TW201810509A - Electronic component carrying unit and test classification device applying same wherein the electronic component is laterally displaced to abut against the benchmark plane of the receiving groove to make calibration and positioning - Google Patents
Electronic component carrying unit and test classification device applying same wherein the electronic component is laterally displaced to abut against the benchmark plane of the receiving groove to make calibration and positioning Download PDFInfo
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- TW201810509A TW201810509A TW105127377A TW105127377A TW201810509A TW 201810509 A TW201810509 A TW 201810509A TW 105127377 A TW105127377 A TW 105127377A TW 105127377 A TW105127377 A TW 105127377A TW 201810509 A TW201810509 A TW 201810509A
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- 238000012360 testing method Methods 0.000 title claims description 84
- 238000009423 ventilation Methods 0.000 claims description 29
- 238000012546 transfer Methods 0.000 claims description 20
- 238000000605 extraction Methods 0.000 claims description 18
- 239000000463 material Substances 0.000 claims description 18
- 238000006073 displacement reaction Methods 0.000 claims description 6
- 230000002093 peripheral effect Effects 0.000 claims description 3
- 238000010586 diagram Methods 0.000 description 14
- 239000000523 sample Substances 0.000 description 7
- 208000028659 discharge Diseases 0.000 description 5
- 238000004519 manufacturing process Methods 0.000 description 3
- 238000003825 pressing Methods 0.000 description 3
- 238000012937 correction Methods 0.000 description 2
- 238000013022 venting Methods 0.000 description 2
- 230000006835 compression Effects 0.000 description 1
- 238000007906 compression Methods 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
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- 238000012545 processing Methods 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
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Abstract
Description
本發明係提供一種於承載器之承槽承置電子元件後,令抽氣部件經由承槽側面開設之通氣流道抽吸電子元件向側方偏移而抵靠於承槽內部之基準面作校正定位,以使同一批次電子元件於同一基準條件下執行預設作業,進而提升作業品質之電子元件承載單元。 The invention provides an electronic component placed in a receiving slot of a carrier, and the suction component is shifted to the side through the air flow channel opened on the side of the receiving slot to abut the reference surface inside the receiving slot. An electronic component carrying unit that corrects positioning so that the same batch of electronic components perform preset operations under the same reference conditions, thereby improving the quality of the operation.
在現今,電子元件日趨精密微小且數量繁多,業者必須利用承載機構於不同作業裝置間運送複數個電子元件,以提高生產效能,該承載機構係設有移料具或載台等,以移料具為例,其可視作業需求而設計具有吸嘴之移料具,或具有吸嘴及承槽之移料具,移料具並由機械手臂移載至作業裝置之上方,該承載機構之移料具可單獨釋放電子元件,或將移料具與電子元件一併放置於作業裝置(如動態測試裝置)上而執行預設作業。 At present, electronic components are becoming more and more precise, minute and numerous. Operators must use a carrier mechanism to transport multiple electronic components between different operating devices in order to improve production efficiency. For example, it can be designed according to the needs of the operation of the material transfer tool with a suction nozzle, or the material transfer tool with a suction nozzle and a trough, the material transfer tool and the robot arm to be transferred above the operating device, The material can release the electronic components separately, or the material moving device and the electronic components can be placed on an operating device (such as a dynamic test device) to perform a preset operation.
請參閱第1、2圖,該承載機構11係設有一可作第一、二、三方向(如X、Y、Z方向)位移之機械手臂111,並於機械手臂111之一端設有具複數個抽氣道113之抽氣件112,該抽氣件112之兩側則設有二夾爪114,二夾爪114係夾持一移料具115,該移料具115之底面凹設有複數個可承置電子元件12之承槽116,並於各承槽116開設有抽氣孔117,複數個抽氣孔117係連通抽氣件112之抽氣道113,以使抽氣件112可經由抽氣道113及抽氣孔117而抽吸承槽116內之電子元件12定位;然為使電子元件12易於置入移料具115之承槽116,該承槽116之尺寸係略大於電子元件12之尺寸,但卻導致電子元件12易於承槽116內作微量水平角度偏轉擺置,由於抽氣孔117係開設於承槽116之頂面,不論電子元件12是否正常擺置或水平角度偏轉擺置於承槽116內,該抽氣孔117係直接吸附電子元件12之頂面,而將電子元件12定位於移料具115,再由機械手臂111帶動移料具115及電子元件12作X-Y-Z方向位 移至作業裝置(圖未示出)處。 Please refer to FIGS. 1 and 2. The bearing mechanism 11 is provided with a robot arm 111 capable of displacement in the first, second, and third directions (such as X, Y, and Z directions), and a plurality of robot arms 111 are provided at one end. Extraction pieces 112 of each extraction duct 113. Two sides of the extraction piece 112 are provided with two clamping jaws 114. The two clamping jaws 114 clamp a moving material 115, and the bottom surface of the moving material 115 is provided with a plurality of recesses. Each of the receiving grooves 116 of the electronic component 12 can be received, and each of the receiving grooves 116 is provided with an exhaust hole 117. The plurality of exhaust holes 117 are connected to the exhaust channel 113 of the exhaust member 112 so that the exhaust member 112 can pass through the exhaust channel. 113 and the suction hole 117 to suck the electronic component 12 in the receiving slot 116 for positioning; however, in order to make the electronic component 12 easy to be placed in the receiving slot 116 of the transfer tool 115, the size of the receiving slot 116 is slightly larger than the size of the electronic component 12. However, it causes the electronic component 12 to be easily placed in a slight horizontal angle deflection in the receiving groove 116. Since the exhaust hole 117 is opened on the top surface of the receiving groove 116, whether the electronic component 12 is normally placed or the horizontal angle deflection is placed in the bearing In the groove 116, the exhaust hole 117 directly adsorbs the top surface of the electronic component 12, and positions the electronic component 12 in The material 115 is driven by the robot arm 111 and the electronic component 12 is moved in the X-Y-Z direction. Move to the working device (not shown).
再者,電子元件在生產過程中必須經過多道加工製程,於製作完成後,業者為了確保產品品質,均以測試機構對電子元件進行測試作業,以淘汰出不良品電子元件;以微感測電子元件為例,其應用於電子產品時,係會執行動態之角度旋轉運動,故業者即會使微感測電子元件執行動態測試作業,該動態測試作業係以承載機構將移料具及待測之微感測電子元件一併置放於測試機構上,並利用測試機構帶動移料具及待測之微感測電子元件同步作角度旋轉運動,進而執行動態測試作業,然於執行動態測試作業時,同一批次之複數個微感測電子元件於移料具之複數個承槽內的擺置角度也必須一致,方可於同一基準條件下執行動態測試作業,反之,若複數個微感測電子元件於複數個承槽內之擺置角度不同,即無法於同一基準條件下執行動態測試作業,以致影響測試品質。 In addition, electronic components must undergo multiple processing processes during the production process. After the production is completed, in order to ensure product quality, the industry conducts testing operations on electronic components with testing institutions to eliminate defective electronic components; micro-sensing Electronic components are used as an example. When they are applied to electronic products, they will perform dynamic angular rotation. Therefore, the industry will make the micro-sensing electronic components perform dynamic test operations. The measured micro-sensing electronic components are placed on the testing mechanism together, and the testing mechanism is used to drive the material moving device and the micro-sensing electronic components to be tested for synchronous angular rotation to perform dynamic testing operations, and then perform dynamic testing operations. At the same time, the placement angles of multiple micro-sensing electronic components in the same batch in the plurality of receiving slots of the material transfer device must also be the same to perform the dynamic test operation under the same reference conditions. Conversely, if multiple micro-sensing The placement angle of the measuring electronic components in the plurality of slots is different, that is, the dynamic test operation cannot be performed under the same reference conditions, which affects Test quality.
請參閱第3、4圖,係為承載機構11應用於測試機構13之示意圖,該測試機構13係設有一由動力源131驅動旋轉之框座132,並於框座132上設置一具有測試座134之電路板133,測試座134係設有複數個可電性連接微感測電子元件14之探針組135,以便對微感測電子元件14執行動態測試作業,另於測試座134之兩側分別設有可壓夾該移料具115及測試座134定位之壓夾具136;於作業時,該承載機構11之機械手臂111係將移料具115及微感測電子元件14置放於測試座134上,令微感測電子元件14之接點141電性連接測試座134之探針組135,該測試機構13之壓夾具136再壓夾該移料具115及測試座134,而定位移料具115,並利用測試座134之探針組135頂抵定位微感測電子元件14,該承載機構11之夾爪114再釋放移料具115,該測試機構13之動力源131即可經由框座132帶動電路板133、測試座134、移料具115及微感測電子元件14同步作角度旋轉運動,使微感測電子元件14執行動態測試作業;惟,由於承載機構11之移料具115的抽氣孔117係開設於承槽116之頂面,不論微感測電子元件14是否正常擺置或水平角度偏轉擺置於承槽116內,抽氣孔117均會直接吸附微感測電子元件14 之頂面而定位,當移料具115之複數個承槽116承載一批次複數個微感測電子元件14時,若部分微感測電子元件14發生水平角度偏轉擺置於承槽116之情況,該抽氣孔117卻仍直接將微感測電子元件14吸附定位,即會導致移料具115內之複數個微感測電子元件14擺置角度不一致,不僅易發生測試座134之探針組135無法準確對位微感測電子元件14之接點141,亦使得一批次複數個微感測電子元件14無法於同一基準條件下執行動態測試作業,造成測試品質不一之缺失。 Please refer to FIGS. 3 and 4, which are schematic diagrams of the application of the load bearing mechanism 11 to the test mechanism 13. The test mechanism 13 is provided with a frame base 132 driven by a power source 131 and a test base is provided on the frame base 132. The circuit board 133 of 134 and the test base 134 are provided with a plurality of probe sets 135 which can be electrically connected to the micro-sensing electronic component 14 in order to perform dynamic test operations on the micro-sensing electronic component 14. Pressing fixtures 136 are provided on the sides to clamp the material transfer device 115 and the test base 134 respectively. During operation, the robot arm 111 of the carrier mechanism 11 places the material transfer device 115 and the micro-sensing electronic component 14 on On the test base 134, the contact 141 of the micro-sensing electronic component 14 is electrically connected to the probe set 135 of the test base 134, and the pressing fixture 136 of the test mechanism 13 presses the material transfer tool 115 and the test base 134, and Position the transfer tool 115 and use the probe set 135 of the test base 134 to abut against the micro-sensing electronic component 14. The gripper 114 of the carrier mechanism 11 then releases the transfer tool 115, and the power source 131 of the test mechanism 13 is Can drive the circuit board 133, the test base 134, the transfer tool 115, and the micro sense through the frame base 132 The electronic component 14 synchronously performs angular rotational movement, so that the micro-sensing electronic component 14 performs dynamic testing operations; however, since the exhaust hole 117 of the material transfer tool 115 of the bearing mechanism 11 is opened on the top surface of the receiving groove 116, regardless of the micro-sensing Whether the electronic component 14 is normally placed or placed at a horizontal angle in the receiving groove 116, and the exhaust holes 117 will directly attract the micro-sensing electronic component 14 It is positioned on the top surface. When the plurality of receiving grooves 116 of the transfer tool 115 carry a batch of a plurality of micro-sensing electronic components 14, if some of the micro-sensing electronic components 14 are horizontally deflected and placed in the receiving groove 116, In some cases, the suction hole 117 still directly adsorbs and positions the micro-sensing electronic component 14, which will result in inconsistent positioning angles of the plurality of micro-sensing electronic components 14 in the transfer tool 115, which not only easily causes the probe of the test base 134. The group 135 cannot accurately align the contacts 141 of the micro-sensing electronic components 14, which also makes it impossible for a batch of multiple micro-sensing electronic components 14 to perform dynamic test operations under the same reference conditions, resulting in a lack of varying test quality.
本發明之目的一,係提供一種電子元件承載單元,其包含驅動器及承載器,該驅動器係設有作至少一方向位移之移動臂,並於移動臂上裝配至少一抽氣部件,該驅動器係帶動承載器作至少一方向位移,該承載器係於底面凹設至少一承置電子元件之承槽,並於承槽之內側面設有至少一基準面,該基準面係相通至少一通氣流道,該通氣流道則連通驅動器之抽氣部件,於承載器之承槽承置電子元件後,抽氣部件即經由通氣流道抽吸承槽內之電子元件位移,令電子元件向側方偏移抵靠於承槽之基準面而作校正定位,以確保電子元件之各側面平行於承槽之各側面,進而使同一批次之電子元件於同一基準條件下執行預設作業,達到提升作業品質之實用效益。 An object of the present invention is to provide an electronic component carrying unit including a driver and a carrier. The driver is provided with a moving arm for displacement in at least one direction, and at least one suction component is mounted on the moving arm. The driver system Drive the carrier to be displaced in at least one direction. The carrier is recessed on the bottom surface with at least one receiving groove for receiving electronic components, and at least one reference surface is provided on the inner side of the receiving groove. The reference surface communicates with at least one air flow channel. The air flow channel is connected to the air extraction component of the driver. After the electronic component is placed in the bearing slot of the carrier, the air extraction component is used to suck the electronic component in the groove through the air flow channel to displace the electronic component to the side. Abut against the reference surface of the receiving slot for calibration and positioning to ensure that each side of the electronic component is parallel to each side of the receiving slot, so that the same batch of electronic components can perform preset operations under the same reference conditions to improve the quality of the operation Practical benefits.
本發明之目的二,係提供一種應用電子元件承載單元之測試分類設備,其包含機台、供料裝置、收料裝置、測試裝置、輸送裝置、承載單元及中央控制裝置,該供料裝置係配置於機台上,並設有至少一容納待測電子元件之供料承置器,該收料裝置係配置於機台上,並設有至少一容納已測電子元件之收料承置器,該測試裝置係配置於機台上,並設有具測試座之電路板,以對電子元件執行測試作業,該輸送裝置係配置於機台上,並設有至少一輸送電子元件之移料器,該承載單元係配置於機台上,以於輸送裝置及測試裝置間移載電子元件,並使電子元件於同一基準要件下執行測試作業,該中央控制裝置係用以控制及整合各裝置作動,以執行自動化作業,達到提升作業效能之實用效益。 The second object of the present invention is to provide a test classification device using an electronic component bearing unit, which includes a machine, a feeding device, a receiving device, a testing device, a conveying device, a bearing unit, and a central control device. The feeding device is It is arranged on the machine platform and is provided with at least one feeding supporter for containing the electronic components to be tested. The receiving device is arranged on the machine platform and is provided with at least one receiving container for the tested electronic components. The test device is arranged on the machine and is provided with a circuit board with a test stand to perform test operations on the electronic components. The conveying device is arranged on the machine and is provided with at least one moving material for conveying the electronic components. The load-bearing unit is arranged on the machine platform to transfer electronic components between the conveying device and the test device, and to perform the test operation under the same reference requirements. The central control device is used to control and integrate each device. Act to perform automated operations to achieve practical benefits of improving operation efficiency.
11‧‧‧承載機構 11‧‧‧ bearing mechanism
111‧‧‧機械手臂 111‧‧‧ robotic arm
112‧‧‧抽氣件 112‧‧‧Exhaust parts
113‧‧‧抽氣道 113‧‧‧Exhaust
114‧‧‧夾爪 114‧‧‧Jaw
115‧‧‧移料具 115‧‧‧ material transfer
116‧‧‧承槽 116‧‧‧ Slot
117‧‧‧抽氣孔 117‧‧‧Air vent
12‧‧‧電子元件 12‧‧‧Electronic components
13‧‧‧測試機構 13‧‧‧testing agency
131‧‧‧動力源 131‧‧‧ Power source
132‧‧‧框座 132‧‧‧Frame
133‧‧‧電路板 133‧‧‧Circuit Board
134‧‧‧測試座 134‧‧‧Test Block
135‧‧‧探針組 135‧‧‧Probe Set
136‧‧‧壓夾具 136‧‧‧Press fixture
14‧‧‧微感測電子元件 14‧‧‧Micro-sensing electronic components
141‧‧‧接點 141‧‧‧contact
20‧‧‧承載單元 20‧‧‧bearing unit
21‧‧‧驅動器 21‧‧‧Driver
211‧‧‧移動臂 211‧‧‧ mobile arm
212‧‧‧抽氣部件 212‧‧‧Exhaust parts
213‧‧‧抽氣道 213‧‧‧Exhaust
214‧‧‧夾具 214‧‧‧Fixture
22‧‧‧承載器 22‧‧‧ Carrier
221‧‧‧第一構件 221‧‧‧The first component
222‧‧‧第二構件 222‧‧‧Second component
223‧‧‧承槽 223‧‧‧Slot
2241‧‧‧第一基準面 2241‧‧‧First datum
2242‧‧‧第二基準面 2242‧‧‧ Second datum
2251‧‧‧第一通氣段 2251‧‧‧First Ventilation Section
2252‧‧‧第二通氣段 2252‧‧‧Second Ventilation Section
23‧‧‧微感測電子元件 23‧‧‧Micro-sensing electronics
231‧‧‧接點 231‧‧‧contact
30‧‧‧測試裝置 30‧‧‧Test device
31‧‧‧動力源 31‧‧‧Power source
32‧‧‧框座 32‧‧‧frame
33‧‧‧電路板 33‧‧‧Circuit Board
34‧‧‧測試座 34‧‧‧Test Block
35‧‧‧探針組 35‧‧‧ Probe Set
36‧‧‧壓夾具 36‧‧‧Press fixture
40‧‧‧機台 40‧‧‧machine
50‧‧‧供料裝置 50‧‧‧feeding device
51‧‧‧供料承置器 51‧‧‧feeder
60‧‧‧收料裝置 60‧‧‧Receiving device
61‧‧‧收料承置器 61‧‧‧Receiving container
70‧‧‧測試裝置 70‧‧‧test device
71‧‧‧電路板 71‧‧‧Circuit Board
72‧‧‧測試座 72‧‧‧Test Block
73‧‧‧框座 73‧‧‧frame
74‧‧‧動力源 74‧‧‧Power source
80‧‧‧輸送裝置 80‧‧‧ Conveying device
81‧‧‧入料載台 81‧‧‧Feeding platform
82‧‧‧出料載台 82‧‧‧Discharging stage
83‧‧‧第一移料器 83‧‧‧The first feeder
84‧‧‧第二移料器 84‧‧‧second feeder
第1圖:習知承載機構承置複數個電子元件之示意圖(一)。 Figure 1: Schematic diagram of a conventional load bearing mechanism for mounting a plurality of electronic components (1).
第2圖:習知承載機構承置複數個電子元件之示意圖(二)。 Figure 2: Schematic diagram of a conventional load bearing mechanism for mounting a plurality of electronic components (2).
第3圖:習知承載機構應用於測試裝置之使用示意圖(一)。 Figure 3: Schematic diagram of the application of the conventional bearing mechanism to the test device (1).
第4圖:習知承載機構應用於測試裝置之使用示意圖(二)。 Figure 4: Schematic diagram of the application of the conventional bearing mechanism to the test device (2).
第5圖:本發明承載單元之示意圖(一)。 Figure 5: Schematic diagram (1) of the bearing unit of the present invention.
第6圖:本發明承載單元之示意圖(二)。 Figure 6: Schematic diagram of the bearing unit of the present invention (2).
第7圖:本發明承載單元之使用示意圖(一)。 Figure 7: Schematic diagram of the use of the bearing unit of the present invention (1).
第8圖:本發明承載單元之使用示意圖(二)。 Figure 8: Schematic diagram of the use of the bearing unit of the present invention (2).
第9圖:本發明承載單元之使用示意圖(三)。 Figure 9: Schematic diagram of the use of the bearing unit of the present invention (3).
第10圖:本發明承載單元之使用示意圖(四)。 Figure 10: Schematic diagram of the use of the bearing unit of the present invention (4).
第11圖:本發明承載單元之使用示意圖(五)。 Figure 11: Schematic diagram (5) of the use of the bearing unit of the present invention.
第12圖:本發明承載單元應用於測試分類設備之示意圖。 FIG. 12 is a schematic diagram of the application of the bearing unit of the present invention to a test classification device.
為使 貴審查委員對本發明作更進一步之瞭解,茲舉一較佳實施例並配合圖式,詳述如後:請參閱第5、6圖,本發明之承載單元20包含驅動器21及承載器22,該驅動器21係設有作至少一方向位移之移動臂211,並於移動臂211裝配至少一抽氣部件,更進一步,該移動臂211可為一機械手臂,而作第一、二、三方向(如X、Y、Z方向)位移,亦可裝配至少一組夾具,以夾放承載器22,於本實施例中,該驅動器21之移動臂211係可作X-Y-Z方向位移,並裝配有具複數個抽氣道213之抽氣部件212,該抽氣部件212則連通抽氣設備(圖未示出),另於抽氣部件212之兩側裝配有可開合作動之二夾具214,用以夾持或釋放承載器22;該承載器22係裝配於驅動器21,更進一步,該承載器22可為一體成型或以複數個構件所組成,並可依作業所需,而更換位於複數個構件最下方之具承槽的構件,以配合承置不同批次之電子元件,於本實施例中,該承載器22係設有相互組裝之第一構件221及第二構件222,並由驅動器21之二夾具214夾持第二構件222,以供驅動 器21之移動臂211帶動作X-Y-Z方向位移,並可依作業需求,使承載器22與驅動器21分離,又該承載器22係於底面凹設至少一承置電子元件之承槽223,並於承槽223之內側面設有至少一基準面,於本實施例中,係於第一構件221之底面凹設有複數個承置電子元件之承槽223,並以各承槽223一角部之相鄰二側面作為第一基準面2241及第二基準面2242,另該承載器22係設有至少一通氣流道,該通氣流道連通至少一基準面及驅動器21之抽氣部件212,更進一步,該承載器22可於相對應承槽223之一角部位置開設有通氣流道,該通氣流道並連通至少一基準面及抽氣部件212,亦或該通氣流道具有第一通氣段及第二通氣段,該第一通氣段係位於承槽223之周側,並連通至少一基準面及第二通氣段,該第二通氣段再連通驅動器21之抽氣部件212,又該承載器22可於該第一構件221之頂面凹設成型該第一通氣段,於本實施例中,承載器22係設有複數個具第一通氣段2251及第二通氣段2252之通氣流道,該通氣流道係於第一構件221之頂面且位於承槽223一角部之周側凹設成型有第一通氣段2251,該第一通氣段2251係連通第一構件221之承槽223的第一基準面2241及第二基準面2242,又該通氣流道係於第二構件222開設有連通第一通氣段2251及抽氣部件212之抽氣道213的第二通氣段2252,使抽氣部件212利用第一通氣段2251及第二通氣段2252而由承槽223之內側面抽吸電子元件向側方偏移抵靠於第一基準面2241及第二基準面2242作基準校正定位,以確保電子元件之各側面平行於承槽223之各側面,進而使同一批次之電子元件於同一基準條件下執行預設作業。 In order to make your reviewer better understand the present invention, a preferred embodiment will be given in conjunction with the drawings, detailed as follows: Please refer to Figs. 5 and 6, the carrying unit 20 of the present invention includes a driver 21 and a carrier 22. The actuator 21 is provided with a moving arm 211 for displacement in at least one direction, and at least one suction component is assembled on the moving arm 211. Furthermore, the moving arm 211 can be a mechanical arm, and the first, second, Displacement in three directions (such as X, Y, Z directions). At least one set of clamps can also be assembled to hold the carrier 22. In this embodiment, the moving arm 211 of the driver 21 can be displaced in the XYZ direction and assembled. There is an air extraction member 212 having a plurality of air extraction channels 213. The air extraction member 212 is connected to an air extraction device (not shown in the figure), and two sides of the air extraction member 212 are equipped with two movable clamps 214. Used to hold or release the carrier 22; the carrier 22 is assembled to the driver 21, and further, the carrier 22 can be integrally formed or composed of a plurality of components, and can be replaced in the plurality according to the needs of the operation. Slotted component at the bottom of each component to fit Electronic components of different batches are installed. In this embodiment, the carrier 22 is provided with a first member 221 and a second member 222 which are assembled with each other, and the second member 222 is held by the two clamps 214 of the driver 21 to For driving The moving arm 211 of the holder 21 is displaced in the XYZ direction of the action, and the carrier 22 can be separated from the driver 21 according to the operation requirements. The carrier 22 is recessed on the bottom surface with at least one receiving slot 223 for receiving electronic components. At least one reference surface is provided on the inner side surface of the receiving groove 223. In this embodiment, a plurality of receiving grooves 223 for receiving electronic components are recessed on the bottom surface of the first member 221. Adjacent two sides are used as the first reference plane 2241 and the second reference plane 2242. In addition, the carrier 22 is provided with at least one airflow channel, which communicates with at least one reference surface and the exhaust member 212 of the driver 21, and further The carrier 22 may be provided with an air flow passage at a corner position corresponding to the bearing groove 223, and the air flow passage communicates with at least one reference surface and the air extraction member 212, or the air flow passage has a first air flow section and a first air flow passage. Two ventilation sections, the first ventilation section is located on the peripheral side of the receiving groove 223, and communicates with at least one reference surface and the second ventilation section, and the second ventilation section is further connected with the suction component 212 of the driver 21 and the carrier 22 Can be recessed on the top surface of the first member 221 In the first ventilation section, in this embodiment, the carrier 22 is provided with a plurality of ventilation passages having a first ventilation section 2251 and a second ventilation section 2252, and the ventilation passage is on the top surface of the first member 221 A first venting section 2251 is recessed and formed on a peripheral side of a corner of the receiving groove 223. The first venting section 2251 is a first reference surface 2241 and a second reference surface 2242 that communicate with the receiving groove 223 of the first member 221. The ventilation channel is a second ventilation section 2252 opened on the second member 222 and connected to the first ventilation section 2251 and the suction channel 213 of the suction component 212, so that the suction component 212 uses the first ventilation section 2251 and the second ventilation. Segment 2252 and the electronic components are sucked from the inner side of the receiving groove 223 to laterally offset against the first reference surface 2241 and the second reference surface 2242 for reference correction positioning to ensure that each side of the electronic component is parallel to the receiving groove 223 Each side, so that the same batch of electronic components can perform preset operations under the same reference conditions.
請參閱第7、8圖,由於承載器22之承槽223的尺寸略大於微感測電子元件23之尺寸,當承載器22於一供料承置器(圖未示出)上拾取微感測電子元件23時,可利用驅動器21之抽氣部件212經由抽氣道213對承載器22之第二通氣段2252進行抽氣,由於通氣流道之第二通氣段2252連通第一通氣段2251,該第一通氣段2252又連通第一基準面2241及第二基準面2242,使得抽氣部件 212經由抽氣道213、第一通氣段2251及第二通氣段2252而對承槽223內之微感測電子元件23的二側面進行抽吸動作,使微感測電子元件23作水平向側方偏移,並令其二側面抵靠於承槽223之第一基準面2241及第二基準面2242而作基準校正定位,使微感測電子元件23之各側面保持平行於承槽223之各側面,以確保同一批次之複數個微感測電子元件23於同一基準條件下執行動態測試作業。 Please refer to FIGS. 7 and 8, since the size of the receiving groove 223 of the carrier 22 is slightly larger than the size of the micro-sensing electronic component 23, when the carrier 22 picks up the micro-sensation on a feed holder (not shown) When measuring the electronic component 23, the second ventilation section 2252 of the carrier 22 can be evacuated by using the suction component 212 of the driver 21 through the suction channel 213. Since the second ventilation section 2252 of the ventilation channel communicates with the first ventilation section 2251, The first ventilation section 2252 communicates with the first reference surface 2241 and the second reference surface 2242, so that the air extraction component 212 sucks the two sides of the micro-sensing electronic component 23 in the receiving groove 223 through the air suction channel 213, the first ventilation section 2251, and the second ventilation section 2252, so that the micro-sensing electronic component 23 is horizontally sideways Offset, and make its two sides abut against the first reference surface 2241 and the second reference surface 2242 of the receiving groove 223 for reference correction positioning, so that each side of the micro-sensing electronic component 23 remains parallel to each of the receiving groove 223 Side to ensure that multiple micro-sensing electronic components 23 in the same batch perform dynamic test operations under the same reference conditions.
請參閱第9圖,於承載單元20之承載器22承載定位一批次之複數個微感測電子元件23後,利用驅動器21之移動臂211帶動承載器22及複數個接點231朝下之微感測電子元件23作X-Y方向位移至測試裝置30之上方,該測試裝置30之測試機構係設有一由動力源31驅動旋轉之框座32,並於框座32上裝配一具有測試座34之電路板33,測試座34係設有複數個可電性連接微感測電子元件23之探針組35,以便對微感測電子元件23執行動態測試作業,另於測試座34之兩側分別設有可壓夾承載器22及測試座34定位之壓夾具36。 Please refer to FIG. 9, after a batch of a plurality of micro-sensing electronic components 23 is carried by the carrier 22 of the carrier unit 20, the moving arm 211 of the driver 21 is used to drive the carrier 22 and the plurality of contacts 231 downward. The micro-sensing electronic component 23 is displaced above the test device 30 in the XY direction. The test mechanism of the test device 30 is provided with a frame base 32 driven by a power source 31 for rotation, and a test base 34 is assembled on the frame base 32. The circuit board 33 and the test base 34 are provided with a plurality of probe sets 35 which can be electrically connected to the micro-sensing electronic component 23, so as to perform dynamic testing operations on the micro-sensing electronic component 23, and on both sides of the test base 34 Compression clamps 36 for positioning the clampable carrier 22 and the test base 34 are respectively provided.
請參閱第10、11圖,接著該承載單元20係以驅動器21之移動臂211帶動承載器22及微感測電子元件23作Z方向向下位移置放於測試裝置30之測試座34上,並令微感測電子元件23之接點231準確電性接觸測試座34之探針組35,於測試裝置30之壓夾具36壓夾承載器22及測試座34定位後,該承載單元20之驅動器21的夾具214即釋放承載器22,並以移動臂211帶動夾具214及抽氣部件212脫離承載器22,由於測試座34之探針組35已抵頂微感測電子元件23定位,而可防止微感測電子元件23位移;因此,當承載單元20之承載器22上的各微感測電子元件23分別靠抵於各承槽223之第一基準面2241及第二基準面2242作基準校正定位後,即可確保微感測電子元件23之各側面平行於承槽223之各側面,使得同一批次之複數個微感測電子元件23位於同一基準條件下,該測試裝置30之動力源31係驅動框座32、具測試座34之電路板33、承載器22及一批次複數個微感測電子元件23同步旋轉作動而執行動態測試作業,達到提升作業品質之實用效益。 Please refer to FIG. 10 and FIG. 11. Then, the carrying unit 20 uses the moving arm 211 of the driver 21 to drive the carrier 22 and the micro-sensing electronic component 23 in the Z direction and is placed on the test base 34 of the testing device 30. And make the contact point 231 of the micro-sensing electronic component 23 accurately contact the probe set 35 of the test base 34. After the pressing fixture 36 of the testing device 30 presses the holder 22 and the test base 34, the bearing unit 20 The holder 214 of the driver 21 releases the carrier 22, and the moving arm 211 drives the holder 214 and the suction component 212 away from the carrier 22, because the probe set 35 of the test base 34 has been positioned against the micro-sensing electronic component 23, and Displacement of the micro-sensing electronic component 23 can be prevented; therefore, when each micro-sensing electronic component 23 on the carrier 22 of the carrying unit 20 abuts against the first reference surface 2241 and the second reference surface 2242 of each receiving groove 223, respectively After the reference is calibrated and positioned, each side of the micro-sensing electronic component 23 can be ensured to be parallel to each side of the receiving groove 223, so that a plurality of micro-sensing electronic components 23 in the same batch are located under the same reference condition. Power source 31 series drive frame base 32, with test base 34 The circuit board 33, the carrier 22, and a plurality of micro-sensing electronic components 23 are synchronously rotated to perform dynamic test operations, thereby achieving practical benefits of improving operation quality.
請參閱第5、6、12圖,係本發明承載單元20應用於電子元件測試分類設備之示意圖,該測試分類設備係於機台40上配置有供料裝置50、收料裝置60、測試裝置70、輸送裝置80、承載單元20及中央控制裝置(圖未示出);該供料裝置50係裝配於機台40,並設有至少一為供料盤之供料承置器51,用以容納至少一待測之電子元件;該收料裝置60係裝配於機台40,並設有至少一為收料盤之收料承置器61,用以容納至少一已測之電子元件;該測試裝置70係裝配於機台40上,並設有電性連接之電路板71及測試座72,以對複數個電子元件執行測試作業,於本實施例中,該電路板71係裝配於一框座73上,並由動力源74驅動旋轉而可帶動電子元件執行動態測試作業;該輸送裝置80係裝配於機台40上,並設有至少一移料器,以輸送電子元件,於本實施例中,係於測試裝置70之一側設置入料載台81及出料載台82,輸送裝置80係以第一移料器83於供料裝置50之供料承置器51取出待測之電子元件,並移載至入料載台81,入料載台81將待測之電子元件載送至測試裝置70之側方,該承載單元20係以承載器22於入料載台81取出待測之電子元件,並以驅動器21將承載器22及電子元件移載至測試裝置70之測試座72,測試裝置70即定位承載器22及電子元件,承載單元20之驅動器21再脫離承載器22,測試裝置70係帶動承載器22、電子元件、電路板71及測試座72同步旋轉作動而執行動態測試作業,於測試完畢後,承載單元20係於測試裝置70取出承載器22及已測之電子元件,並位移至出料載台82之上方,承載單元20之承載器22係將已測電子元件移入出料載台82,出料載台82係載出已測之電子元件,第二移料器84係於出料載台82取出已測之電子元件,並依據測試結果,將已測之電子元件輸送至收料裝置60之收料承置器61處而分類收置;該中央控制裝置係用以控制及整合各裝置作動,以執行自動化作業,達到提升作業效能之實用效益。 Please refer to FIGS. 5, 6 and 12, which are schematic diagrams of the application of the carrying unit 20 of the present invention to an electronic component test and classification device. The test and classification device is provided with a feeding device 50, a receiving device 60, and a testing device on the machine 40. 70. Conveying device 80, carrying unit 20 and central control device (not shown in the figure); the feeding device 50 is assembled on the machine 40, and is provided with at least one feeding holder 51 which is a feeding tray. The receiving device 60 is mounted on the machine 40 and is provided with at least one receiving holder 61 which is a receiving tray for receiving at least one measured electronic component; The test device 70 is assembled on the machine 40 and is provided with a circuit board 71 and a test base 72 electrically connected to perform a test operation on a plurality of electronic components. In this embodiment, the circuit board 71 is assembled on A frame base 73 is driven and rotated by a power source 74 to drive electronic components to perform dynamic testing operations. The conveying device 80 is mounted on the machine 40 and is provided with at least one material mover to convey the electronic components. In this embodiment, a loading load is provided on one side of the testing device 70 The stage 81 and the discharge stage 82, and the conveying device 80 use the first transfer device 83 to remove the electronic components to be tested from the supply holder 51 of the supply device 50, and transfer the electronic components to the loading stage 81. The loading platform 81 carries the electronic components to be tested to the side of the testing device 70. The loading unit 20 uses the carrier 22 to take out the electronic components to be tested from the loading platform 81, and drives the carrier 22 with the driver 21. And the electronic components are transferred to the test seat 72 of the testing device 70, the testing device 70 positions the carrier 22 and the electronic components, and the driver 21 of the bearing unit 20 is separated from the carrier 22, and the testing device 70 drives the carrier 22, the electronic components, The circuit board 71 and the test base 72 are rotated synchronously to perform a dynamic test operation. After the test is completed, the carrier unit 20 is removed from the carrier 22 and the measured electronic components in the test device 70 and is moved above the discharge stage 82 The carrier 22 of the carrier unit 20 moves the measured electronic components into the discharge stage 82, the discharge stage 82 carries the measured electronic components, and the second transfer unit 84 is removed from the discharge stage 82. The tested electronic components, and based on the test results, the tested electronic components The central control device is used to control and integrate the operations of various devices to perform automatic operations and achieve practical benefits of improving operation efficiency.
20‧‧‧承載單元 20‧‧‧bearing unit
21‧‧‧驅動器 21‧‧‧Driver
211‧‧‧移動臂 211‧‧‧ mobile arm
212‧‧‧抽氣部件 212‧‧‧Exhaust parts
213‧‧‧抽氣道 213‧‧‧Exhaust
214‧‧‧夾具 214‧‧‧Fixture
22‧‧‧承載器 22‧‧‧ Carrier
221‧‧‧第一構件 221‧‧‧The first component
222‧‧‧第二構件 222‧‧‧Second component
223‧‧‧承槽 223‧‧‧Slot
2241‧‧‧第一基準面 2241‧‧‧First datum
2251‧‧‧第一通氣段 2251‧‧‧First Ventilation Section
2252‧‧‧第二通氣段 2252‧‧‧Second Ventilation Section
Claims (9)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW105127377A TW201810509A (en) | 2016-08-26 | 2016-08-26 | Electronic component carrying unit and test classification device applying same wherein the electronic component is laterally displaced to abut against the benchmark plane of the receiving groove to make calibration and positioning |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW105127377A TW201810509A (en) | 2016-08-26 | 2016-08-26 | Electronic component carrying unit and test classification device applying same wherein the electronic component is laterally displaced to abut against the benchmark plane of the receiving groove to make calibration and positioning |
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| Publication Number | Publication Date |
|---|---|
| TWI590375B TWI590375B (en) | 2017-07-01 |
| TW201810509A true TW201810509A (en) | 2018-03-16 |
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| TW105127377A TW201810509A (en) | 2016-08-26 | 2016-08-26 | Electronic component carrying unit and test classification device applying same wherein the electronic component is laterally displaced to abut against the benchmark plane of the receiving groove to make calibration and positioning |
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| TWI622777B (en) * | 2017-07-07 | 2018-05-01 | Electronic component picking test classification equipment | |
| TWI701203B (en) * | 2019-09-27 | 2020-08-11 | 鴻勁精密股份有限公司 | Electronic component loading device and operating equipment for its application |
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