TW201002193A - Testing and classifying machine of electronic elements with protective devices - Google Patents
Testing and classifying machine of electronic elements with protective devices Download PDFInfo
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- TW201002193A TW201002193A TW97124300A TW97124300A TW201002193A TW 201002193 A TW201002193 A TW 201002193A TW 97124300 A TW97124300 A TW 97124300A TW 97124300 A TW97124300 A TW 97124300A TW 201002193 A TW201002193 A TW 201002193A
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- 238000012360 testing method Methods 0.000 title claims abstract description 123
- 230000001681 protective effect Effects 0.000 title abstract 3
- 230000007246 mechanism Effects 0.000 claims description 35
- 230000007613 environmental effect Effects 0.000 claims description 30
- 238000002955 isolation Methods 0.000 claims description 25
- 238000006073 displacement reaction Methods 0.000 claims description 11
- 239000000463 material Substances 0.000 claims description 10
- 230000002950 deficient Effects 0.000 claims description 7
- 238000007599 discharging Methods 0.000 claims description 5
- 230000000694 effects Effects 0.000 claims description 4
- 230000002452 interceptive effect Effects 0.000 claims description 2
- 206010011224 Cough Diseases 0.000 claims 1
- 230000002708 enhancing effect Effects 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 14
- 239000000047 product Substances 0.000 description 12
- 238000005259 measurement Methods 0.000 description 5
- 238000009434 installation Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 125000006850 spacer group Chemical group 0.000 description 2
- 235000016068 Berberis vulgaris Nutrition 0.000 description 1
- 241000335053 Beta vulgaris Species 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 239000007795 chemical reaction product Substances 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000000796 flavoring agent Substances 0.000 description 1
- 235000019634 flavors Nutrition 0.000 description 1
- 230000036541 health Effects 0.000 description 1
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 230000008054 signal transmission Effects 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 230000000153 supplemental effect Effects 0.000 description 1
- 230000032258 transport Effects 0.000 description 1
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- Testing Of Individual Semiconductor Devices (AREA)
Abstract
Description
,201002193 九、發明說明: 【發明所屬之技術領域】 本發明尤指其提供一種可罩霜 置,而使電子元件於測試裝置内裝置外部之環境防護裝 $動化作業之方式提昇測試產能及試作業’進而以 置之電子元件測試分類機。 質之具環境防護裝 【先前技術】 以封測作業而言,一些特殊 1C等)’如在職的環射飾物頻1C、麥克風 稷雜之雜訊(如電磁波)干擾響^ 到外_ 類之電子元件於進行測試作紫味,=普其測试之準確性,因此該 才能有效提升其測試之準雜.、目界之雜訊加以隔離, 箱來進行作業,請參閱第1圖,轉:乙方式係採用隔離 號隔離箱之改良結構」專二口 f申凊第94217637號「訊 離效果之底座1 〇及罩蓋11、,底座=具電磁波隔 冗i f; r蓋11上則設有二握以3 伃罩盍11向上開啟,另於达汁 』用徑把13可使 試機之測試電路板! 4,並於^ =内裝設有連結測 電子元件! 5 ;於進行測試有待測試之 1 4上,接著關閉罩蓋1 1,即可使電路板 开杜具電贱隔離效果之隔離箱,可使得雷早 =1,閉的環境中避免受到外界雜訊之干擾,: 測減之準確性;惟該隔離 > ^ 取放電子元件i 5均係採用人工二=== 產效率了之,:而,低測試之產能,對於講求以自動化提昇生 ίϊίΐ 測試作業方式實有加以改善之必要。 ;it本發明人以其多年之工作經驗,經過不斷的研究 201002193 裝置内,干 ί宗f而大幅提昇測試產能及確保測試品質τ此即 【發明内容】 試分明ϋ 係提供—種具環境防護展置之電子元件測 =二可移動於供、收料匡及測試裝置間之輸送 $收料ε,另複數個罩覆於測試裝 境 试作f ’細達到確保測試品f之使驗益。進化,、干擾的測 試分的係提供—種具魏防護裝置之電子元件測 複數i設於機银、收料匡及空匿,另 於測試機之測試ίυί供其=,上設有訊號連結 ίί收;;件移載至測試裝置,並於完成測試後移 之使用i益。轉之方式進行戦健,達到提昇測試產能 【實施方式】 較佳it丨本發明有進-步之深入瞭解’茲例舉一 罕乂佳只%例,並配合圖式說明如产, 平 之【品==士類機係,於機台2 〇前端 品收料匣4 〇 c及办渖ς 0A、不良品收料匣4 0 B、次級 元件,而良品收料料匣3 ◦係供承置待測之電子 ® 4 0 C則分別供承ί ^ : 4 Q B、次級品收料 艮0口不良品、次級品之不同等級完測電 201002193 π ί115 3 !j可接收供料E 3 0處之空料盤或補充良品收 ’ 4 〇 A、不良品收料匣4 〇 B、次級品收料匣4 〇匚處 之空料盤’另於機台2 〇後端排列設有多組而 6 =,C、60D、6〇e、6〇f,i4== 。,良叩收料E4 Q A、不良品收料匣4 ◦ b、次級品^ =尸測試裝置60A、6〇b、6〇c、6()d^、 送裝Γ ◦,其包括有第—取放料機構7 1、轉運 作χ-γ —料機構7 3 ’第一取放料機構7 1係設有可 ^ Y—Z軸向位移之複數支吸嘴711,而可於供料序]n ,巧二電子元件移載至轉運機構7 2 載待/完=承 =後?,=2〇後端=== 1 J乍χ Υ—Ζ軸向位移之複數支吸嘴7 3 1,谁而估筮··而 3^ 3 1 7 23 ; 6 〇 Β Ο ^ 0 圖,各測試裝置6〇a、,;^=J: ^ 試座62a、62b 6 1 C ^ r 1 n ^ 6 2 F之測 §式板61Α、61β、 6ic、6iS:66;r fi6;【,各測試板 61A、61B、 元件之測試訊號傳輸ί: *'J^1#^;426 2 A 2 62D、QE、62F位置設有下壓機構 7 201002193 63A、63B、63C、63d、63e、63 構6 3 A為例,其具有-可由動升降 ^ ,並於下壓桿6 31A之頭端裴設有下壓产且^ ^6 31 A J子,置人測試座6 2 A後,該下壓“ 3'丄 降=測 ^以2治具6 3 2 A壓抵於待測電子元件之表 測試座6 2 a具有良好之電性接觸以 2A、60B、60C、60d、6〇e、6 擾的測試作業,係、於各測試裝置6GA、6 0B 6 =二62Ε、60F之外部分別罩設一環境, 201002193 IX. Description of the Invention: [Technical Field of the Invention] The present invention particularly provides a coverable frosting device, which improves the test capacity by means of an environmental protection device in which the electronic component is external to the device in the test device. The test operation 'further with the electronic component test classification machine. Quality protection equipment [previous technology] In terms of sealing and testing operations, some special 1C, etc.] such as the in-service ring-shooting material frequency 1C, microphone noisy noise (such as electromagnetic waves) interference ^ to the outside _ The electronic components are tested for purple flavor, and the accuracy of the test is valid. Therefore, it is necessary to effectively improve the accuracy of the test. The noise of the target is isolated, and the box is used for the operation. Please refer to Figure 1, turn : B mode is the improved structure of the isolation isolation box." Special two-port f application No. 94217637 "Base 1 and cover 11 of the separation effect, base = electromagnetic wave isolation if; r cover 11 is set There are two grips with 3 伃 盍 向上 11 open upwards, and another 达 ” ” ” ” ” ” ” ” ” ” ” 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 On the 1 4 to be tested, and then close the cover 1 1, the circuit board can be opened with the isolation box of the electric isolation effect, which can make the lightning early = 1 and avoid the interference of external noise in the closed environment: The accuracy of the measurement; however, the isolation > ^ pick and place electronic components i 5 are adopted by people Second === Productivity is:, and,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,, 201002193 In the installation, the equipment is greatly improved, and the test capacity is greatly improved. This is the content of the invention. [Inventive content] The test provides the electronic components of the environmental protection exhibition = two can be moved to the supply and receipt. And the test device transports the $ receipt ε, and the other covers the test installation test f 'fine to ensure the test article f. The evolution, the interference test is provided by the system - the type of protection The electronic component measurement number i of the device is set in the machine silver, the receiving material and the occlusion, and the test of the testing machine is υ υ 供 供 , , , , ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; Use the benefits of the post-shift. The way to transfer to the health, to achieve the test capacity [implementation] better it 丨 this invention has a deeper understanding of the step-by-step example of a rare example, and with the map Description of production, [Product == 士机机系,在机台2 〇Front end product receipt 匣4 〇c and office 渖ς 0A, defective product receipt 匣4 0 B, secondary component, and good product receipt 匣3 ◦ For the electronic products to be tested, 4 0 C is for the supply of ί ^ : 4 QB, the secondary product receipt 艮 0 defective products, the different grades of the secondary products, the test power 201002193 π ί115 3 !j can receive Empty tray at supply E 3 0 or supplemental good product '4 〇A, defective product receipt 匣4 〇B, secondary product receipt 匣4 之 empty tray' on the machine 2 There are multiple groups arranged at the end and 6 =, C, 60D, 6〇e, 6〇f, i4==. , Liangzhu receipt E4 QA, defective goods receipt 匣 4 ◦ b, secondary products ^ = corpse testing device 60A, 6〇b, 6〇c, 6 () d ^, delivery Γ ◦, which includes the first - take and discharge mechanism 7 1 , transfer operation χ-γ - material mechanism 7 3 'first take-off and discharge mechanism 7 1 is provided with a plurality of nozzles 711 capable of axial displacement of Y-Z, and can be supplied Sequence]n, Qiao two electronic components transfer to the transfer mechanism 7 2 loading / finishing = bearing = after?, = 2 〇 back === 1 J乍χ Υ - Ζ axial displacement of the plurality of nozzles 7 3 1, who is estimated ··· and 3^ 3 1 7 23 ; 6 〇Β Ο ^ 0 Figure, each test device 6〇a,,; ^=J: ^ test stand 62a, 62b 6 1 C ^ r 1 n ^ 6 2 F test § board 61Α, 61β, 6ic, 6iS: 66; r fi6; [, test board 61A, 61B, component test signal transmission ί: *'J^1#^; 426 2 A 2 62D, QE, 62F position is provided with a pressing mechanism 7 201002193 63A, 63B, 63C, 63d, 63e, 63 6 3 A as an example, which has - can be moved up and down, and at the head end of the lower pressing rod 6 31A With the lower pressure production and ^ ^ 6 31 AJ, after placing the test seat 6 2 A, the pressing "3' 丄 drop = test ^ 2 fixture 6 3 2 A pressure against the electronic components to be tested The test stand of the test stand 6 2 a has good electrical contact with 2A, 60B, 60C, 60d, 6〇e, 6 disturbances, and is external to each test device 6GA, 6 0B 6 = 2 62Ε, 60F Cover an environment
J〇b、80c、80d、8〇e、8〇f,_HS ,該隔離罩81二板 6 ί ΚίίίΠν ^於丁頁面開設有穿孔8 2八供下壓機構 之下壓朴6 31Α穿伸於内,且於下壓桿6 3丄 製成之隔離件8 3A ’而可於下壓桿6 3 1 A下ΐΐ壓 β 測試作業時,利用隔離件8 3 Μ隔離罩 8 2封閉以辅助隔離外界雜訊,另於隔離罩 面開設有通口 8 4 A,並於通口 8 4 a之外部設;! 8 4 4^^動作2軸向位移之門板86八,用以控制通口 雷;_ 6 0 A反之,於門板8 6 A下降時,則可使待測 業。兀件於封_魏巾’崎免紗獅訊干擾喊行測試作 之殘^7? 5圖,本發明於初始狀態時,第-取放料機構7 1 待測di 2x—γ—z軸向位移’而於供料E 3 0上取出 ;^,千兀件9 〇,並移載置入於轉運機構7 2之載台7 2工上 作閱第6圖,該載台721於承置待測電子元件9 〇後,係 軸向位移至機台2 0之後端,第二取放料機構7 3之吸嘴 8 201002193 7 2 1 7 3 1係將待測電子元件9〇 取放料機構7 3之吸嘴 7 3 :1作丫軸向f職裝置6。A,並使吸嘴 座6 2 a之上方,而使而位移至測試 測電子元株^nn t、及嘴731取出測試座62A内之完 入中再:=;7,3 1將待測電子元件9 〇置 裝置6 Ο A .咬炎朗了將元測電子元件1 00移載出測試 6 3 A即驅動^桿閱6弟3 測試裝置6 〇 A之下屢機構 待測料nt6 3 1訂降,令下壓治具6 3 2 A壓抵於 具有 ==二二與測試座6 2 a 必須於無雜訊干擾的環由=測電子元件9 0 置8 0 A係控㈣虹C 作業時’該環境防護裝 8 1 、πΓ« /1 δ μ 5 A驅動門板8 6 A下降,將隔離罩 = Γ ί使裝配於下壓桿6 3 1八上之隔離 内部mw#8 1Α之穿孔82讀閉,使隔離罩8 1Α之 試作ί 二,則電子元件9 0於封閉環境中執行測 機再將雜訊干擾’以提升測試品質,該測試 7 5月參閱苐9、1 〇圖’第二取放料機構7 3之吸嘴 7 2 1 1 ° ° 7 2 ϊί! 栽送至機;0:前】貝笛贈轴向位移將完測電子元件1 0 0 取出載^ 取放料機構71之吸嘴711則可 料以ί Ϊ ί Γ f,而移載收置於良品收料Ε 4 ◦ Α或不良品收 件Ιίί 料E40C ’而完成分類收置完測電子元 構^ j第1 1圖’係本發明職裝置朗*同型式之下壓機 置6 0 A為例,其下壓機構上:;2 M, 且位於隔離罩8 1 A之内部,該下壓機 201002193 t下屋桿6 4 1 A係由壓缸驅動升降位移,並於下壓桿 ,該下壓目對於麟座6 2⑽置触下壓治具6 4 2 A 以懕把雷^二、6 4 2 A可由下壓桿6 4 1 Λ帶動作升降位移,用 取放執行測試作業·’請參閱第1 2、1 3圖’該第二 防護裝置“ 待測電子元件9 ◦移載至環境 測%座Ρ &離罩8 1Α内’並置人於測試裝置6 〇八之 出至環请防,之後,第二取放料機構7 3之吸嘴7 3 1再退 6 4 ί A係t動置下8r〇 A之外部’而測試裝置60八之下壓桿 6 4 ? A魅^下屢治具6 4 2 AT降位移,令下壓治具 子元件9 0於之待測電子元件9 0,以使待測電 Μ碟Ζίίτ離罩81内之封閉環境中執行測試作業,而可 有效;免外界雜訊干擾,吨升測試品質。 下壓圖’係本發明測試裝置顧不同型式測試座及 以測試震置6 ◦A為例,其係於測試板 6 5 A位鮮壓杯6 4 1 A侧方相對應測試座 ί A之頂壓治具6 4 3 A,該頂壓 測試座6 5A 4參閱;^ 帶動升降位移’用以頂壓開啟 v.,< θΓα™ Ε ^ 5 A,使顧座6 5 Α可供置人制之電 ί二取放料機構7 3之吸嘴7 3 i可將待測電子=〇 於 穿越頂壓治具6 4 3 4 A 子元件9 0 9 〇 6 5 Λ 3 Τ 再退出至環境防護裝置80 A之外部,而測以 桿641A則帶動頂壓治*6 4 3A上升復 201002193J〇b, 80c, 80d, 8〇e, 8〇f, _HS, the isolation cover 81 two boards 6 ί Κ ίίίΠν ^ The page of the Ding is opened with a perforation 8 2 eight for the pressing mechanism under the pressure of 6 31 Α And the spacer 8 3A' which is made by pressing the rod 6 3 而 can be closed by the spacer 8 3 Μ isolation cover 8 2 when the lower pressing rod 6 3 1 A is pressed β test operation to assist the isolation External noise, and a port 8 4 A is opened on the isolation cover, and is set outside the port 8 4 a; 8 4 4^^ Action 2 Axial displacement of the door panel 86 eight, used to control the port lightning; _ 6 0 A, on the contrary, when the door panel 8 6 A descends, it can be tested.兀 于 _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ Take the displacement ' and take it out on the feed E 3 0; ^, the 兀 9 〇, and transfer the loading table 7 placed on the transfer mechanism 7 2 to work on the sixth picture, the stage 721 is under bearing After the electronic component 9 is to be tested, it is axially displaced to the rear end of the machine 20, and the suction nozzle 8 of the second take-off mechanism 7 3 201002193 7 2 1 7 3 1 is used to take the electronic component 9 to be tested. The suction nozzle 7 3 : 1 of the material mechanism 7 3 serves as the axial direction device 6. A, and the nozzle holder 6 2 a above, and then displaced to the test electron cell strain ^nn t, and the mouth 731 out of the test seat 62A in the completion of the re-entry: =; 7, 3 1 will be tested Electronic component 9 装置装置 6 Ο A. Bite yan, the meta-test electronic component 100 00 out of the test 6 3 A, the drive ^ rod read 6 brother 3 test device 6 〇A under the repeated mechanism to be tested nt6 3 1 set down, so that the lower pressing fixture 6 3 2 A pressure with the == two two and the test seat 6 2 a must be in the ring without noise interference = electronic component 9 0 set 8 0 A control (four) rainbow C When working, 'The environmental protection device 8 1 , πΓ« /1 δ μ 5 A drives the door panel 8 6 A down, and the isolation cover = Γ ί makes the isolation inner part of the lower pressure bar 6 3 1 8 mw#8 1Α The perforation 82 is read and closed, so that the isolation cover 8 1 is tested, and the electronic component 90 is executed in a closed environment to interfere with the noise to improve the test quality. The test is performed in May 7 苐 9, 1 〇 Figure 'The second pick-and-drop mechanism 7 3 nozzle 7 2 1 1 ° ° 7 2 ϊί! Planted to the machine; 0: before】 Beet free gift axial displacement will complete the electronic components 1 0 0 take off The nozzle 711 of the discharging mechanism 71 can be expected to be ί ί Γ f, and the transfer is placed in the good receipt Ε 4 Α Α or defective goods receipt Ι ίί material E40C 'and complete the classification and complete the measurement of the electronic component structure ^ j Figure 1 ' is the invention device lang * In the same type, the compressor is set to 60 A as an example, and the pressing mechanism is: 2 M, and is located inside the isolation cover 8 1 A. The lower pressing machine 201002193 t lower house 6 4 1 A is a pressure cylinder Drive the lifting displacement, and press the lever under the lower pressing rod. The lower pressing head is placed on the 6 2 (10) of the pedestal to press the lower pressing fixture 6 4 2 A. The ram 2, 6 4 2 A can be driven by the lower pressing rod 6 4 1 Lifting the displacement, performing the test operation with the pick and place. 'Please refer to Figure 1, 2, and 3' for the second guard. The electronic component to be tested 9 ◦ is transferred to the environmental measurement % Ρ & The person in the test device 6 is out of the ring to prevent it, then the second take-off mechanism 7 3 nozzle 7 3 1 retreats 6 4 ί A t moves the lower part of the 8r 〇A' and the test device 60 eight under the pressure bar 6 4 ? A charm ^ under the fixture 6 4 2 AT drop displacement, so that the pressure gauge sub-component 90 0 to be tested electronic components 9 0, so that the electricity to be tested Ζ ίίτ Performing measurements in a closed environment within the enclosure 81 The operation can be effective; the external noise interference is avoided, and the test quality is ton-liter. The lower pressure diagram is the test device of the present invention, taking different types of test sockets and testing the vibration of 6 ◦A as an example, which is attached to the test board 6 5 A The fresh pressure cup 6 4 1 A side corresponds to the test seat ί A top pressure fixture 6 4 3 A, the top pressure test seat 6 5A 4 see; ^ drive the lifting displacement 'to push the pressure open v., <; θΓαTM Ε ^ 5 A, so that the seat can be placed on the 6 5 Α 置 ί 取 取 取 取 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 3 4 A sub-component 9 0 9 〇6 5 Λ 3 Τ Then exit to the outside of the environmental protection device 80 A, and the measuring rod 641A will drive the top pressure treatment *6 4 3A rise complex 201002193
據此,本發明可使a -Accordingly, the present invention can make a -
内進行無干擾的測試作 用效益。 【圖式簡單說明】 第1圖申Ϊ第94217637號「__箱之改^ 稱」导利案之不意圖。 ,2圖:本發明測試分類機之架構示意圖。 第3圖:本發明測試裝置之前視圖。 圖:本發明測試裝置及環境防護裝置之示意圖。 ^ 5圖:本發明測試分類機之使用示意圖 圖:本發明測試分類機之使用示意圖(二> 第7圖:本發明測試分類機之使用示意圖(三)。 ,8圖:本發明測試分類機之使用示意圖(四)。 圖:本發明測試分類機之使用示意圖(五)。 第1 0圖:本發明測試分類機之使用示意圖(六)。 第11圖:本發明測試裝置應用另一型式下壓機構之示意圖。 第12圖:本發明測試裝置應用另一型式下壓機構之使用示意 圖('~ ) ° 第13圖:本發明測試裝置應用另一型式下壓機構之使用示意 圖(二)。 第14圖:本發明測試裝置應用另一型式下壓機構及測試座之示 意圖。 第15圖:本發明測試裴置應用另一型式下壓機構及測試座之使 用示意圖(一)。 第16圖:本發明測試裝置應用另一型式下壓機構及測試座之使 201002193The effectiveness of the non-interfering test is carried out. [Simple description of the schema] Figure 1 is not intended to be used in the case of the "__Box Change". 2 is a schematic diagram of the architecture of the test classifier of the present invention. Figure 3: Front view of the test device of the present invention. Figure: Schematic diagram of the test device and environmental protection device of the present invention. ^5图: Schematic diagram of the use of the test sorter of the present invention: a schematic diagram of the use of the test sorter of the present invention (2) Fig. 7: Schematic diagram of the use of the test sorter of the present invention (3). Fig. 8: Test classification of the present invention Schematic diagram of the use of the machine (4) Figure: Schematic diagram of the use of the test sorter of the present invention (5). Figure 10: Schematic diagram of the use of the test sorter of the present invention (6). Figure 11: Application of the test device of the present invention Schematic diagram of the type of pressing mechanism. Fig. 12: Schematic diagram of the use of another type of pressing mechanism for the test device of the present invention ('~) ° Fig. 13: Schematic diagram of the use of another type of pressing mechanism for the testing device of the present invention (2) Figure 14: Schematic diagram of another type of pressing mechanism and test seat applied to the testing device of the present invention. Figure 15: Schematic diagram of the use of another type of pressing mechanism and test seat for the test device of the present invention (1). Figure 16: Application of the test device of the present invention to another type of pressing mechanism and test seat 201002193
用示意圖(二)。 【主要元件符號說明】 習式部份: 底座:1 〇 彈性撐桿:12 測試電路板:14 本發明部份: 機台:2 0 良品收料: 4 0 A 次級品收料匣:4 0 C 測s式裝置:6〇A、60B、 測試板:61 A、61B、6 測試座:6 2 A、6 2 B、6 下壓機構:6 3 A、6 3 B、 下壓桿:6 31 A 頂壓治具:6 3 3A 下壓機構:6 4A 下壓治具:6 4 2A 測試座:6 5 A 輸送裝置:7 0 吸嘴:71 1 載台:7 2 1 吸嘴:7 3 1 環境防護裝置:8 0A、8 〇Use the schematic (2). [Main component symbol description] Part of the formula: Base: 1 〇 elastic struts: 12 Test circuit board: 14 Part of the invention: Machine: 2 0 Good material receipt: 4 0 A Secondary product receipt 匣: 4 0 C s-type device: 6〇A, 60B, test board: 61 A, 61B, 6 Test stand: 6 2 A, 6 2 B, 6 Pressing mechanism: 6 3 A, 6 3 B, lower pressing rod: 6 31 A Top press: 6 3 3A Pressing mechanism: 6 4A Pressing fixture: 6 4 2A Test stand: 6 5 A Conveying device: 7 0 Nozzle: 71 1 Stage: 7 2 1 Nozzle: 7 3 1 Environmental protection device: 8 0A, 8 〇
80F80F
隔離罩:81 A 隔離件:8 3 A 壓缸:8 5 A 罩蓋:1 1 握把:1 3 電子元件:15 供料匣:3 0 不良品收料匣:4 〇 B 空匣:5 0Isolation cover: 81 A Isolation: 8 3 A Cylinder: 8 5 A Cover: 1 1 Grip: 1 3 Electronic components: 15 Feeder: 3 0 Bad goods receipt: 4 〇 B Space: 5 0
60C、60D、60E、60F60C, 60D, 60E, 60F
1C、61D、61E、61F1C, 61D, 61E, 61F
2C、62D、62E、62F2C, 62D, 62E, 62F
63C、63D、63E、63F 下壓治具:6 3 2A 通孔:6 3 4 A 下壓桿:6 41 A 第一取放料機構:71 轉運機構:7 2 第二取放料機構:7 3 、80C、80D、80E、63C, 63D, 63E, 63F Pressing fixture: 6 3 2A Through hole: 6 3 4 A Lower pressing rod: 6 41 A First picking and discharging mechanism: 71 Transfer mechanism: 7 2 Second picking and discharging mechanism: 7 3, 80C, 80D, 80E,
穿孔:8 2 A 通口 : 8 4 A 門板:8 6 A 12Perforation: 8 2 A port: 8 4 A door panel: 8 6 A 12
Claims (2)
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW97124300A TWI446867B (en) | 2008-06-27 | 2008-06-27 | Testing and classifying machine of electronic elements with protective devices |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW97124300A TWI446867B (en) | 2008-06-27 | 2008-06-27 | Testing and classifying machine of electronic elements with protective devices |
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| TW201002193A true TW201002193A (en) | 2010-01-01 |
| TWI446867B TWI446867B (en) | 2014-07-21 |
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Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI398653B (en) * | 2010-06-04 | 2013-06-11 | Chroma Ate Inc | A test device and test machine for preventing electromagnetic interference |
| TWI399543B (en) * | 2010-03-05 | 2013-06-21 | Hon Tech Inc | Testing and classifying machine for electronic elements |
| TWI404957B (en) * | 2010-11-16 | 2013-08-11 | Univ Lunghwa Sci & Technology | ?modulated breadboard with electromagnetic interference prevention function |
| TWI414798B (en) * | 2010-05-21 | 2013-11-11 | Hon Tech Inc | Testing and classifying machine for testing electronic elements at high and lower temperature |
| TWI414799B (en) * | 2010-07-16 | 2013-11-11 | Hon Tech Inc | Applied to image sensing IC test classification machine (a) |
| TWI414800B (en) * | 2010-07-16 | 2013-11-11 | Hon Tech Inc | Applied to image sensing IC test classifier (2) |
| CN113341265A (en) * | 2021-07-02 | 2021-09-03 | 中国振华(集团)新云电子元器件有限责任公司(国营第四三二六厂) | Automatic control system for testing leakage current of chip electrolytic capacitor |
-
2008
- 2008-06-27 TW TW97124300A patent/TWI446867B/en active
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI399543B (en) * | 2010-03-05 | 2013-06-21 | Hon Tech Inc | Testing and classifying machine for electronic elements |
| TWI414798B (en) * | 2010-05-21 | 2013-11-11 | Hon Tech Inc | Testing and classifying machine for testing electronic elements at high and lower temperature |
| TWI398653B (en) * | 2010-06-04 | 2013-06-11 | Chroma Ate Inc | A test device and test machine for preventing electromagnetic interference |
| TWI414799B (en) * | 2010-07-16 | 2013-11-11 | Hon Tech Inc | Applied to image sensing IC test classification machine (a) |
| TWI414800B (en) * | 2010-07-16 | 2013-11-11 | Hon Tech Inc | Applied to image sensing IC test classifier (2) |
| TWI404957B (en) * | 2010-11-16 | 2013-08-11 | Univ Lunghwa Sci & Technology | ?modulated breadboard with electromagnetic interference prevention function |
| CN113341265A (en) * | 2021-07-02 | 2021-09-03 | 中国振华(集团)新云电子元器件有限责任公司(国营第四三二六厂) | Automatic control system for testing leakage current of chip electrolytic capacitor |
Also Published As
| Publication number | Publication date |
|---|---|
| TWI446867B (en) | 2014-07-21 |
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