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TWI482871B - Sputtering target with movable cells-like magnetic controller - Google Patents

Sputtering target with movable cells-like magnetic controller Download PDF

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Publication number
TWI482871B
TWI482871B TW101137041A TW101137041A TWI482871B TW I482871 B TWI482871 B TW I482871B TW 101137041 A TW101137041 A TW 101137041A TW 101137041 A TW101137041 A TW 101137041A TW I482871 B TWI482871 B TW I482871B
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target
cell
magnetic
substrate
magnetron
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TW101137041A
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Chinese (zh)
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TW201414867A (en
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Hsiang An Chan
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Mega Energy Vacuum Co Ltd
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Priority to TW101137041A priority Critical patent/TWI482871B/en
Priority to CN201310462692.7A priority patent/CN103710672B/en
Priority to KR1020130119055A priority patent/KR20140044761A/en
Publication of TW201414867A publication Critical patent/TW201414867A/en
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Publication of TWI482871B publication Critical patent/TWI482871B/en

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/34Gas-filled discharge tubes operating with cathodic sputtering
    • H01J37/3411Constructional aspects of the reactor
    • H01J37/345Magnet arrangements in particular for cathodic sputtering apparatus
    • H01J37/3455Movable magnets
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/34Gas-filled discharge tubes operating with cathodic sputtering
    • H01J37/3402Gas-filled discharge tubes operating with cathodic sputtering using supplementary magnetic fields
    • H01J37/3405Magnetron sputtering
    • H01J37/3408Planar magnetron sputtering
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/34Gas-filled discharge tubes operating with cathodic sputtering
    • H01J37/3411Constructional aspects of the reactor
    • H01J37/3414Targets
    • H01J37/3417Arrangements

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physical Vapour Deposition (AREA)

Description

移動式細胞格磁控濺鍍靶Mobile cell magnetron sputtering target

本發明係關於一種磁控濺鍍靶,特別是指一種在濺鍍靶後方設有細胞格磁控,該細胞格磁控依據設定運動軌跡做集體平面運動,以達到濺鍍靶材面消耗均勻,工件上的鍍膜也均勻的一種磁控濺鍍靶。The invention relates to a magnetron sputtering target, in particular to a cell magnetic control arranged behind a sputtering target, and the cell magnetic control performs collective planar motion according to a set motion track, so as to achieve uniform consumption of the sputtering target surface. A magnetron sputtering target with a uniform coating on the workpiece.

磁控濺鍍(magnetron sputtering)是指真空濺鍍腔內在濺鍍靶材的後方安排電磁鐵或永久磁鐵以產生磁場並使得磁力線由靶材後方穿透至靶材的前方,再回到的靶材的後方之電磁鐵或永久磁鐵。電漿產生器利用磁場的導引將電漿離子氣體轟擊金屬靶材的預定區域以敲出金屬原子,再沈積金屬原子於靶材下方的工件表面上以形成薄膜。電漿氣體可以包含惰性氣體如氬氣,或者是可以和靶材反應的反應氣體。Magnetron sputtering refers to the arrangement of an electromagnet or a permanent magnet behind a sputter target in a vacuum sputtering chamber to generate a magnetic field and cause the magnetic field line to penetrate from the rear of the target to the front of the target, and then return to the target. Electromagnet or permanent magnet at the rear of the material. The plasma generator utilizes the guidance of the magnetic field to bombard the predetermined region of the metal target to knock out the metal atoms, and then deposits metal atoms on the surface of the workpiece below the target to form a thin film. The plasma gas may contain an inert gas such as argon or a reaction gas that can react with the target.

這様的結果將使得靶材猶如一個穿隧(tunnel-like)的結構形成一電子阱(electron trap)。這種效應在穿隧形的電子阱在金屬靶材形成一封閉迴路後會更進一步強化,而變得更有效率。然而,它却使電漿形成迴路,而使得靶材猶如被穿隧般的損耗,這結果將存在靶材的利用率被顯著降低的缺點。The result of this will cause the target to form an electron trap like a tunnel-like structure. This effect is further enhanced when the tunneled electron trap is further strengthened after the metal target forms a closed loop. However, it causes the plasma to form a loop, causing the target to be tunnel-like, which results in the disadvantage that the utilization of the target is significantly reduced.

由Pius Grunenfelder,Wangs等人於1995年所獲得的美國專利第5,399,253,發明名稱為”Plasma Generating device”揭露了一種變化的磁場以解決習知磁控濺鍍,因固定磁場所導致靶材穿隧般損耗的問題。如圖1所示靶材為1, 靶材背面有一固定環繞的磁條11固定於一極板12,而磁條11包圍的內部則有兩個會旋轉的磁條13和14。磁條13和14開始時它的N-S兩極一開始時上下的極性正好相反。旋轉磁條13、14以和靶材面法線垂直線為轉軸,一者以順時針方向旋轉,另一者則是逆時針轉。其磁力線透穿靶材1的變化如圖1a->圖1b->圖1c順序變化。圖1c時磁條13和14正好轉了180度。圖中磁力線進、出的位置將使靶材表面產生類似於穿隧足極(tunnel foot pole)16。靶材在該些位置就會消耗較快。對於大面積靶材時,該專利揭示固定磁條11內可以安排更多的旋轉磁條13和14。如圖2所示。U.S. Patent No. 5,399,253, issued to P.S.P. The problem of loss. The target shown in Figure 1 is 1, A magnetic strip 11 having a fixed circumference on the back side of the target is fixed to a plate 12, and the inside of the magnetic strip 11 has two magnetic strips 13 and 14 which are rotated. At the beginning of the magnetic strips 13 and 14, the polarity of the upper and lower sides of the N-S poles is exactly opposite. The rotating magnetic strips 13, 14 are perpendicular to the normal line of the target surface, one of which rotates clockwise, and the other rotates counterclockwise. The variation of the magnetic field lines penetrating through the target 1 is sequentially changed as shown in FIG. 1a -> FIG. 1b -> FIG. 1c. In Figure 1c, the magnetic strips 13 and 14 are rotated exactly 180 degrees. The position of the magnetic lines in and out of the figure will cause the surface of the target to produce a tunnel foot pole 16 similar to that of the tunnel. The target will consume faster at these locations. For large area targets, the patent discloses that more rotating magnetic strips 13 and 14 can be arranged within the fixed magnetic strip 11. as shown in picture 2.

Pius Grunenfelder,Wangs等人於2002年獲得另一美國專利第6,454,920號,發明名稱為”Magnetron Sputtering Source”,這是改良版的磁控濺鍍源。如圖3所示,它的變化是靶材切割成複數塊1a、1b固定於一背板5,背板5下方則是冷却板或冷却管路6。靶材與靶材之間隔另設有薄片狀(strip)的陽極7a、7b。同様也有固定環繞的磁條11及旋轉磁條13和14。Pius Grunenfelder, Wangs et al., U.S. Patent No. 6,454,920, entitled "Magnetron Sputtering Source", is a modified version of the magnetron sputtering source. As shown in FIG. 3, its change is that the target is cut into a plurality of blocks 1a, 1b fixed to a backing plate 5, and below the backing plate 5 is a cooling plate or cooling pipe 6. The anodes 7a, 7b are additionally provided with a strip between the target and the target. The same type of magnetic strip 11 and rotating magnetic strips 13 and 14 are also fixed.

Pius Grunenfelder,Wangs的專利的確對靶材的均勻消耗有所改善,濺射區域也增加了,但是靶材端部因為電子阱的不斷重疊而消耗地更快,而使得濺射鍍膜的有效區和端部的侵蝕有不均勻的現象。Pius Grunenfelder, the Wangs patent does improve the uniform consumption of the target, and the sputtering area is also increased, but the ends of the target are consumed more quickly due to the constant overlap of the electron traps, making the effective area of the sputter coating and The erosion at the ends is uneven.

有鑑於此,本發明之一目的便是要提供一技術以克服習知技術的難題。使靶材的靶面侵蝕範圍擴大,有效消除靶面不均勻的侵蝕,特別是靶材邊綠的鍍膜可以更均勻。In view of the above, it is an object of the present invention to provide a technique to overcome the difficulties of the prior art. The target surface erosion range of the target is enlarged, and the unevenness of the target surface is effectively eliminated, and in particular, the green coating of the target side can be more uniform.

本發明之一目的提供一磁控濺鍍的設計,可有效解決習知磁控濺鍍端部因為電子阱的不斷重疊而消耗地更快的問題。SUMMARY OF THE INVENTION One object of the present invention is to provide a magnetron sputtering design that effectively addresses the problem of conventional magnetron sputtering ends being consumed more quickly due to the constant overlap of electron traps.

本發明之再一目的是使得磁控濺鍍靶的磁場控制簡易化。Still another object of the present invention is to simplify the control of the magnetic field of the magnetron sputtering target.

本發明之又一目的是控制鍍膜均勻性。Yet another object of the invention is to control coating uniformity.

本發明之又一目的是在靶面上同時形成複數個濺鍍源,實現高速鍍膜。Another object of the present invention is to simultaneously form a plurality of sputtering sources on a target surface to achieve high speed coating.

本發明揭露一種磁控濺鍍靶,包含:複數個靶材貼附於一銅底板上,該些靶材連接一負電壓;一驅動裝置;一細胞格磁控裝置,固定於銅底板之後,包含一基板、一細胞格狀磁盤、複數個磁條。而細胞格狀磁盤、及複數個磁條由外而內固定於基板上,由該驅動裝置所驅動,而以一速率在靶材所包含的範圍內,其中,該細胞格狀磁盤由相接的磁條所構成,並以相同的第一磁極面向該些靶材,而該複數個磁條係分佈於該細胞格狀磁盤的格子內,而最外的該環狀磁盤及該複數個磁條以相同的第二磁極,面向該些靶材。此外,在基板外部更包含一獨立的環狀磁盤,它是固定的。The invention discloses a magnetron sputtering target, comprising: a plurality of targets attached to a copper substrate, the targets are connected to a negative voltage; a driving device; a cell magnetic control device, fixed to the copper substrate, The invention comprises a substrate, a cell grid disk and a plurality of magnetic strips. And the cell grid disk and the plurality of magnetic strips are externally and internally fixed on the substrate, driven by the driving device, and at a rate within the range of the target, wherein the cell grid disk is connected The magnetic strip is formed, and the same first magnetic pole faces the targets, and the plurality of magnetic strips are distributed in the grid of the cell grid, and the outermost annular disk and the plurality of magnetics The strips face the targets with the same second magnetic pole. In addition, a separate annular disk is included on the outside of the substrate, which is fixed.

為使本發明之上述目的、特徵和優點能更明顯易懂,下文依本發明設計的磁控靶材的一較佳實施例,並配合所附相關圖式,作詳細說明如下。In order to make the above objects, features and advantages of the present invention more comprehensible, a preferred embodiment of a magnetron target designed in accordance with the present invention, together with the accompanying drawings, is described in detail below.

圖4示一磁控濺鍍靶材的橫截面示意圖係沿圖5平面圖中 A-A線所繪製的橫截面示意圖。由上而下包含複數個靶材100黏貼於一銅底板110上,或是以螺絲方式固定。銅底板110下方則是冷却底板120。在另一實施例中,複數個靶材100直接黏貼於一銅質的冷却底板120。冷却底板120絕不可是鐵、鈷、鎳等鐵磁性材料以免影響磁力線分佈。另外,冷却底板120需要確實貼合於靶材100以免散熱不良。例如,以螺絲鎖住。靶材100連接於一負電壓端。複數個靶材100由一同一電源供應器供應其電源。Figure 4 shows a schematic cross-sectional view of a magnetron sputtering target in the plan view of Figure 5. A cross-sectional schematic drawn by the A-A line. From top to bottom, a plurality of targets 100 are adhered to a copper base plate 110 or are fixed by screws. Below the copper base plate 110 is a cooling base plate 120. In another embodiment, the plurality of targets 100 are directly adhered to a copper cooling substrate 120. The cooling bottom plate 120 must not be a ferromagnetic material such as iron, cobalt or nickel to avoid affecting the distribution of magnetic lines of force. In addition, the cooling floor 120 needs to be surely attached to the target 100 to prevent heat dissipation. For example, lock with a screw. The target 100 is connected to a negative voltage terminal. A plurality of targets 100 are supplied with their power by a same power supply.

冷却底板120的下方則是一細胞格磁控裝置150。如圖5所示之細胞格磁控裝置150的平面示意圖,最外圈為一環狀磁盤152。圖示的環狀磁盤152標示為北極N,環狀磁盤152內部則是細胞格狀磁盤155標示為南極S,而細胞格狀磁盤155的每一個別細胞內部則包含一磁條158,標示為北極N。換言之,不管是環狀磁盤152、或細胞格狀磁盤155或磁條158的另一磁極都在進入紙面的另一端(或請參考圖4所示磁盤的下端)。Below the cooling floor 120 is a cell magnetron 150. A schematic plan view of the cell magnetron 150 shown in FIG. 5, the outermost ring being an annular disk 152. The illustrated ring-shaped disk 152 is labeled as the north pole N, the inside of the ring-shaped disk 152 is the cell grid disk 155 is labeled as the south pole S, and the inner cell of the cell grid disk 155 contains a magnetic strip 158, labeled as Arctic N. In other words, either the ring disk 152, or the cell grid 155 or the other magnetic pole of the magnetic strip 158 is entering the other end of the paper (or refer to the lower end of the disk shown in Figure 4).

在一實施例中,細胞格磁控裝置150包含三列互相併列的方格,中間列的方格數比上、下兩列的個數少1(中間列有三個,上,下二列則有四個方格並列),且以通過細胞格磁控裝置中心的水平線呈鏡面對稱,也以通過細胞格磁控裝置150中心的垂直線呈鏡面對稱。本發明的細胞格磁控裝置150並列的方格,又增加了許多的小中心磁條158的設計,再加上細胞格磁控裝置150不是固定而是呈運動軌跡運動(如下述),可以使靶材消耗更加均勻,又不失磁條間電子阱的效果。In one embodiment, the cell dynamic control device 150 includes three columns of mutually juxtaposed squares, and the number of squares in the middle column is one less than the number of upper and lower columns (three in the middle column, and two columns in the upper and lower columns). There are four squares juxtaposed, and are mirror-symmetric with a horizontal line passing through the center of the cell magnetron, and also mirror-symmetrical with a vertical line passing through the center of the cell magnetron 150. The juxtaposed square of the cell magnetron 150 of the present invention adds a number of designs of the small center magnetic strip 158, and the cell magnetron 150 is not fixed but moves in motion (as described below). The target consumption is more uniform without losing the effect of the electron trap between the magnetic strips.

上述的細胞格磁控裝置150包含細胞格狀磁盤155及該些磁條158先固定於一基板159,基板159再由另一水平移動機 構160帶動,而使得細胞格磁控裝置150呈現以一預定的平面運動軌跡集體移動(collection motion)。環狀磁盤152則是固定於另一獨立不動的基板1591。水平平面運動軌跡,是依據以下的參數做調整,例如:靶材種類、濺鍍速率、靶材面積、靶材消耗程度、鍍膜均勻性來調整。水平移動機構160可以是包含一轉軸驅動一凸輪,或直接連接凸輪,再以齒條、齒輪及皮帶、鍊條及任意組合的其中之一連接於基板159的一轉軸。或者是馬達輸出轉軸驅動三連桿或四連桿等等組合。為避免影響真空,水平移動機構160及細胞格磁控裝置150可以設計在真空鍍腔外。當然,若在真空腔體內,就必須選用適合的軸封及機構。The above cell magnetron 150 includes a cell grid 155 and the magnetic strips 158 are first fixed to a substrate 159, and the substrate 159 is further moved by another horizontal The structure 160 drives the cell magnetron 150 to present a collective motion with a predetermined planar motion trajectory. The annular disk 152 is fixed to another independent substrate 1591. The horizontal plane motion trajectory is adjusted according to the following parameters, such as target type, sputtering rate, target area, target consumption degree, and coating uniformity. The horizontal moving mechanism 160 may be a rotating shaft that includes a rotating shaft to drive a cam, or directly connects the cam, and is connected to the substrate 159 by one of a rack, a gear and a belt, a chain, and any combination. Or the motor output shaft drives a combination of three or four links. To avoid affecting the vacuum, the horizontal moving mechanism 160 and the cell magnetron 150 can be designed outside the vacuum plating chamber. Of course, if you are in a vacuum chamber, you must use a suitable shaft seal and mechanism.

基板159中心的水平平面運動軌跡,可以是例如包含圓形、橢圓或轉角為圓角的矩形、菱形的超橢圓軌跡等等,依據運動軌跡選擇適當傳動組合,來達到上述預定的運動軌跡,電子阱產生後,再變化為另一處,因此,可以使靶材的消耗均勻。另外,基板159的移動速率也可由程式控制及調整。移動速率約為0.25~2cycle/s,換算為300mm×300mm的靶材而言,約為4 cm/s~19 cm/s。上述平面運動軌跡之中心,在某些應用上不與靶材表面中心重疊,以達成一預定的鍍膜均勻性分佈。The horizontal plane motion trajectory at the center of the substrate 159 may be, for example, a rectangle including a circle, an ellipse or a corner, a rounded corner, a diamond-shaped hyperelliptic trajectory, etc., and an appropriate transmission combination is selected according to the motion trajectory to achieve the predetermined motion trajectory, electronic After the trap is generated, it is changed to another place, so that the consumption of the target can be made uniform. In addition, the rate of movement of the substrate 159 can also be controlled and adjusted by the program. The moving rate is about 0.25~2cycle/s, which is about 4 cm/s~19 cm/s for a target of 300mm×300mm. The center of the planar motion trajectory does not overlap the center of the target surface in some applications to achieve a predetermined coating uniformity distribution.

上述的環狀磁盤152是用來增加四周靠邊靶材的濺鍍率與鍍膜的均勻性。而細胞格狀磁盤155磁盤155細胞格大小約為5mm×5mm~300mm×300mm。The above-mentioned annular disk 152 is used to increase the sputtering rate of the surrounding target and the uniformity of the coating. The cell grid disk 155 disk 155 cell size is about 5mm × 5mm ~ 300mm × 300mm.

另依據靶材100為矩形、圓形或多邊形的不同,細胞格狀磁盤155並不限於圖5所示的方型細胞格狀,而可以進一步變化為複數三角格組成(如圖6A所示)、複數個蜂巢格狀(如圖6B所示), 或多層同心圓形(如圖6C所示),多層同心花瓣(如圖6D所示)型或多層同心心形(未圖示),方型細胞格狀、複數三角格組成、及複數個蜂巢格狀適合方形靶或圓形靶,而多層同心圓形、多層同心花瓣、多層同心心形適合於圓型或接近圓型的濺鍍靶。Further, depending on whether the target 100 is rectangular, circular or polygonal, the cell grid disk 155 is not limited to the square cell shape shown in FIG. 5, but may be further changed into a complex triangular lattice composition (as shown in FIG. 6A). , a plurality of honeycomb lattices (as shown in Figure 6B), Or a multi-layer concentric circle (as shown in Figure 6C), a multi-layered concentric petal (as shown in Figure 6D) or a multi-layer concentric heart (not shown), a square cell lattice, a complex triangular lattice, and a plurality of honeycombs The lattice shape is suitable for a square target or a circular target, and the multi-layer concentric circle, the multi-layer concentric petals, and the multi-layer concentric heart shape are suitable for a circular or nearly circular sputtering target.

本發明中細胞格磁控裝置150包含環狀磁盤152、細胞格狀磁盤155及複數個磁條158等以永久磁鐵為優先。電磁鐵為次。因此,當所採用的細胞格磁控裝置150中的磁盤152、155或磁條為永久磁鐵,細胞格磁控裝置150與靶材的距離是可以調整來達到預定的磁場強度以達到以間距來改變鍍率與均勻度的目的。In the present invention, the cell magnetron 150 includes a ring-shaped magnetic disk 152, a cell-shaped magnetic disk 155, a plurality of magnetic strips 158, and the like with a permanent magnet as a priority. The electromagnet is second. Therefore, when the magnetic disk 152, 155 or magnetic strip in the cell magnetron 150 is a permanent magnet, the distance between the cell magnetron 150 and the target can be adjusted to achieve a predetermined magnetic field strength to achieve a pitch. Change the plating rate and uniformity.

另外,整組細胞格磁控裝置150並不限於整組與濺鍍靶100同在一真空中。整組細胞格磁控裝置150也可以隔離於大氣中。Additionally, the entire set of cell magnetrons 150 is not limited to being in the same vacuum as the sputtering target 100. The entire set of cell magnetrons 150 can also be isolated from the atmosphere.

依據本發明的再一實施例,整組細胞格磁控裝置150是在一斜面上,斜面角約在5~30°之間,進而可以控制鍍膜厚度的分佈。According to still another embodiment of the present invention, the entire set of cell magnetron 150 is on an inclined surface with a bevel angle of between about 5 and 30 degrees, thereby controlling the distribution of the coating thickness.

本發明具有以下的優點:The invention has the following advantages:

(1)細胞格磁控裝置150組成簡單,又因是集體運動(細胞格磁控裝置150固定於基板,基板移動軌跡就是細胞格磁控裝置150的移動軌跡),故只需一組驅動裝置即可。(1) The cell grid magnetic control device 150 is simple in composition, and because of the collective motion (the cell grid magnetic control device 150 is fixed on the substrate, the substrate movement trajectory is the movement trajectory of the cell grid magnetic control device 150), so only one set of driving devices is needed. Just fine.

(2)細胞格磁控裝置150集體運動軌跡,依據前述參數做調整,可有效去除靶面消耗不均的問題,特別是靶材在濺鍍期間表面弧狀火花(arc)發生頻率明顯減少。另外,靶材邊緣使用率低的問題也可以有效獲得解決。(2) The collective motion trajectory of the cell magnetic control device 150 can be adjusted according to the above parameters, which can effectively remove the problem of uneven consumption of the target surface, in particular, the frequency of the surface arc spark (arc) of the target during sputtering is significantly reduced. In addition, the problem of low target edge utilization can be effectively solved.

(3)細胞格磁控裝置150以集體運動使電子阱產生後,再變 化位置。變化位置的方式較之習知技術更為彈性,不會過度集中,因此,靶材消耗更為均勻。(3) After the cell dynamic control device 150 causes the electron trap to be generated by collective motion, it is changed again. Location. The way to change position is more flexible than the prior art, and it is not excessively concentrated, so the target consumption is more uniform.

(4)靶材、銅底板與細胞格狀磁盤分離式設計,細胞格狀磁盤更可以在大氣中,因此,調整或更換細胞格狀磁盤容易,靶材的更換也是,不會互相牽絆。(4) The target material, the copper base plate and the cell grid disk are separated and designed, and the cell grid disk can be in the atmosphere. Therefore, it is easy to adjust or replace the cell grid disk, and the target material is replaced without being tied to each other.

本發明雖以較佳實例闡明如上,然其並非用以限定本發明的精神與發明實體僅止於上述實施例。是以在不脫離本發明的精神與範圍內所作的修改,均應包括在下述申請專利範圍內。例如,細胞格磁控裝置的四方格型細胞格狀磁鐵,在另一實施例可以不包含環狀磁盤。換言之,環狀磁盤是一選擇性元件。再一者,濺鍍靶材雖以複數個分離靶材為例,本發明的細胞格磁控裝置,具有靶材消耗均衡的效果,因此,當可應用於一細胞格磁控裝置對應單一靶材。The present invention has been described above by way of a preferred example, and it is not intended to limit the spirit of the invention. Modifications made without departing from the spirit and scope of the invention are intended to be included within the scope of the following claims. For example, a square lattice cell magnet of a cell magnetic control device may not include a ring disk in another embodiment. In other words, the ring disk is an optional component. In addition, although the sputtering target is exemplified by a plurality of separate targets, the cell magnetic control device of the present invention has the effect of balancing the target consumption, and therefore, can be applied to a single target corresponding to a cell magnetic control device. material.

11‧‧‧固定環磁條11‧‧‧Fixed magnetic strip

13、14‧‧‧旋轉磁條13, 14‧‧‧Rotating magnetic strip

1、1a、1b‧‧‧靶材1, 1a, 1b‧‧‧ targets

16‧‧‧穿隧足極16‧‧‧Through the foot

7a、7b‧‧‧片狀陽極7a, 7b‧‧‧ flaky anode

5‧‧‧背板5‧‧‧ Backplane

6‧‧‧冷却板或冷却管路6‧‧‧Cooling plate or cooling line

12‧‧‧極板12‧‧‧ plates

110‧‧‧銅底板110‧‧‧ copper base plate

150‧‧‧細胞格磁控裝置150‧‧‧cell magnetic control device

152‧‧‧環狀磁盤152‧‧‧ ring disk

155‧‧‧細胞格狀磁盤155‧‧‧ cell grid disk

158‧‧‧獨立磁條158‧‧‧Independent magnetic strip

160‧‧‧水平移動機構160‧‧‧Horizontal moving mechanism

159‧‧‧基板159‧‧‧Substrate

120‧‧‧冷却底板120‧‧‧Slow floor

1591‧‧‧環狀磁盤的固定基板1591‧‧‧Fixed disk fixed substrate

圖1顯示習知的磁控濺鍍靶的橫斷面示意圖。Figure 1 shows a schematic cross-sectional view of a conventional magnetron sputtering target.

圖1a至圖1c顯示圖1所示的習知磁控濺鍍靶之磁力線的順序變化圖。1a to 1c are diagrams showing sequential changes in magnetic lines of force of the conventional magnetron sputtering target shown in Fig. 1.

圖2顯示依據圖1所示習知的磁控濺鍍靶,大面積濺鍍靶時有更多的原地旋轉磁條的橫斷面示意圖。2 shows a schematic cross-sectional view of a conventional magnetron sputtering target according to FIG. 1 with more in-situ rotating magnetic strips when a large-area sputtering target is used.

圖3顯示再一習知的磁控濺鍍靶。Figure 3 shows yet another conventional magnetron sputtering target.

圖4顯示本發明磁控濺鍍靶沿圖5平面圖中A-A線所繪製的橫截面示意圖。Figure 4 is a cross-sectional view showing the magnetron sputtering target of the present invention taken along line A-A of the plan view of Figure 5.

圖5顯示本發明磁控濺鍍靶之細胞格磁控裝置平面示意圖。Figure 5 is a plan view showing the cell magnetron of the magnetron sputtering target of the present invention.

圖6A至圖6D 顯示本發明磁控濺鍍靶之細胞格磁控裝置四種變化型的平面視圖。6A to 6D are plan views showing four variations of the cell magnetron of the magnetron sputtering target of the present invention.

152‧‧‧環狀磁盤152‧‧‧ ring disk

150‧‧‧細胞格磁控裝置150‧‧‧cell magnetic control device

158‧‧‧獨立磁條158‧‧‧Independent magnetic strip

155‧‧‧細胞格狀磁盤155‧‧‧ cell grid disk

Claims (10)

一種磁控濺鍍靶,至少包含:一靶材貼附於一銅底板上,該靶材連接一負電壓;一驅動裝置;一基板位於該銅底板之後方;一細胞格磁控裝置固定於該基板,該細胞格磁控裝置包含一細胞格狀磁盤,該細胞格狀磁盤由複數個第一磁條相接而成複數個格子,及複數個位於該些格子中心的第二磁條所組成,該複數個格子以二維方式彼此相鄰接,該基板由該驅動裝置所驅動,而以一預定速率,作預定二維平面軌跡的運動,該平面軌跡之中心,不與靶材表面中心重疊,該第一磁條及該第二磁條面向該靶材的一面磁極相反。 A magnetron sputtering target comprises at least: a target attached to a copper substrate, the target is connected to a negative voltage; a driving device; a substrate is located behind the copper substrate; and a cell magnetron is fixed to the substrate The substrate, the cell magnetic control device comprises a cell grid disk, wherein the cell grid disk is connected by a plurality of first magnetic strips to form a plurality of lattices, and a plurality of second magnetic strips located at the center of the lattices Composition, the plurality of lattices are adjacent to each other in a two-dimensional manner, and the substrate is driven by the driving device to perform a predetermined two-dimensional planar trajectory movement at a predetermined rate, the center of the planar trajectory not being opposite to the target surface The centers overlap, and the magnetic strips of the first magnetic strip and the second magnetic strip facing the target are opposite. 如申請專利範圍第1項所述之磁控濺鍍靶,其中上述之複數個格子選自由大小不相等的方格組、大小相等的方格組、蜂巢格狀、三角格組、多層同心圓形、多層同心心型所組成的群組的其中之一種。 The magnetron sputtering target according to claim 1, wherein the plurality of lattices are selected from the group consisting of squares of different sizes, equal-sized squares, honeycomb lattices, triangular lattices, and multi-layer concentric circles. One of a group of shaped, multi-layered concentric types. 如申請專利範圍第1項所述之磁控濺鍍靶,其中上述之細胞格磁控裝置更包含一環狀磁盤,圍繞並相距一預定距離固定於該細胞格狀磁盤之外的第二基板,該環狀磁盤朝向於該靶材的一面的磁極與該第一磁條的磁極相反。 The magnetron sputtering target according to claim 1, wherein the cell magnetron device further comprises a ring-shaped magnetic disk, and the second substrate is fixed around the cell grid disk at a predetermined distance. The magnetic pole of the annular disk facing one side of the target is opposite to the magnetic pole of the first magnetic strip. 如申請專利範圍第1項所述之磁控濺鍍靶,更包含一間距調整機構,用以調整該靶材與該細胞格磁控裝置的間距,藉以改變鍍率與均勻度。 The magnetron sputtering target according to claim 1, further comprising a spacing adjustment mechanism for adjusting the distance between the target and the cell magnetron device, thereby changing the plating rate and uniformity. 如申請專利範圍第1項所述之磁控濺鍍靶,更包含一角度調整機構,用以調整該靶材與該細胞格磁控裝置的夾角,藉以改變鍍率與均勻度。 The magnetron sputtering target according to claim 1, further comprising an angle adjusting mechanism for adjusting an angle between the target and the cell magnetron device, thereby changing the plating rate and the uniformity. 如申請專利範圍第1項所述之磁控濺鍍靶,其中上述之驅動裝置包含一馬達推動一連動裝置,該連動裝置包含連桿或凸輪或齒輪、齒條或皮帶或鍊條的機構組合。 The magnetron sputtering target of claim 1, wherein the driving device comprises a motor driving a linkage device comprising a linkage of a connecting rod or a cam or a gear, a rack or a belt or a chain. 如申請專利範圍第1項所述之磁控濺鍍靶,其中上述之銅底板與該細胞格磁控裝置之間更包含一冷却裝置。 The magnetron sputtering target of claim 1, wherein the copper substrate and the cell magnetron further comprise a cooling device. 如申請專利範圍第1項所述之磁控濺鍍靶,其中上述之基板中心的平面運動軌跡包含圓形、橢圓、轉角為圓角的矩形或菱形的超橢圓軌跡的其中一種,而該預定速率約4-19cm/s。 The magnetron sputtering target according to claim 1, wherein the planar motion track of the center of the substrate comprises one of a circular, elliptical, rectangular or diamond-shaped hyperelliptical trajectory with a rounded corner, and the predetermined The rate is about 4-19 cm/s. 一種磁控濺鍍靶,至少包含:一靶材貼附於一銅底板上,該靶材連接一負電壓;一驅動裝置;一基板位於該銅底板之後方;一細胞格磁控裝置固定於該基板,該細胞格磁控裝置包含一細胞格狀磁盤,該細胞格狀磁盤由複數個第一磁條相接而成複數個格子,及複數個位於每一該格子中心的第二磁條所組成,所述複數個格子中該複數個格子以二維方式彼此相鄰接,該基板由該驅動裝置所驅動,而以一預定速率,作預定二維平面軌跡的運動,該平面軌跡之中心,不與靶材表面中心重疊,該第一磁條及該第二磁條面向該靶材的一面磁極相反;一環狀磁盤,圍繞並相距一預定距離固定於該細胞格狀磁盤之外的第二基板,該環狀磁盤朝向於該靶材的一面的磁極與該第一磁條的磁極相反,該第二基板是固定的。 A magnetron sputtering target comprises at least: a target attached to a copper substrate, the target is connected to a negative voltage; a driving device; a substrate is located behind the copper substrate; and a cell magnetron is fixed to the substrate The substrate, the cell magnetic control device comprises a cell grid disk, wherein the cell grid disk is connected by a plurality of first magnetic strips to form a plurality of lattices, and a plurality of second magnetic strips located at the center of each of the lattice strips The plurality of grids are adjacent to each other in a two-dimensional manner, and the substrate is driven by the driving device to perform a predetermined two-dimensional plane trajectory movement at a predetermined rate, the plane trajectory a center, not overlapping the center of the surface of the target, the first magnetic strip and the second magnetic strip facing opposite sides of the target magnetic pole; an annular magnetic disk fixed around the cell grid disk at a predetermined distance a second substrate, the magnetic pole of the annular disk facing one side of the target is opposite to the magnetic pole of the first magnetic strip, and the second substrate is fixed. 如申請專利範圍第9項所述之磁控濺射靶,其中上述之複數個格子排成三列,且每列各有複數個格子,中間列的格子數相對較少,並以通過該細胞格磁控裝置中心水平線呈鏡面對稱。The magnetron sputtering target according to claim 9, wherein the plurality of grids are arranged in three columns, and each column has a plurality of lattices, and the number of lattices in the middle column is relatively small, and the cells are passed through the cell. The horizontal line of the magnetic control device is mirror-symmetrical.
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CN100594255C (en) * 2006-11-30 2010-03-17 武汉大学 Method and device for preparing rare earth doped gallium nitride light-emitting film
CN201817544U (en) * 2010-10-28 2011-05-04 北儒精密股份有限公司 Movable magnetic control device of sputtering equipment

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