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TWI415694B - Substrate processing device and processing method thereof - Google Patents

Substrate processing device and processing method thereof Download PDF

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Publication number
TWI415694B
TWI415694B TW97101146A TW97101146A TWI415694B TW I415694 B TWI415694 B TW I415694B TW 97101146 A TW97101146 A TW 97101146A TW 97101146 A TW97101146 A TW 97101146A TW I415694 B TWI415694 B TW I415694B
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substrate
liquid
processing
gas
nanobubbles
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TW97101146A
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Chinese (zh)
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TW200911395A (en
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Akinori Iso
Yukinobu Nishibe
Yasutomo Fujimori
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Shibaura Mechatronics Corp
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Abstract

Provided is a processing apparatus for processing a substrate by using a processing solution. The substrate processing apparatus is provided with a nano bubble generating means, which generates nano bubbles and mixes the nano bubbles in the processing solution; a processing solution supplying means for supplying the processing solution including the nano bubbles generated by the nano bubble generating means onto the board surface of the substrate; a pressurizing means which pressurizes the nano bubbles included in the processing solution supplied onto the board surface of the substrate by the processing solution supplying means and crushesthem with pressure with the board surface of the substrate.

Description

基板之處理裝置及處理方法Substrate processing device and processing method 發明領域Field of invention

本發明係有關於一種藉由處理液處理半導體晶圓或液晶顯示裝置用之玻璃基板等基板之處理裝置及處理方法。The present invention relates to a processing apparatus and a processing method for processing a substrate such as a glass substrate for a semiconductor wafer or a liquid crystal display device by a processing liquid.

發明背景Background of the invention

在製造半導體裝置或液晶顯示裝置等時,有一於半導體晶圓或玻璃基板等基板形成電路圖案之平版印刷製程。該平版印刷製程係如眾所皆知者,於上述基板塗布抗蝕劑,並經由形成有電路圖案之光罩將光照射於該抗蝕劑。When manufacturing a semiconductor device, a liquid crystal display device, or the like, there is a lithography process for forming a circuit pattern on a substrate such as a semiconductor wafer or a glass substrate. The lithography process is well known in which a resist is applied to the substrate, and light is irradiated onto the resist via a photomask formed with a circuit pattern.

接著,除去抗蝕劑未照射到光之部分或者照射到光之部分,並反覆複數次將除去之部分進行蝕刻等一連串之步驟,藉此於上述基板形成電路圖案。Next, a series of steps of etching the portion where the resist is not irradiated to the light or irradiating the light, and repeatedly removing the removed portions are performed, thereby forming a circuit pattern on the substrate.

上述一連串之各步驟中,若上述基板受到污染,則無法精密地形成電路圖案,成為不良品的發生原因。因此,於基板形成電路圖案時,要先除去附著殘留於基板之有機物或抗蝕劑等,使用因應於其處理目的之處理液處理基板。使用於處理基板之處理液已知有純水、蝕刻液、剝離液、顯像液等。In the above-described series of steps, if the substrate is contaminated, the circuit pattern cannot be formed precisely, which may cause a defective product. Therefore, when the circuit pattern is formed on the substrate, the organic substance or the resist remaining on the substrate is removed, and the substrate is treated with the treatment liquid for the purpose of the treatment. Pure water, an etching liquid, a peeling liquid, a developing liquid, and the like are known as a treatment liquid for treating a substrate.

最近,不僅單以加壓氣體對處理液加壓,還將氣體作成微細的氣泡,使之混合於處理液中,藉此,提昇上述處理液的處理效率。專利文獻1中揭示了一種處理裝置,其係藉使微氣泡混合於處理液中,以提昇處理效率。Recently, not only the pressurized gas is used to pressurize the treatment liquid, but also the gas is made into fine bubbles and mixed in the treatment liquid, thereby improving the treatment efficiency of the treatment liquid. Patent Document 1 discloses a processing apparatus which enhances processing efficiency by mixing microbubbles in a treatment liquid.

即,專利文獻1所示之處理裝置具有導入純水及氮氣之混合泵。純水與氮氣係在氣液混合泵中加以混合,送至迴旋加速器。迴旋加速器使純水與氮氣加速迴旋,形成氣液2層流,然後往分散器送出。分散器以流體力學方式剪斷送入之氣液2層流,形成氮氣之微汽泡。然後,含有微氣泡之純水送到處理槽,處理基板。That is, the processing apparatus shown in Patent Document 1 has a mixing pump that introduces pure water and nitrogen. Pure water and nitrogen are mixed in a gas-liquid mixing pump and sent to a cyclotron. The cyclotron accelerates the swirling of pure water and nitrogen to form a gas-liquid two-layer flow, which is then sent to the disperser. The disperser shears the gas-liquid two-layer flow that is sent in a hydrodynamic manner to form a micro-bubble of nitrogen. Then, pure water containing microbubbles is sent to the treatment tank to treat the substrate.

【專利文獻1】日本專利公開公報特開2006-179765[Patent Document 1] Japanese Patent Laid-Open Publication No. 2006-179765

一般而言,專利文獻1所揭示之微氣泡的直徑為10~100μm。由於微氣泡的直徑大,因此會受到浮力而在液中上昇,然後在液面裂開而消失。In general, the microbubbles disclosed in Patent Document 1 have a diameter of 10 to 100 μm. Since the microbubbles have a large diameter, they are buoyant and rise in the liquid, and then they are cleaved and disappeared at the liquid surface.

相對於此,由於直徑在如1μm以下之奈米氣泡的內壓低,因此在水中幾乎不會受到浮力作用。故,會在液中浮遊,且受外壓力而漸漸縮小。當奈米氣泡縮小時,其表面電荷會隨著表面積的縮小而濃縮,因此會形成極強的電場。On the other hand, since the internal pressure of the nanobubble having a diameter of, for example, 1 μm or less is low, it is hardly affected by buoyancy in water. Therefore, it will float in the liquid and gradually shrink by external pressure. When the nanobubbles are shrunk, the surface charge is concentrated as the surface area is reduced, so that an extremely strong electric field is formed.

由於奈米氣泡的強電場會使該奈米氣泡活性化,因此會對存在奈米氣泡之液體造成強力的影響。因此,若處理基板之處理液中含有奈米氣泡的話,可大幅提昇該處理液對基板的處理效果。Since the strong electric field of the nanobubbles activates the nanobubbles, it has a strong influence on the liquid in which the nanobubbles are present. Therefore, if the processing liquid of the processing substrate contains nanobubbles, the treatment effect of the processing liquid on the substrate can be greatly improved.

專利文獻1所示之處理裝置係如上所述,在使用氣液混合泵將氮氣與純水混合後,以迴旋加速器加速使之迴旋而形成氣液2層流當中,利用分散器以流體力學方式來剪斷氣液2層流,而形成氮氣的微氣泡。The processing apparatus shown in Patent Document 1 is a method in which a gas-liquid mixing pump is used to mix nitrogen gas with pure water, and then accelerated by a cyclotron to be swirled to form a gas-liquid two-layer flow, and a hydrodynamic method using a disperser. To cut off the gas-liquid two-layer flow, and form micro-bubbles of nitrogen.

也就是說,專利文獻1所揭示之處理裝置中,即使可藉由氣液混合泵、迴旋加速器及分散器,形成直徑為10~100 μm左右的微氣泡,也要在使用迴旋加速器使氮氣與純水預先混合形成氣液2層流體後,利用分散器以流體力學方式加以剪斷。That is, in the processing apparatus disclosed in Patent Document 1, even if a gas-liquid mixing pump, a cyclotron, and a disperser can be used, a diameter of 10 to 100 can be formed. The microbubbles of about μm are also preliminarily mixed with nitrogen and pure water using a cyclotron to form a gas-liquid two-layer fluid, and then sheared by a disperser in a hydrodynamic manner.

因此,由於在迴旋加速器中,氮氣會溶入純水,因此即使利用分散器並以流體力學方式將在迴旋加速器形成之氣液2層流體剪斷,不僅無法有效率地產生微氣泡,而且專利文獻1中,也未有任何揭示產生比微氣泡有利於基板處理之奈米氣泡等。Therefore, since nitrogen gas is dissolved in pure water in the cyclotron, even if the gas-liquid two-layer fluid formed in the cyclotron is sheared by a disperser and hydrodynamically, not only the microbubbles cannot be efficiently produced, but also the patent In Document 1, there is also no disclosure of nanobubbles or the like which are advantageous for substrate processing than microbubbles.

發明概要Summary of invention

本發明係提供一種可有效率產生直徑比微氣泡小之奈米氣泡,且可提高基板的處理效率之基板的處理裝置及處理方法。The present invention provides a processing apparatus and a processing method for a substrate which can efficiently produce nanobubbles having a smaller diameter than microbubbles and which can improve the processing efficiency of the substrate.

為解決上述課題,本發明提供一種基板之處理裝置,係藉處理液處理基板者,包含有:奈米氣泡產生機構,係產生奈米氣泡,並使該奈米氣泡混合於前述處理液者;處理液供給機構,係將含有由前述奈米氣泡產生機構所產生之奈米氣泡之前述處理液供給至前述基板板面者;及加壓機構,係對由前述處理液供給機構供給至前述基板板面之處理液中所含之奈米氣泡進行加壓,且使該氣泡在前述基板板面壓壞者。In order to solve the above problems, the present invention provides a processing apparatus for a substrate, which comprises: a nano bubble generating mechanism for generating a nanobubble generating means by mixing a nanobubble to the processing liquid; The processing liquid supply means supplies the processing liquid containing the nanobubbles generated by the nano bubble generating means to the substrate surface; and the pressurizing means supplies the processing liquid supply means to the substrate The nanobubbles contained in the treatment liquid on the surface of the sheet are pressurized, and the bubbles are crushed on the surface of the substrate.

又,本發明提供一種基板之處理方法,係藉處理液處理基板者,包含有:混合步驟,係產生奈米氣泡,並使該奈米氣泡與前述處理液混合;供給步驟,係將含有奈米氣 泡之前述處理液供給至前述基板板面;及壓壞步驟,係將供給至前述基板板面之處理液所含之奈米氣泡加壓,使該氣泡在前述基板板面壓壞。Moreover, the present invention provides a method for processing a substrate, which comprises: a mixing step of generating a nanobubble to mix the nanobubbles with the treatment liquid; and a supply step of containing the naphthalene Rice gas The processing liquid supplied to the substrate is supplied to the substrate surface; and the crushing step pressurizes the nano-bubble contained in the processing liquid supplied to the surface of the substrate to cause the air bubbles to be crushed on the surface of the substrate.

圖式簡單說明Simple illustration

第1圖係顯示本發明之第1實施形態之處理裝置的概略構成圖。Fig. 1 is a schematic block diagram showing a processing apparatus according to a first embodiment of the present invention.

第2圖係沿著氣體剪斷器之軸方向之截面圖。Figure 2 is a cross-sectional view along the axial direction of the gas shear.

第3圖係由後端觀看氣體剪斷器之側面圖。Figure 3 is a side view of the gas cutter viewed from the rear end.

第4圖係顯示本發明之第2實施形態之螺旋處理裝置的概略構成圖。Fig. 4 is a schematic block diagram showing a spiral processing apparatus according to a second embodiment of the present invention.

第5圖係顯示本發明之第3實施形態之螺旋處理裝置的概略構成圖。Fig. 5 is a schematic block diagram showing a spiral processing apparatus according to a third embodiment of the present invention.

第6圖係顯示本發明之第4實施形態之水平搬送處理裝置之概略構成圖。Fig. 6 is a schematic block diagram showing a horizontal conveyance processing apparatus according to a fourth embodiment of the present invention.

第7圖係顯示本發明之第5實施形態之水平搬送處理裝置之概略構成圖。Fig. 7 is a schematic block diagram showing a horizontal conveyance processing device according to a fifth embodiment of the present invention.

第9圖顯示本發明之第6實施形態之水平搬送處理裝置之概略構成圖。Fig. 9 is a view showing a schematic configuration of a horizontal transport processing device according to a sixth embodiment of the present invention.

第9圖係顯示本發明之第7實施形態之水平搬送處理裝置之概略構成圖。Fig. 9 is a schematic block diagram showing a horizontal conveyance processing apparatus according to a seventh embodiment of the present invention.

第10圖係顯示本發明之第8實施形態之水平搬送處理裝置之概略構成圖。Fig. 10 is a schematic block diagram showing a horizontal conveyance processing apparatus according to an eighth embodiment of the present invention.

較佳實施例之詳細說明Detailed description of the preferred embodiment

以下,參照圖式說明本發明之實施形態。Hereinafter, embodiments of the present invention will be described with reference to the drawings.

第1圖至第3圖係顯示本發明之第1實施形態,且第1圖係顯示處理裝置之概略構成圖,該處理裝置具有處理槽1。該處理槽1內配置有構成奈米氣泡產生機構之氣體剪斷器2。該氣體剪斷器2係如第2圖所示,內具有於內部形成剪斷室3之中空狀本體4。1 to 3 show a first embodiment of the present invention, and Fig. 1 is a schematic configuration diagram showing a processing apparatus having a processing tank 1. A gas cutter 2 constituting a nano bubble generating mechanism is disposed in the processing tank 1. As shown in Fig. 2, the gas cutter 2 has a hollow body 4 in which a shear chamber 3 is formed inside.

上述剪斷室3之其中一端與形成於上述本體4之軸方向前端面之噴射口5連通,另一端與形成於上述本體4之後端面之氣體供給口6連通。上述剪斷室3係由後部空間部3a、與前部空間部3b形成,前述後部空間部3a係由連通於上述氣體供給口6之後端朝後端部中途部擴徑之圓錐台狀者,前述前部空間部3b係由該後部空間部3a朝前端漸漸縮徑形成之圓錐台狀者,且於上述剪斷室3之後部空間部3a與前部空間部3b之境界部分形成有朝上述本體4之外周面開口之液體供給口7。One end of the shearing chamber 3 communicates with the injection port 5 formed in the axial end surface of the main body 4, and the other end communicates with the gas supply port 6 formed at the rear end surface of the main body 4. The shearing chamber 3 is formed by a rear space portion 3a and a front space portion 3b, and the rear space portion 3a is formed by a truncated cone that is connected to the gas supply port 6 and has a diameter extending toward the center of the rear end portion. The front space portion 3b is formed in a truncated cone shape in which the rear space portion 3a is gradually reduced in diameter toward the front end, and is formed in the boundary portion between the rear space portion 3a and the front space portion 3b in the shear chamber 3 A liquid supply port 7 having a peripheral surface open outside the body 4.

上述氣體供給口6設有氣體迴旋用金屬蓋11。該氣體迴旋用金屬蓋11係與其中一端連接於氣體供給泵12之氣體供給管13的另一端連接。該氣體供給管13之中途部設有第1開關閥14。上述氣體供給泵12之吸引側與未圖示之高壓泵等氣體供給源連接。該氣體供給源係用以供給氧氣。The gas supply port 6 is provided with a metal cover 11 for gas swirling. The gas swirling metal cover 11 is connected to the other end of the gas supply pipe 13 whose one end is connected to the gas supply pump 12. The first switching valve 14 is provided in the middle of the gas supply pipe 13. The suction side of the gas supply pump 12 is connected to a gas supply source such as a high pressure pump (not shown). The gas supply is used to supply oxygen.

上述氣體迴旋用金屬蓋11雖未詳細圖示,但該氣體迴旋用金屬蓋11於內部形成有螺旋溝。藉此,若打開上述第1開關閥14,使由上述氣體供給泵12供給之氧氣迴旋通過上述氣體供給管13,然後由上述剪斷室3之後部空間部3a朝前 部空間部3b噴出,且上述剪斷室3內如第2圖中虛線所示,形成氧氣之氣體空洞部15。該實施形態中,氣體迴旋用金屬蓋11之螺旋溝係構成為使上述氣體朝由上述本體4之後端側觀看為逆時鐘方向迴旋。氣體之迴旋方向係如第2圖中箭頭a所示。Although the metal cover 11 for gas swirling is not shown in detail, the metal cover 11 for gas swirl has a spiral groove formed therein. When the first on-off valve 14 is opened, the oxygen supplied from the gas supply pump 12 is swirled through the gas supply pipe 13, and then the space portion 3a is turned forward by the shear chamber 3 The space portion 3b is ejected, and the gas chamber portion 15 for oxygen gas is formed as indicated by a broken line in Fig. 2 in the shear chamber 3. In this embodiment, the spiral groove of the metal cover 11 for gas swirling is configured such that the gas swirls in the counterclockwise direction as viewed from the rear end side of the main body 4. The swirling direction of the gas is as indicated by the arrow a in Fig. 2.

液體供給金屬蓋16係如第3圖所示,相對本體4之周方向朝時鐘方向傾斜θ1的角度,而且如第2圖所示,相對軸線方向朝後端側傾斜θ2之角度連接於上述液體供給口7。The liquid supply metal cover 16 is inclined at an angle of θ1 toward the clock direction with respect to the circumferential direction of the main body 4 as shown in Fig. 3, and is connected to the liquid at an angle of θ2 toward the rear end side with respect to the axial direction as shown in Fig. 2 . Supply port 7.

上述液體供給金屬蓋16與液體供給管18之另一端連接,且液體供給管18之其中一端連接於液體供給泵17。該液體供給管18之中途部設有第2開關閥19。上述液體供給泵17之吸引側與上述處理槽1之底部連接。該處理槽1係收容有作為處理液之純水L。The liquid supply metal cover 16 is connected to the other end of the liquid supply pipe 18, and one end of the liquid supply pipe 18 is connected to the liquid supply pump 17. A second on-off valve 19 is provided in the middle of the liquid supply pipe 18. The suction side of the liquid supply pump 17 is connected to the bottom of the processing tank 1. The treatment tank 1 contains pure water L as a treatment liquid.

藉此,若打開上述第2開關閥19,由上述液體供給泵17而供給至上述氣體剪斷器2之純水L通過上述液體供給管18且藉由上述液體供給金屬蓋16之傾斜角度θ1而與上述氧氣同樣朝反時鐘徑方向迴旋,而且藉由上述液體供給金屬蓋16之傾斜角度θ2供給至前部空間部3b側行進之方向。When the second switching valve 19 is opened, the pure water L supplied from the liquid supply pump 17 to the gas shearing device 2 passes through the liquid supply pipe 18 and the inclination angle θ1 of the metal supply cover 16 is supplied by the liquid. In the same manner as the oxygen gas, it is swirled in the counterclockwise direction, and is supplied to the direction in which the front space portion 3b side travels by the inclination angle θ2 of the liquid supply metal cover 16.

藉由上述氣體供給泵12,氧氣之供給壓力設定為P1,並藉由上述液體供給泵17而將純水L之供給壓力設定為P2,且設定為P1<P2。藉此,供給至上述本體4之剪斷室3之氧氣的迴旋速度V1與純水L之迴旋速度V2的關係為V1<V2。By the gas supply pump 12, the supply pressure of oxygen is set to P1, and the supply pressure of the pure water L is set to P2 by the liquid supply pump 17, and P1 < P2 is set. Thereby, the relationship between the swirling speed V1 of the oxygen supplied to the shearing chamber 3 of the main body 4 and the swirling speed V2 of the pure water L is V1 < V2.

該實施形態中,氧氣之供給壓力P1與純水L之供給壓力 P2係設定為,氧氣的迴旋速度V1係每秒400旋轉、純水L之迴旋速度V2係每秒600旋轉。In this embodiment, the supply pressure of the oxygen supply pressure P1 and the pure water L The P2 system is set such that the oxygen swirling speed V1 is 400 rotations per second, and the pure water L has a swirling speed V2 of 600 rotations per second.

由上述剪斷室3之軸方向後端供給之氧氣係如箭頭a所示,成為迴旋之氣體空洞部15,且朝噴射口5行進。由上述剪斷室3之外周面供給之純水L係迴旋之氧氣的氣體空洞部15之外周面迴旋,且朝上述噴射口5行進。純水之迴旋方向如第2圖中箭頭b所示。The oxygen supplied from the rear end of the shear chamber 3 in the axial direction is a swirling gas cavity portion 15 as indicated by an arrow a, and travels toward the injection port 5. The outer peripheral surface of the gas cavity portion 15 in which the pure water L supplied from the outer peripheral surface of the shearing chamber 3 is swirled is swirled, and travels toward the injection port 5. The direction of swirling of pure water is as indicated by arrow b in Fig. 2.

氧氣之迴旋速度V1設定成較純水L之迴旋速度V2慢。因此,藉由氧氣與純水L之間的迴旋速度差,氧氣被純水L以流體力學方式剪斷後,藉由該剪斷作用產生氧氣之奈米氣泡。而且,會自上述剪斷室3之前端的噴射口5噴射含有氧氣之奈米氣泡之純水L。又,即使將氧氣之迴旋速度V1設定成較純水L之迴旋速度V2快,也可藉由流體力學的剪斷作用產生氧氣之奈米氣泡。The oxygen swirling speed V1 is set to be slower than the swirling speed V2 of the pure water L. Therefore, by the difference in the speed of the swirl between the oxygen and the pure water L, the oxygen is sheared by the pure water L in a hydrodynamic manner, and the nano-bubble of oxygen is generated by the shearing action. Further, pure water L containing oxygen-containing nanobubbles is ejected from the ejection opening 5 at the front end of the above-described shearing chamber 3. Further, even if the swirling speed V1 of oxygen is set to be faster than the swirling speed V2 of the pure water L, oxygen nanobubbles can be generated by the shearing action of hydrodynamics.

供給至上述剪斷室3之純水L藉在剪斷室3內之氧氣的氣體空洞部15之周圍迴旋,而以流體力學方式剪斷氧氣。也就是說,由於在氧氣與純水L混合後氧氣溶入純水L之前,在剪斷室3剪斷氧氣使之產生奈米氣泡,因此可提高奈米氣泡的產生效率。The pure water L supplied to the above-described shearing chamber 3 is swirled around the gas cavity portion 15 of the oxygen in the shearing chamber 3, and the oxygen gas is sheared hydrodynamically. That is, since oxygen is sheared in the shearing chamber 3 to generate nanobubbles before the oxygen is dissolved in the pure water L after the oxygen is mixed with the pure water L, the generation efficiency of the nanobubbles can be improved.

上述剪斷室3之前部空間部3b係形成朝噴射口5縮徑之圓錐狀。因此,供給至剪斷器3之氧氣與純水L會隨著前部空間部3b行進減少體積,因此壓力減少會受限。The front space portion 3b of the shearing chamber 3 is formed in a conical shape that is reduced in diameter toward the ejection port 5. Therefore, the oxygen supplied to the cutter 3 and the pure water L are reduced in volume as the front space portion 3b travels, so the pressure reduction is limited.

因此,純水L剪斷氧氣之流體力學的剪斷作用係涵括剪斷室3之軸方向全長而維持在大略均一之狀態。也就是說, 隨著氧氣與純水L在剪斷室3行進而可防止奈米氣泡的產生效率降低。Therefore, the hydrodynamic shearing action of pure water L shearing oxygen maintains a substantially uniform state in the axial direction of the shear chamber 3. That is, As the oxygen and the pure water L travel in the shearing chamber 3, the generation efficiency of the nanobubbles can be prevented from being lowered.

如第1圖所示,洗淨處理之基板W係在浸漬於上述處理槽1內所充滿之純水L之狀態下供給至與上述噴射口5對向之位置,且保持在大略垂直立起之狀態。藉此,含有由上述噴射口5噴射之奈米氣泡之純水L朝上述基板W之板面噴射。As shown in Fig. 1, the substrate W to be cleaned is supplied to the position opposed to the ejection port 5 in a state of being immersed in the pure water L filled in the processing tank 1, and is held up substantially vertically. State. Thereby, the pure water L containing the nanobubbles sprayed by the ejection openings 5 is ejected toward the surface of the substrate W.

又,基板W與上述噴射口5的間隔設定成使噴射口5所噴射之純水L以預定之壓力作用於基板W之板面。又,由於使自噴射口5噴射之純水L作用於基板W全面,因此上述氣體剪斷器2會藉由未圖示之驅動機構而沿著基板W之板面的上下方向及幅度方向而驅動。Further, the interval between the substrate W and the ejection port 5 is set such that the pure water L ejected from the ejection port 5 acts on the plate surface of the substrate W with a predetermined pressure. Further, since the pure water L injected from the ejection opening 5 acts on the entire substrate W, the gas shearer 2 is along the vertical direction and the amplitude direction of the plate surface of the substrate W by a driving mechanism (not shown). drive.

由於奈米氣泡係如上所述內壓較低,因此會一面在液中浮游且因外壓而縮小,並且藉表面電荷濃縮而形成極強之電場而活性化。藉此,若朝基板W噴射含有奈米氣泡之純水L,則可有效率且確實地將基板W洗淨處理。特別是,當處理液為純水L,且氣體為氧氣時,含有氧氣之奈米氣泡之純水L可有效率地洗淨除去附著於基板W之有機物。Since the inner cell has a low internal pressure as described above, it floats in the liquid and shrinks due to the external pressure, and is activated by the surface electric charge to form an extremely strong electric field. Thereby, when the pure water L containing the nanobubbles is sprayed toward the substrate W, the substrate W can be efficiently and surely washed. In particular, when the treatment liquid is pure water L and the gas is oxygen, the pure water L containing the oxygen-containing nanobubbles can be efficiently washed to remove the organic matter adhering to the substrate W.

供給至上述氣體剪斷器2之氣體與處理液有純水與臭氧、蝕刻液與氧氣或空氣、蝕刻液と氮氣或二氧化碳、剝離液與氧氣、剝離液與二氧化碳、剝離液與氮氣、顯像液與氧氣、顯像液與氮氣等組合。The gas and the treatment liquid supplied to the gas cutter 2 include pure water and ozone, etching liquid and oxygen or air, etching liquid, nitrogen or carbon dioxide, stripping liquid and oxygen, stripping liquid and carbon dioxide, stripping liquid and nitrogen gas, and development. The liquid is combined with oxygen, a developing solution and nitrogen.

藉由純水與臭氧的組合,不僅可利用純水洗淨基板W,還可具有藉由臭氧之奈米氣泡而強制於基板W上生成 氧化膜之作用、及提昇基板之潤濕性之作用。By combining pure water and ozone, not only the substrate W can be washed with pure water, but also the substrate W can be forced by the ozone bubble of ozone. The role of the oxide film and the effect of improving the wettability of the substrate.

根據蝕刻液與氧氣或空氣的組合,不僅是藉由蝕刻液產生之蝕刻作用,還有氧氣或空氣之奈米氣泡,蝕刻液造成之蝕刻作用所產生之陽離子性物質會因奈米氣泡表面產生之負離子而吸著,並可防止陰離子性物質因為排斥而往基板W再附著。According to the combination of the etching solution and oxygen or air, not only the etching action by the etching liquid, but also the oxygen bubbles of oxygen or air, the cationic substances generated by the etching action caused by the etching liquid are generated by the surface of the nanobubbles. The negative ions are sorbed, and the anionic substance is prevented from reattaching to the substrate W due to repulsion.

而且,由於奈米氣泡具有吸收金屬離子等之性質,因此可同持進行金屬離子的去除。又,可藉由已活性化之氧氣的奈米氣泡提昇蝕刻液對基板W之反應性、也就是蝕刻作用。Further, since the nanobubbles have the property of absorbing metal ions or the like, the metal ions can be removed in the same manner. Further, the reactivity of the etching liquid to the substrate W, that is, the etching action, can be enhanced by the nanobubbles of the activated oxygen.

根據蝕刻液與氮氣或二氧化碳的組合,藉由於奈米氣泡表面產生之負離子,蝕刻作用所產生之陽離子性物質會吸著奈米氣泡,並且可防止陰離子性物質排斥,再附著於基板W。According to the combination of the etching solution and nitrogen or carbon dioxide, the cationic substance generated by the etching acts on the nanobubbles due to the negative ions generated on the surface of the nanobubble, and the anionic substance is prevented from repelling and adheres to the substrate W.

可藉由使用含有奈米氣泡之蝕刻液,不管氣體的種類,並藉奈米氣泡的布朗運動(Brownian motion)在蝕刻液中產生流動性,提升蝕刻處理的均一性。The uniformity of the etching treatment can be improved by using an etching solution containing a nanobubble, regardless of the kind of the gas, and by the Brownian motion of the nanobubbles to generate fluidity in the etching liquid.

根據剝離液與氧氣的組合,不光是具有剝離液除去抗蝕劑的除去作用,還具有再附著防止作用,藉由氧氣之奈米氣泡產生的作用,防止自基板W剝離之抗蝕劑帶負電而附著於基板W,還可藉由活性化之氧氣的奈米氣泡提昇剝離液對基板W的反應性、也就是剝離作用。According to the combination of the stripping liquid and the oxygen, not only the stripping liquid removes the resist, but also has a re-adhesion preventing effect, and the resist which is peeled off from the substrate W is negatively charged by the action of the oxygen bubble of oxygen. Further, adhering to the substrate W can also enhance the reactivity of the peeling liquid to the substrate W, that is, the peeling action, by the nanobubbles of the activated oxygen.

根據剝離液與二氧化碳的組合,不僅具有剝離液除去抗蝕劑之除去作用,還具有防止強鹼化作用,藉由二氧化 碳之奈米氣泡,防止因剝離液與水反應而產生之強鹼溶液對對鋁等配線圖案造成損害。According to the combination of the stripping solution and the carbon dioxide, not only the stripping liquid removes the resist removal effect, but also prevents the strong alkalization by the second oxidation. The carbon nano-bubble prevents the strong alkali solution generated by the reaction of the stripping liquid and water from damaging the wiring pattern such as aluminum.

根據剝離液與氮氣的組合,不僅具有剝離液除去抗蝕劑之除去作用,且因為藉由氮氣的奈米氣泡而使氧氣變得難以進入剝離液,因此還具有防止剝離液早期劣化之作用。According to the combination of the stripping liquid and the nitrogen gas, not only the stripping liquid removing resist is removed, but also the oxygen bubbles become difficult to enter the stripping liquid by the nanobubbles of nitrogen gas, so that the stripping liquid is prevented from deteriorating early.

根據顯像液與氧氣之組合,不僅具有顯像液之顯像作用,還可藉氧氣之奈米氣泡而提高顯像液之反應性、也就是對基板W之顯像作用。According to the combination of the developing solution and the oxygen, not only the imaging effect of the developing liquid but also the reactivity of the developing liquid, that is, the imaging effect on the substrate W, can be enhanced by the nanobubbles of oxygen.

藉由顯像液與氮氣之組合,不僅具有顯像液之顯像作用,且因為藉由氮氣的奈米氣泡而使氧氣變得難以進入顯像液,因此還具有防止顯像液早期劣化之作用。The combination of the developing solution and the nitrogen gas not only has the developing effect of the developing liquid, but also makes it difficult for the oxygen to enter the developing liquid by the nanobubbles of nitrogen gas, thereby preventing the early deterioration of the developing liquid. effect.

藉使用含有奈米氣泡之顯像液而不管氣體種類,藉由在奈米氣泡表面產生之負離子,業已顯像之陽離子性物質會吸著奈米氣泡,防止陰離子性物質,防止再附著於基板W。By using a liquid containing nano bubbles regardless of the type of gas, the negative ions generated on the surface of the nanobubbles, the cationic material that has been imaged will absorb the nanobubbles, prevent anionic substances, and prevent reattachment to the substrate. W.

藉使用含有氧氣、臭氧或氫氣之奈米氣泡之鹼系洗劑、氨水或氫氧化鈣水,藉奈米氣泡表面帶有之負離子,由基板W剝離之陽離子性物質會吸著奈米氣泡、排斥陰離子性物質而防止再附著於基板W。By using an alkali-based lotion containing ammonia, ozone or hydrogen gas, ammonia water or calcium hydroxide water, the negative ions on the surface of the nanobubble, the cationic substances peeled off from the substrate W will absorb the nanobubbles, The anionic substance is repelled to prevent reattachment to the substrate W.

藉由純水或異丙醇(IPA)洗淨90nm以下之微細圖案時,會產生洗淨不足或圖案倒塌,但若使用含有氮氣或二氧化碳之奈米氣泡之純水洗浄的話,則由於該純水之表面張力降低而提高界面活性效果,因此可防止洗浄不足或圖案倒塌。When the fine pattern of 90 nm or less is washed by pure water or isopropyl alcohol (IPA), insufficient washing or pattern collapse occurs, but if it is washed with pure water containing nitrogen or carbon dioxide, it is pure. The surface tension of water is lowered to improve the effect of interfacial activity, so that insufficient washing or pattern collapse can be prevented.

再者,藉上述各氣體與各處理液之組合處理基板W時,在處理槽1收容使用於該組合之處理液。Further, when the substrate W is processed by the combination of the respective gases and the respective treatment liquids, the treatment liquid used in the combination is accommodated in the treatment tank 1.

上述一實施形態中,分別藉由氣體供給泵與液體供給泵設定供給至氣體剪斷器之剪斷室之氣體與處理液之壓力,但亦可於氣體供給管與液體供給管設置壓力調整閥,並藉由該等壓力調整閥調整氣體與處理液之供給壓力。In the above-described embodiment, the gas supplied to the shear chamber of the gas shearer and the pressure of the treatment liquid are set by the gas supply pump and the liquid supply pump, respectively, but the pressure adjustment valve may be provided in the gas supply pipe and the liquid supply pipe. And adjusting the supply pressure of the gas and the treatment liquid by the pressure regulating valves.

又,雖然係構成為於處理槽內配置氣體剪斷器以處理基板,但亦可在設置於使基板旋轉並進行處理之螺旋處理裝置之旋轉台之上方之迴旋臂,安裝上述氣體剪斷器。而且,亦可藉使基板旋轉,且使迴旋臂迴旋後,使上述氣體剪斷器由基板之徑方向中心部朝外方移動,並且使含有奈米氣泡之處理液朝基板板面噴射,以處理基板。Further, although the gas cutter is disposed in the treatment tank to process the substrate, the gas shear may be attached to the swing arm provided above the rotary table of the spiral processing device that rotates the substrate and processes the substrate. . Further, after the substrate is rotated and the swing arm is rotated, the gas shearer is moved outward from the center portion in the radial direction of the substrate, and the treatment liquid containing the nanobubbles is sprayed toward the substrate surface. Process the substrate.

第4圖係顯示本發明之第2實施形態。該實施形態中,使用於液晶顯示裝置且由矩形玻璃基板構成之基板W保持於螺旋處理裝置21之旋轉台22。該旋轉台22收容於杯體23內,且經由主軸24而藉由馬達25驅動旋轉。Fig. 4 is a view showing a second embodiment of the present invention. In this embodiment, the substrate W composed of a rectangular glass substrate used in a liquid crystal display device is held by the turntable 22 of the spiral processing device 21. The turntable 22 is housed in the cup 23 and is driven to rotate by the motor 25 via the spindle 24.

上述旋轉台22係具有如4支支持臂26(僅圖示2支),並且於各支持臂26之前端部設有用以支持上述基板W之角部的下面之支持銷27、及卡合於角部的側面之一對卡合銷28(僅圖示1個)。The rotary table 22 has four support arms 26 (only two are shown), and a support pin 27 for supporting the lower surface of the corner portion of the substrate W is provided at the front end of each support arm 26, and is engaged with One of the side faces of the corner portion is a pair of engaging pins 28 (only one is shown).

超音波噴嘴體31係設置於保持在上述旋轉台22之基板W之上方。該超音波噴嘴體31係供給含有由第1實施形態所示之作為奈米氣泡產生機構之氣體剪斷器2所產生之奈米氣泡之處理液。超音波噴嘴體31於內部設有未圖示之振動 板,且該振動板對供給至內部之處理液賦與超音波振動。The ultrasonic nozzle body 31 is provided above the substrate W held by the turntable 22. The ultrasonic nozzle body 31 is supplied with a treatment liquid containing nano bubbles generated by the gas cutter 2 as the nano bubble generating mechanism shown in the first embodiment. The ultrasonic nozzle body 31 is internally provided with a vibration (not shown) The plate, and the vibrating plate imparts ultrasonic vibration to the processing liquid supplied to the inside.

上述超音波噴嘴31係安裝於搖動臂32之前端,且該搖動臂係在保持於旋轉台22之基板W的上方朝水平方向搖動驅動。藉此,可將由上述超音波噴嘴體31噴射之處理液均一地供給到上述基板W之板面全體。The ultrasonic nozzle 31 is attached to the front end of the swing arm 32, and the swing arm is vertically driven to be driven in the horizontal direction above the substrate W held by the turntable 22. Thereby, the processing liquid sprayed by the ultrasonic nozzle body 31 can be uniformly supplied to the entire plate surface of the substrate W.

根據如此構成之螺旋處理裝置21,含有奈米氣泡之處理液會通過超音波噴嘴體31而供給到基板W。因此,由超音波噴嘴體31朝基板W供給處理液時,其處理液所包含之奈米氣泡會因為超音波振動而在基板W之板面壓壞。According to the spiral processing apparatus 21 configured as described above, the treatment liquid containing the nanobubbles is supplied to the substrate W through the ultrasonic nozzle body 31. Therefore, when the processing liquid is supplied from the ultrasonic nozzle body 31 to the substrate W, the nanobubbles contained in the processing liquid are crushed on the surface of the substrate W due to the ultrasonic vibration.

當奈米氣泡被壓壞時,會因為其壓壞而產生氣穴作用,並因為其氣穴作用而誘發衝撃波。藉此,可大幅促進因應於使用於基板W之處理液的種類之處理作用。When the nanobubble is crushed, it will cause cavitation due to its crushing, and it will induce a wave due to its cavitation. Thereby, the handling action depending on the kind of the treatment liquid used for the substrate W can be greatly promoted.

第5圖係顯示該發明之第3實施形態。該實施形態係第2實施形態之變形例。含有由氣體剪斷器2所產生之奈米氣泡的處理液供給至處理液供給噴嘴35。該處理液供給噴嘴35係配置成朝旋轉中心將處理液供給至保持於旋轉台22之基板W的板面。Fig. 5 is a view showing a third embodiment of the invention. This embodiment is a modification of the second embodiment. The treatment liquid containing the nanobubbles generated by the gas cutter 2 is supplied to the treatment liquid supply nozzle 35. The processing liquid supply nozzle 35 is disposed to supply the processing liquid to the plate surface of the substrate W held by the turntable 22 toward the rotation center.

另一方面,安裝於搖動臂32之超音波噴嘴體31供給之液體係如純水。供給至超音波噴嘴體31之純水則被賦與超音波振動而供給至基板W之板面。On the other hand, the liquid system supplied from the ultrasonic nozzle body 31 of the swing arm 32 is supplied with pure water. The pure water supplied to the ultrasonic nozzle body 31 is supplied to the plate surface of the substrate W by ultrasonic vibration.

根據如此構成,含有由處理液供給噴嘴35供給至基板W之板面之奈米氣泡之處理液會受到由超音波噴嘴體31噴射之純水被賦與之超音波振動的作用。According to this configuration, the treatment liquid containing the nanobubbles supplied to the surface of the substrate W by the treatment liquid supply nozzle 35 is subjected to the ultrasonic vibration imparted by the pure water sprayed from the ultrasonic nozzle body 31.

藉此,處理液所含之奈米氣泡在處理液供給到基板W 後被賦與純水之超音波振動壓壞後,會因為其壓壞而產生氣穴作用,並因為其氣穴作用而誘發衝撃波。藉此,會大幅促進因應於施行於基板W之處理液的種類之處理作用。Thereby, the nanobubbles contained in the treatment liquid are supplied to the substrate W in the treatment liquid. After being crushed by the ultrasonic vibration of the pure water, it will cause cavitation due to its crushing, and induce the rushing wave due to its cavitation. Thereby, the handling action in accordance with the type of the treatment liquid applied to the substrate W is greatly promoted.

第6圖係該發明之第4實施形態,且該實施形態係藉由水平搬送處理裝置36將基板W水平搬運並進行處理,以取代螺旋處理裝置21。水平搬送處理裝置36具有以預定間隔水平配置之複數搬送輥子37,以將基板W朝箭頭方向搬送。Fig. 6 is a fourth embodiment of the present invention. In this embodiment, the substrate W is horizontally transported and processed by the horizontal transport processing device 36 instead of the spiral processing device 21. The horizontal conveyance processing device 36 has a plurality of conveyance rollers 37 horizontally arranged at predetermined intervals to convey the substrate W in the direction of the arrow.

在搬送之基板W的上面,沿著與基板W之搬送方向直交之寬度方向配置有作為超音波振動賦與機構之細長超音波噴嘴體31A。該超音波噴嘴體31A係供給含有由氣體剪斷器2產生之奈米氣泡之處理液。On the upper surface of the substrate W to be transported, an elongated ultrasonic nozzle body 31A as an ultrasonic vibration imparting mechanism is disposed in a width direction orthogonal to the transport direction of the substrate W. The ultrasonic nozzle body 31A supplies a treatment liquid containing nano bubbles generated by the gas cutter 2.

藉此,由於含有賦與超音波振動之奈米氣泡之處理液可涵跨寬度方向全長而供給至水平搬送之基板W的上面,因此當供給至基板W之上面之處理液中的奈米氣泡在基板W上面被壓壞時,會因為其壓壞而產生氣穴作用,並藉由其氣穴作用而誘發衝撃波。藉此,可大幅促進對基板W進行且因應於處理液種類之處理作用。In this way, since the treatment liquid containing the nanobubbles to which the ultrasonic vibration is applied can be supplied to the upper surface of the substrate W that is horizontally conveyed across the entire length in the width direction, the nanobubbles in the treatment liquid supplied to the upper surface of the substrate W are provided. When the substrate W is crushed, it will cause cavitation due to its crushing, and the chopping wave is induced by its cavitation. Thereby, the substrate W can be greatly promoted and treated in accordance with the type of the treatment liquid.

第7圖係顯示藉由水平搬送處理裝置36搬送基板W並進行處理之該發明之第5實施形態。該實施形態為第6圖所示之第4實施形態之變形例,且自超音波噴嘴體31A朝基板W板面供給作為賦與有超音波振動之液體的純水。Fig. 7 shows a fifth embodiment of the invention in which the substrate W is transported by the horizontal transport processing device 36 and processed. This embodiment is a modification of the fourth embodiment shown in Fig. 6, and pure water as a liquid to which ultrasonic vibration is imparted is supplied from the ultrasonic nozzle body 31A toward the surface of the substrate W.

作為處理液供給噴嘴之淋浴管件41係沿著基板W之寬度方向,配置於比上述超音波噴嘴體31A更位於基板W之搬送方向的上游側。淋浴管件41供給含有由氣體剪斷器2產生 之奈米氣泡之處理液,且其處理液供給至上述基板W之上面。The shower tube member 41 as the processing liquid supply nozzle is disposed on the upstream side in the transport direction of the substrate W in the width direction of the substrate W along the ultrasonic nozzle body 31A. The shower tube 41 supply contains a gas shear 2 The treatment liquid of the nano bubble is supplied to the upper surface of the substrate W.

根據如此構成,當藉由淋浴管件41將含有奈米氣泡之處理液供給至基板W的板面時,其處理液會受到賦與自超音波噴嘴體31A供給之純水之超音波振動的作用而被壓壞。According to this configuration, when the treatment liquid containing the nanobubbles is supplied to the surface of the substrate W by the shower tube member 41, the treatment liquid is subjected to the ultrasonic vibration imparted to the pure water supplied from the ultrasonic nozzle body 31A. And it was crushed.

當奈米氣泡壓壞時,會因為其壓壞而產生氣穴作用,並因其氣穴作用而誘發衝撃波。藉此,可大幅促進對基板W進行且因應於處理液之種類之處理作用。When the nanobubble is crushed, it will cause cavitation due to its crushing, and it will induce the rushing wave due to its cavitation. Thereby, the processing action on the substrate W and depending on the kind of the treatment liquid can be greatly promoted.

第8圖係顯示藉由水平搬送處理裝置36搬送基板W並進行處理之該發明之第6實施形態。該實施形態係與藉由搬送滾子37水平搬送之基板W的上面相對向,並且配設有複數淋浴管件41。Fig. 8 shows a sixth embodiment of the invention in which the substrate W is transported by the horizontal transport processing device 36 and processed. This embodiment is opposed to the upper surface of the substrate W horizontally conveyed by the transport roller 37, and a plurality of shower tubes 41 are disposed.

各淋浴管件41係具有全長涵括基板W之寬度方向之長度,並以預定間隔與基板W之搬送方向間隔。另一方面,在與基板W下面之上述淋浴管件41相對向之部位配置有超音波噴嘴體31A,該超音波噴嘴體係對作為液體之純水賦與超音波振動並朝上述基板之下面噴射。Each of the shower tubes 41 has a length that covers the width direction of the substrate W over the entire length, and is spaced apart from the transport direction of the substrate W by a predetermined interval. On the other hand, an ultrasonic nozzle body 31A is disposed on a portion facing the shower tube 41 below the substrate W, and the ultrasonic nozzle system applies ultrasonic vibration to the pure water as a liquid and ejects toward the lower surface of the substrate.

根據如此構成,由複數淋浴管件41將處理液供給至基板W上面,並且由超音波噴嘴體31A將賦與超音波振動之純水供給至下面。藉此,賦與供給至下面之純水之超音波振動作用於供給至基板W之上面之處理液所含之奈米氣泡,因此藉由其超音波振動壓壞處理液所含之奈米氣泡。According to this configuration, the processing liquid is supplied onto the upper surface of the substrate W by the plurality of shower tubes 41, and the pure water imparted with the ultrasonic vibration is supplied to the lower surface by the ultrasonic nozzle body 31A. Thereby, the ultrasonic vibration imparted to the pure water supplied to the lower surface acts on the nanobubbles contained in the treatment liquid supplied onto the upper surface of the substrate W, so that the ultrasonic bubbles contained in the treatment liquid are crushed by the ultrasonic vibration. .

當壓壞奈米氣泡時,會因為其壓壞而產生氣穴作用,並藉由其氣穴作用而誘發衝撃波。藉此,可大幅促進對基 板W進行且因應於處理液種類之處理作用。When the nanobubbles are crushed, cavitation is caused by the crushing, and the chopping waves are induced by the cavitation. In this way, the base can be greatly promoted. The sheet W is carried out and is treated in accordance with the type of the treatment liquid.

而且,由於含有奈米氣泡之處理液供給至基板W之上面,並且經賦與超音波振動之純水供給至基板W的下面,以壓壞處理液所含之奈米氣泡,因此供給至基板W上面之處理液可藉由純水而稀釋,而防止其處理液對於基板W之上面的處理效果降低。Further, since the treatment liquid containing the nanobubbles is supplied to the upper surface of the substrate W, and the pure water imparted with the ultrasonic vibration is supplied to the lower surface of the substrate W to crush the nanobubbles contained in the treatment liquid, the substrate is supplied to the substrate. The treatment liquid above W can be diluted by pure water to prevent the treatment liquid from lowering the treatment effect on the substrate W.

第9圖係顯示藉水平搬送處理裝置36搬送並處理基板W之本發明之第7實施形態。該實施形態中,含有由氣體剪斷器2生成之奈米氣泡之處理液,藉由作為加壓機構之加壓泵42,而加壓成如0.7MPa以上之高壓。然後,加壓成高壓之處理液供給至配置於水平搬送之基板W的上面且作為供給機構之高壓淋浴管件43。Fig. 9 shows a seventh embodiment of the present invention in which the substrate W is transported and processed by the horizontal transport processing device 36. In this embodiment, the treatment liquid containing the nanobubbles generated by the gas cutter 2 is pressurized to a high pressure of 0.7 MPa or more by the pressure pump 42 as a pressurizing means. Then, the treatment liquid pressurized to a high pressure is supplied to the high-pressure shower pipe member 43 which is disposed on the upper surface of the horizontally-transferred substrate W and serves as a supply mechanism.

含有奈米氣泡之處理液係以高壓由高壓淋浴管件43供給至基板W之上面。藉此,當處理液以高壓與基板W之板面衝突時,也就是當處理液供給至基板時,會因為其壓力而壓壞處理液所含之奈米氣泡。The treatment liquid containing the nanobubbles is supplied to the upper surface of the substrate W by the high pressure shower tube 43 at a high pressure. Thereby, when the treatment liquid collides with the plate surface of the substrate W at a high pressure, that is, when the treatment liquid is supplied to the substrate, the nanobubbles contained in the treatment liquid are crushed due to the pressure thereof.

當奈米氣泡壓壞時,會因為其壓壞而產生氣穴作用,並且因其氣穴作用而誘發衝撃波。藉此,可大幅促進對基板W進行且因應於處理液之種類之處理作用。When the nanobubble is crushed, it will cause cavitation due to its crushing, and it will induce a wave due to its cavitation. Thereby, the processing action on the substrate W and depending on the kind of the treatment liquid can be greatly promoted.

又,該第7實施形態中係舉藉由水平搬送處理裝置36水平搬送並處理基板W之例來說明,但亦可適用於使基板W旋轉並進行處理之情況。In the seventh embodiment, the horizontal transfer processing device 36 is used to convey and process the substrate W horizontally. However, the substrate W may be rotated and processed.

第10圖係顯示藉由水平搬送處理裝置36搬送並處理基板W之該發明之第8實施形態。該實施形態係第9圖所示之 第7實施形態之變形例,用以供給含有由氣體剪斷器2生成之奈米氣泡之處理液之複數淋浴管件44係沿著基板W之搬送方向以預定間隔且沿著基板W之寬度方向配置於基板W上面測。又,淋浴管件44亦可為1支。Fig. 10 shows an eighth embodiment of the invention in which the substrate W is transported and processed by the horizontal transport processing device 36. This embodiment is shown in Fig. 9. In a modification of the seventh embodiment, the plurality of shower tubes 44 for supplying the treatment liquid containing the nanobubbles generated by the gas cutter 2 are arranged at predetermined intervals along the width direction of the substrate W along the conveyance direction of the substrate W. It is placed on the substrate W for measurement. Further, the shower tube member 44 may be one.

又,用以將純水供給至前述基板W且作為液體噴射機構之高壓淋浴管件45係沿著基板W的寬度方向配置於基板W之上面側,且為比上述淋浴管件44更位於基板W之搬送方向之下游側,且前述純水與含有由作為供給加壓機構之加壓泵42a加壓成如0.7MPa以上之高壓之奈米氣泡之處理液為不同之液體。Further, the high-pressure shower pipe member 45 for supplying the pure water to the substrate W and serving as the liquid ejecting mechanism is disposed on the upper surface side of the substrate W along the width direction of the substrate W, and is located on the substrate W more than the above-described shower tube member 44. In the downstream side of the conveyance direction, the pure water is different from the treatment liquid containing the high pressure nanobubbles of 0.7 MPa or more by the pressurizing pump 42a as the supply pressurizing means.

根據如此之構成,當由複數之淋浴管件44將處理液供給至基板W之上面時,其處理液所含之奈米氣泡會因由高壓淋浴管件45以高壓供給至基板W上面之純水的壓力而崩壞,且高壓淋浴管件45係配置於比前述淋浴管件44更位於基板W之搬送方向的下游側者。According to this configuration, when the treatment liquid is supplied to the upper surface of the substrate W by the plurality of shower tubes 44, the nano-bubble contained in the treatment liquid is supplied to the pure water pressure on the substrate W by the high-pressure shower tube 45 at a high pressure. Further, the high-pressure shower pipe 45 is disposed on the downstream side of the shower tube 44 in the conveying direction of the substrate W.

當奈米氣泡被壓壞時,會因為其壓壞而產生氣穴作用,並且會因其氣穴作用而誘發衝撃波。藉此,可促進對基板W進行且因應於處理液之種類之處理作用。When the nanobubble is crushed, it will cause cavitation due to its crushing, and it will induce a wave due to its cavitation. Thereby, it is possible to promote the treatment of the substrate W in response to the type of the treatment liquid.

第4圖~第10圖所示之各實施形態中,處理液與製作奈米氣泡之氣體的組合可考慮氧氣或臭氧與純水、氮氣或二氧化碳與蝕刻液、空氣或氧氣或臭氧與剝離液、氮氣或二氧化碳與剝離液等之組合。In each of the embodiments shown in FIGS. 4 to 10, the combination of the treatment liquid and the gas for producing the nanobubbles may consider oxygen or ozone and pure water, nitrogen or carbon dioxide, and etching liquid, air or oxygen or ozone and stripping liquid. , nitrogen or carbon dioxide combined with stripping solution, and the like.

含有奈米氣泡之氣體為氧氣或臭氧,且處理液為純水時,可藉由氣穴作用之衝撃波促使來自基板W板面之有機 物的分解或微粒的脫離。When the gas containing the nanobubble is oxygen or ozone, and the treatment liquid is pure water, the organic wave from the surface of the substrate W can be promoted by the cavitation wave of the cavitation action. Decomposition of matter or detachment of particles.

含有奈米氣泡之氣體為氮氣或二氧化碳,且處理液為蝕刻液時,當因為奈米氣泡被壓壞而產生之氣穴作用誘發衝撃波時,可藉由其衝撃波除去因蝕刻產生之殘渣。同時,藉由奈米氣泡之氣體溶入處理液,具有藉由其氮氣或二氧化碳防止基板W表面氧化之效果。When the gas containing the nanobubbles is nitrogen gas or carbon dioxide, and the treatment liquid is an etching liquid, when the cavitation wave is induced by the cavitation caused by the collapse of the nanobubbles, the residue due to the etching can be removed by the blast wave. At the same time, the gas of the nanobubbles is dissolved in the treatment liquid, and has an effect of preventing oxidation of the surface of the substrate W by nitrogen or carbon dioxide.

含有奈米氣泡之氣體為空氣或氧氣或臭氧,且處理液為剝離液時,藉由奈米氣泡表面之負離子而剝離之陽離子性物質會吸著奈米氣泡,並且排斥陰離子性物質而防止再附著於基板W。When the gas containing the nanobubbles is air or oxygen or ozone, and the treatment liquid is a stripping solution, the cationic substance which is peeled off by the negative ions on the surface of the nanobubble absorbs the nanobubbles and repels the anionic substance to prevent reattachment. On the substrate W.

而且,由於奈米氣泡中具有吸收金屬離子(鋁系、鉬系、鎢系、銅系)等之性質,因此可同時除去金屬離子。Further, since the nanobubbles have properties such as absorption of metal ions (aluminum, molybdenum, tungsten, or copper), metal ions can be simultaneously removed.

含有奈米氣泡之氣體為氮氣或碳氣,且處理液為剝離液時,可藉由因奈米氣泡壓壞而產生之氣穴作用誘發之衝撃波,除去剝離液之殘渣。進而,當氣體為二氧化碳時,可藉壓壞奈米氣泡來防止液的劣化。又,以純水將基板W之表面的剝離液漂洗時,剝離液所含之二氧化碳可防止剝離液與純水反應而成為強鹼性。When the gas containing the nanobubbles is nitrogen gas or carbon gas, and the treatment liquid is a stripping liquid, the residue of the stripping liquid can be removed by the wave which is induced by the cavitation action caused by the collapse of the nanobubbles. Further, when the gas is carbon dioxide, the deterioration of the liquid can be prevented by crushing the nanobubbles. Further, when the peeling liquid on the surface of the substrate W is rinsed with pure water, the carbon dioxide contained in the peeling liquid can prevent the peeling liquid from reacting with the pure water to become strongly alkaline.

產業上之可利用性Industrial availability

根據該發明,可使氣體與處理液迴旋且供給至氣體剪斷器之剪斷室,並藉由氣體與處理液之間的迴旋速度差,以流體力學方式剪斷氣體,使之產生奈米氣泡。因此,在氣體溶入處理液前,可有效率地產生奈米氣泡,故可藉由含有奈米氣泡之處理液有效率地洗淨基板。According to the invention, the gas and the treatment liquid can be swirled and supplied to the shear chamber of the gas shearer, and the gas is mechanically cut by the difference in the speed of the swirl between the gas and the treatment liquid to produce a nanometer. bubble. Therefore, since the nanobubbles can be efficiently generated before the gas is dissolved in the treatment liquid, the substrate can be efficiently washed by the treatment liquid containing the nanobubbles.

1‧‧‧處理室1‧‧‧Processing room

3b‧‧‧前部空間部3b‧‧‧Front Space Department

2‧‧‧氣體剪斷器2‧‧‧ gas cutter

4‧‧‧本體4‧‧‧Ontology

3‧‧‧剪斷室3‧‧‧cutting room

5‧‧‧噴射口5‧‧‧jet

3a‧‧‧後部空間部3a‧‧‧After the Ministry of Space

6‧‧‧氣體供給口6‧‧‧ gas supply port

7‧‧‧液體供給口7‧‧‧Liquid supply port

11‧‧‧氣體迴旋用金屬蓋11‧‧‧Metal cover for gas swirl

12‧‧‧氣體供給泵12‧‧‧ gas supply pump

13‧‧‧氣體供給管13‧‧‧ gas supply pipe

14‧‧‧第1開關閥14‧‧‧1st on-off valve

15‧‧‧氣體空洞部15‧‧‧Gas Cavity Department

16‧‧‧液體供給金屬蓋16‧‧‧Liquid supply metal cover

17‧‧‧液體供給泵17‧‧‧Liquid supply pump

18‧‧‧液體供給管18‧‧‧Liquid supply tube

19‧‧‧第2開關閥19‧‧‧2nd on-off valve

21‧‧‧螺旋處理裝置21‧‧‧Spiral treatment device

22‧‧‧旋轉台22‧‧‧Rotating table

23‧‧‧杯體23‧‧‧ cup body

24‧‧‧主軸24‧‧‧ Spindle

25‧‧‧馬達25‧‧‧Motor

26‧‧‧支持臂26‧‧‧Support arm

27‧‧‧支持銷27‧‧‧Support pins

28‧‧‧卡合銷28‧‧‧ card sales

31,31A‧‧‧超音波噴嘴體31,31A‧‧‧Supersonic nozzle body

32‧‧‧搖動臂32‧‧‧Shake arm

35‧‧‧液體供給噴嘴35‧‧‧Liquid supply nozzle

36‧‧‧水平搬送處理裝置36‧‧‧Horizontal handling device

37‧‧‧搬送輥子37‧‧‧Transport roller

41,43,44‧‧‧淋浴管件41,43,44‧‧‧ Shower fittings

42,42a‧‧‧加壓泵42,42a‧‧‧Pressure pump

45‧‧‧高壓淋浴管件45‧‧‧High pressure shower fittings

L‧‧‧純水L‧‧‧ pure water

P1‧‧‧氧氣之供給壓力P1‧‧‧Oxygen supply pressure

P2‧‧‧純水之供給壓力P2‧‧‧ supply pressure of pure water

V1‧‧‧氧氣之迴旋速度V1‧‧‧ Oxygen gyroscopic speed

V2‧‧‧純水之迴旋速度V2‧‧‧ pure water swing speed

W‧‧‧基板W‧‧‧Substrate

第1圖係顯示本發明之第1實施形態之處理裝置的概略構成圖。Fig. 1 is a schematic block diagram showing a processing apparatus according to a first embodiment of the present invention.

第2圖係沿著氣體剪斷器之軸方向之截面圖。Figure 2 is a cross-sectional view along the axial direction of the gas shear.

第3圖係由後端觀看氣體剪斷器之側面圖。Figure 3 is a side view of the gas cutter viewed from the rear end.

第4圖係顯示本發明之第2實施形態之螺旋處理裝置的概略構成圖。Fig. 4 is a schematic block diagram showing a spiral processing apparatus according to a second embodiment of the present invention.

第5圖係顯示本發明之第3實施形態之螺旋處理裝置的概略構成圖。Fig. 5 is a schematic block diagram showing a spiral processing apparatus according to a third embodiment of the present invention.

第6圖係顯示本發明之第4實施形態之水平搬送處理裝置之概略構成圖。Fig. 6 is a schematic block diagram showing a horizontal conveyance processing apparatus according to a fourth embodiment of the present invention.

第7圖係顯示本發明之第5實施形態之水平搬送處理裝置之概略構成圖。Fig. 7 is a schematic block diagram showing a horizontal conveyance processing device according to a fifth embodiment of the present invention.

第8圖顯示本發明之第6實施形態之水平搬送處理裝置之概略構成圖。Fig. 8 is a view showing a schematic configuration of a horizontal transport processing device according to a sixth embodiment of the present invention.

第9圖係顯示本發明之第7實施形態之水平搬送處理裝置之概略構成圖。Fig. 9 is a schematic block diagram showing a horizontal conveyance processing apparatus according to a seventh embodiment of the present invention.

第10圖係顯示本發明之第8實施形態之水平搬送處理裝置之概略構成圖。Fig. 10 is a schematic block diagram showing a horizontal conveyance processing apparatus according to an eighth embodiment of the present invention.

2‧‧‧氣體剪斷器2‧‧‧ gas cutter

3‧‧‧剪斷室3‧‧‧cutting room

4‧‧‧本體4‧‧‧Ontology

11‧‧‧氣體迴旋用金屬蓋11‧‧‧Metal cover for gas swirl

13‧‧‧氣體供給管13‧‧‧ gas supply pipe

16‧‧‧液體供給金屬蓋16‧‧‧Liquid supply metal cover

18‧‧‧液體供給管18‧‧‧Liquid supply tube

36‧‧‧水平搬送處理裝置36‧‧‧Horizontal handling device

37‧‧‧搬送輥子37‧‧‧Transport roller

42‧‧‧加壓泵42‧‧‧Pressure pump

43‧‧‧淋浴管件43‧‧‧ Shower fittings

Claims (7)

一種基板之處理裝置,係藉處理液處理基板者,其特徵在於包含有用以產生奈米氣泡,並使該奈米氣泡混合於前述處理液之奈米氣泡產生機構,且前述奈米氣泡產生機構係由下述所構成:氣體剪斷器,係於內部形成有剪斷室者;氣體供給部,係設置於前述氣體剪斷器之軸方向之一端部,並且使前述氣體迴旋供給至前述剪斷室者;及液體供給部,係設置於前述氣體剪斷器之一端部之外周面,並且使前述處理液迴旋供給至前述剪斷室,並且藉由其與前述氣體之迴旋速度差而由前述氣體產生前述奈米氣泡者,又,前述基板之處理裝置並具有:處理液供給機構,係將含有由前述奈米氣泡產生機構所產生之奈米氣泡之前述處理液供給至前述基板板面者;及加壓機構,係對由前述處理液供給機構供給至前述基板板面之處理液中所含之奈米氣泡,施加可在前述基板板面壓壞其之壓力者。 A substrate processing apparatus for processing a substrate by a processing liquid, comprising: a nano bubble generating mechanism for generating a nanobubble and mixing the nano bubble with the processing liquid; and the nano bubble generating mechanism The gas shearer is provided with a shear chamber formed therein; the gas supply unit is disposed at one end of the gas shearer in the axial direction, and supplies the gas swirl to the shear a liquid chamber, and a liquid supply portion disposed on an outer peripheral surface of one end of the gas shearer, and swirling the treatment liquid to the shear chamber, and by the difference in swirl speed with the gas In the above-described substrate, the processing device for the substrate further includes a processing liquid supply mechanism that supplies the processing liquid containing the nanobubbles generated by the nano bubble generating mechanism to the substrate surface. And a pressurizing mechanism for applying the nanobubbles contained in the treatment liquid supplied to the surface of the substrate by the processing liquid supply mechanism; Crushed by the pressure of its plate surface of. 如申請專利範圍第1項之基板之處理裝置,其中前述加壓機構係加壓泵,該加壓泵對由前述奈米產生機構供給至前述處理液供給機構之處理液進行加壓,使該處理液中所含之奈米氣泡壓壞。 The processing device for a substrate according to the first aspect of the invention, wherein the pressurizing mechanism is a pressurizing pump that pressurizes a processing liquid supplied from the nano generating mechanism to the processing liquid supply mechanism, The nanobubbles contained in the treatment liquid are crushed. 如申請專利範圍第1項之基板之處理裝置,其中前述基板係藉由水平搬送機構水平搬送者, 且前述加壓機構係可將與前述處理液不同之其他液體加壓至可使前述奈米氣泡壓壞之壓力之加壓泵,並且由前述加壓泵所加壓之液體係藉由液體噴射機構而噴射供給至,比前述基板板面藉前述處理液供給機構供給前述處理液之部位更位於前述基板之搬送方向下游側之部位。 The processing device for a substrate according to claim 1, wherein the substrate is horizontally transported by a horizontal transfer mechanism, And the pressurizing mechanism is a pressurizing pump that pressurizes a liquid different from the processing liquid to a pressure that can crush the nanobubbles, and the liquid system pressurized by the pressurizing pump is sprayed by the liquid. The mechanism is supplied to the portion on the downstream side in the transport direction of the substrate from the portion of the substrate surface on which the processing liquid supply means supplies the processing liquid. 一種基板之處理方法,係藉處理液處理基板者,其特徵在於包含有:混合步驟,係產生奈米氣泡,並使該奈米氣泡與前述處理液混合;供給步驟,係將含有奈米氣泡之前述處理液供給至前述基板板面;及加壓步驟,係對供給至前述基板板面之處理液中所含之奈米氣泡,施加可在前述基板板面壓壞其之壓力。 A method for processing a substrate by treating a substrate with a treatment liquid, comprising: a mixing step of generating a nanobubble and mixing the nanobubble with the treatment liquid; and a supply step of containing a nanobubble The treatment liquid is supplied to the substrate plate surface; and the pressurizing step applies a pressure which can be crushed on the substrate surface of the nano-bubble contained in the treatment liquid supplied to the substrate surface. 如申請專利範圍第4項之基板之處理方法,其中當前述處理液供給至前述基板時,使前述處理液所含之奈米氣泡壓壞。 The method for processing a substrate according to claim 4, wherein when the processing liquid is supplied to the substrate, the nanobubbles contained in the treatment liquid are crushed. 如申請專利範圍第4項之基板之處理方法,其中在前述處理液供給至前述基板後,使前述處理液所含之奈米氣泡壓壞。 The method for processing a substrate according to claim 4, wherein after the treatment liquid is supplied to the substrate, the nanobubbles contained in the treatment liquid are crushed. 一種基板之處理方法,係藉處理液處理基板者,且該處理方法係藉如申請專利範圍第1項之處理裝置處理前述基板。A method of processing a substrate by treating a substrate with a processing liquid, and the processing method is to process the substrate by a processing device according to claim 1 of the patent application.
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