TW201814746A - Lead terminal manufacturing method, wafer type electrolytic capacitor, and semi-finished product of lead terminal - Google Patents
Lead terminal manufacturing method, wafer type electrolytic capacitor, and semi-finished product of lead terminal Download PDFInfo
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- TW201814746A TW201814746A TW106133659A TW106133659A TW201814746A TW 201814746 A TW201814746 A TW 201814746A TW 106133659 A TW106133659 A TW 106133659A TW 106133659 A TW106133659 A TW 106133659A TW 201814746 A TW201814746 A TW 201814746A
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G9/00—Electrolytic capacitors, rectifiers, detectors, switching devices, light-sensitive or temperature-sensitive devices; Processes of their manufacture
- H01G9/004—Details
- H01G9/008—Terminals
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G9/00—Electrolytic capacitors, rectifiers, detectors, switching devices, light-sensitive or temperature-sensitive devices; Processes of their manufacture
- H01G9/004—Details
- H01G9/008—Terminals
- H01G9/012—Terminals specially adapted for solid capacitors
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G13/00—Apparatus specially adapted for manufacturing capacitors; Processes specially adapted for manufacturing capacitors not provided for in groups H01G4/00 - H01G11/00
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G13/00—Apparatus specially adapted for manufacturing capacitors; Processes specially adapted for manufacturing capacitors not provided for in groups H01G4/00 - H01G11/00
- H01G13/006—Apparatus or processes for applying terminals
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Abstract
本發明涉及引線端子的製造方法、晶片型電解電容器和引線端子的半成品,抑制晶片型電解電容器用的引線端子的引線部的焊料潤濕性局部地降低,並且抑制金屬粉的產生。一種引線端子(4)的製造方法,該引線端子(4)具有帶狀的引線部(41)以及設置於其一端的端子部(42),並且所述引線端子(4)經由端子部安裝到晶片型電解電容器(1)的電容器元件(3),該方法包含準備在外周設置有焊料潤濕性良好的包覆層(412)的剖面多邊形的金屬線材(411)的工序以及對金屬線材(411)進行衝壓加工而形成引線部(41)的工序。 The present invention relates to a method for manufacturing a lead terminal, a wafer-type electrolytic capacitor, and a semi-finished product of a lead terminal, suppresses a local decrease in solder wettability of a lead portion of a lead terminal for a wafer-type electrolytic capacitor, and suppresses generation of metal powder. A method for manufacturing a lead terminal (4) having a strip-shaped lead portion (41) and a terminal portion (42) provided at one end thereof, and the lead terminal (4) is mounted to the terminal portion via the terminal portion A capacitor element (3) of a wafer-type electrolytic capacitor (1), the method comprising a step of preparing a metal wire (411) with a polygonal cross section provided with a coating layer (412) having good solder wettability on an outer periphery, and 411) A step of forming a lead portion (41) by performing a press working.
Description
本發明涉及一種晶片型電解電容器用的引線端子的製造方法、晶片型電解電容器和引線端子的半成品。 The present invention relates to a method for manufacturing a lead terminal for a wafer type electrolytic capacitor, a wafer type electrolytic capacitor, and a semi-finished product of a lead terminal.
一般來說,晶片型電解電容器用的引線端子具有焊接到電路基板的帶狀的引線部以及設置於其一端的端子部,經由端子部安裝到晶片型電解電容器的電容器元件。引線部通過對剖面圓形的金屬線材在徑向上進行衝壓加工而形成為帶狀(專利文獻1)。另外,為了確保引線部與電路基板的焊接強度的可靠性,有時由在外周設置有焊料潤濕性良好的包覆層(例如,鍍錫層)的金屬線材而形成。 Generally, a lead terminal for a wafer-type electrolytic capacitor has a strip-shaped lead portion soldered to a circuit board and a terminal portion provided at one end thereof, and the capacitor element is mounted to the wafer-type electrolytic capacitor via the terminal portion. The lead portion is formed into a band shape by press-working a metal wire having a circular cross-section in a radial direction (Patent Document 1). In addition, in order to ensure the reliability of the soldering strength between the lead portion and the circuit board, it may be formed by a metal wire provided with a coating layer (for example, a tin plating layer) having good solder wettability on the outer periphery.
專利文獻1:日本特開平11-26327號公報 Patent Document 1: Japanese Patent Application Laid-Open No. 11-26327
以往,形成引線部的金屬線材的剖面是圓形,所以當對金屬線材進行衝壓加工後,有時設置于外周的包覆層的厚度局部地變薄,損害焊料潤濕性。 Conventionally, the cross section of the metal wire forming the lead portion is circular. Therefore, after the metal wire is press-processed, the thickness of the cladding layer provided on the outer periphery may be locally reduced, which may impair solder wettability.
圖7是以往的引線部的衝壓工序的說明圖。如圖7的(a)所示,形成引線部的金屬線材511的剖面是圓形,在外周設置有包覆層512。如圖7的(b)所示,在第1衝壓模110與第2衝壓模120之間夾壓金屬線材511而形成帶狀的引線部。金屬線材511在被夾壓時,剖面變形為橢圓狀,但此時,由於包覆層512較柔軟,所以,其厚度在金屬線材511的中心部的上下變得最薄,向兩側逐漸變厚。 FIG. 7 is an explanatory diagram of a pressing process of a conventional lead portion. As shown in FIG. 7 (a), the cross section of the metal wire 511 forming the lead portion is circular, and a cladding layer 512 is provided on the outer periphery. As shown in FIG. 7 (b), a metal wire 511 is sandwiched between the first punch 110 and the second punch 120 to form a strip-shaped lead portion. When the metal wire 511 is sandwiched, the cross section deforms into an oval shape, but at this time, because the coating layer 512 is soft, its thickness becomes the thinnest at the top and bottom of the metal wire 511 and gradually changes to both sides. thick.
這樣,如果包覆層512的厚度局部地變薄,則在該部分,焊料潤濕性大幅降低,有時會損害焊接強度的可靠性。另外,由於包覆層512的厚度在兩側變厚,從而在金屬線材511的兩側產生大量金屬粉,還存在容易發生電路基板的短路、電容器特性的降低這樣的問題。 As described above, if the thickness of the cladding layer 512 is locally reduced, solder wettability is greatly reduced in this portion, and reliability of solder strength may be impaired. In addition, since the thickness of the cladding layer 512 becomes thicker on both sides, a large amount of metal powder is generated on both sides of the metal wire 511, and there is also a problem that a short circuit of the circuit board is likely to occur and the characteristics of the capacitor are lowered.
本發明是鑒於上述情形而提出的,其目的在於,抑制晶片型電解電容器用引線端子的引線部的焊料潤濕性局部地降低,並且抑制金屬粉的產生。 The present invention has been made in view of the above circumstances, and an object thereof is to suppress a local decrease in solder wettability of a lead portion of a lead terminal for a wafer type electrolytic capacitor and to suppress generation of metal powder.
為了達到上述目的,第1發明涉及一種引線端子4的製造方法,該引線端子4具有帶狀的引線部41以及設置於其一端的端子部42,並且所述引線端子4經由端子部42安裝到晶片型電解電容器1的電容器元件3,該引線端子的製造方法包含:準備在外周設置有焊料潤濕性良好的包覆層412的剖面多邊形的金屬線材411的工序;以及對金屬線材411進行衝壓加工而形成引線部41的工序。 In order to achieve the above object, the first invention relates to a method of manufacturing a lead terminal 4 having a strip-shaped lead portion 41 and a terminal portion 42 provided at one end thereof, and the lead terminal 4 is mounted to the terminal portion 42 via the terminal portion 42. The capacitor element 3 of the wafer-type electrolytic capacitor 1 includes a step of preparing a metal wire 411 having a polygonal cross-section provided with a coating layer 412 having good solder wettability on an outer periphery, and a step of punching the metal wire 411. Process of forming the lead portion 41.
另外,第2發明涉及一種晶片型電解電容器,具備通過第1發明製造的引線端子4。 The second invention relates to a wafer-type electrolytic capacitor including the lead terminal 4 manufactured by the first invention.
另外,第3發明涉及一種引線端子4的半成品4’,該引線端子4具有帶狀的引線部41以及設置於其一端的端子部42,並且所述引線端子4經由端子部42安裝到晶片型電解電容器1的電容器元件3,該引線端子的半成品具有從端子部42延伸出、並且在外周設置有焊料潤濕性良好的包覆層412的剖面多邊形的金屬線材411,金屬線材411能夠通過衝壓加工而塑性變形為引線部41的形狀 The third invention relates to a semi-finished product 4 ′ of a lead terminal 4 having a strip-shaped lead portion 41 and a terminal portion 42 provided at one end thereof, and the lead terminal 4 is mounted to a wafer type via the terminal portion 42. In the capacitor element 3 of the electrolytic capacitor 1, the semi-finished product of the lead terminal includes a metal wire 411 with a polygonal cross-section extending from the terminal portion 42 and provided with a coating layer 412 having good solder wettability on the outer periphery. The metal wire 411 can be punched Processed and plastically deformed into the shape of the lead portion 41
根據本發明,能夠抑制晶片型電解電容器用的引線端子的引線部的焊料潤濕性局部地降低,並且能夠抑制金屬粉的產生。 According to the present invention, it is possible to suppress a local decrease in solder wettability of a lead portion of a lead terminal for a wafer-type electrolytic capacitor, and to suppress generation of metal powder.
1‧‧‧晶片型電解電容器 1‧‧‧Chip Electrolytic Capacitor
2‧‧‧容器 2‧‧‧ container
3‧‧‧電容器元件 3‧‧‧ capacitor element
4‧‧‧引線端子 4‧‧‧lead terminal
4’‧‧‧引線端子的半成品 4’‧‧‧ Semi-finished products of lead terminals
5‧‧‧封口部件 5‧‧‧Sealing parts
6‧‧‧座板 6‧‧‧ seat plate
41‧‧‧引線部 41‧‧‧Leader
42‧‧‧端子部 42‧‧‧Terminal
51‧‧‧通孔 51‧‧‧through hole
61‧‧‧通孔 61‧‧‧through hole
62‧‧‧對槽 62‧‧‧Slot
110‧‧‧第1衝壓模 110‧‧‧The first stamping die
111‧‧‧衝壓面 111‧‧‧ stamping surface
120‧‧‧第2衝壓模 120‧‧‧ 2nd stamping die
121‧‧‧衝壓面 121‧‧‧ stamping surface
130‧‧‧凹部 130‧‧‧ recess
411‧‧‧金屬線材 411‧‧‧metal wire
412‧‧‧包覆層 412‧‧‧ cladding
412b‧‧‧凸條 412b‧‧‧ convex strip
421‧‧‧扁平部 421‧‧‧ Flat
511‧‧‧金屬線材 511‧‧‧metal wire
512‧‧‧包覆層 512‧‧‧ coating
圖1是本發明的具備引線端子的晶片型電解電容器的立體圖。 FIG. 1 is a perspective view of a wafer-type electrolytic capacitor including a lead terminal according to the present invention.
圖2是圖1的晶片型電解電容器的縱剖視圖。 FIG. 2 is a longitudinal sectional view of the wafer-type electrolytic capacitor of FIG. 1.
圖3是本發明的引線端子的半成品的立體圖。 3 is a perspective view of a semi-finished product of a lead terminal according to the present invention.
圖4是本發明的引線端子製造方法的第1實施方式的說明圖。 FIG. 4 is an explanatory diagram of a first embodiment of a method of manufacturing a lead terminal according to the present invention.
圖5是本發明的引線端子製造方法的第2實施方式的說明圖。 FIG. 5 is an explanatory diagram of a second embodiment of the lead terminal manufacturing method of the present invention.
圖6是比較例的引線端子製造方法的說明圖。 FIG. 6 is an explanatory diagram of a lead terminal manufacturing method of a comparative example.
圖7是以往的引線端子製造方法的說明圖。 FIG. 7 is an explanatory diagram of a conventional lead terminal manufacturing method.
以下,參照附圖,說明本發明的第1實施方式。 Hereinafter, a first embodiment of the present invention will be described with reference to the drawings.
如圖1以及圖2所示,本實施方式的晶片型電解電容器1具備有底筒狀的容器2、收容於該容器2內的電容器元件3、從該電容器元件3匯出的一對引線端子4、將容器2的開口部封閉的封口部件5以及設置於容器2的開口端側的座板6。容器2由金屬制的薄板構成,開口端向內側彎曲而固定支承封口部件5。 As shown in FIGS. 1 and 2, a wafer-type electrolytic capacitor 1 according to this embodiment includes a bottomed cylindrical container 2, a capacitor element 3 housed in the container 2, and a pair of lead terminals that are output from the capacitor element 3. 4. A sealing member 5 that closes the opening of the container 2 and a seat plate 6 provided on the open end side of the container 2. The container 2 is formed of a thin metal plate, and the opening end is bent inward to fix and support the sealing member 5.
引線端子4具有L字形地彎曲的帶狀的引線部41,在其一端設置有端子部42。引線部41通過將剖面四邊形的金屬線材衝壓加工成帶狀而形成。在本實施方式中,金屬線材通過切斷細長的CP線(包銅鋼絲)而形成。 The lead terminal 4 has a strip-shaped lead portion 41 bent in an L-shape, and a terminal portion 42 is provided at one end thereof. The lead portion 41 is formed by punching a metal wire having a rectangular shape in cross section into a band shape. In this embodiment, a metal wire is formed by cutting an elongated CP wire (copper-clad steel wire).
如圖3所示,在金屬線材411的一端設置端子部42,製造引線端子的半成品4’,將該半成品4’的端子部42安裝到電容器元件3的電極箔,將電容器元件3裝入到容器2之後,將金屬線材411衝壓加工成帶狀,做成引線端子4。 As shown in FIG. 3, a terminal portion 42 is provided at one end of the metal wire 411 to manufacture a semi-finished product 4 ′ of the lead terminal. The terminal portion 42 of the semi-finished product 4 ′ is mounted on the electrode foil of the capacitor element 3, and the capacitor element 3 is mounted on After the container 2, the metal wire 411 is press-processed into a strip shape to form a lead terminal 4.
在金屬線材411的外周,為了使焊料潤濕性良好,設置有由錫鍍層構成的包覆層412(參照圖4)。端子部42通過對由鋁等構成的棒狀部件進行衝壓加工而形成,在端子部42的一端具有連接到電容器元件3的扁平部421。在端子部42的另一端,通過焊接等而連接有金屬線材411的一端,金屬線材411從端子部42延伸出。 A coating layer 412 (see FIG. 4) made of a tin plating layer is provided on the outer periphery of the metal wire 411 in order to improve solder wettability. The terminal portion 42 is formed by pressing a rod-shaped member made of aluminum or the like, and has a flat portion 421 connected to the capacitor element 3 at one end of the terminal portion 42. One end of the metal wire 411 is connected to the other end of the terminal portion 42 by welding or the like, and the metal wire 411 extends from the terminal portion 42.
封口部件5由橡膠等形成,具有使端子部42穿插的一對通孔51。座板6由絕緣性材料形成,通過粘接等而固定於容器2的開口端。 The sealing member 5 is formed of rubber or the like, and has a pair of through holes 51 through which the terminal portion 42 is inserted. The seat plate 6 is formed of an insulating material and is fixed to the open end of the container 2 by bonding or the like.
座板6具有使引線部41穿插的一對通孔61、與該通孔61連通的一對槽62。一對引線部41在穿插到通孔61之後,向相互背離的方向彎曲而收容到槽62中。 The seat plate 6 includes a pair of through holes 61 through which the lead portion 41 is inserted, and a pair of grooves 62 communicating with the through holes 61. After being inserted into the through-hole 61, the pair of lead portions 41 are bent in directions away from each other and are accommodated in the groove 62.
接下來,說明引線端子4的製造方法。 Next, a method for manufacturing the lead terminal 4 will be described.
引線端子4通過以下步驟來製造。首先,切斷在外周設置有包覆層412的剖面多邊形的細長的CP線,準備與引線部41對應的長度的金屬線材411。接下來,在金屬線材411的一端設置端子部42。然後,對金屬線材411進行衝壓加工,形成引線部41。 The lead terminal 4 is manufactured by the following steps. First, an elongated CP wire having a polygonal cross-section having a coating layer 412 provided on the outer periphery is cut, and a metal wire 411 having a length corresponding to the lead portion 41 is prepared. Next, a terminal portion 42 is provided at one end of the metal wire 411. Then, the metal wire 411 is press-processed to form a lead portion 41.
在形成引線部41的工序中,如圖4的(a)所示,在第1衝壓模110與第2衝壓模120之間夾壓金屬線材411,塑性加工成圖4的(b)所示的帶狀。此外,也可以在將金屬線材411加工成帶狀之後,切斷其兩側。 In the step of forming the lead portion 41, as shown in FIG. 4 (a), the metal wire 411 is sandwiched between the first stamping die 110 and the second stamping die 120, and plastically processed as shown in FIG. 4 (b). Ribbon. Alternatively, after the metal wire 411 is processed into a strip shape, both sides thereof may be cut.
金屬線材411的剖面是四邊形,所以在衝壓加工時,在其上下兩面,包覆層412的厚度不會局部地變薄,在寬度方向的整個長度範圍內,厚度大致均勻。 The cross section of the metal wire 411 is a quadrangle. Therefore, the thickness of the cladding layer 412 does not become locally thin on both sides of the metal wire 411 during press processing, and the thickness is substantially uniform over the entire length in the width direction.
因此,與圖7所示的剖面圓形的金屬線材511相比,帶狀地加工之後的包覆層412的厚度的偏差變少,所以,能夠抑制焊料潤濕性局部地降低。由此,引線部41對電路基板的焊接強度的可靠性提高。 Therefore, as compared with the metal wire 511 having a circular cross section as shown in FIG. 7, the variation in the thickness of the cladding layer 412 after the strip-shaped processing is reduced, so that it is possible to suppress a local decrease in solder wettability. This improves the reliability of the soldering strength of the lead portion 41 to the circuit board.
另外,由於包覆層412的厚度的偏差變少,從而能夠抑制包覆層412的厚度在兩側變厚,不易產生金屬粉,所以能夠抑制電路基板的短路、電容器特性的降低。 In addition, since the variation in the thickness of the cladding layer 412 is reduced, the thickness of the cladding layer 412 can be suppressed from becoming thicker on both sides, and metal powder is less likely to be generated. Therefore, it is possible to suppress short circuit of the circuit board and decrease in capacitor characteristics.
接下來,說明本發明的第2實施方式。 Next, a second embodiment of the present invention will be described.
如圖5的(a)所示,在本實施方式中,在第1衝壓模110的衝壓面111與第2衝壓模120的衝壓面121,設置有多條槽狀的凹部130。這些凹部130以在金屬線材411的軸線方向(圖5的與紙面正交的方向)上延伸的方式平行地設置,衝壓面111、121的剖面呈波形。 As shown in FIG. 5 (a), in the present embodiment, a plurality of groove-shaped recesses 130 are provided on the pressing surface 111 of the first pressing die 110 and the pressing surface 121 of the second pressing die 120. These recesses 130 are provided in parallel so as to extend in the axial direction of the metal wire 411 (the direction orthogonal to the paper surface in FIG. 5), and the cross sections of the punched surfaces 111 and 121 are wavy.
通過設置這樣的多條凹部130,當在第1衝壓模110與第2衝壓模120之間夾壓金屬線材411時,如圖5的(b)所示,包覆層412沿著多條凹部130,剖面變形成波形,由於形成有在金屬線材411的軸線方向上延伸的多條凸條412b,所以,渣滓412a不容易向金屬線材411的兩側突出。 By providing such a plurality of recesses 130, when the metal wire 411 is sandwiched between the first and second punches 110 and 120, as shown in FIG. 5 (b), the coating layer 412 extends along the plurality of recesses. 130. The cross section is changed into a wave shape, and since a plurality of protruding lines 412b extending in the axial direction of the metal wire 411 are formed, the dross 412a cannot easily protrude to both sides of the metal wire 411.
另一方面,如圖6所示,當在第1衝壓模110的衝壓面111和第2衝壓模120的衝壓面121未設置有多條槽狀的凹部130的情況下,與圖5的情況相比,渣滓412a更容易向金屬線材411的兩側突出,所以金屬粉容易灑落。 On the other hand, as shown in FIG. 6, when a plurality of groove-shaped recesses 130 are not provided on the pressing surface 111 of the first pressing die 110 and the pressing surface 121 of the second pressing die 120, it is the same as the case of FIG. 5. Compared with this, the dross 412a is more likely to protrude to both sides of the metal wire 411, so the metal powder is easily spilled.
通過將圖5所示的凹部130設置於第1衝壓模110和第2衝壓模120,從而金屬粉不容易灑落,所以能夠進一步地抑制電路基板的短路、電容器特性的降低。 By providing the recess 130 shown in FIG. 5 in the first and second stamping dies 110 and 120, metal powder is not easily spilled, so that it is possible to further suppress short circuit of the circuit board and degradation of capacitor characteristics.
此外,本發明不限定於上述各實施方式。 The present invention is not limited to the above embodiments.
例如,金屬線材的剖面形狀也可以是四邊形以外的多邊形。 For example, the cross-sectional shape of the metal wire may be a polygon other than a quadrangle.
另外,金屬線材也可以由CP線以外的原料形成。 The metal wire may be formed of a material other than the CP wire.
另外,也可以代替錫鍍層,而將由焊料潤濕性良好的其他材料構成的包覆層設置於金屬線材的外周。 In addition, instead of the tin plating layer, a coating layer made of another material having good solder wettability may be provided on the outer periphery of the metal wire.
另外,對金屬線材進行衝壓加工而形成引線部的工序也可以在將端子部安裝到電容器元件的電極箔之前進行。在該情況下,能夠在從引線端子充分地去除在引線部的衝壓加工時產生的金屬粉之後,將端子部安裝到電極箔,所以金屬粉不容易附著於完成的晶片型電解電容器,所以能夠進一步地抑制電路基板的短路、電容器性能的降低等。此外,這樣的製造方法在應用於對剖面形狀為多邊形以外的形狀的金屬線材進行衝壓加工的情況時,也能夠得到相同的效果。 In addition, the step of forming a lead portion by pressing a metal wire may be performed before the terminal portion is mounted on the electrode foil of the capacitor element. In this case, since the metal powder generated during the punching process of the lead portion can be sufficiently removed from the lead terminal, the terminal portion can be attached to the electrode foil. Therefore, the metal powder cannot be easily attached to the completed wafer-type electrolytic capacitor. Further, it is possible to further suppress a short circuit of a circuit board, a decrease in capacitor performance, and the like. In addition, when such a manufacturing method is applied to a case where a metal wire having a cross-sectional shape other than a polygon is punched, the same effect can be obtained.
另外,設置於第1衝壓模的衝壓面和第2衝壓模的衝壓面的凹部的形狀也可以是槽狀以外的形狀,凹部的數量也可以是單數。 Moreover, the shape of the recessed part provided in the press surface of a 1st press die and the press surface of a 2nd press die may be a shape other than a groove shape, and the number of recessed parts may be an odd number.
另外,凹部也可以僅設置於第1衝壓模和第2衝壓模中的某一方。此外,在對剖面形狀為多邊形以外的形狀的金屬線材進行衝壓加工的情況下,通過在第1衝壓模的衝壓面和第2衝壓模的衝壓面中的至少一方設置凹部,也能夠得到相同的效果(渣滓不容易向金屬線材的兩側突出,不容易產生金屬粉)。 The recessed portion may be provided only on one of the first punching die and the second punching die. In addition, when a metal wire having a cross-sectional shape other than a polygon is punched, a recess can be provided in at least one of the punching surface of the first punching die and the punching surface of the second punching die to obtain the same Effect (dross does not easily protrude to both sides of the metal wire, and metal powder is not easily generated).
Claims (7)
Applications Claiming Priority (8)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2016196437 | 2016-10-04 | ||
| JP2016-196437 | 2016-10-04 | ||
| JP2017030843A JP6656625B2 (en) | 2017-02-22 | 2017-02-22 | Manufacturing method of chip type electrolytic capacitor |
| JP2017-030843 | 2017-02-22 | ||
| JP2017143082A JP6632034B2 (en) | 2017-07-06 | 2017-07-06 | Method of manufacturing lead wire terminal for chip type electrolytic capacitor and chip type electrolytic capacitor |
| JP2017-143082 | 2017-07-06 | ||
| JP2017-175783 | 2017-09-13 | ||
| JP2017175783A JP2018061015A (en) | 2016-10-04 | 2017-09-13 | Manufacturing method of lead wire terminal, chip type electrolytic capacitor and semifinished product of lead wire terminal |
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| TW201814746A true TW201814746A (en) | 2018-04-16 |
| TWI719260B TWI719260B (en) | 2021-02-21 |
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| TW110109515A TWI740793B (en) | 2016-10-04 | 2017-09-29 | Method for manufacturing lead terminal of chip type electrolytic capacitor and chip type electrolytic capacitor |
| TW110109514A TWI761138B (en) | 2016-10-04 | 2017-09-29 | Lead terminal of chip-type electrolytic capacitor, and method for producing chip-type electrolytic capacitor |
| TW106133659A TWI719260B (en) | 2016-10-04 | 2017-09-29 | Lead terminal manufacturing method, chip type electrolytic capacitor and lead terminal semi-finished product |
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| TW110109515A TWI740793B (en) | 2016-10-04 | 2017-09-29 | Method for manufacturing lead terminal of chip type electrolytic capacitor and chip type electrolytic capacitor |
| TW110109514A TWI761138B (en) | 2016-10-04 | 2017-09-29 | Lead terminal of chip-type electrolytic capacitor, and method for producing chip-type electrolytic capacitor |
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| JPH0677374A (en) * | 1992-08-27 | 1994-03-18 | Nec Corp | Lead for semiconductor device and manufacture thereof |
| JP3344462B2 (en) * | 1997-06-30 | 2002-11-11 | エルナー株式会社 | Electronic components |
| JP4449999B2 (en) * | 2007-03-12 | 2010-04-14 | Tdk株式会社 | Electronic component and its mounting structure, and inverter device |
| JP2009010069A (en) * | 2007-06-27 | 2009-01-15 | Panasonic Corp | Capacitor electrode foil lead wire connection device |
| CN201084559Y (en) * | 2007-08-04 | 2008-07-09 | 沙洲职业工学院 | A punch edge-cutting device in electro-analysis capacitor leader welder |
| CN102138190B (en) * | 2009-11-02 | 2013-03-06 | 湖北工业株式会社 | Method for producing terminal for electronic component, and terminal for electronic component produced by the production method |
| JP5431130B2 (en) * | 2009-11-24 | 2014-03-05 | 三洋電機株式会社 | Electrolytic capacitor manufacturing method |
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| CN109791842B (en) | 2021-11-09 |
| TWI761138B (en) | 2022-04-11 |
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| TWI740793B (en) | 2021-09-21 |
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