TWI453645B - Test device and test method applicable thereto - Google Patents

Description

Test device and test method

The disclosure relates to a test device and a test method therefor.

The production process of the current capacitive touch module includes: testing of a flexible printed circuit board (FPC), testing of a capacitive touch sensing board, and testing of a capacitive touch module.

Typically, FPCs include capacitive touch controllers and related passive components. When testing FPC, it will test whether the circuit on the FPC semi-finished surface mount device (SMD, Surface Mounted Device) is open/short, and test whether the FPC circuit is open/short to ensure that the FPC semi-finished product is good.

Capacitive touch sensing boards contain several capacitive sensing lines with appropriate R/C (resistor/capacitance) values. When the capacitive sensing line of the capacitive touch sensing board has problems such as open/short circuit, the R/C value of the capacitive sensing line changes significantly. Therefore, it is possible to test whether the capacitive touch sensor board is good by detecting the R/C value of the capacitive sensing line.

After the FPC semi-finished product and the capacitive touch sensor board pass the test, the FPC semi-finished product and the capacitive touch sensor board are required to be integrated into a complete capacitive touch module, and then tested for the capacitive touch module. Complete the production process of the capacitive touch module.

In the current production process, before the capacitive touch module is introduced into mass production, engineers must first test samples such as FPC, capacitive touch sensor board and capacitive touch module to obtain relevant test data. . This phase is defined as engineering phase detection.

In the FPC test during the engineering phase, the engineer can burn the required code of the capacitive touch controller to the capacitive touch controller via the personal computer application. The FPC detection command is sent from the personal computer to the capacitive touch controller on the FPC, and the capacitive touch controller automatically tests the working state of the sensing channel and the communication interface of the FPC.

During the detection of the capacitive touch sensor board in the engineering stage, the engineer connects the inductive contact of the FPC to the capacitive touch sensor board to be tested, and sends a capacitive touch sensor board detection command to the FPC via a personal computer application. The capacitive touch controller reads the R/C value of the capacitive touch sensor board by the capacitive touch controller. Production line engineers can obtain the average R/C value by detecting the R/C value of the capacitive sensing line on several capacitive touch sensors, or store the average R/C value of the capacitive sensing line on a personal computer. It is used as a reference for judging the capacitive sensing line on the capacitive touch sensor board.

In the capacitive touch module detection in the engineering stage, the engineer can determine whether the capacitive touch sensor module determines whether the capacitive touch module is based on the R/C value of the capacitive touch sensor panel without manual contact with the capacitive touch module. normal. Alternatively, the engineer can also manually touch the capacitive touch module and then read the capacitive touch module back to the coordinate information by the personal computer to determine whether the capacitive touch module is normal.

However, as described above, in the current technology, since the assistance of the personal computer is required during the test, the test cost is high. In addition, because only one object can be tested at a time, the test speed is slow and the test time is long, which is also to be improved.

The disclosed embodiment relates to a test device for mass production testing This reduces test time and reduces test costs.

According to an exemplary embodiment of the present disclosure, a mass production testing device is provided, including: a main control unit; a plurality of sub-control units coupled to the main control unit; and a plurality of test fixtures coupled to the sub-control units The control unit and the plurality of objects to be tested; and an input unit and an output unit are coupled to the main control unit. The main control unit sends a mass production detection content to the sub control units in response to an input message sent by the input unit, and the sub control unit converts the mass production detection content into a detection program to drive the The test fixtures detect the objects to be tested, and the slave control units convert the information fed back by the objects to be tested into a detection result for returning to the main control unit, and the main control unit outputs a detection state according to the test unit. To the output unit.

According to an exemplary embodiment of the present disclosure, a mass production test method is proposed for use in a mass production test apparatus. The mass production test device includes a main control unit, a plurality of sub-control units coupled to the main control unit, a plurality of test fixtures coupled to the sub-control units and the plurality of test objects, and an input unit and An output unit. The mass production test method includes: the main control unit sends a mass production detection content to the auxiliary control units in response to an input message sent by the input unit; and the sub control unit outputs the mass detection content Converting into a test program to drive the test fixtures to detect the test objects; the slave control units convert one of the information fed back by the test objects into a test result for return to the master control unit; and the master The control unit outputs a detection state to the output unit.

In order to better understand the above and other aspects of the present invention, the following specific embodiments, together with the drawings, are described in detail below:

In the present embodiment, a test apparatus for mass production testing is provided. The test device of the embodiment of the present invention can be used for testing an FPC or a capacitive touch sensor board or a capacitive touch module.

Referring now to Figures 1A and 1B, there is shown a functional block diagram of a production test apparatus in accordance with an embodiment of the present invention. Please refer to Figure 1A and Figure 1B. The mass production test apparatus 100 includes a main control unit 110, sub control units 120(1) to 120(n), test fixtures 130(1) to 130(n), a button 140, and an LCM/LED 150. The test fixtures 130(1) to 130(n) are connected to the object to be tested 160. Button 140 is the input unit and LCM/LED 150 is the output unit.

The main control unit 110 can receive an input message from the button 140 through the input interface to perform mass production detection. The main control unit 110 sends the mass production detection content to each of the sub control units.

The auxiliary control unit 120 detects the corresponding object to be tested with the test fixture 130. The main control unit 110 can retrieve the detection result analyzed by each sub-control unit 120 and output it to the LCM/LED 150. The object to be tested 160 includes, for example but not limited to, an FPC, a capacitive touch sensing module, a capacitive touch module, and the like.

The main control unit 110 includes an input interface 111, an output interface 112, a communication interface 113, and a command encoding unit 114. The main control unit 110 may further include a firmware (not shown) to receive an external update. The input interface 111 is coupled to the button 140 to receive the message transmitted by the button 140. The output interface 112 is coupled to the LCM/LED 150 to display the test results analyzed by the main control unit 110 to the LCM/LED 150. The communication interface 113 of the main control unit 110 is connected to the communication interface 121 of the sub-control unit 120. Command coding unit 114 is used to encode the command, and the encoded command can be transmitted to the sub-control unit 120 through the communication interface 113.

The sub-control unit 120 includes communication interfaces 121 and 122, a memory storage device 123 (which can be updated), an R/C parameter storage unit 124, a detection program encoding unit 125, and a command decoding unit 126. The communication interface 121 of the sub-control unit 120 is connected to the communication interface 113 of the main control unit 110. The communication interface 122 of the sub-control unit 120 is connected to the test fixture 130. The memory storage device 123 stores the code transmitted by the main control unit 110, and the code is to be burned to the object to be tested 160. In this embodiment, if the main control unit 110 commands the sub-control unit 120, the sub-control unit 120 can transmit the program code to the object to be tested 160, thereby shortening the test time. The R/C parameter storage unit 124 stores the R/C parameters transmitted by the main control unit 110. The command decoding unit 126 decodes the encoded command transmitted by the main control unit 110. The detection program encoding unit 125 converts the command decoded by the command decoding unit 126 into a detection program for testing, and sends it to the test fixture 130.

The test fixture 130 includes a communication interface 131, an FPC open/short detection unit 132, a sensing unit 133, and a detection program decoding unit 134. The communication interface 131 of the test fixture 130 is connected to the communication interface 122 of the sub-control unit 120. The FPC open/short detection unit 13 is used to detect whether the FPC has an open/short circuit. The sensing unit 133 is configured to sense the R/C value of the capacitive touch sensing module or the R/C value of the capacitive touch module or the touched coordinate of the capacitive touch module. The detection program decoding unit 134 is configured to decode the detection program transmitted by the sub-control unit 120 for mass production testing.

Under the circumstances, the embodiment of the present invention will be separately explained how to perform mass production testing on the object.

Implementation Mode 1: Testing FPC

The analyte FPC is connected to the test fixture 130. In the embodiment of the present invention, there are n test fixtures 130, so that up to n FPCs can be tested at one time. The main control unit 110 stores the code of the capacitive touch controller (which is located on the FPC) required by the production model in the memory storage device 123 of the sub-control unit 120, and performs the FPC detection in the production line of the production line. The sensing point arrangement order of the production model of the capacitive touch controller is programmed to be transmitted to the sub-control unit 120.

When testing the FPC, in response to a corresponding input key on the button 140 (such as the "FPC test" button) being triggered, the capacitive touch controller code is burned into the capacitive mode of the FPC to be tested. The touch controller, the main control unit 110 reads the state of the sensing channel of the FPC measured by each of the sub-control units 120 (for example, whether the signal line on the FPC is open/short) and the state of the communication interface.

Referring now to Figure 2, there is shown an FPC detection procedure in accordance with an embodiment of the present invention. In step 205, the main control unit sends an FPC detection command. For example, in response to the "FPC Test" button of the button 140 being pressed, the command encoding unit 114 of the main control unit 110 encodes the command and sends an FPC detection command through the communication interface 113.

In step 210, the secondary control unit receives the FPC detection command. For example, the sub-control unit 120 receives the FPC detection command sent by the main control unit 110 through the communication interface 121, and the command decoding unit 126 of the sub-control unit 120 decodes the FPC detection command.

In step 215, the sub-control unit converts to the FPC detection program according to the decoded FPC detection command to drive the test fixture. For example, such as As described above, the detected program encoding unit 125 of the sub-control unit 120 converts the decoded FPC detection command into an FPC detection program.

In step 220, after the test fixture FPC test is completed, the test fixture returns the FPC state to the slave control unit. For example, as described above, the FPC open/short detection unit 132 of the test fixture 130 can detect the channel open/short state of the object to be tested FPC, and transmit the result back to the slave unit 120.

In step 225, the main control unit reads the state of the object to be tested FPC from the sub-control unit. In step 230, the main control unit outputs the test result on the LCM/LED 150. For example, the LCM/LED 150 can include n red LEDs and n green LEDs. If the test result represents that the object to be tested FPC is good, under the control of the main control unit 110, the corresponding green LED is lit, so that the operator can know clearly that the object to be tested FPC is good. Conversely, if the test result represents that the object to be tested FPC is a defective product, the corresponding red LED is lit under the control of the main control unit 110. In addition, the LCM in the LCM/LED 150 can be a simple character type LCD that can perform character display to remind the user of subsequent test steps.

Implementation mode 2: Test capacitive touch sensor board

When testing a capacitive touch sensor board, a known good FPC can be pressed to a capacitive touch sensor board.

Please refer to FIG. 3, which shows a flow chart of detecting a capacitive touch sensing board according to an embodiment of the present invention. In step 305, the main control unit sends a capacitive touch sensor board to detect the command. For example, in response to the "capacitive touch sensor board test" button of the button 140 being pressed, the command encoding unit 114 of the main control unit 110 encodes the command and sends the power through the communication interface 113. The capacitive touch sensor board detects commands.

In step 310, the sub-control unit receives the capacitive touch panel detection command, the details of which are similar to step 210 of FIG. 2, and the details thereof are omitted herein.

In step 315, the sub-control unit converts the capacitive touch sensor board detection command into a capacitive touch sensor board detection program to drive the test fixture, the details of which are similar to step 215 of FIG. 2, The details are omitted here.

In step 320, after the test fixture is tested on the capacitive touch sensor board, the test fixture returns the test information of the capacitive touch sensor board to the auxiliary control unit. For example, the sensing unit 133 of the test fixture 130 can sense the R/C value of the capacitive sensing line of the capacitive touch sensing board of the object to be tested, and transmit the result back to the auxiliary control unit 120.

In step 325, the slave control unit compares the R/C value of the capacitive sensing line of the capacitive touch sensing board of the object to be tested fed back by the test fixture to confirm whether it is within the built-in R/C value range. This built-in R/C value range may exist, for example, in the R/C parameter storage unit 124 of the sub-control unit 120.

In step 330, the main control unit reads a comparison result of the sub-control unit from the sub-control unit. In step 335, the main control unit outputs the test result on the LCM/LED 150.

In addition, in the initial stage of the detection, the capacitive sensing line average R/C value needs to be stored in the R/C parameter storage unit 124 of the sub-control unit 120 to serve as a built-in R/C value range of the capacitive touch sensing board.

Implementation mode 3: test capacitive touch module

When testing a capacitive touch module, it is judged by the test program. The FPC that has been broken is attached to a capacitive touch sensor board that has been judged to be a good product by the detection program to obtain a capacitive touch module of the object to be tested.

In the initial stage of the detection, the average R/C value of the capacitive sensing line obtained in the detection process of the capacitive touch sensing board is stored in the R/C parameter storage unit 124 of the auxiliary control unit, and the capacitive touch sensing is additionally performed. The center coordinate information corresponding to each of the capacitive sensing lines of the upper, lower, left and right borders of the board is also stored in the sub-control unit 120 as a reference value for the subsequent touch test of the capacitive touch sensing board/module.

During the test, the detection can be performed without manual contact with the capacitive touch module. Each sub-control unit reads and determines the R/C value of the capacitive touch sensor board. The main control unit reads the sensing line state of the capacitive touch sensing board of the auxiliary control unit, and outputs the test result via the LCM/LED 150.

Alternatively, the capacitive touch module can be manually touched for detection. The coordinate information reported by the capacitive touch module is read by the auxiliary control unit to determine whether the capacitive touch module is normal.

Please refer to FIG. 4 , which shows a detection flow chart of a test capacitive touch module (manual contactless capacitive touch module) according to an embodiment of the present invention. In step 405, the main control unit sends out the capacitive touch module detection command 1. For example, in response to the "capacitive touch sensor board test" button of the button 140 being pressed, the command encoding unit 114 of the main control unit 110 encodes the command and sends the capacitive touch module detection command through the communication interface 113. .

In step 410, the sub-control unit receives the capacitive touch module detection command 1, the details of which are similar to the step 210 of FIG. 2, and the details thereof are omitted herein.

In step 415, the sub-control unit converts the capacitive touch module detection program 1 according to the decoded capacitive touch module detection command 1 to drive the test fixture, the details of which are similar to step 215 of FIG. Therefore, the details are omitted here.

In step 420, after the test fixture is tested on the capacitive touch module, the test fixture feeds back the test information of the capacitive touch module to the auxiliary control unit. For example, the test fixture 130 feeds back the R/C value of the capacitive sensing line of the capacitive touch module, and transmits the result back to the sub-control unit 120.

In step 425, the slave control unit compares the R/C value of the capacitive sensing line of the capacitive touch module of the object to be tested fed back by the test fixture to confirm whether it is within the R/C value range. The details can be as described above, so it will not be repeated.

In step 430, the master unit reads the comparison result from the slave unit. In step 435, the main control unit outputs the test result on the LCM/LED 150.

Please refer to FIG. 5 , which shows a detection flow chart of a test capacitive touch module (manual contact capacitive touch module) according to an embodiment of the present invention. In step 505, the main control unit sends out the capacitive touch module detection command 2. The details of step 505 can be as described above, and thus will not be repeated here.

In step 510, the sub-control unit receives the capacitive touch module detection command 2, and the details thereof may be as described above, and thus are not repeated herein.

In step 515, the sub-control unit converts the capacitive touch module detection program 2 into a capacitive touch module detection program 2 according to the decoded capacitive touch module detection command 2 to drive the test fixture. The details may be as described above, so Retelling.

In step 520, in response to the touch of the capacitive touch module of the object to be tested, the test fixture returns the touched coordinate value of the capacitive touch module of the object to be tested. Transfer to the sub-control unit.

In step 525, the slave control unit compares the touched coordinate values of the capacitive touch module of the object to be tested fed back by the test fixture to confirm whether it is within the coordinate range of the sensing line.

In step 530, the main control unit reads the coordinate range state of the capacitive touch module of the object to be tested from the auxiliary control unit (that is, whether the touched coordinate value of the capacitive touch module of the auxiliary control unit is in the sensing line. Alignment results within the coordinates of the coordinates). In step 535, the master unit outputs the test result to the LCM/LED 150.

Figure 6 shows a timing diagram of the test operation in accordance with an embodiment of the present invention. It is assumed that the main control unit 110 sends an update code command to the sub-control units 120(1) to 120(n) at intervals of 1 mS (centiseconds) (such as T1 in FIG. 6), and it is known that the present case is not limited thereto. After receiving the command from the main control unit 110, the sub-control units 120(1) to 120(n) perform an update code operation on the test fixtures 130(1) to 130(n). Assume that the time required for the sub-control unit to drive the test fixture to complete the test/burning is 10 seconds (as in Figure 2, T2), and it is not limited to this case. Therefore, in the embodiment of the present invention, it takes only 1 mS*100+10 second to update the code for the test fixtures 130(1)~130(n). It can really shorten the test work time. That is to say, in the embodiment of the present invention, the test for a plurality of objects to be tested can be processed in parallel, thereby shortening the test man-hour.

In short, the mass production test device of the embodiment of the present invention comprises a main control unit and a plurality of sub control units. The main control unit transmits the detection content/detection command, etc., obtains the detection result returned by the sub-control unit, and outputs the detection state. The auxiliary control unit can receive the detection content/detection command sent by the main control unit to be converted into a program required for testing, and test the fixture and the object to be tested (for example, FPC, capacitive type) The touch sensor board and the capacitive touch module are connected. The auxiliary control unit reads the test result/information of the test object returned by the test fixture to determine the returned information of the test object and converts it into a valid test result, and supplies it to the main control unit for the main control unit to output Test results.

The short command information is sent by the main control unit, and the burning or testing work that takes a long time needs to be completed by each sub-control unit to achieve the purpose of shortening the test working hours.

In addition, in order to achieve the test of the sub-control unit and the test fixture, the sub-control unit stores the code information, the R/C average of the capacitive touch sensing line, the frame center coordinate of the capacitive touch sensing line, and the capacitive touch. Information such as the scanning order of the sensing line.

In summary, in the embodiment of the present invention, the use of a simple mass production measuring device can shorten the mass production inspection time of the capacitive touch module in the mass production stage, and reduce the cost of detecting the production equipment.

In summary, although the present invention has been disclosed above by way of example, it is not intended to limit the present invention. Those who have ordinary knowledge in the technical field of the present invention can make various changes and refinements without departing from the spirit and scope of the present case. Therefore, the scope of protection of this case is subject to the definition of the scope of the patent application attached.

100‧‧‧Mass production test device

110‧‧‧Master unit

120(1)~120(n)‧‧‧Senior control unit

130(1)~130(n)‧‧‧Test fixture

140‧‧‧ button

150‧‧‧LCM/LED

160‧‧‧Test object

111‧‧‧Input interface

112‧‧‧ Output interface

113‧‧‧Communication interface

114‧‧‧Command coding unit

121 and 122‧‧‧ communication interface

123‧‧‧Memory storage device

124‧‧‧R/C parameter storage unit

125‧‧‧Test program coding unit

126‧‧‧Command decoding unit

131‧‧‧Communication interface

132‧‧‧FPC open/short detection unit

133‧‧‧Sensor unit

134‧‧‧Detection program decoding unit

205~535‧‧‧Steps

1A and 1B are functional block diagrams of a test apparatus according to an embodiment of the present invention.

Figure 2 shows the FPC detection process in accordance with an embodiment of the present invention.

FIG. 3 is a flow chart showing the detection of the test capacitive touch sensor panel according to the embodiment of the present invention.

FIG. 4 is a flow chart showing the detection of the test capacitive touch module (manual contactless capacitive touch module) according to the embodiment of the present invention.

FIG. 5 is a flow chart showing the detection of the test capacitive touch module (manual contact capacitive touch module) according to the embodiment of the present invention.

Figure 6 shows a timing diagram of the test operation in accordance with an embodiment of the present invention.

100‧‧‧Mass production test device

110‧‧‧Master unit

120(1)~120(n)‧‧‧Senior control unit

130(1)~130(n)‧‧‧Test fixture

140‧‧‧ button

150‧‧‧LCM/LED

160‧‧‧Test object

Claims (15)

A mass production test device includes: a main control unit; a plurality of sub control units coupled to the main control unit; a plurality of test fixtures coupled to the sub control units and the plurality of test objects; An input unit and an output unit are coupled to the main control unit; wherein the main control unit sends a mass production detection content to the sub control unit in response to an input message sent by the input unit, The slave control unit converts the mass production test content into a test program to drive the test fixtures to detect the test objects, and the slave control units convert the information fed back by the test objects into a test result. Returning to the main control unit, the main control unit outputs a detection state to the output unit. The mass production test device of claim 1, wherein the main control unit comprises: an input interface coupled to the input unit; and an output interface coupled to the output unit to display the detection state; A main communication interface is coupled to the sub-control units; and a command encoding unit is configured to encode the mass production detection content. The mass production test device of claim 2, wherein each of the sub-control units includes: a first sub-communication interface coupled to the main control unit; and a second sub-communication interface coupled to the test a code storage unit that stores a code transmitted by the main control unit; a parameter storage unit stores a parameter transmitted by the main control unit; a command decoding unit that decodes the mass production detection content transmitted by the main control unit; and a detection program coding unit that decodes the command A result decoded by the unit is converted into the detection program for delivery to the test fixture. The mass production test device of claim 3, wherein each test fixture comprises: a communication interface coupled to the slave control unit; and an FPC open/short detection unit to detect whether the object to be tested is An open/short circuit; a sensing unit that senses an R/C value or a touched coordinate of the object to be tested; and a detection program decoding unit that decodes the detection program transmitted by the slave control unit to For mass production testing. The mass production test apparatus of claim 4, wherein when the object to be tested is a flexible circuit board, in response to the input unit being triggered, the main control unit encodes a flexible circuit board detection content; The sub-control unit receives and decodes the soft board detection content; the sub-control unit converts the decoded content of the flexible circuit board into a flexible circuit board detection program to drive the test fixture; the test fixture is soft a circuit board test, the test fixture returns a flexible circuit board state to the slave control unit; and the master control unit reads the detection result from the slave control unit to output the The status is detected to the output unit. The mass production test device of claim 4, wherein when the object to be tested is a capacitive touch sensor board, the main control unit sends out a capacitive touch sensor in response to the input unit being triggered. The detection unit receives and decodes the detection content of the capacitive touch sensor board to be converted into a capacitive touch sensor board detection program to drive the test fixture; the test fixture is used for the capacitive touch In the sensor board test, the test fixture feeds back a test information of the capacitive touch sensor board to the slave control unit; the slave control unit compares the test of the capacitive touch sensor board fed back by the test fixture Information to confirm whether it is within a built-in value range; and the main control unit reads the detection result from the sub-control unit to output the detection state to the output unit; wherein, in an initial stage of detection, the main control The unit stores the built-in value range of the capacitive touch sensor board in the slave control unit. The mass production test device of claim 4, wherein when the object to be tested is a capacitive touch module, the main control unit sends out a capacitive touch mode in response to the input unit being triggered. The detection unit receives and decodes the detection content of the capacitive touch module to be converted into a capacitive touch module detection program to drive the test fixture; the test fixture is used for the capacitive touch The module tests and feeds back the capacitor a test information of the touch module to the slave control unit; the slave control unit compares a test information of the capacitive touch module fed back by the test fixture to confirm whether the value is in a built-in value range And the main control unit reads the detection result from the auxiliary control unit to output the detection state to the output unit; wherein, in an initial detection stage, the main control unit replaces the capacitive touch sensor board The average R/C value of the capacitive sensing line is stored in the secondary control unit. The mass production test device of claim 4, wherein when the object to be tested is a capacitive touch module, the main control unit sends out a capacitive touch mode in response to the input unit being triggered. The detection unit receives and decodes the detected content of the capacitive touch module to be converted into a capacitive touch module detection program to drive the test fixture; in response to the capacitive touch module being Touching, the test fixture returns the touched coordinate value of one of the capacitive touch modules to the slave control unit; the slave control unit compares the capacitive touch module fed back by the test fixture The touched coordinate value is used to confirm whether it is within a range of the sensing line coordinate; and the main control unit reads the detection result from the auxiliary control unit to output the detection state to the output unit; wherein, in an initial stage of detection, The main control unit stores a capacitive sensing line average R/C value of the capacitive touch sensing board in the auxiliary control unit, and corresponds the upper, lower, left and right borders of the capacitive touch sensing board. A central coordinate information of each capacitive sensing line is stored in the auxiliary control unit. The mass production test device of claim 1, wherein the main control unit sequentially sends an update code command to the sub control units; and the sub control units sequentially access the main control unit After the program command is updated, an update code action is performed on the test fixtures in sequence to test the objects to be tested in parallel. A mass production test method is applied to a mass production test device, the mass production test device includes a main control unit, a plurality of sub control units coupled to the main control unit, coupled to the plurality of sub control units, and a plurality of a plurality of test fixtures, an input unit and an output unit of the test object, the mass production test method includes: the main control unit sends a mass production test content in response to an input message sent by the input unit To the auxiliary control units; the auxiliary control units convert the mass production detection content into a detection program to drive the test fixtures to detect the test objects; the auxiliary control units will be fed back by the test objects One of the information is converted into a detection result to be returned to the main control unit; and the main control unit outputs a detection state to the output unit. The mass production test method of claim 10, wherein when the object to be tested is a flexible circuit board, in response to the input unit being triggered, the main control unit encodes a soft circuit board detection content; The slave control unit receives and decodes the content of the flexible circuit board detection; The control unit converts the decoded content of the flexible circuit board into a flexible circuit board detection program to drive the test fixture; the test fixture tests the flexible circuit board, and the test fixture returns a flexible circuit board. a status to the slave unit; and the master unit reads the detection result from the slave unit to output the detection status to the output unit. The mass production test method of claim 10, wherein when the object to be tested is a capacitive touch sensor board, the main control unit sends out a capacitive touch sensor in response to the input unit being triggered. The detection unit receives and decodes the detection content of the capacitive touch sensor board to be converted into a capacitive touch sensor board detection program to drive the test fixture; the test fixture is used for the capacitive touch In the sensor board test, the test fixture feeds back a test information of the capacitive touch sensor board to the slave control unit; the slave control unit compares the test of the capacitive touch sensor board fed back by the test fixture Information to confirm whether it is within a built-in value range; and the main control unit reads the detection result from the sub-control unit to output the detection state to the output unit; wherein, in an initial stage of detection, the main control The unit stores the built-in value range of the capacitive touch sensor board in the slave control unit. The mass production test method of claim 10, wherein when the object to be tested is a capacitive touch module, the main control unit sends a capacitive response in response to the input unit being triggered. The touch module detects the content; the auxiliary control unit receives and decodes the detected content of the capacitive touch module to be converted into a capacitive touch module detection program to drive the test fixture; the test fixture has the capacitance The touch module tests and feeds back a test information of the capacitive touch module to the slave control unit; the slave control unit compares a test information of the capacitive touch module fed back by the test fixture To confirm whether it is within a built-in value range; and the main control unit reads the detection result from the sub-control unit to output the detection state to the output unit; wherein, in an initial stage of detection, the main control unit A capacitive sensing line average R/C value of the capacitive touch sensing board is stored in the auxiliary control unit. The mass production test method of claim 10, wherein when the object to be tested is a capacitive touch module, the main control unit sends out a capacitive touch mode in response to the input unit being triggered. The detection unit receives and decodes the detected content of the capacitive touch module to be converted into a capacitive touch module detection program to drive the test fixture; in response to the capacitive touch module being Touching, the test fixture returns the touched coordinate value of one of the capacitive touch modules to the slave control unit; the slave control unit compares the capacitive touch module fed back by the test fixture The touched coordinate value to confirm whether it is within a range of sensor line coordinates; The main control unit reads the detection result from the sub-control unit to output the detection state to the output unit; wherein, in an initial stage of detection, the main control unit averages a capacitive sensing line of the capacitive touch sensing board The R/C value is stored in the auxiliary control unit, and the central coordinate information corresponding to the upper, lower, left and right borders of the capacitive touch sensing board corresponding to each capacitive sensing line is stored in the auxiliary control unit. The mass production test method of claim 10, wherein the main control unit sequentially sends an update code command to the sub control units; and the sub control units sequentially go to the main control unit. After the program command is updated, an update code action is performed on the test fixtures in sequence to test the objects to be tested in parallel.