TWI405215B - Addreessing signal transmission method and memory system - Google Patents
Addreessing signal transmission method and memory system Download PDFInfo
- Publication number
- TWI405215B TWI405215B TW98112569A TW98112569A TWI405215B TW I405215 B TWI405215 B TW I405215B TW 98112569 A TW98112569 A TW 98112569A TW 98112569 A TW98112569 A TW 98112569A TW I405215 B TWI405215 B TW I405215B
- Authority
- TW
- Taiwan
- Prior art keywords
- bit
- group
- memory
- bit group
- msb
- Prior art date
Links
- 238000000034 method Methods 0.000 title claims abstract description 17
- 230000008054 signal transmission Effects 0.000 title claims description 11
- 230000005540 biological transmission Effects 0.000 claims abstract description 43
- 238000010586 diagram Methods 0.000 description 17
- 239000000872 buffer Substances 0.000 description 15
- 102100039940 Gem-associated protein 7 Human genes 0.000 description 4
- 101000886583 Homo sapiens Gem-associated protein 7 Proteins 0.000 description 4
- 238000004891 communication Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000000977 initiatory effect Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
Landscapes
- Read Only Memory (AREA)
Abstract
Description
本發明是有關於一種位址訊號傳輸方法,且特別是有關於一種應用於串列式快閃記憶體(Serial flash)之位址訊號傳輸方法。The present invention relates to an address signal transmission method, and more particularly to an address signal transmission method applied to a serial flash memory.
在現有之技術中,串列式快閃記憶體(Serial Flash)技術係已存在,並被廣泛地應用在各種電子產品中。一般來說,串列式快閃記憶體經由其之輸出輸入接腳(Pin)序列地接收存取指令及位址訊號,並收送存取資料。In the prior art, serial flash memory technology has existed and is widely used in various electronic products. Generally, the serial flash memory sequentially receives an access command and an address signal via its output input pin (Pin), and receives the access data.
一般來說,串列式快閃記憶體經由時脈訊號接腳、晶片選擇接腳、輸入接腳及輸出接腳來分別接收時脈訊號、接收晶片選擇訊號、接收存取控制指令與位址訊號及輸出存取資料。以串列式快閃記憶體之讀取操作為例,晶片選擇接腳接收之晶片選擇訊號CS持續地為低訊號位準,時脈訊號接腳接收時脈訊號SCLK,而讀取串列資料包括以時脈訊號SCLK為基準(Clock Based)之8位元(Bit)控制指令、24位元位址訊號及若干筆以8位元讀取資料,如第1圖所示。其中在接收到位址訊號後之6個緩衝週期(Dummy Cycle)中,快閃記憶體根據位址訊號指示之起始位址對快閃記憶體之記憶體陣列進行讀取操作。如此,以在n個緩衝週期後提供多筆以8位元為單位之讀取資料。In general, the serial flash memory receives the clock signal, the receiving chip selection signal, the receiving access control command and the address respectively via the clock signal pin, the chip selection pin, the input pin and the output pin. Signal and output access data. Taking the read operation of the tandem flash memory as an example, the wafer selection signal CS received by the chip selection pin is continuously at a low signal level, and the clock signal pin receives the clock signal SCLK, and reads the serial data. It includes an 8-bit (Bit) control command based on the clock signal SCLK (Clock Based), a 24-bit address signal, and a number of pens to read data in 8-bit, as shown in FIG. In the six buffer periods (Dummy Cycle) after receiving the address signal, the flash memory reads the memory array of the flash memory according to the start address indicated by the address signal. Thus, multiple pieces of read data in units of 8 bits are provided after n buffer cycles.
然而在上述例子中,快閃記憶體需在6個緩衝週期內完成致能字元線(Word Line)電壓、位元線(Bit Line)電壓及感測對應之記憶區塊儲存之資料等讀取操作。一般來說,過短之讀取時間會導致讀取結果容易發生錯誤。因此,如何在現有之通訊協定下爭取更多之資料讀取時間為業界不斷致力的方向之一。However, in the above example, the flash memory needs to complete the word line voltage, the bit line voltage, and the data stored in the memory block corresponding to the sensing in six buffer cycles. Take the operation. In general, too short a read time can cause errors in reading results. Therefore, how to obtain more data reading time under the existing communication agreement is one of the direction that the industry is constantly striving for.
本發明係有關於一種記憶體系統,其係應用多個輸出輸入接腳來接收位址資料。本發明相關之記憶體系統更根據記憶體之記憶容量來利用位址訊號中若干閒置最高位位元(Most Significant Bit,MSB)來傳輸位址訊號中最低位位元(Least Significant Bit,LSB)中部份之位元。如此,相較於傳統快閃記憶體,本發明相關之記憶體系統可有效地爭取更多之資料讀取時間。The present invention relates to a memory system that uses a plurality of output input pins to receive address data. The memory system related to the present invention uses a number of idle Most Significant Bits (MSBs) of the address signal to transmit the Least Significant Bit (LSB) of the address signal according to the memory capacity of the memory. Part of the middle. Thus, the memory system related to the present invention can effectively strive for more data reading time than conventional flash memory.
根據本發明之一方面,提出一種位址訊號傳輸方法,用以傳輸位址訊號至記憶體,位址訊號被分為一原始最高位位元(Most Significant Bit,MSB)群及一最低位位元(Lest Significant Bit,LSB)群。位址訊號傳輸方法包括下列步驟。首先傳輸一MSB群,此MSB群包括一部份之此原始MSB群及一部份之此LSB群。之後傳輸此LSB群。According to an aspect of the present invention, an address signal transmission method is provided for transmitting an address signal to a memory, and the address signal is divided into an original Most Significant Bit (MSB) group and a lowest position. Lest Significant Bit (LSB) group. The address signal transmission method includes the following steps. First, an MSB group is transmitted. The MSB group includes a portion of the original MSB group and a portion of the LSB group. This LSB group is then transmitted.
根據本發明之另一方面,提出一種記憶體系統,包括記憶體及主機端電路。主機端電路根據記憶體之記憶體容量,決定一筆位址訊號之一閒置MSB群及一正常位元群。主機端電路根據此筆位址訊號之一取代位元群取代此位址訊號中之此閒置MSB群,以於第一傳輸期間中輸出此取代位元群至記憶體,並於第二傳輸期間中輸出此正常位元群至記憶體。其中此取代位元群對應至此正常位元中傳輸次序最後之位元群。According to another aspect of the present invention, a memory system is provided that includes a memory and a host-side circuit. The host computer determines one of the address signals to idle the MSB group and a normal bit group according to the memory capacity of the memory. The host circuit replaces the idle MSB group in the address signal according to one of the bit address signals to output the replacement bit group to the memory during the first transmission period, and during the second transmission period. This normal bit group is output to the memory. The replacement bit group corresponds to the last bit group of the transmission order in the normal bit.
根據本發明之再一方面,提出一種位址訊號傳輸方法,用以傳輸位址訊號至記憶體,位址訊號傳輸方法包括下列步驟。首先根據記憶體之記憶體容量決定位址訊號之一閒置MSB群及一正常位元群。接著根據此筆位址訊號之一取代位元群取代位址訊號中之此閒置MSB群,其中此取代位元群對應至此正常位元群中傳輸次序最後之位元群。然後於第一傳輸期間中輸出此取代位元群至記憶體。之後於第二傳輸期間中輸出此正常位元群至記憶體。According to still another aspect of the present invention, an address signal transmission method is provided for transmitting an address signal to a memory. The address signal transmission method includes the following steps. First, one of the address signals is determined to be an idle MSB group and a normal bit group according to the memory capacity of the memory. Then, the idle MSB group in the address group signal is replaced by one of the bit address signals, wherein the replacement bit group corresponds to the last bit group in the transmission order of the normal bit group. The replacement bit group is then output to the memory during the first transmission period. This normal bit group is then output to the memory during the second transmission period.
為讓本發明之上述內容能更明顯易懂,下文特舉一較佳實施例,並配合所附圖式,作詳細說明如下:In order to make the above-mentioned contents of the present invention more comprehensible, a preferred embodiment will be described below, and in conjunction with the drawings, a detailed description is as follows:
本實施例之記憶體系統係透過調整後之介面來進行位址訊號之傳輸。The memory system of this embodiment transmits the address signal through the adjusted interface.
本實施例之記憶體系統包括記憶體及主機端電路。主機端電路根據記憶體之記憶體容量決定一筆位址訊號之閒置最高位位元(Most Significant Bit,MSB)群及正常位元群。主機端電路根據此筆位址訊號之一取代位元群取代位址訊號中之此閒置MSB群,以於第一傳輸期間中輸出此取代位元群至記憶體,並於第二傳輸期間中輸出此正常位元群至記憶體。其中,此取代位元群對應至此正常位元群中傳輸次序最後之位元群。The memory system of this embodiment includes a memory and a host side circuit. The host-side circuit determines the idle Most Significant Bit (MSB) group and the normal bit group of an address signal according to the memory capacity of the memory. The host circuit replaces the idle MSB group in the address signal according to one of the bit address signals to output the replacement bit group to the memory during the first transmission period, and in the second transmission period This normal bit group is output to the memory. The replacement bit group corresponds to the last bit group of the transmission order in the normal bit group.
請參照第2圖,其繪示依照本發明實施例之記憶體系統的方塊圖。記憶體系統1包括記憶體12及主機端電路14。記憶體12例如為串列式快閃記憶體(Serial Flash)。主機端用以經由介面IF提供之存取指令Cm與位址訊號S_ad至記憶體12。Please refer to FIG. 2, which is a block diagram of a memory system in accordance with an embodiment of the present invention. The memory system 1 includes a memory 12 and a host side circuit 14. The memory 12 is, for example, a serial flash memory. The host side uses the access command Cm and the address signal S_ad provided by the interface IF to the memory 12.
請參照第3圖,其繪示乃第2圖之記憶體12的詳細方塊圖。記憶體12包括接腳電路、位址訊號產生器20、X解碼器22、記憶體陣列24、記憶體頁緩衝器(Page Buffer)26、Y解碼器28、感測電路30、輸出緩衝器32、及資料暫存器38。Please refer to FIG. 3, which is a detailed block diagram of the memory 12 of FIG. The memory 12 includes a pin circuit, an address signal generator 20, an X decoder 22, a memory array 24, a memory page buffer 26, a Y decoder 28, a sensing circuit 30, and an output buffer 32. And data register 38.
請參照第4圖,其繪示乃記憶體12之記憶體陣列24的示意圖。舉例來說,記憶體陣列24包括4個記憶區塊Ma、Mb、Mc及Md,各記憶區塊Ma-Md之記憶容量為32百萬位元(Megabit,MB)。換言之,記憶體陣列24之記憶容量為128MB。Please refer to FIG. 4, which is a schematic diagram of the memory array 24 of the memory 12. For example, the memory array 24 includes four memory blocks Ma, Mb, Mc, and Md, and the memory capacity of each memory block Ma-Md is 32 megabits (Megabit, MB). In other words, the memory array 24 has a memory capacity of 128 MB.
舉例來說,記憶體陣列以一個位元組(Byte)為最小存取單位,記憶體陣列24利用位址訊號S_ad來對記憶體陣列24中之224 (128MB=224 Bytes)個位元組進行定址。位址訊號S_ad包括24個位元A0、A1、…、A23,其中位元A0及A23分別為最低位位元(Least Significant Bit,LSB)及最高位位元(Most Significant Bit,MSB)。舉例來說,位址訊號S_ad之數值(000000)16 -(3FFFFF)16 係對應至記憶區塊Ma;數值(400000)16 -(7FFFFF)16 係對應至記憶區塊Mb;數值(800000)16 -(BFFFFF)16 係對應至記憶區塊Mc;數值(C00000)16 -(FFFFFF)16 係對應至記憶區塊Md。For example, the memory array uses a byte as the minimum access unit, and the memory array 24 uses the address signal S_ad to address 2 24 (128 MB=2 24 Bytes) bits in the memory array 24. The group is addressed. The address signal S_ad includes 24 bits A0, A1, ..., A23, wherein the bits A0 and A23 are the Least Significant Bit (LSB) and the Most Significant Bit (MSB), respectively. For example, the value of the address signal S_ad (000000) 16 - (3FFFFF) 16 corresponds to the memory block Ma; the value (400000) 16 - (7FFFFF) 16 corresponds to the memory block Mb; the value (800000) 16 - (BFFFFF) 16 corresponds to the memory block Mc; the value (C00000) 16 - (FFFFFF) 16 corresponds to the memory block Md.
據此,當位元A22及A23(即是位址訊號S_ad之兩個MSB)對應至數值00時,位址訊號S_ad指向記憶體陣列24中之記憶區塊Ma;當位元A22及A23對應至數值01時,位址訊號S_ad指向記憶體陣列24中之記憶區塊Mb;當位元A22及A23對應至數值10時,位址訊號S_ad指向記憶體陣列24中之記憶區塊Mc;當位元A22及A23對應至數值11時,位址訊號S_ad指向記憶體陣列24中之記憶區塊Md。Accordingly, when the bits A22 and A23 (ie, the two MSBs of the address signal S_ad) correspond to the value 00, the address signal S_ad points to the memory block Ma in the memory array 24; when the bits A22 and A23 correspond When the value is 01, the address signal S_ad points to the memory block Mb in the memory array 24; when the bits A22 and A23 correspond to the value 10, the address signal S_ad points to the memory block Mc in the memory array 24; When bits A22 and A23 correspond to a value of 11, the address signal S_ad points to the memory block Md in the memory array 24.
一般串列式快閃記憶體多被應用為低記憶容量(Low Density)之應用場合中,舉例來說,記憶區塊Mb-Md係為失能,而僅有記憶區塊Ma為致能。如此,記憶體12被視為記憶容量為32MB之串列式快閃記憶體。在這個例子中,位元A22及A23恆對應至數值00。In general, tandem flash memory is often used in applications with low memory density (Low Density). For example, the memory block Mb-Md is disabled, and only the memory block Ma is enabled. Thus, the memory 12 is regarded as a tandem flash memory having a memory capacity of 32 MB. In this example, bits A22 and A23 correspond to the value 00.
接腳電路用以透過介面IF,接收主機端電路14提供之指令Cm與位址訊號S_ad。接腳電路例如包括高電壓訊號接腳(未繪示)及接地電壓訊號接腳(未繪示),分別用以接收電路高電壓訊號及電路接地電壓訊號。接腳電路更例如包括輸出輸入接腳P_SI/SIO0、P_SO/SIO1、P_WP#/SIO2、P_HOLD#/SIP3、時脈訊號接腳P_SCLK及晶片選擇訊號接腳P_CS#,經由介面IF接收主機端電路14提供之操作指令及位址訊號來對記憶體12進行存取操作。The pin circuit is configured to receive the command Cm and the address signal S_ad provided by the host terminal circuit 14 through the interface IF. The pin circuit includes, for example, a high voltage signal pin (not shown) and a ground voltage signal pin (not shown) for receiving the circuit high voltage signal and the circuit ground voltage signal, respectively. The pin circuit further includes, for example, an output input pin P_SI/SIO0, P_SO/SIO1, P_WP#/SIO2, P_HOLD#/SIP3, a clock signal pin P_SCLK, and a chip selection signal pin P_CS#, and receives the host terminal circuit via the interface IF. 14 provides an operation command and an address signal to access the memory 12.
在一個操作實例中,操作指令為讀取指令,此時接腳電路的傳輸訊號時序圖如第5圖所示。輸出輸入接腳P_SI/SIO0係於時序訊號SCLK之脈衝0~7接收8位元之讀取命令。然後輸出輸入接腳P_SI/SIO0、P_SO/SIO1、P_WP#/SI02及P_HOLD#/SIP3於時序脈衝8~13依序地接收位元A23-A0,並將其暫存於資料暫存器36a中。In an operation example, the operation instruction is a read instruction, and the transmission signal timing diagram of the pin circuit is as shown in FIG. The output input pin P_SI/SIO0 receives the 8-bit read command from the pulse 0~7 of the timing signal SCLK. Then, the output input pins P_SI/SIO0, P_SO/SIO1, P_WP#/SI02, and P_HOLD#/SIP3 sequentially receive the bits A23-A0 in the timing pulses 8~13, and temporarily store them in the data register 36a. .
然後,n個脈衝週期係用以作為讀取緩衝,n為自然數。舉例來說,n等於6。在第13個脈衝週期結束後(完整接收位元A23-A0),位址訊號產生器20根據資料暫存器36a中之位址訊號S_ad啟動讀取操作,以驅動X解碼器22、記憶體頁緩衝器26、Y解碼器28及感測電路30來讀取記憶體陣列24中位址訊號S_ad指向之讀取位元組,並將其中之資料儲存於輸出緩衝器32中。在這個例子中,感測電路30中包括8個感測放大器電路(對應至此讀取位元組之8個位元),用以在兩個脈衝週期中感測由位址訊號S_ad定址之此讀取位元組中儲存之8位元資料。Then, n pulse periods are used as read buffers, and n is a natural number. For example, n is equal to 6. After the end of the thirteenth pulse period (complete reception bit A23-A0), the address signal generator 20 initiates a read operation based on the address signal S_ad in the data register 36a to drive the X decoder 22 and the memory. The page buffer 26, the Y decoder 28 and the sensing circuit 30 read the read byte pointed to by the address signal S_ad in the memory array 24, and store the data therein in the output buffer 32. In this example, the sensing circuit 30 includes eight sense amplifier circuits (corresponding to 8 bits of the read byte) for sensing the address addressed by the address signal S_ad in two pulse periods. Read the 8-bit data stored in the byte.
於時序脈衝19結束後,輸出緩衝器32經由輸出輸入接腳P_SI/SIO0、P_SO/SIO1、P_WP#/SI02及P_HOLD#/SIP3輸出多筆以一個位元組為單位之讀取資料。After the end of the timing pulse 19, the output buffer 32 outputs a plurality of reading data in units of one bit via the output input pins P_SI/SIO0, P_SO/SIO1, P_WP#/SI02, and P_HOLD#/SIP3.
在另一個操作實例中,位址訊號產生器20於第12脈衝週期結束後(接收位元A23-A4)即啟動讀取操作。換言之,這個例子在未接收到位元A3-A0之情形下啟動讀取操作,如此,可根據位址訊號S_ad之20個MSB對應至16(24 =16)個位元組。位址訊號產生器20驅動X解碼器22、記憶體頁緩衝器26及感測電路30來讀取記憶體陣列24中對應之16個位元組中儲存之資料。之後在接收到位元A0-A3後,位址訊號產生器20根據位元A0-A3驅動Y解碼器28,以從此對應之16個位元組中選取欲讀取位元組中之資料,並將讀取位元組之資料儲存在輸出緩衝器32中。In another example of operation, the address signal generator 20 initiates a read operation after the end of the 12th pulse period (receiving bits A23-A4). In other words, this example is not received in place in the case of A3-A0 membered start the reading operation, thus, may correspond to 16 (24 = 16) The 20 MSB of the address signals S_ad bytes. The address signal generator 20 drives the X decoder 22, the memory page buffer 26, and the sensing circuit 30 to read the data stored in the corresponding 16 bytes in the memory array 24. After receiving the bits A0-A3, the address signal generator 20 drives the Y decoder 28 according to the bits A0-A3 to select the data to be read from the corresponding 16 bytes, and The data of the read byte is stored in the output buffer 32.
相較於在第13個脈衝週期結束後啟動讀取操作之操作實例,前述在第12個脈衝週期結束後啟動讀取操作之操作實例可提早一個脈衝週期(由第13個脈衝週期提前至第12個脈衝週期)來啟動讀取操作,如此,可實質上延長記憶體12之讀取操作時間。然而,前述提早一個脈衝週期啟動讀取操作之操作實例需使用包括128(8×24 )個感測放大器之感測電路30實現。這樣一來,在第12個脈衝週期結束後啟動讀取操作之操作實例會因使用之感測放大器數目過高且同時使用四組輸出輸入接腳,導致記憶體12之電路雜訊過高之問題。Compared with the operation example of starting the read operation after the end of the 13th pulse period, the aforementioned operation example of starting the read operation after the end of the 12th pulse period can advance one pulse period (advance from the 13th pulse period to the first The read operation is initiated by 12 pulse periods, and thus, the read operation time of the memory 12 can be substantially extended. However, the aforementioned operational example of initiating a read operation one pulse period earlier is implemented using a sensing circuit 30 comprising 128 (8 x 2 4 ) sense amplifiers. In this way, the operation example of starting the read operation after the end of the 12th pulse period will cause the circuit noise of the memory 12 to be too high due to the excessive number of sense amplifiers used and the use of four sets of output input pins at the same time. problem.
在另一個操作實例中,操作指令亦為讀取指令,此時接腳電路的傳輸訊號時序圖如第6圖所示。與第5圖所示之例子不同地,主機端電路14根據記憶體12之記憶體容量,決定位址訊號S_ad之閒置MSB群及正常位元群。在一個例子中,此閒置MSB群為對應數值恆為00之位元A22及A23,而此正常位元群包括位元A0-A21。In another example of operation, the operation command is also a read command. At this time, the transmission signal timing diagram of the pin circuit is as shown in FIG. Unlike the example shown in FIG. 5, the host terminal circuit 14 determines the idle MSB group and the normal bit group of the address signal S_ad based on the memory capacity of the memory 12. In one example, the idle MSB group is a bit A22 and A23 whose corresponding value is always 00, and the normal bit group includes bits A0-A21.
主機端電路14更根據位址訊號S_ad之一取代位元群取代此閒置MSB群,以於第一傳輸期間中輸出此取代位元群至記憶體12,並於第二傳輸期間中輸出此正常位元群至記憶體12。此第一傳輸期間例如對應至第8個脈衝週期,此第二傳輸期間例如對應至第8-13個脈衝週期。The host circuit 14 further replaces the idle MSB group according to one of the address signals S_ad to output the replacement bit group to the memory 12 during the first transmission period, and outputs the normal during the second transmission period. The bit group is to the memory 12. This first transmission period corresponds, for example, to the 8th pulse period, which corresponds, for example, to the 8th-13th pulse period.
此取代位元群對應至此正常位元群中傳輸次序最後之位元群。換言之,主機端電路14在原傳輸此閒置MSB群之脈衝期間中改傳輸位址訊號S_ad中傳輸次序最後之位元群。This replacement bit group corresponds to the last bit group in the transmission order of this normal bit group. In other words, the host side circuit 14 modifies the last bit group of the transmission order in the address signal S_ad during the original transmission of the pulse of the idle MSB group.
舉例來說,此取代位元群包括輸出輸入接腳P_WP#/SIO2及P_NC/SIO3於第13個脈衝週期接收之位元A2及A3。換言之,於第8個脈衝週期中,主機端電路14經由輸出輸入接腳P_WP#_SIO2及P_NC/SIO3分別提供位元A2及A3至記憶體12。如此,對於主機端電路14來說,主機端電路14在第12個脈衝期間結束後實質上完成傳輸位址訊號S_ad中位元A2-A21至記憶體12之操作。For example, the replacement bit group includes the bit inputs A2 and A3 received by the output input pins P_WP#/SIO2 and P_NC/SIO3 at the 13th pulse period. In other words, in the eighth pulse period, the host side circuit 14 supplies the bits A2 and A3 to the memory 12 via the output input pins P_WP#_SIO2 and P_NC/SIO3, respectively. Thus, for the host side circuit 14, the host side circuit 14 substantially completes the operation of transferring the bit A2-A21 to the memory 12 in the address signal S_ad after the end of the 12th pulse period.
從另一個角度來說,主機端電路14在第8-13個脈衝週期中係傳輸一MSB群及一LSB群;此MSB群例如包括位址訊號S_ad中一原始MSB群中之部份。舉例來說,此原始MSB群包括位元A23-A16,而此MSB群包括位元A2、A3及A21-A16。此LSB群包括位元A15-A0。From another point of view, the host side circuit 14 transmits an MSB group and an LSB group in the 8-13th pulse period; the MSB group includes, for example, a portion of an original MSB group in the address signal S_ad. For example, the original MSB group includes bits A23-A16, and the MSB group includes bits A2, A3, and A21-A16. This LSB group includes bits A15-A0.
位址訊號產生器20於第12個脈衝期間結束後(接收到位元A2、A3、A4-A21)啟動讀取操作。換言之,這個操作實例在未接收到位元A0及A1之情形下啟動讀取操作,以根據位址訊號S_ad之22個MSB對應至4(22 =4)個位元組。位址訊號產生電路20根據資料暫存器38中儲存之位元A2、A3及A4-A21來產生對應之存取位址訊號驅動X解碼器22、記憶體頁緩衝器26及感測電路30,以讀取記憶體陣列24中4個位元組中儲存之資料。之後在接收到位元A0及A1後,位址訊號產生器20根據位元A1-A0驅動Y解碼器28,以從4個位元組中選取欲讀取位元組中之資料,並將讀取位元組之資料儲存在輸出緩衝器32中。The address signal generator 20 starts the read operation after the end of the 12th pulse period (received bits A2, A3, A4-A21). In other words, this operation example initiates a read operation without receiving bits A0 and A1 to correspond to 4 (2 2 = 4) bytes according to 22 MSBs of the address signal S_ad. The address signal generating circuit 20 generates a corresponding access address signal driving X decoder 22, a memory page buffer 26 and a sensing circuit 30 according to the bits A2, A3 and A4-A21 stored in the data register 38. To read data stored in 4 bytes in the memory array 24. After receiving the bits A0 and A1, the address signal generator 20 drives the Y decoder 28 according to the bits A1-A0 to select the data to be read from the 4 bytes and read the data. The data of the byte is stored in the output buffer 32.
前述提早一個脈衝週期啟動讀取操作之操作實例中需使用32(8×22 )個感測放大器之感測電路30實現。The foregoing operation example in which a read operation is initiated by one pulse period is performed using a sensing circuit 30 of 32 (8 × 2 2 ) sense amplifiers.
相較於接腳電路的訊號時序圖如第5圖且在第12個脈衝週期結束後即驅動讀取操作之操作實例,繪示於第6圖之前述操作實例可在第12個脈衝週期結束後使得到此正常位元群中20個位元A2-A21之資訊。換言之,即便同在第12個脈衝週期結束後即驅動讀取操作,繪示於第6圖之前述操作實例可有效地減少讀取操作中需讀取之位元組(由16個位元組降低為4個位元組)及需使用之感測放大器數量(由128個感測放大器降低為32個感測放大器)。如此,相較於接腳電路的訊號時序圖如第5圖且在12個脈衝週期結束後驅動讀取操作之操作實例,繪示於第6圖之前述操作實例具有可有效降低感測放大器數目且降低電路雜訊之優點。The operation example shown in FIG. 6 can be ended at the 12th pulse period, as compared with the signal timing diagram of the pin circuit as shown in FIG. 5 and the operation example of driving the read operation after the end of the 12th pulse period. After that, the information of 20 bits A2-A21 in the normal bit group is made. In other words, even if the read operation is driven after the end of the 12th pulse period, the foregoing operation example shown in FIG. 6 can effectively reduce the byte to be read in the read operation (by 16 bytes) Reduced to 4 bytes) and the number of sense amplifiers to use (from 128 sense amplifiers to 32 sense amplifiers). Thus, the foregoing operation example shown in FIG. 6 has an effective reduction in the number of sense amplifiers compared to the signal timing diagram of the pin circuit as shown in FIG. 5 and the operation example of driving the read operation after the end of 12 pulse periods. And reduce the advantages of circuit noise.
記憶體12更例如包括控制電路36,用以對記憶體12之操作進行控制。舉例來說,控制電路36包括時脈訊號產生器(未繪示)、操作模式邏輯電路(未繪示)、狀態機電路(未繪示)及動態記憶體(未繪示)。記憶體12更例如包括高電壓產生電路34,用以受控於控制電路36提供存取偏壓電壓至記憶體陣列24,對其進行存取操作偏壓。The memory 12 further includes, for example, a control circuit 36 for controlling the operation of the memory 12. For example, the control circuit 36 includes a clock signal generator (not shown), an operation mode logic circuit (not shown), a state machine circuit (not shown), and a dynamic memory (not shown). The memory 12 further includes, for example, a high voltage generating circuit 34 for controlling the control circuit 36 to provide an access bias voltage to the memory array 24 for accessing the operating bias.
在本實施例中,雖僅以記憶體12為被設定具有記憶容量32MB之情形為例做說明,然,本實施例之記憶體12並不侷限於此。在另一個例子中,記憶體12亦可被設定具有其他記憶容量。舉例來說,記憶體12亦可被設定具有記憶容量64MB。在這個例子中,位址訊號S_ad之此閒置MSB群例如對應地具有位元A23,而在另一個例子中,接腳電路的傳輸訊號時序圖如第7圖所示。In the present embodiment, the case where the memory 12 is set to have a memory capacity of 32 MB is taken as an example. However, the memory 12 of the present embodiment is not limited thereto. In another example, memory 12 can also be configured to have other memory capacities. For example, the memory 12 can also be set to have a memory capacity of 64 MB. In this example, the idle MSB group of the address signal S_ad has, for example, a bit A23, and in another example, the transmission signal timing diagram of the pin circuit is as shown in FIG.
如此,在欲提前於第12個脈衝週期驅動讀取操作之情形中,這個例子亦可透過一閒置MSB群(對應至位元A23)來傳輸原本傳輸於第13個脈衝週期中之一取代位元群(對應至位元A3),以降低讀取操作中需讀取之位元組數目(由16個位元組降低為8個位元組)及需使用之感測放大器數目(由128個感測放大器降低為64個感測放大器)。Thus, in the case where the read operation is to be driven ahead of the 12th pulse period, this example can also transmit an alternate bit transmitted in the 13th pulse period through an idle MSB group (corresponding to the bit A23). Yuan group (corresponding to bit A3) to reduce the number of bytes to be read in the read operation (from 16 bytes to 8 bytes) and the number of sense amplifiers to be used (by 128) One sense amplifier is reduced to 64 sense amplifiers).
在其他例子中,記憶體12亦可被設定具有記憶容量16MB。在這個例子中,位址訊號S_ad之此閒置MSB群例如對應地具有位元A21-A23,而在一個例子中,接腳電路的傳輸訊號時序圖如第8圖所示。如此,在欲提前於第12個脈衝週期驅動讀取操作之情形中,這個例子亦可透過一閒置MSB群(對應至位元A21-A23)來傳輸原本傳輸於第13個脈衝週期中之一取代位元群(對應至位元A1-A3),以降低讀取操作中需讀取之位元組數目(由16個位元組降低為2個位元組)及需使用之感測放大器數目(由128個感測放大器降低為16個感測放大器)。In other examples, the memory 12 can also be set to have a memory capacity of 16 MB. In this example, the idle MSB group of the address signal S_ad has, for example, corresponding bits A21-A23, and in one example, the transmission signal timing diagram of the pin circuit is as shown in FIG. Thus, in the case where the read operation is to be driven ahead of the 12th pulse period, this example can also transmit one of the 13th pulse periods originally transmitted through an idle MSB group (corresponding to the bits A21-A23). Replace the bit group (corresponding to bits A1-A3) to reduce the number of bytes to be read in the read operation (from 16 bytes to 2 bytes) and the sense amplifier to be used Number (reduced from 128 sense amplifiers to 16 sense amplifiers).
本實施例之記憶體系統係利用調整後之介面來進行位址訊號之傳輸。本實施例之記憶體系統更於未完整地接收到所有位址訊號之位元時即啟動讀取操作。如此,相較於傳統記憶體,本實施例之記憶體系統可有效地延長記憶體之存取操作時間。The memory system of this embodiment utilizes the adjusted interface for the transmission of the address signals. The memory system of this embodiment starts the read operation even when the bits of all the address signals are not completely received. Thus, the memory system of the present embodiment can effectively extend the access operation time of the memory compared to the conventional memory.
另外,本實施例之記憶體系統更根據記憶體對應之記憶容量來利用位址訊號中若干閒置MSB來傳輸位址訊號中若干LSB中部份之位元。如此,相較於傳統記憶體,本實施例之記憶體系統更可有效地縮短存取操作中需讀取之位元組數目及需使用之感測放大器數目,以降低記憶體之電路雜訊。In addition, the memory system of the embodiment further uses a plurality of idle MSBs in the address signal to transmit the bits of the plurality of LSBs in the address signal according to the memory capacity corresponding to the memory. Therefore, compared with the conventional memory, the memory system of the embodiment can effectively shorten the number of bytes to be read in the access operation and the number of sense amplifiers to be used, thereby reducing circuit noise of the memory. .
綜上所述,雖然本發明已以一較佳實施例揭露如上,然其並非用以限定本發明。本發明所屬技術領域中具有通常知識者,在不脫離本發明之精神和範圍內,當可作各種之更動與潤飾。因此,本發明之保護範圍當視後附之申請專利範圍所界定者為準。In view of the above, the present invention has been disclosed in a preferred embodiment, and is not intended to limit the present invention. A person skilled in the art can make various changes and modifications without departing from the spirit and scope of the invention. Therefore, the scope of the invention is defined by the scope of the appended claims.
1‧‧‧記憶體系統1‧‧‧ memory system
12‧‧‧記憶體12‧‧‧ memory
14‧‧‧主機端電路14‧‧‧ host circuit
IF‧‧‧介面IF‧‧ interface
P_SI/SIO0、P_SO/SIO1、P_WP#/SIO2、P_HOLD#/SIP3‧‧‧輸出輸入接腳P_SI/SIO0, P_SO/SIO1, P_WP#/SIO2, P_HOLD#/SIP3‧‧‧ Output input pins
P_CS#‧‧‧晶片選擇訊號接腳P_CS#‧‧‧ wafer selection signal pin
P_SCLK‧‧‧時脈訊號接腳P_SCLK‧‧‧ clock signal pin
20‧‧‧位址訊號產生器2020‧‧‧ address signal generator 20
22‧‧‧X解碼器22‧‧‧X decoder
24‧‧‧記憶體陣列24‧‧‧ memory array
26‧‧‧記憶體頁緩衝器26‧‧‧ memory page buffer
28‧‧‧Y解碼器28‧‧‧Y decoder
30‧‧‧感測電路30‧‧‧Sensor circuit
32‧‧‧輸出緩衝器32‧‧‧Output buffer
38‧‧‧資料暫存器38‧‧‧data register
34‧‧‧高電壓產生電路34‧‧‧High voltage generating circuit
36‧‧‧控制電路36‧‧‧Control circuit
Ma、Mb、Mc、Md‧‧‧記憶區塊Ma, Mb, Mc, Md‧‧‧ memory blocks
第1圖繪示傳統串列式快閃記憶體之讀取序列訊號的時序圖。FIG. 1 is a timing diagram of a read sequence signal of a conventional tandem flash memory.
第2圖繪示依照本發明實施例之記憶體系統的方塊圖。2 is a block diagram of a memory system in accordance with an embodiment of the present invention.
第3圖繪示乃第2圖之記憶體12的詳細方塊圖。FIG. 3 is a detailed block diagram of the memory 12 of FIG.
第4圖繪示乃記憶體12之記憶體陣列24的示意圖。FIG. 4 is a schematic diagram of the memory array 24 of the memory 12.
第5圖繪示記憶體12之接腳電路的傳輸訊號時序圖。FIG. 5 is a timing diagram of the transmission signal of the pin circuit of the memory 12.
第6圖繪示記憶體12之接腳電路的另一傳輸訊號時序圖。FIG. 6 is a timing diagram showing another transmission signal of the pin circuit of the memory 12.
第7圖繪示記憶體12之接腳電路的再一傳輸訊號時序圖。FIG. 7 is a timing diagram of still another transmission signal of the pin circuit of the memory 12.
第8圖繪示記憶體12之接腳電路的再一傳輸訊號時序圖。FIG. 8 is a timing diagram of still another transmission signal of the pin circuit of the memory 12.
Claims (9)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW98112569A TWI405215B (en) | 2009-04-15 | 2009-04-15 | Addreessing signal transmission method and memory system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW98112569A TWI405215B (en) | 2009-04-15 | 2009-04-15 | Addreessing signal transmission method and memory system |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW201037727A TW201037727A (en) | 2010-10-16 |
| TWI405215B true TWI405215B (en) | 2013-08-11 |
Family
ID=44856795
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW98112569A TWI405215B (en) | 2009-04-15 | 2009-04-15 | Addreessing signal transmission method and memory system |
Country Status (1)
| Country | Link |
|---|---|
| TW (1) | TWI405215B (en) |
Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20020193893A1 (en) * | 1997-05-02 | 2002-12-19 | Stephen (Hsiao Yi) Li | Data processing device with an indexed immediate addressing mode |
| US20030196077A1 (en) * | 2002-04-15 | 2003-10-16 | Ip-First Llc | Apparatus and method for extending address modes in a microprocessor |
| US20040153902A1 (en) * | 2003-01-21 | 2004-08-05 | Nexflash Technologies, Inc. | Serial flash integrated circuit having error detection and correction |
| US20060067123A1 (en) * | 2004-09-27 | 2006-03-30 | Nexflash Technologies, Inc. | Serial flash semiconductor memory |
| US20070214324A1 (en) * | 2006-03-09 | 2007-09-13 | Mediatek Inc. | Command controller, prefetch buffer and methods for accessing a serial flash in an embedded system |
| US7343470B1 (en) * | 2003-09-26 | 2008-03-11 | Altera Corporation | Techniques for sequentially transferring data from a memory device through a parallel interface |
| US20080109582A1 (en) * | 2006-11-06 | 2008-05-08 | Elite Semiconductor Memory Technology Inc. | Transmission method for serial periphery interface serial flash |
| TWI297157B (en) * | 2005-03-11 | 2008-05-21 | Winbond Electronics Corp | Serial flash semiconductor memory and method thereof |
| US20090067209A1 (en) * | 2005-03-31 | 2009-03-12 | Renesas Technology Corp. | Low-Power Content-Addressable-Memory Device |
-
2009
- 2009-04-15 TW TW98112569A patent/TWI405215B/en active
Patent Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20020193893A1 (en) * | 1997-05-02 | 2002-12-19 | Stephen (Hsiao Yi) Li | Data processing device with an indexed immediate addressing mode |
| US20030196077A1 (en) * | 2002-04-15 | 2003-10-16 | Ip-First Llc | Apparatus and method for extending address modes in a microprocessor |
| US20040153902A1 (en) * | 2003-01-21 | 2004-08-05 | Nexflash Technologies, Inc. | Serial flash integrated circuit having error detection and correction |
| US7343470B1 (en) * | 2003-09-26 | 2008-03-11 | Altera Corporation | Techniques for sequentially transferring data from a memory device through a parallel interface |
| US20060067123A1 (en) * | 2004-09-27 | 2006-03-30 | Nexflash Technologies, Inc. | Serial flash semiconductor memory |
| TWI297157B (en) * | 2005-03-11 | 2008-05-21 | Winbond Electronics Corp | Serial flash semiconductor memory and method thereof |
| US20090067209A1 (en) * | 2005-03-31 | 2009-03-12 | Renesas Technology Corp. | Low-Power Content-Addressable-Memory Device |
| US20070214324A1 (en) * | 2006-03-09 | 2007-09-13 | Mediatek Inc. | Command controller, prefetch buffer and methods for accessing a serial flash in an embedded system |
| US20080109582A1 (en) * | 2006-11-06 | 2008-05-08 | Elite Semiconductor Memory Technology Inc. | Transmission method for serial periphery interface serial flash |
Also Published As
| Publication number | Publication date |
|---|---|
| TW201037727A (en) | 2010-10-16 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN101828172B (en) | serial interface NAND | |
| CN102339267B (en) | I2C address is changed | |
| US8195839B2 (en) | Apparatus and method for producing identifiers regardless of mixed device type in a serial interconnection | |
| KR101080498B1 (en) | Memory system and method having volatile and non-volatile memory devices at same hierarchical level | |
| US7239547B2 (en) | Memory device | |
| CN114694717A (en) | Flash controller, flash module, and electronic device | |
| CN1713128A (en) | Storage device | |
| JP2006323982A (en) | Method of operating integrated circuit array of memory cells and integrated circuit | |
| JP2002328836A (en) | Memory device | |
| JP2018055737A (en) | Semiconductor memory device and continuous reading method | |
| US6697287B2 (en) | Memory controller and memory system apparatus | |
| CN1653434A (en) | Get data mask mapping information | |
| TWI260496B (en) | Mapping data masks in hardware by controller programming | |
| US8738849B2 (en) | Method and system for enhanced performance in serial peripheral interface | |
| US7296111B2 (en) | Multilevel storage nonvolatile semiconductor memory device enabling high-speed data reading and high-speed data writing | |
| CN113555041A (en) | System for performing reference voltage training operations | |
| TWI405215B (en) | Addreessing signal transmission method and memory system | |
| CN115831193A (en) | Storage system and storage control method | |
| CN101903868B (en) | Storage device and its control method | |
| CN1220264C (en) | Semiconductor IC and mfg. method thereof | |
| JP4855864B2 (en) | Direct memory access controller | |
| CN101882468B (en) | Address signal transmission method and memory system | |
| JP2021043909A (en) | Memory system, controller, and data transfer method | |
| US11461261B2 (en) | Semiconductor memory device | |
| US11328753B2 (en) | Methods of performing self-write operation and semiconductor devices used therefor |