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TWI580949B - Test area CCD line scanning mechanism - Google Patents

Test area CCD line scanning mechanism Download PDF

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Publication number
TWI580949B
TWI580949B TW102129597A TW102129597A TWI580949B TW I580949 B TWI580949 B TW I580949B TW 102129597 A TW102129597 A TW 102129597A TW 102129597 A TW102129597 A TW 102129597A TW I580949 B TWI580949 B TW I580949B
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plate
ccd
line scanning
adjustment
bracket
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TW102129597A
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Chinese (zh)
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TW201409020A (en
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Zaocai Qin
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Joint Power Technology Co Ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901Optical details; Scanning details
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8806Specially adapted optical and illumination features
    • G01N2021/8841Illumination and detection on two sides of object

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  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Facsimile Scanning Arrangements (AREA)
  • Facsimile Heads (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)

Description

測試區CCD線掃描機構 Test area CCD line scanning mechanism

本發明關於機械、電子視覺檢查技術領域,具體是一種測試區CCD(Charge Coupled Device)線掃描機構。 The invention relates to the technical field of mechanical and electronic vision inspection, in particular to a CCD (Charge Coupled Device) line scanning mechanism.

目前在視覺檢查領域對產品進行外觀檢查需要進行多面檢查時,通常採用的方式為物體單面進行掃描後,然後翻轉物體後對另外的一面進行掃描,以此來完成物體的多面掃描檢查工作,此種方式中途需要完成物體的一次翻面工作,機構繁瑣,檢查效率較低,機構成本高。 At present, in the field of visual inspection, visual inspection of products requires multi-face inspection. Usually, the method is to scan one side of the object, then flip the object and scan the other side to complete the multi-face scanning inspection of the object. In this way, it is necessary to complete a turning operation of the object in the middle, the mechanism is cumbersome, the inspection efficiency is low, and the mechanism cost is high.

為了簡化目前對物品進行多面視覺檢查時的繁瑣的機構,節約成本,提高產品生產檢查效益,本發明提供一種測試區CCD線掃描機構,採用此技術方案,讓被檢查物品藉由直立式運動經過雙面CCD進行正反兩面同時掃描,同時完成兩面的檢查工作,無需對產品進行翻轉,減少機械結構的複雜性,因減少翻轉機構固減少設備故障率、減少機器體積。雙面掃面效率更高,更高的生產效益。 In order to simplify the cumbersome mechanism for multi-face visual inspection of articles, save cost, and improve product production inspection efficiency, the present invention provides a test area CCD line scanning mechanism, which adopts this technical scheme to allow an object to be inspected to pass through an upright movement. The double-sided CCD performs simultaneous scanning on both sides of the front and back sides, and completes the inspection work on both sides at the same time, without the need to flip the product, reducing the complexity of the mechanical structure, reducing the equipment failure rate and reducing the machine volume by reducing the turning mechanism. Double-sided scanning is more efficient and has higher production efficiency.

本發明之技術方案: 一種測試區CCD線掃描機構,包括長條掃描窗19、AB面中間隔板20、A面CCD線掃描裝置和B面CCD線掃描裝置,A面CCD線掃描裝置和B面CCD線掃描裝置分別設置在AB面中間隔板20的兩側,AB面中間隔板20上設有長條掃描窗19。 The technical solution of the invention: A test area CCD line scanning mechanism, comprising a long scanning window 19, an AB surface intermediate partition 20, an A surface CCD line scanning device and a B surface CCD line scanning device, an A surface CCD line scanning device and a B surface CCD line scanning device respectively Arranged on both sides of the AB-face intermediate partition 20, the AB-face intermediate partition 20 is provided with a long scanning window 19.

其中,A面CCD線掃描裝置和B面CCD線掃描裝置分別安裝在A面側面支架1和B側面支架18上,A面側面支架1和B側面支架18分別安裝在AB面中間隔板20的兩側。 Wherein, the A-side CCD line scanning device and the B-side CCD line scanning device are respectively mounted on the A-side side bracket 1 and the B-side bracket 18, and the A-side side bracket 1 and the B-side bracket 18 are respectively mounted on the AB-face intermediate partition 20 On both sides.

其中,B側面支架18上連接有A面側面調節塊14,A面側面調節塊14設置在AB面中間隔板20上。 The B side bracket 18 is connected with an A side side adjusting block 14 , and the A side side adjusting block 14 is disposed on the AB surface intermediate partition 20 .

其中,A面側面支架1上設有A面底面支撐板2。 Among them, the A-side side support 1 is provided with an A-side bottom support plate 2.

其中,B側面支架18上設有CCD電源支架底座16和CCD支架電源蓋板17。 The B side bracket 18 is provided with a CCD power bracket base 16 and a CCD bracket power cover 17 .

其中,A面CCD線掃描裝置包括A面固定板3、A面X方向調節板4、A面Y方向調節板7、A面Z軸旋轉固定板8、A面Z軸旋轉調節板9、A面XY旋轉固定架11、A面CCD固定板12、A面CCD感測器13和A面調節支架15,A面X方向調節板4設置在A面固定板3上,A面Y方向調節板7設置在A面X方向調節板4上,A面Z軸旋轉固定板8設置在A面Y方向調節板7上,A面Z軸旋轉調節板9設置在A面Y方向調節板7,A面CCD固定板12設置在A面XY旋轉固定架11上,A面CCD感測器13設置在A面CCD固定板12上。 The A-side CCD line scanning device includes an A-side fixed plate 3, an A-side X-direction adjusting plate 4, an A-side Y-direction adjusting plate 7, an A-side Z-axis rotating fixed plate 8, and an A-side Z-axis rotating adjusting plate 9, A. The surface XY rotation fixed frame 11, the A surface CCD fixed plate 12, the A surface CCD sensor 13 and the A surface adjustment bracket 15, the A surface X direction adjustment plate 4 is disposed on the A surface fixing plate 3, and the A surface Y direction adjustment plate 7 is disposed on the A-side X-direction adjustment plate 4, the A-side Z-axis rotation fixing plate 8 is disposed on the A-side Y-direction adjustment plate 7, and the A-side Z-axis rotation adjustment plate 9 is disposed on the A-side Y-direction adjustment plate 7, A The surface CCD fixing plate 12 is disposed on the A-plane XY rotating holder 11, and the A-side CCD sensor 13 is disposed on the A-side CCD fixing plate 12.

其中,A面CCD線掃描裝置更包括A面Y方向擋條5、A面X方向擋條6、A面Z軸旋轉微調板10和A面調節支架15,A面Y方向擋條5設置在A面X方向調節板4邊緣,A面X方向擋條6設置在A面Y方向調節板7邊緣,A面Z軸旋轉微調板10設置在A面Y方向調節板7上,A面調節支架15設置在A面固定板3上。 The A-side CCD line scanning device further includes an A-side Y-direction dam 5, an A-side X-direction dam 6, an A-side Z-axis rotation fine adjustment plate 10 and an A-side adjustment bracket 15, and an A-side Y-direction dam 5 is disposed at The A-side X-direction adjustment plate 4 is edged, the A-side X-direction bar 6 is disposed on the edge of the A-plane Y-direction adjustment plate 7, and the A-side Z-axis rotation fine adjustment plate 10 is disposed on the A-side Y-direction adjustment plate 7, and the A-side adjustment bracket 15 is disposed on the A-side fixing plate 3.

其中,B面CCD線掃描裝置包括B面固定板3’、B面X方向調節板4’、B面Y方向調節板7’、B面Z軸旋轉固定板8’、B面Z軸旋轉調節板9’、B面XY旋轉固定架11’、B面CCD固定板12’、B面CCD感測器13’和B面調節支架15’,B面X方向調節板4’設置在B面固定板3’上,B面Y方向調節板7’設置在B面X方向調節板4’上,B面Z軸旋轉固定板8’設置在B面Y方向調節板7’上,B面Z軸旋轉調節板9’設置在B面Y方向調節板7’上,B面CCD固定板12’設置在B面XY旋轉固定架11’上,B面CCD感測器13’設置在B面CCD固定板12’上。 The B-plane CCD line scanning device includes a B-side fixed plate 3', a B-side X-direction adjusting plate 4', a B-side Y-direction adjusting plate 7', a B-side Z-axis rotating fixed plate 8', and a B-side Z-axis rotation adjustment. Plate 9', B-plane XY rotation mount 11', B-face CCD fixed plate 12', B-face CCD sensor 13' and B-face adjustment bracket 15', B-side X-direction adjustment plate 4' is fixed on B-plane On the plate 3', the B-side Y-direction adjustment plate 7' is disposed on the B-side X-direction adjustment plate 4', and the B-side Z-axis rotation fixed plate 8' is disposed on the B-face Y-direction adjustment plate 7', and the B-face Z-axis The rotary adjustment plate 9' is disposed on the B-side Y-direction adjustment plate 7', the B-face CCD fixed plate 12' is disposed on the B-plane XY rotation holder 11', and the B-face CCD sensor 13' is disposed on the B-face CCD fixed On the board 12'.

其中,B面CCD線掃描裝置更包括B面Y方向擋條5’、B面X方向擋條6’、B面Z軸旋轉微調板10’和B面調節支架15’,B面Y方向擋條5’設置在B面X方向調節板4’邊緣,B面X方向擋條6’設置在B面Y方向調節板7’邊緣,B面Z軸旋轉微調板10’設置在B面Y方向調節板7’上,B面調節支架15’設置在B面固定板3’上。 The B-plane CCD line scanning device further includes a B-side Y-direction bar 5', a B-side X-direction bar 6', a B-plane Z-axis rotation fine adjustment plate 10' and a B-face adjustment bracket 15', and a B-side Y-direction block. The strip 5' is disposed on the edge of the B-side X-direction adjustment plate 4', the B-side X-direction bar 6' is disposed on the B-side Y-direction adjustment plate 7' edge, and the B-side Z-axis rotation fine adjustment plate 10' is disposed on the B-side Y direction On the adjustment plate 7', the B-face adjustment bracket 15' is disposed on the B-side fixing plate 3'.

本發明之有益效果是:本發明之測試區CCD線掃描機構採用兩面同時掃 描,無需對產品進行翻轉動作,減少機械結構的複雜性,因為無需進行翻轉動作,所以節約了因翻轉而產生的效率減少。從而雙面掃描效率更高,能夠提高一倍的生產效益。同時由於整個設備減少了翻轉機構,設備的體積大大減少,相同的空間能夠放入更多的設備,有效提高廠房的利用率。 The invention has the beneficial effects that the CCD line scanning mechanism of the test area of the invention adopts simultaneous scanning on both sides The drawing does not require the product to be flipped, and the complexity of the mechanical structure is reduced, since the turning operation is not required, so that the efficiency reduction due to the turning is saved. Therefore, double-sided scanning is more efficient and can double the production efficiency. At the same time, since the entire device reduces the turning mechanism, the volume of the device is greatly reduced, and the same space can be put into more equipment, thereby effectively improving the utilization rate of the plant.

圖中:1‧‧‧為A面側面支架 In the picture: 1‧‧‧ is the A side bracket

2‧‧‧為A面底面支撐板 2‧‧‧ is the A-side bottom support plate

3‧‧‧為A面固定板 3‧‧‧A side fixing plate

4‧‧‧為A面X方向調節板 4‧‧‧A side X adjustment plate

5‧‧‧為A面Y方向擋條 5‧‧‧ is the A-side Y-direction strip

6‧‧‧為A面X方向擋條 6‧‧‧ is the A-side X-direction strip

7‧‧‧為A面Y方向調節板 7‧‧‧A side Y adjustment plate

8‧‧‧為A面Z軸旋轉固定板 8‧‧‧A-side Z-axis rotating fixed plate

9‧‧‧為A面Z軸旋轉調節板 9‧‧‧A-side Z-axis rotary adjustment plate

10‧‧‧為A面Z軸旋轉微調板 10‧‧‧A-side Z-axis rotary fine-tuning board

11‧‧‧為A面XY旋轉固定架 11‧‧‧A side XY rotating bracket

12‧‧‧為A面CCD固定板 12‧‧‧A-side CCD fixed plate

13‧‧‧為A面CCD感測器 13‧‧‧A-side CCD sensor

14‧‧‧為A面側面調節塊 14‧‧‧A side adjustment block

15‧‧‧為A面調節支架 15‧‧‧A side adjustment bracket

3’‧‧‧為B面固定板 3'‧‧‧ is a B-side fixing plate

4’‧‧‧為B面X方向調節板 4'‧‧‧ is a B-side X-direction adjustment plate

5’‧‧‧為B面Y方向擋條 5'‧‧‧ is the B-side Y-direction strip

6’‧‧‧為B面X方向擋條 6'‧‧‧ is a B-side X-direction strip

7’‧‧‧為B面Y方向調節板 7'‧‧‧ is the B-side Y-direction adjustment plate

8’‧‧‧為B面Z軸旋轉固定板 8'‧‧‧ is a B-side Z-axis rotating fixed plate

9’‧‧‧為B面Z軸旋轉調節板 9'‧‧‧ is a B-side Z-axis rotary adjustment plate

10’‧‧‧’為B面Z軸旋轉微調板 10’‧‧‧’ is a B-side Z-axis rotary fine-tuning board

11’‧‧‧為B面XY旋轉固定架 11'‧‧‧ is a B-side XY rotating mount

12’‧‧‧為B面CCD固定板 12'‧‧‧ is a B-face CCD fixed plate

13’‧‧‧為B面CCD感測器 13'‧‧‧ is a B-face CCD sensor

15’‧‧‧為B面調節支架 15'‧‧‧ is a B-side adjustment bracket

16‧‧‧為CCD電源支架底座 16‧‧‧ is the base of CCD power bracket

17‧‧‧為CCD支架電源蓋板 17‧‧‧ is the CCD bracket power cover

18‧‧‧為B側面支架 18‧‧‧B side bracket

19‧‧‧為長條掃描窗 19‧‧‧ is a long scanning window

20‧‧‧為AB面中間隔板 20‧‧‧ is the intermediate partition of the AB surface

第1圖為本發明之側面結構示意圖。 Figure 1 is a schematic view showing the side structure of the present invention.

第2圖為本發明之立體結構示意圖。 Figure 2 is a schematic perspective view of the present invention.

下面本發明將結合圖式中的實施例作進一步的描述:如第1圖、第2圖所示,本發明之測試區CCD線掃描機構,包括長條掃描窗19、AB面中間隔板20、A面CCD線掃描裝置和B面CCD線掃描裝置,A面CCD線掃描裝置和B面CCD線掃描裝置分別設置在AB面中間隔板20的兩側,AB面中間隔板20上設有長條掃描窗19。 The present invention will be further described with reference to the embodiments in the drawings. As shown in FIG. 1 and FIG. 2, the test area CCD line scanning mechanism of the present invention includes a long scanning window 19 and an AB surface intermediate partition 20 . The A-side CCD line scanning device and the B-plane CCD line scanning device, the A-side CCD line scanning device and the B-plane CCD line scanning device are respectively disposed on both sides of the AB-face intermediate partition 20, and the AB-face intermediate partition 20 is provided A strip scan window 19.

A面CCD線掃描裝置和B面CCD線掃描裝置分別安裝在A面側面支架1和B側面支架18上,A面側面支架1和B側面支架18分別安裝在AB面中間隔板20的兩側。 The A-side CCD line scanning device and the B-plane CCD line scanning device are respectively mounted on the A-side side bracket 1 and the B-side bracket 18, and the A-side side bracket 1 and the B-side bracket 18 are respectively mounted on both sides of the AB-face intermediate partition 20. .

B側面支架18修改為:A面側面支架1上連接有A面側面調節塊14,A面側面調節塊14設置在AB面中間隔板 20上。 The B side bracket 18 is modified as follows: the A side side bracket 1 is connected with the A side side adjusting block 14, and the A side side adjusting block 14 is disposed at the AB side intermediate partition plate. 20 on.

A面側面支架1上設有A面底面支撐板2。 The A-side side support 1 is provided with an A-side bottom support plate 2.

B側面支架18上設有CCD電源支架底座16和CCD支架電源蓋板17。 The B side bracket 18 is provided with a CCD power supply base 16 and a CCD support power cover 17.

A面CCD線掃描裝置包括A面固定板3、A面X方向調節板4、A面Y方向調節板7、A面Z軸旋轉固定板8、A面Z軸旋轉調節板9、A面XY旋轉固定架11、A面CCD固定板12、A面CCD感測器13和A面調節支架15,A面X方向調節板4設置在A面固定板3上,A面Y方向調節板7設置在A面X方向調節板4上,A面Z軸旋轉固定板8設置在A面Y方向調節板7上,A面Z軸旋轉調節板9設置在A面Y方向調節板7上,A面CCD固定板12設置在A面XY旋轉固定架11上,A面CCD感測器13設置在A面CCD固定板12上。 The A-side CCD line scanning device includes an A-side fixing plate 3, an A-side X-direction adjusting plate 4, an A-side Y-direction adjusting plate 7, an A-side Z-axis rotating fixed plate 8, an A-side Z-axis rotating adjusting plate 9, and an A-plane XY. The rotating fixed frame 11, the A-side CCD fixed plate 12, the A-side CCD sensor 13 and the A-side adjusting bracket 15, the A-side X-direction adjusting plate 4 is disposed on the A-side fixing plate 3, and the A-side Y-direction adjusting plate 7 is disposed. On the A-side X-direction adjustment plate 4, the A-side Z-axis rotation fixing plate 8 is disposed on the A-side Y-direction adjustment plate 7, and the A-side Z-axis rotation adjustment plate 9 is disposed on the A-side Y-direction adjustment plate 7, on the A side. The CCD fixing plate 12 is disposed on the A-side XY rotating holder 11, and the A-side CCD sensor 13 is disposed on the A-side CCD fixing plate 12.

A面CCD線掃描裝置更包括A面Y方向擋條5、A面X方向擋條6、A面Z軸旋轉微調板10和A面調節支架15,A面Y方向擋條5設置在A面X方向調節板4邊緣,A面X方向擋條6設置在A面Y方向調節板7邊緣,A面Z軸旋轉微調板10設置在A面Y方向調節板7上,A面調節支架15設置在A面固定板3上。 The A-side CCD line scanning device further includes an A-side Y-direction dam 5, an A-side X-direction dam 6, an A-side Z-axis rotation fine adjustment plate 10 and an A-side adjustment bracket 15, and an A-side Y-direction dam 5 is disposed on the A side. The edge of the X-direction adjustment plate 4, the A-side X-direction bar 6 is disposed at the edge of the A-plane Y-direction adjustment plate 7, and the A-plane Z-axis rotation fine adjustment plate 10 is disposed on the A-side Y-direction adjustment plate 7, and the A-side adjustment bracket 15 is disposed. On the A side fixing plate 3.

B面CCD線掃描裝置包括B面固定板3’、B面X方向調節板4’、B面Y方向調節板7’、B面Z軸旋轉固定板8’、B面Z軸旋轉調節板9’、B面XY旋轉固定架11’、B面CCD固定板12’、B面CCD感測器13’和B面調節支架16’,B面X 方向調節板4’設置在B面固定板3’上,B面Y方向調節板7,設置在B面X方向調節板4’上,B面Z軸旋轉固定板8’設置在B面Y方向調節板7’上,B面Z軸旋轉調節板9’設置在B面Y方向調節板7’上,B面CCD固定板12’設置在B面XY旋轉固定架11’上,B面CCD感測器13’設置在B面CCD固定板12’上。 The B-plane CCD line scanning device includes a B-face fixing plate 3', a B-side X-direction adjusting plate 4', a B-face Y-direction adjusting plate 7', a B-plane Z-axis rotating fixing plate 8', and a B-plane Z-axis rotating adjusting plate 9 ', B-face XY rotation mount 11', B-face CCD fixed plate 12', B-face CCD sensor 13' and B-side adjustment bracket 16', B-face X The direction adjusting plate 4' is disposed on the B surface fixing plate 3', the B surface Y direction adjusting plate 7 is disposed on the B surface X direction adjusting plate 4', and the B surface Z axis rotating fixing plate 8' is disposed in the B surface Y direction On the adjusting plate 7', the B-side Z-axis rotation adjusting plate 9' is disposed on the B-side Y-direction adjusting plate 7', and the B-face CCD fixing plate 12' is disposed on the B-face XY rotating fixing frame 11', and the B-face CCD feeling The detector 13' is disposed on the B-face CCD fixing plate 12'.

B面CCD線掃描裝置更包括B面Y方向擋條5’、B面X方向擋條6’、B面Z軸旋轉微調板10’和B面調節支架15’,B面Y方向擋條5’設置在B面X方向調節板4’邊緣,B面X方向擋條6’設置在B面Y方向調節板7’邊緣,B面Z軸旋轉微調板10’設置在B面Y方向調節板7’上,B面調節支架15’設置在B面固定板3’上。 The B-plane CCD line scanning device further includes a B-side Y-direction bar 5', a B-face X-direction bar 6', a B-plane Z-axis rotation fine adjustment plate 10' and a B-face adjustment bracket 15', and a B-face Y-direction bar 5 'Set on the B side X direction adjustment plate 4' edge, B side X direction bar 6' is set on the B side Y direction adjustment plate 7' edge, B side Z axis rotation fine adjustment plate 10' is set in the B side Y direction adjustment plate On the 7' side, the B-side adjustment bracket 15' is disposed on the B-side fixing plate 3'.

上面所述之實施例僅僅是對本發明之較佳實施方式進行描述,並非對本發明的構思和範圍進行限定,在不脫離本發明設計構思前提下,本發明所屬技術領域中具有通常知識者對本發明之技術方案作出的各種變型和改進,均應落入本發明的保護範圍,本發明所請求保護的技術內容已經全部記載在發明申請專利範圍中。 The embodiments described above are only intended to describe the preferred embodiments of the present invention, and are not intended to limit the scope and scope of the present invention. Various modifications and improvements made by the technical solutions are intended to fall within the scope of the present invention. The technical contents claimed in the present invention are all described in the scope of the invention.

1‧‧‧為A面側面支架 1‧‧‧A side bracket

2‧‧‧為A面底面支撐板 2‧‧‧ is the A-side bottom support plate

16‧‧‧為CCD電源支架底座 16‧‧‧ is the base of CCD power bracket

17‧‧‧為CCD支架電源蓋板 17‧‧‧ is the CCD bracket power cover

18‧‧‧為B側面支架 18‧‧‧B side bracket

19‧‧‧為長條掃描窗 19‧‧‧ is a long scanning window

20‧‧‧為AB面中間隔板 20‧‧‧ is the intermediate partition of the AB surface

Claims (7)

一種測試區CCD線掃描機構,其包括長條掃描窗(19)、AB面中間隔板(20)、A面CCD線掃描裝置和B面CCD線掃描裝置,該A面CCD線掃描裝置和B面CCD線掃描裝置分別設置在AB面中間隔板(20)的兩側,AB面中間隔板(20)上設有長條掃描窗(19);其中該A面CCD線掃描裝置和B面CCD線掃描裝置分別安裝在A面側面支架(1)和B側面支架(18)上,A面側面支架(1)和B側面支架(18)分別安裝在AB面中間隔板(20)的兩側;其中CCD電源支架底座(16)和CCD支架電源蓋板(17)係設置於為A字型結構的該B側面支架中。 A test area CCD line scanning mechanism, comprising a long scanning window (19), an AB surface intermediate partition (20), an A surface CCD line scanning device and a B surface CCD line scanning device, the A surface CCD line scanning device and B The surface CCD line scanning devices are respectively disposed on two sides of the AB surface intermediate partition plate (20), and the AB surface intermediate partition plate (20) is provided with a long scanning window (19); wherein the A surface CCD line scanning device and the B surface The CCD line scanning devices are respectively mounted on the A-side side bracket (1) and the B-side bracket (18), and the A-side side bracket (1) and the B-side bracket (18) are respectively mounted on the AB-face intermediate partition (20). The side; wherein the CCD power supply base (16) and the CCD support power supply cover (17) are disposed in the B side bracket of the A-shaped structure. 如申請專利範圍第1項所述之測試區CCD線掃描機構,其中該A面側面支架(1)上連接有A面側面調節塊(14),A面側面調節塊(14)設置在AB面中間隔板(20)上。 The test area CCD line scanning mechanism according to claim 1, wherein the A-side side bracket (1) is connected with an A-side side adjustment block (14), and the A-side side adjustment block (14) is disposed at the AB surface. On the intermediate partition (20). 如申請專利範圍第1項所述之測試區CCD線掃描機構,其中該A面側面支架(1)上設有A面底面支撐板(2)。 The test area CCD line scanning mechanism according to claim 1, wherein the A-side side support (1) is provided with an A-side bottom support plate (2). 如申請專利範圍第1項所述之測試區CCD線掃描機構,其中該A面CCD線掃描裝置包括A面固定板(3)、A面X方向調節板(4)、A面Y方向調節板(7)、A面Z軸旋轉固定板(8)、A面Z軸旋轉調 節板(9)、A面XY旋轉固定架(11)、A面CCD固定板(12)、A面CCD感測器(13)和A面調節支架(15),該A面X方向調節板(4)設置在A面固定板(3)上,A面Y方向調節板(7)設置在A面X方向調節板(4)上,A面Z軸旋轉固定板(8)設置在A面Y方向調節板(7)上,A面Z軸旋轉調節板(9)設置在A面Y方向調節板(7)上,A面CCD固定板(12)設置在A面XY旋轉固定架(11)上,A面CCD感測器(13)設置在A面CCD固定板(12)上。 The test area CCD line scanning mechanism according to claim 1, wherein the A-side CCD line scanning device comprises an A-side fixing plate (3), an A-side X-direction adjusting plate (4), and an A-side Y-direction adjusting plate. (7), A-side Z-axis rotating fixed plate (8), A-side Z-axis rotation adjustment Section board (9), A side XY rotation fixing frame (11), A side CCD fixing board (12), A side CCD sensor (13) and A side adjustment bracket (15), the A side X direction adjustment board (4) Set on the A-side fixing plate (3), the A-side Y-direction adjusting plate (7) is set on the A-side X-direction adjusting plate (4), and the A-side Z-axis rotating fixing plate (8) is set on the A side. On the Y-direction adjustment plate (7), the A-side Z-axis rotation adjustment plate (9) is disposed on the A-side Y-direction adjustment plate (7), and the A-side CCD fixed plate (12) is disposed on the A-side XY rotation holder (11) The A-side CCD sensor (13) is disposed on the A-side CCD fixing plate (12). 如申請專利範圍第4項所述之測試區CCD線掃描機構,其中該A面CCD線掃描裝置更包括A面Y方向擋條(5)、A面X方向擋條(6)、A面Z軸旋轉微調板(10)和A面調節支架(15),A面Y方向擋條(5)設置在A面X方向調節板(4)邊緣,A面X方向擋條(6)設置在A面Y方向調節板(7)邊緣,A面Z軸旋轉微調板(10)設置在A面Y方向調節板(7)上,A面調節支架(15)設置在A面固定板(3)上。 The CCD line scanning mechanism of the test area as described in claim 4, wherein the A-side CCD line scanning device further comprises an A-side Y-direction bar (5), an A-side X-direction bar (6), and an A-side Z. Axis rotation fine adjustment plate (10) and A surface adjustment bracket (15), A side Y direction bar (5) is set at the edge of the A side X direction adjustment plate (4), and A side X direction bar (6) is set at A The surface of the Y-direction adjustment plate (7), the A-side Z-axis rotation fine adjustment plate (10) is disposed on the A-side Y-direction adjustment plate (7), and the A-side adjustment bracket (15) is disposed on the A-side fixing plate (3) . 如申請專利範圍第1項所述之測試區CCD線掃描機構,其中該B面CCD線掃描裝置包括B面固定板(3’)、B面X方向調節板(4’)、B面Y方向調節板(7’)、B面Z軸旋轉固定板(8’)、B面Z軸旋轉調節板(9’)、B面XY旋轉固定架(11’)、B面CCD固定板(12’)、B面CCD感測器(13’)和B 面調節支架(15’),該B面X方向調節板(4’)設置在B面固定板(3’)上,B面Y方向調節板(7’)設置在B面X方向調節板(4’)上,B面Z軸旋轉固定板(8’)設置在B面Y方向調節板(7’)上,B面Z軸旋轉調節板(9’)設置在B面Y方向調節板(7’)上,B面CCD固定板(12’)設置在B面XY旋轉固定架(11’)上,B面CCD感測器(13’)設置在B面CCD固定板(12’)上。 The test area CCD line scanning mechanism according to claim 1, wherein the B-side CCD line scanning device comprises a B-side fixing plate (3'), a B-side X-direction adjusting plate (4'), and a B-side Y direction. Adjustment plate (7'), B-side Z-axis rotation fixed plate (8'), B-side Z-axis rotation adjustment plate (9'), B-side XY rotation holder (11'), B-face CCD fixed plate (12' ), B-face CCD sensor (13') and B Surface adjustment bracket (15'), the B-side X-direction adjustment plate (4') is disposed on the B-side fixing plate (3'), and the B-side Y-direction adjustment plate (7') is disposed on the B-side X-direction adjustment plate ( 4'), the B-side Z-axis rotation fixed plate (8') is set on the B-side Y-direction adjustment plate (7'), and the B-side Z-axis rotation adjustment plate (9') is set on the B-side Y-direction adjustment plate ( 7'), the B-plane CCD fixed plate (12') is placed on the B-plane XY rotating mount (11'), and the B-face CCD sensor (13') is placed on the B-face CCD fixed plate (12'). . 如申請專利範圍第6項所述之測試區CCD線掃描機構,其中該B面CCD線掃描裝置更包括B面Y方向擋條(5’)、B面X方向擋條(6’)、B面Z軸旋轉微調板(10’)和B面調節支架(15’),B面Y方向擋條(5’)設置在B面X方向調節板(4’)邊緣,B面X方向擋條(6’)設置在B面Y方向調節板(7’)邊緣,B面Z軸旋轉微調板(10’)設置在B面Y方向調節板(7’)上,B面調節支架(15’)設置在B面固定板(3’)上。 The test area CCD line scanning mechanism according to claim 6, wherein the B-side CCD line scanning device further comprises a B-side Y-direction bar (5'), a B-side X-direction bar (6'), B Z-axis rotary fine adjustment plate (10') and B-side adjustment bracket (15'), B-side Y-direction bar (5') is set on the B-side X-direction adjustment plate (4') edge, B-side X-direction bar (6') is set on the B side Y direction adjustment plate (7') edge, B side Z axis rotation fine adjustment plate (10') is set on the B side Y direction adjustment plate (7'), B side adjustment bracket (15' ) Set on the B-side fixing plate (3').
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