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TWI349109B - - Google Patents

Info

Publication number
TWI349109B
TWI349109B TW096139626A TW96139626A TWI349109B TW I349109 B TWI349109 B TW I349109B TW 096139626 A TW096139626 A TW 096139626A TW 96139626 A TW96139626 A TW 96139626A TW I349109 B TWI349109 B TW I349109B
Authority
TW
Taiwan
Application number
TW096139626A
Other languages
Chinese (zh)
Other versions
TW200823471A (en
Inventor
Ito Akihiko
Masuo Yoshiyuki
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of TW200823471A publication Critical patent/TW200823471A/zh
Application granted granted Critical
Publication of TWI349109B publication Critical patent/TWI349109B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
TW096139626A 2006-11-22 2007-10-23 Electronic component test equipment and method for conveying tray TW200823471A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2006/323337 WO2008062522A1 (fr) 2006-11-22 2006-11-22 Équipement de test de composant électronique et procédé de transport de plateau

Publications (2)

Publication Number Publication Date
TW200823471A TW200823471A (en) 2008-06-01
TWI349109B true TWI349109B (ja) 2011-09-21

Family

ID=39429464

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096139626A TW200823471A (en) 2006-11-22 2007-10-23 Electronic component test equipment and method for conveying tray

Country Status (2)

Country Link
TW (1) TW200823471A (ja)
WO (1) WO2008062522A1 (ja)

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1183943A (ja) * 1997-09-05 1999-03-26 Nec Corp 半導体デバイス挿抜機
DE10297763B4 (de) * 2002-07-30 2010-08-19 Advantest Corporation Prüfgerät für elektronische Bauelemente
JP4462488B2 (ja) * 2004-06-16 2010-05-12 上野精機株式会社 電子部品測定装置及び電子部品測定方法

Also Published As

Publication number Publication date
WO2008062522A1 (fr) 2008-05-29
TW200823471A (en) 2008-06-01

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