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TWI567839B - Wire construction and wire bonding method - Google Patents

Wire construction and wire bonding method Download PDF

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Publication number
TWI567839B
TWI567839B TW103129481A TW103129481A TWI567839B TW I567839 B TWI567839 B TW I567839B TW 103129481 A TW103129481 A TW 103129481A TW 103129481 A TW103129481 A TW 103129481A TW I567839 B TWI567839 B TW I567839B
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TW
Taiwan
Prior art keywords
bonding
wire
bonding wire
contact
reinforcing structure
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Application number
TW103129481A
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Chinese (zh)
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TW201608655A (en
Inventor
林偉勝
江連成
王日富
洪隆棠
葉孟宏
朱育德
Original Assignee
矽品精密工業股份有限公司
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Priority to TW103129481A priority Critical patent/TWI567839B/en
Priority to CN201410459888.5A priority patent/CN105470151A/en
Publication of TW201608655A publication Critical patent/TW201608655A/en
Application granted granted Critical
Publication of TWI567839B publication Critical patent/TWI567839B/en

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Classifications

    • H10W90/00
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/44Structure, shape, material or disposition of the wire connectors prior to the connecting process
    • H01L2224/45Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
    • H01L2224/45001Core members of the connector
    • H01L2224/45099Material
    • H01L2224/451Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
    • H01L2224/45138Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
    • H01L2224/45147Copper (Cu) as principal constituent
    • H10W72/01551
    • H10W72/0711
    • H10W72/07141
    • H10W72/075
    • H10W72/07511
    • H10W72/07521
    • H10W72/07551
    • H10W72/50
    • H10W72/536
    • H10W72/5363
    • H10W72/5434
    • H10W72/5522
    • H10W72/583
    • H10W90/752
    • H10W90/753
    • H10W90/754
    • H10W90/756

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  • Wire Bonding (AREA)

Description

打線構造及銲線形成方法 Wire construction and wire bonding method

本發明係有關一種打線製程,尤指一種銲線形成方法及打線結構。 The invention relates to a wire bonding process, in particular to a wire bonding method and a wire bonding structure.

於現有的半導體封裝技術中,係藉由打線技術(即透過金線或銅線等)將銲線由如晶片之電子元件電性連接至如導線架或封裝基板之承載件,該承載件再藉由如銲球之導電元件電性連接至如電路板之外部裝置。 In the existing semiconductor packaging technology, the bonding wire is electrically connected to the carrier such as the lead frame or the package substrate by wire bonding technology (that is, through gold wire or copper wire, etc.), and the carrier is further It is electrically connected to an external device such as a circuit board by a conductive member such as a solder ball.

習知打線技術(wire bonding)可藉由超音速振動狀態,由鋼嘴形成最初球體在半導體裝置或承載件上,以進行球端加壓(ball bond)作業,使銲墊表面與球端相互固接,再由該球體延伸線體至另一半導體裝置或承載件之銲墊表面上,以進行接點加壓、加溫(bond)作業,最後再以鋼嘴將多餘之銲線剪斷。 Conventional wire bonding can form a first ball on a semiconductor device or a carrier by a steel nozzle by a supersonic vibration state to perform a ball bond operation, so that the surface of the pad and the ball end are mutually Fixed, and then the ball extends from the wire body to the surface of the pad of another semiconductor device or carrier for contact pressurization, bonding operation, and finally the excess wire is cut by the steel nozzle. .

如第1A圖所示,係為習知打線設備進行打線製程的剖視示意圖,該打線設備具有一如鋼嘴之銲件10與線夾(圖略)。於進行打線製程之球端加壓作業時,一銲線3係穿過該銲件10之穿線孔100,且該線夾係夾固該銲線3, 再利用該銲件10使該銲線3形成一球端30於一電子元件8之電極墊80上。待加溫、加壓該球端30以使該球端30固接於該電極墊80上後,再拉伸該銲線3至一用以承載該電子元件8之承載件9之銲墊90上。 As shown in FIG. 1A, it is a cross-sectional view of a conventional wire-bonding device for performing a wire-bonding process, and the wire-bonding device has a weldment 10 such as a steel nozzle and a wire clamp (not shown). When the ball end pressing operation of the wire bonding process is performed, a bonding wire 3 passes through the threading hole 100 of the welding member 10, and the wire clamp clamps the bonding wire 3, The soldering wire 10 is further used to form the wire end 30 on the electrode pad 80 of an electronic component 8. After the ball end 30 is heated and pressed to fix the ball end 30 to the electrode pad 80, the bonding wire 3 is stretched to a pad 90 for carrying the carrier 9 of the electronic component 8. on.

接著,進行接點加壓、加溫作業。先使該第一銲線3與該銲墊90電性連接,再向上移動該銲件10(如箭頭方向A),以拉斷該銲線3,使保留於該銲件10上之銲線3’產生線尾3a,且該線尾3a係伸出該銲件10之下端,以準備進行下一次的打線製程之球端加壓作業。 Next, the joint pressurization and heating work are performed. First, the first bonding wire 3 is electrically connected to the bonding pad 90, and then the soldering member 10 is moved upward (such as the arrow direction A) to break the bonding wire 3 to make the bonding wire remaining on the welding component 10. 3' produces a tail 3a, and the tail 3a extends beyond the lower end of the weldment 10 to prepare for the ball end press of the next wire-bonding process.

隨著電子產業的蓬勃發展,電子產品也逐漸邁向輕薄短小的趨勢,故晶片封裝之技術不斷縮小,因而所用之銲線之尺寸(如線寬或接點)亦不斷縮小,致使增加打線製程之困難度。例如,於進行習知接點加壓、加溫作業時,該銲線3有時無法有效結合至該銲墊90上,故當向上移動該銲件10時(如箭頭方向A’),無法拉斷該銲線3,如第1B圖所示,致使無法完成接點加壓、加溫作業。 With the rapid development of the electronics industry, electronic products are gradually moving toward a thinner and lighter trend, so the technology of chip packaging is shrinking, and the size of the wire used (such as line width or contact) is also shrinking, resulting in an increase in the wire bonding process. The difficulty. For example, when conventional contact pressurization and warming work are performed, the bonding wire 3 may not be effectively bonded to the bonding pad 90, so when the welding element 10 is moved upward (such as the arrow direction A'), The wire 3 is pulled off, as shown in Fig. 1B, so that the joint pressurization and warming operation cannot be completed.

因此,遂於習知打線設備設置鳴叫裝置,以當發生上述該銲線3未有效結合至該銲墊90上之情況時,該鳴叫裝置會自動停止運作並發出警示鈴響,以呼叫作業員。 Therefore, the conventional wire bonding device is provided with a squealing device, so that when the wire bonding wire 3 is not effectively bonded to the bonding pad 90, the squealing device automatically stops operating and issues a warning ring to call the operator. .

惟,目前當發生該銲線3未結合之情況時,需等待作業員以人工方式進行檢測,導致無法繼續進行打線製程,以致於產線停滯,故大幅降低打線設備之生產力,且因檢測極為耗時而增加製作成本。具體地,目前該鳴叫裝置啟動後之作業流程係先請作業員將打線設備切換為手動作 業,再確認是否發生該銲線3未結合之現象,之後手動進行打線功能之測試,且手動清除多餘線尾,最後,將打線設備切換為自動作業,並確認打線品質。 However, when the welding wire 3 is not combined, it is necessary to wait for the operator to perform the manual inspection, which may result in the inability to continue the wire-making process, so that the production line is stagnant, thereby greatly reducing the productivity of the wire-bonding device, and the detection is extremely Time-consuming and increased production costs. Specifically, the current operation process after the activation of the calling device first asks the operator to switch the wire bonding device to the hand motion. In the industry, it is confirmed whether the welding wire 3 is not combined, and then the wire bonding function is manually tested, and the excess wire tail is manually removed. Finally, the wire bonding device is switched to the automatic operation, and the wire quality is confirmed.

因此,如何克服習知技術中之問題,實已成目前亟欲解決的課題。 Therefore, how to overcome the problems in the prior art has become a problem that is currently being solved.

鑑於上述習知技術之種種缺失,本發明係提供一種銲線形成方法,係包括:提供一具有銲件之銲線設備,該銲件係收納有第一銲線與第二銲線;將該第一銲線結合至接點上,且當該第一銲線未結合至該接點上時,該銲件會自動將該第一銲線結合至該接點上;形成強化結構於該第二銲線上;以及將該強化結構結合至該接點與該第一銲線之結合處。 In view of the above-mentioned various deficiencies of the prior art, the present invention provides a method of forming a bonding wire, comprising: providing a bonding wire device having a weldment, the weldment housing a first bonding wire and a second bonding wire; The first bonding wire is coupled to the contact, and when the first bonding wire is not bonded to the contact, the welding member automatically bonds the first bonding wire to the contact; forming a reinforcing structure on the first a second bonding wire; and bonding the reinforcing structure to the junction of the contact and the first bonding wire.

前述之銲線形成方法中,該接點係設於第一電子元件上,且該第一銲線之另一端係結合至第二電子元件上。再者,該強化結構復結合至該第一銲線之另一端與該另一電子元件之結合處。 In the above method of forming a bonding wire, the contact is provided on the first electronic component, and the other end of the first bonding wire is bonded to the second electronic component. Furthermore, the reinforcing structure is coupled to the junction of the other end of the first bonding wire and the other electronic component.

前述之銲線形成方法中,該第一銲線與該第二銲線係相連接,且於該第一銲線結合至該接點上時,該第一與第二銲線相分離。 In the above method of forming a bonding wire, the first bonding wire is connected to the second bonding wire, and when the first bonding wire is bonded to the contact, the first bonding wire is separated from the second bonding wire.

前述之銲線形成方法中,該第二銲線之端部具有強化結構,且該銲件使該強化結構結合至該第一銲線上。例如,該強化結構係以燒結該第二銲線之端部而形成者,使該強化結構係為塊體。 In the above method of forming a bonding wire, the end portion of the second bonding wire has a reinforcing structure, and the soldering member bonds the reinforcing structure to the first bonding wire. For example, the reinforcing structure is formed by sintering the ends of the second bonding wires, and the reinforcing structure is a block.

前述之銲線形成方法中,該銲件使該強化結構結合至該第一銲線上。 In the foregoing method of forming a bonding wire, the soldering member bonds the reinforcing structure to the first bonding wire.

前述之銲線形成方法中,該銲線形成方法係為正向結合式或反向結合式。 In the above-described bonding wire forming method, the bonding wire forming method is a forward bonding type or a reverse bonding type.

前述之銲線形成方法中,該接點上形成有支撐結構,以令該強化結構與該支撐結構夾設該第一銲線。 In the foregoing method of forming a bonding wire, a support structure is formed on the contact to allow the reinforcing structure to sandwich the first bonding wire with the supporting structure.

本發明復提供一種打線構造,係包括:一銲線,係具有相對之第一端與第二端;第一接點,係供結合該銲線之第一端;第二接點,係供結合該銲線之第二端;以及強化結構,係形成至該第二接點上以覆蓋於該銲線之第二端上。 The present invention further provides a wire bonding structure, comprising: a bonding wire having opposite first and second ends; a first contact for bonding the first end of the bonding wire; and a second contact for providing Bonding the second end of the bonding wire; and reinforcing the structure to the second contact to cover the second end of the bonding wire.

前述之打線構造中,該銲線之第一端係為球端,且該強化結構係為塊體。例如,該塊體之形狀不同於該球端之形狀;或者,該塊體之形狀相同於該球端之形狀。 In the above-mentioned wire bonding structure, the first end of the bonding wire is a ball end, and the reinforcing structure is a block. For example, the shape of the block is different from the shape of the ball end; or the shape of the block is the same as the shape of the ball end.

前述之打線構造中,該銲線之第二端係為線狀。 In the wire bonding structure described above, the second end of the wire is linear.

前述之打線構造中,該第一接點係設於電子元件上。例如,該電子元件係為主動元件、被動元件或其組合者。 In the wire bonding structure described above, the first contact is provided on the electronic component. For example, the electronic component is an active component, a passive component, or a combination thereof.

前述之打線構造中,該第二接點係設於電子元件上。例如,該電子元件係為導線架、封裝基板、主動元件、被動元件或其組合者。 In the wire bonding structure described above, the second contact is provided on the electronic component. For example, the electronic component is a lead frame, a package substrate, an active component, a passive component, or a combination thereof.

前述之打線構造中,該第一接點之位置與該第二接點之位置等高。 In the above-mentioned wire bonding structure, the position of the first contact is equal to the position of the second contact.

前述之打線構造中,該第一接點之位置與該第二接點之位置具有高度差。 In the above-mentioned wire bonding structure, the position of the first contact has a height difference from the position of the second contact.

前述之打線構造中,該強化結構復形成至該第一接點 上以覆蓋於該銲線之第一端上。 In the foregoing wire bonding structure, the reinforcing structure is further formed to the first contact Upper to cover the first end of the bonding wire.

前述之打線構造中,該第二接點上形成有支撐結構,以令該強化結構與該支撐結構夾設該銲線之第二端。 In the above-mentioned wire bonding structure, the second contact is formed with a supporting structure such that the reinforcing structure and the supporting structure sandwich the second end of the bonding wire.

由上可知,本發明之銲線形成方法及打線構造,係藉由自動控制系統之設計,以當該第一銲線未有效結合至該接點上時,能於不切換為人工檢測模式之情況下,使該銲件重複接點加壓、加溫作業之步驟,直到該第一銲線有效結合至接點上為止,故相較於習知人工方式進行檢測,本發明之銲線形成方式不僅能繼續進行打線製程以維持銲線設備之生產力,且能省時以大幅降低製作成本。 It can be seen from the above that the wire bonding method and the wire bonding structure of the present invention are designed by the automatic control system so that when the first bonding wire is not effectively coupled to the contact, it can be switched to the manual detection mode. In this case, the welding member is repeatedly subjected to the step of pressing and heating the joint until the first bonding wire is effectively bonded to the joint, so that the welding wire is formed according to the conventional manual method. The method not only can continue the wire bonding process to maintain the productivity of the wire bonding equipment, but also saves time and greatly reduces the production cost.

10,20‧‧‧銲件 10,20‧‧‧ Weldments

100,200‧‧‧穿線孔 100,200‧‧‧ threading hole

2,2’,3,3’,7‧‧‧銲線 2,2’,3,3’,7‧‧‧welding line

2a,4a,7a‧‧‧第一端 2a, 4a, 7a‧‧‧ first end

2b,4b,7b‧‧‧第二端 2b, 4b, 7b‧‧‧ second end

3a,5a’‧‧‧線尾 3a, 5a’‧‧‧ end of line

30,40‧‧‧球端 30,40‧‧‧ ball end

4‧‧‧第一銲線 4‧‧‧First wire bond

5,5’‧‧‧第二銲線 5,5’‧‧‧second welding line

5a‧‧‧端部 5a‧‧‧End

50,50’,70‧‧‧強化結構 50,50’,70‧‧‧Strengthened structure

60‧‧‧承載件 60‧‧‧carriers

61‧‧‧第一電子元件 61‧‧‧First electronic component

610‧‧‧第一接點 610‧‧‧First contact

62,62’,62”‧‧‧第二電子元件 62,62’,62”‧‧‧second electronic components

620,620’,620”‧‧‧第二接點 620, 620’, 620” ‧ ‧ second contact

70’‧‧‧支撐結構 70’‧‧‧Support structure

8‧‧‧電子元件 8‧‧‧Electronic components

80‧‧‧電極墊 80‧‧‧electrode pads

80’‧‧‧墊部 80’‧‧‧Pat Department

9‧‧‧承載件 9‧‧‧Carrier

90,90’‧‧‧銲墊 90,90’‧‧· solder pads

A,A’,A”,B,C,D,E,S,R‧‧‧箭頭方向 A, A’, A”, B, C, D, E, S, R‧‧‧ arrow directions

h‧‧‧高度差 H‧‧‧ height difference

第1A圖係為習知打線製程之剖視示意圖;第1B圖係為第1A圖之實際情況;第2A至2F圖係為本發明之銲線形成方法之剖視示意圖;第3及3’圖係為本發明之打線結構之不同態樣之剖視示意圖;以及第4A至4C圖係為本發明之打線結構之其它實施例之剖視示意圖。 1A is a schematic cross-sectional view of a conventional wire bonding process; FIG. 1B is a practical view of FIG. 1A; and FIGS. 2A to 2F are cross-sectional views of a wire bonding method of the present invention; 3 and 3' The drawings are schematic cross-sectional views of different aspects of the wire bonding structure of the present invention; and Figs. 4A to 4C are schematic cross-sectional views showing other embodiments of the wire bonding structure of the present invention.

以下藉由特定的具體實施例說明本發明之實施方式,熟悉此技藝之人士可由本說明書所揭示之內容輕易地瞭解本發明之其他優點及功效。 The other embodiments of the present invention will be readily understood by those skilled in the art from this disclosure.

須知,本說明書所附圖式所繪示之結構、比例、大小 等,均僅用以配合說明書所揭示之內容,以供熟悉此技藝之人士之瞭解與閱讀,並非用以限定本發明可實施之限定條件,故不具技術上之實質意義,任何結構之修飾、比例關係之改變或大小之調整,在不影響本發明所能產生之功效及所能達成之目的下,均應仍落在本發明所揭示之技術內容得能涵蓋之範圍內。同時,本說明書中所引用之如“上”、“下”、“第一”、“第二”、及“一”等之用語,亦僅為便於敘述之明瞭,而非用以限定本發明可實施之範圍,其相對關係之改變或調整,在無實質變更技術內容下,當亦視為本發明可實施之範疇。 It should be noted that the structure, proportion and size depicted in the drawings of this specification And the like, which are used for the understanding and reading of those skilled in the art, and are not intended to limit the implementation of the invention, and thus do not have technical significance, any structural modification, The change of the proportional relationship or the adjustment of the size should be within the scope of the technical content disclosed by the present invention without affecting the effects and the achievable effects of the present invention. In the meantime, the terms "upper", "lower", "first", "second", "one", and the like, are used for convenience of description, and are not intended to limit the present invention. The scope of the invention, the change or adjustment of the relative relationship, is also considered to be within the scope of the invention.

第2A至2F圖係為本發明之銲線形成方法之剖視示意圖。於本實施例中,所述之銲線形成方法係於一設有電子元件8(可視為第一電子元件)之承載件9(可視為第二電子元件)上以銲線設備進行運作,該銲線設備係包括銲件20、一線夾(圖略)與自動控制系統,且該承載件9上具有至少一銲墊90(可視為第二接點)。 2A to 2F are schematic cross-sectional views showing a method of forming a bonding wire of the present invention. In this embodiment, the wire bonding method is performed by a wire bonding device on a carrier 9 (which can be regarded as a second electronic component) provided with an electronic component 8 (which can be regarded as a first electronic component). The wire bonding equipment includes a weldment 20, a clamp (not shown) and an automatic control system, and the carrier 9 has at least one pad 90 (which can be regarded as a second joint).

如第2A圖所示,一第一銲線4係穿過該銲件20之穿線孔200,且一第二銲線5係收納於該穿線孔200中並夾設於該線夾中,而該第一銲線4與該第二銲線5係相連接。接著,利用該銲件20使該第一銲線4形成一球端40於該電子元件8之電極墊80(可視為第一接點)上。待加溫、加壓該球端40以使該球端40固接於該電極墊80上後,再拉伸該第一銲線4至該承載件9之銲墊90上。 As shown in FIG. 2A, a first bonding wire 4 passes through the threading hole 200 of the soldering member 20, and a second bonding wire 5 is received in the threading hole 200 and is sandwiched in the wire clamp. The first bonding wire 4 is connected to the second bonding wire 5 . Then, the first bonding wire 4 is formed by the soldering member 20 to form a ball end 40 on the electrode pad 80 (which can be regarded as a first contact) of the electronic component 8. After the ball end 40 is heated and pressed to fix the ball end 40 to the electrode pad 80, the first bonding wire 4 is stretched onto the pad 90 of the carrier 9.

接著,進行接點加壓、加溫作業,係先使該第一銲線 4結合至該銲墊90上以相互電性連接,再向上移動該銲件20(如箭頭方向A”),欲拉斷該第一銲線4。 Next, performing contact pressurization and heating work, first making the first bonding wire 4 is bonded to the bonding pad 90 to be electrically connected to each other, and then moved to the soldering member 20 (such as the arrow direction A) to break the first bonding wire 4.

於本實施例中,該第一銲線4未有效結合至該銲墊90上,故向上移動該銲件20時,該第一銲線4與第二銲線5未相互分離。因此,需對該第一銲線4進行自動重新接點加壓、加溫作業的工作。 In the embodiment, the first bonding wire 4 is not effectively bonded to the bonding pad 90. Therefore, when the soldering member 20 is moved upward, the first bonding wire 4 and the second bonding wire 5 are not separated from each other. Therefore, the first bonding wire 4 needs to be automatically reattached and heated.

如第2B圖所示,該銲線設備之自動控制系統會自動命令該銲件20將該第一銲線4再次結合至該銲墊90上,即該銲件20朝該承載件9之方向(即向下,如箭頭方向B)移動,以進行接點加壓、加溫作業。 As shown in FIG. 2B, the automatic control system of the wire bonding apparatus automatically commands the weldment 20 to re-bond the first bonding wire 4 to the bonding pad 90, that is, the direction of the weldment 20 toward the carrier 9. (ie, downward, as in the direction of the arrow B) to perform contact pressurization and warming.

於本實施例中,該銲線設備可依需求增設鳴叫裝置,但不影響整體產線之運作,亦即作業員無需將該銲線設備切換為手動模式,因而無需進行檢測。 In the embodiment, the wire bonding device can add a tweet device according to requirements, but does not affect the operation of the overall production line, that is, the operator does not need to switch the wire bonding device to the manual mode, and thus does not need to perform detection.

如第2C圖所示,於該第一銲線4有效結合至銲墊90上後,向上移動該銲件20(如箭頭方向C),以拉斷該第一銲線4,使該第一銲線4與第二銲線5相互分離。 As shown in FIG. 2C, after the first bonding wire 4 is effectively bonded to the bonding pad 90, the soldering member 20 is moved upward (such as the arrow direction C) to break the first bonding wire 4 to make the first wire. The bonding wire 4 and the second bonding wire 5 are separated from each other.

於本實施例中,該第一銲線4之兩端分別結合至該電子元件8之電極墊80與該銲墊90上,且於拉斷該第一銲線4後,該第二銲線5之一端部5a會伸出該銲件20。 In this embodiment, the two ends of the first bonding wire 4 are respectively coupled to the electrode pad 80 of the electronic component 8 and the bonding pad 90, and after the first bonding wire 4 is pulled off, the second bonding wire is One of the ends 5a of the 5 will protrude from the weldment 20.

如第2D圖所示,形成一強化結構50於該第二銲線5上。 As shown in FIG. 2D, a reinforcing structure 50 is formed on the second bonding wire 5.

於本實施例中,以燒結方式於該第二銲線5之端部5a形成該強化結構50,使該強化結構50係為塊體,如球狀。 In the present embodiment, the reinforcing structure 50 is formed on the end portion 5a of the second bonding wire 5 in a sintered manner, so that the reinforcing structure 50 is a block, such as a spherical shape.

如第2E圖所示,將該銲件20朝該承載件9之方向(即 向下,如箭頭方向D)移動,以將該強化結構50結合至該銲墊90與該第一銲線4之結合處,再進行加溫、加壓作業,使該強化結構50將該第一銲線4固壓於該銲墊90上,以達到強化該銲墊90與該第一銲線4之結合的功效。 As shown in FIG. 2E, the weldment 20 is oriented in the direction of the carrier 9 (ie Moving downward, as in the direction of the arrow D), the reinforcing structure 50 is bonded to the junction of the bonding pad 90 and the first bonding wire 4, and then heating and pressurizing work is performed to make the reinforcing structure 50 A bonding wire 4 is fixed on the bonding pad 90 to enhance the bonding of the bonding pad 90 and the first bonding wire 4.

如第2F圖所示,向上移動該銲件20(如箭頭方向E),以分離該強化結構50與該第二銲線5’,使保留於該銲件20上之第二銲線5’產生線尾5a’,且該線尾5a’係伸出該銲件20之下端,以準備進行另一球端加壓作業。 As shown in FIG. 2F, the weldment 20 is moved upward (such as the arrow direction E) to separate the reinforcing structure 50 and the second bonding wire 5' so that the second bonding wire 5' remaining on the welding member 20 is removed. A tail 4a' is produced, and the tail 5a' extends beyond the lower end of the weldment 20 to prepare for another ball end press.

本發明之銲線形成方法,藉由該自動控制系統之設計,以當該第一銲線4未有效結合至該銲墊90上時,能於不切換為人工檢測模式之情況下,使該銲件20重複接點加壓、加溫作業之步驟,直到該第一銲線4有效結合至銲墊90上為止,故相較於習知人工方式進行檢測,本發明之銲線形成方式不僅能繼續進行打線製程以維持銲線設備之生產力,且能省時以大幅降低製作成本。 The wire bonding method of the present invention is designed by the automatic control system so that when the first bonding wire 4 is not effectively bonded to the bonding pad 90, the switching can be performed without switching to the manual detecting mode. The welding member 20 repeats the steps of the joint pressing and warming operation until the first bonding wire 4 is effectively bonded to the bonding pad 90, so that the bonding wire forming method of the present invention is not only compared with the conventional manual method. The wire bonding process can be continued to maintain the productivity of the wire bonding equipment, and the time can be saved to substantially reduce the production cost.

本發明復提供一種打線構造,如第2F及3圖所示,係包括:一銲線2(或第一銲線4)、一第一接點(即墊部80’,如電極墊80)、一第二接點(如銲墊90,90’)以及強化結構50,50’。 The present invention provides a wire bonding structure, as shown in FIGS. 2F and 3, comprising: a bonding wire 2 (or a first bonding wire 4) and a first contact (ie, a pad portion 80' such as an electrode pad 80). A second contact (such as pad 90, 90') and a reinforced structure 50, 50'.

所述之銲線2(或第一銲線4)係具有相對之第一端2a,4a與第二端2b,4b,該銲線2,4之第一端2a,4a係為球端40,而該銲線2(或第一銲線4)之第二端2b,4b係為線狀。 The bonding wire 2 (or the first bonding wire 4) has opposite first ends 2a, 4a and second ends 2b, 4b, and the first ends 2a, 4a of the bonding wires 2, 4 are ball ends 40 And the second ends 2b, 4b of the bonding wire 2 (or the first bonding wire 4) are linear.

所述之第一接點(如電極墊80或墊部80’)係供結合該銲線2(或第一銲線4)之第一端2a,4a。於本實施例中, 該第一接點泛指設於第一電子元件上之外接處,其中,該第一電子元件係為主動元件、被動元件或其組合者,且該主動元件係例如半導體晶片,而該被動元件係例如電阻、電容及電感。 The first contact (e.g., electrode pad 80 or pad portion 80') is for bonding the first ends 2a, 4a of the bonding wire 2 (or the first bonding wire 4). In this embodiment, The first contact generally refers to an external connection on the first electronic component, wherein the first electronic component is an active component, a passive component or a combination thereof, and the active component is, for example, a semiconductor wafer, and the passive component For example, resistors, capacitors, and inductors.

所述之第二接點(如銲墊90,90’)係供結合該銲線2(或第一銲線4)之第二端2b,4b。於本實施例中,該第二接點泛指設於第二電子元件上之外接處,例如,導線架之導腳、封裝基板之接觸墊等之承載件或其它電子元件上之接點等,其中,該電子元件係為主動元件、被動元件或其組合者,且該主動元件係例如半導體晶片,而該被動元件係例如電阻、電容及電感等。 The second contact (e.g., pad 90, 90') is for bonding the second ends 2b, 4b of the bonding wire 2 (or the first bonding wire 4). In this embodiment, the second contact generally refers to an external connection on the second electronic component, for example, a lead of a lead frame, a contact pad of a package substrate, or the like, or a contact on other electronic components. The electronic component is an active component, a passive component, or a combination thereof, and the active component is, for example, a semiconductor wafer, and the passive component is, for example, a resistor, a capacitor, an inductor, or the like.

所述之強化結構50,50’係形成至該第二接點上以覆蓋於該銲線2(或第一銲線4)之第二端2b,4b上,且該強化結構50,50’係為塊體。於一實施例中,該強化結構50之形狀不同於該球端40之形狀;或者,該強化結構50’之形狀相同於該球端40之形狀。 The reinforcing structure 50, 50' is formed on the second contact to cover the second ends 2b, 4b of the bonding wire 2 (or the first bonding wire 4), and the reinforcing structure 50, 50' Is a block. In one embodiment, the shape of the reinforcing structure 50 is different from the shape of the ball end 40; alternatively, the reinforcing structure 50' has the same shape as the ball end 40.

於一實施例中,如第3’圖所示,該強化結構50’復形成至該第一接點(即墊部80’,如電子元件8之電極墊80)上以覆蓋於該銲線2’(或第一銲線4)之第一端2a,4a上。 In an embodiment, as shown in FIG. 3', the reinforcing structure 50' is overlaid onto the first contact (ie, the pad portion 80', such as the electrode pad 80 of the electronic component 8) to cover the bonding wire. The first end 2a, 4a of 2' (or the first bonding wire 4).

因此,所述之強化結構可依需求形成於一銲線之一端或兩端上。 Therefore, the reinforcing structure can be formed on one end or both ends of a bonding wire as needed.

另外,如第4A圖所示,第一電子元件61與第二電子元件62係為晶片並位於同一承載件60上,使該第一接點610之位置與該第二接點620之位置等高,一銲線7之第 一端7a結合至該第一電子元件61之第一接點610上,且該銲線7之第二端7b結合至該第二電子元件62之第二接點620上,而該強化結構70係形成至該第二接點620上以覆蓋於該銲線7之第二端7b上。 In addition, as shown in FIG. 4A, the first electronic component 61 and the second electronic component 62 are wafers and are located on the same carrier 60, such that the position of the first contact 610 and the position of the second contact 620 are equal. High, a weld line 7 One end 7a is coupled to the first contact 610 of the first electronic component 61, and the second end 7b of the bonding wire 7 is coupled to the second contact 620 of the second electronic component 62, and the reinforcing structure 70 is The second contact 620 is formed to cover the second end 7b of the bonding wire 7.

於本實施例中,打線方式係為正向結合(stitch bond),如箭頭方向S,即先將該銲線7之第一端7a結合至該第一接點610上,再將該銲線7之第二端7b結合至該第二接點620上,之後將該強化結構70形成至該第二接點620上。 In this embodiment, the wire bonding method is a forward bond, such as an arrow direction S, that is, the first end 7a of the bonding wire 7 is first bonded to the first contact 610, and then the bonding wire is The second end 7b of the seventh end 7b is bonded to the second contact 620, after which the reinforcing structure 70 is formed onto the second contact 620.

再者,該第二接點620上可形成有支撐結構70’,以令該強化結構70與該支撐結構70’夾設該銲線7之第二端7b。其中,該支撐結構70’之製法可參考該強化結構50之製法。 Furthermore, the second contact 620 can be formed with a supporting structure 70' such that the reinforcing structure 70 and the supporting structure 70' sandwich the second end 7b of the bonding wire 7. The manufacturing method of the supporting structure 70' can refer to the manufacturing method of the reinforcing structure 50.

又,如第4B圖所示,該第一電子元件61與該第二電子元件62’係為晶片並相互堆疊,使該第一接點610之位置與該第二接點620’之位置具有高度差h。 Moreover, as shown in FIG. 4B, the first electronic component 61 and the second electronic component 62' are stacked as a wafer and are stacked on each other such that the position of the first contact 610 and the position of the second contact 620' have The height difference is h.

於另一實施例中,打線方式亦可為反向。具體地,如第4C圖所示,該第一電子元件61係為晶片,且第二電子元件62”係為承載該第一電子元件61之承載件,其中,打線方式係為反向結合(reverse bond),如箭頭方向R,即先將該銲線7之第二端7b結合至該第二電子元件62”之第二接點620”上,再將該銲線7之第一端7a結合至該第一接點610上,之後才將該強化結構70形成至該第二接點620”上(如圖中虛線)。 In another embodiment, the wire bonding method may also be reversed. Specifically, as shown in FIG. 4C, the first electronic component 61 is a wafer, and the second electronic component 62" is a carrier carrying the first electronic component 61, wherein the wire bonding method is reverse bonding ( Reverse bond), as in the direction of the arrow R, first bonding the second end 7b of the bonding wire 7 to the second contact 620" of the second electronic component 62", and then the first end 7a of the bonding wire 7 Bonding to the first contact 610, the reinforcing structure 70 is formed on the second contact 620" (dashed line in the figure).

因此,本發明之銲線形成方法適用於正向結合式及反 向結合式。 Therefore, the wire bonding method of the present invention is suitable for positive combination and reverse To the combination.

綜上所述,本發明之銲線形成方法及打線構造,主要藉由自動化之設計,以當該第一銲線未有效結合至該接點上時,能自動命令該銲件重複接點加壓、加溫作業之步驟,直到該第一銲線有效結合至接點上為止,故本發明不僅能繼續進行打線製程以維持銲線設備之生產力,且能省時以大幅降低製作成本。 In summary, the wire bonding method and the wire bonding structure of the present invention are mainly designed by an automatic design to automatically command the weldment to repeat the joint when the first wire is not effectively bonded to the joint. The steps of pressing and warming up until the first bonding wire is effectively bonded to the joint, the invention can not only continue the wire bonding process to maintain the productivity of the wire bonding equipment, but also save time and greatly reduce the manufacturing cost.

上述實施例係用以例示性說明本發明之原理及其功效,而非用於限制本發明。任何熟習此項技藝之人士均可在不違背本發明之精神及範疇下,對上述實施例進行修改。因此本發明之權利保護範圍,應如後述之申請專利範圍所列。 The above embodiments are intended to illustrate the principles of the invention and its effects, and are not intended to limit the invention. Any of the above-described embodiments may be modified by those skilled in the art without departing from the spirit and scope of the invention. Therefore, the scope of protection of the present invention should be as set forth in the appended claims.

2‧‧‧銲線 2‧‧‧welding line

2a‧‧‧第一端 2a‧‧‧ first end

2b‧‧‧第二端 2b‧‧‧second end

40‧‧‧球端 40‧‧‧ ball end

50’‧‧‧強化結構 50’‧‧‧Strengthen structure

80’‧‧‧墊部 80’‧‧‧Pat Department

90’‧‧‧銲墊 90'‧‧‧ solder pads

Claims (21)

一種銲線形成方法,係包括:提供一具有銲件之銲線設備,該銲件係收納有相連接之第一銲線與第二銲線;將該第一銲線結合至接點上,且當該第一銲線未結合至該接點上時,該銲件會自動將該第一銲線結合至該接點上;形成強化結構於該第二銲線上;以及將該強化結構結合至該接點與該第一銲線之結合處。 A method for forming a bonding wire, comprising: providing a bonding wire device having a welding member, wherein the welding member receives a first bonding wire and a second bonding wire connected; and bonding the first bonding wire to the joint, And when the first bonding wire is not bonded to the contact, the welding member automatically bonds the first bonding wire to the contact; forming a reinforcing structure on the second bonding wire; and combining the reinforcing structure To the junction of the contact and the first bonding wire. 如申請專利範圍第1項所述之銲線形成方法,其中,該接點係設於電子元件上,且該第一銲線之另一端係結合至另一電子元件上。 The bonding wire forming method according to claim 1, wherein the contact is provided on the electronic component, and the other end of the first bonding wire is bonded to the other electronic component. 如申請專利範圍第2項所述之銲線形成方法,其中,該強化結構復結合至該第一銲線之另一端與該另一電子元件之結合處。 The bonding wire forming method of claim 2, wherein the reinforcing structure is coupled to a junction of the other end of the first bonding wire and the other electronic component. 如申請專利範圍第1項所述之銲線形成方法,其中,於該第一銲線結合至該接點上時,該第一與第二銲線相分離。 The bonding wire forming method according to claim 1, wherein the first bonding wire is separated from the second bonding wire when the first bonding wire is bonded to the contact. 如申請專利範圍第1項所述之銲線形成方法,其中,該強化結構係形成於該第二銲線之端部上。 The bonding wire forming method according to claim 1, wherein the reinforcing structure is formed on an end portion of the second bonding wire. 如申請專利範圍第1項所述之銲線形成方法,其中,該強化結構係以燒結該第二銲線之端部而形成者。 The method of forming a bonding wire according to claim 1, wherein the reinforcing structure is formed by sintering an end portion of the second bonding wire. 如申請專利範圍第1項所述之銲線形成方法,其中, 該強化結構係為塊體。 A method of forming a bonding wire according to claim 1, wherein The reinforced structure is a block. 如申請專利範圍第1項所述之銲線形成方法,其中,該銲件使該強化結構結合至該第一銲線上。 The bonding wire forming method according to claim 1, wherein the welding member bonds the reinforcing structure to the first bonding wire. 如申請專利範圍第1項所述之銲線形成方法,其中,該銲線形成方法係為正向結合式或反向結合式。 The method of forming a bonding wire according to claim 1, wherein the bonding wire forming method is a forward bonding type or a reverse bonding type. 如申請專利範圍第1項所述之銲線形成方法,其中,該接點上形成有支撐結構,以令該強化結構與該支撐結構夾設該第一銲線。 The method of forming a bonding wire according to claim 1, wherein a support structure is formed on the joint to cause the reinforcing structure to sandwich the first bonding wire with the supporting structure. 一種打線構造,係包括:一銲線,係具有相對之第一端與第二端;第一接點,係供結合該銲線之第一端,其中,該銲線之第一端係為球端;第二接點,係供結合該銲線之第二端;以及強化結構,係形成至該第二接點上以覆蓋於該銲線之第二端上,其中,該強化結構係為塊體,且該塊體之形狀相同於該球端之形狀。 A wire bonding structure includes: a bonding wire having opposite first and second ends; and a first contact for bonding the first end of the bonding wire, wherein the first end of the bonding wire is a ball end; a second contact for bonding the second end of the bonding wire; and a reinforcing structure formed on the second contact to cover the second end of the bonding wire, wherein the reinforcing structure is It is a block, and the shape of the block is the same as the shape of the ball end. 如申請專利範圍第11項所述之打線構造,其中,該銲線之第二端係為線狀。 The wire bonding structure according to claim 11, wherein the second end of the wire is linear. 如申請專利範圍第11項所述之打線構造,其中,該強化結構係為塊體。 The wire bonding structure according to claim 11, wherein the reinforcing structure is a block. 如申請專利範圍第11項所述之打線構造,其中,該第一接點係設於電子元件上。 The wire bonding structure of claim 11, wherein the first contact is provided on the electronic component. 如申請專利範圍第14項所述之打線構造,其中,該電子元件係為主動元件、被動元件或其組合者。 The wire bonding structure of claim 14, wherein the electronic component is an active component, a passive component, or a combination thereof. 如申請專利範圍第11項所述之打線構造,其中,該第二接點係設於電子元件上。 The wire bonding structure of claim 11, wherein the second contact is provided on the electronic component. 如申請專利範圍第16項所述之打線構造,其中,該電子元件係為導線架、封裝基板、主動元件、被動元件或其組合者。 The wire bonding structure of claim 16, wherein the electronic component is a lead frame, a package substrate, an active component, a passive component, or a combination thereof. 如申請專利範圍第11項所述之打線構造,其中,該第一接點之位置與該第二接點之位置等高。 The wire bonding structure of claim 11, wherein the position of the first contact is equal to the position of the second contact. 如申請專利範圍第11項所述之打線構造,其中,該第一接點之位置與該第二接點之位置具有高度差。 The wire bonding structure of claim 11, wherein the position of the first contact has a height difference from the position of the second contact. 如申請專利範圍第11項所述之打線構造,其中,該強化結構復形成至該第一接點上以覆蓋於該銲線之第一端上。 The wire bonding structure of claim 11, wherein the reinforcing structure is formed over the first contact to cover the first end of the bonding wire. 如申請專利範圍第11項所述之打線構造,其中,該第二接點上形成有支撐結構,以令該強化結構與該支撐結構夾設該銲線之第二端。 The wire bonding structure of claim 11, wherein the second contact is formed with a supporting structure such that the reinforcing structure and the supporting structure sandwich the second end of the bonding wire.
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Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW542989B (en) * 2000-05-04 2003-07-21 Texas Instruments Inc System and method to reduce bond program errors of integrated circuit bonders
TW200414383A (en) * 2002-11-21 2004-08-01 Kaijo Kk Wire loop, semiconductor device having same, wire bonding method and wire bonding apparatus
TW200518248A (en) * 2003-11-17 2005-06-01 Siliconware Precision Industries Co Ltd Method for enhancing bonding reliability of wire bonding process
TW200629445A (en) * 2004-11-05 2006-08-16 Kaijo Kk Wire bonding apparatus
TW201209947A (en) * 2006-07-27 2012-03-01 Fujitsu Semiconductor Ltd Semiconductor device

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100548008B1 (en) * 2004-05-20 2006-02-01 삼성테크윈 주식회사 Automatic ball forming method of wire bonding equipment
JP4530975B2 (en) * 2005-11-14 2010-08-25 株式会社新川 Wire bonding method
JP2008117888A (en) * 2006-11-02 2008-05-22 Rohm Co Ltd Electronic component and wire bonding method
JP4228024B1 (en) * 2007-12-07 2009-02-25 株式会社新川 Wire bonding apparatus and wire bonding method

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW542989B (en) * 2000-05-04 2003-07-21 Texas Instruments Inc System and method to reduce bond program errors of integrated circuit bonders
TW200414383A (en) * 2002-11-21 2004-08-01 Kaijo Kk Wire loop, semiconductor device having same, wire bonding method and wire bonding apparatus
TW200518248A (en) * 2003-11-17 2005-06-01 Siliconware Precision Industries Co Ltd Method for enhancing bonding reliability of wire bonding process
TW200629445A (en) * 2004-11-05 2006-08-16 Kaijo Kk Wire bonding apparatus
TW201209947A (en) * 2006-07-27 2012-03-01 Fujitsu Semiconductor Ltd Semiconductor device

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