的處理效果。所以基板支撐台是一個電漿處理器中核心的、多功能的裝置,對基板的處理效果具有重大的影響。 Plasma processors are widely used in the semiconductor industry for high-precision processing of substrates to be processed, such as plasma etching and chemical vapor deposition (CVD). The plasma processor includes a reaction chamber, and a substrate support table at the bottom of the reaction chamber is used to place and fix the substrate. In addition to fixing the substrate, the support table needs to control the temperature of the substrate, so it needs to be able to take away the heat generated in the plasma processing. At the same time, the support table is also connected to an RF power supply, which adjusts the processing effect on the substrate by adjusting the output power of the RF power supply . Therefore, the substrate support table is a core and multifunctional device in a plasma processor, which has a significant impact on the processing effect of the substrate.
隨著半導體工業的發展,越來越多的電漿處理製程被開發出來,各個製程需要最佳溫度參數不同,經常在同一個反應腔中需要對一片基板進行連續的多個製程處理,在不同的製程步驟中需要快速的切換其對應的最佳溫度。為了實現快速變溫的需要,現有機制在基板支撐台結構設計成如圖1所示的結構,包括基座10’,基座10’內開設有用於冷卻液流通的冷卻液管道11’以帶走熱量,基座上包括加熱器,加熱器由上下兩層絕緣材料23’、21’和位於絕緣材料層之間的加熱元件如電阻絲29’組成,加熱器上絕緣材料層上表面藉由矽膠層32’ 與上方的靜電夾盤30’結合固定。其中基座一般由金屬製成如鋁合金製成,電連接到至少一個射頻電源。絕緣材料層21’、23’通常由陶瓷材料如AL2O3,AlN,Y2O3等製成。在溫度切換過程中如果需要降溫則關閉加熱的功率輸出,由下方冷卻液管道內的冷卻液全力帶走熱量,在升溫過程中加熱器接受電功率產生大量熱,冷卻液也需要一直流通以帶走上方加熱器以及處理過程中電漿體和射頻電源產生的熱量。所以加熱過程中加熱器產生的熱量會大量的直接被下方的基座10’帶走,並沒有向上到達靜電夾盤30’上的基板。為了減少這種熱量損耗也加快升溫過程,需要在加熱元件29’和下方冷卻液管道11’之間具有更低的熱導率,比如基座10’採用具有更低熱導率的金屬材料鈦(約20W/m.k)或者使得加熱元件29’下方的絕緣材料層21’更厚。 With the development of the semiconductor industry, more and more plasma processing processes have been developed. Each process requires different optimal temperature parameters. Often, multiple processes in a single substrate need to be processed continuously in the same reaction chamber. In the process steps, the corresponding optimal temperature needs to be quickly switched. In order to achieve the requirement of rapid temperature change, the existing mechanism is designed in the structure of the substrate support table as shown in FIG. 1, including a base 10 ′, and a cooling liquid pipe 11 ′ for cooling liquid circulation is opened in the base 10 ′ to take away Heat, the base includes a heater. The heater is composed of two layers of insulating materials 23 ', 21' and a heating element such as a resistance wire 29 'located between the layers of insulating materials. The upper surface of the insulating material layer on the heater is made of silicone The layer 32 'is fixed in combination with the electrostatic chuck 30' above. The base is generally made of metal, such as aluminum alloy, and is electrically connected to at least one radio frequency power source. The insulating material layers 21 ', 23' generally, AlN, Y 2 O 3 and the like made of a ceramic material such as AL 2 O 3. During the temperature switching process, if the temperature needs to be lowered, the heating power output is turned off. The coolant in the coolant pipe below takes the heat away. The heater receives electric power to generate a lot of heat during the heating process. The coolant also needs to be circulated to take away. Upper heater and heat generated by plasma and RF power during processing. Therefore, a large amount of heat generated by the heater during the heating process is directly taken away by the base 10 'below, and does not reach the substrate on the electrostatic chuck 30' upward. In order to reduce this heat loss and speed up the heating process, it is necessary to have a lower thermal conductivity between the heating element 29 'and the lower cooling liquid pipe 11'. For example, the base 10 'uses a metal material with a lower thermal conductivity, titanium ( (About 20 W / mk) or make the insulating material layer 21 'under the heating element 29' thicker.
但是這兩個方案都有問題:鈦材料過於昂貴,其價格超出鋁合金材料(導熱係數170W/m.k)的4倍;絕緣材料層21’厚度增加到超出1mm厚度時,由於下方鋁合金和絕緣材料層的熱膨脹係數差異過大,在頻繁的溫度改變過程中很快絕緣材料層21’就會碎裂失效。所以現有技術中絕緣材料層21’的厚度一般都在0.5-1mm之間,這樣小的厚度還導致在整個平面上絕緣材料層厚度的不均勻性很難控制,因為絕緣材料層通常是噴塗的,表面粗糙度很大,常見製程加工形成的公差都會帶來絕緣材料層厚度不均勻。對於0.5mm厚的材料層來說不同部位絕緣材料厚度差達到25um時,就可以使得不同區域之間的厚度差可以達到5%,位於基板支撐台上方的基板溫度也會相應的受影響而很難獲得均一的溫度分佈。所以業內需要一種新的方法或裝置解決在基板支撐台,能夠快速的改變基板的溫度,同時還需要能使得基板的溫度更均勻。 However, these two solutions have problems: the titanium material is too expensive, and its price exceeds 4 times that of the aluminum alloy material (thermal conductivity coefficient 170W / mk); when the thickness of the insulating material layer 21 'increases to more than 1mm, due to the aluminum alloy and the insulation below The thermal expansion coefficient of the material layer has a large difference, and the insulating material layer 21 'will quickly break and fail during frequent temperature changes. Therefore, in the prior art, the thickness of the insulating material layer 21 'is generally between 0.5 and 1 mm. Such a small thickness also results in difficulty in controlling the unevenness of the thickness of the insulating material layer over the entire plane, because the insulating material layer is usually sprayed. The surface roughness is very large, and tolerances formed by common processes will cause uneven thickness of the insulating material layer. For a 0.5mm thick material layer, when the thickness difference of the insulating material in different parts reaches 25um, the thickness difference between different regions can reach 5%, and the temperature of the substrate above the substrate support table will be affected accordingly and very It is difficult to obtain a uniform temperature distribution. Therefore, the industry needs a new method or device to solve the problem on the substrate support table, which can quickly change the temperature of the substrate, and also needs to make the temperature of the substrate more uniform.
本發明解決的問題是提供一種基板支撐台包括:靜電夾盤、加熱器和基座,靜電夾盤安裝到加熱器上方,加熱器固定到基座上表面;其中所述基座內包括冷卻液流通管道;所述加熱器包括加熱元件用於產生熱量,還包括位於加熱元件上方的上絕緣材料層和位於加熱元件下方的下絕緣材料層,所述下絕緣材料層底面固定到所述基座上表面,其中:所述下絕緣材料層厚度大於1mm,下絕緣材料層中包括至少一金屬層將下絕緣材料層分隔為多個絕緣材料子層。其中多個絕緣材料子層厚度小於1mm,以防止絕緣材料層在溫度變化過程中破裂,較佳的厚度絕緣材料子層厚度小於0.5mm大於0.2mm。 The problem to be solved by the present invention is to provide a substrate support table including: an electrostatic chuck, a heater, and a base. The electrostatic chuck is installed above the heater, and the heater is fixed to the upper surface of the base; wherein the base includes a cooling liquid. A circulation pipe; the heater includes a heating element for generating heat, and further includes an upper insulating material layer above the heating element and a lower insulating material layer below the heating element, and a bottom surface of the lower insulating material layer is fixed to the base The upper surface, wherein the thickness of the lower insulating material layer is greater than 1 mm, and the lower insulating material layer includes at least one metal layer to separate the lower insulating material layer into a plurality of insulating material sub-layers. The thickness of a plurality of insulating material sub-layers is less than 1 mm to prevent the insulating material layer from cracking during temperature changes. The thickness of the insulating material sub-layers is preferably less than 0.5 mm and greater than 0.2 mm.
其中本發明的金屬層最佳選擇為網格狀,基座由鋁合金製成。 Among them, the metal layer of the present invention is best selected in a grid shape, and the base is made of aluminum alloy.
較佳地,下絕緣材料層可以包括兩層金屬層,將下絕緣材料層分隔為第一、第二、第三絕緣材料子層。 Preferably, the lower insulating material layer may include two metal layers to separate the lower insulating material layer into first, second, and third insulating material sub-layers.
本發明中絕緣材料層由陶瓷材料或者有機材料製成,所述陶瓷材料包括氧化鋁、氮化鋁、氧化釔之一,所述有機材料選自PEEK、Vespel、Kapton之一。 In the present invention, the insulating material layer is made of a ceramic material or an organic material, the ceramic material includes one of alumina, aluminum nitride, and yttrium oxide, and the organic material is selected from one of PEEK, Vespel, and Kapton.
本發明基板支撐台的靜電夾盤藉由一層矽膠層與加熱器頂部的上絕緣材料層相連接。 The electrostatic chuck of the substrate supporting table of the present invention is connected to the upper insulating material layer on the top of the heater through a layer of silicon rubber.
本發明同時提供一種用於基板支撐台的加熱器的製造方法,包括步驟:A、在基底材料上形成約小於1mm厚的絕緣材料層;B、在絕緣材料層上形成網格狀金屬層;C、重複執行上述步驟A至B以形成下絕緣材料層,所述下絕緣材料層包括交替的絕緣材料層和金屬層,其中頂層為絕緣材料層;D、在頂 層的絕緣材料層上形成加熱元件;E、在所述加熱元件上形成上絕緣材料層。 The invention also provides a method for manufacturing a heater for a substrate supporting table, comprising the steps of: A. forming an insulating material layer having a thickness of less than about 1 mm on a base material; B. forming a grid-like metal layer on the insulating material layer; C. Repeat the above steps A to B to form a lower insulating material layer, which includes alternating insulating material layers and metal layers, wherein the top layer is an insulating material layer; D. On top A heating element is formed on the insulating material layer of the layer; E. An upper insulating material layer is formed on the heating element.
10、10’‧‧‧基座 10, 10’‧‧‧ base
11‧‧‧冷卻液流通管道 11‧‧‧Coolant circulation pipe
11’‧‧‧冷卻液管道 11’‧‧‧Coolant pipe
22、24‧‧‧金屬層 22, 24‧‧‧ metal layer
21、21’、23、23’、25、27‧‧‧絕緣材料層 21, 21 ’, 23, 23’, 25, 27‧‧‧ insulating material layers
29、29’‧‧‧加熱元件 29, 29’‧‧‧ heating element
30、30’‧‧‧靜電夾盤 30, 30’‧‧‧ electrostatic chuck
32、32’‧‧‧矽膠層 32, 32’‧‧‧ Silicone layer
圖1是現有技術基板支撐台示意圖;圖2是本發明基板支撐台示意圖。 FIG. 1 is a schematic diagram of a prior art substrate support table; FIG. 2 is a schematic diagram of a substrate support table of the present invention.
如圖2所示為本發明基板支撐台示意圖,本發明與圖1所示的現有技術相比具體相類似的基本結構,包括依次疊放的靜電夾盤30、矽膠層32、加熱元件29和基座10,主要區別在於本發明的基板支撐台上包括多層的絕緣材料層21、23、25、27,這些絕緣材料層之間還埋入有兩層狀金屬層22、24以及位於上方的加熱元件29。其中金屬層22、24所用材料與下方基座10類似具有較好的延展性,而且整體厚度很低(小於0.1mm),覆蓋面積也小所以不會增加上下方向的熱導係數。絕緣材料層21至27的厚度可以和現有技術一樣選擇0.5-1mm或者更低,但是本發明藉由不同絕緣材料層之間金屬網格層22、24的設置可以使得這些絕緣材料層不會在溫度變化過程中破裂。現有技術中如果整個絕緣材料層21厚度超過1mm,就會使整個絕緣材料層21的厚度與鋁合金基座10之間發生的相對位移導致材料層21破裂的,本發明中每層絕緣材料層厚度都小於1mm,這些較薄的絕緣材料層21、23、25、27都只與其直接結合的基座10、網格狀金屬層22、24發生相對位移,所以每個絕緣材料層不易發生破裂,但是整體的絕緣材料層總厚度卻遠超1mm的厚度,最大可以達到約3mm,這個厚度已經足以阻擋大量熱量在加熱過程中向下傳導。為了防止破裂,每層絕緣材料層21、23、 25、27的厚度數值可以選擇的更低,比如小0.5mm大於0.2mm,藉由設置更多層的金屬-絕緣材料層單元相疊使得加熱元件29下方的整體絕緣材料層厚度大於1mm,實現有效的隔熱的同時避免絕緣材料層破裂。 As shown in FIG. 2, a schematic diagram of a substrate support table according to the present invention is shown. The basic structure of the present invention is similar to that of the prior art shown in FIG. 1, and includes an electrostatic chuck 30, a silicone layer 32, a heating element 29 and The main difference between the pedestal 10 is that the substrate support table of the present invention includes multiple layers of insulating material layers 21, 23, 25, and 27. Two insulating metal layers 22 and 24 are embedded between the insulating material layers and the upper layer Heating element 29. The materials used for the metal layers 22 and 24 are similar to the lower base 10 and have good ductility, and the overall thickness is very low (less than 0.1 mm), and the coverage area is also small, so the thermal conductivity in the up-down direction is not increased. The thickness of the insulating material layers 21 to 27 can be selected as 0.5-1 mm or less as in the prior art, but the present invention can prevent these insulating material layers from being arranged by setting the metal grid layers 22 and 24 between different insulating material layers. Rupture during temperature changes. In the prior art, if the thickness of the entire insulating material layer 21 exceeds 1 mm, the relative displacement between the thickness of the entire insulating material layer 21 and the aluminum alloy base 10 causes the material layer 21 to break. Each layer of the insulating material layer in the present invention The thickness is less than 1mm. These thin insulating material layers 21, 23, 25, and 27 are only relatively displaced by the base 10 and the grid-like metal layers 22 and 24 which are directly combined with each other, so each insulating material layer is not easy to crack. However, the overall thickness of the overall insulating material layer is far greater than the thickness of 1mm, which can reach a maximum of about 3mm. This thickness is sufficient to prevent a large amount of heat from being transmitted downward during the heating process. To prevent cracking, each layer of insulating material 21, 23, The thickness values of 25 and 27 can be lower, for example, 0.5mm smaller than 0.2mm. By setting more layers of metal-insulating material layer units to overlap, the thickness of the overall insulating material layer below the heating element 29 is greater than 1mm. Effective thermal insulation while avoiding cracks in the insulating material layer.
絕緣材料層總厚度增加後,整體材料層厚度的均勻性更加容易控制,同樣的的加工製程帶來的公差25um,相對採用本發明方案後具有的更大厚度,在整個加熱器平面上厚度的總誤差可以控制在2%以下,這對上方基板溫度的均勻性帶來了額外的好處。本發明中網格狀金屬層的設置除了可以防止絕緣材料層破裂以外,即使局部區域發生了輕微開裂,由於絕緣材料是與網格狀金屬結合的所以這些裂開的部分仍然會被金屬材料拉住,不會發生脫落。所以採用本發明加熱器結構的基板支撐台,能夠在防止加熱器破裂的情況下獲得更厚的絕緣材料層。 After the total thickness of the insulating material layer is increased, the uniformity of the thickness of the overall material layer is easier to control. The same processing process brings a tolerance of 25um. Compared with the larger thickness after the solution of the present invention, the thickness of The total error can be controlled below 2%, which brings additional benefits to the uniformity of the temperature of the upper substrate. The arrangement of the grid-like metal layer in the present invention can prevent the insulation material layer from cracking. Even if a slight crack occurs in a local area, since the insulation material is combined with the grid-like metal, these cracked portions will still be pulled by the metal material. Live without falling off. Therefore, using the substrate supporting table of the heater structure of the present invention can obtain a thicker insulating material layer while preventing the heater from cracking.
本發明結構的基板支撐台對於需要獲得對基板進行高溫處理的製程特別有效,在高溫處理製程過程中基板溫度與下方的基座溫度差可能大於50度甚至可能達到100度。因為本發明提供的隔熱效果更好的加熱器能夠使得加熱元件29中產生的熱主要向上方加熱靜電夾盤30以及靜電夾盤30上方的基板,不僅升溫速度快,能夠減少製程切換時間,還節約能源。 The substrate support table of the structure of the present invention is particularly effective for processes that require high-temperature processing of the substrate. During the high-temperature processing process, the difference between the temperature of the substrate and the temperature of the underlying pedestal may be greater than 50 degrees or even 100 degrees. Because the heater with better thermal insulation effect provided by the present invention can make the heat generated in the heating element 29 mainly heat the electrostatic chuck 30 and the substrate above the electrostatic chuck 30, not only the temperature rising speed is fast, but the process switching time can be reduced. It also saves energy.
本發明中網格狀金屬層22、24也可以是金屬的圓片,同樣能實現本發明目的,避免絕緣材料層破裂。本發明中絕緣材料層除了可以是前面例舉的氧化鋁、氮化鋁等陶瓷材料也可以是有機聚合物製成的絕緣材料,這些有機絕緣材料可以是市場上可以獲得的PEEK(聚醚醚酮)、Vespel(全芳香族聚醯亞胺樹脂)、Kapton(聚醯亞胺薄膜)等,只要是絕緣且熱導率低的材料都能應用於本發明。 In the present invention, the grid-like metal layers 22 and 24 may also be metal discs, which can also achieve the purpose of the present invention and avoid cracking of the insulating material layer. In the present invention, the insulating material layer may be ceramic materials such as alumina, aluminum nitride and the like, as well as insulating materials made of organic polymers. These organic insulating materials may be PEEK (polyetherether) available on the market. Ketone), Vespel (fully aromatic polyimide resin), Kapton (polyimide film), etc., can be applied to the present invention as long as it is an insulating and low thermal conductivity material.
本發明還提供了一種基板支撐台的製造製程,在基板支撐台製造過程包括:A、採用傳統機械加工製程製造帶有冷卻液流通管道11的鋁合金基座10;B、噴塗絕緣材料顆粒到基底材料上形成約0.5mm厚的絕緣材料層21,固化後完成絕緣材料層21的形成,噴塗製程可以是電弧噴塗、電漿噴塗或者除了噴塗製程也可以採用化學氣相沉積形成絕緣材料層,這樣形成的絕緣材料層更緻密均勻;C、形成網格狀金屬層22,形成製程可以是噴塗也可以是直接鋪設金屬薄片;D、重複執行上述步驟B至C以分別形成絕緣材料層23、金屬層24、絕緣材料層25;E、在絕緣材料層25上形成加熱元件29;F、再次執行步驟B,形成絕緣材料層27。 The present invention also provides a manufacturing process of a substrate supporting table. The manufacturing process of the substrate supporting table includes: A. manufacturing the aluminum alloy base 10 with the cooling liquid circulation pipe 11 by a traditional machining process; B. spraying the insulating material particles to An insulating material layer 21 with a thickness of about 0.5 mm is formed on the base material, and the formation of the insulating material layer 21 is completed after curing. The spraying process can be arc spraying, plasma spraying, or in addition to the spraying process, chemical vapor deposition can also be used to form the insulating material layer. The insulating material layer formed in this way is more dense and uniform; C. The grid-like metal layer 22 is formed, and the forming process can be spray coating or direct metal foil laying; D. Repeat the above steps B to C to form the insulating material layers 23, Metal layer 24, insulating material layer 25; E, forming a heating element 29 on the insulating material layer 25; F, performing step B again to form an insulating material layer 27.
完成加熱器和基座10的製造後可以進一步在絕緣材料層上表面塗覆矽膠等黏接材料層,將靜電夾盤放置到所述黏接材料層上完成整個基板支撐台的製造。上述步驟D中B至C重複執行的次數可以根據需要優化設定,重複執行次數越多則絕緣材料層和網格狀金屬層交疊的層數越多,直到達到製程需要的隔熱效果為止。本發明製造製程也可以是先加工製造本發明特製的加熱器,再將加熱器藉由黏膠層黏接到下方基座10上表面,其中加熱器的製造過程與前述A至F類似,但是下絕緣材料層是直接在基底材料上開始製造,首先在基 底上依次生長各種絕緣材料層和金屬層,然後形成加熱元件29和上絕緣材料層,最後將加熱器從基底材料上脫離固定到預先準備的鋁基座10上。 After the manufacture of the heater and the base 10 is completed, an adhesive material layer such as silicon rubber may be further coated on the upper surface of the insulating material layer, and an electrostatic chuck is placed on the adhesive material layer to complete the manufacture of the entire substrate support table. The number of repeated executions of steps B to C in the above step D can be optimally set as required. The more the number of repeated executions, the more the number of overlapping layers of the insulating material layer and the grid-like metal layer, until the insulation effect required by the process is achieved. The manufacturing process of the present invention may also be to first manufacture and manufacture the special heater of the present invention, and then glue the heater to the upper surface of the lower base 10 through an adhesive layer. The manufacturing process of the heater is similar to the aforementioned A to F, but The lower insulating material layer is manufactured directly on the base material. Various insulating material layers and metal layers are sequentially grown on the bottom, and then a heating element 29 and an upper insulating material layer are formed. Finally, the heater is detached from the base material and fixed to the aluminum base 10 prepared in advance.
雖然本發明揭露如上,但本發明並非限定於此。任何所屬技術領域中具有通常知識者,在不脫離本發明的精神和範圍內,均可作各種更動與修改,因此本發明的保護範圍應當以發明申請專利範圍所限定的範圍為准。 Although the present invention is disclosed as above, the present invention is not limited thereto. Any person with ordinary knowledge in the technical field can make various changes and modifications without departing from the spirit and scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the scope defined by the scope of patent application for invention.
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Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW200913054A (en) * | 2007-07-13 | 2009-03-16 | Applied Materials Inc | High temperature cathode for plasma etching |
| US20140096909A1 (en) * | 2009-10-21 | 2014-04-10 | Lam Research Corporation | Heating plate with planar heater zones for semiconductor processing |
| TW201417211A (en) * | 2012-10-29 | 2014-05-01 | 中微半導體設備(上海)有限公司 | Electrostatic chuck component for plasma processing chamber and method of manufacturing same |
| TW201506000A (en) * | 2013-03-25 | 2015-02-16 | 日本碍子股份有限公司 | Cooling plate, method of manufacturing the same, and component for semiconductor manufacturing apparatus |
| TW201535588A (en) * | 2014-03-05 | 2015-09-16 | 應用材料股份有限公司 | Pixelated capacitor controlled electrostatic chuck |
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| JP5201527B2 (en) * | 2008-03-28 | 2013-06-05 | 東京エレクトロン株式会社 | Electrostatic chuck and manufacturing method thereof |
| CN104167344B (en) * | 2013-05-17 | 2017-02-08 | 中微半导体设备(上海)有限公司 | Plasma processing chamber and base station thereof |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW200913054A (en) * | 2007-07-13 | 2009-03-16 | Applied Materials Inc | High temperature cathode for plasma etching |
| US20140096909A1 (en) * | 2009-10-21 | 2014-04-10 | Lam Research Corporation | Heating plate with planar heater zones for semiconductor processing |
| TW201417211A (en) * | 2012-10-29 | 2014-05-01 | 中微半導體設備(上海)有限公司 | Electrostatic chuck component for plasma processing chamber and method of manufacturing same |
| TW201506000A (en) * | 2013-03-25 | 2015-02-16 | 日本碍子股份有限公司 | Cooling plate, method of manufacturing the same, and component for semiconductor manufacturing apparatus |
| TW201535588A (en) * | 2014-03-05 | 2015-09-16 | 應用材料股份有限公司 | Pixelated capacitor controlled electrostatic chuck |
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| CN106935529B (en) | 2020-03-24 |
| CN106935529A (en) | 2017-07-07 |
| TW201735214A (en) | 2017-10-01 |
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