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TWI379992B - - Google Patents

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TWI379992B
TWI379992B TW97149405A TW97149405A TWI379992B TW I379992 B TWI379992 B TW I379992B TW 97149405 A TW97149405 A TW 97149405A TW 97149405 A TW97149405 A TW 97149405A TW I379992 B TWI379992 B TW I379992B
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Taiwan
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detecting
mass
driving
detection
angular velocity
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TW97149405A
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Chinese (zh)
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TW200942776A (en
Inventor
Yoichi Mochida
Masaya Tamura
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Murata Manufacturing Co
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Publication of TWI379992B publication Critical patent/TWI379992B/zh

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01CMEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C19/00Gyroscopes; Turn-sensitive devices using vibrating masses; Turn-sensitive devices without moving masses; Measuring angular rate using gyroscopic effects
    • G01C19/56Turn-sensitive devices using vibrating masses, e.g. vibratory angular rate sensors based on Coriolis forces
    • G01C19/5705Turn-sensitive devices using vibrating masses, e.g. vibratory angular rate sensors based on Coriolis forces using masses driven in reciprocating rotary motion about an axis
    • G01C19/5712Turn-sensitive devices using vibrating masses, e.g. vibratory angular rate sensors based on Coriolis forces using masses driven in reciprocating rotary motion about an axis the devices involving a micromechanical structure

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Gyroscopes (AREA)

Description

1379992 九、發明說明: 【發明所屬之技術領域】 本發明係關於一種適合用於利用例如一個振動體來檢測 2個轴方向之角速度之角速度感測器。 【先前技術】 般而s,作為角速度感測器,已知有在基板上具備複 數個質量部者(例如參照專利文獻卜3)。於專利讀】中揭 示有如下構成,即,沿著包圍基板上之中心點之圓周設置 4個質量部,並且將上述4個質量部配置於沿著正交之2個 轴而為對稱之位置。於該情形時,4個質量部係於圓周方 向上驅動振動《在該狀態下,當圍繞基板之垂直軸之角速 度產生作用時,4個質量部藉由科氏力而於直徑方向上移 位因此,專利文獻1之角速度感測器係如下述者,即, 對4個質量部之直徑方向之移位進行檢測,藉此檢測圍繞工 個軸之角速度。 於專利文獻2中揭示有如下構成,即,沿著包圍基板上 之中心點之圓周設置4個質量部,並且將上述4個質量部安 裝在自中心點延伸之梁之前端。於該情形時,4個質量部 係於圓周方向上驅動振動’並且圓周方向上相鄰之質量部 彼此朝反方向振動。在該狀態下,當圍繞與基板之表面平 行之2個轴之角速度產生作用時,4個質量部係藉由科氏力 而於基板之垂直方向(厚度方向)上移位。因此,專利文獻2 之角速度感測器係如下述者,即,對4個質量部之垂直方 向之移位進行檢測,藉此檢測圍繞2個軸之角速度。 137I27.doc ^/9992 於專利文獻3中揭示有如下構成,即,將2個質量部並排 地配置於基板上之橫方向上,並且以包圍上述2個質量部 之方式設置圓«之框體。於該情料,框體連接於2個 質1。又,2個質量部係使用連接裝置而加以連結,並 且於基板之垂直方向上,彼此朝反方向振動。於該狀態 下,當角速度圍繞質量部之並排方向之轴而產生作用時, 藉由作用於質量部之科氏力,框體係於圓周方向上旋轉振 動。因此,專利文獻3之角速度感測器係如下述者,即, 對框體之圓周方向之移位進行檢測,藉此檢測圍繞丨個軸 之角速度。 [專利文獻1]日本專利特開2000-1801 74號公報 [專利文獻2]日本專利特開平11 — 183179號公報.1379992 IX. Description of the Invention: [Technical Field] The present invention relates to an angular velocity sensor suitable for detecting an angular velocity of two axial directions using, for example, a vibrating body. [Prior Art] As an angular velocity sensor, it is known that a plurality of mass portions are provided on a substrate (for example, refer to Patent Document 3). In the patent reading, a configuration is disclosed in which four mass portions are provided along a circumference surrounding a center point on a substrate, and the four mass portions are disposed at positions symmetrical along two orthogonal axes. . In this case, the four mass portions drive the vibration in the circumferential direction. In this state, when the angular velocity around the vertical axis of the substrate acts, the four mass portions are displaced in the diameter direction by the Coriolis force. Therefore, the angular velocity sensor of Patent Document 1 detects the displacement in the radial direction of the four mass portions, thereby detecting the angular velocity around the axis of the workpiece. Patent Document 2 discloses a configuration in which four mass portions are provided along the circumference of a center point on a surrounding substrate, and the four mass portions are mounted on the front end of the beam extending from the center point. In this case, the four mass portions drive the vibration ' in the circumferential direction' and the mass portions adjacent in the circumferential direction vibrate in opposite directions to each other. In this state, when the angular velocity around the two axes parallel to the surface of the substrate acts, the four mass portions are displaced in the vertical direction (thickness direction) of the substrate by the Coriolis force. Therefore, the angular velocity sensor of Patent Document 2 detects the angular displacement around the two axes by detecting the displacement in the vertical direction of the four mass portions. 137I27.doc ^/9992 discloses a configuration in which two mass portions are arranged side by side in the lateral direction of the substrate, and a frame of a circle « is provided so as to surround the two mass portions. . In this case, the frame is connected to two masses. Further, the two mass portions are connected by a connecting device, and are vibrated in opposite directions in the vertical direction of the substrate. In this state, when the angular velocity acts on the axis of the side-by-side direction of the mass portion, the frame system rotates in the circumferential direction by the Coriolis force acting on the mass portion. Therefore, the angular velocity sensor of Patent Document 3 detects the displacement of the frame in the circumferential direction, thereby detecting the angular velocity around the respective axes. [Patent Document 1] Japanese Laid-Open Patent Publication No. 2000-1801 No. Hei.

[專利文獻3]日本專利特表2007-509346號公報 【發明内容】 [發明所欲解決之問題] 然而’專利文獻1之角速度感測器係對圍繞1個軸之角速 度進行檢測之構成。因此,為了對圍繞2個軸之角速度進 行檢測’必需使用兩個角速度感測器,從而存在製造成本 增大之問題。 另一方面,專利文獻2之角速度感測器係對圍繞2個軸之 角速度進行檢測之構成。然而,該角速度感測器係對由科 氏力引起之質量部之移位進行檢測者,但該質量部本身會 加以驅動振動。因此,例如由於質量部之加工不均等而使 得驅動振動之移位在檢測方向上晃動時,即便角速度未產 137127.doc 1379992 生作用(靜止時)’亦會於變位之檢測部分產生較大之訊號 (雜訊訊號)。藉由利用與由科氏力產生之訊號之相位之不 同’可將即便於靜止時亦會產生之該雜訊訊號加以分離。 然而’藉由雜訊訊號’同步檢波前之放大率受到限制,於 訊號處理之後半段中必需大幅度地進行放大,從而雜訊相 對地變大。又’由於同步檢波產生之相位誤差,產生伴隨 雜訊訊號之較大之偏移輸出。進而,該偏移輸出會引起由 度變化而產生之漂移’從而存在角速度之檢測精度降低 之問題。 又’專利文獻3之角速度感測器係如下述構成,即,由 於係檢測部之框體於驅動振動中保持靜止之構成,因此於 靜止時不會產生驅動振動之訊號。然而,質量部係相對於 基板之垂直方向進行驅動振動之構成,因此,難以確保較 大之驅動振幅,從而存在角速度之檢測靈敏度變低之傾 向。又’由於係對圍繞1個軸之角速度進行檢測之構成, 因此’為了對圍繞2個軸之角速度進行檢測,必需使用兩 個角速度感測器,從而亦存在製造成本增大之問題。 本發明係鑒於上述先前之技術問題開發而完成者,本發 明之目的在於提供可高精度且高靈敏度地檢測圍繞2個軸 之角速度之角速度感測器。 [解決問題之技術手段] 為解決上述問題’請求項1之發明之角速度感測器係藉 由下述構件而構成:基板;4個驅動質量部,其與該基板 保持間隙地相對向,且配置在相對於令心部呈點對稱之位 】37127.doc 1379992 -置;驅動梁,其在與上述基板平行之狀態下以使上述各驅 動質1部可圍繞位於中心部側之支點而振動之方式支持上 述各驅動質里部,連結梁,其將上述4個驅動質量部之支 點附近彼此加以連結;驅動機構,其設置於上述基板之中 . 心部側,且使上述4個驅動質量部以上述支點為中心而朝 . 包圍中心部之圓周方向振動;檢測質量部,其使用上述驅 動梁而連接於上述4個驅動質量部;檢測梁,其設置於該 φ 檢測質量部與上述基板之間,且以使該檢測質量部可圍繞 與上述基板平行之2個轴而振動之方式支持該檢測質量 部;以及移位檢測機構,其於上述檢測質量部圍繞2個軸 而振動時,對上述檢測質量部在上述基板之厚度方向上移 位之情況進行檢測。 於請求項2之發明中,上述4個驅動質量部係相對於包圍 上述中心部之圓周方向上彼此等間隔地配置,上述檢測梁 係設為位於相鄰之2個驅動質量部之間且沿著上述2個轴延 • 伸之構成。 於請求項3之發明中,上述移位檢測機構係位於相鄰之2 個驅動質量部之間,配置在相對於中心部呈點對稱之位 置,且藉由與上述檢測質量部相對向地設置之4個檢測電 極而構成。 於請求項4之發明令,上述檢測質量部上設置有蓋板, 該蓋板係與上述4個驅動質量部保持間隙地覆蓋該檢測質 量P上述移位檢測機構係配置在相對於中心部呈點對稱 之位置,且藉由與該蓋板相對向地設置之4個檢測電極而 137127.doc 1379992 構成。 於請求項5之發明中,上述檢測質量部係構成為其全部 或一部分之厚度尺寸比上述驅動質量部、驅動梁、連結 梁、以及檢測梁之厚度尺寸薄。 於請求項6之發明中,設置有對上述驅動質量部之振動 方向之移位進行監視之監視機構。 於請求項7之發明中,上述檢測梁係使用扭轉支持梁而 形成,該扭轉支持梁於上述檢測質量部在基板之厚度方向 上移位時會產生扭轉變形。 於請求項8之發明中,上述檢測梁係構成為使用應力減 小連接部而分別連接於上述檢測質量部與基板,該應力減 小連接部減小於扭轉變形時作用於該檢測梁之端部側之應 力。 [發明之效果] 根據請求項1之發明,4個驅動質量部係配置在相對於中 心部呈點對稱之位置,因此,2個驅動質量部係夾持中心 部而彼此相對向,並且剩餘之2個驅動質量部亦失持中心 部而彼此相對向。此時,2個驅動質量部與剩餘之2個驅動 質量部彼此配置於不同之位置。因此,例如當基板沿著與 X轴以及Y軸平行之χ_γ平面延展時,2個驅動質量部係沿 著經由中心部之1根線(例如χ軸)而配置,並且剩餘之2個 驅動質量部沿著經由中心部之其他線(例如Υ軸)而配置ρ 又’ 4個驅動質量部沿著包圍中心部之圓周方向而振動, 因此,例如沿著乂軸配置之2個驅動質量部會於Υ軸方向上 137127.doc 1379992 振動,沿著Y軸配置之2個驅動質量部會於X轴方向上振 動。 另一方面,使用驅動梁將檢測質量部連接於4個驅動質 量部’並且該檢測質量部可圍繞與基板平行之2個轴(檢測 轴A、Β)振動。此時,檢測質量部之2個軸可為位於X軸與 Y軸之間之2個軸(傾斜軸),亦可為X軸以及γ軸。[Problem to be Solved by the Invention] The angular velocity sensor of Patent Document 1 is configured to detect an angular velocity around one axis. Therefore, in order to detect the angular velocity around the two axes, it is necessary to use two angular velocity sensors, so that there is a problem that the manufacturing cost increases. On the other hand, the angular velocity sensor of Patent Document 2 is configured to detect the angular velocity around two axes. However, the angular velocity sensor detects the displacement of the mass portion caused by the Coriolis force, but the mass portion itself drives the vibration. Therefore, for example, when the displacement of the driving vibration is swayed in the detecting direction due to the processing unevenness of the mass portion, even if the angular velocity is not produced, the effect of the displacement is greater in the detecting portion of the displacement. Signal (noise signal). By using the difference between the phase of the signal generated by Coriolis force, the noise signal generated even at rest can be separated. However, the amplification rate before the synchronous detection by the noise signal is limited, and it is necessary to perform a large amplification in the latter half of the signal processing, so that the noise becomes relatively large. Moreover, due to the phase error generated by the synchronous detection, a large offset output accompanying the noise signal is generated. Further, the offset output causes a drift caused by a change in degree, and there is a problem that the detection accuracy of the angular velocity is lowered. Further, the angular velocity sensor of Patent Document 3 has a configuration in which the frame of the detecting portion is held stationary during the driving vibration, so that the driving vibration signal is not generated when it is stationary. However, since the mass portion is configured to drive vibration with respect to the vertical direction of the substrate, it is difficult to secure a large driving amplitude, and there is a tendency that the detection sensitivity of the angular velocity is lowered. Further, since the angular velocity around one axis is detected, it is necessary to use two angular velocity sensors in order to detect the angular velocity around the two axes, which also causes an increase in manufacturing cost. The present invention has been made in view of the above-described problems of the prior art, and an object of the present invention is to provide an angular velocity sensor capable of detecting an angular velocity around two axes with high precision and high sensitivity. [Means for Solving the Problems] In order to solve the above problem, the angular velocity sensor of the invention of claim 1 is configured by: a substrate; four driving mass portions that face each other with a gap therebetween, and Arranging at a position symmetrical with respect to the center of the core 37127.doc 1379992 - driving the beam, in a state parallel to the substrate, so that each of the driving materials 1 can vibrate around a fulcrum located on the center side In the manner of supporting the above-mentioned respective inner portions of the driving elements, the connecting beam is connected to the vicinity of the fulcrums of the four driving mass portions, and the driving mechanism is disposed on the side of the substrate, and the four driving qualities are provided. a portion vibrating in a circumferential direction surrounding the center portion around the fulcrum; a detecting mass portion connected to the four driving mass portions by using the driving beam; and a detecting beam provided on the φ detecting mass portion and the substrate And supporting the detecting mass portion so that the detecting mass portion can vibrate around two axes parallel to the substrate; and the displacement detecting mechanism, wherein the detecting portion The mass unit is vibrated about the two axes, a case where the detection unit mass shift in the thickness direction of the substrate of the detected bit. In the invention of claim 2, the four driving mass portions are disposed at equal intervals in a circumferential direction surrounding the center portion, and the detecting beam is disposed between adjacent two driving mass portions and along The above two axes are extended and stretched. In the invention of claim 3, the displacement detecting mechanism is disposed between the adjacent two driving mass portions, is disposed at a point symmetry with respect to the center portion, and is disposed opposite to the detecting mass portion. It is composed of four detection electrodes. According to the invention of claim 4, the detecting mass portion is provided with a cover plate that covers the detection mass with a gap between the cover and the four driving mass portions. The displacement detecting mechanism is disposed at a center portion. The position of the point is symmetrical, and is constituted by four detecting electrodes disposed opposite to the cover plate 137127.doc 1379992. In the invention of claim 5, the detecting mass portion is configured such that all or a part thereof has a thickness smaller than a thickness dimension of the driving mass portion, the driving beam, the connecting beam, and the detecting beam. According to the invention of claim 6, the monitoring means for monitoring the shift of the vibration direction of the driving mass portion is provided. In the invention of claim 7, the detecting beam is formed using a torsion support beam which is torsionally deformed when the detecting mass portion is displaced in the thickness direction of the substrate. In the invention of claim 8, the detecting beam is configured to be connected to the detecting mass portion and the substrate by using a stress reducing connecting portion, and the stress reducing connecting portion is reduced in torsion deformation to act on an end side of the detecting beam. The stress. [Effects of the Invention] According to the invention of claim 1, the four driving mass portions are disposed at positions that are point-symmetric with respect to the center portion. Therefore, the two driving mass portions sandwich the center portion and face each other, and the remaining The two drive mass units also miss the center portion and face each other. At this time, the two drive mass portions and the remaining two drive mass portions are disposed at different positions. Therefore, for example, when the substrate extends along the χγ plane parallel to the X axis and the Y axis, the two driving mass portions are arranged along one line (for example, the χ axis) via the center portion, and the remaining two driving qualities are The portion is disposed along the other line (for example, the x-axis) passing through the center portion, and the four driving mass portions vibrate in the circumferential direction surrounding the center portion. Therefore, for example, the two driving mass portions arranged along the x-axis are In the direction of the x-axis, 137127.doc 1379992 vibrates, and the two driving masses arranged along the Y-axis vibrate in the X-axis direction. On the other hand, the detecting mass portion is connected to the four driving mass portions ' using the driving beam, and the detecting mass portion is rotatable about two axes (detection axes A, Β) parallel to the substrate. In this case, the two axes of the detecting mass portion may be two axes (inclination axes) located between the X axis and the Y axis, and may be an X axis and a γ axis.

而且,若圍繞一方之檢測軸A之角速度產生作用,則圍 φ 繞檢測轴A之角速度中之圍繞X軸方向之成分會作用於在Y 軸方向上振動之驅動質量部,對應於該成分,產生朝向z 軸方向(基板之厚度方向)之科氏力。同樣地,圍繞檢測軸 A之角速度中之圍繞γ軸方向之成分會作用於在X軸方向上 振動之驅動質量部,對應於該成分,產生朝向Z轴方向(基 板之厚度方向)之科氏力。 又’若圍繞他方之檢測轴B之角速度產生作用,則圍繞 檢測軸B之角速度中之圍繞χ軸方向之成分會作用於在γ抽 • 方向上振動之驅動質量部,對應於該成分,產生朝向z軸 方向(基板之厚度方向)之科氏力。同樣地,圍繞檢測軸B 之角速度中之圍繞γ軸方向之成分會作用於在χ軸方向上 振動之驅動質量部,對應於該成分,產生朝向Z軸方向(基 '板之厚度方向)之科氏力。 繼而’作用於4個驅動質量部之科氏力經由驅動梁而傳 遞至檢測質量部,因此,檢測質量部以2個檢測軸為中心 而搖動。又’使圓周方向上相鄰之驅動質量部彼此朝反方 向振動’藉此,夾持中心部而於Z軸方向上反向之力會作 137127.doc 11 1379992 用於檢測質量部。其結果,對應於作用在χ_γ平面上之2個 檢測軸周圍之角逮度,檢測質量部圍繞2個檢測軸而振 動。因此,使用移位檢測機構來對檢測質量部在基板之厚 度方向上移位之情況進行檢測,藉此,可檢測作用於2個 檢測軸周圍之角逮度。藉此,與使用有圍繞丨個軸之兩個 感測器之情形相比,可減小製造成本β 又,4個驅動質量部係配置在相對於中心部呈點對稱之 位置,因此,使圓周方向上彼此相鄰之驅動質量部朝反方 向(反相位)振動,藉此,可固定4個驅動質量部整體之重心 位置,並且可抵消4個驅動質量部整體所產生之圓周方向 之轉矩。此時,由於連結梁將4個驅動質量部之支點附近 彼此加以連結,故而例如即便4個驅動質量部中產生了加 工不均時,各驅動質量部亦於驅動振幅以及相位一致之狀 態下振動。其結果,能夠可靠地減小4個驅動質量部整體 之重心位置之變動或轉矩,從而能夠不使驅動質量部之驅 動振動對基板造成影響。 又,由於設為如下構成,即,作用於驅動質量部之科氏 力經由驅動梁而傳遞至檢測質量部,因此,檢測質量部不 會驅動振動,僅會因科氏力而移位。因此,例如當藉由加 工不均而導致驅動質量部在基板之垂直方向(厚度方向)上 搖晃(傾斜)之狀態下振動時,檢測質量部亦不會搖晃。因 此,移位檢測機構可對檢測質量部之移位進行檢測,而不 會受到驅動質量部之搖晃之影響。藉此,當移位檢測機構 輸出移位之檢測訊號時,可減小相對於該檢測訊號之雜 J37I27.doc •12· 1379992 訊、偏移輸出以及輸出之溫度變化, 檢測精度。 又’由於驅動質量部係在盥基柘巫〜 /'丞扳千仃之狀態下振動,故 而與在與基板垂直之方向上振動之,芦 助之情形相比,可增大驅動 振幅。因此,可增大作用於驅動質 只里砟之科氏力,故而亦 可增大由科氏力引起之檢測質量部 、丨之移位,從而可提高角 速度之檢測靈敏度。Further, if an angular velocity around one of the detection axes A is generated, the component around the X-axis direction of the angular velocity around the detection axis A acts on the driving mass portion vibrating in the Y-axis direction, corresponding to the component, The Coriolis force is generated in the z-axis direction (the thickness direction of the substrate). Similarly, the component around the γ-axis direction around the angular velocity of the detection axis A acts on the driving mass portion vibrating in the X-axis direction, and corresponding to the component, the Coriolis direction is generated in the Z-axis direction (thickness direction of the substrate). force. Further, if the angular velocity around the detection axis B of the other side is generated, the component around the axis direction of the angular velocity of the detection axis B acts on the driving mass portion vibrating in the γ pumping direction, corresponding to the component, resulting in Coriolis force toward the z-axis direction (thickness direction of the substrate). Similarly, the component around the γ-axis direction around the angular velocity of the detection axis B acts on the driving mass portion vibrating in the z-axis direction, and corresponding to the component, is generated in the Z-axis direction (the thickness direction of the base 'plate) Coriolis force. Then, the Coriolis force acting on the four driving mass portions is transmitted to the detecting mass portion via the driving beam, and therefore, the detecting mass portion is swung around the two detecting axes. Further, the driving mass portions adjacent in the circumferential direction are vibrated in opposite directions with each other, whereby the force which is opposed to the center portion and reversed in the Z-axis direction is 137127.doc 11 1379992 for detecting the mass portion. As a result, the detection mass portion vibrates around the two detection axes in accordance with the angular catch around the two detection axes acting on the χ_γ plane. Therefore, the displacement detecting means detects the displacement of the detecting mass portion in the thickness direction of the substrate, whereby the angular catch around the two detecting axes can be detected. Thereby, compared with the case where two sensors surrounding one axis are used, the manufacturing cost β can be reduced, and the four driving mass portions are disposed at positions that are point-symmetric with respect to the center portion, thus The driving mass portions adjacent to each other in the circumferential direction vibrate in the opposite direction (reverse phase), whereby the position of the center of gravity of the entire four driving mass portions can be fixed, and the circumferential direction generated by the entire four driving mass portions can be offset. Torque. In this case, since the connecting beam connects the vicinity of the fulcrums of the four driving masses, for example, even if machining unevenness occurs in the four driving masses, the respective driving masses vibrate in a state where the driving amplitude and the phase are uniform. . As a result, it is possible to reliably reduce the fluctuation or torque of the center of gravity of the entire four driving mass portions, and it is possible to prevent the driving vibration of the driving mass portion from affecting the substrate. Further, since the Coriolis force acting on the driving mass portion is transmitted to the detecting mass portion via the driving beam, the detecting mass portion does not drive the vibration and is displaced only by the Coriolis force. Therefore, for example, when the driving mass portion is vibrated in a state where the driving mass portion is shaken (tilted) in the vertical direction (thickness direction) of the substrate by uneven processing, the detecting mass portion is not shaken. Therefore, the displacement detecting mechanism can detect the displacement of the detecting mass portion without being affected by the shaking of the driving mass portion. Therefore, when the shift detecting mechanism outputs the shift detection signal, the temperature variation and the detection accuracy of the miscellaneous J37I27.doc •12· 1379992 signal, the offset output, and the output can be reduced. Further, since the driving mass portion vibrates in a state in which the 质量 柘 〜 / / / / / / , , , , , , 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 Therefore, the Coriolis force acting on the driving force can be increased, so that the displacement of the detecting mass portion and the crucible caused by the Coriolis force can be increased, and the detection sensitivity of the angular velocity can be improved.

根據請求項2之發明,4個驅動質量部彼此等間隔地配置 於包圍中心部之圓周方向上,檢測梁位於相鄰之2個驅動 質里部之間且沿著2個轴(檢測轴)延伸。因此沿著一方之 檢測軸延伸之檢測梁可對檢測質量部進行支持,使得該檢 測質量部能夠以該檢測梁為中心(支點)而於基板之厚度方 向上移位》同樣地,沿著他方之檢測軸延伸檢測梁亦對檢 測質量部進行支持,使得該檢測質量部能夠以該檢測梁為 中心而於基板之厚度方向上移位。其結果,檢測梁能夠以According to the invention of claim 2, the four driving mass portions are arranged at equal intervals in the circumferential direction surrounding the center portion, and the detecting beam is located between the adjacent two driving core portions and along the two axes (detection axis) extend. Therefore, the detecting beam extending along one of the detecting axes can support the detecting mass portion such that the detecting mass portion can be displaced in the thickness direction of the substrate centering on the detecting beam (the fulcrum). Similarly, along the other side The detection axis extension detecting beam also supports the detection mass portion such that the detection mass portion can be displaced in the thickness direction of the substrate centering on the detection beam. As a result, the detection beam can

從而可提高感測器之 可圍繞與基板平行之2個檢測軸振動之方式來支持檢測質 量部。 又,檢測梁係設為位於相鄰之2個驅動質量部之間且沿 著2個檢測軸延伸之構成。因此,與將檢測梁設置於較驅 動質量部更靠外周側之情形相比,可使感測器整體小型 化。 根據睛求項3之發明,移位檢測機構係位於相鄰之2個驅 動質量部之間,配置在相對於中心部呈點對稱之位置,且 藉由與檢測質量部相對向地設置之4個檢測電極而構成。 137127.doc 2處,當角速度作用於圍繞與基板平行之2個檢測軸時, 檢測質量部圍繞與基板平行之2個檢測轴振動並於基板 之厚度方向上移位部與4個檢測電極之 間之距離對應於角速度而產生變化,故而可藉由檢測續 檢測電極與檢測質量部之間之靜電容而檢測圍繞2個檢測 軸之角速度。 根據請求項4之發明,設置覆蓋檢測質量部之蓋板,移 位檢測機構係藉由與該i板相對向地設置之4個檢測電極 而構成。因此,蓋板與檢測質量部一併移位,故而可藉由 檢測蓋板與檢測電極之間之靜電容而檢測圍繞2個檢測軸 之角速度。又,可將蓋板配置於驅動質量部與檢測電極之 間。藉此’由於可利用蓋板來阻斷驅動質量部之影響,故 而可將檢測電極延展至與驅動質量部相對向之位置為止。 其結果,可增大檢測電極之面積,從而可提高角速度之檢 測靈敏度。 根據請求項5之發明,檢測質量部之構成係設為其全部 或一部分之厚度尺寸比驅動質量部、驅動梁、連結梁、以 及檢測梁之厚度尺寸薄,因此,可減小檢測質量部之質 量’從而增大由科氏力引起之檢測質量部之位移量。藉 此’可提高角速度之檢測靈敏度。 根據請求項6之發明,由於設置有對驅動質量部之振動 方向之移位進行監視之監視機構,故而可使用監視機構來 檢測驅動質量部之振動振幅 以及相位。因此,驅動振動之 振盡電路可將監視機構之輸出訊號用作參照訊號’從而實 I37127.doc -14- 1379992 現共振狀態之穩定化。又,角速度之檢測電路亦可將監視 機構之輸出訊號用作參照訊號,從而可㈣㈣質量以 振動狀態來進行正確之同步檢波。 根據請求項7之發明,檢測梁係使用扭轉支持梁而形 成’該扭轉支持梁於檢測質量部在基板之厚度方向上移位 時會產生扭轉變形’因&,例如可藉由於基板之垂直方向 上對石夕材㈣進行加卫而形餘轉支持梁,從而可容易地 進行加工。又,扭轉支持梁之彈簧常數與寬度尺寸之3次 方成比例地變動,但此與驅動梁、連結梁相同。因此,可 減i寬度尺寸之加工不均對驅動模式與檢測模式之共振頻 率差造成之影響,從而可減小感測器之靈敏度不均。 根據請求項8之發明,檢測梁係使用應力減小連接部而 刀别連接於檢測質量部與基板。此處,例如當使用1塊呈 長之板形狀之扭轉支持梁來構成檢測梁,並且固定該檢 測梁之兩端時,作用於固定部分之應力會阻礙檢測梁之扭 轉變形因此’當檢測梁之厚度尺寸產生變化時,與該厚 度尺寸之變化量相對應之共振頻率之變化變大。其結果, 存在如下傾向’即’加工不均對驅動模式與檢測模式之共 振頻率差造成之影響變大。 相對於此’於本發明中’檢測梁係使用在檢測梁之長度 方向上具有自由度之應力減小連接部而分別連接於檢測質 里部與基板。因此,當檢測梁產生扭轉變形時,檢測梁之 端4側可於其長度方向上移位,因此,可減小作用於檢測 本之兩端側之崎變或應力。藉此,可減小厚度尺寸之加工 137127.doc 15 13799¾ 不均對驅動模式與檢測模式之共振頻率差造成之影響,從 而可減小感測器之靈敏度不均。 【實施方式】 以下,一面參照隨附圖式,一面對本發明之實施形態之 角速度感測器加以詳細說明。 首先,圖1至圖9表示第1實施形態之角速度感測器丨。於 圖中’角速度感測器1係藉由基板2、驅動質量部4〜7、驅 動梁8、連結梁9、振動產生部10〜13、檢測質量部15、檢 測梁16、17、移位檢測部18〜21、振動監視部22、23等而 構成。 基板2構成角速度感測器丨之基礎部分。而且,基板2藉 由例如玻璃材料等而形成為四角形之平板狀,且沿著彼此 正父之X轴、Y轴以及z轴方向中之例如X軸以及γ軸方向 而水平地延伸。 又,於基板2上,對例如具有導電性之低電阻之矽材料 等實施蝕刻加工,藉此形成支持部3、驅動質量部4〜7、驅 動梁8、連結梁9、檢測質量部15、檢測梁16、17等。 支持部3設置於基板2之表面。又,支持部3位於基扳2之 外緣側並形成為框狀。繼而,於支持部3之内部,在自基 板2浮起之狀態下設置有驅動質量部4〜7、驅動梁8、連結 梁9、檢測質量部15以及檢測梁16、17,且經由支持部3而 連接於地面。此時,下述之振動產生部1〇〜13之可動側驅 動電極10A〜13A、移位檢測部18〜2丨之可動側檢測電極 18A〜21A等亦經由支持部3而連接於地面。另一方面,振 137127.doc -16 - 1379992 動產生部10〜13之固定側驅動電極10B〜13B連接於電極支 持部14 ’移位檢測部1 8〜21之固定侧檢測電極丨8β〜21B經 由基板2上之配線而連接於檢測用引出部24» 驅動質量部4〜7保持有間隙地與基板2之表面相對向,且 配置在相對於中心部(中心點〇)呈點對稱之位置。又,驅 動質量部4〜7係每90。彼此等間隔地配置於包圍中心點〇之 圓周方向上》因此,X轴側驅動質量部4、5係沿著χ軸而 配置,且夾持中心點0而彼此相對向。另一方面,Υ轴側 驅動質量部6、7係沿著與X轴正交之γ轴而配置,且夹持 中心點Ο而彼此相對向。 又’驅動質量部4〜7例如形成為大致三角形狀。而且, 驅動質量部4〜7中之三角形之頂點部分相對於直徑方向位 於中心點Ο側(内徑側)。又,於驅動質量部4〜7之頂點部分 (内徑側部分)設置有朝内徑側突出之連接部4 a〜7 Α。而 且,連接部4A~7A之長度方向之途中部分成為驅動質量部 4〜7驅動振動時之支點4B〜7B。 驅動梁8分別配置於各驅動質量部4〜7之圓周方向兩侧, 並且連接驅動質量部4〜7與下述之檢測質量部丨5之間。因 此’相對於各驅動質量部4〜7設置2個驅動梁8,合計設置8 個驅動梁8。又,各驅動梁8沿著驅動質量部4〜7之圓周方 向兩側之邊而延伸。此時’位於驅動質量部4之圓周方向 兩側之2個驅動梁8係以支點4B為中心而放射狀地延伸。同 樣地’其他驅動梁8亦係以支點5b〜7b為中心而放射狀地 延伸。藉此’驅動梁8可相對於圓周方向產生撓曲變形。 137127.doc -17- 1379992 進而’驅動梁8係於長度方向之途中位置折回之狀態下 形成’且形成為可相對於圓周方向擴開、縮小。藉此,驅 動梁8以能夠圍繞在與基板2平行之狀態下位於中心點〇側 之支點4B〜7B振動之方式來支持驅動質量部4〜7。 連結梁9將驅動質量部4〜7之支點4B〜7B之附近彼此加以 連結。具體而言,連結梁9例如係形成為大致八角形之細 長之框狀,且以90。之間隔配置之4邊之途中位置連接於連 接部4A〜7A之途中位置。此時,連接部4八〜7入中之與連結 梁9交又之部位成為驅動質量部4〜7之支點4b〜7b。繼而, 當驅動質量部4〜7驅動振動時,連結梁9整體產生撓曲變 形。藉此,將連結梁9之振幅以及相位調整得與各驅動質 量部4〜7之驅動振幅以及相位一致。 再者,連結梁9並不限於八角形狀,亦可形成為其他多 角形狀。於該情形時,連結梁9較佳係形成為例如四角形 狀或十二角形狀等般具有4之倍數之角的多角形狀。又, 連結梁9並不限於角形狀,亦可為圓形狀。 振動產生部10〜13構成分別將驅動質量部4〜7驅動振動之 驅動機構。而且,振動產生部1〇〜13係藉由安裝於驅動質 量部4〜7之連接部4A〜7A之前端之可動側驅動電極 10A〜13A、及安裝於基板2上之電極支持部14之固定側驅 動電極10B〜13B而構成。 此時,電極支持部丨4位於中心點〇附近,且由驅動質量 。|5 4 7所c圍而且,電極支持部14固定於基板2,於其周 圍設置有朝驅動質量部4〜7突出之固定側驅動電極 137127.doc •18- 1379992 10B〜13B。 又,可動側驅動電極1〇Α、11A例如係藉由包含於γ軸方 向上保持間隔地配置之複數個電極板之梳齒狀電極而構 成,該等電極板沿著X軸方向彼此平行地延伸。固定側驅 動電極10Β' 11Β例如亦係藉由包含於γ軸方向上保持間隔 地配置之複數個電極板之梳齒狀電極而構成,該等電極板 沿著X軸方向彼此平行地延伸。 而且’可動側驅動電極1〇Α、11Α之電極板與固定側驅 動電極10Β、11Β之電極板係彼此保持間隙地嚙合,並構成 平行平板電極。藉此’若將相同之驅動訊號(電壓訊號等) 施加於固定側驅動電極10Β、丨1Β,則於可動側驅動電極 10Α、11Α與固定側驅動電極10Β、11]Β之間會朝γ軸方向產 生驅動力F卜F2(靜電力)。 又’可動側驅動電極1 〇 A之電極板相對於固定側驅動電 極1 0B之電極板配置於γ軸方向之一側。相對於此,可動 側驅動電極11A之電極板相對於固定側驅動電極11 b之電 極板配置於Y軸方向之另一側(相反側)。因此,驅動力F1 與驅動力F2沿著Y軸方向作用於彼此相反之方向(反相 位)。 另一方面,可動側驅動電極12A、13A例如係藉由包含 於X轴方向上保持間隔地配置之複數個電極板之梳齒狀電 極而構成,該等電極板沿著Y軸方向彼此平行地延伸。固 定側驅動電極12B、13B例如亦係藉由包含於X轴方向上保 持間隔地配置之複數個電極板之梳齒狀電極而構成,該等 137127.doc 1379992 電極板沿著γ軸方向彼此平行地延伸。 而且,可動側驅動電極丨2Α、13Α之電極板與固定側驅 動電極12B、13B之電極板係彼此保持間隙地嚙合,並構 成平行平板電極。藉此,若將相同之驅動訊號施加於固定 側驅動電極12B、13B,則於可動側驅動電極12 A、13 A與 固定側驅動電極12B、13B之間,會朝X軸方向產生成為驅 動力F3、F4之靜電力。 又’可動側驅動電極12A之電極板相對於固定側驅動電 極12B之電極板配置於X軸方向之一側。相對於此,可動 側驅動電極13A之電極板相對於固定側驅動電極13B之電 極板配置於X軸方向之另一側(相反侧)。因此,驅動力F3 與驅動力F4沿著X軸方向作用於彼此相反之方向(反相 位)。 進而,當將固定侧驅動電極10B、11B之電極板作為基 準時’可動側驅動電極10A、11A之電極板相對於以中心 點0為中心之圓周方向,例如配置於順時針之位置。相對 於此,當將固定侧驅動電極12B、13B之電極板作為基準 時,可動側驅動電極12A、13A之電極板相對於以中心點〇 為中心之圓周方向,例如配置於逆時針之位置。藉此,當 彼此相鄰之振動產生部10、11與振動產生部12、13產生驅 動力FI、F2與驅動力F3、F4時,驅動力FI、F2與驅動力 F3、F4於圓周方向上彼此反向。 又’可動側驅動電極10A〜13A配置於連接部4A〜7A之兩 端中之夾持支點4B〜7B而位於驅動質量部4〜7之相反側的 137127.doc -20- 1379992 位置。因此,驅動力F1〜F4朝與可動側驅動電極1〇A〜13八 之移位方向相反之方向作用於驅動質量部4〜7。 檢測質量部15係使用驅動梁8而連接於驅動質量部4〜7。 又,檢測質量部15(振動體)例如形成為四角形之框狀,且 包圍驅動質量部4〜7之外周側。進而,檢測質量部15具備 沿著其對角線朝内周側突出之4個内側突出部15A〜15D。 . 此處’内側突出部15A〜MD例如形成為四角形之板狀,且 φ 分別配置於驅動質量部4〜7之間。因此,内側突出部15Α配 置於驅動質量部4、6之間,内側突出部15Β配置於驅動質 量部5、7之間。同樣地,内側突出部15(:配置於驅動質量 部4、7之間,内側突出部15D配置於驅動質量部5、6之 間。又,檢測質量部15係以中心點〇為中心而成為點對稱 之形狀。繼而,檢測質量部15形成為丨塊剛體,且保持間 隙地與基板2之表面相對向》 檢測梁16、17設置於檢測質量部15與基板2之間,且沿 Φ 著與基板2(Χ-Υ平面)平行之2個檢測軸(檢測軸A以及檢測 軸B)延伸。而且,檢測梁16、17形成為具有寬度尺寸§之 車父薄之板體狀,且係使用扭轉支持梁而形成,該扭轉支持 梁於檢測質量部15在基板2之厚度方向上移位時會產生 轉變形。 具體而言,第1檢測梁16位於例如驅動質量部4、7與驅 動質置部5、6之間,且沿著相對於又軸傾斜45。之檢測軸a 而延伸。又,第丨檢測梁16分別設置於内側突出部、 15B之内部。進而,於檢測梁以之兩端側,分別設置有在 137127.doc 1379992 與檢測梁1 6正交之方向(檢測轴B方向)上延伸之連接梁 16A。因此,檢測梁16之一端側經由連接梁16A而連接於 檢測質量部15,並且檢測梁16之他端側經由連接梁16A而 連接於支持部3 » 另一方面,第2檢測梁17位於例如驅動質量部4、6與驅 動質量部5、7之間’且沿著相對於X軸傾斜-45。之檢測轴B 而延伸。又,第2檢測梁17分別設置於内側突出部丨5〇、 15D之内部。進而,於檢測梁17之兩端側,分別設置有在 與檢測梁17正交之方向(檢測軸A方向)上延伸之連接梁 17 A »因此,檢測梁17之一端側經由連接梁丨7 A而連接於 檢測質量部15,並且檢測梁17之他端側經由連接梁丨7 A而 連接於支持部3。 繼而,當檢測質量部15以檢測軸A為中心進行振動(搖 動)時’第1檢測梁16產生扭轉變形(扭轉振動)。另一方 面’第2檢測梁17係使用連接梁17 A而連接於檢測質量部15 以及支持部3。因此,藉由連接梁17A產生撓曲變形而允許 檢測質量部15以檢測軸A為中心進行振動。 同樣地,當檢測質量部1 5以檢測轴B為中心進行振動(搖 動)時,第2檢測梁17產生扭轉變形(扭轉振動)。另一方 面,第1檢測梁16係使用連接梁16A而連接於檢測質量部15 以及支持部3。因此,藉由連接梁16A產生撓曲變形而允許 檢測質量部15以檢測轴B為中心進行振動。藉此,檢測梁 16、17係於能夠圍繞彼此正交之檢測轴八以及檢測抽b振 動之狀態下’對檢測質量部15進行支持。 137127.doc -22- 繼而,當圍繞檢測軸A之角速度〇丨產生作用時,角速度 Ω1中之圍繞X軸方向之成分作用於在γ軸方向上振動之驅 動質量部4、5 ’對應於該成分,產生朝向Z軸方向(基板之 厚度方向)之科氏力Fax。此時,角速度Ω1中之圍繞Y軸方 向之成分作用於在X轴方向上振動之驅動質量部6、7,對 應於該成分’產生朝向Z軸方向(基板之厚度方向)之科氏 力Fay。藉此,對於檢測質量部丨5而言,例如以檢測軸a為 中心’檢測軸B方向之兩端側在z軸方向上振動。 另一方面’當圍繞檢測軸B之角速度Ω2產生作用時,角 速度Ω2中之圍繞X轴方向之成分作用於在γ軸方向上振動 之驅動質量部4、5,對應於該成分,產生朝向z軸方向(基 板之厚度方向)之科氏力Fbx。此時,角速度Ω2中之圍繞Y 轴方向之成分作用於在X軸方向上振動之驅動質量部6、 7’對應於該成分,產生朝向z轴方向(基板之厚度方向)之 科氏力Fby。藉此,對於檢測質量部1 5而言,例如以檢測 軸B為中心’檢測軸a方向之兩端側在z軸方向上振動。 移位檢測部1 8〜2 1構成移位檢測機構,其對檢測質量部 15於基板2之厚度方向上移位之情況進行檢測。又,移位 檢測部1 8〜21係藉由包含内側突出部丨5a〜15D之可動側檢 測電極1 8 A〜21A、以及設置於下述蓋板26之固定側檢測電 極18B〜21B而構成。此處,可動側檢測電極18A〜21A與固 定側檢測電極18B〜21B在Z軸方向上彼此相對向^因此, 固定側檢測電極18B〜21B與内側突出部i5A〜15D相對向, 並配置在相對於中心點〇呈點對稱之位置。 137127.doc •23- 1379992 而且,當檢測質量部15圍繞檢測軸B振動時,内側突出 部15 A、15B於基板2之厚度方向上移位。此時,可動側檢 測電極1 8A、19A與固定側檢測電極18B、19B之間之距離 產生變化,因此,可動側檢測電極18A、19A與固定側檢 測電極1 8B、19B之間之靜電容Cs 1、Cs2亦產生變化。 另一方面’當檢測質量部1 5圍繞檢測軸A振動時,内側 突出部15C、15D於基板2之厚度方向上移位。此時,可動 側檢測電極20A、21A與固定側檢測電極20B、2 1B之間之 距離產生變化’因此’可動側檢測電極20A、2 1A與固定 側檢測電極20B、21B之間之靜電容Cs3、Cs4亦產生變 化。 因此,當檢測質量部15藉由圍繞檢測抽a、B之角速度 Ω1、Ω2而於Z軸方向上移位時,移位檢測部1 8〜21根據可 動側檢測電極18A〜21A與固定侧檢測電極18B〜21B之間之 靜電谷Csl〜Cs4之變化,檢測該位移量作為角速度qi、 Ω2。 振動監視部22、23構成監視機構,其例如對驅動質量部 4、5之振動方向(γ轴方向)之移位進行檢測。又,振動監 視部22、23係藉由狹縫22A、23 A與固定側監視電極22B、 238而構成,該狹縫22八、23八形成於驅動質量部4、5且於 X軸方向上延伸’該固定側監視電極22B、23B與該狹縫 22A、23A相對向地安裝於蓋板26且於χ軸方向上延伸。繼 而,對應於驅動質量部4、5之驅動振動,固定側監視電極 22Β、23Β與驅動質量部4、5之間之對向面積產生變化。 137127.doc •24· 1379992 此處,於驅動質量部4、5靜止之狀態下,固定側監視電 極22B、23B相對於狹缝22A、23A,於Y軸方向上錯位地 配置,部分地與狹縫22A、23A相對向。繼而,當驅動質 量部4、5於Y轴方向上移位時,狹缝22A、23八與固定側監 視電極22B、23B之間之對向面積增加、減少。因此,對 應於驅動質莖部4、5之驅動振動,固定側監視電極22B、 23B與驅動質量部4、5之間之靜電容Cml、(^…會產生變 φ 化,故而振動監視部22、23藉由該靜電容Cm 1、Cm2之變 化而對驅動質量部4、5之振動狀態進行監視。 檢測用引出部24位於檢測質量部丨5之外側,對應於固定 側檢測電極18B〜2 1B而設置有4個檢測用引出部24。又, 檢測用引出部24例如夾持檢測質量部丨5而配置於χ軸方向 之兩側。進而,檢測用引出部24與支持部3等同樣係使用 低電阻之矽材料等而形成為島狀。而且,於檢測用引出部 24上分別連接有固定側檢測電極丨8B〜21B。 • 監視用引出部25位於檢測質量部15之外側,對應於固定 側監視電極22B、23B而設置有2個監視用引出部25。又, 監視用引出部25與檢測用引出部24同樣係使用低電阻之矽 材料等而形成為島狀。而且,於監視用引出部25上分別連 接有固定側監視電極22B、23B。 蓋板26藉由例如玻璃材料等而形成為四角形之板狀,且 使用陽極接合等之機構而接合於支持部3、電極支持部 14、檢測用引出部24以及監視用引出部25。又,於蓋板% 之與檢測質量部15等相對向之對向面(背面)側,形成有凹 137127.doc •25· 1379992 陷為四角形狀之空腔26A。而且,空腔26A設置於與驅動 質量部4〜7、驅動梁8、連結梁9、檢測質量部15以及檢測 梁16、17相對向之位置。藉此,驅動質量部4〜7以及檢測 質量部15可振動移位而不與蓋板26接觸。 又,於蓋板26之空腔26A内,設置有移位檢測部18〜21之 固定側檢測電極18B〜21B,並且設置有振動監視部22、23 之固定側監視電極228、2313。進而,於空腔26八之中心部 分形成有用以與電極支持部14接合之突出部26B。 而且,於蓋板26中,在厚度方向上貫通地形成有複數個 通孔27。此時’通孔27分別形成於與支持部3、電極支持 部14以及檢測用引出部24相對應之位置。藉此,支持部3 等經由通孔27而連接於設置在蓋板26上之外部電極(未圖 示)。因此’振動產生部10〜13、移位檢測部1 8〜21以及振 動監視部22、23可經由外部電極而連接於下述之振動控制 電路31以及角速度檢測電路41等。 其次,一面參照圖10 ’ 一面對控制驅動質量部4〜7之振 動狀態之振動控制電路3 1加以說明。振動控制電路3丨使用 由振動監視部22、23產生之監視訊號Vm,對輸出至振動 產生部10〜13之驅動訊號Vd進行控制。而且,振動控制電 路31係藉由C-V轉換電路32、33、差動放大器34、自動增 益控制電路35(以下稱為AGC電路35)、以及驅動訊號產生 電路36等而構成。 C-V轉換電路32、33分別連接於振動監視部22、23之輸 出側。繼而,C-V轉換電路32、33將振動監視部22、23之 137127.doc •26· 靜電容Cm 1、Cm2之變化轉換為電壓變化,並將該等電塵 變化作為預備監視訊號Vml、Vm2而分別輸出。又,於c-V轉換電路32、33之輸出側連接有差動放大器34» 此處,以在驅動質量部4、5彼此以反相位振動時,2個 預備監視訊號Vml、Vm2彼此成為反相位之方式而構成振 動監視部22、23。因此,藉由差動放大器34對2個預備監 視訊號Vml、Vm2進行差動放大,並輸出至AGC電路35作 為最終之監視訊號Vm。 AGC電路35之輸出側連接於輸出驅動訊號vd之驅動訊號 產生電路36。繼而,AGC電路35以監視訊號Vm成為固定 之方式對增益進行調整。又,驅動訊號產生電路36經由放 大器37而連接於振動產生部1〇〜13»藉此,驅動訊號產生 電路36將驅動訊號Vd分別輸入至振動產生部1〇〜13,振動 產生部10〜13使驅動質量部4、6與驅動質量部5、7彼此以 反相位振動。 其次’對檢測圍繞2個軸(圍繞檢測軸a、B)之角速度 Ω1、Ω2之角速度檢測電路41(角速度檢測機構)加以說明。 角速度檢測電路41使用由振動監視部22 ' 23產生之監視訊 唬Vm ’對由移位檢測部! 8〜21產生之移位檢測訊號Va、Vb 進行同步檢波,檢測作用於驅動質量部4〜7之角速度Ω1、 Ω2。而且,角速度檢測電路41例如係藉由c_v轉換電路 42〜45、差動放大器仏、5〇、以及同步檢波電路47、51等 而構成。 C-V轉換電路42〜45將移位檢測部ι8〜21之靜電、 137127.doc •27· 1379992 3 Cs4之變化轉換為電壓變化,並將該等電壓變 化作為預備性之移位檢測訊號Vsi、vs2、vs3、Vs4而分 別輸出。 此處,於相鄰之驅動質量部4〜7彼此以反相位振動之狀 態下,當圍繞檢測軸人之角速度⑴產生作用時,檢測質量 部15係以檢測軸a為令心,檢測軸B方向之兩端側交替地 於z軸方向上移位。此時,預備性之移位檢測訊號Vs3與移 位檢測訊號Vs4彼此成為反相位。另一方面,預備性之移 位檢測訊號Vsl與移位檢測訊號Vs2彼此成為同相位。 因此’差動放大器46連接於C-V轉換電路44、45之輸出 側,根據該等預備性之移位檢測訊號Vs3、Vs4之差而運算 出最終之移位檢測訊號Va。 同步檢波電路47之輸入側連接於差動放大器46,並且經 由移相電路38而連接於AGC電路35。又,於同步檢波電路 47之輸出側連接有用以取出角速度訊號之低通濾波器 48(以下稱為LPF48),並且於LPF48之輸出側連接有用以對 增益以及偏移進行調整之調整電路49。此處,移相電路38 輸出移相訊號Vm·,該移相訊號Vm'係使經由AGC電路3 5 輸出之監視訊號Vm之相位移動90°所得之訊號。藉此,同 步檢波電路47根據移位檢測訊號Va並使用移相訊號Vm’進 行同步檢波,經由LPF48、調整電路49輸出與圍繞檢測軸 八之角速度Ω1相對應之角速度訊號。 另一方面,於相鄰之驅動質量部4〜7彼此以反相位振動 之狀態下,當圍繞檢測軸B之角速度Ω2產生作用時’檢測 137127.doc -28- 1379992 質量部15係以檢測軸B為中心,檢測軸a方向之兩端側交 替地於z軸方向上移位。此時,預備性之移位檢測訊號Vsl 與移位檢測訊號Vs2彼此成為反相位。另一方面,預備性 之移位檢測訊號Vs3與移位檢測訊號Vs4彼此成為同相位。 因此,差動放大器50連接於C-V轉換電路42、43之輸出 側,並根據該等預備性之移位檢測訊號VS1、Vs2之差而運 算出表终之移位檢測訊號Vb。藉此,同步檢波電路51與同 步檢波電路47同樣地,根據移位檢測訊號Vb並使用移相訊 號Vm·進行同步檢波,經由低通濾波器52(以下稱為 LPF52)、調整電路53輸出與圍繞檢測軸b之角速度Q2相對 應之角速度訊號。 其次,根據圖11至圖14,對本實施形態之角速度感測器 1之製造方法加以說明。 於圖11所示之基板接合步驟中,預先對矽基板61之背面 實施蝕刻處理,形成大致四角形之凹陷部62,並且於凹陷 部62之中央位置形成突起部63。其後,使用例如陽極接合 等之接合機構,將矽基板61之背面接合於成為基板2之玻 璃基板64之表面。 繼而,於圖12所示之薄膜化步驟中,對矽基板61之表面 側進行研磨,以形成厚度尺寸小之矽層65。此時,矽層65 之外緣側以及中央之突起部63接合於玻璃基板64。又,矽 層65中與凹陷部62相對應之薄壁部65A係保持間隙地與玻 璃基板64分離。其次,於矽層65之表面,使用例如導電性 金屬材料而形成接觸部66。此時,接觸部66較矽層65中之 137127.doc •29- 1379992 薄壁部65A配置於更外緣側。 其次,於圖13所示之功能部形成步驟中,實施敍刻處 理,於與石夕層65中之薄壁部65A相對應之位置形成驅動質 量部4〜7、驅動梁8、連結梁9、檢測質量部15、以及檢測 梁16、17»於梦層㈣之與接觸部66相對應之位置形成檢 測用引出部24以及監視用引出部25。於矽層65中之與突起 部63相對應之位置形成電極支持部14,並且於電極支持部 14之周圍形成包含可動側驅動電極i 〇 a〜】3 A以及固定側驅 動電極10B〜13B之振動產生部1〇〜13。於矽層“中之外緣 側,以包圍驅動質量邹4〜7、檢測質量部15等之方式形成 支持部3。 繼而,於圖14所示之蓋板接合步驟十,於成為蓋板^之 玻璃板67之背面侧預先形成作為空腔26A之凹陷部68。此 時,凹陷部68形成於與驅動質量部4〜7、驅動梁8、連結梁 9、檢測質量部15、以及檢測梁16、17等相對向之位置。 又,於凹陷部68之中央位置形成可與電極支持部14接觸之 突起部69。進而,於凹陷部68之内部設置固定側檢測電極 18B〜21B,並且設置固定側監視電極22B、23B。 繼而,使用例如陽極接合等之接合機構,將玻璃板67之 背面接合於矽層65之表面。藉此,玻璃基板67之外緣側接 合於支持部3,突起部69接合於電極支持部14。 又,固定側檢測電極18B〜2丨8係為了構成移位檢測部 18〜21而固定於與檢測質量部15相對向之位置。進而,固 定側監視電極22B、23B係為了構成振動監視部22、23而 137127.doc -30· 1379992 固定於與狹缝22A、23A相對向之位置β 其次,於電極形成步驟中,對蓋板26實施喷砂等之開孔 加工處理,從而形成通孔27。此時,通孔27係分別形成於 與支持部3、電極支持部14以及檢測用引出部以相對應之 位置。最後,於蓋板26之表面設置用以與外部之電路連接 之外部電極(未圖示)。繼而,外部電極經由設置於通孔27 之内表面之導體膜,電性連接於支持部3、電極支持部14 以及檢測用引出部24。藉此,完成圖j至圖9所示之角速度 感測器1。繼而,振動產生部10〜13、移位檢測部18〜21以 及振動監視部22、23係經由外部電極而連接於振動控制電 路3 1以及角速度檢測電路4丨等。 第1實施形態之角速度感測器丨具有如上所述之構成,其 次對其動作加以說明。 首先’說明對圍繞檢測軸A之角速度Ω1進行檢測之情 形。若自外部之振動控制電路31將驅動訊號Vd輸入至電極 支持部14,則驅動訊號Vd會施加於振動產生部1〇〜13之固 疋側驅動電極10B〜13B。藉此,γ軸方向之靜電引力作用 於驅動質量部4、5,驅動質量部4、5於Y軸方向上振動。 另一方面’ X軸方向之靜電引力作用於驅動質量部6、7 , 驅動質量部6、7於X軸方向上振動。繼而,圓周方向上相 鄰之驅動質量部4〜7彼此以反相位振動。 於驅動質量部4〜7振動之狀態下,若圍繞檢測軸A之角速 度Ω1產生作用,則對應於角速度Ωι中之圍繞X軸之成分, 以下之數1所示之科氏力Fax作用於驅動質量部4、5。另一 137127.doc -31· 方面,對應於角速度Ω1中之圍繞Y轴之成分,以下之數2 所示之科氏力Fay作用於驅動質量部6、7。繼而,驅動質 量部4〜7中產生之科氏力Fax、Fay經由驅動梁8而傳遞至檢 測質量部15。藉此,檢測質量部15藉由科氏力Fax、Fay之 合力,以檢測軸A為中心,檢測軸B方向之兩端交替地於z 軸方向上移位,並對應於角速度Ω1而振動。 [數1]Thereby, the detection quality portion can be supported in such a manner that the sensor can vibrate around two detection axes parallel to the substrate. Further, the detecting beam is formed to be located between the adjacent two driving mass portions and extend along the two detecting axes. Therefore, the entire sensor can be miniaturized as compared with the case where the detecting beam is disposed on the outer peripheral side of the relatively driven mass portion. According to the invention of the third aspect, the displacement detecting mechanism is located between the adjacent two driving mass portions, is disposed at a position symmetrical with respect to the center portion, and is disposed opposite to the detecting mass portion. It is composed of detection electrodes. 137127.doc 2, when the angular velocity acts on two detection axes that are parallel to the substrate, the detection mass vibrates around the two detection axes parallel to the substrate and the displacement portion and the four detection electrodes in the thickness direction of the substrate The distance between the two varies depending on the angular velocity. Therefore, the angular velocity around the two detection axes can be detected by detecting the electrostatic capacitance between the continuous detecting electrode and the detecting mass portion. According to the invention of claim 4, a cover covering the detecting quality portion is provided, and the displacement detecting mechanism is constituted by four detecting electrodes provided opposite to the i-plate. Therefore, since the cover plate is displaced together with the detecting mass portion, the angular velocity around the two detecting axes can be detected by detecting the electrostatic capacitance between the cover plate and the detecting electrode. Further, the cover plate may be disposed between the driving mass portion and the detecting electrode. Thereby, since the influence of the driving mass portion can be blocked by the cover plate, the detecting electrode can be extended to a position facing the driving mass portion. As a result, the area of the detecting electrode can be increased, and the detection sensitivity of the angular velocity can be improved. According to the invention of claim 5, the detection mass portion is configured such that all or a part of the thickness dimension is thinner than the thickness of the driving mass portion, the driving beam, the connecting beam, and the detecting beam, so that the detecting quality portion can be reduced. The mass ' thereby increasing the amount of displacement of the proof mass caused by the Coriolis force. By this, the detection sensitivity of the angular velocity can be improved. According to the invention of claim 6, since the monitoring means for monitoring the displacement of the vibration direction of the driving mass portion is provided, the monitoring mechanism can be used to detect the vibration amplitude and phase of the driving mass portion. Therefore, the vibration-shocking circuit can use the output signal of the monitoring mechanism as the reference signal' to stabilize the resonance state of I37127.doc -14-1379992. Moreover, the angular velocity detecting circuit can also use the output signal of the monitoring mechanism as the reference signal, so that the (4) (4) quality can be correctly synchronized in the vibration state. According to the invention of claim 7, the detecting beam is formed by using the torsion support beam to form a torsional deformation when the torsion support beam is displaced in the thickness direction of the substrate by the detecting mass portion, for example, by the vertical of the substrate In the direction, Shi Xicai (4) is reinforced and the support beam is transferred to the beam so that it can be easily processed. Further, the spring constant of the torsion support beam fluctuates in proportion to the third power of the width dimension, but this is the same as the drive beam and the connection beam. Therefore, the processing unevenness of the i-width dimension can be reduced to affect the resonance frequency difference between the driving mode and the detection mode, thereby reducing the sensitivity unevenness of the sensor. According to the invention of claim 8, the detecting beam is connected to the detecting mass portion and the substrate by using the stress reducing connecting portion. Here, for example, when a torsion support beam having a long plate shape is used to constitute the detection beam, and the both ends of the detection beam are fixed, the stress acting on the fixed portion hinders the torsional deformation of the detection beam, thus When the thickness dimension changes, the change in the resonance frequency corresponding to the amount of change in the thickness dimension becomes large. As a result, there is a tendency that the processing unevenness has a large influence on the resonance frequency difference between the drive mode and the detection mode. In contrast, in the present invention, the detecting beam is connected to the detecting mass portion and the substrate by using a stress reducing connecting portion having a degree of freedom in the longitudinal direction of the detecting beam. Therefore, when the detecting beam is subjected to torsional deformation, the end 4 side of the detecting beam can be displaced in the longitudinal direction thereof, and therefore, the change or stress acting on both end sides of the detecting body can be reduced. Thereby, the processing of the thickness dimension can be reduced. 137127.doc 15 137993⁄4 The unevenness affects the resonance frequency difference between the driving mode and the detection mode, thereby reducing the sensitivity unevenness of the sensor. [Embodiment] Hereinafter, an angular velocity sensor according to an embodiment of the present invention will be described in detail with reference to the accompanying drawings. First, Fig. 1 to Fig. 9 show an angular velocity sensor 第 according to the first embodiment. In the figure, the angular velocity sensor 1 is composed of a substrate 2, driving mass portions 4 to 7, a driving beam 8, a connecting beam 9, vibration generating portions 10 to 13, a detecting mass portion 15, detecting beams 16, 17, and shifting. The detection units 18 to 21 and the vibration monitoring units 22 and 23 are configured. The substrate 2 forms the basis of the angular velocity sensor 丨. Further, the substrate 2 is formed in a square shape of a square shape by, for example, a glass material, and horizontally extends along, for example, the X-axis and the γ-axis directions of the X-axis, Y-axis, and z-axis directions of the parent. Further, on the substrate 2, for example, an electrically conductive low-resistance crucible material or the like is etched to form the support portion 3, the drive mass portions 4 to 7, the drive beam 8, the connection beam 9, and the detection mass portion 15, The beams 16, 17 and the like are detected. The support portion 3 is provided on the surface of the substrate 2. Further, the support portion 3 is located on the outer edge side of the base plate 2 and formed in a frame shape. Then, inside the support portion 3, the drive mass portions 4 to 7, the drive beam 8, the connection beam 9, the detection mass portion 15, and the detection beams 16, 17 are provided in a state where the substrate 2 is floated, and the support portion is passed through the support portion. 3 is connected to the ground. At this time, the movable side drive electrodes 10A to 13A of the vibration generating units 1A to 13 and the movable side detecting electrodes 18A to 21A of the displacement detecting portions 18 to 2A are also connected to the ground via the support portion 3. On the other hand, the fixed side drive electrodes 10B to 13B of the vibration 137127.doc -16 - 1379992 motion generating portions 10 to 13 are connected to the fixed side detecting electrodes 丨 8β to 21B of the electrode supporting portion 14 'shift detecting portions 18 to 21 The detection lead portion 24 is connected via the wiring on the substrate 2. The driving mass portions 4 to 7 are opposed to the surface of the substrate 2 with a gap therebetween, and are disposed at a point symmetry with respect to the center portion (center point 〇). . Further, the drive mass units 4 to 7 are every 90. The X-axis side driving mass portions 4 and 5 are disposed along the χ axis, and are sandwiched with the center point 0 so as to face each other at equal intervals in the circumferential direction around the center point 》. On the other hand, the yaw axis side driving mass portions 6, 7 are arranged along the γ axis orthogonal to the X axis, and sandwich the center point Ο to face each other. Further, the driving mass portions 4 to 7 are formed, for example, in a substantially triangular shape. Further, the apex portion of the triangle in the driving mass portions 4 to 7 is located on the center point side (inner diameter side) with respect to the diameter direction. Further, the apex portions (inner diameter side portions) of the driving mass portions 4 to 7 are provided with connecting portions 4a to 7b that protrude toward the inner diameter side. Further, the intermediate portions of the connecting portions 4A to 7A in the longitudinal direction are the fulcrums 4B to 7B when the driving mass portions 4 to 7 drive the vibration. The drive beams 8 are respectively disposed on both sides in the circumferential direction of the respective drive mass portions 4 to 7, and are connected between the drive mass portions 4 to 7 and the following detection mass portions 丨5. Therefore, two drive beams 8 are provided for each of the drive mass units 4 to 7, and a total of eight drive beams 8 are provided. Further, each of the drive beams 8 extends along the sides of the circumferential sides of the drive mass portions 4 to 7. At this time, the two drive beams 8 located on both sides in the circumferential direction of the drive mass portion 4 extend radially around the fulcrum 4B. Similarly, the other drive beams 8 are also radially extended around the fulcrums 5b to 7b. Thereby, the drive beam 8 can be flexibly deformed with respect to the circumferential direction. 137127.doc -17- 1379992 Further, the drive beam 8 is formed in a state in which it is folded back in the middle in the longitudinal direction, and is formed to be expandable and contractible with respect to the circumferential direction. Thereby, the driving beam 8 supports the driving mass portions 4 to 7 in such a manner as to be able to vibrate around the fulcrums 4B to 7B on the side of the center point in a state parallel to the substrate 2. The connecting beam 9 connects the vicinity of the fulcrums 4B to 7B of the driving mass portions 4 to 7 to each other. Specifically, the connecting beam 9 is formed in a frame shape of a substantially octagonal shape, for example, and is 90. The position on the four sides of the interval arrangement is connected to the intermediate position of the connection portions 4A to 7A. At this time, the portions of the connecting portions 4 to 7 that are in contact with the connecting beam 9 serve as the fulcrums 4b to 7b of the driving mass portions 4 to 7. Then, when the driving mass portions 4 to 7 drive the vibration, the entire connecting beam 9 is deflected and deformed. Thereby, the amplitude and phase of the connecting beam 9 are adjusted to match the driving amplitude and phase of the respective driving mass portions 4 to 7. Further, the connecting beam 9 is not limited to an octagonal shape, and may be formed in other polygonal shapes. In this case, the connecting beam 9 is preferably formed into a polygonal shape having an angle of a multiple of four, such as a quadrangular shape or a twelve-corner shape. Further, the connecting beam 9 is not limited to an angular shape, and may have a circular shape. The vibration generating units 10 to 13 constitute driving mechanisms for driving the driving mass units 4 to 7 to vibrate. Further, the vibration generating units 1A to 13 are fixed by the movable side drive electrodes 10A to 13A attached to the front ends of the connection portions 4A to 7A of the drive mass portions 4 to 7 and the electrode support portions 14 mounted on the substrate 2. The side drive electrodes 10B to 13B are configured. At this time, the electrode supporting portion 丨4 is located near the center point , and is driven by the mass. Further, the electrode supporting portion 14 is fixed to the substrate 2, and fixed side driving electrodes 137127.doc • 18-1379992 10B to 13B protruding toward the driving mass portions 4 to 7 are provided around the electrode supporting portion 14. Further, the movable side drive electrodes 1A and 11A are configured by, for example, comb-shaped electrodes including a plurality of electrode plates arranged at intervals in the γ-axis direction, and the electrode plates are parallel to each other along the X-axis direction. extend. The fixed-side driving electrode 10'' is also constituted by, for example, a comb-shaped electrode including a plurality of electrode plates arranged at intervals in the γ-axis direction, and the electrode plates extend in parallel with each other along the X-axis direction. Further, the electrode plates of the movable side drive electrodes 1 and 11 and the electrode plates of the fixed side drive electrodes 10 and 11 are meshed with each other to form a parallel plate electrode. Therefore, if the same driving signal (voltage signal, etc.) is applied to the fixed side driving electrodes 10Β, 丨1Β, the movable side driving electrodes 10Α, 11Α and the fixed side driving electrodes 10Β, 11] 会 will face the γ axis. The direction generates a driving force F F (electrostatic force). Further, the electrode plate of the movable side drive electrode 1 〇 A is disposed on one side in the γ-axis direction with respect to the electrode plate of the fixed-side drive electrode 10B. On the other hand, the electrode plate of the movable side drive electrode 11A is disposed on the other side (opposite side) of the Y-axis direction with respect to the electrode plate of the fixed side drive electrode 11b. Therefore, the driving force F1 and the driving force F2 act in opposite directions (inverse phase) from each other along the Y-axis direction. On the other hand, the movable side drive electrodes 12A and 13A are configured by, for example, comb-shaped electrodes including a plurality of electrode plates arranged at intervals in the X-axis direction, and the electrode plates are parallel to each other along the Y-axis direction. extend. The fixed side drive electrodes 12B and 13B are also constituted by, for example, comb-shaped electrodes including a plurality of electrode plates arranged at intervals in the X-axis direction, and the 137127.doc 1379992 electrode plates are parallel to each other along the γ-axis direction. Extend the ground. Further, the electrode plates of the movable side drive electrodes 丨2, 13 and the electrode plates of the fixed side drive electrodes 12B, 13B are meshed with each other with a gap therebetween, and constitute a parallel plate electrode. As a result, when the same driving signal is applied to the fixed side driving electrodes 12B and 13B, the driving force is generated in the X-axis direction between the movable-side driving electrodes 12 A and 13 A and the fixed-side driving electrodes 12B and 13B. The electrostatic force of F3 and F4. Further, the electrode plate of the movable side drive electrode 12A is disposed on one side in the X-axis direction with respect to the electrode plate of the fixed side drive electrode 12B. On the other hand, the electrode plate of the movable side drive electrode 13A is disposed on the other side (opposite side) in the X-axis direction with respect to the electrode plate of the fixed side drive electrode 13B. Therefore, the driving force F3 and the driving force F4 act in opposite directions (inverting positions) in the X-axis direction. Further, when the electrode plates of the fixed side drive electrodes 10B and 11B are used as the reference, the electrode plates of the movable side drive electrodes 10A and 11A are arranged at a clockwise position with respect to the circumferential direction around the center point 0, for example. On the other hand, when the electrode plates of the fixed side drive electrodes 12B and 13B are used as a reference, the electrode plates of the movable side drive electrodes 12A and 13A are disposed, for example, counterclockwise with respect to the circumferential direction around the center point 。. Thereby, when the vibration generating portions 10, 11 and the vibration generating portions 12, 13 adjacent to each other generate the driving forces FI, F2 and the driving forces F3, F4, the driving forces FI, F2 and the driving forces F3, F4 are in the circumferential direction. Reverse each other. Further, the movable side drive electrodes 10A to 13A are disposed at the fulcrums 4B to 7B of the both ends of the connection portions 4A to 7A at positions 137127.doc -20-1379992 on the opposite side of the drive mass portions 4 to 7. Therefore, the driving forces F1 to F4 act on the driving mass portions 4 to 7 in a direction opposite to the direction in which the movable side driving electrodes 1A to 138 are displaced. The detecting mass unit 15 is connected to the driving mass units 4 to 7 by using the driving beam 8. Further, the detecting mass portion 15 (vibrating body) is formed in a square frame shape, for example, and surrounds the outer peripheral sides of the driving mass portions 4 to 7. Further, the detecting mass portion 15 includes four inner protruding portions 15A to 15D that protrude toward the inner peripheral side along the diagonal line. Here, the inner protruding portions 15A to 15D are formed in a quadrangular plate shape, for example, and φ is disposed between the driving mass portions 4 to 7, respectively. Therefore, the inner protruding portion 15 is disposed between the driving mass portions 4, 6, and the inner protruding portion 15 is disposed between the driving mass portions 5, 7. Similarly, the inner protruding portion 15 is disposed between the driving mass portions 4 and 7, and the inner protruding portion 15D is disposed between the driving mass portions 5 and 6. Further, the detecting mass portion 15 is centered on the center point 而The shape of the point symmetry. Then, the proof mass portion 15 is formed as a rigid body and is opposed to the surface of the substrate 2 with a gap therebetween. The detecting beams 16, 17 are disposed between the detecting mass portion 15 and the substrate 2, and are along the Φ The two detection axes (the detection axis A and the detection axis B) which are parallel to the substrate 2 (the Χ-Υ plane) extend. Further, the detection beams 16 and 17 are formed into a plate shape having a width dimension of § The torsion support beam is formed, and the torsion support beam is deformed when the proof mass portion 15 is displaced in the thickness direction of the substrate 2. Specifically, the first detection beam 16 is located at, for example, the drive mass portions 4, 7 and the drive. Between the texture portions 5 and 6, and extending along the detection axis a inclined with respect to the axis 45. Further, the second detection beams 16 are respectively disposed inside the inner protrusions 15B. Further, the detection beam is The two ends are set separately at 137127.doc 1379992 with The connecting beam 16A extending in the direction in which the beam 16 is orthogonal (detecting the direction of the axis B) is detected. Therefore, one end side of the detecting beam 16 is connected to the detecting mass portion 15 via the connecting beam 16A, and the other end side of the detecting beam 16 is via The connecting beam 16A is connected to the support portion 3 » On the other hand, the second detecting beam 17 is located between, for example, the driving mass portions 4, 6 and the driving mass portions 5, 7 and is inclined at -45 with respect to the X-axis. Further, the second detecting beam 17 is disposed inside the inner protruding portions 丨5〇 and 15D, respectively, and further, on both end sides of the detecting beam 17, is disposed in a direction orthogonal to the detecting beam 17 ( The connecting beam 17 A extending in the direction of the axis A is detected. Therefore, one end side of the detecting beam 17 is connected to the detecting mass portion 15 via the connecting beam 丨 7 A, and the other end side of the detecting beam 17 is connected via the connecting beam 丨 7 A The first detecting beam 16 is subjected to torsional deformation (torsional vibration) when the detecting mass unit 15 vibrates (shakes) around the detecting axis A. On the other hand, the second detecting beam 17 is used. Connecting the beam 17 A to the detecting mass portion 15 and the supporting portion 3. Therefore, the deflection of the connecting beam 17A allows the detecting mass portion 15 to vibrate around the detecting axis A. Similarly, when the detecting mass portion 15 vibrates (shakes) around the detecting axis B, The second detecting beam 17 is subjected to torsional deformation (torsional vibration). On the other hand, the first detecting beam 16 is connected to the detecting mass portion 15 and the supporting portion 3 by using the connecting beam 16A. Therefore, the connecting beam 16A is flexibly deformed. The detection quality portion 15 is allowed to vibrate around the detection axis B. Thereby, the detection beams 16 and 17 are supported by the detection quality portion 15 in a state in which the detection axis eight orthogonal to each other and the detection b vibration are detected. . 137127.doc -22- Then, when the angular velocity 围绕 around the detection axis A acts, the component around the X-axis direction of the angular velocity Ω1 acts on the driving mass portion 4, 5' vibrating in the γ-axis direction corresponding to the The composition generates a Coriolis force Fax in the Z-axis direction (the thickness direction of the substrate). At this time, the component around the Y-axis direction in the angular velocity Ω1 acts on the driving mass portions 6, 7 vibrating in the X-axis direction, and the Coriolis force Fay which is generated in the Z-axis direction (the thickness direction of the substrate) corresponding to the component ' . As a result, the detection mass portion 丨5 vibrates in the z-axis direction at both end sides in the detection axis B direction, for example, centering on the detection axis a. On the other hand, when the angular velocity Ω2 around the detection axis B acts, the component around the X-axis direction of the angular velocity Ω2 acts on the driving mass portions 4, 5 vibrating in the γ-axis direction, corresponding to the component, generating the orientation z Coriolis force Fbx in the axial direction (thickness direction of the substrate). At this time, the component around the Y-axis direction of the angular velocity Ω2 acts on the driving mass portion 6, 7' vibrating in the X-axis direction corresponding to the component, and generates a Coriolis force Fby toward the z-axis direction (the thickness direction of the substrate). . As a result, the detection mass portion 15 vibrates in the z-axis direction at both end sides of the detection axis a direction, for example, centering on the detection axis B. The shift detecting units 18 to 2 1 constitute a shift detecting mechanism that detects the displacement of the detecting mass portion 15 in the thickness direction of the substrate 2. Further, the displacement detecting units 18 to 21 are constituted by the movable side detecting electrodes 18A to 21A including the inner protruding portions 丨5a to 15D and the fixed side detecting electrodes 18B to 21B provided on the cover plate 26 to be described later. . Here, the movable side detecting electrodes 18A to 21A and the fixed side detecting electrodes 18B to 21B are opposed to each other in the Z-axis direction. Therefore, the fixed side detecting electrodes 18B to 21B are opposed to the inner protruding portions i5A to 15D, and are disposed in opposite directions. At the center point, it is a point symmetrical position. 137127.doc • 23-1379992 Further, when the detecting mass portion 15 vibrates around the detecting axis B, the inner protruding portions 15 A, 15B are displaced in the thickness direction of the substrate 2. At this time, the distance between the movable side detecting electrodes 18A, 19A and the fixed side detecting electrodes 18B, 19B changes. Therefore, the electrostatic capacitance Cs between the movable side detecting electrodes 18A, 19A and the fixed side detecting electrodes 18B, 19B 1. Cs2 also changes. On the other hand, when the detecting mass portion 15 vibrates around the detecting axis A, the inner protruding portions 15C, 15D are displaced in the thickness direction of the substrate 2. At this time, the distance between the movable-side detecting electrodes 20A and 21A and the fixed-side detecting electrodes 20B and 2 1B changes. Therefore, the electrostatic capacitance Cs3 between the movable-side detecting electrodes 20A and 21A and the fixed-side detecting electrodes 20B and 21B changes. And Cs4 also changed. Therefore, when the detection mass portion 15 is displaced in the Z-axis direction by the angular velocities Ω1, Ω2 around the detection extractions a and B, the displacement detecting portions 18 to 21 are detected based on the movable-side detecting electrodes 18A to 21A and the fixed side. The change of the electrostatic valleys Cs1 to Cs4 between the electrodes 18B to 21B detects the displacement amount as the angular velocities qi and Ω2. The vibration monitoring units 22 and 23 constitute a monitoring unit that detects, for example, the displacement of the vibration direction (γ-axis direction) of the driving mass units 4 and 5. Further, the vibration monitoring units 22 and 23 are constituted by the slits 22A and 23A and the fixed-side monitoring electrodes 22B and 238. The slits 22 and 23 are formed in the driving mass units 4 and 5 in the X-axis direction. The fixed-side monitoring electrodes 22B and 23B are attached to the cover plate 26 so as to face the slits 22A and 23A, and extend in the z-axis direction. Then, the opposing areas between the fixed-side monitoring electrodes 22A, 23A and the driving mass portions 4, 5 are changed in accordance with the driving vibrations of the driving mass portions 4, 5. 137127.doc •24· 1379992 Here, in the state in which the driving mass units 4 and 5 are stationary, the fixed-side monitoring electrodes 22B and 23B are arranged offset with respect to the slits 22A and 23A in the Y-axis direction, and partially and narrowly. The slits 22A, 23A are opposed to each other. Then, when the driving mass portions 4, 5 are displaced in the Y-axis direction, the opposing area between the slits 22A, 23 and the fixed-side monitoring electrodes 22B, 23B is increased and decreased. Therefore, the electrostatic capacitance Cml between the fixed-side monitoring electrodes 22B and 23B and the driving mass portions 4 and 5 is changed in accordance with the driving vibration of the driving mass stem portions 4 and 5, so that the vibration monitoring unit 22 is changed. The vibration state of the driving mass units 4 and 5 is monitored by the change of the electrostatic capacitances Cm1 and Cm2. The detecting lead portion 24 is located outside the detecting mass unit 丨5, corresponding to the fixed side detecting electrodes 18B to 2 In addition, the detection lead-out portion 24 is disposed on both sides in the z-axis direction, for example, while sandwiching the detection mass portion 丨5, and the detection-use portion 24 is the same as the support portion 3 and the like. In the case of the detection lead portion 24, the fixed side detecting electrodes 8B to 21B are connected to each other. The monitoring lead portion 25 is located outside the detecting mass unit 15 and corresponds to the island. Two monitoring lead portions 25 are provided on the fixed-side monitoring electrodes 22B and 23B. The monitoring lead-out portion 25 is formed in an island shape using a low-resistance material or the like in the same manner as the detecting lead-out portion 24. The monitoring lead portion 25 is divided The fixed side monitoring electrodes 22B and 23B are connected to each other. The cover plate 26 is formed in a square plate shape by, for example, a glass material, and is joined to the support portion 3, the electrode support portion 14, and the detection lead portion by a mechanism such as anodic bonding. 24 and the monitoring lead portion 25. Further, a concave portion 137127.doc • 25· 1379992 is formed into a rectangular shape cavity 26A on the opposite side (back surface) side of the cover portion % and the detecting mass portion 15 and the like. Further, the cavity 26A is provided at a position facing the driving mass portions 4 to 7, the driving beam 8, the connecting beam 9, the detecting mass portion 15, and the detecting beams 16, 17. Thereby, the driving mass portions 4 to 7 and the detection are provided. The mass portion 15 is vibrated and displaced without being in contact with the cover plate 26. Further, in the cavity 26A of the cover plate 26, the fixed side detecting electrodes 18B to 21B of the displacement detecting portions 18 to 21 are provided, and vibration monitoring is provided. The fixed side monitor electrodes 228 and 2313 of the portions 22 and 23. Further, a protruding portion 26B for bonding to the electrode support portion 14 is formed at a central portion of the cavity 26, and is formed in the thickness direction in the cover plate 26. A plurality of through holes 27 are formed in the ground. The through holes 27 are respectively formed at positions corresponding to the support portion 3, the electrode support portion 14, and the detection lead portion 24. Thereby, the support portion 3 or the like is connected to the external electrode provided on the cover plate 26 via the through hole 27. Therefore, the vibration generating units 10 to 13, the displacement detecting units 18 to 21, and the vibration monitoring units 22 and 23 can be connected to the vibration control circuit 31 and the angular velocity detecting circuit 41 described below via external electrodes. Next, a description will be given of a vibration control circuit 31 which faces the vibration state of the control drive mass portions 4 to 7 with reference to Fig. 10'. The vibration control circuit 3 uses the monitor signal Vm generated by the vibration monitoring units 22 and 23 to control the drive signals Vd output to the vibration generating units 10 to 13. Further, the vibration control circuit 31 is constituted by C-V conversion circuits 32, 33, a differential amplifier 34, an automatic gain control circuit 35 (hereinafter referred to as an AGC circuit 35), a drive signal generating circuit 36, and the like. The C-V conversion circuits 32 and 33 are connected to the output sides of the vibration monitoring units 22 and 23, respectively. Then, the CV conversion circuits 32 and 33 convert the changes of the 137127.doc • 26·static capacitances Cm 1 and Cm2 of the vibration monitoring units 22 and 23 into voltage changes, and the electric dust changes are used as the preliminary monitoring signals Vml and Vm2. Output separately. Further, a differential amplifier 34» is connected to the output side of the cV conversion circuits 32 and 33. Here, when the driving mass units 4 and 5 vibrate in opposite phases, the two preliminary monitoring signals Vml and Vm2 are inverted from each other. The vibration monitoring units 22 and 23 are configured in a bit manner. Therefore, the two preliminary monitor signals Vml and Vm2 are differentially amplified by the differential amplifier 34, and output to the AGC circuit 35 as the final monitor signal Vm. The output side of the AGC circuit 35 is connected to the drive signal generating circuit 36 which outputs the drive signal vd. Then, the AGC circuit 35 adjusts the gain so that the monitor signal Vm becomes fixed. Further, the drive signal generating circuit 36 is connected to the vibration generating units 1A to 13» via the amplifier 37. Thereby, the driving signal generating circuit 36 inputs the driving signals Vd to the vibration generating portions 1A1 to 13, respectively, and the vibration generating portions 10 to 13 The driving mass portions 4, 6 and the driving mass portions 5, 7 are vibrated in opposite phases. Next, the angular velocity detecting circuit 41 (angular velocity detecting means) for detecting the angular velocities Ω1 and Ω2 around the two axes (around the detecting axes a and B) will be described. The angular velocity detecting circuit 41 uses the monitoring signal Vm ' generated by the vibration monitoring unit 22' 23 to be used by the shift detecting portion! The shift detecting signals Va and Vb generated at 8 to 21 are synchronously detected, and the angular velocities Ω1 and Ω2 acting on the driving mass portions 4 to 7 are detected. Further, the angular velocity detecting circuit 41 is constituted by, for example, c_v converting circuits 42 to 45, differential amplifiers 仏, 5 〇, and synchronous detecting circuits 47 and 51. The CV conversion circuits 42 to 45 convert the static electricity of the shift detecting units ι 8 to 21, the change of 137127.doc • 27·1379992 3 Cs4 into a voltage change, and use these voltage changes as the preliminary shift detecting signals Vsi, vs2. , vs3, Vs4 and output separately. Here, when the adjacent driving mass portions 4 to 7 vibrate in opposite phases, when the angular velocity (1) around the detecting axis acts, the detecting mass portion 15 takes the detecting axis a as the center and detects the axis. Both end sides of the B direction are alternately displaced in the z-axis direction. At this time, the preliminary shift detecting signal Vs3 and the shift detecting signal Vs4 are opposite to each other. On the other hand, the preliminary shift detecting signal Vs1 and the shift detecting signal Vs2 are in phase with each other. Therefore, the 'difference amplifier 46 is connected to the output side of the C-V conversion circuits 44 and 45, and the final shift detection signal Va is calculated based on the difference between the preparatory shift detection signals Vs3 and Vs4. The input side of the synchronous detection circuit 47 is connected to the differential amplifier 46, and is connected to the AGC circuit 35 via the phase shift circuit 38. Further, a low-pass filter 48 (hereinafter referred to as LPF 48) for extracting an angular velocity signal is connected to the output side of the synchronous detection circuit 47, and an adjustment circuit 49 for adjusting the gain and the offset is connected to the output side of the LPF 48. Here, the phase shifting circuit 38 outputs a phase shift signal Vm', which is a signal obtained by shifting the phase of the monitor signal Vm outputted through the AGC circuit 35 by 90°. Thereby, the synchronization detecting circuit 47 performs synchronous detection based on the shift detecting signal Va and using the phase shift signal Vm', and outputs an angular velocity signal corresponding to the angular velocity Ω1 around the detecting axis 8 via the LPF 48 and the adjusting circuit 49. On the other hand, when the adjacent driving mass portions 4 to 7 vibrate in opposite phases, when the angular velocity Ω2 around the detecting axis B acts, the detection 137127.doc -28-1379992 mass portion 15 is detected. The axis B is centered, and both end sides of the detection axis a direction are alternately displaced in the z-axis direction. At this time, the preliminary shift detecting signal Vs1 and the shift detecting signal Vs2 are opposite to each other. On the other hand, the preliminary shift detecting signal Vs3 and the shift detecting signal Vs4 are in phase with each other. Therefore, the differential amplifier 50 is connected to the output side of the C-V conversion circuits 42, 43 and calculates the shift detection signal Vb at the end of the table based on the difference between the preparatory shift detection signals VS1, Vs2. In the same manner as the synchronous detection circuit 47, the synchronous detection circuit 51 performs synchronous detection based on the shift detection signal Vb using the phase shift signal Vm·, and outputs the output via the low pass filter 52 (hereinafter referred to as LPF 52) and the adjustment circuit 53. An angular velocity signal corresponding to the angular velocity Q2 of the detection axis b. Next, a method of manufacturing the angular velocity sensor 1 of the present embodiment will be described with reference to Figs. 11 to 14 . In the substrate bonding step shown in Fig. 11, the back surface of the germanium substrate 61 is etched in advance to form a substantially quadrangular depressed portion 62, and the protruding portion 63 is formed at the center of the recessed portion 62. Thereafter, the back surface of the ruthenium substrate 61 is bonded to the surface of the glass substrate 64 to be the substrate 2 by using an bonding mechanism such as anodic bonding. Then, in the thinning step shown in Fig. 12, the surface side of the ruthenium substrate 61 is polished to form a ruthenium layer 65 having a small thickness. At this time, the outer edge side of the enamel layer 65 and the central protrusion portion 63 are joined to the glass substrate 64. Further, the thin portion 65A corresponding to the depressed portion 62 of the ruthenium layer 65 is separated from the glass substrate 64 with a gap therebetween. Next, a contact portion 66 is formed on the surface of the tantalum layer 65 using, for example, a conductive metal material. At this time, the contact portion 66 is disposed on the outer edge side of the thin portion 65A of the 137127.doc • 29-1379992 in the crotch layer 65. Next, in the functional portion forming step shown in FIG. 13, the engraving processing is performed to form the driving mass portions 4 to 7, the driving beam 8, and the connecting beam 9 at positions corresponding to the thin portion 65A of the stone layer 65. The detecting mass unit 15 and the detecting beams 16 and 17» form a detecting lead portion 24 and a monitoring lead portion 25 at positions corresponding to the contact portion 66 of the dream layer (4). The electrode support portion 14 is formed at a position corresponding to the protrusion portion 63 in the ruthenium layer 65, and the movable side drive electrodes i 〇a to 3 A and the fixed side drive electrodes 10B to 13B are formed around the electrode support portion 14. The vibration generating units 1 to 13 are provided. The support portion 3 is formed on the middle outer edge side of the 矽 layer so as to surround the driving quality Zou 4 to 7, the proof mass portion 15, etc. Then, the cover bonding step 10 shown in Fig. 14 becomes a cover sheet ^ The back side of the glass plate 67 is formed in advance as a recessed portion 68 as a cavity 26A. At this time, the recessed portion 68 is formed in the driving mass portions 4 to 7, the driving beam 8, the connecting beam 9, the detecting mass portion 15, and the detecting beam. Further, the projections 69 which are in contact with the electrode support portion 14 are formed at the center of the recessed portion 68. Further, the fixed side detection electrodes 18B to 21B are provided inside the recessed portion 68, and are provided. The side monitoring electrodes 22B and 23B are fixed. Then, the back surface of the glass plate 67 is bonded to the surface of the ruthenium layer 65 by using an bonding mechanism such as anodic bonding. Thereby, the outer edge side of the glass substrate 67 is bonded to the support portion 3, and the protrusion is formed. The fixed-side detecting electrodes 18B to 2B are fixed to the position facing the detecting mass portion 15 in order to form the displacement detecting portions 18 to 21. Further, the fixed-side monitoring electrode 22B is fixed. 23B to form a vibration The monitoring units 22 and 23 and 137127.doc -30· 1379992 are fixed to the position β facing the slits 22A and 23A. Next, in the electrode forming step, the cover plate 26 is subjected to a drilling process such as sandblasting to form an opening process. Through holes 27. At this time, the through holes 27 are respectively formed at positions corresponding to the support portion 3, the electrode support portion 14, and the detecting lead portion. Finally, the surface of the cover plate 26 is provided for connection with an external circuit. An external electrode (not shown). Then, the external electrode is electrically connected to the support portion 3, the electrode support portion 14, and the detection lead portion 24 via a conductor film provided on the inner surface of the through hole 27. j to the angular velocity sensor 1 shown in Fig. 9. Then, the vibration generating portions 10 to 13, the displacement detecting portions 18 to 21, and the vibration monitoring portions 22 and 23 are connected to the vibration control circuit 31 and the angular velocity via the external electrodes. The detection circuit 4, etc. The angular velocity sensor 第 of the first embodiment has the above configuration, and the operation thereof will be described next. First, the case of detecting the angular velocity Ω1 around the detection axis A will be described. When the driving control circuit 31 inputs the driving signal Vd to the electrode supporting portion 14, the driving signal Vd is applied to the solid-side driving electrodes 10B to 13B of the vibration generating portions 1A to 13. Thereby, the electrostatic attraction force in the γ-axis direction acts on The driving mass portions 4 and 5 and the driving mass portions 4 and 5 vibrate in the Y-axis direction. On the other hand, the electrostatic attraction force in the X-axis direction acts on the driving mass portions 6, 7 and the driving mass portions 6 and 7 in the X-axis direction. Then, the driving mass portions 4 to 7 adjacent in the circumferential direction vibrate in opposite phases with each other. In the state where the driving mass portions 4 to 7 vibrate, if the angular velocity Ω1 around the detecting axis A acts, it corresponds to the angular velocity. The component around the X-axis of Ωι, the Coriolis force Fax shown in the following 1 acts on the driving mass portions 4, 5. On the other hand, in the aspect of the 137127.doc -31, the Coriolis force Fay shown by the following 2 corresponds to the driving mass portions 6, 7 corresponding to the component around the Y-axis in the angular velocity Ω1. Then, the Coriolis forces Fax and Fay generated in the drive mass units 4 to 7 are transmitted to the detection mass unit 15 via the drive beam 8. As a result, the detecting mass portion 15 is displaced by the combined force of the Coriolis force Fax and Fay, and the both ends of the detecting axis B direction are alternately displaced in the z-axis direction, and are vibrated in accordance with the angular velocity Ω1. [Number 1]

Fax=2xMxQlxxv 其中’ Μ:驅動質量部4、5之質量 Ωΐχ:圍繞檢測轴Α之角速度Ω1中之圍繞X軸之成分 v :驅動質量部4、5之Y軸方向之速度 [數2]Fax=2xMxQlxxv where ' Μ: mass of the driving mass portions 4, 5 Ωΐχ: a component around the X-axis in the angular velocity Ω1 around the detection axis v v : velocity in the Y-axis direction of the driving mass portions 4, 5 [2]

Fay=2xMxQlyxv 其中’Μ:驅動質量部6、7之質量Fay=2xMxQlyxv where 'Μ: the quality of the drive quality parts 6, 7

Qly:圍繞檢測轴Α之角速度Ω1中之圍繞Υ轴之成分 v:驅動質量部6、7之X軸方向之速度 因此,移位檢測部18〜21中,對應於檢測質量部15之Z轴 方向之移位,可動側檢測電極UA〜21A與固定側檢測電極 18B〜21B之間之靜電容csl〜Cs4產生變化。此時,角速度 檢測電路41之C-V轉接電路42〜45將靜電容Csl~Cs4之變化 轉換為預備性之移位檢測訊號Vsl〜Vs4。繼而,差動放大 器46根據移位檢測訊號vs3、Vs4之差,輸出與圍繞檢測軸 A之角速度Ω1相對應之最終之移位檢測訊號va。同步檢波 電路47根據移位檢測訊號Va,對與移相訊號Vm’同步之訊 U7127.doc •32- 號進行檢波。藉此,角速度檢測電路41輸出與圍繞檢測轴 A之角速度Ω1相對應之角速度訊號。 再者’當圍繞檢測轴A之角速度Ω1產生作用時,預備性 之移位檢測訊號Vs 1、Vs2彼此成為同相位。此時,移位檢 測訊號Vb使用移位檢測訊號Vs 1、Vs2之差來進行運算。 因此,當圍繞檢測轴A之角速度Ω1產生作用時,即便同步 檢波電路5 1對移位檢測訊號Vb進行同步檢波,亦不會輸出 與角速度Ω2相對應之角速度訊號。 其次’說明對圍繞檢測軸B之角速度Ω2進行檢測之情 形。自外部之振動控制電路31將驅動訊號Vd輸入至電極支 持部14,使驅動質量部4〜7振動》於該振動狀態下,若圍 繞檢測轴B之角速度Ω2產生作用,則以下之數3所示之科 氏力Fbx作用於驅動質量部4、5,並且以下之數4所示之科 氏力Fby作用於驅動質量部6、7。繼而,驅動質量部4〜7中 產生之科氏力Fbx、Fby經由驅動梁8而傳遞至檢測質量部 1 5。因此,檢測質量部15藉由科氏力Fbx、Fby之合力,以 檢測軸B為中心’檢測軸A方向之兩端於交替地Z軸方向上 移位,並對應於角速度Ω2而振動。 [數3]Qly: the component around the x-axis in the angular velocity Ω1 of the detection axis v1: the velocity in the X-axis direction of the driving mass portions 6, 7 Therefore, the displacement detecting portions 18 to 21 correspond to the Z-axis of the detecting mass portion 15. The displacement of the direction changes the static capacitances cs1 to Cs4 between the movable side detecting electrodes UA to 21A and the fixed side detecting electrodes 18B to 21B. At this time, the C-V switching circuits 42 to 45 of the angular velocity detecting circuit 41 convert the changes of the electrostatic capacitances Cs1 to Cs4 into the preliminary shift detecting signals Vs1 to Vs4. Then, the differential amplifier 46 outputs a final shift detecting signal va corresponding to the angular velocity Ω1 around the detecting axis A based on the difference between the shift detecting signals vs3 and Vs4. The synchronous detection circuit 47 detects the signal U7127.doc • 32- which is synchronized with the phase shift signal Vm' based on the shift detection signal Va. Thereby, the angular velocity detecting circuit 41 outputs an angular velocity signal corresponding to the angular velocity Ω1 around the detecting axis A. Further, when the angular velocity Ω1 around the detection axis A acts, the preparatory shift detecting signals Vs 1 and Vs2 are in phase with each other. At this time, the shift detection signal Vb is calculated using the difference between the shift detection signals Vs1 and Vs2. Therefore, when the angular velocity Ω1 around the detection axis A acts, even if the synchronous detection circuit 51 performs synchronous detection on the displacement detecting signal Vb, the angular velocity signal corresponding to the angular velocity Ω2 is not output. Next, the case of detecting the angular velocity Ω2 around the detection axis B will be described. The external vibration control circuit 31 inputs the drive signal Vd to the electrode support portion 14 to vibrate the drive mass portions 4 to 7 in the vibration state, and if the angular velocity Ω2 around the detection axis B acts, the following three The Coriolis force Fbx is shown to act on the driving mass portions 4, 5, and the Coriolis force Fby shown in the following 4 is applied to the driving mass portions 6, 7. Then, the Coriolis forces Fbx and Fby generated in the drive mass units 4 to 7 are transmitted to the detection mass unit 15 via the drive beam 8. Therefore, the detecting mass portion 15 is displaced in the alternate Z-axis direction by the combined force of the Coriolis force Fbx and Fby, centering on the detecting axis B, and vibrating in accordance with the angular velocity Ω2. [Number 3]

Fbx=2 χΜχΩ2χχ v 其中,Μ:驅動質量部4、5之質量 Ω2χ :圍繞檢測軸Β之角速度Ω2中之圍繞X軸之成分 ν:驅動質量部4、5之Υ軸方向之速度 [數4] 137127.doc •33· 1379992Fbx=2 χΜχΩ2χχ v where Μ: the mass of the driving mass portion 4, 5 Ω2 χ : the component around the X-axis among the angular velocities Ω2 around the detecting axis ν: the velocity in the z-axis direction of the driving mass portions 4, 5 [4 ] 137127.doc •33· 1379992

Fby=2xMxn2yxv 其中,M:驅動質量部6、7之質量 Q2y :圍繞檢測轴Β之角速度Ω2中之圍繞Υ軸之成分 ν :驅動質量部6、7之X軸方向之速度 因此,移位檢測部18〜2 1中,對應於檢測質量部丨5之Ζ轴 方向之移位,可動側檢測電極1 8 A〜21A與固定側檢測電極 18B〜21B之間之靜電容Csl〜Cs4產生變化。此時,角速度 檢測電路41之C-V轉換電路42〜45將靜電容Csl〜Cs4之變化 轉換為移位檢測訊號Vs 1〜Vs4。繼而,差動放大器5 〇根據 移位檢測訊號Vs 1、Vs2之差’輸出與圍繞檢測軸b之角速 度Ω2相對應之移位檢測訊號Vb。同步檢波電路5丨根據移 位檢測訊號Vb,對與移相訊號Vm'同步之訊號進行檢波。 藉此’角速度檢測電路41輸出與圍繞檢測軸B之角速度Q2 相對應之角速度訊號。 再者’當圍繞檢測軸B之角速度Ω2產生作用時,預備性 之移位檢測訊號Vs3、Vs4彼此成為同相位。此時,移位檢 測訊號Va使用移位檢測訊號Vs3、Vs4之差來進行運算。因 此,當圍繞檢測軸B之角速度Ω2產生作用時,即使同步檢 波電路47對移位檢測訊號Va進行同步檢波,亦不會輸出與 角速度Ω1相對應之角速度訊號。 如此’於本實施形態中,由於4個驅動質量部4〜7配置在 相對於中心點〇呈點對稱之位置,故而2個驅動質量部4、5 可夹持中心點Ο而配置於X軸方向之兩側,2個驅動質量部 6、7可夾持中心點〇而配置於γ軸方向之兩側。又,圓周 137127.doc -34- 1379992 方向上相鄰之驅動質量部4〜7彼此以反相位振動。因此, 當驅動質量部4〜7接近檢測軸a時,可使驅動質量部4〜7遠 離檢測轴B «又,當驅動質量部4〜7遠離檢測軸a時,驅動 質量部4〜7可接近檢測軸B。 藉此’當圍繞檢測軸A之角速度Ω1產生作用時,可使驅 動質量部4〜7產生朝向z轴方向之科氏力Fax、Fay。因此, 當角速度Ω1產生作用時,檢測質量部15係以檢測轴a為中 心’檢測轴B方向之兩端側交替地於Z軸方向上移位並振 動。因此’使用移位檢測部18〜21來檢測該振動,藉此可 檢測圍繞檢測軸A之角速度Ω1。 另一方面,當圍繞檢測轴B之角速度Ω2產生作用時,可 使驅動質量部4〜7產生朝向Z軸方向之科氏力Fbx、Fby。因 此’當角速度Ω2產生作用時,檢測質量部15係以檢測軸b 為中心,檢測軸A方向之兩端側交替地於z軸方向上移位 並振動。因此,使用移位檢測部1 8〜21來檢測該振動,藉 此可檢測圍繞檢測軸B之角速度Ω2。 藉此’可使用單一之角速度感測器1來檢測作用於2個檢 測軸A、B周圍之角速度Ω1、Ω2 ’因此,與使用有圍繞1個 轴之兩個感測器之情形相比,可降低製造成本。 又,由於4個驅動質量部4〜7配置在相對於中心點〇呈點 對稱之位置,故而可藉由使圓周方向上彼此相鄰之驅動質 量部4〜7朝反方向(反相位)振動,而固定4個驅動質量部 4〜7整體之重心位置,並且可抵消4個驅動質量部4〜7整體 產生之圓周方向之轉矩(旋轉力矩)。此時,由於連結梁9將 137127.doc -35- 1379992 4個驅動質量部4〜7之支點4B〜7B附近彼此加以連結,故而 例如即便4個驅動質量部4~7產生了加工不均,各驅動質量 部4~7亦會於驅動振幅以及相位已一致之狀態下振動。其 結果,能夠可靠地減小4個驅動質量部4〜7整體之重心位置 之變動或轉矩,從而驅動質量部4〜7之驅動振動不會影響 檢測質里部15、基板2等。藉此’角速度訊號之偏移輸出 變得穩定。 進而,相對於檢測梁16、17(檢測軸A、B),作為可動部 之驅動質量部4〜7、驅動梁8、連結梁9以及檢測質量部1 5 係為線對稱之形狀。因此,即便加速度於基板2之垂直方 向(Z軸方向)上產生作用,可動部整體有時會於z軸方向上 移位,但由該移位引起之移位檢測部1 8〜2丨之靜電容之變 化成為相同之值。因此’利用移位檢測部1 8〜2丨來對移位 檢測訊號Vsl〜Vs4進行差動檢測,藉此可自角速度訊號除 去由加速度產生之成分。 又,由於5又為如下構成’即,作用於驅動質量部4〜7之 科氏力Fax、Fay、Fbx、Fby經由驅動梁8而傳遞至檢測質 置部15,因此檢測質量部15本身不會驅動振動。因此,即 便當驅動質量部4〜7例如因加工不均而於基板2之垂直方向 (z軸方向)上搖晃之狀態下振動時,檢測質量部15亦不會 搖晃。因此,移位檢測部18〜21可對檢測質量部丨^之乙轴方 向之移位進行檢測而不受驅動質量部4〜7之搖晃之影響。 亦即’由於移位檢測部i 8〜2 i不會產生振動搖晃之訊號⑽ 訊訊號)’故而4易對角速度感測器t之輸出訊號(角速度訊 137127.doc -36 - 1379992 號)進行調整°其結果,例如即便當直接將移位檢測訊號 Vsl〜Vs4放大時,或者使用差動放大器46、5〇來進行差動 放大時’增益亦不會因雜訊訊號而飽和。因此,可提高同 步檢波前之初始階段之放大率,故而可相對性地減小角速 度訊號中所含之雜訊訊號,從而可獲得SN(signal_Noise, 4吕號-雜訊)比良好之角速度訊號。 又’於移位檢測部1 8〜21產生之移位檢測訊號Vs 1〜Vs4 中’不會添加由驅動振動之搖晃產生之偏移電壓。因此, 即便當使用調整電路49、53來對偏移電壓進行調整時,偏 移電壓之調整範圍亦會變小,並且偏移電壓之溫度變化 (溫度漂移)會變小。其結果,可提高角速度^^、Ω2之檢測 精度。 又’驅動質量部4〜7係在與基板2平行之狀態下振動,因 此與在垂直於基板2之Ζ軸方向上振動之情形相比,可增大 驅動振幅。因此,可增大作用於驅動質量部4~7之科氏力 Fax、Fay、Fbx、Fby,故而亦可增大由科氏力Fax、Fay、 Fbx、Fby引起之檢測質量部15之移位,從而可提高角速度 Ω1、Ω2之檢測靈敏度。 進而’於本實施形態中設為如下構成,即,4個驅動質 量部4〜7彼此等間隔地配置於包圍中心點◦之圓周方向上, 檢測梁16、17位於相鄰之2個驅動質量部4〜7之間,且沿著 2個檢測軸A、B延伸。因此,沿著檢測軸A延伸之檢測梁 16對檢測質量部15進行支持,使得該檢測質量部15能夠以 該檢測梁16為中心而於基板2之厚度方向上移位。同樣 137127.doc •37- 1379992 地,沿著檢測軸B延伸之檢測梁17亦對檢測質量部15進行 支持,使得該檢測質量部15能夠以該檢測梁17為中心而於 基板2之厚度方向上移位。其結果,檢測梁16、17以能夠 圍繞與基板2平行之檢測軸A、B振動之方式來支持檢測質 量部15。 又’設為如下構成,即,檢測梁16、1 7位於相鄰之2個 驅動質量部4〜7之間,且沿著2個檢測轴A、B延伸。因 此,與將檢測梁設置於較驅動質量部4〜7更靠外周侧之情 形相比,可使角速度感測器1之整體小型化。 進而,移位檢測部18〜21係位於相鄰之2個驅動質量部 4〜7之間,配置在相對於中心點〇呈點對稱之位置,且藉由 與檢測質量部15相對向地設置之4個固定側檢測電極 1 8 B〜21B而構成。此處,當對應於角速度Ω1、Ω2,檢測質 量部1 5以中心點〇為中心而於Z轴方向上振動時,對應於 角速度Ω1、Ω2,檢測質量部15(可動側檢測電極〗8 a〜21 A) 與固定側檢測電極18B〜21B之間之距離產生變化。因此, 可藉由對檢測質量部15與4個固定側檢測電極18B〜21B之 間之靜電容Cs 1〜Cs4進行檢測,而對圍繞2個檢測轴a、b 之角速度Ω1、Ω2進行檢測。 又’由於設置有對驅動質量部4、5之振動方向之移位進 行監視之振動監視部22、23 ’故而可使用振動監視部22、 23來檢測驅動質量部4、5(驅動質量部6、7)之振動振幅以 及相位。因此,可將振動監視部22、23之監視訊號7〇1用 作振動控制電路31之參照訊號,從而可實現共振狀態之穩 137127.doc •38· 1379992 定化。又,亦可將振動監視部22、23之監視訊號Vm用作 角速度檢測電路41之參照訊號(移相訊號vm,),從而可根 據驅動質量部4〜7之振動狀態進行正確之同步檢波。 進而,檢測梁16、17係使用扭轉支持梁而形成,該扭轉 支持梁於檢測質量部15在基板2之厚度方向上移位時會產 生扭轉變形,因此,例如可藉由於基板2之垂直方向上對 石夕材料等進行加工而形成扭轉支持梁,從而可容易地進行 加工。又,扭轉支持梁之彈簧常數係與寬度尺寸之3次方 成比例地變動,但此與驅動梁8、連結梁9相同。因此,可 減小寬度尺寸之加工不均對驅動模式與檢測模式之共振頻 率差造成之影響,從而可減小角速度感測器1之靈敏度不 均。 再者,於第1實施形態中,振動產生部1〇〜丨3設為如下構 成·藉由驅動訊號而使可動側驅動電極1〇 A〜13 A之電極板 與固定側驅動電極10B〜13B之電極板之距離產生變化,從 而產生靜電力(驅動力F1-F4)。然而,本發明並不限於 此’例如亦可如圖15所示之第1變形例之振動產生部13' 般’使用彼此嚙合之2個梳齒狀電極來構成可動側驅動電 極13A’以及固定側驅動電極13B,。於該情形時,振動產生 部係如下者:使可動側驅動電極ΠΑ'以及固定側驅動電 極13B’之間之嚙合深度(對向面積)產生變化,從而產生靜 電力。 又’於第1實施形態中係設為將振動監視部22、23設置 於驅動質量部4、5之構成。然而,本發明並不限於此,例 137127.doc •39· 1379992 如亦可设為如下構成:將振動監視部設置於驅動質量部 6、7 ’以檢測驅動質量部6、7之振動方向(χ轴方向)之移 位。又’可設為將振動監視部設置於驅動質量部4與驅動 質篁部ό之構成,亦可設為將振動監視部僅設置於驅動質 量部4〜7中之任一個驅動質量部之構成。 又’於第1實施形態中係設為將狹缝22A、23Α設置於驅 動質夏部4、5之構成《然而,本發明並不限於此,亦可設 為如下構成:將朝X軸方向突出之突起設置於驅動質量部 4、5,並對應於該突起與驅動質量部4、5之驅動振動,使 與固疋側監視電極22B、23B之對向面積產生變化。 進而’於第1實施形態中’振動監視部22、23係藉由在Z 軸方向上相對向之狹縫22A、23A與固定側監視電極22B、 23B而構成,然而,本發明並不限於此,例如亦可使用如 下之2個梳齒狀電極來構成振動監視部,該2個梳齒狀電極 之喷合深度會對應於驅動質量部4、5之Y軸方向之移位而 產生變化。 其次,圖16至圖18表示本發明之第2實施形態。而且, 本實施形態之特徵在於:設置覆蓋檢測質量部之蓋板,並 且使用與該盘板相對向地設置之4個固定側檢測電極來構 成移位檢測部。再者,於本實施形態中,對與上述第1實 施形態相同之構成要素附上相同之符號,並省略其說明。 角速度感測器71與第1實施形態之角速度感測器1大致同 樣地係藉由基板2、驅動質量部4〜7、驅動梁8、連結梁9、 振動產生部10〜13、檢測質量部15、檢測梁16、17、以及 J37127.doc -40· 1379992 移位檢測部76〜79等而構成。其中,於檢測質量部ι5中之 與蓋板26相對向之對向面(表面)上設置有蓋板72〜75。 蓋板72〜75例如係藉由大致梯形狀之較薄之平板而形 成,位於檢測梁16、17之間且分別設置於與驅動質量部 4〜7相對應之位置。此處,蓋板72〜75係藉由固著於檢測質 量部15之表面之較薄之平板狀之檢測側板部72A〜75八、以 及保持間隙地覆蓋驅動質量部4〜7、驅動梁8以及連結梁9 之表面之驅動側板部72B〜75B而構成。而且,蓋板72〜75 例如係使用低電阻之多晶矽材料等而形成,且經由檢測質 置部15、支持部3等而連接於地面。 又,於驅動側板部72B〜75B與驅動質量部4〜7等之間形 成有間隙。因此,即便當驅動質量部4〜7驅動振動時,驅 動側板部72B〜75 B亦不會與驅動質量部4〜7等接觸。 移位檢測部76〜79構成移位檢測機構,其對質量部15於 基板2之厚度方向上移位之情況進行檢測。又,移位檢測 部76〜79係藉由與蓋板72〜75相對向地設置於蓋板26之固定 側檢測電極76A〜79A而構成。而且,固定側檢測電極 76A 79A係與内側突出部15八〜15〇相對向’且配置在相對 於中〜點0呈點對稱之位置。然巾,固定側檢測電極 76A〜79Ail不限於内側突出部15A~1 5D,纟延展至與驅動 質量部4〜7相對應之位置為止。因此,固定側檢測電極 76八〜79八具有比第1實施形態之固定側檢測電極183〜21]8大 之面積。 繼而,當檢測質量部15圍繞檢測軸B振動時,内侧突出 137127.doc 1379992 部15A、15B於基板2之厚度方向上移位。此時,蓋板 72〜75中之檢測轴A方向之兩端側之部位與固定側檢測電極 76A、77A之間的距離產生變化,因此,蓋板72〜75與固定 側檢測電極76A、77A之間之靜電容Csl ' Cs2亦產生變 化。 另一方面,當檢測質量部15圍繞檢測轴A振動時,内側 突出部15C、15D於基板2之厚度方向上移位。此時,蓋板 72~75中之檢測軸B方向之兩端側之部位與固定側檢測電極 78A、79A之間的距離產生變化,因此蓋板72〜75與固定側 檢測電極78A、79A之間之靜電容Cs3、Cs4亦產生變化。 因此’當檢測質量部15藉由圍繞檢測轴A、B之角速度 Ω1、Ω2而於Z轴方向上移位時,移位檢測部76〜79根據蓋 板72〜75與固定側檢測電極76A〜79A之間之靜電容Csl〜Cs4 之變化,檢測該位移量作為角速度Ω1、Ω2。 如此’於以上述方式構成之本實施形態中,亦可獲得與 第1實施形態大致相同之作用效果。而且,尤其於本實施 形態中,設置覆蓋檢測質量部丨5之蓋板72〜75,使用與該 蓋板72〜75相對向地設置之4個固定側檢測電極76a〜79八來 構成移位檢測部76〜79。因此,蓋板72〜75與檢測質量部15 成為一體並圍繞檢測軸A、B振動,故而藉由檢測蓋板 72 75與固疋側檢測電極% a〜79A之間之靜電容Csl〜Cs4, 而可檢測圍繞2個檢測軸a、B之角速度Ω丨、Ω2。又,可將 蓋板72〜75配置於驅動質量部4〜7與固定側檢測電極 76Α〜79Α之間。藉此,可利用蓋板72〜75來阻斷驅動質量 I37l27.doc •42- 1379992 部4〜7等之影響,因此,可將固定側檢測電極76A〜79A延 展至與驅動質量部4〜7相對向之位置為止。其結果,可增 大固定側檢測電極7 6 A〜79 A之面積,因此亦可使靜電容 Csl〜Cs4大幅度地變化,從而可提高角速度Ω1、Ω2之檢測 靈敏度。 再者,於第2實施形態中,將4塊蓋板72〜75設置於除檢 測梁16、17以外之位置。然而,本發明並不限於此,只要 能夠確保不干涉檢測梁16、17之程度之充分的間隙,則亦 可設為如下構成,即,藉由1塊蓋板來一併覆蓋檢測梁 16 、 17 ° 又,於第2實施形態中係設為省略了振動監視部之構 成》然而,若例如將固定側監視電極形成於基板2側,則 亦可女裝與第1實施形態相同之振動監視部。 其次,圖19至圖21表示本發明之第3實施形態。而且, 本實施形態之特徵在於設為如下構成,即,檢測質量部之 厚度尺寸比驅動質量部、驅動梁、連結梁、以及檢測梁之 厚度尺寸薄。,於本實施形態中,對與上述第】實施 形態相同之構成要素附上相同之符號,並省略其說明。 角速度感測器81與第1實施形態之角速度感測器丨大致同 樣地係藉由基板2、驅動質量部4〜7、驅動梁8、連結梁9、 振動產生部10〜13、檢測質量部82、檢測梁16、17、移位 檢測部18〜21、以及振動監視部22、23等而構成。 檢測質量部82係與第!實施形態之檢測質量部15大致同 樣地構成,檢測質量部8 2具備沿著其對角線朝内周側突出 I37l27.doc •43- 1379992 而且’内側突出部82A-82D -間’並且構成移位檢測部 之4個内側突出部82A-82D。而且 分別配置於驅動質量部4〜7之間, 18〜21之可動側檢測電極18A〜21A。 然而,檢測質量部82具有厚度尺寸較薄之薄壁部83,在 此方面與第1實施形態之檢測質量部丨5不同。此時成為如 下構成.薄壁部83之厚度尺寸比驅動質量部4〜7、驅動梁Fby=2xMxn2yxv where M: the mass Q2y of the driving mass portions 6, 7 : the component around the Υ axis in the angular velocity Ω2 around the detection axis ν: the velocity in the X-axis direction of the driving mass portions 6, 7 Therefore, the displacement detection In the portions 18 to 21, the electrostatic capacitances Cs1 to Cs4 between the movable-side detecting electrodes 18A to 21A and the fixed-side detecting electrodes 18B to 21B change in accordance with the shift in the z-axis direction of the detecting mass portion 丨5. At this time, the C-V conversion circuits 42 to 45 of the angular velocity detecting circuit 41 convert the changes of the electrostatic capacitances Cs1 to Cs4 into the shift detecting signals Vs 1 to Vs4. Then, the differential amplifier 5 输出 outputs the shift detecting signal Vb corresponding to the angular velocity Ω2 around the detecting axis b based on the difference Δ between the shift detecting signals Vs 1 and Vs2. The synchronous detection circuit 5 detects the signal synchronized with the phase shift signal Vm' based on the shift detection signal Vb. Thereby, the angular velocity detecting circuit 41 outputs an angular velocity signal corresponding to the angular velocity Q2 around the detecting axis B. Further, when the angular velocity Ω2 around the detection axis B acts, the preparatory shift detecting signals Vs3 and Vs4 are in phase with each other. At this time, the shift detection signal Va is calculated using the difference between the shift detection signals Vs3 and Vs4. Therefore, when the angular velocity Ω2 around the detection axis B acts, even if the synchronous detection circuit 47 synchronously detects the displacement detecting signal Va, the angular velocity signal corresponding to the angular velocity Ω1 is not output. In the present embodiment, since the four driving mass portions 4 to 7 are disposed at positions that are point-symmetric with respect to the center point ,, the two driving mass portions 4 and 5 can be placed on the X-axis while sandwiching the center point Ο On both sides of the direction, the two driving mass portions 6, 7 can be placed on both sides in the γ-axis direction by sandwiching the center point 。. Further, the driving mass portions 4 to 7 adjacent in the direction of the circumference 137127.doc - 34 - 1379992 vibrate in opposite phases with each other. Therefore, when the driving mass portions 4 to 7 approach the detecting axis a, the driving mass portions 4 to 7 can be moved away from the detecting axis B. Further, when the driving mass portions 4 to 7 are away from the detecting axis a, the driving mass portions 4 to 7 can be Close to the detection axis B. Thereby, when the angular velocity Ω1 around the detection axis A acts, the driving mass portions 4 to 7 can generate the Coriolis forces Fax and Fay in the z-axis direction. Therefore, when the angular velocity Ω1 acts, the detecting mass portion 15 is alternately displaced and vibrated in the Z-axis direction at both ends of the detecting axis B in the center of the detecting axis a. Therefore, the vibration is detected using the displacement detecting portions 18 to 21, whereby the angular velocity Ω1 around the detection axis A can be detected. On the other hand, when the angular velocity Ω2 around the detection axis B acts, the drive mass portions 4 to 7 can generate the Coriolis forces Fbx and Fby toward the Z-axis direction. Therefore, when the angular velocity Ω2 acts, the detection mass portion 15 is centered on the detection axis b, and both end sides in the detection axis A direction are alternately displaced and vibrated in the z-axis direction. Therefore, the vibration is detected using the displacement detecting portions 18 to 21, whereby the angular velocity Ω2 around the detection axis B can be detected. Thereby, the angular velocity Ω1, Ω2 acting around the two detection axes A, B can be detected using a single angular velocity sensor 1 . Therefore, compared with the case where two sensors surrounding one axis are used, Can reduce manufacturing costs. Further, since the four driving mass portions 4 to 7 are disposed at positions that are point-symmetric with respect to the center point ,, the driving mass portions 4 to 7 adjacent to each other in the circumferential direction can be reversed (reverse phase). The center of gravity of the four drive mass portions 4 to 7 is fixed by vibration, and the torque (rotational moment) in the circumferential direction generated by the four drive mass portions 4 to 7 as a whole can be canceled. At this time, since the connecting beam 9 connects the vicinity of the fulcrums 4B to 7B of the four driving mass units 4 to 7 of 137127.doc - 35 - 1379992, for example, even if the four driving mass portions 4 to 7 are unevenly processed, Each of the driving mass units 4 to 7 also vibrates in a state where the driving amplitude and the phase are identical. As a result, the fluctuation or torque of the center of gravity of the entire four driving mass units 4 to 7 can be reliably reduced, and the driving vibrations of the driving mass portions 4 to 7 do not affect the detecting quality portion 15, the substrate 2, and the like. Thereby, the offset output of the 'angular velocity signal becomes stable. Further, with respect to the detecting beams 16 and 17 (detecting axes A and B), the driving mass portions 4 to 7 as the movable portions, the drive beam 8, the connecting beam 9, and the detecting mass portion 15 are linearly symmetrical. Therefore, even if the acceleration acts in the vertical direction (Z-axis direction) of the substrate 2, the entire movable portion may be displaced in the z-axis direction, but the displacement detecting portion 18 to 2 is caused by the displacement. The change in electrostatic capacitance becomes the same value. Therefore, the displacement detecting units 18 to 2 are used to differentially detect the shift detecting signals Vs1 to Vs4, whereby the components generated by the acceleration can be removed from the angular velocity signal. Further, since the fifth portion is configured as follows, the Coriolis forces Fax, Fay, Fbx, and Fby acting on the driving mass portions 4 to 7 are transmitted to the detecting texture portion 15 via the driving beam 8, so that the detecting mass portion 15 itself is not Will drive vibration. Therefore, even if the driving mass portions 4 to 7 vibrate in a state where the driving mass portions 4 to 7 are shaken in the vertical direction (z-axis direction) of the substrate 2, for example, unevenness in processing, the detecting mass portion 15 does not wobble. Therefore, the displacement detecting sections 18 to 21 can detect the shift in the direction of the square of the detecting mass portion 而^ without being affected by the shaking of the driving mass portions 4 to 7. That is, because the shift detecting unit i 8~2 i does not generate a vibration shaking signal (10) signal signal), the output signal of the diagonal variable speed sensor t (the angular velocity signal 137127.doc -36 - 1379992) is performed. As a result of the adjustment, for example, even when the shift detection signals Vs1 to Vs4 are directly amplified, or when the differential amplifiers 46 and 5 are used for differential amplification, the gain is not saturated by the noise signal. Therefore, the amplification factor in the initial stage before the synchronous detection can be improved, so that the noise signal contained in the angular velocity signal can be relatively reduced, thereby obtaining an angular velocity signal of SN (signal_Noise, 4 Lu-noise) ratio. . Further, in the shift detecting signals Vs 1 to Vs4 generated by the shift detecting sections 18 to 21, the offset voltage generated by the shaking of the driving vibration is not added. Therefore, even when the adjustment circuits 49, 53 are used to adjust the offset voltage, the adjustment range of the offset voltage becomes small, and the temperature change (temperature drift) of the offset voltage becomes small. As a result, the detection accuracy of the angular velocity ^^ and Ω2 can be improved. Further, the driving mass portions 4 to 7 vibrate in a state of being parallel to the substrate 2, so that the driving amplitude can be increased as compared with the case of vibrating in the direction perpendicular to the x-axis of the substrate 2. Therefore, the Coriolis forces Fax, Fay, Fbx, and Fby acting on the driving mass portions 4 to 7 can be increased, so that the displacement of the detecting mass portion 15 caused by the Coriolis forces Fax, Fay, Fbx, and Fby can be increased. Therefore, the detection sensitivity of the angular velocities Ω1 and Ω2 can be improved. Further, in the present embodiment, the four driving mass portions 4 to 7 are arranged at equal intervals in the circumferential direction around the center point ,, and the detecting beams 16 and 17 are located adjacent to each other in the two driving qualities. Between the parts 4 to 7, and extending along the two detection axes A and B. Therefore, the detecting beam 16 extending along the detecting axis A supports the detecting mass portion 15 so that the detecting mass portion 15 can be displaced in the thickness direction of the substrate 2 around the detecting beam 16. Similarly, the detection beam 17 extending along the detection axis B also supports the detection mass portion 15 so that the detection mass portion 15 can be centered on the detection beam 17 in the thickness direction of the substrate 2, 137127.doc • 37-1379992 Shift up. As a result, the detecting beams 16 and 17 support the detecting mass unit 15 so as to be able to vibrate around the detecting axes A and B parallel to the substrate 2. Further, the detection beams 16 and 17 are located between the adjacent two driving mass portions 4 to 7 and extend along the two detection axes A and B. Therefore, the overall angular velocity sensor 1 can be miniaturized as compared with the case where the detecting beam is disposed on the outer peripheral side of the driving mass portions 4 to 7. Further, the displacement detecting units 18 to 21 are located between the adjacent two driving mass units 4 to 7, and are disposed at positions that are point-symmetric with respect to the center point ,, and are disposed opposite to the detecting mass unit 15 The four fixed side detecting electrodes 1 8 B to 21B are formed. Here, when the detection mass portion 15 vibrates in the Z-axis direction centering on the center point 对应 corresponding to the angular velocities Ω1 and Ω2, the detecting mass portion 15 (movable side detecting electrode) 8 a corresponds to the angular velocities Ω1 and Ω2. ~21 A) The distance from the fixed side detecting electrodes 18B to 21B changes. Therefore, the angular velocities Ω1 and Ω2 around the two detection axes a and b can be detected by detecting the electrostatic capacitances Cs 1 to Cs4 between the detection mass unit 15 and the four fixed side detection electrodes 18B to 21B. Further, the vibration monitoring units 22 and 23 are provided for monitoring the displacement of the vibration directions of the driving mass units 4 and 5, so that the driving quality units 4 and 5 can be detected using the vibration monitoring units 22 and 23 (the driving mass unit 6) , 7) Vibration amplitude and phase. Therefore, the monitoring signal 7〇1 of the vibration monitoring units 22 and 23 can be used as the reference signal of the vibration control circuit 31, thereby realizing the stability of the resonance state 137127.doc • 38· 1379992. Further, the monitoring signals Vm of the vibration monitoring units 22 and 23 can be used as reference signals (shifting signals vm) of the angular velocity detecting circuit 41, so that accurate synchronous detection can be performed based on the vibration states of the driving mass portions 4 to 7. Further, the detecting beams 16 and 17 are formed using a torsion support beam which is torsionally deformed when the detecting mass portion 15 is displaced in the thickness direction of the substrate 2, and thus, for example, may be caused by the vertical direction of the substrate 2 The stone slab material and the like are processed to form a torsion support beam, so that the processing can be easily performed. Further, the spring constant of the torsion support beam fluctuates in proportion to the third power of the width dimension, but this is the same as the drive beam 8 and the connection beam 9. Therefore, the influence of the processing unevenness of the width dimension on the resonance frequency difference between the driving mode and the detecting mode can be reduced, so that the sensitivity unevenness of the angular velocity sensor 1 can be reduced. In the first embodiment, the vibration generating units 1A to 3b are configured as follows: the electrode plates of the movable side drive electrodes 1A to 13A and the fixed side drive electrodes 10B to 13B are driven by the drive signals. The distance between the electrode plates is changed to generate an electrostatic force (driving force F1-F4). However, the present invention is not limited to this. For example, the movable side drive electrode 13A' may be formed and fixed by using two comb-shaped electrodes that mesh with each other as in the vibration generating portion 13' of the first modification shown in FIG. Side drive electrode 13B,. In this case, the vibration generating portion is such that the meshing depth (opposing area) between the movable side drive electrode ΠΑ' and the fixed side drive electrode 13B' is changed to generate static electricity. In the first embodiment, the vibration monitoring units 22 and 23 are provided in the drive mass units 4 and 5. However, the present invention is not limited thereto, and the example 137127.doc • 39· 1379992 may be configured such that the vibration monitoring unit is provided to the driving mass units 6 and 7′ to detect the vibration direction of the driving mass units 6 and 7 ( Shift in the direction of the x-axis. In addition, the vibration monitoring unit may be provided in the drive mass unit 4 and the drive mass unit ,, and the vibration monitoring unit may be provided only in any one of the drive mass units 4 to 7 . . In the first embodiment, the slits 22A and 23 are provided in the driving quality summer portions 4 and 5. However, the present invention is not limited thereto, and may be configured to be oriented in the X-axis direction. The protruding protrusions are provided to the driving mass portions 4 and 5, and correspond to the driving vibrations of the protrusions and the driving mass portions 4 and 5, and the opposing areas of the solid-side monitoring electrodes 22B and 23B are changed. Further, in the first embodiment, the vibration monitoring units 22 and 23 are configured by the slits 22A and 23A and the fixed-side monitoring electrodes 22B and 23B facing each other in the Z-axis direction. However, the present invention is not limited thereto. For example, the vibration monitoring unit may be configured by using two comb-shaped electrodes, and the spray depth of the two comb-shaped electrodes may change in accordance with the displacement of the drive mass portions 4 and 5 in the Y-axis direction. Next, Fig. 16 to Fig. 18 show a second embodiment of the present invention. Further, the present embodiment is characterized in that a cover covering the detecting mass portion is provided, and four fixed side detecting electrodes provided to face the disk plate are used to constitute a displacement detecting portion. In the present embodiment, the same components as those in the first embodiment are denoted by the same reference numerals, and their description will be omitted. Similarly to the angular velocity sensor 1 of the first embodiment, the angular velocity sensor 71 is mainly composed of the substrate 2, the driving mass portions 4 to 7, the driving beam 8, the connecting beam 9, the vibration generating portions 10 to 13, and the detecting quality portion. 15. The detecting beams 16, 17 and J37127.doc - 40· 1379992 are configured by the shift detecting units 76 to 79 and the like. Here, cover plates 72 to 75 are provided on the opposing surface (surface) of the detecting mass portion ι5 facing the cover plate 26. The cover plates 72 to 75 are formed, for example, by a thin plate having a substantially trapezoidal shape, and are disposed between the detecting beams 16, 17 and respectively disposed at positions corresponding to the driving mass portions 4 to 7. Here, the cover plates 72 to 75 cover the drive mass portions 4 to 7 and the drive beam 8 by the thin plate-shaped detection side plate portions 72A to 75 octagonal to the surface of the proof mass portion 15 and the gaps. And the drive side plate parts 72B-75B of the surface of the beam 9 are connected. Further, the cover plates 72 to 75 are formed using, for example, a low-resistance polysilicon material, and are connected to the ground via the detecting portion 15, the support portion 3, and the like. Further, a gap is formed between the driving side plate portions 72B to 75B and the driving mass portions 4 to 7 and the like. Therefore, even when the driving mass portions 4 to 7 drive the vibration, the driving side plate portions 72B to 75B do not come into contact with the driving mass portions 4 to 7 and the like. The shift detecting units 76 to 79 constitute a shift detecting mechanism that detects the displacement of the mass portion 15 in the thickness direction of the substrate 2. Further, the displacement detecting portions 76 to 79 are configured by being provided on the fixed side detecting electrodes 76A to 79A of the cover plate 26 so as to face the cover plates 72 to 75. Further, the fixed-side detecting electrode 76A 79A is disposed at a position which is symmetrical with respect to the middle to the point 0 with respect to the inner protruding portion 15 ~15〇. In addition, the fixed side detecting electrodes 76A to 79Ail are not limited to the inner protruding portions 15A to 15D, and are stretched to positions corresponding to the driving mass portions 4 to 7. Therefore, the fixed side detecting electrodes 76 to 79 are larger than the fixed side detecting electrodes 183 to 21] 8 of the first embodiment. Then, when the detecting mass portion 15 vibrates around the detecting axis B, the inner protruding portion 137127.doc 1379992 portions 15A, 15B are displaced in the thickness direction of the substrate 2. At this time, the distance between the portions on the both end sides in the detection axis A direction of the cover plates 72 to 75 and the fixed side detection electrodes 76A and 77A changes, and therefore, the cover plates 72 to 75 and the fixed side detection electrodes 76A and 77A The static capacitance Csl 'Cs2 also changes. On the other hand, when the detecting mass portion 15 vibrates around the detecting axis A, the inner protruding portions 15C, 15D are displaced in the thickness direction of the substrate 2. At this time, the distance between the portions of the cover plates 72 to 75 on the both end sides in the detection axis B direction and the fixed side detection electrodes 78A and 79A changes, so that the cover plates 72 to 75 and the fixed side detection electrodes 78A and 79A are changed. The static capacitances Cs3 and Cs4 also change. Therefore, when the detecting mass portion 15 is displaced in the Z-axis direction by the angular velocities Ω1 and Ω2 around the detecting axes A and B, the displacement detecting portions 76 to 79 are based on the cover plates 72 to 75 and the fixed-side detecting electrodes 76A to The change in the static capacitances Cs1 to Cs4 between 79A is detected as the angular velocities Ω1 and Ω2. Thus, in the present embodiment configured as described above, substantially the same operational effects as those of the first embodiment can be obtained. Further, in particular, in the present embodiment, the cover plates 72 to 75 covering the detecting mass portion 丨5 are provided, and the four fixed side detecting electrodes 76a to 79 which are provided opposite to the cover plates 72 to 75 are used to constitute the shift. Detection units 76 to 79. Therefore, the cover plates 72 to 75 are integrated with the detecting mass portion 15 and vibrate around the detecting axes A and B. Therefore, by detecting the electrostatic capacitances Cs1 to Cs4 between the cover plate 72 75 and the solid-side detecting electrodes % a to 79A, The angular velocities Ω 丨 and Ω 2 around the two detection axes a and B can be detected. Further, the cover plates 72 to 75 can be disposed between the driving mass portions 4 to 7 and the fixed side detecting electrodes 76 to 79. Thereby, the influence of the driving quality I37l27.doc • 42-1379992 parts 4 to 7 can be blocked by the cover plates 72 to 75, and therefore, the fixed side detecting electrodes 76A to 79A can be extended to the driving mass parts 4 to 7 Relatively to the position. As a result, the area of the fixed side detecting electrodes 7 6 A to 79 A can be increased, so that the electrostatic capacitances Cs1 to Cs4 can be largely changed, and the detection sensitivities of the angular velocities Ω1 and Ω2 can be improved. Further, in the second embodiment, four cover plates 72 to 75 are provided at positions other than the detecting beams 16 and 17. However, the present invention is not limited thereto, and as long as it is possible to ensure a sufficient gap that does not interfere with the detection beams 16 and 17, it is also possible to cover the detection beam 16 by one cover plate, In the second embodiment, the vibration monitoring unit is omitted. However, if the fixed-side monitoring electrode is formed on the substrate 2 side, for example, the same vibration monitoring as in the first embodiment can be applied. unit. Next, Fig. 19 to Fig. 21 show a third embodiment of the present invention. Further, the present embodiment is characterized in that the thickness of the detecting mass portion is thinner than the thickness of the driving mass portion, the driving beam, the connecting beam, and the detecting beam. In the present embodiment, the same components as those in the above-described first embodiment are denoted by the same reference numerals, and their description will be omitted. Similarly to the angular velocity sensor 第 of the first embodiment, the angular velocity sensor 81 is composed of the substrate 2, the driving mass portions 4 to 7, the driving beam 8, the connecting beam 9, the vibration generating portions 10 to 13, and the detecting mass portion. 82. The detecting beams 16 and 17, the displacement detecting units 18 to 21, and the vibration monitoring units 22 and 23 are configured. The detection quality unit 82 is the same as the first! The detection mass portion 15 of the embodiment is configured in substantially the same manner, and the detection mass portion 8 2 has a projection toward the inner circumference side along the diagonal line I37l27.doc • 43-1379992 and the 'inside projection portion 82A-82D - between and constitutes a shift The four inner protruding portions 82A-82D of the position detecting portion. Further, the movable side detecting electrodes 18A to 21A are disposed between the driving mass units 4 to 7 and 18 to 21, respectively. However, the detecting mass portion 82 has a thin portion 83 having a small thickness, and is different from the detecting mass portion 第5 of the first embodiment. At this time, the thickness of the thin portion 83 is smaller than that of the driving mass portions 4 to 7, and the driving beam is formed.

部83係以中心點〇為中心而成為點對稱之形狀。 如此,於以上述方式構成之本實施形態中,亦可獲得與 第1實施形態大致相同之作用效果。而且,尤其於本實施 形癌令,檢測質量部82設為如下構成,即,具備比驅動質 量部4〜7等之厚度尺寸薄之薄壁部83,因此,可減小檢測 質量部82之質量,從而增大由科氏力引起之檢測質量部82 之位移量。藉此,可提高角速度Ω丨、卩2之檢測靈敏度。 再者,於第3實施形態中係設為如下構成:檢測質量部 82之一部分(薄壁部83)之厚度尺寸較薄,但亦可設為使檢 /則邊里部8 2整體之厚度尺寸變薄之構成。 又,於第3實施形態中,將厚度尺寸較薄之檢測質量部 82應用於與第1實施形態相同之構成。然而,本發明並不 限於此’例如亦可將厚度尺寸較薄之檢測質量部應用於與 第2實施形態相同之構成。 其次,圖22至圖24表示本發明之第4實施形態。而且, 本實施形態之特徵在於設為如下構成:使用應力減小連接 部將檢測梁之兩端侧分別連接於檢測質量部與基板。再 137127.doc -44 - 1379992 者’本實施形態中,對盥卜地笛,奋t 对一上述弟1實施形態相同之構成要 素附上相同之符號,並省略其說明。 角速度感測器91與第i實施形態之角速度感測器^大致同 樣地係藉由基板2、驅動質量部4〜7、驅動梁8、連結梁9、 振動產生部1〇~13、檢測質量部15、檢測梁%%、移位 檢測部18〜21、以及振動監視部22、23等而構成。 第1檢測梁92係與第1實施形態之檢測梁16大致同樣地構 成,且形成為細長之板形狀。因此,檢測梁92設置於檢測 質量部15與基板2之間,且沿著與基板2(χγ平面)平行之 檢測軸Α延伸。而且,檢測梁92係使用扭轉支持梁而形 成’該扭轉支持梁於檢測質量部丨5以檢測軸A為中心而在 基板2之厚度方向上移位時,會產生扭轉變形。 具體而言’第1檢測梁92例如位於驅動質量部4、7與驅 動質量部5、6之間’且沿著相對於X軸傾斜45。之檢測軸a 延伸。又’第1檢測梁92分別設置於内側突出部1 5 a、1 5B 之内部。 然而,檢測梁92之一端部側係使用作為應力減小連接部 之應力減小連接梁93而連接於檢測質量部1 5。又,檢測梁 92之他端部側係使用應力減小連接梁93而連接於支持部 3。以此方式使用應力減小連接梁93 ’在該方面不同於檢 測梁9 2與第1實施形態之檢測梁16。The portion 83 has a point symmetrical shape centering on the center point 〇. As described above, in the present embodiment configured as described above, substantially the same operational effects as those of the first embodiment can be obtained. Further, in particular, in the present invention, the detection quality portion 82 has a configuration in which the thin portion 83 having a thickness smaller than that of the driving mass portions 4 to 7 is provided, so that the detection quality portion 82 can be reduced. The mass, thereby increasing the amount of displacement of the proof mass portion 82 caused by the Coriolis force. Thereby, the detection sensitivities of the angular velocities Ω 丨 and 卩 2 can be improved. In the third embodiment, the thickness of the portion (the thin portion 83) of the detecting mass portion 82 is thin, but the thickness of the entire inner portion 8 2 may be set. The composition of the thinning of the size. Further, in the third embodiment, the detection mass portion 82 having a small thickness is applied to the same configuration as that of the first embodiment. However, the present invention is not limited to this. For example, the detection quality portion having a small thickness may be applied to the same configuration as that of the second embodiment. Next, Fig. 22 to Fig. 24 show a fourth embodiment of the present invention. Further, the present embodiment is characterized in that the both ends of the detecting beam are connected to the detecting mass portion and the substrate, respectively, using the stress reducing connecting portion. Further, in the present embodiment, the same components as those of the above-described first embodiment 1 are denoted by the same reference numerals, and the description thereof will be omitted. Similarly to the angular velocity sensor of the i-th embodiment, the angular velocity sensor 91 is composed of the substrate 2, the driving mass portions 4 to 7, the driving beam 8, the connecting beam 9, the vibration generating portion 1〇13, and the detection quality. The portion 15, the detection beam %%, the displacement detecting portions 18 to 21, and the vibration monitoring portions 22, 23 and the like are configured. The first detecting beam 92 is formed in substantially the same manner as the detecting beam 16 of the first embodiment, and is formed in an elongated plate shape. Therefore, the detecting beam 92 is disposed between the detecting mass portion 15 and the substrate 2, and extends along the detecting axis 平行 parallel to the substrate 2 (χγ plane). Further, the detecting beam 92 is formed by using the torsion support beam. When the detecting mass portion 移位5 is displaced in the thickness direction of the substrate 2 around the detecting axis A, the torsion deformation is generated. Specifically, the first detecting beam 92 is located, for example, between the driving mass portions 4 and 7 and the driving mass portions 5 and 6 and is inclined at 45 with respect to the X-axis. The detection axis a extends. Further, the first detecting beams 92 are provided inside the inner protruding portions 15a and 15B, respectively. However, one end side of the detecting beam 92 is connected to the detecting mass portion 15 by using the stress reducing connecting beam 93 as a stress reducing connecting portion. Further, the other end side of the detecting beam 92 is connected to the support portion 3 by using the stress reducing connecting beam 93. The use of the stress reduction connecting beam 93' in this manner is different from the detecting beam 92 in this respect and the detecting beam 16 of the first embodiment.

此時,應力減小連接梁93係藉由2個L型梁93A而構成, 上述2個L型梁93 A例如夾持檢測梁92而分別設置於與檢測 梁92正交之方向(檢測軸B方向)之兩側。又’各L型梁93A 137127.doc •45· 1379992 於檢測轴B方向上延伸,並且其兩端側f曲為4㈣ 且,各L型梁93A之一端側連接於檢測梁%之端部,各㈣ 梁93A之他端側連接於檢測質量部15或支持部3。 藉此,第1檢測梁92之兩端側係在成為其長度方向之檢 測軸A方向上具有自由度之狀態下受到支持。其結果當 檢測梁92產生扭轉變形時,檢測㈣之兩端側可:長度: 向上移位,因Jt,作用於檢測梁92之兩端側之畸變或應力 減小。 ’ 第2檢測梁94係、與第!實施形態之檢測梁17大致同樣地構 成,且形成為細長之板形狀。因此,檢測梁94設置於檢測 質量部15與基板2之間,且沿著與基板2(χ_γ平面)平行之 檢測軸Β延伸。而且,檢測梁94係使用扭轉支持梁而形 成,該杻轉支持梁於檢測質量部15以檢測軸Β為中心而在 基板2之厚度方向上移位時,會產生扭轉變形。 具體而言’第2檢測梁94例如位於驅動質量部4、6與驅 動質量部5、7之間,且沿著相對於X轴傾斜_45。之檢測轴Β 延伸°又,第2檢測梁94分別設置於内側突出部1 5C、1 5D 之内部。 然而’檢測梁94之-端部側係使用作為應力減小連接部 之應力減小連接梁95而連接於檢測質量部1 5。又,檢測梁 94之他端部側係使用應力減小連接梁95而連接於支持部 3° ^乂此方式使用應力減小連接梁95,在該方面不同於檢 測梁94與第1實施形態之檢測梁17。 此時,應力減小連接梁95係藉由2個L型梁95Α而構成, 】37127.d •46- 1379992 上述2個L型梁95A例如夾持檢測梁94而分別設置於與檢測 梁94正交之方向(檢測轴a方向)之兩側。又,各l型梁95A 於檢測轴A方向上延伸,並且其兩端側彎曲為l字形狀。 而且,各L型梁95A之一端側連接於檢測梁94之端部,各L 型梁95A之他端側連接於檢測質量部15或支持部3。 藉此’第2檢測梁94之兩端側係在成為其長度方向之檢 測軸B方向上具有自由度之狀態下受到支持。其結果,當 檢測梁94產生扭轉變形時,檢測梁94之兩端側可於長度方 向上移位,因此,作用於檢測梁94之兩端側之畸變或應力 減小。 繼而,當檢測質量部15以檢測轴A為中心進行振動(搖 動)時,第1檢測梁92產生扭轉變形(扭轉振動)。另一方 面’第2檢測梁94係使用應力減小連接梁95而連接於檢測 質量部15以及支持部3。因此,藉由應力減小連接梁95產 生撓曲變形而允許檢測質量部15以檢測軸a為中心進行振 動。 同樣地,當檢測質量部15以檢測軸B為中心進行振動(搖 動)時’第2檢測梁94產生扭轉變形(扭轉振動)。另一方 面,第1檢測梁92係使用應力減小連接梁93而連接於檢測 質量部15以及支持部3 ^因此,藉由應力減小連接梁幻產 生撓曲變形而允許檢測質量部15以檢測轴B為中心進行振 動。藉此,檢測梁92、94係以可圍繞彼此正交之檢測軸八 以及檢測軸B振動之狀態下,對檢測質量部15進行支持。 如此,於以上述方式構成之本實施形態中,亦可獲得與 137127.doc -47- 1379992 第1實施形感大致相同之作用效果。而且,尤旦於本實施 形態中’檢測梁92、94之兩端側係使用應力減小連接梁 93、95而分別連接於檢測質量部15與固定於基板2之支持 部3,因此可減小角速度感測器91之靈敏度不均。 此處’詳細說明應力減小連接梁93、95.與靈敏度不均之 關係。首先’於固定檢測梁92、94之兩端之情形時,作用 於固定部分之應力會阻礙檢測梁92、94之扭轉變形。因 此,當檢測梁92、94之厚度尺寸產生變化時,與該厚度尺 寸之變化量相對應之共振頻率之變化變大。其結果,存在 如下傾向:加工不均對驅動模式與檢測模式之共振頻率差 造成之影響變大。 相對於此,於本實施形態中,檢測梁92、94之兩端側係 使用應力減小連接梁93、95而分別連接於檢測質量部丨5與 支持部3,因此,當檢測梁92、94產生扭轉變形時,可減 小作用於檢測梁92、94之兩端側之畸變或應力。藉此,可 減小厚度尺寸之加工不均對驅動模式與檢測模式之共振頻 率差造成之影響,從而可減小感測器之靈敏度不均。 再者’於第4實施形態中,應力減小連接梁93、95係使 用L型梁93A、95A而形成》然而,本發明並不限於此,應 力減小連接部只要係於檢測梁之長度方向(扭轉轴方向)上 具有自由度之構成即可。因此,例如亦可如圖25所示之第 2變形例之應力減小連接梁93,般,使用連接於檢測質量部 15之一端側為τ形狀之τ型梁93A,來形成應力減小連接梁。 又,例如亦可如圖26所示之第3變形例之應力減小連接梁 137127.doc •48· 1379992 93”般’使用在與檢測梁92正交之方向上重複i次或複數次 之折回梁93A"來形成應力減小連接梁。 又,於上述各實施形態中,檢測梁16、Π、92、94係使 用沿著檢測軸A、B延伸為直線狀之扭轉支持梁而形成, • 但例如亦可使用沿著檢測軸A、B重複1次或複數次之扭轉 支持梁而形成。 又’於上述各實施形態中,檢測梁16、i 7、92、94係使 φ 用如下之扭轉支持梁而形成,該扭轉支持梁於檢測質量部 15、82在基板2之厚度方向上移位時會產生扭轉變形。然 而’本發明並不限於此,例如亦可使用如下之撓曲支持梁 來形成檢測梁,該撓曲支持梁於檢測質量部在基板之厚度 方向上移位時會產生撓曲變形。 進而,於上述各實施形態中,檢測梁16、17係設為如下 構成’即’將設置於檢測質量部丨5、82之外周側之支持部 3與檢測質量部15、82之内周侧之間加以連接。然而本 # 發明並不限於此,例如亦可設為如下構成,即,將支持部 設置於檢測質量部之内周側,使用檢測梁來將該支持部與 檢測質量部之外周側之間加以連接。 【圖式簡單說明】 圖1係以除去蓋板之狀態來表示本發明之第1實施形熊之 角速度感測器之平面圖。 圖2係放大地表示圖丨中之角速度感測器之要部之 圖。 ° 面 圖3係放大地表示圖1中之振動產生部之平面圖。 137127.doc -49- 1379992 圖4係以固定側檢測電極重疊於圖丨中之角速度感測器之 狀態來表示之平面圖。 圖5係自圖1中之箭頭ν·ν方向觀察角速度感測器之剖面 圖。 圖6係自圖1中之箭頭¥1_¥1方向觀察角速度感測器之剖 面圖。 圖7係以檢測質量部在Ζ軸方向上振動之狀態來表示角速 度感測器之與圖6相同之位置的剖面圖。 圖8係表示角速度感測器之模式性說明圖。 圖9係以驅動質量部已振動之狀態來表示角速度感測器 之模式性說明圖。 圖1 〇係表示角速度感測器之振動控制電路以及角速度檢 測電路之電路構成圖。 圖11係表示基板接合步驟且與圖5相同之位置的剖面 圖。 圖12係表示薄膜化步驟且與圖5相同之位置的剖面圖。 圖13係表示功能部形成步驟且與圖$相同之位置的剖面 圖。 圖14係表示蓋板接合步驟且與圖5相同之位置的剖面 圖。 圖1 5係表示第1變形例之角速度感測器之振動產生部且 與圖3相同的位置之平面圖。 圖16係以除去蓋板之狀態來表示第2實施形態之角速度 感測器之平面圖。 137127.doc •50- 1379992 圖17係以固定側檢測電極重疊於圖16中之角速度感測器 之狀態來表示之平面圖。 圖18係自圖丨6中之箭頭xviII-XVIII方向觀察角速度感 測器之剖面圖。 圖19係以除去蓋板之狀態來表示第3實施形態之角速度 感測益之平面圖。At this time, the stress reduction connecting beam 93 is constituted by two L-shaped beams 93A, and the two L-shaped beams 93 A are respectively placed in the direction orthogonal to the detecting beam 92 by sandwiching the detecting beam 92 (detecting axis) Both sides of the B direction). Further, each of the L-shaped beams 93A 137127.doc •45· 1379992 extends in the direction of the detecting axis B, and its both ends f are curved to 4 (four), and one end side of each of the L-shaped beams 93A is connected to the end of the detecting beam %, The other end side of each (four) beam 93A is connected to the detecting mass portion 15 or the supporting portion 3. Thereby, both end sides of the first detecting beam 92 are supported in a state of having a degree of freedom in the direction of the detecting axis A in the longitudinal direction. As a result, when the detecting beam 92 is subjected to torsional deformation, the both ends of the detecting (4) can be: Length: Upward displacement, due to Jt, distortion or stress acting on both end sides of the detecting beam 92 is reduced. ' The second detection beam 94 is the same as the first! The detecting beam 17 of the embodiment is formed substantially in the same manner and formed in an elongated plate shape. Therefore, the detecting beam 94 is disposed between the detecting mass portion 15 and the substrate 2, and extends along the detecting axis 平行 parallel to the substrate 2 (χ_γ plane). Further, the detecting beam 94 is formed by using a torsion support beam which is torsionally deformed when the detecting mass portion 15 is displaced in the thickness direction of the substrate 2 around the detecting axis. Specifically, the second detecting beam 94 is located, for example, between the driving mass portions 4, 6 and the driving mass portions 5, 7, and is inclined by -45 with respect to the X-axis. The detection axis 延伸 extends, and the second detection beam 94 is disposed inside the inner protrusions 15C and 15D, respectively. However, the end portion of the detecting beam 94 is connected to the detecting mass portion 15 by using the stress reducing connecting beam 95 as a stress reducing connecting portion. Further, the other end side of the detecting beam 94 is connected to the supporting portion by using the stress reducing connecting beam 95. In this manner, the stress reducing connecting beam 95 is used, which is different from the detecting beam 94 and the first embodiment in this respect. The detection beam 17 is detected. At this time, the stress reduction connecting beam 95 is constituted by two L-shaped beams 95A, 37127.d • 46-1379992. The two L-shaped beams 95A are respectively placed on the detecting beam 94, for example, by sandwiching the detecting beam 94. Both sides of the orthogonal direction (detection axis a direction). Further, each of the l-shaped beams 95A extends in the direction of the detection axis A, and both end sides thereof are bent in a l-shape. Further, one end side of each of the L-shaped beams 95A is connected to the end of the detecting beam 94, and the other end side of each of the L-shaped beams 95A is connected to the detecting mass portion 15 or the supporting portion 3. The both ends of the second detecting beam 94 are supported in a state of having a degree of freedom in the direction of the detecting axis B in the longitudinal direction. As a result, when the detecting beam 94 is subjected to the torsional deformation, the both end sides of the detecting beam 94 can be displaced in the longitudinal direction, and therefore, the distortion or stress acting on both end sides of the detecting beam 94 is reduced. Then, when the detecting mass unit 15 vibrates (shakes) around the detecting axis A, the first detecting beam 92 generates torsional deformation (torsional vibration). On the other hand, the second detecting beam 94 is connected to the detecting mass portion 15 and the supporting portion 3 by using the stress reducing connecting beam 95. Therefore, the deflection of the connecting beam 95 by the stress is reduced, and the detecting mass portion 15 is allowed to vibrate around the detecting axis a. Similarly, when the detecting mass portion 15 vibrates (shakes) around the detecting axis B, the second detecting beam 94 generates torsional deformation (torsional vibration). On the other hand, the first detecting beam 92 is connected to the detecting mass portion 15 and the supporting portion 3 by using the stress reducing connecting beam 93. Therefore, the stress is reduced by the stress reducing connecting beam, and the detecting mass portion 15 is allowed to be detected. The detection axis B is centered for vibration. Thereby, the detecting beams 92, 94 support the detecting mass portion 15 in a state in which the detecting axis eight and the detecting axis B are vibrated around each other. As described above, in the present embodiment configured as described above, it is possible to obtain substantially the same operational effects as those of the first embodiment of 137127.doc -47 - 1379992. Further, in the present embodiment, the other ends of the detecting beams 92 and 94 are connected to the detecting mass portion 15 and the supporting portion 3 fixed to the substrate 2 by using the stress reducing connecting beams 93 and 95, respectively. The sensitivity of the small angular velocity sensor 91 is uneven. Here, the relationship between the stress reduction connecting beams 93, 95. and the sensitivity unevenness will be described in detail. First, when the ends of the detecting beams 92, 94 are fixed, the stress acting on the fixed portion hinders the torsional deformation of the detecting beams 92, 94. Therefore, when the thickness dimension of the detecting beams 92, 94 changes, the change in the resonance frequency corresponding to the amount of change in the thickness dimension becomes large. As a result, there is a tendency that the unevenness of processing increases the influence of the resonance frequency difference between the drive mode and the detection mode. On the other hand, in the present embodiment, the both ends of the detecting beams 92 and 94 are connected to the detecting mass portion 丨5 and the supporting portion 3 by using the stress reducing connecting beams 93 and 95, respectively. When the torsional deformation is generated, the distortion or stress acting on both end sides of the detecting beams 92, 94 can be reduced. Thereby, the influence of the processing unevenness of the thickness dimension on the resonance frequency difference between the driving mode and the detecting mode can be reduced, so that the sensitivity unevenness of the sensor can be reduced. Further, in the fourth embodiment, the stress reduction connecting beams 93 and 95 are formed using the L-shaped beams 93A and 95A. However, the present invention is not limited thereto, and the stress reduction connecting portion is only required to be the length of the detecting beam. It is sufficient to have a degree of freedom in the direction (torsion axis direction). Therefore, for example, the stress-reduction connecting beam 93 of the second modification shown in FIG. 25 can be used, and a τ-shaped beam 93A connected to the end side of the detecting mass portion 15 in a z-shape can be used to form a stress-reduction connection. Beam. Further, for example, the stress reduction connecting beam 137127.doc • 48· 1379992 93 of the third modification shown in FIG. 26 may be used repeatedly in the direction orthogonal to the detecting beam 92 for one or more times. In the above embodiments, the detection beams 16, Π, 92, and 94 are formed by using a torsion support beam that extends linearly along the detection axes A and B, and the return beam 93A " • For example, it is also possible to use a torsion support beam that is repeated one or more times along the detection axes A and B. In the above embodiments, the detection beams 16, i 7, 92, and 94 are used to make φ as follows. The torsion support beam is formed by twisting the torsion support beam when the proof mass portions 15 and 82 are displaced in the thickness direction of the substrate 2. However, the present invention is not limited thereto, and for example, the following deflection may be used. The support beam is formed to support the beam, and the deflection support beam is deflected when the detection mass portion is displaced in the thickness direction of the substrate. Further, in each of the above embodiments, the detection beams 16 and 17 are configured as follows. 'that' will be set in the inspection quality department 5 and 82 are connected between the support portion 3 on the outer circumferential side and the inner circumferential side of the detection mass portions 15 and 82. However, the invention is not limited thereto, and for example, the support portion may be provided in the configuration The inner peripheral side of the detecting mass portion is connected between the supporting portion and the outer peripheral side of the detecting mass portion by using a detecting beam. [Brief Description of the Drawing] Fig. 1 shows the first aspect of the present invention in a state in which the cover is removed. Fig. 2 is a plan view showing an enlarged portion of the angular velocity sensor in Fig. 2. Fig. 3 is an enlarged plan view showing the vibration generating portion of Fig. 1. .doc -49- 1379992 Fig. 4 is a plan view showing the state of the angular velocity sensor in which the fixed side detecting electrode is overlapped in the drawing. Fig. 5 is an angle velocity sensor viewed from the direction of the arrow ν·ν in Fig. 1. Fig. 6 is a cross-sectional view of the angular velocity sensor viewed from the direction of the arrow ¥1_¥1 in Fig. 1. Fig. 7 is a diagram showing the state of the angular velocity sensor by detecting the state of the mass portion vibrating in the x-axis direction. 6 section view of the same position. Figure 8 is a Fig. 9 is a schematic explanatory diagram showing the angular velocity sensor in a state where the driving mass portion has vibrated. Fig. 1 shows the vibration control circuit of the angular velocity sensor and the angular velocity detection Fig. 11 is a cross-sectional view showing a substrate bonding step and the same position as Fig. 5. Fig. 12 is a cross-sectional view showing a thinning step and the same position as Fig. 5. Fig. 13 is a view showing a functional portion forming step. Fig. 14 is a cross-sectional view showing a state in which the cover is joined and is the same as Fig. 5. Fig. 1 is a view showing a vibration generating portion of the angular velocity sensor according to the first modification. Figure 3 is a plan view of the same position. Fig. 16 is a plan view showing the angular velocity sensor of the second embodiment in a state in which the cover is removed. 137127.doc • 50-1379992 Fig. 17 is a plan view showing a state in which the fixed side detecting electrode is superimposed on the angular velocity sensor in Fig. 16. Figure 18 is a cross-sectional view of the angular velocity sensor viewed from the direction of the arrow xviII-XVIII in Figure 6. Fig. 19 is a plan view showing the angular velocity sensation of the third embodiment in a state in which the cover is removed.

圖20係自圖19中之箭頭χχ-χχ方向觀察角速度感測器之 剖面圖。 圖21係自圖19中之箭頭χΧΙ_ΧΧΙ*向觀察角速度感測器 之剖面圖。 圖22係以除去蓋板之狀態來表示第4實施形態之角速度 感測器之平面圖。 圖23係放大地表示圖22中之角速度感測器之要部之平面 圖。 圖24係放大地表不應力減小連接部之周圍之平面圖。Figure 20 is a cross-sectional view of the angular velocity sensor viewed from the direction of the arrow χχ-χχ in Figure 19. Figure 21 is a cross-sectional view of the observation angular velocity sensor from the arrow χΧΙ_ΧΧΙ* in Fig. 19. Fig. 22 is a plan view showing the angular velocity sensor of the fourth embodiment in a state in which the cover is removed. Figure 23 is a plan view showing an enlarged view of an essential part of the angular velocity sensor of Figure 22; Fig. 24 is a plan view showing the vicinity of the connecting portion in an enlarged manner without stress.

圖25係放大地表示第2變形例之應力減小連接部之周圍 之平面圖。 圖26係放大地表示第3變形例之應力減小連接部之 之平面圖。 【主要元件符號說明】 1 、 71 、 81 、 91 2 4〜7 4Β 〜7Β 角速度感測器 基板 驅動質量部 支點Fig. 25 is a plan view showing, in an enlarged manner, the periphery of the stress reduction connecting portion of the second modification. Fig. 26 is a plan view showing, in an enlarged manner, a stress reduction connecting portion of a third modification. [Explanation of main component symbols] 1, 71, 81, 91 2 4~7 4Β ~7Β Angular velocity sensor Substrate Driving quality section Pivot

137127.doc 5U 1379992 8 驅動梁 9 連結梁 10〜13 、 13丨 振動產生部(驅動機構) 15、82 檢測質量部 16 、 17 、 92 、 94 檢測梁 18〜21 、 76~79 移位檢測部(移位檢測機構) 22 ' 23 振動監視部(監視機構) 72 〜75 蓋板 93 、 95 、 93' 、 93" 應力減小連接梁(應力減小連接 部) 137127.doc -52-137127.doc 5U 1379992 8 Drive beam 9 Connecting beams 10 to 13 and 13 丨 Vibration generating unit (driving mechanism) 15 and 82 Detecting mass parts 16 , 17 , 92 , 94 Detecting beams 18 to 21 , 76 to 79 Displacement detecting unit (Shift detection mechanism) 22 ' 23 Vibration monitoring unit (monitoring mechanism) 72 to 75 Cover plate 93, 95, 93', 93" Stress reduction connection beam (stress reduction connection) 137127.doc -52-

Claims (1)

1379992 十、申請專利範圍: 1. 一種角速度感測器,其係藉由下述構件而構成: 基板; 4個驅動質量部,其與該基板保持間隙地相對向,且 配置在相對於中心部呈點對稱之位置; 驅動梁,其在與上述基板平行之狀態下以使上述各驅 動質置部可圍繞位於中心部側之支點而振動之方式支持 上述各驅動質量部; 連結梁,其將上述4個驅動質量部之支點附近彼比加 以連結; 驅動機構,其設置於上述基板之中心部側,且使上述 4個驅動質量部以上述支點為中心而朝包圍中心部之圓 周方向振動; 檢測質量部,其使用上述驅動梁而連接於上述4個驅 動質量部; 檢測梁’其設置於該檢測質量部與上述基板之間,且 以使該檢測質量部可圍繞與上述基板平行之2個軸而振 動之方式支持該檢測質量部;以及 移位檢測機構,其於上述檢測質量部圍繞2個軸而振 動時’對上述檢測質量部在上述基板之厚度方向上移位 之情況進行檢測。 2.如請求項1之角速度感測器,其中上述4個驅動質量部係 相對於包圍上述中心部之圓周方向上彼此等間隔地配 置, •37127.doc 1379992 上述檢測梁係設為位於相鄰之2個驅動質量部之間而 沿著上述2個軸延伸之構成。 3_如請求項1或2之角速度感測器,其中上述移位檢測機構 係位於相鄰之2個驅動質量部之間,配置在相對於中心 部呈點對稱之位置’且藉由與上述檢測質量部相對向地 設置之4個檢測電極而構成。 4. 如請求項1或2之角速度感測器,其中上述檢測質量部上 設置有蓋板’該蓋板係與上述4個驅動質量部保持間隙 地覆蓋該檢測質量部, 上述移位檢測機構係配置在相對於中心部呈點對稱之 位置’且藉由與該蓋板相對向地設置之4個檢測電極而 構成。 5. 如請求項1或2之角速度感測器,其中上述檢測質量部係 構成為其全部或一部分之厚度尺寸比上述驅動質量部、 驅動梁 '連結梁、以及檢測梁之厚度尺寸薄。 6·如請求項1或2之角速度感測器,其中設置有對上述驅動 質量部之振動方向之移位進行監視之監視機構。 7.如請求項1或2之角速度感測器,其中上述檢測梁係使用 扭轉支持梁而形成,該扭轉支持梁於上述檢測質量部在 基板之厚度方向上移位時會產生扭轉變形。 8·如請求項7之角速度感測器,其中上述檢測梁係構成為 使用應力減小連接部而分別連接於上述檢測質量部與基 板,該應力減小連接部減小於扭轉變形時作用於該檢測 梁之端部側之應力》 137127.doc1379992 X. Patent Application Range: 1. An angular velocity sensor composed of the following members: a substrate; four driving mass portions that are opposed to the substrate and that are disposed opposite to the center portion a position symmetrical; the driving beam supports the respective driving mass portions in such a manner as to be parallel to the substrate such that the respective driving mass portions can vibrate around a fulcrum located on the center portion side; The drive points are disposed on a side of a center portion of the substrate, and the four drive mass portions are vibrated in a circumferential direction surrounding the center portion around the fulcrum; a detecting mass portion connected to the four driving mass portions by using the driving beam; a detecting beam disposed between the detecting mass portion and the substrate, so that the detecting mass portion can be parallel to the substrate a shaft and vibration support the detection mass portion; and a displacement detecting mechanism that vibrates around the two axes at the detection mass portion At the time of the detection, the detection quality portion is displaced in the thickness direction of the substrate. 2. The angular velocity sensor of claim 1, wherein the four driving mass portions are disposed at equal intervals from each other in a circumferential direction surrounding the central portion, • 37127.doc 1379992 The two drive mass portions are formed to extend along the two axes. 3) The angular velocity sensor of claim 1 or 2, wherein the displacement detecting mechanism is located between two adjacent driving mass portions, disposed at a position symmetrical with respect to the central portion, and by the above The detection mass unit is configured by four detection electrodes that are disposed opposite to each other. 4. The angular velocity sensor of claim 1 or 2, wherein the detecting mass portion is provided with a cover plate that covers the detecting mass portion with a gap between the four driving mass portions, and the displacement detecting mechanism It is disposed at a position symmetrical with respect to the center portion and is configured by four detecting electrodes provided to face the cover plate. 5. The angular velocity sensor of claim 1 or 2, wherein said detecting mass portion is configured such that all or a portion thereof has a thickness dimension that is thinner than said driving mass portion, said driving beam 'coupling beam, and thickness of said detecting beam. 6. The angular velocity sensor of claim 1 or 2, wherein a monitoring mechanism for monitoring a shift in a vibration direction of said driving mass portion is provided. 7. The angular velocity sensor of claim 1 or 2, wherein said detecting beam is formed using a torsion support beam which is subjected to torsional deformation when said detecting mass portion is displaced in a thickness direction of said substrate. 8. The angular velocity sensor of claim 7, wherein the detecting beam is configured to be connected to the detecting mass portion and the substrate by using a stress reducing connecting portion, wherein the stress reducing connecting portion is reduced in torsional deformation The stress on the end side of the test beam 137127.doc
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