TWI434043B - Probe structure - Google Patents

Description

Probe structure

The present invention relates to a probe structure, and more particularly to a probe structure to which a thermistor can be added.

Many electronic products and electronic components will have a temperature rise when they are used. In addition to the possibility of lowering the temperature, the temperature rise is more likely to cause safety problems. For example, a lithium-cobalt battery is a typical example.

Therefore, when such electronic products and electronic components are electrically tested, it is usually necessary to measure the temperature of the object to be measured simultaneously. As shown in the first figure, the first figure is a conventional technique for detecting electrical tests. A schematic diagram of the temperature measurement system. When the test object 100 is to be electrically tested, the probe 21 is used to contact the positive electrode of the object to be tested 100. Generally, the probe 21 is coupled to the circuit board 22 by the needle sleeve 211, and the probe 21 itself is A simple metal probe; at the same time, in order to form a circuit for electrical testing, the probe 23 fixed to the circuit board 24 must also be in contact with the negative electrode of the object to be tested 100; in addition, the conventional technique is A thermistor 25 is disposed on the circuit board 22 to measure a change in temperature of the object 100 to be tested.

However, the setting position of the thermistor 25 is too far from the object to be tested 100, and the measured temperature is also quite different from the actual temperature of the object to be tested 100. Please refer to the second figure, the second picture is A time-temperature diagram of the temperature of the analyte and the temperature measured by the thermistor. Curve S1 is the object to be tested 100 The actual temperature change, the curve S2 is the ambient temperature change measured by the thermistor 25, it can be clearly found that when the object to be tested 100 is in operation, the temperature will rise rapidly and reach the temperature at time T1. H1, however, the thermistor 25 is too far away from the object to be tested 100, and most of the heat is conducted by air, so only the lower temperature H2 is measured by the energy, and the thermistor 25 is to be measured. To the temperature H1, it is necessary to wait until the time T2 after a long time.

Since the thermistor 25 is disposed above the circuit board 25, the temperature measured by the thermistor 25 is substantially different from the actual temperature of the object to be tested 100. Such a situation may cause the object 100 to be safely removed. The operating temperature range, however, is not known to the tester and is therefore dangerous.

Therefore, the main object of the present invention is to provide a probe structure to which a thermistor can be added, so that the thermistor can be disposed adjacent to the object to be tested, and the heat generated by the object to be tested can simultaneously pass through the probe and The air is conducted to the thermistor, enabling the thermistor to measure the temperature of the object to be tested more quickly and accurately.

A probe structure comprising a needle shaft, an insulating layer and a needle, wherein the needle shaft is made of a conductor material; the insulating layer covers the needle shaft; the needle is made of a conductor material, and the insulating layer is covered to be convex It is provided at one end of the needle shaft.

In a preferred embodiment of the present invention, the probe structure further includes a circuit board And a thermistor, the circuit board is disposed adjacent to the needle; the thermistor is disposed on the circuit board, and the two electrode contacts of the thermistor are electrically connected to the needle shaft through the circuit board The needle.

The invention further discloses a method for manufacturing a probe, the manufacturing method comprising the steps of: preparing a needle shaft of a conductor material; sleeve an insulating layer on the needle shaft; and sleeve a needle on the insulating layer, thereby The needle is protruded from one end of the needle shaft.

In a preferred embodiment of the present invention, the side wall of the needle shaft has an annular groove, and the insulating layer and the needle are covered outside the annular groove, and the manufacturing method further includes The needle is subjected to a rolling press process with respect to the position of the annular groove.

The probe structure of the present invention can set the thermistor adjacent to the object to be tested by changing the structure of the probe compared to the conventional method of measuring the temperature of the object to be tested in the electrical test, and is to be tested. The heat generated by the object can be simultaneously transmitted to the thermistor through the probe and the air, so that the thermistor can measure the temperature of the object to be tested more quickly and accurately to maintain the safety during the electrical test.

The specific embodiments of the present invention will be further described by the following examples and drawings.

The invention relates to a probe structure, in particular to a thermosensitive electric device Blocked probe structure. The invention is illustrated by the following description of the preferred embodiments of the invention, and is not intended to limit the invention. The contents of this preferred embodiment are detailed below.

Please refer to the third and fourth figures. The third figure is a schematic cross-sectional view of the probe structure of the present invention, and the fourth figure is a schematic diagram of the actual use of the probe of the present invention. The probe of the present invention comprises a needle shaft 31, an insulating layer 32 and a needle 33. The needle shaft 31 is made of a conductor material, the insulating layer 32 covers the needle shaft 31, and the needle 33 is made of a conductor material. The insulating layer 32 is protruded from one end of the needle shaft 31. The insulating layer 32 may be made of an insulating material such as Teflon and plastic.

In use, the probe can be coupled to the thermistor 34. The thermistor 34 has a two-electrode contact, and the two-electrode contact is electrically connected to the needle shaft 31 and the needle 33, respectively. The probe can have a uniform standard. In a preferred embodiment of the present invention, the probe may further include a circuit board 35, wherein the circuit board 35 is disposed adjacent to the needle 33, and the thermistor 34 is disposed on the The circuit board 35 and the two electrode contacts of the thermistor 34 are electrically connected to the needle shaft 31 and the needle 33 respectively through the circuit board 35; since the circuit board 35 can accurately utilize the soldering point in the manufacturing process The 341 and the solder joint 342 are soldered to the needle shaft 31 and the needle 33, so that the distance between the thermistor 34 and the needle 33 can be kept within a certain range.

In addition, the probe may further include a needle sleeve 36 and an elastic member 37. The needle sleeve 36 is a hollow sleeve for being sleeved on one end of the needle shaft 31 with respect to the needle shaft 33. The elastic member 37 is disposed on the needle sleeve. 36 internal, to separate The needle sleeve 36 is connected to the needle shaft 31.

In use, the needle sleeve 36 is fixed to the circuit board 41. The needle 33 is electrically connected to the positive electrode of the object to be tested 100, and contacts the negative electrode of the object to be tested 100 by a general probe 42 fixed to the circuit board 43. In this way, the thermistor 34 can form a loop, and even if the shape of the object to be tested 100 is changed, the elastic member 37 can be used for the expansion and contraction movement of the needle shaft 31, and the thermistor 34 is coupled with the needle shaft 31. Therefore, the distance from the object to be tested 100 does not change.

In summary, the probe structure of the present invention can set the thermistor 34 adjacent to the test by changing the structure of the probe compared to the conventional method of measuring the temperature of the test object 100 at the same time as the electrical test. At the object 100, and the heat generated by the object to be tested 100 can be simultaneously transmitted to the thermistor 34 through the probe and the air, so that the thermistor 34 can more quickly and accurately measure the temperature of the object to be tested 100 to maintain Safety during electrical testing.

The invention also discloses a method for manufacturing a probe, the manufacturing method comprising the steps of: preparing a needle shaft 31 of a conductor material; sleeve an insulating layer 32 on the needle shaft 31; and sleeve a needle 33 on the insulation The layer 32 is such that the needle 33 protrudes from one end of the needle shaft 31.

Please refer to the fifth and sixth figures. The fifth figure is the probe without the rolling process, and the sixth picture is the probe after the rolling process. In the preferred embodiment of the present invention, the side wall of the needle shaft 31 may further have an annular groove 311, and the insulating layer 32 and the needle 33 are both wrapped around the annular groove 311, and the The manufacturing method may further include applying an external force F to the position of the needle 33 relative to the annular groove 311 to perform a rolling process, and rolling The probe of the process, the appearance of the needle 33, can observe the annular groove 331.

The features and spirit of the present invention will be more apparent from the detailed description of the preferred embodiments. On the contrary, the intention is to cover various modifications and equivalents within the scope of the invention as claimed.

100‧‧‧Test object

21‧‧‧ probe

211‧‧‧ needle sets

22‧‧‧ Circuit board

23‧‧‧ probe

24‧‧‧ boards

25‧‧‧Thermistor

31‧‧‧ Needle shaft

311‧‧‧ annular groove

32‧‧‧Insulation

33‧‧‧ needle

331‧‧‧ annular groove

34‧‧‧Thermistor

341‧‧‧ solder joints

342‧‧‧ solder joints

35‧‧‧ boards

36‧‧‧ needle sets

37‧‧‧Flexible components

41‧‧‧ boards

42‧‧‧Probe

43‧‧‧ boards

S1‧‧‧ Curve

S2‧‧‧ Curve

T1‧‧‧ time

T2‧‧‧ time

H1‧‧‧temperature

H2‧‧‧ temperature

F‧‧‧External force

The first figure is a schematic diagram of the system for detecting temperature during electrical testing; the second picture is a time-temperature diagram of the temperature of the object to be tested and the temperature measured by the thermistor; Schematic diagram of the probe structure of the invention; the fourth diagram is a schematic diagram of the actual use of the probe of the present invention; the fifth diagram is the probe without the rolling process; and the sixth diagram is the probe after the rolling process .

31‧‧‧ Needle shaft

32‧‧‧Insulation

33‧‧‧ needle

34‧‧‧Thermistor

341‧‧‧ solder joints

342‧‧‧ solder joints

35‧‧‧ boards

Claims (4)

A probe structure comprising: a needle shaft formed by a conductor material; an insulating layer covering the needle shaft; a needle formed by a conductor material and covering the insulating layer to protrude At one end of the needle shaft; a circuit board disposed adjacent to the needle; and a thermistor disposed on the circuit board, and the two electrode contacts of the thermistor are respectively electrically connected through the circuit board Sexually coupled to the needle shaft and the needle. The probe structure of claim 1, wherein the insulating layer is composed of at least one of a Teflon and a plastic. The probe structure of claim 1, further comprising: a needle sleeve configured to be sleeved on the needle shaft with respect to one end of the needle; and an elastic member disposed on The inside of the needle sleeve is respectively abutted against the needle sleeve and the needle shaft. The probe structure of claim 1, wherein the elastic member is a spring.