TW201803044A - Resin molding device and method for producing resin molded article - Google Patents
Resin molding device and method for producing resin molded articleInfo
- Publication number
- TW201803044A TW201803044A TW106119140A TW106119140A TW201803044A TW 201803044 A TW201803044 A TW 201803044A TW 106119140 A TW106119140 A TW 106119140A TW 106119140 A TW106119140 A TW 106119140A TW 201803044 A TW201803044 A TW 201803044A
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- substrate
- resin
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Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C43/00—Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor
- B29C43/32—Component parts, details or accessories; Auxiliary operations
- B29C43/58—Measuring, controlling or regulating
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C43/00—Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor
- B29C43/02—Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor of articles of definite length, i.e. discrete articles
- B29C43/18—Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor of articles of definite length, i.e. discrete articles incorporating preformed parts or layers, e.g. compression moulding around inserts or for coating articles
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- H10W74/016—
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C43/00—Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor
- B29C43/02—Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor of articles of definite length, i.e. discrete articles
- B29C43/18—Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor of articles of definite length, i.e. discrete articles incorporating preformed parts or layers, e.g. compression moulding around inserts or for coating articles
- B29C2043/181—Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor of articles of definite length, i.e. discrete articles incorporating preformed parts or layers, e.g. compression moulding around inserts or for coating articles encapsulated
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C43/00—Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor
- B29C43/32—Component parts, details or accessories; Auxiliary operations
- B29C43/36—Moulds for making articles of definite length, i.e. discrete articles
- B29C2043/3602—Moulds for making articles of definite length, i.e. discrete articles with means for positioning, fastening or clamping the material to be formed or preforms inside the mould
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C43/00—Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor
- B29C43/32—Component parts, details or accessories; Auxiliary operations
- B29C43/58—Measuring, controlling or regulating
- B29C2043/5833—Measuring, controlling or regulating movement of moulds or mould parts, e.g. opening or closing, actuating
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C43/00—Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor
- B29C43/32—Component parts, details or accessories; Auxiliary operations
- B29C43/58—Measuring, controlling or regulating
- B29C2043/5891—Measuring, controlling or regulating using imaging devices, e.g. cameras
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
- Moulds For Moulding Plastics Or The Like (AREA)
- Injection Moulding Of Plastics Or The Like (AREA)
- Physics & Mathematics (AREA)
- Casting Or Compression Moulding Of Plastics Or The Like (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
Abstract
本發明涉及驗證被供給到成型模具的基板是否被正常定位的樹脂成型裝置及樹脂成型品的製造方法。該裝置包括:成型模具(24),具有相互對置配置的第一模具(23)和第二模具(12);基板供給機構(10),將基板供給到第一模具(23)的模具表面;定位機構,對至少包括基板的定位對象物(5)進行定位;合模機構,對成型模具(24)進行合模;攝影機(11),在成型模具(24)被開模的狀態下,能配置在第一模具(23)與第二模具(12)之間;及處理器,根據由攝影機(11)拍攝的圖像資料進行處理,第一模具(23)具有藉由攝影機(11)的拍攝能識別的基準標記(29、30),攝影機(11)拍攝定位後的對象物(5)與基準標記(29、30),處理器根據由攝影機(11)拍攝的物件物(5)與基準標記(29、30)的圖像資料,判斷物件物(5)是否被正常定位。The present invention relates to a resin molding apparatus and a method for manufacturing a resin molded article that verify whether a substrate supplied to a molding die is positioned properly. The device comprises: a forming mold (24), which has a first mold (23) and a second mold (12) arranged opposite to each other; a substrate supply mechanism (10), which supplies a substrate to a mold surface of the first mold (23) A positioning mechanism for positioning a positioning object (5) including at least a substrate; a mold clamping mechanism for clamping a molding mold (24); a camera (11) in a state where the molding mold (24) is opened, It can be arranged between the first mold (23) and the second mold (12); and the processor performs processing based on the image data captured by the camera (11), and the first mold (23) has a camera (11) The recognizable reference mark (29, 30), the camera (11) shoots the positioned object (5) and the reference mark (29, 30), and the processor according to the object (5) shot by the camera (11) With the image data of the fiducial marks (29, 30), determine whether the object (5) is positioned normally.
Description
本發明涉及在對電晶體、積體電路(IC,Integrated Circuit)、發光二極體(LED,Light Emitting Diode)等晶片狀的電子部件(以下適當稱為“晶片”)進行樹脂封裝時等使用的樹脂成型裝置及樹脂成型品的製造方法。The present invention relates to the use of a resin, such as a transistor, an integrated circuit (IC), and a light emitting diode (LED), in a wafer-like electronic component (hereinafter referred to as a "wafer"). Resin molding apparatus and method for manufacturing a resin molded product.
一直以來,使用樹脂成型裝置來對安裝在基板上的半導體晶片等進行樹脂封裝。在樹脂成型裝置中,藉由將基板定位到成型模具的規定位置並對成型模具進行合模,從而對半導體晶片進行樹脂封裝。作為將基板定位到成型模具的規定位置的技術,例如有使基板的外側面與設置於成型模具的導銷相抵接的技術(參照專利文獻1)。Conventionally, a resin molding apparatus is used to resin-encapsulate a semiconductor wafer or the like mounted on a substrate. In a resin molding apparatus, a semiconductor wafer is resin-encapsulated by positioning a substrate at a predetermined position of a molding mold and clamping the molding mold. As a technique for positioning the substrate at a predetermined position of the molding die, for example, there is a technology of bringing the outer surface of the substrate into contact with a guide pin provided in the molding die (see Patent Document 1).
專利文獻1:日本特開平8-142106號公報Patent Document 1: Japanese Patent Application Laid-Open No. 8-142106
然而,專利文獻1中公開的使用導銷的基板定位技術存在如下問題。如專利文獻1的第8圖所示,在下模具10b設置有導銷28的插入孔32,保持使導銷28從上模具10a的夾持面突出的狀態進行合模。或者,如第9圖所示,在進行合模時使導銷28被收入上模具10a內。無論在哪種情況下,都會在進行合模時反復使導銷28接觸到下模具10b的插入孔32或下模具10b的夾持面,因此導銷28可能會發生磨耗或破損。當導銷28因磨耗或破損而發生變形時,基板可能不會被正常定位到上模具10a的規定位置。進一步地,在定位操作之後,如果不對是否被正常定位進行確認就進行樹脂成型,則在未進行恰當的定位的情況下,樹脂成型品會發生位置偏移缺陷。However, the substrate positioning technology using guide pins disclosed in Patent Document 1 has the following problems. As shown in FIG. 8 of Patent Document 1, an insertion hole 32 of a guide pin 28 is provided in the lower mold 10b, and the mold is closed while the guide pin 28 is protruded from the clamping surface of the upper mold 10a. Alternatively, as shown in FIG. 9, the guide pins 28 are received in the upper mold 10 a when the mold is closed. In either case, the guide pin 28 is repeatedly brought into contact with the insertion hole 32 of the lower mold 10b or the clamping surface of the lower mold 10b during mold clamping, so the guide pin 28 may be worn or damaged. When the guide pin 28 is deformed due to abrasion or damage, the substrate may not be normally positioned to a prescribed position of the upper mold 10a. Further, after the positioning operation, if the resin molding is performed without confirming whether or not the normal positioning is performed, the positional defect of the resin molded product may occur without proper positioning.
本發明用於解決上述問題,其目的在於提供一種能夠減少由定位引起的成型缺陷的發生的樹脂成型裝置及樹脂成型品的製造方法。The present invention has been made to solve the above problems, and an object thereof is to provide a resin molding apparatus and a method for manufacturing a resin molded product that can reduce the occurrence of molding defects caused by positioning.
為了解決上述問題,本發明所涉及的樹脂成型品的製造方法包括: 基板供給步驟,將基板供給到具有相互對置配置的第一模具和第二模具的成型模具中的任意一模具的模具表面; 定位步驟,在模具表面上對至少包括基板的定位對象物進行定位; 拍攝步驟,對在定位步驟中被定位後的定位物件物與設置於一個模具的基準標記進行拍攝; 判斷步驟,根據在拍攝步驟中獲得的定位對象物的圖像資料與基準標記的圖像資料,判斷定位物件物是否被正常定位;以及 樹脂成型步驟,當在判斷步驟中判斷為基板被正常定位時,對成型模具進行合模以進行樹脂成型。In order to solve the above-mentioned problems, the method for manufacturing a resin molded article according to the present invention includes: a substrate supplying step of supplying a substrate to a mold surface of any one of a molding mold having a first mold and a second mold which are arranged to face each other. Positioning step, positioning the positioning object including at least the substrate on the mold surface; photographing step, shooting the positioning object positioned in the positioning step and the reference mark set in a mold; determining step, according to the The image data of the positioning object obtained during the shooting step and the image data of the fiducial mark determine whether the positioning object is normally positioned; and the resin molding step, when it is determined in the determination step that the substrate is normally positioned, the molding mold The mold is closed for resin molding.
根據本發明,能夠減少由定位引起的成型缺陷的發生。According to the present invention, it is possible to reduce the occurrence of molding defects caused by positioning.
以下參照附圖來對本發明所涉及的實施方式進行說明。對於本申請文件中的任意一張附圖,為了易於理解,均適當省略或誇張而示意性地進行了描繪。對於相同的結構要素,附加相同的符號並適當省略說明。另外,在本申請檔中,“樹脂成型”是指藉由成型模具對樹脂進行成型,是包括藉由成型模具對封裝樹脂部進行成型的“樹脂封裝”的概念的表述。此外,“樹脂成型品”是指至少包括樹脂成型後的樹脂部分的產品,是包括如後的封裝後基板的概念的表述,封裝後基板是安裝在基板上的晶片藉由成型模具被樹脂成型從而被樹脂封裝後的形態。Hereinafter, embodiments of the present invention will be described with reference to the drawings. For any figure in the present application, for ease of understanding, it is schematically omitted or exaggerated as appropriate. For the same constituent elements, the same reference numerals are attached and descriptions thereof are appropriately omitted. In addition, in this application file, "resin molding" refers to the molding of a resin by a molding die, and is an expression including the concept of "resin packaging" by molding a sealing resin portion by a molding die. In addition, a "resin molded product" refers to a product that includes at least a resin portion after resin molding, and is an expression including the concept of a packaged substrate as described later. A packaged substrate is a wafer mounted on the substrate and is resin-molded by a molding die. Thereby, the resin-encapsulated form.
實施方式1Embodiment 1
樹脂成型裝置的結構Structure of resin molding device
參照第1圖,對本發明所涉及的實施方式1的樹脂成型裝置的結構進行說明。第1圖所示的樹脂成型裝置1是例如採用了壓縮成型方法的樹脂成型裝置。繪示出使用流動性樹脂即液狀樹脂來作為樹脂材料的例子。The structure of the resin molding apparatus of Embodiment 1 which concerns on this invention is demonstrated with reference to FIG. The resin molding apparatus 1 shown in FIG. 1 is a resin molding apparatus using a compression molding method, for example. An example in which a liquid resin, which is a fluid resin, is used as the resin material is shown.
樹脂成型裝置1包括基板供給收納模組2、三個成型模組3A、3B、3C、以及樹脂供給模組4以分別作為結構要素。作為結構要素的基板供給收納模組2、成型模組3A、3B、3C、以及樹脂供給模組4各自相對於其它的結構要素可以相互裝卸且可以更換。The resin molding apparatus 1 includes a substrate supply housing module 2, three molding modules 3A, 3B, 3C, and a resin supply module 4 as constituent elements, respectively. The substrate supply storage module 2, the molding modules 3A, 3B, 3C, and the resin supply module 4 as structural elements can be attached to and detached from each other and can be replaced.
在基板供給收納模組2中設置有:封裝前基板供給部6,對封裝前基板5進行供給;封裝後基板收納部8,對封裝後基板7進行收納;基板載置部9,對封裝前基板5及封裝後基板7進行交接;以及基板運送機構10,對封裝前基板5及封裝後基板7進行運送。在基板運送機構10中設置有攝影機11,該攝影機11對封裝前基板5被供給到成型模具的模具表面時的定位狀態進行拍攝。電荷耦合器件(CCD,Charge Coupled Device)圖像感測器或者互補金屬氧化物半導體(CMOS,Complementary Metal Oxide Semiconductor)圖像感測器被裝載於攝影機11中以作為成像元件。規定位置S1是基板運送機構10在不進行操作的狀態下待機的位置。The substrate supply and storage module 2 is provided with: a pre-package substrate supply unit 6 for supplying the pre-package substrate 5; a post-package substrate storage unit 8 for storing the post-package substrate 7; and a substrate mounting unit 9 for before packaging The substrate 5 and the packaged substrate 7 are transferred; and the substrate transfer mechanism 10 transfers the packaged substrate 5 and the packaged substrate 7. The substrate transport mechanism 10 is provided with a camera 11 that captures a positioning state when the substrate 5 before packaging is supplied to a mold surface of a molding mold. A Charge Coupled Device (CCD) image sensor or a Complementary Metal Oxide Semiconductor (CMOS) image sensor is mounted in the camera 11 as an imaging element. The predetermined position S1 is a position in which the substrate transport mechanism 10 is in a standby state without being operated.
在各成型模組3A、3B、3C中設置有可升降的下模具12以及與下模具12對置配置的上模具(未圖示、參照第2圖)。上模具與下模具12共同構成成型模具。各成型模組3A、3B、3C具有對上模具與下模具12進行合模及開模的合模機構13(圖中雙點劃線所示的部分)。供給有作為樹脂材料的液狀樹脂且作為進行固化的空間的模腔14被設置在下模具12中。在下模具12中設置有脫模膜供給機構15,該脫模膜供給機構15供給長條狀的脫模膜。另外,在此對在下模具12中設置有模腔14的結構進行了說明,但模腔也可以設置在上模具中,還可以設置在上模具和下模具這兩者中。Each of the molding modules 3A, 3B, and 3C is provided with a lower mold 12 that can be raised and lowered and an upper mold (not shown, see FIG. 2) disposed opposite to the lower mold 12. The upper mold and the lower mold 12 together constitute a molding mold. Each of the molding modules 3A, 3B, and 3C includes a mold clamping mechanism 13 (a portion indicated by a two-dot chain line in the figure) for clamping and opening the upper mold and the lower mold 12. A cavity 14 which is supplied with a liquid resin as a resin material and which is a space for curing is set in the lower mold 12. The lower mold 12 is provided with a release film supply mechanism 15 that supplies a long release film. In addition, the structure in which the cavity 14 is provided in the lower mold 12 is described here. However, the cavity may be provided in the upper mold, and may be provided in both the upper mold and the lower mold.
在樹脂供給模組4中設置有:分配器16,將液狀樹脂供給到成型模具;以及樹脂運送機構17,對分配器16進行運送。分配器16在前端部具備噴出液狀樹脂的樹脂噴出部18。規定位置R1是樹脂運送機構17在不進行操作的狀態下待機的位置。The resin supply module 4 is provided with a dispenser 16 that supplies a liquid resin to a molding die, and a resin transport mechanism 17 that transports the dispenser 16. The dispenser 16 includes a resin ejection portion 18 that ejects a liquid resin at a front end portion. The predetermined position R1 is a position where the resin conveyance mechanism 17 stands by in a state where no operation is performed.
第1圖所示的分配器16是使用預先混合有主劑和固化劑的液狀樹脂的單液型分配器。作為主劑,例如使用具有熱固化性的矽酮樹脂或環氧樹脂。也可以使用在噴出液狀樹脂時將主劑和固化劑混合來使用的雙液混合型分配器。The dispenser 16 shown in FIG. 1 is a single-liquid type dispenser using a liquid resin in which a base agent and a curing agent are mixed in advance. As the main agent, for example, a thermosetting silicone resin or an epoxy resin is used. A two-liquid mixing type dispenser in which a main agent and a curing agent are mixed when a liquid resin is ejected may be used.
在樹脂供給模組4中設置有控制部19。在控制部19中組裝有:記憶體20,對設置於基板運送機構10的攝影機11拍攝到的圖像資料進行存儲;處理器21,根據拍攝到的圖像資料來進行影像處理及運算處理等資料處理;以及為了對樹脂成型裝置1進行控制而所需的功能等。A control unit 19 is provided in the resin supply module 4. The control unit 19 is assembled with a memory 20 that stores image data captured by the camera 11 provided in the substrate transport mechanism 10, and a processor 21 that performs image processing and arithmetic processing based on the captured image data. Data processing; functions required for controlling the resin molding apparatus 1 and the like.
控制部19對封裝前基板5及封裝後基板7的運送、封裝前基板5的定位、液狀樹脂的供給、成型模具的加熱、成型模具的開合等進行控制。換言之,控制部19對基板供給收納模組2、成型模組3A、3B、3C、樹脂供給模組4中的各項操作進行控制。The control unit 19 controls the transportation of the pre-package substrate 5 and the post-package substrate 7, the positioning of the pre-package substrate 5, the supply of the liquid resin, the heating of the molding die, and the opening and closing of the molding die. In other words, the control unit 19 controls various operations in the substrate supply housing module 2, the molding modules 3A, 3B, 3C, and the resin supply module 4.
關於配置控制部19的位置,任意位置均可,既可以配置於基板供給收納模組2、成型模組3A、3B、3C、樹脂供給模組4中的至少一個,也可以配置於各模組的外部。此外,控制部19還可以作為多個控制部來構成,該多個控制部是根據成為控制物件的操作而使至少一部分分離而形成的。The position where the control unit 19 is arranged may be any position, and may be arranged on at least one of the substrate supply housing module 2, the molding modules 3A, 3B, 3C, and the resin supply module 4, or may be arranged on each module. Outside. In addition, the control unit 19 may be configured as a plurality of control units that are formed by separating at least a part of the control units according to operations to be controlled.
樹脂成型裝置的操作(樹脂成型品的製造方法)Operation of resin molding device (method of manufacturing resin molded product)
參照第1圖~第2圖,對在樹脂成型裝置1中對安裝在基板上的晶片進行樹脂成型以進行樹脂封裝的操作進行說明。這裡的說明也是對樹脂成型品的製造方法的說明。下面對作為樹脂成型裝置1的操作而使用成型模組3B的情況進行說明。Referring to FIGS. 1 to 2, an operation of resin-molding a wafer mounted on a substrate in a resin molding apparatus 1 to perform resin encapsulation will be described. The description here is also a description of a method for manufacturing a resin molded article. A case where the molding module 3B is used as the operation of the resin molding apparatus 1 will be described below.
首先,例如,對於安裝有晶片22(參照第2圖的(a))的封裝前基板5,使安裝有晶片22的面為下側,並將封裝前基板5從封裝前基板供給部6送出到基板載置部9。接著,使基板運送機構10從規定位置S1沿+Y方向移動,以從基板載置部9接收封裝前基板5。使基板運送機構10返回到規定位置S1。First, for example, for the package front substrate 5 on which the wafer 22 (see FIG. 2 (a)) is mounted, the surface on which the wafer 22 is mounted is the lower side, and the package front substrate 5 is sent out from the package front substrate supply unit 6 To the substrate mounting portion 9. Next, the substrate transport mechanism 10 is moved from the predetermined position S1 in the + Y direction to receive the pre-package substrate 5 from the substrate mounting portion 9. The substrate transfer mechanism 10 is returned to the predetermined position S1.
接著,例如,使基板運送機構10從規定位置S1沿+X方向移動至成型模組3B的規定位置M1。接著,在成型模組3B中,使基板運送機構10沿+Y方向移動並停止在上模具23(參照第2圖的(a))下方的規定位置C1。上模具23與下模具12共同構成成型模具24(參照第2圖的(a))。接著,使基板運送機構10上升以將封裝前基板5供給到上模具23的模具表面。Next, for example, the substrate transport mechanism 10 is moved from the predetermined position S1 in the + X direction to the predetermined position M1 of the molding module 3B. Next, in the molding module 3B, the substrate transfer mechanism 10 is moved in the + Y direction and stopped at a predetermined position C1 below the upper mold 23 (see (a) in FIG. 2). The upper mold 23 and the lower mold 12 together constitute a molding mold 24 (see (a) of FIG. 2). Next, the substrate transport mechanism 10 is raised to supply the pre-package substrate 5 to the mold surface of the upper mold 23.
接著,使用定位機構(參照第3圖的(a))將封裝前基板5定位到上模具23的模具表面的規定位置。可以使用設置於基板運送機構10的攝影機11來驗證封裝前基板5是否被正常定位於上模具23的模具表面的規定位置。對封裝前基板5是否被正常定位於上模具23的模具表面的規定位置進行判斷的操作將在後面描述(參照第3圖~第5圖)。使基板運送機構10返回到基板供給收納模組2的規定位置S1。Next, the pre-package substrate 5 is positioned at a predetermined position on the mold surface of the upper mold 23 using a positioning mechanism (see (a) in FIG. 3). The camera 11 provided in the substrate conveyance mechanism 10 can be used to verify whether or not the pre-package substrate 5 is normally positioned at a predetermined position on the mold surface of the upper mold 23. The operation of determining whether or not the pre-package substrate 5 is normally positioned at a predetermined position on the mold surface of the upper mold 23 will be described later (refer to FIGS. 3 to 5). The substrate transfer mechanism 10 is returned to the predetermined position S1 of the substrate supply storage module 2.
接著,使用樹脂運送機構17來使分配器16從樹脂供給模組4的規定位置R1沿-X方向移動至成型模組3B的規定位置M1。接著,在成型模組3B中,使用樹脂運送機構17來使分配器16從規定位置M1沿+Y方向移動至規定位置C1。如第2圖的(a)所示,藉由脫模膜供給機構15(參照第1圖),將脫模膜25供給到在下模具12的模腔14中。接著,從分配器16的樹脂噴出部18向模腔14噴出規定量的液狀樹脂26。液狀樹脂26的噴出結束後,使樹脂運送機構17返回到規定位置R1。Next, the dispenser 16 is used to move the dispenser 16 from the predetermined position R1 of the resin supply module 4 in the −X direction to the predetermined position M1 of the molding module 3B. Next, in the molding module 3B, the dispenser 16 is used to move the dispenser 16 from the predetermined position M1 to the predetermined position C1 in the + Y direction. As shown in FIG. 2 (a), the release film 25 is supplied to the cavity 14 of the lower mold 12 by the release film supply mechanism 15 (see FIG. 1). Next, a predetermined amount of the liquid resin 26 is ejected from the resin ejection portion 18 of the dispenser 16 into the cavity 14. After the ejection of the liquid resin 26 is completed, the resin transport mechanism 17 is returned to the predetermined position R1.
接著,如第2圖的(b)所示,藉由合模機構13(參照第1圖)使下模具12上升,對上模具23與下模具12進行合模。藉由進行合模,使安裝在封裝前基板5上的晶片22浸泡到被供給到模腔14的液狀樹脂26中。此時,可以使用設置於下模具12的模腔底面部件(未圖示),來對模腔14內的液狀樹脂26施加規定的樹脂壓力。Next, as shown in FIG. 2 (b), the lower mold 12 is raised by the mold clamping mechanism 13 (see FIG. 1), and the upper mold 23 and the lower mold 12 are clamped. By performing mold clamping, the wafer 22 mounted on the pre-package substrate 5 is immersed in the liquid resin 26 supplied to the cavity 14. At this time, a cavity bottom member (not shown) provided in the lower mold 12 may be used to apply a predetermined resin pressure to the liquid resin 26 in the cavity 14.
另外,在進行合模的過程中,也可以使用抽真空機構(未圖示)來對模腔14內進行吸取。據此,殘留在模腔14內的空氣及液狀樹脂26中包含的氣泡等被排出到成型模具24的外部。而且,模腔14內被設定為規定的真空度。In addition, during the mold clamping process, a vacuuming mechanism (not shown) may be used to suck the inside of the mold cavity 14. Accordingly, air remaining in the cavity 14 and air bubbles and the like contained in the liquid resin 26 are discharged to the outside of the molding die 24. The cavity 14 is set to a predetermined degree of vacuum.
接著,使用設置於下模具12的加熱器(未圖示),來以為了使液狀樹脂26固化而所需的時間對液狀樹脂26進行加熱。使液狀樹脂26固化而成型為固化樹脂27。據此,藉由對應於模腔14的形狀而成型的固化樹脂27,對安裝在封裝前基板5上的晶片22進行樹脂封裝。Next, a heater (not shown) provided in the lower mold 12 is used to heat the liquid resin 26 for the time required to cure the liquid resin 26. The liquid resin 26 is cured to form a cured resin 27. Accordingly, the wafer 22 mounted on the pre-package substrate 5 is resin-encapsulated with the cured resin 27 molded in accordance with the shape of the cavity 14.
接著,如第2圖的(c)所示,在使液狀樹脂26固化後,使用合模機構13來對上模具23與下模具12進行開模。在上模具23的模具表面上,固定有被樹脂封裝後的成型品28(封裝後基板7)。Next, as shown in FIG. 2 (c), after the liquid resin 26 is cured, the upper mold 23 and the lower mold 12 are opened using the mold clamping mechanism 13. On the mold surface of the upper mold 23, a molded product 28 (the packaged substrate 7) encapsulated with a resin is fixed.
接著,使基板運送機構10從基板供給收納模組2的規定位置S1移動至上模具23下方的規定位置C1,來接收封裝後基板7。接著,使基板運送機構10移動,以將封裝後基板7交付到基板載置部9中。從基板載置部9中將封裝後基板7收納到封裝後基板收納部8中。在這個階段,樹脂封裝完成。Next, the substrate transfer mechanism 10 is moved from a predetermined position S1 of the substrate supply storage module 2 to a predetermined position C1 below the upper mold 23 to receive the packaged substrate 7. Next, the substrate transport mechanism 10 is moved to deliver the packaged substrate 7 to the substrate mounting portion 9. The packaged substrate 7 is stored in the packaged substrate storage portion 8 from the substrate mounting portion 9. At this stage, resin packaging is completed.
在樹脂成型裝置1中,控制部19(參照第1圖)對封裝前基板5的供給、封裝前基板5的定位、脫模膜25的供給、樹脂運送機構17的移動、液狀樹脂26的噴出、上模具23與下模具12的合模及開模、封裝後基板7的收納等操作進行控制。In the resin molding apparatus 1, the control unit 19 (refer to FIG. 1) supplies the pre-package substrate 5, the positioning of the pre-package substrate 5, the supply of the release film 25, the movement of the resin transport mechanism 17, and the liquid resin 26. Operations such as ejection, mold clamping and opening of the upper mold 23 and the lower mold 12, and storage of the substrate 7 after packaging are controlled.
基板的定位操作及驗證操作(樹脂成型品的製造方法的一部分)Positioning operation and verification operation of the substrate (part of a method for manufacturing a resin molded product)
參照第3圖~第5圖,對供給到成型模具24的封裝前基板5的定位操作以及驗證所供給的封裝前基板5是否被正常定位的操作進行說明。這裡的說明也是對樹脂成型品的製造方法的一部分的說明。在本實施方式中,繪示出將封裝前基板5供給到成型模具24的上模具23的情況。The positioning operation of the pre-package substrate 5 supplied to the molding die 24 and the operation of verifying whether the supplied pre-package substrate 5 is normally positioned will be described with reference to FIGS. 3 to 5. The description here is also a part of a method for manufacturing a resin molded article. In this embodiment, a case where the pre-package substrate 5 is supplied to the upper mold 23 of the molding mold 24 is illustrated.
如第3圖的(a)所示,在上模具23的模具表面(下表面),例如分別設置有沿X方向的基準標記29和沿Y方向的基準標記30。基準標記29、30是用於對供給到上模具23的模具表面的封裝前基板5是否被正常定位進行驗證的基準標記。基準標記29、30只要是由設置於基板運送機構10的攝影機11能夠識別的標記即可,對於直線狀、點狀、曲線狀等圖案形狀、表面的凹凸形狀以及顏色等並不特別限定。在實施方式1中,繪示出使用直線狀的凸圖案來作為基準標記的例子。另外,在將基準標記設為凸狀圖案的情況下,如果使其凸部的高度小於封裝前基板5的厚度,則在進行成型模具24的合模時不會造成妨礙。在將基準標記設為凸狀圖案且有可能使用比其凸部的高度薄的封裝前基板5的情況下,可以在與凸部對置的下模具12的模具表面部分設置凹部。As shown in FIG. 3 (a), on the mold surface (lower surface) of the upper mold 23, for example, reference marks 29 in the X direction and reference marks 30 in the Y direction are respectively provided. The reference marks 29 and 30 are reference marks for verifying whether or not the pre-package substrate 5 supplied to the mold surface of the upper mold 23 is normally positioned. The reference marks 29 and 30 may be marks that can be recognized by the camera 11 provided on the substrate conveyance mechanism 10, and are not particularly limited to pattern shapes such as straight lines, dots, and curves, and uneven shapes and colors on the surface. In the first embodiment, an example in which a linear convex pattern is used as a reference mark is drawn. In addition, when the reference mark is a convex pattern, if the height of the convex portion is made smaller than the thickness of the substrate 5 before the package, there is no obstacle when the mold 24 is closed. In a case where the fiducial mark is a convex pattern and it is possible to use a package front substrate 5 which is thinner than the height of the convex portion, a concave portion may be provided in a mold surface portion of the lower mold 12 facing the convex portion.
在本實施方式的上模具23中,在與設置有基準標記29的模具表面相反側的模具表面,設置有定位銷31,該定位銷31是用於在Y方向上對封裝前基板5進行定位的定位部件。在與設置有基準標記30的模具表面相反側的模具表面,設置有定位銷32,該定位銷32是用於在X方向上對封裝前基板5進行定位的定位部件。定位銷31和32例如沿X方向和Y方向設置至少兩個。In the upper mold 23 of this embodiment, on the mold surface opposite to the mold surface on which the reference mark 29 is provided, a positioning pin 31 is provided for positioning the package front substrate 5 in the Y direction. Positioning parts. On a mold surface opposite to the mold surface on which the reference mark 30 is provided, a positioning pin 32 is provided, and the positioning pin 32 is a positioning member for positioning the front package substrate 5 in the X direction. The positioning pins 31 and 32 are provided, for example, in at least two in the X direction and the Y direction.
如第3圖的(b)所示,在成型模具24被開模的狀態下,定位銷31、32從上模具23的模具表面突出。在成型模具24被合模的狀態下,定位銷31、32被下模具12的模具表面推上去從而被收納進上模具23的內部。而且,例如可以將定位銷31、32設為藉由彈簧等彈性部件來支撐的結構。此外,也可以不使定位銷31、32為可移動,而是使其避讓到設置於下模具12的開口孔中。As shown in FIG. 3 (b), in a state where the molding die 24 is opened, the positioning pins 31 and 32 protrude from the die surface of the upper die 23. In a state where the molding die 24 is closed, the positioning pins 31 and 32 are pushed up by the die surface of the lower die 12 and are stored in the upper die 23. Further, for example, the positioning pins 31 and 32 may be configured to be supported by an elastic member such as a spring. In addition, the positioning pins 31 and 32 may not be movable, and they may be avoided from opening holes provided in the lower mold 12.
參照第3圖,對將封裝前基板5定位到上模具23的模具表面的規定位置的操作進行說明。首先,如第3圖的(b)所示,使收容有封裝前基板5的基板運送機構10移動至上模具23與下模具12之間的規定位置。接著,使基板運送機構10上升,以將封裝前基板5從基板運送機構10交付到上模具23的模具表面。接著,如第3圖的(a)所示,使用設置於上模具23的定位機構33和34,將封裝前基板5的端面分別推碰到定位銷31和32。另外,定位機構33和34也可以設置於基板運送機構10。Referring to FIG. 3, an operation of positioning the pre-package substrate 5 to a predetermined position on the mold surface of the upper mold 23 will be described. First, as shown in FIG. 3 (b), the substrate conveyance mechanism 10 in which the pre-package substrate 5 is housed is moved to a predetermined position between the upper mold 23 and the lower mold 12. Next, the substrate transfer mechanism 10 is raised to transfer the pre-package substrate 5 from the substrate transfer mechanism 10 to the mold surface of the upper mold 23. Next, as shown in FIG. 3 (a), the positioning mechanisms 33 and 34 provided on the upper mold 23 are used to push the end faces of the package substrate 5 to the positioning pins 31 and 32, respectively. The positioning mechanisms 33 and 34 may be provided in the substrate transfer mechanism 10.
在本實施方式中,繪示出封裝前基板5的長邊方向沿X方向配置、封裝前基板5的短邊方向沿Y方向配置的情況。以下,將封裝前基板5的沿長邊方向的端面稱為封裝前基板5的沿X方向的端面。同樣,將封裝前基板5的沿短邊方向的端面稱為封裝前基板5的沿Y方向的端面。In this embodiment, a case where the long-side direction of the package front substrate 5 is arranged in the X direction and the short-side direction of the package front substrate 5 is arranged in the Y direction is illustrated. Hereinafter, the end surface of the package front substrate 5 in the longitudinal direction is referred to as an end surface of the package front substrate 5 in the X direction. Similarly, the end surface in the short-side direction of the package front substrate 5 is referred to as the end surface in the Y direction of the package front substrate 5.
首先,使用定位機構33將封裝前基板5的沿X方向的端面推碰到兩個定位銷31。據此,封裝前基板5的沿X方向的端面被定位到上模具23的模具表面的規定位置。接著,使用定位機構34將封裝前基板5的沿Y方向的端面推碰到兩個定位銷32。據此,封裝前基板5的沿Y方向的端面被定位到上模具23的模具表面的規定位置。First, the positioning mechanism 33 is used to push the end surface of the package front substrate 5 in the X direction against the two positioning pins 31. Accordingly, the end surface of the front substrate 5 in the X direction is positioned at a predetermined position on the mold surface of the upper mold 23. Next, the positioning mechanism 34 is used to push the end surface in the Y direction of the package front substrate 5 against the two positioning pins 32. According to this, the end surface of the front substrate 5 in the Y direction is positioned to a predetermined position on the mold surface of the upper mold 23.
藉由使用定位機構33和34將封裝前基板5推碰到定位銷31和32,從而將封裝前基板5定位到上模具23的模具表面的規定位置。將封裝前基板5定位到規定位置後,藉由吸附機構(未圖示)對封裝前基板5進行真空吸附以固定於上模具23的模具表面。在此狀態下,封裝前基板5針對上模具23的定位完成。The front packaging substrate 5 is pushed against the positioning pins 31 and 32 by using the positioning mechanisms 33 and 34 to position the front packaging substrate 5 to a predetermined position on the mold surface of the upper mold 23. After the pre-package substrate 5 is positioned at a predetermined position, the pre-package substrate 5 is vacuum-adsorbed by an adsorption mechanism (not shown) to be fixed to the mold surface of the upper mold 23. In this state, the positioning of the pre-package substrate 5 with respect to the upper mold 23 is completed.
在這種情況下,使用設置於上模具23的定位機構33和34,分別單獨進行了封裝前基板5針對Y方向和X方向的定位。不限於此,可以設為使定位機構33和34聯動的結構。據此,能夠同時進行封裝前基板5針對Y方向和X方向的定位。In this case, using the positioning mechanisms 33 and 34 provided in the upper mold 23, the positioning of the front package substrate 5 with respect to the Y direction and the X direction is performed separately. It is not limited to this, and it can be set as the structure which linked the positioning mechanisms 33 and 34. Accordingly, the positioning of the pre-package substrate 5 with respect to the Y direction and the X direction can be performed simultaneously.
使用例如引線框、印刷電路板、陶瓷基板、膜基底基板(フィルムベース基板)等来作為封裝前基板5。在封裝前基板5上,根據需要,適當設置有位置對準用的標記35。可以將設置于封裝前基板5的位置對準用的標記35作為用於對封裝前基板5的定位進行驗證的標記來使用。在第3圖中,繪示出在封裝前基板5的四角分別設置有位置對準用的標記35的例子。As the pre-package substrate 5, for example, a lead frame, a printed circuit board, a ceramic substrate, a film-based substrate, or the like is used. A mark 35 for position alignment is appropriately provided on the pre-package substrate 5 as necessary. The mark 35 for position alignment provided on the pre-package substrate 5 can be used as a mark for verifying the positioning of the pre-package substrate 5. In FIG. 3, an example in which the alignment marks 35 are provided on the four corners of the pre-package substrate 5 is shown.
參照第4圖,對驗證被供給到上模具23的封裝前基板5是否被正常定位的操作進行說明。基本的驗證操作以如下方式進行。The operation of verifying whether the pre-package substrate 5 supplied to the upper mold 23 is normally positioned will be described with reference to FIG. 4. The basic verification operation is performed as follows.
首先,使用設置於基板運送機構10的攝影機11,對包含封裝前基板5和基準標記29的區域以及包含封裝前基板5和基準標記30的區域分別進行拍攝。接著,根據由攝影機11拍攝到的各個圖像資料,對封裝前基板5與基準標記29之間的距離以及封裝前基板5與基準標記30之間的距離分別進行計測。將計測出的距離與預先設定的容許範圍相比較,如果在容許範圍內,則判斷為封裝前基板5被正常定位,對成型模具24進行合模來進行樹脂封裝。如果計測出的距離偏離了容許範圍,則判斷為封裝前基板5未被正常定位,停止向下一步驟(合模)推進。First, using the camera 11 provided in the substrate transfer mechanism 10, an area including the pre-package substrate 5 and the reference mark 29 and an area including the pre-package substrate 5 and the reference mark 30 are photographed, respectively. Next, the distance between the pre-package substrate 5 and the reference mark 29 and the distance between the pre-package substrate 5 and the reference mark 30 are measured based on each image data captured by the camera 11. The measured distance is compared with a preset allowable range, and if it is within the allowable range, it is determined that the pre-package substrate 5 is positioned normally, and the molding die 24 is closed to perform resin sealing. If the measured distance deviates from the allowable range, it is determined that the pre-package substrate 5 is not positioned normally, and the advancement to the next step (clamping) is stopped.
以下,對驗證封裝前基板5是否被正常定位的操作進行具體說明。在本實施方式中,例如,如第4圖的(a)所示,藉由對封裝前基板5的沿X方向的端部的任意位置P1與基準標記29之間的距離Y1以及封裝前基板5的沿Y方向的端部的任意位置P2與基準標記30之間的距離X2分別進行計測,從而驗證封裝前基板5是否被正常定位。Hereinafter, an operation for verifying whether the substrate 5 before the package is normally positioned will be specifically described. In this embodiment, for example, as shown in FIG. 4A, the distance Y1 between the arbitrary position P1 of the end portion in the X direction of the front substrate 5 and the reference mark 29 and the front substrate The distance X2 between the arbitrary position P2 of the end portion along the Y direction of 5 and the reference mark 30 is measured separately to verify whether the pre-package substrate 5 is properly positioned.
首先,如第4圖的(a)所示,使設置於基板運送機構10的攝影機11移動至能夠對包含封裝前基板5的沿X方向的端部的位置P1與基準標記29的區域A1進行拍攝的位置。在該位置,藉由攝影機11對區域A1進行拍攝,以獲取圖像資料D1。將獲取到的圖像資料D1保存到組裝在控制部19(參照第1圖)中的記憶體20(參照第1圖)。First, as shown in (a) of FIG. 4, the camera 11 provided on the substrate transport mechanism 10 is moved to an area A1 including the position P1 of the end portion in the X direction of the front substrate 5 and the reference mark 29. Shooting location. At this position, the area A1 is photographed by the camera 11 to obtain the image data D1. The acquired image data D1 is stored in a memory 20 (see FIG. 1) incorporated in the control unit 19 (see FIG. 1).
接著,使攝影機11移動至能夠對包含封裝前基板5的沿Y方向的端部的位置P2與基準標記30的區域A2進行拍攝的位置。在該位置,藉由攝影機11對區域A2進行拍攝,以獲取圖像資料D2。將獲取到的圖像資料D2保存到組裝在控制部19中的記憶體20。Next, the camera 11 is moved to a position where the position P2 of the end portion in the Y direction of the package front substrate 5 and the area A2 of the reference mark 30 can be captured. At this position, the area A2 is photographed by the camera 11 to obtain image data D2. The acquired image data D2 is stored in the memory 20 incorporated in the control unit 19.
接著,使用組裝在控制部19中的處理器21(參照第1圖),從記憶體20取入在各區域A1、A2中分別獲取到的圖像資料D1、D2,並進行影像處理。據此,能夠分別計測出封裝前基板5的沿X方向的端部的位置P1與基準標記29之間的距離Y1以及封裝前基板5的沿Y方向的端部的位置P2與基準標記30之間的距離X2。作為具體的影像處理的一例,可以對相互對應的封裝前基板5的端部與基準標記29、30的邊緣進行邊緣檢測,求出兩者的邊緣之間的距離。Next, using the processor 21 (see FIG. 1) incorporated in the control unit 19, the image data D1 and D2 obtained in the respective regions A1 and A2 are taken from the memory 20 and image processing is performed. Accordingly, the distance Y1 between the position P1 of the end portion in the X direction of the pre-package substrate 5 and the reference mark 29 and the position P2 of the end portion in the Y direction of the front package substrate 5 and the reference mark 30 can be measured. The distance X2. As an example of specific image processing, edge detection can be performed on the ends of the corresponding front substrate 5 and the edges of the reference marks 29 and 30 to determine the distance between the edges of the two.
接著,處理器21將分別計測出的距離Y1及X2與預先設定的基準值T0進行比較。在此,基準值T0是封裝前基板5被正常定位到上模具23的模具表面的規定位置時封裝前基板5的端部與基準標記29及30之間的設計上的距離(設計值)。作為基準值T0,假設在X方向和Y方向設定相同值。Next, the processor 21 compares the distances Y1 and X2 measured respectively with a preset reference value T0. Here, the reference value T0 is a design distance (design value) between the end of the package front substrate 5 and the reference marks 29 and 30 when the package front substrate 5 is normally positioned at a predetermined position on the mold surface of the upper mold 23. As the reference value T0, it is assumed that the same value is set in the X direction and the Y direction.
參照第5圖,對封裝前基板5在上模具23的模具表面上被定位時產生的三種形態進行說明。三種形態是指:(a)封裝前基板5被正常定位的狀態;(b)封裝前基板5未被正常定位且封裝前基板5沒有接觸到定位銷的狀態;(c)封裝前基板5的定位發生了異常(定位銷發生了由磨耗或破損等引起的變形)的狀態。With reference to FIG. 5, three modes that occur when the pre-package substrate 5 is positioned on the mold surface of the upper mold 23 will be described. The three forms refer to: (a) a state in which the front substrate 5 is normally positioned; (b) a state in which the front substrate 5 is not positioned normally and the front substrate 5 is not in contact with the positioning pin; The positioning is abnormal (the positioning pin is deformed due to wear or damage).
在第5圖中,對於例如針對X方向對封裝前基板5進行了定位的情況,繪示出了三種形態。在第5圖中,“T0”表示示出封裝前基板5的端部與基準標記30之間的正常距離的基準值(設計值),“d”表示包括各部件的偏差和計測的誤差等在內針對封裝前基板5的定位而容許的容許值。因此,從基準值T0中減去容許值d後的值(T0-d)以及在基準值T0上加上容許值d後的值(T0+d)成為表示封裝前基板5被正常定位的範圍的容許界限值。基準值T0及容許值d在X方向和Y方向具有相同值。這種情況下,在X方向和Y方向,容許範圍均為從(T0-d)到(T0+d)。另外,在此,為了設定容許範圍,在相對於基準值T0的正側和負側都設定了相同的容許值d,但也可以設定不同的值來作為正側和負側的容許值。In FIG. 5, for example, in a case where the package front substrate 5 is positioned for the X direction, three forms are illustrated. In FIG. 5, “T0” indicates a reference value (design value) showing a normal distance between the end portion of the front substrate 5 and the reference mark 30, and “d” indicates a deviation including each component, a measurement error, and the like. Allowable value for positioning of the substrate 5 before packaging. Therefore, the value (T0-d) after subtracting the allowable value d from the reference value T0 and the value (T0 + d) after adding the allowable value d to the reference value T0 are the ranges indicating that the substrate 5 before the package is normally positioned. The allowable limit value. The reference value T0 and the allowable value d have the same value in the X direction and the Y direction. In this case, the allowable range in both the X direction and the Y direction is from (T0-d) to (T0 + d). Here, in order to set the allowable range, the same allowable value d is set on both the positive and negative sides with respect to the reference value T0, but different values may be set as the allowable values on the positive and negative sides.
如第5圖的(a)所示,如果針對X方向計測出的距離X2為(T0-d)≤X2≤(T0+d),則判斷為封裝前基板5針對上模具23的模具表面的X方向被正常定位。換言之,是封裝前基板5的沿Y方向的端面正常接觸到定位銷32的狀態。As shown in (a) of FIG. 5, if the distance X2 measured for the X direction is (T0-d) ≤ X2 ≤ (T0 + d), it is determined that the front substrate 5 is sealed against the mold surface of the upper mold 23. The X direction is positioned normally. In other words, it is a state where the end surface of the front substrate 5 in the Y direction is normally in contact with the positioning pin 32.
同樣地,如果針對Y方向計測出的距離Y1(參照第4圖)為(T0-d)≤Y1≤(T0+d),則判斷為封裝前基板5針對上模具23的模具表面的Y方向被正常定位。在這種情況下,判斷為封裝前基板5針對X方向和Y方向被正常定位,並向作為下一步驟的合模步驟推進。Similarly, if the distance Y1 measured in the Y direction (refer to FIG. 4) is (T0-d) ≦ Y1 ≦ (T0 + d), it is determined that the front substrate 5 is in the Y direction of the mold surface of the upper mold 23. Being positioned normally. In this case, it is determined that the pre-package substrate 5 is normally positioned for the X direction and the Y direction, and is advanced to the mold clamping step as the next step.
如第5圖的(b)所示,如果針對X方向計測出的距離X2為X2<(T0-d),則判斷為封裝前基板5針對上模具23的模具表面的X方向未被正常定位。換言之,是封裝前基板5的沿Y方向的端面未接觸到定位銷32的狀態。在這種情況下,判斷為封裝前基板5針對X方向未被正常定位,並停止向下一步驟推進。As shown in (b) of FIG. 5, if the distance X2 measured in the X direction is X2 <(T0-d), it is determined that the X direction of the package substrate 5 against the mold surface of the upper mold 23 is not properly positioned. . In other words, it is a state where the end surface of the front substrate 5 in the Y direction is not in contact with the positioning pin 32. In this case, it is determined that the pre-package substrate 5 is not positioned normally in the X direction, and the advancement to the next step is stopped.
即使針對X方向計測出的距離X2為正常即(T0-d)≤X2≤(T0+d),如果針對Y方向計測出的距離Y1為Y1<(T0-d),則關於封裝前基板5也判斷為封裝前基板5針對上模具23的模具表面的Y方向未被正常定位,並停止向下一步驟推進。因此,當針對X方向和Y方向計測出的距離X2和Y1中的任意一距離偏離容許界限值(X2或Y1<(T0-d))時,判斷為封裝前基板5未被正常定位,並停止向下一步驟推進。當判斷為封裝前基板5未被正常定位時,在確認樹脂成型裝置1的狀態後,至少再實施一次封裝前基板5的定位。Even if the distance X2 measured for the X direction is normal, that is, (T0-d) ≤ X2 ≤ (T0 + d), if the distance Y1 measured for the Y direction is Y1 <(T0-d), then the front substrate 5 of the package It is also determined that the Y-direction of the pre-package substrate 5 with respect to the mold surface of the upper mold 23 is not properly positioned, and the advancement to the next step is stopped. Therefore, when any one of the distances X2 and Y1 measured for the X and Y directions deviates from the allowable limit value (X2 or Y1 <(T0-d)), it is determined that the pre-package substrate 5 is not positioned properly, and Stop moving to the next step. When it is determined that the pre-package substrate 5 is not positioned normally, after confirming the state of the resin molding apparatus 1, the positioning of the pre-package substrate 5 is performed at least once again.
如第5圖的(c)所示,如果針對X方向計測出的距離X2為X2>(T0+d),則判斷為上模具23有可能發生了異常。在這種情況下,定位銷32有可能發生了超過容許值d的由磨耗或破損等引起的變形。這是由於如果是定位銷32未發生超過容許值d的變形的狀態,則不可能成為X2>(T0+d)。As shown in FIG. 5 (c), if the distance X2 measured in the X direction is X2> (T0 + d), it is determined that an abnormality may occur in the upper mold 23. In this case, there is a possibility that the positioning pin 32 is deformed due to abrasion, damage, or the like that exceeds the allowable value d. This is because if the positioning pin 32 is not deformed beyond the allowable value d, it is impossible to achieve X2> (T0 + d).
同樣地,如果針對Y方向計測出的距離Y1為Y1>(T0+d),則判斷為定位銷31有可能發生了超過容許值d的由磨耗或破損等引起的變形。當針對X方向和Y方向計測出的距離X2和Y1中的任意一個距離偏離容許界限值(X2或Y1>(T0+d))時,發送在樹脂成型裝置1中發生了異常的信號,確認定位銷31、32的狀態並實施更換等應對。Similarly, if the distance Y1 measured in the Y direction is Y1> (T0 + d), it is determined that the positioning pin 31 may be deformed by abrasion, damage, or the like exceeding the allowable value d. When any one of the distances X2 and Y1 measured in the X direction and the Y direction deviates from the allowable limit value (X2 or Y1> (T0 + d)), a signal indicating that an abnormality has occurred in the resin molding apparatus 1 is sent, and it is confirmed Replace the positioning pins 31 and 32 with each other.
這樣,就能夠對封裝前基板5在上模具23的模具表面上被定位時產生的三種形態進行判斷。因此,當判斷為封裝前基板5被正常定位時,向下一步驟推進。當判斷為封裝前基板5未被正常定位或者成型模具發生了異常時,停止向下一步驟推進。據此,能夠防止由定位引起的成型缺陷的發生。In this way, it is possible to judge the three forms generated when the pre-package substrate 5 is positioned on the mold surface of the upper mold 23. Therefore, when it is determined that the pre-package substrate 5 is positioned normally, the next step is advanced. When it is determined that the pre-package substrate 5 is not positioned properly or an abnormality occurs in the molding die, the next step is stopped. Accordingly, it is possible to prevent the occurrence of molding defects due to positioning.
基板的定位驗證操作的資料處理Data processing for positioning verification of substrates
使用功能方塊圖即第6圖和流程圖即第7圖,對上述的基板的定位驗證操作中的基本的資料處理的一例進行說明。An example of basic data processing in the above-mentioned substrate positioning verification operation will be described using a functional block diagram, FIG. 6 and a flowchart, FIG. 7.
在第6圖中,攝影機C相當於第1圖、第3圖和第4圖中的攝影機11,處理器P相當於第1圖中的處理器21,記憶體M是存儲預先設定的容許範圍的記憶體,與第1圖中的記憶體20可以相同也可以不同。資訊輸出部O用於在判斷為基板未被正常定位時將該資訊輸出到外部,例如可以使用顯示裝置,也可以共用樹脂成型裝置1的操作部的顯示裝置。In FIG. 6, the camera C corresponds to the camera 11 in FIGS. 1, 3, and 4, the processor P corresponds to the processor 21 in FIG. 1, and the memory M stores a preset allowable range. The memory may be the same as or different from the memory 20 in FIG. 1. The information output unit O is used to output the information to the outside when it is determined that the substrate is not positioned normally. For example, a display device may be used, or a display device of the operation portion of the resin molding device 1 may be used in common.
如第7圖所示,當處理開始後,在S11中,在上模具23的模具表面上對封裝前基板5執行藉由定位機構33和34而進行的定位操作。該藉由定位機構33和34而進行的定位操作可以藉由處理器P來指示,也可藉由控制部19內的其它處理器來指示。As shown in FIG. 7, after the process is started, in S11, the positioning operation of the front package substrate 5 by the positioning mechanisms 33 and 34 is performed on the mold surface of the upper mold 23. The positioning operation by the positioning mechanisms 33 and 34 may be instructed by the processor P, or may be instructed by other processors in the control unit 19.
在S12中,處理器P向攝影機C請求用於對基準標記30與封裝前基板5之間的距離X以及基準標記29與封裝前基板5之間的距離Y進行計測的圖像資料。攝影機C將拍攝到的圖像資料D輸出到處理器P。處理器P從攝影機C獲取到圖像資料D,並使用圖像資料D來求出基準標記30與封裝前基板5之間的距離X以及基準標記29與封裝前基板5之間的距離Y。另外,在前述的說明中假設將圖像資料D取入到記憶體20,但也可以如這裡的說明那樣由處理器P從攝影機C直接獲取圖像資料D。In S12, the processor P requests the camera C for image data for measuring the distance X between the reference mark 30 and the front package substrate 5 and the distance Y between the reference mark 29 and the front package substrate 5. The camera C outputs the captured image data D to the processor P. The processor P obtains the image data D from the camera C, and uses the image data D to obtain the distance X between the reference mark 30 and the front substrate 5 and the distance Y between the reference mark 29 and the front substrate 5. In the foregoing description, it is assumed that the image data D is taken into the memory 20, but the image data D may be directly acquired by the processor P from the camera C as described herein.
在S13中,處理器P從記憶體M中讀出容許範圍的最小值(容許界限值的較小一方的值)即(T0-d),並進行與距離X及Y的比較。比較的結果,如果距離X及Y均大於容許界限值(T0-d),則推進到S14,如果X及Y中的至少一個小於容許界限值(T0-d),則推進到S15。In S13, the processor P reads the minimum value of the allowable range (the smaller value of the allowable limit value), that is, (T0-d) from the memory M, and compares it with the distances X and Y. As a result of the comparison, if both the distances X and Y are greater than the allowable limit value (T0-d), the process proceeds to S14, and if at least one of X and Y is less than the allowable limit value (T0-d), the process proceeds to S15.
在S14中,處理器P從記憶體M中讀出容許範圍的最大值(容許界限值的較大一方的值)即(T0+d),並進行與距離X及Y的比較。比較的結果,如果距離X及Y均小於容許界限值(T0+d),則推進到處理A,如果X及Y中的至少一個小於容許界限值(T0+d),則推進到處理B。In S14, the processor P reads the maximum value of the allowable range (the larger value of the allowable limit value), that is, (T0 + d) from the memory M, and compares it with the distances X and Y. As a result of the comparison, if both the distances X and Y are less than the allowable limit value (T0 + d), the process proceeds to process A, and if at least one of X and Y is less than the allowable limit value (T0 + d), the process proceeds to process B.
推進到處理A應該是在S13、14中處理器P判斷為進行了正常的基板定位。The advancement to the process A should be determined by the processor P in S13 and 14 as having performed normal substrate positioning.
處理A是為了結束定位操作和定位驗證操作並推進到下一步驟而由處理器P執行的處理。具體而言,處理器P進行指示,以使基板運送機構10、定位機構33和34從上模具23與下模具12之間避讓開,並推進到下面的合模步驟。此時,可以由處理器P指示資訊輸出部O輸出表示正常的基板定位完成而轉移到下面的合模步驟之意的資訊。The process A is a process performed by the processor P to end the positioning operation and the positioning verification operation and proceed to the next step. Specifically, the processor P instructs the substrate transport mechanism 10 and the positioning mechanisms 33 and 34 to escape from between the upper mold 23 and the lower mold 12 and advances to the lower mold clamping step. At this time, the processor P may instruct the information output unit O to output information indicating that the normal substrate positioning is completed and the process is shifted to the next clamping step.
推進到處理B應該是在S13及14中處理器P判斷為未進行正常的基板定位且定位銷31或32有可能發生了變形。換言之,應該是處理器P判斷為處於基板侵佔到定位銷31或32應當所處的位置的狀態。The advancement to the processing B should be determined by the processor P in S13 and 14 that the normal substrate positioning is not performed and the positioning pins 31 or 32 may be deformed. In other words, it should be the state where the processor P judges that the substrate is invading to the position where the positioning pins 31 or 32 should be located.
處理B是為了結束定位操作和定位驗證操作並停止用於樹脂成型的步驟而由處理器P執行的處理。具體而言,處理器P進行指示,以使基板運送機構10、定位機構33和34從上模具23與下模具12之間避讓開,且不推進到下面的合模步驟。此時,處理器P指示資訊輸出部O例如輸出表示無法進行正常的基板定位、定位銷31或32有可能發生了變形或者促使進行定位銷的檢查之意的資訊。作為所輸出的資訊,也可以設為因未能進行正常的定位操作而停止樹脂成型步驟等其它內容。The process B is a process performed by the processor P to end the positioning operation and the positioning verification operation and stop the steps for resin molding. Specifically, the processor P instructs the substrate transport mechanism 10 and the positioning mechanisms 33 and 34 to escape from between the upper mold 23 and the lower mold 12 and does not proceed to the lower mold clamping step. At this time, the processor P instructs the information output unit O to output information indicating, for example, that normal substrate positioning cannot be performed, that the positioning pins 31 or 32 may be deformed, or that the positioning pins are inspected. As the output information, other contents such as stopping the resin molding step due to failure to perform a normal positioning operation may be used.
推進到S15應該是處理器P判斷為即使進行了藉由定位機構33和34進行的定位操作而封裝前基板5也未接觸到定位銷31或32。The advance to S15 should be judged by the processor P as not to contact the positioning pins 31 or 32 even though the front substrate 5 is packaged even if the positioning operation by the positioning mechanisms 33 and 34 is performed.
在S15中,處理器P參照與預先設定的定位操作的次數相關的設定值,並且與對所執行的定位操作的次數進行計數而得到的值進行比較。其中,與次數相關的設定值可以被預先存儲在記憶體M中,也可以被預先存儲在其它記憶體中。如果比較的結果是統計值小於設定值,則再次進行定位操作。關於這裡的定位操作,也可以不進行藉由定位機構33和34這兩者進行的定位操作。至少可以進行藉由與S13的比較結果中小於容許界限值(T0-d)的值相對應的定位機構而執行的定位操作。In S15, the processor P refers to a set value related to the preset number of positioning operations, and compares it with a value obtained by counting the number of positioning operations performed. The setting value related to the number of times may be stored in the memory M in advance, or may be stored in other memories in advance. If the result of the comparison is that the statistical value is less than the set value, the positioning operation is performed again. Regarding the positioning operation here, the positioning operation by both the positioning mechanisms 33 and 34 may not be performed. At least the positioning operation performed by the positioning mechanism corresponding to a value smaller than the allowable limit value (T0-d) in the comparison result of S13 can be performed.
在第二次以後的處理中,在S13中可以不進行與距離X及Y這兩者的比較處理。至少可以進行針對與上一次S13的比較結果中小於容許界限值(T0-d)的值相對應的值的比較處理。In the second and subsequent processes, the comparison process with the distances X and Y may not be performed in S13. At least a comparison process with respect to a value corresponding to a value smaller than the allowable limit value (T0-d) in the comparison result of the previous S13 may be performed.
如果S15的比較結果是統計值大於設定值,則推進到處理C。If the comparison result of S15 is that the statistical value is greater than the set value, it proceeds to process C.
推進到處理C應該是處理器P判斷為未進行正常的基板定位且有可能由於某些原因而使封裝前基板5未能接觸到定位銷31或32。The advancement to the process C should be determined by the processor P as not performing normal substrate positioning and the pre-package substrate 5 may not be in contact with the positioning pins 31 or 32 for some reason.
處理C是為了結束定位操作和定位驗證操作並停止用於樹脂成型的步驟而由處理器P執行的處理。具體而言,處理器P進行指示,以使基板運送機構10、定位機構33和34從上模具23與下模具12之間避讓開,且不推進到下面的合模步驟。此時,處理器P指示資訊輸出部O例如輸出表示無法進行正常的基板定位、有可能由於某些原因而使封裝前基板5未能接觸到定位銷31或32或者促使進行定位銷及定位機構的檢查之意的資訊。作為所輸出的資訊,也可以設為因未能進行正常的定位操作而停止樹脂成型步驟等其它內容。The process C is a process performed by the processor P to end the positioning operation and the positioning verification operation and stop the steps for resin molding. Specifically, the processor P instructs the substrate transport mechanism 10 and the positioning mechanisms 33 and 34 to escape from between the upper mold 23 and the lower mold 12 and does not proceed to the lower mold clamping step. At this time, the processor P instructs the information output unit O to output, for example, that the normal substrate positioning cannot be performed, the pre-package substrate 5 may not contact the positioning pins 31 or 32 for some reasons, or the positioning pins and the positioning mechanism may be prompted. Information for inspection. As the output information, other contents such as stopping the resin molding step due to failure to perform a normal positioning operation may be used.
另外,也可以省略S15的處理,如果在S13的比較結果中距離X及Y中的至少一個小於容許界限值(T0-d),則轉移到處理C。In addition, the process of S15 may be omitted, and if at least one of the distances X and Y is smaller than the allowable limit value (T0-d) in the comparison result of S13, the process shifts to the process C.
按照上述方式,能夠執行基板的定位驗證操作中的資料處理。另外,在這裡的說明中,即使距離X及Y分別如後述的實施方式2以後的說明那樣為多個,也能夠同樣地進行資料處理,因此為了簡化說明,僅標記為“X”及“Y”而進行了說明。此外,關於圖像資料D,實際上也為多個資料,但為了簡化說明,僅標記為“D”而進行了說明。因此,在後述的實施方式2以後,不再重複進行同樣的說明。In the above manner, data processing in the positioning verification operation of the substrate can be performed. In addition, in the description here, even if the distances X and Y are multiple as in the description of the second embodiment and later, the data processing can be performed in the same manner. For the sake of simplicity, only "X" and "Y" are marked. "And explained. In addition, the image data D is actually a plurality of data, but for the sake of simplicity, only the description is given with “D”. Therefore, the same description will not be repeated after Embodiment 2 described later.
作用效果Effect
在本實施方式中,樹脂成型裝置1設為如下的結構,包括:成型模具24,具有相互對置配置的作為第一模具的上模具23和作為第二模具的下模具12;基板供給機構10,將基板供給到作為上模具23和下模具12中的任意一個模具的上模具23的模具表面;定位機構33、34,在模具表面上對作為至少包括基板的定位對象物的封裝前基板5進行定位;合模機構13,對成型模具24進行合模;攝影機11(C),在成型模具24被開模的狀態下,能夠配置在上模具23與下模具12之間;以及處理器21(P),根據由攝影機11(C)拍攝到的圖像資料來進行處理。In this embodiment, the resin molding apparatus 1 is configured to include a molding die 24 having an upper mold 23 as a first mold and a lower mold 12 as a second mold arranged to face each other; and a substrate supply mechanism 10 The substrate is supplied to the mold surface of the upper mold 23 which is any one of the upper mold 23 and the lower mold 12; the positioning mechanisms 33, 34, on the mold surface, face the package front substrate 5 as a positioning object including at least the substrate Positioning; mold clamping mechanism 13 to mold the mold 24; the camera 11 (C) can be arranged between the upper mold 23 and the lower mold 12 in a state where the mold 24 is opened; and the processor 21 (P), processing is performed based on the image data captured by the camera 11 (C).
進一步地,作為一個模具的上模具23具有藉由攝影機11(C)的拍攝而能夠識別的定位用的基準標記29、30,攝影機11(C)對藉由定位機構33、34被定位後的封裝前基板5與基準標記29、30進行拍攝,處理器21(P)根據由攝影機11(C)拍攝到的封裝前基板5與基準標記29、30的圖像資料,判斷封裝前基板5是否被正常定位。Further, the upper mold 23, which is a mold, has reference marks 29 and 30 for positioning that can be recognized by the imaging of the camera 11 (C), and the camera 11 (C) is positioned on the positioning mechanism 33 and 34. The front package substrate 5 and the reference marks 29 and 30 are photographed. The processor 21 (P) determines whether the front package substrate 5 is based on the image data of the front package substrate 5 and the reference marks 29 and 30 captured by the camera 11 (C). Being positioned normally.
藉由設為這樣的結構,能夠在驗證了被供給到成型模具24的封裝前基板5被正常定位的狀態下進行樹脂成型以進行樹脂封裝,從而能夠減少由定位引起的成型缺陷的發生。因此,當判斷為封裝前基板5被正常定位時,實施藉由樹脂成型進行的樹脂封裝。當判斷為封裝前基板5未被正常定位時,停止藉由樹脂成型進行的樹脂封裝。With such a configuration, it is possible to perform resin molding and resin encapsulation while verifying that the pre-package substrate 5 supplied to the molding die 24 is normally positioned, thereby reducing the occurrence of molding defects due to positioning. Therefore, when it is determined that the pre-package substrate 5 is normally positioned, resin packaging by resin molding is performed. When it is determined that the pre-package substrate 5 is not positioned normally, the resin packaging by resin molding is stopped.
此外,在本實施方式中,作為一模具的上模具23具有定位銷31、32,該定位銷31、32是在藉由作為定位對象物的封裝前基板5的接觸而進行的定位中所使用的定位部件,定位機構33、34藉由使封裝前基板5接觸到定位銷31、32來進行定位。In addition, in the present embodiment, the upper mold 23 as a mold has positioning pins 31 and 32 which are used for positioning by contacting the package front substrate 5 as a positioning object. The positioning mechanisms 33 and 34 perform positioning by contacting the front substrate 5 with the positioning pins 31 and 32.
根據該結構,即使定位銷31、32發生由磨耗或破損等引起的變形,也能夠減少由定位引起的成型缺陷的發生。According to this structure, even if the positioning pins 31 and 32 are deformed by abrasion, damage, or the like, it is possible to reduce the occurrence of molding defects due to positioning.
此外,處理器21(P)根據由攝影機11(C)拍攝到的作為定位對象物的封裝前基板5與基準標記29、30的圖像資料,求出與封裝前基板5和基準標記29、30之間的距離相關的資訊,並與預先設定的容許範圍進行比較,以判斷封裝前基板5是否被正常定位。In addition, the processor 21 (P) obtains the front substrate 5 and the reference marks 29, 30 based on the image data of the front substrate 5 and the reference marks 29, 30 as positioning objects, which are captured by the camera 11 (C). The information related to the distance between 30 and 30 is compared with a preset allowable range to determine whether the substrate 5 before packaging is normally positioned.
根據該結構,能夠更可靠地減少由定位引起的成型缺陷的發生。According to this structure, it is possible to more reliably reduce the occurrence of molding defects due to positioning.
在本實施方式中,當處理器21(P)判斷為作為定位對象物的封裝前基板5未接觸到作為定位部件的定位銷31、32的至少一部分時,定位機構33、34至少再進行一次定位操作。In this embodiment, when the processor 21 (P) determines that the pre-packaged substrate 5 as a positioning object does not contact at least a part of the positioning pins 31 and 32 as a positioning member, the positioning mechanisms 33 and 34 perform at least one more time. Positioning operation.
根據該結構,能夠提高完成正常的基板定位的可能性,從而能夠提高生產率。According to this configuration, the possibility of completing the normal substrate positioning can be increased, and the productivity can be improved.
更詳細而言,根據本實施方式,在封裝前基板5被定位在上模具23的狀態下,藉由攝影機11對包含封裝前基板5的端部的位置P1、P2與設置於上模具23的基準標記29、30的區域A1、A2分別進行拍攝,來獲取圖像資料D1、D2。根據獲取到的圖像資料D1、D2,處理器21對封裝前基板5的端部P1、P2與基準標記29、30之間的距離Y1、X2分別進行計測。藉由由處理器21對這些距離Y1、X2與預先設定的基準值T0進行比較,從而驗證封裝前基板5是否被正常定位到上模具23的規定位置。In more detail, according to this embodiment, in a state where the pre-package substrate 5 is positioned on the upper mold 23, the positions P1 and P2 of the ends including the package front substrate 5 by the camera 11 and The areas A1 and A2 of the fiducial marks 29 and 30 are respectively photographed to obtain image data D1 and D2. Based on the acquired image data D1 and D2, the processor 21 measures the distances Y1 and X2 between the ends P1 and P2 of the package front substrate 5 and the reference marks 29 and 30, respectively. The processor 21 compares these distances Y1 and X2 with a preset reference value T0 to verify whether the pre-package substrate 5 is normally positioned at a predetermined position of the upper mold 23.
在封裝前基板5在上模具23的模具表面上被定位後的狀態中存在有三種形態。第一種形態是封裝前基板5被正常定位到上模具23的規定位置的狀態。在這種情況下,執行作為下一步驟的合模。第二種形態是封裝前基板5未被正常定位且封裝前基板5未接觸到定位銷31、32的狀態。在這種情況下,暫且停止藉由樹脂成型進行的樹脂封裝,並至少再實施一次定位。第三種形態是在封裝前基板5的定位中發生了異常的狀態。由於發生了本來不可能有的狀態,因此定位銷31、32有可能發生了超過容許值的由磨耗或破損等引起的變形。在這種情況下,發送在裝置中發生了異常的信號,調查裝置的狀態並進行應對。藉由由處理器21根據攝影機11拍攝到的圖像資料進行資料處理,從而能夠對這三種形態進行判斷。There are three types of states before the package substrate 5 is positioned on the mold surface of the upper mold 23. The first aspect is a state in which the pre-package substrate 5 is normally positioned at a predetermined position of the upper mold 23. In this case, the mold clamping as the next step is performed. The second form is a state in which the pre-package substrate 5 is not positioned normally and the pre-package substrate 5 is not in contact with the positioning pins 31 and 32. In this case, temporarily stop the resin encapsulation by resin molding, and perform positioning at least once more. The third mode is a state where an abnormality has occurred in the positioning of the substrate 5 before the package. Since a state that is not possible originally occurs, the positioning pins 31 and 32 may be deformed due to wear, damage, or the like exceeding the allowable value. In this case, a signal indicating that an abnormality has occurred in the device is transmitted, and the state of the device is investigated to respond. The processor 21 can perform data processing based on the image data captured by the camera 11 so that the three modes can be determined.
根據本實施方式,處理器21根據攝影機11拍攝到的圖像資料進行影像處理。藉由將藉由影像處理計測出的距離與基準值進行比較,從而判斷封裝前基板5是否被正常定位到上模具23的規定位置。據此,當未被正常定位時或者在裝置中發生異常時,停止向下一步驟推進。從而,不會在封裝前基板5未被正常定位的狀態下進行樹脂成型以進行樹脂封裝,因此能夠減少由定位引起的成型缺陷的發生。According to this embodiment, the processor 21 performs image processing based on the image data captured by the camera 11. By comparing the distance measured by the image processing measurement with a reference value, it is determined whether the pre-package substrate 5 is normally positioned at a predetermined position of the upper mold 23. Accordingly, when it is not normally positioned or when an abnormality occurs in the device, the advancement to the next step is stopped. Therefore, resin molding is not performed for resin packaging in a state where the substrate 5 before packaging is not normally positioned, so that occurrence of molding defects due to positioning can be reduced.
在本實施方式中,藉由攝影機11對包含封裝前基板5的端部的位置與設置於上模具23的基準標記29、30的區域進行拍攝,而獲取到圖像資料。在這種情況下,藉由攝影機11識別出封裝前基板5的端部的位置。對封裝前基板5進行識別的位置並不限於封裝前基板5的端部的位置。例如,如第3圖所示,也可以對設置于封裝前基板5的四角的位置對準用的標記35進行識別。進一步地,可以是在封裝前基板5的內部形成的圖案或晶片等藉由攝影機11能夠識別的物件。In the present embodiment, the camera 11 captures the position of the end of the package front substrate 5 and the area of the fiducial marks 29 and 30 provided on the upper mold 23 to obtain image data. In this case, the position of the end portion of the substrate 5 before packaging is recognized by the camera 11. The position at which the pre-package substrate 5 is identified is not limited to the position of the end portion of the pre-package substrate 5. For example, as shown in FIG. 3, the positional alignment marks 35 provided on the four corners of the package front substrate 5 may be identified. Further, it may be a pattern or a wafer formed on the inside of the substrate 5 before the package, such as an object that can be recognized by the camera 11.
在本實施方式中,作為對封裝前基板5進行定位的單元,使用了設置於上模具23的定位機構33、34。不限於此,也可以在基板運送機構10中設置定位機構。在基板運送機構10將封裝前基板5交付到上模具23的模具表面後,使用設置於基板運送機構10的定位機構來將封裝前基板5分別推碰到定位銷31和32。據此,能夠將封裝前基板5定位到上模具23的模具表面的規定位置。藉由在基板運送機構10中設置定位機構,從而能夠進一步簡化樹脂成型裝置1的結構。In this embodiment, as means for positioning the pre-package substrate 5, positioning mechanisms 33 and 34 provided on the upper mold 23 are used. Not limited to this, a positioning mechanism may be provided in the substrate transfer mechanism 10. After the substrate transport mechanism 10 delivers the pre-package substrate 5 to the mold surface of the upper mold 23, the positioning mechanism provided on the substrate transport mechanism 10 is used to push the pre-package substrate 5 against the positioning pins 31 and 32, respectively. Accordingly, the pre-package substrate 5 can be positioned at a predetermined position on the mold surface of the upper mold 23. By providing the positioning mechanism in the substrate transfer mechanism 10, the structure of the resin molding apparatus 1 can be further simplified.
進一步地,可以使用基板運送機構10自身來作為定位機構。在使用基板運送機構10自身來作為定位機構的情況下,在將封裝前基板5交付到上模具23的模具表面的同時,使用基板運送機構10來使封裝前基板5沿Y方向及X方向移動,從而將封裝前基板5的端面分別推碰到定位銷31和32。據此,能夠將封裝前基板5定位到上模具23的模具表面的規定位置。藉由使用基板運送機構10自身來作為定位機構,從而能夠更加簡化樹脂成型裝置1的結構。Further, the substrate transport mechanism 10 itself may be used as a positioning mechanism. In the case of using the substrate transport mechanism 10 itself as a positioning mechanism, the substrate transport mechanism 10 is used to move the pre-package substrate 5 in the Y and X directions while delivering the package substrate 5 to the mold surface of the upper mold 23. , So that the end faces of the package front substrate 5 are pushed against the positioning pins 31 and 32, respectively. Accordingly, the pre-package substrate 5 can be positioned at a predetermined position on the mold surface of the upper mold 23. By using the substrate transport mechanism 10 itself as a positioning mechanism, the structure of the resin molding apparatus 1 can be further simplified.
在本實施方式中,在與設置有基準標記29的模具表面相反側的模具表面,設置有定位銷31,該定位銷31用於在Y方向上對封裝前基板5進行定位。同樣,在與設置有基準標記30的模具表面相反側的模具表面,設置有定位銷32,該定位銷32用於在X方向上對封裝前基板5進行定位。不限於此,也可以在設置有基準標記29的相同側的模具表面設置用於在Y方向上對封裝前基板5進行定位的定位銷31,在設置有基準標記30的相同側的模具表面設置用於在X方向上對封裝前基板5進行定位的定位銷32。在這種情況下,第5圖的(b)、(c)所示的計測出的距離與容許界限值的大小關係成為相反。因此,在參照第6圖和第7圖的說明中,距離X、Y與容許界限值的大小關係也成為相反。In this embodiment, on the mold surface opposite to the mold surface on which the reference mark 29 is provided, a positioning pin 31 is provided for positioning the package front substrate 5 in the Y direction. Similarly, on the mold surface opposite to the mold surface on which the reference mark 30 is provided, a positioning pin 32 is provided for positioning the package front substrate 5 in the X direction. Not limited to this, a positioning pin 31 for positioning the package front substrate 5 in the Y direction may be provided on a mold surface on the same side where the reference mark 29 is provided, and may be provided on a mold surface on the same side where the reference mark 30 is provided. A positioning pin 32 for positioning the package front substrate 5 in the X direction. In this case, the magnitude relationship between the distance measured and the allowable limit value shown in (b) and (c) of FIG. 5 is reversed. Therefore, in the description referring to FIGS. 6 and 7, the magnitude relationship between the distances X and Y and the allowable limit value is also reversed.
在本實施方式中,在基板供給收納模組2與樹脂供給模組4之間,沿X方向排列並安裝了三個成型模組3A、3B、3C。也可以將基板供給收納模組2與樹脂供給模組4設為一個模組,在該模組上沿X方向排列並安裝一個成型模組3A。進一步地,還可以在該成型模組3A上安裝另一成型模組3B。據此,能夠對應於生產形式或生產量來增減成型模組3A、3B、……。從而,能夠將樹脂成型裝置1的結構設為最佳,因此能夠實現生產率的提高。In this embodiment, three molding modules 3A, 3B, and 3C are arranged and mounted between the substrate supply storage module 2 and the resin supply module 4 in the X direction. The substrate supply storage module 2 and the resin supply module 4 may be set as one module, and a molding module 3A may be arranged and installed in the X direction on the module. Further, another forming module 3B may be mounted on the forming module 3A. Accordingly, it is possible to increase or decrease the molding modules 3A, 3B,... According to the production form or production volume. Therefore, since the structure of the resin molding apparatus 1 can be optimized, productivity can be improved.
另外,在本實施方式中,對作為樹脂成型裝置1而包括基板供給收納模組2、三個成型模組3A、3B、3C、以及樹脂供給模組4的結構進行了說明。樹脂成型裝置並不限定於該結構,只要是至少包括成型模具、供給液狀樹脂的分配器、以及對成型模具進行合模的合模機構,且具有進行樹脂成型的功能的裝置即可。In addition, in the present embodiment, a configuration including a substrate supply housing module 2, three molding modules 3A, 3B, 3C, and a resin supply module 4 as the resin molding apparatus 1 has been described. The resin molding apparatus is not limited to this structure, as long as it is a device that includes at least a molding mold, a dispenser for supplying liquid resin, and a mold clamping mechanism that molds the molding mold and has a function of performing resin molding.
由於在使用陶瓷基板等硬度比較高的基板來作為基板的情況下,定位銷容易發生變形,因此本實施方式在這種情況下特別有效。此外,在藉由透鏡部等光學樹脂部對要求比較高的位置精度的LED或光電二極體等光學晶片進行樹脂封裝的情況下特別有效。Since a relatively rigid substrate such as a ceramic substrate is used as the substrate, the positioning pin is easily deformed. This embodiment is particularly effective in this case. In addition, it is particularly effective when an optical resin portion such as a lens portion is used to resin-encapsulate an optical wafer such as an LED or a photodiode that requires relatively high position accuracy.
實施方式2Embodiment 2
參照第8圖~第9圖,對實施方式2中驗證被供給到上模具23的封裝前基板5是否被正常定位的操作進行說明。與實施方式1的區別是藉由在封裝前基板5的沿X方向及Y方向的端部分別對兩處位置進行拍攝來驗證定位。據此,不僅X方向及Y方向,而且也包括θ方向,都能夠驗證定位是否被正常進行。關於除此之外的操作(製造方法)以及成型模具的結構,由於與實施方式1相同,因此省略說明。The operation of verifying whether the pre-package substrate 5 supplied to the upper mold 23 is properly positioned in the second embodiment will be described with reference to FIGS. 8 to 9. The difference from the first embodiment is that the positioning is verified by photographing two positions at the ends of the front substrate 5 in the X direction and the Y direction, respectively. Accordingly, it is possible to verify whether positioning is performed normally not only in the X and Y directions but also in the θ direction. The other operations (manufacturing methods) and the structure of the molding die are the same as those in the first embodiment, and therefore descriptions thereof are omitted.
基板的定位驗證操作(樹脂成型品的製造方法的一部分)Substrate positioning verification operation (part of a method for manufacturing a resin molded product)
以下,對實施方式2中驗證封裝前基板5是否被正常定位的操作進行說明。這裡的說明也是對樹脂成型品的製造方法的一部分的說明。在本實施方式中,例如,如第8圖的(a)所示,對封裝前基板5的沿X方向的端部的任意位置P3及P4與基準標記29之間的距離Y3及Y4分別進行計測。同樣地,對封裝前基板5的沿Y方向的端部的任意位置P5及P6與基準標記30之間的距離X5及X6分別進行計測。藉由對這四個點的位置與基準標記之間的距離進行計測,從而能夠驗證封裝前基板5在X方向、Y方向以及θ方向上是否被正常定位。Hereinafter, an operation of verifying whether the pre-package substrate 5 is properly positioned in the second embodiment will be described. The description here is also a part of a method for manufacturing a resin molded article. In this embodiment, for example, as shown in FIG. 8 (a), the distances Y3 and Y4 between the arbitrary positions P3 and P4 of the ends in the X direction of the package front substrate 5 and the reference marks 29 are respectively performed. Measure. Similarly, the distances X5 and X6 between the arbitrary positions P5 and P6 of the ends in the Y direction of the package front substrate 5 and the reference mark 30 are measured, respectively. By measuring the distance between the positions of these four points and the reference mark, it is possible to verify whether the pre-package substrate 5 is normally positioned in the X direction, the Y direction, and the θ direction.
首先,如第8圖的(a)所示,使設置於基板運送機構10的攝影機11移動至能夠對包含封裝前基板5的沿X方向的端部的位置P3和基準標記29的區域A3進行拍攝的位置。在該位置,藉由攝影機11對區域A3進行拍攝,來獲取圖像資料D3。將獲取到的圖像資料D3保存到組裝在控制部19中的記憶體20。First, as shown in (a) of FIG. 8, the camera 11 provided on the substrate transport mechanism 10 is moved to an area A3 including the position P3 of the X-direction end portion of the front substrate 5 and the reference mark 29. Shooting location. At this position, the camera 11 captures the area A3 to obtain the image data D3. The acquired image data D3 is stored in the memory 20 incorporated in the control unit 19.
接著,使攝影機11移動至能夠對包含封裝前基板5的沿X方向的端部的位置P4和基準標記29的區域A4進行拍攝的位置。在該位置,藉由攝影機11對區域A4進行拍攝,來獲取圖像資料D4。將獲取到的圖像資料D4保存到組裝在控制部19中的記憶體20。Next, the camera 11 is moved to a position where an image of the area A4 including the position P4 of the end portion of the front substrate 5 in the X direction and the reference mark 29 can be captured. At this position, the camera 11 captures the area A4 to obtain the image data D4. The acquired image data D4 is stored in the memory 20 incorporated in the control unit 19.
接著,使攝影機11移動至能夠對包含封裝前基板5的沿Y方向的端部的位置P5和基準標記30的區域A5進行拍攝的位置。在該位置,藉由攝影機11對區域A5進行拍攝,來獲取圖像資料D5。將獲取到的圖像資料D5保存到組裝在控制部19中的記憶體20。Next, the camera 11 is moved to a position where the region P5 including the end portion of the front substrate 5 in the Y direction and the reference mark 30 can be imaged. At this position, the camera 11 captures the area A5 to obtain the image data D5. The acquired image data D5 is stored in the memory 20 incorporated in the control unit 19.
接著,使攝影機11移動至能夠對包含封裝前基板5的沿Y方向的端部的位置P6和基準標記30的區域A6進行拍攝的位置。在該位置,藉由攝影機11對區域A6進行拍攝,來獲取圖像資料D6。將獲取到的圖像資料D6保存到組裝在控制部19中的記憶體20。Next, the camera 11 is moved to a position capable of capturing an image of an area A6 including the position P6 of the end portion in the Y direction of the package front substrate 5 and the reference mark 30. At this position, the camera 11 captures the area A6 to obtain the image data D6. The acquired image data D6 is stored in the memory 20 incorporated in the control unit 19.
接著,使用組裝在控制部19中的處理器21,從記憶體20取入在各區域A3、A4、A5、A6中分別獲取到的圖像資料D3、D4、D5、D6並進行影像處理。對封裝前基板5的沿X方向的端部的位置P3及P4與基準標記29之間的距離Y3及Y4分別進行計測。同樣地,對封裝前基板5的沿Y方向的端部的任意位置P5及P6與基準標記30之間的距離X5及X6分別進行計測。Next, using the processor 21 incorporated in the control unit 19, the image data D3, D4, D5, and D6 obtained in the respective areas A3, A4, A5, and A6 are taken from the memory 20 and image processing is performed. The distances Y3 and Y4 between the positions P3 and P4 of the X-direction end portions of the front substrate 5 and the reference mark 29 are measured, respectively. Similarly, the distances X5 and X6 between the arbitrary positions P5 and P6 of the ends in the Y direction of the package front substrate 5 and the reference mark 30 are measured, respectively.
接著,處理器21將分別計測出的距離Y3、Y4以及X5、X6與預先設定的基準值T0進行比較。據此,能夠對封裝前基板5在上模具23的模具表面上被定位時產生的四種形態進行驗證。Next, the processor 21 compares the measured distances Y3 and Y4 and X5 and X6 with a preset reference value T0, respectively. According to this, it is possible to verify the four forms generated when the pre-package substrate 5 is positioned on the mold surface of the upper mold 23.
參照第9圖,對封裝前基板5在上模具23的模具表面上被定位時產生的四種形態進行說明。四種形態是指:(a)封裝前基板5被正常定位的狀態;(b)封裝前基板5未被正常定位且封裝前基板5沒有接觸到兩個定位銷的狀態;(c)封裝前基板5的定位發生了異常(定位銷發生了由磨耗或破損等引起的變形)的狀態;(d)發生了θ方向的位置偏移的狀態。Referring to FIG. 9, four modes generated when the pre-package substrate 5 is positioned on the mold surface of the upper mold 23 will be described. The four forms refer to: (a) the state before the package substrate 5 is normally positioned; (b) the state before the package substrate 5 is not properly positioned and the package substrate 5 does not contact the two positioning pins; (c) before the package A state in which the positioning of the substrate 5 is abnormal (the positioning pin is deformed due to abrasion, damage, or the like); (d) A state in which a position shift in the θ direction occurs.
在第9圖中,針對例如針對X方向對封裝前基板5進行了定位的情況,對四種形態進行說明。與實施方式1同樣,“T0”是表示封裝前基板5的端部與基準標記30之間的正常距離的基準值,“d”是包括偏差和測定誤差等在內針對封裝前基板5的定位而容許的容許值。(T0-d)和(T0+d)是表示封裝前基板5被正常定位的範圍的容許界限值。In FIG. 9, for example, in a case where the package front substrate 5 is positioned in the X direction, four modes are described. As in Embodiment 1, "T0" is a reference value indicating the normal distance between the end of the package front substrate 5 and the reference mark 30, and "d" is the positioning of the package front substrate 5 including deviations and measurement errors. And the allowable value. (T0-d) and (T0 + d) are allowable limit values indicating a range in which the substrate 5 before the package is normally positioned.
如第9圖的(a)所示,如果針對X方向計測出的距離X5及X6為(T0-d)≤X5且X6≤(T0+d),則判斷為封裝前基板5針對上模具23的模具表面的X方向被正常定位。換言之,是封裝前基板5的沿Y方向的端面正常接觸到定位銷32的狀態。As shown in (a) of FIG. 9, if the distances X5 and X6 measured in the X direction are (T0-d) ≤ X5 and X6 ≤ (T0 + d), it is determined that the front substrate 5 for packaging is directed toward the upper mold 23 The X direction of the mold surface is positioned normally. In other words, it is a state where the end surface of the front substrate 5 in the Y direction is normally in contact with the positioning pin 32.
同樣地,如果針對Y方向計測出的距離Y3及Y4為(T0-d)≤Y3且Y4≤(T0+d),則判斷為封裝前基板5針對上模具23的模具表面的Y方向被正常定位。由於針對X方向有兩處且針對Y方向有兩處被正常定位,因此可以判斷為針對θ方向也被正常定位。因此,在這種情況下,判斷為封裝前基板5針對X方向、Y方向以及θ方向被正常定位,向作為下一步驟的合模步驟推進。Similarly, if the distances Y3 and Y4 measured for the Y direction are (T0-d) ≤ Y3 and Y4 ≤ (T0 + d), it is determined that the Y direction of the front substrate 5 against the mold surface of the upper mold 23 is normal. Positioning. Since there are two positions for the X direction and two positions for the Y direction, they are normally positioned, so it can be determined that they are also positioned normally for the θ direction. Therefore, in this case, it is determined that the pre-package substrate 5 is normally positioned with respect to the X direction, the Y direction, and the θ direction, and proceeds to the mold clamping step as the next step.
如第9圖的(b)所示,如果針對X方向計測出的距離X5及X6為X5<(T0-d)且X6<(T0-d),則判斷為封裝前基板5針對上模具23的模具表面的X方向未被正常定位。換言之,是封裝前基板5的沿Y方向的端面未接觸到兩個定位銷32的狀態。As shown in (b) of FIG. 9, if the distances X5 and X6 measured in the X direction are X5 <(T0-d) and X6 <(T0-d), it is determined that the front substrate 5 for packaging is directed to the upper mold 23. The X-direction of the mold surface is not properly positioned. In other words, it is a state where the end surface of the front substrate 5 in the Y direction is not in contact with the two positioning pins 32.
同樣地,如果針對Y方向計測出的距離Y3及Y4為Y3<(T0-d)且Y4<(T0-d),則判斷為封裝前基板5針對上模具23的模具表面的Y方向未被正常定位,封裝前基板5的沿X方向的端面未接觸到兩個定位銷31。在這種情況下,判斷為封裝前基板5針對X方向或Y方向未被正常定位,並停止向下一步驟推進。Similarly, if the distances Y3 and Y4 measured for the Y direction are Y3 <(T0-d) and Y4 <(T0-d), it is determined that the Y direction of the package substrate 5 against the mold surface of the upper mold 23 is not In the normal positioning, the end surface of the front substrate 5 in the X direction does not contact the two positioning pins 31. In this case, it is determined that the pre-package substrate 5 is not positioned normally for the X direction or the Y direction, and the advancement to the next step is stopped.
如第9圖的(c)所示,如果針對X方向計測出的距離X5及X6為X5>(T0+d)且X6>(T0+d),則判斷為上模具23有可能發生了異常。在這種情況下,定位銷32有可能發生了超過容許值d的由磨耗或破損等引起的變形。As shown in (c) of FIG. 9, if the distances X5 and X6 measured in the X direction are X5> (T0 + d) and X6> (T0 + d), it is determined that the upper mold 23 may be abnormal. . In this case, there is a possibility that the positioning pin 32 is deformed due to abrasion, damage, or the like that exceeds the allowable value d.
同樣地,如果針對Y方向計測出的距離Y3及Y4為Y3>(T0+d)且Y4>(T0+d),則判斷為上模具23有可能發生了異常。在這種情況下,發送在樹脂成型裝置1中發生了異常的信號,確認定位銷31、32的狀態並實施更換等應對。Similarly, if the distances Y3 and Y4 measured in the Y direction are Y3> (T0 + d) and Y4> (T0 + d), it is determined that the upper mold 23 may be abnormal. In this case, a signal indicating that an abnormality has occurred in the resin molding apparatus 1 is transmitted, and the states of the positioning pins 31 and 32 are confirmed, and measures such as replacement are performed.
如第9圖的(d)所示,例如,如果針對X方向計測出的距離X5及X6為(T0-d)≤X5≤(T0+d)且X6<(T0-d),則判斷為封裝前基板5在上模具23的模具表面上發生了θ方向的位置偏移。在這種情況下,不太清楚封裝前基板5的端面與定位銷31、32的接觸狀態是什麼樣的。關於針對X方向計測出的距離X5及X6,當任意一方在容許範圍內而另一方偏離容許範圍時,可以判斷為發生了θ方向的位置偏移。這樣,藉由在兩處對封裝前基板5的沿一個方向的端部的兩個位置與基準標記之間的距離進行計測,從而能夠確認出θ方向的位置偏移。As shown in (d) of FIG. 9, for example, if the distances X5 and X6 measured in the X direction are (T0-d) ≦ X5 ≦ (T0 + d) and X6 <(T0-d), it is determined as The pre-package substrate 5 is shifted in position in the θ direction on the mold surface of the upper mold 23. In this case, it is not clear what the contact state between the end surface of the package front substrate 5 and the positioning pins 31 and 32 is. Regarding the distances X5 and X6 measured in the X direction, when either one is within the allowable range and the other is out of the allowable range, it can be determined that a position shift in the θ direction has occurred. In this way, by measuring the distance between the two positions of the end portion of the front substrate 5 in one direction and the reference mark at two places, the positional deviation in the θ direction can be confirmed.
同樣地,如果針對Y方向計測出的距離Y3及Y4例如為(T0-d)≤Y3≤(T0+d)且Y3<(T0-d),則判斷為封裝前基板5在上模具23的模具表面上發生了θ方向的位置偏移。在這種情況下,判斷為封裝前基板5針對X方向、Y方向以及θ方向發生了位置偏移,並停止向下一步驟推進。Similarly, if the distances Y3 and Y4 measured in the Y direction are, for example, (T0-d) ≤Y3≤ (T0 + d) and Y3 <(T0-d), it is determined that the substrate 5 before packaging is on the upper mold 23. A positional shift in the θ direction occurred on the mold surface. In this case, it is determined that the pre-package substrate 5 has shifted in position in the X direction, the Y direction, and the θ direction, and stops advancing to the next step.
如第8圖~第9圖所示,藉由對於封裝前基板5的沿X方向及Y方向的端部的兩個位置分別計測與基準標記之間的距離,從而能夠判斷出在X方向、Y方向以及θ方向上是否被正常定位。因此,當計測出的四個點的距離均在容許範圍內時,判斷為被正常定位,並向下一步驟推進。當四個點中即使有一個點偏離容許範圍時,也判斷為未被正常定位,並停止向下一步驟推進。As shown in FIGS. 8 to 9, by measuring the distance from the reference mark to the two positions of the end portions of the front substrate 5 in the X direction and the Y direction, it is possible to determine Whether the Y direction and the θ direction are properly positioned. Therefore, when the measured distances of the four points are within the allowable range, it is judged that they are normally positioned and proceed to the next step. When one of the four points deviates from the allowable range, it is judged that it is not positioned normally, and the next step is stopped.
另外,在第9圖的(b)和第9圖的(d)所示的狀態時,即在上述的(a)~(d)四種形態中的(b)和(d)形態時,多個距離X的值中的至少一小於容許範圍的最小值即容許界限值(T0-d)。在這些情況下,藉由再次實施定位操作,有可能使基板5處於被正常定位的位置,因此可以至少再實施一次定位操作。In addition, in the states shown in (b) of FIG. 9 and (d) of FIG. 9, that is, when the forms (b) and (d) of the four forms (a) to (d) described above, At least one of the values of the plurality of distances X is smaller than the minimum value of the allowable range, that is, the allowable limit value (T0-d). In these cases, by performing the positioning operation again, it is possible to place the substrate 5 in a position where it is normally positioned, so that the positioning operation can be performed at least once more.
本實施方式中的基板的定位驗證操作的資料處理與實施方式1相同,因此不再重複說明。The data processing of the positioning verification operation of the substrate in this embodiment is the same as that in the first embodiment, and therefore the description will not be repeated.
作用效果Effect
根據本實施方式,對封裝前基板5的沿X方向的端部的位置P3及P4與基準標記29之間的距離Y3及Y4分別進行計測。同樣地,對封裝前基板5的沿Y方向的端部的任意位置P5及P6與基準標記30之間的距離X5及X6分別進行計測。藉由對這些計測出的距離Y3、Y4、X5、X6與預先設定的容許範圍進行比較,從而能夠驗證封裝前基板5在X方向、Y方向以及θ方向上是否被正常定位。因此,能夠減少由定位引起的成型缺陷的發生。According to this embodiment, the distances Y3 and Y4 between the positions P3 and P4 of the X-direction end portions of the front substrate 5 and the reference mark 29 are measured, respectively. Similarly, the distances X5 and X6 between the arbitrary positions P5 and P6 of the ends in the Y direction of the package front substrate 5 and the reference mark 30 are measured, respectively. By comparing these measured distances Y3, Y4, X5, and X6 with a preset allowable range, it is possible to verify whether the pre-package substrate 5 is properly positioned in the X, Y, and θ directions. Therefore, it is possible to reduce the occurrence of molding defects caused by positioning.
封裝前基板5在上模具23的模具表面上被定位後的狀態有四種形態。第一種形態是封裝前基板5被正常定位到上模具23的規定位置的狀態。在這種情況下,執行作為下一步驟的合模。第二種形態是封裝前基板5未被正常定位且封裝前基板5未接觸到兩個定位銷的狀態。在這種情況下,是封裝前基板5的端面未接觸到定位銷31、32的狀態,暫且停止藉由樹脂成型進行的樹脂封裝,並至少再實施一次定位。第三種形態是在封裝前基板5的定位中發生了異常的狀態。由於發生了本來不可能有的狀態,因此定位銷31、32有可能發生了超過容許值的由磨耗或破損等引起的變形。在這種情況下,發送在裝置中發生了異常的信號,調查裝置的狀態並進行應對。第四種形態是發生θ方向的位置偏移而未被正常定位的狀態。在這種情況下,是定位銷31和32中的至少一方未與封裝前基板5的端面接觸的狀態,暫且停止藉由樹脂成型進行的樹脂封裝,並至少再實施一次定位。藉由根據攝影機11拍攝到的四個位置的圖像資料來進行資料處理,從而能夠對這四種形態進行判斷。There are four forms of the state before the package substrate 5 is positioned on the mold surface of the upper mold 23. The first aspect is a state in which the pre-package substrate 5 is normally positioned at a predetermined position of the upper mold 23. In this case, the mold clamping as the next step is performed. The second form is a state in which the pre-package substrate 5 is not positioned normally and the pre-package substrate 5 is not in contact with the two positioning pins. In this case, the end faces of the package substrate 5 are not in contact with the positioning pins 31 and 32, and the resin packaging by resin molding is temporarily stopped, and positioning is performed at least once more. The third mode is a state where an abnormality has occurred in the positioning of the substrate 5 before the package. Since a state that is not possible originally occurs, the positioning pins 31 and 32 may be deformed due to wear, damage, or the like exceeding the allowable value. In this case, a signal indicating that an abnormality has occurred in the device is transmitted, and the state of the device is investigated to respond. The fourth form is a state in which a position shift in the θ direction occurs without being positioned normally. In this case, at least one of the positioning pins 31 and 32 is not in contact with the end surface of the package front substrate 5, the resin packaging by resin molding is temporarily stopped, and positioning is performed at least once again. By performing data processing based on the image data of the four positions captured by the camera 11, the four forms can be judged.
在本實施方式中,藉由對封裝前基板5的沿X方向的端部的兩個位置與基準標記29之間的距離以及封裝前基板5的沿Y方向的端部的兩個位置與基準標記30之間的距離共四個位置的距離進行計測,從而對X方向、Y方向以及θ方向的偏移進行了驗證。不限於此,可以藉由對封裝前基板5的沿X方向及Y方向的端部的三個位置與基準標記29及30之間的距離在至少三個點進行計測,從而對X方向、Y方向以及θ方向的偏移進行驗證。為了驗證θ方向的偏移,可以對封裝前基板5的沿X方向的端部或者沿Y方向的端部中的任意一方的兩個點與基準標記之間的距離進行計測。In this embodiment, the distance between the two positions of the end portion of the package front substrate 5 in the X direction and the reference mark 29 and the two positions of the end portion of the package front substrate 5 in the Y direction and the reference The distance between the markers 30 was measured at four positions in total, and the displacements in the X, Y, and θ directions were verified. Not limited to this, the distance between the three positions of the ends of the package front substrate 5 in the X direction and the Y direction and the reference marks 29 and 30 can be measured at at least three points, so that the X direction, Y Direction and theta direction. In order to verify the deviation in the θ direction, the distance between the two points in either the X-direction end or the Y-direction end of the package front substrate 5 may be measured.
實施方式3Embodiment 3
參照第10圖,對實施方式3中驗證被供給到上模具23的封裝前基板5是否被正常定位的操作進行說明。這裡的說明也是對樹脂成型品的製造方法的一部分的說明。與實施方式1的區別是在上模具23中設置了包括X方向及Y方向的U形的基準標記,以及在資料處理中使用基板的角部的位置。關於除此之外的成型模具的結構以及操作(製造方法),由於與實施方式1相同,因此省略說明。The operation of verifying whether the pre-package substrate 5 supplied to the upper mold 23 is normally positioned in the third embodiment will be described with reference to FIG. 10. The description here is also a part of a method for manufacturing a resin molded article. The difference from Embodiment 1 is that a U-shaped reference mark including X-direction and Y-direction is provided in the upper mold 23, and the position of the corner portion of the substrate is used for data processing. The structure and operation (manufacturing method) of the other molding dies are the same as those of the first embodiment, and therefore description thereof is omitted.
以下,對實施方式3中驗證封裝前基板5是否被正常定位的操作進行說明。如第10圖的(a)所示,在上模具23的模具表面上,設置有U形的基準標記36。在本實施方式中,例如對封裝前基板5的角部的位置P7與U形的基準標記36之間的距離X7及Y7分別進行計測。同樣地,對封裝前基板5的角部的位置P8與U形的基準標記36之間的距離X8及Y8分別進行計測。藉由針對X方向對X7、X8兩點以及針對Y方向對Y7、Y8兩點分別進行計測,從而驗證封裝前基板5在X方向、Y方向以及θ方向上是否被正常定位。另外,在與封裝前基板5的角部的位置P7及P8相關的影像處理中,可以利用角點檢測,還可以利用在封裝前基板5的角部相交的兩個端面的邊緣檢測。Hereinafter, the operation of verifying whether the pre-package substrate 5 is properly positioned in the third embodiment will be described. As shown in FIG. 10 (a), a U-shaped reference mark 36 is provided on the mold surface of the upper mold 23. In this embodiment, for example, the distances X7 and Y7 between the position P7 of the corner of the front substrate 5 and the U-shaped reference mark 36 are measured. Similarly, the distances X8 and Y8 between the position P8 of the corner portion of the front substrate 5 and the U-shaped reference mark 36 are measured. By measuring the two points X7 and X8 for the X direction and the two points Y7 and Y8 for the Y direction, it is verified whether the pre-package substrate 5 is properly positioned in the X direction, the Y direction, and the θ direction. In addition, in the image processing related to the positions P7 and P8 of the corner portions of the pre-package substrate 5, corner point detection may be used, and edge detection of two end faces that intersect at the corner portions of the pre-package substrate 5 may also be used.
首先,如第10圖的(a)所示,使設置於基板運送機構10的攝影機11移動至能夠對包含封裝前基板5的角部的位置P7和基準標記36的區域A7進行拍攝的位置。在該位置,藉由攝影機11對區域A7進行拍攝,以獲取圖像資料D7。將獲取到的圖像資料D7保存到組裝在控制部19中的記憶體20。First, as shown in FIG. 10 (a), the camera 11 provided on the substrate transfer mechanism 10 is moved to a position where the region P7 including the corner portion P7 of the front substrate 5 and the reference mark 36 can be imaged. At this position, the area A7 is captured by the camera 11 to obtain image data D7. The acquired image data D7 is stored in the memory 20 incorporated in the control unit 19.
接著,使攝影機11移動至能夠對包含封裝前基板5的角部的位置P8和基準標記36的區域A8進行拍攝的位置。在該位置,藉由攝影機11對區域A8進行拍攝,以獲取圖像資料D8。將獲取到的圖像資料D8保存到組裝在控制部19中的記憶體20。Next, the camera 11 is moved to a position where the region P8 including the corner position P8 of the package front substrate 5 and the reference mark 36 can be imaged. At this position, the area A8 is photographed by the camera 11 to obtain image data D8. The acquired image data D8 is stored in the memory 20 incorporated in the control unit 19.
接著,使用組裝在控制部19中的處理器21,從記憶體20取入在各區域A7、A8中分別獲取到的圖像資料D7、D8,並進行影像處理。對封裝前基板5的角部P7與U形的基準標記36之間的距離X7、Y7以及封裝前基板5的角部P8與U形的基準標記36之間的距離X8、Y8分別進行計測。Next, using the processor 21 incorporated in the control unit 19, the image data D7 and D8 obtained in the respective regions A7 and A8 are taken from the memory 20 and image processing is performed. The distances X7 and Y7 between the corner portion P7 of the package front substrate 5 and the U-shaped reference mark 36 and the distances X8 and Y8 between the corner portion P8 of the package front substrate 5 and the U-shaped reference mark 36 are measured, respectively.
接著,處理器21將分別計測出的距離X7、Y7以及X8、Y8與預先設定的基準值T0進行比較。如果這些距離X7、Y7、X8、Y8均在容許範圍內,則判斷為在X方向、Y方向以及θ方向上被正常定位,並向下一步驟推進。Next, the processor 21 compares the measured distances X7 and Y7 and X8 and Y8 with a preset reference value T0, respectively. If these distances X7, Y7, X8, and Y8 are within the allowable range, it is determined that the X, Y, and θ directions are normally positioned, and the next step is advanced.
當計測出的距離X7、Y7、X8、Y8中即使有任意一個偏離容許範圍時,也判斷為未被正常定位,並停止向下一步驟推進。如此,就能夠驗證出封裝前基板5在X方向、Y方向以及θ方向上是否被正常定位。When any one of the measured distances X7, Y7, X8, and Y8 deviates from the allowable range, it is determined that it is not positioned normally, and the advancement to the next step is stopped. In this way, it is possible to verify whether the pre-package substrate 5 is normally positioned in the X direction, the Y direction, and the θ direction.
關於本實施方式的基板的定位驗證操作的資料處理,將與實施方式1中使用第6圖及第7圖進行的說明的不同之處記載如下。Regarding the data processing of the positioning verification operation of the substrate of the present embodiment, the differences from the description using FIG. 6 and FIG. 7 in the first embodiment are described below.
在與S13的距離Y相關的比較處理中,對於距離Y7也同樣,但對於距離Y8則不同。在本實施方式中,關於與距離Y8相關的比較處理,處理器P從記憶體M中讀出容許範圍的最大值(容許界限值的較大一方的值)即(T0+d),並進行與距離Y8的比較。如果比較的結果是距離Y8小於容許界限值(T0+d)且其它的距離X7、X8以及Y7均大於容許界限值(T0-d),則推進到S14。如果比較的結果是距離Y8大於容許界限值(T0+d)或者其它的距離X7、X8以及Y7中的至少一個小於容許界限值(T0-d),則推進到S15。In the comparison processing related to the distance Y of S13, the same is true for the distance Y7, but different for the distance Y8. In this embodiment, regarding the comparison processing related to the distance Y8, the processor P reads the maximum value of the allowable range (the larger value of the allowable limit value), that is, (T0 + d) from the memory M, and performs Comparison with distance Y8. If the result of the comparison is that the distance Y8 is less than the allowable limit value (T0 + d) and the other distances X7, X8, and Y7 are all greater than the allowable limit value (T0-d), the process proceeds to S14. If the result of the comparison is that the distance Y8 is greater than the allowable limit value (T0 + d) or at least one of the other distances X7, X8, and Y7 is less than the allowable limit value (T0-d), the process proceeds to S15.
在與S14的距離Y相關的比較處理中,對於距離Y7也同樣,但對於距離Y8則不同。在本實施方式中,關於與距離Y8相關的比較處理,處理器P從記憶體M中讀出容許範圍的最小值(容許界限值的較小一方的值)即(T0-d),並進行與距離Y8的比較。如果比較的結果是距離Y8大於容許界限值(T0-d)且其它的距離X7、X8以及Y7均小於容許界限值(T0+d),則推進到處理A。如果比較的結果是距離Y8小於容許界限值(T0-d)或者其它的距離X7、X8以及Y7中的至少一個大於容許界限值(T0+d),則推進到處理B。In the comparison processing related to the distance Y of S14, the same is true for the distance Y7, but different for the distance Y8. In the present embodiment, regarding the comparison processing related to the distance Y8, the processor P reads the minimum value of the allowable range (the smaller value of the allowable limit value), that is, (T0-d) from the memory M, and performs Comparison with distance Y8. If the result of the comparison is that the distance Y8 is greater than the allowable limit value (T0-d) and the other distances X7, X8, and Y7 are all less than the allowable limit value (T0 + d), the process proceeds to process A. If the result of the comparison is that the distance Y8 is less than the allowable limit value (T0-d) or at least one of the other distances X7, X8, and Y7 is greater than the allowable limit value (T0 + d), the process proceeds to process B.
關於S13、S14之外的處理,可以根據S13、S14中的這些區別點而適當變更。Processing other than S13 and S14 can be appropriately changed in accordance with these differences in S13 and S14.
在本實施方式中,對使用封裝前基板5的角部的位置P7及P8來進行資料處理的例子進行了說明,但也可以使用在封裝前基板5的角部相交的兩個端面來進行資料處理。In this embodiment, an example has been described in which data is processed using the positions P7 and P8 of the corners of the front substrate 5, but the data may also be processed using two end faces that intersect at the corners of the front substrate 5. deal with.
根據本實施方式,藉由對封裝前基板5的角部P7與U形的基準標記36之間的距離X7、Y7以及封裝前基板5的角部P8與U形的基準標記36之間的距離X8、Y8分別進行計測,從而能夠驗證出封裝前基板5在X方向、Y方向以及θ方向上是否被正常定位。因此,能夠減少由定位引起的成型缺陷的發生。According to this embodiment, the distance X7, Y7 between the corner P7 of the package front substrate 5 and the U-shaped reference mark 36 and the distance between the corner P8 of the package front substrate 5 and the U-shaped reference mark 36 are determined. X8 and Y8 are respectively measured, so that it is possible to verify whether the pre-package substrate 5 is normally positioned in the X direction, the Y direction, and the θ direction. Therefore, it is possible to reduce the occurrence of molding defects caused by positioning.
藉由由設置於基板運送機構10的攝影機11對兩處包含封裝前基板5的角部與U形的基準標記36的區域進行拍攝,從而能夠驗證出封裝前基板5在X方向、Y方向以及θ方向上是否被正常定位。因此,能夠縮短使攝影機11移動的距離。能夠減少對封裝前基板5進行拍攝的工時。據此,能夠縮減對封裝前基板5是否被正常定位進行驗證的操作。By photographing two areas including the corners of the package front substrate 5 and the U-shaped reference mark 36 by the camera 11 provided on the substrate transport mechanism 10, it is possible to verify that the package front substrate 5 is in the X direction, the Y direction, and Whether it is positioned normally in the θ direction. Therefore, the distance for moving the camera 11 can be shortened. The number of man-hours for imaging the pre-package substrate 5 can be reduced. Accordingly, it is possible to reduce the operation of verifying whether or not the pre-package substrate 5 is normally positioned.
在本實施方式中,藉由對封裝前基板5的角部與U形的基準標記36之間的距離進行計測,從而驗證出封裝前基板5在X方向、Y方向以及θ方向上是否被正常定位。不限於此,例如也可以藉由對在封裝前基板5的四角設置的位置對準用的標記35與U形的基準標記36之間的距離進行計測,從而驗證封裝前基板5在X方向、Y方向以及θ方向上是否被正常定位。In this embodiment, by measuring the distance between the corner of the package front substrate 5 and the U-shaped reference mark 36, it is verified whether the package front substrate 5 is normal in the X, Y, and θ directions. Positioning. Not limited to this, for example, the distance between the alignment marks 35 and the U-shaped reference marks 36 provided at the four corners of the front substrate 5 can be measured to verify that the front substrate 5 is in the X direction and the Y direction. Whether it is normally positioned in the direction and the θ direction.
實施方式4Embodiment 4
參照第11圖,對實施方式4中驗證被供給到上模具23的封裝前基板5是否被正常定位的操作進行說明。這裡的說明也是對樹脂成型品的製造方法的一部分的說明。與實施方式3的區別是在上模具23中將沿Y方向設置的定位銷32設置在了與U形的基準標記36相同側的模具表面。關於除此之外的成型模具的結構以及操作(製造方法),由於與實施方式3相同,因此省略說明。The operation of verifying whether or not the pre-package substrate 5 supplied to the upper mold 23 is normally positioned in the fourth embodiment will be described with reference to FIG. 11. The description here is also a part of a method for manufacturing a resin molded article. The difference from Embodiment 3 is that a positioning pin 32 provided in the Y direction is provided on the mold surface on the same side as the U-shaped reference mark 36 in the upper mold 23. The structure and operation (manufacturing method) of the other molding dies are the same as those of the third embodiment, and therefore description thereof is omitted.
如第11圖的(a)所示,在本實施方式中,對包含封裝前基板5的角部的位置P7、基準標記36以及定位銷32的區域A9進行拍攝。同樣地,對包含封裝前基板5的角部的位置P8、基準標記36以及定位銷32的區域A10進行拍攝。藉由對區域A9進行拍攝,從而能夠計測出封裝前基板5的角部P7與基準標記36之間的距離X7及Y7,並且能夠觀察到定位銷32的狀態。同樣,藉由對區域A10進行拍攝,從而能夠計測出封裝前基板5的角部P8與基準標記36之間的距離X8及Y8,並且能夠觀察到定位銷32的狀態。因此,能夠驗證出封裝前基板5在X方向、Y方向以及θ方向上是否被正常定位,並且能夠確認出定位銷32是否發生了由磨耗或破損等引起的變形。As shown in FIG. 11 (a), in this embodiment, an area A9 including the position P7 of the corner portion of the front substrate 5, the reference mark 36, and the positioning pin 32 is captured. Similarly, an area A10 including the position P8 of the corner portion of the front substrate 5, the reference mark 36, and the positioning pin 32 is captured. By photographing the area A9, the distances X7 and Y7 between the corner P7 of the package front substrate 5 and the reference mark 36 can be measured, and the state of the positioning pin 32 can be observed. Similarly, by photographing the area A10, the distances X8 and Y8 between the corner P8 of the package front substrate 5 and the reference mark 36 can be measured, and the state of the positioning pin 32 can be observed. Therefore, it is possible to verify whether the pre-package substrate 5 is properly positioned in the X direction, the Y direction, and the θ direction, and it is possible to confirm whether the positioning pin 32 is deformed due to abrasion or damage.
關於本實施方式的基板的定位驗證操作的資料處理,對於與實施方式3的不同之處,可以進行使距離X與容許界限值的大小關係相反的變更。Regarding the data processing of the positioning verification operation of the substrate of the present embodiment, the difference from the third embodiment may be changed to reverse the magnitude relationship between the distance X and the allowable limit value.
根據本實施方式,對包含封裝前基板5的角部的位置、基準標記以及定位銷的區域同時進行拍攝。因此,能夠驗證出在X方向、Y方向以及θ方向上是否被正常定位,並且能夠隨時確認定位銷的狀態。因此,當定位銷發生了異常時,能夠在早期發現。According to the present embodiment, the area including the position of the corners of the front substrate 5, the reference mark, and the positioning pin is captured at the same time. Therefore, it is possible to verify whether or not the positioning is normally performed in the X direction, the Y direction, and the θ direction, and it is possible to confirm the state of the positioning pin at any time. Therefore, when an abnormality occurs in the positioning pin, it can be detected early.
實施方式5Embodiment 5
參照第12圖,對實施方式5中驗證被供給到上模具23的封裝前基板5是否被正常定位的操作進行說明。這裡的說明也是對樹脂成型品的製造方法的一部分的說明。與實施方式4的區別是沿著上模具23的Y方向在上模具23的角部附近分別設置矩形形狀的基準標記,並使用該基準標記的角部來進行資料處理。關於除此之外的成型模具的結構以及操作(製造方法),由於與實施方式4相同,因此省略說明。The operation of verifying whether the pre-package substrate 5 supplied to the upper mold 23 is normally positioned in the fifth embodiment will be described with reference to FIG. 12. The description here is also a part of a method for manufacturing a resin molded article. The difference from the fourth embodiment is that rectangular reference marks are provided in the vicinity of the corners of the upper die 23 along the Y direction of the upper die 23, and the corners of the reference marks are used for data processing. The structure and operation (manufacturing method) of the other molding dies are the same as those of the fourth embodiment, and therefore description thereof will be omitted.
如第12圖的(a)所示,例如在上模具23的模具表面的角部附近,分別設置有矩形形狀的基準標記37、38。在本實施方式中,對包含封裝前基板5的角部的位置P7、基準標記37以及定位銷32的區域A9進行拍攝。同樣地,對包含封裝前基板5的角部的位置P8、基準標記38以及定位銷32的區域A10進行拍攝。As shown in FIG. 12A, for example, rectangular reference marks 37 and 38 are provided near corners of the mold surface of the upper mold 23, for example. In this embodiment, an area A9 including the position P7 of the corner portion of the front substrate 5, the reference mark 37, and the positioning pin 32 is captured. Similarly, an area A10 including the position P8 of the corner portion of the front substrate 5, the reference mark 38, and the positioning pin 32 is captured.
根據拍攝到的各個圖像資料,對封裝前基板5的角部的位置P7與基準標記37的角部之間的距離L1以及封裝前基板5的角部的位置P8與基準標記38的角部之間的距離L2分別進行計測。計測出的距離L1包含實施方式3、4中計測出的距離X7及Y7的資訊。同樣,計測出的距離L2包含實施方式3、4中計測出的距離X8及Y8的資訊。因此,藉由在兩處對封裝前基板5的角部與基準標記37、38之間的距離進行計測,從而能夠驗證出封裝前基板5在X方向、Y方向以及θ方向上是否被正常定位。另外,在與基準標記37、38的角部相關的影像處理中,可以利用角點檢測,還可以利用在角部相交的兩個端面的邊緣檢測。According to the captured image data, the distance L1 between the position P7 of the corner of the front substrate 5 and the corner of the reference mark 37 and the position P8 of the corner of the front substrate 5 and the corner of the reference mark 38 The distance L2 is measured separately. The measured distance L1 includes information on the distances X7 and Y7 measured in the third and fourth embodiments. Similarly, the measured distance L2 includes information on the distances X8 and Y8 measured in the third and fourth embodiments. Therefore, by measuring the distance between the corners of the package front substrate 5 and the reference marks 37 and 38 at two places, it is possible to verify whether the package front substrate 5 is normally positioned in the X direction, the Y direction, and the θ direction. . In addition, in the image processing related to the corners of the fiducial marks 37 and 38, corner point detection may be used, and edge detection of two end faces intersecting at the corners may also be used.
關於本實施方式的基板的定位驗證操作的資料處理,與實施方式1~4的不同之處是在本實施方式中對距離L1及L2與容許範圍進行比較。如果比較的結果是距離L1及L2這兩者均在容許範圍內,則處理器P判斷為進行了正常的基板定位,並轉移到第7圖的處理A。Regarding the data processing of the positioning verification operation of the substrate according to this embodiment, the difference from Embodiments 1 to 4 is that the distances L1 and L2 are compared with the allowable range in this embodiment. If the result of the comparison is that both the distances L1 and L2 are within the allowable range, the processor P determines that the normal substrate positioning has been performed, and shifts to the process A in FIG. 7.
如果比較的結果是距離L1及L2中的至少一個在容許範圍外,則處理器P判斷為沒有進行正常的基板定位,且處理器P執行用於結束定位操作及定位驗證操作並停止用於樹脂成型的步驟的處理。此時,處理器P指示資訊輸出部O輸出例如因沒有進行正常的定位操作而停止樹脂成型步驟等資訊。If the result of the comparison is that at least one of the distances L1 and L2 is outside the allowable range, the processor P determines that the normal substrate positioning has not been performed, and the processor P executes to end the positioning operation and the positioning verification operation and stops for resin. Processing of molding steps. At this time, the processor P instructs the information output unit O to output information such as stopping the resin molding step because the normal positioning operation is not performed.
根據本實施方式,藉由對封裝前基板5的角部P7與基準標記37的角部之間的距離L1以及封裝前基板5的角部P8與基準標記38的角部之間的距離L2這兩處的距離進行計測,從而能夠驗證出封裝前基板5在X方向、Y方向以及θ方向上是否被正常定位。因此,能夠減少根據拍攝到的圖像資料來進行影像處理的工時。據此,能夠縮減對封裝前基板5是否被正常定位進行驗證的操作。According to this embodiment, the distance L1 between the corner portion P7 of the package front substrate 5 and the corner portion of the reference mark 37 and the distance L2 between the corner portion P8 of the package front substrate 5 and the corner portion of the reference mark 38 are determined. By measuring the distance between the two locations, it is possible to verify whether the pre-package substrate 5 is normally positioned in the X direction, the Y direction, and the θ direction. Therefore, it is possible to reduce man-hours for performing image processing based on the captured image data. Accordingly, it is possible to reduce the operation of verifying whether or not the pre-package substrate 5 is normally positioned.
在本實施方式中,設置了矩形形狀的基準標記以作為基準標記。只要是藉由影像處理能夠檢測出點的基準標記,則不限於此,也可以使用具有圓形形狀、三角形形狀、多邊形形狀等的基準標記。進一步地,還可以使用點狀、加號(+)形狀、減號(-)形狀等的基準標記。只要是藉由攝影機能夠識別的標記即可。配置基準標記的位置只要是從封裝前基板5的角部相對於X方向及Y方向具有實質性的距離的位置即可。In this embodiment, a rectangular reference mark is provided as the reference mark. As long as it is a fiducial mark capable of detecting a point by image processing, it is not limited to this, and fiducial marks having a circular shape, a triangular shape, a polygonal shape, or the like may be used. Further, fiducial marks such as dots, plus (+) shape, minus (-) shape, etc. may also be used. It only needs to be a mark that can be recognized by a camera. The position at which the fiducial mark is arranged may be any position that has a substantial distance from the corner of the front package substrate 5 with respect to the X and Y directions.
在各實施方式中,將封裝前基板5供給到成型模具24的上模具23,並藉由由攝影機11進行拍攝從而驗證出被供給到上模具23的封裝前基板5是否被正常定位。不限於此,即使在將封裝前基板5供給到成型模具24的下模具12並在下模具12的模具表面上進行定位的情況下,也可以應用本發明。在這種情況下,也會取得各實施方式所示的同樣的效果。In each embodiment, the pre-package substrate 5 is supplied to the upper mold 23 of the molding die 24, and it is verified by the camera 11 that the pre-package substrate 5 supplied to the upper mold 23 is normally positioned. Not limited to this, the present invention can be applied even in a case where the pre-package substrate 5 is supplied to the lower mold 12 of the molding mold 24 and positioned on the mold surface of the lower mold 12. In this case, the same effects as those shown in the respective embodiments can be obtained.
在各實施方式中,繪示了在採用了壓縮成型方法的樹脂成型裝置1的成型模具24中驗證被供給到上模具23的封裝前基板5是否被正常定位的情況。不限於此,即使在採用了傳遞成型方法或射出成型方法的樹脂成型裝置的成型模具中,也可以應用本發明。In each of the embodiments, a case where it is verified whether or not the pre-package substrate 5 supplied to the upper mold 23 is normally positioned in the molding mold 24 of the resin molding apparatus 1 using a compression molding method. The present invention is not limited to this, and can be applied to a molding die of a resin molding apparatus using a transfer molding method or an injection molding method.
在各實施方式中,繪示出了使用封裝前基板5來作為定位對象物的例子,但並不限定於此。只要至少包括基板即可,例如將加強用的夾具安裝在基板上而成的對象物等。In each embodiment, an example in which the package front substrate 5 is used as a positioning target is illustrated, but the invention is not limited to this. It suffices to include at least a substrate, for example, an object obtained by mounting a reinforcing jig on the substrate.
在各實施方式中,繪示出了使用液狀樹脂來作為樹脂材料的情況。不限於此,可以使用粉末狀、顆粒狀、片狀、固體狀的樹脂材料等來作為樹脂材料。In each embodiment, a case where a liquid resin is used as the resin material is illustrated. The resin material is not limited to this, and powdery, granular, flake, solid resin materials, and the like can be used.
在各實施方式中,對在對半導體晶片進行樹脂成型時使用的樹脂成型裝置及樹脂成型品的製造方法進行了說明。進行樹脂成型的物件可以是IC、電晶體等半導體晶片,也可以是不使用半導體的非半導體晶片,還可以是半導體晶片和非半導體晶片混合存在的晶片組。在藉由固化樹脂對安裝在引線框、印刷電路板、陶瓷基板等基板上的一個或複數個晶片進行樹脂成型時,可以應用本發明。In each embodiment, the resin molding apparatus and the manufacturing method of a resin molded product used when resin-molding a semiconductor wafer are demonstrated. The object for resin molding may be a semiconductor wafer such as an IC or a transistor, or a non-semiconductor wafer that does not use a semiconductor, or a wafer group in which a semiconductor wafer and a non-semiconductor wafer are mixed. The present invention can be applied when resin-molding one or a plurality of wafers mounted on a substrate such as a lead frame, a printed circuit board, or a ceramic substrate with a cured resin.
如上所述,在上述實施方式的樹脂成型裝置中,設為如下結構,包括:成型模具,具有相互對置配置的第一模具和第二模具;基板供給機構,將基板供給到第一模具和第二模具中的任意一個模具的模具表面;定位機構,在模具表面上對至少包括基板的定位對象物進行定位;合模機構,對成型模具進行合模;攝影機,在成型模具被開模的狀態下,能夠配置在第一模具與第二模具之間;以及處理器,根據由攝影機拍攝到的圖像資料來進行處理,一個模具具有藉由攝影機的拍攝而能夠識別的定位用的基準標記,攝影機對藉由定位機構被定位後的定位物件物與基準標記進行拍攝,處理器根據由攝影機拍攝到的定位物件物與基準標記的圖像資料,判斷定位物件物是否被正常定位。As described above, in the resin molding apparatus of the above-mentioned embodiment, the following configuration is provided, which includes a molding mold having a first mold and a second mold arranged to face each other, and a substrate supply mechanism that supplies a substrate to the first mold and A mold surface of any one of the second molds; a positioning mechanism for positioning a positioning object including at least a substrate on the mold surface; a mold clamping mechanism for clamping the molding mold; a camera that opens the molding mold In a state, it can be disposed between the first mold and the second mold; and the processor performs processing based on the image data captured by the camera. One mold has a reference mark for positioning that can be recognized by the camera. The camera shoots the positioning object and the fiducial mark after being positioned by the positioning mechanism, and the processor determines whether the positioning object is normally positioned according to the image data of the positioning object and the fiducial mark captured by the camera.
進一步地,在上述實施方式的樹脂成型裝置中,一個模具具有在藉由定位物件物的接觸而進行的定位中所使用的定位部件,定位機構藉由使定位對象物接觸到定位部件來進行定位。Further, in the resin molding apparatus of the above-mentioned embodiment, one mold has a positioning member used for positioning by contact of a positioning object, and the positioning mechanism performs positioning by bringing the positioning object into contact with the positioning member. .
根據該結構,即使定位部件發生由磨耗或破損等引起的變形,也能夠減少由定位引起的成型缺陷的發生。According to this configuration, even if the positioning member is deformed by abrasion, damage, or the like, it is possible to reduce the occurrence of molding defects due to positioning.
進一步地,在上述實施方式的樹脂成型裝置中,處理器根據由攝影機拍攝到的定位物件物與基準標記的圖像資料,求出與定位物件物和基準標記之間的距離相關的資訊,並與預先設定的容許範圍進行比較,來判斷定位物件物是否被正常定位。其中,當判斷為定位物件物未被正常定位時,可以使定位機構至少再進行一次定位操作。Further, in the resin molding apparatus of the above embodiment, the processor obtains information related to the distance between the positioning object and the reference mark based on the image data of the positioning object and the reference mark captured by the camera, and Compare with the preset allowable range to determine whether the positioning object is normally positioned. When it is determined that the positioning object is not normally positioned, the positioning mechanism may be caused to perform at least one positioning operation.
根據該結構,能夠更可靠地減少由定位引起的成型缺陷的發生。According to this structure, it is possible to more reliably reduce the occurrence of molding defects due to positioning.
此外,在上述實施方式的樹脂成型裝置中,當處理器判斷為定位物件物未接觸到定位部件的至少一部分時,定位機構至少再進行一次定位操作。Further, in the resin molding apparatus of the above embodiment, when the processor determines that the positioning object does not contact at least a part of the positioning member, the positioning mechanism performs a positioning operation at least once more.
根據該結構,能夠提高可以完成正常的基板定位的可能性,從而能夠提高生產率。According to this configuration, it is possible to increase the possibility that normal substrate positioning can be completed, and productivity can be improved.
上述實施方式的樹脂成型品的製造方法包括:基板供給步驟,將基板供給到具有相互對置配置的第一模具和第二模具的成型模具中的任意一個模具的模具表面;定位步驟,在模具表面上對至少包括基板的定位對象物進行定位;拍攝步驟,對在定位步驟中被定位後的定位物件物與設置於一個模具的基準標記進行拍攝;判斷步驟,根據在拍攝步驟中得到的定位物件物與基準標記的圖像資料,判斷定位物件物是否被正常定位;以及樹脂成型步驟,當在判斷步驟中判斷為基板被正常定位時,對成型模具進行合模以進行樹脂成型。The method for manufacturing a resin molded article according to the above-mentioned embodiment includes a substrate supply step of supplying a substrate to a mold surface of any one of a molding mold having a first mold and a second mold arranged to face each other; a positioning step, Positioning a positioning object including at least a substrate on the surface; a photographing step, photographing the positioning object positioned in the positioning step and a fiducial mark set in a mold; a judging step, according to the positioning obtained in the photographing step Image data of the object and the fiducial mark to determine whether the positioning object is normally positioned; and in the resin molding step, when it is determined in the determination step that the substrate is normally positioned, the mold is clamped to perform resin molding.
根據該方法,能夠在驗證了被供給到成型模具的定位物件物被正常定位的狀態下進行樹脂成型,從而能夠減少由定位引起的成型缺陷的發生。According to this method, resin molding can be performed in a state where it is verified that the positioning object supplied to the molding die is normally positioned, and the occurrence of molding defects due to positioning can be reduced.
進一步地,在上述實施方式的樹脂成型品的製造方法中,定位步驟藉由使定位物件物接觸到設置於一個模具的定位部件來進行定位。Furthermore, in the manufacturing method of the resin molded article of the said embodiment, a positioning process performs positioning by making a positioning object contact the positioning member provided in one mold.
根據該方法,即使定位部件發生由磨耗或破損等引起的變形,也能夠減少由定位引起的成型缺陷的發生。According to this method, even if the positioning member is deformed by abrasion, damage, or the like, it is possible to reduce the occurrence of molding defects caused by positioning.
進一步地,在上述實施方式的樹脂成型品的製造方法中,判斷步驟求出與定位物件物和基準標記之間的距離相關的資訊,並與預先設定的容許範圍進行比較,來判斷定位物件物是否被正常定位。Further, in the method for manufacturing a resin molded article according to the above embodiment, the determination step obtains information related to the distance between the positioning object and the reference mark, and compares it with a preset allowable range to determine the positioning object. Whether it is positioned normally.
根據該方法,能夠更可靠地減少由定位引起的成型缺陷的發生。According to this method, it is possible to more reliably reduce the occurrence of molding defects due to positioning.
此外,在上述實施方式的樹脂成型品的製造方法中,當在判斷步驟中判斷為定位對象物未接觸到定位部件的至少一部分時,至少再進行一次定位步驟的定位。Moreover, in the manufacturing method of the resin molded article of the said embodiment, when it is determined in the determination step that a positioning target does not contact at least one part of a positioning member, positioning at the positioning step is performed at least once more.
根據該方法,能夠提高可以完成正常的基板定位的可能性,從而能夠提高生產率。According to this method, it is possible to increase the possibility that normal substrate positioning can be completed, and it is possible to improve productivity.
本發明並不限定於上述的各實施方式,在不脫離本發明宗旨的範圍內,可以根據需要而任意且適當地進行組合、變更或選擇採用。The present invention is not limited to the above-mentioned embodiments, and can be arbitrarily and appropriately combined, changed, or selected and adopted as needed without departing from the scope of the present invention.
1‧‧‧樹脂成型裝置
2‧‧‧基板供給收納模組
3A、3B、3C‧‧‧成型模組
4‧‧‧樹脂供給模組
5‧‧‧封裝前基板(基板、定位對象物)
6‧‧‧封裝前基板供給部
7‧‧‧封裝後基板
8‧‧‧封裝後基板收納部
9‧‧‧基板載置部
10‧‧‧基板運送機構
11‧‧‧攝影機
12‧‧‧下模具(第二模具、第一模具)
13‧‧‧合模機構
14‧‧‧模腔
15‧‧‧脫模膜供給機構
16‧‧‧分配器
17‧‧‧樹脂運送機構
18‧‧‧樹脂噴出部
19‧‧‧控制部
20‧‧‧記憶體
21‧‧‧處理器
22‧‧‧晶片
23‧‧‧上模具(第一模具、第二模具)
24‧‧‧成型模具
25‧‧‧脫模膜
26‧‧‧液狀樹脂
27‧‧‧固化樹脂
28‧‧‧成型品
29、30‧‧‧基準標記
31、32‧‧‧定位銷(定位部件)
33、34‧‧‧定位機構
35‧‧‧位置對準用的標記
36‧‧‧U形的基準標記(基準標記)
37、38‧‧‧矩形形狀的基準標記(基準標記)
S1、R1、M1、C1‧‧‧規定位置
P1、P2、P3、P4、P5、P6、P7、P8、P9、P10‧‧‧封裝前基板的端部上的位置
Y1、Y3、Y4、Y7、Y8‧‧‧計測出的距離
X2、X5、X6、X7、X8‧‧‧計測出的距離
L1、L2‧‧‧計測出的距離
A1、A2、A3、A4、A5、A6、A7、A8、A9、A10‧‧‧區域
D1、D2、D3、D4、D5、D6、D7、D8‧‧‧圖像資料
T0‧‧‧基準值
d‧‧‧容許值
(T0-d)、(T0+d)‧‧‧容許界限值
C‧‧‧攝影機
P‧‧‧處理器
M‧‧‧記憶體
O:資訊輸出部1‧‧‧ resin molding device
2‧‧‧ substrate supply storage module
3A, 3B, 3C‧‧‧forming module
4‧‧‧Resin supply module
5‧‧‧ Before the package substrate (substrate, positioning object)
6‧‧‧ Pre-package substrate supply department
7‧‧‧ Substrate after packaging
8‧‧‧ Post-package substrate storage section
9‧‧‧ Substrate mounting section
10‧‧‧ substrate transport mechanism
11‧‧‧Camera
12‧‧‧ lower mold (second mold, first mold)
13‧‧‧Clamping mechanism
14‧‧‧ cavity
15‧‧‧Release film supply mechanism
16‧‧‧Distributor
17‧‧‧Resin Delivery Agency
18‧‧‧Resin ejection section
19‧‧‧ Control Department
20‧‧‧Memory
21‧‧‧Processor
22‧‧‧Chip
23‧‧‧ Upper mold (first mold, second mold)
24‧‧‧Forming mold
25‧‧‧Release film
26‧‧‧Liquid resin
27‧‧‧cured resin
28‧‧‧ molded products
29, 30‧‧‧ fiducial marks
31, 32‧‧‧ dowels (locating parts)
33, 34‧‧‧ Positioning agencies
35‧‧‧ Positioning mark
36‧‧‧U-shaped reference mark (reference mark)
37, 38‧‧‧ Rectangular fiducial marks (fiducial marks)
S1, R1, M1, C1‧‧‧ prescribed positions
P1, P2, P3, P4, P5, P6, P7, P8, P9, P10 ‧‧‧ position on the end of the front substrate
Y1, Y3, Y4, Y7, Y8‧‧‧Measured distances
Distance measured by X2, X5, X6, X7, X8‧‧‧
L1, L2‧‧‧Measured distance
A1, A2, A3, A4, A5, A6, A7, A8, A9, A10
D1, D2, D3, D4, D5, D6, D7, D8‧‧‧ image data
T0‧‧‧ benchmark
d‧‧‧Allowable value (T0-d), (T0 + d) ‧‧‧Allowable limit value
C‧‧‧Camera
P‧‧‧Processor
M‧‧‧Memory
O: Information output department
第1圖係繪示在實施方式1的樹脂成型裝置中裝置的概要的俯視圖。FIG. 1 is a plan view showing an outline of an apparatus in the resin molding apparatus according to the first embodiment.
第2圖的(a)~(c)係繪示在實施方式1中對安裝在基板上的晶片進行樹脂封裝的過程的概略剖面圖。(A)-(c) of FIG. 2 is a schematic sectional view which shows the process of resin-sealing the wafer mounted on the board | substrate in Embodiment 1.
第3圖係繪示實施方式1中在上模具的模具表面上對封裝前基板進行定位後的狀態的概略圖,(a)是底視圖,(b)是A-A線剖面圖。FIG. 3 is a schematic view showing a state where the substrate before packaging is positioned on the mold surface of the upper mold in Embodiment 1, (a) is a bottom view, and (b) is a cross-sectional view taken along the line A-A.
第4圖係繪示在實施方式1中對在上模具的模具表面上被定位後的封裝前基板進行拍攝的狀態的概略圖,(a)是底視圖,(b)是B-B線剖面圖。FIG. 4 is a schematic view showing a state in which a pre-package substrate that has been positioned on a mold surface of an upper mold is imaged in Embodiment 1, (a) is a bottom view, and (b) is a cross-sectional view taken along the line B-B.
第5圖的(a)~(c)係繪示實施方式1中在上模具的模具表面上對封裝前基板進行了定位時的三種狀態的概略圖。(A)-(c) of FIG. 5 are schematic diagrams which show three states when the substrate before packaging is positioned on the mold surface of the upper mold in the first embodiment.
第6圖是用於在實施方式1中對基板的定位進行驗證的功能方塊圖。FIG. 6 is a functional block diagram for verifying the positioning of the substrate in the first embodiment.
第7圖是在實施方式1中對被供給到上模具的模具表面的封裝前基板是否被正常定位進行驗證的流程圖。FIG. 7 is a flowchart for verifying whether or not the pre-package substrate that is supplied to the mold surface of the upper mold is properly positioned in the first embodiment.
第8圖係繪示在實施方式2中對在上模具的模具表面上被定位後的封裝前基板進行拍攝的狀態的概略圖,(a)是底視圖,(b)是C-C線剖面圖。FIG. 8 is a schematic view showing a state in which a pre-package substrate that has been positioned on a mold surface of an upper mold is imaged in Embodiment 2. (a) is a bottom view, and (b) is a cross-sectional view taken along the line C-C.
第9圖的(a)~(d)係繪示實施方式2中在上模具的模具表面上對封裝前基板進行了定位時的四種狀態的概略圖。(A)-(d) of FIG. 9 is a schematic diagram which shows four states when the pre-package substrate is positioned on the mold surface of the upper mold in Embodiment 2.
第10圖係繪示在實施方式3中對在上模具的模具表面上被定位後的封裝前基板進行拍攝的狀態的概略圖,(a)是底視圖,(b)是D-D線剖面圖。Fig. 10 is a schematic view showing a state in which a pre-package substrate that has been positioned on a mold surface of an upper mold is imaged in Embodiment 3, (a) is a bottom view, and (b) is a cross-sectional view taken along the line D-D.
第11圖係繪示在實施方式4中對在上模具的模具表面上被定位後的封裝前基板進行拍攝的狀態的概略圖,(a)是底視圖,(b)是E-E線剖面圖。FIG. 11 is a schematic view showing a state in which a pre-package substrate that has been positioned on a mold surface of an upper mold is imaged in Embodiment 4, (a) is a bottom view, and (b) is a cross-sectional view taken along line E-E.
第12圖係繪示在實施方式5中對在上模具的模具表面上被定位後的封裝前基板進行拍攝的狀態的概略圖,(a)是底視圖,(b)是F-F線剖面圖。FIG. 12 is a schematic view showing a state in which a pre-package substrate that has been positioned on a mold surface of an upper mold is imaged in Embodiment 5, (a) is a bottom view, and (b) is a cross-sectional view taken along the line F-F.
5‧‧‧封裝前基板(基板、定位對象物) 5‧‧‧Pre-package substrate (substrate, positioning object)
10‧‧‧基板運送機構 10‧‧‧ substrate transport mechanism
11‧‧‧攝影機 11‧‧‧Camera
12‧‧‧下模具(第二模具、第一模具) 12‧‧‧ lower mold (second mold, first mold)
14‧‧‧模腔 14‧‧‧ cavity
22‧‧‧晶片 22‧‧‧Chip
23‧‧‧上模具(第一模具、第二模具) 23‧‧‧ Upper mold (first mold, second mold)
24‧‧‧成型模具 24‧‧‧Forming mold
29、30‧‧‧基準標記 29, 30‧‧‧ fiducial marks
31、32‧‧‧定位銷(定位部件) 31, 32‧‧‧ positioning pins (positioning parts)
35‧‧‧位置對準用的標記 35‧‧‧ Positioning mark
A1、A2‧‧‧區域 A1, A2‧‧‧ area
P1、P2‧‧‧封裝前基板的端部上的位置 P1, P2‧‧‧Position on the end of the package substrate
X2‧‧‧計測出的距離 X2‧‧‧Measured distance
Y1‧‧‧計測出的距離 Y1‧‧‧Measured distance
Claims (8)
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| JP2016129604A JP6549531B2 (en) | 2016-06-30 | 2016-06-30 | Resin molding apparatus and method of manufacturing resin molded article |
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| JP7116330B2 (en) | 2020-01-31 | 2022-08-10 | 日亜化学工業株式会社 | Method for manufacturing light emitting device |
| JP7477404B2 (en) * | 2020-09-03 | 2024-05-01 | ルネサスエレクトロニクス株式会社 | Semiconductor device manufacturing method |
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| JPH05109797A (en) * | 1991-10-14 | 1993-04-30 | Mitsubishi Electric Corp | Semiconductor resin sealing device |
| JP3214788B2 (en) * | 1994-11-21 | 2001-10-02 | アピックヤマダ株式会社 | Resin molding device and resin molding method |
| JPH1197510A (en) * | 1997-09-18 | 1999-04-09 | Toshiba Corp | Alignment method |
| JP2003203950A (en) | 2001-12-28 | 2003-07-18 | Toshiba Corp | Semiconductor device manufacturing equipment |
| JP3865397B2 (en) | 2004-05-25 | 2007-01-10 | 住友ベークライト株式会社 | Method and apparatus for aligning flexible printed wiring board |
| JP5128095B2 (en) * | 2006-08-25 | 2013-01-23 | Towa株式会社 | Resin sealing molding equipment for electronic parts |
| JP4848255B2 (en) * | 2006-11-29 | 2011-12-28 | アピックヤマダ株式会社 | Resin molding method and resin molding apparatus |
| JP2010080630A (en) * | 2008-09-25 | 2010-04-08 | Canon Inc | Stamping device and method of manufacturing article |
| WO2010082298A1 (en) * | 2009-01-13 | 2010-07-22 | パイオニア株式会社 | Transfer device and transfer method |
| KR20120000846A (en) * | 2010-06-28 | 2012-01-04 | 삼성전자주식회사 | Wafer alignment method and process monitoring method |
| JP5024494B1 (en) * | 2012-03-05 | 2012-09-12 | 富士ゼロックス株式会社 | Method for manufacturing mounting device and substrate device |
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| CN114347341A (en) * | 2021-12-31 | 2022-04-15 | 佛山市国星光电股份有限公司 | Discrete device plastic packaging device and method |
| CN114347341B (en) * | 2021-12-31 | 2024-04-09 | 佛山市国星光电股份有限公司 | Plastic packaging device and plastic packaging method for discrete devices |
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| CN107553799B (en) | 2019-10-22 |
| KR102050134B1 (en) | 2019-11-28 |
| CN107553799A (en) | 2018-01-09 |
| TWI641091B (en) | 2018-11-11 |
| JP6549531B2 (en) | 2019-07-24 |
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