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TW201913065A - Electronic component press-bonding unit and testing device used for the same capable of regulating press-bonding force and displacement speed of a press-picking device to meet testing requirement of various types of electronic components - Google Patents

Electronic component press-bonding unit and testing device used for the same capable of regulating press-bonding force and displacement speed of a press-picking device to meet testing requirement of various types of electronic components Download PDF

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Publication number
TW201913065A
TW201913065A TW106129018A TW106129018A TW201913065A TW 201913065 A TW201913065 A TW 201913065A TW 106129018 A TW106129018 A TW 106129018A TW 106129018 A TW106129018 A TW 106129018A TW 201913065 A TW201913065 A TW 201913065A
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Taiwan
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wheel
transmission
electronic component
press
intermediate wheel
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TW106129018A
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Chinese (zh)
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TWI658271B (en
Inventor
謝旼達
張家俊
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鴻勁精密股份有限公司
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Priority to TW106129018A priority Critical patent/TWI658271B/en
Priority to CN201810421365.XA priority patent/CN109387709B/en
Priority to KR2020180002058U priority patent/KR200490045Y1/en
Publication of TW201913065A publication Critical patent/TW201913065A/en
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Publication of TWI658271B publication Critical patent/TWI658271B/en

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Abstract

Provided are an electronic component press-bonding unit and a testing device used for the same. The press-bonding unit mainly comprises a press-picking mechanism, a first-direction motor and at least two transmission sets. The press-picking mechanism is provided with a press-picking device connected to a guide screw rod. t least two transmission sets are connectedly disposed between an output shaft of the first-direction motor and the guide screw rod of the press-picking mechanism. Each of the transmission sets is provided with a driving wheel on the output shaft of the first-direction motor to contact and drive an intermediate wheel. Each of the intermediate wheels is coaxially pivoted with a transmission wheel to couple with a driven wheel on the guide screw rod, the driving wheel, the intermediate wheel, the transmission wheel and the driven wheel of each transmission set. In addition, the intermediate wheel and the transmission wheel of each of the transmission sets are respectively controlled to be coupled and driven or to be separated by a clutch structure, so that the first-direction motor and the guide screw rod are switched to be coupled and driven by each of the transmission sets, and the press-bonding force and the displacement speed of the press-picking device are regulated to meet the testing requirements of various types of electronic components, and to achieve the practical benefits of ensuring test quality, improving apparatus usage efficiency and saving equipment costs.

Description

電子元件壓接單元及其應用之測試設備  Electronic component crimping unit and test equipment for its application  

本發明係提供一種可改變壓取器之壓接力量及位移速度,以因應各種類型電子元件的測試作業需求,並達到確保測試品質、提升設備使用效能及節省設備成本之電子元件壓接單元及其應用之測試設備。 The invention provides an electronic component crimping unit capable of changing the crimping force and the displacement speed of the presser in response to the test operation requirements of various types of electronic components, and achieving the test quality, improving the use efficiency of the device and saving the equipment cost. Test equipment for its application.

在現今,電子元件(例如具錫球之IC)概分為邏輯IC、記憶體IC、類比IC及微元件IC等不同類型,不同類型電子元件之錫球的位置及數量不盡相同,然不論任何類型之電子元件,皆必須於測試設備上進行測試作業,以淘汰出不良品,而確保產品品質。 In today's world, electronic components (such as ICs with solder balls) are divided into logic ICs, memory ICs, analog ICs, and micro-component ICs. The positions and quantities of solder balls of different types of electronic components are different. Any type of electronic component must be tested on the test equipment to eliminate defective products and ensure product quality.

請參閱第1、2圖,習知之測試設備主要係於機台配置有測試裝置10及壓接單元11;該測試裝置10係於一測試電路板101上設有複數個測試套座102,並於該各測試套座102內設有複數支探針103,各探針103下方則分別設有彈簧104,使各探針103可作彈性伸縮位移;該壓接單元11係可驅動位移至測試裝置10上方,該壓接單元11設有一由驅動機構驅動作第一方向(如Z方向)位移之壓取器111,該壓取器111之底部於對應各測試套座102位置分別設有可為吸嘴之下壓頭,以同時取放複數個電子元件20,其中,該驅動機構係設有一馬達112,該馬達112之輸出軸以一皮帶輪組113連結一導螺桿114,該壓取器111則以螺套螺合於該導螺桿114上,使馬達112可經由皮帶輪組113傳動該導螺桿114旋轉,再由導螺桿 114帶動壓取器111作升、降位移;請參閱第3、4圖,於執行測試作業時,當壓接單元11將複數個電子元件20移載至測試裝置10上方後,其係以馬達112驅動皮帶輪組113,並經由皮帶輪組113傳動該導螺桿114旋轉,而帶動壓取器111作第一方向(如Z方向)下壓位移,並將各電子元件20置入對應之測試套座102中,使各電子元件20之各錫球201分別接觸各測試套座102內之各探針103,而為了使電子元件20之各錫球201確實的接觸測試套座102內之各探針103,以確保測試品質,其係持續將各電子元件20下壓一適當距離,以確保電子元件20之各錫球201與測試套座102內之各探針103相接觸,即可同時執行複數個電子元件20之測試作業;另當壓取器111下壓電子元件20時,為了使各探針103可受到電子元件20之各錫球201壓抵而壓縮彈簧104,該驅動機構之馬達112必須能輸出足夠的扭力,使壓取器111的下壓力足夠克服所有彈簧104產生的反作用力,才可確保電子元件20之各錫球201與測試套座102內之各探針103相接觸,因此,於選擇配置馬達112時,除了必須考量馬達112輸出的轉速,使壓取器111快速的升降位移,以提升作業效率外,更必須考量馬達112輸出的扭力,使壓取器111的下壓力足夠克服所有彈簧104產生的反作用力,而於轉速及扭力的雙重考量下選擇配置適當的馬達112;惟,由於電子元件之類型繁多,且不同類型電子元件之錫球的位置及數量不盡相同,當於該機台執行其他不同類型電子元件之測試作業時,若執行測試作業之電子元件的錫球數量較少時,則可於機台上換裝其他對應之測試裝置,由於該各測試套座內之探針及彈簧數量係對應該類型電子元件之錫球數量而減少,相對的,所有彈簧產生的反作用力降低,則馬達112帶動壓取器111所產生的下壓力仍足以克服所有彈簧所產生的反作用力,而可執行測試作業;然而,當執行測試作業之電子元件的錫球數量較多時,則於機 台上換裝另一對應之測試裝置,由於該測試裝置之各測試套座內的探針及彈簧數量係對應該類型電子元件之錫球數量而增加,相對的,所有彈簧產生的反作用力提高,而可能產生該馬達112帶動壓取器111所產生的下壓力無法克服所有彈簧所產生的反作用力之情況,使壓取器111難以將電子元件持續下壓各探針而壓縮各彈簧,而無法確保電子元件之各錫球與測試套座內之各探針相接觸,進而影響測試品質。 Please refer to the first and second figures. The test equipment is mainly provided with a test device 10 and a crimping unit 11 on the machine base. The test device 10 is provided with a plurality of test sockets 102 on a test circuit board 101, and A plurality of probes 103 are disposed in each of the test sockets 102, and springs 104 are respectively disposed under the probes 103, so that the probes 103 can be elastically stretched and displaced; the crimping unit 11 can drive displacement to the test. Above the device 10, the crimping unit 11 is provided with a presser 111 driven by a driving mechanism to be displaced in a first direction (such as a Z direction). The bottom of the presser 111 is respectively provided at a position corresponding to each test socket 102. A plurality of electronic components 20 are disposed at the same time, and the driving mechanism is provided with a motor 112. The output shaft of the motor 112 is coupled to a lead screw 114 by a pulley set 113. The presser The screw 112 is screwed onto the lead screw 114, so that the motor 112 can drive the lead screw 114 to rotate via the pulley set 113, and then the lead screw 114 drives the presser 111 to raise and lower the displacement; 4, when the test operation is performed, when the crimping unit 11 will be plural After the electronic component 20 is transferred to the upper side of the test device 10, it drives the pulley set 113 with the motor 112, and drives the lead screw 114 to rotate via the pulley set 113, and drives the presser 111 to perform the first direction (such as the Z direction). Pressure displacement, and each electronic component 20 is placed in the corresponding test socket 102, so that each solder ball 201 of each electronic component 20 contacts each probe 103 in each test socket 102, and in order to make the electronic component 20 Each of the solder balls 201 surely contacts the probes 103 in the test socket 102 to ensure test quality, and the electronic components 20 are continuously pressed down by an appropriate distance to ensure the solder balls 201 and test sleeves of the electronic components 20. When the probes 103 in the block 102 are in contact, the test operations of the plurality of electronic components 20 can be performed simultaneously. When the presser 111 presses down the electronic components 20, in order to allow the probes 103 to be received by the electronic components 20 The solder ball 201 is pressed against the compression spring 104, and the motor 112 of the drive mechanism must be able to output sufficient torque so that the downforce of the presser 111 is sufficient to overcome the reaction force generated by all the springs 104 to ensure the tin of the electronic component 20. Ball 201 and test socket 102 The probes 103 are in contact with each other. Therefore, in order to selectively configure the motor 112, in addition to having to consider the rotational speed outputted by the motor 112, the presser 111 is quickly moved up and down to improve the working efficiency, and the torque outputted by the motor 112 must be considered. The downward pressure of the presser 111 is sufficient to overcome the reaction force generated by all the springs 104, and the appropriate motor 112 is selected under the double consideration of the rotational speed and the torque; however, due to the various types of electronic components and different types of electronic components The position and quantity of the solder balls are not the same. When the test of other different types of electronic components is performed on the machine, if the number of solder balls of the electronic components performing the test operation is small, the machine can be replaced with other machines. Corresponding test device, because the number of probes and springs in the test sockets is reduced according to the number of solder balls of the type of electronic components, and vice versa, the reaction force generated by all the springs is reduced, and the motor 112 drives the presser 111. The resulting downforce is still sufficient to overcome the reaction forces generated by all the springs, and the test can be performed; however, when performing the test operation When the number of solder balls of the sub-component is large, another corresponding test device is replaced on the machine table, because the number of probes and springs in each test socket of the test device is the number of solder balls corresponding to the type of electronic components. Increasingly, in contrast, the reaction force generated by all the springs is increased, and the downforce generated by the motor 112 to drive the presser 111 may not overcome the reaction force generated by all the springs, making it difficult for the presser 111 to carry the electrons. The components continue to press down the probes to compress the springs, and it is impossible to ensure that the solder balls of the electronic components are in contact with the probes in the test socket, thereby affecting the test quality.

為解決上述之缺弊,其雖可於機台上裝設具較大輸出扭力之馬達,以因應各種不同電子元件之測試作業需求,然而,輸出扭力愈大之馬達,除了成本較高外,且體積較大而不利於空間的配置,此外輸出扭力愈大之馬達則輸出轉速愈慢,相對的,將使馬達帶動壓取器升降位移的速度變慢,而影響整體的測試作業效率;因此,於各種不同電子元件之測試作業需求及測試作業效率的雙重考量下,即必須購置各種分別具有不同輸出扭力馬達之測試設備,而依據各種不同電子元件之測試作業需求於不同的測試設備上進行測試作業,其不僅降低各測試設備之使用效能,更大幅增加設備成本。 In order to solve the above drawbacks, a motor with a large output torque can be installed on the machine to meet the test operation requirements of various electronic components. However, the motor with higher output torque is higher in cost. Moreover, the larger the volume is not conducive to the configuration of the space, and the more the output torque is, the slower the output speed is. In contrast, the speed at which the motor drives the lifter to move up and down becomes slower, which affects the overall test work efficiency; Under the double consideration of the test operation requirements and test efficiency of various electronic components, it is necessary to purchase various test equipments with different output torque motors, and perform different test equipment according to the test operation requirements of various electronic components. Test operations, which not only reduce the performance of each test equipment, but also significantly increase equipment costs.

有鑑於此,本發明人遂以其多年從事相關行業的研發與製作經驗,針對目前所面臨之問題深入研究,經過長期努力之研究與試作,終究研創出一種電子元件壓接單元及其應用之測試設備,以有效改善先前技術之缺點,此即為本發明之設計宗旨。 In view of this, the inventor has been engaged in research and development and production experience of related industries for many years, and has conducted in-depth research on the problems currently faced. After long-term efforts and trials, he has finally developed an electronic component crimping unit and its application. Test equipment to effectively improve the shortcomings of the prior art is the design object of the present invention.

本發明之目的一,係提供一種電子元件壓接單元,該壓接單元主要包含有壓取機構、第一方向馬達及至少二傳動組;該壓取機構係設有一連結於導螺桿之壓取器,該第一方向馬達之輸出軸與壓取機構之導螺桿間則連結設有至少二傳動組,該各傳動組係於分別於第一方向馬達之輸出軸上設有驅動輪,以分別連結帶動一中間輪,於各中間輪則分別同軸樞設有傳動輪,以連結導螺桿上的 從動輪,並使各傳動組之驅動輪、中間輪、傳動輪及從動輪具不同的相對轉速比,另分別以離合結構控制該各傳動組之中間輪及傳動輪連結傳動或分離,使該第一方向馬達與該導螺桿藉由該各傳動組作變換連結傳動,而調變該壓取器之壓接力量及位移速度,以因應各種類型電子元件的測試作業需求,並達到確保測試品質之實用目的。 An object of the present invention is to provide an electronic component crimping unit, which mainly comprises a pressing mechanism, a first direction motor and at least two transmission groups; the pressing mechanism is provided with a pressing force connected to the lead screw At least two transmission groups are connected between the output shaft of the first direction motor and the lead screw of the pressing mechanism, and the transmission groups are respectively provided with driving wheels on the output shafts of the first direction motors respectively The connecting belt drives an intermediate wheel, and the intermediate wheels are coaxially arranged with a transmission wheel to connect the driven wheels on the lead screw, and the driving wheels, the intermediate wheel, the transmission wheel and the driven wheel of each transmission group have different relative rotational speeds. In addition, the intermediate wheel and the transmission wheel of the respective transmission groups are respectively controlled to be driven or separated by a clutch structure, so that the first direction motor and the lead screw are converted and coupled by the transmission groups, and the pressure is modulated. The crimping force and displacement speed of the device are used to meet the testing needs of various types of electronic components and achieve the practical purpose of ensuring the quality of the test.

本發明之目的二,係提供一種電子元件壓接單元,其係以離合結構分別控制各傳動組之中間輪與傳動輪連結傳動或分離,使該第一方向馬達與該導螺桿藉由該各傳動組作變換連結傳動,而改變由該導螺桿輸出之扭力及轉速,並調變該壓取器之壓接力量及位移速度,進而可在不需更換馬達及在原有的機台上,提供適當的壓接力量及位移速度,以因應各種類型電子元件的測試作業需求,達到提升設備使用效能及節省設備成本之實用目的。 A second object of the present invention is to provide an electronic component crimping unit that controls a transmission and separation of an intermediate wheel and a transmission wheel of each transmission group by a clutch structure, so that the first direction motor and the lead screw are respectively The transmission group is used for changing and connecting the transmission, and changing the torque and the rotational speed outputted by the lead screw, and adjusting the crimping force and the displacement speed of the pressurer, thereby providing the motor without replacing the motor and the original machine. Appropriate crimping force and displacement speed can meet the practical needs of improving the equipment performance and saving equipment cost in response to the test operation requirements of various types of electronic components.

本發明之目的三,係提供一種應用電子元件壓接單元之測試設備,其係於機台上配置有供料裝置、收料裝置、測試裝置、輸送裝置及控制裝置,該供料裝置係設有至少一容納待測電子元件之供料承置器,該收料裝置係設有至少一容納已作業電子元件之收料承置器,該測試裝置係設有至少一具測試套座之測試電路板,用以對電子元件執行測試作業,該輸送裝置設有至少一本發明之壓接單元,以將電子元件移載至測試裝置,該控制裝置係用以控制及整合各裝置作動,而執行自動化作業,並達到確保作業品質、提升設備使用效能及節省設備成本之實用目的。 A third object of the present invention is to provide a testing device for applying an electronic component crimping unit, which is provided with a feeding device, a receiving device, a testing device, a conveying device and a control device, and the feeding device is provided on the machine table. Having at least one supply receptacle for accommodating the electronic component to be tested, the receiving device is provided with at least one receiving receptacle for accommodating the electronic component to be tested, and the testing device is provided with at least one test socket test a circuit board for performing a test operation on an electronic component, the transport device being provided with at least one crimping unit of the present invention for transferring electronic components to a test device for controlling and integrating the actuation of the devices, and Perform automated operations and achieve practical goals of ensuring job quality, improving equipment efficiency, and saving equipment costs.

習知部分: Conventional part:

10‧‧‧測試裝置 10‧‧‧Testing device

101‧‧‧測試電路板 101‧‧‧Test circuit board

102‧‧‧測試套座 102‧‧‧Test kit

103‧‧‧探針 103‧‧‧Probe

104‧‧‧彈簧 104‧‧‧ Spring

11‧‧‧壓接單元 11‧‧‧Crimping unit

111‧‧‧壓取器 111‧‧‧Presser

112‧‧‧馬達 112‧‧‧Motor

113‧‧‧皮帶輪組 113‧‧‧ Pulley set

114‧‧‧導螺桿 114‧‧‧ lead screw

20‧‧‧電子元件 20‧‧‧Electronic components

201‧‧‧錫球 201‧‧‧ solder balls

本發明部份: Part of the invention:

30‧‧‧壓接單元 30‧‧‧Crimping unit

30’‧‧‧壓接單元 30’‧‧‧Crimping unit

31‧‧‧壓取機構 31‧‧‧Picking mechanism

31’‧‧‧壓取機構 31’‧‧‧Picking agency

311‧‧‧機座 311‧‧‧ machine base

312‧‧‧導螺桿 312‧‧‧ lead screw

312’‧‧‧導螺桿 312'‧‧‧ lead screw

3121‧‧‧螺套 3121‧‧‧Spiral sleeve

313‧‧‧壓取器 313‧‧‧Presser

313’‧‧‧壓取器 313'‧‧‧Presser

3131‧‧‧下壓頭 3131‧‧‧Under the indenter

314‧‧‧滑座 314‧‧‧Slide

3141‧‧‧滑軌 3141‧‧‧Slide rails

32‧‧‧第一方向馬達 32‧‧‧First direction motor

32’‧‧‧第一方向馬達 32’‧‧‧First direction motor

33‧‧‧第一傳動組 33‧‧‧First Transmission Group

33’‧‧‧第一傳動組 33’‧‧‧First Transmission Group

331‧‧‧第一驅動輪 331‧‧‧First drive wheel

331’‧‧‧第一驅動輪 331’‧‧‧First drive wheel

332‧‧‧第一中間輪 332‧‧‧First Intermediate Wheel

332’‧‧‧第一中間輪 332’‧‧‧First Intermediate Wheel

3321‧‧‧第一支撐軸 3321‧‧‧First support shaft

333‧‧‧第一撓性件 333‧‧‧First Flexure

333’‧‧‧第一撓性件 333’‧‧‧First Flexure

334‧‧‧第一傳動輪 334‧‧‧First transmission wheel

334’‧‧‧第一傳動輪 334’‧‧‧First transmission wheel

335‧‧‧第一從動輪 335‧‧‧First driven wheel

335’‧‧‧第一從動輪 335’‧‧‧First driven wheel

336‧‧‧第三撓性件 336‧‧‧3rd flexure

336’‧‧‧第三撓性件 336’‧‧‧ Third Flexor

337‧‧‧第一桿件 337‧‧‧First member

3371‧‧‧第一承座 3371‧‧‧First seat

3372‧‧‧第一止推軸承 3372‧‧‧First thrust bearing

338‧‧‧第一壓缸 338‧‧‧First pressure cylinder

339‧‧‧第一彈性件 339‧‧‧First elastic parts

34‧‧‧第二傳動組 34‧‧‧Second gear set

34’‧‧‧第二傳動組 34’‧‧‧Second gear set

341‧‧‧第二驅動輪 341‧‧‧Second drive wheel

341’‧‧‧第二驅動輪 341’‧‧‧Second drive wheel

342‧‧‧第二中間輪 342‧‧‧second intermediate wheel

342’‧‧‧第二中間輪 342’‧‧‧second intermediate wheel

3421‧‧‧第二支撐軸 3421‧‧‧second support shaft

343‧‧‧第二撓性件 343‧‧‧Second flexure

343’‧‧‧第二撓性件 343'‧‧‧Second flexure

344‧‧‧第二傳動輪 344‧‧‧Second drive wheel

344’‧‧‧第二傳動輪 344’‧‧‧second drive wheel

345‧‧‧第二從動輪 345‧‧‧Second driven wheel

345’‧‧‧第二從動輪 345’‧‧‧Second driven wheel

346‧‧‧第四撓性件 346‧‧‧Fourth flexure

346’‧‧‧第四撓性件 346'‧‧‧Fourth flexure

347‧‧‧第二桿件 347‧‧‧Second bars

3471‧‧‧第二承座 3471‧‧‧Second seat

3472‧‧‧第二止推軸承 3472‧‧‧Second thrust bearing

348‧‧‧第二壓缸 348‧‧‧Second pressure cylinder

349‧‧‧第二彈性件 349‧‧‧Second elastic parts

347‧‧‧第二桿件 347‧‧‧Second bars

348‧‧‧第二壓缸 348‧‧‧Second pressure cylinder

349‧‧‧第二承座 349‧‧‧Second seat

3491‧‧‧第二止推軸承 3491‧‧‧Second thrust bearing

40‧‧‧機台 40‧‧‧ machine

41‧‧‧測試裝置 41‧‧‧Testing device

41a‧‧‧測試裝置 41a‧‧‧Testing device

411‧‧‧測試電路板 411‧‧‧Test circuit board

411a‧‧‧測試電路板 411a‧‧‧Test circuit board

412‧‧‧測試套座 412‧‧‧Test kit

412a‧‧‧測試套座 412a‧‧‧ test kit

413‧‧‧探針 413‧‧‧ probe

413a‧‧‧探針 413a‧‧‧Probe

414‧‧‧彈簧 414‧‧‧ Spring

414a‧‧‧彈簧 414a‧‧ ‧ spring

42‧‧‧電子元件 42‧‧‧Electronic components

421‧‧‧錫球 421‧‧‧ solder balls

43‧‧‧電子元件 43‧‧‧Electronic components

431‧‧‧錫球 431‧‧‧ solder balls

60‧‧‧機台 60‧‧‧ machine

61‧‧‧供料裝置 61‧‧‧Feeding device

611‧‧‧供料承置器 611‧‧‧Feeder

62‧‧‧收料裝置 62‧‧‧Receiving device

621‧‧‧收料承置器 621‧‧‧Receipt receiver

63‧‧‧測試裝置 63‧‧‧Testing device

631‧‧‧測試電路板 631‧‧‧Test circuit board

632‧‧‧測試套座 632‧‧‧Test kit

64‧‧‧輸送裝置 64‧‧‧Conveyor

641‧‧‧第一拾取器 641‧‧‧First Picker

642‧‧‧第一供料載台 642‧‧‧First feeding platform

643‧‧‧第二供料載台 643‧‧‧Second feed stage

644‧‧‧第一組壓接單元 644‧‧‧First set of crimping units

645‧‧‧第二組壓接單元 645‧‧‧Second group crimping unit

646‧‧‧第一收料載台 646‧‧‧First receiving platform

647‧‧‧第二收料載台 647‧‧‧Second receiving platform

648‧‧‧第二拾取器 648‧‧‧Second Picker

第1圖:習知電子元件測試設備之示意圖。 Figure 1: Schematic diagram of a conventional electronic component test equipment.

第2圖:係第1圖測試設備之測試裝置的部分放大示意圖。 Fig. 2 is a partially enlarged schematic view showing the test apparatus of the test apparatus of Fig. 1.

第3圖:習知電子元件測試設備之使用示意圖。 Figure 3: Schematic diagram of the use of conventional electronic component test equipment.

第4圖:係第3圖之部分放大示意圖。 Fig. 4 is a partially enlarged schematic view of Fig. 3.

第5圖:本發明第一實施例之結構示意圖。 Fig. 5 is a schematic view showing the structure of the first embodiment of the present invention.

第6圖:本發明第一實施例第一、二傳動組之立體圖。 Figure 6 is a perspective view of the first and second transmission groups of the first embodiment of the present invention.

第7圖:本發明第一實施例第一、二傳動組之俯視圖。 Figure 7 is a plan view showing the first and second transmission groups of the first embodiment of the present invention.

第8圖:係第7圖之A-A剖視圖。 Fig. 8 is a cross-sectional view taken along line A-A of Fig. 7.

第9圖:本發明第一實施例壓接電子元件之示意圖(一)。 Figure 9 is a schematic view (1) of crimping an electronic component in the first embodiment of the present invention.

第10圖:係第9圖之部分放大示意圖。 Fig. 10 is a partially enlarged schematic view of Fig. 9.

第11圖:本發明第一實施例壓接電子元件之示意圖(二)。 Figure 11 is a schematic view (2) of crimping electronic components of the first embodiment of the present invention.

第12圖:本發明第一實施例壓接電子元件之示意圖(三)。 Figure 12 is a schematic view (3) of crimping electronic components of the first embodiment of the present invention.

第13圖:本發明第一實施例壓接電子元件之示意圖(四)。 Figure 13 is a schematic view (4) of crimping an electronic component in the first embodiment of the present invention.

第14圖:係第13圖之部分放大示意圖。 Figure 14 is a partial enlarged view of Fig. 13.

第15圖:本發明第一實施例壓接電子元件之示意圖(五)。 Figure 15 is a schematic view (5) of the crimping of electronic components in the first embodiment of the present invention.

第16圖:本發明第一實施例壓接另一類型電子元件之示意圖(一)。 Figure 16 is a schematic view (1) of crimping another type of electronic component in the first embodiment of the present invention.

第17圖:係第16圖之部分放大示意圖。 Figure 17 is a partial enlarged view of Fig. 16.

第18圖:本發明第一實施例壓接另一類型電子元件之示意圖(二)。 Figure 18: Schematic diagram (2) of crimping another type of electronic component in the first embodiment of the present invention.

第19圖:本發明第一實施例壓接另一類型電子元件之示意圖(三)。 Figure 19: Schematic diagram (3) of crimping another type of electronic component in the first embodiment of the present invention.

第20圖:本發明第一實施例壓接另一類型電子元件之示意圖(四)。 Figure 20: Schematic diagram (4) of crimping another type of electronic component in the first embodiment of the present invention.

第21圖:係第20圖之部分放大示意圖。 Fig. 21 is a partially enlarged schematic view of Fig. 20.

第22圖:本發明第一實施例壓接另一類型電子元件之示意圖(五)。 Figure 22: Schematic diagram (5) of crimping another type of electronic component in the first embodiment of the present invention.

第23圖:本發明第二實施例之結構示意圖。 Figure 23 is a schematic view showing the structure of a second embodiment of the present invention.

第24圖:本發明第二實施例第一、二傳動組之俯視圖。 Figure 24 is a plan view of the first and second transmission groups of the second embodiment of the present invention.

第25圖:本發明應用於測試設備之示意圖。 Figure 25: Schematic diagram of the application of the invention to a test device.

為使 貴審查委員對本發明作更進一步之瞭解,茲舉一較佳實施例並配合圖式,詳述如後:請參閱第5~8圖,本發明第一實施例之電子元件壓接單元30主要係包含有壓取機構31、第一方向馬達32及至少二傳動組;該壓取機構31係於一機座311上架設一可作第一方向(Z方向)及第二方向(X方向)位移之壓取器313,於本實施例 中,該機座311上係架設有以第一方向(Z方向)配置之導螺桿312,該導螺桿312之螺套3121則連結傳動至該壓取器313,以於該導螺桿312旋轉作動時,帶動該壓取器313作第一方向(Z方向)位移,於本實施例中,該螺套3121係連結於一可作第一方向(Z方向)升降滑移之滑座314,該滑座314上並設有第二方向(X方向)之滑軌3141,該壓取器313則滑設於該滑軌3141上,而使該壓取器313除了可藉由該滑座314的帶動作第一方向(Z方向)的升降位移外,亦可於該滑座314上作第二方向(X方向)的橫向位移;由於本申請案的重點在於第一方向(Z方向)的升降位移,因此該壓取器313第二方向(X方向)橫向位移的驅動方式在此不予贅述。該壓取器313底部係設有至少一可為吸嘴之下壓頭,以取放電子元件,於本實施例中,該壓取器313底部係設有複數個下壓頭3131,以同時取放複數個電子元件;該壓接單元30係於該壓取機構31之導螺桿312的側方位置裝設有第一方向馬達32,該壓接單元30並於該第一方向馬達32之輸出軸與該導螺桿312間連結設有至少二傳動組,於本實施例中,該第一方向馬達32之輸出軸與該導螺桿312間係連結設有第一傳動組33及第二傳動組34;其中,該第一傳動組33係於該第一方向馬達32之輸出軸上設有第一驅動輪331,以連結帶動一架設於該第一驅動輪331周側位置之第一中間輪332,於本實施例中,該第一中間輪332係以軸承架設於一第一支撐軸3321上,該第一驅動輪331與該第一中間輪332間則連結設有一為皮帶之第一撓性件333,使該第一中間輪332可藉由該第一驅動輪331及第一撓性件333的帶動,而於該第一支撐軸3321上樞轉;該第二傳動組34則於該第一方向馬達32之輸出軸上設有第二驅動輪341,以連結帶動一架設於該第二驅動輪341周側位置之第二中間輪342,於本實施例中,該第二中間輪342係以軸承架設於一第二支撐軸3421上,該第二驅動輪341 與該第二中間輪342間則連結設有一為皮帶之第二撓性件343,使該第二中間輪342可藉由該第一驅動輪331及第二撓性件343的帶動,而於該第二支撐軸3421上樞轉;另該第一傳動組33係於第一支撐軸3321上與該第一中間輪332同軸樞設有第一傳動輪334,以連結設於該導螺桿312上之第一從動輪335,於本實施例中,該第一從動輪335係鍵結於該導螺桿312上,該第一傳動輪334與該第一從動輪335間則連結設有一為皮帶之第三撓性件336,使該導螺桿312可藉由該第一傳動輪334及第三撓性件336的帶動,而由該第一從動輪335帶動樞轉;該第二傳動組34則於第二支撐軸3421上與該第二中間輪342同軸樞設有第二傳動輪344,以連結設於該導螺桿312上之第二從動輪345,於本實施例中,該第二從動輪345係鍵結於該導螺桿312上,該第二傳動輪344與該第二從動輪345間係連結設有一為皮帶之第四撓性件346,使該導螺桿312可藉由該第二傳動輪344及第四撓性件346的帶動,而由該第二從動輪345帶動樞轉;其中,該第一傳動組33之第一驅動輪331、第一中間輪332、第一傳動輪334、第一從動輪335與該第二傳動組34之第二驅動輪341、第二中間輪342、第二傳動輪344、第二從動輪345係具不同的相對轉速比,例如,該第一傳動組33之第一驅動輪331、第一中間輪332、第一傳動輪334、第一從動輪335之外徑比可為3:6:6:6,使得該第一傳動組33之第一驅動輪331、第一中間輪332、第一傳動輪334、第一從動輪335之轉速比為2:1:1:1,另該第二傳動組34之第二驅動輪341、第二中間輪342、第二傳動輪344、第二從動輪345之外徑比可為4:6:6:6,使得該第二傳動組34之第二驅動輪341、第二中間輪342、第二傳動輪344、第二從動輪345之轉速比為1.5:1:1:1,又由於第一傳動組33之第一驅動輪331與第 二傳動組34之第二驅動輪341同軸裝設於第一方向馬達32之輸出軸上,而具有相同的轉速,因此第一傳動組33之第一驅動輪331、第一中間輪332、第一傳動輪334、第一從動輪335與第二傳動組34的相對轉速比為6:3:3:3,而第二傳動組34之第二驅動輪341、第二中間輪342、第二傳動輪344、第二從動輪345與第一傳動組33的相對轉速比則為6:4:4:4;亦即第一傳動組33具有低轉速高扭力的特性,而第二傳動組34則具有高轉速低扭力的特性;此外,在第一傳動組33之第一從動輪335與第二傳動組34之第二從動輪345為具有相同的外徑時,由於都是鍵結於該導螺桿312上同動,因此亦可以單一個一體式的長形從動輪來取代。另該第一傳動組33之第一中間輪332與第一傳動輪334間係設有第一離合結構,以控制該第一中間輪332與第一傳動輪334連結傳動或分離,該第一離合結構可為手動操作或自動操作者,於本實施例中,該第一離合結構係為自動操作者,其係於該第一中間輪332與第一傳動輪334軸向穿設有複數支第一桿件337,並以第一驅動源驅動各第一桿件337位移而穿伸該第一中間輪332與第一傳動輪334,使該第一中間輪332與第一傳動輪334連結傳動,或驅動各第一桿件337位移而脫離第一中間輪332,使該第一中間輪332與第一傳動輪334分離,於本實施例中,該第一驅動源係設有供驅動各第一桿件337位移之第一壓缸338及抵推各第一桿件337反向位移之第一彈性件339,該各第一桿件337係連結於一第一承座3371上,並於該第一承座3371與第一壓缸338之伸縮桿間連結設有第一止推軸承3372,以使該第一中間輪332與第一傳動輪334可順利旋轉作動;該第二傳動組34之第二中間輪342與第二傳動輪344間則設有第二離合結構,以控制該第二中間輪342與第二傳動輪344連結傳動或分離,該第二離合結構可為手動操作或自動操作者,於本實施例中,該第 二離合結構係為自動操作者,其係於該第二中間輪342與第二傳動輪344軸向穿設有複數支第二桿件347,並以一第二驅動源驅動各第二桿件347位移而穿伸該第二中間輪342及第二傳動輪344,使該第二中間輪342與第二傳動輪344連結傳動,或驅動各第二桿件347位移而脫離第二傳動輪344,使該第二中間輪342與第二傳動輪344分離,於本實施例中,該第二驅動源係設有供驅動各第二桿件347位移之第二壓缸348及抵推各第二桿件347反向位移之第二彈性件349,該各第二桿件347係連結於第二承座3471上,並於該第二承座3471與第二壓缸348之伸縮桿間連結設有第二止推軸承3472,以使該第二中間輪342與第二傳動輪344可順利旋轉作動,而可以該第一離合結構及第二離合結構分別控制該第一傳動組33之第一中間輪332、第一傳動輪334及該第二傳動組34之第二中間輪342、第二傳動輪344作相互搭配之連結傳動或分離,使該第一方向馬達32與該導螺桿312藉由該第一傳動組33或第二傳動組34作變換連結傳動,由於該第一傳動組33之第一驅動輪331、第一中間輪332、第一傳動輪334、第一從動輪335與該第二傳動組34之第二驅動輪341、第二中間輪342、第二傳動輪344、第二從動輪345係具不同的相對轉速比,而可改變由該導螺桿312輸出之扭力及轉速,並進而調變帶動該壓取器313之壓接力量及位移速度,以因應各種類型電子元件的測試作業需求,亦即當該第一離合結構控制第一傳動組33之第一中間輪332與第一傳動輪334連結傳動,且該第二離合結構控制第二傳動組34之第二中間輪342與第二傳動輪344分離時,該第一方向馬達32與該導螺桿312即藉由該第一傳動組33作連結傳動,而可由該導螺桿312輸出之較大的扭力及較低的轉速,另當該第一離合結構控制第一傳動組33之第一中間輪332與第一傳動輪334分離,且該第二離合結構控制第二傳動組34之第 二中間輪342與第二傳動輪344連結傳動時,該第一方向馬達32與該導螺桿312即藉由該第二傳動組34作連結傳動,而可由該導螺桿312輸出之較小的扭力及較高的轉速。 In order to make the present invention further understand the present invention, a preferred embodiment and a drawing will be described in detail as follows: Please refer to FIGS. 5-8, the electronic component crimping unit of the first embodiment of the present invention. 30 mainly includes a pressing mechanism 31, a first direction motor 32 and at least two transmission groups; the pressing mechanism 31 is mounted on a base 311 for a first direction (Z direction) and a second direction (X) The direction of the displacement of the presser 313, in the embodiment, the base 311 is provided with a lead screw 312 arranged in a first direction (Z direction), and the screw sleeve 3121 of the lead screw 312 is coupled to the motor The presser 313 is configured to drive the presser 313 to be displaced in the first direction (Z direction) when the lead screw 312 is rotated. In the embodiment, the screw sleeve 3121 is coupled to the first direction. a slide rail 314 is disposed in the (Z direction), and the slide rail 314 is provided with a slide rail 3141 in a second direction (X direction). The presser 313 is slidably disposed on the slide rail 3141. In addition to the lifting and lowering of the first direction (Z direction) of the belt action of the carriage 314, the presser 313 can also perform the second direction on the carriage 314 (X). The lateral displacement of the direction; since the focus of the present application is the lifting displacement of the first direction (Z direction), the driving manner of the lateral displacement of the second direction (X direction) of the presser 313 is not described herein. The bottom of the presser 313 is provided with at least one indenter under the nozzle for picking up and placing electronic components. In the embodiment, the bottom of the presser 313 is provided with a plurality of lower indenters 3131 at the same time. And a plurality of electronic components are disposed; the crimping unit 30 is disposed at a lateral position of the lead screw 312 of the pressing mechanism 31, and the first direction motor 32 is disposed in the first direction motor 32. At least two transmission groups are connected between the output shaft and the lead screw 312. In this embodiment, the output shaft of the first direction motor 32 and the lead screw 312 are coupled to each other to provide a first transmission group 33 and a second transmission. The first transmission group 33 is provided with a first driving wheel 331 on the output shaft of the first direction motor 32 to connect and drive a first intermediate position disposed on the circumferential side of the first driving wheel 331. In the embodiment, the first intermediate wheel 332 is mounted on a first support shaft 3321 by a bearing, and the first drive wheel 331 and the first intermediate wheel 332 are coupled to each other. a flexure 333, the first intermediate wheel 332 can be supported by the first driving wheel 331 and the first flexure 333 And driving on the first support shaft 3321; the second drive set 34 is provided with a second drive wheel 341 on the output shaft of the first direction motor 32, so as to be coupled to drive the second support wheel 341 In the present embodiment, the second intermediate wheel 342 is mounted on a second support shaft 3421, the second drive wheel 341 and the second intermediate wheel. 342 is connected to a second flexible member 343 which is a belt, so that the second intermediate wheel 342 can be driven by the first driving wheel 331 and the second flexible member 343, and the second supporting shaft 3421 The first transmission group 33 is coupled to the first intermediate wheel 332 and the first transmission wheel 334 is coaxially disposed on the first support shaft 3321 to connect the first driven wheel disposed on the lead screw 312. 335. In this embodiment, the first driven wheel 335 is coupled to the lead screw 312, and a third flexure is provided as a belt between the first driving wheel 334 and the first driven wheel 335. The lead screw 312 can be driven by the first driving wheel 334 and the third flexible member 336 by the first driven wheel 335. The second transmission group 34 is coaxially disposed with the second transmission wheel 344 on the second support shaft 3421 and coupled to the second intermediate wheel 342 to connect the second driven wheel 345 disposed on the lead screw 312. In this embodiment, the second driven wheel 345 is coupled to the lead screw 312, and the second driving member 344 is coupled to the second driven wheel 345 to provide a fourth flexure 346 for the belt. The lead screw 312 can be driven by the second driven wheel 344 and the fourth driven member 346 to be pivoted by the second driven wheel 345; wherein the first driving wheel 331 of the first transmission set 33 The first intermediate wheel 332, the first transmission wheel 334, the first driven wheel 335, and the second drive wheel 341, the second intermediate wheel 342, the second transmission wheel 344, and the second driven wheel 345 of the second transmission set 34 are The ratio of the outer diameter of the first driving wheel 331, the first intermediate wheel 332, the first transmitting wheel 334, and the first driven wheel 335 of the first transmission group 33 can be 3:6:6. :6, the rotation ratio of the first driving wheel 331, the first intermediate wheel 332, the first transmission wheel 334, and the first driven wheel 335 of the first transmission group 33 is 2 1:1:1, the second drive wheel 341, the second intermediate wheel 342, the second drive wheel 344, and the second driven wheel 345 of the second transmission set 34 may have an outer diameter ratio of 4:6:6:6. Therefore, the rotation ratio of the second driving wheel 341, the second intermediate wheel 342, the second transmission wheel 344, and the second driven wheel 345 of the second transmission group 34 is 1.5:1:1:1, and the first transmission group The first driving wheel 331 of 33 and the second driving wheel 341 of the second transmission group 34 are coaxially mounted on the output shaft of the first direction motor 32, and have the same rotational speed, so the first driving wheel of the first transmission group 33 331. The relative rotational speed ratio of the first intermediate wheel 332, the first transmission wheel 334, the first driven wheel 335 and the second transmission set 34 is 6:3:3:3, and the second driving wheel 341 of the second transmission set 34 The ratio of the relative rotation speeds of the second intermediate wheel 342, the second transmission wheel 344, and the second driven wheel 345 to the first transmission group 33 is 6:4:4:4; that is, the first transmission group 33 has a low rotation speed and a high torque. The second transmission set 34 has the characteristics of high rotational speed and low torque; in addition, the first driven wheel 335 of the first transmission set 33 and the second driven wheel of the second transmission set 34 When 345 has the same outer diameter, since both of them are bonded to the lead screw 312, they can be replaced by a single integrated long driven wheel. A first clutch structure is disposed between the first intermediate wheel 332 of the first transmission group 33 and the first transmission wheel 334 to control the first intermediate wheel 332 to be coupled or disconnected from the first transmission wheel 334. The clutch structure may be a manual operation or an automatic operator. In this embodiment, the first clutch structure is an automatic operator, and the first intermediate wheel 332 and the first transmission wheel 334 are axially provided with a plurality of branches. The first rod member 337 drives the first rod member 337 to be displaced by the first driving source to extend the first intermediate wheel 332 and the first transmission wheel 334 to connect the first intermediate wheel 332 with the first transmission wheel 334. The first intermediate wheel 332 is disengaged from the first intermediate wheel 332, and the first intermediate wheel 332 is separated from the first transmission wheel 334. In this embodiment, the first driving source is provided for driving. a first pressure cylinder 338 that is displaced by the first rod member 337 and a first elastic member 339 that is oppositely displaced from the first rod member 337. The first rod members 337 are coupled to a first socket 3371. And a first thrust bearing 3372 is coupled between the first socket 3371 and the telescopic rod of the first pressure cylinder 338 to enable the An intermediate wheel 332 and the first transmission wheel 334 can be smoothly rotated; a second clutch structure is disposed between the second intermediate wheel 342 and the second transmission wheel 344 of the second transmission set 34 to control the second intermediate wheel 342. The second transmission structure can be a manual operation or an automatic operator. In this embodiment, the second clutch structure is an automatic operator, and the second intermediate wheel is attached to the second intermediate wheel. 342 and the second transmission wheel 344 are axially disposed with a plurality of second rod members 347, and a second driving source drives the second rod members 347 to be displaced to extend the second intermediate wheel 342 and the second transmission wheel 344. The second intermediate wheel 342 is coupled to the second transmission wheel 344, or the second rod member 347 is displaced to disengage from the second transmission wheel 344, so that the second intermediate wheel 342 is separated from the second transmission wheel 344. In this embodiment, the second driving source is provided with a second pressure cylinder 348 for driving the displacement of each of the second rods 347 and a second elastic member 349 for resisting the reverse displacement of the second rod members 347. The two rods 347 are coupled to the second socket 3471 and are disposed between the second socket 3471 and the second cylinder 348. A second thrust bearing 3472 is disposed between the contraction rods, so that the second intermediate wheel 342 and the second transmission wheel 344 can be smoothly rotated, and the first clutch structure and the second clutch structure can respectively control the first transmission. The first intermediate wheel 332 of the group 33, the first transmission wheel 334 and the second intermediate wheel 342 and the second transmission wheel 344 of the second transmission set 34 are coupled or disengaged with each other to make the first direction motor 32 and The lead screw 312 is converted and coupled by the first transmission group 33 or the second transmission group 34, because the first driving wheel 331, the first intermediate wheel 332, the first transmission wheel 334, and the first transmission group 33 A driven wheel 335 and the second drive wheel 341, the second intermediate wheel 342, the second drive wheel 344, and the second driven wheel 345 of the second transmission set 34 have different relative rotational speed ratios, and can be changed by the lead screw The torque and the rotational speed of the output 312 are further modulated to drive the crimping force and the displacement speed of the presser 313 to meet the test operation requirements of various types of electronic components, that is, when the first clutch structure controls the first transmission group 33. The first intermediate wheel 332 is coupled to the first transmission wheel 334 When the second clutch structure controls the second intermediate wheel 342 of the second transmission group 34 to be separated from the second transmission wheel 344, the first direction motor 32 and the lead screw 312 are made by the first transmission group 33. Connecting the transmission, and the larger torque and lower rotation speed can be outputted by the lead screw 312, and when the first clutch structure controls the first intermediate wheel 332 of the first transmission group 33 to be separated from the first transmission wheel 334, and When the second clutch structure and the second intermediate wheel 342 of the second transmission group 34 are coupled to the second transmission wheel 344, the first direction motor 32 and the lead screw 312 are coupled and driven by the second transmission group 34. The smaller torque and higher speed can be output by the lead screw 312.

請參閱第9、10、11圖,本發明第一實施例之壓接單元30係可應用於測試設備,該測試設備之機台40上設有測試裝置41,該測試裝置41則於一測試電路板411上設有複數個測試套座412,並於該各測試套座412內設有複數支探針413,各探針413下方則分別設有彈簧414,使各探針413可作彈性伸縮位移,另該壓接單元30之壓取器313係可驅動位移而將電子元件移載至該測試裝置41上方,以執行電子元件之測試作業;以執行電子元件42之測試作業為例,該壓接單元30之各下壓頭3131係同時吸取複數個電子元件42,並將各電子元件42移載至該測試裝置41上方,另依據電子元件42之各錫球421位置及數量,而於機台40上裝設對應之測試裝置41,另於壓接單元30之第一方向馬達32選擇以第一傳動組33或第二傳動組34連結傳動該導螺桿312,而由該導螺桿312輸出適當的扭力及轉速;於本實施例中,由於電子元件42之各錫球421的數量較少,因此,該第一離合結構之第一驅動源的第一壓缸338係不作動,使該第一中間輪332與第一傳動輪334分離,該第二離合結構則以第二壓缸348驅動各第二桿件347位移而穿伸該第二中間輪342及第二傳動輪344,使該第二中間輪342與第二傳動輪344連結傳動;請參閱第12、13、14圖,該第一方向馬達32之輸出軸即藉由第二傳動組34之第二驅動輪341、第二撓性件343、第二中間輪342、第二傳動輪344、第四撓性件346、第二從動輪345連結帶動該導螺桿312旋轉作動,而帶動該壓取器313作第一方向(Z方向)下壓位移,並將各電子元件42置入對應之測試套座412中,使各電子元件42之各錫球421分別接觸各測試套座412內之各探針41 3,在此同時,第一方向馬達32之輸出軸將同時帶動第一傳動組33之第一驅動輪331,而藉由第一撓性件333帶動第一中間輪332於該第一支撐軸3321上自由轉動,另該第一傳動組33鍵結於導螺桿312上之第一從動輪335將隨同第二從動輪345轉動,而藉由第三撓性件336帶動第一傳動輪334於該第一支撐軸3321上自由轉動;請參閱第12、13、15圖,各電子元件42之各錫球421分別接觸各測試套座412內之各探針413後,該第一方向馬達32持續以第二傳動組34連結帶動該導螺桿312旋轉,而帶動該壓取器313將各電子元件42再下壓一適當距離,各探針413即受到電子元件42之各錫球421壓抵而壓縮彈簧414,以確保電子元件42之各錫球421與測試套座412內之各探針413相接觸,即可同時執行複數個電子元件42之測試作業;於本實施例中,由於電子元件42之各錫球421的數量較少,相對的各測試套座412內的探針413及彈簧414的數量也較少,因此壓取器313所需之壓接力量也較小,故當選擇以第二傳動組34連結帶動時,由於該第二傳動組34具有高轉速低扭力的特性,而可使該導螺桿312輸出較小的扭力及較高的轉速,進而提供該壓取器313適當的壓接力量及位移速度。 Referring to Figures 9, 10, and 11, the crimping unit 30 of the first embodiment of the present invention is applicable to a test device. The test device 41 is provided with a test device 41, and the test device 41 is tested. A plurality of test sockets 412 are disposed on the circuit board 411, and a plurality of probes 413 are disposed in the test sockets 412, and springs 414 are respectively disposed under the probes 413, so that the probes 413 can be elasticized. The telescopic displacement, the presser 313 of the crimping unit 30 can drive the displacement to transfer the electronic component to the test device 41 to perform the test operation of the electronic component; for example, the test operation of the electronic component 42 is performed. Each of the lower indenters 3131 of the crimping unit 30 simultaneously picks up a plurality of electronic components 42 and transfers the electronic components 42 to the test device 41, and according to the position and number of the solder balls 421 of the electronic component 42. A corresponding testing device 41 is mounted on the machine 40, and the first direction motor 32 of the crimping unit 30 is selected to be coupled to the lead screw 312 by the first transmission group 33 or the second transmission group 34, and the lead screw 312 is driven by the lead screw 312 outputs appropriate torque and rotation speed; in this embodiment Since the number of the solder balls 421 of the electronic component 42 is small, the first cylinder 338 of the first driving source of the first clutch structure is not activated, and the first intermediate wheel 332 is separated from the first transmission wheel 334. The second clutch structure drives the second rods 347 to be displaced by the second cylinder 348 to extend the second intermediate wheel 342 and the second transmission wheel 344 to make the second intermediate wheel 342 and the second transmission wheel 344. Linking the transmission; see Figures 12, 13, and 14, the output shaft of the first direction motor 32 is the second drive wheel 341, the second flexure 343, and the second intermediate wheel 342 of the second transmission set 34, The second transmission wheel 344, the fourth flexure 346, and the second driven wheel 345 are coupled to drive the lead screw 312 to rotate, and the presser 313 is driven to be displaced in the first direction (Z direction), and the electrons are driven. The components 42 are placed in the corresponding test sockets 412 such that the solder balls 421 of the electronic components 42 respectively contact the probes 41 3 in the test sockets 412, while the output shaft of the first direction motor 32 will At the same time, the first driving wheel 331 of the first transmission group 33 is driven, and the first intermediate wheel 332 is driven by the first flexible member 333. The first support shaft 3321 is freely rotatable, and the first driven wheel 335 of the first transmission set 33 that is coupled to the lead screw 312 will rotate along with the second driven wheel 345, and is driven by the third flexure 336. A driving wheel 334 is freely rotatable on the first supporting shaft 3321; please refer to FIGS. 12, 13, and 15, after each solder ball 421 of each electronic component 42 contacts each probe 413 in each test socket 412, The first direction motor 32 continues to drive the lead screw 312 to rotate by the second transmission group 34, and the presser 313 drives the electronic components 42 down by an appropriate distance, and each probe 413 is received by each of the electronic components 42. The solder ball 421 is pressed against the compression spring 414 to ensure that the solder balls 421 of the electronic component 42 are in contact with the probes 413 in the test socket 412, so that the test operations of the plurality of electronic components 42 can be performed simultaneously; In the example, since the number of the solder balls 421 of the electronic component 42 is small, the number of the probes 413 and the springs 414 in the opposite test sockets 412 is also small, so the crimping force required by the crimper 313 is also Smaller, so when the second drive set 34 is selected to be driven, due to the second Moving group 34 having high speed, low torque characteristics, and the lead screw 312 can output a smaller torque and high speed, thereby providing the press 313 takes appropriate crimp strength and displacement velocity.

請參閱第16、17、18圖,於執行其他不同類型電子元件43之測試作業時,由於該電子元件43之各錫球431位置不同且數量增加,其係依據該電子元件43之各錫球431位置及數量,而於機台40上裝設另一具測試電路板411a、測試套座412a、探針413a及彈簧414a之測試裝置41a,另該壓接單元30之各下壓頭3131同時吸取複數個電子元件43,並將各電子元件43移載至該測試裝置41a上方,另為了確保由該導螺桿312輸出之足夠的扭力,可於壓接單元30之第一方向馬達32選擇變換以第一傳動組33連結傳動該導螺桿31 2,而以該第一離合結構之第一壓缸338驅動各第一桿件337位移而穿伸該第一中間輪332及第一傳動輪334,使該第一中間輪332與第一傳動輪334連結傳動,該第二離合結構之第二驅動源的第二壓缸348則不作動,使該第二中間輪342與第二傳動輪344分離;請參閱第19、20、21圖,該第一方向馬達32之輸出軸即藉由第一傳動組33之第一驅動輪331、第一撓性件333、第一中間輪332、第一傳動輪334、第三撓性件336、第一從動輪335連結帶動該導螺桿312旋轉作動,而帶動該壓取器313作第一方向(Z方向)下壓位移,並將各電子元件43置入對應之測試套座412a中,使各電子元件43之各錫球431分別接觸各測試套座412a內之各探針413a,在此同時,第一方向馬達32之輸出軸將同時帶動第二傳動組43之第二驅動輪341,而藉由第二撓性件343帶動第二中間輪342於該第二支撐軸3421上自由轉動,另該第二傳動組34鍵結於導螺桿312上之第二從動輪345將隨同第一從動輪335轉動,而藉由第四撓性件346帶動第二傳動輪344於該第二支撐軸3421上自由轉動;請參閱第19、20、22圖,各電子元件43之各錫球431分別接觸各測試套座412a內之各探針413a後,該第一方向馬達32持續以第一傳動組33連結帶動該導螺桿312旋轉,而帶動該壓取器313將各電子元件43再下壓一適當距離,各探針413a即受到電子元件43之各錫球431壓抵而壓縮彈簧414a,以確保電子元件43之各錫球431與測試套座412a內之各探針413a相接觸,即可同時執行複數個電子元件43之測試作業;於本實施例中,由於電子元件43之各錫球431的數量較多,相對的各測試套座412a內的探針413a及彈簧414a的數量也較多,因此壓取器313所需之壓接力量也較大,故當選擇以第一傳動組33連結帶動時,由於該第一傳動組33具有低轉速高扭力的特性,而可增加該導螺桿31 2輸出的扭力,並使該壓取器313的下壓力足夠克服所有彈簧414a產生的反作用力,而提供適當的壓接力量及位移速度。藉此,本發明第一實施例之壓接單元30係利用第一、二離合結構分別控制第一傳動組33之第一中間輪332、第一傳動輪334及第二傳動組34之第二中間輪342、第二傳動輪344連結傳動或分離,使該第一方向馬達32與該導螺桿312藉由該第一傳動組33或第二傳動組34作變換連結傳動,而調變該壓取器313之壓接力量及位移速度,以因應各種類型電子元件的測試作業需求,並達到確保測試品質之實用效益。另外,藉由該第一傳動組33及第二傳動組34作變換連結傳動,即可改變由該導螺桿312輸出之扭力及轉速及該壓取器313之壓接力量及位移速度,而可在不需更換馬達及在原有的機台上,提供適當的壓接力量及位移速度,以執行各種不同類型電子元件之測試作業,進而達到提升設備使用效能及節省設備成本之實用效益。 Referring to Figures 16, 17, and 18, when performing test operations of other types of electronic components 43, since the positions of the solder balls 431 of the electronic component 43 are different and the number is increased, the solder balls are based on the solder balls of the electronic component 43. 431 position and number, and another testing circuit board 411a, test socket 412a, probe 413a and spring 414a test device 41a are mounted on the machine 40, and the lower pressing heads 3131 of the crimping unit 30 are simultaneously A plurality of electronic components 43 are sucked, and the electronic components 43 are transferred to the test device 41a, and in order to ensure sufficient torque output by the lead screw 312, the motor 32 can be selectively changed in the first direction of the crimping unit 30. The lead screw 31 is coupled and driven by the first transmission group 33, and the first cylinder 338 of the first clutch structure drives the displacement of each of the first rods 337 to extend the first intermediate wheel 332 and the first transmission wheel 334. The first intermediate wheel 332 is coupled to the first transmission wheel 334, and the second pressure cylinder 348 of the second drive source of the second clutch structure is not actuated, so that the second intermediate wheel 342 and the second transmission wheel 344 are Separation; see figures 19, 20, 21, the first party The output shaft of the motor 32 is the first drive wheel 331, the first flexure 333, the first intermediate wheel 332, the first transmission wheel 334, the third flexure 336, and the first driven wheel of the first transmission set 33. The 335 is connected to drive the lead screw 312 to rotate, and the presser 313 is driven to be displaced in the first direction (Z direction), and the electronic components 43 are placed in the corresponding test sleeves 412a to make the electronic components 43. Each of the solder balls 431 contacts each of the probes 413a in each of the test sockets 412a, and at the same time, the output shaft of the first direction motor 32 simultaneously drives the second drive wheels 341 of the second transmission group 43 by The second flexing member 343 drives the second intermediate wheel 342 to rotate freely on the second supporting shaft 3421. The second driven wheel 345 of the second transmission set 34 that is coupled to the lead screw 312 will rotate along with the first driven wheel 335. The second transmission member 344 is freely rotated on the second support shaft 3421 by the fourth flexure 346. Referring to FIGS. 19, 20 and 22, the solder balls 431 of the electronic components 43 are respectively in contact with each test. After the probes 413a in the socket 412a, the first direction motor 32 continues to be coupled by the first transmission group 33. The lead screw 312 rotates, and the pusher 313 drives the electronic components 43 down by an appropriate distance. Each of the probes 413a is pressed by the solder balls 431 of the electronic component 43 to compress the spring 414a to ensure the electronic components. The solder balls 431 of 43 are in contact with the probes 413a in the test socket 412a, so that the test operations of the plurality of electronic components 43 can be simultaneously performed; in the present embodiment, the number of the solder balls 431 of the electronic components 43 is There are many, and the number of the probes 413a and the springs 414a in the opposite test sockets 412a is also large, so that the crimping force required by the presser 313 is also large, so when the first transmission group 33 is selected to be connected When the first transmission set 33 has the characteristics of low rotation speed and high torque, the torque outputted by the lead screw 31 2 can be increased, and the downward pressure of the presser 313 is sufficient to overcome the reaction force generated by all the springs 414a. Provide proper crimping force and displacement speed. Thereby, the crimping unit 30 of the first embodiment of the present invention controls the first intermediate wheel 332, the first transmission wheel 334 and the second transmission group 34 of the first transmission group 33 by the first and second clutch structures, respectively. The intermediate wheel 342 and the second transmission wheel 344 are coupled to drive or disengage, so that the first direction motor 32 and the lead screw 312 are converted and coupled by the first transmission group 33 or the second transmission group 34, and the pressure is modulated. The crimping force and displacement speed of the extractor 313 are used in response to the test operation requirements of various types of electronic components, and the practical benefits of ensuring the test quality are achieved. In addition, the torque and the rotational speed outputted by the lead screw 312 and the crimping force and the displacement speed of the presser 313 can be changed by the first transmission group 33 and the second transmission group 34. Providing appropriate crimping force and displacement speed without replacing the motor and on the original machine to perform various types of testing of different types of electronic components, thereby achieving practical benefits of improving equipment efficiency and saving equipment costs.

請參閱第23、24圖,本發明第二實施例與第一實施例之差異僅在於各傳動組的配置方式,本發明第二實施例之電子元件壓接單元30’係包含有壓取機構31’、第一方向馬達32’,以及連結於該第一方向馬達32’之輸出軸與該導螺桿312’間之第一傳動組33’及第二傳動組34’;其中,該第一傳動組33’係於該第一方向馬達32’之輸出軸上設有第一驅動輪331’,該第一驅動輪331’並以第一撓性件333’連結第一中間輪332’;該第二傳動組34’則於該第一方向馬達32’之輸出軸上設有第二驅動輪341’,該第二驅動輪341’並以第二撓性件343’連結第二中間輪342’;另該第一傳動組33’於該第一中間輪332’同軸樞設有第一傳動輪334’,該第一傳動輪334’並以第三撓性件336’連結設於該導螺桿312’上之第一從動輪335’;該第二傳動組34’則於該第二中間輪342’同軸樞設有第二傳動輪344’,該第二傳動輪3 44’並以第四撓性件346’連結設於該導螺桿312’上之第二從動輪345’;其中,該第一傳動組33’之第一驅動輪331’、第一中間輪332’、第一傳動輪334’、第一從動輪335’與該第二傳動組34’之第二驅動輪341’、第二中間輪342’、第二傳動輪344’、第二從動輪345’係具不同的相對轉速比,例如,該第一傳動組33’之第一驅動輪331’、第一中間輪332’、第一傳動輪334’、第一從動輪335’之外徑比可為6:6:6:4,使得該第一傳動組33’之第一驅動輸331’、第一中間輪332’、第一傳動輪334’、第一從動輪335’之轉速比為1:1:1:1.5,另該第二傳動組34’之第二驅動輪341’、第二中間輪342’、第二傳動輪344’、第二從動輪345’之外徑比可為6:6:6:3,使得該第二傳動組34’之第二驅動輪341’、第二中間輪342’、第二傳動輪344’、第二從動輪345’之轉速比則可為1:1:1:2,因此第一傳動組33’之第一驅動輪331’、第一中間輪332’、第一傳動輪334’、第一從動輪335’與第二傳動組34’的相對轉速比為1:1:1:1.5,而第二傳動組34’之第二驅動輪341’、第二中間輪342’、第二傳動輪344’、第二從動輪345’與第一傳動組33’的相對轉速比則為1:1:1:2;亦即第一傳動組33’具有低轉速高扭力的特性,而第二傳動組34’則具有高轉速低扭力的特性;此外,在第一傳動組33’之第一驅動輪331’與第二傳動組34’之第二驅動輪341’為具有相同的外徑時,由於都是鍵結於第一方向馬達32’之輸出軸上同動,因此亦可以單一個一體式的長形驅動輪來取代。另該第一傳動組33’之第一中間輪332’與第一傳動輪334’間係設有第一離合結構,以控制該第一中間輪332’與第一傳動輪334’連結傳動或分離,該第二傳動組34’之第二中間輪342’與第二傳動輪344’間則設有第二離合結 構,以控制該第二中間輪342’與第二傳動輪344’連結傳動或分離,而以該第一離合結構及第二離合結構分別控制該第一傳動組33’之第一中間輪332’、第一傳動輪334’及該第二傳動組34’之第二中間輪342’、第二傳動輪344’作相互搭配之連結傳動或分離,使該第一方向馬達32’與該導螺桿312’藉由該第一傳動組33’或第二傳動組34’作變換連結傳動,由於該第一傳動組33’之第一驅動輪331’、第一中間輪332’、第一傳動輪334’、第一從動輪335與該第二傳動組34’之第二驅動輪341’、第二中間輪342’、第二傳動輪344’、第二從動輪345’係具不同的相對轉速比,而可改變由該導螺桿312’輸出之扭力及轉速,並進而調變帶動該壓取器313’之壓接力量及位移速度,以因應各種類型電子元件的測試作業需求,亦即當該第一離合結構控制第一傳動組33’之第一中間輪332’與第一傳動輪334’連結傳動,且該第二離合結構控制第二傳動組34’之第二中間輪342’與第二傳動輪344’分離時,該第一方向馬達32’與該導螺桿312’即藉由該第一傳動組33’作連結傳動,由於該第一傳動組33’具有低轉速高扭力的特性,而可由該導螺桿312’輸出之較大的扭力及較低的轉速;另當該第一離合結構控制第一傳動組33’之第一中間輪332’與第一傳動輪334’分離,且該第二離合結構控制第二傳動組34’之第二中間輪342’與第二傳動輪344’連結傳動時,該第一方向馬達32’與該導螺桿312’即藉由該第二傳動組34’作連結傳動,由於該第二傳動組34’具有高轉速低扭力的特性,而可由該導螺桿312’輸出之較小的扭力及較高的轉速;藉此,本發明第二實施例之壓接單元30’係利用第一、二離合結構分別控制第一傳動組33’之第一中間輪332’、第一傳動輪334’及第二傳動組34’之第二中間輪342’、第二傳動輪344’連結傳動或分離,使該第一方向馬達32’與該導 螺桿312’藉由該第一傳動組33’或第二傳動組34’作變換連結傳動,而調變該壓取器313’之壓接力量及位移速度,以因應各種類型電子元件的測試作業需求,並達到確保測試品質之實用效益。另外,藉由該第一傳動組33’及第二傳動組34’作變換連結傳動,即可改變由該導螺桿312’輸出之扭力及轉速及該壓取器313’之壓接力量及位移速度,而可在不需更換馬達及在原有的機台上,提供適當的壓接力量及位移速度,以執行各種不同類型電子元件之測試作業,進而達到提升設備使用效能及節省設備成本之實用效益。 Referring to Figures 23 and 24, the second embodiment of the present invention differs from the first embodiment only in the arrangement of the respective transmission sets. The electronic component crimping unit 30' of the second embodiment of the present invention includes a pressing mechanism. 31', a first direction motor 32', and a first transmission group 33' and a second transmission group 34' coupled between the output shaft of the first direction motor 32' and the lead screw 312'; wherein the first The first drive wheel 331' is coupled to the output shaft of the first direction motor 32', and the first drive wheel 331' is coupled to the first intermediate wheel 332' by the first flexible member 333'; The second transmission set 34' is provided with a second driving wheel 341' on the output shaft of the first direction motor 32', and the second driving wheel 341' is coupled to the second intermediate wheel by the second flexible member 343'. The first transmission group 33' is coaxially disposed with the first transmission wheel 334' coaxially with the first transmission wheel 33'. The first transmission wheel 334' is coupled to the third transmission member 336'. a first driven wheel 335' on the lead screw 312'; the second transmission set 34' is coaxially disposed on the second intermediate wheel 342' a second transmission wheel 344', the second transmission wheel 344' is coupled to the second driven wheel 345' disposed on the lead screw 312' by a fourth flexure 346'; wherein the first transmission set 33' a first driving wheel 331', a first intermediate wheel 332', a first transmission wheel 334', a first driven wheel 335' and a second driving wheel 341', a second intermediate wheel 342' of the second transmission set 34', The second transmission wheel 344 ′ and the second driven wheel 345 ′ have different relative rotational speed ratios, for example, the first driving wheel 331 ′ of the first transmission group 33 ′, the first intermediate wheel 332 ′, and the first transmission wheel 334 . The outer diameter ratio of the first driven wheel 335' may be 6:6:6:4, such that the first drive transmission 331', the first intermediate wheel 332', and the first transmission wheel 334 of the first transmission set 33'. 'The first driven wheel 335' has a speed ratio of 1:1:1:1.5, and the second drive wheel 341', the second intermediate wheel 342', the second transmission wheel 344' of the second transmission set 34', The outer diameter ratio of the second driven wheel 345' may be 6:6:6:3, so that the second driving wheel 341', the second intermediate wheel 342', the second transmission wheel 344' of the second transmission group 34', First The speed ratio of the driven wheel 345' can be 1:1:1:2, so the first driving wheel 331' of the first transmission group 33', the first intermediate wheel 332', the first transmission wheel 334', the first slave The relative rotational speed ratio of the movable wheel 335' and the second transmission set 34' is 1:1:1:1.5, and the second drive wheel 341', the second intermediate wheel 342', and the second transmission wheel 344 of the second transmission set 34'. The ratio of the relative rotational speed of the second driven wheel 345' to the first transmission set 33' is 1:1:1:2; that is, the first transmission set 33' has the characteristics of low rotational speed and high torque, and the second transmission group 34' then has the characteristics of high rotation speed and low torque; moreover, when the first drive wheel 331' of the first transmission group 33' and the second drive wheel 341' of the second transmission group 34' have the same outer diameter, All of the keys are coupled to the output shaft of the first direction motor 32', so that it can be replaced by a single integrated long drive wheel. In addition, a first clutch structure is disposed between the first intermediate wheel 332 ′ of the first transmission group 33 ′ and the first transmission wheel 334 ′ to control the first intermediate wheel 332 ′ to be coupled with the first transmission wheel 334 ′ or Separating, a second clutch structure is disposed between the second intermediate wheel 342' and the second transmission wheel 344' of the second transmission group 34' to control the transmission of the second intermediate wheel 342' and the second transmission wheel 344'. Or separating, and controlling the first intermediate wheel 332 ′ of the first transmission group 33 ′, the first transmission wheel 334 ′ and the second middle of the second transmission group 34 ′ by the first clutch structure and the second clutch structure respectively The wheel 342' and the second transmission wheel 344' are coupled or disengaged with each other, so that the first direction motor 32' and the lead screw 312' are made by the first transmission group 33' or the second transmission group 34'. Transforming the link transmission, due to the first drive wheel 331', the first intermediate wheel 332', the first drive wheel 334', the first driven wheel 335 and the second drive set 34' of the first transmission set 33' The driving wheel 341', the second intermediate wheel 342', the second transmission wheel 344', and the second driven wheel 345' are not The same relative speed ratio can change the torque and the rotational speed outputted by the lead screw 312', and further modulate the crimping force and the displacement speed of the presser 313' to meet the test operation requirements of various types of electronic components. That is, when the first clutch structure controls the first intermediate wheel 332' of the first transmission group 33' to be coupled to the first transmission wheel 334', and the second clutch structure controls the second intermediate portion of the second transmission group 34'. When the wheel 342' is separated from the second transmission wheel 344', the first direction motor 32' and the lead screw 312' are coupled by the first transmission group 33', since the first transmission group 33' has a low The high speed torque characteristic, and the larger torque and lower speed can be outputted by the lead screw 312'; the first clutch structure controls the first intermediate wheel 332' of the first transmission group 33' and the first transmission. When the wheel 334' is separated, and the second clutch structure controls the second intermediate wheel 342' of the second transmission group 34' to be coupled with the second transmission wheel 344', the first direction motor 32' and the lead screw 312' By the second transmission group 34' as a connection transmission, The second transmission group 34' has the characteristics of high rotation speed and low torque, and can be outputted by the lead screw 312' with a small torque and a high rotation speed; thereby, the crimping unit 30' of the second embodiment of the present invention The first intermediate wheel 332' of the first transmission group 33', the first transmission wheel 334' and the second intermediate wheel 342' of the second transmission group 34' and the second transmission wheel 344 are respectively controlled by the first and second clutch structures. 'Connecting the drive or disengaging, causing the first direction motor 32' and the lead screw 312' to be transformed and coupled by the first transmission group 33' or the second transmission group 34' to modulate the pressurer 313' The crimping force and displacement speed are used to meet the testing needs of various types of electronic components and achieve practical benefits of ensuring test quality. In addition, the torque and the rotational speed outputted by the lead screw 312' and the crimping force and displacement of the presser 313' can be changed by the first transmission group 33' and the second transmission group 34'. Speed, and can provide appropriate crimping force and displacement speed without changing the motor and on the original machine, to perform various types of electronic components test operations, thereby improving the utility of the equipment and saving equipment costs. benefit.

請參閱第25圖,係本發明電子元件壓接單元應用於測試設備之示意圖,該測試設備係於機台60上配置有供料裝置61、收料裝置62、測試裝置63、輸送裝置64及控制裝置(圖未示出);該供料裝置61係於機台60上設有至少一為供料盤之供料承置器611,用以容納至少一待測之電子元件;該收料裝置62係於機台60上設有至少一為收料盤之收料承置器621,用以容納至少一完測之電子元件;該測試裝置63係於機台60上設有至少一具測試套座632之測試電路板631,以對電子元件執行測試作業;該輸送裝置64係於機台60上設有至少一本發明之壓接單元,用以將電子元件移載至測試裝置63執行測試作業;於本實施例中,該輸送裝置64係設有之第一拾取器641,以於供料裝置61之供料承置器611取出待測之電子元件,並分別輸送至第一供料載台642及第二供料載台643,該第一供料載台642及第二供料載台643將待測之電子元件載送至測試裝置63處,該輸送裝置64於該測試裝置63處設有相同於本發明電子元件壓接單元之第一組壓接單元644及第二組壓接單元645,該第一組壓接單元644及第二組壓接單元645分別將第一供料載台642及第二供料載台643上待測之電子元件移載至測試裝置63執行測試作業,以及將測試裝置63處完測之電子元件移載至 第一收料載台646及第二收料載台647,而由該第一收料載台646及第二收料載台647載出已測之電子元件,該輸送裝置64另設有第二拾取器648,以於第一收料載台646及第二收料載台647上取出完測之電子元件,並依據測試結果,將完測之電子元件輸送至收料裝置62之收料承置器621分類收置;該控制裝置係用以控制及整合各裝置作動,以執行自動化作業,達到提升作業效能之實用效益。 Please refer to FIG. 25, which is a schematic diagram of the application of the electronic component crimping unit of the present invention to a testing device. The testing device is provided with a feeding device 61, a receiving device 62, a testing device 63, a conveying device 64, and a feeding device (not shown); the feeding device 61 is provided on the machine table 60 with at least one feeding device 611 as a feeding tray for accommodating at least one electronic component to be tested; The device 62 is provided on the machine table 60 with at least one receiving receptacle 621 as a receiving tray for accommodating at least one completed electronic component; the testing device 63 is provided on the machine 60 with at least one Testing the test board 631 of the socket 632 to perform a test operation on the electronic component; the transporting device 64 is provided on the machine 60 with at least one crimping unit of the present invention for transferring the electronic component to the testing device 63 In the present embodiment, the conveying device 64 is provided with a first picker 641 for taking out the electronic components to be tested in the feeding device 611 of the feeding device 61, and respectively conveying them to the first a supply stage 642 and a second supply stage 643, the first supply stage 642 and the The feeding stage 643 carries the electronic component to be tested to the testing device 63. The conveying device 64 is provided with the first group of crimping units 644 and the same as the electronic component crimping unit of the present invention. Two sets of crimping units 645, the first set of crimping units 644 and the second set of crimping units 645 respectively transfer the electronic components to be tested on the first feeding stage 642 and the second feeding stage 643 to the test The device 63 performs a test operation, and transfers the electronic components that have been tested at the test device 63 to the first receiving stage 646 and the second receiving stage 647, and the first receiving stage 646 and the second receiving The loading station 647 carries out the measured electronic components, and the conveying device 64 is further provided with a second picker 648 for taking out the measured electronic components on the first receiving stage 646 and the second receiving stage 647. According to the test result, the completed electronic components are transported to the receiving device 621 of the receiving device 62 for sorting and collecting; the control device is used for controlling and integrating the operations of the devices to perform automated operations to improve the operating efficiency. Practical benefits.

據此,本發明實為一深具實用性及進步性之設計,然未見有相同之產品及刊物公開,從而允符發明專利申請要件,爰依法提出申請。 Accordingly, the present invention is a practical and progressive design, but it has not been disclosed that the same products and publications are disclosed, thereby permitting the invention patent application requirements, and applying in accordance with the law.

Claims (10)

一種電子元件壓接單元,主要係包含:壓取機構:係於機座上架設有呈第一方向配置之導螺桿,並以該導螺桿連結帶動一壓接電子元件之壓取器;第一方向馬達:係設有輸出軸;至少二傳動組:係設於該第一方向馬達之輸出軸與該壓取機構之導螺桿間,該各傳動組係於該第一方向馬達之輸出軸上設有驅動輪,以分別連結帶動各中間輪,該各中間輪則分別同軸樞設有各傳動輪,而以該各傳動輪連結該導螺桿上的從動輪,並使該各傳動組之驅動輪、中間輪、傳動輪及從動輪具不同的相對轉速比,另於該各傳動組之中間輪與傳動輪間分別設有離合結構,以分別控制該各傳動組之中間輪及傳動輪連結傳動或分離,而調變該壓取器之壓接力量及位移速度。  An electronic component crimping unit mainly comprises: a pressing mechanism: a lead screw disposed in a first direction is arranged on the base, and a crimper for pressing the electronic component is driven by the lead screw; The directional motor is provided with an output shaft; at least two transmission groups are disposed between the output shaft of the first direction motor and the lead screw of the pressing mechanism, and the transmission groups are connected to the output shaft of the first direction motor a driving wheel is arranged to respectively drive the intermediate wheels, wherein the intermediate wheels are respectively coaxially pivoted with the respective transmission wheels, and the driving wheels are connected with the driven wheels on the lead screws, and the driving groups are driven The wheel, the intermediate wheel, the transmission wheel and the driven wheel have different relative rotational speed ratios, and a clutch structure is respectively arranged between the intermediate wheel and the transmission wheel of the respective transmission groups to respectively control the intermediate wheel and the transmission wheel of the respective transmission groups. Drive or separate, and adjust the crimping force and displacement speed of the press.   依申請專利範圍第1項所述之電子元件壓接單元,其中,該壓取器底部係設有至少一下壓頭。  The electronic component crimping unit according to claim 1, wherein the bottom of the presser is provided with at least a lower pressing head.   依申請專利範圍第1項所述之電子元件壓接單元,其中,該第一方向馬達之輸出軸與該壓取機構之導螺桿間係連結設有第一傳動組及第二傳動組。  The electronic component crimping unit according to claim 1, wherein the first transmission group and the second transmission group are coupled to the output shaft of the first direction motor and the lead screw of the pressing mechanism.   依申請專利範圍第3項所述之電子元件壓接單元,其中,該第一傳動組係於該第一方向馬達之輸出軸上設有第一驅動輪,以連結帶動一架設於該第一驅動輪周側位置之第一中間輪,該第一中間輪則同軸樞設有第一傳動輪,以連結設於該導螺桿上之第一從動輪,並於該第一中間輪與該第一傳動輪間設有第一離合結構。  The electronic component crimping unit of claim 3, wherein the first transmission group is provided with a first driving wheel on the output shaft of the first direction motor, and is coupled to drive the first mounting wheel. a first intermediate wheel that is disposed at a circumferential side of the wheel, the first intermediate wheel is coaxially disposed with a first transmission wheel to connect the first driven wheel disposed on the lead screw, and the first intermediate wheel and the first intermediate wheel A first clutch structure is arranged between the transmission wheels.   依申請專利範圍第4項所述之電子元件壓接單元,其中,該第 一傳動組之第一驅動輪與該第一中間輪間係連結設有第一撓性件,該第一傳動輪與該第一從動輪間則連結設有第三撓性件。  The electronic component crimping unit of claim 4, wherein the first driving wheel of the first transmission group and the first intermediate wheel are coupled with a first flexible member, the first transmission wheel A third flexible member is coupled to the first driven wheel.   依申請專利範圍第4項所述之電子元件壓接單元,其中,該第一離合結構係於該第一中間輪與該第一傳動輪軸向穿設有第一桿件,並以一第一驅動源驅動該各第一桿件位移而穿伸該第一中間輪與該第一傳動輪,使該第一中間輪與該第一傳動輪連結傳動,或驅動該各第一桿件位移而脫離該第一中間輪,使該第一中間輪與該第一傳動輪分離。  The electronic component crimping unit of claim 4, wherein the first clutch structure is disposed in the first intermediate wheel and the first transmission wheel is axially disposed with the first rod member, and is first The driving source drives the first rods to displace and extend the first intermediate wheel and the first transmission wheel, so that the first intermediate wheel and the first transmission wheel are coupled to drive, or drive the first rods to be displaced Disengaging the first intermediate wheel separates the first intermediate wheel from the first transmission wheel.   依申請專利範圍第3項所述之電子元件壓接單元,其中,該第二傳動組係於該第一方向馬達之輸出軸上設有第二驅動輪,以連結帶動一架設於該第二驅動輪周側位置之第二中間輪,該第二中間輪則同軸樞設有第二傳動輪,以連結設於該導螺桿上之第二從動輪,並於該第二中間輪與該第二傳動輪間設有第二離合結構。  The electronic component crimping unit of claim 3, wherein the second transmission group is provided with a second driving wheel on the output shaft of the first direction motor to connect and drive the second driving wheel to the second driving wheel. a second intermediate wheel that is disposed at a circumferential side of the wheel, the second intermediate wheel is coaxially disposed with a second transmission wheel to connect the second driven wheel disposed on the lead screw, and the second intermediate wheel and the second intermediate wheel A second clutch structure is arranged between the two transmission wheels.   依申請專利範圍第7項所述之電子元件壓接單元,其中,該第二傳動組之第二驅動輪與該第二中間輪間係連結設有第二撓性件,該第二傳動輪與該第二從動輪間則連結設有第四撓性件。  The electronic component crimping unit according to the seventh aspect of the invention, wherein the second driving wheel is coupled to the second intermediate wheel and the second intermediate wheel is provided with a second flexible member. A fourth flexible member is coupled to the second driven wheel.   依申請專利範圍第7項所述之電子元件壓接單元,其中,該第二離合結構係於該第二中間輪與該第二傳動輪軸向穿設有第二桿件,並以一第二驅動源驅動該各第二桿件位移而穿伸該第二中間輪及該第二傳動輪,使該第二中間輪與該第二傳動輪連結傳動,或驅動該各第二桿件位移而脫離該第二傳動輪,使該第二中間輪與該第二傳動輪分離。  The electronic component crimping unit of claim 7, wherein the second clutch structure is axially disposed with the second rod and the second intermediate wheel and the second transmission wheel. The driving source drives the second rods to displace and extend the second intermediate wheel and the second transmission wheel, so that the second intermediate wheel and the second transmission wheel are coupled to drive, or drive the second rods to be displaced Disengaging the second transmission wheel separates the second intermediate wheel from the second transmission wheel.   一種應用電子元件壓接單元之測試設備,包含:機台;供料裝置:係配置於該機台上,並設有至少一供料承置器,用以容納至少一待測之電子元件;收料裝置:係配置於該機台上,並設有至少一收料承置器, 用以容納至少一完測之電子元件;測試裝置:係裝配於該機台上,並設有至少一具測試套座之測試電路板,以對電子元件執行測試作業;輸送裝置:係配置於該機台上,並設有至少一依申請專利範圍第1項所述之電子元件壓接單元,以將電子元件移載至測試裝置;控制裝置:係用以控制及整合各裝置作動,以執行自動化作業。  A testing device for applying an electronic component crimping unit, comprising: a machine; a feeding device: disposed on the machine, and provided with at least one feeding device for accommodating at least one electronic component to be tested; The receiving device is disposed on the machine and is provided with at least one receiving device for accommodating at least one electronic component that is inspected; the testing device is mounted on the machine and is provided with at least one a test circuit board with a test socket for performing a test operation on the electronic component; a transport device: disposed on the machine, and having at least one electronic component crimping unit according to claim 1 of the patent application scope, Transferring electronic components to the test device; control device: used to control and integrate the various devices to perform automated operations.  
TW106129018A 2017-08-14 2017-08-25 Electronic component crimping unit and test equipment for its application TWI658271B (en)

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