TWI412750B - Probe circuit - Google Patents

Abstract

A probe electric circuit is used for measuring a charged object under testing. The first electrode of the charged object under testing is coupled to reference grounding. The probe electric circuit comprises a probe, a dividing resistor and a voltage detector. The probe comprises a probe rod, an insulating layer covering the probe rod, a probe pin covering the insulating layer, and a thermistor. The probe pin is used to electrically couple to the second electrode of the charged object under testing. The thermistor is electrically coupled to the probe rod and the probe pin. The dividing resistor is electrically coupled between the probe rod and one reference voltage source. The voltage detector is used to measure the dividing voltage between the dividing resistor and the probe rod.

Description

Probe circuit

The present invention relates to a probe circuit, and more particularly to a measurement circuit having a probe of a thermistor.

Many electronic products and electronic components will have a temperature rise when they are used. In addition to the possibility of lowering the temperature, the temperature rise is more likely to cause safety problems. For example, a lithium-cobalt battery is a typical example.

Therefore, when conducting electrical tests on such electronic products and electronic components, it is usually necessary to measure the temperature of the object to be measured simultaneously. Please refer to the first figure and the second figure. The first figure is a conventional technique for electrical properties. A schematic diagram of the system for detecting temperature during testing, and the second diagram is a schematic diagram of a circuit for sensing temperature using conventional techniques. When the electrical test object 100 is to be electrically tested, the probe 21 is used to contact the positive electrode of the charged test object 100. Generally, the probe 21 is coupled to the circuit board 22 by the needle sleeve 211, and The probe 21 itself is a simple metal probe; at the same time, in order to constitute a circuit for electrical testing, the probe 23 fixed to the circuit board 24 must also be in contact with the negative electrode of the charged test object 100.

In addition, the conventional technique is to measure the temperature change of the charged test object 100 by setting the thermistor 25 on the circuit board 22, so that the thermistor 25 forms a loop and performs temperature. Measurements, then a reference voltage source 26, a voltage dividing resistor 27, a voltage sensor 29, and a ground terminal 28 must be planned on the circuit board 22 to form a circuit as shown in the second figure.

However, the setting position of the thermistor 25 in the measuring method is too far from the charging object 100, and the measured temperature is quite different from the actual temperature of the charging object 100. Referring to the third figure, the third figure is a time-temperature diagram of the temperature of the object to be tested and the temperature measured by the thermistor. The curve S1 is the actual temperature change of the charged test object 100, and the curve S2 is the change of the ambient temperature measured by the thermistor 25. It can be clearly found that when the charged test object 100 is in the working state, the temperature will be Rapid rise, and reach temperature H1 at time T1, but at this time the thermistor 25 is too far away from the charged object to be tested 100, and most of the heat is conducted by air, so only energy is measured. At a lower temperature H2, if the thermistor 25 measures the temperature H1, it must wait for a time T2 after a long time.

In addition, when performing electrical measurement, the circuit board 24 has a planned grounding end, and the temperature measuring circuit of the prior art separately forms a circuit on the circuit board 22, which is equivalent to waste of resources, and at the same time increases manufacturing cost. .

Accordingly, the main object of the present invention is to provide a measuring circuit for a probe having a thermistor such that the thermistor can be disposed adjacent to the charged object to be tested, and the heat generated by the charged object to be tested is generated. The probe and air can be simultaneously transmitted to the thermistor, so that the thermistor can measure the temperature of the charged test object more quickly and accurately. Moreover, the measurement circuit is planned when using the electrical test. Refer to grounding to avoid planning additional reference grounding.

A probe circuit is used for measuring a charged object to be tested. One of the first electrodes of the charged object is coupled to a reference ground, and the probe circuit includes a probe, a voltage dividing resistor and a voltage. Detector. The probe system includes a needle shaft, an insulating layer, a needle and a thermistor, the needle shaft is made of a conductor material, and the insulating layer covers the needle shaft; the needle is made of a conductor material and covers the insulating layer to a second electrode disposed on one end of the needle shaft and electrically coupled to the second electrode of the charged object; the thermistor has two electrode contacts, and the two electrode contacts are electrically coupled to the second electrode The needle shaft is with the needle. The voltage dividing resistor is electrically coupled between the needle shaft and a reference voltage source. The voltage detector is configured to measure a divided voltage between the voltage dividing resistor and the needle shaft.

In a preferred embodiment of the present invention, the probe further includes a circuit board disposed adjacent to the needle, and the thermistor is disposed on the circuit board to transmit through the circuit board. The two electrode contacts of the thermistor are electrically connected to the needle shaft and the needle, respectively.

In a preferred embodiment of the present invention, the probe circuit further includes a dial that is vertically coupled to the dial, and the voltage dividing resistor is disposed on the dial.

In a preferred embodiment of the present invention, the probe further includes a needle sleeve and an elastic member. The needle sleeve is a hollow sleeve that is vertically fixed to the dial to thereby sleeve the needle shaft relative to the needle. One end; an elastic member is disposed inside the needle sleeve to abut the needle sleeve and the needle shaft, respectively.

In a preferred embodiment of the present invention, the probe circuit further includes a processor coupled to the voltage detector for receiving the voltage detector to measure the output of the divided voltage. Dividing the voltage value, and calculating the voltage value according to the voltage, a voltage value of the object to be tested, a reference voltage value of the reference voltage source, and a voltage dividing resistance value of the voltage dividing resistor The thermistor value of the thermistor; in addition, the processor can further store a resistance-temperature comparison table of the thermistor, and obtain a one from the resistance-temperature comparison table according to the thermistor value. Ambient temperature.

Compared with the conventional method for measuring the temperature of the object to be tested simultaneously in the electrical test, the probe circuit of the present invention can place the thermistor adjacent to the charged object to be tested, and the charged object is generated. The heat can be transmitted to the thermistor through the probe and the air at the same time, so that the thermistor can measure the temperature of the charged test object more quickly and accurately to maintain the safety during the electrical test.

In addition, the probe circuit of the present invention utilizes the charged test object and the reference grounding planned during the electrical test to form a loop, so that the reference grounding is not required to be additionally planned, and the cost-saving effect can also be achieved.

The specific embodiments of the present invention will be further described by the following examples and drawings.

The present invention relates to a probe circuit, and more particularly to a measurement circuit having a probe of a thermistor. The invention is illustrated by the following description of the preferred embodiments of the invention, and is not intended to limit the invention. The contents of this preferred embodiment are detailed below.

Please refer to the fourth, fifth and sixth figures. The fourth figure is a schematic cross-sectional view of the probe used in the present invention, and the fifth figure is a schematic diagram of the practical application of the probe circuit of the present invention, and the sixth figure is A schematic diagram of the probe circuit of the present invention. The probe circuit of the present invention is used for measuring a charged object to be tested 100. One of the first electrodes (negative electrodes) of the charged test object 100 is coupled to a reference ground, and the probe circuit includes The probe 300, the voltage dividing resistor 41, and the voltage detector 43; wherein, in practical applications, the probe 45 disposed on the dial 46 contacts the first electrode of the charged test object 100 to be coupled to The reference on the dial 46 is grounded.

The probe 300 includes a needle shaft 31, an insulating layer 32, a needle 33 and a thermistor 34. The needle shaft 31 is made of a conductor material; the insulating layer 32 covers the needle shaft 31, in the preferred embodiment of the present invention. The insulating layer 32 may be composed of Teflon or plastic. The needle 33 is made of a conductor material and is covered with the insulating layer 32 to protrude from one end of the needle shaft 31 for electrical coupling. The second electrode (positive electrode) of the charged object 100; the thermistor 34 has two electrode contacts, and the two electrode contacts are electrically coupled to the needle shaft 31 and the needle 33; In the preferred embodiment of the present invention, the probe 300 further includes a circuit board 35 disposed adjacent to the needle 33, and the thermistor 34 is disposed on the circuit board 35 to The two electrode contacts of the thermistor 34 are electrically connected to the needle shaft 31 and the needle 33 through the soldering points 341 and 342 of the circuit board 35, respectively.

In a preferred embodiment of the present invention, the probe circuit may further include a dial 44 that is vertically coupled to the dial 44, and the voltage dividing resistor 41 is disposed on the needle. The disc 44 further includes a needle sleeve 36 and an elastic member 37. The needle sleeve 36 is a hollow sleeve that is vertically fixed to the dial 44 so as to sleeve the needle shaft 31 with respect to one end of the needle 33. The elastic member 37 is disposed inside the needle sleeve 36 to abut against the needle sleeve 36 and the needle shaft 31 respectively, so that the needle shaft 31 can be vertically moved relative to the dial 44.

The voltage dividing resistor 41 is electrically coupled between the needle shaft 31 and a reference voltage source 42. The voltage detector 43 is configured to measure a voltage divider between the voltage dividing resistor 41 and the needle shaft 31. In a preferred embodiment of the invention, the voltage detector 43 can be an analog converter. Or a comparison circuit.

In a preferred embodiment of the present invention, the probe circuit further includes a processor 47 coupled to the voltage detector 43 for receiving the voltage detector 43 to measure the voltage division. And dividing the voltage value by one of the voltage, and according to the voltage dividing voltage value, the voltage of the object to be tested 100, the reference voltage value of the reference voltage source 42 and the voltage dividing resistor 41 The temperature-resistance value of the thermistor 34 is calculated by a voltage-dividing resistor value; in addition, the processor 47 can pre-store a resistance-temperature comparison table of the thermistor 34, and according to the thermistor value, An ambient temperature is obtained in the resistance-temperature comparison table, which represents the ambient temperature of the charged test object 100.

Since the dial 44 can be simultaneously provided with the probe 300 in the probe circuit of the present invention and the conventional probe used for electrical testing in the prior art, the voltage value of the object to be tested of the charged test object 100 can be electrically The sex test shows that, of course, the specification of the charged object 100 can also be used as a reference.

In summary, the probe circuit of the present invention can set the thermistor 34 adjacent to the charged object 100 in a manner similar to the conventional method of measuring the temperature of the object to be tested simultaneously with the electrical test, and The heat generated by the charged test object 100 can be simultaneously transmitted to the thermistor 34 through the probe and the air, so that the thermistor 34 can more quickly and accurately measure the temperature of the charged test object 100 to maintain electrical properties. Security during testing.

In addition, the probe circuit of the present invention utilizes the charged test object 100 and the reference ground planned in the electrical test to form a loop, so that it is not necessary to additionally plan the reference ground on the dial 44, and the saving can be achieved. The cost of the effect.

The features and spirit of the present invention will be more apparent from the detailed description of the preferred embodiments. On the contrary, the intention is to cover various modifications and equivalents within the scope of the invention as claimed.

100. . . Charged test object

twenty one. . . Probe

211. . . Needle sleeve

twenty two. . . Circuit board

twenty three. . . Probe

twenty four. . . Circuit board

25. . . Thermistor

26. . . Reference voltage source

27. . . Voltage divider resistor

28. . . Ground terminal

29. . . Voltage sensor

300. . . Probe

31. . . Needle shaft

32. . . Insulation

33. . . Needle

34. . . Thermistor

341, 342. . . Solder joint

35. . . Circuit board

36. . . Needle sleeve

37. . . Elastic component

41. . . Voltage divider resistor

42. . . Reference voltage source

43. . . Voltage detector

44. . . Dial

45. . . Probe

46. . . Dial

47. . . processor

S1. . . curve

S2. . . curve

T1. . . time

T2. . . time

H1. . . temperature

H2. . . temperature

The first figure is a schematic diagram of a system for detecting temperature during electrical testing by conventional techniques;

The second diagram is a schematic diagram of a circuit for sensing temperature using conventional techniques;

The third figure is a time-temperature diagram of the temperature of the object to be tested and the temperature measured by the thermistor;

The fourth figure is a schematic cross-sectional view of a probe utilized in the present invention;

The fifth figure is a schematic diagram of the practical application of the probe circuit of the present invention;

The sixth drawing is a schematic diagram of the probe circuit of the present invention.

100. . . Charged test object

300. . . Probe

34. . . Thermistor

41. . . Voltage divider resistor

42. . . Reference voltage source

43. . . Voltage detector

47. . . processor

Claims (7)

A probe circuit for measuring a charged object to be tested, wherein the first electrode of the charged object is coupled to a reference ground, and the probe circuit comprises: a probe, including a needle shaft is composed of a conductor material; an insulating layer covers the needle shaft; a needle is formed of a conductor material, and the insulating layer is covered to protrude from one end of the needle shaft, And a second electrode for electrically coupling the one of the charged test objects; and a thermistor having a two-electrode contact, wherein the two-electrode contact is electrically coupled to the pin a shaft and the needle; a voltage dividing resistor is electrically coupled between the needle shaft and a reference voltage source; and a voltage detector is configured to measure the voltage dividing resistor and the needle shaft Voltage. The probe circuit of claim 1, wherein the probe further comprises a circuit board disposed adjacent to the needle, and the thermistor is disposed on the circuit board to transmit The circuit board electrically connects the two electrode contacts of the thermistor to the needle shaft and the needle. The probe circuit of claim 1, further comprising a dial that is vertically coupled to the dial, the voltage dividing resistor being disposed on the dial. The probe circuit of claim 3, wherein the probe further comprises: a needle sleeve, which is a hollow sleeve fixed vertically to the dial, so as to sleeve the needle shaft relative to the needle One end; and an elastic member disposed inside the needle sleeve to abut the needle sleeve and the needle shaft, respectively. The probe circuit of claim 1, wherein the voltage detector is one of an analog-to-digital converter and a comparison circuit. The probe circuit of claim 1, further comprising a processor coupled to the voltage detector for receiving the voltage detector to measure the output of the divided voltage Dividing the voltage value, and calculating the voltage value according to the voltage, a voltage value of the object to be tested, a reference voltage value of the reference voltage source, and a voltage dividing resistance value of the voltage dividing resistor One of the thermistor thermistor values. The probe circuit of claim 6, wherein the processor further stores a resistance-temperature comparison table of the thermistor, and obtains a resistance from the resistance-temperature comparison table according to the thermistor value. Ambient temperature.