TW201111561A - Tin-containing alloy plating bath, electroplating method using same, and base having electroplated material deposited thereon - Google Patents
Tin-containing alloy plating bath, electroplating method using same, and base having electroplated material deposited thereon Download PDFInfo
- Publication number
- TW201111561A TW201111561A TW99125437A TW99125437A TW201111561A TW 201111561 A TW201111561 A TW 201111561A TW 99125437 A TW99125437 A TW 99125437A TW 99125437 A TW99125437 A TW 99125437A TW 201111561 A TW201111561 A TW 201111561A
- Authority
- TW
- Taiwan
- Prior art keywords
- tin
- mass
- plating
- substrate
- plating bath
- Prior art date
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- 238000007747 plating Methods 0.000 title claims abstract description 83
- 238000009713 electroplating Methods 0.000 title claims abstract description 51
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 title claims abstract description 45
- 229910045601 alloy Inorganic materials 0.000 title claims abstract description 28
- 239000000956 alloy Substances 0.000 title claims abstract description 28
- 238000000034 method Methods 0.000 title claims abstract description 23
- 239000000463 material Substances 0.000 title description 25
- 239000008139 complexing agent Substances 0.000 claims abstract description 18
- 229910052751 metal Inorganic materials 0.000 claims abstract description 18
- 239000002184 metal Substances 0.000 claims abstract description 18
- 239000002904 solvent Substances 0.000 claims abstract description 13
- 150000003606 tin compounds Chemical class 0.000 claims abstract description 11
- 238000000151 deposition Methods 0.000 claims abstract 3
- 239000000758 substrate Substances 0.000 claims description 47
- -1 hydrazine compound Chemical class 0.000 claims description 17
- OAKJQQAXSVQMHS-UHFFFAOYSA-N hydrazine Substances NN OAKJQQAXSVQMHS-UHFFFAOYSA-N 0.000 claims description 8
- 230000005684 electric field Effects 0.000 claims description 2
- 239000000126 substance Substances 0.000 claims 2
- 101150095744 tin-9.1 gene Proteins 0.000 claims 1
- 229910052718 tin Inorganic materials 0.000 abstract description 39
- 229910052688 Gadolinium Inorganic materials 0.000 abstract description 7
- 230000003647 oxidation Effects 0.000 abstract description 6
- 238000007254 oxidation reaction Methods 0.000 abstract description 6
- 238000004519 manufacturing process Methods 0.000 abstract description 5
- UIWYJDYFSGRHKR-UHFFFAOYSA-N gadolinium atom Chemical compound [Gd] UIWYJDYFSGRHKR-UHFFFAOYSA-N 0.000 abstract 1
- 150000002251 gadolinium compounds Chemical class 0.000 abstract 1
- 239000011135 tin Substances 0.000 description 40
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 34
- 239000002585 base Substances 0.000 description 26
- 238000012360 testing method Methods 0.000 description 18
- 230000000052 comparative effect Effects 0.000 description 17
- 229910052742 iron Inorganic materials 0.000 description 16
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 15
- 229910052802 copper Inorganic materials 0.000 description 15
- 239000010949 copper Substances 0.000 description 15
- 229910000679 solder Inorganic materials 0.000 description 13
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- 239000002253 acid Substances 0.000 description 10
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- 229910001432 tin ion Inorganic materials 0.000 description 8
- 229910001174 tin-lead alloy Inorganic materials 0.000 description 8
- 239000011133 lead Substances 0.000 description 7
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- 229910001887 tin oxide Inorganic materials 0.000 description 5
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- IISBACLAFKSPIT-UHFFFAOYSA-N bisphenol A Chemical compound C=1C=C(O)C=CC=1C(C)(C)C1=CC=C(O)C=C1 IISBACLAFKSPIT-UHFFFAOYSA-N 0.000 description 1
- 239000010951 brass Chemical group 0.000 description 1
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- KDYFGRWQOYBRFD-NUQCWPJISA-N butanedioic acid Chemical compound O[14C](=O)CC[14C](O)=O KDYFGRWQOYBRFD-NUQCWPJISA-N 0.000 description 1
- 125000004432 carbon atom Chemical group C* 0.000 description 1
- BVKZGUZCCUSVTD-UHFFFAOYSA-N carbonic acid Chemical compound OC(O)=O BVKZGUZCCUSVTD-UHFFFAOYSA-N 0.000 description 1
- 150000001735 carboxylic acids Chemical class 0.000 description 1
- 125000002091 cationic group Chemical group 0.000 description 1
- 239000003093 cationic surfactant Substances 0.000 description 1
- TYAVIWGEVOBWDZ-UHFFFAOYSA-K cerium(3+);phosphate Chemical compound [Ce+3].[O-]P([O-])([O-])=O TYAVIWGEVOBWDZ-UHFFFAOYSA-K 0.000 description 1
- OZECDDHOAMNMQI-UHFFFAOYSA-H cerium(3+);trisulfate Chemical compound [Ce+3].[Ce+3].[O-]S([O-])(=O)=O.[O-]S([O-])(=O)=O.[O-]S([O-])(=O)=O OZECDDHOAMNMQI-UHFFFAOYSA-H 0.000 description 1
- 229910052804 chromium Inorganic materials 0.000 description 1
- 239000011651 chromium Substances 0.000 description 1
- 238000009833 condensation Methods 0.000 description 1
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- 239000004020 conductor Substances 0.000 description 1
- 150000004696 coordination complex Chemical class 0.000 description 1
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- KUNSUQLRTQLHQQ-UHFFFAOYSA-N copper tin Chemical group [Cu].[Sn] KUNSUQLRTQLHQQ-UHFFFAOYSA-N 0.000 description 1
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- LDHQCZJRKDOVOX-NSCUHMNNSA-N crotonic acid Chemical compound C\C=C\C(O)=O LDHQCZJRKDOVOX-NSCUHMNNSA-N 0.000 description 1
- 150000003983 crown ethers Chemical class 0.000 description 1
- 238000000354 decomposition reaction Methods 0.000 description 1
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- 230000000694 effects Effects 0.000 description 1
- 238000005868 electrolysis reaction Methods 0.000 description 1
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- 125000001495 ethyl group Chemical group [H]C([H])([H])C([H])([H])* 0.000 description 1
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- 235000013905 glycine and its sodium salt Nutrition 0.000 description 1
- XKUKSGPZAADMRA-UHFFFAOYSA-N glycyl-glycyl-glycine Natural products NCC(=O)NCC(=O)NCC(O)=O XKUKSGPZAADMRA-UHFFFAOYSA-N 0.000 description 1
- 108010067216 glycyl-glycyl-glycine Proteins 0.000 description 1
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- 239000003617 indole-3-acetic acid Substances 0.000 description 1
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- 238000007733 ion plating Methods 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- JEIPFZHSYJVQDO-UHFFFAOYSA-N iron(III) oxide Inorganic materials O=[Fe]O[Fe]=O JEIPFZHSYJVQDO-UHFFFAOYSA-N 0.000 description 1
- 229910052745 lead Inorganic materials 0.000 description 1
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- VZCYOOQTPOCHFL-UPHRSURJSA-N maleic acid Chemical compound OC(=O)\C=C/C(O)=O VZCYOOQTPOCHFL-UPHRSURJSA-N 0.000 description 1
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- MGFYIUFZLHCRTH-UHFFFAOYSA-N nitrilotriacetic acid Chemical compound OC(=O)CN(CC(O)=O)CC(O)=O MGFYIUFZLHCRTH-UHFFFAOYSA-N 0.000 description 1
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- QNGNSVIICDLXHT-UHFFFAOYSA-N para-ethylbenzaldehyde Natural products CCC1=CC=C(C=O)C=C1 QNGNSVIICDLXHT-UHFFFAOYSA-N 0.000 description 1
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- QCDYQQDYXPDABM-UHFFFAOYSA-N phloroglucinol Chemical compound OC1=CC(O)=CC(O)=C1 QCDYQQDYXPDABM-UHFFFAOYSA-N 0.000 description 1
- 229960001553 phloroglucinol Drugs 0.000 description 1
- 229920000768 polyamine Polymers 0.000 description 1
- 229920000098 polyolefin Polymers 0.000 description 1
- 238000001556 precipitation Methods 0.000 description 1
- 230000002265 prevention Effects 0.000 description 1
- KOUKXHPPRFNWPP-UHFFFAOYSA-N pyrazine-2,5-dicarboxylic acid;hydrate Chemical compound O.OC(=O)C1=CN=C(C(O)=O)C=N1 KOUKXHPPRFNWPP-UHFFFAOYSA-N 0.000 description 1
- JUJWROOIHBZHMG-UHFFFAOYSA-N pyridine Substances C1=CC=NC=C1 JUJWROOIHBZHMG-UHFFFAOYSA-N 0.000 description 1
- MCJGNVYPOGVAJF-UHFFFAOYSA-N quinolin-8-ol Chemical compound C1=CN=C2C(O)=CC=CC2=C1 MCJGNVYPOGVAJF-UHFFFAOYSA-N 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 238000005476 soldering Methods 0.000 description 1
- 239000000243 solution Substances 0.000 description 1
- 241000894007 species Species 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 229910052712 strontium Inorganic materials 0.000 description 1
- CIOAGBVUUVVLOB-UHFFFAOYSA-N strontium atom Chemical compound [Sr] CIOAGBVUUVVLOB-UHFFFAOYSA-N 0.000 description 1
- 229910001427 strontium ion Inorganic materials 0.000 description 1
- BDHFUVZGWQCTTF-UHFFFAOYSA-M sulfonate Chemical compound [O-]S(=O)=O BDHFUVZGWQCTTF-UHFFFAOYSA-M 0.000 description 1
- 229910021653 sulphate ion Inorganic materials 0.000 description 1
- 238000004381 surface treatment Methods 0.000 description 1
- 229940095064 tartrate Drugs 0.000 description 1
- 238000009210 therapy by ultrasound Methods 0.000 description 1
- 238000003971 tillage Methods 0.000 description 1
- RYSQYJQRXZRRPH-UHFFFAOYSA-J tin(4+);dicarbonate Chemical compound [Sn+4].[O-]C([O-])=O.[O-]C([O-])=O RYSQYJQRXZRRPH-UHFFFAOYSA-J 0.000 description 1
- FAKFSJNVVCGEEI-UHFFFAOYSA-J tin(4+);disulfate Chemical compound [Sn+4].[O-]S([O-])(=O)=O.[O-]S([O-])(=O)=O FAKFSJNVVCGEEI-UHFFFAOYSA-J 0.000 description 1
- LTSUHJWLSNQKIP-UHFFFAOYSA-J tin(iv) bromide Chemical compound Br[Sn](Br)(Br)Br LTSUHJWLSNQKIP-UHFFFAOYSA-J 0.000 description 1
- HPGGPRDJHPYFRM-UHFFFAOYSA-J tin(iv) chloride Chemical compound Cl[Sn](Cl)(Cl)Cl HPGGPRDJHPYFRM-UHFFFAOYSA-J 0.000 description 1
- 229910000969 tin-silver-copper Inorganic materials 0.000 description 1
- BWHOZHOGCMHOBV-BQYQJAHWSA-N trans-benzylideneacetone Chemical compound CC(=O)\C=C\C1=CC=CC=C1 BWHOZHOGCMHOBV-BQYQJAHWSA-N 0.000 description 1
- VZCYOOQTPOCHFL-UHFFFAOYSA-N trans-butenedioic acid Natural products OC(=O)C=CC(O)=O VZCYOOQTPOCHFL-UHFFFAOYSA-N 0.000 description 1
- LDHQCZJRKDOVOX-UHFFFAOYSA-N trans-crotonic acid Natural products CC=CC(O)=O LDHQCZJRKDOVOX-UHFFFAOYSA-N 0.000 description 1
- YQMWDQQWGKVOSQ-UHFFFAOYSA-N trinitrooxystannyl nitrate Chemical compound [Sn+4].[O-][N+]([O-])=O.[O-][N+]([O-])=O.[O-][N+]([O-])=O.[O-][N+]([O-])=O YQMWDQQWGKVOSQ-UHFFFAOYSA-N 0.000 description 1
- 150000003648 triterpenes Chemical class 0.000 description 1
- MWOOGOJBHIARFG-UHFFFAOYSA-N vanillin Chemical compound COC1=CC(C=O)=CC=C1O MWOOGOJBHIARFG-UHFFFAOYSA-N 0.000 description 1
- FGQOOHJZONJGDT-UHFFFAOYSA-N vanillin Natural products COC1=CC(O)=CC(C=O)=C1 FGQOOHJZONJGDT-UHFFFAOYSA-N 0.000 description 1
- 235000012141 vanillin Nutrition 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D3/00—Electroplating: Baths therefor
- C25D3/02—Electroplating: Baths therefor from solutions
- C25D3/56—Electroplating: Baths therefor from solutions of alloys
- C25D3/60—Electroplating: Baths therefor from solutions of alloys containing more than 50% by weight of tin
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D21/00—Processes for servicing or operating cells for electrolytic coating
- C25D21/12—Process control or regulation
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D3/00—Electroplating: Baths therefor
- C25D3/02—Electroplating: Baths therefor from solutions
- C25D3/56—Electroplating: Baths therefor from solutions of alloys
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/12—All metal or with adjacent metals
- Y10T428/12493—Composite; i.e., plural, adjacent, spatially distinct metal components [e.g., layers, joint, etc.]
- Y10T428/12708—Sn-base component
- Y10T428/12715—Next to Group IB metal-base component
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/12—All metal or with adjacent metals
- Y10T428/12493—Composite; i.e., plural, adjacent, spatially distinct metal components [e.g., layers, joint, etc.]
- Y10T428/12708—Sn-base component
- Y10T428/12722—Next to Group VIII metal-base component
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Automation & Control Theory (AREA)
- Electroplating And Plating Baths Therefor (AREA)
Description
201111561 六、發明說明: 【發明所屬之技術領域】 本發明係有關可賦予適合於電氣•電子構件之含錫合 金電鍍製品之含錫合金電解電鍍浴,及使用此電鍍浴之電 解電鍍方法及該電解電鍍所堆積的基體。 【先前技術】 一般,對於汽車、家電、OA機器等各種電子機器所 使用的連接器•端子等電子•電氣零件而言,爲使用銅合 金作爲母材’此等以提高防銹、耐蝕性、改善電氣特性的 所謂機能提升之目的’係將其施以電鍍處理。其中以含有 鉛5〜40重量%的錫-錯合金電鍍,因爲其優異耐晶鬚( w h i s k e r )性、焊錫潤濕性、密著性、彎曲性及耐熱性等的 關係,被廣泛地使用。(例如參考日本特開平8 - 1 7 6 8 8 3號 公報等)。 但’近年因爲鉛對環境之影響被指證,作爲環境對策 之不含鉛之電鍍,亦即無鉛電鍍的切換正急速在進行中。 另一方面’無鉛含錫合金電鏟則在電鍍表面容易產生 晶鬚。因此’隨著近年的電子零件之高密度化,在含錫合 金電鍍製品方面’起因爲晶鬚之產生及表面氧化所導致的 接觸電阻不良及電氣短路的大問題正發生著。 對於此問題’所屬領域業者們摸索著含錫合金電鍍製 品的晶鬚對策。日本特開2008 - 8 8477號公報揭示提案在施 以特定的底基層及中間層後,施與錫電鍍,再進行迴流( -5- 201111561 reflow)處理之方法。另外’日本特開2008-194689號公報 揭示提案以形成結晶形態爲二種相異的錫電鍍被膜,以抑 制晶鬚產生之方法。更有如日本特開2008-280559號公報 ,藉由將已施以無鉛含錫合金電鍍之連接器等以超音波進 行處理,以抑制晶鬚產生。然而,此等方法與使用錫-鉛 合金電鍍之情況相較之下,步驟變得複雑。 【發明內容】 [發明所欲解決的課題] 本發明係鑑於上述之情事者,提供以防止所得到含錫 合金電鍍製品之表面氧化,可抑制晶鬚的產生之含錫合金 電解電鍍浴,及使用此電鍍浴之電解電鍍方法及該電解電 鍍所堆積的基體爲目的》 本發明係提供可賦予適合於電氣•電子構件優異耐氧 化性之含錫合金電鍍製品之含錫合金電解電鍍浴,及使用 此電鍍浴之電解電鍍方法及該電解電鍍所堆積的基體。 詳細爲使含錫合金堆積於基體表面上之電鍍浴,其特 徵爲含有(a)以電鍍浴中全金屬質量作爲基準時,爲含 有錫99.9質量%〜46質量%之錫化合物、(b)以電鍍浴中 全金屬質量作爲基準時,爲含有釓0.1質量%〜54質量%之 釓化合物、(c )至少一種的絡合劑及(d )溶劑的電鍍浴 ,及可使用此電鍍浴之電解電鍍方法賦予優異耐氧化性之 含錫合金電鑛製品。 藉由使用本發明之含錫合金之電鍍浴之電解電鍍法, -6- 201111561 可提供防止表面氧化、抑制晶鬚產生的含錫合金電鍍製品 。更,所得到的含錫合金電鍍製品,除了一邊可維持與錫 -鉛合金電鍍同樣的潤濕性外’更可抑制電鏟表面之變色 及具有維克氏硬度20〜165之表面硬度。 將由以下實施例說明內容展示本發明之其他特點。 [實施發明的最佳型態] 以下爲說明本發明之實施形態。另外’以下所示之實 施形態單純只是本發明之一例,只要爲所屬領域業者們均 可予以適當的設計變更。 (電鍍浴) 本發明之電鍍浴爲含有(a)以電鑛浴中全金屬質量 作爲基準時,爲含有錫99.9質量%〜46質量%之錫化合物、 (b)以電鍍浴中全金屬質量作爲基準時,爲含有釓〇.].質 量%〜5 4質量%之釓化合物、(c )至少一種的絡合劑及( d )溶劑。 a.錫化合物 本發明之錫化合物,以單獨或與後述的絡合劑一起溶 解於溶劑中,只要爲能提供錫離子之化合物即可。本發明 中並無此等的限定,可使用氯化錫、溴化錫、硫酸錫、亞 硫酸錫、碳酸錫、有機磺酸錫、硫代琥珀酸錫、硝酸錫、 201111561 檸檬酸錫、酒石酸錫、葡萄糖酸錫、草酸錫、氧化錫等的 錫鹽,及含有此等混合物之任意可溶性鹽類。以與有機磺 酸之鹽類爲宜。 由錫化合物所提供的錫離子,以電鍍浴中全金屬質量 爲基準,以含有99.9質量%〜46質量%之量在本發明的電鍍 浴中。較佳爲99.7質量%〜50質量%。更佳爲99.7質量%〜 60質量%、又更佳可爲含有99.7質量%〜70質量%之錫離子 〇 電鍍浴中之總金屬離子濃度在0.01g/L〜200g/L的範圍 ,更佳爲〇.5g/L〜100.0g/L。一般而言,錫離子以20g/L〜 2〇Og/L、更佳爲25g/L〜80g/L的濃度存在電鍍浴中。 b.釓化合物 本發明之釓化合物,以單獨或與後述的絡合劑一起溶 解於溶劑中,只要爲能提供釓離子之化合物即可。本發明 中可使用的釓化合物並無此等的限定,可爲硝酸釓、氧化 釓、硫酸釓、鹽化釓、磷酸釓等的亂鹽,及含有此等之混 合物。以氧化釓爲宜。 由釓化合物所提供的釓離子,以電鍍浴中全金屬質量 爲基準,以含有0.1質量%〜54質量%之量在本發明的電鍍 浴中。較佳爲0.3質量。/。〜5 0質量%。更佳爲〇 . 3質量%〜4 0 質量%、又更佳可爲含有〇. 3質量%〜3 0質量%之釓離子。 若釓離子的量未達0.1質量%時,所得到的含錫合金電鍍製 品則無法有效抑制晶鬚的產生。另一方面,相對於全金屬 -8 - 201111561 質量之釓離子的量若超過5 4質量%時,會導致電氣傳導性 降低。一般而言,釓離子以0.01g/L〜5.0g/L、較佳爲 0.1g/L〜5.0g/L之濃度存在電鍍浴中。 c.絡合劑 絡合劑爲對由上述錫化合物及/或上述釓化合物所提 供的錫離子及/或釓離子進行配位,爲使離子安定化的化 合物。本發明中的絡合劑,可具有二處以上的金屬配位部 位。 本發明可使用的絡合劑並無此等的限定,以含有具有 2〜10個碳原子的胺基酸;草酸、己二酸、琥珀酸、丙二酸 及馬來酸等的多羧酸;三甘胺酸等的胺基乙酸;乙二胺四 乙酸(「EDTA」)、二乙烯三胺五乙酸(「DTPAj ) ' N- ( 2-羥乙基)乙二胺三乙酸、ι,3-二胺基-2-丙醇-N,N,N',N' -四乙酸、雙-(羥苯基)-乙二胺二乙酸、二胺 基環己四乙酸,或乙二醇-雙-((β-胺基乙基醚)-N、N1-四 乙酸)等的亞院基聚胺基乙酸(alkylenepolyamine acetate );N,N,N',N、四-(2-羥丙基)乙二胺、乙二胺、2,2,,2"-三胺基三乙胺、三亞乙基四胺、二乙烯三胺及四(胺基乙 基)乙二胺等的多胺;檸檬酸鹽;酒石酸鹽;Ν,Ν-二-( 2-羥乙基)甘胺酸;葡萄糖酸鹽;乳酸鹽;冠醚;穴狀配 位子(crypt and ) ; 2,2 ’,2 〃 -氮基三乙醇鹽酸鹽(2,2,,2"- n i t r i 1 〇 t r i e t h a η ο 1 )等的多羥基化合物;2,2 ' ·吡啶、1 ,1 0 -啡 啉及8-羥喹啉等的雜芳香族化合物;锍乙酸與二乙基二硫 -9 - 201111561 代胺基甲酸等的硫代含有配位子;及乙醇胺、二乙醇胺、 及三乙醇胺等的醇胺。另外,亦可組合上述絡合劑2種以 上使用。 本發明之絡合劑可以各種的濃度使用。例如相對於存 在於電鍍浴中的錫離子及/或釓離子之總量,以化學計量 法的當量,或可使用讓全部的錫離子及/或釓離子絡合的 過剩的化學計量法。「化學計量法的」用語,如在此處所 使用的指爲等莫耳。 此外,絡合劑在電鍍浴中亦可以〇.lg/L〜250g/L之濃 度存在。較佳爲2g/L〜220g/L、更佳爲以50g/L〜150g/L之 濃度含於電鍍浴中。 d.溶劑 本發明的電鍍浴之溶劑,只要爲能溶解上述錫化合物 、釓化合物及絡合劑者即可。作爲該溶劑,可使用水,以 及乙腈、醇、乙二醇、甲苯、二甲基甲醯胺等的非水溶劑 。較佳爲以離子樹脂等除去其他金屬離子之溶劑。最佳爲 已施以除去金屬離子處理之水。 本發明的電鍍浴,通常爲具有1〜14的pH値。較佳以電 鍍浴爲具有$ 7者、更佳爲$4之pH値。亦可添加緩衝劑, 以維持電鍍浴之pH値在所希望的値。不管適合性爲如何的 酸或鹼均可作爲緩衝劑使用,此亦可爲有機或無機。所謂 的「適合性的」酸或鹼,爲在以酸或鹼作爲pH値緩衝之足 夠的量,在使用如此的酸或鹼之狀況時,不會從溶液產生 -10- 201111561 錫離子及/或絡合劑沈澱之意。示例的緩衝劑並無限定, 但包含氫氧化鈉或氫氧化鉀等的鹼金屬氫氧化物、碳酸鹽 、檸檬酸、酒石酸、硝酸、乙酸及磷酸。 e.添加劑 本發明的電鍍浴,更可混合任意選擇的周知界面活性 劑、安定劑、光澤劑、半光澤劑、抗氧化劑、pH調整劑等 的各種添加劑。 作爲上述界面活性劑,可舉例將環氧乙烷(EO )及/ 或環氧丙烷(PO) 2〜300莫耳加成縮合在烷醇、 酚、萘酚、雙酚類、C,〜C25烷基酹、芳基烷基酚、Ct〜 Czs烷基萘酚、(^〜(:^烷氧基化磷酸(鹽)、去水山梨醇 酯(sorb itan ester)、苯乙烯化酚類、聚烯烴基二醇、C, 〜C 2 2脂肪族胺、C !〜C 2 2脂肪族醯胺等的非離子系界面活 性劑爲首的陽離子系、陰離子系、或兩性的各種界面活性 劑。 上述安定劑以液體之安定或防止分解爲目的而被添加 ’具體上有氰化合物、硫代尿素類、亞硫酸鹽、乙醯半胱 胺酸等的含硫磺化合物、檸檬酸等的羥基羧酸類( oxycarboxylic acids )等周知的安定劑爲有效。此外’上 述列舉的絡合劑爲作爲安定劑有用者。 作爲上述光澤劑’可舉例如m-氯苯甲醛、p-硝苯甲醛 、p -羥基苯甲醛、1 -萘甲醛、柳醛、三聚乙醛、丙烯醛、 巴豆醛、戊二醛、香草醛等的各種醛類、亞苄丙酮、苯乙 -11 - 201111561 酮等的酮類、丙烯酸、甲基丙烯酸、巴豆酸等的不飽和羧 酸、三哄、咪唑、吲哚、喹啉、2-乙烯吡啶、苯胺等。 作爲上述半光澤劑,可舉例如硫代尿素類、N- ( 3-羥 基亞 丁基)-p-磺酸(N-(3-hydroxybutylidene)-p-sulfanilic acid ) 、N-亞丁基磺酸、N-苯亞烯丙基磺酸(N- cinnamylidene sulfanilic acid ) 、2,4-二胺基-6-(2’-甲基 咪唑基(厂))乙基-1,3,5-三畊、2,4·二胺基-6-(2、乙基-4-甲基咪唑基(厂))乙基-l,3,5-三哄、2,4-二胺基-6-(2'-十 —基咪唑基(1'))乙基-1,3,5-三哄、水楊酸苯酯,或苯并 噻唑、2 -甲基苯并噻唑、2-(甲基毓基)苯并唾唑、2 -胺 基苯并噻唑、2-胺基-6-甲氧基苯并噻唑、2-甲基-5-氯苯 并噻唑、2-羥基苯并噻唑、2-胺基-6-甲基苯并唾唑、2-氯 苯并噻唑、2,5 -二甲基苯并噻唑、2 -巯基苯并唾唑、6 -硝 基-2-毓基苯并噻唑、5-羥基-2-甲基苯并噻唑、2-苯并噻 唑硫代乙酸等的苯并噻唑類。作爲上述抗氧化劑,可舉例 如抗壞血酸或其鹽、氫醌 '兒茶酚、間苯二酚、間苯三酚 、甲苯酚磺酸或其鹽、苯酚磺酸或其鹽、萘酚磺酸或其鹽 等。 作爲上述pH値調整劑,可舉例如鹽酸、硫酸等的各種 酸、氫氧化銨、氫氧化鈉等的各種鹼等。 (電解電鍍方法) 本發明包含將基體浸漬於電鍍浴中之步驟、與對於該 基體外加電場之步驟’提供電鍍浴爲含有(a )以電鍍浴 -12- 201111561 中全金屬質量作爲基準時,爲含有錫99.9質量 之錫化合物、(b )以電鍍浴中全金屬質量作爲 爲含有釓〇 . 1質量%〜5 4質量%之釓化合物、(c ) 的絡合劑及(d )溶劑之爲其特之電解電鍍方法 之電解電鍍方法可使用所屬領域業者廣爲一般使 ,如有滾桶電鍍、吊掛電鍍(rack-plating)、高 鍍、無吊掛電鍍等。 a. 基體 本發明中能將含錫合金堆積於表面的基體爲 體,在電解電鍍製程中爲作爲陰極使用。可作爲 的導電性材料並無此等的限定,以含有鐵、鎳、 錫、鉛、及此等合金。較佳爲不鏽鋼、42合: Ni = 42: 58wt%)、隣青銅、錬、黃銅材%。此外 電鍍的接著性,基體亦可施以表面處理。 b. 電解條件 在本發明之電解電鑛方法中,使含錫合金堆 (被電鍍)之基體爲當作陰極使用。將可溶性或 溶性的陽極作爲第2電極使用。本發明中可使用 或直流電鍍,或者是脈衝電鍍與直流電鍍之組合 根據被電鍍之基體,電解電鍍製程的電流密 表面電位,所屬領域業者可適當地設計變更。一 及陰極電流密度的變化爲0.5〜5 A/cm2。電鍍浴 • 4 6質量% 基準時, 至少--種 。本發明 用的方法 速連續電 導電性基 基體使用 銅、鉻、 ( Fe : ,爲提升 積於表面 較佳爲不 脈衝電鍍 〇 度及電極 般,陽極 之溫度爲 -13- 201111561 維持在電解電鍍製程中25 °C〜3 5°C的範圍。爲 厚度之堆積物,電解電鍍製程必須持續足夠的 本發明之方法,可在基體表面形成厚度0.01 μηι 錫合金膜。 (電解電鍍所堆積的基體) 本發明係提供一種電解電鏟所堆積的基體 在基體之表面以含有(1)以全金屬質量作爲 質量%〜4 6質量%之錫、(2 )以全金屬質量作 質量%〜5 4質量%之釓。 於該基體表面所堆積的含錫合金電鍍,可 化 '防止晶鬚之產生。另外,該含錫合金電鍍 硬度20〜165的硬度。 本發明之於基體表面所堆積的含錫合金電 此優異之耐氧化性性質並非以理論即可限定的 經由釓之添加而形成具有緻密結晶構造的含錫 【實施方式】 [實施例] 以下爲對於本發明及效果以實施例及比較 ,本發明之適用範圍並不限定於實施例。 (耐熱性試驗) 將已電解電鍍之基板以230°C加熱5分鐘’ 形成所希望 時間。經由 〜5 Ομιη之含 ,其特徵爲 基準爲99.9 爲基準爲0.1 抑制表面氧 具有維克氏 鏟,具有如 ,可能因爲 合金關係* 例進行說明 觀察電鍍表 -14- 201111561 面的變化。更進一步,將前述已進行過加熱處理之電鍍表 面以百格刀試驗(Cross-cut Test) ( lmm間隔)進行評價 (接觸電阻) 將已電解電鍍之基板以一對的端電極(terminal electrode)挾持。使端電極與基板間之接觸面積爲10cm2 ,並以1 00ON的力道將端電極押壓到基板上。以此狀態下 ,在端電極間通以5.00 A之電流,測定另一端電極與基板 間的電位差。以所得到的電位差求得接觸電阻値。 (表面維克氏硬度之測定方法) 以(股)MATSUZAWA製表面硬度計(DMH-2型), 於常溫環境下以施加0.245N ( 25gF )荷重、15秒的負荷條 件予以測定。 (鹽水噴霧試驗) 依據JfIS H 8 502對已電解電鍍之基板進行中性鹽水噴 霧試驗(5%-NaCl水溶液)。於0.5小時後、2小時後、8小 時後觀察電鑛表面之狀態(腐蝕之有無)。 (晶鬚試驗) 依據電子情報技術產業協會(JEITA)規格ET-7410, 觀察於高溫高濕下晶鬚的產生。 -15- 201111561 將已電解電鍍之基板以在溫度55°C±3°C、相對濕度 8 5%中放置2000小時。之後,使用掃描式電子顯微鏡( SEM)對於試料表面之0.2mmx〇.4mm範圍,觀察晶鬚之有 無。無觀察到晶鬚之產生時以「無產生」記錄。另一方面 ,產生之晶鬚長度爲1〜ΙΟμιη時以「微小產生」記錄。另 外,晶鬚鬚長度爲10 μηι以上時以「有產生」記錄。 (焊錫潤濕性試驗) 依據JIS Ζ3 196對已電解電鍍之基板以沾錫天平法( w e 11 i n g b a 1 a n c e m e t h 〇 d )進行焊錫潤濕性試驗。焊錫浴方 面,鉛系焊錫以使用錫—鉛共晶焊錫(錫:鉛=6 0 % : 4 0 % )、無鉛焊錫以使用錫—銀—銅焊錫(錫:銀:銅=96.5% :3 % : 0.5 % ;千住金屬製Μ 7 0 5 )各別評價。 (實施例1 ) 調製含有如第1表所示濃度之以下成分的電鍍浴。調 製後的電鍍浴顯示強酸性。 [表1] (第1表)
氧化錫 3 5g/L
異丙醇擴酸(isopro panol sulfonic acid) 1 50g/L 二乙醇胺 60g/L
光澤劑 5g/L
L-抗壞血酸 lg/L -16- 201111561
氧化釓 0.4g/L 於上述電鍍浴中,對鐵系基材及銅系基材施以電解電 鑛。將基材浸漬於25〜30 °C之電鍍浴,以基材作爲陰極通 以電流密度爲0.5〜5 . OA/dm2的電流持續1〜2分鐘,得到膜 厚2 . Ο μιη的電鍍膜。所得到的電鍍膜中的釓含有量,以電 鍍膜的總質量作爲基準時,爲〇. 1 〇質量%。 所得到的電鍍膜施以耐熱性、接觸電阻値、維克氏硬 度及鹽水耐久性相關的試驗。結果如第5表所示。 (實施例2 ) 調製含有如第2表所示濃度之以下成分的電鍍浴。調 製後的電鍍浴顯示強酸性。 [表2] (第2表)
氧化錫 3 5 g/L
異丙醇擴酸(isopro panol sulfonic acid) 1 2 0 g/L 二乙醇胺 50g/L
光澤劑 5g/L
L-抗壞血酸 lg/L
氧化釓 0.6g/L 於上述電鍍浴中,對鐵系基材及銅系基材施以電解電 鍍。將基材浸漬於2 5〜3 (TC之電鍍浴,以基材作爲陰極通 -17- 201111561 以電流密度爲0.5〜5.ΟΑ/dm2的電流持續1〜2分鐘,得到膜 厚2.0 μιη的電鍍膜。所得到的電鍍膜中的釓含有量,以電 鑛膜的總質量作爲基準時,爲〇·3 〇質量%。 所得到的電鍍膜施以耐熱性、接觸電阻値、維克氏硬 度及鹽水耐久性相關的試驗。結果如第5表所示。 (實施例3 ) 調製含有如第3表所示濃度之以下成分的電鍍浴。調 製後的電鍍浴顯示強酸性。 [表3] (第3表)
氧化錫 3 5g/L
異丙醇擴酸(isopro panol sulfonic acid) 1 2 Og/L 二乙醇胺 50g/L
光澤劑 5g/L
L-抗壞血酸 lg/L
氧化釓 9.5g/L 於上述電鍍浴中,對鐵系基材及銅系基材施以電解電 鍍。將基材浸漬於25〜3 0°C之電鍍浴,以基材作爲陰極通 以電流密度爲0.5〜5.0A/dm2的電流持續1〜2分鐘,得到膜 厚2. Ομιη的電鍍膜。所得到的電鑛膜中的釓含有量,以電 鍍膜的總質量作爲基準時,爲8.00質量%。 所得到的電鍍膜施以耐熱性、接觸電阻値、維克氏硬 -18- 201111561 度及鹽水耐久性相關的試驗。結果如第5表所示。 (實施例4 ) 調製含有如第4表所示濃度之以下成分的電鍍浴。調 製後的電鎪浴顯示強酸性。 [表4] (第4表)
氧化錫 Mg/L
異丙醇擴酸(i s 〇 p r 〇 p a η ο 1 s u 1 f ο n i c a c i d) 1 2 0 g/ L
二乙醇胺 50g/L
光澤劑 5g/L
L-抗壞血酸 lg/L
氧化 iL 2 9 g / L 於上述電鍍浴中,對鐵系基材及銅系基材施以電解電 鍍。將基材浸漬於25〜30 °C之電鍍浴,以基材作爲陰極通 以電流密度爲0.5〜5.0A/dm2的電流持續1〜2分鐘,得到膜 厚2.0 μηι的電鍍膜。所得到的電鍍膜中的釓含有量,以電 鍍膜的總質量作爲基準時,爲54. 〇〇質量%。 所得到的電鍍膜施以耐熱性、接觸電阻値、維克氏硬 度及鹽水耐久性相關的試驗。結果如第5表所示。 對於經由實施例1〜4及第5表所記載之比較例1〜5之 電鍍浴所得到的電鍍膜施以耐熱性、接觸電阻値、維克氏 硬度及鹽水耐久性相關的試驗’結果如第5表所示° -19 - 201111561 晶鬚 微小產生| 有產生| 微小產生| 有產生| 無產生| L無產生I 無產生| 無產生| I無產生| 無產生| 1有產生| L有產生| 有產生| 有產生| 有產生| 1有產生| 有產生| 有產生1 s水噴霧試驗 8Η 0 〇 〇 〇 〇 〇 〇 〇 〇 〇 X X X X X X X X 〇 〇 〇 〇 〇 〇 〇 0 〇 0 0 0 〇 〇 X X X X 0. 5H 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 X X 〇 〇 表面硬度 (HV) 0) (0 W 0) (0 C0 N σ> CO CJ CD CP C0 寸· 0) C9 呀’ 0) 163 163 r~ r- f τ— C0 csi τ- 00 csi r- .Γ- 'r- C0 τ- 0) csi τ- 0) r- C0 csi 12. 3 接觸電阻値 (mQ) 0. 205 0. 195 0. 295 0. 287 0. 345 0. 326 0. 348 0. 329 0. 302 0. 276 0. 227 0. 211 0. 478 0. 444 0. 248 0. 217 0. 302 0. 275 耐熱後 百格刀試驗 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 Ο 〇 〇 〇 〇 〇 〇 龌職 ss Φ ®S ◎ ◎ ◎ ◎ ◎ ◎ ◎ ◎ X X X X X X X X X X 電鍍厚度 C^m) 〇 N 〇 N Ο CNJ Ο Ν 〇 cvi 〇 〇 csj 〇 csi 〇 Cvj ο csi 〇 csi ο ci 〇 cvi 〇 Csj 〇 〇 csi 2. 0 2. 0 基材 I鐵系基材 銅系基材 鐵系基材 銅系基材 |鐵系基材 |銅系基材 I鐵系基材 I銅系基材 鐵系基材 銅系基材 鐵系基材 銅系基材 1鐵系基材 銅系基材 鐵系基材 1銅系基材| 鐵系基材 銅系基材 實施例1 (Sn+0.1%Gd) 實施例2 (Sn+0.3%Gd) 實施例3 (Sn+8%Gd) 實施例4 (Sn+54%Gd) 比較例1 (Sn—10%Pb) 比較例2 (Sn+0.01%Gd) 比較例3 (硫酸Sn) 比較例4 洧機酸Sn) 比較例5 (Sn-2%Ag) (q-K1E?ro l )刼酬蚺 ' (ΕΪ1.0 l ~ L)刼鄉七鏟:趣ffiwnsite-X so.. ¾¾¾^幽掛馘e?: im 塍展擗 x&^o:趣ffiR绽¢sx &s o §© " i® -20- 201111561 含有錫-鉛合金電鍍(比較例1 )之全數的比較例, 於耐熱測試後發現有變色。另一方面,本發明之實施例1 〜4,亦無產生變色或剝離,確認具有足夠的耐熱性。另 外,在鹽水噴霧試驗中,含有0.01 % Gd之錫電鍍膜(比較 例2 )、僅由錫所成的電鍍膜(比較例3及4 )及錫-銀合 金電鍍膜(比較例5 )分別發現有腐蝕。相對於此,本發 明之電鍍膜(實施例1〜4 )及錫-鉛合金電鍍膜(比較例 1 ),即使在8小時後亦無產生腐蝕。 更,本發明之電鑛膜,確認邊具有與錫-鉛合金電鍍 同程度的表面接觸電阻値,且邊具有比錫一鉛合金電鍍高 的表面硬度。 又,觀察高溫高濕試驗後晶鬚的產生方面,釓以0. 1 % (實施例1 )及0.3% (實施例2 )之情況時,觀察到對於鐵 系材質具有抑制晶鬚產生之傾向。甚至,實施例3及4中不 論是鐵系材質或銅系材質均完全沒有發現晶鬚產生。另一 方面,在比較例中除了錫-鉛合金電鍍(比較例1 )之外 ,全數的比較例均產生晶鬚。 接下來,對於經由實施例1〜4及第5表所記載之比較 例1〜5之電鍍浴所得到的電鑛膜施以焊錫潤濕性試驗。結 果如第6表所示。 -21 - 201111561 [表6] ss 安定性 Sb 100 100 o 100 100 100 100 100 100 g 100 100 100 § 100 100 100 100 酲 R 睐 0.72 0.70 0.75 0.73 0.78 0.77 0.86 0.84 0.76 0.77 0.79 0.78 0.78 0.80 0.79 0.76 0.80 0.78 D m 0 1 < 1 c zero cross 時間TO 总 0.57 0.56 0.57 0.57 0.61 0.60 0.62 0.61 0.59 0.58 0.60 0.60 0.59 0.59 0.59 0.59 0.60 0.59 c/) -R m *〇 z S s 严 CO (O s 〇> r* s a s i〇 r· 00 s 蹈 m ιϋ E P C9 O CO io 〇> CJ 〇> esi o CO CO rf Τ" CO ψ» ei σ> c4 O) cJ •R 蟀 S 7. 3.072 s S 3.011 jj s 3.016 s 8 σ> K CM esi s (Ο 2.987 s κ ί E o ci o CO <M 〇> <N o CO c*i s ci S 5 CO 0> esi w 求 o o o ο 〇 〇 o ο o o o o o o o o ο o 产 产 t* T* r· r— T~ r- T~ r— m R 箱 p 0.62 0.60 0.62 0.61 0.64 0.62 0.66 0.64 0.61 0.61 0.59 0.57 0.60 0.59 0.55 0.53 0.59 0.58 m〇 蹈 ΙΛ p •0 a 1 h CO 8 s CO CO (O CO κ 卜 CO CO CO CO n 8 CM CO (Ο CO (O CO 1 c I 酲 〇· 〇· d ο o’ d o d d 〇· d d o 〇· 〇 d o' d R m T3 z s S a S σ> o (O CO 00 (Ο o s O) (O o 3.063 蹈 m t: ri o CO o CO σ> esi CO CJ CO T* CO CO r· CO o CO •R 蟀 s z t s a S O) e*5 to CO 00 <a JZ P s O) CO o s K IL B T— CO r~ CO 5 O CO o CO a> cm' σ> CM* ri r· CO CO — CO 严 CO r*· CO o CO o CO 3? te te te ¢: S i 味 « 味 i 味 糊 味 i 味 1 味 i 味 猢 味 i i 味 猢 味 镟 m 味 糊 味 m 味 i 味 糊 味 猢 味 « 味 铤 骚 m 樹 ns* 賊 m 曝 貓 TTg* 賊 厩 樹 媒 級 區 m 喔 ο /"•N /-% 3 <—Η m i cs q r·» ο gf s 0. 求 es cn 琢 w c <0 < 系 i IK w 堤 狃 ? c w 揭 c w m 狃 in C W I rp c CO 您 q C to 想 s_/ £ μ 5 i £ N 1 c W (^39咱5°卜2鉍嘩領担4-) % 9 · Ο 1% ε 1% S · 9 6 = 3ϋιων I c S* % 0寸—求Ο 9 =晡抹q d丨c s * 如同第6表所示,本發明之實施例1〜4,不論是對於 鉛系焊錫(錫-鉛共晶焊錫)或是對於無鉛焊錫(錫-銀 -22- 201111561 -銅焊錫)’均確認具有與錫-鉛合金電鍍(比較例1 ) 同程度的潤濕性。 雖然本發明已如實施例說明內容所描述,這是可以理 解該發明不僅限於此實施例說明所揭露之內容。以下的專 利申請範圍應給予最廣泛的解釋’以涵蓋所有這些修改和 相同的結構和功能。
S -23-
Claims (1)
- 201111561 七、申請專利範圍: 1. 一種電解電鍍所堆積的基體,其特徵係在基體之表 面含有 (1) 以全體金屬質量作爲基準時,爲99.9質量%〜46 質量%之錫;及 (2) 以全體金屬質量作爲基準時,爲〇.1質量%〜54 質量%之釓。 2 .如專利申請範圍第1項之基體,其中,前述基體係 電子構件或電氣構件。 3_ —種用以於基體之表面堆積含錫合金之電解電鍍方 法;其特徵包含 將基體浸漬於電鍍浴中之步驟;與 對該基體施加電場之步驟, 其中前述電鍍浴含有: (a) 以電鍍浴中全金屬質量作爲基準時,含有錫 9 9.9質量%〜4 6質量%之錫化合物; (b) 以電鍍浴中全金屬質量作爲基準時,含有纟[0.1 質量%〜54質量%之釓化合物; (c )至少一種的絡合劑;及 (d )溶劑。 4. 一種用以於基體之表面堆積含錫合金之電解電鎞浴 ;其係含有 (a)以電鍍浴中全金屬質量作爲基準時,含有錫 9 9.9質量%〜4 6質量%之錫化合物; -24- 201111561 (b)以電鍍浴中全金屬質量作爲基準時,含有釓ο·1 質量。/。〜5 4質量%之釓化合物; (c )至少一種的絡合劑·’及 (d )溶劑。 -25- 201111561 四 指定代表圖: (一) 、本案指定代表圖為:無 (二) 、本代表圖之元件代表符號簡單說明:無 201111561 五 本案若有化學式時,請揭示最能顯示發明特徵的化學 式:無
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| PCT/JP2009/063691 WO2011013252A1 (ja) | 2009-07-31 | 2009-07-31 | スズ含有合金メッキ浴、これを用いた電解メッキ方法および該電解メッキが堆積された基体 |
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| EP (1) | EP2460910B1 (zh) |
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| SG173551A1 (en) | 2009-02-06 | 2011-09-29 | Kenji Dewaki | Silver-containing alloy plating bath and electrolytic plating method using the same |
| CN103046090B (zh) * | 2012-12-28 | 2015-04-15 | 武汉吉和昌化工科技有限公司 | 一种无氰碱性镀铜溶液中防置换铜添加剂及其制备方法 |
| US10633754B2 (en) | 2013-07-05 | 2020-04-28 | The Boeing Company | Methods and apparatuses for mitigating tin whisker growth on tin and tin-plated surfaces by doping tin with germanium |
| US20160225597A1 (en) | 2013-09-13 | 2016-08-04 | Inficon Inc. | Chemical analyzer with membrane |
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| SG173551A1 (en) | 2009-02-06 | 2011-09-29 | Kenji Dewaki | Silver-containing alloy plating bath and electrolytic plating method using the same |
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| SG178183A1 (en) | 2012-03-29 |
| EP2460910A4 (en) | 2013-06-05 |
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| US9080247B2 (en) | 2015-07-14 |
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