Classifications

• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
  • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
  • G01R1/02—General constructional details
  • G01R1/06—Measuring leads; Measuring probes
  • G01R1/067—Measuring probes
  • G01R1/073—Multiple probes
  • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
  • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
  • G01R1/07378—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers
• • H—ELECTRICITY
  • H01—ELECTRIC ELEMENTS
  • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
  • H01R33/00—Coupling devices specially adapted for supporting apparatus and having one part acting as a holder providing support and electrical connection via a counterpart which is structurally associated with the apparatus, e.g. lamp holders; Separate parts thereof
  • H01R33/74—Devices having four or more poles, e.g. holders for compact fluorescent lamps
  • H01R33/76—Holders with sockets, clips, or analogous contacts adapted for axially-sliding engagement with parallely-arranged pins, blades, or analogous contacts on counterpart, e.g. electronic tube socket
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
  • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
  • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
  • G01R31/317—Testing of digital circuits
  • G01R31/3181—Functional testing
  • G01R31/319—Tester hardware, i.e. output processing circuits
  • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
  • G01R31/31905—Interface with the device under test [DUT], e.g. arrangements between the test head and the DUT, mechanical aspects, fixture

Landscapes

• Engineering & Computer Science (AREA)
• Power Engineering (AREA)
• Physics & Mathematics (AREA)
• General Physics & Mathematics (AREA)
• Tests Of Electronic Circuits (AREA)
• Details Of Connecting Devices For Male And Female Coupling (AREA)

Applications Claiming Priority (1)

Publications (2)

Family

ID=33508594

Family Applications (1)

Country Status (6)

Families Citing this family (11)

Family Cites Families (5)

• 2004
  • 2004-06-01 CN CNB2004800000970A patent/CN100427955C/zh not_active Expired - Fee Related
  • 2004-06-01 DE DE112004000029T patent/DE112004000029T5/de not_active Withdrawn
  • 2004-06-01 WO PCT/JP2004/007526 patent/WO2004109308A1/ja not_active Ceased
  • 2004-06-01 JP JP2005504506A patent/JP4002935B2/ja not_active Expired - Lifetime
  • 2004-06-01 KR KR1020047017238A patent/KR100609518B1/ko not_active Expired - Lifetime
  • 2004-06-04 TW TW093116076A patent/TWI261674B/zh not_active IP Right Cessation

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