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TWI529486B - Photosensitive resin composition, photosensitive element, method for producing resist pattern, and method for producing printed wiring board - Google Patents

Photosensitive resin composition, photosensitive element, method for producing resist pattern, and method for producing printed wiring board Download PDF

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TWI529486B
TWI529486B TW100119383A TW100119383A TWI529486B TW I529486 B TWI529486 B TW I529486B TW 100119383 A TW100119383 A TW 100119383A TW 100119383 A TW100119383 A TW 100119383A TW I529486 B TWI529486 B TW I529486B
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photosensitive resin
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resin composition
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TW201211694A (en
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渡邊滿明
石川力
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日立化成股份有限公司
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  • Materials For Photolithography (AREA)
  • Manufacturing Of Printed Circuit Boards (AREA)
  • Manufacturing Of Printed Wiring (AREA)
  • Non-Metallic Protective Coatings For Printed Circuits (AREA)
  • Photosensitive Polymer And Photoresist Processing (AREA)
  • Polymerisation Methods In General (AREA)

Description

感光性樹脂組成物、感光性元件、光阻圖型之製造方法及印刷配線板之製造方法 Photosensitive resin composition, photosensitive element, method for producing photoresist pattern, and method for producing printed wiring board

本發明係關於一種感光性樹脂組成物、以及使用該感光性樹脂組成物之感光性元件、光阻圖型之製造方法、及印刷配線板之製造方法。 The present invention relates to a photosensitive resin composition, a photosensitive element using the photosensitive resin composition, a method for producing a photoresist pattern, and a method for producing a printed wiring board.

一直以來,在印刷配線板之製造領域中,作為用於蝕刻處理、鍍敷處理等的光阻劑材料,已廣泛使用感光性樹脂組成物以及於感光性樹脂組成物使用支撐體和保護膜而得的感光性元件。 In the field of the production of printed wiring boards, as a photoresist material used for etching treatment, plating treatment, etc., a photosensitive resin composition has been widely used, and a support and a protective film are used for the photosensitive resin composition. The photosensitive element obtained.

印刷配線板係藉由將感光性元件層合在電路形成用基板上,曝光成圖型狀後,以顯影液除去未曝光部,形成光阻圖型,再以該光阻圖型作為遮罩,實施蝕刻處理或鍍敷處理而形成電路後,從基板上剝離除去硬化部分之方法而製造。 The printed wiring board is formed by laminating a photosensitive element on a circuit-forming substrate, exposing it to a pattern, and removing the unexposed part by a developing solution to form a photoresist pattern, and using the photoresist pattern as a mask. After the etching treatment or the plating treatment is performed to form a circuit, the method of removing and removing the hardened portion from the substrate is performed.

從環保性以及安全性的立場出發,作為除去該未曝光部的光阻劑的顯影液,使用碳酸鈉等的鹼顯影型已成為主流。顯影液通常只要具有某種程度的溶解感光性樹脂組成物層的能力即能夠使用,在顯影時,感光性樹脂組成物被溶解或分散於顯影液中。 From the standpoint of environmental protection and safety, an alkali developing type using sodium carbonate or the like as a developing solution for removing the photoresist of the unexposed portion has become mainstream. The developer can be used as long as it has a certain ability to dissolve the photosensitive resin composition layer, and the photosensitive resin composition is dissolved or dispersed in the developer at the time of development.

在此,當設置在電路形成用基板上的通孔被光阻劑膜覆蓋的情況下,要求所使用的感光性樹脂組成物具有能使覆蓋通孔的光阻劑膜不因顯影液或水洗的噴霧壓力而破裂 的蓋孔性,亦即具有蓋孔可靠性。 Here, in the case where the through hole provided on the circuit formation substrate is covered with the photoresist film, it is required that the photosensitive resin composition used has a photoresist film capable of covering the through hole without being washed by the developer or the water. Burst of spray pressure The capping property, that is, the reliability of the cap hole.

作為蓋孔可靠性優異的感光性樹脂組成物,已提出了含有具有氨酯鍵的雙官能單體或三官能單體之感光性樹脂組成物(例如參照專利文獻1及2)。此外,亦揭示了使用聚己內酯改質之異氰尿酸環單體之感光性樹脂組成物(例如參照專利文獻3)。 A photosensitive resin composition containing a bifunctional monomer or a trifunctional monomer having a urethane bond has been proposed as a photosensitive resin composition having excellent cap hole reliability (see, for example, Patent Documents 1 and 2). Further, a photosensitive resin composition of a isocyanuric acid ring monomer modified with polycaprolactone is also disclosed (for example, see Patent Document 3).

[先前技術文獻] [Previous Technical Literature] [專利文獻] [Patent Literature]

專利文獻1:日本專利公開號平10-142789公報 Patent Document 1: Japanese Patent Publication No. Hei 10-142789

專利文獻2:日本專利公開號2001-117224公報 Patent Document 2: Japanese Patent Publication No. 2001-117224

專利文獻3:WO2007/049519號說明書 Patent Document 3: Specification No. WO2007/049519

然而,專利文獻1、2中記載之含有具有氨酯鍵的雙官能單體的感光性樹脂組成物,有無法獲得充分蓋孔可靠性的情況;此外,含有具有氨酯鍵的三官能單體的感光性樹脂組成物,有硬化膜容易變硬、變脆的情況。此外,專利文獻3中記載的感光性樹脂組成物,在解析度方面需要進一步提高。 However, the photosensitive resin composition containing a bifunctional monomer having a urethane bond described in Patent Documents 1 and 2 may not provide sufficient capping reliability; and further, it contains a trifunctional monomer having a urethane bond. In the photosensitive resin composition, the cured film is likely to be hard and brittle. Further, the photosensitive resin composition described in Patent Document 3 needs to be further improved in terms of resolution.

本發明即是鑒於此等實際情況而完成者,其目的在於提供解析度優異、同時硬化膜的機械強度優異且具有柔軟性的感光性樹脂組成物,亦即蓋孔可靠性優異之感光性樹 脂組成物,以及使用該感光性樹脂組成物之感光性元件、光阻圖型之製造方法、及印刷配線板之製造方法。 The present invention has been made in view of such actual circumstances, and an object of the present invention is to provide a photosensitive resin composition which is excellent in resolution and excellent in mechanical strength of a cured film and has flexibility, that is, a photosensitive tree having excellent cover hole reliability. A lipid composition, a photosensitive element using the photosensitive resin composition, a method for producing a photoresist pattern, and a method for producing a printed wiring board.

本發明之第一態樣係一種感光性樹脂組成物,其含有下列成分:(A)成分:黏合劑聚合物、(B)成分:具有至少一個乙烯性不飽和鍵之聚合性化合物、及(C)成分:光聚合起始劑,且前述(B)成分含有以下述通式(I)表示之化合物, (式中,R1表示二價有機基團,R2表示以下述通式(II)表示之基團), (式中,R3表示氫原子或甲基,X表示伸烷基,n表示10~25之整數)。 The first aspect of the present invention is a photosensitive resin composition comprising the following components: (A) component: a binder polymer, and (B) component: a polymerizable compound having at least one ethylenically unsaturated bond, and C) component: a photopolymerization initiator, and the component (B) contains a compound represented by the following formula (I). (wherein R 1 represents a divalent organic group, and R 2 represents a group represented by the following formula (II)), (wherein R 3 represents a hydrogen atom or a methyl group, X represents an alkylene group, and n represents an integer of 10 to 25).

藉由使感光性樹脂組成物含有以上述通式(I)表示之化合物,可提高蓋孔可靠性及解析度。 By including the compound represented by the above formula (I) in the photosensitive resin composition, the reliability and resolution of the lid hole can be improved.

又,本發明之第二態樣係一種感光性樹脂組成物,其 含有下列成分:(A)成分:黏合劑聚合物、(B)成分:具有至少一個乙烯性不飽和鍵之聚合性化合物、及(C)成分:光聚合起始劑,且前述(B)成分含有以下述通式(III)表示之化合物與以下述通式(IV)表示之化合物之反應產物, (式中,R3表示氫原子或甲基,X表示伸烷基,n表示10~25之整數), (式中,R1表示二價有機基團)。 Further, a second aspect of the present invention is a photosensitive resin composition comprising the following components: (A) component: a binder polymer, and (B) component: a polymerizable compound having at least one ethylenically unsaturated bond, And (C) component: a photopolymerization initiator, and the component (B) contains a reaction product of a compound represented by the following formula (III) and a compound represented by the following formula (IV). (wherein R 3 represents a hydrogen atom or a methyl group, X represents an alkylene group, and n represents an integer of 10 to 25), (wherein R 1 represents a divalent organic group).

藉由使感光性樹脂組成物含有上述通式(III)與上述通式(IV)的氨酯化反應之反應產物,可提高蓋孔可靠性以及解析度。 By allowing the photosensitive resin composition to contain the reaction product of the urethanization reaction of the above formula (III) with the above formula (IV), the lid hole reliability and resolution can be improved.

此外,本發明之第三態樣係一種感光性元件,其具有支撐體、及感光性樹脂層,所述感光性樹脂層係形成於上述支撐體上之上述感光性樹脂組成物的塗膜。 Further, a third aspect of the invention is a photosensitive element comprising a support and a photosensitive resin layer, wherein the photosensitive resin layer is a coating film of the photosensitive resin composition formed on the support.

此外,本發明之第四態樣係一種光阻圖型之製造方法,其具有下列步驟:在電路形成用基板上形成感光性樹脂層之感光性樹脂層形成步驟,該感光性樹脂層為上述感光性樹脂組成物的塗膜;對上述感光性樹脂層之至少一部分 照射活性光線而使曝光部光硬化之曝光步驟;以及藉由顯影從電路形成用基板上除去上述感光性樹脂層的未硬化部分之顯影步驟。 Further, a fourth aspect of the present invention is a method for producing a resist pattern having a photosensitive resin layer forming step of forming a photosensitive resin layer on a circuit forming substrate, wherein the photosensitive resin layer is as described above a coating film of the photosensitive resin composition; at least a part of the photosensitive resin layer An exposure step of irradiating the active light to photoharden the exposed portion; and a developing step of removing the uncured portion of the photosensitive resin layer from the circuit-forming substrate by development.

進而,本發明之第五態樣係一種印刷配線板之製造方法,其含有下述步驟:對藉由上述光阻圖型之製造方法而形成有光阻圖型之電路形成用基板進行蝕刻處理或鍍敷處理,以形成導體圖型。 Further, a fifth aspect of the present invention provides a method of manufacturing a printed wiring board, comprising the steps of: etching a substrate for forming a circuit having a photoresist pattern formed by the method for manufacturing a photoresist pattern; Or plating treatment to form a conductor pattern.

根據本發明,可提供解析度優異、同時硬化膜之機械強度優異且具有柔軟性之感光性樹脂組成物,亦即蓋孔可靠性優異之感光性樹脂組成物,以及使用該感光性樹脂組成物之感光性元件、光阻圖型之製造方法、及印刷配線板之製造方法。 According to the present invention, it is possible to provide a photosensitive resin composition which is excellent in resolution and excellent in mechanical strength of a cured film and has flexibility, that is, a photosensitive resin composition excellent in lid hole reliability, and a photosensitive resin composition using the same A photosensitive element, a method for producing a photoresist pattern, and a method for producing a printed wiring board.

以下對本發明進行詳細說明。又,本發明中之(甲基)丙烯酸係指丙烯酸以及其對應之甲基丙烯酸,(甲基)丙烯酸酯係指丙烯酸酯以及其對應之甲基丙烯酸酯,(甲基)丙烯醯基係指丙烯醯基以及其對應之甲基丙烯醯基。 The invention is described in detail below. Further, (meth)acrylic acid in the present invention means acrylic acid and its corresponding methacrylic acid, (meth)acrylate means acrylate and its corresponding methacrylate, and (meth)acryloyl group means Acryl sulfhydryl and its corresponding methacryl fluorenyl group.

此外,於本說明書中,「步驟」此用語不僅僅是獨立的步驟,即使是與其他步驟無法明確區別的情況下只要達成該步驟預期的作用則亦包含在本用語中。此外,本說明書中,使用「~」表示的數值範圍表示包含分別以「~ 」前後記載的數值為最小值以及最大值的範圍。又於本說明書中,在提及組成物中各成分的量時,當組成物中存在多種相當於各成分的物質時,只要沒有特別限定,則是指存在於組成物中的該多種物質的合計量。 In addition, in this specification, the term "step" is not only an independent step, but even if it is not clearly distinguishable from other steps, it is included in the term as long as the intended effect of the step is achieved. In addition, in this specification, the numerical range indicated by "~" indicates that the inclusion is "~ The values described before and after are the minimum and maximum ranges. Further, in the present specification, when referring to the amount of each component in the composition, when a plurality of substances corresponding to the respective components are present in the composition, unless otherwise specified, it means the plurality of substances present in the composition. Total measurement.

<感光性樹脂組成物> <Photosensitive resin composition>

本發明的感光性樹脂組成物為含有(A)成分:黏合劑聚合物、(B)成分:至少具有一個乙烯性不飽和鍵之聚合性化合物、及(C)成分:光聚合起始劑之感光性樹脂組成物,其中,上述(B)成分含有以下述通式(I)表示之化合物、或以下述通式(III)表示之化合物與以下述通式(IV)表示之化合物的氨酯化反應的反應產物。 The photosensitive resin composition of the present invention contains (A) a component: a binder polymer, (B) a component: a polymerizable compound having at least one ethylenically unsaturated bond, and (C) a component: a photopolymerization initiator. In the photosensitive resin composition, the component (B) contains a compound represented by the following formula (I) or a compound represented by the following formula (III) and a urethane of a compound represented by the following formula (IV). The reaction product of the reaction.

於通式(I)以及通式(II)中,R1表示二價有機基團,R2表示以上述通式(II)表示之基團。R3表示氫原子或甲基,X表示伸烷基,n表示10~25的整數。 In the formula (I) and the formula (II), R 1 represents a divalent organic group, and R 2 represents a group represented by the above formula (II). R 3 represents a hydrogen atom or a methyl group, X represents an alkylene group, and n represents an integer of 10 to 25.

於通式(III)以及通式(IV)中,R3、X以及n分別與上述通式(II)中的R3、X以及n同義,而R1與通式(I)中的R1同義。 In the general formula (III) and the general formula (IV), R 3 , X and n are respectively synonymous with R 3 , X and n in the above formula (II), and R 1 and R in the formula (I) 1 synonymous.

藉由含有上述特定化合物作為聚合性化合物,可構成蓋孔可靠性以及解析度優異的感光性樹脂組成物。因此,前述感光性樹脂組成物可適用於製造具有微細電路層的多層印刷配線板,特別可適用於蓋孔用。 By containing the above specific compound as a polymerizable compound, a photosensitive resin composition having excellent lid hole reliability and resolution can be formed. Therefore, the photosensitive resin composition can be suitably used for producing a multilayer printed wiring board having a fine circuit layer, and is particularly suitable for use in a cover hole.

〔(B)成分:至少具有一個乙烯性不飽和鍵的聚合性化合物〕 [Component (B): a polymerizable compound having at least one ethylenically unsaturated bond]

於本發明的感光性樹脂組成物中,作為(B)成分,係含有以上述通式(I)表示的化合物、或以上述通式(III)表示的化合物與以上述通式(IV)表示的化合物的氨酯化反應的反應產物作為必要成分。 In the photosensitive resin composition of the present invention, the compound represented by the above formula (I) or the compound represented by the above formula (III) and the compound represented by the above formula (IV) are contained as the component (B). The reaction product of the urethanization reaction of the compound is an essential component.

於上述通式(I)以及通式(IV)中,R1表示二價有機基團。 In the above formula (I) and formula (IV), R 1 represents a divalent organic group.

作為R1所示的二價有機基團,只要含碳原子且能夠連接異氰尿酸酯環及醯胺基,則無特別限制。可以列舉出例如碳數1~10之伸烷基以及碳數6~10之伸芳基。又,上述碳數1~10之伸烷基既可為直鏈狀,亦可為支鏈狀。此外,通式(I)以及通式(IV)中的3個R1彼此可相同亦可不同。 The divalent organic group represented by R 1 is not particularly limited as long as it contains a carbon atom and is capable of linking an isocyanurate ring and a guanamine group. For example, an alkylene group having 1 to 10 carbon atoms and an extended aryl group having 6 to 10 carbon atoms may be mentioned. Further, the alkylene group having 1 to 10 carbon atoms may be linear or branched. Further, three R 1 in the general formula (I) and the general formula (IV) may be the same or different.

作為上述碳數1~10之伸烷基,具體而言可列舉出例如亞甲基、伸乙基、伸丙基、伸異丙基、伸丁基、伸異丁 基、伸戊基、伸新戊基、伸己基、伸庚基、伸辛基、2-乙基-伸己基、伸壬基以及伸癸基。作為碳數6~10之伸芳基,可以列舉出伸苯基等。 Specific examples of the alkylene group having 1 to 10 carbon atoms include a methylene group, an ethyl group, a propyl group, an isopropyl group, a butyl group, and an extended butyl group. Base, pentyl group, neopentyl group, hexyl group, heptyl group, octyl group, 2-ethyl-extension hexyl group, hydrazine group and hydrazine group. Examples of the aryl group having 6 to 10 carbon atoms include a stretching phenyl group and the like.

於本發明中,從蓋孔可靠性和解析度之觀點觀之,R1較佳為碳數2~10之伸烷基,更佳為碳數3~8之伸烷基。 In the present invention, R 1 is preferably an alkylene group having 2 to 10 carbon atoms, more preferably an alkylene group having 3 to 8 carbon atoms, from the viewpoint of reliability and resolution of the lid hole.

上述通式(I)中的3個R2彼此可相同亦可不同。 The three R 2 in the above formula (I) may be the same or different from each other.

於上述通式(II)以及通式(III)中,X表示伸烷基。伸烷基的碳數並未特別限制,但從蓋孔可靠性和解析度之觀點觀之,較佳為碳數2~7之伸烷基,更佳為碳數2~4之伸烷基。 In the above formula (II) and formula (III), X represents an alkylene group. The carbon number of the alkylene group is not particularly limited, but from the viewpoint of reliability and resolution of the cap hole, it is preferably an alkylene group having 2 to 7 carbon atoms, more preferably an alkylene group having 2 to 4 carbon atoms. .

作為X中的伸烷基,具體而言可以列舉出例如伸乙基、伸丙基、伸丁基、伸戊基以及伸己基。此外,上述伸烷基可為直鏈狀亦可為支鏈狀。此外,通式(II)中的10個以上的X彼此可相同亦可不同,但較佳為彼此相同。 Specific examples of the alkylene group in X include an ethyl group, a propyl group, a butyl group, a pentyl group and a hexyl group. Further, the above alkylene group may be linear or branched. Further, 10 or more Xs in the formula (II) may be the same or different from each other, but are preferably the same as each other.

此外,n雖然表示10~25的整數,但從蓋孔可靠性和強度之觀點觀之,較佳為15~25。 Further, although n represents an integer of 10 to 25, it is preferably 15 to 25 from the viewpoint of reliability and strength of the cover hole.

以上述通式(I)表示之化合物例如可藉由下述通式(III)所示之化合物與下述通式(IV)所示之化合物的氨酯化反應而製造。作為該反應條件,只要是通常生成氨酯鍵的反應條件,即無特別限制,此外也可以使用適當的催化劑等來進行反應。 The compound represented by the above formula (I) can be produced, for example, by a transesterification reaction of a compound represented by the following formula (III) with a compound represented by the following formula (IV). The reaction conditions are not particularly limited as long as the reaction conditions are usually such that a urethane bond is formed, and the reaction may be carried out using a suitable catalyst or the like.

[化5] [Chemical 5]

R3、X以及n分別與上述通式(II)中的R3、X以及n同義,較佳態樣亦相同。此外,R1與通式(I)中的R1同義,較佳樣態亦相同。 R 3 , X and n are respectively synonymous with R 3 , X and n in the above formula (II), and preferred embodiments are also the same. Further, R 1 has the same meaning as R 1 in the formula (I), and the preferred form is also the same.

通式(I)所示之化合物為使3分子的通式(III)所示的化合物分別與通式(IV)所示的化合物的3個異氰酸酯基進行加成反應而生成的化合物。 The compound represented by the formula (I) is a compound obtained by subjecting three molecules of the compound represented by the formula (III) to the three isocyanate groups of the compound represented by the formula (IV).

於上述通式(III)所示之化合物與上述通式(IV)所示之化合物的反應產物中,除通式(I)所示的化合物以外,亦可包含使1分子或2分子的通式(III)所示之化合物與1分子的通式(IV)所示的化合物進行加成反應而生成的化合物。此外,亦可包含該等以外之反應產物。 In the reaction product of the compound represented by the above formula (III) and the compound represented by the above formula (IV), in addition to the compound represented by the formula (I), one molecule or two molecules may be contained. A compound produced by the addition reaction of a compound represented by the formula (III) and a compound represented by the formula (IV) in one molecule. In addition, reaction products other than these may also be included.

上述通式(III)所示之化合物與上述通式(IV)所示之化合物的反應產物中所包含之通式(I)所示之化合物的含有率並未特別限制。從蓋孔可靠性和強度之觀點觀之,較佳為15質量%以上,更佳為25質量%以上。 The content of the compound represented by the formula (I) contained in the reaction product of the compound represented by the above formula (III) and the compound represented by the above formula (IV) is not particularly limited. From the viewpoint of the reliability and strength of the lid hole, it is preferably 15% by mass or more, and more preferably 25% by mass or more.

於上述感光性樹脂組成物中,上述通式(I)所示之化合物、或上述通式(III)所示之化合物與上述通式(IV)所示之化合物的反應產物之含有率並未特別限制。從蓋孔可靠性、硬化膜的機械強度以及柔軟性的觀點觀之,在感光性樹脂組成物中較佳為1質量%~25質量%,更佳為5質量%~20質量%。 In the photosensitive resin composition, the content of the reaction product of the compound represented by the above formula (I) or the compound represented by the above formula (III) and the compound represented by the above formula (IV) is not Special restrictions. From the viewpoint of the reliability of the lid hole, the mechanical strength of the cured film, and the flexibility, the photosensitive resin composition is preferably from 1% by mass to 25% by mass, and more preferably from 5% by mass to 20% by mass.

於上述感光性樹脂組成物中,作為(B)成分,上述通式(I)所示之化合物、或上述通式(III)所示之化合物與上述通式(IV)所示之化合物的反應產物,較佳為含有1質量%~25質量%之R1為碳數1~10之伸烷基、X為碳數2~4之伸烷基、且n為10~25之化合物;上述通式(I)所示之化合物、或上述通式(III)所示之化合物與上述通式(IV)所示之化合物的反應產物,更佳為含有5質量%~20質量%之R1的X為碳數2~4之伸烷基、且n為15~25之化合物。 In the photosensitive resin composition, the compound represented by the above formula (I) or the compound represented by the above formula (III) and the compound represented by the above formula (IV) are reacted as the component (B). The product is preferably a compound containing 1% by mass to 25% by mass of R 1 as an alkylene group having 1 to 10 carbon atoms, X being an alkylene group having 2 to 4 carbon atoms, and n being 10 to 25; The reaction product of the compound represented by the formula (I) or the compound represented by the above formula (III) and the compound represented by the above formula (IV) is more preferably contained in an amount of 5% by mass to 20% by mass of R 1 . X is a compound having a C 2 to 4 alkyl group and n is 15 to 25.

此外,本發明中的(B)成分除了作為必要成分的上述通式(I)所示之化合物、或上述通式(III)所示之化合物與上述通式(IV)所示之化合物的反應產物以外,亦可含有至少具有一個乙烯性不飽和鍵的聚合性化合物(以下有時稱為「其他聚合性化合物」)。 Further, in the present invention, the component (B) is reacted with a compound represented by the above formula (I) or a compound represented by the above formula (III) and a compound represented by the above formula (IV) as an essential component. In addition to the product, a polymerizable compound having at least one ethylenically unsaturated bond (hereinafter sometimes referred to as "other polymerizable compound") may be contained.

作為其他聚合性化合物,可列舉出例如使α,β-不飽和羧酸與多元醇進行縮合反應而得之化合物、使α,β-不飽和羧酸加成到含有縮水甘油基的化合物而得之化合物、(甲基)丙烯酸之烷基酯、(甲基)丙烯酸衍生物之苯二甲酸酯、具有氨酯鍵之(甲基)丙烯酸酯化合物以及雙酚A系(甲基)丙烯酸酯化合物。 Examples of the other polymerizable compound include a compound obtained by subjecting an α,β-unsaturated carboxylic acid to a condensation reaction with a polyhydric alcohol, and a compound obtained by adding an α,β-unsaturated carboxylic acid to a compound containing a glycidyl group. a compound, an alkyl (meth)acrylate, a phthalate of a (meth)acrylic acid derivative, a (meth) acrylate compound having a urethane bond, and a bisphenol A (meth) acrylate Compound.

作為上述使α,β-不飽和羧酸與多元醇進行縮合反應而得之化合物,可列舉出例如伸乙氧基的數目為2~14的聚乙二醇二(甲基)丙烯酸酯、伸丙氧基的數目為2~14的聚丙二醇二(甲基)丙烯酸酯、伸乙氧基的數目為2~14 且伸丙氧基的數目為2~14的聚乙二醇聚丙二醇二(甲基)丙烯酸酯、三羥甲基丙烷二(甲基)丙烯酸酯、三羥甲基丙烷三(甲基)丙烯酸酯、三羥甲基丙烷伸乙氧基三(甲基)丙烯酸酯、三羥甲基丙烷二伸乙氧基三(甲基)丙烯酸酯、三羥甲基丙烷三伸乙氧基三(甲基)丙烯酸酯、三羥甲基丙烷四伸乙氧基三(甲基)丙烯酸酯、三羥甲基丙烷五伸乙氧基三(甲基)丙烯酸酯、四羥甲基甲烷三(甲基)丙烯酸酯、四羥甲基甲烷四(甲基)丙烯酸酯、二季戊四醇五(甲基)丙烯酸酯以及二季戊四醇六(甲基)丙烯酸酯。 Examples of the compound obtained by subjecting the α,β-unsaturated carboxylic acid to a polycondensation reaction with a polyhydric alcohol include polyethylene glycol di(meth)acrylate having a number of ethylene oxide groups of 2 to 14 and stretching. The number of polypropylene glycol di(meth) acrylate and ethoxy group having a number of propoxy groups of 2 to 14 is 2 to 14 Polyethylene glycol polypropylene glycol di(meth)acrylate, trimethylolpropane di(meth)acrylate, trimethylolpropane tri(meth)acrylate having a number of propoxy groups of 2 to 14 Ester, trimethylolpropane ethoxylated tri(meth) acrylate, trimethylolpropane diethylene ethoxy tri(meth) acrylate, trimethylolpropane triethylene ethoxy tris Acrylate, trimethylolpropane tetraethyleneoxytri(meth)acrylate, trimethylolpropane pentaerythritol tris(meth)acrylate, tetramethylolmethanetris(methyl) ) acrylate, tetramethylol methane tetra(meth) acrylate, dipentaerythritol penta (meth) acrylate, and dipentaerythritol hexa (meth) acrylate.

作為上述使α,β-不飽和羧酸加成到含有縮水甘油基的化合物而得之化合物,可列舉出例如雙酚A二氧伸乙基二(甲基)丙烯酸酯、雙酚A三氧伸乙基二(甲基)丙烯酸酯、雙酚A十氧伸乙基二(甲基)丙烯酸酯等雙酚A聚氧伸乙基二(甲基)丙烯酸酯、三羥甲基丙烷三縮水甘油醚之(甲基)丙烯酸酯加成物以及雙酚A二縮水甘油醚之(甲基)丙烯酸酯加成物。 Examples of the compound obtained by adding an α,β-unsaturated carboxylic acid to a compound containing a glycidyl group include bisphenol A dioxoethyl di(meth)acrylate and bisphenol A trioxane. Bisphenol A polyoxyethylidene di(meth)acrylate, trimethylolpropane tricondensate, such as ethyl di(meth)acrylate, bisphenol A decahydroethylidene di(meth)acrylate A (meth) acrylate adduct of glyceryl ether and a (meth) acrylate adduct of bisphenol A diglycidyl ether.

作為上述(甲基)丙烯酸之烷基酯,可列舉出(甲基)丙烯酸甲酯、(甲基)丙烯酸乙酯、(甲基)丙烯酸丁酯以及(甲基)丙烯酸2-乙基己酯等。 Examples of the alkyl (meth)acrylate include methyl (meth)acrylate, ethyl (meth)acrylate, butyl (meth)acrylate, and 2-ethylhexyl (meth)acrylate. Wait.

作為上述(甲基)丙烯酸衍生物的苯二甲酸酯,可列舉出γ-氯-β-羥丙基-β'-(甲基)丙烯醯氧基乙基-鄰苯二甲酸酯、β-羥乙基-β'-(甲基)丙烯醯氧基乙基-鄰苯二甲酸酯以及β-羥丙基-β'-(甲基)丙烯醯氧基乙基-鄰苯二甲酸 酯等。 Examples of the phthalic acid ester of the (meth)acrylic acid derivative include γ-chloro-β-hydroxypropyl-β -(meth)acryloxyethyl-phthalate. β-Hydroxyethyl-β ' -(meth)acrylomethoxyethyl-phthalate and β-hydroxypropyl-β ' -(methyl)propenyloxyethyl-o-phenylene Formate and so on.

作為上述具有氨酯鍵的(甲基)丙烯酸酯化合物,可列舉出β位具有OH基的(甲基)丙烯酸衍生物與異佛爾酮二異氰酸酯、2,6-甲苯二異氰酸酯、2,4-甲苯二異氰酸酯、1,6-六亞甲基二異氰酸酯等二異氰酸酯化合物的加成反應物、三((甲基)丙烯醯氧基四乙二醇異氰酸酯)六亞甲基異氰尿酸酯、EO改質氨酯二(甲基)丙烯酸酯以及EO、PO改質氨酯二(甲基)丙烯酸酯等。 Examples of the (meth) acrylate compound having a urethane bond include a (meth)acrylic acid derivative having an OH group at the β-position, isophorone diisocyanate, 2,6-toluene diisocyanate, and 2,4. Addition reaction of diisocyanate compound such as toluene diisocyanate or 1,6-hexamethylene diisocyanate, tris((meth)acryloxytetraethyleneethylene glycol isocyanate) hexamethylene isocyanurate EO modified urethane di(meth) acrylate and EO, PO modified urethane di(meth) acrylate, and the like.

又,EO表示環氧乙烷,經EO改質的化合物具有伸乙氧基的嵌段結構。且,PO表示環氧丙烷,經PO改質的化合物具有伸丙氧基的嵌段結構。作為EO改質氨酯二(甲基)丙烯酸酯,可列舉出例如新中村化學工業(股)製造的製品名UA-11等。此外,作為EO、PO改質氨酯二(甲基)丙烯酸酯,可列舉出例如新中村化學工業(股)製造的製品名UA-13。 Further, EO represents ethylene oxide, and the EO-modified compound has a block structure of an ethoxy group. Further, PO represents propylene oxide, and the PO-modified compound has a block structure in which a propoxy group is extended. Examples of the EO-modified urethane di(meth)acrylate include a product name UA-11 manufactured by Shin-Nakamura Chemical Industry Co., Ltd., and the like. Further, examples of the EO and PO-modified urethane di(meth)acrylate include the product name UA-13 manufactured by Shin-Nakamura Chemical Industry Co., Ltd.

作為上述雙酚A系(甲基)丙烯酸酯化合物,可列舉出2,2-雙(4-((甲基)丙烯醯氧基聚伸乙氧基)苯基)丙烷、2,2-雙(4-((甲基)丙烯醯氧基聚伸丙氧基)苯基)丙烷、以及2,2-雙(4-((甲基)丙烯醯氧基聚伸乙氧基聚伸丙氧基)苯基)丙烷等。該等化合物可單獨使用或將兩種以上組合使用。 Examples of the bisphenol A-based (meth) acrylate compound include 2,2-bis(4-((meth) propylene oxy) ethoxy) phenyl) propane, 2, 2-double. (4-((Methyl)propenyloxypolypropoxy)phenyl)propane, and 2,2-bis(4-((meth)propenyloxy) ethoxylated poly(propoxy) Base) phenyl)propane and the like. These compounds may be used singly or in combination of two or more.

於該等化合物中,從耐化學性的觀點而言,較佳為含有雙酚A系(甲基)丙烯酸酯化合物以及(甲基)丙烯酸衍生物之苯二甲酸酯中的至少1種,更佳為含有兩者。 Among these compounds, at least one of a bisphenol A-based (meth) acrylate compound and a (meth)acrylic acid derivative phthalate is preferably used from the viewpoint of chemical resistance. More preferably, it contains both.

上述其他聚合性化合物之含有率並無特別限制,但從蓋孔可靠性以及解析度的觀點觀之,在上述(B)成分的總量100質量%中較佳為50質量%~90質量%,更佳為60質量%~80質量%。 The content of the other polymerizable compound is not particularly limited, but is preferably 50% by mass to 90% by mass based on 100% by mass of the total amount of the component (B) from the viewpoint of the reliability of the cap hole and the resolution. More preferably, it is 60% by mass to 80% by mass.

此外,上述(B)至少具有一個乙烯性不飽和鍵的聚合性化合物的含有率,在(A)成分以及(B)成分的總量100質量%中較佳為20質量%~60質量%,更佳為30質量%~55質量%。藉由使該含有率為20質量%以上,會有光敏感度提高之傾向,藉由使其為60質量%以下,會有使硬化膜的柔軟性更加提高的傾向。 Further, the content of the polymerizable compound having at least one ethylenically unsaturated bond in the above (B) is preferably 20% by mass to 60% by mass based on 100% by mass of the total of the components (A) and (B). More preferably, it is 30% by mass to 55% by mass. When the content is 20% by mass or more, the light sensitivity tends to be improved, and when it is 60% by mass or less, the flexibility of the cured film tends to be further improved.

〔(A)成分:黏合劑聚合物〕 [(A) component: binder polymer]

作為可在本發明使用之(A)成分:黏合劑聚合物,可列舉出丙烯酸系樹脂、苯乙烯系樹脂、環氧系樹脂、醯胺系樹脂、醯胺環氧系樹脂、醇酸系樹脂以及酚系樹脂等。從鹼顯影性的立場而言,較佳為丙烯酸系樹脂。上述樹脂可單獨使用一種或將兩種以上組合使用。 Examples of the component (A) which can be used in the present invention include a acryl resin, a styrene resin, an epoxy resin, a guanamine resin, a guanamine epoxy resin, and an alkyd resin. And phenolic resin and the like. From the standpoint of alkali developability, an acrylic resin is preferred. The above resins may be used alone or in combination of two or more.

上述(A)黏合劑聚合物例如可藉由使聚合性單體進行自由基聚合而製造。作為上述聚合性單體,可列舉出例如苯乙烯、乙烯基甲苯以及α-甲基苯乙烯等在α-位或芳香族環處經取代的可聚合之苯乙烯衍生物、二丙酮丙烯醯胺等丙烯醯胺、丙烯腈以及乙烯基-正丁基醚等乙烯基醇的酯類、(甲基)丙烯酸烷酯、(甲基)丙烯酸苄酯、(甲基)丙烯酸四氫糠酯、(甲基)丙烯酸二甲胺基乙酯、( 甲基)丙烯酸二乙胺基乙酯、(甲基)丙烯酸縮水甘油酯、(甲基)丙烯酸2,2,2-三氟乙酯、(甲基)丙烯酸2,2,3,3-四氟丙酯、(甲基)丙烯酸、α-溴丙烯酸、α-氯丙烯酸、β-呋喃基(甲基)丙烯酸、β-苯乙烯基(甲基)丙烯酸、馬來酸、馬來酸酐、馬來酸單甲酯、馬來酸單乙酯、馬來酸單異丙酯等馬來酸單酯、富馬酸、桂皮酸、α-氰基桂皮酸、衣康酸、巴豆酸以及丙炔酸。該等物質可單獨使用一種或將兩種以上組合使用。 The (A) binder polymer can be produced, for example, by radical polymerization of a polymerizable monomer. Examples of the polymerizable monomer include a polymerizable styrene derivative substituted with an α-position or an aromatic ring such as styrene, vinyl toluene, and α-methylstyrene, and diacetone acrylamide. An ester of a vinyl alcohol such as acrylamide, acrylonitrile or vinyl-n-butyl ether; an alkyl (meth)acrylate; a benzyl (meth)acrylate; a tetrahydrofurfuryl (meth)acrylate; Methyl) dimethylaminoethyl acrylate, ( Diethylaminoethyl methacrylate, glycidyl (meth)acrylate, 2,2,2-trifluoroethyl (meth)acrylate, 2,2,3,3-tetra(meth)acrylate Fluoropropyl ester, (meth)acrylic acid, α-bromoacrylic acid, α-chloroacrylic acid, β-furyl (meth)acrylic acid, β-styryl (meth)acrylic acid, maleic acid, maleic anhydride, horse Maleic acid monoester, fumaric acid, cinnamic acid, α-cyano cinnamic acid, itaconic acid, crotonic acid and propyne, such as monomethyl ester, monoethyl maleate, monoisopropyl maleate acid. These may be used alone or in combination of two or more.

作為上述(甲基)丙烯酸烷酯,可列舉出例如下述通式(V)所示之化合物:H2C=C(R6)-COOR7 (V)〔式(V)中,R6表示氫原子或甲基,R7表示碳數1~12之烷基〕、以及該等化合物之烷基被羥基、環氧基、鹵素基等取代之化合物等。 The (meth)acrylic acid alkyl ester may, for example, be a compound represented by the following formula (V): H 2 C=C(R 6 )-COOR 7 (V) [in the formula (V), R 6 A hydrogen atom or a methyl group, R 7 represents an alkyl group having 1 to 12 carbon atoms, and a compound in which an alkyl group of the compound is substituted with a hydroxyl group, an epoxy group, a halogen group or the like.

作為以上述通式(V)中的R7所表示的碳數1~12之烷基,可列舉出例如甲基、乙基、丙基、丁基、戊基、己基、庚基、辛基、壬基、癸基、十一烷基、十二烷基以及該等基團之結構異構物。 Examples of the alkyl group having 1 to 12 carbon atoms represented by R 7 in the above formula (V) include a methyl group, an ethyl group, a propyl group, a butyl group, a pentyl group, a hexyl group, a heptyl group, and an octyl group. , mercapto, decyl, undecyl, dodecyl and structural isomers of such groups.

作為上述通式(V)所示之單體,可列舉出例如(甲基)丙烯酸甲酯、(甲基)丙烯酸乙酯、(甲基)丙烯酸丙酯、(甲基)丙烯酸丁酯、(甲基)丙烯酸戊酯、(甲基)丙烯酸己酯、(甲基)丙烯酸庚酯、(甲基)丙烯酸辛酯、(甲基)丙烯酸2-乙基己酯、(甲基)丙烯酸壬酯、(甲基)丙烯酸癸酯、(甲基)丙烯酸十一烷基酯以及 (甲基)丙烯酸十二烷基酯。該等物質可單獨使用一種或將兩種以上組合使用。 Examples of the monomer represented by the above formula (V) include methyl (meth)acrylate, ethyl (meth)acrylate, propyl (meth)acrylate, and butyl (meth)acrylate. Amyl methacrylate, hexyl (meth) acrylate, heptyl (meth) acrylate, octyl (meth) acrylate, 2-ethylhexyl (meth) acrylate, decyl (meth) acrylate , (meth) methacrylate, undecyl (meth) acrylate, and Dodecyl (meth)acrylate. These may be used alone or in combination of two or more.

此外,從鹼顯影性的立場來看,本發明中之(A)成分的黏合劑聚合物較佳為含有羧基。含有羧基的黏合劑聚合物例如可藉由使具有羧基之聚合性單體與其他聚合性單體進行自由基聚合而製造。 Further, from the standpoint of alkali developability, the binder polymer of the component (A) in the present invention preferably contains a carboxyl group. The carboxyl group-containing binder polymer can be produced, for example, by radically polymerizing a polymerizable monomer having a carboxyl group with another polymerizable monomer.

作為上述具有羧基之聚合性單體,可列舉出丙烯酸以及甲基丙烯酸等,較佳為甲基丙烯酸。 Examples of the polymerizable monomer having a carboxyl group include acrylic acid and methacrylic acid, and methacrylic acid is preferred.

從鹼顯影性及鹼耐性的平衡的立場而言,上述(A)黏合劑聚合物中來自於具有羧基之聚合性單體的結構單元之含有率(具有羧基之聚合性單體相對於所使用的全部聚合性單體的比例)較佳為12質量%~50質量%,更佳為12質量%~40質量%,又更佳為15質量%~30質量%,特佳為15質量%~25質量%。 From the standpoint of the balance between the alkali developability and the alkali resistance, the content ratio of the structural unit derived from the polymerizable monomer having a carboxyl group in the (A) binder polymer (polymerizable monomer having a carboxyl group is used with respect to the use) The ratio of all the polymerizable monomers is preferably from 12% by mass to 50% by mass, more preferably from 12% by mass to 40% by mass, still more preferably from 15% by mass to 30% by mass, particularly preferably from 15% by mass to the mass%. 25 mass%.

藉由使該含有率為12質量%以上,會有鹼顯影性提高之傾向。又,藉由使其為50質量%以下,會有鹼耐性優異之傾向。 When the content is 12% by mass or more, the alkali developability tends to be improved. Moreover, when it is 50% by mass or less, alkali resistance tends to be excellent.

進而,從可撓性的立場而言,本發明中之(A)成分的黏合劑聚合物較佳為含有來自於苯乙烯或苯乙烯衍生物之結構單元。 Further, from the standpoint of flexibility, the binder polymer of the component (A) in the present invention preferably contains a structural unit derived from styrene or a styrene derivative.

上述來自於苯乙烯或苯乙烯衍生物之結構單元的含有率並未特別限制,但從使密著性及剝離特性均良好的觀點觀之,在黏合劑聚合物中較佳為含有0.1質量%~30質量%,更佳為含有1質量%~28質量%,特佳為含有1.5質量 %~27質量%。 The content of the structural unit derived from the styrene or the styrene derivative is not particularly limited, but from the viewpoint of good adhesion and peeling properties, it is preferable to contain 0.1% by mass in the binder polymer. ~30% by mass, more preferably 1% by mass to 28% by mass, particularly preferably 1.5% by mass %~27% by mass.

藉由使該含有率為0.1質量%以上,會有使密著性提高之傾向。又,藉由使其為30質量%以下,可以抑制剝離片變大、並抑制剝離時間延長。 When the content is 0.1% by mass or more, the adhesion tends to be improved. Moreover, by making it 30 mass % or less, it can suppress that a peeling sheet becomes large, and can suppress the extension of peeling time.

該等黏合劑聚合物可單獨使用一種或將兩種以上組合使用。作為將兩種以上組合使用時的黏合劑聚合物,可列舉出例如由不同的共聚合成分所構成的兩種以上黏合劑聚合物、不同重量平均分子量的兩種以上黏合劑聚合物、不同分散度的兩種以上黏合劑聚合物等。 These binder polymers may be used alone or in combination of two or more. Examples of the binder polymer when two or more types are used in combination include two or more kinds of binder polymers composed of different copolymerized components, two or more kinds of binder polymers having different weight average molecular weights, and different dispersions. Two or more kinds of binder polymers, etc.

從機械強度及鹼顯影性的平衡的立場而言,上述(A)黏合劑聚合物之重量平均分子量較佳為20,000~300,000,更佳為30,000~150,000,又更佳為40,000~110,000。 The weight average molecular weight of the above (A) binder polymer is preferably from 20,000 to 300,000, more preferably from 30,000 to 150,000, still more preferably from 40,000 to 110,000, from the standpoint of balance of mechanical strength and alkali developability.

藉由使重量平均分子量為20,000以上,會有使耐顯影液性進一步提高的傾向。此外,藉由使其為300,000以下,可抑制顯影時間延長。 When the weight average molecular weight is 20,000 or more, the development liquid resistance tends to be further improved. Further, by making it 300,000 or less, the development time can be suppressed from being prolonged.

又,本發明中之重量平均分子量係利用凝膠滲透層析法測定,並藉由使用標準聚苯乙烯所製作的校正曲線換算而得的值。 Further, the weight average molecular weight in the present invention is a value obtained by gel permeation chromatography and converted from a calibration curve prepared using standard polystyrene.

上述(A)黏合劑聚合物的含量,相對於(A)成分以及(B)成分的總量100質量%,較佳為30質量%~80質量%,更佳為50質量%~70質量%。 The content of the (A) binder polymer is preferably 30% by mass to 80% by mass, and more preferably 50% by mass to 70% by mass based on 100% by mass of the total of the components (A) and (B). .

藉由使(A)成分的含量為30質量%以上,可使硬化膜的柔軟性進一步提高。此外,藉由使其為80質量%以下,會有顯示更良好光敏感度的傾向。 When the content of the component (A) is 30% by mass or more, the flexibility of the cured film can be further improved. In addition, when it is 80% by mass or less, there is a tendency to exhibit better light sensitivity.

〔(C)成分:光聚合起始劑〕 [(C) component: photopolymerization initiator]

作為(C)成分的光聚合起始劑,可列舉出例如二苯甲酮、N,N’-四甲基-4,4’-二胺基二苯甲酮(米其勒酮(Michler's ketone))、N,N’-四乙基-4,4’-二胺基二苯甲酮、4-甲氧基-4’-二甲基胺基二苯甲酮、2-苄基-2-二甲胺基-1-(4-嗎啉苯基)-丁酮-1、2-甲基-1-〔4-(甲硫基)苯基〕-2-嗎啉基丙酮-1等芳香族酮類;2-乙基蒽醌、菲醌、2-第三丁基蒽醌、八甲基蒽醌、1,2-苯并蒽醌(1,2-Benzanthraquinone)、2,3-苯并蒽醌、2-苯基蒽醌、2,3-二苯基蒽醌、1-氯蒽醌、2-甲基蒽醌、1,4-萘醌、9,10-菲醌、2-甲基-1,4-萘醌、2,3-二甲基蒽醌等醌類;苯偶因甲基醚、苯偶因乙基醚、苯偶因苯基醚等苯偶因醚化合物;苯偶因、甲基苯偶因、乙基苯偶因等苯偶因化合物;苄基二甲基縮酮等苄基衍生物;2-(鄰氯苯基)-4,5-二苯基咪唑二聚體、2-(鄰氯苯基)-4,5-二(甲氧基苯基)咪唑二聚體、2-(鄰氟苯基)-4,5-二苯基咪唑二聚體、2-(鄰甲氧基苯基)-4,5-二苯基咪唑二聚體、2-(對甲氧基苯基)-4,5-二苯基咪唑二聚體等之2,4,5-三芳基咪唑二聚體;9-苯基吖啶、1,7-雙(9,9’-吖啶基)庚烷等吖啶衍生物;N-苯基甘胺酸、N-苯基甘胺酸衍生物;香豆素系化合物;噁唑系化合物等。 The photopolymerization initiator as the component (C) may, for example, be benzophenone or N,N'-tetramethyl-4,4'-diaminobenzophenone (Michler's ketone). )), N,N'-tetraethyl-4,4'-diaminobenzophenone, 4-methoxy-4'-dimethylaminobenzophenone, 2-benzyl-2 -dimethylamino-1-(4-morpholinylphenyl)-butanone-1, 2-methyl-1-[4-(methylthio)phenyl]-2-morpholinylacetone-1, etc. Aromatic ketones; 2-ethyl hydrazine, phenanthrenequinone, 2-tert-butyl fluorene, octamethyl hydrazine, 1,2-benzopyrene (1,2-Benzanthraquinone), 2,3- Benzopyrene, 2-phenylindole, 2,3-diphenylanthracene, 1-chloroindole, 2-methylindole, 1,4-naphthoquinone, 9,10-phenanthrenequinone, 2 - anthracene such as methyl-1,4-naphthoquinone or 2,3-dimethylhydrazine; benzoin ether compounds such as benzoin methyl ether, benzoin ethyl ether, and benzoin phenyl ether Benzene-caine compounds such as benzoin, methyl benzene, ethyl benzoate; benzyl derivatives such as benzyl dimethyl ketal; 2-(o-chlorophenyl)-4,5-diphenyl Imidazole dimer, 2-(o-chlorophenyl)-4,5-bis(methoxyphenyl)imidazole dimer, 2-(o-fluorophenyl)-4,5-diphenylimidazolium a polymer, 2-(o-methoxyphenyl)-4,5-diphenylimidazole dimer, 2-(p-methoxyphenyl)-4,5-diphenylimidazole dimer, etc. 2,4,5-triarylimidazole dimer; acridine derivative such as 9-phenyl acridine, 1,7-bis(9,9'-acridinyl)heptane; N-phenylglycine , N-phenylglycine derivative; coumarin compound; oxazole compound.

該等物質可單獨使用一種或將兩種以上組合使用。 These may be used alone or in combination of two or more.

此外,上述2,4,5-三芳基咪唑二聚體中之2個2,4,5-三 芳基咪唑的芳基之取代基,可為相互相同而為對稱之化合物,亦可為不同而為非對稱化合物。 In addition, two of the above 2,4,5-triarylimidazole dimers are 2,4,5-three The substituent of the aryl group of the aryl imidazole may be a compound which is symmetrical to each other, or may be an asymmetric compound.

此外,亦可如二乙基噻噸酮和二甲胺基苯甲酸的組合般,將噻噸酮系化合物與三級胺化合物組合。 Further, a thioxanthone-based compound may be combined with a tertiary amine compound as in the combination of diethylthioxanthone and dimethylaminobenzoic acid.

從密著性以及敏感度的立場而言,上述感光性樹脂組成物中,較佳為含有2,4,5-三芳基咪唑二聚體之至少1種作為光聚合起始劑,更佳為含有2,4,5-三芳基咪唑二聚體的至少1種、及芳香族酮類的至少1種作為光聚合起始劑。 From the standpoint of adhesion and sensitivity, the photosensitive resin composition preferably contains at least one of 2,4,5-triarylimidazole dimer as a photopolymerization initiator, more preferably At least one of the 2,4,5-triarylimidazole dimer and at least one of the aromatic ketones are used as a photopolymerization initiator.

上述(C)光聚合起始劑的含量,相對於(A)成分以及(B)成分的總量100質量%,較佳為0.01質量%~20質量%,更佳為0.2質量%~5質量%。 The content of the (C) photopolymerization initiator is preferably from 0.01% by mass to 20% by mass, more preferably from 0.2% by mass to 5% by mass based on 100% by mass of the total of the components (A) and (B). %.

藉由使該含量為0.01質量%以上,會有使光敏感度變得更好的傾向,藉由使其為20質量%以下,會有抑制曝光時於感光性樹脂層表面處的吸收增大、使內部的光硬化變得更好的傾向。 When the content is 0.01% by mass or more, the light sensitivity tends to be better, and when it is 20% by mass or less, the absorption at the surface of the photosensitive resin layer during exposure is suppressed from increasing. The tendency to make the internal light hardening better.

〔其他成分〕 [Other ingredients]

此外,根據需要,上述感光性樹脂組成物中亦可含有其他成分。作為其他成分可以列舉出香豆素、吡唑啉等敏化色素、孔雀綠等染料、三溴苯碸、無色結晶紫等光顯色劑、熱顯色防止劑、對甲苯磺醯胺等增塑劑、顏料、填充劑、消泡劑、阻燃劑、穩定劑、密著性賦予劑、流平劑、剝離促進劑、抗氧化劑、香料、顯像劑以及熱交聯劑等。 Further, other components may be contained in the photosensitive resin composition as needed. Examples of other components include sensitizing dyes such as coumarin and pyrazoline, dyes such as malachite green, photochromic agents such as tribromophenylhydrazine and colorless crystal violet, and thermal coloring preventive agents and p-toluenesulfonamide. Plasticizers, pigments, fillers, defoamers, flame retardants, stabilizers, adhesion imparting agents, leveling agents, release promoters, antioxidants, perfumes, imaging agents, and thermal crosslinking agents.

至於其他成分之含量,相對於(A)成分以及(B)成 分的總量100質量%,可分別含有0.01質量%~20質量%左右。該等成分可單獨使用或將兩種以上組合使用。 As for the content of other ingredients, relative to (A) and (B) The total amount of the fractions is 100% by mass, and may be contained in an amount of about 0.01% by mass to 20% by mass. These components may be used singly or in combination of two or more.

根據需要,上述感光性樹脂組成物可含有至少一種有機溶劑。上述有機溶劑只要是通常所用的有機溶劑即可使用而無特別限制。具體而言,可列舉出甲醇、乙醇、丙酮、甲基乙基酮、甲基溶纖劑、乙基溶纖劑、甲苯、N,N-二甲基甲醯胺以及丙二醇單甲醚等溶劑以及該等之混合溶劑。 The photosensitive resin composition may contain at least one organic solvent as needed. The organic solvent is not particularly limited as long as it is an organic solvent which is usually used. Specific examples thereof include solvents such as methanol, ethanol, acetone, methyl ethyl ketone, methyl cellosolve, ethyl cellosolve, toluene, N,N-dimethylformamide, and propylene glycol monomethyl ether. And such mixed solvents.

例如,可將上述(A)黏合劑聚合物、(B)聚合性化合物、及(C)光聚合起始劑溶解於上述有機溶劑中,調製為固體成分為30質量%~60質量%左右的溶液(以下稱為「塗佈液」)而使用。 For example, the (A) binder polymer, the (B) polymerizable compound, and the (C) photopolymerization initiator may be dissolved in the organic solvent to prepare a solid content of about 30% by mass to 60% by mass. The solution (hereinafter referred to as "coating liquid") is used.

又,所謂固體成分是指從上述溶液(感光性樹脂組成物)中除去揮發性成分後殘留的成分。 In addition, the solid component means a component remaining after removing a volatile component from the solution (photosensitive resin composition).

上述塗佈液例如可如下述般用於感光性樹脂層的形成。將上述塗佈液塗佈於後述的支撐膜、金屬板等支撐體的表面上並使其乾燥,藉此可在支撐體上形成源自於上述感光性樹脂組成物的感光性樹脂層。 The coating liquid can be used for the formation of a photosensitive resin layer, for example, as follows. The coating liquid is applied onto the surface of a support such as a support film or a metal plate to be described later and dried, whereby a photosensitive resin layer derived from the photosensitive resin composition can be formed on the support.

作為金屬板,可列舉出例如銅、銅系合金、鎳、鉻、鐵、不銹鋼等鐵系合金,較佳為銅、銅系合金以及鐵系合金等。 Examples of the metal plate include iron-based alloys such as copper, copper-based alloys, nickel, chromium, iron, and stainless steel, and copper, copper-based alloys, and iron-based alloys are preferable.

所形成的感光性樹脂層厚度根據其用途而不同,但以乾燥後的厚度計較佳為1μm~100μm左右亦可用保護膜覆蓋感光性樹脂層之與支撐體相對面的相反側之面(表面 )。保護膜可列舉出聚乙烯以及聚丙烯等聚合物膜等。 The thickness of the photosensitive resin layer to be formed varies depending on the application, but it is preferably from about 1 μm to 100 μm in terms of the thickness after drying, and the surface of the opposite side of the photosensitive resin layer opposite to the support may be covered with a protective film (surface) ). The protective film may, for example, be a polymer film such as polyethylene or polypropylene.

<感光性元件> <Photosensitive element>

本發明之感光性元件具有支撐體及感光性樹脂層,該感光性樹脂層為形成於上述支撐體上之上述感光性樹脂組成物的塗膜,且具有根據需要而設置之保護膜等其他層。 The photosensitive element of the present invention has a support and a photosensitive resin layer which is a coating film of the photosensitive resin composition formed on the support, and has other layers such as a protective film provided as needed. .

〔支撐體〕 [support]

作為上述支撐體,可使用例如聚對苯二甲酸乙二酯、聚丙烯、聚乙烯及聚酯等具有耐熱性以及耐溶劑性之聚合物膜。 As the support, for example, a polymer film having heat resistance and solvent resistance such as polyethylene terephthalate, polypropylene, polyethylene, or polyester can be used.

上述支撐體(以下有時稱為「支撐膜」)的厚度較佳為1μm~100μm,更佳為1μm~50μm,又更佳為1μm~30μm。藉由使支撐體厚度為1μm以上,可抑制剝離支撐膜時之支撐膜破裂。又藉由使其為100μm以下,可抑制解析度的降低。 The thickness of the support (hereinafter sometimes referred to as "support film") is preferably from 1 μm to 100 μm, more preferably from 1 μm to 50 μm, still more preferably from 1 μm to 30 μm. By making the thickness of the support 1 μm or more, it is possible to suppress cracking of the support film when the support film is peeled off. Further, by setting it to 100 μm or less, the decrease in resolution can be suppressed.

〔保護膜〕 [protective film]

根據需要,上述感光性元件亦可具備覆蓋感光性樹脂層之與支撐體相對面的相反側之面(表面)的保護膜。 The photosensitive element may have a protective film covering a surface (surface) of the photosensitive resin layer opposite to the surface opposite to the support, as needed.

作為上述保護膜,較佳為對感光性樹脂層的接著力小於支撐膜對感光性樹脂層的接著力的保護膜,且,較佳為低魚眼(fish eye)的薄膜。 The protective film is preferably a protective film having a lower adhesive force to the photosensitive resin layer than the support film to the photosensitive resin layer, and is preferably a fish eye film.

此處,「魚眼」係指將構成保護膜的材料加熱熔融, 並利用混練、擠壓成形、雙軸拉伸、澆鑄法等製造薄膜時,材料的異物、未熔化物、氧化劣化物等被包含在薄膜中的現象。也就是說,「低魚眼」意指薄膜中的上述異物等較少。 Here, "fisheye" means heating and melting a material constituting a protective film. When a film is produced by kneading, extrusion molding, biaxial stretching, casting, or the like, foreign matter, an unmelted material, an oxidative degradation product, or the like of the material is contained in the film. That is to say, "low fisheye" means that the above-mentioned foreign matter or the like in the film is small.

保護膜的厚度較佳為1μm~100μm,更佳為5μm~50μm,又更佳為5μm~30μm,特佳為15μm~30μm。藉由使保護膜的厚度為1μm以上,在剝離保護膜並將感光性樹脂層以及支撐膜層合到基板上時可抑制保護膜的破裂。此外,藉由使其為100μm以下,可提高生產率。 The thickness of the protective film is preferably from 1 μm to 100 μm, more preferably from 5 μm to 50 μm, still more preferably from 5 μm to 30 μm, particularly preferably from 15 μm to 30 μm. When the thickness of the protective film is 1 μm or more, cracking of the protective film can be suppressed when the protective film is peeled off and the photosensitive resin layer and the support film are laminated on the substrate. Further, by making it 100 μm or less, productivity can be improved.

〔製造方法〕 〔Production method〕

本發明之感光性元件例如可如下所述般製造。可藉包含如下步驟之製造方法進行製造:將(A)成分:黏合劑聚合物、(B)成分:聚合性化合物、及(C)光聚合起始劑溶解於上述有機溶劑中,準備塗佈液之步驟;將上述塗佈液塗佈於支撐體上而形成塗佈層之步驟;及使上述塗佈層乾燥而形成感光性樹脂層之步驟。 The photosensitive element of the present invention can be produced, for example, as described below. It can be produced by a production method comprising the steps of: (A) component: a binder polymer, (B) component: a polymerizable compound, and (C) a photopolymerization initiator dissolved in the above organic solvent to prepare a coating. a step of applying a coating liquid onto the support to form a coating layer; and a step of drying the coating layer to form a photosensitive resin layer.

構成上述塗佈液之(A)成分:黏合劑聚合物、(B)成分:聚合性化合物、(C)光聚合起始劑以及有機溶劑的細節、以及塗佈液的細節係如上所述。且,上述塗佈液可使用市售塗佈液,亦可利用常規方法調製。 The details of the component (A) constituting the coating liquid: the binder polymer, the component (B): the polymerizable compound, the (C) photopolymerization initiator, and the organic solvent, and the details of the coating liquid are as described above. Further, the coating liquid may be a commercially available coating liquid or may be prepared by a conventional method.

將上述塗佈液塗佈於支撐體上的步驟,可藉由利用輥塗機、缺角輪塗佈機、凹版塗佈機、氣刀塗佈機、模嘴式塗佈機、刮條塗佈機以及噴塗機等之習知方法進行。 The step of applying the above coating liquid onto the support can be carried out by using a roll coater, a notch coater, a gravure coater, an air knife coater, a die coater, and a wiper strip. Conventional methods such as cloth machines and sprayers are carried out.

且,上述塗佈層的乾燥只要是可從塗佈層除去有機溶劑之至少一部分即可,沒有特別限制。例如可在70℃~150℃進行5分鐘~30分鐘左右。 Further, the coating layer is not particularly limited as long as it can remove at least a part of the organic solvent from the coating layer. For example, it can be carried out at 70 ° C to 150 ° C for about 5 minutes to 30 minutes.

從防止後續步驟中有機溶劑擴散的觀點觀之,在乾燥後,感光性樹脂層中的殘存有機溶劑量較佳為2質量%以下。 From the viewpoint of preventing the diffusion of the organic solvent in the subsequent step, the amount of the residual organic solvent in the photosensitive resin layer after drying is preferably 2% by mass or less.

感光性元件中之感光性樹脂層厚度可根據用途而適當選擇。感光性樹脂層的厚度以乾燥後的厚度計較佳為1μm~200μm,更佳為5μm~100μm,特佳為10μm~50μm。藉由使感光性樹脂層的厚度為1μm以上,可使工業塗佈變得容易、生產率獲得提高。當其為200μm以下時,會有可充分獲得本發明之效果、光敏感度較高、且光阻劑底部的光硬化性優異之傾向。 The thickness of the photosensitive resin layer in the photosensitive element can be appropriately selected depending on the use. The thickness of the photosensitive resin layer is preferably from 1 μm to 200 μm, more preferably from 5 μm to 100 μm, particularly preferably from 10 μm to 50 μm, in terms of thickness after drying. When the thickness of the photosensitive resin layer is 1 μm or more, industrial coating can be facilitated and productivity can be improved. When it is 200 μm or less, the effect of the present invention can be sufficiently obtained, the light sensitivity is high, and the photocurability of the bottom of the photoresist tends to be excellent.

根據需要,本發明之感光性元件亦可具有緩衝層、接著層、光吸收層、或氣體阻隔層等中間層等。 The photosensitive element of the present invention may have an intermediate layer such as a buffer layer, an adhesive layer, a light absorbing layer, or a gas barrier layer, etc., as needed.

在本發明中,該等中間層可適用例如日本專利公開號2006-098982公報等中所記載的中間層。 In the present invention, the intermediate layer can be applied, for example, to the intermediate layer described in Japanese Patent Laid-Open Publication No. 2006-098982.

本發明之感光性元件的形態並未特別限制。例如可為片狀、或者可為在捲芯上捲繞成輥狀的形狀。 The form of the photosensitive element of the present invention is not particularly limited. For example, it may be in the form of a sheet or may be wound into a roll shape on a winding core.

在捲繞成輥狀的情況下,較佳為以使支撐膜在外側的方式進行捲繞。作為捲芯,可列舉出例如聚乙烯樹脂、聚丙烯樹脂、聚苯乙烯樹脂、聚氯乙烯樹脂以及ABS(丙烯腈-丁二烯-苯乙烯共聚物)等塑膠等。 In the case of winding in a roll shape, it is preferable to wind the support film so as to be outside. Examples of the winding core include plastics such as a polyethylene resin, a polypropylene resin, a polystyrene resin, a polyvinyl chloride resin, and an ABS (acrylonitrile-butadiene-styrene copolymer).

從保護端面的立場而言,較佳為在如此獲得的輥狀感 光性元件的端面設置端面隔片,從耐邊緣融合(edge fusion)的立場觀之,較佳為設置防濕端面隔片。且,作為捆包方法,較佳為包入透濕性小的黑薄片(Black sheet)中進行包裝。 From the standpoint of protecting the end face, it is preferred to obtain the roll-like feeling thus obtained The end face of the optical element is provided with an end face spacer, and from the standpoint of edge fusion resistance, it is preferable to provide a moisture-proof end face spacer. Further, as the packing method, it is preferably packaged in a black sheet having a small moisture permeability.

本發明之感光性元件可適合用於例如後述的光阻圖型的製造方法中。 The photosensitive element of the present invention can be suitably used, for example, in a production method of a resist pattern described later.

<光阻圖型的製造方法> <Method of Manufacturing Photoresist Pattern>

本發明之光阻圖型的製造方法具有:(i)在電路形成用基板上形成感光性樹脂層的感光性樹脂層形成步驟,該感光性樹脂層為上述感光性樹脂組成物的塗膜;(ii)對上述感光性樹脂層的至少一部分照射活性光線而使曝光部光硬化的曝光步驟;及(iii)藉由顯影自電路形成用基板上除去上述感光性樹脂層的未硬化部分的顯影步驟;且根據需要包含其他步驟。 The method for producing a photoresist pattern of the present invention includes: (i) a photosensitive resin layer forming step of forming a photosensitive resin layer on a circuit forming substrate, wherein the photosensitive resin layer is a coating film of the photosensitive resin composition; (ii) an exposure step of irradiating at least a part of the photosensitive resin layer with an active light to cure the exposed portion; and (iii) developing the uncured portion of the photosensitive resin layer by developing the substrate for circuit formation Steps; and include additional steps as needed.

(i)感光性樹脂層形成步驟 (i) Photosensitive resin layer forming step

於感光性樹脂層形成步驟中,在電路形成用基板(以下有時簡稱為「基板」)上形成感光性樹脂層,該感光性樹脂層為上述感光性樹脂組成物的塗膜。電路形成用基板通常具有絕緣層及形成於絕緣層上的導體層。感光性樹脂層所接觸的電路形成用基板的表面通常為金屬面,但對其材質並沒有特別限制。 In the photosensitive resin layer forming step, a photosensitive resin layer is formed on the circuit-forming substrate (hereinafter sometimes simply referred to as "substrate"), and the photosensitive resin layer is a coating film of the photosensitive resin composition. The circuit formation substrate usually has an insulating layer and a conductor layer formed on the insulating layer. The surface of the circuit-forming substrate that the photosensitive resin layer is in contact with is usually a metal surface, but the material thereof is not particularly limited.

作為在基板上形成感光性樹脂層之方法,例如,在上 述感光性元件具有保護膜的情況下,可在除去保護膜後,藉由將感光性元件的感光性樹脂層在根據需要進行加熱的同時壓接在電路形成用基板上而進行。藉此可獲得依次具有電路形成用基板、感光性樹脂層及支撐體之層合體。 As a method of forming a photosensitive resin layer on a substrate, for example, on In the case where the photosensitive element has a protective film, the photosensitive resin layer of the photosensitive element can be pressure-bonded to the circuit-forming substrate while heating as needed after removing the protective film. Thereby, a laminate having a circuit formation substrate, a photosensitive resin layer, and a support in this order can be obtained.

從密著性以及順應性的立場而言,該感光性樹脂層形成步驟較佳為在減壓下進行。壓接時的加熱較佳為在70℃~130℃的溫度下進行。且壓接較佳為在0.1MPa~1.0MPa左右(1kgf/cm2~10kgf/cm2左右)的壓力下進行,但該等條件可以根據需要適當選擇。 The photosensitive resin layer forming step is preferably carried out under reduced pressure from the standpoint of adhesion and compliance. The heating at the time of pressure bonding is preferably carried out at a temperature of from 70 ° C to 130 ° C. Further, the pressure bonding is preferably carried out at a pressure of about 0.1 MPa to 1.0 MPa (about 1 kgf/cm 2 to 10 kgf/cm 2 ), but these conditions can be appropriately selected as needed.

又,根據需要,亦可進行電路形成用基板之預熱處理。若將感光性樹脂層加熱至70℃~130℃,則預先對電路形成用基板進行預熱處理並非必要,但藉由進行電路形成用基板的預熱處理,可進一步提高密著性以及順應性。 Further, pre-heat treatment of the substrate for circuit formation may be performed as needed. When the photosensitive resin layer is heated to 70° C. to 130° C., it is not necessary to preheat the circuit for forming a circuit board in advance. However, by performing preheating of the substrate for circuit formation, adhesion and compliance can be further improved. .

(ii)曝光步驟 (ii) Exposure step

於曝光步驟中,藉由對形成於電路形成用基板上的感光性樹脂層脂之至少一部分照射活性光線,使被活性光線照射的曝光部光硬化,以形成潛像。 In the exposure step, at least a part of the photosensitive resin layer grease formed on the circuit-forming substrate is irradiated with the active light, and the exposed portion irradiated with the active light is photo-cured to form a latent image.

此時,當存在於感光性樹脂層上的支撐體(支撐膜)對活性光線為穿透性的情況下,可透過支撐膜照射活性光線。另一方面,當支撐膜對活性光線為非穿透性的情況下,於除去支撐膜後對感光性樹脂層照射活性光線。 At this time, when the support (support film) existing on the photosensitive resin layer is transparent to the active light, the active light can be irradiated through the support film. On the other hand, when the support film is non-penetrating to the active light, the photosensitive resin layer is irradiated with the active light after the support film is removed.

作為曝光方法,可以列舉出隔著被稱為佈線圖(ART WORK)的負或正遮罩圖型將活性光線呈圖像狀照射的方 法(遮罩曝光法)。此外,亦可採用利用LDI(Laser Direct Imaging,雷射直接成像)曝光法、DLP(Digital Light Processing,數位光學處理)曝光法等直接描繪曝光法將活性光線呈圖像狀照射的方法。 As an exposure method, a method of irradiating an active ray as an image through a negative or positive mask pattern called a ART WORK can be cited. Method (mask exposure method). Further, a method of directly irradiating the active light into an image by a direct drawing exposure method such as LDI (Laser Direct Imaging) exposure method or DLP (Digital Light Processing) exposure method may be employed.

作為活性光線的光源,可使用習知的光源,例如碳弧燈、汞蒸氣弧燈、超高壓汞燈、高壓汞燈、氙燈、氬氣雷射等氣體雷射、YAG雷射等固體雷射、半導體雷射以及氮化鎵系藍紫色雷射等有效放射出紫外線的光源。此外,亦可使用照相用泛光燈、日光燈等有效放射出可見光的光源。 As a light source of the active light, a conventional light source such as a carbon arc lamp, a mercury vapor arc lamp, an ultrahigh pressure mercury lamp, a high pressure mercury lamp, a xenon lamp, an argon laser gas laser or the like, a YAG laser or the like can be used. , semiconductor lasers, and gallium nitride-based blue-violet lasers that emit ultraviolet light. Further, a illuminating light source such as a photographic floodlight or a fluorescent lamp can be used.

(iii)顯影步驟 (iii) development step

於顯影步驟中,藉由顯影自電路形成用基板上除去上述感光性樹脂層的未硬化部分,從而在電路形成用基板上形成由上述感光性樹脂層光硬化後的硬化物所構成的光阻圖型。 In the developing step, the uncured portion of the photosensitive resin layer is removed from the substrate for forming a substrate, and the photoresist formed by the cured product of the photosensitive resin layer is cured on the circuit-forming substrate. Graphic type.

在感光性樹脂層上存在支撐膜的情況下,於除去支撐膜後,進行上述曝光部分以外的未曝光部分的除去(顯影)。顯影方法有濕式顯影及乾式顯影。 When the support film is present on the photosensitive resin layer, after the support film is removed, the unexposed portion other than the exposed portion is removed (developed). Development methods include wet development and dry development.

在濕式顯影的情況下,使用與感光性樹脂組成物相對應的顯影液,利用習知的顯影方法進行顯影。顯影方法可以列舉出使用浸漬方式、槳攪方式、噴霧方式、刷洗方式、拍打方式(slapping)、刮洗(scrapping)、搖動浸漬等之方法,從提高解析度的觀點觀之,以高壓噴霧方式為 最合適。亦可將上述方法中的兩種以上組合進行顯影。 In the case of wet development, development is carried out by a conventional development method using a developer corresponding to the photosensitive resin composition. Examples of the development method include a method using an immersion method, a paddle method, a spray method, a brushing method, a slapping method, a scapping, a shaking immersion, etc., from the viewpoint of improving the resolution, and a high-pressure spray method. for most suitable. It is also possible to develop two or more of the above methods in combination.

顯影液的成分可根據上述感光性樹脂組成物的成分而適當選擇。可列舉出例如鹼性水溶液、水系顯影液、有機溶劑系顯影液等。 The component of the developer can be appropriately selected depending on the components of the photosensitive resin composition. For example, an alkaline aqueous solution, an aqueous developing solution, an organic solvent developing solution, and the like can be given.

使用鹼性水溶液作為顯影液時,較為安全且穩定,且操作性良好。作為鹼性水溶液的鹼,可使用例如鋰、鈉或鉀的氫氧化物等氫氧化鹼,鋰、鈉、鉀或銨的碳酸鹽或碳酸氫鹽等碳酸鹼,磷酸鉀、磷酸鈉等鹼金屬磷酸鹽,焦磷酸鈉、焦磷酸鉀等鹼金屬焦磷酸鹽等。 When an alkaline aqueous solution is used as the developing solution, it is safer and more stable, and the workability is good. As the base of the alkaline aqueous solution, for example, an alkali hydroxide such as a hydroxide of lithium, sodium or potassium, a carbonate such as lithium, sodium, potassium or ammonium carbonate or a hydrogencarbonate, or an alkali metal such as potassium phosphate or sodium phosphate can be used. An alkali metal pyrophosphate such as phosphate, sodium pyrophosphate or potassium pyrophosphate.

作為顯影時所使用的鹼性水溶液,較佳為0.1質量%~5質量%碳酸鈉稀溶液、0.1質量%~5質量%碳酸鉀稀溶液、0.1質量%~5質量%氫氧化鈉稀溶液、0.1質量%~5質量%四硼酸鈉稀溶液等。此外,顯影時所使用的鹼性水溶液的pH較佳為9~11的範圍,其溫度可根據感光性樹脂層的顯影性進行調節。此外,鹼性水溶液中亦可混入界面活性劑、消泡劑、少量用於促進顯影的有機溶劑等。 The alkaline aqueous solution used for development is preferably 0.1% by mass to 5% by mass of a thin solution of sodium carbonate, 0.1% by mass to 5% by mass of a dilute solution of potassium carbonate, and 0.1% by mass to 5% by mass of a dilute solution of sodium hydroxide. 0.1% by mass to 5% by mass of a diluted solution of sodium tetraborate. Further, the pH of the alkaline aqueous solution used for development is preferably in the range of 9 to 11, and the temperature thereof can be adjusted according to the developability of the photosensitive resin layer. Further, a surfactant, an antifoaming agent, a small amount of an organic solvent for promoting development, and the like may be mixed in the alkaline aqueous solution.

上述水系顯影液為例如由水或鹼性水溶液與1種以上的有機溶劑所構成的顯影液。此處,作為鹼性水溶液的鹼,除前述物質以外,亦可列舉出例如硼砂、偏矽酸鈉、氫氧化四甲基銨、乙醇胺、乙二胺、二伸乙基三胺、2-胺基-2-羥甲基-1,3-丙二醇、1,3-二胺基丙醇-2、嗎啉等。水系顯影液的pH較佳為在可充分進行顯影的範圍內儘可能小,較佳為pH8~12,更佳為pH9~10。 The aqueous developing solution is, for example, a developing solution comprising water or an alkaline aqueous solution and one or more organic solvents. Here, as the base of the alkaline aqueous solution, in addition to the above, for example, borax, sodium metasilicate, tetramethylammonium hydroxide, ethanolamine, ethylenediamine, diethylenetriamine, and 2-amine may be mentioned. Alkyl-2-hydroxymethyl-1,3-propanediol, 1,3-diaminopropanol-2, morpholine, and the like. The pH of the aqueous developing solution is preferably as small as possible within a range in which development is sufficiently performed, and is preferably pH 8 to 12, more preferably pH 9 to 10.

作為水系顯影液中使用的有機溶劑,可列舉出例如3- 丙酮醇、丙酮、乙酸乙酯、具有碳數1~4之烷氧基的烷氧基乙醇、乙醇、異丙醇、丁醇、二乙二醇單甲醚、二乙二醇單乙醚、二乙二醇單丁醚等。該等溶劑可單獨使用一種或將兩種以上組合使用。水系顯影液中的有機溶劑之含有率通常較佳為2質量%~90質量%。且其溫度可根據感光性樹脂層的顯影性進行調整。水系顯影液中亦可少量混入界面活性劑、消泡劑等。 Examples of the organic solvent used in the aqueous developing solution include, for example, 3- Acetyl alcohol, acetone, ethyl acetate, alkoxyethanol having an alkoxy group having 1 to 4 carbon atoms, ethanol, isopropanol, butanol, diethylene glycol monomethyl ether, diethylene glycol monoethyl ether, two Ethylene glycol monobutyl ether and the like. These solvents may be used alone or in combination of two or more. The content of the organic solvent in the aqueous developing solution is usually preferably from 2% by mass to 90% by mass. Further, the temperature thereof can be adjusted in accordance with the developability of the photosensitive resin layer. A small amount of a surfactant, an antifoaming agent, or the like may be mixed into the aqueous developing solution.

作為有機溶劑系顯影液,可列舉出例如1,1,1-三氯乙烷、N-甲基吡咯烷酮、N,N-二甲基甲醯胺、環己酮、甲基異丁基酮、γ-丁內酯等。為防止起火,較佳為在這些有機溶劑中以1質量%~20質量%的範圍添加水。 Examples of the organic solvent-based developing solution include 1,1,1-trichloroethane, N-methylpyrrolidone, N,N-dimethylformamide, cyclohexanone, and methyl isobutyl ketone. Γ-butyrolactone and the like. In order to prevent ignition, it is preferred to add water in an amount of 1% by mass to 20% by mass in these organic solvents.

在本發明中,於顯影步驟除去未曝光部分後,亦可根據需要包含藉由進行60℃~250℃左右之加熱處理或0.2mJ/cm2~10mJ/cm2左右之曝光處理等,使光阻圖型進一步硬化的步驟。 In the present invention, after the unexposed portion is removed in the developing step, it may be subjected to heat treatment at about 60 ° C to 250 ° C or exposure treatment at about 0.2 mJ/cm 2 to 10 mJ/cm 2 as needed. The step of further hardening the pattern.

<印刷配線板之製造方法> <Method of Manufacturing Printed Wiring Board>

本發明之印刷配線板的製造方法包含:對利用上述光阻圖型之製造方法形成有光阻圖型的電路形成用基板進行蝕刻處理或鍍敷處理,從而形成導體圖型的步驟;且根據需要含有光阻劑除去步驟等其他步驟。 The method for producing a printed wiring board according to the present invention includes the steps of forming a conductor pattern by performing an etching treatment or a plating treatment on a circuit formation substrate on which a resist pattern is formed by the above-described photoresist pattern type manufacturing method; Other steps such as a photoresist removal step are required.

於蝕刻處理中,以形成於基板上的光阻圖型作為遮罩,將未被光阻劑覆蓋的電路形成用基板的導體層蝕刻除去,從而形成導體圖型。 In the etching process, a photoresist pattern formed on a substrate is used as a mask, and a conductor layer of a substrate for circuit formation not covered with a photoresist is etched away to form a conductor pattern.

蝕刻處理之方法可根據欲除去的導體層而適當選擇。例如,作為蝕刻液可以列舉出氯化銅溶液、氯化鐵溶液、鹼蝕刻溶液、過氧化氫系蝕刻液,從蝕刻因數良好的觀點而言,宜使用氯化鐵溶液。 The etching treatment method can be appropriately selected depending on the conductor layer to be removed. For example, examples of the etching liquid include a copper chloride solution, a ferric chloride solution, an alkali etching solution, and a hydrogen peroxide-based etching liquid. From the viewpoint of a good etching factor, a ferric chloride solution is preferably used.

另一方面,於鍍敷處理中,以形成於基板上的光阻圖型作為遮罩,在未被光阻劑覆蓋的電路形成用基板的導體層上鍍銅和焊料等。於鍍敷處理後,除去硬化光阻劑,再蝕刻被該光阻劑覆蓋的導體層,從而形成導體圖型。 On the other hand, in the plating process, a photoresist pattern formed on a substrate is used as a mask, and copper, solder, or the like is plated on the conductor layer of the circuit-forming substrate which is not covered with the photoresist. After the plating treatment, the hardened photoresist is removed, and the conductor layer covered by the photoresist is etched to form a conductor pattern.

作為鍍敷處理之方法,可為電解鍍敷處理,亦可為非電解鍍敷處理。作為鍍敷處理,可列舉出例如硫酸銅鍍敷以及焦磷酸酸銅鍍敷等銅鍍敷、高均勻焊料(high-throw solder)鍍敷等焊料鍍敷、瓦特浴(硫酸鎳-氯化鎳)鍍敷以及胺基磺酸鎳鍍敷等鎳鍍敷、硬質金鍍敷以及軟質金鍍敷等金鍍敷等。 As a method of the plating treatment, it may be an electrolytic plating treatment or an electroless plating treatment. Examples of the plating treatment include copper plating such as copper sulfate plating and copper pyrophosphate plating, solder plating such as high-throw solder plating, and Watt bath (nickel sulfate-nickel chloride). Nickel plating such as plating and nickel sulfonate plating, hard gold plating, and gold plating such as soft gold plating.

於上述蝕刻處理以及鍍敷處理後,基板上的光阻圖型被除去。光阻圖型的除去例如可利用比上述顯影步驟所用的鹼性水溶液鹼性更強的鹼性水溶液來進行。作為該強鹼性的水溶液,可使用例如1質量%~10質量%氫氧化鈉水溶液、1質量%~10質量%氫氧化鉀水溶液等。其中,較佳為使用1質量%~10質量%氫氧化鈉水溶液或氫氧化鉀水溶液,更佳為使用1質量%~5質量%氫氧化鈉水溶液或氫氧化鉀水溶液。 After the etching treatment and the plating treatment, the photoresist pattern on the substrate is removed. The removal of the photoresist pattern can be carried out, for example, by using an alkaline aqueous solution which is more alkaline than the alkaline aqueous solution used in the above development step. As the strongly alkaline aqueous solution, for example, a 1% by mass to 10% by mass aqueous sodium hydroxide solution, a 1% by mass to 10% by mass aqueous potassium hydroxide solution, or the like can be used. Among them, a 1% by mass to 10% by mass aqueous sodium hydroxide solution or a potassium hydroxide aqueous solution is preferably used, and a 1% by mass to 5% by mass aqueous sodium hydroxide solution or a potassium hydroxide aqueous solution is more preferably used.

光阻圖型之除去方式可列舉出例如浸漬方式以及噴霧方式等,該等方法可單獨使用,亦可併用。 Examples of the method of removing the photoresist pattern include a dipping method and a spraying method. These methods may be used singly or in combination.

在實施鍍敷處理後除去光阻圖型的情況下,可進一步藉由蝕刻處理對被光阻劑覆蓋的導體層進行蝕刻,以形成導體圖型,從而製造期望的印刷配線板。蝕刻處理方法可根據欲除去的導體層而適當選擇。例如可應用上述蝕刻液。 In the case where the photoresist pattern is removed after the plating treatment, the conductor layer covered with the photoresist may be further etched by an etching process to form a conductor pattern, thereby producing a desired printed wiring board. The etching treatment method can be appropriately selected depending on the conductor layer to be removed. For example, the above etching liquid can be applied.

本發明之印刷配線板之製造方法不僅可應用於單層印刷配線板之製造,且亦可應用於多層印刷配線板之製造,此外,亦可應用於具有小直徑通孔的印刷配線板等之製造。 The method for producing a printed wiring board of the present invention can be applied not only to the manufacture of a single-layer printed wiring board but also to the manufacture of a multilayer printed wiring board, and can also be applied to a printed wiring board having a small-diameter through hole or the like. Manufacturing.

[實施例] [Examples]

以下利用實施例對本發明具體地加以說明。但只要不脫離本發明的技術思想,則本發明不受該等實施例之限定。且,只要沒有特別規定,「份」以及「%」均為質量基準。 The invention will be specifically described below by way of examples. However, the present invention is not limited by the embodiments as long as it does not depart from the technical idea of the present invention. And, unless otherwise specified, "parts" and "%" are quality benchmarks.

<實施例1~4、比較例1~2> <Examples 1 to 4, Comparative Examples 1 to 2>

將如表1所示之種類以及調配量(單位:g)的各成分混合,獲得實施例1~4以及比較例1~2的感光性樹脂組成物之溶液。 The components of the types and the amounts (unit: g) shown in Table 1 were mixed to obtain a solution of the photosensitive resin compositions of Examples 1 to 4 and Comparative Examples 1 and 2.

表1中的各成分之縮寫如下所示。 The abbreviations of the components in Table 1 are as follows.

〔A成分〕 [component A]

‧(A-1):甲基丙烯酸/甲基丙烯酸甲酯/丙烯酸丁酯/苯乙烯(25/50/20/5(質量比)),重量平均分子量=80,000,50質量%甲基溶纖劑/甲苯=6/4(質量比)溶液 ‧(A-1): methacrylic acid/methyl methacrylate/butyl acrylate/styrene (25/50/20/5 (mass ratio)), weight average molecular weight=80,000, 50% by mass methylcellulose Agent / toluene = 6 / 4 (mass ratio) solution

‧(A-2):甲基丙烯酸/甲基丙烯酸甲酯/丙烯酸乙酯(20/55/25(質量比)),重量平均分子量=80,000,50質量%甲基溶纖劑/甲苯=6/4(質量比)溶液 ‧(A-2): methacrylic acid/methyl methacrylate/ethyl acrylate (20/55/25 (mass ratio)), weight average molecular weight=80,000, 50% by mass methyl cellosolve/toluene=6 /4 (mass ratio) solution

又,重量平均分子量係利用凝膠滲透層析(GPC)法測定,並使用標準聚苯乙烯校正曲線換算而算出。GPC條件以及酸值測定步驟如下所示。 Further, the weight average molecular weight was measured by a gel permeation chromatography (GPC) method and calculated using a standard polystyrene calibration curve. The GPC conditions and the acid value measurement steps are as follows.

(GPC條件) (GPC condition)

泵:日立L-6000型〔日立製作所股份有限公司製造〕 Pump: Hitachi L-6000 type [manufactured by Hitachi, Ltd.]

管柱:Gelpack GL-R420+Gelpack GL-R430+Gelpack GL-R440(共3根)〔以上由日立化成工業股份有限公司製 造,製品名〕 Pipe column: Gelpack GL-R420+Gelpack GL-R430+Gelpack GL-R440 (3 in total) [above by Hitachi Chemical Co., Ltd. Made, product name]

沖提液:四氫呋喃 Effervescent solution: tetrahydrofuran

測定溫度:40℃ Measuring temperature: 40 ° C

流量:2.05mL/分鐘 Flow rate: 2.05mL/min

檢測器:日立L-3300型RI〔日立製作所股份有限公司製造,製品名〕 Detector: Hitachi L-3300 RI [manufactured by Hitachi, Ltd., product name]

〔B成分〕 [Component B]

‧BPE-500:2,2-雙(4-(甲基丙烯醯氧基十五乙氧基)苯基)〔新中村化學工業(股)製造〕 ‧BPE-500: 2,2-bis(4-(methacryloxypentadecane)phenyl)[manufactured by Shin-Nakamura Chemical Industry Co., Ltd.]

‧FA-MECH:γ-氯-β-羥丙基-β’-甲基丙烯醯氧基乙基-鄰苯二甲酸酯〔日立化成工業(股)製造〕 ‧FA-MECH: γ-chloro-β-hydroxypropyl-β'-methacryloxyethyl-phthalate [Manufactured by Hitachi Chemical Co., Ltd.]

‧樣品A:上述通式(I)所示之化合物,且R1為-C6H12-,R2為通式(II)中n=10、X為伸乙基、且R3為甲基之化合物 ‧ Sample A: a compound of the above formula (I), and R 1 is -C 6 H 12 -, R 2 is n=10 in the formula (II), X is an exoethyl group, and R 3 is an Base compound

‧樣品B:通式(I)所示之化合物,且R1為-C6H12-,R2為通式(II)中n=15、X為伸乙基、且R3為甲基之化合物 ‧ Sample B: a compound of the formula (I), and R 1 is -C 6 H 12 -, R 2 is n = 15 in the formula (II), X is an exoethyl group, and R 3 is a methyl group Compound

JTX0309:下述通式(VI)所示的化合物,且R51以及R52為下述通式(VIIa)所示之基團、R53為下述通式(VIIb)所示之基團(日本Cytec Industries Inc.製造,樣品名:JTX0309) JTX0309: a compound represented by the following formula (VI), wherein R 51 and R 52 are a group represented by the following formula (VIIa), and R 53 is a group represented by the following formula (VIIb) ( Manufactured by Cytec Industries Inc., Japan, sample name: JTX0309)

[化6] [Chemical 6]

‧UA-21:三(甲基丙烯醯氧基四乙二醇異氰酸酯六亞甲基)異氰尿酸酯〔新中村化學工業(股)製造〕 ‧UA-21: Tris(methacryloxytetramethylene glycol isocyanate hexamethylene)isocyanurate [manufactured by Shin-Nakamura Chemical Industry Co., Ltd.]

〔C成分〕 [Component C]

B-CIM:2-(鄰氯苯基)-4,5-二苯基咪唑2聚體 B-CIM: 2-(o-chlorophenyl)-4,5-diphenylimidazole 2mer

‧EAB:N,N’-四乙基-4,4’-二胺基二苯甲酮 ‧EAB: N,N'-tetraethyl-4,4'-diaminobenzophenone

〔其他成分〕 [Other ingredients]

‧MKG:孔雀綠 ‧MKG: Malachite Green

‧LCV:無色結晶紫 ‧LCV: colorless crystal violet

將以上述方法獲得的感光性樹脂組成物之溶液均勻塗佈於作為支撐膜的16μm厚之聚對苯二甲酸乙二酯薄膜(商品名G2-16,帝人(股)製)上,並在100℃的熱風對流式乾燥機中乾燥10分鐘,形成感光性樹脂層後,在感光性樹脂層上黏貼聚乙烯製保護膜(商品名:NF-13,Tamapoly股份有限公司製)予以保護,從而獲得感光性樹脂組成物層合體。感光性樹脂層之乾燥後膜厚為40μm。 A solution of the photosensitive resin composition obtained by the above method was uniformly applied onto a 16 μm-thick polyethylene terephthalate film (trade name: G2-16, manufactured by Teijin Co., Ltd.) as a support film, and After drying in a hot air convection dryer at 100 ° C for 10 minutes to form a photosensitive resin layer, a protective film made of polyethylene (trade name: NF-13, manufactured by Tamapoly Co., Ltd.) is adhered to the photosensitive resin layer to protect it. A photosensitive resin composition laminate was obtained. The film thickness after drying of the photosensitive resin layer was 40 μm.

接著,在兩面設置有35μm厚之銅箔的1.6mm厚之覆銅層合板(AIN(股)製)上,如圖1所示般,分別用4個沖模 機,以直徑4、5、6mm的孔徑,對各個孔徑,分別製作3個獨立的圓孔41、以及3個圓孔相連且圓孔的間隔逐漸縮小的3連孔42。使用具有相當於# 600的刷子的研磨機(三啟(股)製)除去製作圓孔41以及3連孔42時所產生的毛邊,將其作為孔破裂數測定用基板40。 Next, on a 1.6 mm-thick copper-clad laminate (manufactured by AIN) having 35 μm thick copper foil on both sides, as shown in Fig. 1, four dies were used, respectively. The machine has three independent circular holes 41 and three three-holes 42 in which the circular holes are gradually spaced apart by the respective apertures of 4, 5, and 6 mm in diameter. The burrs generated when the round holes 41 and the third holes 42 are formed are removed by using a grinder (manufactured by Sanken Co., Ltd.) having a brush corresponding to #600, and this is used as the hole crack number measuring substrate 40.

將獲得的孔破裂數測定用基板加熱至80℃,自以上述方法獲得的感光性樹脂組成物層合體剝離保護膜,以感光性樹脂層與該銅表面相對的方式在120℃、0.4Mpa進行層合,獲得孔破裂數測定用基板上層合有感光性樹脂層及聚對苯二甲酸乙二酯薄膜的疊合板。於層合後,冷卻該孔破裂數測定用基板,並在孔破裂數測定用基板的溫度降至23℃時,在聚對苯二甲酸乙二酯薄膜面上緊密貼合Stouffer 21段階段式曝光表,並使用具有高壓汞燈的曝光機HMW-201B(OAK(股)製),以會使8.0段光硬化的曝光量進行光硬化。 The substrate for measuring the number of fractures of the obtained pores was heated to 80 ° C, and the photosensitive resin composition laminate obtained by the above method was peeled off from the protective film, and the photosensitive resin layer was opposed to the copper surface at 120 ° C and 0.4 MPa. Laminated to obtain a laminated plate in which a photosensitive resin layer and a polyethylene terephthalate film were laminated on a substrate for measuring the number of cracks in the hole. After lamination, the substrate for measuring the number of cracks in the hole is cooled, and when the temperature of the substrate for measuring the number of cracks of the hole is lowered to 23 ° C, the Stouffer 21-stage stage is closely adhered on the surface of the polyethylene terephthalate film. The exposure meter was used, and an exposure machine HMW-201B (manufactured by OAK Co., Ltd.) having a high-pressure mercury lamp was used to photoharden the exposure amount of the 8.0-stage photohardening.

(蓋孔可靠性) (cover hole reliability)

於曝光後,在室溫放置15分鐘,接著從孔破裂數測定用基板剝離聚對苯二甲酸乙二酯薄膜,藉由噴射30℃、1重量%碳酸鈉水溶液60秒而進行顯影。於顯影後,測定3連孔的孔破裂數,算出異常形狀蓋孔破裂率,以評價蓋孔可靠性。 After the exposure, the film was allowed to stand at room temperature for 15 minutes, and then the polyethylene terephthalate film was peeled off from the substrate for measuring the number of holes to be broken, and developed by spraying 30 ° C and a 1% by weight aqueous sodium carbonate solution for 60 seconds. After the development, the number of hole breaks in the three-joined hole was measured, and the crack rate of the abnormal shape cap hole was calculated to evaluate the reliability of the cap hole.

接著,對覆蓋圓孔部分的硬化膜,使用插入直徑為1.5mm的圓柱,利用流變儀(RHEOTECH股份有限公司製 )測定直至斷裂時之強度及伸長度。強度及伸長度的數值越大則蓋孔可靠性越良好。該等結果示於表2。 Next, a cylindrical material having a diameter of 1.5 mm was used for the cured film covering the circular hole portion, and a rheometer (manufactured by RHEOTECH Co., Ltd.) was used. The strength and elongation at the time of breaking were measured. The larger the value of the strength and the elongation, the better the reliability of the cap hole. These results are shown in Table 2.

(解析度) (resolution)

此外,解析度係如下方式進行評價。 Further, the resolution was evaluated as follows.

將具有Stouffer 21段階段式曝光表的光掩模(photo tool)與作為解析度評價用負型底片之具有間隔寬度/線寬度為30/400~200/400(單位:μm)的配線圖型的光掩模緊密貼合,並以Stouffer的21段階段式曝光表中的顯影後的殘存階段數為8.0的能量進行曝光。 A photo tool having a Stouffer 21-stage stage exposure meter and a wiring pattern having a width/line width of 30/400 to 200/400 (unit: μm) as a negative type negative film for resolution evaluation The photomask was closely adhered and exposed to an energy of 8.0 in the Stouffer 21-stage stage exposure meter after development.

此處,解析度係由顯影處理能夠徹底除去未光硬化的部分的線寬間的間隔寬度的最小值(單位:μm)來進行評價。且,在解析度的評價中數值越小表示越良好。 Here, the resolution is evaluated by the development processing capable of completely removing the minimum value (unit: μm) of the interval width between the line widths of the portions which are not photocured. Further, the smaller the numerical value in the evaluation of the resolution, the better.

由表2可知,實施例1~4之異常形狀蓋孔破裂率較低,強度以及伸長度的值較大。相對於此,比較例1之異常形狀蓋孔破裂率較高,強度以及伸長度的值較小。此外,在解析度方面,比較例1、2比實施例1~4差。 As can be seen from Table 2, the abnormal shape of the cover holes of Examples 1 to 4 was low, and the values of strength and elongation were large. On the other hand, in Comparative Example 1, the abnormal shape cap hole breaking rate was high, and the values of the strength and the elongation were small. Further, in terms of resolution, Comparative Examples 1 and 2 were inferior to Examples 1 to 4.

因此,根據本發明可提供硬化膜的機械強度優異且具有柔軟性的感光性樹脂組成物,亦即蓋孔可靠性優異的感光性樹脂組成物,以及使用該感光性樹脂組成物的感光性 元件、光阻圖型之製造法、及印刷配線板之製造法。 Therefore, according to the present invention, it is possible to provide a photosensitive resin composition which is excellent in mechanical strength of a cured film and has flexibility, that is, a photosensitive resin composition excellent in lid hole reliability, and photosensitivity using the photosensitive resin composition. Manufacturing method of component, photoresist pattern, and manufacturing method of printed wiring board.

40‧‧‧孔破裂數測定用基板 40‧‧‧Substrate for measuring the number of holes broken

41‧‧‧圓孔 41‧‧‧ round hole

42‧‧‧3連孔 42‧‧3 holes

圖1係表示本發明之實施例中的孔破裂數測定用基板之示意平面圖。 Fig. 1 is a schematic plan view showing a substrate for measuring the number of cracks in the hole in the embodiment of the present invention.

圖2係圖1中以A所示之區域中的3連孔的放大圖。 Fig. 2 is an enlarged view of three connecting holes in the area indicated by A in Fig. 1.

Claims (6)

一種感光性樹脂組成物,其含有下列成分:(A)成分:黏合劑聚合物,(B)成分:具有至少一個乙烯性不飽和鍵之聚合性化合物,以及(C)成分:光聚合起始劑,且前述(B)成分含有以下述通式(I)表示之化合物, (式中,R1表示二價有機基團,R2表示以下述通式(II)表示之基團), (式中,R3表示氫原子或甲基,X表示伸烷基,n表示10~25之整數)。 A photosensitive resin composition containing the following components: (A) component: a binder polymer, (B) component: a polymerizable compound having at least one ethylenically unsaturated bond, and (C) component: photopolymerization initiation And the component (B) contains a compound represented by the following formula (I), (wherein R 1 represents a divalent organic group, and R 2 represents a group represented by the following formula (II)), (wherein R 3 represents a hydrogen atom or a methyl group, X represents an alkylene group, and n represents an integer of 10 to 25). 一種感光性樹脂組成物,其含有下列成分:(A)成分:黏合劑聚合物,(B)成分:具有至少一個乙烯性不飽和鍵之聚合性化合物,以及(C)成分:光聚合起始劑, 且前述(B)成分含有以下述通式(III)表示之化合物與以下述通式(IV)表示之化合物之反應產物, (式中,R3表示氫原子或甲基,X表示伸烷基,n表示10~25之整數), (式中,R1表示二價有機基團)。 A photosensitive resin composition containing the following components: (A) component: a binder polymer, (B) component: a polymerizable compound having at least one ethylenically unsaturated bond, and (C) component: photopolymerization initiation And the component (B) contains a reaction product of a compound represented by the following formula (III) and a compound represented by the following formula (IV). (wherein R 3 represents a hydrogen atom or a methyl group, X represents an alkylene group, and n represents an integer of 10 to 25), (wherein R 1 represents a divalent organic group). 一種感光性元件,其具有:支撐體,以及感光性樹脂層,該感光性樹脂層係形成於前述支撐體上之如申請專利範圍第1或2項之感光性樹脂組成物的塗膜。 A photosensitive element comprising: a support, and a photosensitive resin layer formed on the support by a photosensitive resin composition according to claim 1 or 2 of the patent application. 一種光阻圖型之製造方法,其具有下列步驟:於電路形成用基板上形成感光性樹脂層之感光性樹脂層形成步驟,該感光性樹脂層為如申請專利範圍第1或2項之感光性樹脂組成物的塗膜,對前述感光性樹脂層之至少一部份照射活性光線,使曝光部經光硬化之曝光步驟,以及藉由顯影自電路形成用基板上去除前述感光性樹脂層 之未硬化部份之顯影步驟。 A method for producing a resist pattern having a photosensitive resin layer forming step of forming a photosensitive resin layer on a circuit for forming a substrate, the photosensitive resin layer being photosensitive according to claim 1 or 2 The coating film of the resin composition, the active light ray is irradiated to at least a portion of the photosensitive resin layer, the exposure step of the exposed portion is photohardened, and the photosensitive resin layer is removed from the substrate for circuit formation by development The development step of the uncured portion. 一種印刷配線板之製造方法,其包含對藉由如申請專利範圍第4項之光阻圖型之製造方法而形成有光阻圖型之電路形成用基板進行蝕刻處理或鍍敷處理,以形成導體圖型之步驟。 A method of manufacturing a printed wiring board, comprising: performing an etching treatment or a plating treatment on a circuit for forming a circuit pattern having a photoresist pattern by a manufacturing method of the photoresist pattern of claim 4; The steps of the conductor pattern. 一種印刷配線板,其係由如申請專利範圍第5項之印刷配線板之製造方法所製造。 A printed wiring board manufactured by the method of manufacturing a printed wiring board according to claim 5 of the patent application.
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JP4788716B2 (en) * 2005-10-25 2011-10-05 日立化成工業株式会社 Photosensitive resin composition, photosensitive element using the same, resist pattern forming method, and printed wiring board manufacturing method
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JP2010152345A (en) * 2008-11-25 2010-07-08 Asahi Kasei E-Materials Corp Photosensitive resin composition and its use

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