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TWI316131B - Apparatus and method for inspecting edge defect and discoloration of glass substrate - Google Patents

Apparatus and method for inspecting edge defect and discoloration of glass substrate

Info

Publication number
TWI316131B
TWI316131B TW95129342A TW95129342A TWI316131B TW I316131 B TWI316131 B TW I316131B TW 95129342 A TW95129342 A TW 95129342A TW 95129342 A TW95129342 A TW 95129342A TW I316131 B TWI316131 B TW I316131B
Authority
TW
Taiwan
Prior art keywords
discoloration
glass substrate
edge defect
inspecting edge
inspecting
Prior art date
Application number
TW95129342A
Other languages
Chinese (zh)
Other versions
TW200809184A (en
Inventor
Bong-Joo Woo
Soon-Jong Lee
Original Assignee
Semisysco Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Semisysco Co Ltd filed Critical Semisysco Co Ltd
Priority to TW95129342A priority Critical patent/TWI316131B/en
Publication of TW200809184A publication Critical patent/TW200809184A/en
Application granted granted Critical
Publication of TWI316131B publication Critical patent/TWI316131B/en

Links

TW95129342A 2006-08-10 2006-08-10 Apparatus and method for inspecting edge defect and discoloration of glass substrate TWI316131B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW95129342A TWI316131B (en) 2006-08-10 2006-08-10 Apparatus and method for inspecting edge defect and discoloration of glass substrate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW95129342A TWI316131B (en) 2006-08-10 2006-08-10 Apparatus and method for inspecting edge defect and discoloration of glass substrate

Publications (2)

Publication Number Publication Date
TW200809184A TW200809184A (en) 2008-02-16
TWI316131B true TWI316131B (en) 2009-10-21

Family

ID=44767081

Family Applications (1)

Application Number Title Priority Date Filing Date
TW95129342A TWI316131B (en) 2006-08-10 2006-08-10 Apparatus and method for inspecting edge defect and discoloration of glass substrate

Country Status (1)

Country Link
TW (1) TWI316131B (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI479145B (en) * 2013-07-19 2015-04-01 Hon Hai Prec Ind Co Ltd System and Method for Detecting Shape Flaw
TWI638139B (en) * 2017-09-13 2018-10-11 頂瑞機械股份有限公司 Glass inspection system and method

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107238955B (en) * 2017-06-30 2023-12-29 北京兆维科技开发有限公司 Liquid crystal module screen detection system
CN109494167A (en) * 2018-11-29 2019-03-19 北京铂阳顶荣光伏科技有限公司 Base board defect detecting device and filming equipment
CN112180872B (en) * 2020-10-14 2022-09-23 浙江工商职业技术学院 Devices for Industrial Process Control

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI479145B (en) * 2013-07-19 2015-04-01 Hon Hai Prec Ind Co Ltd System and Method for Detecting Shape Flaw
TWI638139B (en) * 2017-09-13 2018-10-11 頂瑞機械股份有限公司 Glass inspection system and method

Also Published As

Publication number Publication date
TW200809184A (en) 2008-02-16

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees