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TWI291731B - Chip carrier and chip package structure thereof - Google Patents

Chip carrier and chip package structure thereof Download PDF

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Publication number
TWI291731B
TWI291731B TW095103721A TW95103721A TWI291731B TW I291731 B TWI291731 B TW I291731B TW 095103721 A TW095103721 A TW 095103721A TW 95103721 A TW95103721 A TW 95103721A TW I291731 B TWI291731 B TW I291731B
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TW
Taiwan
Prior art keywords
dispensing
rectangular
flexible substrate
wafer
disposed
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Application number
TW095103721A
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Chinese (zh)
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TW200731453A (en
Inventor
Tzung-Li Hung
Tsung-Lung Chen
Ping-Mao Yang
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Chipmos Technologies Inc
Chipmos Technologies Bermuda
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Application filed by Chipmos Technologies Inc, Chipmos Technologies Bermuda filed Critical Chipmos Technologies Inc
Priority to TW095103721A priority Critical patent/TWI291731B/en
Publication of TW200731453A publication Critical patent/TW200731453A/en
Application granted granted Critical
Publication of TWI291731B publication Critical patent/TWI291731B/en

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    • H10W90/724

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  • Wire Bonding (AREA)

Abstract

A chip carrier including a flexible substrate, a wiring layer and a set of dispensing alignment marks is provided. The flexible substrate has a rectangular dispensing region having a pair of long sides and a pair of short sides. The wiring layer having multiple inner leads located inside the rectangular dispensing region and suitable for electrically connected with the chip. The set of dispensing alignment marks is located at the opposite sides of the rectangular dispensing region on the flexible substrate. The dispensing alignment marks are arranged along a reference line parallel to and between the pair of the long sides. After the chip electrically connecting with the chip carrier, the set of the dispensing alignment marks is used for the identification of the relative positions of the flexible substrate and the chip.

Description

1291731 18749twf.doc/y 九、發明說明: 【發明所屬之技術領域】 本叙明疋有關於一種晶片承載器(c^ip carrier)以及採 用此日日片承載。口的日日片封裝體(chip package structure),且 特別是有關於一種可撓曲的晶片承載器(flexible chip carrier)以及採用此晶片承載器的晶片封裝體。 【先前技術】 在目前的封裝技術中,晶片主要是經由打線接合(wire bonding)技術、覆晶接合(flip chip)技術或是捲帶自動接合 (tape automated bonding,TAB)技術,來與晶片承載器電性 連接。在這些接合技術中,由於捲帶自動接合技術具有: 月b在可撓性基材上直接進行電性的測試、能夠利用可撓性 基材來完成電子元件的立體組裝以及能夠製作出薄型且小 型的晶片封裝體等等優點,因此經由捲帶自動接合技術所 製作的晶片封裝體已被廣泛地應用於個人電腦、液晶電 視、助聽器以及記憶卡等等電子產品中。 _ 圖1A至圖1C是習知之經由捲帶自動接合技術來製作 晶片封裝體的流程示意圖。請參照圖1A,首先提供一可撓 性基材110,而可撓性基材110的材料為聚乙醯胺 (polyimide)。接著,在可撓性基材11(3的一表面η]上貼 附一層銅箔,並且經由微影/钱刻製程將此銅箔圖案化以形 成一線路層12〇,其中線路層120具有多條内引腳(inner lead) 122 〇 接著提供一晶片130以及多個凸塊140,而這些凸塊 6 1291731 18749twf.doc/y 140是配置於晶片13〇的主動表面132上。接著,以這些 内引腳122中的一根或數根引腳作為晶片13〇與可撓性基 材110之間的對位標記,並且經由影像辨識系統來將每二 個凸塊140配置於與之對應的内引腳122上。 請參照圖1B,將晶片130放置於一承載平台2〇〇上。 之,,經由丁熱壓機的熱壓頭21〇對可撓性基材ιι〇施加 熱量以及壓力,以將這些凸塊14〇壓合於内引腳上, 並且完成内引腳122與晶片130之間的電性連接。 請參照圖1 c,經由點膠機(dispensing t〇〇1)將封 配置於可撓性基材110上並且將晶片13〇輯(帅^ 於'内,以形成一晶片封裝體10〇,其中封裝膠體150是 用來避免外界環境的水氣滲透到晶片13〇,進而 片130的電性特性。 ~曰h曰 •ΤΓί的是,在f知技術將以13Gf性連接於内 告於122會被晶片13Q所覆蓋’所以, 虽於可撓性基材110上塗佈封裝膠體15G時 法再以内⑽m作為觸w13G與 ;^ 間相對位置的對位標記m 之前’習知技術就缺乏適當的對位標記來辨識^3〇盈 可撓性基材110之間的相對位置。 /、 除此之外’由於熱_ 210對可撓性基材 的熱量以及壓力會造成可触基材11Q的二^^= 1B與圖1C所示),是以扃—搂从达 2性,夂形(如圖 虚可於性婦1心心在讀触況下要辨識晶片130 14了红11基材m之間触對 7 1291731 18749twf.doc/y —知技術缺乏適當的對位標記,並且 ;①土 0在熱壓後產生了塑性變形,是以在形 成封裝膠體150的過程中,疋以在形 ^ ^ , Β ΰ ΛΑ4中點胗機就容易碰撞到晶片130 而造成晶片13 0的損壞。a & + 靠度_a_y)較低如此一來,晶片封裳體_的可 【發明内容】 本發明的目的就是在提供一種晶片承載器,以避免晶 片被點膠機碰傷的問題。 本發明的再一目的是提供一種晶片封裝體,其中封裝 膠體具有良好的可靠度。 本發明提出一種晶片承載器,適於承載-晶片,並盘 ^電性連接。此晶片承载器包括—可撓性基材、一線路 ,以=組_對位標記。可撓性基材具有—矩形點膜 ΐ ’其中此矩形點膠區具有—對長邊以及-對短邊。線路 :配置於可撓性基材上,其中線路層具有多個位於矩形點 膠區内之㈣腳,且這些㈣腳適於與晶#電性連接。點 膠對位標記配置於可撓性基材上,且分佈於矩形點膠區的 兩側。點膠對位標記沿著—參考線排列,#考線與 長邊平行,且位於這對長邊之間。1291731 18749twf.doc/y IX. Description of the invention: [Technical field to which the invention pertains] This description relates to a wafer carrier (c^ip carrier) and the use of this day wafer carrier. A chip package structure, and in particular, a flexible chip carrier and a chip package using the wafer carrier. [Prior Art] In the current packaging technology, the wafer is mainly supported by a wire bonding technique, a flip chip technology or a tape automated bonding (TAB) technology. Electrical connection. In these joining techniques, the automatic tape joining technology has a monthly test of electrical properties on a flexible substrate, a three-dimensional assembly of electronic components by a flexible substrate, and a thin and capable production. The advantages of small chip packages and the like, and thus chip packages manufactured by tape automated bonding technology have been widely used in electronic products such as personal computers, liquid crystal televisions, hearing aids, and memory cards. 1A through 1C are schematic flow diagrams of conventional fabrication of a chip package via tape automated bonding techniques. Referring to Figure 1A, a flexible substrate 110 is first provided, and the material of the flexible substrate 110 is polyimide. Next, a copper foil is attached on a surface η of the flexible substrate 11 (3), and the copper foil is patterned by a lithography process to form a wiring layer 12, wherein the wiring layer 120 has A plurality of inner leads 122 are then provided with a wafer 130 and a plurality of bumps 140, and the bumps 6 1291731 18749 twf.doc/y 140 are disposed on the active surface 132 of the wafer 13A. Next, One or several of the inner leads 122 serve as alignment marks between the wafer 13 and the flexible substrate 110, and each of the two bumps 140 is disposed corresponding thereto via an image recognition system. Referring to FIG. 1B, the wafer 130 is placed on a carrying platform 2〇〇, and heat is applied to the flexible substrate ιι via the thermal head 21 of the hot press. Pressure is applied to the bumps 14 to the inner leads, and the electrical connection between the inner leads 122 and the wafer 130 is completed. Referring to FIG. 1c, via a dispensing machine (dispensing t〇〇1) Configuring the package on the flexible substrate 110 and arranging the wafer 13 to form a chip package 1 0〇, wherein the encapsulant 150 is used to prevent the moisture of the external environment from penetrating into the wafer 13 and thus the electrical characteristics of the sheet 130. ~曰h曰•ΤΓί, the technology will be connected within 13Gf It is reported that 122 will be covered by the wafer 13Q. Therefore, when the encapsulant 15G is applied to the flexible substrate 110, the internal (10) m is used as the alignment mark m before the relative position of the w13G. There is a lack of proper alignment marks to identify the relative position between the flexible substrates 110. /, otherwise, 'the heat and pressure on the flexible substrate can be touched by the heat _ 210 The substrate 11Q of the two ^ ^ = 1B and Figure 1C), is the 扃 搂 达 达 达 达 达 达 达 ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( 要 要 要 要 要 要 要 要 要 要Contact between substrates m 7 1291731 18749twf.doc / y - the lack of proper alignment marks in the known technology, and; 1 soil 0 produced plastic deformation after hot pressing, in the process of forming the encapsulant 150, It is easy to collide with the wafer 130 at the point of the ^^, Β ΰ ΛΑ4 to cause damage to the wafer 130. a & + The degree of _a_y) is lower, and the object of the present invention is to provide a wafer carrier to avoid the problem that the wafer is bumped by the dispenser. The object is to provide a chip package in which the package colloid has good reliability. The present invention provides a wafer carrier suitable for carrying a wafer and electrically connecting the wafer carrier. The wafer carrier comprises a flexible substrate, A line is marked with = group _ alignment. The flexible substrate has a rectangular dot film ΐ ' where the rectangular dispensing zone has - long sides and - short sides. Line: disposed on a flexible substrate, wherein the circuit layer has a plurality of (four) legs located in the rectangular dispensing area, and the (four) feet are adapted to be electrically connected to the crystal. The dispensing alignment marks are disposed on the flexible substrate and are distributed on both sides of the rectangular dispensing area. The dispensing alignment marks are arranged along the reference line, and the # test line is parallel to the long side and is located between the pair of long sides.

依照本發明-實施例所述之晶片承載器,可挽性基 具有多個傳動孔’位於可撓性基材的兩側,且這些傳 的排列方向與這些短邊平行。 L 依照本發明-實施例所述之晶片承載器,參考線 一長邊的距離相等。 ^ 8 1291731 18749twf.doc/y 擗广:只施例所述之晶片承載器,這組點膠對 二己G括―第K立標記以及―第二對位標記。第-對 =^己配置於矩形點膠區的—側,並且第二對位標記配置 膠區的另-侧。此外,第—對位標記與矩形點膠 區=邊的最短距離更可以與第二對位標記與矩形 之短邊的最短距離相等。 依照本發明-實施例所述之晶片承載器,線路層且有 夕條由矩形點縣内延伸至矩形點膠區外之跡線以及多個 位於矩祕縣外之外引腳。這些㈣腳是經由這些跡線 而連接至這些外引腳。此外,矩形點膠區、這些内引腳、 这些跡線以及這些外引腳是於該切割區域内,這些傳動孔 是位於切割區外,而這組點膠對位標記可以位於;割區之 内或是切割區之外。 依照本發明一實施例所述之晶片承載器,更包括多個 外引腳接合對位標記。這些外引腳接合對位標記是配置於 可撓性基材上。 、 依照本發明一實施例所述之晶片承載器,更包括一焊 ^層,其配置於可撓性基材上,以覆蓋住部分的線路層^ 這組點膠對位標記不被該焊罩層所覆蓋。 依照本發明一實施例所述之晶片承載器,這組點膠對 位標記不被焊罩層所覆蓋。 ^ 本發明提出一種晶片封裝體,其包括一可撓性基材、 一線路層、一晶片以及一組點膠對位標記。可撓性基材具 有一矩形點膠區,其中矩形點膠區具有一對長邊以^一對 1291731 18749twf.doc/y 短邊。線路層配置於可撓性基材上,其中線路層具有多個 位於矩形點膠區内之内引腳。晶片,配置於線路層上,並 對應於矩形點膠區,且與這些㈣腳電性連接。這紅_ 對位標記配置於可撓性⑽上,且分佈於矩顧膠區的^ 側。這組點膠對位標記沿著一參考線排列,而參考線鱼 長邊平行,且位於對長邊之間。 ^ 依照本發明一實施例所述之晶片封裝體,參考線與任 一長邊的距離相等。 〃 依照本發明-實施例所述之晶片承載器,組點膠對位 標記包括一第一對位標記以及一第二對位標記。第一對位 標記配置於矩形點膠區的一侧。第二對位標記配置於矩形 點膠區的另一侧。此外,第一對位標記與矩形點膠區之短 邊的最短距離更可以與第二對位標記與矩形點膠區之短邊 的最短距離相等。 依照本發明一實施例所述之晶片承載器,線路層還包 括多條由矩形點膠區内延伸至矩形點膠區外之跡線以及多 個位於矩形點膠區外之外引腳,這些内引腳經由這些跡線 而連接至這些外引腳。 依照本發明一實施例所述之晶片承載器,更包括多個 外引腳接合對位標記,配置於該可撓性基材上。 依照本發明一實施例所述之晶片承載器,更包括一焊 罩層,配置於該可撓性基材上,以覆蓋住部分該線路層。 依照本發明一實施例所述之晶片承載器,這組點膠對 位標記不被該焊罩層所覆蓋。 1291731 18749twf.doc/y 依照本發明一實施例所述之晶片承載器,更包括一封 裝膠體,配置於可撓性基材上,並且將晶片包覆於其; 此外,封裝膠體更可以具有一開口’暴露出晶片之相對於 主動表面之一背面。 、 由於本發明的這組點膠對位標記是位於參考線上,並 由於這組點膠對位標記是位於矩形點膠區的相對兩侧,^ 此當本發明經由熱壓機將晶片壓合於線路層之内引腳後, _ 這組點膠對位標記不會被晶片所遮蔽,並且不容易因為可 撓性基材的變形而導致其對位功能的降低。如此一來,本 發明可以經由這組點膠對位標記確定晶片與可撓性基材之 間的相對位置。是以,當本發明經由點膠機將封裝膠體形 成於可撓性基材上之預定位置時,點膠機不會碰撞到晶 片’並且封裝膠體與晶片之間不容易產生缝隙。 “為讓本發明之上述和其他目的、特徵和優點能更明顯 易廑,下文特舉較佳實施例,並配合所附圖式,作詳細說 明如下。 u / 口 1 【實施方式】 077圖2是本發明一實施例之晶片承載器的示意圖。請參 照圖2,晶片承载器3〇〇主要包括一可撓性基材31〇、一線 路層320以及一組點膠對位標記33〇。在本實施例中,形 ,可撓性基材310白勺材料可以為聚乙醯胺、玻璃環氧樹 ^ 又项丁歸—酸醯亞胺-三氮雜苯(bismaleimide-taiazine, 知0樹脂&、聚酯軟片或是其他具可撓性的材料。由圖2可 ϋ,可撓性基材310具有一矩形點膠區312,其中矩形點 1291731 18749twf.doc/y 膠區312具有一對長邊312a以及一對短邊31处。此外, 可撓性基材310更可以具有多個傳動孔314,而這些傳動 孔314是位於可撓性基材31〇的兩側,並且這些傳動孔 的排列方向與這些短邊312b平行。According to the wafer carrier of the present invention, the handleable substrate has a plurality of transmission holes 'on both sides of the flexible substrate, and the directions of the transmissions are parallel to the short sides. L According to the wafer carrier of the invention, the distance between the long sides of the reference line is equal. ^ 8 1291731 18749twf.doc/y 擗广: Only the wafer carrier described in the example, this set of dispensing pairs includes the "K" mark and the "Second" mark. The first-pair = ^ is disposed on the side of the rectangular dispensing zone, and the second alignment mark is disposed on the other side of the rubber zone. Further, the shortest distance between the first-alignment mark and the rectangular dispensing area = edge may be equal to the shortest distance between the second alignment mark and the short side of the rectangle. In accordance with the wafer carrier of the present invention, the circuit layer has a trace extending from the rectangular dot to the outside of the rectangular dispensing zone and a plurality of pins outside the rectangular county. These (four) feet are connected to these external pins via these traces. In addition, rectangular dispensing zones, the inner leads, the traces, and the outer leads are in the cutting area, the drive holes are located outside the cutting zone, and the set of dispensing alignment marks can be located; Inside or outside the cutting area. A wafer carrier according to an embodiment of the invention further includes a plurality of outer leads to be bonded to the alignment mark. These outer pin-bonded registration marks are placed on a flexible substrate. The wafer carrier according to an embodiment of the invention further includes a solder layer disposed on the flexible substrate to cover a portion of the wiring layer. The set of dispensing alignment marks is not soldered. Covered by a cover layer. In accordance with an embodiment of the wafer carrier of the present invention, the set of dispensing alignment marks are not covered by the solder mask layer. The present invention provides a chip package comprising a flexible substrate, a wiring layer, a wafer, and a set of dispensing alignment marks. The flexible substrate has a rectangular dispensing zone wherein the rectangular dispensing zone has a pair of long sides to a pair of 1291731 18749 twf.doc/y short sides. The wiring layer is disposed on the flexible substrate, wherein the wiring layer has a plurality of inner pins located in the rectangular dispensing region. The wafer is disposed on the circuit layer and corresponds to the rectangular dispensing area and is electrically connected to the (four) feet. The red _ alignment mark is disposed on the flexible (10) and distributed on the side of the rectangular rubber zone. The set of dispensing alignment marks are arranged along a reference line, and the reference line fish have parallel sides and are located between the long sides. According to the chip package of the embodiment of the invention, the reference line is equidistant from any of the long sides. In accordance with the wafer carrier of the present invention embodiment, the set of dispensing alignment marks includes a first alignment mark and a second alignment mark. The first alignment mark is disposed on one side of the rectangular dispensing area. The second alignment mark is disposed on the other side of the rectangular dispensing area. Further, the shortest distance between the first alignment mark and the short side of the rectangular dispensing area may be equal to the shortest distance between the second alignment mark and the short side of the rectangular dispensing area. According to the wafer carrier of the embodiment of the present invention, the circuit layer further includes a plurality of traces extending from the rectangular dispensing region to the outside of the rectangular dispensing region and a plurality of pins outside the rectangular dispensing region. Internal pins are connected to these external pins via these traces. A wafer carrier according to an embodiment of the invention further includes a plurality of outer lead-bonding alignment marks disposed on the flexible substrate. The wafer carrier according to an embodiment of the invention further includes a solder mask layer disposed on the flexible substrate to cover a portion of the circuit layer. In accordance with an embodiment of the wafer carrier of the present invention, the set of dispensing alignment marks are not covered by the solder mask layer. The wafer carrier according to an embodiment of the invention further includes an encapsulant disposed on the flexible substrate and coated with the wafer; further, the encapsulant may further have a The opening 'exposures the back side of the wafer relative to one of the active surfaces. Since the set of dispensing alignment marks of the present invention are located on the reference line, and since the set of dispensing alignment marks are located on opposite sides of the rectangular dispensing area, the present invention presses the wafer via a hot press. After the pins in the circuit layer, the set of dispensing alignment marks are not obscured by the wafer, and the alignment function is not easily reduced due to deformation of the flexible substrate. As such, the present invention can determine the relative position of the wafer to the flexible substrate via the set of dispensing alignment marks. Therefore, when the present invention forms the encapsulant on a predetermined position on the flexible substrate via the dispenser, the dispenser does not collide with the wafer' and no gap is easily formed between the encapsulant and the wafer. The above and other objects, features, and advantages of the present invention will become more apparent from the aspects of the invention. 2 is a schematic view of a wafer carrier according to an embodiment of the present invention. Referring to FIG. 2, the wafer carrier 3A mainly includes a flexible substrate 31A, a wiring layer 320, and a set of dispensing alignment marks 33A. In this embodiment, the material of the flexible substrate 310 may be polyacetamide, glass epoxy tree, and bismuth-sodium bisulphate-bisazabenzene (bismaleimide-taiazine). 0 resin & polyester film or other flexible material. As shown in Fig. 2, the flexible substrate 310 has a rectangular dispensing area 312, wherein the rectangular point 1291731 18749twf.doc/y glue area 312 There is a pair of long sides 312a and a pair of short sides 31. In addition, the flexible substrate 310 may further have a plurality of transmission holes 314, and the transmission holes 314 are located on both sides of the flexible substrate 31〇, and These transmission holes are arranged in parallel with these short sides 312b.

線路層320的形成例如是先將銅箱直接壓合於可挽性 基材310上,或是經由黏著層來將銅箔貼附於可撓性基材 310上,之後圖案化此銅箱以形成並且線路層32〇。線路層 320主要包括多個内引腳322、多條跡線324以及多個外弓曰 腳326。廷些内引腳322是位於矩形點膠區312内。這此 外引腳326是位於矩形點膠區312外。這些跡線324是$ 矩形點膠區312向外延伸,而這些跡線324的一端是2、言 些内引腳322電性連接,且這些跡線324的另一端3盥= 些外引腳326電性連接。此外,本實施例更可以經=電= 的方式在内引腳322與外引腳326上形成一層錫層、全^ 或是焊錫層,以增加後續的封裝製程中凸塊或焊球(未^ 示)與引腳322、326之間電性連接的效果。 '曰The circuit layer 320 is formed by, for example, directly pressing the copper box onto the flexible substrate 310, or attaching the copper foil to the flexible substrate 310 via an adhesive layer, and then patterning the copper box to The circuit layer 32 is formed and formed. The circuit layer 320 primarily includes a plurality of inner leads 322, a plurality of traces 324, and a plurality of outer bow legs 326. The inner pins 322 are located within the rectangular dispensing zone 312. The outer lead 326 is located outside of the rectangular dispensing zone 312. These traces 324 are outwardly extending from the rectangular dispensing region 312, and one end of the traces 324 is 2, the inner pins 322 are electrically connected, and the other ends of the traces 324 are 3 盥 = some external pins 326 electrical connection. In addition, in this embodiment, a tin layer, a full solder layer or a solder layer may be formed on the inner lead 322 and the outer lead 326 by way of == to increase bumps or solder balls in the subsequent packaging process (not ^ shows the effect of electrical connection with pins 322, 326. '曰

廷組點膠對位標記330配置於可撓性基材31〇上,苴 中這組點膠對位標記330是沿著一條參考線Ref排列,並 且配置於矩形點膠區312的兩側。參考線尺#是_條 的假想線,其與這對長邊312a平行並且位於這對長邊31% 之間。較佳的,參考線Ref更可以如本實施例所示,鱼 任一條長邊312a的距離皆相等。 ” 另外,在本實施例中這對點膠對位標記33〇包括一 對位標記332以及-第二對位標記334,其中第一對位 12 1291731 】8749twf.doc/y ,記332與第二對位標記334的外型為十字形。第一對位 標記332配置於矩形點膠區312的一側,並且第二對位標 記334配置於矩形點膠區312的另一側。值得注意的是, 士實施例麟用㈣定本發明,在本發_其他實施例中 „對位標記33〇可具有多個第—對位標332以及 夕個第二對位標記334,且這些對位標記的外型 更可以為圓形、方形、L行或是其他種形狀的對位標記。The set of dispensing alignment marks 330 are disposed on the flexible substrate 31, and the set of dispensing marks 330 are arranged along a reference line Ref and disposed on both sides of the rectangular dispensing area 312. The reference ruler # is an imaginary line of _ bars that is parallel to the pair of long sides 312a and is located between the pair of long sides 31%. Preferably, the reference line Ref can be as shown in this embodiment, and the distance between any long side 312a of the fish is equal. In addition, in the embodiment, the pair of dispensing alignment marks 33A include a pair of position marks 332 and a second alignment mark 334, wherein the first pair of bits 12 1291731] 8749twf.doc/y, 332 and The shape of the second alignment mark 334 is a cross. The first alignment mark 332 is disposed on one side of the rectangular dispensing area 312, and the second alignment mark 334 is disposed on the other side of the rectangular dispensing area 312. In the present invention, in other embodiments, the align mark 33 〇 may have a plurality of first-to-position 332 and a second second align mark 334, and these alignments The shape of the mark can be a circular mark, a square shape, an L line or an alignment mark of other shapes.

承上述,第一對位標記332與這對短邊312b的最短 η第二對位標記334與這對短邊3i2b的最短距離相 二換口之苐對位標圮M2和最靠近第二對位標記322 短邊312b的距離是等於第二對位標記334和最靠近第一 位標記322短邊312b的距離。當然,在本發明的其他實施 例中,更可以視實際上的需要,使得第一對位標記3D與 這對短邊312b的最短距離不等於第二對位標記334對 知:邊312b的最短距離。 /、。、 冉者In the above, the first alignment mark 332 and the shortest η second alignment mark 334 of the pair of short sides 312b and the shortest distance of the pair of short sides 3i2b are replaced by the alignment mark M2 and the closest second pair. The distance of the bit mark 322 short side 312b is equal to the distance between the second bit mark 334 and the short side 312b closest to the first bit mark 322. Of course, in other embodiments of the present invention, the shortest distance between the first alignment mark 3D and the pair of short sides 312b is not equal to the second alignment mark 334: the shortest side 312b distance. /,. Leader

— 枣貝靶例逛可以在可撓性基材310上規劃_切 割區域34G,以使得本實施例可以在後續的封|製程中= 依據切割區域340的輪廓來對晶片承載器3〇〇進行裁切, 其中矩形點膠區312、這些内引腳322、這些跡線324、、二 些外引腳326以及這組點膠對位標記33〇是位於 = 340内,這些傳動孔314是位於切割區域34〇外。三 本實施例並非用以限定本發明,在本發明的其他=於’ 中,這組點膠對位標記330也可以視設計上的需二也例 於切割區域340外。 配置 13 1291731 18749twf.doc/y 此外’晶片承載器300更可以包括一焊罩層(s〇lder mask)350,其中焊罩層350是配置於可撓性基材310上, 以覆蓋住部分的線路層320。值得注意的是,這組點膠對 位標記330並不被焊罩層35〇所覆蓋。 另外’晶片承載器300還可以具有多個外引腳接合對 位標記360,其中這些外引腳接合對位標記360是配置於 可撓性基材310上。 本實施例除了提出上述的晶片承載器300外,更可以 將一晶片電性連接於晶片承載器3〇〇上以形成一晶片封裝 體。圖3是本發明一實施例之晶片封裝體的示意圖。請參 妝圖3,首先提供一晶片400。然後以一根或是數根内引腳 322 (圖2)作為可撓性基材31〇與晶片400之間的對位標 6己’將晶片400配置於可撓性基材310之矩形點膠區312 上’其中晶片400之主動表面是面向矩形點膠區312,並 且主動表面的輪廓與矩形點膠區312的輪廓相同。之後經 由一熱壓程序對可撓性基材31〇施加熱量與壓力,使得晶 • 片400電性連接於這些内引腳322 (圖2),以形成一晶片 封I體500,其中晶片4〇〇例如是經由多個凸塊電性連接來電性 連接於這些内引腳322。 之後利用這組點膠對位標記33〇來辨識晶片4〇〇與可 撓性基材310之間的相對位置。然後經由點膠機(未繪示) 將封裊膠體410配置於可撓性基材31〇上並且配置於晶片 4〇〇的周緣,以將晶片4〇〇密封於其内。如此一來,晶片 400就可以叉到封裝膠體4ι〇的保護,而免於外界環境之 14 1291731 18749twf.doc/y 諸如水氣或其他外在因素的傷害。更佳的是,在本實施例 中封裝膠體410具有-開口 412,其中開口 412暴露出晶 片400之相對主動表面之背面4〇2。如此一來,晶片4〇〇 =運作,所產生的熱量就可以直接經由背面4〇2與外界環 土兄的熱父換而快速地排除至外界環境。 值知注意的是,當晶片4〇〇經由熱壓程序而與内引腳- The jujube target can be laid out on the flexible substrate 310 - the cutting region 34G, so that the embodiment can perform the wafer carrier 3 in accordance with the contour of the cutting region 340 in the subsequent sealing process Cutting, wherein the rectangular dispensing area 312, the inner pins 322, the traces 324, the two outer pins 326, and the set of dispensing alignment marks 33 are located in the =340, the transmission holes 314 are located The cutting area 34 is outside. The present embodiment is not intended to limit the present invention. In the other aspects of the present invention, the set of dispensing alignment marks 330 may also be considered as outside the cutting area 340 depending on the design requirements. Configuration 13 1291731 18749twf.doc/y Further, the wafer carrier 300 may further include a solder mask 350, wherein the solder mask layer 350 is disposed on the flexible substrate 310 to cover a portion Circuit layer 320. It is worth noting that the set of dispensing alignment marks 330 are not covered by the solder mask layer 35. In addition, the wafer carrier 300 can also have a plurality of outer lead-bonded alignment marks 360, wherein the outer-pin bonded alignment marks 360 are disposed on the flexible substrate 310. In this embodiment, in addition to the wafer carrier 300 described above, a wafer can be electrically connected to the wafer carrier 3 to form a chip package. 3 is a schematic view of a chip package in accordance with an embodiment of the present invention. Referring to Figure 3, a wafer 400 is first provided. Then, one or a plurality of inner leads 322 (FIG. 2) are used as the alignment mark between the flexible substrate 31 and the wafer 400. The wafer 400 is disposed on the rectangular point of the flexible substrate 310. On the glue zone 312, the active surface of the wafer 400 faces the rectangular dispensing zone 312, and the contour of the active surface is the same as the outline of the rectangular dispensing zone 312. Then, heat and pressure are applied to the flexible substrate 31 via a hot pressing process, so that the wafer 400 is electrically connected to the inner leads 322 (FIG. 2) to form a wafer package body 500, wherein the wafer 4 For example, the inner leads 322 are electrically connected to each other via a plurality of bumps. The set of dispensing alignment marks 33〇 is then utilized to identify the relative position between the wafer 4〇〇 and the flexible substrate 310. The sealing gel 410 is then placed on the flexible substrate 31A via a dispenser (not shown) and disposed on the periphery of the wafer 4 to seal the wafer 4 therein. In this way, the wafer 400 can be forked to the protection of the encapsulant 4 〇 without the external environment 14 1291731 18749 twf.doc / y such as moisture or other external factors. More preferably, in the present embodiment, the encapsulant 410 has an opening 412 in which the opening 412 exposes the back side 4〇2 of the opposite active surface of the wafer 400. In this way, the wafer 4 〇〇 = operation, the heat generated can be quickly removed to the outside environment directly through the back 4 〇 2 and the hot father of the outside world. The value is noted when the wafer 4 is connected to the inner pin via a hot press program.

322電性連接之後,外引腳接合對位標記36〇會在方向X 與方向Y上與晶片4〇〇產生相對位移,但是這組點膠對位 標記330卻只會在方向χ上與晶片4〇〇產生較少的相對位 移。是以,相較於可撓性機材31〇上其他的對位標記(如 外引腳接合對位標記36〇),這組點膠對位標記在辨 識晶片400與可撓性基材31〇的相對位置上具有較佳的於 準度。 月 綜上所述,由於本發明具有一組配置於參考線上 膠對位標記,因此當晶片經由熱壓程序而電性連接於内^ 腳之後,本發明能夠經由這組點膠對位標記來準確地 瞻 片與撓性基材的相對位置。是以,相較於習知技= 口本卷月可以經由點谬機來準確地將封襞聲體配置於 撓性基材上之預定位置上而不會撞傷晶片。如此 ' L本發:ΐ出之晶片承載器所製作的片封裝體便能夠I 有較间的良率以及具有較佳的可靠度。 -、 雖然本發明已以較佳實施例揭露如上,铁盆 限定本發明’任何熟習此技藝者,在不脫離:發 和範圍内,當可作些許之更動與潤飾,因此本發; 15 1291731 18749twf.doc/y 範圍當視後附之申請專利範圍所界定者為準。 【圖式簡單說明】 圖1A至圖1C是習知之經由捲帶自動接合技術來製作 晶片封裝體的流程示意圖。 圖2是本發明一實施例之晶片承載器的示意圖。 圖3是本發明一實施例之晶片封裝體的示意圖。 【主要元件符號說明】 100 :晶片封裝體 110 :可撓性基材 112 :表面 120 :線路層 122 :内引腳 130 :晶片 132 :主動表面 140 :凸塊 150 :封裝膠體 200 :承載平台 210 :熱壓頭 300 :晶片承載器 310 :可撓性基材 312 :矩形點膠區 312a :長邊 16 1291731 18749twf.doc/y 312b :短邊 314 :傳動孔 320 :線路層 322 :内引腳 324 :跡線 326 :外引腳 330 :點膠對位標記 332 :第一對位標記 _ 334 :第二對位標記 340 :切割區域 350 :焊罩層 360 :外引腳接合對位標記 400 :晶片 402 :背面 410 :封裝膠體 412 ··開口 φ 500 :晶片封裝體After the 322 is electrically connected, the outer pin is bonded to the alignment mark 36, and the relative displacement of the wafer 4 is in the direction X and the direction Y, but the set of the alignment mark 330 is only in the direction of the wafer. 4〇〇 produces less relative displacement. Therefore, the set of dispensing alignment marks on the identification wafer 400 and the flexible substrate 31 compared to other alignment marks on the flexible machine 31 (such as the outer lead-bonded alignment mark 36A). The relative position of the relative position is better. In summary, since the present invention has a set of glue alignment marks disposed on the reference line, the present invention can be used to mark the alignment marks after the wafer is electrically connected to the inner leg via a hot pressing process. Accurately view the relative position of the flexible substrate. Therefore, it is possible to accurately arrange the sealing body on a predetermined position on the flexible substrate via the spotting machine without hitting the wafer compared to the conventional technique. So 'L's hair: The chip package made by the chip carrier can produce better yield and better reliability. - Although the present invention has been disclosed in the preferred embodiments as above, the iron basin defines the present invention. Anyone skilled in the art can make some changes and refinements without departing from the scope of the invention, and therefore the present invention; 15 1291731 The scope of 18749 twf.doc/y is subject to the definition of the scope of the patent application. BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1A to FIG. 1C are schematic diagrams showing a conventional process for fabricating a chip package via a tape automated bonding technique. 2 is a schematic view of a wafer carrier in accordance with an embodiment of the present invention. 3 is a schematic view of a chip package in accordance with an embodiment of the present invention. [Main Component Symbol Description] 100 : Chip Package 110 : Flexible Substrate 112 : Surface 120 : Circuit Layer 122 : Inner Lead 130 : Wafer 132 : Active Surface 140 : Bump 150 : Package Colloid 200 : Bearing Platform 210 : Thermal head 300: Wafer carrier 310: Flexible substrate 312: Rectangular dispensing area 312a: Long side 16 1291731 18749twf.doc/y 312b: Short side 314: Transmission hole 320: Line layer 322: Inner pin 324: Trace 326: Outer Pin 330: Dispensing Alignment Mark 332: First Alignment Marker _334: Second Alignment Marker 340: Cutting Area 350: Solder Mask Layer 360: Outer Pin Bonding Alignment Mark 400 : Wafer 402 : Back surface 410 : Package colloid 412 · · Opening φ 500 : Chip package

Ref :參考線 X :方向 Y :方向 17Ref : Reference line X : Direction Y : Direction 17

Claims (1)

1291731 18749twf.doc/y 十、申請專利範圍: 1· 一種晶片承載器,適於承載一晶片,並與該晶片電 性連接’該晶片承載器包括: 一可撓性基材,具有一矩形點膠區,其中該矩形點膠 區具有一對長邊以及一對短邊; 一線路層,配置於該可撓性基材上,其中該線路層具 有多個位於該矩形點膠區内之内引腳,且該些内引腳適於 與該晶片電性連接;以及 一組點膠對位標記,配置於該可撓性基材上,且分佈 於該矩形點膠區兩側,其中該組點膠對位標記沿著一參考 線排列,而該參考線與該對長邊平行,且位於該對長邊之 間。 2·如申請專利範圍第1項所述之晶片承載器,其中該 可撓性基材具有多個傳動孔,位於該可撓性基材的兩側, 且該些傳動孔的排列方向與該些短邊平行。 3·如申請專利範圍第1項所述之晶片承載器,其中該 參考線與任一長邊的距離相等。 4·如申請專利範圍第1項所述之晶片承載器,其中該 組點膠對位標記包括·· 一第一對位標記,配置於該矩形點膠區的一侧;以及 一第二對位標記,配置於該矩形點膠區的另一侧。 ^ 5·如申請專利範圍第4項所述之晶片承載器,其中該 第一對位標記與該矩形點膠區之短邊的最短距離與該第二 對位標記與該矩形點膠區之短邊的最短距離相等。 18 1291731 18749twf.doc/y 6.如申請專利範圍第!項所述之晶片承_, 線路層具有多條由該矩形點勝區内延伸至該矩形點膠區外/ 之跡線以及㈣位於該矩形轉區外之外㈣,該些 腳經由該些跡線而連接至該些外引腳。 Μ二 入如申請專利範圍第6項所述之晶片承载器,其中該 可撓性基材具有-切割區域,其中該矩形點膠區、該些内 引腳、該些跡線以及該些外引腳位於該切割區域内,:竽 組點膠對位標記以及該些傳動孔位於肋龍外。" 8.如申請專利範圍第6項所述之晶片承載器,其令該 可撓性基材具有-切割區域’其中該組點膠對位標記、該 矩形點膠區、該些内引腳、該些跡線以及該些外引腳位Ζ 該切割區域内,而該些傳動孔位於該切割區外。 9. 如申請專利範圍第!項所述之晶片承載器,更包括 多個外引腳接合對位標記,配置於該可撓性基材上。 10. 如申請專利範圍第i項所述之晶片承載器,更包 括-焊罩層’配置於該可撓性基材上,以覆蓋住部分該 路層。 11. 如申請專利範圍第10項所述之晶片承載器,其中 該組點膠對位標記不被該焊罩層所覆蓋。 12· —種晶片封裝體,包括: -可撓性基材,具有_矩形點膠區,#中該矩形點膠 區具有一對長邊以及一對短邊; -線路層,配置於該可撓性基材上,其中該線路層具 有多個位於該矩形點膠區内之内引腳; 19 1291731 18749twf.doc/y 一晶片,配置於該線路層上,並對應於該矩形點膠 區’且與該些内引腳電性連接;以及 ’ ^ 一組點膠對位標記,配置於該可撓性基材上,且分佈 於该矩形點膠區兩側,其中該組點膠對位標記沿著一來考 線排列,而該參考線與該對長邊平行,且位於該對長邊之 間。 ▲ 13·如申請專利範圍第12項所述之晶片封裝體,其中 該參考線與任一長邊的距離相等。 /、 14·如申請專利範圍第13項所述之晶片封裝體,其中 該組點膠對彳立標記包括: 一第一對位標記,配置於該矩形點膠區的一侧;以及 一第二對位標記,配置於矩形點膠區的另一侧。 15·如申請專利範圍第14項所述之晶片封裝體,其中 該第一對位標記與該矩形點膠區之短邊的最短距離與該第 二對位標記與該矩形點膠區之短邊的最短距離相等。 16·如申請專利範圍第12項所述之晶片封裝體,其中 丨镇路層還包括多條由該矩形點膠區峡伸至該矩形點膠 區外之跡線以及多個位於該矩形點膠區外之外引腳,該些 内引腳經由該些跡線而連接至該些外引腳。 17·如申請專利範圍第12項所述之晶片封裝體,更包 括多個外引腳接合對位標記,配置於該可撓性基材上。 18·如申請專利範圍第12項所述之晶片封裝體,更包 括一焊罩層,配置於該可撓性基材上,以覆蓋住部分該線 路層。 20 1291731 18749twf.doc/y 19. 如申請專利範圍第18項所述之晶片封裝體,其中 該組點膠對位標記不被該焊罩層所覆蓋。 20. 如申請專利範圍第12項所述之晶片封裝體,更包 括一封裝膠體,配置於該可撓性基材上,並且將該晶片包 覆於其内。 21. 如申請專利範圍第20項所述之晶片封裝體,該封 裝膠體具有一開口,暴露出該晶片之相對於主動表面之一 背面。1291731 18749twf.doc/y X. Patent Application Range: 1. A wafer carrier adapted to carry a wafer and electrically connected to the wafer. The wafer carrier comprises: a flexible substrate having a rectangular dot a rubber zone, wherein the rectangular dispensing zone has a pair of long sides and a pair of short sides; a circuit layer disposed on the flexible substrate, wherein the circuit layer has a plurality of located within the rectangular dispensing zone a pin, wherein the inner pins are adapted to be electrically connected to the chip; and a set of dispensing alignment marks disposed on the flexible substrate and distributed on both sides of the rectangular dispensing area, wherein the The set of dispensing alignment marks are arranged along a reference line that is parallel to the pair of long sides and between the pair of long sides. The wafer carrier of claim 1, wherein the flexible substrate has a plurality of transmission holes on both sides of the flexible substrate, and the arrangement direction of the transmission holes is These short sides are parallel. 3. The wafer carrier of claim 1, wherein the reference line is equidistant from any of the long sides. 4. The wafer carrier of claim 1, wherein the set of dispensing alignment marks comprises: a first alignment mark disposed on one side of the rectangular dispensing area; and a second pair A bit mark is disposed on the other side of the rectangular dispensing area. The wafer carrier of claim 4, wherein the first alignment mark has a shortest distance from a short side of the rectangular dispensing area and the second alignment mark and the rectangular dispensing area The shortest distance of the short side is equal. 18 1291731 18749twf.doc/y 6. If you apply for a patent scope! The circuit board has a plurality of traces extending from the rectangular dot win area to outside the rectangular dispensing area and (4) outside the rectangular turn area (four), the feet passing through the Traces are connected to the outer pins. The wafer carrier of claim 6, wherein the flexible substrate has a -cutting region, wherein the rectangular dispensing region, the inner leads, the traces, and the outer portions The pins are located in the cutting area: the set of dispensing alignment marks and the drive holes are located outside the ribs. 8. The wafer carrier of claim 6, wherein the flexible substrate has a -cutting region, wherein the set of dispensing alignment marks, the rectangular dispensing region, the inner leads The legs, the traces, and the outer pins are located within the cutting area, and the drive holes are located outside the cutting area. 9. If you apply for a patent scope! The wafer carrier of the present invention further includes a plurality of outer lead-bonding alignment marks disposed on the flexible substrate. 10. The wafer carrier of claim i, further comprising a solder mask layer disposed on the flexible substrate to cover a portion of the via layer. 11. The wafer carrier of claim 10, wherein the set of dispensing alignment marks are not covered by the solder mask layer. 12) a chip package comprising: - a flexible substrate having a rectangular dispensing area, wherein the rectangular dispensing region has a pair of long sides and a pair of short sides; - a wiring layer disposed on the a flexible substrate, wherein the circuit layer has a plurality of inner pins located in the rectangular dispensing region; 19 1291731 18749 twf.doc/y a wafer disposed on the circuit layer and corresponding to the rectangular dispensing region And electrically connected to the inner leads; and '^ a set of dispensing alignment marks disposed on the flexible substrate and distributed on both sides of the rectangular dispensing area, wherein the set of dispensing pairs The bit marks are arranged along a line of reference which is parallel to the pair of long sides and is located between the pair of long sides. The chip package of claim 12, wherein the reference line is equidistant from any of the long sides. The chip package of claim 13, wherein the set of dispensing pairs includes: a first alignment mark disposed on one side of the rectangular dispensing area; and a first The two-position mark is disposed on the other side of the rectangular dispensing area. The chip package of claim 14, wherein the first alignment mark has a shortest distance from a short side of the rectangular dispensing area and the second alignment mark is shorter than the rectangular dispensing area. The shortest distance of the sides is equal. The chip package of claim 12, wherein the town layer further comprises a plurality of traces extending from the rectangular dispensing zone to the outside of the rectangular dispensing zone and a plurality of locations at the rectangular point Pins outside the glue zone, the inner pins being connected to the outer pins via the traces. The chip package of claim 12, further comprising a plurality of outer lead-bonding alignment marks disposed on the flexible substrate. The chip package of claim 12, further comprising a solder mask layer disposed on the flexible substrate to cover a portion of the circuit layer. The chip package of claim 18, wherein the set of dispensing alignment marks are not covered by the solder mask layer. 20. The chip package of claim 12, further comprising an encapsulant disposed on the flexible substrate and encasing the wafer therein. 21. The chip package of claim 20, wherein the encapsulant has an opening exposing a back side of the wafer relative to one of the active surfaces. 21twenty one
TW095103721A 2006-02-03 2006-02-03 Chip carrier and chip package structure thereof TWI291731B (en)

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