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TWI419461B - Instrumentation amplifier - Google Patents

Instrumentation amplifier Download PDF

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Publication number
TWI419461B
TWI419461B TW99132506A TW99132506A TWI419461B TW I419461 B TWI419461 B TW I419461B TW 99132506 A TW99132506 A TW 99132506A TW 99132506 A TW99132506 A TW 99132506A TW I419461 B TWI419461 B TW I419461B
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Taiwan
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electrically connected
inverter
amplifier
resistor
gate
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TW99132506A
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Chinese (zh)
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TW201214950A (en
Inventor
Chua Chin Wang
Kian-Siong Lim
Yi Jie Hsieh
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Univ Nat Sun Yat Sen
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Priority to TW99132506A priority Critical patent/TWI419461B/en
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Publication of TWI419461B publication Critical patent/TWI419461B/en

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Description

儀表放大器Instrumentation amplifier

  本發明係有關於一種儀表放大器,特別係有關於一種可提供CMRR自我校正功能之儀表放大器。
The present invention relates to an instrumentation amplifier, and more particularly to an instrumentation amplifier that provides a CMRR self-correcting function.

  習知可自動校正CMRR之儀表放大器70,請參閱第10圖所示,該儀表放大器70係具有一可程式化類比介面71、一電性連接該可程式化類比介面71之類比/數位調變器72、一電性連接該類比/數位調變器72之數位控制平台73以及至少一電性連接該數位控制平台73之數位/類比轉換器74,習知儀表放大器70係可以數位方式進行CMRR之自動校正,惟使用數位方式達成CMRR自動校正將使得晶片之佈線面積大幅增加,連帶導致成本的浪費。
The instrumentation amplifier 70 of the CMRR can be automatically corrected. Referring to FIG. 10, the instrumentation amplifier 70 has a programmable analog interface 71 and an analog/digital modulation electrically connected to the programmable analog interface 71. The device 72 is electrically connected to the digital control platform 73 of the analog/digital modulator 72 and at least one digital/analog converter 74 electrically connected to the digital control platform 73. The conventional instrumentation amplifier 70 can perform CMRR in a digital manner. Automatic correction, but the use of digital way to achieve CMRR automatic correction will greatly increase the wiring area of the chip, which will lead to cost waste.

  本發明之主要目的係在於提供一種儀表放大器,其係包含一前級放大器、一電性連接該前級放大器之後級放大器、一電性連接該前級放大器之電阻自動搜尋與選擇電路、一電性連接該電阻自動搜尋與選擇電路及該後級放大器之峰對峰偵測器以及一電性連接該自動搜尋與選擇電路及峰對峰偵測器之時序控制電路,該前級放大器係具有一第一修正訊號端、一第二修正訊號端及一參考訊號端,該時序控制電路係具有一時脈訊號接收端及一數位訊號接收端,該數位訊號接收端係電性連接該電阻自動搜尋與選擇電路,本發明係藉由該峰對峰偵測器偵測來自該後級放大器之弦波峰對峰值,並使該電阻自動搜尋與選擇電路針對弦波峰對峰值進行取樣與比對,進而校正該前級放大器,使得該儀表放大器可找出最佳之CMRR值。
The main object of the present invention is to provide an instrumentation amplifier comprising a preamplifier, a preamplifier electrically connected to the preamplifier, a resistor automatic search and selection circuit electrically connected to the preamplifier, and an electric The peak-to-peak detector of the resistor automatic search and selection circuit and the post-amplifier, and a timing control circuit electrically connected to the automatic search and selection circuit and the peak-to-peak detector, the preamplifier has a first modified signal terminal, a second modified signal terminal and a reference signal terminal, the timing control circuit has a clock signal receiving end and a digital signal receiving end, wherein the digital signal receiving end is electrically connected to the resistor for automatic searching And the selection circuit, the invention detects the peak-to-peak value of the chord peak from the post-stage amplifier by the peak-to-peak detector, and causes the resistance automatic search and selection circuit to sample and compare the peak value of the chord peak, and then The preamplifier is calibrated so that the instrumentation amplifier can find the best CMRR value.

  請參閱第1圖,其係本發明之第一較佳實施例,一種儀表放大器100係包含一前級放大器10、一電性連接該前級放大器10之後級放大器20、一電性連接該前級放大器10之電阻自動搜尋與選擇電路30、一電性連接該電阻自動搜尋與選擇電路30及該後級放大器20之峰對峰偵測器40以及一電性連接該自動搜尋與選擇電路30及峰對峰偵測器40之時序控制電路50,該前級放大器10係具有一第一修正訊號端11、一第二修正訊號端12及一參考訊號端13,該時序控制電路50係具有一時脈訊號接收端51及一數位訊號接收端52,該數位訊號接收端52係電性連接該電阻自動搜尋與選擇電路30。Referring to FIG. 1 , which is a first preferred embodiment of the present invention, an instrumentation amplifier 100 includes a preamplifier 10 , an electrical amplifier connected to the preamplifier 10 , and an electrical amplifier connected to the front stage. The resistance automatic search and selection circuit 30 of the stage amplifier 10 is electrically connected to the resistance automatic search and selection circuit 30 and the peak-to-peak detector 40 of the post-stage amplifier 20, and is electrically connected to the automatic search and selection circuit 30. And the timing control circuit 50 of the peak-to-peak detector 40, the preamplifier 10 has a first modified signal terminal 11, a second modified signal terminal 12 and a reference signal terminal 13, and the timing control circuit 50 has The one-time signal receiving end 51 and the one-digit signal receiving end 52 are electrically connected to the resistance automatic search and selection circuit 30.

  請參閱第2圖,該第一修正訊號端11及該第二修正訊號端12係可分別接收一第一修正訊號及一第二修正訊號,該前級放大器10可將該第一修正訊號及該第二修正訊號進行訊號放大,在本實施例中,該前級放大器10係包含一第一反向放大器11及一第二反向放大器12,該第一反向放大器11係包含一第一運算放大器141、一第一電阻142及一第二電阻143,該第一運算放大器141係具有一第一正極端144、一第一負極端145及一第一輸出端146,該第一電阻142及該第二電阻143之ㄧ端係電性連接該第一負極端145,該第二電阻143之另一端係電性連接該第一輸出端146,該第二反向放大器15係包含一第二運算放大器151、一第三電阻152及一可變電阻153,該第二運算放大器151係具有一第二正極端154、一第二負極端155及一第二輸出端156,該可變電阻153、該第一運算放大器141之該第一輸出端146及該第三電阻152之ㄧ端係電性連接該第二負極端155,該第二電阻143之另一端係電性連接該第二輸出端156,在本實施例中,該前級放大器10係另具有一第四電阻16,該第二反向放大器12係藉由該第四電阻16而電性連接該第一反向放大器11,請再參閱第2圖,該可變電阻153係包含一第五電阻153a及複數個彼此串連之第六電阻153b及複數個電晶體開關153c,該第五電阻153a係電性連接該第六電阻153b,各該第六電阻153b係電性連接各該電晶體開關153c,各該電晶體開關153c係可藉由導通與否來控制各該第六電阻153b之電阻值變化,請參閱第3圖,該後級放大器20係可為一第三反向放大器,該後級放大器20係用以將該前級放大器10之共模訊號進行放大,以使後端電路便於作偵測與處理動作。Referring to FIG. 2, the first modified signal end 11 and the second modified signal end 12 respectively receive a first modified signal and a second modified signal, and the preamplifier 10 can use the first modified signal and The second correction signal is subjected to signal amplification. In the embodiment, the preamplifier 10 includes a first inverting amplifier 11 and a second inverting amplifier 12, and the first inverting amplifier 11 includes a first An operational amplifier 141, a first resistor 142 and a second resistor 143, the first operational amplifier 141 has a first positive terminal 144, a first negative terminal 145 and a first output 146. The first resistor 142 The second resistor 143 is electrically connected to the first negative terminal 145, and the other end of the second resistor 143 is electrically connected to the first output terminal 146. The second inverting amplifier 15 includes a first The second operational amplifier 151 has a second positive terminal 154, a second negative terminal 155 and a second output 156. The variable resistor 151 has a second resistor 151 and a second output 156. 153. The first output of the first operational amplifier 141 146 and the third resistor 152 are electrically connected to the second negative terminal 155, and the other end of the second resistor 143 is electrically connected to the second output terminal 156. In this embodiment, the preamplifier The 10th series further has a fourth resistor 16, and the second inverting amplifier 12 is electrically connected to the first inverting amplifier 11 by the fourth resistor 16. Referring to FIG. 2, the variable resistor 153 is further The fifth resistor 153a and the plurality of sixth resistors 153b and the plurality of transistor switches 153c are connected in series, and the fifth resistor 153a is electrically connected to the sixth resistor 153b, and each of the sixth resistors 153b is electrically connected. Each of the transistor switches 153c can control the change of the resistance value of each of the sixth resistors 153b by conduction or not. Referring to FIG. 3, the post amplifier 20 can be a third. The inverting amplifier 20 is used to amplify the common mode signal of the preamplifier 10 to facilitate the detection and processing of the back end circuit.

  請參閱第4圖,該峰對峰偵測器30係具有兩個時脈控制取樣電路31、兩個電性連接各該時脈控制取樣電路31之電壓減法器32及一電性連接該電壓減法器32之判斷電路33,該峰對峰偵測器30係用以偵測從該後級放大器20所輸出之弦波峰對峰值,以使該電阻自動搜尋與選擇電路40做後續之判斷與處理,在本實施例中,該判斷電路33係具有一第三運算放大器331、一第一反向器332、一第二反向器333、一第三反向器334、一第四反向器335、一第五反向器336、一第一電晶體開關337及一第二電晶體開關338,該第三運算放大器331係具有一第三正極端331a、一第三負極端331b及一第三輸出端331c,該第三正極端331a係電性連接該第一電晶體開關337,該第三負極端331b係電性連接該第二電晶體開關338,該第一反向器332及該第三反向器334係電性連接該第三輸出端331c,該第二反向器333係電性連接該第一反向器332及該第一電晶體開關337,該第四反向器335係電性連接該第三反向器334及該第五反向器336,該第五反向器336係電性連接該第二電晶體開關338,該判斷電路33可確保該峰對峰偵測器30之輸出電壓值為電壓峰值減掉電壓谷值,而非電壓谷值減掉電壓峰值,因此可避免因訊號反相而錯誤判斷的問題發生。Referring to FIG. 4, the peak-to-peak detector 30 has two clock-controlled sampling circuits 31, two voltage subtractors 32 electrically connected to the clock-controlled sampling circuits 31, and a voltage-connected voltage. The judging circuit 33 of the subtracter 32 is configured to detect the peak-to-peak value of the sine wave output from the post-amplifier 20, so that the resistor automatically searches and selects the circuit 40 for subsequent judgment and In the embodiment, the determining circuit 33 has a third operational amplifier 331, a first inverter 332, a second inverter 333, a third inverter 334, and a fourth reverse. The third operational amplifier 331 has a third positive terminal 331a, a third negative terminal 331b, and a third transistor 337, and a second transistor 338. The third output terminal 331c is electrically connected to the first transistor switch 337, and the third negative terminal 331b is electrically connected to the second transistor switch 338, the first inverter 332 and The third inverter 334 is electrically connected to the third output end 331c, and the second inverter 333 is The first inverter 332 and the first transistor switch 337 are electrically connected to the third inverter 334 and the fifth inverter 336. The fifth reverse The detector 336 is electrically connected to the second transistor switch 338, and the determining circuit 33 can ensure that the output voltage value of the peak-to-peak detector 30 is a voltage peak minus a voltage valley, rather than a voltage valley minus a voltage peak. Therefore, it is possible to avoid the problem of erroneous judgment due to signal inversion.

  請參閱第5圖,該電阻自動搜尋與選擇電路40係包含一取樣與比較單元41、一計數轉態控制電路42、一計數器43及邏輯閘控制單元44,其中該邏輯閘控制單元44係具有一第一正反器44a、一第二正反器44b、一第三正反器44c、一第四正反器44d、一第六反向器44f、一第七反向器44g、一第八反向器44h、一第九反向器44i、一第十反向器44j、一第一非及閘44k、一第二非及閘44l、一第三非及閘44m、一第四非及閘44n及一非或閘44o,各該正反器係各具有一時脈接收端44e,該第六反向器44f係電性連接該第一正反器44a、該第二正反器44b、該第三正反器44c及該第四正反器44d之該時脈接收端44e,該第七反向器44g係電性連接該第六反向器44f,該第一非及閘44k係電性連接該第七反向器44g,該第八反向器44h係電性連接該第一非及閘44k,該第二非及閘44l係電性連接該第一正反器44a及該第二正反器44b,該第三非及閘44m係電性連接該第三正反器44c及該第四正反器44d,該非或閘44o之ㄧ端係電性連接該第二非及閘44l及該第三非及閘44m,該非或閘44o之另一端係電性連接該第八反向器44h及該第九反向器44i,該第四非及閘44n係電性連接該第九反向器44i,該第十反向器44j係電性連接該第四非及閘44n。Referring to FIG. 5, the resistance automatic search and selection circuit 40 includes a sampling and comparison unit 41, a count transition control circuit 42, a counter 43 and a logic gate control unit 44, wherein the logic gate control unit 44 has a first flip-flop 44a, a second flip-flop 44b, a third flip-flop 44c, a fourth flip-flop 44d, a sixth inverter 44f, a seventh inverter 44g, a first Eight inverters 44h, a ninth inverter 44i, a tenth inverter 44j, a first non-gate 44k, a second non-gate 44l, a third non-gate 44m, a fourth non And a gate 44n and a non-or gate 44o, each of the flip-flops has a clock receiving end 44e, the sixth inverter 44f is electrically connected to the first flip-flop 44a, the second flip-flop 44b The third inverter 44g is electrically connected to the sixth inverter 44f, and the first non-gate 44k is electrically connected to the sixth inverter 44f. Electrically connecting the seventh inverter 44g, the eighth inverter 44h is electrically connected to the first NAND gate 44k, and the second NAND gate 44l is electrically connected to the first flip flop 44a and The first The second flip-flop 44b is electrically connected to the third flip-flop 44c and the fourth flip-flop 44d, and the non-gate 44o is electrically connected to the second non-gate 44l and the third NAND gate 44m, the other end of the NAND gate 44o is electrically connected to the eighth inverter 44h and the ninth inverter 44i, and the fourth NAND gate 44n is electrically connected to the first The nine inverter 44i is electrically connected to the fourth non-gate 44n.

  請參閱第6圖,其係該時序控制電路50之電路架構圖,其係由計數器及邏輯閘組成,該時序控制電路50係藉由外部時脈訊號以產生該峰對峰偵測器30及該電阻自動搜尋與選擇電路40所需之時脈訊號,請參閱第9圖,其係該些時脈訊號之時序關係圖。Please refer to FIG. 6 , which is a circuit diagram of the timing control circuit 50 , which is composed of a counter and a logic gate. The timing control circuit 50 generates the peak-to-peak detector 30 by using an external clock signal. The resistor automatically searches for and selects the clock signal required by the circuit 40. Please refer to FIG. 9, which is a timing diagram of the clock signals.

  請再參閱第1圖,該第一修正訊號及該第二修正訊號係可藉由該前級放大器10及該後級放大器20進行訊號放大,其中該前級放大器10之該可變電阻153係用以作為電阻匹配選擇,經由該後級放大器20輸出之弦波峰對峰值係可由該峰對峰偵測器30偵測而得,請再參閱第4圖,該峰對峰偵測器30之輸出為一直流電壓值,該直流電壓值之變化係可使後端之該電阻自動搜尋與選擇電路40作電阻匹配選擇,請再參閱第5圖,該電阻自動搜尋與選擇電路40之輸出端係為一五位元之輸出,該五位元之輸出值變化係可對該前級放大器10之可變電阻153進行電阻值校正,當該電阻自動搜尋與選擇電路40完成電阻匹配動作後,其係可輸出一切換訊號而使得該峰對峰偵測器30與該後級放大器20斷路且停止自我校正,請參閱第7圖,其係該可變電阻153之電阻值與CMRR之關係圖,藉由阻值校正動作,必定可找到一組最佳之CMRR值,請參閱第8A-8B圖,其係該電阻自動搜尋與選擇電路40搜尋最佳CMRR值時之示意圖,請先參閱第8A圖,當校正前之可變電阻值落在最佳解之左半邊時,該五位元之初始值為01111,該可變電阻153之電阻值逐漸增加(計數器往下計數),每當電阻值微幅增加一次,就會和前一次作比較,若CMRR值比前一次來的大,則輸出1,其係表示可以繼續往右增加,當該可變電阻153之電阻值到達最佳解時,CMRR值為最大值,若電阻值再繼續向右增加,則輸出0,亦即經過了最佳解,因此又回到最佳值,輸出1,最後阻值會再向右增加一次,以確保CMRR為最大值,接著,請參閱第8B圖,當校正前之可變電阻值落在最佳解之右半邊時,該五位元之初始值為01111,該可變電阻153之電阻值同樣地向右增加(計數器往下計數),由於最佳解落於左邊,因此輸出0,此時該可變電阻153之電阻值係向左減少,因CMRR逐漸增加而輸出1,當電阻值到達最佳解時,CMRR為最大值,若電阻值繼續減少,將輸出0,亦即經過了最佳解,此時電阻值會再右增加一次,以確保CMRR為最大值。Referring to FIG. 1 again, the first correction signal and the second correction signal are signal amplified by the preamplifier 10 and the post amplifier 20, wherein the variable resistor 153 of the preamplifier 10 is The chord peak-to-peak value outputted by the post-stage amplifier 20 can be detected by the peak-to-peak detector 30, please refer to FIG. 4, the peak-to-peak detector 30 is used as a resistor matching option. The output is a DC voltage value, and the change of the DC voltage value enables the resistor of the back end to automatically search and select the circuit 40 for resistance matching. Please refer to FIG. 5, the output of the resistor automatic search and selection circuit 40. The output is a five-bit output, and the output value of the five-bit element can be corrected for the resistance of the variable resistor 153 of the preamplifier 10. When the resistance is automatically searched and selected by the circuit 40, the resistance matching operation is performed. The system can output a switching signal to make the peak-to-peak detector 30 and the post-amplifier 20 open and stop self-correction. Please refer to FIG. 7 , which is a relationship between the resistance value of the variable resistor 153 and the CMRR. By resistance school Action, you must find a set of best CMRR values, please refer to Figure 8A-8B, which is a schematic diagram of the automatic search and selection circuit 40 for searching for the best CMRR value, please refer to Figure 8A before correction. When the variable resistance value falls on the left half of the optimal solution, the initial value of the five-bit element is 01111, and the resistance value of the variable resistor 153 gradually increases (the counter counts down), whenever the resistance value increases slightly. Once, it will be compared with the previous one. If the CMRR value is larger than the previous one, the output is 1, which means that it can continue to increase to the right. When the resistance value of the variable resistor 153 reaches the optimal solution, the CMRR value For the maximum value, if the resistance value continues to increase to the right, the output 0, that is, the best solution is passed, so it returns to the optimal value, the output is 1, and finally the resistance value is increased to the right again to ensure the CMRR is The maximum value, then, referring to FIG. 8B, when the variable resistance value before correction falls on the right half of the optimal solution, the initial value of the five-bit element is 01111, and the resistance value of the variable resistor 153 is similarly Increase to the right (count down), output 0 because the best solution is on the left At this time, the resistance value of the variable resistor 153 is decreased to the left, and the CMRR is gradually increased to output 1, and when the resistance value reaches the optimal solution, the CMRR is the maximum value, and if the resistance value continues to decrease, the output is 0, that is, after The best solution, then the resistance value will increase again right to ensure that the CMRR is the maximum.

  本發明係藉由該峰對峰偵測器30偵測來自該後級放大器20之弦波峰對峰值,並使該電阻自動搜尋與選擇電路40針對弦波峰對峰值進行取樣與比對,進而校正該前級放大器10之該可變電阻153之電阻值,使得該儀表放大器100可找出最佳之CMRR值,達成自我校正之功能,此外,本發明係以類比方式達成電阻匹配功能,因此佈線於晶片時,可有效減少晶片的使用面積。The present invention detects the peak-to-peak value of the chord peak from the post-stage amplifier 20 by the peak-to-peak detector 30, and causes the resistance automatic search and selection circuit 40 to sample and compare the peak value of the chord peak, thereby correcting The resistance value of the variable resistor 153 of the preamplifier 10 enables the instrumentation amplifier 100 to find an optimum CMRR value and achieve a self-correction function. In addition, the present invention achieves a resistance matching function in an analogous manner, thus wiring When used on a wafer, the area of use of the wafer can be effectively reduced.

  本發明之保護範圍當視後附之申請專利範圍所界定者為準,任何熟知此項技藝者,在不脫離本發明之精神和範圍內所作之任何變化與修改,均屬於本發明之保護範圍。
The scope of the present invention is defined by the scope of the appended claims, and any changes and modifications made by those skilled in the art without departing from the spirit and scope of the invention are within the scope of the present invention. .

100‧‧‧儀表放大器100‧‧‧Instrument Amplifier

10‧‧‧前級放大器10‧‧‧Preamplifier

11‧‧‧第一修正訊號端11‧‧‧First correction signal end

12‧‧‧第二修正訊號端12‧‧‧ second modified signal end

13‧‧‧參考訊號端13‧‧‧Reference signal end

14‧‧‧第一反向放大器14‧‧‧First Inverting Amplifier

141‧‧‧第一運算放大器141‧‧‧First operational amplifier

142‧‧‧第一電組142‧‧‧First Group

143‧‧‧第二電阻143‧‧‧second resistance

144‧‧‧第一正極端144‧‧‧first positive end

145‧‧‧第一負極端145‧‧‧first negative end

146‧‧‧第一輸出端146‧‧‧ first output

15‧‧‧第二反向放大器15‧‧‧Second Inverting Amplifier

151‧‧‧第二運算放大器151‧‧‧Second operational amplifier

152‧‧‧第三電阻152‧‧‧ Third resistor

153‧‧‧可變電阻153‧‧‧Variable resistor

153a‧‧‧第五電阻153a‧‧‧ fifth resistor

153b‧‧‧第六電阻153b‧‧‧ sixth resistor

153c‧‧‧電晶體開關153c‧‧•Transistor Switch

154‧‧‧第二正極端154‧‧‧second positive end

155‧‧‧第二負極端155‧‧‧second negative end

156‧‧‧第二輸出端156‧‧‧second output

16‧‧‧第四電阻16‧‧‧fourth resistor

20‧‧‧後級放大器20‧‧‧post amplifier

30‧‧‧峰對峰偵測器30‧‧‧peak-to-peak detector

31‧‧‧時脈控制取樣電路31‧‧‧clock control sampling circuit

32‧‧‧電壓減法器32‧‧‧Voltage subtractor

33‧‧‧判斷電路33‧‧‧Judgement circuit

331‧‧‧第三運算放大器331‧‧‧ Third operational amplifier

331a‧‧‧第三正極端331a‧‧‧third positive end

331b‧‧‧第三負極端331b‧‧‧ third negative end

331c‧‧‧第三輸出端331c‧‧‧ third output

332‧‧‧第一反向器332‧‧‧First reverser

333‧‧‧第二反向器333‧‧‧Secondary reverser

334‧‧‧第三反向器334‧‧‧ Third reverser

335‧‧‧第四反向器335‧‧‧fourth reverser

336‧‧‧第五反向器336‧‧‧ fifth reverser

337‧‧‧第一電晶體開關337‧‧‧First transistor switch

338‧‧‧第二電晶體開關338‧‧‧Second transistor switch

40‧‧‧電阻自動搜尋與選擇電路40‧‧‧Resistance automatic search and selection circuit

41‧‧‧取樣與比較單元41‧‧‧Sampling and comparison unit

42‧‧‧計數轉態控制電路42‧‧‧Counting transition control circuit

43‧‧‧計數器43‧‧‧ counter

44‧‧‧邏輯閘控制單元44‧‧‧Logic gate control unit

44a‧‧‧第一正反器44a‧‧‧First positive and negative

44b‧‧‧第二正反器44b‧‧‧second flip-flop

44c‧‧‧第三正反器44c‧‧‧ third positive and negative

44d‧‧‧第四正反器44d‧‧‧fourth flip-flop

44e‧‧‧時脈接收端44e‧‧‧clock receiver

44f‧‧‧第六反向器44f‧‧‧ sixth reverser

44g‧‧‧第七反向器44g‧‧‧ seventh reverser

44h‧‧‧第八反向器44h‧‧‧ eighth reverser

44i‧‧‧第九反向器44i‧‧‧ninth reverser

44j‧‧‧第十反向器44j‧‧‧ tenth reverser

44k‧‧‧第一非及閘44k‧‧‧First non-gate

44l‧‧‧第二非及閘44l‧‧‧Second non-gate

44m‧‧‧第三非及閘44m‧‧‧ third non-gate

44n‧‧‧第四非及閘44n‧‧‧fourth non-gate

44o‧‧‧非或閘44o‧‧‧Non-gate

50‧‧‧時序控制電路50‧‧‧Sequence Control Circuit

51‧‧‧時脈訊號接收端51‧‧‧clock signal receiving end

52‧‧‧數位訊號接收端52‧‧‧Digital signal receiver

70‧‧‧儀表放大器70‧‧‧Instrument Amplifier

71‧‧‧可程式化類比介面71‧‧‧Programmable analog interface

72‧‧‧類比/數位調變器72‧‧‧ Analog/Digital Modulator

73‧‧‧數位控制平台73‧‧‧Digital Control Platform

74‧‧‧數位/類比轉換器74‧‧‧Digital/Analog Converter

第1圖:依據本發明之第一較佳實施例,一種儀表放大器之電路圖。
第2圖:依據本發明之另一較佳實施例,該儀表放大器之前級放大器之電路圖。
第3圖:依據本發明之另一較佳實施例,該儀表放大器之後級放大器之電路圖。
第4圖:依據本發明之另一較佳實施例,該儀表放大器之峰對峰偵測器之電路圖。
第5圖:依據本發明之另一較佳實施例,該儀表放大器之電阻自動搜尋與選擇電路之電路圖。
第6圖:依據本發明之另一較佳實施例,該儀表放大器之時序控制電路之電路圖。
第7圖:依據本發明之另一較佳實施例,該儀表放大器之該可變電阻之電阻值與CMRR之關係圖。
第8A-8B圖:依據本發明之另一較佳實施例,該儀表放大器之電阻自動搜尋與選擇電路之CMRR最佳值自動搜尋示意圖。
第9圖:依據本發明之另一較佳實施例,該儀表放大器之時序關係圖。
第10圖:依據本發明之另一較佳實施例,習知儀表放大器之電路圖。
Figure 1 is a circuit diagram of an instrumentation amplifier in accordance with a first preferred embodiment of the present invention.
Figure 2 is a circuit diagram of a preamplifier of the instrumentation amplifier in accordance with another preferred embodiment of the present invention.
Figure 3 is a circuit diagram of a subsequent stage amplifier of the instrumentation amplifier in accordance with another preferred embodiment of the present invention.
Figure 4 is a circuit diagram of a peak-to-peak detector of the instrumentation amplifier in accordance with another preferred embodiment of the present invention.
Figure 5: Circuit diagram of the automatic search and selection circuit of the resistance of the instrumentation amplifier in accordance with another preferred embodiment of the present invention.
Figure 6 is a circuit diagram of a timing control circuit of the instrumentation amplifier in accordance with another preferred embodiment of the present invention.
Figure 7 is a diagram showing the relationship between the resistance value of the variable resistor of the instrumentation amplifier and the CMRR according to another preferred embodiment of the present invention.
8A-8B is a diagram showing an automatic search of the CMRR optimum value of the resistance automatic search and selection circuit of the instrumentation amplifier according to another preferred embodiment of the present invention.
Figure 9 is a timing diagram of the instrumentation amplifier in accordance with another preferred embodiment of the present invention.
Figure 10 is a circuit diagram of a conventional instrumentation amplifier in accordance with another preferred embodiment of the present invention.

100‧‧‧儀表放大器 100‧‧‧Instrument Amplifier

10‧‧‧前級放大器 10‧‧‧Preamplifier

11‧‧‧第一修正訊號端 11‧‧‧First correction signal end

12‧‧‧第二修正訊號端 12‧‧‧ second modified signal end

13‧‧‧參考訊號端 13‧‧‧Reference signal end

20‧‧‧後級放大器 20‧‧‧post amplifier

30‧‧‧峰對峰偵測器 30‧‧‧peak-to-peak detector

40‧‧‧電阻自動搜尋與選擇電路 40‧‧‧Resistance automatic search and selection circuit

50‧‧‧時序控制電路 50‧‧‧Sequence Control Circuit

51‧‧‧時脈訊號接收端 51‧‧‧clock signal receiving end

52‧‧‧數位訊號接收端 52‧‧‧Digital signal receiver

Claims (10)

一種儀表放大器,其係包含:
一前級放大器,其係具有一第一修正訊號端、一第二修正訊號端及一參考訊號端;
一後級放大器,其係電性連接該前級放大器;
一電阻自動搜尋與選擇電路,其係電性連接該前級放大器;
一峰對峰偵測器,其係電性連接該電阻自動搜尋與選擇電路及該後級放大器;以及
一時序控制電路,其係具有一時脈訊號接收端及一數位訊號接收端,該時序控制電路係電性連接該電阻自動搜尋與選擇電路及峰對峰偵測器,該數位訊號接收端係電性連接該電阻自動搜尋與選擇電路。
An instrumentation amplifier comprising:
a preamplifier having a first modified signal terminal, a second modified signal terminal and a reference signal terminal;
a post-stage amplifier electrically connected to the preamplifier;
a resistor automatic search and selection circuit electrically connected to the preamplifier;
a peak-to-peak detector electrically connected to the resistance automatic search and selection circuit and the post-stage amplifier; and a timing control circuit having a clock signal receiving end and a digital signal receiving end, the timing control circuit The resistor is automatically connected to the resistor search and selection circuit and the peak-to-peak detector, and the digital signal receiving end is electrically connected to the resistor automatic search and selection circuit.
如專利申請範圍第1項所述之儀表放大器,其中該前級放大器係包含一第一反向放大器及一電性連接該第一反向放大器之第二反向放大器。The instrumentation amplifier of claim 1, wherein the preamplifier comprises a first inverting amplifier and a second inverting amplifier electrically connected to the first inverting amplifier. 如專利申請範圍第2項所述之儀表放大器,其中該第一反向放大器係包含一第一運算放大器、一第一電阻及一第二電阻,該第一運算放大器係具有一第一正極端、一第一負極端及一第一輸出端,該第一電阻及該第二電阻之一端係電性連接該第一負極端,該第二電阻之另一端係電性連接該第一輸出端。The instrumentation amplifier of claim 2, wherein the first inverting amplifier comprises a first operational amplifier, a first resistor and a second resistor, the first operational amplifier having a first positive terminal a first negative terminal and a first output terminal, the first resistor and the second resistor are electrically connected to the first negative terminal, and the other end of the second resistor is electrically connected to the first output terminal . 如專利申請範圍第3項所述之儀表放大器,其中該第二反向放大器係包含一第二運算放大器、一第三電阻及一可變電阻,該第二運算放大器係具有一第二正極端、一第二負極端及一第二輸出端,該可變電阻、該第一運算放大器之該第一輸出端及該第三電阻之ㄧ端係電性連接該第二負極端,該第二電阻之另一端係電性連接該第二輸出端。The instrumentation amplifier of claim 3, wherein the second inverting amplifier comprises a second operational amplifier, a third resistor and a variable resistor, the second operational amplifier having a second positive terminal a second negative terminal and a second output terminal, the variable resistor, the first output end of the first operational amplifier, and the second end of the third resistor are electrically connected to the second negative terminal, the second The other end of the resistor is electrically connected to the second output end. 如專利申請範圍第4項所述之儀表放大器,其中該可變電阻係包含複數個彼此串聯之電阻及複數個電晶體開關,各該電阻係電性連接各該電晶體開關。The instrumentation amplifier of claim 4, wherein the variable resistor comprises a plurality of resistors connected in series with each other and a plurality of transistor switches, each of the resistors being electrically connected to each of the transistor switches. 如專利申請範圍第1項所述之儀表放大器,其中該後級放大器係可為一第三反向放大器。The instrumentation amplifier of claim 1, wherein the post amplifier is a third inverting amplifier. 如專利申請範圍第1項所述之儀表放大器,其中該峰對峰偵測器係具有至少一時脈控制取樣電路、至少一電性連接該時脈控制取樣電路之電壓減法器及一電性連接該電壓減法器之判斷電路。The instrumentation amplifier of claim 1, wherein the peak-to-peak detector has at least one clock-controlled sampling circuit, at least one voltage subtractor electrically connected to the clock-controlled sampling circuit, and an electrical connection. The judgment circuit of the voltage subtractor. 如專利申請範圍第7項所述之儀表放大器,其中該判斷電路係具有一第三運算放大器、一第一反向器、一第二反向器、一第三反向器、一第四反向器、一第五反向器、一第一電晶體開關及一第二電晶體開關,該第三運算放大器係具有一第三正極端、一第三負極端及一第三輸出端,該第三正極端係電性連接該第一電晶體開關,該第三負極端係電性連接該第二電晶體開關,該第一反向器及該第三反向器係電性連接該第三輸出端,該第二反向器係電性連接該第一反向器及該第一電晶體開關,該第四反向器係電性連接該第三反向器及該第五反向器,該第五反向器係電性連接該第二電晶體開關。The instrumentation amplifier of claim 7, wherein the determining circuit has a third operational amplifier, a first inverter, a second inverter, a third inverter, and a fourth inverter. a third operational amplifier having a third positive terminal, a third negative terminal, and a third output terminal, the third transistor, the first transistor switch, and the second transistor switch The third positive terminal is electrically connected to the first transistor switch, and the third negative terminal is electrically connected to the second transistor switch, and the first inverter and the third inverter are electrically connected to the first transistor a third output terminal electrically connected to the first inverter and the first transistor switch, wherein the fourth inverter is electrically connected to the third inverter and the fifth reverse The fifth inverter is electrically connected to the second transistor switch. 如專利申請範圍第1項所述之儀表放大器,其中該電阻自動搜尋與選擇電路係包含一取樣與比較單元、一計數轉態控制電路、一計數器及一邏輯閘控制單元。The instrumentation amplifier of claim 1, wherein the resistance automatic search and selection circuit comprises a sampling and comparison unit, a counting transition control circuit, a counter and a logic gate control unit. 如專利申請範圍第9項所述之儀表放大器,其中該邏輯閘控制單元係具有一第一正反器、一第二正反器、一第三正反器、一第四正反器、一第六反向器、一第七反向器、一第八反向器、一第九反向器、一第十反向器、一第一非及閘、一第二非及閘、一第三非及閘、一第四非及閘及一非或閘,各該正反器係各具有一時脈接收端,該第六反向器係電性連接該第一正反器、該第二正反器、該第三正反器及該第四正反器之時脈接收端,該第七反向器係電性連接該第六反向器,該第一非及閘係電性連接該第七反向器,該第八反向器係電性連接該第一非及閘,該第二非及閘係電性連接該第一正反器及該第二正反器,該第三非及閘係電性連接該第三正反器及該第四正反器,該非或閘之一端係電性連接該第二非及閘及該第三非及閘,該非或閘之另一端係電性連接該第八反向器及該第九反向器,該第四非及閘係電性連接該第九反向器,該第十反向器係電性連接該第四非及閘。The instrumentation amplifier of claim 9, wherein the logic gate control unit has a first flip-flop, a second flip-flop, a third flip-flop, a fourth flip-flop, and a a sixth inverter, a seventh inverter, an eighth inverter, a ninth inverter, a tenth inverter, a first non-gate, a second non-gate, a first a third non-gate, a fourth non-gate and a non-gate, each of the flip-flops each having a clock receiving end, the sixth inverter electrically connecting the first flip-flop, the second a positive inverter, a third flip-flop, and a clock receiving end of the fourth flip-flop, the seventh inverter is electrically connected to the sixth inverter, and the first non-gate is electrically connected The seventh inverter is electrically connected to the first NAND gate, and the second NAND gate is electrically connected to the first flip flop and the second flip flop. The third non-gate is electrically connected to the third flip-flop and the fourth flip-flop, and one of the non-gates is electrically connected to the second non-gate and the third non-gate, and the non-gate or the other One end is electrically connected to the first The eighth inverter and the ninth inverter are electrically connected to the ninth inverter, and the tenth inverter is electrically connected to the fourth non-gate.
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