TW201628812A - Workpiece adsorption plate, workpiece cutting device, workpiece cutting method, and manufacturing method of workpiece adsorption plate - Google Patents
Workpiece adsorption plate, workpiece cutting device, workpiece cutting method, and manufacturing method of workpiece adsorption plate Download PDFInfo
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- TW201628812A TW201628812A TW104133452A TW104133452A TW201628812A TW 201628812 A TW201628812 A TW 201628812A TW 104133452 A TW104133452 A TW 104133452A TW 104133452 A TW104133452 A TW 104133452A TW 201628812 A TW201628812 A TW 201628812A
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23Q—DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
- B23Q3/00—Devices holding, supporting, or positioning work or tools, of a kind normally removable from the machine
- B23Q3/02—Devices holding, supporting, or positioning work or tools, of a kind normally removable from the machine for mounting on a work-table, tool-slide, or analogous part
- B23Q3/06—Work-clamping means
- B23Q3/08—Work-clamping means other than mechanically-actuated
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23Q—DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
- B23Q3/00—Devices holding, supporting, or positioning work or tools, of a kind normally removable from the machine
- B23Q3/02—Devices holding, supporting, or positioning work or tools, of a kind normally removable from the machine for mounting on a work-table, tool-slide, or analogous part
- B23Q3/06—Work-clamping means
- B23Q3/08—Work-clamping means other than mechanically-actuated
- B23Q3/088—Work-clamping means other than mechanically-actuated using vacuum means
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/0005—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by breaking, e.g. dicing
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/0005—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by breaking, e.g. dicing
- B28D5/0052—Means for supporting or holding work during breaking
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- H10P52/00—
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- H10P54/00—
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- Mechanical Engineering (AREA)
- Dicing (AREA)
- Forests & Forestry (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Life Sciences & Earth Sciences (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Processing Of Stones Or Stones Resemblance Materials (AREA)
- Jigs For Machine Tools (AREA)
- Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)
- Perforating, Stamping-Out Or Severing By Means Other Than Cutting (AREA)
- Treatment Of Fiber Materials (AREA)
Abstract
Description
本發明係關於當將平板狀工件切斷並單片化時吸附支撐平板狀工件的工件吸附板、使用工件吸附板的平板狀工件的切斷裝置和切斷方法、以及工件吸附板的製造方法的改進。 The present invention relates to a workpiece suction plate that adsorbs a flat workpiece when the flat workpiece is cut and singulated, a cutting device and a cutting method of the flat workpiece using the workpiece suction plate, and a method of manufacturing the workpiece adsorption plate improvement of.
一直以來,當從作為平板狀工件之一的成形後基板中切出多個封裝狀電子零件(相當於多個產品,以下,簡稱為封裝)時,係利用刀片切斷成形後基板。在這種平板狀工件的切斷處理中,為了將切斷精度維持較高,在切斷時有必要牢固地固定工件。因此,一直以來,在切斷處理時係將平板狀工件吸附並固定到工件吸附板上。 Conventionally, when a plurality of package-like electronic components (corresponding to a plurality of products, hereinafter referred to as packages) are cut out from a molded substrate which is one of the flat workpieces, the formed substrate is cut by a blade. In the cutting process of such a flat workpiece, in order to maintain the cutting accuracy high, it is necessary to firmly fix the workpiece at the time of cutting. Therefore, the flat workpiece has been adsorbed and fixed to the workpiece adsorption plate at the time of the cutting process.
專利文獻1:日本特開2004-330417號公報 Patent Document 1: Japanese Patent Laid-Open Publication No. 2004-330417
專利文獻2:日本特開平09-251948號公報 Patent Document 2: Japanese Laid-Open Patent Publication No. 09-251948
專利文獻3:日本特開平05-84682號公報 Patent Document 3: Japanese Laid-Open Patent Publication No. 05-84682
專利文獻4:日本特開2013-169638號公報 Patent Document 4: Japanese Laid-Open Patent Publication No. 2013-169638
隨著近來的電子裝置的小型化而對封裝的小型化要求也在提高,希望進一步提高平板狀工件的切斷精度以實現封裝的小型化。 With the recent miniaturization of electronic devices, the demand for miniaturization of packages has also increased, and it is desired to further improve the cutting precision of flat-shaped workpieces to achieve miniaturization of packages.
在以往的工件切斷方法中,藉由使平板狀工件吸附到工件吸 附板上來進行切斷時的工件的固定以謀求切斷精度的提高。然而,當在平板狀工件上產生比較大的彎曲時,無法在充分矯正該彎曲的狀態,即將具有彎曲狀態的工件矯正成充分平坦而緊貼在工件吸附板上的狀態下進行固定,這一現象在謀求切斷精度的提高及作業效率的提高方面成為問題。 In the conventional workpiece cutting method, by sucking a flat workpiece to the workpiece suction The attachment of the workpiece at the time of cutting is performed on the attachment plate to improve the cutting accuracy. However, when a relatively large bending is generated on the flat workpiece, the state in which the bending is sufficiently corrected, that is, the workpiece having the curved state is corrected to be sufficiently flat and adhered to the workpiece suction plate, and this is fixed. The phenomenon is a problem in that improvement in cutting accuracy and improvement in work efficiency are required.
此外,還可以考慮藉由加大將平板狀工件吸引到工件吸附板上的力來增強矯正平板狀工件的力。在這種情況下,雖然能夠將彎曲較大的平板狀工件矯正成平板狀,但對於平板狀工件而言欲返回到原來的彎曲形狀的恢復力變大。因此,在切斷途中,若因施加到平板狀工件的各種力而在平板狀工件與工件吸附板之間產生某種程度大小的間隙,則對平板狀工件的吸附不充分,在最壞的情況下導致吸附被解除。由此,平板狀工件返回到原來的彎曲形狀,無法進行之後的切斷處理。 Further, it is also conceivable to enhance the force for correcting the flat workpiece by increasing the force that attracts the flat workpiece to the workpiece suction plate. In this case, although the flat workpiece having a large curvature can be corrected into a flat shape, the restoring force to return to the original curved shape of the flat workpiece becomes large. Therefore, when a certain amount of gap is formed between the flat workpiece and the workpiece suction plate due to various forces applied to the flat workpiece during the cutting, the suction of the flat workpiece is insufficient, and the worst is In this case, the adsorption is released. Thereby, the flat workpiece returns to the original curved shape, and the subsequent cutting process cannot be performed.
因此,本發明的目的在於,提供一種在切斷處理時能夠牢固地固定保持平面狀工件而與其形狀的偏差無關的工件吸附板、工件切斷裝置、工件切斷方法及工件吸附板的製造方法。 Therefore, an object of the present invention is to provide a workpiece suction plate, a workpiece cutting device, a workpiece cutting method, and a workpiece suction plate manufacturing method capable of firmly fixing and holding a planar workpiece during cutting processing regardless of variations in shape thereof .
對上述的以往的問題進一步詳細考察。在以往的切斷方法中,藉由吸附來矯正平板狀工件的彎曲等變形以使其緊貼並吸附固定在工件吸附板上。工件的吸附係藉由經由設置在工件吸附板上的吸附孔對平板狀工件進行空氣吸引來實施。然而,若平板狀工件的彎曲較大,則經由變形的平板狀工件與工件吸附板之間形成的間隙從外部漏入到吸附孔的空氣量增大,其結果,由吸引空氣產生的吸引力下降而無法充分矯正平板狀工件的彎曲以使其緊貼在工件吸附板上。 The above-mentioned conventional problems are further examined in detail. In the conventional cutting method, deformation such as bending of a flat workpiece is corrected by suction so as to be in close contact with and adsorbed and fixed to the workpiece suction plate. The adsorption of the workpiece is carried out by air suction of the flat workpiece through the adsorption holes provided on the workpiece suction plate. However, if the bending of the flat workpiece is large, the amount of air leaking from the outside into the adsorption hole through the gap formed between the deformed flat workpiece and the workpiece suction plate is increased, and as a result, the attraction force by the suction air is generated. The curvature of the flat workpiece cannot be sufficiently corrected to fall against the workpiece suction plate.
因此,在本發明中,在將平板狀工件切斷來進行單片化時吸附支撐所述平板狀工件的工件吸附板中,具備吸附所述平板狀工件的吸附面部,將所述吸附面部劃分為面方向內側的內域和在面方向外側包圍所述內域的外域,並且使所述內域的硬度低於所述外域的硬度。 Therefore, in the present invention, the workpiece suction plate that adsorbs and supports the flat workpiece when the flat workpiece is cut and singulated is provided with a suction surface that adsorbs the flat workpiece, and the adsorption surface is divided. The inner domain on the inner side in the plane direction and the outer domain on the outer side in the plane direction, and the hardness of the inner domain is made lower than the hardness of the outer domain.
另外,在所述工件切斷裝置中,具備:上述的本發明的工件吸附板;和切斷所述吸附板上吸附的所述平板狀工件來進行單片化的切斷手段。 Further, the workpiece cutting device includes: the workpiece suction plate of the present invention described above; and a cutting means for cutting the flat workpiece adsorbed on the adsorption plate to form a single piece.
另外,在工件切斷方法中,包括:準備步驟,準備工件吸附板,所述工件吸附板具備具有內域和在面方向外側包圍所述內域的外域的吸附面部,且所述內域的硬度低於所述外域的硬度;保持步驟,使所述平板狀工件吸附並保持在所述工件吸附板的所述吸附面部上;以及切斷步驟,切斷所述工件吸附板上吸附保持的所述平板狀工件來進行單片化。 Further, in the workpiece cutting method, the method includes a preparation step of preparing a workpiece adsorption plate having an adsorption region having an inner region and an outer region surrounding the inner region in a lateral direction, and the inner region a hardness lower than a hardness of the outer region; a holding step of adsorbing and holding the flat workpiece on the adsorption surface of the workpiece adsorption plate; and a cutting step of cutting off the adsorption and holding of the workpiece adsorption plate The flat workpiece is singulated.
另外,在製造本發明的工件吸附板的方法中,所述工件吸附板具備:吸附面部,當切斷平板狀工件來進行單片化時吸附支撐所述平板狀工件;和貼著在所述吸附面部上的底板,且使所述吸附面部的面方向內側的內域的硬度低於在面方向外側包圍所述內域的所述吸附面部的外域的硬度,所述工件吸附板的製造方法包括:準備步驟,準備外模和內模,所述外模具有與所述吸附面部相應的形 狀的模內表面,所述內模由具有與所述內域的外周形狀相應的外周形狀的細厚框體構成;樹脂填充步驟,在將所述內模沿所述外模的內域形成區域的周緣嵌入配置在所述外模中的狀態下,向位於外模內周與內模外周之間的所述外模的外域形成區域,以與所述吸附面部的高度尺寸相等的高度尺寸填充硬化後成為所述外域的第一樹脂材料,並且向所述外模的所述內域形成區域,以與所述吸附面部的高度尺寸相等的高度尺寸填充硬化後的硬度低於所述第一樹脂材料且硬化後成為所述內域的第二樹脂材料;內模拔去步驟,在所述第一樹脂材料及第二樹脂材料硬化到不會相互混合的程度時,從所述外模拔出所述內模以使所述第一樹脂材料和所述第二樹脂材料緊貼;以及底板黏接步驟,在拔出所述內模後的所述外模內藉由使所述底板與所述第一樹脂材料及所述第二樹脂材料抵接而進行黏接。 Further, in the method of manufacturing the workpiece suction plate of the present invention, the workpiece suction plate includes: an adsorption surface portion that adsorbs and supports the flat plate-shaped workpiece when the flat-shaped workpiece is cut to be singulated; and is attached to the The bottom plate on the surface is adsorbed, and the hardness of the inner region in the surface direction of the adsorption surface portion is lower than the hardness of the outer region of the adsorption surface portion surrounding the inner region in the outer surface in the surface direction, and the method for manufacturing the workpiece adsorption plate The method includes: preparing a step of preparing an outer mold and an inner mold, the outer mold having a shape corresponding to the adsorption surface a mold inner surface, the inner mold being composed of a thin and thick frame having a peripheral shape corresponding to a peripheral shape of the inner region; and a resin filling step of forming the inner mold along an inner domain of the outer mold a state in which the periphery of the region is embedded in the outer mold, and a region is formed toward an outer region of the outer mold between the inner circumference of the outer mold and the outer circumference of the inner mold to have a height dimension equal to the height dimension of the suction surface Filling the first resin material that becomes the outer domain after hardening, and forming a region toward the inner region of the outer mold, and having a hardness equal to a height dimension equal to a height dimension of the adsorption surface is harder than the first portion a resin material and hardened to become a second resin material of the inner region; an inner mold removal step, when the first resin material and the second resin material are hardened to such an extent that they do not mix with each other, from the outer mold Pulling out the inner mold to make the first resin material and the second resin material in close contact; and a bottom plate bonding step, in the outer mold after the inner mold is pulled out, by using the bottom plate And the first resin material and the Two abutting the resin material for bonding.
在本發明中,在固定平板狀工件時,不矯正工件的變形(彎曲),而是使工件吸附板的表面形狀追隨變形的平板狀工件的形狀而變形,由此提高工件吸附板與平板狀工件之間的緊貼性。 In the present invention, when the flat workpiece is fixed, the deformation (bending) of the workpiece is not corrected, but the surface shape of the workpiece suction plate is deformed following the shape of the deformed flat workpiece, thereby improving the workpiece suction plate and the flat shape. The closeness between the workpieces.
此外,若藉由降低工件吸附板整體的硬度(使其變軟)而使其為能夠充分變形的狀態,則工件吸附板的機械強度下降,無法牢固地固定平板狀工件,因此在單片化處理後的工件的晶片(封裝等)中,切斷偏移(尤其平板狀工件的外周部)、卷邊和缺陷毛刺等不良品的產生率會提高。 In addition, when the hardness of the entire suction plate of the workpiece is lowered (softened) so as to be sufficiently deformed, the mechanical strength of the workpiece suction plate is lowered, and the flat workpiece cannot be firmly fixed, so that the sheet is singulated. In the wafer (package or the like) of the processed workpiece, the rate of occurrence of defective products such as cutting offset (especially the outer peripheral portion of the flat workpiece), curling, and defective burrs is improved.
因此,在本發明中,藉由將工件吸附板的吸附面部劃分為面方向內側的內域和在面方向外側包圍內域的外域,並且使內域的硬度低於 外域的硬度,從而在外域中抑制變形以謀求工件吸附板的強度維持,同時內域能夠追隨平板狀工件的形狀而變形。由此,可藉由外域牢固地保持平板狀工件的同時使內域緊貼在平板狀工件上。 Therefore, in the present invention, the adsorption surface portion of the workpiece suction plate is divided into an inner region on the inner side in the plane direction and an outer region on the outer side in the plane direction, and the hardness of the inner region is lower than The hardness of the outer region suppresses deformation in the outer region to maintain the strength of the workpiece suction plate, and the inner region can be deformed following the shape of the flat workpiece. Thereby, the inner region can be closely attached to the flat workpiece while the flat workpiece is firmly held by the outer region.
此外,在本發明的另一發明中,使所述外域的硬度低於所述內域的硬度。 Further, in another invention of the present invention, the hardness of the outer region is made lower than the hardness of the inner region.
根據本發明,能不受工件的形狀變化影響,以緊貼的狀態牢固地保持平板狀工件,因此發揮解決前述的基板切斷方面的諸多問題而能高效地切斷平板狀工件的優異的效果。 According to the present invention, the flat-shaped workpiece can be firmly held in an intimate state without being affected by the shape change of the workpiece. Therefore, the above-described problem of the substrate cutting can be solved, and the excellent effect of cutting the flat workpiece can be efficiently performed. .
另外,根據本發明,藉由高效地切斷平板狀工件,發揮能夠提供可提高產品的生產率的基板切斷方法的優異的效果。 Moreover, according to the present invention, it is possible to provide an excellent effect of the substrate cutting method capable of improving the productivity of the product by efficiently cutting the flat workpiece.
1‧‧‧成形後基板 1‧‧‧Formed substrate
1a‧‧‧基板面 1a‧‧‧Substrate surface
1b‧‧‧樹脂面 1b‧‧‧Resin surface
1c‧‧‧塊域 1c‧‧‧block domain
1c’‧‧‧產品域 1c’‧‧‧Product Area
1d‧‧‧端材域 1d‧‧‧End material domain
1e‧‧‧對準標記 1e‧‧‧ alignment mark
1f‧‧‧成形後基板的外周緣(端材域的外周緣) 1f‧‧‧ outer periphery of the formed substrate (outer periphery of the end material domain)
1g‧‧‧端材域的內周緣(塊域的外周緣) The inner circumference of the 1g‧‧‧ end material domain (outer periphery of the block domain)
2‧‧‧基板 2‧‧‧Substrate
2a‧‧‧基板面 2a‧‧‧Substrate surface
2b‧‧‧模面 2b‧‧‧Mold face
3‧‧‧樹脂成形體 3‧‧‧Resin molded body
4a‧‧‧虛擬切斷線(長邊方向) 4a‧‧‧Virtual cut line (long side direction)
4b‧‧‧虛擬切斷線(短邊方向) 4b‧‧‧Virtual cut line (short side direction)
5‧‧‧封裝狀電子零件(封裝) 5‧‧‧Packaged electronic parts (package)
5a‧‧‧基板面 5a‧‧‧Substrate surface
5b‧‧‧模面 5b‧‧‧Mold face
6‧‧‧基板部 6‧‧‧Parts Department
7‧‧‧樹脂部 7‧‧‧Resin Department
9‧‧‧工件切斷裝置 9‧‧‧Workpiece cutting device
9a‧‧‧裝置前表面 9a‧‧‧ front surface of the device
9b‧‧‧裝置後表面 9b‧‧‧The rear surface of the device
10‧‧‧連結具 10‧‧‧Links
11‧‧‧基板排列機構部 11‧‧‧Substrate Arrangement Department
12‧‧‧基板切斷機構部 12‧‧‧Substrate cutting mechanism
13‧‧‧基板供給台 13‧‧‧Substrate supply station
14‧‧‧基板旋轉排列手段 14‧‧‧Substrate rotation arrangement
15a‧‧‧第一基板載置手段 15a‧‧‧First substrate mounting means
15b‧‧‧第二基板載置手段 15b‧‧‧Second substrate mounting means
16a‧‧‧第一往復移動手段 16a‧‧‧First reciprocating means
16b‧‧‧第二往復移動手段 16b‧‧‧Second reciprocating means
17a‧‧‧第一切斷台 17a‧‧‧The first cutting table
17b‧‧‧第二切斷台 17b‧‧‧Second cut-off
18‧‧‧旋轉機構 18‧‧‧Rotating mechanism
19‧‧‧台安裝台 19‧‧‧ installation table
20‧‧‧載置面 20‧‧‧Loading surface
21‧‧‧工件吸附板 21‧‧‧Workpiece adsorption plate
21’‧‧‧工件吸附板 21'‧‧‧Workpiece adsorption plate
21a‧‧‧貫通孔 21a‧‧‧through holes
22‧‧‧導軌構件 22‧‧‧rail members
23‧‧‧滑動構件 23‧‧‧Sliding members
24‧‧‧基板載置位置 24‧‧‧Substrate placement
25‧‧‧基板切斷位置 25‧‧‧Sheet cutting position
26a‧‧‧第一切斷台17a的移動區域 26a‧‧‧The moving area of the first cutting table 17a
26b‧‧‧第二切斷台17b的移動區域 26b‧‧‧Moving area of the second cutting table 17b
27a‧‧‧對準機構 27a‧‧‧Alignment mechanism
27b‧‧‧對準機構 27b‧‧‧Alignment mechanism
28‧‧‧第一切斷手段 28‧‧‧First cut-off means
29‧‧‧第二切斷手段 29‧‧‧Second cutting means
30‧‧‧清洗部 30‧‧‧Cleaning Department
31‧‧‧底板 31‧‧‧floor
31a‧‧‧基部 31a‧‧‧ base
31b‧‧‧載置部 31b‧‧‧Loading Department
32‧‧‧吸附面部 32‧‧‧Sucking the face
32’‧‧‧吸附面部 32’‧‧·Sucking face
32a‧‧‧內域 32a‧‧‧ 内域
32b‧‧‧外域 32b‧‧‧Outland
32c‧‧‧下層域 32c‧‧‧lower domain
32d‧‧‧上層域 32d‧‧‧Upper domain
33a‧‧‧外域的外周緣 33a‧‧‧The outer periphery of the outer domain
33b‧‧‧外域的內周緣(內域的外周緣) 33b‧‧‧The inner periphery of the outer domain (outer periphery of the inner domain)
34‧‧‧吸引機構 34‧‧‧Attracting institutions
34a‧‧‧吸引孔部 34a‧‧‧Attraction
34b‧‧‧吸引裝置 34b‧‧‧Attraction device
41‧‧‧基板裝填部 41‧‧‧Substrate Loading Department
42‧‧‧推出構件 42‧‧‧Exporting components
43‧‧‧封裝供給部 43‧‧‧Package Supply Department
44‧‧‧封裝檢查部 44‧‧‧Package Inspection Department
45‧‧‧檢查用照相機 45‧‧‧Check camera
46‧‧‧封裝篩選手段 46‧‧‧Package screening
47‧‧‧合格品托盤 47‧‧‧Quality goods tray
48‧‧‧不良品托盤 48‧‧‧Dishware tray
50‧‧‧外模 50‧‧‧External model
50’‧‧‧金屬模 50’‧‧‧metal mold
50a‧‧‧外域形成區域 50a‧‧‧Outland formation area
50b‧‧‧內域形成區域 50b‧‧‧Inner domain formation area
51‧‧‧內模 51‧‧‧Inner model
52‧‧‧腔室 52‧‧‧ chamber
60A‧‧‧第一樹脂材料 60A‧‧‧First resin material
60B‧‧‧第二樹脂材料 60B‧‧‧Second resin material
60C‧‧‧第三樹脂材料 60C‧‧‧ Third resin material
60D‧‧‧第四樹脂材料 60D‧‧‧fourth resin material
61‧‧‧真空乾燥器 61‧‧‧vacuum dryer
62‧‧‧氣泡 62‧‧‧ bubbles
63‧‧‧烘箱 63‧‧‧ oven
64‧‧‧分界 64‧‧ ‧ demarcation
A‧‧‧基板裝填單元 A‧‧‧Substrate loading unit
B‧‧‧切斷單元 B‧‧‧cutting unit
C‧‧‧封裝檢查單元 C‧‧‧Package inspection unit
D‧‧‧封裝收納單元 D‧‧‧Package storage unit
E‧‧‧控制部 E‧‧‧Control Department
H‧‧‧腔室的深度尺寸 H‧‧‧depth dimensions of the chamber
r‧‧‧載置部的高度尺寸 R‧‧‧ Height dimension of the mounting section
r’‧‧‧第一、第二樹脂材料的填充高度尺寸 R’‧‧‧ Filling height dimensions of the first and second resin materials
s‧‧‧內模的高度尺寸 S‧‧‧ height dimension of the inner mold
t‧‧‧吸附面部的高度尺寸 t‧‧‧Adsorption height of the face
t’‧‧‧第一、第二樹脂材料的填充高度尺寸 T'‧‧‧ Filling height dimensions of the first and second resin materials
u‧‧‧上層域的高度尺寸 U‧‧‧ Height dimension of the upper domain
u’‧‧‧第三樹脂材料的填充高度尺寸 U’‧‧‧ fill height dimension of third resin material
v‧‧‧下層域的高度尺寸 V‧‧‧ Height dimension of the lower domain
v’‧‧‧第四樹脂材料的填充高度尺寸 V’‧‧‧ fill height dimension of the fourth resin material
w‧‧‧外域的框 w‧‧‧Outland frame
圖1是顯示本發明的實施形態的工件切斷裝置的大致構成的俯視圖。 Fig. 1 is a plan view showing a schematic configuration of a workpiece cutting device according to an embodiment of the present invention.
圖2是顯示本發明的實施形態的切斷單元的大致構成的俯視圖。 Fig. 2 is a plan view showing a schematic configuration of a cutting unit according to an embodiment of the present invention.
圖3是顯示本發明的實施形態的切斷單元的主要部分的立體圖。 Fig. 3 is a perspective view showing a main part of a cutting unit according to an embodiment of the present invention.
圖4是顯示本發明的實施形態的切斷單元的主要部分的剖視圖。 Fig. 4 is a cross-sectional view showing a main part of a cutting unit according to an embodiment of the present invention.
圖5是顯示切斷途中的成形後基板的第一狀態的俯視圖。 Fig. 5 is a plan view showing a first state of the formed substrate in the middle of cutting.
圖6是顯示切斷途中的成形後基板的第二狀態的俯視圖。 Fig. 6 is a plan view showing a second state of the formed substrate in the middle of cutting.
圖7是顯示切斷途中的成形後基板(產品域)的第三狀態的俯視圖。 Fig. 7 is a plan view showing a third state of the formed substrate (product region) in the middle of cutting.
圖8是顯示切斷途中的成形後基板(產品域)的第四狀態的俯視圖。 Fig. 8 is a plan view showing a fourth state of the formed substrate (product region) in the middle of cutting.
圖9是顯示使用本發明的工件切斷裝置的成形後基板的切斷方法的各 步驟的流程圖。 Fig. 9 is a view showing a method of cutting a substrate after molding using the workpiece cutting device of the present invention; Flow chart of the steps.
圖10(a)是顯示利用本發明的實施形態的工件切斷裝置進行切斷處理的成形後基板的大致構成的立體圖,(b)是顯示從成形後基板切出的封裝狀電子零件(封裝)的大致構成的立體圖。 Fig. 10 (a) is a perspective view showing a schematic configuration of a substrate after cutting by a workpiece cutting device according to an embodiment of the present invention, and (b) is a package-like electronic component (package) which is cut out from a substrate after molding. A perspective view of the general structure of ).
圖11是進一步顯示成形後基板的構成的俯視圖。 Fig. 11 is a plan view further showing the configuration of the substrate after molding.
圖12是顯示本發明的實施形態的工件吸附板的構成的剖視圖。 Fig. 12 is a cross-sectional view showing the configuration of a workpiece suction plate according to an embodiment of the present invention.
圖13是顯示實施形態的工件吸附板的構成的立體圖。 Fig. 13 is a perspective view showing a configuration of a workpiece suction plate of the embodiment.
圖14是分別顯示成形後基板的彎曲狀態的側視圖。 Fig. 14 is a side view showing the bent state of the substrate after molding, respectively.
圖15是顯示使用實施形態的工件吸附板的成形後基板的保持狀態的剖視圖。 Fig. 15 is a cross-sectional view showing a state in which the substrate is held after molding using the workpiece suction plate of the embodiment.
圖16是分別顯示製造實施形態的工件吸附板時所使用的外模和內模的構成的局部剖面立體圖。 Fig. 16 is a partial cross-sectional perspective view showing the configuration of an outer mold and an inner mold which are used when manufacturing the workpiece suction plate of the embodiment.
圖17是顯示製造實施形態的工件吸附板的方法的各個前期步驟的剖視圖。 Fig. 17 is a cross-sectional view showing each preliminary step of the method of manufacturing the workpiece suction plate of the embodiment.
圖18是顯示製造實施形態的工件吸附板的方法的各個後期步驟的剖視圖。 Fig. 18 is a cross-sectional view showing each of the later steps of the method of manufacturing the workpiece suction plate of the embodiment.
圖19是顯示本發明的變形例的工件吸附板的構成的剖視圖。 19 is a cross-sectional view showing the configuration of a workpiece suction plate according to a modification of the present invention.
圖20是分別顯示製造變形例的工件吸附板的方法的主要部分步驟的剖視圖。 Fig. 20 is a cross-sectional view showing main steps of a method of manufacturing a workpiece suction plate of a modification, respectively.
圖21是供說明成形後基板中的產品域、吸附面部中的內域與外域的分界的位置關係的圖,(a)顯示即將使成形後基板吸附到吸附面部之前的狀態,(b)顯示吸附後的狀態。 21 is a view for explaining a positional relationship between a product region in a substrate after molding and a boundary between an inner region and an outer region in the adsorption surface portion, wherein (a) shows a state immediately before the formed substrate is adsorbed to the adsorption surface, and (b) shows The state after adsorption.
以下,參照附圖,對本發明的實施形態進行詳細說明。本實施形態中,在切斷作為平板狀工件的一例的成形後基板的工件切斷裝置中實施本發明。 Hereinafter, embodiments of the present invention will be described in detail with reference to the accompanying drawings. In the present embodiment, the present invention is implemented in a workpiece cutting device that cuts a post-molded substrate as an example of a flat workpiece.
圖1是顯示本發明所涉及的工件切斷裝置9的圖。圖2是顯示設置在圖1所示的工件切斷裝置9中的切斷單元B的圖。圖3和圖4是顯示圖2所示的切斷單元B的主要部分的圖。圖5、圖6、圖7和圖8是顯示切斷途中的成形後基板1的狀態的圖。圖9是顯示使用本發明所涉及的工件切斷裝置9的成形後基板1的切斷方法的流程圖。圖10(a)是顯示由切斷裝置9切斷的成形後基板1的圖。圖10(b)是顯示作為將圖10(a)所示的成形後基板1切斷而形成的產品的封裝狀電子零件(以下,簡稱為封裝)5的圖。圖11是成形後基板1的俯視圖。此外,與成形後基板1相比,從成形後基板中切開為多個的封裝5呈微小的形狀,因此圖10(b)放大顯示封裝5。 FIG. 1 is a view showing a workpiece cutting device 9 according to the present invention. FIG. 2 is a view showing the cutting unit B provided in the workpiece cutting device 9 shown in FIG. 1. 3 and 4 are views showing a main part of the cutting unit B shown in Fig. 2. 5, 6, 7, and 8 are views showing a state of the substrate 1 after molding in the middle of cutting. FIG. 9 is a flowchart showing a method of cutting the substrate 1 after molding using the workpiece cutting device 9 according to the present invention. Fig. 10 (a) is a view showing the molded substrate 1 cut by the cutting device 9. (b) of FIG. 10 is a view showing a package-like electronic component (hereinafter, simply referred to as package) 5 as a product formed by cutting the molded substrate 1 shown in FIG. 10( a ). Fig. 11 is a plan view of the substrate 1 after molding. Further, since the package 5 cut into a plurality of pieces from the formed substrate has a minute shape as compared with the formed substrate 1, the package 5 is shown enlarged in FIG. 10(b).
如圖10(a)和圖11所示,作為平板狀工件的一例的成形後基板1具有基板2和樹脂成形體3(密封樹脂)。基板2具備排列配置的多個塊域1c和設置在塊域1c的周圍的端材域1d。端材域1d為最終被廢棄的不需要的部分。在各個塊域1c中形成有相當於多個產品的多個封裝狀電子零件(以下,簡稱為封裝)5。以下,將排列配置在基板2上的多個塊域1c稱為成形後基板1的產品域1c’。如圖11所示,在端材域1d的一部分形成有對準標記1e。對準標記1e係藉由印刷或刻印等方法形成在端材域1d上。 As shown in Fig. 10 (a) and Fig. 11, the molded substrate 1 as an example of a flat workpiece has a substrate 2 and a resin molded body 3 (sealing resin). The substrate 2 includes a plurality of block domains 1c arranged in an array and an end material region 1d provided around the block region 1c. The end material domain 1d is an unwanted portion that is ultimately discarded. A plurality of package-like electronic components (hereinafter simply referred to as packages) 5 corresponding to a plurality of products are formed in each of the block domains 1c. Hereinafter, the plurality of block domains 1c arranged in the substrate 2 are referred to as the product region 1c' of the formed substrate 1. As shown in FIG. 11, an alignment mark 1e is formed in a part of the end material field 1d. The alignment mark 1e is formed on the end material domain 1d by a method such as printing or imprinting.
基板2具備基板面2a和作為其相反的側的表面的模面2b,樹脂成形體3設置於基板2的模面2b側(參照圖14)。可在成形後基板1的基板面1a側設定虛擬切斷線4a、4b。虛擬切斷線4a為與矩形狀的成形後基板1的長邊平行且虛擬地設定的切斷線,切斷線4b為與短邊平行且虛擬地設定的切斷線。如圖10(b)所示,從成形後基板1切開為多個的封裝5具有基板部6和樹脂部(密封樹脂)7。封裝5具備基板面5a和作為其相反的側的表面的模面5b,樹脂部7被設置在基板部6的模面5b側。如後述,藉由使用本發明所涉及的工件切斷裝置9來切斷成形後基板1,從而形成各個封裝5。 The substrate 2 includes a mold surface 2b on the substrate surface 2a and a surface on the opposite side thereof, and the resin molded body 3 is provided on the mold surface 2b side of the substrate 2 (see FIG. 14). The virtual cutting lines 4a and 4b can be set on the side of the substrate surface 1a of the substrate 1 after molding. The virtual cutting line 4a is a cutting line that is virtually parallel to the long side of the rectangular molded substrate 1, and the cutting line 4b is a cutting line that is set in parallel with the short side and virtually set. As shown in FIG. 10( b ), the package 5 cut into a plurality of pieces from the formed substrate 1 has a substrate portion 6 and a resin portion (sealing resin) 7 . The package 5 includes a mold surface 5b on the substrate surface 5a and a surface on the opposite side thereof, and the resin portion 7 is provided on the mold surface 5b side of the substrate portion 6. As will be described later, each of the packages 5 is formed by cutting the formed substrate 1 using the workpiece cutting device 9 according to the present invention.
接著,對本發明所涉及的工件切斷裝置9的構成進行說明。如圖1所示,工件切斷裝置9具備:基板裝填單元A,裝填成形後基板1;切斷單元B,將從基板裝填單元A移送來的成形後基板1切斷(分離)成各個封裝5;封裝檢查單元C,對由切斷單元B切斷的各個封裝5進行外觀檢查來篩選合格品和不良品;封裝收容單元D,將由封裝檢查單元C檢查篩選出的封裝5作為合格品和不良品而分別收容到托盤中;以及控制部E。 Next, the configuration of the workpiece cutting device 9 according to the present invention will be described. As shown in Fig. 1, the workpiece cutting device 9 includes a substrate loading unit A for loading and molding the substrate 1, and a cutting unit B for cutting (separating) the molded substrate 1 transferred from the substrate loading unit A into individual packages. 5; the package inspection unit C performs visual inspection on each package 5 cut by the cutting unit B to screen qualified products and defective products; and packages the storage unit D, and checks the package 5 selected by the package inspection unit C as a good product and The defective product is separately accommodated in the tray; and the control unit E.
工件切斷裝置9被構成為,將基板裝填單元A中裝填的成形後基板1移送到切斷單元B而切斷成各個封裝5,接著,利用封裝檢查單元C檢查並篩選切斷後的各個封裝5,並且利用封裝收容單元D將封裝5作為合格品和不良品來分別收容,而且,控制部E控制這些單元A、B、C、D的一系列的處理。 The workpiece cutting device 9 is configured to transfer the formed substrate 1 loaded in the substrate loading unit A to the cutting unit B, and cut into the respective packages 5. Then, the package inspection unit C inspects and filters the cut packages. 5. The package 5 is housed as a good product and a defective product by the package storage unit D, and the control unit E controls a series of processes of the units A, B, C, and D.
工件切斷裝置9被構成為上述的各單元A、B、C、D能夠以該順序相互裝卸自如地連結並裝設。另外,工件切斷裝置9可被構成為 例如利用連結工具10裝卸自如地連結各單元A、B、C、D。 The workpiece cutting device 9 is configured such that each of the above-described units A, B, C, and D can be detachably coupled to each other in this order. In addition, the workpiece cutting device 9 can be configured as For example, each of the units A, B, C, and D is detachably connected by the connecting tool 10.
接著,對切斷單元B進行說明。如圖2所示,切斷單元B具有基板排列機構部11和基板切斷機構部12。基板排列機構部11具有:基板供給台13,從基板裝填單元A供給成形後基板1;和基板旋轉排列手段14,卡合被供給到基板供給台13的成形後基板1,將使其旋轉所需的角度(例如,90度)以使其排列在所需的方向上的成形後基板1供給設定在基板切斷機構部12側。 Next, the cutting unit B will be described. As shown in FIG. 2, the cutting unit B has a substrate arranging mechanism portion 11 and a substrate cutting mechanism portion 12. The substrate array mechanism portion 11 includes a substrate supply stage 13 and supplies the molded substrate 1 from the substrate loading unit A. The substrate rotation alignment means 14 engages the molded substrate 1 supplied to the substrate supply table 13 and rotates it. The required angle (for example, 90 degrees) is set so that the formed substrate 1 is arranged in the desired direction on the side of the substrate cutting mechanism portion 12.
在具有以上的構成的切斷單元B中,首先,從基板裝填單元A向基板供給台13供給設定成形後基板1,接著,從基板供給台13卡合抬起成形後基板1,並且,使其以所需的角度旋轉,由此使成形後基板1排列在所需的方向上並供給到基板切斷機構部12側。 In the cutting unit B having the above configuration, first, the substrate 1 to be formed is supplied from the substrate loading unit A to the substrate supply table 13, and then the substrate 1 is lifted and lifted from the substrate supply table 13, and the substrate 1 is lifted and lifted. This is rotated at a desired angle, whereby the formed substrate 1 is aligned in a desired direction and supplied to the substrate cutting mechanism portion 12 side.
接著,對基板切斷機構部12的構成進行說明。工件切斷裝置9為雙台方式,如圖2所示,基板切斷機構部12被構成為具備分別進行基板的切斷(基板的單片化)的兩個線路(成為裝置內的生產線的單片化線路),並且這兩個單片化線路沿Y方向被配置為平行狀態,其配設位置與後述的第一、第二切斷台17a、17b的移動區域26a、26b大致一致。 Next, the configuration of the substrate cutting mechanism unit 12 will be described. The workpiece cutting device 9 is a two-stage system. As shown in FIG. 2, the substrate cutting mechanism unit 12 is configured to include two lines for cutting the substrate (single substrate) (to be a production line in the device). The singulation line is arranged in a parallel state in the Y direction, and the arrangement position thereof substantially coincides with the movement regions 26a and 26b of the first and second cutting tables 17a and 17b which will be described later.
此外,在圖2所示的圖例中,在正面左側配置有第一切斷台17a的移動區域26a,並在正面右側配置有第二切斷台17b的移動區域26b。 Further, in the example shown in Fig. 2, the moving area 26a of the first cutting table 17a is disposed on the left side of the front side, and the moving area 26b of the second cutting table 17b is disposed on the right side of the front side.
另外,在基板切斷機構部12中,在各個第一、第二切斷台17a、17b的移動區域26a、26b設置有第一、第二基板載置手段15a、15b和使第一、第二基板載置手段15a、15b沿Y方向往復移動而引導的第一、第二往復移動手段16a、16b。 Further, in the substrate cutting mechanism portion 12, the first and second substrate placing means 15a, 15b are provided in the moving regions 26a, 26b of the respective first and second cutting tables 17a, 17b, and the first and the first The first and second reciprocating means 16a, 16b that are guided by the two substrate placing means 15a, 15b to reciprocate in the Y direction.
因此,在移動區域26a中,第一基板載置手段15a可藉由第一往復移動手段16a進行往復移動,在移動區域26b中,第二基板載置手段15b可藉由第二往復移動手段16b進行往復移動。此外,關於與基板切斷機構部12中的移動區域26a、26b相關的構成零件,對第一使用“a”來作為添標,並且對第二使用“b”來作為添標。 Therefore, in the moving region 26a, the first substrate mounting means 15a can be reciprocated by the first reciprocating means 16a. In the moving region 26b, the second substrate mounting means 15b can be moved by the second reciprocating means 16b. Reciprocating movement. Further, regarding the constituent parts related to the moving regions 26a and 26b in the substrate cutting mechanism portion 12, the first use "a" is used as a mark, and the second use "b" is used as a mark.
第一、第二基板載置手段15a、15b具有以模面1a為下表面的狀態(或以基板面1b為上表面的狀態)載置成形後基板1的第一、第二切斷台(切斷用載置旋轉台)17a、17b。如圖12、圖13所示,第一、第二切斷台17a、17b具備吸引保持成形後基板1的工件吸附板21。工件吸附板21被安裝在第一、第二切斷台17a、17b的上表面(基板載置面)。工件吸附板21具備底板31和吸附面部32。底板31具備基部31a和載置部31b。基部31a具有矩形板形狀。載置部31b具有小於基部31a且與成形後基板1相等的大小或大於成形後基板1的矩形板形狀,並以將四邊對齊的方式層疊配置在基部31a的上表面的中央位置。基部31a和載置部31b由鋁、銅等金屬構成,一體成形。 The first and second substrate mounting means 15a and 15b have the first and second cutting stages on which the substrate 1 is placed after the molding surface 1a is in the lower surface (or the substrate surface 1b is in the upper surface). The cutting rotary table 17a, 17b is cut. As shown in FIGS. 12 and 13, the first and second cutting tables 17a and 17b are provided with a workpiece suction plate 21 that sucks and holds the formed substrate 1. The workpiece suction plate 21 is attached to the upper surfaces (substrate mounting surfaces) of the first and second cutting tables 17a and 17b. The workpiece suction plate 21 includes a bottom plate 31 and an adsorption surface portion 32. The bottom plate 31 is provided with a base portion 31a and a mounting portion 31b. The base portion 31a has a rectangular plate shape. The mounting portion 31b has a rectangular plate shape smaller than the base portion 31a and equal to or larger than the shape of the substrate 1 after molding, and is disposed in a central position on the upper surface of the base portion 31a so as to be aligned on four sides. The base portion 31a and the mounting portion 31b are made of a metal such as aluminum or copper, and are integrally formed.
吸附面部32具有與載置部31b相等的大小的矩形板形狀,並以將形狀對齊的方式層疊配置在載置部31b的上表面上。吸附面部32與底板31的載置部31b黏接。吸附面部32係用於表面吸附固定成形後基板1的零件,且具備能夠保持成形後基板1的高度尺寸t(例如,2.0mm左右)。 The adsorption surface portion 32 has a rectangular plate shape having a size equal to that of the mounting portion 31b, and is laminated on the upper surface of the mounting portion 31b so as to align the shapes. The adsorption surface portion 32 is adhered to the mounting portion 31b of the bottom plate 31. The adsorption surface portion 32 is a component for adsorbing and fixing the molded substrate 1 on the surface, and has a height dimension t (for example, about 2.0 mm) capable of holding the substrate 1 after molding.
以下,在圖12和圖13的基礎上參照圖21進行說明。圖21被誇張地描繪。吸附面部32具備面方向內側的內域32a和在面方向外側包圍內域32a的外域32b。外域32b和內域32a具有以成形後基板1的形狀為 準的以下的形狀。 Hereinafter, description will be made with reference to Fig. 21 based on Figs. 12 and 13 . Figure 21 is exaggeratedly depicted. The adsorption surface portion 32 includes an inner region 32a on the inner side in the plane direction and an outer region 32b surrounding the inner region 32a on the outer side in the plane direction. The outer domain 32b and the inner domain 32a have a shape in which the substrate 1 is formed The following shapes are accurate.
即, which is,
.外域32b的外周緣33a具有與成形後基板1的外周緣(端材域1d的外周緣)1f相等的大小或比其稍大的矩形形狀。 . The outer peripheral edge 33a of the outer region 32b has a size equal to or slightly larger than the outer peripheral edge (outer peripheral edge 1b of the end material region 1d) 1f of the formed substrate 1.
.外域32b的內周緣(內域32a的外周緣)33b具有與端材域1d的內周緣(產品域1c'(參照圖7和圖8)的外周緣)1g相比稍小的矩形形狀。 . The inner periphery of the outer region 32b (the outer periphery of the inner region 32a) 33b has a rectangular shape slightly smaller than the inner periphery of the end material region 1d (the outer periphery of the product region 1c' (see FIGS. 7 and 8)) 1g.
由此,外域32b為具有與端材域1d相等的內周形狀且具備與端材域1d相等的大小或比其稍大的框寬度w的框形狀,內域32a為具備與產品域1c’相比稍小的外周形狀的矩形形狀。關於內域32a小於產品域1c’的程度,參照圖21後述。 Thereby, the outer region 32b has a frame shape having an inner circumferential shape equal to the end material region 1d and having a size equal to or slightly larger than the end material region 1d, and the inner region 32a is provided with the product region 1c' A rectangular shape that is slightly smaller than the outer shape. The extent to which the inner domain 32a is smaller than the product domain 1c' will be described later with reference to Fig. 21 .
內域32a和外域32b均由軟質樹脂構成,但其硬度不同。即,內域32a的硬度低於外域32b的硬度。具體而言,內域32a由蕭式A硬度為50~40的低硬度橡膠材料(例如,矽橡膠)構成,外域32b由蕭式A硬度為70~60的高硬度橡膠材料(例如,矽橡膠)構成。在此,若由超過蕭式A硬度70的高硬度橡膠材料構成外域32b,則在切斷成形後基板1的外周部附近時,外周部附近的成形後基板1與外域32b之間的摩擦力過小,無法保持成形後基板1。另外,若由低於蕭式A硬度40的低硬度橡膠材料構成內域32a,則雖然可能進一步追隨成形後基板1的變形而變形,但無法保持在高精度地維持其位置的狀態下。基於以上的理由,設定內外域32a、32b的硬度。 Both the inner domain 32a and the outer domain 32b are composed of a soft resin, but their hardness is different. That is, the hardness of the inner domain 32a is lower than the hardness of the outer domain 32b. Specifically, the inner region 32a is composed of a low-hardness rubber material (for example, ruthenium rubber) having a hardness of 50 to 40, and the outer region 32b is made of a high-hardness rubber material having a hardness of 70 to 60 (for example, ruthenium rubber). ) constitutes. When the outer region 32b is made of a high-hardness rubber material having a hardness A of 70, the friction between the formed substrate 1 and the outer region 32b in the vicinity of the outer peripheral portion when the outer peripheral portion of the substrate 1 is cut and formed is cut. Too small to maintain the formed substrate 1 . In addition, when the inner region 32a is formed of a low-hardness rubber material having a hardness lower than the hardness A of 40, the deformation of the substrate 1 after the molding is further deformed, but the state in which the position is maintained with high precision cannot be maintained. For the above reasons, the hardness of the inner and outer domains 32a and 32b is set.
進一步,工件吸附板21具備吸引用的多個貫通孔21a。貫通孔21a被設置為沿工件吸附板21的厚度方向貫通底板31和吸附面部32, 並使工件吸附板21的表面背面連通。貫通孔21a不拘泥於內域32a的形成區域和外域32b的形成區域,以既定的密度配置在工件吸附板21上。在第一、第二切斷台17a、17b中設置有吸附機構34。吸附機構34具備連通到貫通孔21a的吸引孔部34a和真空泵等吸引裝置34b。吸附機構34經由貫通孔21a和吸引孔部34a由吸引裝置34b來吸引被表面吸附配置在吸附面部32上的成形後基板1。在吸引裝置34b與吸引孔部34a之間的配管上設置有開閉閥(未圖示)。也可以使用大容量的減壓箱來作為吸引裝置34b。 Further, the workpiece suction plate 21 is provided with a plurality of through holes 21a for suction. The through hole 21a is provided to penetrate the bottom plate 31 and the adsorption surface portion 32 in the thickness direction of the workpiece suction plate 21, The surface back surface of the workpiece suction plate 21 is communicated. The through hole 21a is disposed on the workpiece suction plate 21 at a predetermined density regardless of the formation region of the inner region 32a and the formation region of the outer region 32b. An adsorption mechanism 34 is provided in the first and second cutting tables 17a and 17b. The adsorption mechanism 34 includes a suction hole portion 34a that communicates with the through hole 21a and a suction device 34b such as a vacuum pump. The suction mechanism 34 sucks the formed substrate 1 that is adsorbed on the adsorption surface portion 32 by the suction device 34b via the through hole 21a and the suction hole portion 34a. An opening and closing valve (not shown) is provided in the pipe between the suction device 34b and the suction hole portion 34a. A large-capacity decompression box can also be used as the suction device 34b.
如圖3和圖4所示,在第一、第二切斷台17a、17b的下端側設置有使切斷台17a、17b旋轉的旋轉機構18。旋轉機構18被設置為載置在台安裝台19上的狀態,沿Z方向從下側向上側,以台安裝台19、旋轉機構18、第一、第二切斷台17a、17b的順序配置。 As shown in FIGS. 3 and 4, a rotation mechanism 18 that rotates the cutting tables 17a and 17b is provided on the lower end sides of the first and second cutting tables 17a and 17b. The rotating mechanism 18 is placed on the stage mounting table 19, and is arranged in the order from the lower side to the upper side in the Z direction by the stage mounting table 19, the rotating mechanism 18, and the first and second cutting stages 17a and 17b. .
利用具備上述的構成的旋轉機構18,首先,將由基板旋轉排列手段14(參照圖1和圖2)排列的成形後基板1供給設定在第一、第二切斷台17a、17b的台載置面20上,由此藉由吸附機構34(參照圖12)將成形後基板1在其模面1a側吸附固定到第一、第二切斷台17a、17b(台載置面20)上,接著,能夠利用旋轉機構18往既定方向旋轉既定角度。 First, the molded substrate 1 arranged by the substrate rotation alignment means 14 (see FIGS. 1 and 2) is supplied to the stage set on the first and second cutting stages 17a and 17b by the rotation mechanism 18 having the above-described configuration. On the surface 20, the formed substrate 1 is adsorbed and fixed to the first and second cutting stages 17a and 17b (the stage mounting surface 20) on the side of the die surface 1a by the suction mechanism 34 (see FIG. 12). Then, the rotating mechanism 18 can be rotated in a predetermined direction by a predetermined angle.
另外,在第一、第二往復移動手段16a、16b中設置有:第一、第二往復移動手段16a、16b的本體(設置台);兩個導軌構件22,在第一、第二往復移動手段16a、16b的本體中沿往復移動的方向(Y方向)設置於第二往復移動手段第一、第二基板載置手段15a、15b的側面;滑動構件(滑塊)23,在導軌構件22上滑動以引導第一、第二基板載置手段15a、15b;和滾珠螺桿等往復驅動機構(未圖示),用於將滑動構件23沿Y方向 往復移動。 Further, in the first and second reciprocating means 16a, 16b, a main body (setting table) of the first and second reciprocating means 16a, 16b is provided; and the two rail members 22 are reciprocated in the first and second directions. The body of the means 16a, 16b is disposed in the direction of the reciprocating movement (Y direction) on the side surfaces of the first and second substrate placing means 15a, 15b of the second reciprocating means; the sliding member (slider) 23 in the rail member 22 Sliding upward to guide the first and second substrate placing means 15a, 15b; and a reciprocating driving mechanism (not shown) such as a ball screw for sliding the sliding member 23 in the Y direction Reciprocating.
藉由具備上述的構成,能夠在各個移動區域26a、26b中,利用第一、第二往復移動手段16a、16b使第一、第二切斷台17a、17b在基板載置位置24與基板切斷位置25之間(即,在第一、第二切斷台17a、17b的移動區域26a、26b內)往復移動(參照圖1和圖2)。此外,當然在第一、第二基板載置手段15a、15b中,被構成為能夠使滑動構件23和第一、第二切斷台17a、17b一體地往復滑動。 With the above configuration, the first and second cutting tables 17a and 17b can be cut at the substrate mounting position 24 and the substrate by the first and second reciprocating means 16a and 16b in the respective moving regions 26a and 26b. The break position 25 (i.e., within the moving regions 26a, 26b of the first and second cutting tables 17a, 17b) reciprocates (see Figs. 1 and 2). Further, of course, the first and second substrate placing means 15a, 15b are configured such that the sliding member 23 and the first and second cutting tables 17a, 17b can be integrally reciprocally slid.
接著,對本實施形態的工件切斷裝置9中的對準機構進行說明。藉由這些對準機構27a、27b,供給設定在第一、第二切斷台17a、17b上的成形後基板1的基板面1a被對準到第一、第二切斷台17a、17b的移動區域26a、26b中的基板載置位置24側,從而在基板面1a上設定所需的虛擬切斷線。 Next, the alignment mechanism in the workpiece cutting device 9 of the present embodiment will be described. By the alignment mechanisms 27a and 27b, the substrate surface 1a of the formed substrate 1 set on the first and second cutting stages 17a and 17b is aligned to the first and second cutting stages 17a and 17b. The substrate mounting position 24 side of the moving regions 26a and 26b is set to set a desired virtual cutting line on the substrate surface 1a.
此外,在本發明中,也可以採用對分別供給設定在兩個切斷台(第一、第二切斷台17a、17b)上的成形後基板1(兩片)設置一個對準機構27的構成。 Further, in the present invention, it is also possible to provide an alignment mechanism 27 for separately supplying the formed substrate 1 (two sheets) set on the two cutting tables (the first and second cutting stages 17a, 17b). Composition.
接著,對本實施形態的工件切斷裝置9中的切斷手段進行說明。在第一、第二切斷台17a、17b的移動區域26a、26b中的基板切斷位置側25,設置有具有刀片(旋轉切斷刃)的切斷手段,即第一切斷手段28和第二切斷手段29。第一切斷手段28和第二切斷手段29被構成為能夠分別獨立地沿X方向或Y方向往復移動。另外,通常如圖例所示,第一切斷手段28和第二切斷手段29被設置在將其刀片側相互對向配置的狀態下。 Next, the cutting means in the workpiece cutting device 9 of the present embodiment will be described. In the substrate cutting position side 25 of the moving regions 26a and 26b of the first and second cutting tables 17a and 17b, a cutting means having a blade (rotation cutting blade), that is, a first cutting means 28 and The second cutting means 29. The first cutting means 28 and the second cutting means 29 are configured to be independently reciprocally movable in the X direction or the Y direction. Further, generally, as shown in the example, the first cutting means 28 and the second cutting means 29 are provided in a state in which the blade sides are opposed to each other.
在藉由第一、第二切斷手段28、29切斷成形後基板1時, 可使第一、第二切斷手段28、29相對於第一、第二切斷台17a、17b(成形後基板1)移動來切斷成形後基板1。 When the formed substrate 1 is cut by the first and second cutting means 28, 29, The first and second cutting means 28, 29 can be moved relative to the first and second cutting stages 17a, 17b (the formed substrate 1) to cut the formed substrate 1.
此外,關於由第一、第二切斷手段28、29(刀片)進行的切斷,一般來說,使第一、第二切斷手段28、29的刀片的位置與成形後基板1的虛擬切斷線4a、4b、4c、4d的位置一致,並使第一、第二切斷手段28、29(刀片)向下移動至第一、第二切斷台17a、17b(成形後基板1)側,且使第一、第二切斷台17a、17b(成形後基板1)沿成為其移動方向的虛擬切斷線的方向移動,由此切斷成形後基板1。 Further, regarding the cutting by the first and second cutting means 28, 29 (blades), generally, the positions of the blades of the first and second cutting means 28, 29 and the virtual state of the substrate 1 after molding are made. The positions of the cutting lines 4a, 4b, 4c, 4d are identical, and the first and second cutting means 28, 29 (blades) are moved downward to the first and second cutting tables 17a, 17b (substrate 1 after forming) On the side, the first and second cutting stages 17a and 17b (the formed substrate 1) are moved in the direction of the virtual cutting line in the moving direction, thereby cutting the formed substrate 1.
另外,在第一、第二切斷手段28、29中分別設置有加工液噴射手段(未圖示),該加工液噴射手段在切斷成形後基板1時,向刀片噴射加工液來去除切斷屑(切削屑)。因此,在向第一切斷手段(刀片)28和第二切斷手段(刀片)29分別噴射加工液的狀態下,使用第一、第二切斷手段28、29來切斷載置在第一切斷台17a(或第二切斷台17b)上的成形後基板1,由此能夠從成形後基板1形成各個封裝5(參照圖10)。 Further, the first and second cutting means 28, 29 are respectively provided with a machining liquid ejecting means (not shown) for ejecting the machining liquid to the blade to remove the cut when the post-molding substrate 1 is cut. Chip breaking (chip cutting). Therefore, in the state where the machining liquid is ejected to each of the first cutting means (blade) 28 and the second cutting means (blade) 29, the first and second cutting means 28, 29 are used to cut off the placement. The formed substrate 1 on the cutting table 17a (or the second cutting table 17b) can form the respective packages 5 from the formed substrate 1 (see FIG. 10).
如圖1和圖2所示,在第一、第二切斷台17a、17b的移動區域26a、26b中的基板切斷位置25與基板載置位置24之間的中間部設置有清洗部30,該清洗部30藉由向被切斷的各個封裝5噴射清洗液,清洗並乾燥各個封裝5。 As shown in FIGS. 1 and 2, a cleaning portion 30 is provided at an intermediate portion between the substrate cutting position 25 and the substrate mounting position 24 in the moving regions 26a and 26b of the first and second cutting tables 17a and 17b. The cleaning unit 30 cleans and dries the respective packages 5 by ejecting the cleaning liquid to the respective packages 5 that are cut.
另外,在第一切斷台17a的移動區域26a和第二台17b的移動區域26b的下方位置設置有收容切斷屑的收容器(未圖示)。 Further, a container (not shown) for accommodating the cutting debris is provided at a position below the moving region 26a of the first cutting table 17a and the moving region 26b of the second table 17b.
因此,當將載置有由第一、第二切斷手段28、29切斷的各個封裝5的第一、第二切斷台17a、17b從基板切斷位置25向基板載置位置 24移動返回時,可在第一、第二切斷台17a、17b上載置有各個封裝5的狀態下,利用清洗部30清洗並乾燥各個封裝5。 Therefore, the first and second cutting stages 17a and 17b of the respective packages 5 cut by the first and second cutting means 28 and 29 are placed from the substrate cutting position 25 to the substrate mounting position. When moving back 24, the respective packages 5 can be cleaned and dried by the cleaning unit 30 in a state where the respective packages 5 are placed on the first and second cutting tables 17a and 17b.
在此,對本實施形態中的切斷步驟與對準步驟的關係進行概要說明。例如,首先,在工件切斷裝置9(切斷單元B)中的基板載置位置24,利用對準機構27a(27b),對準形成在成形後基板1上的第一對準標記1e(參照圖11),確定成形後基板1中的切斷位置作為基板的對準資訊。 Here, the relationship between the cutting step and the alignment step in the present embodiment will be briefly described. For example, first, at the substrate mounting position 24 in the workpiece cutting device 9 (cutting unit B), the first alignment mark 1e formed on the formed substrate 1 is aligned by the alignment mechanism 27a (27b) ( Referring to Fig. 11), the cutting position in the substrate 1 after forming is determined as the alignment information of the substrate.
接著,使成形後基板1移動至基板切斷位置25,並基於所述基板的對準資訊切斷成形後基板1的切斷位置,由此從成形後基板1中去除端材域1d以形成塊域1c(塊域群1c’)(進行所謂圖5和圖6中所示的島切)。 Next, the formed substrate 1 is moved to the substrate cutting position 25, and the cutting position of the formed substrate 1 is cut based on the alignment information of the substrate, thereby removing the end material region 1d from the formed substrate 1 to form Block domain 1c (block domain group 1c') (the so-called island cut shown in Figs. 5 and 6 is performed).
接著,基於所述塊域的對準資訊,可切斷該塊域1c的切斷位置來形成各個封裝5(進行所謂圖7和圖8中所示的單片的形成)。 Next, based on the alignment information of the block domain, the cut position of the block domain 1c can be cut to form the respective packages 5 (the formation of the so-called single sheets shown in FIGS. 7 and 8 is performed).
接著,參照圖9的流程圖,對使用工件切斷裝置9的成形後基板1的切斷方法進行說明。首先,準備具備內域32a的硬度低於外域32b的硬度的吸附面部32的本發明的工件吸附板21(準備步驟S1)。此後,從基板裝填單元A向切斷單元B中的基板排列機構部11(基板供給台13)供給設定成形後基板1,並且利用基板旋轉排列手段14使成形後基板1沿想要的方向排列之後,將經排列的成形後基板1配置在位於存在於基板載置位置24處的第一切斷台17a(或第二切斷台17b)的載置面20上的工件吸附板21上。 Next, a cutting method of the formed substrate 1 using the workpiece cutting device 9 will be described with reference to the flowchart of Fig. 9 . First, the workpiece suction plate 21 of the present invention having the adsorption surface portion 32 having the hardness of the inner region 32a lower than the hardness of the outer region 32b is prepared (preparation step S1). Thereafter, the substrate assembly unit 11 (substrate supply stage 13) in the cutting unit B is supplied from the substrate loading unit A, and the formed substrate 1 is set, and the formed substrate 1 is arranged in the desired direction by the substrate rotation alignment means 14. Thereafter, the aligned molded substrate 1 is placed on the workpiece suction plate 21 on the mounting surface 20 of the first cutting table 17a (or the second cutting table 17b) existing at the substrate mounting position 24.
此時,以如下方式使成形後基板1的朝向固定一致。即,在進行切斷處理的成形後基板1上可能會殘留有製造時產生的彎曲等變形。 彎曲具有凸彎曲和凹彎曲,該凸彎曲如圖14(a)所示,基板2的中央部的表面側(模面2b側)凸出成凸狀且背面側(基板面2a側)為凹狀,該凹彎曲如圖14(b)所示,基板2的中央部的背面側(基板面2a側)凸出成凸狀且表面側(模面2b側)為凹狀。當將成形後基板1安裝在工件吸附板21上時,在判斷出其彎曲的朝向並設為凸出成凸狀的成形後基板1的表面與工件吸附板抵接的基板的朝向之後,將成形後基板1安裝在工件吸附板21上。 At this time, the orientation of the formed substrate 1 was fixed in the same manner as follows. In other words, deformation of the substrate or the like which is formed during the cutting process may be caused by deformation such as bending during production. The curved portion has a convex curvature and a concave curvature. As shown in Fig. 14 (a), the surface side (the side of the mold surface 2b) of the central portion of the substrate 2 is convexly convex and the back side (the side of the substrate surface 2a) is concave. As shown in FIG. 14(b), the concave curved portion of the substrate 2 has a convex shape on the back side (the side of the substrate surface 2a) and a concave surface on the surface side (the side of the mold surface 2b). When the molded substrate 1 is mounted on the workpiece suction plate 21, after the direction in which the curved substrate is judged to be convex and convex, the surface of the substrate after the formed substrate 1 is in contact with the workpiece suction plate, The formed substrate 1 is mounted on the workpiece suction plate 21 after molding.
具體而言,對於產生凸彎曲的成形後基板1,在設為中央部為凸的表面側(模面2b側)與工件吸附板21抵接的朝向之後,分別使成形後基板1的端材域1d與吸附面部32的外域32b相對,並使產品域1c’與內域32a相對,以將成形後基板1安裝在工件吸附板21上。對於產生凹彎曲的成形後基板1,在設為中央部為凸的背面側(基板面2a側)與工件吸附板21抵接的朝向之後,分別使成形後基板1的端材域1d與吸附面部32的外域32b相對,並使產品域1c’與內域32a相對,以將成形後基板1安裝在工件吸附板21上。產品域1c’由在成形後基板1中除端材域1d之外相互排列配置的多個塊域1c構成(參照圖7和圖8)。 Specifically, the formed substrate 1 having the convex curvature is formed so that the end surface of the formed substrate 1 is formed after the direction in which the center portion is convex (the side of the mold surface 2b) abuts on the workpiece suction plate 21 The domain 1d is opposed to the outer region 32b of the adsorption face portion 32, and the product region 1c' is opposed to the inner region 32a to mount the formed substrate 1 on the workpiece suction plate 21. In the formed substrate 1 having the concave curvature, the end surface of the formed substrate 1 is adsorbed and adsorbed, respectively, after the direction of the back surface side (the substrate surface 2a side) where the center portion is convex is in contact with the workpiece suction plate 21. The outer region 32b of the face portion 32 is opposed to each other, and the product region 1c' is opposed to the inner region 32a to mount the formed substrate 1 on the workpiece suction plate 21. The product region 1c' is composed of a plurality of block domains 1c which are arranged side by side in addition to the end material region 1d in the substrate 1 after molding (see Figs. 7 and 8).
如圖15所示,在上述的基板配置中,例如將產生凹彎曲的成形後基板1安裝在工件吸附板21上,由此利用工件吸附板21吸附保持成形後基板1。具體而言,比外域32b柔軟的內域32a變形(陷入),內域32a吸附背面側(基板面2a側)的中央部,外域32b吸附成形後基板1的背面側的外周部。進一步,藉由大致同時地驅動吸引裝置34b,經由吸引孔部34a和貫通孔21a吸引工件吸附板21上的成形後基板1,由此,將成形後基板1 固定在吸附面部32上而不使成形後基板1變形較大(保持步驟S2)。 As shown in FIG. 15, in the above-described substrate arrangement, for example, the molded substrate 1 having concave curvature is attached to the workpiece suction plate 21, whereby the molded substrate 1 is suction-held by the workpiece suction plate 21. Specifically, the inner region 32a which is softer than the outer region 32b is deformed (trapped), the inner region 32a adsorbs the central portion on the back side (the substrate surface 2a side), and the outer region 32b adsorbs the outer peripheral portion on the back side of the formed substrate 1 . Further, by driving the suction device 34b substantially simultaneously, the formed substrate 1 on the workpiece suction plate 21 is sucked through the suction hole portion 34a and the through hole 21a, whereby the formed substrate 1 is formed. It is fixed to the adsorption surface portion 32 without deforming the substrate 1 after molding (keeping step S2).
當進行以上的成形後基板1的吸引保持時,在該工件切斷裝置9中,將吸附面部32劃分為與產品域1c’相對的內域32a和與端材域1d相對的外域32b,此外,由蕭式A硬度為50~40的低硬度橡膠材料構成內域32a,並由蕭式A硬度為70~60的高硬度橡膠材料構成外域32b。由此,如圖15所示,.藉由使具有比外域32b的硬度低的硬度的內域32a凹變形而吸收成形後基板1的彎曲而不使成形後基板1較大變形就使成形後基板1緊貼在內域32a上,進一步,.利用與內域32a相比硬度高的外域32b保持成形後基板1的外周部,.從而可將成形後基板1堅固且牢固地保持在工件吸附板21上。 When the suction and holding of the substrate 1 after the above forming is performed, in the workpiece cutting device 9, the adsorption surface portion 32 is divided into an inner region 32a opposed to the product region 1c' and an outer region 32b opposed to the end material region 1d. The inner region 32a is composed of a low-hardness rubber material having a hardness of 50 to 40, and the outer region 32b is composed of a high-hardness rubber material having a hardness of 70 to 60. Thus, as shown in Figure 15, The inner substrate 32a having a hardness lower than the hardness of the outer region 32b is concavely deformed to absorb the bending of the formed substrate 1 without deforming the formed substrate 1 to cause the formed substrate 1 to be in close contact with the inner region 32a. further,. The outer peripheral portion of the formed substrate 1 is maintained by the outer region 32b having a higher hardness than the inner region 32a. Thereby, the formed substrate 1 can be firmly and firmly held on the workpiece suction plate 21.
由此,即使是彎曲較大的平板狀工件(成形後基板1),也能夠高精度地保持以進行切斷處理。另外,即使在實施將平板狀工件(成形後基板1)細分切為微小的形狀(封裝狀電子零件等)的作業時,也能夠將切斷後的加工品的加工精度維持得較高。 Thereby, even if the flat-shaped workpiece (the formed substrate 1) having a large curvature is held, it can be held with high precision to perform the cutting process. In addition, even when an operation of subdividing the flat workpiece (the formed substrate 1) into a minute shape (package-like electronic component or the like) is performed, the processing accuracy of the processed product after cutting can be maintained high.
此外,在成形後基板1中,也具有無法從基板2的表面側(模面2b側)進行切斷處理的基板。在這種成形後基板1中,將在成形後基板1上產生凸彎曲的成形後基板1選擇性地挑出,以上述的方法安裝在工件吸附板21上。 Further, in the substrate 1 after molding, there is also a substrate which cannot be cut from the surface side (the surface of the mold surface 2b) of the substrate 2. In the formed substrate 1, the formed substrate 1 which is convexly curved on the formed substrate 1 is selectively picked out and mounted on the workpiece suction plate 21 by the above method.
在進行上述的處理之後,如圖1和圖2所示,使載置有成形後基板1的狀態的第一、第二切斷台17a、17b移動至基板切斷裝置25(成 形後基板的接收步驟S3)。 After performing the above-described processing, as shown in FIGS. 1 and 2, the first and second cutting stages 17a and 17b on which the formed substrate 1 is placed are moved to the substrate cutting device 25. Receiving step S3) of the rear substrate.
在該狀態下,藉由對準機構27a、27b測量第一、第二切斷台17a、17b上的成形後基板1的位置和切斷前的成形後基板1中的各塊域1c的位置。在該對準處理中,檢出形成在成形後基板1的端材域1d上的對準標記1e(參照圖11)的位置,並基於檢出的對準標記1e的位置資訊,確定第一、第二切斷台17a、17b中的成形後基板1的位置和各個塊域1c的位置(對準步驟S4)。以下,將由對準步驟S4確定的成形後基板1的位置資訊和塊域1c的位置資訊稱作對準資訊。 In this state, the position of the formed substrate 1 on the first and second cutting stages 17a, 17b and the position of each block field 1c in the formed substrate 1 before cutting are measured by the alignment mechanisms 27a, 27b. . In the alignment process, the position of the alignment mark 1e (refer to FIG. 11) formed on the end body region 1d of the formed substrate 1 is detected, and based on the position information of the detected alignment mark 1e, the first is determined. The position of the formed substrate 1 in the second cutting stages 17a, 17b and the position of each block field 1c (alignment step S4). Hereinafter, the position information of the formed substrate 1 and the position information of the block domain 1c determined by the alignment step S4 are referred to as alignment information.
接著,使第一、第二切斷台17a、17b以所需角度(90度的角度)旋轉,並且在該狀態下,如圖5所示,在成形後基板1上設定沿長邊方向的虛擬切斷線4a,並使用第一、第二切斷手段28、29沿設定的虛擬切斷線4a切斷成形後基板1。此外,基於藉由對準機構27a、27b確定的成形後基板1和塊域1c的位置資訊(對準資訊)設定虛擬切斷線4a。 Next, the first and second cutting tables 17a, 17b are rotated at a desired angle (angle of 90 degrees), and in this state, as shown in FIG. 5, the substrate 1 is formed on the substrate 1 in the longitudinal direction. The cut line 4a is cut by the first and second cutting means 28, 29 along the set virtual cutting line 4a. Further, the virtual cut line 4a is set based on the position information (alignment information) of the formed substrate 1 and the block field 1c which are determined by the alignment mechanisms 27a and 27b.
使載置有沿長邊方向的虛擬切斷線4a切斷的成形後基板1的第一、第二切斷台17a、17b以所需角度往相反方向旋轉而返回到原來的位置,在該狀態下,如圖6所示,在成形後基板1上設定沿短邊方向的虛擬切斷線4b之後,使用第一、第二切斷手段28、29沿設定的虛擬切斷線4b進一步切斷成形後基板1。此外,與虛擬切斷線4a相同,基於藉由對準機構27a、27b確定的成形後基板1和塊域1c的位置資訊(對準資訊)設定虛擬切斷線4b。 The first and second cutting tables 17a and 17b of the molded substrate 1 on which the dummy cutting line 4a cut along the longitudinal direction is placed are rotated in opposite directions at a desired angle, and returned to the original position. In the state, as shown in FIG. 6, after the virtual cutting line 4b in the short-side direction is set on the substrate 1 after molding, the first and second cutting means 28, 29 are further cut along the set virtual cutting line 4b. The formed substrate 1 is broken. Further, similarly to the virtual cut line 4a, the virtual cut line 4b is set based on the position information (alignment information) of the formed substrate 1 and the block field 1c which are determined by the alignment mechanisms 27a and 27b.
根據上述的處理,成形後基板1被分離為產品域1c’(多個塊域1c)和設置於塊域1c的外周圍的端材域1d。此時,構成產品域1c’ 的多個塊域1c彼此也相互切斷分離地排列。在基板分離結束後,從各塊域1c去除已分離的端材域1d。由此,如圖7所示,成形後基板1被切斷分離成多個塊域1c(塊域切開步驟S5)。 According to the above processing, the formed substrate 1 is separated into a product region 1c' (a plurality of block domains 1c) and an end material region 1d provided at the outer periphery of the block region 1c. At this time, the product domain 1c' is formed. The plurality of block domains 1c are also arranged to be separated from each other. After the substrate separation is completed, the separated end material domains 1d are removed from the respective block domains 1c. Thereby, as shown in FIG. 7, the formed substrate 1 is cut and separated into a plurality of block domains 1c (block domain incision step S5).
接著,使第一、第二切斷台17a、17b以所需角度(90度的角度)旋轉,並且在該狀態下,如圖7所示,在產品域1c’上設定沿其長邊方向的虛擬切斷線4c之後,使用第一、第二切斷手段28、29沿已設定的虛擬切斷線4c將產品域1c’(塊域1c)切斷成長條狀。 Next, the first and second cutting tables 17a, 17b are rotated at a desired angle (angle of 90 degrees), and in this state, as shown in Fig. 7, the product area 1c' is set along the longitudinal direction thereof. After the virtual cutting line 4c, the product region 1c' (block region 1c) is cut into a strip shape along the set virtual cutting line 4c using the first and second cutting means 28, 29.
此外,使載置有沿虛擬切斷線4c切斷成長條狀的產品域1c’(塊域1c)的第一、第二切斷台17a、17b以所需角度沿相反方向旋轉而返回到原來的位置,在此狀態下,如圖8所示,設定沿產品域1c’的短邊方向的虛擬切斷線4d之後,使用第一、第二切斷手段28、29沿設定的虛擬切斷線4d進一步切斷各個塊域1c。由此,在第一、第二切斷台17a、17b的載置面20上形成多個封裝5(塊域切斷步驟S6)。切斷步驟由塊域切開步驟S5和塊域切斷步驟S6構成。 Further, the first and second cutting tables 17a and 17b on which the product domain 1c' (block domain 1c) cut along the virtual cutting line 4c is placed are rotated in opposite directions at a desired angle to return to The original position, in this state, as shown in Fig. 8, after the virtual cut line 4d in the short-side direction of the product field 1c' is set, the first and second cutting means 28, 29 are used to set the virtual cut. The broken line 4d further cuts off each block domain 1c. Thereby, a plurality of packages 5 are formed on the mounting surface 20 of the first and second cutting stages 17a and 17b (block area cutting step S6). The cutting step is constituted by a block domain incision step S5 and a block domain cutting step S6.
接著,使載置有各個封裝5(切斷後基板1c)的第一、第二切斷台17a、17b從基板切斷位置25向基板載置位置24移動(參照圖1和圖2)。此時,利用清洗部30清洗並乾燥載置在第一、第二切斷台17a、17b上的封裝5(清洗步驟S7和乾燥步驟S8)。進一步在基板載置位置24,卡合載置在第一、第二切斷台17a、17b上的(切斷清洗後的)封裝5而移送至封裝檢查單元1C(封裝的轉交步驟S9)。 Next, the first and second cutting stages 17a and 17b on which the respective packages 5 (the cut substrate 1c) are placed are moved from the substrate cutting position 25 to the substrate mounting position 24 (see FIGS. 1 and 2). At this time, the package 5 placed on the first and second cutting stages 17a and 17b is cleaned and dried by the cleaning unit 30 (washing step S7 and drying step S8). Further, at the substrate mounting position 24, the package 5 (cut off the cleaning) placed on the first and second cutting stages 17a and 17b is engaged and transferred to the package inspection unit 1C (the transfer step S9 of the package).
此外,在本實施形態中,雖舉矩形狀(例如,長方形)的切斷台和矩形狀(例如,長方形)的成形後基板為例進行了說明,但在本發 明中,可以使用各種形狀的切斷台和各種形狀的成形後基板。 Further, in the present embodiment, a rectangular (for example, rectangular) cutting table and a rectangular (for example, rectangular) shaped substrate are described as an example, but in the present invention, In the description, a cutting table of various shapes and a shaped substrate of various shapes can be used.
如圖1所示,在基板裝填單元A設置有用於裝填成形後基板1的基板裝填部41和用於從基板裝填部41推出成形後基板1的推出構件42。因此,藉由利用推出構件42從基板裝填部41推出成形後基板1,能夠向切斷單元B中的基板排列機構部11(基板供給台13)供給成形後基板1。 As shown in FIG. 1, the substrate loading unit A is provided with a substrate loading portion 41 for loading the formed substrate 1, and an ejection member 42 for ejecting the molded substrate 1 from the substrate loading portion 41. Therefore, by pushing out the molded substrate 1 from the substrate loading portion 41 by the push-out member 42, the formed substrate 1 can be supplied to the substrate array mechanism portion 11 (substrate supply table 13) in the cutting unit B.
另外,在封裝檢查單元C設置有:封裝供給部43,用於供給由切斷單元B切斷的各個封裝5;封裝檢查部44,用於檢查來自封裝供給部43的各個封裝5;檢查用照相機45,在封裝檢查部44檢查各個封裝5;和封裝篩選手段46,將由封裝檢查部44和檢查用照相機45檢查過的封裝5篩選為合格品和不良品並移送至封裝的收容單元D。因此,藉由在封裝檢查單元C中,在封裝檢查部44利用檢查用照相機45檢查從切斷單元B供給到封裝供給部43中的各個封裝5,從而能夠利用封裝篩選手段46篩選為合格品和不良品並移送至封裝收容單元D。 Further, the package inspection unit C is provided with a package supply unit 43 for supplying the respective packages 5 cut by the cutting unit B, and a package inspection unit 44 for inspecting the respective packages 5 from the package supply unit 43; The camera 45 inspects each package 5 in the package inspection unit 44, and the package screening means 46, and filters the package 5 inspected by the package inspection unit 44 and the inspection camera 45 into a good product and a defective product, and transfers the package 5 to the package storage unit D. Therefore, in the package inspection unit C, the package inspection unit 44 inspects each package 5 supplied from the cutting unit B to the package supply unit 43 by the inspection camera 45, so that it can be selected as a good product by the package screening means 46. And the defective product is transferred to the package housing unit D.
如圖1所示,在封裝收容單元D設置有用於收容合格品的合格品托盤47和用於收容不良品的不良品托盤48。因此,可在封裝收容單元D中,利用封裝篩選手段46將由封裝檢查單元C檢查為合格品的封裝5收容在合格品托盤47中,並利用封裝篩選手段46將檢查為不良品的封裝5收容在不良品托盤48中。 As shown in FIG. 1, the package storage unit D is provided with a good product tray 47 for accommodating a good product and a defective product tray 48 for accommodating a defective product. Therefore, in the package storage unit D, the package 5 inspected by the package inspection unit C as a good product can be stored in the good product tray 47 by the package screening means 46, and the package 5 inspected as a defective product can be accommodated by the package screening means 46. In the defective product tray 48.
由於從成形後基板1切出的各個塊域1c的面積遠小於成形後基板1整體的面積,因此與使成形後基板1彎曲的力相比,使各個塊域1c彎曲的力較小,並且能夠使第一、第二切斷台17a、17b與塊域1c的樹脂成形體3下表面之間的間隙的大小小於封裝後基板1中的相同的間隙的大 小。因此,與吸引成形後基板1整體的構成相比,能夠有效增加對各塊域1c的吸引力。此外,在將塊域1c吸附固定在第一、第二切斷台17a、17b上時,能夠有效增加對各塊域1c的吸附固定力。 Since the area of each of the block domains 1c cut out from the substrate 1 after molding is much smaller than the area of the entire substrate 1 after molding, the force for bending the respective block domains 1c is smaller than the force for bending the substrate 1 after molding, and The gap between the first and second cutting stages 17a, 17b and the lower surface of the resin molded body 3 of the block domain 1c can be made smaller than the same gap in the packaged substrate 1. small. Therefore, the attraction force to each block domain 1c can be effectively increased as compared with the configuration of attracting the entire substrate 1 after molding. Further, when the block domain 1c is adsorbed and fixed to the first and second cutting tables 17a and 17b, the adsorption fixing force for each of the block domains 1c can be effectively increased.
另外,由於能夠有效增加對各塊域1c的吸附固定力,因此能夠有效防止在由第一、第二切斷手段28、29進行切斷時,從各塊域1c切斷分離的封裝5受到切斷力而向周圍飛出的不良情況。 Further, since the adsorption fixing force to each of the block domains 1c can be effectively increased, it is possible to effectively prevent the package 5 cut and separated from each of the block domains 1c from being subjected to the cutting by the first and second cutting means 28 and 29. The problem of cutting off the force and flying out to the surroundings.
此外,除了能夠有效提高封裝5的尺寸精度,還可防止切斷時封裝5從切斷部位飛出等,由此防止第一、第二切斷手段28、29的破損(刀片破損等)來謀求長壽命化,從而可提高產品的生產率。 Further, in addition to being able to effectively improve the dimensional accuracy of the package 5, it is possible to prevent the package 5 from flying out of the cut portion at the time of cutting, thereby preventing damage of the first and second cutting means 28, 29 (broken blade, etc.). Longevity is achieved, which increases product productivity.
另外,根據本發明可得到如下的作用效果。即,根據使用該工件切斷裝置9的基板切斷方法,將從成形後基板1切出封裝5的步驟劃分為塊域切開步驟S5和塊域切斷步驟S6,由此,在開始切出封裝5的塊域切斷步驟S6的時點,成形後基板1為被分離成各個塊域1c的狀態,由此能夠盡可能減小封裝5的切出中的基板彎曲的影響。 Further, according to the present invention, the following effects can be obtained. In other words, according to the substrate cutting method using the workpiece cutting device 9, the step of cutting out the package 5 from the formed substrate 1 is divided into a block cutting step S5 and a block cutting step S6, whereby the cutting is started. At the time of the block domain cutting step S6 of the package 5, the substrate 1 is separated into the respective block domains 1c, whereby the influence of the substrate bending during the cutting of the package 5 can be minimized.
然而,為了呼應隨著最近的電子裝置的小型化而提高的對封裝5的小型化要求,需要進一步提高封裝的切斷精度。在本發明中,藉由以上述的方式改進工件吸附板21的形狀,從而進一步提高在成形後基板的接收步驟S3中實施的由工件吸附板21對成形後基板1的吸附保持精度,由此封裝的切斷精度更優良。 However, in order to respond to the miniaturization of the package 5 which has been improved with the recent miniaturization of the electronic device, it is necessary to further improve the cutting accuracy of the package. In the present invention, by improving the shape of the workpiece suction plate 21 in the above manner, the adsorption holding precision of the formed substrate 1 by the workpiece suction plate 21 which is performed in the receiving step S3 of the formed substrate is further improved, thereby The cutting accuracy of the package is better.
此外,在上述的實施形態中,舉例說明了使用第一、第二切斷手段28、29(兩個刀片)切斷成形後基板1的構成,但在使用單數的切斷手段(刀片)的構成中也可以採用本發明。在藉由單數的切斷手段切斷 成形後基板1的情況下,可抑制切斷後的塊域1c中的位置偏移,因此若在該構成中實施本發明,則可得到更良好的效果。 Further, in the above-described embodiment, the configuration in which the substrate 1 after molding is cut by using the first and second cutting means 28 and 29 (two blades) is exemplified, but a single cutting means (blade) is used. The present invention can also be employed in the configuration. Cut off by a single cut In the case of forming the substrate 1 after the molding, the positional deviation in the block region 1c after the cutting can be suppressed. Therefore, by carrying out the present invention in this configuration, a more excellent effect can be obtained.
另外,在上述的實施形態中,舉例說明了在使成形後基板1的樹脂成形體側朝下的狀態下進行吸附固定的構成,但在使成形後基板1的基板本體側朝下的狀態下進行吸附固定的構成中同樣也可以採用本發明。 In addition, in the above-described embodiment, the structure in which the resin molded body side of the substrate 1 is formed is attached and lowered, and the substrate body side of the substrate 1 is formed to face downward. The present invention can also be applied to the configuration in which adsorption fixation is carried out.
接著,參照圖16和圖17,對工件吸附板21的製造方法進行說明。圖16(a)是用於製作工件吸附板21的外模50的局部剖面立體剖面圖,圖16(b)是用於製作工件吸附板21的內模51的局部剖面立體剖面圖,圖17和圖18是顯示工件吸附板21的製造步驟的圖。 Next, a method of manufacturing the workpiece suction plate 21 will be described with reference to Figs. 16 and 17 . Figure 16 (a) is a partial cross-sectional perspective view of the outer mold 50 for forming the workpiece suction plate 21, and Figure 16 (b) is a partial cross-sectional perspective view of the inner mold 51 for forming the workpiece suction plate 21, Figure 17 And FIG. 18 is a view showing a manufacturing step of the workpiece suction plate 21.
外模50具備具有能夠製作吸附面部32的形狀的內部形狀的有底的腔室52。腔室52的深度尺寸H為將吸附面部32的高度尺寸t(參照圖12)和底板31的載置部31b的高度尺寸r(參照圖12)加在一起的尺寸(H=t+r)。內模51由具有與吸附面部32的內域32a的外周緣33b的形狀相對應的外周形狀的無底的細厚框體構成。內模51的高度尺寸s與腔室52的深度尺寸H相同。 The outer mold 50 is provided with a bottomed chamber 52 having an inner shape capable of producing a shape of the suction surface portion 32. The depth dimension H of the chamber 52 is a size (H=t+r) in which the height dimension t (see FIG. 12) of the adsorption surface portion 32 and the height dimension r (refer to FIG. 12) of the mounting portion 31b of the bottom plate 31 are added together. . The inner mold 51 is composed of a bottomless thin frame having an outer peripheral shape corresponding to the shape of the outer peripheral edge 33b of the inner region 32a of the suction surface portion 32. The height dimension s of the inner mold 51 is the same as the depth dimension H of the chamber 52.
以下,對使用上述的外模50和內模51的工件吸附板21的製造方法進行說明。首先,準備如圖16(a)、(b)所示的外模50和內模51(準備步驟S20)。 Hereinafter, a method of manufacturing the workpiece suction plate 21 using the above-described outer mold 50 and inner mold 51 will be described. First, the outer mold 50 and the inner mold 51 shown in Figs. 16(a) and 16(b) are prepared (preparation step S20).
接著,沿已準備的外模50的內域形成區域50a的周緣收納配置內模51。由此,進一步在外模50的內周與內模51的外周之間形成外域形成區域50b。在該狀態下,將由矽系的常溫硬化性液狀樹脂構成的第一 樹脂材料60A和第二樹脂材料60B填充到外模50的腔室52中(樹脂填充步驟S21)。 Next, the inner mold 51 is accommodated along the periphery of the inner region forming region 50a of the prepared outer mold 50. Thereby, the outer region forming region 50b is further formed between the inner circumference of the outer mold 50 and the outer circumference of the inner mold 51. In this state, the first composition of the lanthanide room temperature curable liquid resin is used. The resin material 60A and the second resin material 60B are filled into the chamber 52 of the outer mold 50 (resin filling step S21).
在此,在外域形成區域50b中填充硬化後成為外域32b的第二樹脂材料60B,在內域形成區域50a中填充硬化後的硬度低於第二樹脂材料60B且硬化後成為內域32a的第一樹脂材料60A。具體而言,將由硬化後蕭式A硬度為70~60的矽系的常溫硬化性液狀樹脂構成的第二樹脂材料60B填充到外域形成區域50b中,並且將由硬化後蕭式A硬度為50~40的矽系的常溫硬化性液狀樹脂構成的第一樹脂材料60A填充到內域形成區域50a中。此時,以使第一、第二樹脂材料60A、60B的填充高度尺寸t稍超過待形成的吸附面部32的高度尺寸t的方式設定第一、第二樹脂材料60A、60B的填充量。此外,第一、第二樹脂材料60A、60B並不限定於矽系樹脂,也可以採用氟系樹脂。 Here, in the outer region forming region 50b, the second resin material 60B which becomes the outer region 32b after being filled and hardened is filled, and the hardness after filling and hardening in the inner region forming region 50a is lower than that of the second resin material 60B and becomes the inner region 32a after hardening. A resin material 60A. Specifically, the second resin material 60B composed of a lanthanum-based room temperature curable liquid resin having a hard A hardness of 70 to 60 after hardening is filled in the outer region forming region 50b, and the hardness A is 50 after hardening. The first resin material 60A composed of the lanthanide room temperature curable liquid resin of ~40 is filled in the inner domain forming region 50a. At this time, the filling amounts of the first and second resin materials 60A and 60B are set such that the filling height dimension t of the first and second resin materials 60A and 60B slightly exceeds the height dimension t of the adsorption surface portion 32 to be formed. Further, the first and second resin materials 60A and 60B are not limited to the fluorene-based resin, and a fluorine-based resin may be used.
接著,將填充有第一、第二樹脂材料60A、60B的帶內模的外模50收納到帶乾式旋轉泵的真空乾燥器61中,並在常溫、約100kPa的條件下靜置20分鐘,由此去除位於第一、第二樹脂材料60A、60B的內部的氣泡62(脫氣步驟S22)。 Next, the outer mold 50 with the inner mold filled with the first and second resin materials 60A and 60B is placed in a vacuum dryer 61 with a dry rotary pump, and allowed to stand at normal temperature and about 100 kPa for 20 minutes. The bubbles 62 located inside the first and second resin materials 60A, 60B are thus removed (degassing step S22).
在脫氣步驟結束後,從真空乾燥器61中取出帶內模的外模50。進而,等待直至第一、第二樹脂材料60A、60B硬化到不會相互混合的程度,在硬化至此程度的時點,從外模50中取出內模51以使第一樹脂材料60A和第二樹脂材料60B緊貼(內模拔去步驟S23)。 After the end of the degassing step, the outer mold 50 with the inner mold is taken out from the vacuum dryer 61. Further, wait until the first and second resin materials 60A, 60B are hardened to such an extent that they do not mix with each other, and at the time of hardening to this extent, the inner mold 51 is taken out from the outer mold 50 to make the first resin material 60A and the second resin The material 60B is in close contact (the inner mold is unplugged in step S23).
進而,在底板31的載置部31b的表面上預先塗布底塗劑之後,使載置部31b為前頭將底板31插入到外模50的腔室52內。進行底板 31的插入,直至基部31a與外模50的上端抵接,載置部31b與第一、第二樹脂材料60A、60B抵接(底板插入步驟S24)。 Further, after the primer is applied to the surface of the placing portion 31b of the bottom plate 31, the mounting portion 31b is inserted into the chamber 52 of the outer mold 50 in the front. Carrying out the bottom plate The insertion of 31 is performed until the base portion 31a comes into contact with the upper end of the outer mold 50, and the placing portion 31b abuts against the first and second resin materials 60A, 60B (the bottom plate insertion step S24).
如此,若在外模50內使底板31與第一、第二樹脂材料60A、60B抵接,則腔室52內部的第一、第二樹脂材料60A、60B藉由底板31的載置部31b被加壓,由此第一、第二樹脂材料60A、60B進入到位於底板31中的貫通孔21a中,並且溢出到底板31的背面。在該狀態下,將外模50和底板31常溫載置24小時,從而使第一、第二樹脂材料60A、60B完全硬化(硬化步驟S25)。 When the bottom plate 31 is brought into contact with the first and second resin materials 60A and 60B in the outer mold 50, the first and second resin materials 60A and 60B inside the chamber 52 are placed by the placing portion 31b of the bottom plate 31. The pressure is applied, whereby the first and second resin materials 60A, 60B enter into the through holes 21a located in the bottom plate 31, and overflow to the back surface of the bottom plate 31. In this state, the outer mold 50 and the bottom plate 31 are placed at normal temperature for 24 hours, thereby completely curing the first and second resin materials 60A and 60B (hardening step S25).
此外,假設使用熱硬化性液狀樹脂,則在因加熱而膨脹的底板31之上進行樹脂硬化,從而具有當冷卻至常溫底板31收縮時,在吸附面部32中產生彎曲或扭曲的可能性。在本實施例中,藉由使用常溫硬化性液狀樹脂而避免這種問題,能夠製造具有尺寸精度高的吸附面部32的工件吸附板21。 Further, assuming that the thermosetting liquid resin is used, the resin is hardened on the bottom plate 31 which is expanded by heating, and there is a possibility that bending or distortion occurs in the adsorption surface portion 32 when it is cooled to the normal temperature of the bottom plate 31. In the present embodiment, such a problem is avoided by using a room temperature curable liquid resin, and the workpiece suction plate 21 having the adsorption surface portion 32 having high dimensional accuracy can be manufactured.
接著,在第一、第二樹脂材料60A、60B完全硬化之後,將外模50和底板31放入到烘箱63中,並在100℃下加熱1小時,由此使第一、第二樹脂材料60A、60B完全硬化為內域32a和外域32b,並黏著已形成的內域32a和外域32b,進而,藉由使塗布在底板31的載置部31b上的底塗劑硬化而牢固地黏著內外域32a、32b和載置部31b(底板黏著步驟S26)。此外,內外域32a、32b與底板31的黏著可得到充分的黏著強度即可,也可以是因第一、第二樹脂材料60A、60B的硬化而產生的自然黏著。此時,不需要底塗劑的塗布和黏著步驟S26。 Next, after the first and second resin materials 60A, 60B are completely hardened, the outer mold 50 and the bottom plate 31 are placed in an oven 63, and heated at 100 ° C for 1 hour, thereby making the first and second resin materials 60A, 60B are completely hardened into the inner domain 32a and the outer domain 32b, and adhere to the formed inner domain 32a and outer domain 32b, and further, the inner coating agent is firmly adhered by hardening the primer applied to the mounting portion 31b of the bottom plate 31. The domains 32a and 32b and the placing portion 31b (bottom plate bonding step S26). Further, the adhesion between the inner and outer domains 32a and 32b and the bottom plate 31 may be sufficient, and the natural adhesion due to the hardening of the first and second resin materials 60A and 60B may be employed. At this time, the coating and sticking step S26 of the primer is not required.
之後,從烘箱63取出相互黏著的底板31和內外域32a、32b 並使其自然冷卻之後,去除到達底板31的背面的第一、第二樹脂材料60A、60B,並且從成形體(工件吸附板21)卸下外模50(脫模步驟S27)。最後,利用鑽頭藉由穿過底板21的貫通孔21a進行鑽孔,去除在該貫通孔21a的內部硬化的第一、第二樹脂材料60A、60B,進而連續地在吸附面部32上穿孔,由此在吸附面部32的內外域32a、32b上也製作貫通孔21a(貫通孔製作步驟S28)。如此,可得到本實施例所的工件吸附板21。 Thereafter, the mutually adhered bottom plate 31 and the inner and outer domains 32a, 32b are taken out from the oven 63. After the natural cooling, the first and second resin materials 60A and 60B reaching the back surface of the bottom plate 31 are removed, and the outer mold 50 is removed from the molded body (work suction plate 21) (release step S27). Finally, the first and second resin materials 60A and 60B hardened inside the through hole 21a are removed by drilling through the through hole 21a of the bottom plate 21, and the perforation is continuously performed on the adsorption surface portion 32. Thus, the through hole 21a is also formed in the inner and outer domains 32a and 32b of the adsorption surface portion 32 (through hole forming step S28). Thus, the workpiece suction plate 21 of the present embodiment can be obtained.
如以上所述,由於在本發明所的工件吸附板21的製造方法中,使用與內外域32a、32b對應的內模51和外模50成形吸附面部32,因此可容易製作期望形狀的吸附面部32。也容易進行吸附面部32對底板31的定位。由此,能夠以廉價的製造成本製造出大型的工件吸附板21。 As described above, in the method of manufacturing the workpiece suction plate 21 of the present invention, the suction surface 32 is formed using the inner mold 51 and the outer mold 50 corresponding to the inner and outer domains 32a and 32b, so that it is easy to produce a suction surface of a desired shape. 32. It is also easy to position the bottom surface 31 of the suction surface portion 32. Thereby, the large workpiece suction plate 21 can be manufactured at an inexpensive manufacturing cost.
在上述的實施形態中,使吸附面部32和底板31的形狀為矩形,但也可以與被工件吸附板21吸附保持的平板狀工件(成形後基板1)的形狀相應地採用其它形狀。另外,使供給到外模10中的第一、第二樹脂材料60A、60B的量稍少於上述的量(即,第一、第二樹脂材料60A、60B的液面超過底板31的表面的量),也可為第一、第二樹脂材料60A、60B浸入到底板31的貫通孔21a中的程度的量 In the above-described embodiment, the shape of the adsorption surface portion 32 and the bottom plate 31 is rectangular. However, other shapes may be adopted depending on the shape of the flat workpiece (the formed substrate 1) which is held and held by the workpiece suction plate 21. Further, the amount of the first and second resin materials 60A, 60B supplied to the outer mold 10 is slightly smaller than the above-described amount (that is, the liquid level of the first and second resin materials 60A, 60B exceeds the surface of the bottom plate 31). The amount of the first and second resin materials 60A, 60B immersed in the through hole 21a of the bottom plate 31
可在將第一、第二樹脂材料60A、60B供給到外模10之前,事先在第一、第二樹脂材料60A、60B中添加碳粉末,由此使吸附面部32具有導電性。由於具有這種吸附面部32的工件吸附板21,可以放掉當安裝或卸下平板狀工件(成形後基板1)時產生的靜電,因此可防止靜電對平板狀工件內部的電子元件等帶來損傷。另外,藉由使用添加透明的樹脂或色素的第一、第二樹脂材料60A、60B,可製作具有透明的吸附面部32的工件 吸附板21或具有被著色成期望的顏色的吸附面部32的工件吸附板21。 The carbon powder may be added to the first and second resin materials 60A and 60B before the first and second resin materials 60A and 60B are supplied to the outer mold 10, whereby the adsorption surface portion 32 is made electrically conductive. Since the workpiece suction plate 21 having such a suction surface portion 32 can discharge static electricity generated when the flat workpiece (the substrate 1 after molding) is attached or detached, it is possible to prevent static electricity from coming to the electronic components inside the flat workpiece. damage. Further, by using the first and second resin materials 60A, 60B to which a transparent resin or pigment is added, a workpiece having a transparent adsorption surface portion 32 can be produced. The adsorption plate 21 or the workpiece suction plate 21 having the adsorption surface portion 32 colored to a desired color.
在上述的實施形態的工件吸附板21中,將吸附面部32劃分為其平面方向內側的內域32a和外側的外域32b,並且,構成為使內域32a的硬度低於外域32b的硬度。與此相對地,也可以在吸附面部32中,使外域32b的硬度低於內域32a的硬度。以下,對具備這種構成的工件吸附板21’的用途及效果進行說明。 In the workpiece suction plate 21 of the above-described embodiment, the adsorption surface portion 32 is divided into the inner region 32a on the inner side in the planar direction and the outer region 32b on the outer side, and the hardness of the inner region 32a is lower than the hardness of the outer region 32b. On the other hand, in the adsorption surface portion 32, the hardness of the outer region 32b may be lower than the hardness of the inner region 32a. Hereinafter, the use and effects of the workpiece suction plate 21' having such a configuration will be described.
如前述,在成形後基板1中,也具有無法從基板2的表面側(模面2b側)起進行切斷處理的情況。然而,成形後基板1中殘留的彎曲具有凸彎曲和凹彎曲,該凸彎曲如圖14(a)所示,基板2的中央部的表面側(模面2b側)凸出成凸狀且背面側(基板面2a側)為凹狀,並且該凹彎曲如圖14(b)所示,基板2的中央部的背面側(基板面2a側)凸出成凸狀且表面側(模面2b側)為凹狀。 As described above, in the substrate 1 after molding, the cutting process may not be performed from the surface side (the side of the die surface 2b) of the substrate 2. However, the curvature remaining in the substrate 1 after molding has a convex curvature and a concave curvature, and as shown in FIG. 14( a ), the surface side (the side of the mold surface 2 b ) of the central portion of the substrate 2 is convexly convex and the back surface The side (the side of the substrate surface 2a) is concave, and the concave curvature is as shown in Fig. 14 (b), and the back side (the side of the substrate surface 2a) of the central portion of the substrate 2 is convex and convex (surface 2b) Side) is concave.
對無法從基板2的表面側(模面2b側)進行切斷處理的成形後基板1來說,只要是在基板2中產生凸彎曲的狀態,即可在藉由內域32a的硬度低於外域32b的硬度的工件吸附板21牢固地保持成形後基板1的狀態下進行切斷處理。然而,在基板2上產生凹彎曲的狀態下,基板2的中央部處為凹狀的表面側(模面2b側)被配置在工件吸附板21上,其成為凹狀的表面側難以充分吸附在內域32a上。因此,無法在將成形後基板1牢固地保持在工件吸附板21上的狀態下進行切斷處理。 The molded substrate 1 which cannot be cut from the front surface side (the mold surface 2b side) of the substrate 2 may have a lower hardness in the inner region 32a as long as it is convexly bent in the substrate 2. The workpiece suction plate 21 having the hardness of the outer region 32b is firmly held in a state in which the substrate 1 is molded. However, in a state in which the substrate 2 is concavely curved, the surface side (the mold surface 2b side) having the concave portion at the central portion of the substrate 2 is disposed on the workpiece suction plate 21, and it is difficult to sufficiently adsorb the concave surface side. On the inner domain 32a. Therefore, the cutting process cannot be performed in a state where the formed substrate 1 is firmly held on the workpiece suction plate 21.
針對此種狀況,採用使用外域32b的硬度低於內域32a的硬度的工件吸附板21’的變形例。根據該變形例,可牢固地保持基板2上產生凹彎曲的成形後基板1。在工件吸附板21’中,構成為使外域32b的硬度 低於內域32a的硬度。由此,比內域32a柔軟的外域32b變形(陷入),外域32b吸附成形後基板1的外周部,並且內域32a吸附成形後基板1中向上凸的中央部。由此,將成形後基板1固定在吸附面部32上而不使其變形較大。使外域32b的硬度低於內域32a的硬度的構成對於圖14(a)所示的凸彎曲和圖14(b)所示的凹彎曲的任一彎曲而言,在以使成形後基板1的中央部朝上凸的方式將該成形後基板1安裝在工件吸附板21上的情況下有效。 In response to such a situation, a modification of the workpiece suction plate 21' in which the hardness of the outer region 32b is lower than the hardness of the inner region 32a is employed. According to this modification, the formed substrate 1 on which the concave curvature is generated on the substrate 2 can be firmly held. In the workpiece suction plate 21', the hardness of the outer domain 32b is configured. Below the hardness of the inner domain 32a. Thereby, the outer region 32b which is softer than the inner region 32a is deformed (trapped), the outer region 32b adsorbs the outer peripheral portion of the formed substrate 1, and the inner region 32a adsorbs the central portion of the substrate 1 which is convex upward. Thereby, the formed substrate 1 is fixed to the adsorption surface portion 32 without being largely deformed. The configuration in which the hardness of the outer region 32b is lower than the hardness of the inner region 32a is performed for any of the convex bending shown in FIG. 14(a) and the concave bending shown in FIG. 14(b). The central portion is effective in the case where the formed substrate 1 is attached to the workpiece suction plate 21 in an upwardly convex manner.
在上述的實施形態中,將吸附面部32劃分為其平面方向內側的內域32a和外側的外域32b,並且,構成為使內域32a的硬度低於外域32b的硬度。在變形例中,構成為使外域32b的硬度低於內域32a的硬度。與此相對地,如圖19所示,也可以設置如下的吸附面部32’:將吸附面部32’劃分為其高度方向(厚度方向)的內側(底板側)的下層域32c和外側(平板狀工件抵接面側)的上層域32d,並且構成為使上層域32d的硬度低於下層域32c的硬度(下層域32c-蕭式A硬度為70~60,上層域32d=蕭式A硬度為50~40)。即使以這種方式構成,也能夠藉由使上層域32d與平板狀工件的形狀相應地變形來使其緊貼在平板狀工件上,並藉由下層域32c牢固地保持平板狀工件(成形後基板1)。 In the above-described embodiment, the adsorption surface portion 32 is divided into the inner region 32a on the inner side in the planar direction and the outer region 32b on the outer side, and the hardness of the inner region 32a is made lower than the hardness of the outer region 32b. In the modified example, the hardness of the outer region 32b is made lower than the hardness of the inner region 32a. On the other hand, as shown in FIG. 19, the adsorption surface part 32' may be provided in which the adsorption surface part 32' is divided into the lower layer area 32c and the outer side (flat shape) of the inner side (floor side) in the height direction (thickness direction). The upper layer region 32d of the workpiece abutting surface side is configured such that the hardness of the upper layer region 32d is lower than the hardness of the lower layer region 32c (the lower layer region 32c - the Xiao A hardness is 70 to 60, and the upper layer region 32d = the Xiao A hardness is 50~40). Even in such a configuration, it is possible to closely adhere to the flat workpiece by deforming the upper layer 32d in accordance with the shape of the flat workpiece, and firmly hold the flat workpiece by the lower layer 32c (after forming Substrate 1).
參照圖20,對具備上述的吸附面部32’的工件吸附板21’的製造方法進行說明。首先,在準備具有與如圖16(a)所示的外模50相同的形狀的金屬模50’後,將成為上層域32d的由矽系的常溫硬化性液狀樹脂構成的第三樹脂材料60C填充到外模50’的腔室52中(第一樹脂填充步驟S31)。具體而言,將由硬化後成為蕭式A硬度50~40的矽系的常溫硬 化性液狀樹脂構成的第三樹脂材料60C填充到金屬模50’中。此時,以使第三樹脂材料60C的填充高度尺寸U’與形成的上層域32d的高度尺寸U(參照圖19)相同的方式設定第三樹脂材料60C的填充量。 A method of manufacturing the workpiece suction plate 21' including the above-described adsorption surface portion 32' will be described with reference to Fig. 20 . First, after preparing the metal mold 50' having the same shape as the outer mold 50 shown in Fig. 16(a), the third resin material composed of the lanthanum room temperature curable liquid resin to be the upper layer region 32d is formed. 60C is filled into the chamber 52 of the outer mold 50' (first resin filling step S31). Specifically, it will be hardened at room temperature by a lanthanide system having a hardness of 50 to 40 after hardening. The third resin material 60C composed of a chemical liquid resin is filled in the metal mold 50'. At this time, the filling amount of the third resin material 60C is set in such a manner that the filling height dimension U' of the third resin material 60C is the same as the height dimension U (see Fig. 19) of the formed upper layer region 32d.
接著,將填充有第三樹脂材料60C的外模50’收納到帶乾式旋轉泵的真空乾燥器61中,並在常溫且約100kPa的條件下靜置20分鐘,由此去除位於第三樹脂材料60C的內部的氣泡62(第一脫氣步驟S32)。 Next, the outer mold 50' filled with the third resin material 60C is housed in a vacuum dryer 61 with a dry rotary pump, and allowed to stand at normal temperature and about 100 kPa for 20 minutes, thereby removing the third resin material. The inner bubble 62 of 60C (first degassing step S32).
在脫氣結束後,從真空乾燥器61中取出外模50’。進而,等待直至第三樹脂材料60C硬化到不與其它液狀樹脂材料混合的程度,並在硬化到該程度的時點,將由硬化後成為蕭式A硬度50~40的矽系的常溫硬化性液狀樹脂構成的第四樹脂材料60D進一步填充到金屬模50’內的第三樹脂材料60C的上表面(第二樹脂填充步驟S33)。此時,以使第四樹脂材料60D的填充高度V’與形成的下層域32d的高度尺寸V(參照圖19)相同的方式設定第四樹脂材料60D的填充量。 After the end of the degassing, the outer mold 50' is taken out from the vacuum dryer 61. Further, it is waited until the third resin material 60C is hardened to such an extent that it is not mixed with other liquid resin materials, and when it is hardened to such an extent, it is a room temperature hardening liquid which becomes a sturdy A hardness of 50 to 40 after hardening. The fourth resin material 60D composed of a resin is further filled into the upper surface of the third resin material 60C in the metal mold 50' (second resin filling step S33). At this time, the filling amount of the fourth resin material 60D is set in such a manner that the filling height V' of the fourth resin material 60D is the same as the height dimension V (see Fig. 19) of the formed lower layer region 32d.
接著,將填充有第四樹脂材料60D的外模50’再次收納到帶乾式旋轉泵的真空乾燥器61中,在常溫且約100kPa的條件下靜置20分鐘,由此去除位於第四樹脂材料60D的內部的氣泡62(第二脫氣步驟S34)。 Next, the outer mold 50' filled with the fourth resin material 60D is again housed in a vacuum dryer 61 with a dry rotary pump, and left to stand at normal temperature and about 100 kPa for 20 minutes, thereby removing the fourth resin material. The inner bubble 62 of 60D (second degassing step S34).
由於以後的步驟與圖18所示的底板插入步驟S24、硬化步驟S25、底板黏著步驟S26、脫模步驟S27和貫通孔製作步驟S28相同,因此在此省略說明。 Since the subsequent steps are the same as the bottom plate insertion step S24, the hardening step S25, the bottom plate adhesion step S26, the demolding step S27, and the through hole forming step S28 shown in FIG. 18, the description thereof will be omitted.
參照圖21(a)、(b),對成形後基板1中相當於多個封裝5的產品域1c’和內域32a與外域32b的分界(以下稱作“分界”)的位置關係進行說明。如圖21(a)、(b)所示,在將產品域1c’的總寬度設為100% 的情況下,內域32a與外域32b的分界64位於從產品域1c’的周緣向內側進入5~10%的位置較理想。分界64位於從產品域1c’的周緣向內側進入7.5%的位置最理想。 21(a) and (b), the positional relationship between the product domain 1c' corresponding to the plurality of packages 5 and the boundary between the inner domain 32a and the outer domain 32b (hereinafter referred to as "demarcation") in the substrate 1 after molding will be described. . As shown in Figs. 21(a) and (b), the total width of the product domain 1c' is set to 100%. In the case where the boundary 64 between the inner domain 32a and the outer domain 32b is located 5 to 10% from the periphery of the product domain 1c'. The boundary 64 is preferably located at a position of 7.5% from the periphery of the product domain 1c' to the inside.
在分界64的位置過於接近產品域1c’的周緣(分界64位於距離周緣低於5%的位置)的情況和分界64的位置距離產品域1c’的周緣過於遠離的情況(分界64位於距離周緣超過10%的位置的情況)中的任一情況下,均有可能無法充分吸附成形後基板1的外周部。 The position of the boundary 64 is too close to the periphery of the product domain 1c' (the boundary 64 is located at a position less than 5% from the periphery) and the position of the boundary 64 is too far from the periphery of the product domain 1c' (the boundary 64 is located at a distance from the periphery) In any of the cases where the position exceeds 10%, the outer peripheral portion of the formed substrate 1 may not be sufficiently adsorbed.
在目前為止的說明中,作為切斷處理的對象物的平板狀工件,舉成形後基板為例進行了說明。不限於此,也可以選擇矽晶圓及化合物半導體晶圓等半導體晶圓、陶瓷基板和玻璃基板等為平板狀工件。這些基板為形成有多個如積體電路的電路元件或如MEMS等功能元件的基板。在這些情況下,被切斷的各個晶片狀構件即相當於產品。平板狀工件也可以是用作各種電子機器的蓋的玻璃板。 In the above description, the flat workpiece as the object to be cut is described as an example of the formed substrate. The present invention is not limited thereto, and a semiconductor wafer such as a germanium wafer or a compound semiconductor wafer, a ceramic substrate, or a glass substrate may be selected as a flat workpiece. These substrates are substrates in which a plurality of circuit elements such as integrated circuits or functional elements such as MEMS are formed. In these cases, each of the wafer-shaped members that are cut is equivalent to a product. The flat workpiece may also be a glass plate used as a cover for various electronic machines.
此外,即使是將使用透光性樹脂一併成形的成形品切斷來製造相當於多個產品的多個光學零件(例如,透鏡)的情況等,也可以適用本發明。此時,成形品即相當於平板狀工件。平板狀工件除了為平板的情況之外,如多個光學元件包括多個凸透鏡的情況般包括凹凸亦可。作為平板狀工件的成形品,只要是切斷一併成形的成形品而製造多個產品時的成形品即可。作為平板狀工件的成形品與製造出的產品為何種產品無關。 In addition, the present invention can be applied to a case where a molded article formed by molding a translucent resin is cut to produce a plurality of optical components (for example, lenses) corresponding to a plurality of products. At this time, the molded article corresponds to a flat workpiece. The flat workpiece may include irregularities as in the case of a plurality of optical elements including a plurality of convex lenses, in addition to the case of a flat plate. The molded article of the flat workpiece may be a molded article in which a plurality of products are produced by cutting the molded article formed separately. The molded article as a flat workpiece has nothing to do with the product to be manufactured.
本發明並不限定於上述的各實施形態,在不脫離本發明的主旨的範圍內,可按照需要,任意且適當變更、選擇來採用。 The present invention is not limited to the above-described embodiments, and may be arbitrarily and appropriately changed and selected as needed within the scope of the gist of the invention.
1‧‧‧成形後基板 1‧‧‧Formed substrate
2‧‧‧基板 2‧‧‧Substrate
2a‧‧‧基板面 2a‧‧‧Substrate surface
2b‧‧‧模面 2b‧‧‧Mold face
3‧‧‧樹脂成形體 3‧‧‧Resin molded body
17a‧‧‧第一切斷台 17a‧‧‧The first cutting table
17b‧‧‧第二切斷台 17b‧‧‧Second cut-off
21‧‧‧工件吸附板 21‧‧‧Workpiece adsorption plate
31‧‧‧底板 31‧‧‧floor
31a‧‧‧基部 31a‧‧‧ base
31b‧‧‧載置部 31b‧‧‧Loading Department
32‧‧‧吸附面部 32‧‧‧Sucking the face
32’‧‧‧吸附面部 32’‧‧·Sucking face
32a‧‧‧內域 32a‧‧‧ 内域
32b‧‧‧外域 32b‧‧‧Outland
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| JP2014217101A JP5897686B1 (en) | 2014-10-24 | 2014-10-24 | Workpiece suction plate, work cutting device, work cutting method, and work suction plate manufacturing method |
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- 2015-10-19 KR KR1020150145372A patent/KR101739199B1/en active Active
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| TWI730150B (en) * | 2016-09-06 | 2021-06-11 | 日商迪思科股份有限公司 | Working clamp table, manufacturing method of porous ceramic suction plate and suction holding system |
| TWI730763B (en) * | 2019-05-24 | 2021-06-11 | 日商Towa股份有限公司 | Suction plate, cutting apparatus, and cutting method |
| TWI868224B (en) * | 2019-09-27 | 2025-01-01 | 日商東京精密股份有限公司 | Cutting device and method |
| TWI799942B (en) * | 2020-09-23 | 2023-04-21 | 日商Towa股份有限公司 | Cutting device and method of manufacturing cut product |
Also Published As
| Publication number | Publication date |
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| JP2016083717A (en) | 2016-05-19 |
| CN105538519A (en) | 2016-05-04 |
| CN105538519B (en) | 2017-07-28 |
| KR20160048659A (en) | 2016-05-04 |
| KR101739199B1 (en) | 2017-05-23 |
| TWI577516B (en) | 2017-04-11 |
| JP5897686B1 (en) | 2016-03-30 |
| MY185297A (en) | 2021-04-30 |
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