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TW201204801A - Adhesion film for connecting circuit and usage thereof, circuit connection structure and manufacturing method thereof, and connecting method of circuit member - Google Patents

Adhesion film for connecting circuit and usage thereof, circuit connection structure and manufacturing method thereof, and connecting method of circuit member Download PDF

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Publication number
TW201204801A
TW201204801A TW100120184A TW100120184A TW201204801A TW 201204801 A TW201204801 A TW 201204801A TW 100120184 A TW100120184 A TW 100120184A TW 100120184 A TW100120184 A TW 100120184A TW 201204801 A TW201204801 A TW 201204801A
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TW
Taiwan
Prior art keywords
circuit
film
electrode
particles
adhesive layer
Prior art date
Application number
TW100120184A
Other languages
Chinese (zh)
Inventor
Satoru Mori
Kazuya Sato
Original Assignee
Hitachi Chemical Co Ltd
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Publication date
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Publication of TW201204801A publication Critical patent/TW201204801A/en

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    • H10W72/073
    • H10W72/074
    • H10W72/325
    • H10W72/352
    • H10W72/354
    • H10W74/15

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  • Adhesives Or Adhesive Processes (AREA)
  • Adhesive Tapes (AREA)
  • Electric Connection Of Electric Components To Printed Circuits (AREA)
  • Combinations Of Printed Boards (AREA)
  • Non-Insulated Conductors (AREA)

Abstract

The present invention provides an adhesion film for connecting circuit. The adhesion film for connecting circuit includes: a conductive adhesive layer including an adhesive composition and conductive particles, and an insulative adhesive layer including an adhesive composition and excluding conductive particles. The adhesive composition contained in the insulative adhesive layer includes (a) film formation material, (b) epoxy resin, (c) latent curing agent, and (d) organic microparticles. The organic microparticles are particles consisting of at least one copolymer or complex selected from (meth)acrylic acid alkyl ester-butadiene-styrene copolymer or complex, (meth)acrylic acid alkyl ester-silicone copolymer or complex and silicone-(meth)acrylic acid copolymer or complex.

Description

20120480K 六、發明說明: 【發明所屬之技術領域】 本發明是有關於一種電路連接用接著膜及其使用、電 路連接構造體及其製造方法以及電路構件的連接方法。 【先前技術】 先前’為了將半導體元件連接於基板,特別是液晶等 的平板顯示器(Flat Panel Display,FPD )用的玻璃(giass ) 基板’使用因加熱而固化的熱固性的接著劑膜。 作為熱固性的接著劑膜’含有熱固性樹脂即環氧 (epoxy)樹脂的接著劑膜被廣泛使用,由於環氧樹脂因加 熱而固化之後,成為機械性強度高的聚合物,因此,藉由 上述接著劑膜來牢固地將半導體元件與液晶顯示器 (display)予以連接,可獲得可靠性高的電氣裝置。近年 來’含有能夠以比環氧樹脂更低的溫度來固化的丙烯酸酉旨 的接著劑膜亦逐步被使用。 9 然而,於使用接著劑膜來將玻璃基板與半導體元件予 以連接的情形下’當對接著劑膜進行加熱時,由於半導體 元件有時因熱傳導而被加熱之後發生熱膨脹,因此該半導 體元件會伸展。因此,於加熱結束之後,若整體冷卻,則 伸展的半導體元件會收縮,有時伴隨該收縮’構成FPD的 玻璃基板會發生翹曲等的變形。若玻璃基板發生變形,則 會導致位於已變形的部分的顯示器的顯示影像雜亂。 至今為止,為了抑制翹曲等的變形,各種方法已為人 所知。例如,已提出有使膜介於加熱及加壓工具(t〇〇1) 4 201204801 it:: f :件之間的連接方法(曰本專利特開2006-229124 專;;= 錢進行加熱的方法(曰本 -.wti\ζιζτζζτ^ιτζ 專利第3477367號公報)。 75乃號公報、日本 板的力的㈣來抑制玻璃基 =變形,但存在連接可靠性下降的問題。又,存在如下 =著:膜形;==膜_ 减η 尤其存在如下的傾向,即,隨著破 件的厚度變薄,容易顯著地產生㈣玻 【發明内容】 因此’本發_目的在於提供如下的電# ==^_電路_接著_電路連接= 用接著膜即便當用於將厚度比先 】二: 接可罪性且可抑制玻璃基板的變形,而且成膜】亦=連 二=力過雨,故而電路構件發生變形;而且因在安= 後的電路連接用接著膜中產生彈性率過低的部分^ 接可靠性下降。亦已知··尤其於彈性率局部地過低的=[Technical Field] The present invention relates to an adhesive film for circuit connection, a use thereof, a circuit connection structure, a method of manufacturing the same, and a method of connecting circuit members. [Prior Art] Conventionally, in order to connect a semiconductor element to a substrate, in particular, a glass (giass) substrate for a flat panel display (FPD) such as a liquid crystal, a thermosetting adhesive film which is cured by heating is used. As a thermosetting adhesive film, an adhesive film containing an epoxy resin, which is a thermosetting resin, is widely used. Since the epoxy resin is cured by heating, it becomes a polymer having high mechanical strength. The film is used to firmly connect the semiconductor element to a liquid crystal display, and a highly reliable electric device can be obtained. In recent years, an adhesive film containing an acrylic resin capable of curing at a lower temperature than an epoxy resin has been gradually used. 9 However, in the case where an adhesive film is used to connect the glass substrate and the semiconductor element, when the adhesive film is heated, since the semiconductor element is sometimes heated by heat conduction and then thermally expanded, the semiconductor element is stretched. . Therefore, when the whole is cooled after the completion of the heating, the stretched semiconductor element shrinks, and the glass substrate constituting the FPD may be deformed by warpage or the like. If the glass substrate is deformed, the display image of the display located in the deformed portion may be disordered. Heretofore, various methods have been known for suppressing deformation such as warpage. For example, it has been proposed to connect the film to the heating and pressing tool (t〇〇1) 4 201204801 it:: f : the connection method between the pieces (曰本专利--2006-229124 special;;= money for heating In the method of the Japanese Patent Application No. 3477367, the force of the Japanese plate is suppressed (4) to suppress the glass base = deformation, but there is a problem that the connection reliability is lowered. In particular, there is a tendency that the thickness of the broken piece becomes thinner, and it is easy to produce (4) glass. [Inventive content] Therefore, the present invention aims to provide the following electric# ==^_Circuit_Next_Circuit connection = With the adhesive film, even when used for thickness ratio first]: Convict and can inhibit the deformation of the glass substrate, and film formation] = even two = force rain, Therefore, the circuit member is deformed; and the reliability of the portion where the modulus of elasticity is too low is caused by the adhesive film for the circuit connection after the installation of the lower =. It is also known that the elastic modulus is locally too low.

201204801 . 'U 時’相對向的電極彼此難以使導電粒子保持扁平,因此, 連接可靠性有下降的傾向。 基於上述發現而進一步進行研究,本發明者等發現. 將具有特定的構成的有機微粒子用於電路連接用接著膜, 藉此,可保持高連接可靠性,亦可抑制基材的變形,從而 完成了本發明。 亦即,本發明提供一種電路連接用接著膜,該電路連 接用接著膜包括:含有接著劑組成物及導電粒子的導電性 接著劑層、與含有接著劑域物且*含有導電粒子的絕緣 性接著劑層’絕緣性接著劑層中所含的接著劑組成物包含 (a)成膜材料、(b)環氧樹脂、(c)潛伏性固化劑及 =微粒子,⑷有機微粒子是由選自包含(甲基)丙稀酸 it Γ料乙埽共聚㈣複合物、(甲基)丙埽酸燒基 氧共雜或複合物絲魏_(?基)_酸共聚物 =群組的至少-種聚合物或複合物構成的粒子, 雷用接著膜用以於使第1電路電極及第2電路 態下,將第1電路構件與第2電路構件予 下的第上述第1電路構件在厚度為〇.3顏以 述第2雷2基板的主面上形成有上述第1電路電極,上 主面件在厚度為G.3職以下的第2電路基板的 主面^成有上述第2電路電極。 接著接著膜,則由於在絕緣性 子,因此巾使有特定的⑷有機微粒 貫現具有良好的彈性率的臈。藉此,即便當使 6 201204801,lf 用上述電路連接用接著膜來將包 電路基板的電路構件彼此予:度二:m以下的 件的變形,而且可獲得良好的連接可靠性。 著劑層中的接著劑組成物包含上述(d)有機y緣性接 (a)成膜材料及(b)環氧樹脂,因此,可產:二及 熱性、接著性及成膜性。 生優…的耐 再者’由於電路連接用接著膜包括導電 絕緣性接著劑層該兩個層,因此相對向的電=此容】 :足::粒子,從而可使連接可靠 : 好的連接可靠性。 j獲侍良 =土:明的電路連接用接著膜而言,導 ^可更含有絕緣性粒子。藉此,可維持更優異的連接可 本Ϊ明提供一種電路連接構造體,該電路連接構 Γ構件,在厚度為〇·3 mm以下的第1 主面上形成有第1電路電極;第2電路構件, 以下的第2電路基板的主面上形成有第2 第2電路電極配置為與第1電路電極相對向, L t電極與第1電路電極電性連接;以及連接部,介 路構件與第2電路構件之間,連接部為本發明的 電路連接用接著膜的固化物。 士恭=為如上所制電路連接構频,則由於連接部包含 的電路連接用接著膜的固化物201204801. It is difficult for the electrodes facing each other at 'U-times' to keep the conductive particles flat, and therefore the connection reliability tends to be lowered. The inventors of the present invention have found that the organic fine particles having a specific configuration are used for the bonding film for circuit connection, thereby maintaining high connection reliability and suppressing deformation of the substrate, thereby completing the above research. The invention has been made. In other words, the present invention provides an adhesive film for circuit connection, comprising: a conductive adhesive layer containing an adhesive composition and conductive particles, and an insulating layer containing an adhesive agent and containing conductive particles; The adhesive composition contained in the adhesive layer 'insulating adhesive layer> comprises (a) a film forming material, (b) an epoxy resin, (c) a latent curing agent and = fine particles, and (4) the organic fine particles are selected from the group consisting of Containing (meth)acrylic acid it Γ 埽 埽 ( 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四a particle composed of a polymer or a composite, and a barrier film for using a first circuit member and a second circuit state, wherein the first circuit member and the second circuit member are placed in a thickness of the first circuit member The first circuit electrode is formed on the main surface of the second ray 2 substrate, and the upper surface of the second main circuit board having the thickness of G.3 or less has the second surface. Circuit electrode. Subsequently, the film is adhered to, because of the insulating property, the towel causes the specific (4) organic fine particles to have a good elastic modulus. As a result, even when the bonding film for circuit connection is used, the circuit members of the circuit board are deformed by a degree of two or less, and good connection reliability can be obtained. The adhesive composition in the primer layer contains the above (d) organic y-bonded (a) film-forming material and (b) epoxy resin, and therefore, it can produce heat and adhesion, and film formability. Reliable for the superior... 'Because the connecting film for the circuit connection includes the conductive insulating adhesive layer, the two layers, so the relative electric = this capacity: foot:: particles, so that the connection is reliable: good connection reliability. j is satisfied with the good = soil: the circuit connection of the Ming with the film, the lead can contain more insulating particles. Therefore, it is possible to maintain a more excellent connection. The circuit connection structure is provided, and the circuit is connected to the structure member, and the first circuit electrode is formed on the first main surface having a thickness of 〇·3 mm or less; a circuit member, wherein a second second circuit electrode is disposed on a main surface of the second circuit board, and a second circuit electrode is disposed to face the first circuit electrode, wherein the L t electrode is electrically connected to the first circuit electrode; and a connection portion and a dielectric member The connection portion between the second circuit member and the second circuit member is a cured product of the adhesive film for circuit connection of the present invention. Shi Gong = the connection frequency of the circuit made as described above, because the cured portion of the film for the connection of the circuit included in the connection portion

接構造體内的内部應力控制為低内部應力,從而可U 201204801 生彈性率過低的部分。因此,可抑制電路構件的變形,並 且可實現優異的連接可靠性。 此外,本發明提供一種電路連接構造體的製造方法, »玄電路連接構造體的製造方法包括如下的步驟··使上述本 發明的電路連接用接著膜介於一對電路構件之間而獲得積 層體’上述-對電路構件包括第!電路構件與第2電路構 件上述第1電路構件在厚度為mm以下的第1電路 基板的主面上形成有第i電路電極,上述第2電路構件在 厚度為0.3 mm以下的第2電路基板的主面上形成有第2 電路電極;以輯積層齡行加熱及减 接著膜固化,藉此來形成連接部,上述連接部介於一= 路構件之間’且以使相對向地置的第1 電路電極紐連接的m料路猶魏mi 接構造方法,則可製造出如下的電路連 t體該電路連接構造體可抑制電路構件的變形,並 且可實現優異的連接可靠性。 件的提供—種電路構件的連接方法,該電路構 ==在使第1電路電極與第2電路電極相對向地 置的狀U ’對第1電路構件、第2電路構件以及配晋 構件及第2電路構件之間的本發明的電路連ί 極予以電性熱^f述二第電極與第2電路電 以下龄,Ϊ 4第1電路構件在厚度為G.3 mm 上述第2 *電路基板的主面上形成有上述第1電路電極, 路構件在厚度為0.3 _以下的第2電路基板 8 201204801 , 的主面上形成有上述第2電路電極。 表若為如上所述的電路構件的連接方法,則由於使用本 發明的電路連接用接著㈣固化物來連接電路構件,因 此i即便將固化物内的内部應力控制為低内部應力,亦可 充分地確保相對向的電極之間的導電性。因此,可形成如 下的電路連接構造體,該電路連接構造體可抑制電路構件 的變形,並且具有良好的連接可靠性。 而且,本發明提供一種接著膜的用於電路連接的使 用,,接著膜包括:含有接著劑組成物及導電粒子的導電 性接著,層、與含有接著.成物且不含有導電粒子的絕 ^性接著_,絕雜接著劑層+所含的接著劑組成物包 3 成膜材料、(b)環氧樹脂、(c)潛伏性固化劑及(d) 有機,粒子’(d)有機微粒子是由選自包含(甲基)丙婦酸 =基醋·丁二烯-苯乙烯共聚物或複合物、(曱基)丙烯酸烷基 酯-聚石夕氧共聚物或複合物及聚魏(曱基)丙稀酸共聚物 或複合,的群組的至少—種聚合物或複合物構成的粒子, f述接著膜_於電路連接的使用是在使第1電路電極及 第2電路電極相對向的狀態下,將第1電路構件與第2電 路構件予以·連接,其巾上述第i f路構件在厚度為〇3 mm以下的第1電路基板的主面上形成有上述第1電路電 極上述第2電路構件在厚度為0.3 mm以下的第2電路 基板的主面上形成有上述第2電路電極。 藉由將上述接著膜用於電路連接,即便當使用該連接 膜來將包括厚度為〇·3 mm以下的電路基板的電路構件彼 201204801: ==亦可抑制電路構件的變形,並且可獲得良 當將上述接著膜用於電路 ^ 可更含有絕緣性粒子。藉此,可維持亦 用、==可提供如:的電路連接用接著膜及〜使 a方法7^ 稍用接著膜的電路連接構造體及盆製 ,方法以及電路構件的連接方法,上料 二 :::用於將厚度比先前的電路基板的厚度更薄的= 且可^體疋件予以連接時,亦可維持優異的連接可靠^ ’而且成膜性亦優異。尤其於本 =二:,如下的電路連接用接著臈,該電路連接用 連接時厚度為〇·3 mm以下的電路構件彼此予以 連接時,亦可實現上述效果。 為,本發明之上述和其他目的、特徵和優點能更明顯 明如^文特舉較佳實施例,並配合所附圖式,作詳細說 【實施方式】 明下,根據需要,一面參照圖式,一面詳細地對本發 的較佳實麵態進行說明ϋ本發明並^限定於以 下的實施形態。 、 <電路連接用接著膜> 1〇、首先參照圖1來對本實施形態的電路連接用接著膜 進行說明。圖1是表示本發明的一個實施形態的電路連 用接著膜的模式剖面圖。電路連接用接著膜10包括··含 201204801 ^著劑組成物4b及導電粒子5的導· %、 與形成於導電性接著劑層3b上且含有 二 絕緣性接著劑層W、'且成物4a的 (絕緣性接著劑層) 有時25接著劑層%含有:包含(a)成膜材料(以下, 3Uf」)、⑻環氧樹脂(以下,有時稱為The internal stress in the structure of the joint is controlled to a low internal stress, so that U 201204801 can produce a portion with a low modulus of elasticity. Therefore, deformation of the circuit member can be suppressed, and excellent connection reliability can be achieved. Further, the present invention provides a method of manufacturing a circuit connection structure, and the method for manufacturing a circuit connection structure includes the steps of: forming a laminate layer between the pair of circuit members by the above-described bonding film for circuit connection of the present invention Body 'above-to-circuit components include the first! Circuit member and second circuit member The first circuit member has an i-th circuit electrode formed on a main surface of a first circuit board having a thickness of mm or less, and the second circuit member has a second circuit board having a thickness of 0.3 mm or less. a second circuit electrode is formed on the main surface; the connection layer is heated and the film is cured, thereby forming a connection portion, and the connection portion is interposed between the one-way members and is disposed opposite to each other 1 The circuit of the circuit electrode is connected to the m-path, and the following circuit can be manufactured. The circuit connection structure can suppress deformation of the circuit member and achieve excellent connection reliability. Provided as a method of connecting a circuit member, the circuit structure == a first U-shaped member, a second circuit member, and a matching member in a state in which the first circuit electrode and the second circuit electrode are opposed to each other The circuit of the present invention between the second circuit members is electrically charged, and the second electrode and the second circuit are electrically aged, and the first circuit member has a thickness of G.3 mm. The first circuit electrode is formed on the main surface of the substrate, and the second circuit electrode is formed on the main surface of the second circuit board 8 201204801 having a thickness of 0.3 Å or less. In the connection method of the circuit member as described above, since the circuit member is connected by using the (four) cured product for circuit connection according to the present invention, i can be sufficiently controlled even if the internal stress in the cured product is controlled to a low internal stress. The ground ensures the electrical conductivity between the opposing electrodes. Therefore, a circuit connection structure which can suppress deformation of the circuit member and which has good connection reliability can be formed. Further, the present invention provides use of a bonding film for circuit connection, the film comprising: an electrical conductivity comprising an adhesive composition and conductive particles, followed by a layer, and a composition containing a conductive material and containing no conductive particles. Next, _, the adhesive layer + the adhesive composition contained in the package 3, the film forming material, (b) epoxy resin, (c) latent curing agent and (d) organic, particles '(d) organic fine particles It is selected from the group consisting of (meth)propanoid = vinegar-butadiene-styrene copolymer or composite, (alkyl) acrylate-polyoxan copolymer or composite and poly-wei ( a group of at least one polymer or composite of a group of acrylic acid copolymers or a combination of acrylic acid copolymers, or a combination of a film and a circuit, for use in connecting the first circuit electrode and the second circuit electrode In the state of the first circuit member, the first circuit member is connected to the second circuit member, and the first circuit member has the first circuit electrode formed on the main surface of the first circuit board having a thickness of 〇3 mm or less. The second circuit member is on the second circuit board having a thickness of 0.3 mm or less There are formed on the surface of the second circuit electrodes. By using the above-mentioned adhesive film for circuit connection, even when the connecting film is used, a circuit member including a circuit substrate having a thickness of 〇·3 mm or less can be suppressed, and deformation of the circuit member can be suppressed, and good results can be obtained. When the above-mentioned adhesive film is used for the circuit, it may further contain insulating particles. In this way, it is possible to maintain the use of the film, and to provide a circuit connection structure for the circuit connection, a circuit connection structure for the a method, a method for the use of the film, and a method for connecting the circuit member. Two::: When the thickness is thinner than the thickness of the previous circuit board, and the body member can be connected, the excellent connection reliability can be maintained and the film formation property is also excellent. In particular, this is the case where the following circuit connection is used, and the circuit connection is connected to each other with a circuit member having a thickness of 〇·3 mm or less. The above and other objects, features, and advantages of the present invention will be apparent from the description of the appended claims appended claims The preferred embodiment of the present invention will be described in detail, and the present invention is not limited to the following embodiments. <Continuous film for circuit connection> First, the bonding film for circuit connection of the present embodiment will be described first with reference to Fig. 1 . Fig. 1 is a schematic cross-sectional view showing a circuit-connecting adhesive film according to an embodiment of the present invention. The circuit-connecting adhesive film 10 includes a conductive composition of the composition 04b and the conductive particles 5, and a conductive adhesive layer 3b and a second insulating adhesive layer W, and 4 (Insulating adhesive layer) The adhesive layer % may include (a) a film forming material (hereinafter, 3 Uf) and (8) an epoxy resin (hereinafter, sometimes referred to as

伏性固化劑(以τ,_稱為「⑷ 成为」)及(d)有機微粒子(以下,有時稱 的接著劑組成物4^ ⑷& J 作為(a)成分的成膜材料是聚合物(㈣贿),該聚 合物具有使液狀的ϋ化性樹脂組成_化的仙。使成膜 材料包含於固化性樹脂組成物,藉此,當使固化性樹脂組 成物成形為膜狀時,可獲得不易裂開、不易碎裂及不易黏 連且易於使用的接著劑膜。 作為如上所述的成膜材料,例如可列舉選自包含苯氧 基樹脂、%乙婦曱賴脂、聚苯乙稀樹脂、聚乙婦丁麟 脂、聚賴月旨、聚醯胺樹脂、二甲苯樹脂及聚胺醋樹脂的 群組的至少一種聚合物。這些樹脂中,苯氧基樹脂、聚胺 酉曰樹月曰及聚乙埽丁酸樹脂較佳。這些樹脂與(b)成分之間 的相溶性優異’可使固化之後的電路連接用接著膜10產生 優異的接著性、耐熱性、以及機械強度。 使雙g肖b本紛類與表鹵代醇(epihai〇hydrin )發生反 應直至達到高分子量為止,或使雙官能環氧樹脂與雙官能 苯酚類發生加成聚合反應,藉此來獲得苯氧基樹脂。具體 11 2012048(^ 而吕,於存在鹼金屬氫氧化物等的觸媒的條件下,在非反 ,性溶劑中,U貌〜12CTC的溫度來使丨莫耳的雙官能 苯齡類與0.985莫耳〜1.015莫耳的表鹵代醇發生反應,藉 此’可獲得上述苯氧基樹脂。 #較佳為將㈣紐魏樹脂與雙官能絲賴的調配 當量比設為環氧基/苯酚羥基二丨⑺”〜丨/丨丨來進行獲得苯 氧基樹脂的加成聚合反應。藉此,可使之後的電路連 接用接著膜10的機械特性及熱特性良好。又,較佳為於存 在鹼金屬化合物、有機磷系化合物、以及 合 酮系、内自曰系、以及醇系等的有機溶劑中,將原料固含量 設為50質量份以了,加熱至耽〜細。c來進行上述加成 聚合反應。 作為用以獲得苯氧基樹脂的雙官能環氧樹脂,例如可 列舉雙齡A型環氧樹脂、雙齡F型環氧樹脂、雙齡ad型 環氧樹脂、_ S型環倾脂、鮮二縮水甘_及經甲 基取代的聯苯二縮水甘細。作為雙官能苯賴,可列舉 具有兩個苯雜Μ基的物質,例如對苯二_、雙紛A、 雙紛;F、雙紛AD、雙盼S、雙紛第、經甲基取代的雙酚第、 一羥基聯苯及經甲基取代的二羥基聯苯等的雙酚類。 亦可藉由自由基聚合性的官能基、或其他反應性化合 物來對苯減獅賴改質。可翔地使帛上述各種苯氧 基樹脂’或可組合地使用兩種以上的上述各種苯氧基樹脂。 聚胺醋樹脂是於分子鏈中具有胺基甲酸醋鍵結的彈性 12 20120480丄 f 體’且通常是大致以當量來使飽和聚酯樹脂的活性氫基、 與二異氰酸酯化合物(曱苯二異氰酸酯、二異氰酸酯二苯 基曱燒、六亞曱基二異氰酸酯、苯二亞曱基二異氰酸酯、 以及二異氰酸酯環己基曱烷等)的二異氰酸酯基發生反應 所4于的線性高分子,上述飽和聚酯樹脂是多元酸(對苯二 甲酸、間苯二曱酸、鄰苯二曱酸、琥珀酸、己二酸、壬二 酸、以及癸二酸等)、與二元醇(乙二醇、1,4-丁二醇、1,5_ 戊二醇、1,6-己二醇、二乙二醇、三乙二醇、聚乙二醇、 以及丙二醇等)發生縮合反應而獲得且具有末端羥基。 上述聚胺酯樹脂容易溶解於有機溶劑例如酯系(乙酸 乙酯、乙酸丁酯等)、酮系(曱基乙基酮、環己酮、以及丙 酮等)、芳香族系(曱苯、二曱笨、以及苯等)及氣系(三 氣乙烯、二氣曱烷等)的溶劑。 聚乙烯丁醛樹脂是於分子鏈中具有乙烯縮醛單元的彈 性體,且通常是使乙酸乙_旨聚合,接著進行驗處理之後, 使其與酿(歸、乙駿、祕、以及了轉)發生反應而 獲得的線性高分子。胁本實施形態中所使用的聚乙稀丁 酸樹脂而言’聚合度較佳為〜25GG,丁祕化度較佳 為65 mol%以上。 若聚合度不足7GG,則聚乙稀丁崎脂的凝聚力不 足,導致成膜性下降。若聚合度超過25⑼,騎樹脂進行 壓接時的樹脂流動性不足,無法順利地使導電粒子介於被 黏接體的電極之間’從而難以獲得充分的連接可靠性。又, 若丁縮雜度不足65 mGl%,難基或乙縣的比例増 201204801 、 -----jn 從而難以獲得充分的連接可靠性。 「T 成分的成膜材料的玻璃轉移溫度(以下稱為 。gJ並無特別的限定,但較佳為4〇〇c〜7〇ΐ,更佳為 ’進而較佳為5叱〜7代。若為具有此種Tg 的成膜材料,則藉由彈性變形來將固 内產生的内部應力予以吸收,使電二=: 篁我小,因此,可更確實地使連接可靠性提高。 相對於總質量為100質量份的接著劑組成物如而古, 成=料_配量雛為1G f量份〜5G f量份,更佳為 質置份〜40質量份。使成膜材料的量處於上述範圍,藉 此,可進一步抑制基材的變形(翹曲量),從而提供電氣^ 接性更優異的電路連接用接著膜10。 成膜材料的分子量越大,則越容易獲得成膜性,而且 可大範圍地設定對接著劑組成物4a的流動性產生影響的 熔融黏度。成膜材料的重量平均分子量(Mw)較佳 〜150000,尤佳為10000〜8〇〇〇〇。若該值為5〇〇〇 ‘以上, 則存在易於獲得良好的成膜性的傾向,另一方面,若上述 值為150000以下’則存在容易獲得與其他成分之間的良^ 的相溶性的傾向。 再者,所謂上述「重量平均分子量」,是指依照下述表 1所示的條件且根據凝膠滲透色譜法(Gel PermeationThe voltaic curing agent (referred to as "(4) becomes" in τ, _) and (d) organic fine particles (hereinafter, sometimes referred to as the adhesive composition 4^(4)& J as the component (a), the film-forming material is a polymer (4) Bribes, the polymer has a liquid-like deuterated resin composition, and the film-forming material is contained in the curable resin composition, whereby the curable resin composition is formed into a film shape. An adhesive film which is not easily cleaved, is not easily broken, and which is not easily adhered and which is easy to use can be obtained. As the film forming material as described above, for example, it is selected from the group consisting of a phenoxy resin, a ethoxylated lyophile, and a poly At least one polymer of a group of styrene resin, polyethyl butyl sulfonate, poly lysine, polyamide resin, xylene resin, and polyurethane resin. Among these resins, phenoxy resin, polyamine It is preferable that the eucalyptus eucalyptus and the polyacetic acid butyric acid resin are excellent in compatibility between the resin and the component (b), and it is possible to produce excellent adhesion, heat resistance, and the like for the film-bonding adhesive film 10 after curing. Mechanical strength. Make the double g sb and the epihalohydrin (epiha) I〇hydrin) reacts until a high molecular weight is reached, or an addition polymerization reaction of a bifunctional epoxy resin with a difunctional phenol is carried out to obtain a phenoxy resin. Specifically, 11 2012048 (^ and L, in the presence of a base) Under the conditions of a catalyst such as a metal hydroxide, in a non-reverse solvent, the temperature of the U-~12 CTC is used to make the bifunctional benzoate of the oxime with 0.985 mol to 1.015 mol of epihalohydrin. A reaction occurs, whereby the above phenoxy resin can be obtained. # Preferably, the ratio of the equivalence ratio of the (4) Newwei resin to the difunctional silk is set to be epoxy/phenol hydroxy ruthenium (7)"~丨/丨丨The addition polymerization reaction of the phenoxy resin is carried out, whereby the mechanical properties and thermal properties of the subsequent film-attaching film 10 can be improved. Further, it is preferred to have an alkali metal compound, an organophosphorus compound, and In the organic solvent such as a ketone-based system, an internal fluorene-based system, or an alcohol-based compound, the raw material has a solid content of 50 parts by mass, and is heated to 耽~fine c to carry out the above-mentioned addition polymerization reaction. Oxygenated difunctional epoxy The fat may, for example, be a double-aged A-type epoxy resin, a double-aged F-type epoxy resin, a double-aged ad-type epoxy resin, a _S-type decanted fat, a fresh bis-dihydrate, and a methyl-substituted biphenyl-diene. As a bifunctional benzoic acid, a substance having two benzoindol groups may be mentioned, for example, p-benzoic acid, double diversified A, and double dimer; F, double disentrant AD, double expectant S, double dimer, and a bisphenol such as a methyl-substituted bisphenol, a monohydroxybiphenyl or a methyl-substituted dihydroxybiphenyl. A phenol-reducing lion can also be obtained by a radical polymerizable functional group or other reactive compound. The above various phenoxy resins may be used in combination or two or more kinds of the above various phenoxy resins may be used in combination. The polyurethane resin is an elastic bond having an amino formate urethane bond in a molecular chain. 12 20120480 丄f body 'and usually in an equivalent amount to make the active hydrogen group of the saturated polyester resin, and the diisocyanate compound (nonyl diisocyanate, diisocyanate diphenyl sulfonium, hexamethylene diisocyanate, benzene Two of a fluorenylene diisocyanate, a diisocyanate, a cyclohexyl decane, etc. a linear polymer obtained by reacting an isocyanate group, wherein the saturated polyester resin is a polybasic acid (terephthalic acid, isophthalic acid, phthalic acid, succinic acid, adipic acid, sebacic acid, and Sebacic acid, etc.), and glycol (ethylene glycol, 1,4-butanediol, 1,5-pentanediol, 1,6-hexanediol, diethylene glycol, triethylene glycol, polyethylene) A diol, a propylene glycol or the like is obtained by a condensation reaction and has a terminal hydroxyl group. The polyurethane resin is easily dissolved in an organic solvent such as an ester system (ethyl acetate, butyl acetate, etc.), a ketone system (mercaptoethyl ketone, cyclohexanone, and acetone), and an aromatic system (anthracene, diphenyl). And solvents such as benzene, etc. and gas systems (three-gas ethylene, dioxane, etc.). The polyvinyl butyral resin is an elastomer having an ethylene acetal unit in a molecular chain, and is usually polymerized with acetic acid, and then subjected to a test treatment, and then it is brewed (return, jun, secret, and turn). a linear polymer obtained by a reaction. In the polyethylene acetonate resin used in the present embodiment, the degree of polymerization is preferably ~25 GG, and the degree of cleavage is preferably 65 mol% or more. When the degree of polymerization is less than 7 GG, the cohesive strength of the polyethylene butyl sulphate is insufficient, resulting in a decrease in film formability. When the degree of polymerization exceeds 25 (9), the fluidity of the resin when the resin is pressure-bonded is insufficient, and the conductive particles cannot be smoothly interposed between the electrodes of the bonded body, so that it is difficult to obtain sufficient connection reliability. Moreover, if the enthalpy is less than 65 mGl%, the ratio of the hard base or the county 増 201204801 and -----jn makes it difficult to obtain sufficient connection reliability. The glass transition temperature of the film-forming material of the T component (hereinafter referred to as gJ is not particularly limited, but is preferably 4〇〇c to 7〇ΐ, more preferably 'and more preferably 5叱 to 7th generation). In the case of a film-forming material having such a Tg, the internal stress generated in the solid is absorbed by the elastic deformation, so that the electricity is less than :, so that the connection reliability can be more reliably improved. The amount of the film-forming material is such that the total amount of the film-forming material is 100 parts by mass, and the amount of the film-forming material is more than 10 parts by mass. In the above range, the deformation (warpage amount) of the substrate can be further suppressed, and the adhesive film for circuit connection 10 which is more excellent in electrical connection property can be provided. The larger the molecular weight of the film formation material, the easier the film formation can be obtained. Further, the melt viscosity which affects the fluidity of the adhesive composition 4a can be set in a wide range. The weight average molecular weight (Mw) of the film-forming material is preferably ~150,000, particularly preferably 10,000 to 8 Å. When the value is 5 〇〇〇 ' or more, there is a tendency to obtain good film formability. On the other hand, when the value is 150,000 or less, the compatibility with the other components tends to be easily obtained. The above-mentioned "weight average molecular weight" means according to Table 1 below. The conditions shown and according to gel permeation chromatography (Gel Permeation

Chromatography,GPC),使用標準聚笨乙烯的校準曲線 (calibration curve )來進行測定所得的值。 201204801 [表1] 裝置 --東曹股份—有限公司製造GPC-8020 一 檢測器 --東曹股份有限公司製造RI_8〇2〇 管柱 日立化成工業股份有限公司製造Gelpack --------------- - ----------------- 试料濃度 ---________ 120 mg/3 ml 一 /谷W ---〜______ 四氫呋喃 注入量 壓力 --—60 μΐ ———__ 30 kgf/cm 流量 --~~~___ 1.00ml/min 作為(巧成分的環氧樹脂,可單獨或組合兩種以上地 使用自表氣醇與選自包含雙盼A、雙紛F及雙紛AD等的 群,的至少-種雙生出的雙㈣環氧樹脂、自表氣醇 與,紛棘及㉝巾的-種麟或雜祕衍生出的驗 盤環氧樹^、具有包含萘環的骨架的萘純氧樹脂、以及 縮水甘油胺、縮水甘油醚、聯苯、及脂環式等的於一個分 子内具有兩個以上的縮水甘油基的各種環氧化合物等。根 ^ =質離子(i°n) (Na+、cm或水解性氯等減少 至300 ppm以下的高純度品。 上述環氧樹脂中,由於可廣泛地獲得分子量不同的等 級(grade) ’且可任意地對接著性或反紐等進行, 因此’㈣型縣樹脂較佳^雙_環氧樹脂中,^ 型環氧樹脂尤佳。雙❹型環氧樹脂的黏度低= 氧基樹脂组合地使用,可容易且大範圍地對電 用、 著膜10的流動性進倾定。又,魏F型環氧樹脂^Chromatography, GPC), the value obtained by measurement using a standard polystyrene calibration curve. 201204801 [Table 1] Device--Dongcao Co., Ltd. manufactures GPC-8020 A detector--Dongcao Co., Ltd. manufactures RI_8〇2〇Pipe column Hitachi Chemical Co., Ltd. manufactures Gelpack ------- -------- - ----------------- Sample concentration---________ 120 mg/3 ml One/Valley W ---~______ Tetrahydrofuran injection Pressure---60 μΐ ———__ 30 kgf/cm Flow--~~~___ 1.00ml/min As a (complex epoxy resin), it can be used alone or in combination of two or more. Containing a group of double-awaiting A, double-finged F, and double-distributed AD, at least a pair of twin bis (tetra) epoxy resins, self-evaporating alcohols, and thorns and 33 towels - derived from arbor or miscellaneous An inspection epoxy tree, a naphthalene pure oxygen resin having a skeleton containing a naphthalene ring, and glycidylamine, glycidyl ether, biphenyl, and alicyclic, etc. having two or more glycidyl groups in one molecule Various epoxy compounds, etc.. Roots = mass ions (i°n) (Na+, cm or hydrolyzable chlorine, etc., which are reduced to 300 ppm or less. Among the above epoxy resins, they are widely available. The molecular weight is different grade ' and can be arbitrarily carried out on the adhesion or the reverse, etc., so the '(four) type resin is better ^ double _ epoxy resin, ^ type epoxy resin is particularly good. The viscosity of the resin is low = the oxy resin is used in combination, and the fluidity of the film 10 can be easily and widely used. Further, the Wei F type epoxy resin ^

S 15 201204801 10產生良好 有如下的優點,即’容易使電路連接用接著膜 的黏著性。 相對於總質量為100質量份的接著劑組成物4a而言, 環氧樹脂的調配量較佳為5質量份〜5G f量份,更佳為2〇 質量份〜40質量份。於環氧樹脂的調配量不足5質量份的 情形下,當對電路構件彼此進行壓接時,存在電路連接用 接著膜^的流動性下降的傾向,於環氧樹脂的調配量超過 5〇質置份的情形下’當進行長期保管時,存在電路連接用 接著膜10發生變形的傾向。 作為(C)成分即潛伏性固化劑,例如可列舉味唾系、 醯肼系、、胺倾亞胺及雙氰胺q單獨地使訂述潛伏性 固化劑或可組合地使用兩種以上的上述潛伏性固化劑。而 且’亦可將敎性ID化劑與分解促_、抑刪等加以組 口。再者’ A 了使可使用時間延長,較佳為利用聚胺醋系、 聚酿系的高分子物質等來將潛伏性固化劑予以而實現 相對於100質量份的環氧樹脂而言,潛伏性固化劑的 調配量較佳為10質量份〜 f量份,更佳為刚質量份 叫50質量份。藉此’於固化反應巾,可麟充分的反應 率。若潛伏性固化劑的調配量不足1〇質量份,則無法獲得 充分的反應率,從而存在難以獲得良好的接著強度及連接 電阻的傾向。若潛伏性固化劑的調配量超過2〇〇質量份, 則存在如T賴向’例如電路連接料細丨G的流動性下 降’連接電阻上升,電路連接用接著膜1G的適用期(pot 201204801 life)縮短。 機微粒子是由選自包含__ 基醋-聚錢q物^共聚物或複合物、(曱基)丙烯酸烧 :物的群組的至少-種聚合物或複合物構成的微粒 的分:^ 溶解性低,對於固化性組成物 且有二维六聯致‘、、、77子量為100萬以上的有機微粒子或 八有一維父聯構造的有;i* , 物的分散性進錯此,對於固化性組成 槿:Λ編。再者,此處所謂「具有三維交聯 仏」疋表抑合物鏈具有三_狀構造,例如,利用具 來::ϋ的可與聚合物的反應點鍵結的官能基的交聯劑 ^對具有反應點的聚合物進行處理,藉此來獲得 如上所述的構造的有機微粒子。分子量為⑽萬以上的 ,微粒子及具有三較聯構造的有概粒子較佳為對於溶 劑的溶解性均低。對於溶劑的轉性低的上财機微粒子 更顯著地獲得上述效I再者,根據更顯著地獲得上 效果的觀點,較佳為使用包含分子量為100萬以上或具 三維交聯構造的(曱基)丙烯酸烷基-聚矽氧共聚物、聚矽 -(甲基)丙烯酸共聚物或這些聚合物的複合物的有機微粒 ^ 〇 此外,亦可使用具有核殼(core shell)型的構造且枝 層的組成與殼層的組成不同的有機微粒子作為(d)成八 作為核殼型的有機微粒子,具體而言可列舉以聚石夕氧歸 17S 15 201204801 10 is good. There is an advantage that the adhesion of the adhesive film for circuit connection is easy. The amount of the epoxy resin to be added is preferably 5 parts by mass to 5 parts by mass, more preferably 2 parts by mass to 40 parts by mass, based on 100 parts by mass of the total of the adhesive composition 4a. When the amount of the epoxy resin is less than 5 parts by mass, when the circuit members are pressure-bonded to each other, the fluidity of the film for the connection film tends to decrease, and the amount of the epoxy resin is more than 5 enamel. In the case of the portion, when the long-term storage is performed, the film connecting film 10 tends to be deformed. Examples of the latent curing agent which is the component (C) include, for example, saliva, anthraquinone, an amine imide, and dicyandiamide. The latent curing agent may be used alone or in combination of two or more kinds. The above latent curing agent. Moreover, the sputum ID agent can be combined with decomposition, catalysis, deletion, and the like. In addition, 'A' has a prolonged usable time, and it is preferable to use a polyamine vinegar type, a polymer material of a polystyrene system, etc., and to implement a latent hardening agent, and it is latent with respect to 100 mass part of epoxy resin. The amount of the curing agent is preferably from 10 parts by mass to 10,000 parts by mass, more preferably from 50 parts by mass. By this, the curing reaction towel can be sufficiently reacted. When the amount of the latent curing agent is less than 1 part by mass, a sufficient reaction rate cannot be obtained, and it is difficult to obtain good adhesion strength and connection resistance. When the amount of the latent curing agent is more than 2 parts by mass, there is a case where the T-direction 'for example, the fluidity of the circuit-connecting material fine G is lowered', the connection resistance is increased, and the application period of the film-attaching film 1G is used (pot 201204801) Life) shortened. The machine microparticles are particles composed of at least one polymer or composite selected from the group consisting of __ based vinegar-poly valence copolymer or composite, (mercapto) acrylonitrile: ^ The solubility is low, and there are two or six kinds of organic microparticles or eight one-dimensional parent-linked structures for the curable composition, and the dispersibility of the material is wrong. For the curability composition 槿: Λ编. Further, the "three-dimensionally crosslinked ruthenium" ruthenium chain has a three-form structure, for example, a cross-linker having a functional group bonded to a reaction point of a polymer: The polymer having the reaction site is treated to obtain the organic fine particles of the configuration as described above. When the molecular weight is (10) or more, the fine particles and the general particles having the three comparative structures are preferably low in solubility to the solvent. In the case of the above-mentioned effect I obtain the above effect more effectively, it is preferable to use a molecular weight of 1,000,000 or more or a three-dimensional crosslinked structure. Alkyl-polyoxyalkylene copolymer, polyfluorene-(meth)acrylic acid copolymer or organic fine particles of a composite of these polymers. Further, a core shell type structure may be used and The organic fine particles having different composition of the branch layer and the composition of the shell layer are (d) into eight as the core-shell type organic fine particles, and specifically,

201204801, 'X 酸橡膠作為核來對丙烯酸樹脂進行接枝所得的粒子、及以 丙稀酸共聚物作為核來對丙稀酸樹脂進行接枝所得的粒子 等。又,亦可使用如國際專利公開第2009/051067號小冊 子所揭示的核戎型聚梦氧微粒子、如國際專利公開第 2009/020005號小冊子所揭示的(甲基)丙烯酸烷基酯丁二 烯-苯乙烯共聚物或複合物、(甲基)丙稀酸燒基酯_聚石夕氧共 聚物或複合物及聚矽氧_(甲基)丙烯酸共聚物或複合物等 的有機微粒子、如日本專利特開2002-256037號公報所揭 示的核殼構造聚合物粒子、以及如日本專利特開 2004-18803號公報所揭示的核殼構造的橡膠粒子等。可單 獨地使用一種上述核殼型的絕緣性粒子,亦可組合地使用 兩種以上的上述核设型的絕緣性粒子。再者,此種(d)有 機微粒子的平均粒徑較佳為0 01 μιη〜2μπι左右。 再者,上述「平均粒徑」是指以如下的方式所測定的 值。亦即,利用掃描型電子顯微鏡(SEM( Scanning Ε1_〇η =i_cope) ’ Hitachi,Ltd 製造,產品名:s_8〇〇)來對任 $地選擇的有機微粒子的一次粒子進行觀察(倍率:5000 =)’對該一次粒子的最大徑及最小徑進行測定。將該最大 ^及最小徑的積的平方根設為上述粒子的一次粒徑。接 ί 1針對50個任意地選擇的有機微粒子,以上述方式來對 粒徑進行測定,將一次粒徑的平均值設為平均粒徑。 你/亦同樣地對後述的導電粒子及絕緣性粒子的平均粒 仅進竹測定。 相對於總質量為100質量份的接著劑組成物如而言, 201204801 . -_. _ .rll (d)成分的調配量較佳為60質量份以下更佳為4〇質量 份以下。若有機微粒子的調配量超過6〇質量份,則存在成 膜性及導電粒子5對於電極的密著力下降的傾向。 又,根據用途,接著劑組成物4a例如亦可更含有軟化 劑、抗老化劑、阻燃劑、色素、觸變劑(thi贈〇咖agen〇、 以及石夕烧偶合劑(siianeeGuplingagent)等的添加劑。 (導電性接著劑層) 導電性接著劑層3b中所含的接著劑組成物物只要可 形成為膜狀’且可於電路構件連接時抑制電路構件的變形 即可,該接著劑組成物4b可與絕緣性接著劑们a中所含 的接著劑組錄4a相同’亦可與該接著聽成物如不同。 然而,較佳為以使絕緣性接著劑層3a的流動性大於導電性 接著劑層3b⑽祕的方式,對上述成分的麵及調 進行調整。 於接著劑組成物4b中分散有導電粒子5。由於電路 接用接著膜1G含有導電粒子5,因此,電路電極的位置或 南度的不均因導電粒子5的變形而被吸收,接觸面積辦 加三故而可獲得更穩定的電性連接。X,由於電路連接用日 接著膜10含有導電粒子5,目此,導電粒子5有時可衝破 電路電極表面的氧㈣或鈍態層^發生關 性連接更穩定。 便冤 作為如上所述的導電粒子5,可列舉Au、Ag、Ni、 Cu、以及焊錫等的金屬粒子或雜子等。根據獲得充分的 適用期的觀點,導電粒子5的最外層並非為Ni、Cu等的 201204801,if 過渡金屬類,較佳為AU、Ag、以及麵金屬的貴金屬類, 其中,AU更佳。又,導電粒子5可為利用&等的貴金屬 類來將Νι等的過渡金細的表面予以包覆而成的導電粒 子,亦可為藉由包覆等來將上述金屬等的導通層形成於非 導電性的玻璃、陶瓷(ceramic)、以及塑膠(plastic)等且 將最外層設為貴金屬類的導電粒子。 較佳為使用藉由包覆等來將導通層形成於塑膠而成的 粒子或熱炫融金屬粒子作為導電粒子5。上述粒子因加献 及加壓而具有變形性,因此,可使在連接時與電路電極發 生接觸的接觸面積增加,或可將電路構件的電路端子的厚 度不均予以吸收,從而可使電路連接的可靠性提高。 设置於導電粒子5的最外層的貴金屬類的包覆層的厚 度較佳為1GGA以上。藉此,可充分地使所連接的^路之 間的電阻減小。然:而,於在Ni等的過渡金屬上設置貴 類的包覆層的情形時,該包覆層的厚度較佳為3〇〇入以上。 理由在於··由於在導電粒子5混合分散時產生的貴金 的包覆層的缺鮮,Ni等的過渡金㈣出至接著劑财, 因此,由於該過渡金屬的氧化還原作用而產生游離自由 基,從而使電路連接用接著膜1G的保存穩定性下降。另一 方面’貴金屬類的包覆層的厚度的上限並無制的限制, 但根據製造成本的觀點,較佳為〗μηι以下。 導電粒子5的平均粒徑較佳為必須比藉由電路 接著膜10來連接的電路構件的相鄰接的電極的最小間隔 更小’且於電路電極的高度存在不均的情形時,上述導電201204801, 'X-acid rubber is a particle obtained by grafting an acrylic resin as a core, and particles obtained by grafting an acrylic resin with an acrylic acid copolymer as a core. Further, a core-type polyoxyl microparticle disclosed in the pamphlet of International Patent Publication No. 2009/051067, such as an alkyl (meth)acrylate butadiene disclosed in International Patent Publication No. 2009/020005, may also be used. - styrene copolymer or composite, (meth)acrylic acid alkyl ester _ polyoxetoxy copolymer or composite and polyfluorene-(meth)acrylic acid copolymer or composite organic fine particles, such as The core-shell structure polymer particles disclosed in Japanese Laid-Open Patent Publication No. 2002-256037, and the rubber particles of the core-shell structure disclosed in Japanese Laid-Open Patent Publication No. 2004-18803. One type of the core-shell type insulating particles may be used singly, or two or more types of the above-mentioned core type insulating particles may be used in combination. Further, the average particle diameter of the (d) organic fine particles is preferably about 0 1 μm to about 2 μm. In addition, the above "average particle diameter" means a value measured as follows. In other words, the primary particles of the organic fine particles selected for the ground were observed by a scanning electron microscope (SEM (Scanning Ε1_〇η = i_cope) 'manufactured by Hitachi, Ltd., product name: s_8〇〇) (magnification: 5000) =) 'Measure the maximum and minimum diameters of the primary particles. The square root of the product of the maximum ^ and the minimum diameter is defined as the primary particle diameter of the above particles. In the case of 50 randomly selected organic fine particles, the particle diameter was measured in the above manner, and the average value of the primary particle diameters was defined as the average particle diameter. In the same manner, you can measure the average particle size of the conductive particles and the insulating particles described later. With respect to the adhesive composition having a total mass of 100 parts by mass, for example, the compounding amount of the composition of 201204801 - -. _.rll (d) is preferably 60 parts by mass or less, more preferably 4 parts by mass or less. When the amount of the organic fine particles is more than 6 parts by mass, the film forming property and the adhesion of the conductive particles 5 to the electrode tend to decrease. Further, depending on the application, the adhesive composition 4a may further contain, for example, a softener, an anti-aging agent, a flame retardant, a coloring matter, a thixotropic agent (thi age age age age 以及 以及 以及 以及 以及 以及 以及 以及 以及 以及 以及 si si si si si si si si si si si si si si si si si (Electrically Conductive Adhesive Layer) The adhesive composition contained in the conductive adhesive layer 3b can be formed into a film shape and can suppress deformation of the circuit member when the circuit member is connected. The material 4b may be the same as the adhesive group 4a contained in the insulating adhesives a', and may be different from the subsequent listener. However, it is preferable that the fluidity of the insulating adhesive layer 3a is greater than that of the conductive material. The surface of the above-mentioned component is adjusted in the manner of the adhesive layer 3b (10). The conductive particles 5 are dispersed in the adhesive composition 4b. Since the circuit-attached film 1G contains the conductive particles 5, the position of the circuit electrode The unevenness of the south or the south is absorbed by the deformation of the conductive particles 5, and the contact area is increased to obtain a more stable electrical connection. X, since the circuit 10 for the circuit connection contains the conductive particles 5, the guide The electric particles 5 may be more stable in the case where the oxygen (4) or the passive layer on the surface of the circuit electrode is broken. The conductive particles 5 as described above may be, for example, Au, Ag, Ni, Cu, or solder. From the viewpoint of obtaining a sufficient pot life, the outermost layer of the conductive particles 5 is not 201204801 of Ni, Cu, etc., if transition metals, preferably AU, Ag, and precious metals of a face metal. In addition, the conductive particles 5 may be conductive particles obtained by coating a fine gold-plated surface such as Νι with a noble metal such as & or the like, or by coating or the like. A conductive layer such as a metal is formed of a non-conductive glass, a ceramic, a plastic, or the like, and the outermost layer is a noble metal-based conductive particle. It is preferable to form a conductive layer by coating or the like. The particles formed of plastic or the hot molten metal particles are used as the conductive particles 5. The particles are deformed by addition and pressurization, so that the contact area with the circuit electrode during connection can be increased, or Circuit The thickness of the circuit terminals of the device is absorbed unevenly, and the reliability of the circuit connection can be improved. The thickness of the cladding layer of the noble metal provided on the outermost layer of the conductive particles 5 is preferably 1 GGA or more. The electric resistance between the connected circuits is reduced. However, when a noble cladding layer is provided on a transition metal such as Ni, the thickness of the cladding layer is preferably 3 or more. The reason is that the transition gold of Ni and the like which is generated when the conductive particles 5 are mixed and dispersed is depleted, and the transition gold (IV) such as Ni is released to the next step, so that the transition metal is free due to the redox action of the transition metal. The free radicals lower the storage stability of the circuit-connecting adhesive film 1G. On the other hand, the upper limit of the thickness of the cladding layer of the noble metal is not limited, but it is preferably less than or equal to μηι from the viewpoint of production cost. . It is preferable that the average particle diameter of the conductive particles 5 is smaller than the minimum interval of the adjacent electrodes of the circuit member connected by the circuit subsequent film 10, and the conductive layer is uneven when the height of the circuit electrode is uneven.

201204801 - — II 5的平均粒彳致於該高度的^均。導餘子5的平均 粒徑較佳為1 pm〜l〇 ^ Λ_ μιη更佳為2 μιη〜5 μιη。若平均粒 足μιη貝ij存在如下的傾向,即,無法對應於電路電 極的高度的不紅電路電極之_導電性容易下降,若平 均超過1G μιη ’畴在相鄰接的電路電極之間的絕緣 性容易下降的傾向。 相對於總質量為100質量份的接著劑組成物仆而言, 導,粒子5的調配量較佳設為0.1質量份〜3G質量份,更 佳設為0.1質量份〜20質量份。#此,可防止由過剩的導 電粒子5引起的鄰接電路的短路等。 導電性接著劑層3b可更含有絕緣性粒子。藉此,膜固 化之後的導電性接著劑層内的内部應力進一步被緩和。 八作為如上所述的絕緣性粒子,亦可使用與上述(d)成 分相同的成分,但除此以外,例如亦可使用丙烯酸樹脂、 聚醋、.聚胺酯、聚乙烯丁搭、聚芳醋、聚苯乙烯、丁腈橡 膠(Nitrile Butadiene Rubber ’ NBR)、苯乙稀_丁二烯橡膠 (Styrene Butadiene Rubber,SBR)及聚矽氧改質樹脂等或 含有包含這些物質作為成分的共聚物的有機粒子。又,例 如亦可使用矽土、氧化鋁等的無機粒子。 於導電性接著劑層3b含有絕緣性粒子的情形時,相對 於總質量為100質量份接著劑組成物4b而言,(d)有機微 粒子、絕緣絲子及導電好5的合相^量較佳為8〇 質量份以下’更佳為60質量份以下。若絕緣性粒子及導電 粒子的合tt雕量超過8〇質量份,存錢難及導電粒 21 201204801 . —.—pir 子5對於電極的密著力下降的傾向。 ^緣性接著_ 3a的厚度較佳為12卿〜2()卿,^ =14帅〜16帅。又,導電性接著劑層 =:二更佳為5,〜1―由於各層= 接二=良:此’可使作業性、導電粒子捕捉性及讀 而;電路連接用接著膜1G的厚度較佳為lGjLim〜4〇 μηι。若該厚度不足1〇卿,則存在如下的傾向,即,益法 完全地將被黏接體之間的空間予降 若上述厚度超過4〇啤,則存在如下的傾向,即會::行 壓接時,樹脂會溢出,從而污染周邊零件。 將與絕緣性接著劑層h相關的包含接著劑組成物如 的混合物、與導電性接著劑層3b相關的包含接著劑組成物 4b及導電粒子5的混合物分觀解或分餘有機溶劑來實 見液狀化》周製出塗佈液,將該塗佈液例如塗佈於亲樣性 基材(支持膜)上,以固化劑的活性溫度以下的溫度來將 溶劑予以除去’藉此,可形成絕緣性接著劑層3a及導電性 接著劑層3b。 作為形成絕緣性接著劑層3a及導電性接著劑層3b的 其他方法,可列舉如下的方法,即,分別對絕緣性接著劑 層3a及導電性接著劑層3b的構成成分進行加熱以確保流 動性之後,添加溶劑來形成塗佈液,將該塗佈液塗佈於剝 離性基材上,以固化劑的活性溫度以下的溫度來將溶劑予 以除去。 22 201204801 ' v / ^ vplj 根據使料敝祕々秘著敝錢4b的溶解性 ^的觀點,此時使用的溶劑較佳為芳香族烴系溶劑盘含 氧糸溶劑的混合溶劑。X ’作為剝離性基材,例如可列舉 ( Polyethylene Terephthalate &gt; 7)、聚丙烯、聚乙婦、以及聚醋等的具有雜性及耐溶 劑性的聚合物I尤佳使驗表面處理而 PET膜等。 剝離性基材的厚度|紐為2〇 μιη〜75 μιη。若該厚度不 足20/μηι,則存在如下的傾向,即,於進行臨時壓接時難 乂進行操作,若上述厚度超過75 μιη,則存在於電路連接 用接著膜Η)錢雜基材之Fa1產生捲繞賴的傾向。 、作為電路連接用接著膜10的製法,例如可採用對以上 ,方式形成的導電性接著劑層4b及絕緣性接著劑層如進 行層壓(laminate)的方法、或依序對各層進行塗佈的方法 等的眾所周知的方法。 本實施形態的電路連接用接著膜可用作覆晶玻璃 (Chlp〇nGlass,c0c})等的安裝過程中的將玻璃等比較 硬的基板與半導體元件予以接合的異向導電性接著劑。 一例如’可於使電路連接用接著膜介於玻璃基板及半導 體疋件等的電路構件之間的狀態下進行加熱及加壓,將兩 者所具有的電路電極彼此予以電性連接。此處,當使用有 基板的厚度為0.3 mm以下的電路構件時,翹曲尤其會成 為問題’尤其於此種情形時,可有效果地使用本實施形態 的電路連接用接著膜。 23 201204801 . …——^iir 紅卩’謂如下的接著顧於電路連接麟,該接著 恳lέ有接著劑組成物及導電粒子的導電性接著劑 含有接著劑組成物且*含有導絲子的絕緣性接著 膜:料絕叉f接著劑層中所含的接著劑組成物包含(a)成 =枓、㈤環氧樹脂、⑷潛伏性固化劑及⑷有機微 f 有機錄子是由選自包俯基)_酸院基醋_ 乙稀共聚物或複合物、(甲基)丙稀酸烧基^㈣ 5的、=:复,物及聚錢侧丙稀酸共聚物或複合 路、車技田n聚合物或複合物構成的粒子’上述電 用妓於使第1電路電極及第2電路電極相對向的 上^、成右=在厚度為0.3 mm以下的第1電路基板的主面 電路電極㈣1電路構件、餘厚度為μ 第2雷2電路基板的主面上形成有第2電路電極的 第2電路構件予以電性連接。 路構度=二:= 膜的電路基板的厚度的下限只要;維:各自的 度’則無問題,該下限較佳為。〇5咖 1主馮0.08 mm以上。 相對向地配置的電路構件的電路電極的二二口=置: 於相對向地配置= 之門的狀態下如域及加壓,藉此,可將相對向地配置 24 201204801 、 的電:性連接而獲得電路連接構造體。 2對向地配置的電路電極彼此藉由 :及直接接觸中的-種接觸方式或兩種接觸方式而= &lt;電路連接構造體&gt; 圖2是表示於一對電路構件 態的1路連接嶋膜% =體 的模相_,圖3是絲對圖2卿的積獅 壓而獲得的本實施形態的電路連接0構造體 1UU的模式剖面圖。 圖3所示的電路連接構造體i⑻包括:於玻璃基板ia 乂 1電路基板&gt; 的主面上形成有配線圖案(帅咖)ib 1電路電極)的基板丨(第i電路構件)、於積體電路 (Integrated Circuit,IC)晶片(―)2a (第 2 電路基板) 的主面上形成有凸塊(bump)電極2b (第2電路電極)的 半導體元件2 (第2電路構件)、以及介於基板丨及半導艘 元件2之間的電路連接用接著膜1〇的固化物6&amp;及固化物 6b (連接部)。於電路連接構造體1〇〇中,配線圖案讣及 凸塊電極2b於相對向地配置的狀態下電性連接。 此處,配線圖案lb較佳為由透明導電性材料形成。我 型而吕’將銦-錫氧化物(Indiurn Tin Oxide,ITO)用作遂 明導電性材料。又,凸塊電極2b由具有可作為電極而發揮 功能的程度的導電性的材料(較佳為選自包含金、銀、錫、 25 201204801,,; 鉑族的金屬及IT〇的群組的至少一種材料)形成。 於電路連接構造體100中,相對抗的凸塊電極2b及配 線圖案lb彼此經由導電粒子5而電性連接。亦即,導電粒 子5與凸塊電極2b及配線圖案lb均直接發生接觸,藉此 來將凸塊電極2b及配線圖案lb予以電性連接。 對於電路連接構造體1〇〇而言,由於藉由電路連接用 接著膜10的固化物6a及固化物6b來將基板丨與半導體元 件2予以接合’因此,即便#電路構件的厚度薄(〇3職 以下)時,亦可充分地抑制基板1的勉曲,且可獲得優異 的連接可靠性。 λ 如上所述的電路連接構造體100可經由如下的步驟3 製造。亦即’可藉由如下的製造方法來製造上述電路連4 構造體1GG ’魏造方法包括如下的步驟:使本實施形_ 的電路連翻接著齡於一對電路構件之㈣獲得㈤ 體’該-對電路構件包括在厚度為G3咖以下的 板la (第1電路基板)的主面上形成有配線圖案第 電路電極)的基板1 (第1電路構件)、及在厚度為〇 3 m] 以下的K:晶片2a (第2電路基板)的主面上形成有凸士 電極2b(帛2電路電極)的半導體元件2(第2電 ) 以及對積舰進行加熱及加壓而使魏連接 化’藉此來形成連接部,該連接部介於—對電路 、 且以使相對向地配置的配線_ lb (第丨電 曰 塊電極2b (第2電路電極)電性連接 ^ 構件彼齡以料。 ^將-對電ί 26 201204801. 〇t,if &lt;電路構件的連接方法&gt; 藉由如下的方法來獲得電路連接構造體100,即,於 配線圖案lb及凸塊電極2b相對向祕置的狀態下,對在 ,璃基板la的主面上形成有配線圖案lb的基板i、在1C 日曰片2a的主面上形成有凸塊電極2b的半導體元件2、以 及^於基板1及半導體元件2之間的電路連翻接著膜1〇 進订加熱及加壓,將配線圖案lb及凸塊電極2b予以電性 上述方法可準備以如下的方式形成的積層體綱, 即’在將形成於娜性基材上的電路連制接麵貼人 於基板1上的狀態下進行加熱及加壓,對電路連接用接^ 膜10進行臨時壓接,將剝離性基材予以剝離,接著一 準電路電極’-面將半導體元件2放置於該電路電極,然 後進灯加熱及加壓’基板卜電路連接用接著膜W及半導 體元件2依序積層。 根據電路連接祕著膜1G中的接著·成物如及接 著劑組成物4b的固化性等,適當地調製對上述積層體細 進行加熱及減祕件,使得魏連翻接鶴1()固化 後獲得充分的接著強度。 根據使用有本實施形態的電路連接用接著膜的電路 件的連接方法’即便當電路構件的厚度薄(〇3mm以 亦可抑制電路構件的_,且可獲得良好的連接可靠 [實例] 27 201204801 以下,列舉實例來更具體地對本發明進行說明。然而, 本發明並不限定於這些實例。 (1)電路連接用接著膜的準備 如下所述’準備用以製作導電性接著劑層及絕緣性接 著劑層的各材料。又,稱量出約10 mg的成膜材料,利用 TA Instruments公司製造的DSC裝置(產品名:q1000) 且依據JIS K7121-1987的規定來對成膜材料的Tg進行測 定。 (a) 成分:成膜材料 「FX-316」(東都化成(Tohto Kasei)製造,產品名): 苯氧基樹脂(Tg : 66°C) (b) 成分:環氧樹脂 「EXA-4850-150」(DIC 製造,產品名) 「YL-980」(Yuka-ShellEpoxy 製造,產品名) (c) :潛伏性固化劑 「Novacure」(旭化成化學(Asahi Kasei Chemicals) 製造,產品名) (d) =有機微粒子 「X-52-7030」(信越矽利光(Shin-Etsu Slicone)製 造,產品名):聚矽氧複合物(聚矽氧橡膠與聚矽氧樹脂的 複合物) 「BTA751」(羅門哈斯(Rohm and Haas)製造,產品 名):MBS複合物 「EXL-2655」(羅門哈斯製造,產品名):MBS複合 28 201204801〆 (d),:(d)成分以外的絕緣性粒子 「MSP-N〇5〇」(曰本Nikko Rica製造’產品名).贫 土複合物 「R805」(曰本Aerosil製造,產品名):石夕土 (導電粒子) 「Micropearl AU」(積水化學製造,產品名) (添加劑) 「SH6040」(東麗道康寧(Toray Dow Corning )製造 產品名):矽烷偶合劑 (實例1) &lt;導電性接著劑層&gt; 將30質量份的苯氧基樹脂「fx_316」、分別為10質 量份的環氧樹脂「EXA-4850-150」及「YL-980」、30質量 份的潛伏性固化劑「Novacure」以及1質量份的石夕烧偶合 劑「SH6040」溶解於1〇〇質量份的甲苯之後,添加19質 量份的導電粒子「Micropearl AU」,調製出導電性接著劑 層形成用塗佈液。 使用塗佈襄置((股)康井精機公司製造,產品名:精 :塗佈機)來將上述塗佈液塗佈於單面(塗佈有塗佈液的 PE=被施以脫模處理(中剝離處理)的厚度為50阿的 膜來進行1〇分鐘的熱風乾燥,藉此,於Μ 犋上形成厚度為10 μιη的導電性接著劑層。 &lt;絕緣性接著劑層&gt; 29 201204801 , ,ιχ 將38質直伤的本氧基樹脂「FX-316」、28質量份的環 氧樹脂「YL-980」、18質量份的潛伏性固化劑「N〇vacure」 及1質量份的矽烷偶合劑「SH6040」溶解於1〇〇質量份的 作為溶劑的曱苯之後’添加15質量份的包含聚矽氧複合物 的微粒子「X-52-7030」,調製出絕緣性接著劑層形成用塗 佈液》 與上述同樣地,使用塗佈裝置((股)康井精機公司製 造,產品名:精密塗佈機)來將上述塗佈液塗佈於單面已 被施以脫模處理的厚度為50 μιη的PET膜,以7(TC來進 行1〇分鐘的熱風乾燥,藉此,於PET膜上形成厚度為15㈣ 的絕緣性接著劑層。 &lt;電路連接用接著膜&gt; 緣性接hi 社㈣麟料紐接著劑層與絕 laminat 、進行加熱,一面利用輥層壓機(roller 接著膜 行層壓,獲得厚度為25师的電路連接用 、(實例2〜實例5以及比較例1及比較例2) 製二配比例(質量份)來添加各成分,調 同樣地進,形成用塗佈液,除此以外,與實例1 知作來製作電路連接用接著膜。 30201204801 - The average grain size of II 5 is at this height. The average particle diameter of the guide vane 5 is preferably 1 pm to l 〇 ^ Λ _ μιη more preferably 2 μιη to 5 μιη. If the average particle size ij ij has a tendency that the conductivity of the non-red circuit electrode which cannot correspond to the height of the circuit electrode is likely to decrease, if the average exceeds 1 G μm domain between the adjacent circuit electrodes The insulation tends to be lowered. The amount of the particles 5 to be added is preferably 0.1 parts by mass to 3 parts by mass, more preferably 0.1 parts by mass to 20 parts by mass, based on 100 parts by mass of the total mass of the adhesive composition. # this, it is possible to prevent a short circuit or the like of the adjacent circuit caused by the excessive conductive particles 5. The conductive adhesive layer 3b may further contain insulating particles. Thereby, the internal stress in the conductive adhesive layer after the film is cured is further alleviated. VIII As the insulating particles as described above, the same components as those of the component (d) described above may be used. However, for example, acrylic resin, polyester, polyurethane, polyethylene butadiene, polyaryl vinegar, or the like may be used. Polystyrene, Nitrile Butadiene Rubber 'NBR, Styrene Butadiene Rubber (SBR), polyfluorene-modified resin, etc. or organic containing a copolymer containing these substances as a component particle. Further, for example, inorganic particles such as alumina or alumina can also be used. When the conductive adhesive layer 3b contains insulating particles, (d) the organic fine particles, the insulating filaments, and the conductive phase 5 are compared with respect to the total mass of 100 parts by mass of the adhesive composition 4b. Preferably, it is 8 parts by mass or less, and more preferably 60 parts by mass or less. When the amount of the insulating particles and the conductive particles is more than 8 parts by mass, it is difficult to deposit the conductive particles. 21 201204801 . . . - The tendency of the pir 5 to decrease the adhesion of the electrodes. ^ The edge of the _ 3a thickness is preferably 12 Qing ~ 2 () Qing, ^ = 14 handsome ~ 16 handsome. Further, the conductive adhesive layer =: two is more preferably 5, 〜1 - since each layer = two is good = good: this can make workability, conductive particles capture and read; the thickness of the circuit connecting adhesive film 1G is higher Good for lGjLim~4〇μηι. If the thickness is less than 1 〇, there is a tendency that the benefit method completely reduces the space between the bonded bodies. If the thickness exceeds 4 〇 beer, there is a tendency that: When crimped, the resin will overflow and contaminate surrounding parts. The mixture containing the adhesive composition, such as a mixture of the adhesive composition layer, and the conductive adhesive layer 3b, including the adhesive composition 4b and the conductive particles 5, is divided into a solution or a residual organic solvent. See the liquid solution. The coating liquid is prepared in a week, and the coating liquid is applied, for example, to a substrate (support film), and the solvent is removed at a temperature lower than the activation temperature of the curing agent. The insulating adhesive layer 3a and the conductive adhesive layer 3b can be formed. As another method of forming the insulating adhesive layer 3a and the conductive adhesive layer 3b, a method of heating the constituent components of the insulating adhesive layer 3a and the conductive adhesive layer 3b to ensure flow is exemplified. After the addition, a solvent is added to form a coating liquid, and the coating liquid is applied onto the release substrate, and the solvent is removed at a temperature equal to or lower than the activation temperature of the curing agent. 22 201204801 ' v / ^ vplj The solvent used at this time is preferably a mixed solvent of an aromatic hydrocarbon solvent disk containing an oxonium solvent, from the viewpoint of the solubility of the money 4b. X ' as the exfoliating substrate, for example, a polymer having a hybrid and solvent resistance such as (polyethylene Terephthalate &gt; 7), polypropylene, polyethylene, and polyester, etc. Membrane and the like. The thickness of the peelable substrate | New is 2 〇 μιη to 75 μιη. If the thickness is less than 20/μηι, there is a tendency that it is difficult to perform the temporary pressure bonding, and if the thickness exceeds 75 μm, it is present in the film-attached film F) There is a tendency to wind up. As a method of manufacturing the bonding film 10 for circuit connection, for example, a method of laminating the conductive adhesive layer 4b and the insulating adhesive layer formed as described above, or sequentially coating each layer may be employed. Well-known methods such as methods. The bonding film for circuit connection of the present embodiment can be used as an anisotropic conductive bonding agent for bonding a relatively hard substrate such as glass to a semiconductor element during mounting of a flip-chip glass (Chlp〇n Glass, c0c}). For example, heating and pressurization are performed in a state in which a film for connecting a connection film is interposed between circuit members such as a glass substrate and a semiconductor element, and the circuit electrodes of the two are electrically connected to each other. Here, when a circuit member having a thickness of the substrate of 0.3 mm or less is used, warpage is particularly problematic. In particular, in this case, the bonding film for circuit connection of the present embodiment can be used effectively. 23 201204801 . ...——^iir red 卩 谓 谓 谓 谓 谓 谓 谓 谓 谓 谓 谓 谓 谓 谓 谓 顾 顾 顾 电路 电路 电路 电路 电路 电路 电路 电路 电路 电路 电路 电路 电路 电路 电路 电路 电路 电路 电路 电路 电路 电路 电路 电路 电路 电路 电路 电路Insulating Adhesive Film: The adhesive composition contained in the adhesive layer of the filler is composed of (a) as = 枓, (5) epoxy resin, (4) latent curing agent, and (4) organic micro-f organic recording is selected from Package base) _ acid yard based vinegar _ ethylene copolymer or composite, (meth) acrylic acid burning base ^ (four) 5, =: complex, and money side acrylic copolymer or composite road, "The particles of the vehicle polymer n polymer or composite" are used for the upper side of the first circuit electrode and the second circuit electrode, and the right side of the first circuit board having a thickness of 0.3 mm or less. The surface circuit electrode (four) 1 circuit member and the remaining thickness μ are electrically connected to the second circuit member on which the second circuit electrode is formed on the main surface of the second lightning circuit board. The road structure = two: = the lower limit of the thickness of the circuit board of the film is only required; the dimension: the degree of each is not problematic, and the lower limit is preferably. 〇5 coffee 1 main von 0.08 mm or more. The two or two ports of the circuit electrode of the circuit member disposed oppositely are placed in a state in which the gate is disposed oppositely to the ground, and the pressure is applied, whereby the electricity of the 24 201204801 can be arranged to face each other. Connected to obtain a circuit connection structure. 2 pairs of circuit electrodes arranged in the ground are: and a contact type or a contact mode in direct contact = &lt;circuit connection structure&gt; Fig. 2 shows a 1-way connection in a pair of circuit member states The enamel film % = the mode phase of the body _, and FIG. 3 is a schematic cross-sectional view of the circuit-connected 0 structure body 1UU of the present embodiment obtained by the wire embossing of the lion of FIG. The circuit-connected structure i (8) shown in FIG. 3 includes a substrate 丨 (i-th circuit member) in which a wiring pattern (a ray circuit electrode) is formed on a main surface of a glass substrate ia 乂 1 circuit substrate a semiconductor element 2 (second circuit member) in which a bump electrode 2b (second circuit electrode) is formed on a main surface of an integrated circuit (IC) chip (") 2a (second circuit board), And a cured product 6& and a cured product 6b (connecting portion) of the bonding film 1〇 between the substrate 丨 and the semi-guide boat element 2. In the circuit connection structure 1A, the wiring pattern 讣 and the bump electrode 2b are electrically connected in a state of being disposed opposite to each other. Here, the wiring pattern 1b is preferably formed of a transparent conductive material. I type and use 'Indiurn Tin Oxide (ITO) as a conductive material. Further, the bump electrode 2b is made of a conductive material having a function as an electrode (preferably selected from the group consisting of gold, silver, tin, 25 201204801, a metal of a platinum group, and an IT group). At least one material is formed). In the circuit connection structure 100, the opposing bump electrodes 2b and the wiring patterns 1b are electrically connected to each other via the conductive particles 5. That is, the conductive particles 5 are in direct contact with the bump electrodes 2b and the wiring pattern lb, whereby the bump electrodes 2b and the wiring patterns 1b are electrically connected. In the circuit-connecting structure 1A, the substrate 丨 and the semiconductor element 2 are bonded by the cured product 6a and the cured product 6b of the bonding film 10 for the circuit connection. Therefore, even if the thickness of the #circuit member is thin (〇 When the duty is 3 or less, the distortion of the substrate 1 can be sufficiently suppressed, and excellent connection reliability can be obtained. λ The circuit connection structure 100 as described above can be manufactured via the following step 3. That is, the manufacturing method of the above-mentioned circuit connection 4 GG ' can be manufactured by the following manufacturing method including the following steps: the circuit of the present embodiment is turned over and then the (four) body of a pair of circuit members is obtained. The pair of circuit members includes a substrate 1 (first circuit member) in which a wiring pattern second electrode is formed on a main surface of a board 1a (first circuit board) having a thickness of G3 or less, and a thickness of 〇3 m. The following K: The semiconductor element 2 (second electric) in which the bump electrode 2b (帛2 circuit electrode) is formed on the main surface of the wafer 2a (the second circuit board), and the heating and pressurization of the product ship The connection is formed to form a connection portion which is interposed between the circuit and the wiring _ lb (the second electrode electrode 2b (the second circuit electrode) electrically connected to each other) 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 In the opposite state, the shape of the main surface of the glass substrate la The substrate i having the wiring pattern 1b, the semiconductor element 2 having the bump electrode 2b formed on the main surface of the 1C-day wafer 2a, and the circuit between the substrate 1 and the semiconductor element 2 are connected to the film 1 Heating and pressurizing, electrically connecting the wiring pattern 1b and the bump electrode 2b. The above method can prepare a layered body which is formed in the following manner, that is, 'applied to the circuit connecting surface formed on the substrate Heating and pressurization are performed on the substrate 1, and the connection film for circuit connection 10 is temporarily pressure-bonded to peel off the peelable substrate, and then the semiconductor element 2 is placed on the circuit of the quasi-circuit electrode '-plane The electrode is then heated and pressurized, and the substrate film W and the semiconductor element 2 are sequentially laminated. The adhesion of the substrate and the adhesive composition 4b in the film 1G is connected. By appropriately modulating the above-mentioned laminated body to heat and reduce the secrets, the Weilian flip-over crane 1 () is cured to obtain a sufficient adhesive strength. The connection of the circuit member using the bonding film for circuit connection according to the present embodiment is used. Method The thickness of the circuit member is thin (〇3 mm to suppress the circuit member _, and good connection reliability can be obtained [Example] 27 201204801 Hereinafter, the present invention will be described more specifically by way of examples. However, the present invention is not limited thereto. These examples are as follows: (1) Preparation of an adhesive film for circuit connection is as follows. 'Prepare each material for forming a conductive adhesive layer and an insulating adhesive layer. Further, about 10 mg of a film-forming material is weighed, The Tg of the film-forming material was measured by a DSC apparatus (product name: q1000) manufactured by TA Instruments and in accordance with the regulations of JIS K7121-1987. (a) Ingredients: Film-forming material "FX-316" (manufactured by Tohto Kasei, product name): Phenoxy resin (Tg: 66 °C) (b) Composition: Epoxy resin "EXA-4850- 150" (Manufactured by DIC, product name) "YL-980" (manufactured by Yuka-ShellEpoxy, product name) (c): latent curing agent "Novacure" (manufactured by Asahi Kasei Chemicals, product name) (d) = Organic microparticle "X-52-7030" (manufactured by Shin-Etsu Slicone, product name): poly-oxygenated compound (composite of polyoxyxene rubber and polyoxyl resin) "BTA751" (Solomon) Manufactured by Rohm and Haas, product name): MBS compound "EXL-2655" (manufactured by Rohm and Haas, product name): MBS composite 28 201204801〆(d),: Insulating particles other than (d) "MSP-N〇5〇" ("Nikko Rica" product name). Lean soil complex "R805" (manufactured by Sakamoto Aerosil, product name): Shiki soil (conductive particles) "Micropearl AU" (Sekisui Chemical Manufacturing, Product Name) (Additive) "SH6040" (Toray Dow Corn) (ing) Manufactured product name): decane coupling agent (Example 1) &lt;Electrically conductive adhesive layer&gt; 30 parts by mass of phenoxy resin "fx_316", respectively, 10 parts by mass of epoxy resin "EXA-4850- 150" and "YL-980", 30 parts by mass of latent curing agent "Novacure" and 1 part by mass of Shishi sinter coupling agent "SH6040" dissolved in 1 part by mass of toluene, and then added 19 parts by mass of conductive The particle "Micropearl AU" was prepared to prepare a coating liquid for forming a conductive adhesive layer. The coating liquid was applied to one side using a coating set (manufactured by Kane Seiki Co., Ltd., product name: fine: coater) (PE coated with a coating liquid was subjected to demolding) The film having a thickness of 50 Å in the treatment (intermediate release treatment) was dried by hot air for 1 minute, whereby a conductive adhesive layer having a thickness of 10 μm was formed on the crucible. <Insulating adhesive layer> 29 201204801 , , ιχ The oxy-resin "FX-316" with 28 cases of direct damage, 28 parts by mass of epoxy resin "YL-980", 18 parts by mass of latent curing agent "N〇vacure" and 1 mass After the decane coupling agent "SH6040" was dissolved in 1 part by mass of toluene as a solvent, 15 parts by mass of fine particles "X-52-7030" containing a polyfluorene oxide compound were added to prepare an insulating adhesive. In the same manner as described above, the coating liquid is applied to one side of the coating liquid using a coating device (manufactured by Kane Seiki Co., Ltd., product name: precision coating machine). Molded PET film with a thickness of 50 μm, dried at 7 (TC for 1 minute), borrowed Thus, an insulating adhesive layer having a thickness of 15 (four) was formed on the PET film. <The film for connecting the film> The edge of the bonding layer was bonded with the laminat and heated, and the roll laminator was used. (roller followed by film lamination, obtaining a circuit connection of 25 divisions, (Example 2 to Example 5, and Comparative Example 1 and Comparative Example 2) to prepare a ratio (parts by mass) to add each component, and adjust the same In addition to the coating liquid for forming, it is known as Example 1 to produce an adhesive film for circuit connection.

201204801 . w * w Λ X201204801 . w * w Λ X

[表2] 成分 絕緣性接著劑層 導電性接著劑層 實例 比較例 1 2 3 4 5 1 2 (a) FX-316 38 38 38 38 38 38 38 ---^ 30 (b) EXA-4850-150 - - - - - - - —— 10 YL-980 28 28 28 23 18 28 28 __10 (c) Novacure 18 18 18 18 18 18 18 30 (d) X-52-7030 15 - BTA751 - 15 - - - - EXL-2655 - - 15 - - - - - - - 20 - - - - - - - 30 - - • ⑷’ MSP-N050 15 - • R805 - 15 鱗 Micropearl AU - - 19 SH6040 1 1 1 1 1 1 1 1 (2)電路連接構造體的製作 &lt;基板及半導體元件的準備&gt; 準備於玻璃基板(康寧(Corning) #1737,38 mmx28 mm ’ 厚度為 0.3 mm )的表面形成有 ITO( Indium Tin Oxide ) 的配線圖案(圖案寬度為50 μιη,電極之間的空間為5 μιη) 的基板。準備1C晶片(外形為17 mmxl7 mm,厚度為0.3 mm ’凸塊的大小為50 μηι&gt;&lt;50 μιη,凸塊之間的空間為5〇 μιη ’凸塊高度為15 μιη)作為半導體元件。 &lt;基板及半導體元件的連接&gt; 使用上述實例及比較例中所製作的電路連接用接著 膜,以如下所示的方式來將1C晶片與玻璃基板予以連接。 再者,將由包含陶竟加熱器(ceramic heater)的平台(stage) (150mmxl50mm)及工具(3mmx20mm)構成的加熱 31 pif 201204801 壓接件用於連接。 將電路連接用接著膜(1.5mmx2i)mm)的導電 t f/者2、上的PET膜予以剝離,於80°c、0.98MPa(10 g二)的條件下進行2秒的加熱及加塵 ,藉此來將導電 膜的Ϊ续::貼附於破璃基板。接著’將電路連接用接著 凸_上的ΡΕΤ辭以娜,使1C晶片的 高到遠〜1板神之後,於魏連接祕著膜的實測最 ^條件;二19〇C及凸塊電極面積換算壓力為70MPa 緣性接著#^^晶片上方進行1G秒的加熱及加壓,將絕 緣性接者劑層貼附於Ic晶片 晶片與朗基板進行主連接i由電料制接著膜來對 (3)評價 (成膜性) 臈.二:的=「製:接,接著联的成 ㈣、不-連:成 A:可形成膜 B:無法形成膜 (勉曲) 圖4是表示玻璃基板的翹曲的評 圖。圖4所示的電路連接構造體1〇〇 、莫式剖面 元件2及將基板丨與半導體元件2 =導體 路連接用接著膜UM滅。L表示當將半導體元件2的2 32 201204801 ^υ / ^uplf 的基板1的下表面的高度設為G時,直至與半導體元件2 =中心相隔12.5 mm處為止的基板i的下表面的高度中的 最大值。以L為指標來對組曲進行評價。L的值越小,則 表示勉曲越小。將L的值不足15 μιη的情形設為「a」,將 L的值為15 μηι以上的情形設為「Β」,以兩個階段來進行 評價。將旭曲的評價結果表示於表3中。 又使電路連接構造體的製作過程中的玻璃基板及1C 晶片的厚度分別自〇.3 mm變更至〇 5 mm,按照與上述相 同的順序,使用上述實例及比較例所製作的電路連接用接 著膜來進行連接’製作接合體。對所獲得的接合體的翹曲 進行評價之後,接合體的翹曲均不足15 μιη。 (連接可靠性) 使用已製作的電路連接構造體來對玻璃基板的電路與 半導體元件的電極之間的電阻值進行測定。使用萬用電錶 (multimeter)(裝置名:MLR2卜ETAC公司製造),於溫 度為85t:,濕度為85%RH的1000小時的熱濕度測試 (Thermal Humidity Test,THT )之後進行測定。基於 THT 測試之後的電阻值且依據以下的基準,以A或B該兩個階 段來對連接可靠性進行評價。將各電路連接構造體的測定 結果表示於表3中。 A :不足10Ω B : 10Ω以上 33 201204801 、 •μ· w r[Table 2] Inorganic Insulating Adhesive Layer Conductive Adhesive Layer Example Comparative Example 1 2 3 4 5 1 2 (a) FX-316 38 38 38 38 38 38 38 ---^ 30 (b) EXA-4850- 150 - - - - - - - - 10 YL-980 28 28 28 23 18 28 28 __10 (c) Novacure 18 18 18 18 18 18 18 30 (d) X-52-7030 15 - BTA751 - 15 - - - - EXL-2655 - - 15 - - - - - - - 20 - - - - - - - 30 - - • (4)' MSP-N050 15 - • R805 - 15 Scale Micropearl AU - - 19 SH6040 1 1 1 1 1 1 1 1 (2) Fabrication of circuit connection structure &lt;Preparation of substrate and semiconductor element&gt; ITO (Indium Tin) was formed on the surface of a glass substrate (Corning #1737, 38 mm x 28 mm '0.3 mm thick) Oxide ) The wiring pattern (the pattern width is 50 μηη, and the space between the electrodes is 5 μηη). A 1C wafer (having an outer shape of 17 mm x 17 mm and a thickness of 0.3 mm ′ was used, and the size of the bump was 50 μηι&gt;&lt; 50 μm, and the space between the bumps was 5 μm μ', and the height of the bump was 15 μm) was used as the semiconductor element. &lt;Connection of Substrate and Semiconductor Element&gt; Using the bonding film for circuit connection produced in the above examples and comparative examples, the 1C wafer and the glass substrate were connected as follows. Further, a heating 31 pif 201204801 crimping member composed of a stage (150 mm x 150 mm) and a tool (3 mm x 20 mm) including a ceramic heater was used for connection. The circuit was connected with a conductive film tf/2 of the adhesive film (1.5 mm x 2i) mm, and the PET film was peeled off, and heated and dusted for 2 seconds under the conditions of 80 ° C and 0.98 MPa (10 g 2 ). Thereby, the continuity of the conductive film is attached to: the glass substrate. Then 'connect the circuit with the 凸 以 以 , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , The conversion pressure is 70 MPa. Then, 1 G seconds of heating and pressurization is performed on the top of the wafer, and the insulating connector layer is attached to the Ic wafer wafer and the Lang substrate for main connection i is made of an electric material to form a film. 3) Evaluation (film formation property) 臈. 2: = "System: connection, followed by formation (4), not - connection: formation A: film formation B: film formation (distortion) Figure 4 is a glass substrate The circuit connection structure shown in Fig. 4, the Mohs cross-section element 2, and the substrate 丨 and the semiconductor element 2 = conductor path connection film UM are extinguished. L indicates when the semiconductor element 2 is to be used. 2 32 201204801 ^ υ / ^uplf The height of the lower surface of the substrate 1 is set to G, the maximum value of the height of the lower surface of the substrate i up to 12.5 mm from the center of the semiconductor element 2 = center. The index is used to evaluate the composition. The smaller the value of L, the smaller the distortion is. The case where the value of L is less than 15 μηη "A", the situation is more than 15 μηι L is set to "Β" to be evaluated in two stages. The evaluation results of the Xuqu are shown in Table 3. Further, the thicknesses of the glass substrate and the 1C wafer in the process of manufacturing the circuit-connected structure were changed from 33 mm to 〇5 mm, respectively, and the circuit connection was made using the above-described examples and comparative examples in the same order as described above. The film is joined to make a joint. After the warpage of the obtained joined body was evaluated, the warpage of the joined body was less than 15 μm. (Connection reliability) The resistance value between the circuit of the glass substrate and the electrode of the semiconductor element was measured using the fabricated circuit connection structure. The measurement was carried out using a multimeter (device name: MLR2, manufactured by ETAC Co., Ltd.) at a temperature of 85 t: and a humidity of 85% RH for 1000 hours of Thermal Humidity Test (THT). Based on the resistance values after the THT test and based on the following criteria, the connection reliability was evaluated in two stages, A or B. The measurement results of the respective circuit connection structures are shown in Table 3. A : less than 10 Ω B : 10 Ω or more 33 201204801 , • μ· w r

[表3] 微粒子種類 成膜性 勉曲(μιη) 厚度為0.3 mm的某拓 實例1 聚矽氧複合物_ A A 實例2 MBS複合物 A A ^~~~~^ 實例3 MBS複合物 A A 實例4 mbs複合物 Γ A A 實例5 MBS複合物 Γ A A A 比較例1 矽土複合物 A B 比較例2 矽土 A B 本發明的電路連接用接著膜即便當用於將厚度薄的 路構件彼此予以連接時,成膜性、翹曲及連接可靠性 現出優異的特性。 _衣 雖然本發明已以較佳實施例揭露如上,然其並非用以 限定本發明,任何熟習此技藝者,在不脫離本發明之精神 和範圍内,當可作些許之更動與潤飾,因此本發明之保 範圍當視後附之申請專利範圍所界定者為準。 ' 【圖式簡單說明】 圖1是表示本發明的一個實施形態的電路連接用 膜的模式剖面圖。 圖2是表示於一對電路構件之間插入有本實施形態的 電路連接用接著膜的積層體的模式剖面圖。 &quot;&quot; 圖3是表示本實施形態的電路連接構造體的模式 圖。 圖4是表示玻璃基板的翹曲的評價方法的模式 34 201204801., t */upll 【主要元件符號說明】 1 :基板 la :玻璃基板 lb :配線圖案 2:半導體元件 2a : 1C晶片 2b :凸塊電極 3a :絕緣性接著劑層 3b :導電性接著劑層 4a、4b :接著劑組成物 5:導電粒子 6a、6b :固化物 10 :電路連接用接著膜 100 :電路連接構造體 200 :積層體 L:高度的最大值[Table 3] Microparticle type film-forming distortion (μιη) Thickness of 0.3 mm, a certain example 1 Polyoxygenated complex _ AA Example 2 MBS complex AA ^~~~~^ Example 3 MBS complex AA Example 4 Mbs composite Γ AA Example 5 MBS composite Γ AAA Comparative Example 1 矽 composite AB Comparative Example 2 AB AB AB The lining AB for circuit connection of the present invention is used even when used to connect thin-thickness path members to each other. Excellent properties are exhibited by film properties, warpage and connection reliability. Although the present invention has been disclosed in the above preferred embodiments, it is not intended to limit the invention, and those skilled in the art can make some modifications and refinements without departing from the spirit and scope of the invention. The scope of the invention is defined by the scope of the appended claims. [Brief Description of the Drawings] Fig. 1 is a schematic cross-sectional view showing a film for circuit connection according to an embodiment of the present invention. Fig. 2 is a schematic cross-sectional view showing a laminate in which a bonding film for circuit connection of the present embodiment is inserted between a pair of circuit members. &quot;&quot; Fig. 3 is a schematic view showing a circuit connection structure of the embodiment. 4 is a mode 34 showing a method of evaluating warpage of a glass substrate. 201204801. t */upll [Description of main components] 1 : Substrate la : Glass substrate lb : Wiring pattern 2 : Semiconductor element 2a : 1C Wafer 2b : Convex Block electrode 3a: Insulating adhesive layer 3b: Conductive adhesive layer 4a, 4b: Adhesive composition 5: Conductive particles 6a, 6b: Cured material 10: Connecting film for circuit connection 100: Circuit connection structure 200: Laminated Body L: the maximum height

Claims (1)

201204801 七 、申請專利範圍: L 一種電路連接用接著膜,包括: 及 導電性接著劑層,含有接著劑組成物及導電粒子;以 子 絕緣性接著劑層,含有接著劑組成物且不含有導電粒 入上述絕緣性接著劑層中所含有的上述接著劑組成物包 3 (a)成膜材料、環氧樹脂、(c)潛伏性固化 有機微粒子, 心ϋ⑷有機微粒子是由選自包含(甲基)丙烯酸烧基 ϋη乙烯絲物或複合物、(?基)丙烯親基酯- 複人ϋ或複合物及聚梦氧甲基)丙烯酸共聚物或 複組的至少-種聚合物或複合物構成的粒子, 電路電;用接著膜用於在使第1電路極及第2 ,路電極相對向的狀態下, 件予以電性連接,其中上述第丨m路構 以下的第i電路基板的主面上mu為 3. —種電路連接構造體,包括· 第1電路構件,在厚 板的主面上形成有第! 丽以下的第1電路基 第2電路構件,在厚’ 板的主面上形成有第2 d〇.3 _以下的第2電路基 電路電極,且上述第2電路電極配 36 201204801 電路電極相對向,上述第2電路電極與上 C第1電路電極電性連接;以及 之間連接部’介於上述第1電路構件與上述第2電路構件 ㈣ΐΪΐί部為如巾請專利範圍第1項或第2項所述之 電路連接用接著膜的固化物。 硐 驟:4. -種電路連接構造體的製造方法,包括如下的步 接著專利範圍第1項或第2項所述之電路連接用 路=路構件之間而獲得積層體,上述-對電 槿ίϊϊϊ 1路構件與第2電路構件,上述第1電路 Cmm以下的第1電路基板的主 電極,上述第2電路構件在厚度為0.3 = 、,2,路基板的主面上形成有第2電路電極;以及 著膜進行加熱及加壓而使上述電路連接用接 =牛之Π形,接部,上述連接部介於上述-對 與上述m 使相對向地配置的上述第1電路電極 ==電極電性連接的方式,將上述-對電路構 5·—種電路構件的連接方法,包括: 態下於Ιίϋ路電極與第2電路電極相對向地配置的狀 「電』f電路構件、第2電路構件以及配置於上述ί ^ V, 及上述第2電路構件之間的如申請專利範圍第J ί 之電路連接用接著膜進行加US將 中上迷第丨電路構件在厚度為们職以下的第料 37 201204801,u, 板的主面上形成有上述第1電路電極,上述第2電路構件 在厚度為0.3 mm以下的第2電路基板的主面上形成有上 述第2電路電極。 6. —種接著膜的用於電路連接的使用,上述接著膜包 括: 導電性接著劑層,含有接著劑組成物及導電粒子;以 及 絕緣性接著劑層,含有接著劑組成物且不含有導電粒 子’ 上述絕緣性接著劑層中所含有的接著劑組成物包含 (〇成膜材料、(b)環氧樹脂、潛伏性固化劑及 有機微粒子, 上迷有機微粒子是由選自包含(曱基)丙烯酸烷 rL二烯苯乙烯共聚物或複合物、(甲基)丙烯酸烧基@ 福:物或複合物及聚矽氧-(甲基)丙烯酸共聚物 複。物的群組的至少—種聚合物或複合物構成的粒子, 搞《i34接魏㈣於電路連接的使岐於使第1電路 2電相對向的狀態下,將第1電路構件與 電,構件予以電性連接,其中上述第ι電路構件 細以下的第i電路基板的主面上形成有 述第2電路構件在厚度為G.3 mm以下的ί 電路基板的主面上形成有上述第2電路電極。 接的述之接著膜的電吩 、述導電性接著綱更含有絕緣性粒子0 38201204801 VII. Patent application scope: L A bonding film for circuit connection, comprising: a conductive adhesive layer containing an adhesive composition and conductive particles; a sub-insulating adhesive layer containing an adhesive composition and not containing conductive The above-mentioned adhesive composition package 3 (a) a film-forming material, an epoxy resin, and (c) latent-cured organic fine particles, which are contained in the above-mentioned insulating adhesive layer, are selected from the group consisting of (A) organic fine particles. Acrylic acid ϋ 乙烯 vinyl wire or composite, (?) propylene parentyl ester - complex ruthenium or complex and polymethylene methacrylate copolymer or at least one polymer or complex The constituting particles are electrically connected to the circuit, and the bonding film is used to electrically connect the first circuit and the second electrode in a state in which the ith circuit substrate is below the 丨m path The main surface mu is a type of circuit connection structure, including the first circuit member, and the first surface of the thick plate is formed! In the first circuit-based second circuit member below Li, the second circuit-based circuit electrode of the second d〇3__ is formed on the main surface of the thick 'plate, and the second circuit electrode is provided with 36 201204801 circuit electrode The second circuit electrode is electrically connected to the upper C first circuit electrode; and the connection portion 'between the first circuit member and the second circuit member (four) ΐΪΐ 部 is part of the patent scope 1 or The circuit described in item 2 is connected to a cured product of the adhesive film. Step: 4. A method for manufacturing a circuit-connecting structure, comprising the steps of: obtaining a laminated body between the circuit connecting path and the path member according to the first or second aspect of the patent scope, the above-mentioned Ϊϊϊίϊϊϊ 1st member and second circuit member, the main electrode of the first circuit board of the first circuit Cmm or less, the second circuit member has a thickness of 0.3 = , 2, and the second main surface of the circuit board is formed with a second surface a circuit electrode; and the film is heated and pressurized to connect the circuit to the horn; and the connecting portion is interposed between the pair of the first circuit electrodes disposed opposite to the m. The method of electrically connecting the electrodes to the above-described circuit configuration includes a "electric" f-circuit member in which the electrodes are disposed opposite to the second circuit electrode, The second circuit member and the bonding film for circuit connection disposed between the above-mentioned ί ^ V and the second circuit member are added to the US, and the second circuit member is in the thickness. The following materials 37 2012 04801, u, the first circuit electrode is formed on the main surface of the board, and the second circuit electrode is formed on the main surface of the second circuit board having a thickness of 0.3 mm or less. In the use of the film for circuit connection, the adhesive film includes: a conductive adhesive layer containing an adhesive composition and conductive particles; and an insulating adhesive layer containing an adhesive composition and containing no conductive particles. The adhesive composition contained in the adhesive layer comprises (a film-forming material, (b) an epoxy resin, a latent curing agent, and organic fine particles, and the organic fine particles are selected from the group consisting of (indenyl)acrylic acid-containing rL. At least one polymer or composite of a group of olefinic styrene copolymers or composites, (meth)acrylic acid groups, or complexes, and polyfluorene-(meth)acrylic acid copolymers The constituting particles are electrically connected to the first circuit member and the electric member, and the first imaginary circuit member is electrically connected to the first circuit 2 in a state in which the i34 is connected to the circuit (4). The second circuit member is formed on the main surface of the ith circuit board, and the second circuit electrode is formed on the main surface of the λ circuit board having a thickness of G.3 mm or less. The conductivity is further covered with insulating particles.
TW100120184A 2010-06-14 2011-06-09 Adhesion film for connecting circuit and usage thereof, circuit connection structure and manufacturing method thereof, and connecting method of circuit member TW201204801A (en)

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JP6218354B2 (en) * 2012-01-06 2017-10-25 積水化学工業株式会社 Insulating material, multilayer film manufacturing method, laminate manufacturing method, connection structure, and connection structure manufacturing method
JP6155931B2 (en) * 2013-07-19 2017-07-05 住友ベークライト株式会社 Resin composition, adhesive film, adhesive sheet, dicing tape integrated adhesive sheet, and electronic component
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KR20190015652A (en) * 2017-08-03 2019-02-14 (주)트러스 Conductive adhesive tape using compressible conductive powder and manufacturing method thereof
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KR102569980B1 (en) * 2017-09-11 2023-08-24 가부시끼가이샤 레조낙 Adhesive film for circuit connection and manufacturing method thereof, manufacturing method for circuit connection structure, and adhesive film accommodating set
JP7516777B2 (en) * 2020-02-26 2024-07-17 株式会社レゾナック Adhesive film for circuit connection, circuit connection structure and method for producing same
CN114686125B (en) * 2022-04-29 2024-11-26 常州德创高新材料科技有限公司 Circuit connection adhesive film

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