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TW201816478A - Method and machine for polishing glass substrate - Google Patents

Method and machine for polishing glass substrate Download PDF

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Publication number
TW201816478A
TW201816478A TW106123497A TW106123497A TW201816478A TW 201816478 A TW201816478 A TW 201816478A TW 106123497 A TW106123497 A TW 106123497A TW 106123497 A TW106123497 A TW 106123497A TW 201816478 A TW201816478 A TW 201816478A
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Taiwan
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glass substrate
polishing
chemical polishing
liquid
spray
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TW106123497A
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Chinese (zh)
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住母家岩夫
伊東由夫
中村馬羅
日高羅林頓
田中光明
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日商電硝工程股份有限公司
日商日本創造股份有限公司
日商Icm股份有限公司
日商常盤製作所股份有限公司
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Publication of TW201816478A publication Critical patent/TW201816478A/en

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    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C15/00Surface treatment of glass, not in the form of fibres or filaments, by etching

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  • Chemical & Material Sciences (AREA)
  • Liquid Crystal (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
  • Geochemistry & Mineralogy (AREA)
  • Materials Engineering (AREA)
  • Organic Chemistry (AREA)
  • Surface Treatment Of Glass (AREA)
  • Electroluminescent Light Sources (AREA)

Abstract

To provide a polishing method and a polishing device for a glass substrate, with which chemical polishing of a glass substrate surface can be performed so as to form the glass substrate into a uniform thin film, tool marks can be suppressed, risk of damage can be reduced, and high polishing efficiency can be achieved. This polishing method for a glass substrate is for uniformly polishing the surface of a glass substrate to be used for a liquid crystal display or organic EL display and includes: an arranging step of arranging and securing a vertically-hung glass substrate; a chemical polishing step of continuously spraying and applying a chemical polishing solution on both sides of the glass substrate from a plurality of spray nozzles; and a washing step of washing the melt-polished glass substrate. In the chemical polishing step, to prevent unevenness from occurring and remaining in spray application of the chemical polishing solution due to dripping, the spray nozzles on the upper edge side of the glass substrate are disposed such that the vertical spacing or horizontal spacing therebetween is narrower than on the lower edge side of the glass substrate.

Description

玻璃基板的研磨方法及研磨裝置    Method and device for polishing glass substrate   

本發明係關於一種用以研磨玻璃基板以使其超薄化的研磨裝置,尤其是關於一種用以化學研磨玻璃基板之表面直至使用於液晶顯示器或有機EL顯示器的玻璃基板成為薄膜狀為止,並且提高研磨效率的玻璃基板的研磨方法及研磨裝置。 The present invention relates to a polishing device for polishing a glass substrate to make it ultra-thin, and more particularly, to a method for chemically polishing the surface of a glass substrate until a glass substrate used for a liquid crystal display or an organic EL display becomes a thin film, and A polishing method and a polishing device for a glass substrate that improve polishing efficiency.

習知以來,已有開發、利用多件用以研磨玻璃基板之表面以使玻璃基板超薄化的技術。一般而言,在研磨技術中,係存在有藉由研磨機等來將研磨對象進行物理性研磨的方法、或利用電氣來將研磨對象進行電氣化學性研磨的方法、或使用藉由化學物質所致使之化學反應的研磨方法等。 Since the prior art, a number of techniques have been developed and utilized for polishing the surface of a glass substrate to make the glass substrate ultra-thin. Generally speaking, in polishing technology, there are a method of physically polishing an object to be polished by a grinder or the like, or a method of electrically and chemically polishing an object to be polished by electricity, or using a chemical substance. Grinding methods that cause chemical reactions.

此等方法之中,化學研磨,係指使用化學物質,藉由溶解欲研磨的對象之表面來進行研磨的手法,且多為進行將加工對象置入於已充填有氟酸系之溶液的液 槽,且浸漬於溶液中以使表面溶解。在溶解中,係可採取鼓泡作用(bubbling)(將氣泡碰撞於研磨對象以使溶液循環的方法),以使研磨對象之表面能一處不漏地被研磨。目前,係廣泛採用化學研磨,作為研磨液晶顯示器或有機EL顯示器等之玻璃基板的方法,且能夠藉由化學研磨,來製造薄且輕的液晶顯示器或有機EL顯示器用玻璃基板。 Among these methods, chemical polishing refers to a method that uses a chemical substance to grind by dissolving the surface of the object to be polished, and is mostly a solution in which a processing object is placed in a solution filled with a fluoric acid solution. And immersed in the solution to dissolve the surface. During dissolution, bubbling (a method of colliding air bubbles with the object to be circulated to circulate the solution) can be adopted so that the surface of the object to be ground can be ground without leakage. At present, chemical polishing is widely used as a method for polishing glass substrates such as liquid crystal displays or organic EL displays, and chemical polishing can be used to manufacture thin and light glass substrates for liquid crystal displays or organic EL displays.

可是,目前廣為普及的是使用液晶作為使用於TV或個人電腦的顯示器,且在被謀求高畫質化的同時還謀求高速化、大容量化、薄膜化或輕量化。又,平板型終端(tablet type terminal)或智慧型手機(Smartphone)等的技術也在進步中,作為使用於此等的顯示器,有被要求製作交貨薄且輕的液晶顯示器零件。現狀是接受如此的市場之要求,並被訴求液晶顯示器能最後加工得更薄。 However, the use of liquid crystal as a display for a TV or a personal computer is now widely spread. In addition to achieving high image quality, high-speed, large-capacity, thin-film, or light-weight devices have also been sought. In addition, technologies such as tablet type terminals and smartphones are also progressing. As displays used in these technologies, thin-and-light-weight liquid crystal display parts are required to be manufactured. The status quo is to accept the requirements of such a market, and have been asked that the liquid crystal display can be finally processed to be thinner.

又,施予化學研磨後的顯示器基板之板厚的均一性,係被要求就連基板之端部的區域也要均一,且也被要求顯示器製品的窄邊框化。 In addition, the uniformity of the thickness of the display substrate after the chemical polishing is required is required to make the area of the end portion of the substrate uniform, and the narrow frame of the display product is also required.

對於如此的要求,在使用上述鼓泡作用的化學研磨技術中,係採用同時研磨處理複數片基板的成批處理方式,會有用以壓住基板的夾具之痕跡形成於基板端部的區域,不得謂能夠充分地對應窄邊寬之要求的問題點。亦即,在成批處理方式的情況下,雖然為了同時浸漬多數片於研磨液而有必要提升速度,或為了抑制藉由浸漬之場所所致使的研磨量之不均一而有必要攪拌研磨液(鼓泡處 理),且有必要牢固地保持以免基板偏移或裂痕,但是藉由夾具會形成夾具痕,藉此就會衍生出端部上的厚度變得非為均一的事態。另一方面,當為了減少上述夾具痕而減少按壓基板的夾具,或減弱按壓的強度時,在研磨處理中也會同時衍生出基板偏移(溝槽偏移)或容易發生裂痕或破裂的問題點。 For such requirements, in the chemical polishing technology using the above-mentioned bubbling effect, a batch processing method of simultaneously polishing and processing a plurality of substrates is used, and there will be traces of a fixture for holding the substrate formed at the end of the substrate. It is said that it can fully respond to the problem of narrow width requirements. That is, in the case of the batch processing method, it is necessary to increase the speed in order to immerse a large number of pieces in the polishing liquid at the same time, or it is necessary to stir the polishing liquid in order to suppress the unevenness of the polishing amount caused by the immersed place ( Bubbling treatment), and it is necessary to hold firmly to prevent the substrate from shifting or cracking, but a jig mark will be formed by the jig, which will lead to a situation where the thickness on the end portion becomes non-uniform. On the other hand, in order to reduce the above-mentioned jig marks, the number of jigs that press the substrate is reduced, or the strength of the pressing is reduced, and the problems of substrate offset (groove offset) or cracks or rupture are also caused during the polishing process. point.

作為用以解決如此之問題點的技術,係存在有日本特開2013-252984號公報中所揭示的技術。在此,已有揭示一種關於化學研磨的如下技術:具備複數個搬運輥及處理腔室,該複數個搬運輥係以將玻璃基板朝向水平方向搬運的方式所構成,該處理腔室係以對藉由複數個搬運輥所搬運的玻璃基板進行化學研磨處理的方式所構成;處理腔室,係至少具有處理槽及回收槽;處理槽,係位在比複數個搬運輥更高的位置以使化學研磨液溢流(overflow)的方式所構成;回收槽,係以回收從處理槽溢流的化學研磨液的方式所構成。 As a technique for solving such a problem, there is a technique disclosed in Japanese Patent Application Laid-Open No. 2013-252984. Here, there has been disclosed a chemical polishing technology including a plurality of transfer rollers and a processing chamber configured to transfer a glass substrate in a horizontal direction, and the processing chamber is configured to The glass substrates carried by a plurality of conveying rollers are chemically polished. The processing chamber has at least a processing tank and a recovery tank. The processing tank is positioned higher than the plurality of conveying rollers so that The chemical polishing liquid overflows, and the recovery tank is configured to recover the chemical polishing liquid overflowing from the processing tank.

依據該技術,雖然可認為因能夠一邊將玻璃基板朝向水平方向搬運,且一邊從玻璃基板之上表面及下表面將化學研磨液噴霧成淋浴狀,並進行化學研磨(蝕刻),故而能夠減少夾具痕,但是因將基板配置成水平,故而只要在基板之上表面側使研磨液充填成槳(paddle)狀供給就充分,相對於此,因下表面側噴霧於基板的研磨液會直接藉由重力而落下,故而有使可以充分地有助於研磨之化學反應的研磨液之供給相對於上表面側會變少的問 題點。又,因在下表面側係設置有用以將玻璃基板朝向水平方向搬運的輥子或軸(shaft)類等,故而內在有遮蔽往基板表面之噴霧的問題點。 According to this technique, it is considered that the number of jigs can be reduced because the glass substrate can be transported in a horizontal direction, and the chemical polishing liquid can be sprayed into a shower shape from the upper and lower surfaces of the glass substrate to perform chemical polishing (etching). However, since the substrate is arranged horizontally, it is sufficient to supply the polishing liquid in a paddle shape on the upper surface side of the substrate. In contrast, the polishing liquid sprayed on the substrate from the lower surface side directly passes the polishing liquid. Since gravity falls, there is a problem that the supply of the polishing liquid that can sufficiently contribute to the chemical reaction of polishing is reduced relative to the upper surface side. In addition, since rollers or shafts or the like for conveying the glass substrate in a horizontal direction are provided on the lower surface side, there is a problem in that the spray to the substrate surface is shielded.

又,雖然當所形成的玻璃基板變薄時,板厚之均一性的容許範圍也會變小,但是特別有可能發生藉由輥子搬運等的裝置而使研磨液被遮蔽的下表面側之板厚不均一,且為了將之極小化,得考慮藉由搬運速度之適當化來應付。可是,當加快搬運速度時,有時就會在搬運時所發生的進給速度之不均一或輥子與基板的滑動狀況之不均一而在基板上發生震動,且有可能容易發生當基板之厚度變薄就會在基板周邊產生微小裂痕(crack)等的不良狀況。又,雖然可以期待藉由減小輥子搬運之間距(pitch)來防止裂痕等的功效,但是因研磨液被遮蔽的區域會增加,故而有基板之下表面側之研磨後的板厚之均一性降低的問題點。 In addition, although the allowable range of the uniformity of the plate thickness becomes smaller when the formed glass substrate becomes thin, a plate on the lower surface side where the polishing liquid is shielded by a device such as a roller conveyance may occur in particular. The thickness is not uniform, and in order to minimize it, it is necessary to consider the appropriate handling speed. However, when the conveying speed is increased, uneven feeding speed or uneven sliding conditions between the roller and the substrate may cause vibration on the substrate, and the thickness of the substrate may easily occur. Thinning can cause problems such as microcracks around the substrate. In addition, although the effect of preventing cracks and the like can be expected by reducing the pitch of roller conveyance, the area covered by the polishing liquid will increase, so there is uniformity of the thickness of the plate after polishing on the lower surface side of the substrate. Reduced problem points.

又,作為縱向配置基板的方式,存在有日本特開2008-13389號。在此,已揭示一種以下的技術:能夠藉由對玻璃基板吐出淋浴狀之氟酸溶液來進行蝕刻的蝕刻裝置及使用該蝕刻裝置的蝕刻製程(etching process),且藉由適當地設計淋浴器(shower)之噴霧角度、淋浴噴嘴(shower nozzle)與基板之間的間隔、基板之擺動振幅長度等,就能夠從淋浴器均一地供給至基板面內,藉此可以抑制微粒子(相對於氟酸的不溶物質)附著於基板表面,且可以實現高速且面內均一的蝕刻。 In addition, as a method of arranging the substrates vertically, there is Japanese Patent Application Laid-Open No. 2008-13389. Here, a technique has been disclosed in which an etching device capable of performing etching by ejecting a shower-like fluoric acid solution onto a glass substrate, and an etching process using the etching device, and appropriately designing a shower device The spray angle of the shower, the interval between the shower nozzle and the substrate, the swing amplitude length of the substrate, etc., can be uniformly supplied from the shower into the substrate surface, thereby suppressing fine particles (relative to fluoric acid (Insoluble matter) adheres to the surface of the substrate, and can achieve high-speed and uniform in-plane etching.

依據該方法,雖然能消除研磨液由輥子等之搬運裝置所阻斷的上述問題點,但是因研磨液會一邊接觸於縱向所裝設的基板表面且一邊流下,故而在基板之上側的區域表面之落下的流速較慢且流量也為固定,但是在基板之下側藉由淋浴噴霧所滴下的研磨液,是處於連續不斷地加上的狀態,故而液量會增加並且流速也會變高,結果,會有基板之下側區域的研磨率變高,且板厚會在上下間變化的問題點。 According to this method, although the above-mentioned problem that the polishing liquid is blocked by a conveying device such as a roller can be eliminated, the polishing liquid flows down while contacting the surface of the substrate installed in the vertical direction, so it is on the surface of the area above the substrate. The falling flow rate is slow and the flow rate is also fixed, but the polishing liquid dropped by the shower spray on the lower side of the substrate is continuously added, so the liquid volume will increase and the flow rate will increase. As a result, there is a problem that the polishing rate of the lower area of the substrate becomes high and the thickness of the plate changes between the upper and lower sides.

更且,在日本特許第3995146號公報中,已有揭示以下的技術:同時含有一定濃度之具有化學研磨玻璃基板之作用的研磨成分、和具有使溶液黏度增加之作用的增黏劑,且將黏度落在5×10-1至5×105Pa˙s之範圍的研磨液,僅塗佈既定量於玻璃基板上並使進行玻璃基板之平坦化反應,且在經過既定時間後,洗淨已供至平坦化反應的研磨液。 Furthermore, in Japanese Patent No. 3995146, the following technology has been disclosed: it simultaneously contains a certain concentration of a polishing component having a function of chemically polishing a glass substrate, and a thickener having a function of increasing the viscosity of a solution, and The polishing liquid having a viscosity in the range of 5 × 10 -1 to 5 × 10 5 Pa˙s is applied only to a predetermined amount on a glass substrate to perform a flattening reaction on the glass substrate, and is washed after a predetermined time elapses. The polishing liquid supplied to the flattening reaction.

依據該方法,雖然得考慮能夠防止由5×10-1至5×105Pa˙s之黏度範圍所構成的研磨液往下垂流,且能夠防止基板之上下間的板厚之變化,但是當從研磨效率之觀點、以及藉由依夾具而形成夾具痕所致使的端部上的厚度之非均一化的觀點來考慮時,就不一定是充分的技術。 According to this method, although it is considered that the polishing liquid composed of a viscosity range of 5 × 10 -1 to 5 × 10 5 Pa˙s can be prevented from flowing downward, and the thickness of the substrate above and below the substrate can be prevented from changing, From the viewpoint of polishing efficiency and the viewpoint of non-uniformity in thickness at the end portion due to the formation of jig marks by the jig, it is not necessarily a sufficient technique.

於是,期望能開發一種能夠化學研磨以使使用於液晶顯示器或有機EL顯示器的玻璃基板成為均一的薄膜,並且提高研磨效率,抑制夾具痕的發生同時抑制破損的風險之玻璃基板的研磨方法及研磨裝置。 Therefore, it is desired to develop a polishing method and polishing method for a glass substrate that can be chemically polished so that a glass substrate used in a liquid crystal display or an organic EL display becomes a uniform thin film, and the polishing efficiency is improved, the occurrence of jig marks is suppressed, and the risk of breakage is suppressed. Device.

〔先前技術文獻〕     [Previous Technical Literature]     〔專利文獻〕     [Patent Literature]    

專利文獻1:日本特開2013-252984號公報 Patent Document 1: Japanese Patent Application Laid-Open No. 2013-252984

專利文獻2:日本特開2008-13389號公報 Patent Document 2: Japanese Patent Application Laid-Open No. 2008-13389

專利文獻3:日本特許第3995146號公報 Patent Document 3: Japanese Patent No. 3995146

本發明之目的係為了解決上述之課題,而提供一種能夠化學研磨以使使用於液晶顯示器或有機EL顯示器的玻璃基板成為均一的薄膜,並且提高研磨效率,抑制夾具痕的發生同時抑制破損的風險之研磨效率高的玻璃基板的研磨方法及研磨裝置。 An object of the present invention is to solve the above-mentioned problems, and to provide a chemical film capable of uniformly thinning a glass substrate used in a liquid crystal display or an organic EL display, improving the polishing efficiency, suppressing the occurrence of jig marks, and suppressing the risk of breakage. A method and apparatus for polishing a glass substrate with high polishing efficiency.

為了達成上述目的,本發明之玻璃基板的研磨方法,係用以均質地研磨使用於液晶顯示器或有機EL顯示器的玻璃基板之表面的玻璃基板的研磨方法,其由以下所構成:設置製程,其是將玻璃基板垂直地懸吊來設置固定;及化學研磨製程,其是將用以溶融研磨前述玻璃基板的化學研磨液從複數個噴射噴嘴持續地噴射塗佈於前述玻璃基板之兩側面;以及洗淨製程,其是洗淨經過既定的溶融研磨時間之後已被溶融研磨後的前述玻璃基板;前述化學研磨製程,係為了防止由於液體往下垂流所致使的化學 研磨液之噴射塗佈不均勻的發生和殘留,而將玻璃基板上端側的噴射噴嘴之縱向間隔或橫向間隔以配置成比玻璃基板下端還窄的方式,來將化學研磨液多量地噴射於上端側,且較少量地噴射於下端側。 In order to achieve the above object, the method for polishing a glass substrate of the present invention is a method for polishing a glass substrate used for uniformly polishing the surface of a glass substrate used for a liquid crystal display or an organic EL display. The polishing method includes the following steps: The glass substrate is suspended by being vertically suspended to be fixed; and a chemical polishing process is performed by continuously spraying and coating the chemical polishing liquid for melting and polishing the glass substrate from a plurality of spray nozzles on both sides of the glass substrate; and The cleaning process is to clean the aforementioned glass substrate which has been melt-polished after a predetermined melting and polishing time; the aforementioned chemical polishing process is to prevent uneven spray coating of the chemical polishing liquid caused by the liquid flowing downward. Occurrence and residue, the vertical and horizontal intervals of the spray nozzles on the upper end of the glass substrate are arranged to be narrower than the lower end of the glass substrate to spray a large amount of the chemical polishing liquid on the upper end, and a small amount On the lower side.

又,本發明之玻璃基板的研磨方法,係用以均質地研磨使用於液晶顯示器或有機EL顯示器的玻璃基板之表面的玻璃基板的研磨方法,其由以下所構成:設置製程,其是將玻璃基板垂直地懸吊來設置固定;及化學研磨製程,其是將用以溶融研磨前述玻璃基板的化學研磨液從複數個噴射噴嘴持續地噴射塗佈於前述玻璃基板之兩側面;以及洗淨製程,其是洗淨已被溶融研磨後的前述玻璃基板;前述化學研磨製程,係為了防止由於液體往下垂流所致使的化學研磨液之噴射塗佈不均勻的發生和殘留,而將從等間隔設置的複數個噴射噴嘴所噴射的化學研磨液之量,以從玻璃基板下端側之噴射噴嘴所噴射的化學研磨液之量,比從玻璃基板上端側之噴射噴嘴所噴射的化學研磨液之量還少的方式,來進行噴射。 The method for polishing a glass substrate of the present invention is a method for polishing a glass substrate that is used for uniformly polishing the surface of a glass substrate used for a liquid crystal display or an organic EL display. The polishing method includes the following steps: The substrate is suspended vertically to be fixed; and a chemical polishing process, which continuously sprays and applies chemical polishing liquid for melting and polishing the glass substrate from a plurality of spray nozzles on both sides of the glass substrate; and a cleaning process It is to clean the aforementioned glass substrate which has been melt-polished; the aforementioned chemical polishing process is to prevent the uneven and spraying of the spray coating of the chemical polishing liquid caused by the downward flow of the liquid, and it will be separated from the regular interval The amount of the chemical polishing liquid sprayed by the plurality of spray nozzles provided is equal to the amount of the chemical polishing liquid sprayed from the spray nozzle on the lower end side of the glass substrate than the amount of the chemical polishing liquid sprayed from the spray nozzle on the upper end side of the glass substrate. There are still few ways to spray.

又,前述玻璃基板,係由已將液晶封入於CF(Color Filter;彩色濾光片)基板與TFT(Thin Film Transistor;薄膜電晶體)基板之空隙的液晶顯示器用玻璃基板、或有機EL顯示器用玻璃基板所構成。 The glass substrate is a glass substrate for a liquid crystal display or an organic EL display, in which liquid crystal is sealed in a gap between a CF (Color Filter) substrate and a TFT (Thin Film Transistor) substrate. Made of glass substrate.

前述化學研磨液,係含有由氟酸、硫酸、鹽酸所組成之群組中選擇的一個或複數個溶融研磨成分。 The chemical polishing liquid contains one or a plurality of molten polishing components selected from the group consisting of hydrofluoric acid, sulfuric acid, and hydrochloric acid.

更且,前述玻璃基板的研磨方法,係藉由噴射塗佈含 有硫酸的化學研磨液,來閉塞除去前述玻璃基板的潛在傷痕。 In addition, the method for polishing a glass substrate is performed by spray-coating a chemical polishing solution containing sulfuric acid to block and remove a potential flaw on the glass substrate.

又,本發明之玻璃基板的研磨裝置,係用以均質地研磨使用於液晶顯示器或有機EL顯示器的玻璃基板之表面的玻璃基板的研磨裝置,其由以下所構成:設置手段,其是將玻璃基板垂直地懸吊來設置固定;及複數個噴射噴嘴,其是將用以溶融研磨前述玻璃基板的化學研磨液對前述玻璃基板之兩側面垂直並持續地噴射塗佈;以及洗淨手段,其是洗淨經過既定的溶融研磨時間之後已被溶融研磨後的前述玻璃基板;前述噴射噴嘴,係為了防止由於液體往下垂流所致使的化學研磨液之噴射塗佈不均勻的發生和殘留,而將玻璃基板上端側的噴射噴嘴之縱向間隔或橫向間隔配以置成比玻璃基板下端的噴射噴嘴之縱向間隔或橫向間隔還窄的方式,來將化學研磨液多量地噴射於上端側,且較少量地噴射於下端側。 The glass substrate polishing device of the present invention is a polishing device for uniformly polishing a glass substrate used on the surface of a glass substrate of a liquid crystal display or an organic EL display. The substrate is suspended vertically to set and be fixed; and a plurality of spray nozzles spraying and coating the chemical polishing liquid used to melt and grind the glass substrate on both sides of the glass substrate vertically and continuously; and a cleaning method, which It is to clean the glass substrate that has been melt-polished after a predetermined melt-polishing time; the spray nozzle is to prevent the unevenness and residue of the spray coating of the chemical polishing liquid caused by the liquid flowing downward, and The vertical or horizontal interval of the spray nozzles on the upper end of the glass substrate is set to be narrower than the vertical or horizontal interval of the spray nozzles on the lower end of the glass substrate, so that a large amount of the chemical polishing liquid is sprayed on the upper end. A small amount is sprayed on the lower end side.

又,本發明之玻璃基板的研磨裝置,係用以均質地研磨使用於液晶顯示器或有機EL顯示器的玻璃基板之表面的玻璃基板的研磨裝置,其由以下所構成:設置手段,其是將玻璃基板垂直地懸吊來設置固定;及複數個噴射噴嘴,其是將用以溶融研磨前述玻璃基板的化學研磨液對前述玻璃基板之兩側面垂直並持續地噴射塗佈;以及洗淨手段,其是洗淨經過既定的溶融研磨時間之後已被溶融研磨後的前述玻璃基板;前述噴射噴嘴,係為了防止由於液體往下垂流所致使的化學研磨液之噴射塗佈不均勻的發 生和殘留,而將從等間隔設置的複數個噴射噴嘴所噴射的化學研磨液之量,以從玻璃基板下端側之噴射噴嘴所噴射的化學研磨液之量,比從玻璃基板上端側之噴射噴嘴所噴射的化學研磨液之量還少的方式,來進行噴射。 The glass substrate polishing device of the present invention is a polishing device for uniformly polishing a glass substrate used on the surface of a glass substrate of a liquid crystal display or an organic EL display. The substrate is suspended vertically to set and be fixed; and a plurality of spray nozzles spraying and coating the chemical polishing liquid used to melt and grind the glass substrate on both sides of the glass substrate vertically and continuously; and a cleaning method, which It is to clean the glass substrate that has been melt-polished after a predetermined melt-polishing time; the spray nozzle is to prevent the unevenness and residue of the spray coating of the chemical polishing liquid caused by the liquid flowing downward, and The amount of the chemical polishing liquid sprayed from the plurality of spray nozzles arranged at equal intervals is equal to the amount of the chemical polishing liquid sprayed from the spray nozzle on the lower end side of the glass substrate, compared to the amount of chemical sprayed from the spray nozzle on the upper end side of the glass substrate. The amount of the polishing liquid is still small to spray.

又,前述設置手段,係由支撐玻璃基板左右緣端的側邊固定手段、和支撐玻璃基板下部緣端的底邊固定手段所構成;前述側邊固定手段,係由在未被覆玻璃基板之兩側面的位置接觸於玻璃基板左右緣端角隅部並從兩端夾持的剖面大致三角形之切口淺凹槽所構成;前述底邊固定手段,係由載置玻璃基板之底邊的載置用之底座所構成。 In addition, the aforementioned setting means is composed of side edge fixing means for supporting the left and right edge ends of the glass substrate and bottom edge fixing means for supporting the lower edge end of the glass substrate; and the above-mentioned side fixing means is formed on both sides of the uncoated glass substrate. Positioned in contact with the corners of the left and right edges of the glass substrate, and formed by a shallow groove with a generally triangular cut in the cross section clamped from both ends; the aforementioned bottom edge fixing means is a base for placing the bottom edge of the glass substrate Made up.

更且,前述噴射噴嘴之等間隔設置的複數個噴射噴嘴之前端口,係將上端側的噴射噴嘴之前端口徑形成較大,將下端側的噴射噴嘴之前端口徑形成較小。 Furthermore, the plurality of ports before the spray nozzles provided at equal intervals in the aforementioned spray nozzles are formed to have a larger port diameter before the spray nozzles on the upper end side and a smaller port diameter before the spray nozzles on the lower end side.

由於本發明之玻璃基板的研磨方法及研磨裝置,係如同上面所詳述的構成,所以具有如下的功效。 Since the method and apparatus for polishing a glass substrate of the present invention have the same structure as described above, they have the following effects.

1.因是藉由複數個噴射噴嘴將化學研磨液從兩面噴射塗佈於藉由設置製程所懸吊的玻璃基板,故而能夠對玻璃基板一處不漏地塗佈化學研磨液。又,因是將玻璃基板上端側的噴射噴嘴之縱向間隔或橫向間隔配置成比玻璃基板下端還窄,故而能夠防止由於液體往下垂流所致使的化學研磨液之噴射塗佈不均勻的發生和殘留。 1. Since the chemical polishing liquid is spray-coated from both sides by a plurality of spray nozzles onto the glass substrate suspended by the installation process, the chemical polishing liquid can be applied to the glass substrate without leakage. In addition, because the vertical or horizontal interval of the spray nozzles on the upper end side of the glass substrate is arranged to be narrower than the lower end of the glass substrate, it is possible to prevent the non-uniform spray coating of the chemical polishing liquid caused by the downward flow of the liquid and the Residual.

2.因是針對從複數個噴射噴嘴所噴射的化學研磨液之量,將玻璃基板上端側形成為比下端側之量還噴射較多的構成,故而能夠防止由於液體往下垂流所致使的化學研磨液之噴射塗佈不均勻的發生和殘留。 2. It is a structure that the upper end side of the glass substrate is sprayed more than the amount of the chemical polishing liquid sprayed from the plurality of spray nozzles, so that the chemical caused by the liquid flowing downward can be prevented. Non-uniform spray coating of the polishing liquid occurs and remains.

3.因玻璃基板,係作為液晶顯示器用玻璃基板或有機EL顯示器用玻璃基板,故而能夠研磨使用於各種顯示器的玻璃基板。 3. Since the glass substrate is a glass substrate for a liquid crystal display or a glass substrate for an organic EL display, the glass substrate used in various displays can be polished.

4.因化學研磨液,係含有由氟酸、硫酸、鹽酸等之溶融研磨成分,故而能夠使用比重小的鹽酸系之研磨液至比重大的硫酸系之研磨液。 4. Because the chemical polishing liquid contains molten polishing ingredients such as hydrofluoric acid, sulfuric acid, and hydrochloric acid, it is possible to use hydrochloric acid-based polishing liquids with a small specific gravity to sulfuric acid-based polishing liquids with a high specific gravity.

5.因是噴射塗佈含有硫酸的化學研磨液,故而對於玻璃基板上所產生的潛在傷痕或異常(凹坑(pit)),能夠享受抑制研磨時之凹部內的研磨的功效。 5. Since the chemical polishing liquid containing sulfuric acid is spray-coated, it is possible to enjoy the effect of suppressing the polishing in the recessed portion during polishing for potential flaws or abnormalities (pits) generated on the glass substrate.

6.因設置有將化學研磨液從兩面噴射塗佈於藉由設置手段所懸吊的玻璃基板的複數個噴射噴嘴,故而能夠對玻璃基板一處不漏地塗佈化學研磨液。又,因是將玻璃基板上端側的噴射噴嘴之縱向間隔或橫向間隔配置成比玻璃基板下端還窄,故而能夠防止由於液體往下垂流所致使的化學研磨液之噴射塗佈不均勻的發生和殘留。又,能謀求裝置的省空間化,並且能夠藉由習知的研磨裝置(成批方式)之部分的改造或對應來構成研磨裝置。 6. A plurality of spray nozzles for spraying and coating the chemical polishing liquid on both sides of the glass substrate suspended by the setting means are provided, so that the chemical polishing liquid can be applied to the glass substrate without leaking. In addition, because the vertical or horizontal interval of the spray nozzles on the upper end side of the glass substrate is arranged to be narrower than the lower end of the glass substrate, it is possible to prevent the non-uniform spray coating of the chemical polishing liquid caused by the downward flow of the liquid and the Residual. In addition, it is possible to achieve space saving of the device, and it is possible to configure a polishing device by modifying or coping with a part of a conventional polishing device (batch method).

7.因噴射化學研磨液的複數個噴射噴嘴,將玻璃基板上端側形成為比下端側之量還噴射較多的構成,故而能夠防止由於液體往下垂流所致使的化學研磨液之噴 射塗佈不均勻的發生和殘留。 7. The plurality of spray nozzles for spraying the chemical polishing liquid form a structure in which the upper end side of the glass substrate is sprayed more than the amount on the lower end side, so the spray coating of the chemical polishing liquid caused by the liquid flowing downward can be prevented. Unevenness occurs and remains.

8.因是藉由由剖面大致三角形之切口淺凹槽所構成的側邊固定手段、和由載置玻璃基板之底邊的載置用之底座所構成的底邊固定手段,來構成設置手段,故而能夠抑制藉由化學研磨所產生的夾具痕之發生。 8. The installation means is constituted by a side edge fixing means constituted by a shallow groove with a cutout having a substantially triangular cross section, and a bottom edge fixing means constituted by a mounting base on which the bottom edge of the glass substrate is placed. Therefore, it is possible to suppress the occurrence of jig marks generated by chemical polishing.

9.因複數個噴射噴嘴之前端口,是將上端側形成較大,將下端側形成較小。故而能夠防止由於液體往下垂流所致使的化學研磨液之噴射塗佈不均勻的發生和殘留。 9. Due to the ports before the plurality of injection nozzles, the upper end side is made larger and the lower end side is made smaller. Therefore, it is possible to prevent the non-uniformity and residue of the spray coating of the chemical polishing liquid caused by the liquid flowing downward.

10‧‧‧玻璃基板 10‧‧‧ glass substrate

12‧‧‧CF基板 12‧‧‧CF substrate

14‧‧‧TFT基板 14‧‧‧TFT substrate

16‧‧‧液晶 16‧‧‧ LCD

20‧‧‧化學研磨液 20‧‧‧ chemical polishing liquid

100‧‧‧玻璃基板的研磨方法 100‧‧‧Glass substrate grinding method

110‧‧‧設置製程 110‧‧‧Set up process

120‧‧‧化學研磨製程 120‧‧‧ chemical grinding process

130‧‧‧洗淨製程 130‧‧‧washing process

200‧‧‧玻璃基板的研磨裝置 200‧‧‧ glass substrate grinding device

210‧‧‧設置手段 210‧‧‧ Setting means

212‧‧‧側邊固定手段 212‧‧‧side fixation

214‧‧‧底邊固定手段 214‧‧‧Bottom fixing method

220、220a、220b‧‧‧噴射噴嘴 220, 220a, 220b ‧‧‧jet nozzle

230‧‧‧洗淨手段 230‧‧‧washing means

240‧‧‧框體 240‧‧‧Frame

圖1係本發明之玻璃基板的研磨方法之流程圖。 FIG. 1 is a flowchart of a method for polishing a glass substrate according to the present invention.

圖2係玻璃基板的研磨裝置之概念圖。 FIG. 2 is a conceptual diagram of a polishing device for a glass substrate.

圖3係玻璃基板之側面的剖視圖。 Fig. 3 is a sectional view of a side surface of a glass substrate.

圖4係將設置間隔最適化的噴射噴嘴之側視圖。 FIG. 4 is a side view of an injection nozzle with an optimally arranged interval.

圖5係將研磨液之噴射量最適化的噴射噴嘴之側視圖。 FIG. 5 is a side view of a spray nozzle that optimizes the spray amount of the polishing liquid.

圖6係顯示設置手段之構成的立體圖。 FIG. 6 is a perspective view showing the structure of the setting means.

以下,基於圖式所示的實施例來詳細說明本發明之玻璃基板的研磨方法100及研磨裝置200。 Hereinafter, a method 100 and a polishing apparatus 200 for polishing a glass substrate according to the present invention will be described in detail based on examples shown in the drawings.

圖1係本發明之玻璃基板的研磨方法之流程圖,圖2係 玻璃基板的研磨裝置之概念圖。圖3係玻璃基板之側面的剖視圖,圖4係將設置間隔最適化的噴射噴嘴之側視圖。圖5係將研磨液之噴射量最適化的噴射噴嘴之側視圖,圖6係顯示設置手段之構成的立體圖。 FIG. 1 is a flowchart of a method for polishing a glass substrate of the present invention, and FIG. 2 is a conceptual diagram of a polishing device for a glass substrate. FIG. 3 is a cross-sectional view of a side surface of a glass substrate, and FIG. 4 is a side view of an injection nozzle with an optimal interval. FIG. 5 is a side view of a spray nozzle that optimizes the spray amount of the polishing liquid, and FIG. 6 is a perspective view showing the structure of the installation means.

如圖1所示,本發明之玻璃基板的研磨方法100,係由研磨方法100、化學研磨製程120及洗淨製程130所構成,且為以均質且均一之厚度來研磨使用於液晶顯示器或有機EL顯示器的玻璃基板10之表面用的研磨方法。 As shown in FIG. 1, the glass substrate polishing method 100 of the present invention is composed of a polishing method 100, a chemical polishing process 120, and a cleaning process 130, and is used for polishing liquid crystal displays or organic materials with a uniform and uniform thickness. A method for polishing the surface of the glass substrate 10 of an EL display.

作為研磨對象的玻璃基板10,首先是配置於能夠在設置製程110中處理的狀態。設置製程110,係指垂直懸吊玻璃基板10來固定設置的製程。玻璃基板10,係在研磨前由1mm至數mm的厚度所構成,藉由該製程,作為研磨對象的玻璃基板10,係能藉由夾具來固定,直至研磨結束為止。 The glass substrate 10 to be polished is first placed in a state capable of being processed in the setting process 110. The setting process 110 refers to a process of hanging the glass substrate 10 vertically to fix the setting. The glass substrate 10 is composed of a thickness of 1 mm to several mm before polishing. By this process, the glass substrate 10 as an object to be polished can be fixed by a jig until the polishing is completed.

其次,如圖1所示,在設置製程110所固定設置的玻璃基板10,係在化學研磨製程120中處理。化學研磨製程120,係指藉由化學研磨液200來溶融研磨玻璃基板10的製程,從複數個噴射噴嘴220朝向垂直所設置的玻璃基板10,從兩側面遍及於全面地噴射塗佈化學研磨液20,藉此來溶融研磨玻璃基板10。在本實施例中,係成為在一定時間之期間將化學研磨液20從複數個噴射噴嘴220持續地噴射塗佈於玻璃基板10之兩側面的構成。所噴射出的化學研磨液20,係在塗佈於玻璃基板10之後,流動於玻璃基板10並蓄積於被設置於下部的廢液蓄積手段(未圖示)。 藉此,化學研磨液20能夠始終噴射於玻璃基板10來持續研磨,且進行有效率的化學研磨。 Next, as shown in FIG. 1, the glass substrate 10 fixedly installed in the setting process 110 is processed in the chemical polishing process 120. The chemical polishing process 120 refers to a process of melting and polishing the glass substrate 10 by using the chemical polishing liquid 200. The plurality of spray nozzles 220 are directed toward the glass substrate 10 disposed vertically, and the chemical polishing liquid is spray-coated on both sides from all sides. 20, whereby the glass substrate 10 is melt-polished. In this embodiment, the chemical polishing liquid 20 is continuously spray-coated from a plurality of spray nozzles 220 on both sides of the glass substrate 10 during a certain period of time. The sprayed chemical polishing liquid 20 is applied to the glass substrate 10 and then flows through the glass substrate 10 and accumulates in a waste liquid accumulation means (not shown) provided in the lower portion. Thereby, the chemical polishing liquid 20 can be continuously sprayed on the glass substrate 10 for continuous polishing, and efficient chemical polishing can be performed.

再者,在本實施例中,雖然是遍及於約5分鐘至120分鐘持續地進行化學研磨製程120的處理,但是並非被限定於該處理時間,也能夠非為持續性的而是以一定間隔來斷續地(間歇性地)進行處理。 Furthermore, in this embodiment, although the processing of the chemical polishing process 120 is performed continuously for about 5 minutes to 120 minutes, it is not limited to this processing time, and it may be not constant but at a certain interval. To process intermittently (intermittently).

其次,在化學研磨製程120進行化學研磨處理的玻璃基板10,係在圖1所示的洗淨製程130中處理。洗淨製程130,係指用以洗淨除去已附著於被溶解研磨後的玻璃基板10之表面的化學研磨液20及反應生成物的製程。在經過藉由化學研磨製程120所為的既定之溶融研磨時間後,洗淨被溶融研磨後的玻璃基板10。藉此,能夠中斷化學研磨之進行以完成研磨處理。 Next, the glass substrate 10 subjected to the chemical polishing process in the chemical polishing process 120 is processed in the cleaning process 130 shown in FIG. 1. The cleaning process 130 refers to a process for cleaning and removing the chemical polishing liquid 20 and the reaction product adhered to the surface of the glass substrate 10 after being dissolved and polished. After the predetermined melting and polishing time by the chemical polishing process 120 has passed, the glass substrate 10 after the melting and polishing is cleaned. Thereby, the progress of the chemical polishing can be interrupted to complete the polishing process.

玻璃基板10的化學研磨製程120、和洗淨製程130,係能夠重複實施。藉此,能夠改善玻璃基板10之研磨及洗淨的功效。再者,雖然在化學研磨製程120中所使用的化學研磨液20、和在洗淨製程130中所使用的化學研磨液20之洗淨液(未圖示),無論是哪一個都是流動至廢液蓄積手段,但是為了抑制兩者摻混,也能夠形成為藉由各製程來切換廢液配管的構造。藉由形成為該構造,就能夠效率佳地再利用廢液。 The chemical polishing process 120 and the cleaning process 130 of the glass substrate 10 can be repeatedly performed. Thereby, the polishing and cleaning effects of the glass substrate 10 can be improved. Furthermore, although the chemical polishing liquid 20 used in the chemical polishing process 120 and the cleaning liquid (not shown) of the chemical polishing liquid 20 used in the cleaning process 130 are used, both of them flow to Waste liquid accumulation means, but in order to suppress mixing of the two, it is also possible to form a structure in which waste liquid piping is switched by each process. By having such a structure, waste liquid can be reused efficiently.

作為習知以來所使用的技術,如前述般,雖然有存在將玻璃基板設置於水平方向並以淋浴方式從上下一邊塗佈同時一邊搬運研磨液的化學研磨方式,但是依據 此,只要是最後加工的基板厚度,例如是0.3mm左右之厚度的玻璃基板製品,則其等級幾乎不發生因上下表面之研磨特性的差異,亦即研磨速度的差異等而發生板厚之不均一性等的問題。 As a technique used conventionally, as mentioned above, although there is a chemical polishing method in which a glass substrate is placed in a horizontal direction and is applied in a shower method from above and below while conveying a polishing liquid, as long as it is the final processing The thickness of the substrate is, for example, a glass substrate product having a thickness of about 0.3 mm, and the problem of unevenness of the plate thickness due to the difference in the polishing characteristics of the upper and lower surfaces, that is, the difference in the polishing speed, and the like does not occur.

然而,在被要求進行比0.3mm更薄之研磨的玻璃基板製品等中,當成為例如0.25mm左右之板厚時,貼合的單板之厚度就會成為上下之基板各為0.125mm前後且成為較薄,特別是基板端部之強度也會急遽地降低。為此,藉由貼合基板之上下基板的研磨特性之差異的影響,就有在上下間之板厚上發生差異的問題。更且,即便是在如此的狀況中,為了維持被要求的基板之總厚度的規格值,仍要將容易變薄的基板進行更薄的最後加工,造成不得不使總厚度納入規格值內的狀況,且成為基板之強度的問題,特別是基板之端部的強度變低的問題。 However, in glass substrate products that are required to be thinner than 0.3 mm, when the plate thickness is, for example, about 0.25 mm, the thickness of the single board to be bonded will be about 0.125 mm before and after the substrate. When it becomes thin, especially the intensity | strength of the board | substrate edge part will fall sharply. For this reason, there is a problem that a difference occurs in the thickness of the upper and lower plates due to the influence of the difference in the polishing characteristics of the upper substrate and the lower substrate. Moreover, even in such a situation, in order to maintain the specification value of the total thickness of the substrate, the thinner substrate must be thinner and finally processed, resulting in the total thickness having to be included in the specification value. And the problem of the strength of the substrate, in particular the problem of the strength of the end portion of the substrate becoming low.

如本發明,藉由縱向設置玻璃基板10,就能夠消除如此的問題,且無論哪一面都能夠均一地進行化學研磨,且進行了用以配合被要求之規格的研磨,結果,能夠消除玻璃基板之強度受損的問題。 According to the present invention, such a problem can be eliminated by arranging the glass substrate 10 in the vertical direction, and chemical polishing can be performed uniformly on any side, and polishing to match the required specifications can be eliminated. As a result, the glass substrate can be eliminated. The problem of impaired strength.

在本實施例中,化學研磨製程120,係成為以下的構成:將玻璃基板10之上端側的噴射噴嘴220之縱向間隔或橫向間隔,以配置成比玻璃基板10之下端還窄的方式,來對玻璃基板10噴射塗佈化學研磨液20。藉由形成為該構成,就能夠將化學研磨液20,多量地噴射塗佈於玻璃基板10之上端測,且較少量地噴射於玻璃基板10之下端 側。 In this embodiment, the chemical polishing process 120 has a structure in which the vertical or horizontal intervals of the spray nozzles 220 on the upper end side of the glass substrate 10 are arranged to be narrower than the lower end of the glass substrate 10. The chemical polishing liquid 20 is spray-coated on the glass substrate 10. With this configuration, a large amount of the chemical polishing liquid 20 can be spray-coated on the upper end of the glass substrate 10, and a small amount can be sprayed on the lower end side of the glass substrate 10.

雖然在以垂直地設置玻璃基板10的狀態來噴射塗佈化學研磨液20的情況下,因化學研磨液20,是一邊接觸於縱向所裝設的玻璃基板10之表面一邊流下,故而在玻璃基板10之上側的區域表面流下的流速較慢且流量也為一定,但是在玻璃基板10之下側藉由噴射塗佈所滴下的化學研磨液20,是處於連續不斷地加上的狀態,所以液量會增加並且流速也會變高。結果,因玻璃基板10之下側區域的研磨率變高,故而發生了板厚在玻璃基板10之上下間成為不均等的問題。 In the case where the chemical polishing liquid 20 is spray-coated in a state where the glass substrate 10 is vertically installed, the chemical polishing liquid 20 flows down while contacting the surface of the glass substrate 10 installed in the vertical direction. The area above the 10 has a slower flow rate and a constant flow rate. However, the chemical polishing liquid 20 dropped by spray coating on the lower side of the glass substrate 10 is continuously applied, so the liquid The amount will increase and the flow rate will increase. As a result, since the polishing rate of the lower region of the glass substrate 10 becomes high, a problem arises that the plate thickness becomes uneven between the upper and lower portions of the glass substrate 10.

依據本實施例,藉由在玻璃基板10之上部係噴射塗佈有多量的化學研磨液20,在下部則塗佈有少量的化學研磨液20,就能使上下間的化學研磨液20之塗佈及流通之量最適化,能夠防止由於液體往下垂流所致使的化學研磨液20之噴射塗佈不均勻的發生和殘留,且能夠抑制研磨厚度之不均一。 According to this embodiment, a large amount of the chemical polishing liquid 20 is spray-coated on the upper portion of the glass substrate 10, and a small amount of the chemical polishing liquid 20 is coated on the lower portion, so that the upper and lower chemical polishing liquid 20 can be applied. Optimizing the amount of cloth and circulation can prevent the uneven and uneven spray coating of the chemical polishing liquid 20 caused by the liquid flowing downward, and can suppress the uneven thickness of the polishing.

作為本發明之玻璃基板的研磨方法100之另一實施例,係在以相對於玻璃基板10成為等間隔之方式設置有複數個噴射噴嘴220之後,控制從該複數個噴射噴嘴220所噴射的化學研磨液20之量,以將從位於玻璃基板10之下端側的噴射噴嘴220b所噴射的化學研磨液20之量,噴射得比從位於玻璃基板10之上端側的噴射噴嘴220a所噴射的化學研磨液20之量還少。 As another embodiment of the method 100 for polishing a glass substrate of the present invention, after a plurality of spray nozzles 220 are provided at equal intervals with respect to the glass substrate 10, the chemical sprayed from the plurality of spray nozzles 220 is controlled. The amount of the polishing liquid 20 is sprayed more than the amount of the chemical polishing liquid 20 sprayed from the spray nozzle 220 b located on the lower end side of the glass substrate 10 than that of the chemical polishing sprayed from the spray nozzle 220 a on the upper end side of the glass substrate 10. The amount of liquid 20 is still small.

如同前述般,在對玻璃基板10在上下各區域 中均等地噴射塗佈化學研磨液20的情況下,因與玻璃基板10之上側區域相較,玻璃基板10之下側區域的研磨率變得較高,故而會發生板厚在玻璃基板10之上下間成為不均質的問題。依據本發明之構成,藉由在玻璃基板10之上部係噴射塗佈有多量的化學研磨液20,在下部則塗佈有少量的化學研磨液20,就能使上下間的化學研磨液20之塗佈及流通之量最適化,能夠防止由於液體往下垂流所致使的化學研磨液20之噴射塗佈不均勻的發生和殘留,且能夠抑制研磨厚度之不均一。 As described above, when the chemical polishing liquid 20 is spray-coated equally on the upper and lower regions of the glass substrate 10, the polishing rate of the lower region of the glass substrate 10 becomes lower than that of the upper region of the glass substrate 10. Since it is high, there exists a problem that plate | board thickness becomes non-uniformity between the upper and lower sides of the glass substrate 10. According to the configuration of the present invention, a large amount of the chemical polishing liquid 20 is spray-coated on the upper portion of the glass substrate 10, and a small amount of the chemical polishing liquid 20 is coated on the lower portion, so that the chemical polishing liquid 20 between the upper and lower portions can be changed. The amount of coating and distribution is optimized, which can prevent the unevenness of the spray coating of the chemical polishing liquid 20 caused by the liquid flowing downward and the residue, and can suppress the unevenness of the polishing thickness.

再者,如圖3所示,本實施例的玻璃基板10,係能夠作為已將液晶16封入於CF基板12與TFT基板14之空隙的液晶顯示器用玻璃基板。又,當然也能夠使用有機EL顯示器用玻璃基板。 In addition, as shown in FIG. 3, the glass substrate 10 of this embodiment is a glass substrate for a liquid crystal display which can be used to seal the liquid crystal 16 in the gap between the CF substrate 12 and the TFT substrate 14. It is needless to say that a glass substrate for an organic EL display can be used.

藉此,能夠研磨製造使用於各種顯示器的玻璃基板,且能夠構成能夠對應於所有要求的玻璃基板的研磨方法100。 Thereby, the glass substrate used for various displays can be grind | polished and manufactured, and the polishing method 100 which can respond | correspond to all the glass substrates required can be comprised.

再者,液晶顯示器,係指為了將液晶形成為均一的厚度,而貼合CF基板和TFT基板的二片基板,且在該基板之形成空隙,將液晶封入於該空隙所形成。最終將所貼合的基板,從兩面進行化學研磨(蝕刻),以使其薄化的製造方法。該研磨後的最後加工厚度(完成品的厚度),雖然習知以來一般是0.3mm至0.6mm左右,但是近年來的市場要求,特別是接受基板之薄型化的要求,現狀已增加最後加工比0.3mm還薄的製品。藉由將已貼合的基 板研磨成較薄,就能夠將例如觸控面板(touch panel)內建於基板,且能夠開發一併具有各種功能的製品。 In addition, a liquid crystal display is formed by bonding two substrates of a CF substrate and a TFT substrate to form a uniform thickness of the liquid crystal, forming a gap in the substrate, and sealing the liquid crystal in the gap. Finally, a manufacturing method in which the bonded substrates are chemically polished (etched) from both sides to make them thinner. Although the final processing thickness (thickness of the finished product) after the polishing is generally about 0.3 mm to 0.6 mm, the market demand in recent years, especially the requirement to reduce the thickness of the substrate, has increased the final processing ratio. 0.3mm thin product. By grinding the bonded substrate to a thinner thickness, for example, a touch panel can be built into the substrate, and products having various functions can be developed together.

化學研磨液20,係能夠作為含有由氟酸、硫酸、鹽酸所組成之群組中選擇的一個或複數個溶融研磨成分的液材。藉此,能夠使用比重小的鹽酸系之研磨液至比重大的硫酸系之研磨液,可以按照研磨對象之厚度或研磨速度等狀況來使用所有的化學研磨液20,且能夠進行效率佳的玻璃基板之研磨。 The chemical polishing liquid 20 can be a liquid material containing one or a plurality of molten polishing components selected from the group consisting of hydrofluoric acid, sulfuric acid, and hydrochloric acid. Thereby, it is possible to use a hydrochloric acid-based polishing liquid with a small specific gravity to a sulfuric acid-based polishing liquid with a high specific gravity, and it is possible to use all the chemical polishing liquids 20 according to the thickness of the object to be polished or the polishing speed, and it is possible to perform highly efficient glass Polishing of substrates.

特別是,作為本發明之玻璃基板的研磨方法100之實施例,係能夠噴射塗佈含有硫酸的化學研磨液20。藉此,能夠附加地獲得閉塞玻璃基板10之潛在傷痕的功效,且能夠獲得防止因既有之些微損傷而產生的損傷裂痕的功效。又,能夠對於研磨中在玻璃基板10上所產生的潛在傷痕或異常(凹坑),享受抑制研磨時之凹部內的研磨的功效。 In particular, as an example of the polishing method 100 of the glass substrate of the present invention, the chemical polishing liquid 20 containing sulfuric acid can be spray-coated. Thereby, the effect of blocking potential scars of the glass substrate 10 can be additionally obtained, and the effect of preventing damage cracks due to the existing slight damage can be obtained. Moreover, it is possible to enjoy the effect | action which suppresses the grinding | polishing in the recessed part at the time of a latent flaw or an abnormality (crater) produced in the glass substrate 10 during grinding | polishing.

其次,針對本發明之玻璃基板的研磨裝置200加以說明。如圖2所示,玻璃基板的研磨裝置200,係由設置手段210、噴射噴嘴220及洗淨手段230所構成,用以均質且均一地研磨使用於液晶顯示器或有機EL顯示器的玻璃基板10之表面。 Next, the polishing apparatus 200 of the glass substrate of this invention is demonstrated. As shown in FIG. 2, the glass substrate polishing device 200 is composed of a setting device 210, a spray nozzle 220, and a cleaning device 230 for uniformly and uniformly polishing the glass substrate 10 used for a liquid crystal display or an organic EL display. surface.

設置手段210,係指用以垂直懸吊作為研磨對象的玻璃基板10來設置固定用的構件,且如圖2所示,在本實施例中,是藉由設置於框體240的設置手段210,將玻璃基板10之上側兩側面和底部固定設置於框體240的構 成。玻璃基板10,係在研磨前具有1mm至數mm之厚度;玻璃基板10,係藉由設置手段210的夾具來固定,直至研磨結束為止。再者,設置手段210,並不一定要設置於框體240,也可形成為使用具有同樣功能之支撐玻璃基板10專用的框體夾具(未圖示)等的構成。又,也可考慮將設置手段210設置於該框體夾具的構成,即便藉由該構成仍可以期待同樣的功效。 The setting means 210 refers to a means for setting and fixing the glass substrate 10 as the object to be polished by hanging vertically. As shown in FIG. 2, in this embodiment, the setting means 210 is provided on the frame 240. A structure in which both upper and lower side surfaces and the bottom of the glass substrate 10 are fixed to the frame 240 is provided. The glass substrate 10 has a thickness of 1 mm to several mm before grinding; the glass substrate 10 is fixed by a fixture of the setting means 210 until the grinding is completed. In addition, the installation means 210 does not necessarily need to be provided in the frame 240, and may be formed into a structure using a frame jig (not shown) or the like dedicated to supporting the glass substrate 10 having the same function. It is also possible to consider a configuration in which the installation means 210 is provided in the frame jig, and the same effect can be expected even with this configuration.

噴射噴嘴220,係指將用以溶融研磨(化學研磨)玻璃基板10的化學研磨液20噴射塗佈於玻璃基板10用的細開口部,且如圖2、圖4及圖5所示,在化學研磨液20垂直地噴射於玻璃基板10的位置設置有複數個,且均等且持續地將化學研磨液20噴射塗佈於玻璃基板10之兩側面。藉此,能遍及於玻璃基板10之兩面全面地噴射塗佈化學研磨液20,且能夠進行玻璃基板10的溶融研磨(化學研磨)。 The spray nozzle 220 refers to spray-coating a chemical polishing liquid 20 for melt polishing (chemical polishing) the glass substrate 10 on a thin opening portion for the glass substrate 10, and as shown in FIG. 2, FIG. 4, and FIG. A plurality of positions where the chemical polishing liquid 20 is vertically sprayed on the glass substrate 10 are provided, and the chemical polishing liquid 20 is sprayed on both sides of the glass substrate 10 uniformly and continuously. Thereby, the chemical polishing liquid 20 can be spray-coated on both sides of the glass substrate 10, and the glass substrate 10 can be melt-polished (chemically polished).

在本實施例中,係成為複數個噴射噴嘴220,將化學研磨液20在一定時間之期間持續地噴射塗佈於玻璃基板10之兩側面的構成。所噴射出的化學研磨液20,係在塗佈於玻璃基板10之後,流動於玻璃基板10並蓄積於被設置於下部的廢液蓄積手段(未圖示)。藉由形成為該構成,化學研磨液20能夠始終噴射於玻璃基板10,玻璃基板10能遍及於全面地持續進行化學研磨,且進行有效率的化學研磨。 In the present embodiment, the plurality of spray nozzles 220 are configured to spray and apply the chemical polishing liquid 20 to both sides of the glass substrate 10 continuously for a certain period of time. The sprayed chemical polishing liquid 20 is applied to the glass substrate 10 and then flows through the glass substrate 10 and accumulates in a waste liquid accumulation means (not shown) provided in the lower portion. By having such a structure, the chemical polishing liquid 20 can always be sprayed on the glass substrate 10, and the glass substrate 10 can continuously perform chemical polishing over the entire surface and perform efficient chemical polishing.

再者,在本實施例中,雖然是成為遍及於約5 分鐘至120分鐘持續地從噴射噴嘴220噴射塗佈化學研磨液20於玻璃基板10的構成,但是並非被限定於該處理時間,又,也能夠形成為非為持續性的而是以一定間隔來斷續地(間歇性地)進行處理的構成。 In addition, in this embodiment, the chemical polishing liquid 20 is sprayed and applied to the glass substrate 10 from the spray nozzle 220 continuously for about 5 minutes to 120 minutes, but it is not limited to this processing time, and It is also possible to form a structure that is not continuous but is processed intermittently (intermittently) at a certain interval.

洗淨手段230,係指洗淨已藉由化學研磨液20所溶融研磨後的玻璃基板10,並沖走化學研磨液20的手段,且為用以將已附著於被溶解研磨後的玻璃基板10之表面的化學研磨液20及反應生成物予以洗淨除去的手段。在藉由從噴射噴嘴220噴射化學研磨液20來進行既定時間溶融研磨(化學研磨)之後,藉由朝向被溶融研磨後的玻璃基板10噴射洗淨液來洗淨。藉此,能夠中斷化學研磨之進行以完成研磨處理。 The cleaning means 230 refers to a method of washing the glass substrate 10 that has been melt-polished with the chemical polishing liquid 20 and washing away the chemical polishing liquid 20, and is a method for attaching the glass substrate that has been dissolved and polished Means for washing and removing the chemical polishing liquid 20 and the reaction product on the surface of 10 After the chemical polishing liquid 20 is sprayed from the spray nozzle 220 to perform melt polishing (chemical polishing) for a predetermined period of time, the cleaning liquid is sprayed onto the glass substrate 10 after being melt-polished to be washed. Thereby, the progress of the chemical polishing can be interrupted to complete the polishing process.

藉由從噴射噴嘴220噴射塗佈化學研磨液20所致使的玻璃基板10之溶解研磨處理、和藉由洗淨手段230所致使的玻璃基板10之洗淨處理,係能夠形成為重複實施的構成。藉此,能夠改善玻璃基板10之研磨及洗淨的功效。再者,雖然從噴射噴嘴220所噴射塗佈出的化學研磨液20、和在洗淨手段230中所使用的化學研磨液20之洗淨液(未圖示),無論是哪一個都是流動至廢液蓄積手段(未圖示),但是為了抑制兩者摻混並被廢棄,也能夠形成為切換廢液配管的構造。藉由形成為該構造,就能夠效率佳地廢棄或再利用廢液。 The dissolving and polishing process of the glass substrate 10 caused by the spray application of the chemical polishing liquid 20 from the spray nozzle 220 and the cleaning process of the glass substrate 10 caused by the cleaning means 230 can be formed to be repeatedly performed. . Thereby, the polishing and cleaning effects of the glass substrate 10 can be improved. In addition, although the chemical polishing liquid 20 spray-coated from the spray nozzle 220 and the cleaning liquid (not shown) of the chemical polishing liquid 20 used in the cleaning means 230 are both, it flows either. Although it is a waste liquid accumulation means (not shown), in order to suppress mixing and discarding of both, it can also be set as the structure which switches waste liquid pipes. With this structure, waste liquid can be efficiently discarded or reused.

再者,洗淨手段230,也能夠形成為切換化學研磨液20之供給方法,且藉由從噴射噴嘴220噴射洗淨液 (未圖示)來噴霧於玻璃基板10以進行洗淨處理的構成。又,也能夠完全使用另一個洗淨液供給配管(供給噴嘴,未圖示)來對玻璃基板10噴霧、供給洗淨液(未圖示),且非為特別限定洗淨液之噴霧、供給方法。 In addition, the cleaning means 230 may be configured to switch the method of supplying the chemical polishing liquid 20 and spray the cleaning liquid (not shown) from the spray nozzle 220 to spray the glass substrate 10 to perform a cleaning process. . The glass substrate 10 can also be sprayed and supplied with another cleaning liquid supply pipe (supply nozzle (not shown)) using another cleaning liquid supply pipe (supply nozzle, not shown), and is not particularly limited to the spraying and supplying of the cleaning liquid. method.

在本實施形態中,如圖4所示,噴射噴嘴220,係成為將位於玻璃基板10之上端側的噴射噴嘴220a之縱向間隔或橫向間隔,配置成比位於玻璃基板10之下端側的噴射噴嘴220b之縱向間隔或橫向間隔還窄的構成。藉由形成為該構成,就能夠形成為將化學研磨液20多量地噴射於玻璃基板10之上端側,且較少量地噴射於玻璃基板10之下端側的構成。藉此,能夠防止由於液體往下垂流所致使的化學研磨液20之噴射塗佈不均勻的發生和殘留,且能夠抑制研磨厚度之不均一。 In this embodiment, as shown in FIG. 4, the ejection nozzles 220 are arranged such that the ejection nozzles 220 a located on the upper end side of the glass substrate 10 are spaced apart vertically or horizontally from the ejection nozzles located on the lower end side of the glass substrate 10. 220b has a narrow vertical or horizontal interval. With such a configuration, a configuration in which a large amount of the chemical polishing liquid 20 is sprayed on the upper end side of the glass substrate 10 and a small amount is sprayed on the lower end side of the glass substrate 10 can be formed. Thereby, it is possible to prevent the non-uniformity of the spray coating of the chemical polishing liquid 20 caused by the liquid flowing downward and to remain, and to suppress the non-uniformity of the polishing thickness.

亦即,如本發明的研磨裝置,在形成為以垂直地設置玻璃基板10的狀態,將化學研磨液20從水平朝向垂直地噴射塗佈於玻璃基板10的構成的情況下,化學研磨液20會流落於縱向所裝設的玻璃基板10之表面。此時,在玻璃基板10之上側的區域表面落下的流速較慢且流量也為一定,但是在玻璃基板10之下側會與直接噴射塗佈的化學研磨液20配合,並藉由噴射塗佈於玻璃基板10之上部的化學研磨液20垂流而處於連續不斷地加上的狀態,所以在玻璃基板10下部流動於表面的液量會增加並且流速也會變高。結果,因玻璃基板10之下側區域的研磨率變高,故而發生了板厚在玻璃基板10之上下間不均質化的問題。 That is, as in the polishing apparatus of the present invention, in a state where the glass substrate 10 is vertically installed, the chemical polishing liquid 20 is sprayed and applied to the glass substrate 10 from the horizontal direction, and the chemical polishing liquid 20 is formed. It will flow on the surface of the glass substrate 10 installed in the vertical direction. At this time, the flow velocity falling on the surface of the region on the upper side of the glass substrate 10 is slow and the flow rate is constant. However, the lower side of the glass substrate 10 is matched with the chemical polishing liquid 20 sprayed directly, and is spray-coated. The chemical polishing liquid 20 on the upper part of the glass substrate 10 is continuously flowing in a state of being continuously applied. Therefore, the amount of the liquid flowing on the surface under the glass substrate 10 increases and the flow velocity becomes high. As a result, since the polishing rate of the lower region of the glass substrate 10 becomes high, a problem occurs in that the thickness of the glass substrate 10 becomes non-uniform.

依據本實施例,因在玻璃基板10之上部係噴射塗佈多量的化學研磨液20,在下部則塗佈少量的化學研磨液20,故而能使玻璃基板10之上下間的化學研磨液20之塗佈及流通之量最適化,能夠防止由於液體往下垂流所致使的化學研磨液20之噴射塗佈不均勻的發生和殘留,且能夠抑制研磨厚度之不均一。 According to this embodiment, since a large amount of the chemical polishing liquid 20 is spray-coated on the upper portion of the glass substrate 10 and a small amount of the chemical polishing liquid 20 is applied on the lower portion, the chemical polishing liquid 20 above and below the glass substrate 10 can be applied. The amount of coating and distribution is optimized, which can prevent the unevenness of the spray coating of the chemical polishing liquid 20 caused by the liquid flowing downward and the residue, and can suppress the unevenness of the polishing thickness.

作為本發明之玻璃基板的研磨裝置200之另一實施例,係如圖5所示,能夠形成為以下的構成:在以相對於玻璃基板10成為等間隔之方式設置有複數個噴射噴嘴220之後,控制從該複數個噴射噴嘴220所噴射的化學研磨液20之量,以將位於玻璃基板10之下端側的噴射噴嘴220b所噴射的化學研磨液20之量,形成得比位於玻璃基板10之上端側的噴射噴嘴220a所噴射的化學研磨液20之量還少。 As another example of the polishing device 200 for a glass substrate of the present invention, as shown in FIG. 5, it can be formed into a structure in which a plurality of spray nozzles 220 are provided at equal intervals with respect to the glass substrate 10. The amount of the chemical polishing liquid 20 sprayed from the plurality of spray nozzles 220 is controlled so that the amount of the chemical polishing liquid 20 sprayed from the spray nozzle 220 b located on the lower end side of the glass substrate 10 is formed to be larger than that of the chemical polishing liquid 20 located on the glass substrate 10. The amount of the chemical polishing liquid 20 sprayed by the spray nozzle 220a on the upper end side is still small.

如同前述般,在對玻璃基板10在上下各區域中均等地噴射塗佈化學研磨液20的情況下,因在化學研磨液20之塗佈量、流量的關係上,與玻璃基板10之上側區域相較,玻璃基板10之下側區域的研磨率變得較高,故而會發生板厚在玻璃基板10之上下間變化的問題。依據上述構成,藉由在玻璃基板10之上部噴射塗佈有多量的化學研磨液20,在下部塗佈有少量的化學研磨液20,就能使上下間的化學研磨液20之塗佈及流通之量最適化,能夠防止由於液體往下垂流所致使的化學研磨液20之噴射塗佈不均勻的發生和殘留,且能夠抑制研磨厚度之不均一。 As described above, when the chemical polishing liquid 20 is spray-coated uniformly on the upper and lower regions of the glass substrate 10, the area above the glass substrate 10 is related to the application amount and flow rate of the chemical polishing liquid 20. In comparison, since the polishing rate of the lower region of the glass substrate 10 becomes higher, a problem occurs in that the plate thickness changes between the upper and lower sides of the glass substrate 10. According to the above configuration, a large amount of the chemical polishing liquid 20 is spray-coated on the upper portion of the glass substrate 10, and a small amount of the chemical polishing liquid 20 is coated on the lower portion, so that the coating and circulation of the chemical polishing liquid 20 between the upper and lower portions can be performed. Optimizing the amount can prevent the non-uniformity of the spray coating of the chemical polishing liquid 20 caused by the liquid flowing downward and the residue, and can suppress the non-uniformity of the polishing thickness.

如圖6所示,設置手段210,係能夠形成為由 側邊固定手段212及底邊固定手段214所構成的構成。側邊固定手段212,係指以包夾玻璃基板10之左右緣端的方式來固定支撐用的構件,在本實施例中,是指被覆玻璃基板10之兩側面並以不妨礙化學研磨液20之噴射塗佈的方式,一邊接觸於玻璃基板10之左右緣端角部,同時一邊從兩端夾持玻璃基板10的構成,作為形狀,係由剖面大致三角形之切口淺凹槽所構成的構成。 As shown in FIG. 6, the installation means 210 can be formed by a side fixing means 212 and a bottom fixing means 214. The side fixing means 212 refers to a member for supporting and fixing the left and right edge ends of the glass substrate 10. In this embodiment, it refers to covering both sides of the glass substrate 10 and not hindering the chemical polishing liquid 20. In the spray coating method, the glass substrate 10 is sandwiched from both ends while contacting the corners of the left and right edges of the glass substrate 10, and the shape is formed by a shallow groove with a substantially triangular cross-section.

以往,係成為在進行玻璃基板10之化學研磨且固定玻璃基板10時,藉由較深之凹槽所構成的固定手段來固定夾持玻璃基板10的構成。藉由該構成,該固定手段就會部分被覆玻璃基板10之兩側面,而有妨礙化學研磨液20之噴射塗佈,且用以壓住玻璃基板10的夾具之痕跡形成於玻璃基板10左右端部之區域的問題點。 Conventionally, when the glass substrate 10 is chemically polished and the glass substrate 10 is fixed, the glass substrate 10 is fixedly clamped by a fixing means composed of a deep groove. With this configuration, the fixing means partially covers both sides of the glass substrate 10, and the spray coating of the chemical polishing liquid 20 is hindered, and the marks of the jig for pressing the glass substrate 10 are formed at the left and right ends of the glass substrate 10. Problems in the ministry area.

如本發明,藉由將側邊固定手段212形成為剖面大致三角形之切口淺凹槽,且將側邊固定手段212之長度形成較短,就能夠構成不妨礙化學研磨液20之噴射塗佈,且抑制了夾具痕之殘留的玻璃基板的研磨裝置200。 According to the present invention, by forming the side fixing means 212 into a shallow groove with a substantially triangular cross-section and forming the length of the side fixing means 212 to be short, it is possible to constitute a spray coating that does not hinder the chemical polishing liquid 20, Moreover, the grinding | polishing apparatus 200 of the glass substrate which suppresses the residue of a jig mark is suppressed.

又,底邊固定手段214,係指用以支撐玻璃基板10之下部端緣的構件,且為由載置玻璃基板10之底邊的載置用之底座所構成的構成。 The bottom edge fixing means 214 refers to a member for supporting the lower end edge of the glass substrate 10 and is configured by a mounting base on which the bottom edge of the glass substrate 10 is placed.

以往,係與側邊固定手段212同樣,藉由較深之凹槽所構成的固定手段來固定玻璃基板10之底部的構成。雖然藉由用如此的構造來牢固地固定玻璃基板10,就能夠抑制藉由鼓泡作用等所致使的化學研磨時之玻璃基板10的脫落 等,但是會有造成夾具痕之形成的原因、玻璃基板10之破損的原因的問題點。 Conventionally, similar to the side fixing means 212, the bottom part of the glass substrate 10 is fixed by the fixing means which consists of a deep groove. Although the glass substrate 10 is firmly fixed with such a structure, the glass substrate 10 can be prevented from falling off during chemical polishing due to bubbling or the like. However, there are causes for the formation of jig marks and glass. Problems in the cause of damage to the substrate 10.

在本發明中,藉由將底邊固定手段214形成為載置用之底座形狀,就能夠形成為化學研磨液20之噴射塗佈不被妨礙的構成,並且形成為抑制了因固定手段之夾持所引起的玻璃基板10之破損的玻璃基板的研磨裝置200之構成。 In the present invention, by forming the bottom edge fixing means 214 in the shape of a base for mounting, it is possible to form a structure in which the spray coating of the chemical polishing liquid 20 is not hindered, and to suppress the pinch due to the fixing means. The structure of the grinding | polishing apparatus 200 of the glass substrate which hold | maintains the damage | damage of the glass substrate 10 is hold | maintained.

作為本發明之玻璃基板的研磨裝置200之更另一實施例,等間隔所設置的複數個噴射噴嘴220之前端口,係能夠形成為將上端側的噴射噴嘴220a之前端口徑形成為較大,將下端側的噴射噴嘴220b之前端口徑形成為較小的構成。即便藉由該構成,仍與上述同樣,在玻璃基板10之上部噴射塗佈有多量的化學研磨液20,並且在下部塗佈有少量的化學研磨液20,就能夠使上下間的化學研磨液20之塗佈及流通之量最適化,且能夠防止由於液體往下垂流所致使的化學研磨液20之噴射塗佈不均勻的發生和殘留,且抑制研磨厚度之不均一。 As still another embodiment of the polishing device 200 for a glass substrate of the present invention, the ports before the plurality of spray nozzles 220 provided at equal intervals can be formed to have a larger port diameter before the spray nozzles 220a on the upper end side. The lower end side of the injection nozzle 220b has a smaller port diameter. Even with this configuration, as described above, a large amount of the chemical polishing liquid 20 is spray-coated on the upper portion of the glass substrate 10, and a small amount of the chemical polishing liquid 20 is coated on the lower portion. The amount of coating and circulation of 20 is optimized, and it is possible to prevent the unevenness of the spray coating of the chemical polishing liquid 20 caused by the liquid flowing downward, and to prevent the unevenness of the polishing thickness.

藉由形成為以上的構成,與將玻璃基板浸漬於習知的溶液中以進行鼓泡處理的方法相較,還能夠進行更有效率的玻璃基板10之研磨。 With the above configuration, the glass substrate 10 can be more efficiently polished than a method of immersing the glass substrate in a conventional solution to perform a bubbling treatment.

玻璃基板10之化學研磨後的板厚之不均一,係有必要隨著最後加工厚度變薄而減小。例如,在將開始研磨時的板厚設為1mm,將最後加工的板厚設為0.4mm,將板厚之不均一的容許值設為最後加工厚度之10%的情況 下,不均一的容許值係成為正負0.04mm以下。另一方面,當研磨量係成為0.6mm,且將研磨前的基板板厚之不均一假設為零時,為了進行0.6mm研磨處理,在基板材之全面實現0.04mm以內之不均一的容許率,係成為0.067(容許不均一/研磨處理量)。 The non-uniform thickness of the glass substrate 10 after the chemical polishing is necessary to decrease as the final processing thickness becomes thinner. For example, if the plate thickness at the start of grinding is set to 1 mm, the final plate thickness is set to 0.4 mm, and the allowable value of the non-uniformity of the plate thickness is set to 10% of the final processed thickness, the non-uniformity is allowed. The value is equal to or less than 0.04 mm. On the other hand, when the polishing amount is 0.6 mm, and the non-uniformity of the thickness of the substrate before polishing is assumed to be zero, in order to perform the 0.6 mm polishing process, the allowable rate of the non-uniformity within 0.04 mm is realized in the entire substrate. It is 0.067 (permissible non-uniformity / polishing amount).

在進行0.3mm最後加工的情況下,當將不均一之容許範圍設為最後加工厚度之10%時就成為0.03mm以下。雖然研磨量係成為0.7mm,但是相對於該研磨量所可以容許的不均一係成為0.03mm,容許率係成為0.043(容許不均一/研磨處理量),且對0.4mm最後加工,要求更加嚴格的值。更且,在將最後加工厚度設為0.25mm的情況下,相對於研磨量為0.75mm所可以容許的不均一是成為0.025,容許率係成為0.033(容許不均一/研磨處理量),且即便是些微的不均一仍無法忽視。 When the final processing of 0.3 mm is performed, when the allowable range of the unevenness is set to 10% of the final processing thickness, it becomes 0.03 mm or less. Although the polishing amount is 0.7 mm, the allowable non-uniformity relative to the polishing amount is 0.03 mm, the allowable rate is 0.043 (permissible non-uniformity / polishing treatment amount), and the final processing of 0.4 mm requires stricter requirements. Value. In addition, when the final processing thickness is 0.25 mm, the allowable non-uniformity with respect to the polishing amount of 0.75 mm is 0.025, and the allowable rate is 0.033 (permissible non-uniformity / polishing treatment amount). It is the slight unevenness that cannot be ignored.

又,在研磨液晶顯示器的情況下,即便是針對CF側的基板與TFT側的基板之雙方板厚的差異,所要求的誤差仍是成為些微。例如,在研磨1mm之液晶顯示器的情況下,當各板厚發生了研磨量之1%程度的差異時,在0.4mm最後加工的情況會發生600μ之研磨量的1%之6μ的差異。在整體的容許量為正負40μ且容許範圍設為80μ的情況下,當考慮雙方基板之板厚的差異之6μ時,容許範圍實際上就成為74μ(80-6)。 In the case of polishing a liquid crystal display, even if the difference in thickness between the CF-side substrate and the TFT-side substrate is required, the required error is slight. For example, in the case of polishing a 1 mm liquid crystal display, when a difference of about 1% of the polishing amount occurs in each plate thickness, a difference of 6% of 1% of the polishing amount of 600 μ occurs in the case of 0.4 mm final processing. In the case where the overall allowable amount is plus or minus 40 μ and the allowable range is set to 80 μ, the allowable range actually becomes 74 μ (80-6) when the difference between the board thicknesses of both substrates is 6 μ.

同樣,在0.3mm最後加工的情況下,係對容許範圍60μ扣除研磨量之1%的7μ而成為53μ(60-7),在最 後加工厚度設為0.25mm的情況下,係對容許範圍50μ扣除研磨量之1%的7.5μ而成為42.5μ(50-7.5),且隨著構成較薄,而一定要嚴格地抑制不均一。 Similarly, in the case of 0.3mm final processing, it is 53μ (60-7) after deducting 1% of the polishing amount from 60μ in the allowable range, and when the final processing thickness is set to 0.25mm, it is 50μ in the allowable range. After deducting 7.5μ, which is 1% of the polishing amount, it becomes 42.5μ (50-7.5), and as the structure is thinner, it is necessary to strictly suppress unevenness.

更且,在0.25μ最後加工的情況下,CF側、TFT側的基板,雖然只要沒有各板厚之差異,就能以0.125mm進行最後加工,但是在一存在有各板厚差時就會在較薄之側存在不均一的情況下,會有強度變弱的問題。當板厚成為0.1mm(100μ)左右時,基板之端部的強度就會變得相當弱,而會提高破損之發生風險。 Moreover, in the case of 0.25μ final processing, although the CF-side and TFT-side substrates can be final processed at 0.125mm as long as there is no difference in the thickness of each substrate, when there is a difference in the thickness of each substrate, In the case where there is unevenness on the thinner side, there is a problem that the strength becomes weak. When the plate thickness is about 0.1 mm (100 μ), the strength of the end portion of the substrate becomes relatively weak, and the risk of damage is increased.

例如,在最後加工厚度為0.3mm至0.6mm左右的製造過程中,目前增加需求不均一幾乎不成為問題之程度的較薄基板,特別是在生產0.3mm以下之製品的情況下,係成為被嚴格要求抑制研磨量之不均一的狀態。 For example, in the manufacturing process where the final processing thickness is about 0.3mm to 0.6mm, currently increasing thinner substrates to the extent that uneven demand hardly poses a problem, especially in the case of producing products below 0.3mm, is becoming a problem. It is strictly required to suppress the uneven state of the polishing amount.

藉由使用本發明之玻璃基板的研磨方法及研磨裝置,就能夠實現如上述的不均一之抑制,且與舊有的鼓泡方式、或其他的先前技術相較,能夠提供一種能夠製造更有效率且沒有不均勻之已能抑制研磨厚度之不均一的製品的玻璃基板的研磨方法及研磨裝置。 By using the polishing method and the polishing device of the glass substrate of the present invention, the above-mentioned unevenness can be suppressed, and compared with the conventional bubbling method or other prior technologies, a method capable of manufacturing more A polishing method and a polishing device for a glass substrate that are efficient and free of uneven products that can suppress uneven polishing thickness.

Claims (9)

一種玻璃基板的研磨方法,係用以均質地研磨使用於液晶顯示器或有機EL顯示器的玻璃基板之表面的玻璃基板的研磨方法(100),其特徵為包含:設置製程(110),其是將玻璃基板(10)垂直地懸吊來設置固定;及化學研磨製程(120),其是將用以溶融研磨前述玻璃基板的化學研磨液(20)從複數個噴射噴嘴(220)持續地噴射塗佈於前述玻璃基板之兩側面;以及洗淨製程(130),其是洗淨經過既定的溶融研磨時間之後已被溶融研磨後的前述玻璃基板;前述化學研磨製程(120),係為了防止由於液體往下垂流所致使的化學研磨液之噴射塗佈不均勻的發生和殘留,而將玻璃基板(10)上端側的噴射噴嘴(220)之縱向間隔或橫向間隔以比玻璃基板下端還窄的方式配置,將化學研磨液多量地噴射於上端側,且較少量噴射於下端側。     A method for polishing a glass substrate is a method (100) for polishing a glass substrate used uniformly on the surface of a glass substrate of a liquid crystal display or an organic EL display. The method is characterized by comprising a setting process (110), A glass substrate (10) is suspended vertically to be fixed; and a chemical polishing process (120) is a method of continuously spraying and coating a chemical polishing liquid (20) for melting and polishing the glass substrate from a plurality of spray nozzles (220). It is disposed on both sides of the aforementioned glass substrate; and a cleaning process (130), which cleans the aforementioned glass substrate that has been melt-polished after a predetermined melting and polishing time; the aforementioned chemical polishing process (120) is to prevent The unevenness of the spray coating of the chemical polishing liquid caused by the downward flow of the liquid occurs and remains, and the vertical or horizontal interval of the spray nozzle (220) on the upper end side of the glass substrate (10) is narrower than the lower end of the glass substrate The method is configured to spray a large amount of the chemical polishing liquid on the upper end side and a small amount of the chemical polishing liquid on the lower end side.     一種玻璃基板的研磨方法,係用以均質地研磨使用於液晶顯示器或有機EL顯示器的玻璃基板之表面的玻璃基板的研磨方法(100),其特徵為包含:設置製程(110),其是將玻璃基板垂直地懸吊來設置固定;及化學研磨製程(120),其是將用以溶融研磨前述玻璃基板的化學研磨液從複數個噴射噴嘴(220)持 續地噴射塗佈於前述玻璃基板之兩側面;以及洗淨製程(130),其是洗淨已被溶融研磨後的前述玻璃基板;前述化學研磨製程(120),係為了防止由於液體往下垂流所致使的化學研磨液之噴射塗佈不均勻的發生和殘留,而將從等間隔設置的複數個噴射噴嘴(220)所噴射的化學研磨液之量,以從玻璃基板下端側之噴射噴嘴所噴射的化學研磨液之量,比從玻璃基板上端側之噴射噴嘴所噴射的化學研磨液之量還少的方式,來進行噴射。     A method for polishing a glass substrate is a method (100) for polishing a glass substrate used uniformly on the surface of a glass substrate of a liquid crystal display or an organic EL display. The method is characterized by comprising a setting process (110), The glass substrate is suspended vertically to be set and fixed; and a chemical polishing process (120), which continuously sprays and applies a chemical polishing liquid for melt-polishing the glass substrate from a plurality of spray nozzles (220) onto the glass substrate. Both sides; and a cleaning process (130), which cleans the aforementioned glass substrate which has been melt-polished; the aforementioned chemical polishing process (120), in order to prevent the spray coating of the chemical polishing liquid caused by the liquid flowing downward The unevenness of cloth occurs and remains, and the amount of the chemical polishing liquid sprayed from the plurality of spray nozzles (220) arranged at equal intervals is compared with the amount of the chemical polishing liquid sprayed from the spray nozzles on the lower end side of the glass substrate. The amount of the chemical polishing liquid sprayed from the spray nozzle on the upper end side of the glass substrate is sprayed so that the amount is small.     如申請專利範圍第1或2項之玻璃基板的研磨方法,其中,前述玻璃基板(10),係由已將液晶封入於CF基板(12)與TFT基板(14)之空隙的液晶顯示器用玻璃基板、或有機EL顯示器用玻璃基板所構成。     For example, the method for polishing a glass substrate according to item 1 or 2 of the application, wherein the glass substrate (10) is a glass for a liquid crystal display device in which liquid crystal is sealed in a gap between the CF substrate (12) and the TFT substrate (14). A substrate or a glass substrate for an organic EL display.     如申請專利範圍第1或2項之玻璃基板的研磨方法,其中,前述化學研磨液(20),係含有由氟酸、硫酸、鹽酸所組成之群組中選擇的一個或複數個溶融研磨成分。     For example, the method for polishing a glass substrate according to item 1 or 2 of the patent application scope, wherein the aforementioned chemical polishing liquid (20) contains one or more molten polishing components selected from the group consisting of hydrofluoric acid, sulfuric acid, and hydrochloric acid. .     如申請專利範圍第1或2項之玻璃基板的研磨方法,其中,前述玻璃基板的研磨方法(100),係藉由噴射塗佈含有硫酸的化學研磨液(20),來閉塞除去前述玻璃基板的潛在傷痕。     For example, the method for polishing a glass substrate according to item 1 or 2 of the patent application scope, wherein the method (100) for polishing the glass substrate is to apply a chemical polishing solution (20) containing sulfuric acid to block and remove the glass substrate. Potential scars.     一種玻璃基板的研磨裝置,係用以均質地研磨使用於 液晶顯示器或有機EL顯示器的玻璃基板之表面的玻璃基板的研磨裝置(200),其特徵為包含:設置手段(210),其是將玻璃基板(10)垂直地懸吊來設置固定;及複數個噴射噴嘴(220),其是將用以溶融研磨前述玻璃基板(10)的化學研磨液(20)對前述玻璃基板(10)之兩側面垂直並持續地噴射塗佈;以及洗淨手段(230),其是洗淨經過既定的溶融研磨時間之後已被溶融研磨後的前述玻璃基板;前述噴射噴嘴(220),係為了防止由於液體往下垂流所致使的化學研磨液(20)之噴射塗佈不均勻的發生和殘留,而將玻璃基板上端側的噴射噴嘴(220a)之縱向間隔或橫向間隔以比玻璃基板下端的噴射噴嘴(220b)之縱向間隔或橫向間隔還窄的方式配置,將化學研磨液多量地噴射於上端側,且較少量噴射於下端側。     A glass substrate polishing device is a polishing device (200) for uniformly polishing a glass substrate used on the surface of a glass substrate of a liquid crystal display or an organic EL display. The polishing device (200) is characterized by comprising: a setting means (210); The glass substrate (10) is suspended vertically to be fixed; and a plurality of spray nozzles (220) are formed by applying a chemical polishing liquid (20) for melting and polishing the glass substrate (10) to the glass substrate (10). Both sides are spray-coated vertically and continuously; and a cleaning means (230), which cleans the glass substrate that has been melt-polished after a predetermined melt-polishing time; the spray nozzle (220) is used to prevent The unevenness of the spray coating of the chemical polishing liquid (20) caused by the downward flow of the liquid occurs and remains, and the vertical or horizontal interval of the spray nozzle (220a) on the upper end of the glass substrate is longer than the spray nozzle on the lower end of the glass substrate (220b) is arranged in such a manner that the vertical interval or the horizontal interval is still narrow, and a large amount of the chemical polishing liquid is sprayed on the upper end side, and a smaller amount is sprayed on the lower end side.     一種玻璃基板的研磨裝置,係用以均質地研磨使用於液晶顯示器或有機EL顯示器的玻璃基板之表面的玻璃基板的研磨裝置(200),其特徵為包含:設置手段(210),其是將玻璃基板(10)垂直地懸吊來設置固定;及複數個噴射噴嘴(220),其是將用以溶融研磨前述玻璃基板(10)的化學研磨液對前述玻璃基板之兩側面垂直並持續地噴射塗佈;以及洗淨手段(230),其是洗淨經過既定的溶融研磨時間之後已被溶融研磨後的前述玻璃基板; 前述噴射噴嘴(220),係為了防止由於液體往下垂流所致使的化學研磨液(20)之噴射塗佈不均勻的發生和殘留,而將從等間隔設置的複數個噴射噴嘴(220)所噴射的化學研磨液之量,以從玻璃基板下端側之噴射噴嘴(220b)所噴射的化學研磨液之量,比從玻璃基板上端側之噴射噴嘴(220a)所噴射的化學研磨液之量還少的方式,來進行噴射。     A glass substrate polishing device is a polishing device (200) for uniformly polishing a glass substrate used on the surface of a glass substrate of a liquid crystal display or an organic EL display. The polishing device (200) is characterized by comprising: a setting means (210); The glass substrate (10) is suspended vertically to be fixed; and a plurality of spray nozzles (220) are used to vertically and continuously apply a chemical polishing liquid for melt grinding the glass substrate (10) to both sides of the glass substrate Spray coating; and a cleaning means (230), which cleans the glass substrate that has been melt-polished after a predetermined melt-polishing time; the spray nozzle (220) is for preventing the liquid from flowing downward Occurrence and residue of the non-uniform spray coating of the chemical polishing liquid (20), and the amount of the chemical polishing liquid sprayed from a plurality of spray nozzles (220) arranged at equal intervals, from the spray nozzles on the lower end side of the glass substrate (220b) The amount of the chemical polishing liquid sprayed is sprayed in a manner that the amount of the chemical polishing liquid sprayed from the spray nozzle (220a) on the upper end side of the glass substrate is smaller.     如申請專利範圍第6或7項之玻璃基板的研磨裝置,其中,前述設置手段(210),係由支撐玻璃基板左右緣端的側邊固定手段(212)、和支撐玻璃基板下部緣端的底邊固定手段(214)所構成;前述側邊固定手段(212),係由在未被覆玻璃基板(10)之兩側面的位置接觸於玻璃基板左右緣端角隅部並從兩端夾持的剖面大致三角形之切口淺凹槽所構成;前述底邊固定手段(214),係由載置玻璃基板(10)之底邊的載置用之底座所構成。     For example, the device for polishing a glass substrate according to item 6 or 7 of the patent application, wherein the aforementioned setting means (210) is a side edge fixing means (212) supporting the left and right edges of the glass substrate and a bottom edge supporting the lower edge of the glass substrate. The fixing means (214) is constituted; the side fixing means (212) is a cross section that is in contact with the corners of the left and right edges of the glass substrate at positions on both sides of the uncovered glass substrate (10) and is clamped from both ends A substantially triangular notch is formed by a shallow groove; the aforementioned bottom edge fixing means (214) is composed of a base for placing the bottom edge of the glass substrate (10).     如申請專利範圍第6或7項之玻璃基板的研磨裝置,其中,前述噴射噴嘴(220)之等間隔設置的複數個噴射噴嘴之前端口,係將上端側的噴射噴嘴(220a)之前端口徑形成較大,將下端側的噴射噴嘴(220b)之前端口徑形成較小。     For example, the polishing device for a glass substrate according to item 6 or 7 of the patent application, wherein the plurality of front ports of the spray nozzles (220) provided at equal intervals are formed by forming the front port diameter of the upper side spray nozzles (220a). The larger the diameter is, the smaller the port diameter is before the injection nozzle (220b) on the lower end side.    
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