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TW201144815A - A inspecting probe for electronic component - Google Patents

A inspecting probe for electronic component

Info

Publication number
TW201144815A
TW201144815A TW099128966A TW99128966A TW201144815A TW 201144815 A TW201144815 A TW 201144815A TW 099128966 A TW099128966 A TW 099128966A TW 99128966 A TW99128966 A TW 99128966A TW 201144815 A TW201144815 A TW 201144815A
Authority
TW
Taiwan
Prior art keywords
inspecting
electronic component
cylinder body
probe
piston body
Prior art date
Application number
TW099128966A
Other languages
English (en)
Other versions
TWI421503B (zh
Inventor
Woo-Yoel Jeong
Original Assignee
Nts Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nts Co Ltd filed Critical Nts Co Ltd
Publication of TW201144815A publication Critical patent/TW201144815A/zh
Application granted granted Critical
Publication of TWI421503B publication Critical patent/TWI421503B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
TW099128966A 2010-06-01 2010-08-27 遠程檢測電子部件探測器 TWI421503B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020100052020A KR101020025B1 (ko) 2010-06-01 2010-06-01 전자부품 검침 프로브

Publications (2)

Publication Number Publication Date
TW201144815A true TW201144815A (en) 2011-12-16
TWI421503B TWI421503B (zh) 2014-01-01

Family

ID=43938510

Family Applications (1)

Application Number Title Priority Date Filing Date
TW099128966A TWI421503B (zh) 2010-06-01 2010-08-27 遠程檢測電子部件探測器

Country Status (8)

Country Link
US (1) US8975906B2 (zh)
KR (1) KR101020025B1 (zh)
CN (1) CN102985833B (zh)
MY (1) MY168143A (zh)
PH (1) PH12012502398A1 (zh)
SG (1) SG185815A1 (zh)
TW (1) TWI421503B (zh)
WO (1) WO2011152588A1 (zh)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101727032B1 (ko) 2012-02-13 2017-04-26 리노공업주식회사 반도체디바이스 테스트용 프로브
KR101439343B1 (ko) * 2013-04-18 2014-09-16 주식회사 아이에스시 포고핀용 탐침부재
KR101439342B1 (ko) 2013-04-18 2014-09-16 주식회사 아이에스시 포고핀용 탐침부재
CN203337694U (zh) * 2013-05-27 2013-12-11 深圳市策维科技有限公司 一种测试探针
KR101531043B1 (ko) * 2013-11-19 2015-06-24 (주)마이크로컨텍솔루션 포고 핀 및 그 제조방법
WO2015105209A1 (ko) * 2014-01-09 2015-07-16 주식회사 아이에스시 탐침장치
JP6359347B2 (ja) * 2014-06-02 2018-07-18 日本発條株式会社 プローブユニットおよびコンタクトプローブ
KR101552553B1 (ko) * 2014-09-23 2015-10-01 리노공업주식회사 검사장치용 컨택트 프로브
CN105092908B (zh) * 2015-06-04 2017-11-14 合肥京东方光电科技有限公司 一种测试探针和测试装置
CN105044406B (zh) * 2015-08-28 2018-04-10 东莞市天元通金属科技有限公司 电流探针
TWI564569B (zh) * 2015-09-21 2017-01-01 旺矽科技股份有限公司 探針結構及其製造方法
JP2017142080A (ja) * 2016-02-08 2017-08-17 日本電産リード株式会社 接触端子、検査治具、及び検査装置
CN108139430A (zh) * 2016-03-18 2018-06-08 深圳市艾励美特科技有限公司 一种检测装置的测试探针
KR101827736B1 (ko) * 2016-07-29 2018-02-09 오재숙 반도체 칩 검사용 커넥터 핀 장치 및 그의 제작 방법
US10514391B2 (en) * 2016-08-22 2019-12-24 Kla-Tencor Corporation Resistivity probe having movable needle bodies
CN106597301B (zh) * 2016-11-24 2019-02-22 李莉 大电流平面接触导电装置
SG11201903814UA (en) * 2016-11-30 2019-05-30 Nidec Read Corp Contact terminal, inspection jig, and inspection device
JP7021874B2 (ja) * 2017-06-28 2022-02-17 株式会社ヨコオ コンタクトプローブ及び検査治具
JP7183007B2 (ja) * 2018-11-26 2022-12-05 日本メクトロン株式会社 バッテリ監視ユニット
US11940465B2 (en) 2019-03-13 2024-03-26 Nhk Spring Co., Ltd. Contact probe and signal transmission method
KR102191700B1 (ko) * 2019-08-02 2020-12-16 주식회사 이노글로벌 양방향 도전성 모듈
KR20240075950A (ko) * 2022-11-22 2024-05-30 (주)포인트엔지니어링 전기 전도성 접촉핀 및 이를 구비하는 검사장치

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100326723B1 (ko) * 1996-04-12 2002-04-17 마에다 츠구요시 도전성 접촉 유니트 시스템
KR19980054957U (ko) * 1996-12-31 1998-10-07 서두칠 회로 검사용 프로브 헤드
JP2000125324A (ja) * 1998-10-13 2000-04-28 Okutonikusu:Kk ピンプローブ及び電流供給装置
JP2002350463A (ja) * 2001-05-23 2002-12-04 Sanyu Kogyo Kk コンタクトプローブ
KR100546361B1 (ko) * 2003-08-08 2006-01-26 삼성전자주식회사 반도체 소자 검사장치의 포고 핀 및 그 운용방법
KR100584225B1 (ko) * 2004-10-06 2006-05-29 황동원 전자장치용 콘택트
TWI253790B (en) 2004-11-24 2006-04-21 Roger Chen The electrical contact probe
CN2795864Y (zh) * 2005-02-03 2006-07-12 陈涛 印刷电路板测试装置的弹性转接元件
CN2807263Y (zh) * 2005-06-02 2006-08-16 赐安电子有限公司 探针的改进结构
CN100430734C (zh) * 2006-01-25 2008-11-05 段超毅 集成电路测试用组合探针
KR100810044B1 (ko) 2006-08-10 2008-03-05 리노공업주식회사 검사용 탐침 장치 및 그 제조방법
KR100809578B1 (ko) * 2006-08-28 2008-03-04 리노공업주식회사 검사용 탐침 장치
JP2008175700A (ja) * 2007-01-19 2008-07-31 Matsushita Electric Ind Co Ltd 半導体装置の検査装置および検査方法
US7862391B2 (en) 2007-09-18 2011-01-04 Delaware Capital Formation, Inc. Spring contact assembly
KR100958135B1 (ko) * 2008-02-29 2010-05-18 리노공업주식회사 검사용 탐침 장치
CN201181303Y (zh) * 2008-03-18 2009-01-14 东莞中探探针有限公司 一体式大电流探针

Also Published As

Publication number Publication date
US20130069684A1 (en) 2013-03-21
CN102985833A (zh) 2013-03-20
MY168143A (en) 2018-10-11
SG185815A1 (en) 2013-01-30
WO2011152588A1 (ko) 2011-12-08
TWI421503B (zh) 2014-01-01
KR101020025B1 (ko) 2011-03-09
PH12012502398A1 (en) 2016-05-25
CN102985833B (zh) 2015-12-09
US8975906B2 (en) 2015-03-10

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