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TW201423386A - Keyboard detecting system and method thereof - Google Patents

Keyboard detecting system and method thereof Download PDF

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Publication number
TW201423386A
TW201423386A TW101146930A TW101146930A TW201423386A TW 201423386 A TW201423386 A TW 201423386A TW 101146930 A TW101146930 A TW 101146930A TW 101146930 A TW101146930 A TW 101146930A TW 201423386 A TW201423386 A TW 201423386A
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Taiwan
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test
tested
keyboard
button
buttons
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TW101146930A
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Chinese (zh)
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Shih-Chi Liu
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Inventec Corp
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Abstract

A keyboard detecting system is provided. The system is used to detect a keyboard. The system includes a detecting host and a keyboard press unit. The detecting host generates a detecting signal and receives a press signal generated when a key in the keyboard is pressed. The keyboard press unit is connected to the detecting host. The keyboard press unit presses the keys in the keyboard according to the detecting signal.

Description

鍵盤測試系統及方法 Keyboard test system and method

本發明有關於一種測試系統及其操作方法,且特別是關於一種鍵盤測試系統及其操作方法。 The present invention relates to a test system and method of operation thereof, and more particularly to a keyboard test system and method of operation thereof.

鍵盤廣泛使用於各種電子設備中,以作為電子設備之控制命令或資料輸入之週邊設備。因此,鍵盤之品質優劣及其功能是否可正常操作,將直接影響該電子設備之操作穩定性。 The keyboard is widely used in various electronic devices as a peripheral device for controlling commands or data input of electronic devices. Therefore, whether the quality of the keyboard and its functions can be operated normally will directly affect the operational stability of the electronic device.

傳統上,係以人工方式來對鍵盤按鍵進行測試,即以人工方式逐一按壓鍵盤中之每一個按鍵,由測試程式來進行測試,並由人工判斷測試程式回傳之結果。不但費時費工,且以人工逐一按壓按鍵之測試方式,由於按壓之力道大小不一,或因按鍵鍵帽表面按壓受力不均,極易造成測試程式誤判,甚至需進行重測。再者,透過人工按壓鍵盤之測試方式,亦可能因測試者施力不當,造成鍵盤毀損,嚴重影響鍵盤產品之品質管制。 Traditionally, keyboard keys have been manually tested, that is, each button in the keyboard is manually pressed one by one, tested by a test program, and manually judged by the test program. Not only is it time-consuming and labor-intensive, but also the test method of manually pressing the buttons one by one. Because the force of the pressing force is different, or the pressing force on the surface of the button and the key is uneven, the test program may be misjudged or even retested. Moreover, the test method of manually pressing the keyboard may also cause damage to the keyboard due to improper application of the tester, which seriously affects the quality control of the keyboard product.

因此,本發明之一目的即在於提供一種鍵盤測試系統及其操作方法,以提升鍵盤測試品質。 Therefore, an object of the present invention is to provide a keyboard testing system and an operating method thereof for improving keyboard testing quality.

本發明之一態樣係在提供一種鍵盤測試系統,用以對一待測鍵盤進行測試。此鍵盤測試系統包括:一測試主機以 及一鍵盤按壓裝置。其中測試主機設置有具有若干待測按鍵的一待測鍵盤。鍵盤按壓裝置電性連接測試主機,鍵盤按壓裝置包括一控制單元以及一按壓單元。按壓單元上設置有與此些待測按鍵同時運行一匹配的若干按鈕。測試主機產生一測試命令,控制單元接收到此測試命令後會控制按壓單元,由按壓單元根據此測試命令按壓此些按鈕,進而測試與此些按鈕匹配的待測鍵盤上之待測按鍵,並產生之一按壓訊號傳送回該測試主機。 One aspect of the present invention provides a keyboard testing system for testing a keyboard to be tested. This keyboard test system includes: a test host to And a keyboard pressing device. The test host is provided with a keyboard to be tested having a plurality of buttons to be tested. The keyboard pressing device is electrically connected to the test host, and the keyboard pressing device comprises a control unit and a pressing unit. The pressing unit is provided with a plurality of buttons that match the running of the buttons to be tested at the same time. The test host generates a test command, and after receiving the test command, the control unit controls the pressing unit, and the pressing unit presses the buttons according to the test command, thereby testing the button to be tested on the keyboard to be tested that matches the buttons, and A compression signal is generated and transmitted back to the test host.

依據本發明一實施例,測試主機更具有一判斷功能模組以及一測試功能模組。判斷功能模組,用以判斷待測按鍵否被正常按壓。測試功能模組內建有待測鍵盤之一按鍵測試順序以及一按鍵參數。測試命令至少包括按鍵測試順序。測試功能模組可控制鍵盤按壓裝置根據此按鍵測試順序依序按壓按壓單元的此些按鈕進而測試匹配的待測按鍵來產生按壓訊號。在判斷功能模組判斷與此些按鈕匹配的待測按鍵被正常按壓後,測試功能模組更比對按壓訊號與按鍵參數來判斷與此些按鈕匹配的待測按鍵之輸出是否為預期之輸出。 According to an embodiment of the invention, the test host further has a judgment function module and a test function module. The function module is determined to determine whether the button to be tested is normally pressed. The test function module has a button test sequence and a button parameter of the keyboard to be tested. The test command includes at least the key test sequence. The test function module can control the keyboard pressing device to sequentially press the buttons of the pressing unit according to the button test sequence to test the matched button to be tested to generate a pressing signal. After the function module determines that the button to be tested matched with the buttons is normally pressed, the test function module compares the pressing signal with the button parameters to determine whether the output of the button to be tested matching the buttons is the expected output. .

依據本發明一實施例,鍵盤按壓裝置更包括一提醒裝置,根據待測鍵盤之測試結果,發出對應之信號。 According to an embodiment of the invention, the keyboard pressing device further includes a reminding device, and according to the test result of the keyboard to be tested, a corresponding signal is sent.

本發明之另一態樣係在提供一種鍵盤測試方法,係用以對一待測鍵盤進行測試。此方法包括,首先一測試主機連接至一鍵盤按壓裝置,其中,測試主機包括設置有若干待測按鍵的一待測鍵盤,而鍵盤按壓裝置包括一控制單元、一按壓單元,按壓單元包括與此些待測按鍵同時運行一一匹配的若干按鈕。接著,由測試主機上產生一測試命 令發送至鍵盤按壓裝置。當鍵盤按壓裝置的控制單元接收到測試命令,會根據該測試命令自動按壓按壓單元的該些按鈕,進而測試與按鈕匹配的待測鍵盤上之待測按鍵。接著,判斷該些按鈕匹配的該些待測按鍵否被正常按壓。。當待測按鍵被正常按壓時,判斷此待測按鍵之輸出是否為預期之輸出。當待測按鍵之輸出為預期輸出時,接著,判斷是否所有之待測按鍵均完成測試。若所有之待測按鍵均完成測試,則發出一測試結果。 Another aspect of the present invention provides a keyboard testing method for testing a keyboard to be tested. The method includes first connecting a test host to a keyboard pressing device, wherein the test host includes a keyboard to be tested provided with a plurality of buttons to be tested, and the keyboard pressing device includes a control unit and a pressing unit, and the pressing unit includes The buttons to be tested simultaneously run a number of matching buttons. Then, a test life is generated by the test host. Send to the keyboard press device. When the control unit of the keyboard pressing device receives the test command, the buttons of the pressing unit are automatically pressed according to the test command, and then the button to be tested on the keyboard to be tested matching the button is tested. Then, it is determined whether the buttons to be tested matched by the buttons are normally pressed. . When the button to be tested is normally pressed, it is determined whether the output of the button to be tested is the expected output. When the output of the button to be tested is the expected output, then it is determined whether all the buttons to be tested have completed the test. If all the buttons to be tested have completed the test, a test result is issued.

依據本發明一實施例,本方法更包括當待測按鍵被不正常按壓時,重新產生一測試命令。 According to an embodiment of the invention, the method further comprises regenerating a test command when the button to be tested is pressed abnormally.

依據本發明一實施例,本方法更包括當該待測按鍵之輸出非預期輸出時,發出一測試不合格結果,以及當所有之待測按鍵均完成測試,且此些待測按鍵之輸出為預期輸出時,發出一測試合格結果。 According to an embodiment of the invention, the method further includes: when the output of the button to be tested is unintended, outputting a test failure result, and when all the buttons to be tested are tested, and the output of the button to be tested is A test pass result is issued when the output is expected.

綜合上述所言,本發明之鍵盤測試系統與方法可自動進行待測按鍵盤之按壓與檢測,因此可大幅降低傳統上人工檢測之耗時耗工之情形,以及人工檢測可能之人為誤判。 In summary, the keyboard testing system and method of the present invention can automatically perform pressing and detecting of the keyboard to be tested, thereby greatly reducing the time-consuming and labor-intensive situation of the conventional manual detection, and manually detecting possible human error.

以下為本發明較佳具體實施例以所附圖示加以詳細說明,下列之說明及圖示使用相同之參考數字以表示相同或類似元件,並且在重複描述相同或類似元件時則予省略。 The following description of the preferred embodiments of the invention is in the

第1圖所示為根據本發明一實施例之鍵盤測試系統概略圖。鍵盤測試系統100包括:一測試主機101以及一鍵盤按壓裝置102。其中,當進行鍵盤測試時,測試主機101 會電性連接鍵盤按壓裝置102,以傳輸對應之測試指令給鍵盤按壓裝置102來對一待測鍵盤103上之待測按鍵進行測試。在一實施例,例如透過通用序列匯流排(Universal Serial Bus,USB)將測試主機101與鍵盤按壓裝置102電性連接一起。 1 is a schematic diagram of a keyboard testing system in accordance with an embodiment of the present invention. The keyboard testing system 100 includes a test host 101 and a keyboard pressing device 102. Wherein, when performing a keyboard test, the test host 101 The keyboard pressing device 102 is electrically connected to transmit a corresponding test command to the keyboard pressing device 102 to test the button to be tested on the keyboard 103 to be tested. In one embodiment, the test host 101 is electrically coupled to the keyboard press device 102, such as through a Universal Serial Bus (USB).

測試主機101具有一微處理器1011。微處理器1011具有至少兩功能模組,測試功能模組1012以及判斷功能模組1013。其中,測試功能模組1012,內建有一待測鍵盤103之待測按鍵測試順序以及按鍵參數。當微處理器1011執行此測試功能模組1012時,測試功能模組1012即會根據內建之待測按鍵測試順序控制鍵盤按壓裝置102,據以依此待測按鍵測試順序依序按壓待測鍵盤103上之待測按鍵來進行測試,同時將按壓待測按鍵後產生之按壓訊號與內建之按鍵參數比對判斷按壓之待測按鍵是否正常。而判斷功能模組1013,其係用以判斷待測鍵盤103上被按壓之待測按鍵是否被正常按壓。因為,不正常之按壓會導致測試功能模組1012誤判,因此,本發明在進行按鍵參數比對前會先由微處理器1011執行判斷功能模組1013判斷待測按鍵是否被正常按壓,避免誤判之情況發生。換言之,當判斷功能模組1013判斷一按鍵是被正常按壓後,再由測試功能模組1012根據內建之按鍵參數判斷此按鍵其按壓後之對應輸出是否為預期之按鍵輸出。此外,由於排列在鍵盤上之按鍵可包括數字按鍵、功能按鍵以及特殊符號按鍵等,一使用者可藉由調整測試功能模組1012內建之按鍵測試順序,來針對特定之按鍵進行測試,例如,只針對功能 按鍵進行測試。 Test host 101 has a microprocessor 1011. The microprocessor 1011 has at least two function modules, a test function module 1012 and a judgment function module 1013. The test function module 1012 has a test sequence of the button to be tested and a button parameter of the keyboard 103 to be tested. When the microprocessor 1011 executes the test function module 1012, the test function module 1012 controls the keyboard pressing device 102 according to the built-in test button test sequence, and accordingly presses the test to be tested according to the test sequence of the button to be tested. The button to be tested on the keyboard 103 is tested, and the pressing signal generated after pressing the button to be tested is compared with the built-in button parameter to determine whether the pressed button to be tested is normal. The determining function module 1013 is configured to determine whether the button to be tested pressed on the keyboard 103 to be tested is normally pressed. Because the abnormal pressing will cause the test function module 1012 to misjudge, therefore, the present invention first performs the judgment function module 1013 by the microprocessor 1011 to determine whether the button to be tested is normally pressed before the button parameter comparison is performed, thereby avoiding misjudgment. The situation happened. In other words, when the function module 1013 determines that a button is normally pressed, the test function module 1012 determines whether the corresponding output of the button is the expected button output according to the built-in button parameter. In addition, since the buttons arranged on the keyboard can include digital buttons, function buttons, and special symbol buttons, a user can test a specific button by adjusting the button test sequence built in the test function module 1012, for example, , only for features Press the button to test.

鍵盤按壓裝置102,具有一控制單元1021、一按壓單元1022以及一提醒裝置1023。按壓單元1022具有與待測按鍵同時運行一一匹配的若干按鈕。控制單元1021用以根據測試功能模組1012執行時發出之待測按鍵測試順序,控制按壓單元1022根據此測試順序依序按壓按鈕,進而測試與該按鈕匹配之待測鍵盤103上之待測按鍵。按壓單元亦會回傳待測按鍵按壓後產生之按壓訊號給測試主機101,讓判斷功能模組1013以及測試功能模組1012進行與該按鈕匹配之待測按鍵狀態判斷。提醒裝置1023則是根據測試主機101之判斷結果,發出對應之信號提醒工程人員測試結果。在一實施例中,按壓單元1022,例如為一具有動作桿之電磁伸縮模組,藉由電磁之驅動力使動作桿作伸縮運動,來接觸待測鍵盤103按鍵或不接觸待測鍵盤103按鍵之方式,按壓待測鍵盤103。而控制單元1021,例如可為一8051系列之單晶片,利用矩陣控制之方式控制電磁伸縮模組之作動。提醒裝置1023,例如為一發光系統,藉由顯示不同顏色之燈號來提醒工程人員待測鍵盤103之測試結果。而在另一實施例中,提醒裝置1023亦可為一發聲系統,藉由聲音信號來提醒工程人員待測鍵盤103之測試結果。 The keyboard pressing device 102 has a control unit 1021, a pressing unit 1022, and a reminding device 1023. The pressing unit 1022 has a number of buttons that match the ones to be tested at the same time. The control unit 1021 is configured to control the pressing unit 1022 to sequentially press the button according to the test sequence according to the test sequence of the test button to be tested when the test function module 1012 is executed, and then test the button to be tested on the keyboard 103 to be tested that matches the button. . The pressing unit also returns the pressing signal generated by the pressing of the button to be tested to the test host 101, and the determining function module 1013 and the testing function module 1012 perform the state determination of the button to be tested that matches the button. The reminding device 1023 sends a corresponding signal to alert the engineering personnel to test the result according to the judgment result of the test host 101. In an embodiment, the pressing unit 1022 is, for example, an electromagnetic telescopic module having an action rod, and the driving rod is telescopically moved by the electromagnetic driving force to contact the keyboard 103 to be tested or not to touch the keyboard 103 to be tested. In other words, the keyboard 103 to be tested is pressed. The control unit 1021 can be, for example, a single chip of the 8051 series, and controls the operation of the electromagnetic expansion module by using matrix control. The reminder device 1023, for example, an illumination system, alerts the engineer to test the test result of the keyboard 103 by displaying the lights of different colors. In another embodiment, the reminding device 1023 can also be a sounding system, and the sound signal is used to remind the engineering staff of the test result of the keyboard 103 to be tested.

第2圖所示為根據本發明一實施例利用鍵盤測試系統對一待測鍵盤進行測試之流程圖。請同時參閱第2圖與第1圖。首先於步驟201,開始本發明之測試流程200。於開始前,用來驅動鍵盤測試系統100進行測試之功能模組, 判斷功能模組1013以及測試功能模組1012,可儲存於測試主機101中由微處理器1011執行。接著,於步驟202,測試主機101電性連接鍵盤按壓裝置102,以偵測鍵盤按壓裝置102之狀態,藉以確保鍵盤按壓裝置102可正常運作。在一實施例中,例如透過通用序列匯流排(Universal Serial Bus,USB)將測試主機101與鍵盤按壓裝置102電性連接一起。再於步驟203中,測試主機101透過通用序列匯流排對偵測鍵盤按壓裝置102狀態。再於步驟204判斷鍵盤按壓裝置102之狀態是否正常。在一實施例,是以電氣連結方式,由測試功能模組1012偵測該鍵盤按壓裝置102功能。 2 is a flow chart showing testing of a keyboard to be tested using a keyboard test system in accordance with an embodiment of the present invention. Please also refer to Figure 2 and Figure 1. First in step 201, the test flow 200 of the present invention begins. Before starting, the functional module used to drive the keyboard test system 100 for testing, The judgment function module 1013 and the test function module 1012 can be stored in the test host 101 and executed by the microprocessor 1011. Next, in step 202, the test host 101 is electrically connected to the keyboard pressing device 102 to detect the state of the keyboard pressing device 102, thereby ensuring that the keyboard pressing device 102 can operate normally. In one embodiment, the test host 101 is electrically coupled to the keyboard press device 102, such as through a Universal Serial Bus (USB). In step 203, the test host 101 detects the state of the keyboard pressing device 102 through the universal sequence bus pair. In step 204, it is determined whether the state of the keyboard pressing device 102 is normal. In one embodiment, the function of the keyboard pressing device 102 is detected by the test function module 1012 in an electrical connection manner.

若在步驟204中,判斷出鍵盤按壓裝置102狀態並不正常,例如並未與測試主機101正確連接。則回到步驟203,檢測測試主機101與鍵盤按壓裝置102中之連接是否錯誤,並再次由測試功能模組1012對鍵盤按壓裝置102之狀態進行偵測。反之,若在步驟204中,判斷出鍵盤按壓裝置102之狀態正常,例如已與測試主機101正確連接。則可進行步驟205,由測試主機101傳輸測試命令給鍵盤按壓裝置102來對一待測鍵盤103上之待測按鍵進行測試。當鍵盤按壓裝置102接收到此測試命令後,會於步驟206,按壓按壓單元1022上與待測按鍵一一匹配的按鈕來按壓此待測鍵盤103上之待測按鍵進行測試。在一實施例中,按壓單元1022具有與待測按鍵同時運行之一匹配的若干按鈕,當鍵盤按壓裝置102中之控制單元1021接收測試主機101所傳送出之測試命令,會根據測試功能模組1012 內建之按鍵測試順序,自動按壓按壓單元1022上與待測按鍵匹配的按鈕,進而測試與該按鈕匹配待測鍵盤103上之待測按鍵。 If it is determined in step 204 that the state of the keyboard pressing device 102 is not normal, for example, it is not properly connected to the test host 101. Then, returning to step 203, it is detected whether the connection between the test host 101 and the keyboard pressing device 102 is wrong, and the state of the keyboard pressing device 102 is detected again by the test function module 1012. On the other hand, if it is determined in step 204 that the state of the keyboard pressing device 102 is normal, for example, it has been properly connected to the test host 101. Then, step 205 can be performed, and the test host 101 transmits a test command to the keyboard pressing device 102 to test the button to be tested on the keyboard 103 to be tested. After the keyboard pressing device 102 receives the test command, in step 206, the button on the pressing unit 1022 that matches the button to be tested is pressed to press the button to be tested on the keyboard 103 to be tested for testing. In an embodiment, the pressing unit 1022 has a plurality of buttons that match one of the simultaneous operations of the button to be tested. When the control unit 1021 in the keyboard pressing device 102 receives the test command transmitted by the test host 101, the test function module is 1012 The built-in button test sequence automatically presses a button on the pressing unit 1022 that matches the button to be tested, and then tests the button to match the button to be tested on the keyboard 103 to be tested.

接著於步驟207,測試主機101會判斷待測鍵盤103上待測按鍵之按壓狀態,亦即判斷與此些按鈕匹配之待測按鍵是否被正常按壓。在一實施例中,因為,不正常之按壓會導致測試功能模組1012誤判,因此,本發明在測試功能模組1012進行待測按鍵測試前,會先由微處理器1011執行判斷功能模組1013判斷按鍵是否被正常按壓,避免誤判之情況發生。若於步驟208中,判斷功能模組1013所作之判斷為待測鍵盤103之按鍵是不正常按壓狀況,則執行步驟209,測試主機會發出一重測命令至鍵盤按壓裝置102,對待測鍵盤103之按鍵重新按壓,並於步驟208再次進行按鍵按壓狀態之判斷。反之,若於步驟208中,判斷功能模組1013所作之判斷為待測鍵盤103之按鍵是正常按壓狀況,則進行步驟210,判斷是否所有待測之按鍵均完成測試。在一實施例中,是由測試功能模組1012判斷其所設定之按鍵測試順序是否已被執行完畢。 Next, in step 207, the test host 101 determines the pressed state of the button to be tested on the keyboard 103 to be tested, that is, whether the button to be tested matched with the buttons is normally pressed. In an embodiment, because the abnormal pressing causes the test function module 1012 to be misjudged, the present invention first executes the determining function module by the microprocessor 1011 before the test function module 1012 performs the test of the button to be tested. 1013 determines whether the button is normally pressed to avoid a misjudgment. If it is determined in step 208 that the function of the function module 1013 is that the button of the keyboard 103 to be tested is abnormally pressed, step 209 is executed, and the test host sends a retest command to the keyboard pressing device 102, and the keyboard 103 is to be tested. The button is pressed again, and in step 208, the determination of the button press state is performed again. On the other hand, if it is determined in step 208 that the function of the function module 1013 is that the button of the keyboard 103 to be tested is a normal pressing condition, then step 210 is performed to determine whether all the buttons to be tested have completed the test. In an embodiment, it is determined by the test function module 1012 whether the set key test sequence has been executed.

若於步驟210,判斷出待測鍵盤103尚有待測按鍵未完成測試,則再次執行步驟205,測試主機101傳輸對應之測試命令給鍵盤按壓裝置102繼續對待測鍵盤103進行測試。反之,若於步驟210,判斷出待測鍵盤103上之待測按鍵均已完成測試。則執行步驟211,判斷是否所有待測按鍵通過測試。在一實施例中,是由微處理器101執行測試功能模組1012進行按鍵測試結果之判斷,例如:根據 內建之按鍵參數,判斷被按壓之按鍵,其按壓後對應之輸出是否為預期之按鍵輸出。若於步驟211,判斷出此待測鍵盤103上所有之待測按鍵均通過測試。則執行步驟212,傳送檢驗合格資訊至測試主機101。反之,若於步驟211,判斷出此待測鍵盤103尚有部分之待測按鍵並未通過測試。則執行步驟213,傳送檢驗不合格資訊至測試主機101。在一實施例中,同時可藉由設置於鍵盤按壓裝置102上之提醒裝置1023將檢驗之結果告知工程人員。例如,若提醒裝置1023為一發光系統,則藉由顯示綠顏色燈號來告知工程人員待測鍵盤103之測試結果為合格,藉由顯示紅顏色燈號來告知工程人員待測鍵盤103之測試結果為不合格。最後於步驟214,結束此測試流程。 If it is determined in step 210 that the test button 103 has not yet completed the test, the test host 101 transmits the corresponding test command to the keyboard pressing device 102 to continue testing the keyboard 103. On the other hand, if it is determined in step 210, the test button on the keyboard 103 to be tested has been tested. Then, step 211 is executed to determine whether all the buttons to be tested pass the test. In an embodiment, the test function module 1012 is executed by the microprocessor 101 to perform a button test result, for example, according to The built-in button parameters determine whether the pressed button is pressed or not, and the corresponding output is the expected button output. If it is determined in step 211, all the buttons to be tested on the keyboard 103 to be tested pass the test. Then, in step 212, the verification qualification information is transmitted to the test host 101. On the other hand, if it is determined in step 211, it is determined that some of the buttons to be tested of the keyboard 103 to be tested have not passed the test. Then, in step 213, the verification failure information is transmitted to the test host 101. In an embodiment, the result of the inspection can be notified to the engineer at the same time by the reminding device 1023 provided on the keyboard pressing device 102. For example, if the reminder device 1023 is a lighting system, the engineer is informed by the green color light to indicate that the test result of the keyboard 103 to be tested is qualified, and the engineer is informed of the test of the keyboard 103 by displaying the red color light. The result was unqualified. Finally at step 214, the test flow is ended.

綜上所述,本發明之鍵盤測試系統可自動進行待測按鍵盤之按壓與檢測,因此可大幅降低傳統上人工檢測之耗時耗工之情形,以及人工檢測可能之人為誤判。且於檢測過程中,工程人員可同時從事其他工作,大幅提升工作效能。再者,藉由外設之提醒裝置,更可讓工程人員即時得知檢測之結果,來進行即時之處理。 In summary, the keyboard test system of the present invention can automatically perform pressing and detecting of the keyboard to be tested, thereby greatly reducing the time-consuming and labor-intensive situation of the conventional manual detection, and manually detecting possible human error. In the process of testing, engineers can perform other tasks at the same time, greatly improving work efficiency. Moreover, with the reminder device of the peripheral device, the engineering personnel can immediately know the result of the detection for immediate processing.

雖然本發明已以實施方式揭露如上,然其並非用以限定本發明,任何熟習此技藝者,在不脫離本發明之精神和範圍內,當可作各種之更動與潤飾,因此本發明之保護範圍當視後附之申請專利範圍所界定者為準。 Although the present invention has been disclosed in the above embodiments, it is not intended to limit the present invention, and the present invention can be modified and modified without departing from the spirit and scope of the present invention. The scope is subject to the definition of the scope of the patent application attached.

100‧‧‧鍵盤測試系統 100‧‧‧Keyboard Test System

101‧‧‧測試主機 101‧‧‧Test host

102‧‧‧鍵盤按壓裝置 102‧‧‧Keyboard pressing device

103‧‧‧待測鍵盤 103‧‧‧Test keyboard

1011‧‧‧微處理器 1011‧‧‧Microprocessor

1012‧‧‧測試功能模組 1012‧‧‧Test function module

1013‧‧‧判斷功能模組 1013‧‧‧ judgment function module

1021‧‧‧控制單元 1021‧‧‧Control unit

1022‧‧‧按壓單元 1022‧‧‧ Press unit

1023‧‧‧提醒裝置 1023‧‧‧ reminder device

200‧‧‧測試流程 200‧‧‧Test procedure

201~214‧‧‧步驟 201~214‧‧‧Steps

為讓本發明之上述和其他目的、特徵、優點與實施例 能更明顯易懂,所附圖式之說明如下: The above and other objects, features, advantages and embodiments of the present invention are made. Can be more obvious and easy to understand, the description of the drawing is as follows:

第1圖所示為根據本發明一實施例之鍵盤測試系統概略圖。 1 is a schematic diagram of a keyboard testing system in accordance with an embodiment of the present invention.

第2圖所示為根據本發明一實施例利用鍵盤測試系統對一待測鍵盤進行測試之流程圖。 2 is a flow chart showing testing of a keyboard to be tested using a keyboard test system in accordance with an embodiment of the present invention.

100‧‧‧鍵盤測試系統 100‧‧‧Keyboard Test System

101‧‧‧測試主機 101‧‧‧Test host

102‧‧‧鍵盤按壓裝置 102‧‧‧Keyboard pressing device

103‧‧‧待測鍵盤 103‧‧‧Test keyboard

1011‧‧‧微處理器 1011‧‧‧Microprocessor

1012‧‧‧測試功能模組 1012‧‧‧Test function module

1013‧‧‧判斷功能模組 1013‧‧‧ judgment function module

1021‧‧‧控制單元 1021‧‧‧Control unit

1022‧‧‧按壓單元 1022‧‧‧ Press unit

1023‧‧‧提醒裝置 1023‧‧‧ reminder device

Claims (10)

一種鍵盤測試系統,係用以對一待測鍵盤進行測試,包括:一測試主機,包括:設置有若干待測按鍵的一待測鍵盤;以及一鍵盤按壓裝置,電性連接該測試主機,該鍵盤按壓裝置还包括:一控制單元;以及一按壓單元,該按壓單元包括與該些待測按鍵同時運行一一匹配的若干按鈕;其中,該測試主機用以產生一測試命令,該控制單元接收該測試命令控制該按壓單元,該按壓單元根據該測試命令按壓該些按鈕,進而測試與該些按鈕匹配的待測鍵盤上之待測按鍵,並產生之一按壓訊號傳送回該測試主機。 A keyboard test system for testing a keyboard to be tested, comprising: a test host, comprising: a keyboard to be tested provided with a plurality of buttons to be tested; and a keyboard pressing device electrically connected to the test host, The keyboard pressing device further includes: a control unit; and a pressing unit, the pressing unit includes a plurality of buttons that are matched with the ones to be tested at the same time; wherein the testing host is configured to generate a test command, and the control unit receives The test command controls the pressing unit, and the pressing unit presses the buttons according to the test command, and then tests the button to be tested on the keyboard to be tested that matches the buttons, and generates a pressing signal to be transmitted back to the test host. 如申請專利範圍第1項所述之鍵盤測試系統,其中該測試主機更包括:一判斷功能模組,用以判斷該待測按鍵否被正常按壓;以及一測試功能模組,其中該測試功能模組內建有該待測鍵盤之一按鍵測試順序以及一按鍵參數;其中,該測試命令至少包括該按鍵測試順序,該測試 功能模組控制該鍵盤按壓裝置根據該按鍵測試順序依序按壓該按壓單元的該些按鈕進而測試匹配的該些待測按鍵並產生該按壓訊號,以及在該判斷功能模組判斷該些按鈕匹配的該些待測按鍵被正常按壓後,將該按壓訊號與該按鍵參數進行比對來判斷該些按鈕匹配的該些待測按鍵之輸出是否為預期之輸出。 The keyboard test system of claim 1, wherein the test host further comprises: a judgment function module for determining whether the button to be tested is normally pressed; and a test function module, wherein the test function The module has a button test sequence of the keyboard to be tested and a button parameter; wherein the test command includes at least the button test sequence, the test The function module controls the keyboard pressing device to sequentially press the buttons of the pressing unit according to the button testing sequence to test the matched buttons to be tested and generate the pressing signal, and determine that the buttons match in the determining function module. After the buttons to be tested are normally pressed, the pressing signal is compared with the button parameters to determine whether the outputs of the buttons to be tested matched by the buttons are expected outputs. 如申請專利範圍第1項所述之鍵盤測試系統,其中該鍵盤按壓裝置更包括:一提醒裝置,根據待測鍵盤之測試結果,發出對應之信號。 The keyboard testing system of claim 1, wherein the keyboard pressing device further comprises: a reminding device, and sending a corresponding signal according to the test result of the keyboard to be tested. 如申請專利範圍第3項所述之鍵盤測試系統,其中該提醒裝置為一燈號系統或一發聲系統。 The keyboard testing system of claim 3, wherein the reminding device is a light signal system or a sounding system. 如申請專利範圍第1項所述之鍵盤測試系統,其中該按壓單元為一電磁伸縮模組。 The keyboard testing system of claim 1, wherein the pressing unit is an electromagnetic telescopic module. 一種鍵盤測試方法,係用以對一待測鍵盤進行測試,包括:一測試主機連接至一鍵盤按壓裝置,其中,該測試主機包括設置有若干待測按鍵的一待測鍵盤,該鍵盤按壓裝置包括:一控制單元、一按壓單元,該按壓單元包括與該些待測按鍵同時運行一一匹配的若干按鈕; 由測試主機上產生一測試命令發送至鍵盤按壓裝置;該鍵盤按壓裝置的控制單元接收該測試命令,並根據該測試命令自動按壓該按壓單元的該些按鈕,進而測試與該些按鈕匹配的該待測鍵盤上之待測按鍵;判斷該些按鈕匹配的該些待測按鍵否被正常按壓;當該待測按鍵被正常按壓時,判斷該待測按鍵之輸出是否為一預期輸出;當該待測按鍵之輸出為該預期輸出時,判斷是否所有之待測按鍵均完成測試;以及若所有之待測按鍵均完成測試,發出一測試結果。 A keyboard testing method for testing a keyboard to be tested, comprising: a test host connected to a keyboard pressing device, wherein the testing host comprises a keyboard to be tested provided with a plurality of buttons to be tested, the keyboard pressing device The utility model comprises: a control unit and a pressing unit, wherein the pressing unit comprises a plurality of buttons that are matched with the ones to be tested at the same time; Generating a test command from the test host to the keyboard pressing device; the control unit of the keyboard pressing device receives the test command, and automatically pressing the buttons of the pressing unit according to the test command, thereby testing the button matching the buttons a button to be tested on the keyboard to be tested; determining whether the buttons to be tested matched by the buttons are normally pressed; and when the button to be tested is normally pressed, determining whether the output of the button to be tested is an expected output; When the output of the button to be tested is the expected output, it is judged whether all the buttons to be tested have completed the test; and if all the buttons to be tested have completed the test, a test result is issued. 如申請專利範圍第6項所述之鍵盤測試方法,更包括:當該待測按鍵被不正常按壓時,重新產生一測試命令。 The keyboard testing method of claim 6, further comprising: regenerating a test command when the button to be tested is pressed abnormally. 如申請專利範圍第6項所述之鍵盤測試方法,更包括:當該待測按鍵之輸出非預期輸出時,發出一測試不合格結果。 The keyboard testing method as described in claim 6 further includes: when the output of the button to be tested is unexpectedly outputted, a test failure result is issued. 如申請專利範圍第6項所述之鍵盤測試方法,更包括:當所有之待測按鍵均完成測試,且該些待測按鍵之輸出為預期輸出時,發出一測試合格結果。 For example, the keyboard testing method described in claim 6 further includes: when all the buttons to be tested are tested, and the output of the buttons to be tested is the expected output, a test qualified result is issued. 如申請專利範圍第6項所述之鍵盤測試方法,更包括: 該測試主機包括:一判斷功能模組,用以判斷該待測按鍵否被正常按壓;以及一測試功能模組,其中該測試功能模組內建有該待測鍵盤之一按鍵測試順序以及一按鍵參數;其中,該測試命令至少包括一按鍵測試順序,該測試功能模組控制該鍵盤按壓裝置根據該按鍵測試順序依序按壓該按壓單元的該些按鈕進而測試匹配的該些待測按鍵並產生該按壓訊號,以及在該判斷功能模組判斷該些按鈕匹配的該些待測按鍵正常按壓後,將該按壓訊號與該按鍵參數進行比對來判斷該些待測按鍵之輸出是否為預期之輸出。 For example, the keyboard testing method described in claim 6 of the patent scope further includes: The test host includes: a judgment function module for determining whether the button to be tested is normally pressed; and a test function module, wherein the test function module has a button test sequence of the keyboard to be tested and a test a button parameter; wherein the test command includes at least a button test sequence, the test function module controls the keyboard pressing device to sequentially press the buttons of the pressing unit according to the button test sequence to test the matched buttons to be tested and The pressing signal is generated, and after the determining function module determines that the buttons to be tested matched by the buttons are normally pressed, comparing the pressing signal with the button parameter to determine whether the output of the button to be tested is expected The output.
TW101146930A 2012-12-12 2012-12-12 Keyboard detecting system and method thereof TW201423386A (en)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112084082A (en) * 2020-08-28 2020-12-15 苏州富强科技有限公司 Keyboard detection method
CN116430218A (en) * 2023-04-06 2023-07-14 合肥联宝信息技术有限公司 Keyboard detection method

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112084082A (en) * 2020-08-28 2020-12-15 苏州富强科技有限公司 Keyboard detection method
CN112084082B (en) * 2020-08-28 2023-10-20 苏州富强科技有限公司 Keyboard detection method
CN116430218A (en) * 2023-04-06 2023-07-14 合肥联宝信息技术有限公司 Keyboard detection method

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