TW202006340A - Method for estimating tool wear by using color of chips estimating the tool wear generated when the chips are produced - Google Patents
Method for estimating tool wear by using color of chips estimating the tool wear generated when the chips are produced Download PDFInfo
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Abstract
Description
本發明與切削加工之技術領域有關,尤指一種估測刀具磨耗之方法。The present invention relates to the technical field of cutting processing, in particular to a method for estimating tool wear.
使用切削加工機對工件進行切削加工時,會依據工件的材料性質或產品的需求設定對應的主軸轉速、刀刃進給率或切削溫度等加工條件,藉以完成切削作業。據此,習知刀具磨耗的估測方法常透過測量工件產品表面的粗糙度、切削溫度、電流及震動等方式進行,其中,測量表面粗糙度必須使用表面粗糙度量測儀,測量切削溫度、電流與震動必須在加工機上設置溫度感測器、電流感測器與加速規,而測量刀具磨耗程度必須透過工業用顯微鏡才能精準量測。When using a cutting machine to cut a workpiece, the corresponding spindle spindle speed, blade feed rate, or cutting temperature and other processing conditions are set according to the material properties of the workpiece or the needs of the product to complete the cutting operation. According to this, the conventional method of estimating tool wear is often carried out by measuring the surface roughness, cutting temperature, current and vibration of the workpiece product. Among them, measuring the surface roughness must use a surface roughness measuring instrument to measure the cutting temperature, Current and vibration must be equipped with a temperature sensor, current sensor and acceleration gauge on the processing machine, and the degree of tool wear must be measured through an industrial microscope to accurately measure.
上述習知的估測方法中,測量表面粗糙度時,由於待測工件或產品可能具有較大的體積而不便攜帶或搬運,以致不容易實施測量。再者,習知的方法中,至少必須使用表面粗糙度量測儀、溫度感測器及工業用顯微鏡等三種設備才能收集到較完善的數據,因而具有成本較高之缺點。若是再加入測量電流及震動的電流感測器與加速規,不但需要設法裝置於切削加工機上,更會使花費成本大幅增加。In the above-mentioned conventional estimation method, when measuring the surface roughness, since the workpiece or product to be measured may have a large volume, it is not easy to carry or carry, so it is not easy to perform the measurement. Furthermore, in the conventional method, at least three devices, such as a surface roughness measuring instrument, a temperature sensor, and an industrial microscope, must be used to collect more complete data, which has the disadvantage of higher cost. If a current sensor and an acceleration gauge for measuring current and vibration are added, it not only needs to be installed on the cutting machine, but also greatly increases the cost.
有鑑於此,如何改進上述問題即為本發明所欲解決之首要課題。In view of this, how to improve the above problems is the primary problem to be solved by the present invention.
本發明基於使用切削加工機對工件進行切削加工時會產生切屑,由於切屑係高速轉動之刀具與工件接觸所產生,而會受到摩擦的高熱影響使其表面氧化變色,因此提供一種應用切屑顏色估測刀具磨耗之方法,其收集大量切屑顏色及刀具磨耗的資料並建立成資料庫,俾供藉由觀察切屑之顏色即可估測刀具磨耗情形。The present invention is based on the fact that chips are generated when the workpiece is cut using a cutting machine. Since the chips are generated by the high-speed rotating tool contacting the workpiece, the surface will be oxidized and discolored due to the high heat of friction. Therefore, an application chip color estimation is provided. A method of measuring tool wear, which collects a large amount of chip color and tool wear data and establishes a database, so that the tool wear can be estimated by observing the color of the chip.
本發明之主要目的在於簡化估測加工條件的技術,進而可以用較少的設備及較低的成本實施。The main purpose of the present invention is to simplify the technique for estimating the processing conditions, which can be implemented with less equipment and lower cost.
為達前述之目的,本發明提供一種應用切屑顏色估測刀具磨耗之方法,其包括有: 取經切削加工後的切屑; 使用影像擷取裝置拍攝切屑,並解析其顏色之RGB值; 將切屑顏色之RGB值轉換為CIExyY色度值; 使用該影像擷取裝置解析切削刀具之磨耗值; 將上述切屑之CIExyY色度值及切削刀具之磨耗值建立為資料庫。To achieve the foregoing purpose, the present invention provides a method for estimating tool wear using chip color, which includes: takes the chip after cutting; uses an image capture device to take the chip and analyze the RGB value of its color; changes the chip color Convert the RGB values to CIExyY chromaticity values; Use the image capture device to analyze the cutting tool wear value; Build the above-mentioned chip CIExyY color value and cutting tool wear value as a database.
上述該影像擷取裝置為一工業用顯微鏡。The above image capturing device is an industrial microscope.
於一實施例中,使用影像擷取裝置每次取多片切屑進行拍攝,並求取其顏色之RGB值。In one embodiment, an image capture device is used to take multiple pieces of chips for shooting at a time, and the RGB value of the color is obtained.
於一實施例中,切屑顏色之RGB值先經校正後再轉換為CIExyY色度值。In one embodiment, the RGB value of the chip color is corrected and then converted into a CIExyY chromaticity value.
而本發明之上述目的與優點,不難從下述所選用實施例之詳細說明與附圖中獲得深入了解。However, it is not difficult to obtain an in-depth understanding from the following detailed descriptions and drawings of the selected embodiments.
請參閱第1圖,所示者為本發明提供之應用切屑顏色估測刀具磨耗之方法,其包括有: 取經切削加工後的切屑; 使用影像擷取裝置每次取多片切屑進行拍攝,並解析其顏色之RGB值; 校正上述切屑顏色之RGB值,再轉換為CIExyY色度值; 使用該影像擷取裝置解析切削刀具之磨耗值; 將上述切屑之CIExyY色度值及切削刀具之磨耗值建立為資料庫。Please refer to FIG. 1, which shows a method for estimating tool wear using chip color provided by the present invention, which includes: taking chips after cutting; using an image capturing device to take multiple pieces of chips at a time for shooting, and Analyze the RGB value of its color; Correct the RGB value of the above chip color, and then convert it to CIExyY chromaticity value; Use the image capture device to analyze the cutting tool wear value; The above chip's CIExyY chromaticity value and cutting tool wear value Create as a database.
本發明於實際運作上,該影像擷取裝置為一工業用顯微鏡。藉由工業用顯微鏡擷取切屑的影像,並使用解析軟體解析切屑表面顏色的RGB值,該值經由校正後,再轉換為CIExyY色度值。上述色彩的校正方法是先以工業攝影機拍攝標準色塊,得出標準色塊的RGB拍攝值,將其與標準色塊所標示的正確值進行比對,即可得出專屬於此攝影機的色彩校正矩陣,則以此矩陣對攝得的切屑色彩進行校正。此外,切削加工作業完成後,藉由工業用顯微鏡觀察切削後之刀具,並解析其磨耗程度。In actual operation of the invention, the image capturing device is an industrial microscope. The image of the chip is captured by an industrial microscope, and the RGB value of the chip surface color is analyzed using analysis software. After correction, the value is converted into a CIExyY chromaticity value. The above color correction method is to take a standard color patch with an industrial camera, get the RGB shooting value of the standard color patch, and compare it with the correct value marked by the standard color patch to get the color exclusive to this camera The correction matrix is used to correct the color of the chip. In addition, after the cutting operation is completed, observe the cutting tool with an industrial microscope and analyze the degree of wear.
在一次切削加工作業中,會有一組具對應關係的切屑顏色色度值及刀具磨耗值的關聯數據,並以這些數據建立為資料庫。當該資料庫中收集了大量數據後,將可利用這些數據解析切屑顏色色度值與刀具磨耗值之間的關係。據此,往後將可觀察切屑的顏色,並藉由該資料庫估測該切屑產生時的加工條件,例如刀具的磨耗程度。In a cutting operation, there will be a set of related data of the corresponding chip color and chromaticity value and tool wear value, and these data are used as a database. When a large amount of data is collected in the database, the data can be used to analyze the relationship between chip color and chromaticity values and tool wear values. According to this, the color of the chips can be observed in the future, and the processing conditions at the time when the chips are generated can be estimated by the database, such as the degree of wear of the tool.
本發明相較於習知的估測方法,其優點在於檢測的對象係體積小又方便攜帶、搬運之切屑,實施上非常簡易、便利。此外,本發明在數據的收集上,針對切屑顏色色度值與刀具磨耗值等項目僅需使用工業用顯微鏡,因而具有成本較低且便於實施之功效。Compared with the conventional estimation method, the present invention has the advantage that the object to be detected is a small chip which is easy to carry and carry, and is very simple and convenient to implement. In addition, in terms of data collection, the present invention only needs to use an industrial microscope for items such as chip color, chromaticity value and tool wear value, and thus has the effect of lower cost and easy implementation.
惟,以上實施例之揭示僅用以說明本發明,並非用以限制本發明,故舉凡等效元件之置換仍應隸屬本發明之範疇。However, the disclosures of the above embodiments are only used to illustrate the present invention, not to limit the present invention. Therefore, the replacement of equivalent elements should still belong to the scope of the present invention.
綜上所述,可使熟知本項技藝者明瞭本發明確可達成前述目的,實已符合專利法之規定,爰依法提出申請。In summary, those who are familiar with this skill can understand that the present invention can indeed achieve the aforementioned objectives, and in fact have complied with the provisions of the Patent Law, and file an application in accordance with the law.
無no
第1圖為本發明之流程示意圖。Figure 1 is a schematic diagram of the process of the present invention.
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