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TW201931964A - A structure of a Printing Circuit Board and a carrier and methods of manufacturing semiconductor package - Google Patents

A structure of a Printing Circuit Board and a carrier and methods of manufacturing semiconductor package Download PDF

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Publication number
TW201931964A
TW201931964A TW107137405A TW107137405A TW201931964A TW 201931964 A TW201931964 A TW 201931964A TW 107137405 A TW107137405 A TW 107137405A TW 107137405 A TW107137405 A TW 107137405A TW 201931964 A TW201931964 A TW 201931964A
Authority
TW
Taiwan
Prior art keywords
circuit
layer
insulator
carrier board
circuit board
Prior art date
Application number
TW107137405A
Other languages
Chinese (zh)
Inventor
王忠寶
Original Assignee
王忠寶
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 王忠寶 filed Critical 王忠寶
Priority to CN201822118335.XU priority Critical patent/CN210137482U/en
Priority to CN201811541707.8A priority patent/CN109982502A/en
Priority to US16/224,781 priority patent/US20190189467A1/en
Publication of TW201931964A publication Critical patent/TW201931964A/en

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Classifications

    • H10W74/00
    • H10W74/142
    • H10W90/724
    • H10W90/754

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  • Combinations Of Printed Boards (AREA)
  • Production Of Multi-Layered Print Wiring Board (AREA)

Abstract

本發明揭示一電路板結合一載板而組成的結構及封裝體的製造方法,其中,電路板至少具有有線路及防焊層,載板至少具有一組件,防焊層可具有與線路相對應設置的預留開孔(或貫穿狀開孔),該預留開孔將在封裝體的製作過程中移除,使線路可供對外電連通用,防焊層的一表面與線路一表面接合,另一表面與載板一表面接合;在封裝體的製作過程中,當電路板與塑料結合後,並需以蝕刻液將載板移除時,藉防焊層完全包覆線路一表面的特徵,可避免線路被蝕刻液攻擊而造成損壞,當防焊層的預留開孔被轉換成貫穿狀開孔後,能夠使線路表面的邊緣區域至少有一部分仍被防焊層包覆,據此,可使線路與絕緣體更穩固的結合在一起,據此,線路的厚度得以實施更薄,進而可降低電路板及封裝體的厚度,而電路板可依需求再具有絕緣體及/或第二線路。 The invention discloses a structure composed of a circuit board combined with a carrier board and a method for manufacturing a package, wherein the circuit board has at least a circuit and a solder resist layer, and the carrier board has at least one component, and the solder resist layer may have a correspondence with the circuit. A set of reserved openings (or through-holes), which will be removed during the manufacturing process of the package, so that the circuit can be used for external electrical communication, and one surface of the solder resist layer is bonded to one surface of the circuit , The other surface is bonded to one surface of the carrier board; in the manufacturing process of the package, when the circuit board is combined with plastic, and the carrier board needs to be removed with an etching solution, the solder mask layer is used to completely cover the surface of the circuit. Feature, which can avoid the damage caused by the attack of the etching solution. When the reserved openings of the solder mask layer are converted into through-holes, at least a part of the edge area of the circuit surface can still be covered by the solder mask layer. Therefore, the circuit and the insulator can be more firmly combined, and accordingly, the thickness of the circuit can be implemented thinner, which can reduce the thickness of the circuit board and the package, and the circuit board can further have an insulator and / or a second as required. line.

Description

一種電路板及封裝體製造方法 Circuit board and package manufacturing method

一種電路板及封裝體製造方法,尤其是指供半導體晶片及/或封裝體用的電路板,與封裝體製造方法。 The invention relates to a circuit board and a package manufacturing method, in particular to a circuit board for a semiconductor wafer and / or a package, and a package manufacturing method.

如圖14-1~圖14-4所示,是習用封裝體1A的製造方法,說明如後:如圖14-1所示的習用封裝體1A製造方法剖面圖,首先,提供習用的電路板5A及可分拆的(detach)載板(carrier)8K,其中,電路板5A包括絕緣體4H及可供電性傳輸的線路35,絕緣體4H具有上表面41、下表面42及通孔(via)44,線路35具有上表面31、下表面32及側邊33,線路35設位於絕緣體4H下表面42,且下表面32及側邊33與絕緣體4H接合,其中,下表面32裸露於通孔44的部分實施為接點(terminal)324,用以供對外電連通用,上表面31裸露於絕緣體4H下表面42,絕緣體4H厚度T是由上表面41與線路35下表面32間的厚度T4,以及線路35的厚度T3組成,線路35厚度T3是介於15~30微米(μm)間;該載板8K是由銅箔基板(copper clad laminate)8A、固化膠(prepreg)8B及可分拆銅箔8C組成,該銅箔基板8A是由二銅箔8A1及黏著膠8A2組成,此黏著膠8A2是由固化膠或其他適用的黏著膠組成,其中,黏著膠8A2是將該二銅箔8A1接合在一起,並令此黏著膠8A2介於二銅箔8A1之間,而該可分拆銅箔8C可由二銅箔及一薄膜層(未繪示)組成,薄膜層將二銅箔接合在一起,並令薄膜層是介於二銅箔之間,其中,令該與薄膜層接合的一銅箔實施為接合層8C1,並令該另一與薄膜層接合的銅箔實施為分拆層8C2,且該分拆層8C2藉由固化膠8B與銅箔基板8A結合在一起,此接合層8C1及分拆層8C2可由銅層(copper layer)及/或其他適用的金屬層組成,載板8K設位在電路板5A絕緣體4H下表面42,並藉接合層8C1與電路板5A的絕緣體4H下表面42結合在一起,使線路35上表面31不裸露於大氣中,接著,提供晶片(chip)20及實施為導線的導電件18,其中,先將晶片20設位在絕緣體4H上表面41,再藉導電件18分別與晶片20端點24及線路35接點324接合,使晶片20與電路板5A電 連通,接著,提供塑料60,塑料60包覆晶片20、導電件18及電路板5A表面,據此,封裝體1A就已組成;接著,如圖14-2所示的習用封裝體1A製造方法剖面圖,提供一分拆的工序(process),將載板8K的接合層8C1及分拆層8C2分離,使分拆層8C2、固化膠8B及銅箔基板8A同時被移除,其中,此移除工序是以蝕刻液實施;接著,如圖14-3是底視圖,提供一蝕刻(etching)的移除工序,將可分拆銅箔的接合層8C1移除,令線路35上表面31裸露於絕緣體4H下表面42;接著,如圖14-4所示的習用封裝體1A製造方法剖面圖,依需求提供一錫球S,錫球S與線路35上表面31接合,使晶片20得以藉錫球S對外電連通;由上述說明得知,電路板5A至少有下列的缺點,說明如下:1)如圖14-4所示,線路35厚度T3通常是大於15微米,在線路35與錫球S接合後,當錫球S受外力F的拉扯時,易造成線路35下表面32與絕緣體4H接合處產生分層(delamination)或間隙G,使線路35與導電件18間電性傳輸不穩定,甚至無法電連通而造成封裝體1A的損壞,其中,雖可增加線路35厚度T3到22微米或更厚,藉提升側邊33與絕緣體4H的接合面積及強度,用以避免封裝體1A產生間隙G,但是,厚的線路35除了令絕緣體4H厚度T無法有效降低,還會增加生產成本,使電路板5A無法滿足電子產品要更薄的需求;2)如圖14-2所示,在分拆層8C1被蝕刻液移除的過程中,同時也會將線路35的一部分移除,使線路35厚度T3轉換成更薄的厚度T3K,據此,使線路35側邊33減少與絕緣體4H的接合面積,從而,降低線路35與絕緣體4H的接合強度,使線路35與錫球S接合後,更易因錫球S受外力F的拉扯而造成電路板5A的損壞。 As shown in Figures 14-1 to 14-4, the manufacturing method of the conventional package 1A is described later. The sectional view of the manufacturing method of the conventional package 1A shown in Figure 14-1 is shown below. First, a conventional circuit board is provided. 5A and detachable carrier 8K, wherein the circuit board 5A includes an insulator 4H and a power-supply transmission line 35, and the insulator 4H has an upper surface 41, a lower surface 42 and a via 44 The circuit 35 has an upper surface 31, a lower surface 32, and a side 33. The circuit 35 is provided on the lower surface 42 of the insulator 4H, and the lower surface 32 and the side 33 are joined to the insulator 4H. The lower surface 32 is exposed in the through hole 44. The part is implemented as a terminal 324 for external electrical communication. The upper surface 31 is exposed on the lower surface 42 of the insulator 4H. The thickness T of the insulator 4H is the thickness T4 between the upper surface 41 and the lower surface 32 of the circuit 35. The thickness T3 of the circuit 35 is composed of 15 ~ 30 micrometers (μm); the carrier board 8K is made of copper clad laminate 8A, prepreg 8B and detachable copper The copper foil substrate 8A is composed of two copper foils 8A1 and an adhesive 8A2. The adhesive 8A2 is made of a cured adhesive or His suitable adhesive composition consists of the adhesive 8A2 which joins the two copper foils 8A1 together, and makes the adhesive 8A2 be between the two copper foils 8A1, and the detachable copper foil 8C can be made of two copper foils. And a thin film layer (not shown), the thin film layer joins two copper foils together, and the thin film layer is interposed between the two copper foils, wherein the copper foil joined with the thin film layer is implemented as a bonding layer 8C1, and the other copper foil bonded to the film layer is implemented as a separation layer 8C2, and the separation layer 8C2 is combined with the copper foil substrate 8A by a curing glue 8B, and the bonding layer 8C1 and the separation layer 8C2 It may consist of a copper layer and / or other applicable metal layers. The carrier board 8K is located on the lower surface 42 of the circuit board 5A insulator 4H, and is bonded to the lower surface 42 of the circuit board 5A insulator 4H by the bonding layer 8C1. So that the upper surface 31 of the circuit 35 is not exposed to the atmosphere. Then, a chip 20 and a conductive member 18 implemented as a wire are provided. Among them, the chip 20 is first set on the upper surface 41 of the insulator 4H, and then the conductive member 18 is borrowed. Bonded to the terminal 24 of the chip 20 and the contact 324 of the circuit 35, respectively, so that the chip 20 and the circuit board 5A are electrically connected. Connect, then, provide the plastic 60, which covers the surface of the wafer 20, the conductive member 18, and the circuit board 5A. Based on this, the package 1A has been formed; then, the conventional package 1A manufacturing method shown in FIG. 14-2 The cross-sectional view provides a disassembly process to separate the bonding layer 8C1 and the disassembly layer 8C2 of the carrier board 8K, so that the disassembly layer 8C2, the curing glue 8B, and the copper foil substrate 8A are removed at the same time. The removal process is performed with an etching solution. Next, as shown in FIG. 14-3 is a bottom view, an etching removal process is provided to remove the bonding layer 8C1 of the detachable copper foil, so that the upper surface 31 of the circuit 35 Bare on the lower surface 42 of the insulator 4H; then, as shown in the cross-sectional view of the manufacturing method of the conventional package 1A shown in FIG. 14-4, a solder ball S is provided as required, and the solder ball S is bonded to the upper surface 31 of the circuit 35, so that the chip 20 can be The solder ball S is used for external electrical communication. According to the above description, the circuit board 5A has at least the following disadvantages, which are explained as follows: 1) As shown in Figure 14-4, the thickness T3 of the circuit 35 is usually greater than 15 microns. After the solder ball S is bonded, when the solder ball S is pulled by the external force F, the lower surface 32 of the circuit 35 and the insulator 4H are likely to be caused. Delamination or gap G is generated at the joint, which makes the electrical transmission between the circuit 35 and the conductive member 18 unstable, and even the electrical connection cannot be caused, which damages the package 1A. Although the thickness of the circuit 35 can be increased from T3 to 22 microns Or thicker, by increasing the joint area and strength of the side 33 and the insulator 4H to avoid the gap G of the package 1A, but the thick line 35 can not effectively reduce the thickness T of the insulator 4H, but also increase the production cost. The circuit board 5A cannot meet the demand for thinner electronic products; 2) As shown in Figure 14-2, during the removal of the spin-off layer 8C1 by the etching solution, a part of the circuit 35 is also removed, so that The thickness T3 of the line 35 is converted to a thinner thickness T3K. According to this, the side area 33 of the line 35 is reduced to the bonding area with the insulator 4H, thereby reducing the bonding strength of the line 35 and the insulator 4H, and the line 35 and the solder ball S are joined. It is easier to damage the circuit board 5A because the solder ball S is pulled by the external force F.

本發明是一種電路板結合一載板而組成的結構及封裝體製造方法,此電路板至少是由線路及防焊層組成,此載板至少是由一組件組成,其中,防焊層具有與線路相對應設置的預留開孔(或貫穿狀開孔),該預留開孔將在封裝體的製作過程中被轉換成開孔,使線路可供對外電連通用,該防焊層下表面與線路上表面接合,上表面與載板一表面接合,藉由防焊層包覆線路一表面的特徵,如此,在封裝體的製作過程中,可避免線路被移除載板的蝕刻液攻擊而造成損壞;同時,載板可用以保護防焊層及改善電路板曲翹問題,且令載板可以不包含習用載板中分拆的銅箔而達到降低成本的功效,其中,更可令本發明電路板達到電子產業對於“薄”的需求及提升電路板品質的目的。 The invention is a structure and a method for manufacturing a package composed of a circuit board combined with a carrier board. The circuit board is composed of at least a circuit and a solder mask. The carrier board is composed of at least one component. The reserved opening (or through-hole) corresponding to the circuit is converted into an opening during the manufacturing process of the package, so that the circuit can be used for external electrical communication. The surface is bonded to the upper surface of the circuit, the upper surface is bonded to the surface of the carrier board, and the features of the surface of the circuit are covered by a solder mask. In this way, the etching solution of the carrier board can be prevented from being removed during the manufacturing process of the package. Damage caused by attacks; at the same time, the carrier board can be used to protect the solder mask and improve the warpage of the circuit board. It can also reduce the cost of the carrier board without the copper foil split from the conventional carrier board. This makes the circuit board of the present invention meet the requirements of the electronics industry for "thin" and improve the quality of the circuit board.

31、3A1、3B1、41‧‧‧上表面 31, 3A1, 3B1, 41‧‧‧ upper surface

6S、71、81、91‧‧‧上表面 6S, 71, 81, 91‧‧‧ upper surface

32、42、72、82、92‧‧‧下表面 32, 42, 72, 82, 92‧‧‧ lower surface

33、43、53、73、83‧‧‧側邊 33, 43, 53, 73, 83‧‧‧ side

18‧‧‧導電件 18‧‧‧ conductive parts

20‧‧‧晶片 20‧‧‧Chip

24、3A‧‧‧端點 24, 3A‧‧‧ endpoint

30、35、70‧‧‧線路 30, 35, 70‧‧‧ lines

324、724‧‧‧接點 324, 724‧‧‧ contact

3A4‧‧‧接合區 3A4‧‧‧Joint Zone

3B‧‧‧延伸部 3B‧‧‧ Extension

40、4H‧‧‧絕緣體 40, 4H‧‧‧ insulator

44‧‧‧通孔 44‧‧‧through hole

50、51、5A‧‧‧電路板 50, 51, 5A‧‧‧Circuit board

60‧‧‧塑料 60‧‧‧plastic

65‧‧‧薄膜 65‧‧‧ film

39、79、99‧‧‧凸部 39, 79, 99‧‧‧ convex

80、88、8K‧‧‧載板 80, 88, 8K‧‧‧ carrier board

85‧‧‧邊牆 85‧‧‧ side wall

86、96‧‧‧開孔 86, 96‧‧‧ opening

87‧‧‧盲孔 87‧‧‧ blind hole

801‧‧‧調整層 801‧‧‧ adjustment layer

8C1‧‧‧接合層 8C1‧‧‧Joint layer

8A‧‧‧銅箔基板 8A‧‧‧ Copper foil substrate

8B‧‧‧固化膠 8B‧‧‧Cure glue

8C‧‧‧可分拆銅箔 8C‧‧‧detachable copper foil

8A1‧‧‧銅箔 8A1‧‧‧copper foil

8A2‧‧‧黏著膠 8A2‧‧‧Adhesive

8C2‧‧‧分拆層 8C2‧‧‧Split layer

90、95‧‧‧防焊層 90, 95‧‧‧ solder mask

90F‧‧‧防焊層的一部分 90F‧‧‧ part of solder mask

9F‧‧‧預留開孔 9F‧‧‧Reserved opening

10、1A‧‧‧封裝體 10.1A‧‧‧package

D‧‧‧深度 D‧‧‧ Depth

F‧‧‧外力 F‧‧‧ external force

G‧‧‧間隙 G‧‧‧ Clearance

KK‧‧‧切割線 KK‧‧‧ Cutting Line

S‧‧‧錫球 S‧‧‧ solder ball

T、T3、T3k、T4、T5、T30‧‧‧厚度 T, T3, T3k, T4, T5, T30‧‧‧thickness

T40、T8C1、T8C2‧‧‧厚度 T40, T8C1, T8C2‧‧‧thickness

L‧‧‧寬度 L‧‧‧Width

圖1-1:沿圖1-2所示切割線KK的電路板及載板的結構剖面圖 Figure 1-1: A structural cross-sectional view of the circuit board and the carrier board along the cutting line KK shown in Figure 1-2

圖1-2:電路板的底視圖 Figure 1-2: Bottom view of the circuit board

圖2~圖8:電路板及載板的結構剖面圖 Figures 2 ~ 8: Structural cross-sections of circuit boards and carrier boards

圖9-1~圖13-3:封裝體的三種不同製造方法剖面圖 Figure 9-1 ~ Figure 13-3: Three different cross-sectional views of the manufacturing method of the package

圖14-1~圖14-2:習用封裝體的製造方法剖面圖 Figure 14-1 ~ Figure 14-2: Cross-sectional views of the manufacturing method of conventional packages

圖14-3:習用封裝體的底視圖 Figure 14-3: Bottom view of a conventional package

圖14-4:習用封裝體的製造方法剖面。 Figure 14-4: A cross-section of the manufacturing method of a conventional package.

如圖1-1~圖1-2所示,是本發明電路板及載板結構的基本結構,其中,圖1-2是電路板51的底視圖,而圖1-1是載板80的剖面圖及電路板51沿圖1-2切割線KK的剖面圖,電路板51厚度T5尤其適用不大於30微米(即T5≦30微米)的需求,如:25、20、10、2微米或其他適用的厚度,電路板51包括有:線路30,供電性傳輸用,其可由銅或鎳等適用的導體製成,其具有上表面31、下表面32、側邊33及厚度T30,厚度T30尤其適用不大於10微米的需求,如:10、5、3、1微米或其他適用的厚度,線路30至少是由一端點3A組成,而本實施例的線路30是由端點3A與相鄰的延伸部3B接合而組成,其中,上表面31是由端點3A上表面3A1及延伸部3B上表面3B1組成,同時,端點3A是供對外電連通用,且上表面3A1的邊緣區域實施為接合區3A4,此線路30的上、下表面31、32可實施為矩形或圓形或不規則的圖形,令線路30可在防焊層90下表面92自由的延伸設置;防焊層90,其是由絕緣物質組成,如防焊膠(solder mask)或樹酯(epoxy)或其他適用的絕緣物質組成,其具有預留開孔9F、上表面91及下表面92,其中,預留開孔9F是由防焊層90的一部分90F組成,並令預留開孔9F與線路30端點3A相對應設置,防焊層90下表面92與線路30上表面31接合,使線路30上表面31被完全包封而不裸露於防焊層90外部,防焊層90的一部分90F在封裝體的製作過程中,會被移除使預留開孔9F轉換成開孔(96_參閱圖9-4),使線路30端點3A得以供對外電連通,其中,由於電路板51僅由線路30及防焊層90堆疊組成,據此,能夠令電路板厚度T5不大於30微米,甚或不大於2微米,從而,令本發明電路板51可符合電子產業對於“薄”的需求;載板80,可由銅或其他適用的金屬製成,或由樹脂或其他適用的非金屬組成,其具有上表面81、下表面82及側邊83,載板80與防焊層90接合,在本圖1-1所示的載板80實施例中,是令該載板80下表面82與防焊層90上表面91接合,使載板80上表面81裸露於大氣中,該載板80可置換成如圖2~圖14-1所示的載板80、88、8K,使載板80可由單一組件或多個組件組成,本圖1-1實施例的載板是由單一組 件組成;藉上述說明可得知,在封裝體10的製作過程中(參閱圖9-2),當需以蝕刻液將載板80移除時,藉防焊層90完全包覆線路30上表面31的特徵,使線路30不受蝕刻液攻擊而損壞,進而可提升電路板51品質,或降低電路板51及封裝體的厚度與成本;另外,由於載板80與防焊層90接合,可避免防焊層90遭到外力撞擊而損壞。 Figures 1-1 to 1-2 show the basic structure of the circuit board and carrier board structure of the present invention. Among them, Figure 1-2 is a bottom view of the circuit board 51, and Figure 1-1 is a carrier board 80. The cross-sectional view and the cross-sectional view of the circuit board 51 along the cutting line KK in FIG. 1-2. The thickness T5 of the circuit board 51 is particularly suitable for the requirement of not more than 30 microns (that is, T5 ≦ 30 microns), such as: 25, 20, 10, 2 microns or For other applicable thicknesses, the circuit board 51 includes: line 30, for power transmission, which can be made of suitable conductors such as copper or nickel, and has an upper surface 31, a lower surface 32, a side 33, and a thickness T30, a thickness T30. It is particularly suitable for requirements not larger than 10 microns, such as: 10, 5, 3, 1 microns or other applicable thicknesses. The line 30 is composed of at least one endpoint 3A, and the line 30 of this embodiment is composed of the endpoint 3A and the adjacent The extension 3B is formed by joining. The upper surface 31 is composed of the upper surface 3A1 of the endpoint 3A and the upper surface 3B1 of the extension 3B. At the same time, the endpoint 3A is used for external electrical communication and the edge area of the upper surface 3A1 is implemented. For the junction area 3A4, the upper and lower surfaces 31, 32 of this line 30 can be implemented as rectangular or circular or irregular patterns, so that the line 30 The solder mask 90 is freely extended on the lower surface 92; the solder mask 90 is composed of an insulating substance, such as a solder mask or epoxy or other applicable insulating substance, and has a The open hole 9F, the upper surface 91 and the lower surface 92 are reserved. Among them, the reserved hole 9F is composed of a part 90F of the solder mask layer 90, and the reserved hole 9F is provided corresponding to the end 3A of the line 30 to prevent soldering. The lower surface 92 of the layer 90 is bonded to the upper surface 31 of the circuit 30, so that the upper surface 31 of the circuit 30 is completely encapsulated without being exposed to the outside of the solder mask layer 90. A part 90F of the solder mask layer 90 will be damaged during the manufacturing process of the package. Removal converts the reserved opening 9F into an opening (96_see FIG. 9-4), so that the terminal 3A of the line 30 can be used for external electrical communication, wherein the circuit board 51 is only stacked by the line 30 and the solder resist layer 90 According to this, the thickness T5 of the circuit board can be less than 30 microns, or even less than 2 microns, so that the circuit board 51 of the present invention can meet the "thin" demand of the electronics industry; the carrier board 80 can be made of copper or other suitable Made of metal, or composed of resin or other suitable non-metal, which has an upper surface 81, lower The surface 82 and the side 83, the carrier plate 80 is joined with the solder resist layer 90. In the embodiment of the carrier plate 80 shown in FIG. 1-1, the lower surface 82 of the carrier plate 80 and the upper surface 91 of the solder resist layer 90 are formed. By bonding, the upper surface 81 of the carrier board 80 is exposed to the atmosphere, and the carrier board 80 can be replaced with the carrier boards 80, 88, 8K as shown in FIG. 2 to FIG. 14-1, so that the carrier board 80 can be composed of a single component or multiple Components, the carrier board of the embodiment of Figure 1-1 is composed of a single group According to the above description, during the manufacturing process of the package 10 (see FIG. 9-2), when the carrier board 80 needs to be removed with an etching solution, the circuit 30 is completely covered by the solder resist 90. The characteristics of the surface 31 make the circuit 30 not damaged by the attack of the etching solution, thereby improving the quality of the circuit board 51 or reducing the thickness and cost of the circuit board 51 and the package body. In addition, since the carrier board 80 is bonded to the solder resist layer 90, It is possible to prevent the solder resist layer 90 from being damaged by an external force.

如圖2所示,是電路板50及載板80的結構剖面圖,電路板50厚度T5及線路30厚度T30與圖1-1所示相同,電路板50及載板80的特徵及符號,與圖1-1的電路板51及載板80有相同處,請參閱圖1-1說明,其不同處是:防焊層90更是包覆線路30側邊33,使線路30增加與防焊層90的接合面積,而可更穩固的與防焊層90結合在一起,以避免線路30自防焊層90產生剝離(peel-off)的損壞。 As shown in FIG. 2, it is a structural cross-sectional view of the circuit board 50 and the carrier board 80. The thickness T5 of the circuit board 50 and the thickness T30 of the circuit 30 are the same as those shown in FIG. 1-1. The characteristics and symbols of the circuit board 50 and the carrier board 80 are as follows. It is the same as the circuit board 51 and the carrier board 80 in FIG. 1-1. Please refer to the description in FIG. 1-1. The difference is that the solder resist layer 90 covers the side 33 of the circuit 30 to increase and prevent the circuit 30. The bonding area of the solder layer 90 can be more firmly combined with the solder resist layer 90 to avoid peel-off damage of the circuit 30 from the solder resist 90.

如圖3所示,是電路板50及載板88的結構剖面圖,電路板50尤其適用於絕緣體40厚度T40不大於30微米的需求(即T40≦30微米),如:25、20、10、2微米或其他的適用厚度,電路板50及載板88的特徵及符號,與圖1-1的電路板51及載板80有相同處,請參閱圖1-1說明,其中,電路板50的不同處是:更具有絕緣體40,其具有上表面41、下表面42、側邊43及通孔44,其由絕緣物質組成,如環氧樹酯或防焊膠或其他適用的絕緣物質組成,其厚度T40是由線路30下表面32與上表面41間的厚度T4及線路30厚度T30組成,絕緣體40與防焊層90下表面92接合,並包覆線路30下表面32及其側邊33,其中,通孔44與線路30下表面32相對應設置,並令線路30下表面32裸露於絕緣體40通孔44的部分實施為接點324,使接點324可供電連通用,此接點324裸露於絕緣體通孔44內;而載板的不同處是:此載板88是由多個組件組成,本實施例載板88是由調整層801及載板80接合組成,並令調整層801裸露在大氣中的表面實施為載板88上表面81,調整層801的材質與載板80不同,其可實施為絕緣物質或固化膠或防焊層或其他適用的材質,電路板50可藉調整層801提升剛性及降低成本,因為,若載板80實施為銅,當載板80厚度大於36微米時,除了材料成本高外,在電路板50的製作過程中,要將工作板(working panel)藉铣刀分割成具有多個電路板50的基板(substrate)時,會造成铣刀加速損壞而增加製作成本,以及,由於銅的熱膨脹係數(CTE)高,具有多個電路板50的基板在生產或使用的過程中,會因該基板曲翹過大造成碰撞擠壓的損壞,據此,藉結合一材料成本低且熱膨脹係數與載板80不同的調整層801,使載板80厚度得以降到3~18微米而可降低成本,以及維持電路板50的剛性及符合量產的曲翹程度,使電路板50具有 更好的使用性,同時,由於載板88可以僅由調整層801及載板80組成,從而,令載板88不需具有如圖14-1載板8K的可分拆銅箔8C及固化膠8B,據此,可降低材料成本以及生產成本,令電路板50更具有實用性;而若電路板50與圖14-1所示載板8K結合,同樣可避免習用電路板5A所造成的缺點,說明如下:1)在封裝體製作過程中,當需藉蝕刻液將載板8K接合層8C1移除時(參閱圖9-1~圖9-3及說明),由於線路30上表面31完全被防焊層90包封,從而,可避免線路30被蝕刻液攻擊而變薄或損壞,據此,線路30厚度T30可比圖14-1習用線路35厚度T3實施為更薄,如:11、7、4、1微米或其他適用的厚度,使電路板50及封裝體可藉該薄的線路30達到使產品更薄的需求,並藉該薄的線路30達到降低材料及生產成本的功效;2)當線路30與錫球S(參閱圖9-4)結合後,因線路30接合區3A4被防焊層90包覆(參閱圖9-4),而使線路30仍可更穩固的與絕緣體40結合,使錫球S受外力F的拉扯時,可避免線路30下表面32與絕緣體40間產生分層的損壞;其中,當本圖3所示載板88被如圖14-1所示的載板8K取代後,則該載板8K的接合層8C1也可以被視為是實施為載板80(參閱圖1-1),據此,令本電路板及載板的結構更可達到好用、實用的功效。 As shown in FIG. 3, it is a structural cross-sectional view of the circuit board 50 and the carrier board 88. The circuit board 50 is particularly suitable for the requirement that the thickness of the insulator 40 is T40 not more than 30 microns (that is, T40 ≦ 30 microns), such as: 25, 20, 10 , 2 micron or other applicable thickness, the characteristics and symbols of the circuit board 50 and the carrier board 88 are the same as the circuit board 51 and the carrier board 80 of FIG. 1-1, please refer to the description of FIG. 1-1, where the circuit board The difference between 50 and 50 is that it further has an insulator 40, which has an upper surface 41, a lower surface 42, a side edge 43, and a through hole 44, which is composed of an insulating substance, such as epoxy resin or solder resist or other applicable insulating substances. The thickness T40 is composed of the thickness T4 between the lower surface 32 and the upper surface 41 of the circuit 30 and the thickness T30 of the circuit 30. The insulator 40 is bonded to the lower surface 92 of the solder resist layer 90 and covers the lower surface 32 of the circuit 30 and its sides. Edge 33, where the through hole 44 is provided corresponding to the lower surface 32 of the line 30, and the portion of the lower surface 32 of the line 30 that is exposed from the through hole 44 of the insulator 40 is implemented as a contact 324, so that the contact 324 can be connected for power supply. The contact 324 is exposed in the insulator through hole 44; the difference between the carrier board is that the carrier board 88 is composed of multiple component groups In this embodiment, the carrier plate 88 is composed of the adjustment layer 801 and the carrier plate 80 joined together, and the surface of the adjustment layer 801 exposed to the atmosphere is implemented as the upper surface 81 of the carrier plate 88. The material of the adjustment layer 801 is different from that of the carrier plate 80. It can be implemented as an insulating substance or curing glue or solder mask or other suitable materials. The circuit board 50 can improve the rigidity and reduce the cost by adjusting the layer 801, because if the carrier board 80 is implemented as copper, when the thickness of the carrier board 80 is greater than At 36 microns, in addition to high material costs, during the manufacturing process of the circuit board 50, when a working panel is divided into substrates with multiple circuit boards 50 by a milling cutter, the milling cutter will be accelerated. Damage increases the production cost, and due to the high coefficient of thermal expansion (CTE) of copper, during the production or use of a substrate with multiple circuit boards 50, the substrate may be damaged by collision and extrusion due to excessive warpage of the substrate. By combining an adjustment layer 801 with a low material cost and a different thermal expansion coefficient from that of the carrier board 80, the thickness of the carrier board 80 can be reduced to 3 to 18 microns, which can reduce costs, and maintain the rigidity of the circuit board 50 and conform to mass production. Degree of warping 50 has Better usability. At the same time, since the carrier plate 88 can only be composed of the adjustment layer 801 and the carrier plate 80, the carrier plate 88 does not need to have the detachable copper foil 8C and curing of the carrier plate 8K as shown in Figure 14-1. Adhesive 8B, according to this, can reduce material costs and production costs, making the circuit board 50 more practical; and if the circuit board 50 is combined with the carrier board 8K shown in Figure 14-1, it can also avoid the conventional circuit board 5A The disadvantages are explained as follows: 1) In the manufacturing process of the package, when the carrier board 8K bonding layer 8C1 needs to be removed by an etching solution (see FIGS. 9-1 to 9-3 and description), the upper surface 31 of the circuit 30 It is completely encapsulated by the solder resist layer 90, so that the line 30 can be prevented from being thinned or damaged by the attack of the etching solution. According to this, the thickness T30 of the line 30 can be thinner than the thickness T3 of the conventional line 35 in FIG. 14-1, such as: 11 , 7, 4, 1 micron or other suitable thickness, so that the circuit board 50 and the package can use the thin circuit 30 to achieve a thinner product, and use the thin circuit 30 to reduce the material and production cost. ; 2) After the wiring 30 is combined with the solder ball S (see FIG. 9-4), the bonding area 3A4 of the wiring 30 is covered by the solder resist layer 90 (see FIG. 9-4) ), So that the circuit 30 can still be more firmly combined with the insulator 40, so that when the solder ball S is pulled by the external force F, the layered damage between the lower surface 32 of the circuit 30 and the insulator 40 can be avoided; After the shown carrier board 88 is replaced by the carrier board 8K shown in FIG. 14-1, the bonding layer 8C1 of the carrier board 8K can also be regarded as being implemented as the carrier board 80 (see FIG. 1-1), and accordingly So that the structure of the circuit board and the carrier board can achieve useful and practical effects.

如圖4所示,是電路板51及載板88的結構剖面圖,電路板51及載板88的特徵及符號與圖3的電路板50及載板88有相同處,請參閱圖3說明,其中,電路板51的不同處是:其更包含有第二線路70,供電性傳輸用,並具有上表面71、下表面72、側邊73及凸部79,凸部79設位於下表面72,且下表面72與絕緣體40上表面41接合,令凸部79容設於絕緣體40通孔44內,並與線路70接點324接合而電連通;而載板88的不同處是:調整層801具有盲孔(blind via)87,盲孔87具有寬度L及深度D,其中,藉由改變深度D即可令盲孔87貫穿或不貫穿該調整層801,本實施例中,盲孔87是貫穿調整層801,令載板80的一部分可裸露於盲孔87內,並令此盲孔87不貫穿載板88,載板88至少可藉改變盲孔87的寬度L及/或深度D,用以改變載板88熱膨脹係數,從而可改良電路板51曲翹的程度,及避免因曲翹過大而造成擠壓的損壞,另外,在絕緣體40上表面41可依需求,再設有防焊層,以保護第二線路70,而且,在第二線路70上表面71也可依需求,設有導電層(未繪示),以利於對外電連接用。 As shown in FIG. 4, it is a structural cross-sectional view of the circuit board 51 and the carrier board 88. The characteristics and symbols of the circuit board 51 and the carrier board 88 are the same as those of the circuit board 50 and the carrier board 88 in FIG. 3. Please refer to FIG. 3 for explanation. Among them, the circuit board 51 is different in that it further includes a second circuit 70 for power transmission, and has an upper surface 71, a lower surface 72, a side 73, and a convex portion 79. The convex portion 79 is located on the lower surface. 72, and the lower surface 72 is joined with the upper surface 41 of the insulator 40, so that the convex portion 79 is accommodated in the through hole 44 of the insulator 40, and is connected to the line 70 contact 324 to be in electrical communication; the difference between the carrier plate 88 is: adjustment The layer 801 has a blind via 87 having a width L and a depth D. The blind hole 87 may or may not pass through the adjustment layer 801 by changing the depth D. In this embodiment, the blind hole 87 is a through adjustment layer 801, so that a part of the carrier plate 80 can be exposed in the blind hole 87, and the blind hole 87 does not penetrate the carrier plate 88. The carrier plate 88 can at least change the width L and / or depth of the blind hole 87 by D, used to change the thermal expansion coefficient of the carrier board 88, thereby improving the degree of warpage of the circuit board 51, and avoiding crush damage due to excessive warpage In addition, a solder resist layer may be provided on the upper surface 41 of the insulator 40 to protect the second circuit 70 as required, and a conductive layer (not shown) may be provided on the upper surface 71 of the second circuit 70 as required. ) To facilitate external electrical connection.

如圖5所示,是電路板51及載板80的結構剖面圖,電路板51及載板80的特徵及符號與圖2電路板50及載板80有相同處,請參閱圖2說明,其不同處是:電路板51具有絕緣體40,其具有上表面41、下表面42、 側邊43及通孔44,絕緣體40與防焊層90下表面92接合,並包覆線路30下表面32,其中,通孔44與線路30下表面32相對應設置,令線路30下表面32裸露於絕緣體40通孔44的部分實施為接點324,使接點324得以供電連通用;另外,依需求,電路板51可設置第二線路70(虛線),供電性傳輸用,其具有上表面71、下表面72、側邊73及凸部79,凸部79設位於下表面72,且下表面72接合於絕緣體40上表面41,令凸部79容設於絕緣體40通孔44內,並與線路70接點324接合而電連通,使電路板51因第二線路70而具有更高的線路密度。 As shown in FIG. 5, it is a structural cross-sectional view of the circuit board 51 and the carrier board 80. The characteristics and symbols of the circuit board 51 and the carrier board 80 are the same as those of the circuit board 50 and the carrier board 80 in FIG. 2. The difference is that the circuit board 51 has an insulator 40 having an upper surface 41, a lower surface 42, On the side 43 and the through hole 44, the insulator 40 is bonded to the lower surface 92 of the solder mask 90 and covers the lower surface 32 of the circuit 30. The through hole 44 is provided corresponding to the lower surface 32 of the circuit 30 so that the lower surface 32 of the circuit 30 The part exposed in the through hole 44 of the insulator 40 is implemented as a contact 324, so that the contact 324 can be used for power supply and communication. In addition, the circuit board 51 can be provided with a second line 70 (dotted line) for power transmission according to requirements. The surface 71, the lower surface 72, the side 73, and the convex portion 79. The convex portion 79 is provided on the lower surface 72, and the lower surface 72 is joined to the upper surface 41 of the insulator 40, so that the convex portion 79 is accommodated in the through hole 44 of the insulator 40. The circuit board 51 is connected to the contact 324 of the line 70 and is in electrical communication, so that the circuit board 51 has a higher line density due to the second line 70.

如圖6所示,是電路板51及載板80的結構剖面圖,電路板51及載板80的特徵及符號與圖2電路板50及載板80有相同處,請參閱圖2說明,電路板51的二不同處是:1).線路30更是具有凸部39,凸部39設位於線路30下表面32;2).更是具有第二線路70及絕緣體40,其中,第二線路70具有側邊73、上表面71及下表面72,此下表面72的一部分實施為接點724用以供電連通用,而絕緣體40具有上表面41、下表面42及通孔44,絕緣體40是與防焊層90下表面92及線路30下表面32接合,其中,令第二線路70設位於絕緣體40上表面41,且令絕緣體40包覆第二線路70下表面72及側邊73,並令第二線路70上表面71裸露於絕緣體40上表面41,同時,令第二線路70的接點724裸露於通孔44,而絕緣體40通孔44與線路凸部39相對應設置,並令線路30凸部39設位在通孔44內,且與第二線路70的接點724接合而電連通。 As shown in FIG. 6, it is a structural cross-sectional view of the circuit board 51 and the carrier board 80. The characteristics and symbols of the circuit board 51 and the carrier board 80 are the same as those of the circuit board 50 and the carrier board 80 in FIG. 2. The two differences of the circuit board 51 are: 1). The circuit 30 further has a convex portion 39, and the convex portion 39 is provided on the lower surface 32 of the circuit 30; 2). It also has a second circuit 70 and an insulator 40, of which the second The circuit 70 has a side 73, an upper surface 71, and a lower surface 72. A part of the lower surface 72 is implemented as a contact 724 for power communication. The insulator 40 has an upper surface 41, a lower surface 42, and a through hole 44, and the insulator 40. It is bonded to the lower surface 92 of the solder resist layer 90 and the lower surface 32 of the circuit 30. The second circuit 70 is located on the upper surface 41 of the insulator 40, and the insulator 40 covers the lower surface 72 and the side 73 of the second circuit 70. The upper surface 71 of the second circuit 70 is exposed on the upper surface 41 of the insulator 40. At the same time, the contact 724 of the second circuit 70 is exposed on the through hole 44, and the through hole 44 of the insulator 40 is provided corresponding to the line protrusion 39. The convex portion 39 of the circuit 30 is set in the through hole 44 and is connected to the contact 724 of the second circuit 70 to be in electrical communication.

如圖7所示,是載板80及電路板51的結構剖面圖,其中,載板80的特徵及符號與圖1-1的載板80有相同處,請參閱圖1-1說明,其不同處是:載板80更是具有開孔86,開孔86實施為貫穿狀,並且開孔86具有邊牆85,開孔86與線路30端點3A相對應設置;而電路板51的特徵及符號與圖3電路板50有相同處,請參閱圖3說明,其不同處是:電路板51的防焊層90具有凸部99,此凸部99設位於防焊層90上表面91,且令防焊層90的一部分90F容設於載板80的開孔86內,據此,防焊層90預留開孔9F也是容置於載板80開孔86內,並令開孔86邊牆85與防焊層90凸部99接合,從而,使防焊層90是與載板80下表面82及載板80開孔86的邊牆85接合,藉此,在電路板51與封裝體結合的過程中,令載板80可被選擇移除(參閱圖10-2)或保留(參閱圖12-2),當載板80被保留時,可藉載板80提升封裝體的散熱功效,或在載板80側邊83增設鎳或其他適用的金屬層或薄膜(參閱圖12-3),用以提升封裝體抗電磁干擾的面積及功效;另外,該載板80上表面81可依需求接合一第 二防焊層(95),用以保護載板80,其中令該第二防焊層(95)是與載板80上表面81及防焊層90接合,且該第二防焊層(95)表面更是還可再接合有另一載板,例如圖14-1所示的載板8K,其中,若第二防焊層(95)是與如圖14-1的載板8K接合,則此另一載板(即如圖14-1所示的載板8K)是藉由其接合層8C1與該第二防焊層(95)接合,另外,此另一載板也可實施為如圖3~圖4所示的載板88,用以避免電路板51的曲翹現象。 As shown in FIG. 7, it is a structural cross-sectional view of the carrier board 80 and the circuit board 51. Among them, the characteristics and symbols of the carrier board 80 are the same as those of the carrier board 80 in FIG. 1-1. The difference is that the carrier board 80 has an opening 86, which is implemented as a through-hole, and the opening 86 has a side wall 85. The opening 86 is provided corresponding to the end 3A of the line 30; and the characteristics of the circuit board 51 The symbols are the same as those of the circuit board 50 in FIG. 3. Please refer to the description in FIG. 3. The difference is that the solder mask layer 90 of the circuit board 51 has a convex portion 99 which is provided on the upper surface 91 of the solder mask layer 90. In addition, a part 90F of the solder resist layer 90 is accommodated in the opening 86 of the carrier board 80. Accordingly, the reserved opening 9F of the solder resist 90 is also accommodated in the opening 80 of the carrier board 80, and the opening 86 is The side wall 85 is joined to the convex part 99 of the solder resist layer 90, so that the solder resist layer 90 is joined to the side wall 85 of the lower surface 82 of the carrier board 80 and the opening 86 of the carrier board 80, and thereby the circuit board 51 and the package are bonded. During the bonding process, the carrier board 80 can be removed (see Figure 10-2) or retained (see Figure 12-2). When the carrier board 80 is retained, the heat dissipation of the package can be improved by the carrier board 80 Efficacy, or 8 on the side of the carrier board 80 3 Add nickel or other applicable metal layers or films (see Figure 12-3) to improve the area and efficiency of the package's resistance to electromagnetic interference; in addition, the upper surface 81 of the carrier board 80 can be joined with a first Two solder mask layers (95) are used to protect the carrier plate 80, wherein the second solder mask layer (95) is bonded to the upper surface 81 and the solder mask layer 90 of the carrier plate 80, and the second solder mask layer (95 ) The surface can be joined with another carrier board, such as the carrier board 8K shown in FIG. 14-1, wherein if the second solder resist (95) is joined with the carrier board 8K shown in FIG. 14-1, Then, the other carrier board (ie, the carrier board 8K shown in FIG. 14-1) is bonded to the second solder resist layer (95) through its bonding layer 8C1. In addition, the other carrier board can also be implemented as The carrier board 88 shown in FIG. 3 to FIG. 4 is used to avoid the warpage of the circuit board 51.

如圖8所示,是電路板50及載板80的結構剖面圖,電路板50及載板80的特徵及符號與圖7電路板51及載板80有相同處,請參閱圖7說明,其不同處是:電路板50防焊層90具有開孔96,開孔96是貫穿防焊層90,且開孔96是與線路30端點3A及載板80開孔86相對應設置,使線路30端點3A得以供對外電連通用,同時,此凸部99設位於防焊層90上表面91,防焊層90的凸部99容置於載板80開孔86內,且令防焊層90的凸部99仍與載板80開孔86邊牆85接合,據此,防焊層90是與載板80的下表面82及邊牆85接合,從而,可提升載板80與防焊層90的接合面積及強度,進而可避免載板80與防焊層90產生剝離的損壞,而防焊層90凸部99可凸出或平齊於載板80上表面81,或可令防焊層90凸部99的至少一部分不與載板80開孔86邊牆85接合,使載板80可藉邊牆85與錫或其他導體與線路30電連通,而載板80上表面81可依需求再接合第二防焊層(95),用以保護載板80,其中第二防焊層95可具有一貫穿狀開孔,並令此貫穿狀開孔是與載板開孔86、防焊層開孔96及端點3A相對應設置;由圖1-1~圖8所示電路板50、51得知,在線路30上表面31被防焊層90包覆的特徵下,藉改變或置換線路30、70及/或載板80、88,或增加組件,可使電路板50、51更實用。 As shown in FIG. 8, it is a structural cross-sectional view of the circuit board 50 and the carrier board 80. The characteristics and symbols of the circuit board 50 and the carrier board 80 are the same as those of the circuit board 51 and the carrier board 80 in FIG. 7. The difference is that the solder mask layer 90 of the circuit board 50 has an opening 96 that penetrates the solder mask layer 90, and the opening 96 is provided corresponding to the end 3A of the line 30 and the opening 86 of the carrier board 80 so that The terminal 3A of the line 30 can be used for external electrical communication. At the same time, the convex portion 99 is provided on the upper surface 91 of the solder resist layer 90. The convex portion 99 of the solder resist layer 90 is accommodated in the opening 86 of the carrier board 80, and The convex portion 99 of the solder layer 90 is still joined with the opening 86 of the carrier plate 80 and the side wall 85. According to this, the solder resist layer 90 is joined with the lower surface 82 and the side wall 85 of the carrier plate 80, so that the carrier plate 80 and the The joint area and strength of the solder mask layer 90 can further prevent peeling damage between the carrier plate 80 and the solder mask layer 90, and the convex portion 99 of the solder mask layer 90 can be convex or flush with the upper surface 81 of the carrier plate 80, or At least a part of the convex part 99 of the solder resist layer 90 is not connected with the side wall 85 of the opening 86 of the carrier board 80, so that the carrier board 80 can be in electrical communication with the line 30 through the side wall 85 and tin or other conductors, and the upper surface of the carrier board 80 81 on demand The second solder resist layer (95) is bonded to protect the carrier board 80, wherein the second solder resist layer 95 may have a through-hole opening, and the through-hole opening is connected with the carrier board opening 86 and the solder resist layer. The opening 96 and the end point 3A are set correspondingly; it is known from the circuit boards 50 and 51 shown in FIGS. 1-1 to 8 that the upper surface 31 of the circuit 30 is covered with the solder resist layer 90, and can be changed or replaced. Circuits 30, 70 and / or carrier boards 80, 88, or additional components can make circuit boards 50, 51 more practical.

如圖9-1~圖9-4所示,是封裝體10製造方法的剖面圖,首先,如圖9-1所示,先提供一電路板50及載板8K的結構,其中,電路板50的結構及特徵與圖3的電路板50相同,請參閱圖3說明,而載板8K是由多個組件組成,且載板8K的結構及特徵與圖14-1的載板8K相同,請參閱圖14-1說明,其中,令此載板8K接合層8C1是與防焊層90上表面91接合,並可令接合層8C1下表面實施為載板8K下表面82,且可令銅箔基板8A上表面實施為載板8K上表面81,接著,提供晶片20,將晶片20與電路板50接合,本圖9-1的晶片20是設位在絕緣體40上表面41,接著,提供一實施為導線的導電件18,導電件18兩端分別與晶片20端點24及電路板50線路30接點324接合,令晶片20與電路板50電連通,接著,提供塑料60,塑料60包封晶片20、導電件18及電路板50表面,據此,封裝體10就已組成,其中,此晶片20也可 實施為如圖11-1所示的晶片20,而此導電件18也可實施為如圖11-1所示的導電件18,其中,本圖9-1所示載板8K的接合層8C1也可以被視為是實施為載板80(參閱圖1-1),據此,令本電路板及載板的結構更可達到好用、實用的功效;接著,提供一由圖9-2及圖9-3所示而組成的移除工序,將該載板8K移除,此移除工序說明如後,首先,如圖9-2所示,將可分拆銅箔8C的接合層8C1及分拆層8C2分開,使分拆層8C2、固化膠8B及銅箔基板8A被移除,據此,僅令載板8K的接合層8C1(80)接合於防焊層90,其中,本圖9-2所示的接合層8C1(80)也可以被視為是實施為載板80,而此移除工序可以用機器設備或人工施作及/或其他適用的移除工序實施;接著,如圖9-3所示,再將接合層8C1移除,至此,該載板8K即被移除,從而,令防焊層90上表面91可裸露於大氣中,而本圖9-3實施例的接合層8C1是用蝕刻液移除,其中,因線路30被防焊層90完全包封,使線路30不會被蝕刻液攻擊而造成損壞或變薄;接著,如圖9-4所示,提供一開孔工序,此開孔工序是以鐳射或化學溶劑的方式實施,將防焊層90的一部分90F移除,使預留開孔9F轉換成開孔96,並令線路30端點3A得以供電連通用,本實施例是供錫球S電連通,其中,因該位於端點3A邊緣的接合區3A4仍是與防焊層90接合,使線路30與絕緣體40可更穩固的接合在一起,據此,當錫球S受外力F拉扯時,在線路30下表面32與絕緣體40間,不易或不會產生如圖14-4所示的分層或間隙的損壞,進而可將線路30厚度T30實施為比圖14-1習用的線路35厚度T3更薄,從而,使封裝體10的厚度也可實施為更薄,其中,在線路30的表面也可依需求,設有導電層(未繪示),以利於對外電連接用;另外,如圖9-1所示的實施例中,此接合層8C1具有厚度T8C1,此接合層8C1的厚度T8C1可約為18微米(或其他適用的厚度),而此分拆層8C2具有厚度T8C2,此分拆層8C2的厚度T8C2約為3-5微米(或其他適用的厚度),令接合層8C1的厚度T8C1大於分拆層8C2的厚度T8C2(即T8C1>T8C2),據此,就可避免電路板50的損壞,因為,在提供一移除工序(參閱圖9-2及圖9-3)時,由於接合層8C1的厚度T8C1比分拆層8C2的厚度T8C2還厚,令接合層8C1可更穩固地與防焊層90接合在一起,據此,當該可分拆銅箔8C的接合層8C1與分拆層8C2分開時,可以使該接合層8C1不易被分拆層8C2扯破,從而,令防焊層90(甚或電路板50)不易破損,而可避免電路板50的損壞;其中,在提供移除工序時,若不會造成接合層8C1被分拆層8C2扯破的損壞,則也可依需求,令接合層8C1厚度T8C1小於分拆層8C2厚度T8C2(即T8C1<T8C2)。 As shown in FIGS. 9-1 to 9-4, cross-sectional views of the manufacturing method of the package 10 are shown. First, as shown in FIG. 9-1, a circuit board 50 and a carrier board 8K are provided. Among them, the circuit board The structure and features of 50 are the same as the circuit board 50 in FIG. 3, please refer to the description in FIG. 3, and the carrier board 8K is composed of multiple components, and the structure and features of the carrier board 8K are the same as those of the carrier board 8K in FIG. 14-1. Please refer to the description of FIG. 14-1, in which the carrier plate 8K bonding layer 8C1 is bonded to the upper surface 91 of the solder resist layer 90, and the lower surface of the bonding layer 8C1 can be implemented as the lower surface 82 of the carrier plate 8K. The upper surface of the foil substrate 8A is implemented as the upper surface 81 of the carrier board 8K. Then, a wafer 20 is provided, and the wafer 20 is bonded to the circuit board 50. The wafer 20 of FIG. 9-1 is located on the upper surface 41 of the insulator 40. A conductive member 18 implemented as a wire, the two ends of the conductive member 18 are respectively connected to the terminal 24 of the chip 20 and the contact 324 of the circuit board 50 line 30, so that the chip 20 and the circuit board 50 are in electrical communication, and then, a plastic 60, a plastic 60 is provided. The surface of the wafer 20, the conductive member 18, and the circuit board 50 is encapsulated, and the package body 10 has been formed. The wafer 20 may also be It is implemented as the wafer 20 shown in FIG. 11-1, and the conductive member 18 can also be implemented as the conductive member 18 shown in FIG. 11-1. Among them, the bonding layer 8C1 of the carrier board 8K shown in FIG. 9-1 It can also be regarded as being implemented as a carrier board 80 (see Fig. 1-1). Based on this, the structure of the circuit board and the carrier board can be more useful and practical; And the removal process composed of FIG. 9-3, the carrier board 8K is removed. The description of this removal process is as follows. First, as shown in FIG. 9-2, the bonding layer of the copper foil 8C can be detached. The 8C1 and the separation layer 8C2 are separated, so that the separation layer 8C2, the curing adhesive 8B, and the copper foil substrate 8A are removed. According to this, only the bonding layer 8C1 (80) of the carrier board 8K is bonded to the solder resist layer 90. Among them, The bonding layer 8C1 (80) shown in FIG. 9-2 can also be regarded as being implemented as a carrier plate 80, and this removal process can be implemented by using machinery and equipment or manually and / or other applicable removal processes; Next, as shown in FIG. 9-3, the bonding layer 8C1 is removed, and at this point, the carrier board 8K is removed, so that the upper surface 91 of the solder resist layer 90 can be exposed to the atmosphere, and this FIG. 9- The bonding layer 8C1 of the 3 embodiment is transferred by an etching liquid. In addition, because the line 30 is completely encapsulated by the solder resist layer 90, the line 30 is not damaged or thinned by the attack of the etching solution; then, as shown in FIG. 9-4, a hole-opening process is provided. The hole process is implemented by means of laser or chemical solvent. A part of 90F of the solder resist layer 90 is removed, the reserved opening 9F is converted into an opening 96, and the end 3A of the line 30 can be connected for power supply. This embodiment The solder ball S is electrically connected, because the bonding area 3A4 located at the edge of the end point 3A is still bonded to the solder resist layer 90, so that the circuit 30 and the insulator 40 can be more firmly bonded together. According to this, when the solder ball When S is pulled by an external force F, it is difficult or not to cause layering or gap damage as shown in FIG. 14-4 between the lower surface 32 of the line 30 and the insulator 40, and the thickness T30 of the line 30 can be implemented more than that in FIG. 14 -1 The thickness T3 of the conventional circuit 35 is thinner, so that the thickness of the package body 10 can also be implemented to be thinner. Among them, a conductive layer (not shown) can be provided on the surface of the circuit 30 as required to facilitate For external electrical connection; In addition, in the embodiment shown in FIG. 9-1, the bonding layer 8C1 has a thickness T8C1. The thickness T8C1 of the layer 8C1 may be about 18 microns (or other applicable thickness), and the split layer 8C2 has a thickness T8C2, and the thickness T8C2 of the split layer 8C2 is about 3-5 microns (or other applicable thickness), By making the thickness T8C1 of the bonding layer 8C1 greater than the thickness T8C2 of the separation layer 8C2 (ie, T8C1> T8C2), the damage of the circuit board 50 can be avoided because a removal process is provided (see FIG. 9-2 and FIG. 9-3), because the thickness T8C1 of the bonding layer 8C1 is thicker than the thickness T8C2 of the split layer 8C2, the bonding layer 8C1 can be more firmly bonded to the solder resist layer 90. Accordingly, when the detachable copper When the bonding layer 8C1 of the foil 8C is separated from the separation layer 8C2, the bonding layer 8C1 can not be easily torn by the separation layer 8C2, so that the solder resist 90 (or even the circuit board 50) is not easily damaged, and the circuit board can be avoided. 50; among them, when the removal process is provided, if the bonding layer 8C1 is not damaged by the split layer 8C2, the thickness of the bonding layer 8C1 T8C1 may be smaller than the thickness of the split layer 8C2 T8C2 ( That is, T8C1 <T8C2).

如圖10-1~圖10-3所示,是封裝體10製造方法的剖面圖,首 先,如圖10-1所示,先提供一電路板51及載板88的結構,電路板51的特徵及符號與圖4的電路板51相同,而載板88的特徵及符號與圖3的載板88相同,請參閱圖3及圖4說明,接著,提供晶片20,將晶片20設位在絕緣體40上表面41,令晶片20與電路板51接合,接著,提供一實施為導線的導電件18,導電件18兩端分別與晶片20端點24及電路板51線路70接合,令晶片20與電路板51電連通,接著,提供塑料60,塑料60包封晶片20、導電件18及電路板51,據此,封裝體10就已組成;接著,如圖10-2所示,提供一移除工序,將載板88移除,該移除工序可以用機械研磨、鐳射、化學蝕刻及/或其他適用的移除工序實施,令載板88(即載板80與調整層801)自電路板51分離,使電路板51防焊層90上表面91裸露於大氣中,其中,在移除載板80前,可依需求,先提供一開孔工序,在調整層801開設盲孔87(虛線),用以提升移除載板80的效率及/或調整電路板51的曲翹度;接著,如圖10-3所示,提供一開孔工序,將防焊層90的一部分90F移除,使預留開孔9F轉換成開孔96,令線路30端點3A得以供電連通用,其中,因該位於端點3A邊緣的接合區3A4仍是與防焊層90接合,使線路30與絕緣體40可更穩固的接合在一起,據此,在線路30下表面32與絕緣體40間,不易或不會產生如圖14-4所示的分層或間隙的損壞,而此開孔工序可以用鐳射或化學蝕刻及/或其他適用的開孔工序實施。 As shown in Figs. 10-1 to 10-3, it is a cross-sectional view of the manufacturing method of the package body 10. First, as shown in FIG. 10-1, the structure of a circuit board 51 and a carrier board 88 is provided. The features and symbols of the circuit board 51 are the same as those of the circuit board 51 of FIG. 4, and the features and symbols of the carrier board 88 are the same as those of FIG. The carrier board 88 is the same, please refer to FIG. 3 and FIG. 4. Next, a wafer 20 is provided, and the wafer 20 is positioned on the upper surface 41 of the insulator 40 so that the wafer 20 is bonded to the circuit board 51. The conductive member 18, the two ends of the conductive member 18 are respectively connected to the terminal 24 of the wafer 20 and the circuit board 51 line 70, so that the wafer 20 and the circuit board 51 are in electrical communication, and then, a plastic 60 is provided to encapsulate the wafer 20 and the conductive member 18 And the circuit board 51, according to which the package body 10 has been formed; then, as shown in FIG. 10-2, a removal process is provided to remove the carrier board 88, and the removal process can be performed by mechanical grinding, laser, chemical Etching and / or other applicable removal procedures are implemented, so that the carrier board 88 (ie, the carrier board 80 and the adjustment layer 801) is separated from the circuit board 51, and the upper surface 91 of the solder mask layer 90 of the circuit board 51 is exposed to the atmosphere. Before removing the carrier plate 80, a hole-opening process may be provided first, and a blind hole 87 (dotted line) is opened in the adjustment layer 801. It is used to improve the efficiency of removing the carrier board 80 and / or adjust the curvature of the circuit board 51. Next, as shown in FIG. 10-3, a hole-opening process is provided to remove a portion 90F of the solder resist layer 90 so that The reserved opening 9F is converted into an opening 96, so that the terminal 3A of the line 30 can be used for power communication. Among them, the junction area 3A4 located at the edge of the terminal 3A is still connected to the solder resist 90, so that the line 30 and the insulator 40 are connected. It can be more firmly joined together. According to this, between the lower surface 32 of the line 30 and the insulator 40, it is difficult or not to cause the damage of the layering or gap as shown in Figure 14-4, and the opening process can be laser Or chemical etching and / or other applicable opening processes.

如圖11-1~圖11-3所示,是封裝體10製造方法的剖面圖,首先,如圖11-1所示,先提供一電路板51及載板80的結構,電路板51及載板80的特徵及符號與圖6相同,請參閱圖6說明,接著,提供一晶片20及一實施為導電凸塊(bump)的導電件18,此晶片20實施為覆晶晶片(flip chip),將晶片20與電路板51接合,本圖11-1的晶片20設位在絕緣體40下表面42,並藉導電件18兩端分別與晶片20端點24及電路板51線路30接合,令晶片20與電路板51電連通,接著,提供塑料60,塑料60包封晶片20、導電件18及電路板51表面,據此,封裝體10就已組成;接著,如圖11-2所示,提供一移除工序,將載板80移除,該移除工序可以用機械研磨、鐳射、化學蝕刻及/或其他適用的移除工序實施,令載板80自電路板51分離,使電路板51防焊層90上表面91裸露於大氣中,由於線路30被防焊層90包覆,使線路30不被蝕刻液攻擊而造成損壞;接著,如圖11-3所示,提供一開孔工序,將防焊層90的一部分90F移除,使預留開孔9F轉換成開孔96,令線路30端點3A得以供電連通用,其中,因為該位於線路30接合區3A4仍與防焊層90接合,使線路30與絕緣體40更穩固的接合在一起,據此,在線路30下表面32與絕 緣體40間,不易或不會產生如圖14-4所示的分層或間隙的損壞,而此開孔工序可以用鐳射、化學蝕刻及/或其他適用的開孔工序實施。 As shown in FIGS. 11-1 to 11-3, it is a cross-sectional view of the manufacturing method of the package body 10. First, as shown in FIG. 11-1, a circuit board 51 and a carrier board 80 structure are provided. The characteristics and symbols of the carrier plate 80 are the same as those in FIG. 6. Please refer to FIG. 6 for explanation. Next, a wafer 20 and a conductive member 18 implemented as a conductive bump are provided. The wafer 20 is implemented as a flip chip. ), The wafer 20 is bonded to the circuit board 51. The wafer 20 of FIG. 11-1 is located on the lower surface 42 of the insulator 40, and the two ends of the conductive member 18 are respectively bonded to the end point 24 of the wafer 20 and the circuit 30 of the circuit board 51. The chip 20 is electrically connected to the circuit board 51. Then, a plastic 60 is provided to encapsulate the surface of the chip 20, the conductive member 18, and the circuit board 51, and the package body 10 is formed. Then, as shown in FIG. 11-2 As shown, a removal process is provided to remove the carrier board 80. This removal process can be implemented by mechanical grinding, laser, chemical etching, and / or other applicable removal processes to separate the carrier board 80 from the circuit board 51, so that The upper surface 91 of the solder mask layer 90 of the circuit board 51 is exposed to the atmosphere. Since the circuit 30 is covered by the solder mask layer 90, the circuit 30 is not attacked by the etching solution. As a result, as shown in FIG. 11-3, a hole-opening process is provided to remove a portion 90F of the solder mask layer 90, so that the reserved hole 9F is converted into an opening 96, so that the end 30 of the line 30 is 3A. It is used for power supply connection, because the 3A4 located in the junction area 3 of the line 30 is still joined to the solder resist layer 90, so that the line 30 and the insulator 40 are more firmly joined together. According to this, the lower surface 32 of the line 30 and the insulation Between the edge bodies 40, it is difficult or not to cause the damage of layering or gaps as shown in FIG. 14-4, and this hole-opening process can be implemented by laser, chemical etching and / or other applicable hole-opening processes.

如圖12-1~圖12-3所示,是封裝體10的製造方法的剖面圖,首先,如圖12-1所示,先提供一電路板51及載板80的結構,電路板51及載板80的的結構及特徵與圖7相同,請參閱圖7說明,接著,提供晶片20,將晶片20與電路板51接合,本圖12-1所示晶片20設位在絕緣體40上表面41,接著,提供一實施為導線的導電件18,導電件18兩端分別與晶片20端點24及電路板51線路30接合,令晶片20與電路板51電連通,接著,提供塑料60,塑料60包封晶片20、導電件18及電路板51表面,據此,封裝體10就已組成;接著,如圖12-2所示,提供一開孔工序,將防焊層90的一部分90F移除,使預留開孔9F轉換成開孔96,令線路30端點3A得以供電連通用,其中,因該位於端點3A邊緣的接合區3A4仍是與防焊層90接合,使線路30與絕緣體40能夠更穩固的接合在一起,據此,在線路30下表面32與絕緣體40間,不易或不會產生如圖14-4所示的分層或間隙的損壞,同時,可依需求,令載板80開孔86邊牆85的至少一部分裸露於防焊層90凸部99,使載板80開孔86的邊牆85可與錫或其他導體電連通;接著,如圖12-3所示,因載板80可實施為導體,據此,依需求,於完成如圖12-2所示的開孔工序後,可提供以銅或鎳或其他具有電磁屏蔽功效物質製成的薄膜65,藉貼合或塗佈或濺鍍的工序,將薄膜65設置在塑料60表面6S、電路板51側邊53及載板80側邊83,其中,令封裝體10藉載板80可增加電磁屏蔽的面積,提升抗電磁干擾功效,另外,該載板80上表面81可依需求接合第二防焊層(參閱圖7;標號“95”),此第二防焊層(95)是與載板80上表面81及防焊層90接合,且該第二防焊層(95)表面更是還可依需求再接合有另一載板,如圖14-1所示的載板8K,其中,此另一載板(即如圖14-1所示的載板8K)是藉其接合層8C1與該第二防焊層(95)接合,另外,在實施如圖12-2所示的開孔工序之前,更是還可包含有一移除工序,並令此移除工序是將該另一載板移除,而且,在完成此移除工序後,並且也完成開孔工序後,令第二防焊層(95)具有貫穿狀開孔,並令此貫穿狀開孔是與載板開孔86、防焊層開孔96及線路端點3A相對應設置。 12-1 to 12-3 are cross-sectional views of a method for manufacturing the package 10. First, as shown in FIG. 12-1, a circuit board 51 and a carrier board 80 are first provided, and the circuit board 51 is provided. The structure and characteristics of the carrier board 80 are the same as those in FIG. 7. Please refer to FIG. 7 for explanation. Next, a wafer 20 is provided, and the wafer 20 is bonded to the circuit board 51. The wafer 20 shown in FIG. 12-1 is set on the insulator 40. Surface 41. Next, a conductive member 18 implemented as a wire is provided. The two ends of the conductive member 18 are respectively connected to the terminal 24 of the chip 20 and the circuit 30 of the circuit board 51, so that the chip 20 and the circuit board 51 are in electrical communication. Then, a plastic 60 is provided. The plastic 60 encapsulates the surface of the wafer 20, the conductive member 18, and the circuit board 51, and accordingly, the package body 10 has been formed; then, as shown in FIG. 12-2, a hole-opening process is provided to part of the solder resist layer 90 90F is removed, and the reserved opening 9F is converted into the opening 96, so that the terminal 3A of the line 30 can be used for power supply and communication. Among them, the junction area 3A4 located at the edge of the terminal 3A is still connected to the solder resist 90, so that The circuit 30 and the insulator 40 can be more firmly joined together. Accordingly, it is difficult or impossible for the lower surface 32 of the circuit 30 and the insulator 40 to be bonded together. As shown in Figure 14-4, the layer or gap is damaged. At the same time, at least a part of the opening 80 of the carrier board 86 and the side wall 85 can be exposed to the convex portion 99 of the solder resist layer 90 to open the carrier board 80 as required. The side wall 85 of the hole 86 can be in electrical communication with tin or other conductors. Then, as shown in FIG. 12-3, since the carrier board 80 can be implemented as a conductor, according to the requirements, as shown in FIG. 12-2, After the hole-opening process, a thin film 65 made of copper or nickel or other materials with electromagnetic shielding effect can be provided. The thin film 65 is set on the surface 6S of the plastic 60 and the side of the circuit board 51 by the process of bonding or coating or sputtering. The side 53 and the side 83 of the carrier board 80, wherein the package body 10 can increase the area of electromagnetic shielding by the carrier board 80 and improve the anti-electromagnetic interference effect. In addition, the upper surface 81 of the carrier board 80 can be joined with a second solder resist as required. Layer (see FIG. 7; reference number "95"), the second solder mask layer (95) is bonded to the upper surface 81 and the solder mask layer 90 of the carrier board 80, and the surface of the second solder mask layer (95) is further According to requirements, another carrier board can be bonded, as shown in the carrier board 8K shown in Figure 14-1. Among them, the other carrier board (ie, the carrier board 8K shown in Figure 14-1) is based on its bonding layer 8C1. With this The two solder resists (95) are joined. In addition, before the hole-opening process shown in FIG. 12-2 is performed, a removal process may be included, and the removal process is to move the other carrier board. In addition, after the removal process is completed and the hole-opening process is also completed, the second solder resist layer (95) is provided with a through-hole opening, and the through-hole opening is connected with the carrier plate opening 86, The solder mask opening 96 and the line terminal 3A are provided correspondingly.

如圖13-1~圖13-3所示,是封裝體10的製造方法的剖面圖,首先,如圖13-1所示,先提供一電路板50及載板88的結構,電路板50的結構及特徵與圖1-1電路板51相同,載板88的特徵及符號與圖4的載板88相同,請參閱圖1-1及圖4說明,接著,提供晶片20及一實施為導電凸塊的導 電件18,將晶片20與電路板50接合,本圖13-1的晶片20設位在線路30下表面32,並藉導電件18兩端分別與晶片20端點24及線路30接合,令晶片20與電路板50電連通,接著,提供塑料60,塑料60包封晶片20、導電件18及電路板50,據此,封裝體10就已組成;接著,如圖13-2所示,提供一移除工序,將載板88移除,該移除工序可以用機械研磨、鐳射、化學蝕刻及/或其他適用的移除工序實施,令載板88自電路板50分離,使電路板50防焊層90上表面91裸露於大氣中,其中,該載板88的調整層801亦於此移除工序中被移除;接著,如圖13-3所示,提供一開孔工序,將防焊層90的一部分90F移除,使預留開孔9F轉換成開孔96,令線路30端點3A得以供電連通用,其中,因該位於線路30邊緣的接合區3A4仍是與防焊層90接合,使線路30與塑料60能夠更穩固的接合在一起,據此,在線路30下表面32與塑料60間,不易或不會產生如圖14-4所示的分層或間隙的損壞,而此開孔工序可以用鐳射及/或其他適用的開孔工序實施。 13-1 to 13-3 are cross-sectional views of a method for manufacturing the package 10. First, as shown in FIG. 13-1, a circuit board 50 and a carrier board 88 are first provided, and the circuit board 50 is provided. The structure and features are the same as those of the circuit board 51 in FIG. 1-1, and the features and symbols of the carrier board 88 are the same as those of the carrier board 88 in FIG. 4, please refer to the description of FIGS. 1-1 and 4, and then provide the chip 20 and an implementation as Conduction of conductive bumps The electrical component 18 joins the chip 20 and the circuit board 50. The wafer 20 of FIG. 13-1 is located on the lower surface 32 of the circuit 30, and the two ends of the conductive member 18 are respectively connected to the end point 24 of the chip 20 and the circuit 30. The chip 20 is in electrical communication with the circuit board 50. Then, a plastic 60 is provided, which encapsulates the chip 20, the conductive member 18, and the circuit board 50. Based on this, the package body 10 is formed. Then, as shown in FIG. 13-2, A removal process is provided to remove the carrier board 88. The removal process can be implemented by mechanical grinding, laser, chemical etching, and / or other applicable removal processes to separate the carrier board 88 from the circuit board 50 and make the circuit board The upper surface 91 of the solder resist layer 90 is exposed to the atmosphere, and the adjustment layer 801 of the carrier plate 88 is also removed in this removal process. Then, as shown in FIG. 13-3, a hole-opening process is provided. The part 90F of the solder mask layer 90 is removed, and the reserved opening 9F is converted into the opening 96, so that the terminal 3A of the line 30 can be used for power supply and communication. The junction area 3A4 located at the edge of the line 30 is still connected to the The bonding layer 90 is bonded, so that the circuit 30 and the plastic 60 can be more firmly bonded together. According to this, the lower surface 32 of the circuit 30 and the plastic 60 are bonded together. For 60 rooms, it is difficult or impossible to cause layering or gap damage as shown in Figure 14-4, and this opening process can be implemented by laser and / or other applicable opening processes.

上述圖1-1~圖13-3所示僅為本發明電路板50、51、載板80、88及封裝體10製造方法的實施例,當不能以此限定本發明,如:圖1-1~圖8所示的任一電路板50、51,均可搭配如圖1-1~圖8所示的任一載板80、88或如圖9-1所示的載板8K,只要具有本發明電路板及載板的基本結構均能達到降低電路板及封裝體的厚度,進而降低材料及生產成本,及減少線路下表面與絕緣體或塑料間產生分層或間隙的損壞,並能提高電路板的品質;再如圖9-1~圖13-3所示的任一封裝體的製造方法,可依需求,搭配圖1-1~圖11-4所示的任一電路板50、51及載板80、88,或再增加其他的工序,如:圖0-1及/或圖10-2所述,可增加調整層的開孔工序,用以提升製造方法的效率,或降低生產成本;故舉凡數值變更或等效元件置換,或依本發明申請的權利要求範圍所作的均等變化與修飾,皆應仍屬本發明專利涵蓋的範疇。 The above-mentioned FIGS. 1-1 to 13-3 are only examples of the method for manufacturing the circuit boards 50, 51, the carrier boards 80, 88, and the package 10 of the present invention. When the present invention cannot be limited in this way, as shown in FIG. 1- Any of the circuit boards 50 and 51 shown in 1 to 8 can be matched with any of the carrier boards 80 and 88 shown in Fig. 1-1 to Fig. 8 or the carrier board 8K shown in Fig. 9-1. The basic structure of the circuit board and the carrier board of the invention can reduce the thickness of the circuit board and the package body, thereby reducing the material and production costs, and reduce the damage of the layer or gap between the lower surface of the circuit and the insulator or plastic, and can Improve the quality of the circuit board; as shown in any of the package manufacturing methods shown in Figure 9-1 to Figure 13-3, you can match any of the circuit boards shown in Figure 1-1 to Figure 11-4 as required. , 51, and carrier plates 80, 88, or add other processes, such as: as described in Figure 0-1 and / or Figure 10-2, the opening process of the adjustment layer can be added to improve the efficiency of the manufacturing method, or Reduce production costs; therefore, any numerical change or equivalent component replacement, or equivalent changes and modifications made in accordance with the scope of the claims of the present application, should still be covered by the patent of the present invention Category.

Claims (39)

一種電路板及載板結構,電路板是供晶片接合用,電路板至少包括有:線路及防焊層;及載板至少包括有:一組件;此電路板及載板結構的特徵是:線路,此線路至少是由一端點組成,且此線路具有上表面、下表面及側邊,線路是供電性傳輸用;防焊層,其具有預留開孔、上表面及下表面,其中,預留開孔是由防焊層的一部分組成,並令此防焊層預留開孔與線路端點相對應設置,防焊層下表面與線路上表面接合,防焊層是由絕緣物質組成;及載板,其具有上表面、下表面及側邊,載板下表面與防焊層上表面接合,使載板上表面裸露於大氣中。 A circuit board and a carrier board structure. The circuit board is used for wafer bonding. The circuit board includes at least: a circuit and a solder mask; and the carrier board includes at least: a component; the circuit board and the carrier board are characterized by: This line is composed of at least one endpoint, and this line has an upper surface, a lower surface, and sides. The line is used for power transmission. The solder mask has reserved openings, upper surfaces, and lower surfaces. The reserved opening is composed of a part of the solder mask layer, and the reserved opening of the solder mask layer is set to correspond to the end of the line, the lower surface of the solder mask layer is connected to the upper surface of the circuit, and the solder mask layer is composed of an insulating material; And a carrier board, which has an upper surface, a lower surface, and side edges, and the lower surface of the carrier board is bonded to the upper surface of the solder resist layer, so that the surface of the carrier board is exposed to the atmosphere. 如申請專利範圍第1項所述之一種電路板及載板結構,其中,電路板線路更是具有延伸部,延伸部與端點相鄰設置,令線路是由端點及相鄰的延伸部組成,其中,端點上表面是供對外電連通用,且端點上表面的邊緣區域實施為接合區。 The circuit board and carrier board structure described in item 1 of the scope of patent application, wherein the circuit of the circuit board has an extension portion, and the extension portion is disposed adjacent to the end point, so that the line is composed of the end point and the adjacent extension portion. The composition, wherein the upper surface of the end point is used for external electrical communication, and the edge region of the upper surface of the end point is implemented as a bonding area. 如申請專利範圍第1項所述之一種電路板及載板結構,此電路板更具有絕緣體,其具有上表面、下表面、側邊及通孔,絕緣體下表面與防焊層接合,並包覆線路下表面及線路側邊,絕緣體通孔與線路下表面相對應設置,其中,線路下表面與絕緣體通孔相對應設置的區域實施為接點,此接點裸露於絕緣體通孔內,以供對外電連接用。 For example, a circuit board and a carrier board structure described in item 1 of the scope of patent application, the circuit board further has an insulator, which has an upper surface, a lower surface, a side edge, and a through hole, and the lower surface of the insulator is bonded to the solder resist layer, and includes The lower surface of the line and the side of the line are covered, and the insulator through-holes are provided corresponding to the lower surface of the line. The area where the lower surface of the line and the insulator through-holes are provided is implemented as a contact, and this contact is exposed in the insulator through-hole. For external electrical connection. 如申請專利範圍第3項所述之一種電路板及載板結構,此電路板更包含有第二線路,第二線路具有上表面、下表面、側邊及凸部,其中,凸部設位於下表面,且第二線路下表面接合於絕緣體上表面,令凸部容設於絕緣體通孔內,使第二線路藉凸部與線路接點電連通。 According to a circuit board and a carrier board structure described in item 3 of the scope of the patent application, the circuit board further includes a second circuit, the second circuit has an upper surface, a lower surface, a side edge, and a convex portion, wherein the convex portion is provided at The lower surface, and the lower surface of the second circuit is bonded to the upper surface of the insulator, so that the convex portion is accommodated in the through hole of the insulator, so that the second circuit is in electrical communication with the line contact by the convex portion. 如申請專利範圍第1項所述之一種電路板及載板結構,其中,此載板更是包含有一調整層,令載板是由多個組件組成,此調整層與載板接合,使調整層裸露在大氣中的表面實施為載板上表面。 The circuit board and the carrier board structure described in item 1 of the scope of the patent application, wherein the carrier board further includes an adjustment layer, so that the carrier board is composed of multiple components, and the adjustment layer is connected with the carrier board to make adjustments. The surface of the layer exposed in the atmosphere is implemented as the upper surface of a carrier board. 如申請專利範圍第5項所述之一種電路板及載板結構,其中,載板的調整層更是具有盲孔,盲孔與線路相對應設置,並令盲孔具有寬度及深度。 The circuit board and the carrier board structure described in item 5 of the scope of the patent application, wherein the adjustment layer of the carrier board has a blind hole, and the blind hole is provided corresponding to the line, and the blind hole has a width and a depth. 如申請專利範圍第1項所述之一種電路板及載板結構,其中,載板是由多個組件組成,並令此載板至少是由是銅箔基板、固化膠及可分拆銅箔堆疊組成,該銅箔基板是由二銅箔及黏著膠組成,其中,黏著膠是介於二銅箔之間,該可分拆銅箔是由二銅箔及薄膜層組成,薄膜層是將二銅箔 接合在一起,並令薄膜層是介於二銅箔之間,其中,令該與薄膜層接合的一銅箔實施為接合層,並令該另一與薄膜層接合的銅箔實施為分拆層,且分拆層藉固化膠與銅箔基板結合在一起,此載板藉其接合層與防焊層接合。 A circuit board and a carrier board structure described in item 1 of the scope of the patent application, wherein the carrier board is composed of a plurality of components, and the carrier board is made of at least a copper foil substrate, cured glue and detachable copper foil The copper foil substrate is composed of two copper foils and an adhesive. The adhesive is interposed between the two copper foils. The detachable copper foil is composed of two copper foils and a thin film layer. Two copper foil Bonded together and the thin film layer is between two copper foils, wherein one copper foil bonded to the thin film layer is implemented as a bonding layer, and the other copper foil bonded to the thin film layer is implemented as a split Layer, and the split layer is combined with the copper foil substrate by the curing glue, and the carrier plate is connected with the solder resist layer by its bonding layer. 如申請專利範圍第7項所述之一種電路板及載板結構,其中,接合層具有厚度,分拆層具有厚度,令接合層的厚度大於分拆層的厚度。 The circuit board and the carrier board structure described in item 7 of the scope of the patent application, wherein the bonding layer has a thickness and the split layer has a thickness such that the thickness of the bonding layer is greater than the thickness of the split layer. 如申請專利範圍第1項所述之一種電路板及載板結構,其中,載板更是具有開孔,開孔實施為貫穿狀,且開孔具有邊牆,此開孔與防焊層預留開孔及線路端點相對應設置,其中,令防焊層更是還具有凸部,該凸部容設於載板開孔內,並與開孔邊牆接合。 The circuit board and the carrier board structure described in item 1 of the scope of the patent application, wherein the carrier board has openings, the openings are implemented as through-holes, and the openings have side walls. The openings and the solder mask are Corresponding opening holes and line end points are provided correspondingly. Among them, the solder resist layer further has a convex portion, which is accommodated in the opening of the carrier board and is connected with the side wall of the opening. 如申請專利範圍第9項所述之一種電路板及載板結構,其中,更是還包含有第二防焊層,並令該第二防焊層是與載板上表面及防焊層接合。 A circuit board and a carrier board structure as described in item 9 of the scope of application for a patent, which further includes a second solder mask layer, and the second solder mask layer is bonded to the surface of the carrier board and the solder mask layer. . 如申請專利範圍第10項所述之一種電路板及載板結構,其中,更還包含有另一載板,此另一載板至少是由是銅箔基板、固化膠及可分拆銅箔堆疊組成,該銅箔基板是由二層銅箔及黏著膠組成,其中,黏著膠是介於二銅箔之間,該可分拆銅箔是是由二銅箔及薄膜層組成,該薄膜層是將二銅箔接合在一起,並令該薄膜層是介於二銅箔之間,其中,令該與薄膜層接合的一銅箔實施為接合層,並令該另一與薄膜層接合的銅箔實施為分拆層,且分拆層藉固化膠與銅箔基板結合在一起,此另一載板藉接合層與該第二防焊層接合。 A circuit board and a carrier board structure as described in item 10 of the scope of the patent application, which further includes another carrier board, and the other carrier board is made of at least a copper foil substrate, a cured glue, and a detachable copper foil. The copper foil substrate is composed of two layers of copper foil and an adhesive, wherein the adhesive is between the two copper foils, and the detachable copper foil is composed of two copper foils and a thin film layer. The film Layer is to join two copper foils together and make the thin film layer be between two copper foils, wherein one copper foil joined to the thin film layer is implemented as a bonding layer and the other is joined to the thin film layer The copper foil is implemented as a separation layer, and the separation layer is combined with the copper foil substrate by a curing glue, and the other carrier board is bonded to the second solder resist layer by a bonding layer. 如申請專利範圍第11項所述之一種電路板及載板結構,其中,接合層具有厚度,分拆層具有厚度,令接合層的厚度大於分拆層的厚度。 The circuit board and the carrier board structure described in item 11 of the scope of the patent application, wherein the bonding layer has a thickness and the split layer has a thickness such that the thickness of the bonding layer is greater than the thickness of the split layer. 如申請專利範圍第1項所述之一種電路板及載板結構,其中,電路板的厚度≦30微米。 The circuit board and the carrier board structure described in item 1 of the scope of patent application, wherein the thickness of the circuit board is ≦ 30 microns. 如申請專利範圍第1項所述之一種電路板及載板結構,其中,電路板線路的厚度≦10微米。 The circuit board and the carrier board structure described in item 1 of the scope of patent application, wherein the thickness of the circuit board circuit is ≦ 10 μm. 如申請專利範圍第3項所述之一種電路板及載板結構,其中,電路板絕緣體的厚度≦30微米。 The circuit board and the carrier board structure described in item 3 of the scope of patent application, wherein the thickness of the circuit board insulator is ≦ 30 μm. 如申請專利範圍第1項所述之一種電路板及載板結構,其中,電路板的防焊層更是包覆線路的側邊。 The circuit board and the carrier board structure described in item 1 of the scope of the patent application, wherein the solder mask of the circuit board is a side of the circuit. 如申請專利範圍第16項所述之一種電路板及載板結構,電路板更是包含有絕緣體及第二線路,該絕緣體具有上表面、下表面及通孔,絕緣體與防焊層下表面接合,並包覆線路下表面,其中,絕緣體通孔與線路下表 面相對應設置,令線路下表面的一部分裸露於絕緣體通孔,並令此線路下表面裸露於絕緣體通孔的部分實施為接點,且令此接點供電連通用;該第二線路具有上表面、下表面、側邊及凸部,凸部設位於第二線路下表面,該第二線路下表面接合於絕緣體上表面,其中,令第二線路凸部容設於絕緣體通孔內,並令第二線路與線路接點接合而電連通,此第二線路供電性傳輸用。 For example, a circuit board and a carrier board structure described in item 16 of the scope of the patent application. The circuit board further includes an insulator and a second circuit. The insulator has an upper surface, a lower surface, and a through hole. The insulator is bonded to the lower surface of the solder mask. , And cover the lower surface of the line, where the insulator through hole and the line below The surface is provided correspondingly, so that a part of the lower surface of the line is exposed in the insulator through hole, and the part of the lower surface of the line that is exposed in the insulator through hole is implemented as a contact, and this contact is used for power supply and communication; the second circuit has an upper surface , The lower surface, the side and the convex portion, the convex portion is provided on the lower surface of the second circuit, and the lower surface of the second circuit is joined to the upper surface of the insulator, wherein the convex portion of the second circuit is accommodated in the insulator through hole, and The second line is connected to the line contact and is in electrical communication. The second line is used for power transmission. 如申請專利範圍第16項所述之一種電路板及載板結構,電路板更是包含有絕緣體及第二線路,其中,令線路更是還具有凸部,該凸部設位在線路下表面,該第二線路具有上表面、下表面及側邊,其中,第二線路下表面的一部分實施為接點,該絕緣體具有上表面、下表面及通孔,絕緣體是與防焊層下表面及線路下表面接合,其中,令第二線路設位於絕緣體上表面,且令絕緣體包覆第二線路下表面及其側邊,並令第二線路上表面裸露於絕緣體上表面,同時,令第二線路的接點裸露於絕緣體通孔,而線路凸部設位在通孔內,據此,令線路凸部與第二線路的接點電連通。 According to a circuit board and a carrier board structure described in item 16 of the scope of application for a patent, the circuit board further includes an insulator and a second circuit, wherein the circuit further has a convex portion, and the convex portion is located on the lower surface of the circuit. The second circuit has an upper surface, a lower surface, and a side, wherein a part of the lower surface of the second circuit is implemented as a contact, the insulator has an upper surface, a lower surface, and a through hole, and the insulator is connected to the lower surface of the solder resist layer and The lower surface of the circuit is bonded, wherein the second circuit is located on the upper surface of the insulator, the insulator covers the lower surface of the second circuit and its sides, and the upper surface of the second circuit is exposed on the upper surface of the insulator. The contacts of the line are exposed in the insulator through-holes, and the convex portions of the lines are located in the through-holes, so that the convex portions of the lines are in electrical communication with the contacts of the second line. 一種電路板及載板結構,電路板是供晶片接合用,電路板包括有:線路及防焊層;及載板至少包括有:一組件;此電路板及載板結構的特徵是:線路,此線路至少是由一端點組成,且此線路具有上表面、下表面及側邊,線路是供電性傳輸用;防焊層,其具有上表面、下表面、凸部及開孔,其中,此凸部設位於防焊層上表面,此開孔是貫穿防焊層,防焊層是由絕緣物質組成,防焊層下表面與線路上表面接合,並令線路端點與防焊層開孔相對應設置;及載板,其具有上表面、下表面、開孔及側邊,此開孔具有邊牆,載板下表面與防焊層上表面接合,其中,此防焊層的凸部是容置於載板開孔內,並令防焊層的凸部與載板開孔的邊牆接合,此防焊層開孔是與線路端點及載板開孔相對應設置,使線路端點供對外電連通用。 A circuit board and a carrier board structure. The circuit board is used for wafer bonding. The circuit board includes: a circuit and a solder mask; and the carrier board includes at least: a component; the characteristics of the circuit board and the carrier board structure are: This line is composed of at least one end, and this line has an upper surface, a lower surface, and sides. The line is for power transmission; a solder mask has an upper surface, a lower surface, a convex portion, and an opening. The convex part is located on the upper surface of the solder mask layer. This opening is a penetration of the solder mask layer. The solder mask layer is composed of an insulating material. The lower surface of the solder mask layer is connected to the upper surface of the circuit, and the end of the line and the solder mask layer are opened. Correspondingly set; and a carrier plate having an upper surface, a lower surface, an opening and a side edge, the opening has a side wall, and the lower surface of the carrier plate is joined with the upper surface of the solder resist layer, wherein the convex portion of the solder resist layer It is accommodated in the opening of the carrier board, and the convex part of the solder mask layer is connected to the side wall of the opening of the carrier board. This solder mask opening is provided corresponding to the end point of the circuit and the opening of the carrier board, so that the circuit The endpoint is used for external electrical connection. 如申請專利範圍第19項所述之一種電路板及載板結構,電路板更是包含有絕緣體,其具有上表面、下表面、側邊及通孔,絕緣體下表面與防焊層接合,並包覆線路下表面及線路側邊,絕緣體通孔與線路下表面相對應設置,其中,線路下表面與絕緣體通孔相對應設置的區域實施為接點,此接點裸露於絕緣體通孔內,以供對外電連接用。 According to a circuit board and a carrier board structure described in item 19 of the scope of the patent application, the circuit board further includes an insulator having an upper surface, a lower surface, a side edge and a through hole, and the lower surface of the insulator is bonded to the solder resist layer, and The lower surface of the line and the side of the line are covered, and the insulator through-holes are provided corresponding to the lower surface of the line. The area where the lower surface of the line and the insulator through-hole are provided is implemented as a contact, and this contact is exposed in the insulator through-hole. For external electrical connection. 如申請專利範圍第20項所述之一種電路板及載板結構,此電路板更包含有第二線路,第二線路具有上表面、下表面、側邊及凸部,其中,凸部設位於下表面,且第二線路下表面接合於絕緣體上表面,令凸部容設於 絕緣體通孔內,使第二線路藉凸部與線路電連通。 For example, a circuit board and a carrier board structure described in item 20 of the scope of patent application, the circuit board further includes a second circuit, the second circuit has an upper surface, a lower surface, a side edge, and a convex portion, wherein the convex portion is provided at The lower surface, and the lower surface of the second circuit is bonded to the upper surface of the insulator, so that the convex portion is accommodated in In the through hole of the insulator, the second line is electrically connected to the line through the convex portion. 一種封裝體的製造方法,其包含有:步驟一:提供一電路板及載板的結構,該電路板具有線路及防焊層,其中,線路具有上表面、下表面及側邊,且線路至少由一端點組成,防焊層具有上表面、下表面、側邊及預留開孔,其中,防焊層下表面與線路上表面接合,且預留開孔與線路的端點相對應設置,該載板具有上表面、下表面及側邊,其下表面與防焊層上表面接合,使載板上表面裸露於大氣中;步驟二:提供晶片、導電件及塑料,先將晶片與電路板接合,並令晶片與電路板電連通,再使塑料包覆晶片、導電件及電路板;步驟三:提供一移除工序,將載板移除,並令電路板的防焊層裸露於大氣中:及步驟四:提供一開孔工序,將防焊層的預留開孔轉換成開孔,使線路端點得以對外電連通。 A method for manufacturing a package includes the following steps: Step 1: providing a circuit board and a carrier board structure, the circuit board having a circuit and a solder mask, wherein the circuit has an upper surface, a lower surface, and sides, and the circuit is at least It consists of an end point. The solder mask has an upper surface, a lower surface, a side edge and a reserved opening. The lower surface of the solder protection layer is connected to the upper surface of the circuit, and the reserved opening is provided corresponding to the end of the circuit. The carrier board has an upper surface, a lower surface, and side edges. The lower surface is bonded to the upper surface of the solder resist layer, so that the surface of the carrier board is exposed to the atmosphere. Step 2: Provide the chip, conductive parts, and plastic. The board is bonded, and the chip is electrically connected to the circuit board, and then the plastic is coated with the wafer, the conductive member and the circuit board; Step 3: Provide a removal process to remove the carrier board and expose the solder mask of the circuit board to In the atmosphere: and Step 4: Provide an opening process to convert the reserved openings in the solder mask layer into openings, so that the endpoints of the line can be electrically connected to the outside. 如申請專利範圍第22項所述之一種封裝體的製造方法,其中,在步驟一中,令該載板更是還具有調整層,令載板是由多個組件組成,該調整層與載板接合,該調整層於步驟三被移除。 The method for manufacturing a package according to item 22 of the scope of patent application, wherein, in step 1, the carrier board further has an adjustment layer, and the carrier board is composed of multiple components. The adjustment layer and the carrier The board is bonded, and the adjustment layer is removed in step three. 如申請專利範圍第23項所述之一種封裝體的製造方法,其中,調整層具有盲孔,該盲孔具有寬度及深度。 The method for manufacturing a package according to item 23 of the scope of patent application, wherein the adjustment layer has a blind hole, and the blind hole has a width and a depth. 如申請專利範圍第22項所述之一種封裝體的製造方法,其中,電路板的防焊層包覆線路側邊。 The method for manufacturing a package according to item 22 of the scope of the patent application, wherein the solder mask of the circuit board covers the side of the circuit. 如申請專利範圍第22項所述之一種封裝體的製造方法,電路板更具有絕緣體,其具有上表面、下表面、側邊及通孔,絕緣體下表面與防焊層接合,並包覆線路下表面及側邊,其中,絕緣體通孔與線路下表面相對應設置,使線路下表面的一部分裸露於絕緣體通孔內,令該線路下表面裸露於絕緣體通孔的區域實施為接點,以供對外電連接用,且令絕緣體上表面與塑料接合。 According to a method for manufacturing a package as described in claim 22 of the scope of patent application, the circuit board further has an insulator having an upper surface, a lower surface, a side edge, and a through hole. The lower surface of the insulator is bonded to the solder resist layer, and the circuit is covered. The lower surface and the side, wherein the through hole of the insulator is provided corresponding to the lower surface of the line, so that a part of the lower surface of the line is exposed in the through hole of the insulator, and the area where the lower surface of the line is exposed in the through hole of the insulator is implemented as a contact. It is used for external electrical connection, and the upper surface of the insulator is joined with plastic. 如申請專利範圍第26項所述之一種封裝體的製造方法,此電路板更包含有第二線路,第二線路具有上表面、下表面、側邊及凸部,其中,凸部設位於下表面,且第二線路下表面接合於絕緣體上表面,令凸部容設於絕緣體通孔內,使第二線路藉凸部與線路電連通。 According to a method for manufacturing a package as described in item 26 of the scope of patent application, the circuit board further includes a second circuit, and the second circuit has an upper surface, a lower surface, a side edge, and a convex portion, wherein the convex portion is provided at the lower portion. Surface, and the lower surface of the second circuit is bonded to the upper surface of the insulator, so that the convex portion is accommodated in the insulator through hole, so that the second circuit is in electrical communication with the circuit by the convex portion. 如申請專利範圍第22項所述之一種封裝體的製造方法,其中,載板是由多個組件組成,並令此載板至少是由是銅箔基板、固化膠及可分拆銅箔堆疊組成,該銅箔基板是由二銅箔及黏著膠組成,其中,黏著膠是介於 二銅箔之間,該可分拆銅箔是由二銅箔及薄膜層組成,薄膜層是將二銅箔接合在一起,並令薄膜層是介於二銅箔之間,其中,令該與薄膜層接合的一銅箔實施為接合層,並令該另一與薄膜層接合的銅箔實施為分拆層,且分拆層藉固化膠與銅箔基板結合在一起,此載板藉接合層與防焊層接合。 The method for manufacturing a package according to item 22 of the scope of patent application, wherein the carrier board is composed of a plurality of components, and the carrier board is made of at least a copper foil substrate, a curing glue and a detachable copper foil stack. The copper foil substrate is composed of two copper foils and an adhesive, wherein the adhesive is between Between two copper foils, the detachable copper foil is composed of two copper foils and a thin film layer. The thin film layer joins the two copper foils together, and the thin film layer is interposed between the two copper foils. One copper foil bonded to the thin film layer is implemented as a bonding layer, and the other copper foil bonded to the thin film layer is implemented as a split layer, and the split layer is combined with the copper foil substrate by a curing glue. The bonding layer is bonded to the solder mask. 如申請專利範圍第28項所述之一種封裝體的製造方法,其中,接合層具有厚度,分拆層具有厚度,令接合層的厚度大於分拆層的厚度。 The method for manufacturing a package according to item 28 of the scope of the patent application, wherein the bonding layer has a thickness and the split layer has a thickness such that the thickness of the bonding layer is greater than the thickness of the split layer. 如申請專利範圍第25項所述之一種封裝體的製造方法,其中,電路板更是包含有絕緣體及第二線路,該絕緣體具有上表面、下表面及通孔,絕緣體與防焊層下表面接合,並包覆線路下表面,其中,絕緣體通孔與線路下表面相對應設置,令線路下表面的一部分裸露於絕緣體通孔,並令此線路下表面裸露於絕緣體通孔的部分實施為接點,且令此接點供電連通用;該第二線路具有上表面、下表面、側邊及凸部,凸部設位於第二線路下表面,該第二線路下表面接合於絕緣體上表面,其中,令第二線路凸部容設於絕緣體通孔內,並令第二線路與線路接點接合而電連通,此第二線路供電性傳輸用。 The method for manufacturing a package according to item 25 of the scope of patent application, wherein the circuit board further includes an insulator and a second circuit, the insulator has an upper surface, a lower surface and a through hole, and the insulator and the lower surface of the solder resist layer Bonding and covering the lower surface of the line, wherein the insulator through-hole is provided corresponding to the lower surface of the line, so that a part of the lower surface of the line is exposed in the insulator through-hole, and the part of the lower surface of the line exposed in the insulator through-hole is implemented as a connection The second line has an upper surface, a lower surface, a side edge, and a convex portion, and the convex portion is located on the lower surface of the second line, and the lower surface of the second line is bonded to the upper surface of the insulator, Wherein, the convex part of the second line is accommodated in the through hole of the insulator, and the second line is connected with the line contact to be electrically connected, and the second line is used for power transmission. 如申請專利範圍第25項所述之一種封裝體的製造方法,電路板更是包含有絕緣體及第二線路,其中,令線路更是還具有凸部,該凸部設位在線路下表面,該第二線路具有上表面、下表面及側邊,其中,第二線路下表面的一部分實施為接點,該絕緣體具有上表面、下表面及通孔,絕緣體是與防焊層下表面及線路下表面接合,其中,令第二線路設位於絕緣體上表面,且令絕緣體包覆第二線路下表面及其側邊,並令第二線路上表面裸露於絕緣體上表面,同時,令第二線路的接點裸露於絕緣體通孔,而線路凸部設位在通孔內,據此,令線路凸部與第二線路的接點電連通。 According to a method for manufacturing a package as described in claim 25 of the scope of patent application, the circuit board further includes an insulator and a second circuit, wherein the circuit further has a convex portion, which is located on the lower surface of the circuit. The second circuit has an upper surface, a lower surface, and a side. Among them, a part of the lower surface of the second circuit is implemented as a contact. The insulator has an upper surface, a lower surface, and a through hole. The insulator is connected to the lower surface of the solder resist layer and the circuit. The lower surface is bonded, wherein the second circuit is provided on the upper surface of the insulator, the insulator covers the lower surface of the second circuit and its sides, and the upper surface of the second circuit is exposed on the upper surface of the insulator. The contacts of the circuit board are exposed through the insulator through-holes, and the line convex portions are located in the through-holes, and accordingly, the line convex portions and the contacts of the second line are electrically connected. 一種封裝體的製造方法,其包含有:步驟一:提供一電路板及載板的結構,該電路板具有線路及防焊層,其中,線路至少是由一端點組成,此線路具有上表面、下表面及側邊;防焊層具有上表面、下表面、側邊、預留開孔及凸部,此凸部設位於防焊層上表面,其中,防焊層下表面與線路上表面接合,且防焊層預留開孔與線路端點相對應設置,防焊層是由絕緣物質組成;載板具有上表面、下表面、側邊及開孔,開孔具有邊牆,載板下表面與防焊層接合,並令此載板開孔是與防焊層預留開孔及線路端點相對應設置,其中,令防焊層的凸部容置於載板開孔內並與載板開孔的邊牆接合,據此,令防焊層是與載板下表面 及載板開孔的邊牆接合;步驟二:提供晶片、導電件及塑料,先將晶片與電路板接合,並令晶片與電路板電連通,再使塑料包覆晶片、導電件及電路板;及步驟三:提供一開孔工序,將防焊層的預留盲孔轉換成開孔,使線路端點得以對外電連通。 A method for manufacturing a package includes the following steps: providing a circuit board and a carrier board structure, the circuit board having a circuit and a solder mask, wherein the circuit is composed of at least one end point, and the circuit has an upper surface, Lower surface and sides; the solder mask layer has an upper surface, a lower surface, a side edge, a reserved opening and a convex portion, and the convex portion is provided on the upper surface of the solder mask layer, wherein the lower surface of the solder mask layer is connected to the upper surface of the circuit And the solder mask is provided with an opening corresponding to the end of the line, the solder mask is composed of an insulating material; the carrier board has an upper surface, a lower surface, sides and openings, and the opening has a side wall, under the carrier board The surface is joined with the solder mask layer, and the opening of the carrier board is set corresponding to the reserved opening of the solder mask layer and the end point of the line. Among them, the convex part of the solder mask layer is accommodated in the opening of the carrier board and The side walls of the openings of the carrier board are joined, so that the solder mask is connected to the lower surface of the carrier board. And the side wall of the opening of the carrier board; Step 2: Provide the chip, conductive member and plastic, first connect the chip to the circuit board, and make the chip and the circuit board electrically communicate, and then cover the chip, the conductive member and the circuit board with plastic ; And step three: providing an opening process to convert the reserved blind hole of the solder mask layer into an opening, so that the end of the line can be electrically connected to the outside. 如申請專利範圍第32項所述之一種封裝體的製造方法,其中,完成步驟三後,令電路板防焊層凸部的至少一部分不與載板開孔的邊牆接合。 The method for manufacturing a package according to item 32 of the scope of the patent application, wherein after step 3 is completed, at least a part of the protruding portion of the solder mask layer of the circuit board is not joined to the side wall of the opening of the carrier board. 如申請專利範圍第32項所述之一種封裝體的製造方法,其中,電路板防焊層包覆線路側邊。 The method for manufacturing a package according to item 32 of the scope of patent application, wherein the circuit board solder resist layer covers the side of the circuit. 如申請專利範圍第32項所述之一種封裝體的製造方法,其中,完成步驟三後,提供具有電磁屏蔽功效的薄膜,並將薄膜設置在塑料表面、電路板側邊及載板側邊。 The method for manufacturing a package according to item 32 of the scope of patent application, wherein after step 3 is completed, a film with electromagnetic shielding effect is provided, and the film is disposed on a plastic surface, a circuit board side, and a carrier board side. 如申請專利範圍第32項所述之一種封裝體的製造方法,其中,此電路板及載板的結構,更是還包含有第二防焊層及另一載板,第二防焊層與載板上表面接合,此另一載板至少是由是銅箔基板、固化膠及可分拆銅箔堆疊組成,該銅箔基板是由二層銅箔及黏著膠組成,其中,黏著膠是介於二銅箔之間,該可分拆銅箔是由二銅箔及薄膜層組成,薄膜層是將二銅箔接合在一起,並令薄膜層是介於二銅箔之間,其中,令該與薄膜層接合的一銅箔實施為接合層,並令該另一與薄膜層接合的銅箔實施為分拆層,且此分拆層藉固化膠與銅箔基板結合在一起,此另一載板藉接合層與該第二防焊層接合。 The method for manufacturing a package as described in claim 32 of the scope of patent application, wherein the structure of the circuit board and the carrier board further includes a second solder mask layer and another carrier board, the second solder mask layer and The upper surface of the carrier board is bonded, and this other carrier board is at least composed of a copper foil substrate, a cured adhesive, and a detachable copper foil stack. The copper foil substrate is composed of two layers of copper foil and an adhesive, wherein the adhesive is Interposed between two copper foils, the detachable copper foil is composed of two copper foils and a thin film layer. The thin film layer joins the two copper foils together, and the thin film layer is interposed between the two copper foils. Among them, A copper foil bonded to the thin film layer is implemented as a bonding layer, and another copper foil bonded to the thin film layer is implemented as a split layer, and the split layer is combined with the copper foil substrate by a curing glue. The other carrier board is bonded to the second solder resist layer by a bonding layer. 如申請專利範圍第36項所述之一種封裝體的製造方法,其中,接合層具有厚度,分拆層具有厚度,令接合層的厚度大於分拆層的厚度。 The method for manufacturing a package according to item 36 of the scope of the patent application, wherein the bonding layer has a thickness and the split layer has a thickness such that the thickness of the bonding layer is greater than the thickness of the split layer. 如申請專利範圍第36項所述之一種封裝體的製造方法,其中,在完成步驟二後,並在實施步驟三前,更是還包含有一移除工序,此移除工序是將該另一載板移除。 The method for manufacturing a package according to item 36 of the scope of patent application, wherein after the step 2 is completed and before the step 3 is performed, the method further includes a removing step, and the removing step is to remove the other Carrier board removed. 如申請專利範圍第38項所述之一種封裝體的製造方法,其中,在完成該移除工序後,並在完成步驟三後,令第二防焊層具有貫穿狀開孔,並令此貫穿狀開孔是與載板開孔、防焊層開孔及線路端點相對應設置。 The method for manufacturing a package according to item 38 of the scope of patent application, wherein after the removal process is completed and after step 3 is completed, the second solder resist layer has a through-hole opening, and the through The openings are arranged corresponding to the openings of the carrier board, the openings of the solder mask layer and the end points of the line.
TW107137405A 2017-12-18 2018-10-23 A structure of a Printing Circuit Board and a carrier and methods of manufacturing semiconductor package TW201931964A (en)

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* Cited by examiner, † Cited by third party
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CN115903300A (en) * 2021-08-18 2023-04-04 庆鼎精密电子(淮安)有限公司 Backlight plate and manufacturing method thereof
CN115903300B (en) * 2021-08-18 2024-06-07 庆鼎精密电子(淮安)有限公司 Backlight plate and manufacturing method thereof

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